Electronic load system, power supply testing method, electronic device and storage medium

Abstract

The present application discloses an electronic load system, a power supply testing method, an electronic device, and a storage medium, relating to the field of electrical technologies. The main control circuit can provide a reference voltage to the current sampling and control circuit and can also obtain load current setting parameters. The current sampling and control circuit mainly determines the control voltage by comparing the sampled voltage with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and further control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the change rate of the current, the rapid change of the load current can be realized. Therefore, the technical problem of how to achieve the rapid change of the current and improve the accuracy of the test results can be solved, and the technical effect of meeting the requirement of the rapid change of the current and improving the test results can be achieved.

Description

Technical Field

[0001] The present application relates to the field of electrical technologies, and in particular, to an electronic load system, a power supply testing method, an electronic device, and a storage medium. Background Art

[0002] In the field of electronic technologies, the integrity testing of board-level power supplies is a key link to ensure the power quality of circuit boards. As an important part of the integrity testing of board-level power supplies, dynamic load pulling testing is mainly used to evaluate the response ability and stability of a power supply when the load changes rapidly. Currently, dynamic load pulling testing is mainly implemented by relying on an electronic load instrument.

[0003] In the integrity testing of board-level power supplies, for a DC circuit with a digital chip as the load, a relatively high requirement is imposed on the slope of current change. However, for existing electronic load systems or instruments, the nominal maximum load pulling slope is relatively low, and the actual value cannot reach the nominal index, making it impossible to quickly change the current. Therefore, the test results will be inaccurate. Summary of the Invention

[0004] The present application provides an electronic load system, a power supply testing method, an electronic device, and a storage medium, so as to at least solve the problem in the related art that for existing electronic load systems or instruments, the nominal maximum load pulling slope is relatively low, the actual value cannot reach the nominal index, it is impossible to quickly change the current, and thus the test results will be inaccurate.

[0005] The present application provides an electronic load system, including: a main control circuit, a current sampling and control circuit, a power circuit, and a working power supply circuit.

[0006] The working power supply circuit is configured to provide a working voltage for the main control circuit.

[0007] The main control circuit is configured to obtain pre-configured load current parameters, convert the working voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit; wherein, the reference voltage is a stable voltage value serving as a reference standard in the electronic load system.

[0008] The current sampling and control circuit is configured to perform voltage sampling processing on the power circuit to obtain a sampling voltage, perform differential operation processing on the sampling voltage and the reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit.

[0009] The power circuit is configured to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and the load current parameters to obtain a target current, wherein the load current parameters are at least used to control the rate of adjusting the magnitude of the current.

[0010] The present application also provides a power supply testing method, which is applied to the above-mentioned electronic load system and includes:

[0011] Obtain the pre-configured load current parameter, and convert the working voltage into a reference voltage based on the load current parameter; wherein, the reference voltage is a stable voltage value serving as a reference standard in the electronic load system;

[0012] Perform voltage sampling processing on the power circuit of the electronic load system to obtain a sampled voltage, and perform differential operation processing based on the sampled voltage and the reference voltage to obtain a control voltage; wherein, the electronic load system is a pre-constructed system for performing power supply testing;

[0013] Adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the magnitude of the current.

[0014] The present application also provides a power supply testing device, including:

[0015] An acquisition unit, configured to obtain the pre-configured load current parameter, and convert the working voltage into a reference voltage based on the load current parameter; wherein, the reference voltage is a stable voltage value serving as a reference standard in the electronic load system;

[0016] A sampling unit, configured to perform voltage sampling processing on the power circuit of the electronic load system to obtain a sampled voltage;

[0017] An operation unit, configured to perform differential operation processing based on the sampled voltage and the reference voltage to obtain a control voltage; wherein, the electronic load system is a pre-constructed system for performing power supply testing;

[0018] An adjustment unit, configured to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the magnitude of the current.

[0019] The present application also provides an electronic device, including: a memory, configured to store a computer program; a processor, configured to implement the steps of any one of the above-mentioned power supply testing methods when executing the computer program.

[0020] The present application also provides a computer-readable storage medium, in which a computer program is stored, and wherein the computer program implements the steps of any one of the above-mentioned power supply testing methods when executed by a processor.

[0021] The present application also provides a computer program product, including a computer program which, when executed by a processor, implements the steps of any one of the above power test methods.

[0022] Through the electronic load system, power test method, electronic device, and storage medium of the present application, the main control circuit can provide a reference voltage to the current sampling and control circuit, and can also obtain load current setting parameters. The current sampling and control circuit mainly determines the control voltage by comparing the sampled voltage with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and further control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the change rate of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve the rapid change of the current and improve the accuracy of the test results can be solved, and the technical effect of meeting the requirement of the rapid change of the current and improving the test results can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.

[0024] Figure 1 It is a schematic structural diagram of an electronic load system provided by an embodiment of the present application;

[0025] Figure 2 It is a working block diagram of an electronic load system provided by an embodiment of the present application;

[0026] Figure 3 It is a schematic diagram of the page of a host computer provided by an embodiment of the present application;

[0027] Figure 4 It is a schematic diagram of a current control loop provided by an embodiment of the present application;

[0028] Figure 5 It is a schematic flowchart of a power test method provided by an embodiment of the present application;

[0029] Figure 6 It is a schematic structural diagram of a power test device provided by an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0030] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the protection scope of the present application.

[0031] It should be noted that in the description of the present application, the terms "including", "comprising" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or device. The terms "first", "second", etc. in the present application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0032] In order to enable those skilled in the art of the present technology to better understand the solution of the present application, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0033] In combination with the specific application environment architecture or specific hardware architecture on which the execution of the power supply test method depends, the specific application environment architecture or specific hardware architecture will be described herein.

