Three-dimensional imaging system and three-dimensional imaging method

Abstract

The invention discloses a three-dimensional imaging system and a three-dimensional imaging method. The three-dimensional imaging method comprises the following steps: projecting a structured light pattern on a reference plane and extracting a reference plane image of the reference plane to obtain a reference phase; projecting a structured light pattern on the workpiece surface and extracting a workpiece surface image group of the workpiece surface to obtain a workpiece phase; obtaining a workpiece phase difference based on the difference between the reference phase and the workpiece phase; performing time sequence binarization coding on the workpiece surface image group to generate a coded image; detecting a noise region in the coded image; integrating the noise regions to establish noise phase shielding; filtering noise in the encoded image according to the noise phase shield to generate a noise-filtered phase; compensating the phase after noise filtering to restore the phase difference of the workpiece; and performing three-dimensional reconstruction on the reduced workpiece phase difference to form a three-dimensional point cloud on the surface of the workpiece.

Description

Technical Field

[0001] The present disclosure relates to an imaging system, and in particular to a three-dimensional imaging system and a three-dimensional imaging method. Background Art

[0002] There are various types of workpieces on the manufacturing line, and most of them have reflective or light-absorbing properties. In order to ensure the quality of the three-dimensional point cloud of the workpiece, the workpiece is usually imaged by adjusting the 3D camera parameters or using a camera with multiple viewing angles. However, no matter which method is used, the workpiece must be imaged multiple times and the point cloud fusion must be performed to obtain a complete point cloud, which prolongs the shooting time. In addition, if the workpiece is photographed and imaged using only one parameter or one viewing angle, its point cloud is easily damaged, causing the system to misjudge, and the system cannot perform subsequent workpiece detection or positioning.

[0003] Therefore, how to shorten the time of imaging the workpiece and predict the cause of point cloud damage in real time is an urgent problem to be solved. Summary of the invention

[0004] The present disclosure provides a three-dimensional imaging system, including a projection device, an image capture device and a processor. The projection device is used to project a structured light pattern on a reference plane and a workpiece surface respectively. The image capture device is used to extract a reference plane image of the reference plane and a workpiece surface image group of the workpiece surface. The processor is coupled to the image capture device, and is used to: receive the reference plane image and the workpiece surface image group; obtain a reference phase according to the reference plane image, and obtain a workpiece phase according to the workpiece surface image group; obtain a workpiece phase difference based on the difference between the reference phase and the workpiece phase; perform temporal binary encoding on the workpiece surface image group to generate an encoded image; detect at least one noise region in the encoded image; integrate at least one noise region to establish a noise phase shield; filter out the noise in the encoded image according to the noise phase shield to generate a noise-filtered phase; compensate for the noise-filtered phase to restore the workpiece phase difference; and perform three-dimensional reconstruction on the restored workpiece phase difference to form a three-dimensional point cloud of the workpiece surface.

[0005] In one embodiment of the present disclosure, the processor is further used to: obtain the maximum grayscale value and the minimum grayscale value of each pixel position in the workpiece surface image group, wherein the difference between the maximum grayscale value and the minimum grayscale value is the image grayscale difference; obtain the pixel grayscale value of each pixel position in the workpiece surface image group; calculate the difference between the pixel grayscale value and the minimum grayscale value based on the pixel grayscale value of each pixel to obtain the pixel grayscale difference corresponding to each pixel position; obtain the grayscale ratio value of each pixel position based on the ratio of the pixel grayscale difference value of each pixel position to the image grayscale difference value; compare the grayscale ratio value of each pixel position with a threshold value to set a binary code for each pixel position, wherein in response to a pixel position whose grayscale ratio value is less than the threshold value, the binary code of the pixel position is set to 0, and in response to a pixel position whose grayscale ratio value is not less than the threshold value, the binary code of the pixel position is set to 1; and generate an encoded image based on the binary code of each pixel position in the workpiece surface image group.

[0006] In one embodiment of the present disclosure, the color corresponding to the pixel position in the above-mentioned encoded image is related to the binary code of the pixel position; wherein in response to the binary code of the pixel position being 0, the processor sets the color corresponding to the pixel position in the encoded image to black; wherein in response to the binary code of the pixel position being 1, the processor sets the color corresponding to the pixel position in the encoded image to white.

