Automatic testing machine for integrated circuit board
By using a combined cooling system of water-cooled board and water-cooled box in the integrated circuit board automatic test machine, the damage problem of heat to circuit board components in integrated circuit board testing is solved, efficient heat dissipation and quality control are achieved, and the market attractiveness of the test machine is enhanced.
Patent Information
- Application Number
- CN202510375283.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-27
- Publication Date
- 2025-04-29
AI Technical Summary
During the testing process of existing integrated circuit board test machines, the heat released by the integrated circuit board causes damage to the circuit board components, resulting in poor quality and limiting the application range of the test machine.
An integrated circuit board automatic testing machine is designed, using a combined cooling system of water-cooled board and water-cooled box. The integrated circuit board to be tested is fixed to both surfaces of the water-cooled board and connected to the water-cooled box through a circulation pipeline to achieve efficient heat dissipation of the integrated circuit board.
Through effective heat dissipation measures, the factory quality control level of integrated circuit boards is improved, ensuring that each circuit board meets performance standards, and enhancing the market attractiveness of automated test machines.
Smart Images

Figure CN119902060A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of automation equipment, and in particular to an automatic testing machine for integrated circuit boards. Background Art
[0002] As a revolutionary technology, integrated circuit boards have greatly promoted the miniaturization and visualization of circuits, and have played a vital role in achieving large-scale production of fixed circuits and optimizing the layout of electronic equipment.
[0003] Given its wide application in daily life, many manufacturers specializing in the production of integrated circuit boards have emerged. However, as a highly sophisticated electronic component, any slight deviation in the specifications of the integrated circuit board may cause a significant decline in its performance or even a complete loss of its function. In addition, there are many tiny welding points on the integrated circuit board. If only manual connection and inspection are carried out one by one, it is obviously unable to meet the stringent requirements of modern production for efficiency and precision. Therefore, it is particularly important to conduct comprehensive and rigorous testing on the integrated circuit board before it leaves the factory and is put into actual application to ensure its quality and reliability.
[0004] At present, although there are integrated circuit board testers available on the market, during the test process, the integrated circuit board will release a lot of heat, which will cause a certain degree of damage to the components on the surface of the circuit board. This phenomenon will not only bury the hidden danger of poor quality of the integrated circuit board, but also greatly limit the application field and scope of the tester.
[0005] Therefore, it is particularly urgent to innovate and optimize existing technologies.
[0006] The above information is presented as background information only to assist with understanding the present disclosure and no determination or admission is made as to whether any of the above may be used as prior art with respect to the present disclosure. Summary of the invention
[0007] The present invention provides an integrated circuit board automatic testing machine to solve the problems existing in the prior art.
[0008] To achieve the above object, the present invention provides the following technical solutions:
[0009] An integrated circuit board automatic tester comprises a test box 1, a water cooling box 2, a water cooling plate 3 and a test board 4; wherein:
[0010] The test box 1 comprises a lower box body 101 and an upper cover 102, wherein the lower box body 101 has a cavity and an opening, and the opening is connected to the cavity;
[0011] The upper cover 102 is disposed on the opening;
[0012] The water cooling plate 3 is arranged in the cavity, and two opposite surfaces of the water cooling plate 3 are used to fix the integrated circuit board to be tested and to dissipate heat for the integrated circuit board;
[0013] The water cooling box 2 is connected to the water cooling plate 3 through a circulation pipeline 5 to inject cooling liquid into the water cooling plate 3 and recover the cooling liquid;
[0014] The upper cover 102 is provided with a workbench 6, and the workbench 6 is provided with a probe module 7 electrically connected to the integrated circuit board;
[0015] The test board 4 is disposed on the workbench 6 and contacts the probe module 7 to establish an electrical connection.
[0016] Further, in the integrated circuit board automatic testing machine, the upper cover 102 and the lower box body 101 are connected by a hinge;
[0017] A multi-angle positioning support assembly 8 is provided between the upper cover 102 and the lower box body 101 to stably support the upper cover 102 when it is opened to different angles.
