A computer memory bar aging test device and method

Abstract

The application discloses a computer memory bank aging test device and method, and belongs to the memory bank test field. The computer memory bank aging test device comprises a test box, a box cover is installed on the top of the test box, an air inlet pipe is arranged on the test box, a filter screen is fixedly connected to the bottom of the outer side wall of the air inlet pipe and used for filtering dust in air, a zeolite ring is arranged on the air inlet pipe and used for absorbing moisture in air and heating air after absorbing water, and a heating net is arranged on the air inlet pipe. The application can uniformly and effectively heat the memory bank and the test board, ensures the uniformity of the temperature of all the memory bank and the test board, guarantees the accuracy of the aging test on the memory bank, prevents moisture in air from entering the test box and adhering to the connecting part of the memory bank and the slot, avoids the poor contact between the memory bank and the slot, protects the memory bank, guarantees the service life of the memory bank, and thus ensures the efficiency and quality of the aging test on the memory bank.

Description

Technical Field

[0001] This invention relates to the field of memory module testing technology, and in particular to a computer memory module aging test apparatus and method. Background Technology

[0002] Computer memory module aging tests can be conducted using the following methods: Memory stress testing: Using specialized memory testing software such as Memtest86+ and Prime95, the memory modules can be stress-tested. This software checks for potential memory problems by continuously reading and writing to the memory. Errors are monitored during the test. Memory stability testing: Using software such as OCCT and AIDA64, memory stability tests can be performed. These software programs test the memory for extended periods to check its ability to operate stably over long periods. Continuous read and write operations are performed during the test to verify memory stability. Temperature testing: High temperatures can affect memory modules, so aging tests can be conducted by increasing the ambient temperature. Temperature control devices, such as incubators or heaters, can be used to raise the ambient temperature to a certain level. Running the computer under these conditions and performing memory tests simulates the memory's operating state under high temperatures. Regardless of the testing method used, ensure that important data is backed up and follow the instructions of the testing software. Furthermore, aging tests place additional load on the memory and may generate higher temperatures; overheating should be avoided to prevent hardware damage.

[0003] Currently, when conducting high-temperature aging tests on memory modules, it is necessary to heat the working environment of the memory modules with hot air. However, during the hot air heating process, it is necessary to ensure the cleanliness of the air and eliminate moisture in the air. If the moisture content in the air is too high, it will cause moisture to enter the memory module and slot, resulting in poor contact between the memory module and the slot, which will damage the memory module, affect its lifespan, and cause unnecessary losses. Summary of the Invention

[0004] The purpose of this invention is to solve the problem of ensuring air cleanliness and eliminating moisture in the air in the prior art, and to propose a computer memory module aging test device and method.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] A computer memory module aging test device includes a test chamber, the top of which is fitted with a cover, and a test computer is mounted on the outer side wall of the cover.

[0007] An air intake pipe, wherein a filter screen is fixedly connected to the bottom of the outer side wall of the air intake pipe for filtering dust in the air;

[0008] The bottom of the air intake pipe is equipped with a drive motor via a motor mount. The output end of the drive motor is fixedly connected to a rotating shaft. A cleaning frame is fixedly connected to the outer wall of the rotating shaft for cleaning dust from the outer wall of the filter screen. Fan blades are fixedly connected to the outer wall of the rotating shaft for drawing outside air into the test chamber.

[0009] Zeolite rings are installed on the inner wall of the air intake pipe to absorb moisture in the air. After absorbing moisture, the zeolite rings heat the air. The zeolite rings divide the air intake pipe into upper and lower spaces, and absorb moisture in the air as it enters the upper space from the lower space.

[0010] A heating mesh is disposed between the zeolite ring and the fan blades, and the heating mesh is fixedly connected to the inner wall of the air intake pipe.

[0011] The inner wall of the slot is cleaned to ensure the stability of the connection between the memory module and the slot when it is inserted, prevent dust from causing electrostatic short circuits, and avoid affecting the lifespan of the memory module. Furthermore, if the operating temperature of the memory module when connected to the slot exceeds a threshold, it can be pushed out of the slot, thus providing good protection for the memory module and the device. Preferably, a test board is fixedly connected to the inner wall of the test box, a slot is fixedly connected to the top of the test board, a push plate is slidably connected to the inner wall of the slot, a push rod is fixedly connected to the bottom of the push plate, a telescopic spring is sleeved on the outer wall of the push rod, a connecting plate is fixedly connected to the bottom of the telescopic spring, air holes are opened on both sides of the push plate, a piston plate is fixedly connected to the top end of the connecting plate, a piston groove is slidably connected to the outer wall of the piston plate, a temperature-sensing airbag is fixedly connected to the bottom of the inner wall of the piston groove, and an air inlet is opened at the top of the piston groove.

[0012] In order to provide uniform heat to all test boards and memory modules, so that the temperature of the memory modules and test boards is the same or similar, thereby ensuring the accuracy of testing all memory modules, preferably, a rotating plate is fixedly connected to the top of the rotating shaft, a rotating rod is rotatably connected to the top end of the rotating plate away from the rotating shaft, an air blowing plate is slidably connected to the outer wall of the rotating rod, and a connecting pipe is fixedly connected to the bottom of the air blowing plate.

