Integrated circuit inspection method and device, electronic equipment and storage medium
Through the automated integrated circuit quality detection method, the detection is performed using attribute files and preset inspection project scripts, the problem of inefficiency of existing detection methods is solved, and more efficient detection processes and results are realized.
Patent Information
- Application Number
- CN202311361901.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-10-19
- Publication Date
- 2025-04-22
AI Technical Summary
The existing integrated circuit quality inspection methods take up a lot of time for engineers, resulting in inefficient inspections.
It provides an integrated circuit inspection method, which automatically detects the integrated circuit by obtaining the attribute files of the integrated circuit to be detected and preset inspection project scripts, including basic inspection items and user-defined inspection items, and generates a visual web report.
It reduces the time for engineers to manually check, improves inspection efficiency, reduces time cost, and facilitates users to view inspection results through web reports.
Smart Images
Figure CN119862824A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of computers, and in particular to an integrated circuit inspection method, device, electronic device and storage medium. Background Art
[0002] As the scale of integrated circuits becomes larger and larger, a chip is divided into more and more sub-modules. Usually, the sub-modules are checked for quality using the attribute files of the sub-modules. For example, the attribute files may include a netlist file. A netlist file is a file used to describe the connection relationship between circuit elements in circuit design. Generally, it is a text file that follows a relatively simple tag syntax. Since the netlist file of each sub-module involves data from many aspects of the sub-module, when the sub-modules are checked for quality based on the netlist file, the same netlist file will involve quality checks from many aspects.
[0003] Existing EDA tools provide some basic inspection items for attribute files, but the basic inspection items provided by existing EDA tools cannot meet actual needs. Therefore, engineers usually need to conduct further quality inspections on submodules based on attribute files according to their own experience. A large number of quality inspections will take up a lot of time for engineers, resulting in low inspection efficiency. Summary of the invention
[0004] The present application provides an integrated circuit inspection method, device, electronic device and storage medium to solve the problem that existing quality inspection methods take up a lot of engineers' time and result in low inspection efficiency.
[0005] In a first aspect, the present application provides an integrated circuit inspection method, comprising: obtaining a property file of an integrated circuit to be inspected, obtaining all inspection scripts corresponding to a preset first category inspection item and a preset second category inspection item, wherein the first category inspection item is at least one preset basic inspection item, and the second category inspection item is at least one user-defined inspection item; based on all the obtained inspection scripts, the property files are inspected separately to obtain inspection results corresponding to each inspection item.
[0006] In the embodiment of the present application, in addition to the basic inspection items, the attribute files of the integrated circuit to be inspected can also be inspected according to the user-defined inspection items, without the need for manual inspection by engineers, which reduces the workload of engineers, thereby reducing the time occupied by engineers, reducing time costs, and improving inspection efficiency.
[0007] In combination with the technical solution provided in the first aspect above, in some possible implementations, after obtaining the inspection result corresponding to each inspection item, the method further includes: generating a web page report for all the inspection results.
[0008] In the embodiment of the present application, the inspection results are converted into a visual web page report, thereby facilitating viewing of problems existing in the integrated circuit to be inspected.
[0009] In combination with the technical solution provided in the first aspect above, in some possible implementations, for all the inspection results, a web page report is generated for all the inspection results, including: determining the inspection results to be marked that meet the preset marking conditions among the inspection results corresponding to each inspection item; marking the content corresponding to the inspection results to be marked in the generated web page report to obtain the web page report.
[0010] In the embodiment of the present application, by presetting marking conditions, the content in the web page report that meets the preset marking conditions can be marked, so that the content that needs to be focused on can be marked, making it easier for users to view the web page report.
[0011] In combination with the technical solution provided in the first aspect above, in some possible implementations, the web report includes the risk level of the inspection item, the name of the inspection item, the number of abnormalities in the inspection item, and the unit of the number of abnormalities in the inspection item.