[0034] Figure 1 It is a schematic structural diagram of an electronic load system provided by the present application. The execution of the power supply test method depends on the electronic load system.

[0035] As Figure 1 shown, the electronic load system includes: a main control circuit 11, a current sampling and control circuit 12, a power circuit 13, and a working power supply circuit 14.

[0036] The working power supply circuit 14 is used to provide a working voltage for the main control circuit 11.

[0037] The main control circuit 11 is used to obtain pre-configured load current parameters, convert the working voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit 12.

[0038] The current sampling and control circuit 12 is used to perform voltage sampling processing on the power circuit to obtain a sampling voltage, perform differential operation processing on the sampling voltage and the reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit 13.

[0039] A power circuit 13 is used to adjust the on-resistance in the power circuit according to a control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain a target current. The load current parameter is at least used to control the rate of adjusting the magnitude of the current.

[0040] Among them, the main control circuit 11 can be a digital control circuit composed of STM32F103 as the main control chip. Its main function is to give a reference voltage to the current sampling and control circuit 12 through the Digital-to-Analog (DAC) function to control the current passing through the Metal-Oxide-Semiconductor (MOS). It can also communicate with the host computer to obtain the load current setting parameters, and can also achieve multi-machine parallel operation through the Inter-Integrated Circuit (IIC). The current sampling and control circuit 12 is mainly composed of an operational amplifier. By comparing the current value flowing through the MOS with the given value of the main control chip, it controls the on-resistance of the MOS, and further controls the magnitude of the current passing through the MOS. The power circuit 13 is mainly composed of four MOSs (on-resistances) and is used to absorb current as a load. Due to its characteristic of being able to conduct and turn off quickly, it can achieve the function of rapid change of the load current. The working power supply circuit 14 mainly functions to provide the necessary power supply voltage for the main control circuit 11 to ensure the normal operation of the entire electronic load system. Its components include but are not limited to: power adapters, voltage regulators and other components to ensure that the output voltage is stable and meets the requirements of the main control circuit 11.

[0041] Furthermore, for the convenience of understanding the embodiments of the present application, the present application also provides a working block diagram of an electronic load system, as Figure 2 shown. Among them, the main control circuit is connected to the host computer, the working power supply circuit and the current sampling and control circuit, and the power circuit is connected to the device to be detected and the current sampling and control circuit.

[0042] The main control circuit 11, as the control center of the system, includes but is not limited to: a main control chip, a digital-to-analog conversion module (DAC), a communication interface and a logic control unit. The main control chip (such as: STM32F103) receives the load current parameters set by the external host computer through the communication interface, including but not limited to: target current value, current change rate, extreme current duration, etc. The digital-to-analog conversion module converts the target current value in the load current parameters into a corresponding reference voltage signal.

[0043] The current sampling and control circuit 12 includes but is not limited to: a voltage sampling module, a differential operational amplifier, and a signal driving unit. The voltage sampling module obtains a tiny voltage drop signal (i.e., the sampling voltage) corresponding to the actual current flowing through the load by bridging the detection points across both ends of the sampling resistor in the power circuit 13. The differential operational amplifier performs multi-stage amplification and signal conditioning on the sampling voltage, and performs a differential operation with the reference voltage output by the main control circuit to generate a control voltage representing the error. After the control voltage enhances the driving ability through a signal driving unit (such as a voltage follower composed of transistors), it is transmitted to the power circuit 13 to adjust the magnitude of the on-resistance in the power circuit. Through the closed-loop feedback mechanism, the dynamic difference between the sampling voltage and the reference voltage is corrected in real time to ensure the accurate tracking of the output current.

[0044] The power circuit 13 consists of power metal-oxide-semiconductor field-effect transistors (MOS) connected in parallel, a sampling resistor, and a gate control network. The MOS acts as a variable load device, and its on-resistance is controlled by the gate voltage. When the control voltage is applied to the gate of the MOS, its on-resistance dynamically adjusts with the voltage change, thereby changing the current value flowing through the MOS. The sampling resistor is connected in series in the load loop, and its resistance value is in the milliohm level, which is used to convert the current value into a measurable voltage signal for the current sampling and control circuit 12 to perform feedback calculations. The parallel design of multiple MOSs not only expands the maximum current-carrying capacity of the system but also realizes the refined adjustment of the on-resistance through independent gate control. The set current change rate in the load current parameters is finally converted into the adjustment speed of the on-resistance in the power circuit 13 through the programming control of the reference voltage change rate by the main control circuit 11, so as to realize the controllable slope of the output current.

[0045] The working power supply circuit 14 is the energy supply unit of the system, and its functions include but are not limited to: converting the external input voltage into a stable low-voltage DC power supply to provide an appropriate working voltage for the main control circuit 11 and other functional modules. The working voltage usually includes multi-stage voltage outputs. For example, 5V and 3.3V power supplies are generated through a low-dropout linear regulator (LDO) to drive the digital control unit and the analog signal processing circuit respectively, ensuring that each module operates in a low-noise and high-stability power supply environment.

