System and method for evaluating service life of low dropout regulator

Abstract

The invention belongs to the technical field of detection, and particularly discloses a life evaluation system and method for a low dropout regulator, and the method comprises the steps: carrying out the accelerated degradation test of a low dropout regulator sample, and monitoring the output voltage of the low dropout regulator sample in the aging process; based on the output voltage of the low dropout linear regulator sample and the test parameters in the aging process, the pseudo failure life under different stress levels is calculated through the degradation model, and then a life distribution model corresponding to the low dropout linear regulator is obtained for life prediction. According to the application, the service life of the low-dropout linear regulator sample can be pre-judged, and the problem of high maintenance difficulty caused by the damage of the low-dropout linear regulator sample can be solved.

Description

Technical Field

[0001] The present application belongs to the field of detection technology, and more specifically, relates to a system and method for evaluating the life of a low voltage dropout linear regulator. Background Art

[0002] The main function of a low-dropout linear regulator is to convert and stabilize the input voltage at a preset, lower constant voltage level. This output voltage can be set according to circuit requirements and can be adjusted within a certain range. It ensures that the output voltage remains stable when the input voltage or load changes, which is essential for the normal operation of electronic equipment. Low-dropout linear regulators play a key role in modern electronic design, especially in portable electronic devices, communication equipment, automotive electronics, and medical equipment that require high-efficiency, high-stability, and low-noise power supply.

[0003] However, during the use of low-dropout linear regulators, due to the influence of current and external environment, they will inevitably age. The aging of low-dropout linear regulators mainly includes the aging of chips and the aging of packages. The aging mechanism of chips includes the enhancement of thermal mechanical stress caused by heat accumulation, the expansion of chip cracks, and the complete detachment of the chip bonding layer from the bonding surface due to poor process. The aging mechanism of the package is mainly that high temperature and humidity lead to the degradation of the packaging material, and water vapor penetrates into the packaging material, causing the lead to deteriorate and the PCB copper wire to rust. The movable conductive ions introduced with the water vapor will reside on the surface of the chip, causing leakage. The voltage regulation function of the aged low-dropout linear regulator decreases, the output voltage is unstable, and it may even burn out.

[0004] However, the aging of low-dropout linear regulators is not easy to observe directly, and it is not easy to judge through all tests due to the huge number of applications. As a precision voltage-stabilized power supply, once it ages or burns out, the circuit will lose its function, which will have a huge impact on the operation of the equipment. This phenomenon poses a major hidden danger to some important circuits.

[0005] Although there is a new understanding and recognition of the aging state of low-dropout linear regulators, the aging process of low-dropout linear regulators is very long, and there is currently no good way to evaluate the actual life of long-life devices such as low-dropout linear regulators. Summary of the invention

[0006] In view of the defects of the prior art, the purpose of the present application is to provide a system and method for evaluating the life of a low-dropout linear regulator, aiming to solve the problem that it is currently impossible to evaluate the actual life of a low-dropout linear regulator.

[0007] To achieve the above-mentioned purpose, in a first aspect, the present application provides a life evaluation system for a low-dropout linear regulator, comprising: an aging module, a parameter testing module and a data processing module; the data processing module is connected to both the aging module and the parameter testing module; The aging module is used to provide the test parameters required for the accelerated degradation test for the low-dropout linear regulator samples; The parameter test module is used to monitor the output voltage of the low-voltage dropout linear regulator sample during the aging process of the low-voltage dropout linear regulator sample; The data processing module is used to calculate the pseudo-failure life under different stress levels through a degradation model based on the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process, and then obtain the corresponding life distribution model of the low-dropout linear regulator for life prediction.

[0008] Further preferably, the test parameters required for the low-dropout linear regulator sample in the accelerated degradation test include: environmental thermal stress, electrical stress, vibration stress, test temperature, test time, test voltage and test current density.

[0009] Further preferably, the data processing module includes: The determination unit is used to determine that the low-voltage dropout linear regulator sample is failed when the output voltage deviation rate of the low-voltage dropout linear regulator sample is above 10%; and the degradation test is terminated when the number of low-voltage dropout linear regulator samples that have failed accounts for more than 2 / 3 of the total number of low-voltage dropout linear regulator samples. A pseudo-failure calculation unit, used for calculating pseudo-failure life under different stress levels based on the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process by establishing a degradation model; The fitting calculation unit is used to fit the pseudo failure life under different stress levels and obtain the life distribution model for life prediction of low voltage drop linear regulator samples.