[0012] In an embodiment of the present application, by using data in four dimensions, namely, the risk level of the inspection item, the name of the inspection item, the number of abnormalities in the inspection item, and the unit of the number of abnormalities in the inspection item, the distribution of problems existing in the integrated circuit to be inspected can be intuitively reflected, thereby facilitating users to analyze the problems existing in the integrated circuit to be inspected.
[0013] In combination with the technical solution provided in the first aspect above, in some possible implementations, the web page report includes the names of the inspection items, and the method also includes: in response to the operation of selecting the name of any inspection item in the web page report, displaying a detailed inspection report corresponding to the inspection item, and the detailed inspection report includes all the contents of the inspection results corresponding to the inspection item.
[0014] In combination with the technical solution provided in the first aspect above, in some possible implementations, after obtaining the attribute file of the integrated circuit to be inspected, the method also includes: extracting the target data in the attribute file, the target data being a set of data required for inspection by all inspection scripts; storing the target data in a specified variable structure to obtain a target variable structure; accordingly, based on all the inspection scripts obtained, the attribute file is inspected separately to obtain the inspection result corresponding to each inspection item, including: based on all the inspection scripts obtained, respectively obtaining and inspecting the corresponding data to be inspected from the target variable structure to obtain the inspection result corresponding to each inspection item, wherein the data to be inspected corresponding to each inspection script is the data inspected by the inspection script.
[0015] In an embodiment of the present application, by converting the target data in the property file into a target variable structure, when the inspection script is subsequently used for inspection, the data to be inspected can be directly obtained from the target variable structure without traversing the entire property file multiple times, thereby reducing the time for obtaining the data to be inspected, thereby improving the efficiency of the inspection.
[0016] In combination with the technical solution provided in the first aspect above, in some possible implementations, the property file includes a netlist file and a constraint file.
[0017] In combination with the technical solution provided in the first aspect above, in some possible implementations, the inspection result corresponding to each of the inspection items includes risk level, whether there is a violation, the number of violations, and information about the circuit where the problem occurs.
[0018] In combination with the technical solution provided in the first aspect above, in some possible implementations, before obtaining all inspection scripts corresponding to preset second-category inspection items, the method also includes: obtaining configuration information of specified inspection items, the configuration information including inspection thresholds of specified information; filling the inspection thresholds of the specified information into preset script templates to obtain inspection scripts corresponding to the specified inspection items, and the second-category inspection items include the specified inspection items.
[0019] In the embodiment of the present application, by filling the inspection threshold of the specified information into the preset script template, the corresponding inspection script can be obtained to realize the inspection of the specified information, so that the present solution can be applied to more scenarios and the applicability of the present solution is improved.
[0020] In combination with the technical solution provided in the first aspect above, in some possible implementations, the configuration information also includes the risk level of the specified information and whether the specified information is presented in the inspection results; filling the inspection threshold of the specified information into a preset script template includes: filling the risk level of the specified information, the inspection threshold of the specified information, and whether the specified information is presented in the inspection results into the preset script template to obtain the inspection script corresponding to the specified inspection item.
[0021] In a second aspect, the present application provides an integrated circuit inspection device, comprising: an acquisition module and a processing module; the acquisition module is used to obtain the attribute file of the integrated circuit to be inspected; the acquisition module is also used to obtain all inspection scripts corresponding to the preset first category inspection items and the preset second category inspection items, wherein the first category inspection items are at least one preset basic inspection item, and the second category inspection items are at least one user-defined inspection item; the processing module is used to inspect the attribute files separately based on all the acquired inspection scripts to obtain the inspection results corresponding to each inspection item.
[0022] In a third aspect, the present application provides an electronic device, comprising: a memory and a processor, the memory and the processor being connected; the memory being used to store programs; the processor being used to call the programs stored in the memory to execute the integrated circuit inspection method provided in the first aspect above and / or in combination with any possible implementation of the first aspect above.
[0023] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a computer, the integrated circuit inspection method provided in the first aspect above and / or in combination with any possible implementation of the first aspect above is executed. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.