[0018] Furthermore, the integrated circuit board automatic testing machine further includes an air cooling component 9;
[0019] The air cooling component 9 is disposed in the cavity and located at the bottom of the water cooling plate 3 .
[0020] Furthermore, in the integrated circuit board automatic tester, hook members 10 are provided on the opposite side edges of the water cooling plate 3;
[0021] The lower box body 101 is provided with a buckle groove 11 on the inner wall corresponding to the hook member 10;
[0022] The hook member 10 can be buckled in the buckle slot 11 to fix the water cooling plate 3 to the lower box 101 .
[0023] Furthermore, in the integrated circuit board automatic testing machine, a rotating shaft hole is provided on the hook member 10;
[0024] A rotating shaft 12 is inserted into the rotating shaft hole;
[0025] The hook member 10 is rotatably hinged to the water cooling plate 3 through the shaft hole and the shaft 12;
[0026] The hook member 10 is provided with a first handle 13 for easy operation.
[0027] Further, in the integrated circuit board automatic test machine, the upper cover 102 is provided with a second handle 14 and a double-elbow clamping mechanism;
[0028] The second handle 14 is connected to the double-elbow clamping mechanism. By operating the second handle 14 , the double-elbow clamping mechanism can be driven to clamp or release the test board 4 .
[0029] Further, in the integrated circuit board automatic test machine, the double-elbow clamping mechanism includes a connecting rod 15, and the connecting rod 15 is connected to the second handle 14;
[0030] The connecting rod 15 is fixedly connected to a connecting frame 16;
[0031] The two sides of the connecting frame 16 are respectively hingedly connected with a toggle rod 17;
[0032] Each of the toggle rods 17 is hingedly connected to a clamping block 18, and the two clamping blocks 18 are used to clamp the test board 4;
[0033] Each of the clamping blocks 18 is disposed on a corresponding slide rail 19 , and can slide along the slide rail 19 under the drive of the second handle 14 .
[0034] Furthermore, in the integrated circuit board automatic tester, guide pillars 20 are provided on both sides of the test board 4;
[0035] A guide groove 21 is provided on the clamping block 18 at a position corresponding to the guide post 20;
[0036] The guide post 20 is inserted into the guide groove 21 , and can move along the guide groove 21 when the second handle 14 drives the clamping block 18 to slide along the slide rail 19 , so as to lock the test board 4 .
[0037] Furthermore, the integrated circuit board automatic testing machine further includes a rotating support frame 22;
[0038] The lower box 101 is provided with a rotating shaft 23 on both sides;
[0039] The rotating shaft 23 is rotatably mounted on the rotating support frame 22 .
[0040] Furthermore, the integrated circuit board automatic testing machine further includes a rotation drive mechanism;
[0041] The rotation driving mechanism is disposed on the rotation support frame 22 , and a driving rod of the rotation driving mechanism is transmission-connected to one of the rotation shafts 23 .
[0042] Compared with the prior art, the present invention has the following beneficial effects:
[0043] The present invention provides an automatic testing machine for integrated circuit boards. A water cooling plate is arranged in the cavity of a lower box body, and then the water cooling plate is connected to the water cooling box through a circulation pipeline, and then the integrated circuit board to be tested is fixed on two opposite surfaces of the water cooling plate, so that the water cooling plate can dissipate heat for the integrated circuit board to prevent damage to the integrated circuit board caused by excessive heat accumulation. This improvement not only greatly improves the quality control level of the integrated circuit board before leaving the factory, and ensures that each integrated circuit board can meet the established performance standards; at the same time, it also further enhances the market appeal of the automatic testing machine, and lays a solid foundation for its wide application in the field of integrated circuit board testing.