[0010] Further preferably, the degradation model in the pseudo-failure calculation unit is an Arrhenius model, an Arrhenius model, an inverse power law model or an Eyring model.

[0011] Further preferably, the data processing module is used to monitor the output voltage of the low dropout linear regulator sample continuously or at a set interval.

[0012] In a second aspect, the present application provides a method for evaluating the life of a low dropout linear regulator, which specifically includes the following steps: Step 1: setting test parameters required for the accelerated degradation test, performing the accelerated degradation test on the low-dropout linear regulator sample, and monitoring the output voltage of the low-dropout linear regulator sample during the aging process; Step 2: Based on the output voltage of the low-dropout linear regulator sample and the test parameters during the aging process, the pseudo-failure life under different stress levels is calculated through the degradation model, and then the corresponding life distribution model of the low-dropout linear regulator is obtained for life prediction.

[0013] Further preferably, step 2 specifically includes the following steps: Step 2.1: Obtain the output voltage of the low-dropout linear regulator sample. When the output voltage deviation rate of the low-dropout linear regulator sample is above 10%, the low-dropout linear regulator sample is determined to be failed. When the number of failed low-dropout linear regulator samples in the low-dropout linear regulator sample accounts for more than 2 / 3 of the total number, the degradation test is terminated. Step 2.2: By establishing a degradation model, the pseudo failure life under different stress levels is calculated based on the output voltage of the low dropout linear regulator sample and the test parameters during the aging process; Step 2.3: Fit the pseudo-failure life under different stress levels to obtain a life distribution model for use in life prediction of low dropout linear regulator samples.

[0014] Further preferably, the test parameters required for the low-dropout linear regulator sample in the accelerated degradation test include: environmental thermal stress, electrical stress, vibration stress, test temperature, test time, test voltage and test current density.

[0015] Further preferably, the degradation model is an Arrhenius model, an Arrhenius model, an inverse power law model or an Eyring model.

[0016] Further preferably, the output voltage of the low dropout linear regulator sample is monitored continuously or at a set interval.

[0017] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art: The present application provides a method for evaluating the life of a low-voltage difference linear regulator, wherein, based on the output voltage of the low-voltage difference linear regulator sample during the aging process and the test parameters during the aging process, the pseudo-failure life under different stress levels is calculated through a degradation model, and then the life distribution model corresponding to the low-voltage difference linear regulator can be obtained. For the same type of low-voltage difference linear regulator, the life distribution model can be directly used to predict the life, and there is no need to repeat the aging process multiple times, so as to facilitate the prediction of the life of the low-voltage difference linear regulator sample under actual use environment, so as to solve the problem in the prior art that the low-voltage difference linear regulator sample needs to be tested for a long time to obtain the service life, and the life of the low-voltage difference linear regulator sample cannot be predicted, resulting in the difficulty of repair work caused by the damage of the low-voltage difference linear regulator sample. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 is a diagram of a life assessment system for a low voltage dropout linear regulator provided in an embodiment of the present application; Figure 2 is a flow chart of a method for evaluating the life of a low-dropout linear regulator provided in an embodiment of the present application; Figure 3 4 is a graph showing degradation data of a low voltage dropout linear regulator provided in an embodiment of the present application. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0020] The term "and / or" in this article is a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The symbol " / " in this article indicates that the associated objects are in an or relationship, for example, A / B means A or B.

[0021] The terms “first”, “second” and the like in the specification and claims herein are used to distinguish different objects rather than to describe a specific order of the objects.

[0022] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0023] In the description of the embodiments of the present application, unless otherwise specified, “plurality” means two or more than two.

[0024] The present application provides a low-time-cost low-dropout linear regulator life evaluation system, which is used to collect characteristic parameters of low-dropout linear regulator samples and to perform life tests and life evaluations on low-dropout linear regulator samples, including: an aging module, a parameter test module, and a data processing module; Among them, the data processing module includes a data acquisition unit, a data preprocessing unit, a data determination unit and a life assessment unit; The aging module is used to provide the stress required for the accelerated degradation test to the low-dropout linear regulator sample, including stress such as temperature; wherein the aging module may be an aging box, and the low-dropout linear regulator sample is placed in the aging box during the aging test; The parameter test module is used to monitor the output voltage of the low-dropout linear regulator sample in the accelerated degradation test; The data acquisition unit is used to collect the output voltage of the low-voltage dropout linear regulator sample and the test parameters of the low-voltage dropout linear regulator sample during the aging process; The data preprocessing unit is used to remove abnormal values ​​in the test parameters and the output voltage of the low-dropout linear regulator sample, and provide the collected accelerated aging detection parameters of the low-dropout linear regulator sample to the life assessment unit; The data determination unit is used to determine that the low-voltage dropout linear regulator sample is failed when the output voltage deviation rate of the low-voltage dropout linear regulator sample is above 10%; and when the number of low-voltage dropout linear regulator samples that have failed accounts for more than 2 / 3 of the total number of low-voltage dropout linear regulator samples, the degradation test is terminated; The life assessment unit is used to calculate the pseudo-failure life at different stress levels by establishing a degradation model based on the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process; fit the pseudo-failure life at different stress levels to obtain a life distribution model for life prediction of the low-dropout linear regulator sample.