[0025] Figure 1 A schematic diagram of a flow chart of an integrated circuit inspection method shown in an embodiment of the present application;
[0026] Figure 2 A schematic diagram of a web page report shown in an embodiment of the present application;
[0027] Figure 3A structural block diagram of an integrated circuit inspection device shown in an embodiment of the present application;
[0028] Figure 4 A structural block diagram of an electronic device shown in an embodiment of the present application. DETAILED DESCRIPTION
[0029] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.
[0030] It should be noted that similar numbers and letters represent similar items in the following figures, so once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. At the same time, in the description of this application, relational terms such as "first", "second", etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.
[0031] The technical solution of the present application will be described in detail below with reference to the accompanying drawings.
[0032] See also Figure 1 , Figure 1 This is an integrated circuit inspection method shown in the embodiment of the present application. Figure 1 Describe the steps it involves.
[0033] S100: Obtaining a property file of the integrated circuit to be detected.
[0034] The property file of the integrated circuit to be detected can be obtained in advance and stored in a storage medium, and can be directly called when needed. Alternatively, the property file of the integrated circuit to be detected can also be obtained from a third-party device in real time when needed.
[0035] In one implementation, the property file may include at least one of a netlist file and a constraint file (SDC, Synopsys Design Constraint) of the integrated circuit to be tested. For example, the property file may include both the netlist file and the constraint file, or the property file only includes the netlist file, or the property file only includes the constraint file.
[0036] Among them, the constraint file is used to describe the constraints on the timing, area, power consumption and other aspects of the integrated circuit, which determines whether the chip meets the design requirements.
[0037] S200: Obtain all inspection scripts corresponding to the preset first-category inspection items and the preset second-category inspection items.
[0038] Among them, the first category of inspection items is at least one preset basic inspection item, and the second category of inspection items is at least one inspection item customized by the user.
[0039] Optionally, the second category of inspection items may be special inspection items determined by the user according to the type of the integrated circuit to be inspected.
[0040] It is understandable that the above-mentioned check script can process the property file in two different dimensions. On the one hand, the check script can check whether there are any abnormalities in the property file. The risk level can also be divided according to the severity of the abnormality. On the other hand, the check script can count the key information in the property file, for example, the number of memories in the netlist file, the proportion of different types of cells, the clock information in the constraint file, etc.
[0041] Among them, all inspection scripts corresponding to the first type of inspection items can be pre-acquired and stored in a storage medium, and can be directly called when needed. Alternatively, all inspection scripts corresponding to the first type of inspection items can also be obtained from a third-party device in real time when needed.
[0042] Similarly, all inspection scripts corresponding to the second type of inspection items can be pre-acquired and stored in a storage medium, and can be directly called when needed. Alternatively, all inspection scripts corresponding to the second type of inspection items can also be acquired from a third-party device in real time when needed.
[0043] In one implementation, the second type of inspection script may be obtained by first obtaining configuration information of the specified inspection item before obtaining all inspection scripts corresponding to the preset second type of inspection items, the configuration information including the inspection threshold of the specified information. Then, the inspection threshold of the specified information is filled into the preset script template to obtain the inspection script corresponding to the specified inspection item, and the second type of inspection items include the specified inspection items.
[0044] The configuration information of the designated inspection item may be obtained from other devices, or may be input by a user or staff. The inspection threshold is the range of the designated information value when the designated information is normal.
[0045] For ease of understanding, the designated information is the resistance ratio, and the inspection threshold of the designated information is 10% to 20%. Then, the resistance ratio of 10% to 20% is filled into the preset script template to obtain an inspection script for inspecting the resistance ratio.
[0046] When the inspection script is used for inspection, it can be considered that the resistance ratio is within the range of 10% to 20% and has passed the inspection, or it can be considered that the resistance ratio is within the range of 10% to 20% and has not passed the inspection. The specific implementation method can be set when setting the preset script template.
[0047] The examples given here are only for ease of understanding and should not be construed as limiting the present application.