[0007] In an embodiment of the present disclosure, the encoded image is a black-and-white striped image composed of a plurality of black stripes and a plurality of white stripes interlaced with each other, each black stripe has a first width, and each white stripe has a second width.

[0008] In one embodiment of the present disclosure, the processor is further configured to adjust the ratio of the first width to the second width by adjusting a threshold. When the ratio of the first width to the second width is 1, the threshold is set as a comparison threshold.

[0009] In one embodiment of the present disclosure, the at least one noise area mentioned above includes: an area with at least one white block in at least one black stripe; an area with at least one black block in at least one white stripe; an area where at least two black stripes or at least two white stripes are connected; or an area where at least one black stripe or at least one white stripe is blurred.

[0010] In one embodiment of the present disclosure, the processor is further configured to perform mirror compensation on the phase after noise filtering based on the center line of the phase after noise filtering as a baseline to restore the phase difference of the workpiece.

[0011] In one embodiment of the present disclosure, the processor is further configured to compensate the noise-filtered phase according to a fitting trend line of the noise-filtered phase to restore the workpiece phase difference.

[0012] The present disclosure also provides a three-dimensional imaging method, including: projecting a structured light pattern on a reference plane and extracting a reference plane image of the reference plane to obtain a reference phase; projecting a structured light pattern on a workpiece surface and extracting a workpiece surface image group of the workpiece surface to obtain a workpiece phase; obtaining a workpiece phase difference based on a difference between the reference phase and the workpiece phase; performing temporal binary encoding on the workpiece surface image group to generate an encoded image; detecting at least one noise region in the encoded image; integrating at least one noise region to establish a noise phase shield; filtering out noise in the encoded image according to the noise phase shield to generate a noise-filtered phase; compensating for the noise-filtered phase to restore the workpiece phase difference; and performing three-dimensional reconstruction on the restored workpiece phase difference to form a three-dimensional point cloud of the workpiece surface.

[0013] Based on the above, the 3D imaging system and 3D imaging method provided by the present disclosure only need to shoot once to obtain a set of workpiece surface images, and then achieve 3D point cloud reconstruction of the workpiece by predicting image noise, establishing noise phase shielding, filtering noise to generate a noise-filtered phase, and compensating for the noise-filtered phase to restore the workpiece phase difference. Therefore, the 3D imaging system and 3D imaging method provided by the present disclosure do not need to shoot the workpiece multiple times or adjust parameters, and only shoot the workpiece through one perspective or one set of parameters, saving shooting time. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 is a schematic diagram of a three-dimensional imaging system according to an embodiment of the present disclosure;

[0015] Figure 2 is a flow chart of a three-dimensional imaging method according to an embodiment of the present disclosure;

[0016] Figure 3 is a schematic diagram of obtaining a phase difference of a workpiece in a three-dimensional imaging system and a three-dimensional imaging method according to an embodiment of the present disclosure;

[0017] Figure 4 is in accordance with Figure 2 The schematic diagram of steps S208-S212 is shown;

[0018] Figure 5 is a schematic diagram of a phase after noise filtering in a three-dimensional imaging system and a three-dimensional imaging method according to an embodiment of the present disclosure;

[0019] Figure 6 is a schematic diagram of compensating for a phase after noise filtering in a three-dimensional imaging system and a three-dimensional imaging method according to an embodiment of the present disclosure;

[0020] Figure 7It is a schematic diagram of compensating the phase after noise filtering in a three-dimensional imaging system and a three-dimensional imaging method according to another embodiment of the present disclosure.

[0021] Description of Reference Numerals

[0022] 1: 3D imaging system;

[0023] 11: Projection device;

[0024] 111: structured light pattern;

[0025] 12: Image capture device;

[0026] 13: Processor;

[0027] 2: Three-dimensional imaging method;

[0028] S201-S204, S206, S208, S208a, S208b, S210, S212, S214, S216, S218, S220: steps;

[0029] 31: reference phase;

[0030] 32: Workpiece phase;

[0031] 33: Workpiece phase difference;

[0032] 41: Workpiece surface image group;

[0033] 42: coded image;

[0034] 431-434: Noise area;

[0035] 441-444: Error condition;

[0036] 45: Noise phase shielding;