[0046] The pre-configured load current parameters include, but are not limited to: the minimum value of the load current, the maximum value of the load current, the maximum current duration, the minimum current duration, and the current change rate (A / μs). At the same time, the load current parameters, as control variables of external input, cover dimensions such as the target current extreme value, change rate, and duration. The change rate is defined by the current change amount per unit time (such as A / μs), and through the main control circuit 11, it is mapped to the slope of the reference voltage signal, thereby controlling the adjustment step interval and amplitude of the on-resistance in the power circuit 13. For example: during the stage where the current rises from the minimum value to the maximum value, the system decomposes the target current into multiple discrete steps, each step corresponding to an incremental change in the reference voltage, and achieves precise control of the overall slope through a preset time interval. The parameterized control mechanism enables the electronic load system to simulate the transient current characteristics of the digital chip load and is applicable to high-demand scenarios such as power supply dynamic response testing.

[0047] Through the electronic load system of the present application, the main control circuit can give a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by comparing the sampled voltage with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and further control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameters can control the change rate of the current, the rapid change of the load current can be realized. Therefore, the technical problem of how to achieve the rapid change of the current and improve the accuracy of the test results can be solved, and the technical effect of meeting the demand for the rapid change of the current and improving the test results can be achieved.

[0048] In an implementable embodiment of the present application, the main control circuit 11 includes: a main control chip 111 and a communication interface 112.

[0049] The communication interface 112 is used to obtain a configuration instruction for pre-configuring the load current parameters from a preset host device; wherein, the configuration instruction includes parameter information of the load current parameters.

[0050] The main control chip 111 is used to perform parameter configuration processing in the electronic load system according to the configuration instruction and the parameter information to obtain the load current parameters.

[0051] The main control chip 111 is further used to perform voltage conversion processing on the working voltage based on the load current parameters through the digital-to-analog conversion function, and output the reference voltage through the first preset pin of the main control chip.

[0052] Among them, the hardware part of the main control circuit 11 includes but is not limited to: the main control chip 111, crystal oscillator, status indicator light, program burning interface, communication interface 112 (such as: Universal Asynchronous Receiver / Transmitter (URAT) interface, Inter-Integrated Circuit (I2C) interface, Controller Area Network (CAN) interface), load switch, etc. The main control chip 111 is the control center of the device and is responsible for the normal operation of the device. After the device is powered on, the main control chip 111 first receives the instructions issued by the host computer through the URAT interface, completes the setting of the load current-related parameters (i.e., load current parameters). The DAC function of the main control chip 111 can output different voltages of 0-3V through the first preset pin (i.e., reference voltage), so as to control the current value passing through the MOS. By controlling the change rate of the voltage value output by the first preset pin of the main control chip 111, the current change rate (A / us) can be controlled. Multiple devices can be interconnected through the I2C interface to achieve multi-machine parallel operation, improving the upper limit of the maximum load current. The load switch can control the load when the device is single and can also achieve common load for each device when multiple devices are in parallel.

[0053] The main control chip 111, as the core processing unit of the main control circuit 11, integrates a digital-to-analog conversion module (DAC), multi-task scheduling function and high-speed operation ability, and is responsible for executing parameter configuration processing and voltage conversion processing. The communication interface 112 is the data interaction channel between the main control circuit 11 and external devices, supports a variety of industrial standard protocols, can receive configuration instructions from a preset host computer device (such as: computer or industrial control computer), and transmits the parameter information in the instructions to the main control chip 111. At the same time, regarding the host computer device, this application provides a page schematic diagram of the host computer, such as Figure 3 shown, through the host computer device, the parameter information of the load current parameter can be provided.

[0054] The first preset pin is the physical output port of the main control chip 111, and transmits the generated reference voltage signal to the current sampling and control circuit 12. The first preset pin is connected to the external filter network through a low-impedance drive circuit to reduce noise interference and voltage drop during signal transmission. For example: the 20# pin of the STM32F103 chip is configured as the first preset pin, and its output voltage range covers 0-3.3V, corresponding to the preset extreme value range of the load current.

[0055] The co - design of the main control chip 111 and the communication interface 112 realizes the flexible configuration and high - dynamic response ability of the electronic load system, enabling the system to adapt to different host computer environments and supporting remote control and automated test scenarios. The main control chip 111 converts complex load current requirements into executable voltage control sequences through parameter configuration processing, and combines digital - to - analog conversion functions to achieve high - precision reference voltage output, ensuring the controllability and repeatability of the current adjustment process. This enables the electronic load system to quickly respond to host computer instructions, accurately simulate various load transient characteristics, and provide a highly reliable dynamic load simulation ability for power supply testing.

[0056] In an implementable embodiment of the present application, the power circuit 13 includes: a sampling resistor 131,

[0057] The sampling resistor 131 is used to determine the sampling position for the current sampling and control circuit 12 to perform voltage sampling processing from the power circuit 13.

[0058] Among them, the sampling resistor 131 is a key sensing element in the power circuit. It is made of low - resistance and high - precision materials (such as: manganin alloy), and is connected in series in the main circuit of the load current. The resistance value of the sampling resistor 131 is designed to be in the milliohm range (for example: 1mΩ). When carrying a large current, it generates a small voltage drop that is linearly related to the current value, while avoiding introducing significant additional power consumption. The two ends of the sampling resistor 131 form the physical sampling position for voltage sampling processing. That is, when the current flows through the resistor, the voltage difference across the resistor directly reflects the instantaneous current value. By placing the sampling resistor 131 on the main current path of the power circuit, it is ensured that all currents flowing through the load are accurately captured, providing a real - time feedback signal for closed - loop control.

[0059] The precise layout and parameter design of the sampling resistor 131 significantly improve the reliability of current detection and the stability of system control. By placing the sampling resistor 131 at a key position in the main current path, the system can real - time capture the true value of the load current, providing a high - fidelity signal source for closed - loop feedback.