[0013] In order to scrape off the water filtered by the zeolite ring and ensure sufficient water absorption, a scraper guide plate is fixedly connected to the outer wall of the rotating shaft, a guide pipe is fixedly connected to the bottom of the scraper guide plate, and a water storage tank is fixedly connected to the bottom of the guide pipe.

[0014] In order to impact the absorbed water onto the filter screen and clean the filter screen, prevent the filter screen from clogging, and ensure air intake efficiency, thereby ensuring the heating efficiency of the memory module, the outer wall of the rotating shaft is provided with a reciprocating screw, the outer wall of the reciprocating screw is engaged with a lifting plate, the top of the lifting plate is fixedly connected with a connecting ring, and the outer wall of the lifting plate is slidably connected with a limit frame.

[0015] Furthermore, the outer wall of the air intake pipe is fixedly connected to the bottom of the test chamber, and the rotating shaft passes through the middle of the air intake pipe and is rotatably connected to the air intake pipe.

[0016] Furthermore, the top of the telescopic spring is fixedly connected to the bottom of the push plate, the bottom of the push rod is fixedly connected to the top of the connecting plate, the piston groove is opened in the test plate, and the top of the temperature-sensing airbag is fixedly connected to the piston plate.

[0017] Furthermore, the end of the air blowing plate is slidably connected to the inner wall of the test chamber, and the end of the connecting pipe away from the air blowing plate is fixedly connected to the top of the outer wall of the air inlet pipe.

[0018] Furthermore, the outer wall of the connecting ring is rotatably connected to the inner wall of the water storage tank, the top of the scraper plate is slidably connected to the bottom of the zeolite ring, the water storage tank is fixedly connected to the outer wall of the rotating shaft, the bottom of the limiting frame is fixedly connected to the bottom of the inner wall of the air inlet pipe, and the outer wall of the lifting plate is slidably connected to the inner wall of the filter screen.

[0019] A method for aging test of computer memory modules includes the following steps:

[0020] Step 1: Open the case and insert the memory module into the slot;

[0021] Step 2: Start the heating grid and drive motor to introduce hot air into the test chamber to heat up the memory modules;

[0022] Step 3: During the heating process, test the performance of the memory module using a test computer;

[0023] Step 4: After the test is complete, open the case and remove the memory stick.

[0024] Compared with the prior art, the present invention provides a computer memory module aging test device and method, which has the following beneficial effects:

[0025] 1. This computer memory module aging test device, when the drive motor operates and uses fan blades to draw outside air into the test chamber, uses a filter to filter dust from the air. At the same time, the drive motor causes the cleaning rack to rotate, causing the cleaning rack to rotate along the outer surface of the filter to clean the outer surface of the filter, preventing the filter from becoming clogged and affecting the air intake efficiency. Furthermore, the air entering the air intake pipe is blown onto the memory modules and test board by the air blowing pipe, providing uniform and effective heating to the memory modules and test board, ensuring the temperature uniformity of all memory modules and test board, thereby guaranteeing the accuracy of the aging test of the memory modules.

[0026] 2. This computer memory module aging test device, when the drive motor operates to draw outside air into the intake pipe, has zeolite rings absorbing moisture from the air. Since zeolite releases heat when it comes into contact with water, it provides initial heating of the air, thus improving heating efficiency. This also prevents moisture from entering the test chamber and adhering to the connection between the memory module and the slot, which could cause poor contact. This provides excellent protection for the memory module, ensuring its lifespan and guaranteeing the efficiency and quality of the memory module aging test.

[0027] 3. This computer memory module aging test device, when conducting temperature aging tests on memory modules, will cause the temperature-sensitive airbag to absorb the temperature of the memory module and slot when the temperature of the memory module and slot exceeds the threshold. This causes the temperature-sensitive airbag to expand, pushing the piston plate upward. Subsequently, through the connecting plate and connecting rod, the push plate is pushed upward, pushing the memory module out of the slot and cleaning and cooling the slot. This provides good protection for the memory module and prevents the memory module or slot from burning out due to high temperature during temperature aging tests, causing unnecessary trouble and losses.

[0028] The parts of this device not described herein are the same as or can be implemented using existing technologies. This invention can uniformly and effectively heat the memory modules and test board, ensuring the temperature uniformity of all memory modules and the test board, thereby guaranteeing the accuracy of aging tests on the memory modules. It also prevents moisture in the air from entering the test chamber and adhering to the connection between the memory modules and the slots, causing poor contact between the memory modules and the slots. This provides good protection for the memory modules, ensuring their lifespan, and thus ensuring the efficiency and quality of aging tests on the memory modules. Attached Figure Description

[0029] Figure 1 This is a three-dimensional partial cross-sectional view of a computer memory module aging test device proposed in this invention;

[0030] Figure 2This is a three-dimensional structural diagram of a computer memory module aging test device proposed in this invention;

[0031] Figure 3 This is a schematic diagram of the front-side cross-section of a computer memory module aging test device proposed in this invention;

[0032] Figure 4 This invention proposes a computer memory module aging test device. Figure 3 Enlarged structural diagram at point A in the middle;

[0033] Figure 5 This is a schematic diagram of the side-section of the computer memory module aging test device proposed in this invention.