[0044] The present invention has other features and advantages, which will be apparent from or will be described in detail in the accompanying drawings and the following detailed description incorporated herein, which together serve to explain the specific principles of the invention. BRIEF DESCRIPTION OF THE DRAWINGS
[0045] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0046] Figure 1 This is one of the structural schematic diagrams of an integrated circuit board automatic test machine provided by an embodiment of the present invention;
[0047] Figure 2 This is a second structural schematic diagram of an integrated circuit board automatic test machine provided by an embodiment of the present invention;
[0048] Figure 3 It is a schematic diagram of the structure of a water cooling box provided by an embodiment of the present invention;
[0049] Figure 4 This is a third structural schematic diagram of an integrated circuit board automatic test machine provided by an embodiment of the present invention;
[0050] Figure 5 is a schematic diagram of the structure of a water cooling plate provided by an embodiment of the present invention;
[0051] Figure 6 is a schematic diagram of the structure of several water cooling plates provided by an embodiment of the present invention;
[0052] Figure 7 This is a fourth structural schematic diagram of an integrated circuit board automatic test machine provided by an embodiment of the present invention;
[0053] Figure 8 is a schematic diagram of the structure of a circulation pipeline provided by an embodiment of the present invention;
[0054] Fig. 9 is a schematic structural diagram of an air cooling assembly provided by an embodiment of the present invention;
[0055] Fig.10 This is one of the structural schematic diagrams of the water cooling plate, the hook member and the buckle slot provided in the embodiment of the present invention;
[0056] Fig.11 This is the second structural schematic diagram of the water cooling plate, the hook member and the buckle slot provided in the embodiment of the present invention;
[0057] Fig.12 is a structural schematic diagram of a second handle and a double-elbow clamping mechanism provided by an embodiment of the present invention;
[0058] Fig.13 This is a fifth structural diagram of an integrated circuit board automatic test machine provided by an embodiment of the present invention;
[0059] Fig.14 is a schematic structural diagram of a rotating support frame provided by an embodiment of the present invention;
[0060] Fig.15 This is the sixth structural schematic diagram of an integrated circuit board automatic testing machine provided by an embodiment of the present invention.
[0061] Reference numerals:
[0062] Test box 1, water cooling box 2, water cooling plate 3, test board 4, circulation pipeline 5, workbench 6, probe module 7, multi-angle positioning support assembly 8, air cooling assembly 9, hook 10, buckle groove 11, rotating shaft 12, first handle 13, second handle 14, connecting rod 15, connecting frame 16, elbow 17, clamping block 18, slide rail 19, guide column 20, guide groove 21, rotating support frame 22, rotating shaft 23, integrated circuit board 24;
[0063] The lower box body 101 and the upper cover 102 . DETAILED DESCRIPTION
[0064] In order to explain in detail the possible application scenarios, technical principles, specific schemes that can be implemented, and the purposes and effects that can be achieved, the following is a detailed description of the specific embodiments listed in conjunction with the accompanying drawings. The embodiments described herein are only used to more clearly illustrate the technical solutions of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.
[0065] Reference to "embodiment" herein means that the specific features, structures or characteristics described in conjunction with the embodiment may be included in at least one embodiment of the present application. The term "embodiment" appearing in various places in the specification does not necessarily refer to the same embodiment, nor does it particularly limit its independence or association with other embodiments. In principle, in the present application, as long as there is no technical contradiction or conflict, the various technical features mentioned in the embodiments can be combined in any way to form a corresponding implementable technical solution.
[0066] Unless otherwise defined, the technical terms used in this document have the same meanings as those generally understood by those skilled in the art to which this application belongs; the use of relevant terms in this document is only for describing specific embodiments and is not intended to limit this application.
[0067] In the description of this application, the term "and / or" is an expression used to describe the logical relationship between objects, indicating that three relationships may exist, for example, A and / or B, which means: A exists, B exists, and A and B exist at the same time. In addition, the character " / " in this article generally indicates that the objects before and after are in an "or" logical relationship.
[0068] In the present application, terms such as “first” and “second” are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship of quantity, priority or sequence between these entities or operations.
[0069] Without further limitations, in this application, the words "include", "comprises", "has" or other similar expressions used in the sentences are intended to cover non-exclusive inclusion. These expressions do not exclude the presence of additional elements in the process, method or product including the elements, so that the process, method or product including a series of elements may include not only those limited elements, but also other elements not explicitly listed, or also include elements inherent to such process, method or product.