[0060] In an implementable embodiment of the present application, the current sampling and control circuit 12 is also used for:

[0061] Performing current sampling processing from the position of the sampling resistor 131 in the power circuit 13 to obtain a sampled current;

[0062] Performing voltage calculation processing based on the sampled current and the sampling resistor 131 in the power circuit 13 to obtain a sampled voltage.

[0063] Among them, the sampled current is the result output of current sampling processing, and its value represents the actual load current currently flowing through the power circuit 13. The acquisition of the sampled current depends on the collaborative optimization of the physical characteristics of the sampling resistor 131 and the circuit design: the low resistance characteristic of the sampling resistor 131 ensures controllable power loss in high-current scenarios, while the high-precision material and temperature compensation design (such as: copper-manganese alloy and thermistor compensation network) guarantees the resistance stability, so that the calculation result of the sampled current is not affected by environmental temperature fluctuations.

[0064] Voltage calculation processing is the step of converting the sampled current into an equivalent voltage signal. The current sampling and control circuit 12 can perform a multiplication operation on the sampled current and the known resistance value of the sampling resistor 131 based on Ohm's law to generate a corresponding sampled voltage. The sampled voltage, as the output result of voltage calculation processing, is the core feedback variable of the closed-loop control loop. The sampled voltage and the reference voltage output by the main control circuit 11 are jointly input to the differential operational amplifier to generate a control voltage representing the deviation between the target current and the actual current.

[0065] The current sampling and control circuit realizes the high-fidelity capture and precise conversion of the current signal through the combination of physical sampling and algorithm calculation. The current sampling processing is directly associated with the main current path of the power circuit 13 to ensure the real-time and authenticity of the feedback signal. The voltage calculation processing converts the current value into a voltage signal, forming a comparison in the same dimension with the reference voltage of the main control circuit 11, which simplifies the design complexity of the closed-loop control logic.

[0066] In an implementable embodiment of the present application, the current sampling and control circuit 12 includes: an operational amplifier 121,

[0067] The operational amplifier 121 includes a first differential amplification circuit 1211 and a second differential amplification circuit 1212;

[0068] The first differential amplification circuit 1211 is used to perform voltage amplification processing on the sampled voltage to obtain the amplified sampled voltage, and perform voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result;

[0069] The first differential amplification circuit 1211 is further used to perform proportional and integral operation processing according to the voltage comparison result to obtain an initial control voltage;

[0070] The second differential amplification circuit 1212 is used to perform voltage amplification processing on the initial control voltage to obtain a control voltage.

[0071] Among them, the current sampling and control circuit 12 includes but is not limited to: an operational amplifier 121, a transistor. The operational amplifier 121 is (for example: LM358). There are two differential operational amplifier circuits inside the operational amplifier (the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212). One of the differential operational amplifier circuits (the first differential amplifier circuit 1211) is connected to the voltages at both ends of the sampling resistor 131 through two pins of the operational amplifier 121 (for example: pin 3# and pin 2#), and then the voltage signal at both ends of the sampling resistor 131 is amplified by a preset multiple (for example: 30 times) through the first differential amplifier circuit 1211 and output to the subsequent operational circuit. The other differential amplifier circuit (the second differential amplifier circuit 1212) is connected to the output end of the previous-stage operation through another pin of the operational amplifier 121 (for example: pin 6#). One pin of the operational amplifier 121 (for example: pin 5#) is connected to the first preset pin of the main control chip 111. After differential operation and amplification of two pins of the operational amplifier (that is, pin 5# and pin 6#), the control voltage is amplified by a preset multiple (for example: 100 times) and output to the pin of the operational amplifier 121 (for example: pin 7#). The voltage output from pin 7# of the operational amplifier 121 acts on the base of the transistor through a resistor. The transistor and the resistor here form a voltage follower circuit, mainly to improve the driving ability of the voltage output from pin 7# of the operational amplifier 121.

[0072] The function of the current sampling and control circuit 12 is to collect the voltage across the sampling resistor 131, amplify the voltage across the sampling resistor 131 by 30 times using a differential operation circuit, and then perform a differential operation on the amplified voltage and the voltage value (reference voltage) output from the first preset pin of the main control chip 111 to obtain a control voltage. The control voltage enhances the driving ability through a transistor to control the on-resistance of the MOS, thereby achieving the purpose of controlling the current flowing through the MOS.

[0073] The cascaded design of the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212 realizes the hierarchical optimization of signal conditioning and error correction. The first differential amplifier circuit 1211 converts the weak current feedback signal into an error correction amount through high-precision differential amplification and proportional-integral operation, effectively suppressing external interference and improving system stability; the second differential amplifier circuit 1212 ensures that the amplitude and purity of the control voltage meet the driving requirements of the power device through secondary gain improvement and noise filtering.

[0074] In an implementable embodiment of the present application, the current sampling and control circuit 12 is further used for:

[0075] When it is determined according to the voltage comparison result that the amplified sampling voltage is greater than the reference voltage, perform a difference calculation process based on the amplified sampling voltage and the reference voltage to obtain a first voltage difference;

[0076] Perform proportional and integral operation processing based on the first voltage difference to obtain a first initial control voltage, and perform voltage amplification processing on the first initial control voltage to obtain a first control voltage; wherein, the first control voltage is used to increase and adjust the on-resistance in the power circuit.

[0077] In the case where it is determined according to the voltage comparison result that the amplified sampling voltage is less than the reference voltage, perform difference calculation processing based on the amplified sampling voltage and the reference voltage to obtain a second voltage difference.

