Method, apparatus, electronic device, and storage medium for non-contact measurement of voltage

Abstract

Embodiments of the present application disclose a kind of non-contact voltage measurement method, device, electronic equipment and storage medium, wherein the method comprises: by the distance sensor of uniform distribution on the probe of voltage measurement sensor, the distance of the probe to the surface point of measured object is measured, and measurement data is obtained;With the plane of the cross section where the probe is located as plane, space orthogonal coordinate system is established, the matrix equation is integrated out for calculation in combination with the measurement data, the position of the wire in the plane is determined;According to the position of the wire in the plane, coupling capacitance is obtained by calculation;According to the coupling capacitance, coupling voltage is obtained by calculation, the uniformity and accuracy of measurement data can be ensured, and the reliability and precision of voltage measurement are improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of voltage measurement, and in particular to a method for non-contact voltage measurement. BACKGROUND

[0002] In the monitoring and diagnosis of modern power systems and electronic devices, non-contact voltage measurement technology has been widely used due to its safety and convenience. This kind of technology is usually based on the principle of capacitive coupling, and the voltage value is derived by measuring the coupling capacitance between the sensor probe and the live wire. Specifically, a capacitor is formed between the sensor probe and the live wire, and the capacitance value changes with the distance, relative position between the two, and the voltage on the wire. The induced voltage can be obtained by measuring the capacitive coupling effect and used to derive the actual voltage.

[0003] The fixed calibration parameter method assumes that the coupling capacitance is only related to the relative position between the wire and the probe, and considers that the change of this relative position has a negligible effect on the measurement result. However, in actual applications, the relative position of the wire and the probe may change, and environmental conditions such as temperature and humidity may also affect the capacitance value. The fixed calibration parameter cannot adapt to these changes, resulting in increased measurement error.

[0004] Self-calibration technology attempts to improve the adaptability and accuracy of measurement by adjusting calibration parameters under different known voltage conditions. However, the self-calibration process is complex and requires multiple known voltage reference points, and needs to be recalibrated after each position change, increasing the complexity of measurement. In addition, self-calibration technology may not be able to calibrate parameters in time in a dynamically changing environment, such as frequent changes in wire position, resulting in unstable measurement.

[0005] Overall, due to the uncertainty of the coupling capacitance, the measurement accuracy is greatly affected, which may result in low on-site measurement accuracy and poor practicability. SUMMARY

[0006] The main purpose of the present application is to provide a method, device, electronic device and storage medium for non-contact voltage measurement, which can ensure the uniformity and accuracy of the measurement data and improve the reliability and accuracy of voltage measurement.

[0007] To achieve the above purpose, the first aspect of the present application provides a method for non-contact voltage measurement, the method comprising:

[0008] measuring the distance from the probe to the surface point of the measured object by the distance sensor uniformly distributed on the probe of the voltage measurement sensor, and obtaining measurement data;

[0009] A space rectangular coordinate system is established with the section where the probe is located as a plane, and a matrix equation is integrated based on the measurement data to determine the position of the wire in the plane;

[0010] According to the position of the wire in the plane, the coupling capacitance is calculated and obtained;

[0011] According to the coupling capacitance, the coupling voltage is calculated and obtained.

[0012] Optionally, the distance sensor adopts three distance sensors, and the three distance sensors form an equilateral triangle plane projection structure with an angle of 120° between each other.

[0013] Optionally, the space rectangular coordinate system is established with the section where the probe is located as a plane, and a matrix equation is integrated based on the measurement data to determine the position of the wire in the plane, including:

[0014] The position vectors of the three distance sensors are determined with the center of the probe as the origin;

[0015] The distance equations of the three sensors to the surface points of the measured object are established;

[0016] The distance equations are converted into a matrix form, and the position of the surface points of the measured object is obtained by solving the distance equations using the least square method according to the position vectors of the three distance sensors.

[0017] Optionally, the coupling capacitance is calculated and obtained according to the position of the wire in the plane, including:

[0018] The distance between the wire and the sensor plane is determined according to the position of the wire in the plane;

[0019] The coupling capacitance is calculated and obtained according to the distance through a preset formula.