[0034] Figure 6 This invention proposes a computer memory module aging test device. Figure 5 Enlarged structural diagram at point B;

[0035] Figure 7 This is a three-dimensional partial cross-sectional view of the air inlet pipe of a computer memory module aging test device proposed in this invention;

[0036] Figure 8 This is a schematic diagram of the expansion airbag structure of a computer memory module aging test device proposed in this invention;

[0037] Figure 9 This is a schematic diagram of the flow guide plate structure of a computer memory module aging test device proposed in this invention;

[0038] Figure 10 This is a schematic diagram of the turbulence groove structure of a computer memory module aging test device proposed in this invention;

[0039] Figure 11 This is a schematic diagram of the adjusting cylinder structure of a computer memory module aging test device proposed in this invention;

[0040] Figure 12 This is a schematic diagram of the counterweight sleeve structure of a computer memory module aging test device proposed in this invention;

[0041] Figure 13 This is a schematic diagram of the control cylinder structure of a computer memory module aging test device proposed in this invention.

[0042] In the diagram: 1. Test chamber; 2. Chamber lid; 3. Test plate; 4. Slot; 5. Push plate; 6. Push rod; 7. Telescopic spring; 8. Connecting plate; 9. Air blowing hole; 10. Piston plate; 11. Piston groove; 12. Temperature-sensing airbag; 13. Air inlet; 14. Test computer; 15. Air inlet pipe; 16. Filter screen; 17. Drive motor; 18. Rotating shaft; 19. Fan blade; 20. Heating grid; 21. Zeolite ring; 22. Rotating plate; 23. Rotating rod; 24. Air blowing plate; 25. Connecting pipe; 26. Scraper guide plate; 27. Conductor pipe; 28. Water tank; 29. ​​Connecting ring; 30. Lifting plate; 31. Limiting frame; 32. Cleaning frame; 33. 34. Reciprocating screw; 35. Sliding rod; 36. Hemispherical ball; 37. Return spring; 38. Piston assembly; 39. Intake port; 40. Intake pipe; 41. Inflation bladder; 42. First movable hose; 43. Second movable hose; 44. Pressure relief valve; 45. Nozzle; 46. Dust collection tank; 47. Guide plate; 48. Turbulence groove; 49. Turbulence shaft; 50. Adjusting cylinder; 51. Electromagnetic coil; 52. Adjusting ball; 53. Counterweight sleeve; 54. Adjusting spring; 55. First adjusting electrode contact; 56. Second adjusting electrode contact; 57. Control cylinder; 58. First control electrode contact; 59. Control tension spring; 50. Second control electrode contact. Detailed Implementation

[0043] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0044] In the description of this invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0045] Reference Figures 1-3 , Figure 5 A computer memory module aging test device includes a test box 1, a support leg installed at the bottom of the test box 1 to support the test box 1 away from the operating table, a box cover 2 installed at the top of the test box 1, and a test computer 14 installed on the outer side wall of the box cover 2.

[0046] Reference Figure 1 , Figures 3-5A test plate 3 is fixedly connected to the inner wall of the test chamber 1. A slot 4 is fixedly connected to the top of the test plate 3. A push plate 5 is slidably connected to the inner wall of the slot 4. A push rod 6 is fixedly connected to the bottom of the push plate 5. A telescopic spring 7 is sleeved on the outer wall of the push rod 6. The top of the telescopic spring 7 is fixedly connected to the bottom of the push plate 5. A connecting plate 8 is fixedly connected to the bottom of the telescopic spring 7. The bottom of the push rod 6 is fixedly connected to the top of the connecting plate 8. Air holes 9 are opened on both sides of the push plate 5. A piston plate 10 is fixedly connected to the top end of the connecting plate 8. A piston groove 11 is slidably connected to the outer wall of the piston plate 10. A temperature-sensing airbag 12 is fixedly connected to the bottom of the inner wall of the piston groove 11. The piston groove 11 is opened inside the test plate 3. The top of the temperature-sensing airbag 12 is fixedly connected to the piston plate 10. An air inlet 13 is opened at the top of the piston groove 11.

[0047] It should be noted that the test board 3 and slot 4 are evenly connected to the test computer 14, and the test computer 14 is equipped with memory module testing software for aging tests of memory modules under heating conditions. A one-way valve is installed in the piston plate 10 so that the air in the piston groove 11 can only be discharged through the piston plate 10. The piston plate 10, connecting plate 8, push rod 6, push plate 5 and air blowing hole 9 are connected. A one-way valve is installed in the air inlet 13 so that outside air can only enter the piston groove 11 through the air inlet 13.