[0078] Perform proportional and integral operation processing based on the second voltage difference to obtain a second initial control voltage, and perform voltage amplification processing on the second initial control voltage to obtain a second control voltage; wherein, the second control voltage is used to decrease and adjust the on-resistance in the power circuit.

[0079] Wherein, the voltage comparison result is the logical output of the first differential amplifier circuit comparing the amplified sampling voltage with the reference voltage. When the amplified sampling voltage is greater than the reference voltage, it indicates that the actual load current exceeds the target set value, and the on-resistance of the power device needs to be adjusted to reduce the current; conversely, if the amplified sampling voltage is less than the reference voltage, it indicates that the actual current does not reach the target value, and the on-resistance needs to be decreased to increase the current.

[0080] The difference calculation processing quantifies the deviation amplitude between the sampling voltage and the reference voltage based on the voltage comparison result. When the amplified sampling voltage is greater than the reference voltage, calculate the positive difference between the two (i.e., the first voltage difference), which is a positive voltage signal reflecting the severity of current overshoot; when the amplified sampling voltage is less than the reference voltage, calculate the negative difference between the two (i.e., the second voltage difference), which is a negative voltage signal reflecting the deviation amount of current shortage.

[0081] The proportional and integral operation processing applies control algorithms to the first voltage difference and the second voltage difference respectively. For the first voltage difference (positive deviation), the proportional operation module generates a correction amount proportional to the deviation amount according to the preset proportional coefficient, and the integral operation module accumulatively integrates the duration of the deviation. The two are superimposed to form a first initial control voltage. This voltage is a negative signal, which is amplified by the second differential amplifier circuit to generate a first control voltage. Its high level drives the gate voltage of the MOS device in the power circuit 13 to increase, thereby increasing the on-resistance and forcing the load current to decrease to approach the target value. For the second voltage difference (negative deviation), the proportional-integral operation generates a positive second initial control voltage, which is amplified to form a second control voltage. Its low level drives the gate voltage of the MOS device to decrease, reducing the on-resistance and prompting the load current to rise to the set range.

[0082] The dual - path difference processing mechanism of the current sampling and control circuit 12 realizes the bidirectional and precise regulation of the load current. By distinguishing overshoot and undershoot states and applying differential control strategies, the system can quickly respond to current deviations, avoiding oscillation or overshoot problems that may be caused by unidirectional regulation. The introduction of proportional - integral operation not only improves the dynamic response speed but also effectively suppresses the steady - state error through the cumulative effect of the integral term, ensuring strict tracking of the current value during long - term operation.

[0083] In an implementable embodiment of the present application, the power circuit 13 is further configured to transmit the target current to the device to be detected;

[0084] The power circuit 13 is further configured to adjust the magnitude of the current according to the adjusted on - resistance and the preset current change slope included in the load current parameters to obtain the target current.

[0085] Among them, through the closed - loop control and dynamic adjustment mechanism, the precisely programmed target current is applied to the device to be detected, and the controllable change of the current waveform is realized based on the preset current change slope. The power circuit 13, as the final execution unit of the load current, has both the dual functions of current transmission and dynamic regulation.

[0086] The power circuit 13 significantly improves the reliability and scenario adaptability of the power supply test through the precise transmission and dynamic adjustment of the target current.

[0087] In an implementable embodiment of the present application, the power circuit 13 is further configured to:

[0088] Increase the on - resistance in the power circuit according to the first control voltage, and reduce the current according to the adjusted on - resistance and the load current parameters;

[0089] Reduce the on - resistance in the power circuit according to the second control voltage, and increase the current according to the adjusted on - resistance and the load current parameters.

[0090] Among them, the bidirectional dynamic adjustment ability of the power circuit endows the electronic load system with extremely high scenario adaptability and control precision. Through the precise drive of the first control voltage and the second control voltage, the system can complete the up - and - down regulation of the current within the microsecond time scale, accurately reproducing the transient current characteristics of the digital chip load. The closed - loop adjustment mechanism of the on - resistance effectively suppresses the influence of non - ideal factors such as device parameter discreteness and temperature drift on current control, ensuring linear regulation characteristics within a wide current range (such as: 0A to 30A).

[0091] In an implementable embodiment of the present application, in order to understand the current control process of the present application, the present application also provides a schematic diagram of the current control loop, as Figure 4As shown, where the sampling resistor and the MOS are resistors in the power circuit 13, the MOS is the on-resistance, the differential amplifier circuit is a circuit in the current sampling and control circuit 12 (including the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212), the single-chip microcomputer outputs the working voltage output in the working power supply circuit 14, which represents the digital-to-analog (DA) output of the single-chip microcomputer, and proportional-integral-derivative (PID) represents the process of generating a control voltage according to the sampling voltage and the reference voltage through the PID algorithm, and the voltage between gate and source (VGS) is the control voltage.

[0092] Embodiments of the present application provide a method for expansion and update. The method will be described in detail in combination with the execution process of the expansion and update method.

[0093] As Figure 5 shown, Figure 5 is a schematic flow chart of a power supply test method provided by the present application. The power supply test method is applied to Figure 1 the described electronic load system, including:

[0094] Step 501: Obtain the pre-configured load current parameter, and convert the working voltage into a reference voltage based on the load current parameter; where the reference voltage is a stable voltage value used as a reference standard in the electronic load system.

[0095] In the embodiments of the present application, the device to be detected is connected to the electronic load system. Before the electronic load system works, the host computer needs to set parameters for it according to the test requirements of the device to be detected. After the load switch of the electronic load system is started, the electronic load system will perform a current drawing process according to the set load current parameter.

