Off-line MCU detector and detection method

Abstract

The invention provides an off-line MCU detector, and relates to the technical field of digital integrated circuit testing, and the main structure of the off-line MCU detector is as follows: an input unit is used for sending an instruction to a main controller; the main controller is used for processing an input instruction, writing and reading a test code and configuration information of the FPGA into the FLASH, writing the configuration information into the FPGA, writing the test code into the tested MCU device through the FPGA, and reading a test result of the FPGA; the FLASH is used for storing test codes and configuration information of the FPGA; the FPGA is used for sending test excitation to the tested MCU device and reading a signal returned by the tested MCU device; and the output display unit is used for receiving a signal of the main controller and displaying a test result. The invention further provides an off-line MCU detection method. On-site test requirements of workers can be quickly met under the condition of low cost, and the test process is simplified.

Description

Technical Field

[0001] The present invention relates to the technical field of digital integrated circuit testing, and in particular to an offline MCU detector and a detection method. Background Art

[0002] With the rapid development of the electronics industry, electronic technology, communication technology and other technologies, a large number of production equipment and products are becoming more and more electronic, digital, automated and intelligent, and the use of MCU is increasing, so the corresponding testing equipment must also be more perfect.

[0003] MCU, the full name of which is Microcontroller Unit, is also called a single-chip microcomputer or single-chip microcomputer. This is because it appropriately reduces the frequency and specifications of the central processing unit (CPU), and integrates peripheral interfaces such as memory, counter, USB, AD conversion, UART, etc. into a single chip to form a chip-level computer processing system. Due to its simple structure, high reliability, strong processing power, low voltage, low power consumption, and strong environmental adaptability, it has been widely used in automotive electronics, industrial control, instrumentation, household appliances and other fields. As a programmable integrated circuit, MCU plays an important role in various electronic and mechanical equipment with its powerful processing power, high integration, security, real-time performance and other characteristics, realizing various complex system functions. With the development of technology and the increase in demand, the performance of MCU is also constantly improving.

[0004] The MCU chip testing system is a comprehensive device specially used to test the performance and quality of MCU chips. It usually consists of two parts: hardware and software. The hardware includes test instruments, adapters, test fixtures, etc., which are used to connect the MCU test machine to achieve efficient and high-precision testing. The software part usually includes test programs, test management software, etc., which are used for automated testing, measurement and diagnosis. The MCU chip testing system can quickly evaluate the quality and performance of the chip, including testing the logical functions, performance indicators, reliability, etc. of the MCU. By testing the MCU, potential problems can be discovered and solved in a timely manner, thereby ensuring the stability and reliability of electronic equipment.

[0005] Since traditional detection systems are usually built on the basis of standard measurement and control buses and instrument buses, they are large in size, high in cost, and complex to operate. They are suitable for functional testing of chips before they leave the factory, but their reliability cannot be guaranteed after long-term storage, and it is impossible for users to test the chips at any time. Summary of the invention

[0006] The purpose of the present invention is to quickly meet the on-site testing needs of staff at a low cost, simplify the testing process, and improve product quality.

[0007] The technical solution adopted by the present invention to achieve its invention object is an offline MCU detector, including an input unit, a main controller, FLASH, FPGA, and an output display unit, wherein:

[0008] The input unit is used to send instructions to the main controller;

[0009] The main controller is used to process the input instructions of the input unit, to write and read the test code and the configuration information of the FPGA to the FLASH, to write the configuration information to the FPGA and to write the test code to the MCU device under test through the FPGA, and to read the test results of the FPGA;

[0010] The FLASH is used to store the test code of the MCU device under test and the configuration information of the FPGA;

[0011] The FPGA is used to send test stimulus to the MCU device under test and read the signal returned by the MCU device under test;

[0012] The output display unit is used to receive signals from the main controller and display test results.

[0013] In FLASH, you can store some chip test codes and corresponding FPGA configurations in advance. For new types of chips, you can connect the main controller to the computer, update the new test codes and FPGA configurations to FLASH, and refresh the display of available test items.

[0014] Furthermore, the FPGA and the MCU device under test are connected via a chip fixture.

[0015] Furthermore, the chip fixture is detachably connected to the FPGA via an external interface. The chip fixture is not directly welded to the detector, which facilitates replacement of different fixtures and implements testing of MCU chips with different packages.

[0016] Furthermore, it also has test interfaces, including JTAG, SWD software test interfaces and UART, IIC, CAN, SPI hardware test interfaces, so as to facilitate the connection of the MCU chip that has been soldered to the product, and the test interface is connected to the reserved test interface of the product.

[0017] The present invention also provides an offline MCU detection method, comprising the following steps:

[0018] S1. Connect the main controller to the computer and write the test code and FPGA configuration information into FLASH through the main controller;

[0019] S2, installing the MCU device under test on a chip fixture connected to the FPGA;

[0020] S3, sending instructions to the main controller through the input unit, reading the test code of the MCU device under test and the configuration information of the FPGA from the FLASH through the main controller, writing the configuration information to the FPGA, and writing the test code to the MCU device under test through the FPGA;

[0021] S4, sending instructions to the main controller through the input unit, notifying the FPGA to send test stimulus to the MCU device under test and start testing;

[0022] S5, FPGA reads the signal returned by the MCU device under test;

[0023] S6. The main controller reads the test result of the FPGA and displays the test result through the output display unit.