[0037] 51: Phase after noise filtering;

[0038] 52: Line segment gap;

[0039] 61: center line;

[0040] 62, 74: compensation line segment;

[0041] 71: Fitted trend line;

[0042] 72, 73: Trend line fitting segments. DETAILED DESCRIPTION

[0043] Some exemplary embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. The component symbols cited in the following description will be regarded as the same or similar components when the same component symbols appear in different drawings. These exemplary embodiments are only part of the present disclosure and do not disclose all possible implementation methods of the present disclosure. More specifically, these exemplary embodiments are only examples of methods, devices, and systems within the scope of the patent application of the present disclosure.

[0044] Figure 1 1 is a schematic diagram of a three-dimensional imaging system 1 according to an embodiment of the present disclosure. The three-dimensional imaging system 1 of the present disclosure includes a projection device 11, an image capture device 12 and a processor 13. First, Figure 1 The components and configuration relationships in the three-dimensional imaging system 1 are introduced, and detailed functions will be disclosed together with subsequent embodiments.

[0045] The projection device 11 is electrically or wirelessly connected to the processor 13. After receiving the control signal from the processor 13, the projection device 11 projects the structured light pattern 111 onto the reference plane to be projected and the workpiece surface. In practice, the projection device 11 can be, for example, a general projector, a wireless projector, or other projection devices with projection function.

[0046] The form of the structured light pattern 111 can be roughly divided into light spots, stripes, and space patterns. Both the light spot structured light and the space pattern structured light are geometrically calculated point by point, while the stripe structured light pattern is an encoded stripe light image. The structured light pattern 111 can be generated by a structured light generator (not shown in the figure) and projected onto the reference plane and the workpiece surface via the projection device 11. The present disclosure projects the stripe structured light pattern via the projection device 11. The projection device 11 can use, for example, a five-step phase shift method to project multiple structured light patterns 111 onto the reference plane and the workpiece surface.

[0047] When the projection device 11 projects multiple structured light patterns 111 onto the reference plane, the image capture device 12 extracts the reference plane image of the reference plane. Also, when the projection device 11 projects multiple structured light patterns 111 onto the workpiece surface, the image capture device 12 extracts a workpiece surface image group of the workpiece surface, wherein the workpiece surface image group includes multiple workpiece surface images. In practice, the image capture device 12 is, for example, a camera or other image capture device having the function of photographing and capturing images.

[0048] The processor 13 is coupled to the image capture device 12 to receive the image captured by the image capture device 12 and perform subsequent processing on the image. In practice, the processor 13 may be, for example, a central processing unit (CPU) including relevant data computing functions and projection control functions, or other programmable general-purpose or special-purpose microprocessors (Microprocessors), digital signal processors (Digital Signal Processors, DSPs), image processors (Image Processing Units, IPUs), graphics processors (Graphics Processing Units, GPUs), programmable controllers, application-specific integrated circuits (Application Specific Integrated Circuits, ASICs), programmable logic devices (Programmable Logic Devices, PLDs), other similar control devices, or a combination of these devices.

[0049] Figure 2 is a flow chart of a three-dimensional imaging method 2 according to an embodiment of the present disclosure. Figure 2 The three-dimensional imaging method 2 can be achieved by Figure 1 The three-dimensional imaging system 1 performs its process, and then please refer to Figure 1 as well as Figure 2 The three-dimensional imaging method 2 includes steps S201-S204, S206, S208, S210, S212, S214, S216, S218, and S220.

[0050] In step S201, the structured light pattern 111 is projected on a reference plane by the projection device 11, wherein the reference plane may be a plane on which the workpiece is to be placed. Next, while the projection device 11 continues to project the structured light pattern 111 on the reference plane, in step S202, a reference plane image of the reference plane is extracted by the image capture device 12, the processor 13 receives the reference plane image, and obtains a reference phase according to the reference plane image.

[0051] In step S203, the structured light pattern 111 is projected onto the workpiece surface by the projection device 11, wherein the workpiece is placed on the above-mentioned reference plane. Next, while the projection device 11 continues to project the structured light pattern 111 onto the workpiece surface, in step S204, the workpiece plane image group of the workpiece surface is extracted by the image capture device 12, and the processor 13 receives the workpiece plane image group, and obtains the workpiece phase according to the workpiece plane image group. The workpiece surface image group includes a plurality of workpiece surface images.