[0020] Optionally, the preset formula is:

[0021]

[0022] Wherein, C represents the coupling capacitance, (x, y) represents the position of the wire in the plane, ε0 represents the electric constant in vacuum, and n and β are setting parameters.

[0023] Optionally, the coupling voltage is calculated and obtained according to the coupling capacitance, including:

[0024] The coupling capacitance is brought into a transfer function to determine the theoretical waveform of the to-be-measured voltage, and the coupling voltage is obtained, wherein the transfer function represents the relationship between the to-be-measured voltage and the output signal.

[0025] Optionally, the deriving the coupling voltage according to the coupling capacitance comprises:

[0026] The coupling capacitance is brought into a transfer function, a theoretical waveform of the to-be-measured voltage is determined, the coupling voltage is obtained, and the transfer function represents a relationship between the to-be-measured voltage and an output signal.

[0027] The second aspect of the present application provides a device for non-contact voltage measurement, comprising:

[0028] The acquisition module is configured to measure distances from the probe to surface points of the measured object by the distance sensors uniformly distributed on the probe of the voltage measurement sensor, and obtain measurement data.

[0029] The calculation module is configured to establish a spatial rectangular coordinate system with a plane being the cross section where the probe is located, integrate a matrix equation according to the measurement data, and determine a position of the conductor in the plane.

[0030] The calculation module is further configured to derive the coupling capacitance according to the position of the conductor in the plane.

[0031] The derivation module is configured to derive the coupling voltage according to the coupling capacitance.

[0032] The third aspect of the present application provides an electronic device, comprising a memory and a processor, the memory stores a computer program, and the computer program is executed by the processor to make the processor execute the steps of the first aspect and any possible implementation manner thereof.

[0033] The fourth aspect of the present application provides a computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to make the processor execute each step in the method of the first aspect.

[0034] The present application provides a method for non-contact voltage measurement, which measures distances from the probe to surface points of the measured object by the distance sensors uniformly distributed on the probe of the voltage measurement sensor, obtains measurement data, establishes a spatial rectangular coordinate system with a plane being the cross section where the probe is located, integrates a matrix equation according to the measurement data, determines a position of the conductor in the plane, derives the coupling capacitance according to the position of the conductor in the plane, and derives the coupling voltage according to the coupling capacitance. The method directly calculates the coupling capacitance, avoids errors caused by calibration parameters, can measure the relative position between the conductor and the probe in real time, dynamically calculates the coupling capacitance, ensures high-precision measurement when the position changes or the environmental conditions change, ensures the uniformity and accuracy of the measurement data, and improves the reliability and precision of voltage measurement. BRIEF DESCRIPTION OF DRAWINGS

[0035] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced. Obviously, the accompanying drawings in the following description only represent some of the embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0036] In the formula, the variables are as follows:

[0037] Figure 1A A schematic diagram of an original inductive electrode provided by an embodiment of the present application;

[0038] Figure 1B A schematic diagram of a circuit of a topology conversion method provided by an embodiment of the present application;

[0039] Figure 2 A flowchart of a method for non-contact measurement of voltage provided by an embodiment of the present application;

[0040] Figure 3 A schematic diagram of a sensor arrangement provided by an embodiment of the present application;

[0041] Figure 4 A flowchart of another method for non-contact measurement of voltage provided by an embodiment of the present application;

[0042] Figure 5 A structural schematic diagram of a device for non-contact measurement of voltage provided by an embodiment of the present application;

[0043] Figure 6 A structural schematic diagram of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0044] In order to make the person skilled in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely in the following with reference to the accompanying drawings of the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of the present application.

[0045] The terms "first", "second", and the like in the description and in the claims of the present application and in the above figures are used for distinguishing between similar objects and are not necessarily used to describe a particular sequential or chronological order. Also, the terms "comprises", "comprising", "includes", "including", "contains", "containing" or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises, includes, contains or contains a list of steps or elements does not include only those but can optionally include other not-listed steps or elements too. None of the field's closed systems are intended to exclude any

[0046] Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily mutually exclusive of one another. As will be apparent to one of skill in the art, embodiments described herein can be combinable with other embodiments.