[0024] The beneficial effects of the present invention are:

[0025] The detector is small in size, light in weight, and compact in structure, making it very suitable for on-site testing. With a built-in power supply, it can be tested anytime and anywhere without relying on other equipment. The detector can also be connected to a computer to send the test results to the computer for statistics and analysis. For the users of the detector, the operation is simple and can be used after simple training. You only need to select the items to be tested. After the test is completed, the test results will be automatically displayed, which can help users further screen chips, reduce product failure rates caused by chip defects, improve product quality, and reduce after-sales problems. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is a schematic diagram of the system structure of Example 1 of the present invention. DETAILED DESCRIPTION

[0027] In order to more clearly understand the above-mentioned objects, features and advantages of the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0028] Example 1

[0029] Figure 1 A specific implementation of the offline MCU detector of the present invention is shown, including an input unit, a main controller, FLASH, FPGA, and an output display unit, wherein:

[0030] The input unit is used to send instructions to the main controller; the input unit includes a touch screen and a button, the touch screen is used as the main input device of this embodiment, and the button is used as an auxiliary input device;

[0031] The main controller is used to process the input instructions of the input unit, to write and read the test code and the configuration information of the FPGA to the FLASH, to write the configuration information to the FPGA and to write the test code to the MCU device under test through the FPGA, and to read the test results of the FPGA;

[0032] The FLASH is used to store the test code of the MCU device under test and the configuration information of the FPGA;

[0033] The FPGA is used to send test stimulus to the MCU device under test and read the signal returned by the MCU device under test;

[0034] The output display unit is used to receive signals from the main controller and display test results. In addition to being an input unit, the touch screen in this embodiment also serves as an output display unit. Of course, other display devices can also be selected as output display units connected to the main controller.

[0035] The FPGA and the MCU device under test are connected via a chip fixture, and the chip fixture is detachably connected to the FPGA via an external interface.

[0036] This embodiment also has a test interface for connecting the MCU chip that has been soldered to the product. The test interface is internally connected to the FPGA and externally connected to a reserved test interface of the product.

[0037] Example 2

[0038] Example 2 is a specific implementation of an offline MCU detection method using the detector described in Example 1, comprising the following steps:

[0039] S1. Connect the main controller to the computer and write the test code and FPGA configuration information into FLASH through the main controller;

[0040] S2, installing the MCU device under test on a chip fixture connected to the FPGA;

[0041] S3, sending instructions to the main controller through the input unit, reading the test code of the MCU device under test and the configuration information of the FPGA from the FLASH through the main controller, writing the configuration information to the FPGA, and writing the test code to the MCU device under test through the FPGA;

[0042] S4, sending instructions to the main controller through the input unit, notifying the FPGA to send test stimulus to the MCU device under test and start testing;

[0043] S5, FPGA reads the signal returned by the MCU device under test;

[0044] S6. The main controller reads the test result of the FPGA and displays the test result through the output display unit.

[0045] The above embodiments of the present invention are merely examples for illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, other different forms of changes and modifications can be made based on the above description. It is impossible to list all the embodiments here. Any obvious changes or modifications derived from the technical solution of the present invention are still within the scope of protection of the present invention.

Claims

1. An offline MCU detector, characterized in that: It includes input unit, main controller, FLASH, FPGA, output display unit, among which: The input unit is used to send a test instruction to the main controller; The main controller is used to process the input instructions of the input unit, to write and read the test code and the configuration information of the FPGA to the FLASH, to write the configuration information to the FPGA and to write the test code to the MCU device under test through the FPGA, and to read the test results of the FPGA; The FLASH is used to store the test code of the MCU device under test and the configuration information of the FPGA; The FPGA is used to send test stimulus to the MCU device under test and read the signal returned by the MCU device under test; The output display unit is used to receive signals from the main controller and display test results.

2. An offline MCU detector according to claim 1, characterized in that: The FPGA and the MCU device under test are connected via a chip fixture.

3. An offline MCU detector according to claim 2, characterized in that: The chip fixture is detachably connected to the FPGA via an external interface.

4. An offline MCU detector according to claim 1, characterized in that: It also has test interfaces, including JTAG, SWD software test interfaces and UART, IIC, CAN, SPI hardware test interfaces.

5. An offline MCU detection method, characterized in that: The steps include: S1. Connect the main controller to the computer and write the test code and FPGA configuration information into FLASH through the main controller; S2, installing the MCU device under test on a chip fixture connected to the FPGA; S3, sending instructions to the main controller through the input unit, reading the test code of the MCU device under test and the configuration information of the FPGA from the FLASH through the main controller, writing the configuration information to the FPGA, and writing the test code to the MCU device under test through the FPGA; S4, sending instructions to the main controller through the input unit, notifying the FPGA to send test stimulus to the MCU device under test and start testing; S5. FPGA reads the signal returned by the MCU device under test; S6. The main controller reads the test result of the FPGA and displays the test result through the output display unit.

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