[0025] In practical applications, the data processing module can be a computer program product such as a computer; the data processing module can be further divided into units in other ways according to different functions; the life assessment unit can also be further divided into a fitting calculation unit and a pseudo-failure calculation unit; Further preferably, when the low voltage difference linear regulator is an LED, the parameter test module is used to detect the LED life test state, that is, to detect the temperature and humidity parameters provided by the aging box during the accelerated aging test of multiple LED samples, to detect the current parameters flowing through the LED samples during the accelerated aging test, and to detect the luminous flux of the LED samples during the life test and the LED power-on normal operation time parameters; Further preferably, the parameter test module is used to detect the life test state of the low-dropout linear regulator detection and life assessment system, and detect the output voltage of multiple low-dropout linear regulator detection and life assessment system samples during the accelerated aging test; Further preferably, the data acquisition unit may acquire parameters of the low-dropout linear regulator, including output voltage, according to a set period; The life assessment unit in the data processing module is used to automatically model the data collected by the data acquisition module, automatically correct the deviation value, automatically compare it with the module's built-in accelerated degradation model, and display the parameter estimation values ​​and calculated pseudo-failure life under different data fitting models.

[0026] Based on the above-mentioned low-time-cost low-dropout linear regulator life assessment system, the present application provides a corresponding life assessment method, which specifically includes the following steps: Step S1: placing a low-dropout linear regulator sample in an aging module for an accelerated degradation test, where the aging module can provide stresses such as electricity, temperature, and vibration; Furthermore, the aging module performs an accelerated degradation test on the low-dropout linear regulator sample and provides accelerated degradation test parameters, including test temperature, test time, test voltage, test current density and other parameters; applies stresses such as electricity, temperature, humidity and vibration required for the test; wherein the ambient temperature, power supply voltage and output voltage of the low-dropout linear regulator are fed back to the data acquisition unit, and the environmental thermal stress, electrical stress and vibration stress will cause the low-dropout linear regulator to achieve accelerated degradation in the working state; Step S2: using a parameter test module to continuously or at a set interval monitor the output voltage of the low dropout linear regulator; Step S3: based on the output voltage of the low dropout linear regulator, when the accelerated aging test reaches a threshold condition, the accelerated degradation test is stopped and the life assessment module is started; More specifically, when the output voltage deviation rate of the low-dropout linear regulator is more than 10%, the low-dropout linear regulator sample is determined to be failed; and when the number of failed low-dropout linear regulator samples accounts for more than 2 / 3 of the total number of low-dropout linear regulator samples, the test termination condition is met, that is, the degradation test is stopped, and the life assessment module is turned on at this time; Step S4: using a life evaluation unit to automatically calculate parameter estimation values ​​under different degradation models, and calculate pseudo failure life; More specifically, a degradation model is established through a life assessment unit; the pseudo-failure life under different stress levels is calculated through the model; the degradation model can be selected from statistical models and physical models, and the optional models include: Arrhenius model, improved Arrhenius model, inverse power law model and Eyring model, etc.; multiple groups of low-dropout linear regulator samples are subjected to accelerated aging tests under different temperature and other stress levels, and the corresponding ambient temperature T, electric field strength V, current density j And the duration of the accelerated aging test process for a single LED sample t, the parameters are substituted into the degradation model of the low-dropout linear regulator sample, the model parameters of different models can be calculated, and the parameter estimation values ​​of different models can be obtained; the pseudo-failure life of the low-dropout linear regulator is calculated through the degradation model and threshold conditions; Step S5: using a life evaluation unit to obtain a life distribution model by fitting pseudo failure lives under different stress levels to predict the life of the low dropout linear regulator.

[0027] More specifically, according to steps S1 to S4, the pseudo failure life is obtained, the pseudo failure life under different stress levels is fitted, the life distribution model is calculated, and the life of the low voltage difference linear regulator under the working environment stress is calculated by the life distribution model.