[0070] In this application, expressions such as "greater than", "less than", "exceed" and the like are understood to exclude the number itself; expressions such as "above", "below", "within" and the like are understood to include the number itself. In addition, in the description of the embodiments of this application, "multiple" means more than two (including two), and similar expressions related to "multiple" are also understood in this way, such as "multiple groups", "multiple times", etc., unless otherwise clearly and specifically limited.
[0071] In the description of the embodiments of the present application, space-related expressions used, such as "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "vertical", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicate the orientation or position relationship based on the orientation or position relationship shown in the specific embodiments or drawings, and are only for the convenience of describing the specific embodiments of the present application or facilitating the reader's understanding, and do not indicate or imply that the referred device or component must have a specific position, a specific orientation, or be constructed or operated in a specific orientation, and therefore cannot be understood as a limitation on the embodiments of the present application.
[0072] Unless otherwise expressly specified or limited, in the description of the embodiments of the present application, the terms such as "install", "connect", "connect", "fix", "set", etc. used should be understood in a broad sense. For example, the "connection" can be a fixed connection, a detachable connection, or an integrated setting; it can be a mechanical connection, an electrical connection, or a communication connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements. For technicians in the technical field to which the present application belongs, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.
[0073] In view of the above-mentioned defects in the prior art, the applicant, based on many years of rich practical experience and professional knowledge in this field, and in conjunction with the application of theory, actively conducts research and innovation in the hope of creating a technology that can solve the defects in the prior art. After continuous research and design, and after repeated trial production and improvement, the present invention with real practical value was finally created.
[0074] Please refer to Figure 1-9 The embodiment of the present invention provides a highly innovative integrated circuit board automatic tester, which includes a test box 1, a water cooling box 2, a water cooling plate 3, a test board 4 and other key components. The test box 1 is composed of a lower box body 101 and an upper cover 102. The lower box body 101 is designed with a cavity inside and is equipped with an opening, which is directly connected to the cavity; and the upper cover 102 cleverly covers the opening to form a closed space.
[0075] The water cooling plate 3 is carefully placed inside the cavity of the lower box 101, and its two opposite surfaces bear the important task of fixing the integrated circuit board 24 to be tested, and at the same time bear the responsibility of efficiently dissipating heat from the integrated circuit board 24. In order to build a complete cooling system, the water cooling box 2 is connected to the water cooling plate 3 through a precise circulation pipeline 5. This design allows the coolant to be smoothly injected into the water cooling plate 3, and after completing the heat dissipation task, it is effectively recovered into the water cooling box 2, thereby forming a complete coolant circulation system.
[0076] In addition, a workbench 6 is cleverly provided on the upper cover 102, and the workbench 6 is further equipped with a probe module 7 that is electrically connected to the integrated circuit board 24. The test board 4 is securely mounted on the workbench 6 and in close contact with the probe module 7, thereby ensuring that a stable and reliable electrical connection can be established between them.
[0077] From the perspective of structural design and functional realization, the embodiment of the present invention cleverly sets a water cooling plate 3 inside the cavity of the lower box 101. This design is intended to effectively manage the heat generated by the integrated circuit board 24 during the test process. Subsequently, a closed cooling circulation system is constructed through the connection between the circulation pipeline 5 and the water cooling box 2, thereby further improving the heat dissipation efficiency.
[0078] On this basis, the integrated circuit board 24 to be tested is securely fixed on two opposite surfaces of the water-cooled plate 3. This layout not only ensures that the integrated circuit board 24 can receive timely and uniform heat dissipation support during the test, but also effectively reduces the risk of damage to the integrated circuit board 24 caused by excessive heat accumulation.
[0079] Through this innovative design, the water cooling plate 3 can efficiently absorb and remove the heat generated by the integrated circuit board 24 during operation, thereby significantly improving the factory quality control level of the integrated circuit board 24 and ensuring that each circuit board can meet the established performance standards. At the same time, this improvement has greatly enhanced the attractiveness of the automated testing equipment in the market and laid a solid foundation for its wide application in the field of integrated circuit board testing.
[0080] In summary, the implementation of the present invention not only helps to improve the product quality of integrated circuit boards, but also has a positive role in promoting the market promotion and popularization of the testing equipment.