[0048] Reference Figure 1 , Figure 3 , Figure 5 , Figure 7 An air intake pipe 15 is provided, with a filter screen 16 fixedly connected to the bottom of its outer wall for filtering dust from the air. The outer wall of the air intake pipe 15 is fixedly connected to the bottom of the test chamber 1. A drive motor 17 is mounted on the bottom of the air intake pipe 15 via a motor mount. A rotating shaft 18 is fixedly connected to the output end of the drive motor 17. The rotating shaft 18 passes through the middle of the air intake pipe 15 and is rotatably connected to the air intake pipe 15. A cleaning rack 32 is fixedly connected to the outer wall of the rotating shaft 18 for cleaning dust from the outer wall of the filter screen 16. A fan blade 19 is fixedly connected to the outer wall of the rotating shaft 18 for drawing outside air into the test chamber 1. A heating mesh 20 is provided between the zeolite ring 21 and the fan blade 19, and the heating mesh 20 is fixedly connected to the inner wall of the air intake pipe 15.

[0049] It should be noted that the cleaning rack 32 is attached to the filter screen 16, and the part of the cleaning rack 32 that is attached to the filter screen 16 is provided with bristles.

[0050] Reference Figure 1 , Figure 3 , Figure 5 , Figure 7A rotating plate 22 is fixedly connected to the top of the rotating shaft 18. A rotating rod 23 is rotatably connected to the top of the rotating plate 22 away from the rotating shaft 18. An air blowing plate 24 is slidably connected to the outer wall of the rotating rod 23. A connecting pipe 25 is fixedly connected to the bottom of the air blowing plate 24. The end of the air blowing plate 24 is slidably connected to the inner wall of the test chamber 1. The end of the connecting pipe 25 away from the air blowing plate 24 is fixedly connected to the top of the outer wall of the air inlet pipe 15.

[0051] It should be noted that the top of the air blowing plate 24 has an air blowing port for blowing air to heat the test board 3 and the memory module.

[0052] Reference Figure 1 , Figure 3 , Figures 5-7 Zeolite ring 21 is installed on the inner wall of intake pipe 15 to absorb moisture in the air. After absorbing moisture, the zeolite ring 21 heats the air. The zeolite ring 21 divides intake pipe 15 into upper and lower spaces. As air enters from the lower space, it absorbs moisture. A scraper guide plate 26 is fixedly connected to the outer wall of rotating shaft 18. The top of the scraper guide plate 26 is slidably connected to the bottom of zeolite ring 21. A guide pipe 27 is fixedly connected to the bottom of the scraper guide plate 26. A water tank 28 is fixedly connected to the outer wall of the rotating shaft 18. A reciprocating screw 33 is provided on the outer wall of the rotating shaft 18. A lifting plate 30 is engaged on the outer wall of the reciprocating screw 33. The outer wall of the lifting plate 30 is slidably connected to the inner wall of the filter screen 16. A connecting ring 29 is fixedly connected to the top of the lifting plate 30. The outer wall of the connecting ring 29 is rotatably connected to the inner wall of the water tank 28. A limit frame 31 is slidably connected to the outer wall of the lifting plate 30. The bottom of the limit frame 31 is fixedly connected to the bottom of the inner wall of the air inlet pipe 15.

[0053] It should be noted that a one-way valve is installed in the guide pipe 27, so that water can only be drawn into the water tank 28 through the guide pipe 27. A one-way valve is installed in the connecting ring 29, so that water in the water tank 28 can only be discharged through the connecting ring 29. The lifting plate 30 is connected to the connecting ring 29. At the same time, the outer wall of the lifting plate 30 has holes for drainage, and the size of the holes is smaller than the size of the holes in the filter screen 16.

[0054] In this invention, when in use, first open the cover 2 and insert the memory stick into the slot 4. When inserting, the push plate 5 slides down through the memory stick, and the connecting plate 8 moves down through the push rod 6. At this time, the connecting plate 8 will drive the piston plate 10 to slide down along the inner side wall of the piston groove 11, so that the temperature sensing airbag 12 is compressed. At the same time, the test computer 14 is started to perform an aging test on the memory stick using the test software.

[0055] Then, close the cover 2, start the drive motor 17 to rotate the shaft 18, which in turn drives the fan blades 19 to rotate. Simultaneously, activate the heating mesh 20, causing outside air to be drawn into the intake pipe 15 through the filter mesh 16 by the fan blades 19. The air entering the intake pipe 15 passes through the zeolite ring 21, which absorbs moisture from the air. This absorption of moisture causes the zeolite ring 21 to heat up, initially heating the air. The air then undergoes secondary heating through the heating mesh 20. The heated air is then transmitted through the connecting pipe 25 to the blowing plate 24 and blown out by the blowing plate 24. During this process, the rotation of the shaft 18... This will cause the rotating plate 22 to rotate, which in turn will cause the rotating rod 23 to rotate, so that the air blowing plate 24 slides along the inner side wall of the test box 1. The air blowing plate 24 blows air onto the test plate 3 and the memory module to heat them, simulating the ambient temperature to conduct an aging test on the memory module. This ensures the uniformity of temperature of all memory modules and the test plate 3, thereby ensuring the accuracy of the aging test on the memory module. It also prevents moisture in the air from entering the test box 1 and adhering to the connection between the memory module and the slot 4, causing poor contact between the memory module and the slot 4. This provides good protection for the memory module and ensures its service life, thereby ensuring the efficiency and quality of the aging test on the memory module.