[0028] In summary, the low-voltage difference linear regulator life assessment system and method provided by the present application is to power the low-voltage difference linear regulator sample at a certain temperature, perform an accelerated aging test in the low-voltage difference linear regulator aging module, the low-voltage difference linear regulator parameter test module continuously or intermittently tests characteristic parameters such as output voltage, and the data acquisition unit regularly collects ambient temperature T, electric field strength V and current density j etc. test stress parameters and output voltage deviation degradation characteristic parameters; when the output voltage deviation rate of the low-dropout linear regulator is above 10%, the low-dropout linear regulator sample is judged to be failed; and when the number of failed low-dropout linear regulator samples in the low-dropout linear regulator samples accounts for more than 2 / 3 of the total number, the test termination condition is met, that is, the degradation test is stopped, and the life assessment module is turned on at this time; the same accelerated degradation test is carried out at multiple stress levels at the same time, and the degradation trajectories of different stress levels are obtained respectively; the model parameters are obtained by analyzing and calculating the degradation model, thereby obtaining the degradation model, and calculating the pseudo-failure life data; the life distribution model is obtained by fitting the pseudo-failure life data under different stress levels, and the life under normal stress level is calculated by the life model.

[0029] To summarize, the low-voltage difference linear regulator life assessment system and method provided in the present application are conducive to predicting the life of low-voltage difference linear regulator samples in actual use environments, so as to solve the problem in the prior art that low-voltage difference linear regulator samples require long-term experiments to derive their service life, and the life of low-voltage difference linear regulator samples cannot be predicted, resulting in difficulty in repairing the low-voltage difference linear regulator samples due to damage.

[0030] Example like Figure 1 As shown, the present application provides a low-dropout linear regulator life assessment system, which is used to collect characteristic parameters of low-dropout linear regulator samples and to perform life tests and life assessments on low-dropout linear regulators, including: an aging module, a parameter testing module, and a data processing module; Among them, the data processing module includes a data acquisition unit, a data preprocessing unit, a data determination unit and a life assessment unit; The aging module is used to provide the stress required for the accelerated degradation test to the low-dropout linear regulator sample, including stress such as temperature, and the low-dropout linear regulator sample is placed in the box; The parameter test module is used to monitor the output voltage of the low-dropout linear regulator sample in the accelerated degradation test; the data acquisition unit is used to collect the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process; The data preprocessing unit is used to remove abnormal values ​​in the test parameters and the output voltage of the low-dropout linear regulator sample, and provide the collected accelerated aging detection parameters of the low-dropout linear regulator sample to the life assessment unit; The data judgment unit is used to judge that the low-voltage difference linear regulator sample has failed when the output voltage deviation rate of the low-voltage difference linear regulator sample is above 10%; and the degradation test is terminated when the number of low-voltage difference linear regulator samples that have failed accounts for more than 2 / 3 of the total number of low-voltage difference linear regulator samples; the life assessment unit is used to calculate the pseudo-failure life under different stress levels by establishing a degradation model based on the output voltage of the low-voltage difference linear regulator sample and the test parameters of the low-voltage difference linear regulator sample during the aging process; fit the pseudo-failure life under different stress levels to obtain a life distribution model for life prediction of the low-voltage difference linear regulator sample.

[0031] Correspondingly, if Figure 2 As shown, the present application provides a method for evaluating the life of a low voltage dropout linear regulator, comprising the following steps: Step S1: placing a low-dropout linear regulator sample into an aging module for an accelerated degradation test, and the aging module provides degradation test parameters; More specifically, the low-dropout linear regulator samples were placed in an aging module for accelerated degradation testing, and the aging module provided power (the VIN port provided a rated operating voltage of 5V, the GND port was grounded, and the enable terminal EN was connected to a high level to put the device in a working state, with no load output), temperature stress (three temperature stress levels of 85°C, 125°C, and 175°C); The aging module performs accelerated degradation test on the low-dropout linear regulator sample. More specifically, it provides accelerated degradation test parameters, including test temperature T, test time t and test voltage V; and applies electrical and temperature stresses required for the test; the ambient temperature, power supply voltage and output voltage of the low-dropout linear regulator are fed back to the data acquisition unit. The environmental thermal stress and electrical stress will cause the low-dropout linear regulator to achieve accelerated degradation in the working state; Step S2: using a parameter test module to continuously or at a set interval monitor the output voltage Vout of the low voltage dropout linear regulator; More specifically, the parameter test module monitors the output voltage (Vout) parameters of the sample at intervals of 200 hours set by software, and compares and calculates the output voltage deviation rate δ with the standard output voltage (Vstd):