[0096] The load current parameter is pre-configured by the host computer and transmitted to the main control circuit of the electronic load system. The main control circuit converts the digital load current parameter into an analog voltage signal, that is, the reference voltage, through the digital-to-analog conversion function (DAC).

[0097] The reference voltage serves as the set reference for closed-loop control, and its amplitude has a linear proportional relationship with the target current value. For example, in the current-voltage mapping table, a target current of 30 A corresponds to a reference voltage of 3 V. The stability of the reference voltage is ensured by the high-precision reference source and low-noise power supply circuit of the main control circuit, guaranteeing that the voltage value used as the reference standard has no drift or fluctuation during the dynamic test. At the same time, the change rate in the load current parameter is parsed by the main control chip into a slope control instruction for the reference voltage. By adjusting the step interval and amplitude of the DAC output value, the linear increase or decrease of the reference voltage is achieved, thereby indirectly controlling the rate of current change.

[0098] Step 502: Perform voltage sampling processing on the power circuit of the electronic load system to obtain a sampled voltage, and perform differential operation processing on the sampled voltage and the reference voltage to obtain a control voltage. Here, the electronic load system is a pre-constructed system for power supply testing.

[0099] In the embodiment of this application, the sampling resistor connected in series in the power circuit of the electronic load system converts the current flowing through the load into a millivolt-level voltage drop signal. The current sampling and control circuit collects and amplifies the voltage across the sampling resistor through a high-precision differential amplifier to obtain a sampled voltage representing the actual current value. After filtering and conditioning, the sampled voltage and the reference voltage are input to a differential operational amplifier for difference operation. The essence of the differential operation is to calculate the algebraic difference between the reference voltage and the sampled voltage, generating an error signal (i.e., the control voltage) that reflects the direction and magnitude of the current deviation. For example, when the sampled voltage is lower than the reference voltage, the result of the difference operation is a positive signal, indicating that the actual current has not reached the target value and the load current needs to be increased; conversely, it is a negative signal, indicating that the current needs to be decreased. During this process, the high common-mode rejection ratio characteristic of the differential operational amplifier effectively filters out ground wire noise and common-mode interference, ensuring the accuracy of error extraction.

[0100] Step 503: Adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain the target current. Here, the load current parameter is at least used to control the rate of adjusting the size of the current.

[0101] In the embodiment of this application, the amplified control voltage acts on the gate of the parallel MOS device in the power circuit, and the size of the MOS on-resistance is changed by adjusting the gate voltage. When the control voltage increases, the conductive channel of the MOS becomes narrower, the on-resistance increases, resulting in a decrease in the current flowing through the load; conversely, when the control voltage decreases, the on-resistance decreases and the load current increases accordingly.

[0102] The adjustment process is combined with the preset change rate in the load current parameter. For example, in a scenario where the current increases at a rate of 10A / μs, the system increases the target current value every microsecond. The adjusted on-resistance and the real-time current value form a negative feedback loop, so that the load current is finally stabilized in the target range, completing the dynamic load test of the device to be tested.

[0103] Through the electronic load system and power supply test method, electronic device and storage medium of the present application, the main control circuit can give a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by collecting the sampling voltage and comparing it with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and then control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the rate of change of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve rapid change of current and improve the accuracy of the test results can be solved, so as to meet the demand for rapid change of current and improve the technical effect of the test results.

[0104] In an achievable embodiment of the present application, differential operation processing is performed based on the sampling voltage and the reference voltage, and it can also be implemented in but not limited to the following ways: performing voltage amplification processing on the sampling voltage to obtain an amplified sampling voltage, and performing voltage comparison processing on the amplified sampling voltage and the reference voltage to obtain a voltage comparison result; performing proportional and integral operation processing on the voltage comparison result to obtain an initial control voltage, and performing voltage amplification processing on the initial control voltage to obtain a control voltage.

[0105] In the embodiments of the present application, the collaborative design of multi-stage voltage amplification and proportional-integral regulation gives the differential operation processing high precision and strong robustness. The voltage amplification process converts weak current signals into usable feedback with high signal-to-noise ratio through gain enhancement and common-mode suppression; the voltage comparison process realizes real-time dynamic calibration between target value and actual value, providing accurate error input for closed-loop control; the proportional-integral operation takes into account transient response speed and long-term regulation accuracy through algorithm fusion; the secondary voltage amplification ensures that the control signal has voltage and current margin to drive the power device.

[0106] This processing flow enables the electronic load system to quickly converge to the target current under complex working conditions and maintain stable output under load changes or external interference, providing a highly reliable methodological basis for dynamic performance testing of power supplies.

[0107] In an achievable embodiment of the present application, when obtaining the control voltage, the following methods may also be used but are not limited to: when it is determined according to the voltage comparison result that the amplified sampling voltage is greater than the reference voltage, perform a difference calculation process based on the amplified sampling voltage and the reference voltage to obtain a first voltage difference; perform proportional and integral operation processing on the first voltage difference to obtain a first initial control voltage, and perform voltage amplification processing on the first initial control voltage to obtain a first control voltage; wherein, the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit; when it is determined according to the voltage comparison result that the amplified sampling voltage is less than the reference voltage, perform a difference calculation process based on the amplified sampling voltage and the reference voltage to obtain a second voltage difference; perform proportional and integral operation processing on the second voltage difference to obtain a second initial control voltage, and perform voltage amplification processing on the second initial control voltage to obtain a second control voltage; wherein, the second control voltage is used to decrease and adjust the magnitude of the on-resistance in the power circuit.