[0048] Optionally, the configuration information may further include at least one of the risk level of the specified information and whether the specified information is presented in the inspection result. That is, the configuration information may include the risk level of the specified information and the inspection threshold of the specified information; or the configuration information may include whether the specified information is presented in the inspection result and the inspection threshold of the specified information; or the configuration information may include the risk level of the specified information, whether the specified information is presented in the inspection result and the inspection threshold of the specified information.
[0049] For ease of understanding, the configuration information also includes the risk level of the specified information and whether the specified information is presented in the inspection result. Correspondingly, the specific process of filling the inspection threshold of the specified information into the preset script template can be: fill the risk level of the specified information, the inspection threshold of the specified information, and whether the specified information is presented in the inspection result into the preset script template to obtain the inspection script corresponding to the specified inspection item.
[0050] Among them, the specific classification of the risk level of the specified information can be set according to actual needs. For example, three levels of information, error, and warning can be set. The examples here are only for ease of understanding and should not be regarded as limitations on this application.
[0051] For ease of understanding, the designated information is the resistance ratio, the inspection threshold of the designated information is 10% to 20%, the risk level of the designated information is error, and the designated information is in the inspection result. Then, the resistance ratio of 10% to 20%, the risk level is error, and the designated information is filled in the preset script template in the inspection result to obtain an inspection script for checking the resistance ratio.
[0052] Among them, in the inspection result obtained by using the inspection script, the risk level of the inspection will be error, and the specified information will be displayed in the inspection result.
[0053] The examples given here are only for ease of understanding and should not be construed as limiting the present application.
[0054] In order to improve the inspection efficiency, in one implementation mode, after obtaining the property file of the integrated circuit to be inspected, the target data in the property file can also be extracted, where the target data is a collection of data required for inspection by all inspection scripts; the target data is then stored in a specified variable structure to obtain a target variable structure.
[0055] Correspondingly, the property files are checked separately based on all the obtained inspection scripts, and the specific method for obtaining the inspection results corresponding to each inspection item can be: based on all the obtained inspection scripts, the corresponding data to be checked are obtained from the target variable structure and checked respectively, to obtain the inspection results corresponding to each inspection item, wherein the data to be checked corresponding to each inspection script is the data checked by the inspection script.
[0056] By converting the target data in the property file into a target variable structure, the data to be checked can be directly obtained from the target variable structure when the inspection script is used for subsequent inspection. There is no need to traverse the entire property file multiple times, which reduces the time to obtain the data to be checked and thus improves the efficiency of the inspection.
[0057] Optionally, the specified variable structure can be set according to actual needs. For example, when using the EDA tool PrimeTime, the specified variable structure can be a variable structure supported by Prime Time. The examples here are only for ease of understanding and should not be used as a limitation to this application.
[0058] S300: Check the property files respectively based on all the obtained inspection scripts to obtain the inspection result corresponding to each inspection item.
[0059] Optionally, the property files are checked separately based on all the obtained check scripts. In addition to checking the anomalies in the property files, the property information in the property files can also be checked and counted.
[0060] For example, the function of the check script may be to count the number of memories in the attribute file, and the check result corresponding to the check script is the number of memories. The examples here are only for ease of understanding and should not be used as a limitation to the present application.
[0061] In one implementation mode, the inspection result corresponding to each inspection item includes risk level, whether there is a violation, the number of violations, and information about the circuit where the problem occurs.
[0062] The risk level indicates the severity of the harm caused by problems with the inspection item. Whether there is a violation indicates whether there is a situation that cannot pass the inspection of the inspection item. The number of violations indicates the number of situations that cannot pass the inspection item. The circuit information with problems indicates the circuit information that cannot pass the inspection of the inspection item.
[0063] Optionally, the risk level of the inspection result corresponding to the inspection script for inspecting and counting the attribute information in the attribute file can be set to indicate harmlessness. For example, it can be Information, that is, the inspection result with a risk level of Information is harmless. The examples here are only for the convenience of explanation and should not be used as a limitation to this application.