[0032] Record data. The data recording format is shown in the table below:

[0033] Step S3: When the accelerated aging test reaches a threshold condition, the accelerated degradation test is stopped and the life assessment unit is started; More specifically, when the accelerated aging test reaches the threshold condition or reaches the specified time, the accelerated degradation test is stopped and the life assessment unit is started; specifically: when the output voltage deviation rate of the low-dropout linear regulator is more than 10%, the sample is determined to be completely damaged and the test is stopped; different timing truncation is set for the three temperature stress levels, that is, at a temperature of 85°C, the test is stopped when the test reaches 6400h; at a temperature of 125°C, the test is stopped when the test reaches 3200h; at a temperature of 175°C, the test is stopped when the test reaches 1600h; the data processing module analyzes the data to obtain the output voltage deviation rate degradation curve of the low-dropout linear regulator sample, such as Figure 3 As shown, the life evaluation unit is turned on at this time;

[0034] Step S4: using a life evaluation unit to automatically calculate parameter estimation values ​​under different degradation models, and calculate pseudo failure life; More specifically, the degradation model can be selected from the following statistical models: (1) (2) (3) (4) (5) (6) in, and are the parameters to be determined for the model; is the duration of the trial; is the output voltage change rate; In is a mathematical symbol, taking the natural logarithm; Accelerated aging tests are performed on multiple groups of low-dropout linear regulator samples under different temperature and other stress levels, and the corresponding ambient temperature T and the duration t of the accelerated aging test process of a single LED sample are collected. The parameters are substituted into the life assessment model of the low-dropout linear regulator samples to calculate the model parameters of different models and obtain the parameter estimation values ​​of different models; the pseudo-failure life of the low-dropout linear regulator is calculated through the degradation model and threshold conditions; In this case, the statistical model of simple linear degradation of formula (1) is selected for linear regression; the failure threshold is set to the output voltage change rate ≥ 5%, and the pseudo life of the sample is calculated. The calculation results are shown in the following table:

[0035] Step S5: using a life evaluation unit to obtain a life distribution model by fitting pseudo failure lives under different stress levels to predict the life of the low dropout linear regulator.

[0036] More specifically, according to steps S1 to S4, the pseudo failure life is obtained, the pseudo failure life under different stress levels is fitted, the pseudo failure life is fitted using the log-normal distribution, and a likelihood function is constructed. The likelihood function for:

[0037] in, is the probability density function (PDF) of the normal logarithmic distribution. The maximum likelihood estimation is used to iteratively solve the lognormal distribution parameters, including the mean. and standard deviation ; n is the total number of tests; For the i The time of the test; The log-normal life distribution model parameters of this batch of low-dropout linear regulators are calculated as follows:

[0038]

[0039]

[0040] in, is the life span variable; The characteristic life of the low-dropout linear regulator in the working environment (25°C) is calculated through the life distribution model. The average life is 181946h and the median life is 176492h. Through the above embodiments, this experiment significantly shortens the component life test cycle (about 180,000 hours) through the degradation test (up to 6,400 hours), thereby achieving low-time-cost life evaluation of the low-dropout linear regulator.

[0041] In summary, the present application provides a system and method for evaluating the life of a low-dropout linear regulator, wherein a sample of a low-dropout linear regulator is powered at a certain temperature, an accelerated aging test is performed in an aging module, a parameter test module continuously or intermittently tests characteristic parameters such as output voltage, and a data acquisition unit periodically collects test stress parameters such as ambient temperature T, electric field strength V, and current density j, as well as degradation parameters such as output voltage; when the accelerated aging test reaches a threshold condition or reaches a specified time, the accelerated degradation test is stopped and the life evaluation unit is started; specifically: when the output voltage deviation rate of the low-dropout linear regulator is more than 10%, the sample is determined to be completely damaged and the test is stopped; different timing truncation is set for three temperature stress levels, that is, at a temperature of 85°C, the test is performed until 6 The test was stopped at 400h; at 125℃, the test was stopped at 3200h; at 175℃, the test was stopped at 1600h; at this time, the life assessment unit was turned on; the same accelerated degradation test was carried out at multiple stress levels at the same time, and the degradation trajectories of different stress levels were obtained respectively; the model parameters were obtained by analyzing and calculating the degradation model, so as to obtain the degradation model and calculate the pseudo-failure life data; the life distribution model was obtained by fitting the pseudo-failure life data at different stress levels, and the life under normal stress level was calculated by the life model; this experiment significantly shortened the component life test cycle (about 180,000h) through degradation experiments (up to 6400h), realizing the life assessment of low-dropout linear regulator with low time cost.