[0052] In step S206 , after the processor 13 obtains the reference phase and the workpiece phase, it obtains the workpiece phase difference based on the difference between the reference phase and the workpiece phase. Figure 3 It is a schematic diagram of obtaining a workpiece phase difference 33 based on a difference between a reference phase 31 and a workpiece phase 32 in a three-dimensional imaging system 1 and a three-dimensional imaging method 2 according to an embodiment of the present disclosure.

[0053] Since the reference plane is a plane, Figure 3 The reference phase 31 shown in is a straight line. The workpiece is placed on this reference plane, and each workpiece surface image in the workpiece surface image group includes the workpiece surface and the reference plane that is not blocked by the workpiece. Therefore, Figure 3 The workpiece phase 32 shown in FIG. 1 corresponds to the position of the workpiece placed on the reference plane in a non-linear pattern. After the processor 13 obtains the reference phase 31 and the workpiece phase 32 , it obtains the workpiece phase difference 33 based on the difference between the reference phase 31 and the workpiece phase 32 .

[0054] In step S208, the processor 13 performs temporal binary encoding on the workpiece surface image group to generate an encoded image. In step S210, the processor 13 detects at least one noise region in the encoded image. In step S212, the processor 13 integrates at least one noise region to establish a noise phase shield. Then, Figure 4 Steps S208-S212 are further described.

[0055] Figure 4 is in accordance with Figure 2 For ease of explanation, Figure 2 Step S208 shown in Figure 4 The method is divided into steps S208a and S208b. In step S208a, the processor 13 performs temporal binary encoding on the workpiece surface image group 41. As mentioned above, the projection device 11 projects i structured light patterns 111 onto the workpiece surface using, for example, a five-step phase shift method, and the image capture device 12 extracts the workpiece surface image group 41 of the workpiece surface. The workpiece surface image group 41 includes i workpiece surface images (phase shift images), and each workpiece surface image has the same size. The processor 13 obtains the grayscale ratio value of each pixel position in each workpiece surface image of the workpiece surface image group 41.

[0056] Specifically, the processor 13 obtains the pixel grayscale value J for each pixel position in each workpiece surface image of the workpiece surface image group 41. If the workpiece surface image group 41 includes i workpiece surface images, the processor 13 will obtain i pixel grayscale values ​​J at each pixel position, but the pixel grayscale value J of each pixel position in each workpiece surface image is different. For each pixel position, the processor 13 takes out the maximum grayscale value of each pixel position in each workpiece surface image. and minimum grayscale value The maximum grayscale value and minimum grayscale value The difference is the image grayscale difference In addition, the processor 13 obtains the pixel grayscale value J of each pixel position in each workpiece surface image of the workpiece surface image group 41, and calculates the pixel grayscale value J and the minimum grayscale value based on the pixel grayscale value J of each pixel. The difference between the grayscale values ​​of each pixel is obtained by

[0057] The processor 13 obtains the image grayscale difference corresponding to each pixel position And pixel grayscale difference Then, based on the pixel grayscale difference at each pixel position And the grayscale difference of the image The grayscale ratio value G of each pixel position is obtained by the ratio of

[0058]

[0059] Next, the processor 13 compares the grayscale ratio value G of each pixel position with the threshold value G th Compare to set the binary code b of each pixel position, where

[0060]

[0061] That is, in response to the grayscale ratio value G being less than the threshold value G th The processor 13 sets the binary code b of the pixel position to 0; in response to the grayscale ratio value G being not less than the threshold value G th The processor 13 sets the binary code b of the pixel position to 1.

[0062] Once the processor 13 completes setting the binary code b of each pixel position, in step S208 b , the encoded image 42 is generated based on the binary code b of each pixel position in the workpiece surface image group 41 .

[0063] The encoded image 42 is a black and white striped image composed of a plurality of black stripes and a plurality of white stripes, and the color of the corresponding pixel position in the encoded image 42 is related to the binary code b of the pixel position. In detail, in response to the binary code b of the pixel position being 0, the processor 13 sets the color corresponding to the pixel position in the encoded image 42 to black; in response to the binary code b of the pixel position being 1, the processor 13 sets the color corresponding to the pixel position in the encoded image 42 to white.