[0056] Meanwhile, as the water absorbed by the zeolite ring 21 slowly extends out of the zeolite ring 21 and adheres to the bottom of the zeolite ring 21, the rotation of the rotating shaft 18 will cause the scraper 26 to scrape the water at the bottom of the zeolite ring 21 and guide it into the guide pipe 27, and then into the water storage tank 28. At the same time, due to the setting of the reciprocating screw 33, the lifting plate 30 will slide up and down in a cycle under the action of the limiting frame 31. During the up and down sliding of the lifting plate 30, the connecting ring 29 will slide up and down along the inner side wall of the water storage tank 28. When the lifting plate 30 slides upward, the connecting ring 29 will slide upward along the water storage tank 28, squeezing the water in the water storage tank 28 into the lifting plate 30 through the connecting ring 29. The lifting plate 30 sprays water onto the filter screen 16 to rinse the filter screen 16. At the same time, the cleaning frame 32 driven by the rotating shaft 18 will thoroughly clean the filter screen 16, improve the cleanliness of the filter screen 16, prevent the filter screen 16 from clogging, and affect the air intake efficiency.

[0057] During the temperature aging test of the memory module, when the temperature of the memory module and slot 4 exceeds the threshold, the temperature-sensitive airbag 12 will absorb the temperature of the memory module and slot 4, causing the temperature-sensitive airbag 12 to expand and push the piston plate 10 to slide upward. Then, through the connecting plate 8 and the push rod 6, the push plate 5 is pushed upward, pushing the memory module out of the slot 4 and cleaning and cooling the slot 4. This provides good protection for the memory module and prevents the memory module or slot 4 from burning out due to high temperature during the temperature aging test, causing unnecessary trouble and losses.

[0058] like Figure 1 , Figure 7 , Figure 8 A sliding rod 34 is slidably connected to the side wall of the intake pipe 15. A hemisphere 35 is fixedly connected to one end of the sliding rod 34 extending to the inner wall of the intake pipe 15. A return spring 36 is sleeved on the sliding rod 34. The return spring 36 is located between the inner wall of the intake pipe 15 and the hemisphere 35.

[0059] A piston assembly 37 is fixedly connected to the outer wall of the intake pipe 15. The sliding rod 34 extends to one end of the outer wall of the intake pipe 15 and is fixedly connected to the piston plate inside the piston assembly 37. An air intake port 38 is provided on the side wall of the intake pipe 15. The air intake port 38 is located below the zeolite ring 21. An air intake pipe 39 is connected between the piston cylinder on the piston assembly 37 and the air intake port 38.

[0060] An inflatable airbag 40 is fixedly connected to the outer wall of the air intake pipe 15. A first flexible hose 41 is connected between the inflatable airbag 40 and the piston cylinder on the piston assembly 37. A nozzle 44 is provided on the inner wall of the test chamber 1. A second flexible hose 42 is connected between the nozzle 44 and the inflatable airbag 40. A pressure relief valve 43 is installed on the second flexible hose 42.

[0061] Both the suction pipe 39 and the first movable hose 41 are equipped with one-way valves; the one-way valve on the suction pipe 39 allows gas to enter the piston cylinder of the piston assembly 37 only through the suction pipe 39; the one-way valve on the first movable hose 41 allows gas to enter the first movable hose 41 only through the piston cylinder of the piston assembly 37.

[0062] As the scraper plate 26 rotates periodically to scrape off the moisture adhering to the zeolite ring 21, when it rotates to the hemispherical 35, it pushes the sliding rod 34 to move, thereby driving the piston plate in the piston assembly 37 to move. Under the action of the return spring 36, it moves back and forth, drawing air from the bottom of the zeolite ring 21 into the expansion bladder 40 for storage through the suction pipe 39 and the first movable hose 41. Since the air humidity at the bottom of the zeolite ring 21 is relatively high, the air drawn in is also high humidity gas.

[0063] When the pressure inside the expansion bladder 40 reaches the value set by the pressure relief valve 43, the pressure relief valve 43 automatically opens, and the high-humidity airflow is sprayed out through the nozzle 44 and sprayed onto the computer memory module. It works in conjunction with the gas heated from the heating grid 20 to test the performance of the memory module in a high-temperature and high-humidity environment.

[0064] In other words, the rotating scraper 26 not only scrapes away the moisture from the zeolite ring 21, but also works in conjunction with the piston assembly 37 to test the performance under high temperature and high humidity conditions.

[0065] Furthermore, the absorption of moisture from the air not only enhances the heating effect of the heating grid 20, but also extracts moisture from the air, preparing for subsequent testing of performance under high temperature and high humidity conditions via the piston assembly 37.

[0066] At the same time, such as Figure 1 The test chamber 1 is equipped with a dust storage tank 45, which contains fine dust. The dust storage tank 45 is equipped with a filling port for easy dust filling. The dust storage tank 45 is located at the bottom of the second movable hose 42, and the top of the dust storage tank 45 is connected to the second movable hose 42.