[0064] Optionally, the inspection result corresponding to each inspection item may also include at least one of an inspection command, an inspection script, and an exemption mechanism.
[0065] Among them, the inspection script represents the inspection script corresponding to the inspection item.
[0066] The exemption mechanism represents the conditions that can be considered to have passed the inspection of the inspection item in the problems detected by the inspection item. For example, if a problem is found in circuit element 1 during the inspection of inspection item A, but circuit element 1 satisfies the exemption mechanism, it is confirmed that circuit element 1 has passed the inspection of inspection item A. The examples here are only for ease of understanding and should not be used as limitations on this application.
[0067] In order to facilitate users to view the inspection results, in one implementation, after obtaining the inspection results corresponding to each inspection item, a web page report can be generated for all inspection results. By converting the inspection results into a visual web page report, it is convenient to view the problems existing in the integrated circuit to be inspected.
[0068] The web page report may be, for example, a file in HTML (Hyper Text Markup Language) format, or other visualized files in addition to HTML format files.
[0069] When the web page report is a file in HTML format, the inspection results can be written in TCL (Tool Command Language) to obtain a web page report in HTML format. Since TCL is not a high-level language and does not need to be compiled in advance like C language, this solution does not require additional calls and conversions, and all processes do not require the creation of a separate compilation environment.
[0070] Optionally, before generating the web report, all inspection results may be filtered out for inspection items that do not have problems, that is, they are not displayed in the web report, thereby reducing the amount of data that needs to be displayed and reducing the time it takes for users to view the web report.
[0071] In one implementation, in the process of generating a web page report for all inspection results, the inspection results to be marked that meet the preset marking conditions in the inspection results corresponding to each inspection item can also be determined. The content corresponding to the inspection results to be marked is marked in the generated web page report to obtain a web page report.
[0072] The preset marking condition can be set according to actual needs, for example, it can be a condition that the content that needs to be paid special attention to satisfies, for example, it can be a risk level higher than a preset level. The examples here are only for ease of understanding and should not be used as a limitation to this application.
[0073] Optionally, the method of marking the content corresponding to the inspection result to be marked in the generated web page report may be to set the content corresponding to the inspection result to be marked in the web page report to be highlighted or highlighted in color. Alternatively, it is also possible to add a symbol to the content corresponding to the inspection result to be marked in the web page report, wherein the position of the symbol can be set according to actual needs, for example, it can be set in front of the corresponding content, or it can also be set in the back. The examples here are only for ease of understanding and should not be used as limitations on this application.
[0074] Therein, the preset marking conditions may include multiple ones, and correspondingly, the marking methods corresponding to different marking conditions may also be different.
[0075] For example, if the preset marking conditions include marking condition 1, marking condition 2, and marking condition 3, the marking method corresponding to marking condition 1 is to set the corresponding content in the web page report to be highlighted, the marking method corresponding to marking condition 2 is to add symbol 1 directly in front of the corresponding content in the web page report, and the marking method corresponding to marking condition 3 is to add symbol 2 directly behind the corresponding content in the web page report. The examples here are only for ease of understanding and should not be used as a limitation to this application.
[0076] In one implementation, the web page report includes the risk level of the inspection item, the name of the inspection item, the number of abnormalities in the inspection item, and the unit of the number of abnormalities in the inspection item.
[0077] The number of inspection items with abnormalities is the numerical value of the inspection items with problems, and the unit of the number of inspection items with abnormalities is the unit of the numerical value of the number of inspection items with abnormalities.
[0078] The unit of the number of inspection items with abnormalities can be pieces, in which case the numerical value of the number of inspection items with abnormalities indicates the number of inspection items with problems. The unit of the number of inspection items with abnormalities can be %, in which case the numerical value of the number of inspection items with abnormalities indicates the percentage of inspection items with problems. The examples here are only for ease of understanding, and the specific implementation methods of the unit of the number of inspection items with abnormalities and the number of inspection items with abnormalities include but are not limited to the above examples.