[0042] It can be understood that the detailed functional implementation of each of the above-mentioned units / modules can be found in the introduction of the aforementioned method embodiment, and will not be repeated here.

[0043] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A low dropout linear regulator life assessment system, characterized in that: include: Aging module, parameter testing module and data processing module; The aging module is used to provide the test parameters required for the accelerated degradation test for the low-dropout linear regulator samples; The parameter test module is used to monitor the output voltage of the low-voltage dropout linear regulator sample during the aging process of the low-voltage dropout linear regulator sample; The data processing module is used to calculate the pseudo-failure life under different stress levels through a degradation model based on the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process, and then obtain the corresponding life distribution model of the low-dropout linear regulator for life prediction.

2. The low dropout linear regulator life assessment system according to claim 1, characterized in that: The data processing module comprises: The determination unit is used to determine that the low-voltage dropout linear regulator sample is failed when the output voltage deviation rate of the low-voltage dropout linear regulator sample is above 10%; and the degradation test is terminated when the number of low-voltage dropout linear regulator samples that have failed accounts for more than 2 / 3 of the total number of low-voltage dropout linear regulator samples. A pseudo-failure calculation unit, used for calculating the pseudo-failure life under different stress levels based on the output voltage of the low-dropout linear regulator sample and the test parameters of the low-dropout linear regulator sample during the aging process by establishing a degradation model; The fitting calculation unit is used to fit the pseudo failure life under different stress levels and obtain the life distribution model for life prediction of low voltage drop linear regulator samples.

3. The low dropout linear regulator life assessment system according to claim 1 or 2, characterized in that: The test parameters required for the low-dropout linear regulator samples in the accelerated degradation test include: environmental thermal stress, electrical stress, vibration stress, test temperature, test time, test voltage and test current density.

4. The low dropout linear regulator life assessment system according to claim 2, characterized in that: The degradation model in the pseudo-failure calculation unit is the Arrhenius model, the Arrhenius model, the inverse power law model or the Eyring model.

5. The low dropout linear regulator life assessment system according to claim 1 or 2, characterized in that: The data processing module is used for monitoring the output voltage of the low voltage drop linear regulator sample continuously or at a set interval.

6. A method for evaluating the life of a low-dropout linear regulator, characterized in that: The following steps are involved: Step 1: setting test parameters required for the accelerated degradation test, performing the accelerated degradation test on the low-dropout linear regulator sample, and monitoring the output voltage of the low-dropout linear regulator sample during the aging process; Step 2: Based on the output voltage of the low-dropout linear regulator sample and the test parameters during the aging process, the pseudo-failure life under different stress levels is calculated through the degradation model, and then the corresponding life distribution model of the low-dropout linear regulator is obtained for life prediction.

7. The method for evaluating the life of a low-dropout linear regulator according to claim 6, characterized in that: Step 2 specifically includes the following steps: Step 2.1: Obtain the output voltage of the low-dropout linear regulator sample. When the output voltage deviation rate of the low-dropout linear regulator sample is above 10%, the low-dropout linear regulator sample is determined to be failed. When the number of failed low-dropout linear regulator samples in the low-dropout linear regulator sample accounts for more than 2 / 3 of the total number, the degradation test is terminated. Step 2.2: By establishing a degradation model, the pseudo failure life under different stress levels is calculated based on the output voltage of the low dropout linear regulator sample and the test parameters during the aging process; Step 2.3: Fit the pseudo-failure life under different stress levels to obtain a life distribution model for use in life prediction of low dropout linear regulator samples.

8. The method for evaluating the life of a low voltage dropout linear regulator according to claim 6 or 7, characterized in that: The test parameters required for the low-dropout linear regulator samples in the accelerated degradation test include: environmental thermal stress, electrical stress, vibration stress, test temperature, test time, test voltage and test current density.

9. The method for evaluating the life of a low-dropout linear regulator according to claim 7, characterized in that: The degradation model is an Arrhenius model, an Arrhenius model, an inverse power law model or an Eyring model.

10. The method for evaluating the life of a low-dropout linear regulator according to claim 6, characterized in that: In step 1, the output voltage of the low dropout linear regulator sample is monitored continuously or at a set interval.

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