[0067] When the high-humidity airflow passes through the second flexible hose 42, since the second flexible hose 42 is connected to the top of the dust storage tank 45, the gas velocity in the second flexible hose 42 is much higher than that in the dust storage tank 45. In fact, the gas in the dust storage tank 45 is in a static state. At this time, the flow velocity in the second flexible hose 42 is high, and the pressure will decrease, forming a negative pressure. Therefore, some dust in the dust storage tank 45 will enter the second flexible hose 42 and then be sprayed out from the nozzle 44 with the airflow, simulating the performance of memory modules under harsh conditions.

[0068] Under the action of the pressure relief valve 43, the second movable hose 42 periodically delivers gas. When no gas is delivered in the second movable hose 42, the pressure between the second movable hose 42 and the dust storage tank 45 will be the same. At this time, the dust in the dust storage tank 45 will be in a static state. Therefore, by placing the dust storage tank 45 below the second movable hose 42, when the nozzle 44 does not spray gas, the dust in the dust storage tank 45 will not enter the second movable hose 42, thus ensuring that the dust is as dry as possible.

[0069] like Figures 9-13 The inner wall of the test chamber 1 has a rotatable disturbance shaft 48, and a guide plate 46 is fixedly connected to the disturbance shaft 48. Both the top and the top of the guide plate 46 are provided with disturbance grooves 47.

[0070] At the air outlet of each nozzle 44, a guide vane 46 is provided, and when the guide vane 46 is in a horizontal state, it is exactly flush with the center of the nozzle 44.

[0071] One end of the disturbance shaft 48 is fixedly connected to an adjusting cylinder 49. Electromagnetic coils 50 are provided on both sides of the adjusting cylinder 49. An adjusting ball 51 is also provided inside the adjusting cylinder 49. A counterweight sleeve 52 slides inside both ends of the adjusting cylinder 49. An adjusting spring 53 is connected between the counterweight sleeve 52 and the adjusting cylinder 49. A second adjusting electrode contact 55 is provided on one side of the counterweight sleeve 52. A first adjusting electrode contact 54 is also provided on the inner wall of both ends of the adjusting cylinder 49. The first adjusting electrode contact 54 and the second adjusting electrode contact 55 on the same side can contact each other.

[0072] The adjusting ball 51 is a metal ball.

[0073] The bottom of the inflatable airbag 40 is connected to a control cylinder 56. A first control electrode contact 57 is slidably connected inside the control cylinder 56. A second control electrode contact 59 is provided at the bottom of the control cylinder 56. A control tension spring 58 is connected between the first control electrode contact 57 and the top of the control cylinder 56.

[0074] When the pressure inside the inflatable airbag 40 reaches a certain level, and the nozzle 44 sprays air, the airflow blows the corresponding guide plate 46. Simultaneously, under the pressure inside the inflatable airbag 40, the air pressure pushes the first control electrode contact 57 downwards, causing it to contact the second control electrode contact 59, thus activating the control circuit. At this time, as... Figure 11 When the electromagnetic coil 50 on the left side of the regulating cylinder 49 is energized, electromagnetic ejection is generated. Under the action of electromagnetic ejection force, the regulating ball 51 is ejected to the right and ejected to the right side of the regulating cylinder 49. At this time, under the action of gravity of the regulating ball 51, the right side of the regulating cylinder 49 tilts downward, the guide plate 46 rotates, and drives the side of the guide plate 46 near the nozzle 44 to move upward. At this time, under the action of the guide plate 46, most of the gas ejected from the nozzle 44 flows downward.

[0075] Meanwhile, when the adjusting ball 51 is ejected to the right side of the adjusting cylinder 49, it squeezes the counterweight sleeve 52 on the right side. The first adjusting electrode contact 54 on the same side contacts the second adjusting electrode contact 55 on the same side, and the electromagnetic control circuit is activated, causing the electromagnetic coil 50 on the left side to be in an open circuit state. Similarly, when the adjusting ball 51 is on the left side, the electromagnetic coil 50 on the right side is in an open circuit state. That is to say, due to the presence of the adjusting ball 51, each time the first control electrode contact 57 contacts the second control electrode contact 59, only one side of the electromagnetic coils 50 on both sides of the adjusting cylinder 49 will be energized, and it is the electromagnetic coil 50 on the same side as the adjusting ball 51 that is energized. In other words, the electromagnetic coils 50 on both sides will be alternately energized under the action of the adjusting ball 51, generating electromagnetic force. That is to say, when the inflating airbag 40 causes the nozzle 44 to spray air again, the adjusting ball 51 will be ejected to the left side of the adjusting cylinder 49. At this time, if Figure 11 The left side of the regulating cylinder 49 tilts downward, which causes the guide plate 46 to move downward on the side near the nozzle 44, and most of the gas ejected from the nozzle 44 flows upward.

[0076] Furthermore, each time the inflating airbag 40 causes the nozzle 44 to spray air, the airflow, under the action of the guide plate 46, sometimes flows upward and sometimes flows downward. Therefore, turbulence is formed inside the test chamber 1. Under the action of turbulence, the hot airflow, humid airflow, and airflow containing dust will be disturbed by the airflow and act on the computer memory stick from various aspects, thus avoiding long-term action in only one direction and ensuring comprehensiveness during the test.