[0047] The embodiments of the present application will be described below in connection with the drawings, which are given as a non-limiting example.

[0048] First, the traditional non-contact measurement method is introduced.

[0049] The traditional non-contact measurement method is based on the topology model of capacitive coupling, and the methods using this model are currently relatively mature, including the following: proportional reduction method, topology transformation method, and FFT method by introducing a known reference source. The principles of each method are described below:

[0050] Proportional reduction method: the sensor probe is fixed to the wire and certain tightening measures are taken. There is a certain linear relationship between the probe output and the measured voltage in theory, and the measured voltage can be restored by calibrating the proportional coefficient.

[0051] This method has poor stability, and if the medium between the probe and the wire changes, the calibration coefficient will change, it cannot be self-calibrated, and the accuracy will gradually decrease.

[0052] Topology transformation method: as shown in Figure 1A , the capacitive coupling voltage sensor includes an upper plate coupled with the measured wire and a floating sensing electrode. The upper plate and the measured wire form a coupling capacitor C1, and the upper plate and the lower plate form a structural capacitor C2 through an insulating medium, wherein R m is a sampling resistor. The principle of the proposed self-calibration method based on topology transformation is shown in the figure. Known value lumped capacitors C m , C n and single-pole double-throw switch S1 are connected to both ends of structural capacitor C2 to control whether C m , C n are used or not, and Vi This is the voltage of the circuit under test, let's assume V. o 1, V o 2 represents the sampling resistor R when the switch is open and closed, respectively. m The voltage across the terminals, according to V o 1, V o 2 and V respectively i By using the transfer function between them and eliminating the unknown C1, the voltage to be measured V can be obtained. i .

[0053] This method cannot change the relative position between the sensor and the circuit under test, otherwise the proportional coefficient K will change in real time. However, in actual measurement, the relative position between the sensor and the wire will definitely change, so it is not practical.

[0054] The FFT method with a known reference source is introduced. By fabricating a sensor probe containing a double-layer electrode sheet, the voltage signal with the same frequency as the signal to be measured is collected and mixed with the reference source voltage. After passing through an amplification network composed of an operational amplifier (OA) and an instrumentation amplifier (INA), the mixed signal at the output terminal is converted from analog to digital and then processed by FFT to separate the frequency components of the signal to be measured and the frequency components of the reference source signal. The voltage to be measured is then derived from the known signals in the system.

[0055] This method fails to account for the effect of parasitic capacitance between the plate and the ground on the measurement results, which can lead to inaccurate measurements.

[0056] Figure 1B This is a schematic diagram of a conventional induction electrode provided for an embodiment of this application. For example... Figure 1B As shown, the original sensing electrode is a rectangular sheet, composed of two electrode sheets of equal length, one wide and one narrow, stacked together. The output signal of the electrode sheet is led out through a coaxial shielded cable. The wider electrode sheet (black in the figure) is grounded through a lead-out point. The narrower electrode sheet (white in the figure) leads out the sensing signal through a lead-out point.

[0057] The electrode has a weak ability to confine the magnetic field, and its relative position with the wire under test is not easy to control, resulting in instability of the coupling capacitance.

[0058] The distance sensor used in the embodiments of this application can be a millimeter-wave ranging sensor.

[0059] The working principle of millimeter-wave ranging sensors: Based on the time-of-flight measurement method. The sensor emits a short pulse or continuous wave signal. When the signal encounters a target object, part of the signal is reflected back and received by the sensor. By measuring the time difference between the transmitted and received signals, the distance to the target object can be calculated. The basic formula of the time-of-flight method is:

[0060]

[0061] where d is the distance of the target object, and t is the time of the signal from the sensor to the target object and back to the sensor.

[0062] The millimeter wave sensor ranging principle is phase ranging. The phase method ranging is to calculate the distance by measuring the phase difference between the transmitted signal and the received signal.