[0064] Each of the black stripes in the encoded image 42 has a first width, and each of the white stripes in the encoded image 42 has a second width. Since the first width and the second width are related to the binary code b of the pixel position, and the binary code b is obtained by comparing the grayscale ratio value G with the threshold G th Therefore, the processor 13 determines the grayscale ratio value G of each pixel position and the threshold value G th The threshold G used for comparison th The threshold G can be adjusted by the processor 13. th To adjust the ratio of the first width to the second width, when the ratio of the first width to the second width is 1 (that is, the first width is equal to the second width), the processor 13 sets the threshold value G corresponding to the ratio of the first width to the second width being 1. th is the final comparison threshold.

[0065] In step S210, at least one noise region in the encoded image 42 is detected by the processor 13, for example Figure 4 Noise regions 431-434 in the image. Noise region 431 is a region with white blocks in black stripes, which is caused by error condition 441 of point cloud elimination due to secondary reflection in the region. Noise region 432 is a region with black blocks in white stripes, which is caused by error condition 442 of point cloud elimination due to insufficient light source reception in the region. Noise region 433 is a region where at least two black stripes or at least two white stripes are connected, which is caused by error condition 443 of point cloud elimination due to plane dirtiness. Noise region 434 is a region where black stripes or white stripes are blurred, which is caused by error condition 444 of point cloud elimination due to blurred plane coding.

[0066] In step S212 , the noise regions 431 - 434 are integrated by the processor 13 to establish a noise phase mask 45 .

[0067] Please continue to refer to Figure 1-Figure 2 In step S214, the noise in the encoded image 42 is filtered out by the processor 13 according to the noise phase mask 45 to generate a noise-filtered phase. Figure 5FIG. 5 is a schematic diagram of a phase 51 after noise filtering in a three-dimensional imaging system 1 and a three-dimensional imaging method 2 according to an embodiment of the present disclosure. Figure 5 It can be seen that after noise filtering, the phase 51 is approximately Figure 3 The workpiece phase difference 33 is shown, but there is an obvious line segment gap 52 on the line segment of the phase 51 after noise filtering. The working phase difference 33 can be restored by compensating for the line segment gap 52 of the phase 51 after noise filtering.

[0068] In step S216, the processor 13 compensates the noise-filtered phase 51 according to the workpiece feature to restore the workpiece phase difference 33. Specifically, the processor 13 compensates the line gap 52 of the noise-filtered phase 51 according to the workpiece feature to restore the working phase difference 33. The following describes an embodiment in which the processor 13 compensates the noise-filtered phase 51 to restore the workpiece phase difference 33.

[0069] Figure 6 FIG. 1 is a schematic diagram of compensating the noise-filtered phase 51 in a three-dimensional imaging system 1 and a three-dimensional imaging method 2 according to an embodiment of the present disclosure. Taking solder ball work as an example, since the shape of the solder ball surface is symmetrical, based on the center line 61 of the noise-filtered phase 51 as the baseline, the processor 13 performs mirror compensation on the noise-filtered phase 51 to restore the workpiece phase difference 33, that is, the processor Figure 5 As shown in FIG. , after the noise is filtered out, the line segment gap 52 of the phase 51 is compensated by the compensating line segment 62, and thus the workpiece phase difference 33 is restored.

[0070] Figure 7 1 is a schematic diagram of compensating the noise-filtered phase 51 in a three-dimensional imaging system 1 and a three-dimensional imaging method 2 according to another embodiment of the present disclosure. Taking the solder ball operation as an example, since the outer shape of the solder ball surface is a symmetrical arc, the processor 13 can generate a fitting trend line 71 of the noise-filtered phase 51 through the ideal arc of the solder ball surface. In particular, when the trend line fitting segments 72 and 73 of the fitting trend line 71 approximately overlap with the noise-filtered phase 51, the processor 13 can determine the shape and position of the fitting trend line 71. Once the shape and position of the fitting trend line 71 are determined, the processor 13 compensates the noise-filtered phase 51 according to the fitting trend line 71 of the noise-filtered phase 51 to restore the workpiece phase difference 33, that is, the processor 13 Figure 5 As shown in FIG. , after the noise is filtered out, the line segment gap 52 of the phase 51 is compensated by the compensating line segment 74, and thus the workpiece phase difference 33 is restored.