[0079] For ease of understanding, please refer to one implementation of the web page report. Figure 2 , Figure 2 From left to right, the risk levels of the inspection items are as follows: Figure 2 Type item shown), the name of the inspection item ( Figure 2 Check Items shown), the number of abnormalities in the check items ( Figure 2 Result items shown), the quantity unit where the inspection item has abnormality ( Figure 2 Unit item shown). Figure 2 The web page report shown is only one implementation of the web page report provided by this application and should not be regarded as a limitation to this application.
[0080] in, Figure 2 The risk level of the inspection item "DESIGN.CELL.DONT_USE:BY_LIST" is Warning, and the number of exceptions is 84619. Figure 2 The risk level corresponding to the inspection item "DESIGN.CELL.LOWVT.PERCENTAGE.LVT" is Information, and the number of occurrences is 18%. Figure 2 The risk level of the check item "DESIGN.CELL.LOCKUP.CONNECTIVITY.ISSUE.NUM" is Error, and the number of exceptions is 0.
[0081] In one implementation, the web report includes the name of the inspection item. In order to facilitate viewing of the detailed inspection results of each inspection item, the detailed inspection report corresponding to the inspection item can be displayed in response to the operation of selecting the name of any inspection item in the web report. The detailed inspection report includes all the contents of the inspection results corresponding to the inspection item.
[0082] Among them, the name of each inspection item in the web report can be associated with its corresponding inspection result. After the name of the inspection item is selected, it can jump to the corresponding inspection result display interface; or, after the name of the inspection item is selected, a pop-up window of the corresponding inspection result is displayed.
[0083] The pop-up window showing the inspection result and the inspection result display interface are both display pages obtained after visualizing the inspection result. The method of visualizing is the same as the method of generating the web page report mentioned above, and will not be described here for the sake of simplicity.
[0084] Optionally, when the web report also includes other data in addition to the name of the inspection item, for example, the web report also includes at least one of the following data: the risk level of the inspection item, the number of inspection items with abnormalities, and the quantity unit of inspection items with abnormalities, when the risk level of the inspection item\the number of inspection items with abnormalities\the quantity unit of inspection items with abnormalities corresponding to an inspection item are selected, you can jump to the inspection result display interface of the corresponding inspection item; or, display the inspection result of the corresponding inspection item in a pop-up window.
[0085] Optionally, in the web report, for each inspection item, a control corresponding to the inspection item may be set. When the control is selected, the user may be redirected to the corresponding inspection result display interface; or, after the name of the inspection item is selected, a pop-up window displaying the corresponding inspection result may be displayed.
[0086] Based on the same inventive concept, the present application also provides an integrated circuit inspection device, such as Figure 3 As shown, the integrated circuit inspection device 100 includes an acquisition module 110 and a processing module 120 .
[0087] The acquisition module 110 is used to acquire the property file of the integrated circuit to be detected.
[0088] The acquisition module 110 is also used to obtain all inspection scripts corresponding to the preset first category inspection items and the preset second category inspection items, wherein the first category inspection items are at least one preset basic inspection item, and the second category inspection items are at least one user-defined inspection item.
[0089] The processing module 120 is used to check the attribute files respectively based on all the obtained inspection scripts to obtain the inspection result corresponding to each inspection item.
[0090] After obtaining the inspection result corresponding to each inspection item, the processing module 120 is further used to generate a web page report for all the inspection results.
[0091] The processing module 120 is specifically used to determine the inspection results to be marked that meet the preset marking conditions in the inspection results corresponding to each inspection item; mark the content corresponding to the inspection results to be marked in the generated web page report to obtain the web page report.
[0092] In one implementation, the web page report includes the risk level of the inspection item, the name of the inspection item, the number of abnormalities in the inspection item, and the unit of the number of abnormalities in the inspection item.