[0081] Please refer again Figure 4, in order to gain a deeper understanding of a specific implementation detail of the embodiment of the present invention. In this embodiment, a hinge connection mechanism is cleverly used to closely connect the upper cover 102 and the lower box body 101. This design not only ensures that the upper cover 102 can be flexibly opened and closed, but also greatly improves the structural stability and durability of the entire test machine.
[0082] It is worth mentioning that, in order to further enhance the convenience and stability of the upper cover 102 during use, the present invention also carefully arranges a set of multi-angle positioning support components 8 between the upper cover 102 and the lower box 101. The original intention of the design of this component is to provide a stable support for the upper cover 102 when it is opened to different angles, thereby preventing the upper cover 102 from accidentally closing or shaking due to its own weight or external force, and effectively ensuring the continuity and safety of the test process.
[0083] The working principle of the multi-angle positioning support assembly 8 is quite ingenious: it can automatically adjust and lock the position of the upper cover 102 at different stages of opening the upper cover 102 through the internal mechanical structure (such as a multi-section sleeve-engaging structure similar to an umbrella pole) or elastic elements, so that it can stably stay at the desired angle. In this way, the tester can freely adjust the opening angle of the upper cover 102 as needed, so as to more conveniently perform operations such as installation, testing and result observation of the integrated circuit board.
[0084] In summary, by providing a hinge connection between the upper cover 102 and the lower box 101 and a multi-angle positioning support assembly 8, the present invention not only improves the structural stability and durability of the test machine, but also greatly enhances its convenience and flexibility during use. This innovative design undoubtedly brings a more efficient, safe and reliable solution to the automated testing of integrated circuit boards.
[0085] Please refer again Figure 7 and 9 , in order to deeply understand another important implementation detail in the embodiment of the present invention. In this embodiment, the functions of the integrated circuit board automatic tester are further enriched, and the comprehensive upgrade of heat management during the test process is achieved by cleverly introducing the air cooling component 9.
[0086] The air cooling component 9 is carefully arranged in the cavity of the lower box 101 of the test box 1, and is cleverly located at the bottom of the water cooling plate 3. This layout is intended to fully utilize the advantages of the combination of air cooling and water cooling to form a more efficient and comprehensive heat dissipation system. The air cooling component 9 generates a directional airflow through an internal fan or blower and other devices to effectively remove the heat in the cavity of the lower box 101, and discharge it to the outside of the test machine through a dedicated exhaust channel.
[0087] When the integrated circuit board 24 generates a lot of heat during the test, the water cooling plate 3 first directly dissipates the heat and cools the integrated circuit board 24 through the coolant circulation inside it. At the same time, the air cooling component 9 provides additional heat dissipation support below, and further removes the heat in the cavity through the generated airflow, thereby accelerating the entire heat dissipation process and improving the heat dissipation efficiency.
[0088] This innovative design not only significantly improves the stability of the test machine under long-term, high-intensity testing, but also effectively extends the service life of the integrated circuit board 24 and other electronic components inside the test machine. Through the organic combination of air cooling and water cooling, the present invention achieves precise control of heat management during the test process, providing a more efficient and reliable solution for the automated testing of integrated circuit boards.
[0089] In summary, by introducing the air cooling component 9 and cleverly arranging it at the bottom of the water cooling plate 3, the present invention further improves the heat dissipation performance of the integrated circuit board automatic tester, and provides a strong guarantee for the continuity and accuracy of the test process. This innovative design undoubtedly brings more advanced and efficient technical means to the field of integrated circuit board testing.
[0090] Please refer to Figure 10-11 , in order to gain a deeper understanding of another key implementation detail in the embodiment of the present invention. In this embodiment, the fixing mechanism between the water cooling plate 3 and the lower box 101 is cleverly designed, and the water cooling plate 3 is stably installed in the lower box 101 through the perfect combination of the hook member 10 and the buckle groove 11.
[0091] Specifically, hooks 10 are carefully arranged on the edges of the two opposite sides of the water cooling plate 3, and buckle grooves 11 are cleverly arranged on the inner wall of the lower box 101 corresponding to the positions of the hooks 10. The shapes of these buckle grooves 11 match the hooks 10, which can ensure that the hooks 10 can be tightly embedded therein when buckled and are not easy to fall off.