[0077] In other words, the gas inside the inflatable airbag 40 can also simultaneously control the direction of the guide plate 46 through the regulating cylinder 49, thereby changing the airflow direction; and the regulating ball 51 not only controls the direction in which the regulating cylinder 49 tilts, but also automatically de-energizes the electromagnetic coil 50 on the other side, thereby preventing the electromagnetic coils 50 on both sides from being energized at the same time, which would create resistance to the ejection of the regulating ball 51.

[0078] like Figure 10 Each deflector plate 46 has a different shape of turbulence groove 47, some tilted to the left, some tilted to the right, some larger at the top and smaller at the bottom and tilted to one side, etc., so as to ensure that when the airflow passes over the surface of the deflector plate 46, it will be blown in different directions under the action of turbulence grooves 47 of different shapes, further achieving the turbulence effect.

[0079] Under the action of the control spring 58, the first control electrode contact 57 and the second control electrode contact 59 are in a separated state. They will only make contact when the pressure reaches the set value, and will separate again when the pressure drops.

[0080] Reference Figures 1-8 A method for aging test of computer memory modules includes the following steps:

[0081] Step 1: Open the case cover 2 and insert the memory stick into slot 4;

[0082] When in use, first open the case cover 2 and insert the memory stick into the slot 4. When inserting, the push plate 5 slides down through the memory stick and the connecting plate 8 moves down through the push rod 6. At this time, the connecting plate 8 will drive the piston plate 10 to slide down along the inner wall of the piston groove 11, so that the temperature sensing airbag 12 is compressed. At the same time, the test computer 14 is started to perform an aging test on the memory stick using the test software.

[0083] Step 2: Start the heating grid 20 and drive motor 17 to introduce hot air into the test chamber 1 to heat the memory module;

[0084] Close the cover 2, start the drive motor 17 to rotate the shaft 18, which in turn drives the fan blades 19 to rotate. Simultaneously, activate the heating mesh 20, drawing outside air through the filter mesh 16 into the intake pipe 15 under the action of the fan blades 19. The air entering the intake pipe 15 passes through the zeolite ring 21, which absorbs moisture from the air. This absorption of moisture causes the zeolite ring 21 to heat up, initially heating the air. The air then undergoes secondary heating through the heating mesh 20. The heated air is then transmitted through the connecting pipe 25 to the blowing plate 24 and blown out. During this process, the rotation of the shaft 18... The rotating plate 22 is driven to rotate, which in turn drives the rotating rod 23 to rotate, causing the air blowing plate 24 to slide along the inner wall of the test chamber 1. The air blowing plate 24 blows air onto the test board 3 and the memory module to heat them, simulating the ambient temperature to perform an aging test on the memory module. This ensures the uniformity of temperature for all memory modules and the test board 3, thereby guaranteeing the accuracy of the aging test on the memory module. It also prevents moisture in the air from entering the test chamber 1 and adhering to the connection between the memory module and the slot 4, which could cause poor contact between the memory module and the slot 4. This provides good protection for the memory module and ensures its lifespan, thus ensuring the efficiency and quality of the aging test on the memory module.

[0085] Meanwhile, as the water absorbed by the zeolite ring 21 slowly extends out of the zeolite ring 21 and adheres to the bottom of the zeolite ring 21, the rotation of the rotating shaft 18 will cause the scraper 26 to scrape the water at the bottom of the zeolite ring 21 and guide it into the guide pipe 27, and then into the water storage tank 28. At the same time, due to the setting of the reciprocating screw 33, the lifting plate 30 will slide up and down in a cycle under the action of the limiting frame 31. During the up and down sliding of the lifting plate 30, the connecting ring 29 will slide up and down along the inner side wall of the water storage tank 28. When the lifting plate 30 slides upward, the connecting ring 29 will slide upward along the water storage tank 28, squeezing the water in the water storage tank 28 into the lifting plate 30 through the connecting ring 29. The lifting plate 30 sprays water onto the filter screen 16 to rinse the filter screen 16. At the same time, the cleaning frame 32 driven by the rotating shaft 18 will thoroughly clean the filter screen 16, improve the cleanliness of the filter screen 16, prevent the filter screen 16 from clogging, and affect the air intake efficiency.

[0086] When the temperature of the memory module and slot 4 exceeds the threshold during the temperature aging test, the temperature-sensitive airbag 12 will absorb the temperature of the memory module and slot 4, causing the temperature-sensitive airbag 12 to expand and push the piston plate 10 to slide upward. Then, through the connecting plate 8 and the push rod 6, the push plate 5 is pushed upward, pushing the memory module out of the slot 4 and cleaning and cooling the slot 4. This provides good protection for the memory module and prevents the memory module or slot 4 from burning out due to high temperature during the temperature aging test, causing unnecessary trouble and losses.

[0087] Step 3: During the heating process, test the performance of the memory modules using computer tester 14;

[0088] Step 4: After the test is completed, open the case 2 and take out the memory stick.