[0093] The web page report includes the name of the inspection item. The processing module 120 is also used to respond to the operation of selecting the name of any inspection item in the web page report and display the detailed inspection report corresponding to the inspection item. The detailed inspection report includes all the contents of the inspection results corresponding to the inspection item.
[0094] After obtaining the property file of the integrated circuit to be inspected, the processing module 120 is also used to extract the target data in the property file, which is a collection of data required for all inspection scripts to be inspected; the target data is stored in a specified variable structure to obtain a target variable structure. Based on all the inspection scripts obtained, the corresponding data to be inspected are obtained from the target variable structure and inspected to obtain the inspection result corresponding to each inspection item, wherein the data to be inspected corresponding to each inspection script is the data inspected by the inspection script.
[0095] In one implementation manner, the property file includes a netlist file and a constraint file.
[0096] In one implementation manner, the inspection result corresponding to each of the inspection items includes risk level, whether there is a violation, the number of violations, and information about the circuit where the problem occurs.
[0097] Before obtaining all inspection scripts corresponding to the preset second-category inspection items, the acquisition module 110 is also used to obtain configuration information of the specified inspection item, and the configuration information includes the inspection threshold of the specified information; the inspection threshold of the specified information is filled into the preset script template to obtain the inspection script corresponding to the specified inspection item, and the second-category inspection item includes the specified inspection item.
[0098] The configuration information also includes the risk level of the specified information and whether the specified information is presented in the inspection results; the processing module 120 is specifically used to fill the risk level of the specified information, the inspection threshold of the specified information, and whether the specified information is presented in the inspection results into a preset script template to obtain the inspection script corresponding to the specified inspection item.
[0099] The integrated circuit inspection device 100 provided in the embodiment of the present application has the same implementation principle and technical effects as those of the aforementioned integrated circuit inspection method embodiment. For the sake of brief description, for matters not mentioned in the device embodiment, reference may be made to the corresponding contents in the aforementioned integrated circuit inspection method embodiment.
[0100] See also Figure 4, which is an electronic device 200 provided in an embodiment of the present application. The electronic device 200 includes: a processor 210 and a memory 220.
[0101] The memory 220 and the processor 210 are electrically connected to each other directly or indirectly to achieve data transmission or interaction. For example, these components can be electrically connected to each other via one or more communication buses or signal lines. The memory 220 is used to store computer programs, such as storing Figure 3 The software function module shown in is the integrated circuit inspection device 100. The integrated circuit inspection device 100 includes at least one software function module that can be stored in the memory 220 in the form of software or firmware or solidified in the operating system (OS) of the electronic device 200. The processor 210 is used to execute the executable module stored in the memory 220, such as the software function module or computer program included in the integrated circuit inspection device 100. At this time, the processor 210 is used to obtain the attribute file of the integrated circuit to be detected; obtain all inspection scripts corresponding to the preset first category inspection items and the preset second category inspection items, wherein the first category inspection items are at least one preset basic inspection item, and the second category inspection items are at least one user-defined inspection item; based on all the inspection scripts obtained, the attribute files are checked separately to obtain the inspection results corresponding to each inspection item.
[0102] Among them, the memory 220 can be, but is not limited to, random access memory (Random Access Memory, RAM), read only memory (Read Only Memory, ROM), programmable read-only memory (Programmable Read-Only Memory, PROM), erasable programmable read-only memory (Erasable Programmable Read-Only Memory, EPROM), electrically erasable read-only memory (Electric Erasable Programmable Read-Only Memory, EEPROM), etc.
[0103] The processor 210 may be an integrated circuit chip with signal processing capabilities. The above-mentioned processor may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The various methods, steps and logic block diagrams disclosed in the embodiments of the present application may be implemented or executed. A general-purpose processor may be a microprocessor or the processor 210 may also be any conventional processor, etc.
[0104] The electronic device 200 mentioned above includes but is not limited to a personal computer, a server, etc.
[0105] The embodiment of the present application also provides a computer-readable storage medium (hereinafter referred to as storage medium), on which a computer program is stored, and when the computer program is run by a computer such as the above-mentioned electronic device 200, the above-mentioned integrated circuit inspection method is executed. The computer-readable storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.