[0063] Suppose the transmitted signal is:

[0064] s(t) = A cos(2πf c t + φ0)

[0065] The received signal is:

[0066] r(t) = A cos(2πf c (t-τ) + φ0 + Δφ)

[0067] Where Δφ is the phase difference.

[0068] By measuring the phase difference Δφ, the delay time and the distance can be calculated:

[0069] Δφ = 2πf c τ

[0070]

[0071] The electrode in the embodiment of the application is improved. The distance is measured mainly through specific distance sensors and distribution. The method in the embodiment of the application is introduced below.

[0072] Figure 2 A flowchart of a method for non-contact measurement of voltage provided by the embodiment of the application. As shown in the figure, the method comprises: Figure 2

[0073] 201. The distance from the probe to the surface point of the measured object is measured by the distance sensor uniformly distributed on the probe of the voltage measurement sensor, and the measurement data is obtained.

[0074] 202. The space rectangular coordinate system is established with the cross section where the probe is located as the plane, the matrix equation is integrated for calculation in combination with the measurement data, and the position of the conductor in the plane is determined.

[0075] 203. The coupling capacitance is calculated and obtained according to the position of the conductor in the plane.

[0076] 204. The coupling voltage is calculated and obtained according to the coupling capacitance.

[0077] ​Specifically, in the embodiments of the present application, distance sensors uniformly distributed on the probe of the voltage measurement sensor can be used to measure the distance from the probe to the surface point of the measured object, determine the position of the wire in the plane, directly use the measured relative position (x, y), combine the known physical constants and the probe design parameters, and directly calculate the coupling capacitance C to restore the measured voltage.

[0078] The method in the embodiments of the present application mainly includes the following steps:

[0079] 1. Sensor arrangement:

[0080] Three distance sensors are distributed at an interval of 120° on the sensor array to form a projection structure of an equilateral triangle plane. Each sensor measures the distance from it to the wire.

[0081] 3. Position determination:

[0082] Based on the three known points (sensor positions) and the distance relative to each sensor, the position of the wire in the plane is determined by using a geometric method.

[0083] 3. Coupling voltage calculation:

[0084] Based on the equivalent voltage division circuit between the wire and the sensor, the coupling voltage is derived.

[0085] In an alternative embodiment, three distance sensors can be selected, which are at an angle of 120° from each other, forming a projection structure of an equilateral triangle plane.

[0086] Please refer to Figure 3 , Figure 3 A sensor arrangement structure schematic diagram provided by the embodiments of the present application includes a cross-sectional schematic diagram and a three-dimensional structure diagram. As shown in Figure 3 , three distance sensors (S1, S2, S3) are distributed at an interval of 120° on the sensor array to form a projection structure of an equilateral triangle plane. Each sensor collects the distance data from it to the corresponding measurement point (wire), which are d1, d2, and d3, respectively.

[0087] In an alternative embodiment, the above step 202 includes:

[0088] The position vectors of the above three distance sensors are determined with the center of the above probe as the origin;

[0089] The distance equations of the above three sensors to the surface point of the measured object are established;

[0090] The distance equations are converted into matrix form, and the position of the surface point of the measured object is obtained by using the least square method according to the position vectors of the above three distance sensors.

[0091] Based on three known points (sensor positions) and the distance relative to each sensor, the position of the wire in the plane (x, y) can be located using a geometric method. The position determination algorithm is described in detail below.

[0092] 1. Basic geometric calculation

[0093] Assume that the center of the probe is the origin O, and the position vectors of the three sensors are

[0094]

[0095] The distance equation is:

[0096] Assume that the position of the measured object surface point is:

[0097]

[0098] The distance d of the sensor to the point is i satisfies the following equation:

[0099]

[0100] Convert the above equation to matrix form:

[0101]

[0102] Use the least squares method to numerically solve the real-time values of x and y:

[0103]

[0104] In an alternative embodiment, the above step 203 comprises:

[0105] Determining the capacitance and the distance of the wire to the sensor plane based on the position of the wire in the plane;

[0106] Calculating the coupling capacitance through a predetermined formula based on the distance.