[0089] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A computer memory module aging test device, comprising a test chamber (1), characterized in that, The test box (1) is equipped with a box cover (2) on the top, and a test computer (14) is installed on the outer side wall of the box cover (2). Also includes: An air intake pipe (15) is provided with a filter screen (16) fixedly connected to the bottom of its outer side wall for filtering dust in the air. The bottom of the air intake pipe (15) is equipped with a drive motor (17) via a motor mount. The output end of the drive motor (17) is fixedly connected to a rotating shaft (18). A cleaning rack (32) is fixedly connected to the outer wall of the rotating shaft (18) for cleaning the dust on the outer wall of the filter screen (16). A fan blade (19) is fixedly connected to the outer wall of the rotating shaft (18) for drawing outside air into the test chamber (1). Zeolite ring (21), the zeolite ring (21) is installed on the inner wall of the air inlet pipe (15) to absorb moisture in the air, and the zeolite ring (21) heats the air after absorbing water. The zeolite ring (21) divides the air inlet pipe (15) into upper and lower spaces, and absorbs moisture in the air as the air enters the upper space from the lower space. Heating mesh (20) is disposed between zeolite ring (21) and fan blade (19), and heating mesh (20) is fixedly connected to the inner wall of air inlet pipe (15).

2. The computer memory module aging test device according to claim 1, characterized in that, The inner wall of the test box (1) is fixedly connected to a test plate (3), the top of the test plate (3) is fixedly connected to a slot (4), the inner wall of the slot (4) is slidably connected to a push plate (5), the bottom of the push plate (5) is fixedly connected to a push rod (6), the outer wall of the push rod (6) is fitted with a telescopic spring (7), the bottom of the telescopic spring (7) is fixedly connected to a connecting plate (8), the two sides of the push plate (5) are provided with air holes (9), the top end of the connecting plate (8) is fixedly connected to a piston plate (10), the outer wall of the piston plate (10) is slidably connected to a piston groove (11), the bottom of the inner wall of the piston groove (11) is fixedly connected to a temperature-sensing airbag (12), and the top of the piston groove (11) is provided with an air inlet (13).

3. The computer memory module aging test device according to claim 1, characterized in that, A rotating plate (22) is fixedly connected to the top of the rotating shaft (18). A rotating rod (23) is rotatably connected to the top of the rotating plate (22) away from the rotating shaft (18). An air blowing plate (24) is slidably connected to the outer wall of the rotating rod (23). A connecting pipe (25) is fixedly connected to the bottom of the air blowing plate (24).

4. The computer memory module aging test device according to claim 1, characterized in that, A scraper guide plate (26) is fixedly connected to the outer wall of the rotating shaft (18), a guide pipe (27) is fixedly connected to the bottom of the scraper guide plate (26), and a water storage tank (28) is fixedly connected to the bottom of the guide pipe (27).

5. The computer memory module aging test device according to claim 4, characterized in that, The outer side wall of the rotating shaft (18) is provided with a reciprocating screw (33), the outer side wall of the reciprocating screw (33) is engaged with a lifting plate (30), the top of the lifting plate (30) is fixedly connected with a connecting ring (29), and the outer side wall of the lifting plate (30) is slidably connected with a limit frame (31).

6. The computer memory module aging test device according to claim 1, characterized in that, The outer wall of the air inlet pipe (15) is fixedly connected to the bottom of the test box (1), and the rotating shaft (18) passes through the middle of the air inlet pipe (15) and is rotatably connected to the air inlet pipe (15).

7. The computer memory module aging test device according to claim 2, characterized in that, The top of the telescopic spring (7) is fixedly connected to the bottom of the push plate (5), the bottom of the push rod (6) is fixedly connected to the top of the connecting plate (8), the piston groove (11) is opened in the test plate (3), and the top of the temperature-sensing airbag (12) is fixedly connected to the piston plate (10).

8. The computer memory module aging test device according to claim 3, characterized in that, The end of the air blowing plate (24) is slidably connected to the inner wall of the test chamber (1), and the end of the connecting pipe (25) away from the air blowing plate (24) is fixedly connected to the top of the outer wall of the air inlet pipe (15).

9. The computer memory module aging test device according to claim 5, characterized in that, The outer wall of the connecting ring (29) is rotatably connected to the inner wall of the water tank (28), the top of the scraper (26) is slidably connected to the bottom of the zeolite ring (21), the water tank (28) is fixedly connected to the outer wall of the rotating shaft (18), the bottom of the limiting frame (31) is fixedly connected to the bottom of the inner wall of the air inlet pipe (15), and the outer wall of the lifting plate (30) is slidably connected to the inner wall of the filter screen (16).

10. A method for aging test of computer memory modules, using the computer memory module aging test apparatus according to any one of claims 1-5, characterized in that, Includes the following steps: Step 1: Open the case cover (2) and insert the memory stick into the slot (4); Step 2: Start the heating grid (20) and drive motor (17) to introduce hot air into the test chamber (1) to heat up the memory module; Step 3: During the heating process, the performance of the memory module is tested using a test computer (14); Step 4: After the test is completed, open the case (2) and take out the memory stick.

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