[0071] Please continue to refer to Figure 1-Figure 2In step S218, the processor 13 performs three-dimensional reconstruction on the restored workpiece phase difference, and then, in step S220, a three-dimensional point cloud of the workpiece surface is formed by the processor 13. Once the three-dimensional point cloud of the workpiece surface is formed, the processor 13 can perform three-dimensional imaging of the workpiece surface.

[0072] In summary, the 3D imaging system and 3D imaging method provided by the present disclosure only need to shoot once to obtain a set of workpiece surface images, and then achieve 3D point cloud reconstruction of the workpiece by predicting image noise, establishing noise phase shielding, filtering noise to generate a noise-filtered phase, and compensating for the noise-filtered phase to restore the workpiece phase difference. Therefore, the 3D imaging system and 3D imaging method provided by the present disclosure do not need to shoot the workpiece multiple times or adjust parameters, and only shoot the workpiece through one perspective or one set of parameters, saving shooting time.

Claims

1. A three-dimensional imaging system, comprising: A projection device, used to project the structured light pattern onto the reference plane and the workpiece surface respectively; An image capturing device, used for extracting a reference plane image of the reference plane and extracting a workpiece surface image group of the workpiece surface, wherein the workpiece surface image group comprises a plurality of workpiece surface images; A processor, coupled to the image capture device, configured to: Receiving the reference plane image and the workpiece surface image group; Acquire a reference phase according to the reference plane image, and acquire a workpiece phase according to the workpiece surface image group; Obtaining a workpiece phase difference based on a difference between the reference phase and the workpiece phase; Performing temporal binary encoding on the workpiece surface image group to generate an encoded image; detecting at least one noise region in the encoded image; integrating the at least one noise region to establish a noise phase shield; masking and filtering out noise in the encoded image according to the noise phase to produce a noise-filtered phase; Compensating the phase after the noise is filtered out to restore the workpiece phase difference; as well as The restored workpiece phase difference is three-dimensionally reconstructed to form a three-dimensional point cloud of the workpiece surface.

2. The three-dimensional imaging system according to claim 1, wherein the processor is further configured to: Obtaining a maximum grayscale value and a minimum grayscale value of each pixel position in the workpiece surface image group, wherein the difference between the maximum grayscale value and the minimum grayscale value is an image grayscale difference; Obtaining a pixel grayscale value of each pixel position in the workpiece surface image group; Calculating the difference between the pixel grayscale value and the minimum grayscale value based on the pixel grayscale value of each pixel to obtain a pixel grayscale difference corresponding to each pixel position; Obtaining a grayscale ratio value of each pixel position based on a ratio of the pixel grayscale difference value at each pixel position to the image grayscale difference value; Comparing the grayscale ratio value of each pixel position with a threshold value to set a binary code of each pixel position, wherein in response to the pixel position where the grayscale ratio value is less than the threshold value, the binary code of the pixel position is set to 0, and in response to the pixel position where the grayscale ratio value is not less than the threshold value, the binary code of the pixel position is set to 1; as well as The encoded image is generated based on the binarization encoding of each pixel position in the workpiece surface image group.

3. The three-dimensional imaging system according to claim 2, wherein the color corresponding to the pixel position in the encoded image is related to the binary code of the pixel position; wherein in response to the binary encoding of the pixel position being 0, the processor sets the color corresponding to the pixel position in the encoded image to black; In response to the binary encoding of the pixel position being 1, the processor sets the color corresponding to the pixel position in the encoded image to white.

4. The three-dimensional imaging system according to claim 3, wherein the encoded image is a black-and-white striped image composed of a plurality of black stripes and a plurality of white stripes interlaced, each of the black stripes has a first width, and each of the white stripes has a second width.

5. The three-dimensional imaging system according to claim 4, wherein the processor is further configured to: Adjusting the ratio of the first width to the second width by adjusting the threshold; and When the ratio of the first width to the second width is 1, the threshold is set as a comparison threshold.