[0107] The measurement principle of the coupling capacitance is described as follows:

[0108] For a ring-shaped sensor, the relationship between the capacitance C and the distance of the wire to the sensor plane may not be a simple inverse proportion relationship, but a certain power relationship. This power relationship can be obtained by experimental data fitting or by solving complex electric field distribution. Assume that there is a ring-shaped sensor probe, and the wire is located on the central axis of the ring-shaped sensor. In this case, the electric field distribution has axial symmetry, and the relationship between the capacitance and the distance may be:

[0109] C∝1 / dn

[0110] where d is the effective distance from the wire to the sensor plane, and n is a pending parameter that can be determined through experiments.

[0111] The position of the wire within the ring-shaped sensor is determined by (x, y), and the coupling capacitance C is the electrical property between the wire and the sensor. For a ring-shaped or cylindrical sensor, the coupling capacitance can be calculated based on the distance and relative position using empirical or approximate formulas (the above preset formula):

[0112]

[0113] where C represents the coupling capacitance, i.e., the capacitance between the wire and the ring-shaped sensor. Capacitance is a physical quantity that measures the ability of a conductor to store electric charge;

[0114] ε0 is the electric constant in vacuum, also known as the permittivity of air, with a value of about 8.854×10-12 F / m (farad per meter). It is a basic physical constant used to calculate the strength of electromagnetic fields in vacuum;

[0115] β is a constant related to the design of the sensor, which may be related to the geometry, material properties, or specific design parameters of the sensor. Its role in the formula is to adjust the capacitance value to match the actual sensor characteristics.

[0116] In an alternative embodiment, the self-calibration of the coupling capacitance is described as follows:

[0117] Experimental calibration: In laboratory conditions, use known voltages and various wire positions to measure V m and calculate C and β, n.

[0118] Calculate the scaling factor: Adjust the model parameters β and n based on the actual application so that the calculated V is close to the actual voltage.

[0119] When the relative position between the wire and the sensor changes, since β and n are only related to the structural parameters of the sensor probe itself, β and n can be kept constant, and the measured (x, y) values of the three distance sensors can be used to calculate the coupling capacitance C to be measured.

[0120] After determining the above position, the voltage can be calculated based on the coupling capacitance.

[0121] Further alternatively, the above step 204 includes:

[0122] The above coupling capacitance is brought into the transfer function to determine the theoretical waveform of the voltage to be measured, and the above coupling voltage is obtained, and the transfer function represents the relationship between the voltage to be measured and the output signal.

[0123] As shown in Figure 1, the sensor, with its probe closely attached to the outer periphery of the wire insulation layer, constructs a coupling capacitor using the principle of capacitive coupling, with the wire as the inner conductor and the outer covering layer as the outer conductor. The value (C) of this capacitor is affected by the inner conductor radius (R1), the outer conductor radius (R2), the conductor length (L), and the dielectric constant of the medium, which varies depending on the medium used.

[0124] The values ​​of R1, R2, L, etc. can be adjusted by the model parameters β and n.

[0125] Figure 3 This is a schematic diagram of an equivalent circuit topology provided for an embodiment of this application. For example... Figure 3 As shown, the above circuit model can be equivalent to this circuit topology, where V in (t) represents the voltage to be measured, C is the coupling capacitance formed between the wire insulation layer and the electrode, R is the sampling resistor, and V out (t) represents the voltage across the sampling resistor.