[0108] In the embodiment of the present application, the bidirectional adjustment mechanism based on the voltage comparison result significantly improves the dynamic performance and steady-state accuracy of the power supply test method. The independent processing strategy for overshoot and undershoot states enables the system to apply optimal adjustment parameters for different deviation characteristics, avoiding response hysteresis or overshoot oscillation caused by unidirectional adjustment. The differential configuration of the proportional-integral operation parameters effectively suppresses the integral saturation phenomenon while ensuring rapid correction, ensuring the stable convergence of the system under sudden loads. The directional adjustment of the on-resistance combined with the non-linear electrical characteristics of MOS devices realizes the efficient linearization control of current, enabling the device under test to expose its true performance characteristics in various dynamic test scenarios.

[0109] The generation and driving mechanism of the bidirectional control voltage provides underlying support for the accurate reproduction of complex load waveforms, meeting the diverse requirements of high-precision power supply verification.

[0110] In an achievable embodiment of the present application, when adjusting the current, the following methods may also be used but are not limited to: increase and adjust the on-resistance in the power circuit according to the first control voltage, and decrease the current according to the adjusted on-resistance and the load current parameter to obtain the target current; or, decrease and adjust the on-resistance in the power circuit according to the second control voltage, and increase the current according to the adjusted on-resistance and the load current parameter to obtain the target current.

[0111] In the embodiment of the present application, the bidirectional current adjustment mechanism endows the power supply test method with extremely high scenario adaptability and control flexibility. The independent driving logic of the first control voltage and the second control voltage enables the system to quickly respond to the overshoot and undershoot states of the current, avoiding response hysteresis or steady-state error accumulation caused by unidirectional adjustment.

[0112] In summary, the present application can achieve the following technical effects:

[0113] In the present application, the main control circuit can provide a reference voltage to the current sampling and control circuit, and can also obtain the load current setting parameters. The current sampling and control circuit mainly determines the control voltage by comparing the sampled voltage with the reference voltage, so as to control the on-resistance in the power circuit through the control voltage, and further control the magnitude of the current passing through the on-resistance. At the same time, since the load current parameter can control the change rate of the current, the rapid change of the load current can be achieved. Therefore, the technical problem of how to achieve the rapid change of the current and improve the accuracy of the test results can be solved, and the technical effect of meeting the requirement of the rapid change of the current and improving the test results can be achieved.

[0114] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by means of software plus a necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases, the former is a better implementation manner.

[0115] An embodiment of the present application further provides a power supply test device. Figure 6 As shown in the structural schematic diagram of a power supply test device provided by the present application, Figure 6 it includes:

[0116] An acquisition unit 61, configured to acquire pre-configured load current parameters, and convert the working voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system;

[0117] A sampling unit 62, configured to perform voltage sampling processing on the power circuit of the electronic load system to obtain a sampled voltage;

[0118] An operation unit 63, configured to perform differential operation processing on the sampled voltage and the reference voltage to obtain a control voltage; wherein, the electronic load system is a pre-constructed system for performing power supply tests;

[0119] An adjustment unit 64, configured to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and the load current parameters to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the magnitude of the current.

[0120] In an embodiment of the present application, the operation unit 63 is further configured to:

[0121] Perform voltage amplification processing on the sampled voltage to obtain the amplified sampled voltage, and perform voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result;

[0122] Perform proportional and integral operation processing according to the voltage comparison result to obtain an initial control voltage, and perform voltage amplification processing on the initial control voltage to obtain a control voltage.

[0123] In an embodiment of the present application, the operation unit 63 is further configured to:

[0124] In the case where it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, perform difference calculation processing on the amplified sampled voltage and the reference voltage to obtain a first voltage difference;

[0125] Perform proportional and integral operation processing according to the first voltage difference to obtain a first initial control voltage, and perform voltage amplification processing on the first initial control voltage to obtain a first control voltage; wherein, the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit;

[0126] In the case where it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, perform difference calculation processing on the amplified sampled voltage and the reference voltage to obtain a second voltage difference;

[0127] Perform proportional and integral operation processing according to the second voltage difference to obtain a second initial control voltage, and perform voltage amplification processing on the second initial control voltage to obtain a second control voltage; wherein, the second control voltage is used to decrease and adjust the magnitude of the on-resistance in the power circuit.

[0128] In an embodiment of the present application, the adjustment unit 64 is further configured to:

[0129] Increase and adjust the on-resistance in the power circuit according to the first control voltage, and perform current reduction processing according to the adjusted on-resistance and the load current parameter to obtain a target current; or,

[0130] Decrease and adjust the on-resistance in the power circuit according to the second control voltage, and perform current increase processing according to the adjusted on-resistance and the load current parameter to obtain a target current.

[0131] For the description of the features in the corresponding embodiment of the power supply test device, reference can be made to the relevant description in the corresponding embodiment of the power supply test method, which will not be elaborated here one by one.

[0132] An embodiment of the present application further provides an electronic device, including a memory and a processor. A computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above embodiments of the power supply test method.

[0133] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored. Wherein, the computer program is configured to execute the steps in any one of the above embodiments of the power test method when running.

[0134] In an exemplary embodiment, the above computer-readable storage medium may include but is not limited to: various media such as USB flash drives, read-only memories (ROM for short), random access memories (RAM for short), external hard drives, magnetic disks or optical discs that can store computer programs.

[0135] An embodiment of the present application further provides a computer program product. The above computer program product includes a computer program, and when the computer program is executed by a processor, it implements the steps in any one of the above embodiments of the power test method.

[0136] An embodiment of the present application further provides another computer program product, including a non-volatile computer-readable storage medium. The non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, it implements the steps in any one of the above embodiments of the power test method.