6. The three-dimensional imaging system according to claim 4, wherein the at least one noise region comprises: At least one of the black stripes has at least one white area; At least one of the white stripes has at least one black area; An area where at least two of the black stripes or at least two of the white stripes are connected; or An area in which at least one of the black stripes or at least one of the white stripes is blurred.

7. The three-dimensional imaging system according to claim 1, wherein the processor is further configured to: The phase after noise filtering is mirror-compensated based on the center line of the phase after noise filtering as a baseline to restore the workpiece phase difference.

8. The three-dimensional imaging system according to claim 1, wherein the processor is further configured to: The noise-filtered phase is compensated according to a fitting trend line of the noise-filtered phase to restore the workpiece phase difference.

9. A three-dimensional imaging method, comprising: Projecting a structured light pattern on a reference plane and extracting a reference plane image of the reference plane to obtain a reference phase; Projecting the structured light pattern onto a workpiece surface and extracting a workpiece surface image group of the workpiece surface to obtain a workpiece phase, wherein the workpiece surface image group includes a plurality of workpiece surface images; Obtaining a workpiece phase difference based on a difference between the reference phase and the workpiece phase; Performing temporal binary encoding on the workpiece surface image group to generate an encoded image; detecting at least one noise region in the encoded image; integrating the at least one noise region to establish a noise phase shield; masking and filtering out noise in the encoded image according to the noise phase to produce a noise-filtered phase; Compensating the phase after the noise is filtered out to restore the workpiece phase difference; as well as The restored workpiece phase difference is three-dimensionally reconstructed to form a three-dimensional point cloud of the workpiece surface.

10. The three-dimensional imaging method according to claim 9, wherein the step of performing the temporal binary encoding on the workpiece surface image group to generate the encoded image comprises: Obtaining a maximum grayscale value and a minimum grayscale value of each pixel position in the workpiece surface image group, wherein the difference between the maximum grayscale value and the minimum grayscale value is an image grayscale difference; Obtaining a pixel grayscale value of each pixel position in the workpiece surface image group; Calculating the difference between the pixel grayscale value and the minimum grayscale value based on the pixel grayscale value of each pixel to obtain a pixel grayscale difference corresponding to each pixel position; Obtaining a grayscale ratio value of each pixel position based on a ratio of the pixel grayscale difference value at each pixel position to the image grayscale difference value; Comparing the grayscale ratio value of each pixel position with a threshold value to set a binary code of each pixel position, wherein in response to the pixel position where the grayscale ratio value is less than the threshold value, the binary code of the pixel position is set to 0, and in response to the pixel position where the grayscale ratio value is not less than the threshold value, the binary code of the pixel position is set to 1; as well as The encoded image is generated based on the binarization encoding of each pixel position in the workpiece surface image group.

11. The three-dimensional imaging method according to claim 10, wherein the color corresponding to the pixel position in the encoded image is related to the binary code of the pixel position; wherein in response to the binary code of the pixel position being 0, the color corresponding to the pixel position in the encoded image is set to black; In response to the binary encoding of the pixel position being 1, the color corresponding to the pixel position in the encoded image is set to white.

12. The three-dimensional imaging method according to claim 11, wherein the encoded image is a black and white striped image composed of a plurality of black stripes and a plurality of white stripes interlaced, each of the black stripes has a first width, and each of the white stripes has a second width.

13. The three-dimensional imaging method according to claim 12, further comprising: Adjusting the ratio of the first width to the second width by adjusting the threshold; as well as When the ratio of the first width to the second width is 1, the threshold is set as a comparison threshold.

14. The three-dimensional imaging method according to claim 12, wherein the at least one noise region comprises: At least one of the black stripes has at least one white area; At least one of the white stripes has at least one black area; An area where at least two of the black stripes or at least two of the white stripes are connected; or An area in which at least one of the black stripes or at least one of the white stripes is blurred.

15. The three-dimensional imaging method according to claim 9, wherein the step of compensating the noise-filtered phase to restore the workpiece phase difference comprises: The phase after noise filtering is mirror-compensated based on the center line of the phase after noise filtering as a baseline to restore the workpiece phase difference.

16. The three-dimensional imaging method according to claim 9, wherein the step of compensating the noise-filtered phase to restore the workpiece phase difference comprises: The noise-filtered phase is compensated according to a fitting trend line of the noise-filtered phase to restore the workpiece phase difference.

Images