[0106] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims
1. An integrated circuit inspection method, characterized in that: include: Obtaining the property file of the integrated circuit to be tested; Obtain all inspection scripts corresponding to the preset first-category inspection items and the preset second-category inspection items, wherein the first-category inspection items are at least one preset basic inspection item, and the second-category inspection items are at least one user-defined inspection item; Based on all the obtained inspection scripts, the attribute files are inspected respectively to obtain the inspection result corresponding to each inspection item.
2. The method according to claim 1, characterized in that: After obtaining the inspection result corresponding to each inspection item, the method further includes: For all the inspection results, a web page report is generated for all the inspection results.
3. The method according to claim 2, characterized in that For all the inspection results, generating a web page report for all the inspection results includes: Determine the inspection results to be marked that meet the preset marking conditions among the inspection results corresponding to each inspection item; The content corresponding to the inspection result to be marked is marked in the generated web page report to obtain the web page report.
4. The method according to claim 2, characterized in that: The web page report includes the risk level of the inspection item, the name of the inspection item, the number of abnormalities in the inspection item, and the quantity unit of the number of abnormalities in the inspection item.
5. The method according to claim 2, characterized in that: The webpage report includes the name of the inspection item, and the method further includes: In response to an operation of selecting the name of any inspection item in the webpage report, a detailed inspection report corresponding to the inspection item is displayed, and the detailed inspection report includes all contents of the inspection result corresponding to the inspection item.
6. The method according to claim 1, characterized in that After obtaining the property file of the integrated circuit to be detected, the method further includes: Extracting target data from the property file, where the target data is a collection of data required for all inspection scripts to perform inspections; The target data is stored in a specified variable structure to obtain a target variable structure; Accordingly, the property files are checked respectively based on all the obtained check scripts to obtain the check results corresponding to each check item, including: Based on all the inspection scripts obtained, the corresponding data to be inspected are obtained and inspected from the target variable structure respectively to obtain the inspection result corresponding to each inspection item, wherein the data to be inspected corresponding to each inspection script is the data inspected by the inspection script.
7. The method according to claim 1, characterized in that The property file includes at least one of a netlist file and a constraint file.
8. The method according to claim 1, characterized in that: The inspection result corresponding to each inspection item includes risk level, whether there is a violation, the number of violations, and information about the circuit where the problem occurs.
9. The method according to any one of claims 1 to 8, characterized in that: Before obtaining all inspection scripts corresponding to the preset second-category inspection items, the method further includes: Obtaining configuration information of a specified inspection item, wherein the configuration information includes an inspection threshold of the specified information; The inspection threshold of the designated information is filled into a preset script template to obtain an inspection script corresponding to the designated inspection item, and the second category of inspection items includes the designated inspection item.
10. The method according to claim 9, characterized in that The configuration information also includes the risk level of the specified information and whether the specified information is presented in the inspection result; Filling the check threshold of the specified information into a preset script template includes: The risk level of the designated information, the inspection threshold of the designated information, and whether the designated information is presented in the inspection result are filled into a preset script template to obtain an inspection script corresponding to the designated inspection item.
11. An integrated circuit inspection device, characterized in that: include: An acquisition module, used for acquiring a property file of the integrated circuit to be detected; The acquisition module is further used to acquire all inspection scripts corresponding to the preset first category inspection items and the preset second category inspection items, wherein the first category inspection items are at least one preset basic inspection item, and the second category inspection items are at least one user-defined inspection item; The processing module is used to check the attribute files respectively based on all the obtained inspection scripts to obtain the inspection result corresponding to each inspection item.
12. An electronic device, characterized in that: include: A memory and a processor, wherein the memory and the processor are connected; The memory is used to store programs; The processor is used to call the program stored in the memory to execute the method according to any one of claims 1-10.
13. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed by a computer, the method according to any one of claims 1 to 10 is executed.