[0137] Those skilled in the art can further realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0138] The above has introduced in detail an electronic load system, a power test method, an electronic device, and a storage medium provided by the present application. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application. It should be noted that for those of ordinary skill in the art in this technical field, without departing from the principle of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.

Claims

1. An electronic load system, characterized in that: include: A main control circuit, a current sampling and control circuit, a power circuit, and a working power supply circuit, wherein the current sampling and control circuit includes an operational amplifier, and the operational amplifier includes a first differential amplifier circuit and a second differential amplifier circuit; The working power supply circuit is used to provide working voltage to the main control circuit; The main control circuit is used to obtain pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit; The current sampling and control circuit is used to perform voltage sampling processing from the power circuit to obtain a sampled voltage, perform differential operation processing based on the sampled voltage and the reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit; The first differential amplifier circuit is used to perform voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and perform voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result; The first differential amplifier circuit is further used to perform proportional and integral operations according to the voltage comparison result to obtain an initial control voltage; The second differential amplifier circuit is used to perform voltage amplification processing on the initial control voltage to obtain the control voltage; The power circuit is used to adjust the size of the on-resistance in the power circuit according to the control voltage, and adjust the size of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate of adjusting the size of the current.

2. The electronic load system according to claim 1, characterized in that: The main control circuit includes: a main control chip, a communication interface, The communication interface is used to obtain a configuration instruction for pre-configuring the load current parameter from a preset host device; wherein the configuration instruction includes parameter information of the load current parameter; The main control chip is used to perform parameter configuration processing in the electronic load system according to the configuration instruction and the parameter information to obtain the load current parameter; The main control chip is also used to perform voltage conversion processing on the working voltage based on the load current parameter through a digital-to-analog conversion function, and output the reference voltage through a first preset pin of the main control chip.

3. The electronic load system according to claim 1, characterized in that: The power circuit comprises: a sampling resistor, The sampling resistor is used to determine the sampling position of the current sampling and control circuit for performing voltage sampling processing from the power circuit.

4. The electronic load system according to claim 3, characterized in that: The current sampling and control circuit is also used for: Perform current sampling processing from the position of the sampling resistor in the power circuit to obtain a sampling current; The sampling voltage is obtained by performing voltage calculation processing according to the sampling current and the sampling resistor in the power circuit.

5. The electronic load system according to claim 4, characterized in that: The current sampling and control circuit is also used for: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the on-resistance in the power circuit.

6. The electronic load system according to claim 1, characterized in that: The power circuit is also used to transmit the target current to the device to be detected; The power circuit is further used to adjust the magnitude of the current according to the adjusted on-resistance and the preset current change slope included in the load current parameter to obtain the target current.

7. The electronic load system according to claim 5, characterized in that: The power circuit is also used for: increasing the on-resistance in the power circuit according to the first control voltage, and reducing the current according to the adjusted on-resistance and the load current parameter; The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameter.

8. A power supply testing method, characterized in that: The power supply testing method is applied to the electronic load system according to any one of claims 1 to 7, comprising: Obtaining a pre-configured load current parameter, and converting the operating voltage into a reference voltage based on the load current parameter; wherein the reference voltage is a stable voltage value used as a reference standard in the electronic load system; Performing voltage sampling processing on a power circuit of an electronic load system to obtain a sampled voltage, and performing differential operation processing on the sampled voltage and the reference voltage to obtain a control voltage; wherein the electronic load system is a pre-built system for power supply testing; The on-resistance in the power circuit is adjusted according to the control voltage, and the current is adjusted according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is at least used to control the rate at which the current is adjusted.

9. The power supply testing method according to claim 8, characterized in that: The step of performing differential operation on the sampled voltage and the reference voltage to obtain the control voltage comprises: Performing voltage amplification processing on the sampled voltage to obtain an amplified sampled voltage, and performing voltage comparison processing on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result; Proportional and integral operations are performed on the voltage comparison result to obtain an initial control voltage, and voltage amplification is performed on the initial control voltage to obtain the control voltage.

10. The power supply testing method according to claim 9, characterized in that: The performing proportional and integral operations on the voltage comparison result to obtain an initial control voltage, and performing voltage amplification on the initial control voltage to obtain the control voltage comprises: When it is determined according to the voltage comparison result that the amplified sampled voltage is greater than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a first voltage difference; Performing proportional and integral operations on the first voltage difference to obtain a first initial control voltage, and performing voltage amplification on the first initial control voltage to obtain a first control voltage; wherein the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit; When it is determined according to the voltage comparison result that the amplified sampled voltage is less than the reference voltage, performing a difference calculation process according to the amplified sampled voltage and the reference voltage to obtain a second voltage difference; Proportional and integral operations are performed on the second voltage difference to obtain a second initial control voltage, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to reduce and adjust the size of the on-resistance in the power circuit.

11. The power supply testing method according to claim 10, characterized in that: The step of adjusting the magnitude of the on-resistance in the power circuit according to the control voltage, and adjusting the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain the target current comprises: The on-resistance in the power circuit is increased and adjusted according to the first control voltage, and the current is reduced according to the adjusted on-resistance and the load current parameter to obtain the target current; or, The on-resistance in the power circuit is reduced and adjusted according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameter to obtain the target current.

12. An electronic device, characterized in that: include: Memory for storing computer programs; A processor, configured to implement the steps of the power supply testing method as claimed in any one of claims 8 to 11 when executing the computer program.

13. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of the power supply testing method according to any one of claims 8 to 11.

14. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the power supply testing method according to any one of claims 8 to 11 are implemented.

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