[0126] Specifically, the voltage to be measured, the coupling capacitor C, and the sampling resistor R together form a closed loop. When the signal to be measured is a sufficiently pure sinusoidal signal, the voltage V across the coupling capacitor in the loop... c (t) can be represented as follows:

[0127] V C (t)=V C sinωt

[0128] Where V c Let be the peak value of the AC voltage to be measured, and be the angular frequency of the voltage to be measured. The current i(t) in the circuit can be calculated as follows:

[0129]

[0130] The output voltage across the sampling resistor R is:

[0131] V out =RCV C ωcosωt

[0132] Based on the above circuit structure, the input V can be derived. in (t) and V out Transfer function between:

[0133]

[0134] In the above formula, the sampling resistor R is a known quantity, and V out The waveform can be acquired in real time. If the real-time value of C is calculated based on the (x,y) coordinates obtained from the three distance sensors, and then substituted into the formula for calculating the coupling capacitor, V can be determined.in The theoretical waveform.

[0135] Figure 4 This is a schematic flowchart illustrating another non-contact voltage measurement method provided in an embodiment of this application. Figure 4 As shown, the method includes:

[0136] Coupling capacitance calculation: The distance sensor will measure the distances d1, d2, and d3 between itself and the wire; based on the known quantities, the coupling capacitance is calculated using the coupling capacitance calculation model.

[0137] Self-calibration: Adjusting factors in the model parameters other than the relative position changes of the probe and wires based on actual applications;

[0138] A non-contact voltage measurement circuit model based on the coupling capacitor principle was constructed, and the output resistance voltage was calculated using the voltage divider principle.

[0139] The original voltage is calculated based on the transfer function between the input and output.

[0140] The above steps can also be referred to Figure 2 The specific steps involved in the illustrated embodiments will not be repeated here.

[0141] In this embodiment, three distance sensors are evenly distributed on the voltage measurement sensor probe, with each pair at a 120° angle to the others, ensuring the uniformity and comprehensiveness of the measurement data. Using the distance sensors in conjunction with the voltage measurement probe, the measured data d1, d2, d3, and the induced voltage Vout are fused through matrix operations to calculate the conductor coordinates, and then the coupling capacitance value is calculated to reconstruct the voltage to be measured.

[0142] The method in this embodiment directly calculates the coupling capacitance C using the measured relative position (x, y) combined with known physical constants and probe design parameters. By directly calculating the coupling capacitance, errors introduced by calibration parameters are avoided, thus improving measurement accuracy.

[0143] The method in this embodiment calculates the coupling capacitance directly using physical formulas and known quantities, and uses calibration parameters β and n to calibrate factors other than the relative positions of the wires and probes, thereby eliminating errors and instabilities caused by the calibration process.

[0144] The method in this application embodiment is real-time: it measures the relative position between the wire and the probe in real time and dynamically calculates the coupling capacitance to ensure that high-precision measurement can still be maintained when the position changes or the environmental conditions change.

[0145] The method in this embodiment simplifies the calibration process: it eliminates the need for complex calibration procedures, reduces measurement time and complexity, and improves the convenience and efficiency of measurement.

[0146] The method in this application embodiment is highly adaptable: it can adapt to different measurement environments and changes in conductor position, and has strong adaptability and stability.

[0147] Based on the description of the foregoing method embodiments, this application also provides a non-contact voltage measurement device.

[0148] Figure 5 This is a schematic diagram of a non-contact voltage measurement device provided in an embodiment of this application. Figure 5 As shown, the non-contact voltage measuring device 500 includes:

[0149] The acquisition module 510 is used to measure the distance from the probe to a point on the surface of the object being measured by a distance sensor that is uniformly distributed on the probe of the voltage measurement sensor, and to obtain measurement data.

[0150] The calculation module 520 is used to establish a spatial rectangular coordinate system with the cross section where the probe is located as the plane, and to integrate the measurement data to generate a matrix equation for calculation to determine the position of the conductor in the plane.

[0151] The calculation module 520 is also used to calculate the coupling capacitance based on the position of the wire in the plane;

[0152] The derivation module 530 is used to calculate the coupling voltage based on the coupling capacitor.

[0153] in, Figure 5 The method steps that the apparatus in the illustrated embodiment can perform have been described in the foregoing. Figure 2 , Figure 4 The embodiments shown are described in detail here and will not be repeated.

[0154] Based on the description of the foregoing method embodiments, an electronic device is also proposed in one embodiment of this application. Please refer to... Figure 6 , Figure 6 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Figure 6 As shown, the electronic device 600 includes a processor 601 and a memory 602. The memory 602 stores a computer program, which, when executed by the processor 601, will perform actions such as... Figure 2 or Figure 4 Any step in the method embodiment shown. The electronic device 600 may also include input / output devices, etc. In a specific embodiment, the electronic device may be a terminal device, etc.

[0155] In one embodiment, a computer readable storage medium is also provided, which stores a computer program. The computer program is executed by the processor 601, so that the processor 601 performs any steps of the above method embodiments.

[0156] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by a computer program instructing related hardware. The program can be stored in a non-volatile computer readable storage medium, and when the program is executed, the processes of the above-mentioned embodiments can be included. Any reference to memory, storage, database or other medium used in each embodiment provided by the present application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0157] Each technical feature of the above embodiments can be combined arbitrarily. In order to make the description simple, each technical feature of the above embodiments is not described in all possible combinations, however, as long as the combination of technical features does not exist, it should be considered as the scope of the present application.

[0158] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for a person of ordinary skill in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A method of non-contact measurement of voltage, characterized by, The method comprises: measuring the distance from the probe to the surface point of the measured object by distance sensors uniformly distributed on the probe of the voltage measurement sensor, obtaining measurement data, the distance sensors adopt three distance sensors, the three distance sensors form an equilateral triangle plane projection structure with an angle of 120° between each other; establishing a space rectangular coordinate system with the cross section where the probe is located as a plane, integrating a matrix equation for calculation in combination with the measurement data to determine the position of the conductor in the plane, specifically comprising: determining the position vectors of the three distance sensors with the center of the probe as the origin; establishing the distance equation of the three distance sensors to the surface point of the measured object; converting the distance equation into a matrix form, and solving the position of the surface point of the measured object by the least square method according to the position vectors of the three distance sensors; calculating and obtaining the coupling capacitance according to the position of the conductor in the plane, specifically comprising: determining the distance between the capacitance and the sensor plane according to the position of the conductor in the plane; and calculating the coupling capacitance by a preset formula according to the distance; the preset formula is: ； where C represents the coupling capacitance, (x, y) represents the position of the wire in the plane, represents the electric constant in vacuum, n and β are set parameters; said β is a constant related to the sensor design, used to adjust the capacitance value to match the actual sensor characteristics; said n is a parameter related to the structural parameters of the sensor probe itself, said n and said β are determined experimentally; calculating the coupling voltage according to the coupling capacitance.

2. The method of non-contact voltage measurement of claim 1, wherein, The calculation of the coupling voltage according to the coupling capacitance comprises: bringing the coupling capacitance into a transfer function to determine the theoretical waveform of the voltage to be measured, and obtaining the coupling voltage, the transfer function representing the relationship between the voltage to be measured and the output signal.

3. The method of non-contact voltage measurement of claim 2, wherein, The method further comprises: calculating the voltage across the coupling capacitance in the circuit, calculating the loop current, and determining the output voltage across the sampling resistor based on the loop current; determining the transfer function based on the structure of the circuit.

4. A device for non-contact measurement of voltage, characterized in that for executing the method of any one of claims 1-3; comprising: an acquisition module for measuring the distance from the probe to the surface point of the measured object by distance sensors uniformly distributed on the probe of the voltage measurement sensor, and obtaining measurement data; a calculation module for establishing a space rectangular coordinate system with the cross section where the probe is located as a plane, integrating a matrix equation for calculation in combination with the measurement data to determine the position of the conductor in the plane; the calculation module is also used for calculating and obtaining the coupling capacitance according to the position of the conductor in the plane; a derivation module for calculating and obtaining the coupling voltage according to the coupling capacitance.

5. An electronic device, comprising: comprising a memory and a processor, the memory storing a computer program, the computer program being executed by the processor to make the processor execute the steps of the method of any one of claims 1-3.

6. A computer readable storage medium storing a computer program, characterized in that, The computer program is executed by the processor to make the processor execute the steps of the method of any one of claims 1-3.

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