[0092] When the installed water-cooling plate 3 needs to be fixed, it is only necessary to align the hook member 10 on it with the buckle slot 11 of the lower case 101, and then gently press it to rotate the hook member 10 and smoothly snap into the buckle slot 11. Once the hook member 10 is completely buckled in the buckle slot 11, they will be tightly locked together, thereby firmly fixing the water-cooling plate 3 in the lower case 101. Fig.10 It indicates the locked state. Fig.11 This fixing method is not only simple and easy to implement, but also very firm, and can effectively prevent the water cooling plate 3 from shaking or displacement during the test.
[0093] In addition, the fixing mechanism of the hook member 10 and the buckle groove 11 also facilitates the disassembly and replacement of the water cooling plate 3. When the water cooling plate 3 needs to be cleaned, repaired or replaced, or the integrated circuit board 24 after the test needs to be disassembled, the hook member 10 only needs to be gently pressed to make it disengage from the buckle groove 11, and the water cooling plate 3 together with the integrated circuit board 24 thereon can be easily taken out from the lower box 101. This design not only improves the operability and maintainability of the test machine, but also reduces the operation time and maintenance cost.
[0094] In summary, by cleverly designing the fixing mechanism of the hook member 10 and the buckle groove 11, the present invention realizes the stable installation and convenient removal of the water cooling plate 3 in the lower box 101. This innovative design not only improves the structural stability and durability of the test machine, but also provides great convenience for subsequent maintenance and replacement work.
[0095] Please refer again Figure 10-11 In one implementation of the present embodiment, the connection method between the water-cooling plate 3 and the hook member 10 is further explained. By introducing the rotating shaft 12 and the first handle 13, the rotatable hinge of the hook member 10 on the water-cooling plate 3 is realized, and the convenience of operation is greatly improved.
[0096] Specifically, a rotating shaft hole is cleverly provided on the hook member 10, and this design allows the rotating shaft 12 to smoothly penetrate into the hole, thereby tightly connecting the hook member 10 and the water-cooling plate 3. More advanced is that this connection method is not fixed, but the hook member 10 is rotatably hinged relative to the water-cooling plate 3 through the rotating shaft 12. This means that the hook member 10 can rotate freely within a certain range to meet the needs of being inserted into or removed from the buckle groove 11.
[0097] In order to further improve the convenience of operation, a first handle 13 is carefully arranged on the hook member 10. This design allows the tester to easily press or hold the first handle 13, and the hook member 10 can be locked or released by a simple rotation. The shape and size of the first handle 13 are carefully considered, which not only conforms to the principle of ergonomics, but also facilitates the tester to operate with one hand, thereby greatly improving work efficiency.
[0098] In actual application, when the water cooling plate 3 needs to be installed, the tester can press the first handle 13, rotate the hook member 10 to a suitable angle, and then easily buckle it in the buckle slot 11 of the lower box 101. Similarly, when the water cooling plate 3 needs to be removed, it is only necessary to hold the first handle 13 and slightly rotate the hook member 10 to make it pop out of the buckle slot 11. This design not only simplifies the installation and removal process, but also reduces the difficulty and time cost of operation.
[0099] In summary, by introducing the innovative design of the rotating shaft 12 and the first handle 13, the present invention realizes the rotatable hinge connection and convenient operation of the hook member 10 on the water-cooling plate 3. This unique design improves the structural flexibility and ease of use of the testing machine.
[0100] Please refer to 1-2 and 4 again, and combine them with Fig.12 , in order to fully understand another key innovation in the embodiment of the present invention. In this embodiment, the structure of the upper cover 102 is carefully designed, and the test board 4 is efficiently and stably clamped and conveniently replaced by introducing the second handle 14 and the double-elbow clamping mechanism.
[0101] Specifically, the upper cover 102 is cleverly provided with a second handle 14. This design is not only ergonomic and convenient for the tester to operate with one hand, but also closely connected with the double-elbow clamping mechanism. As an advanced mechanical structure, the double-elbow clamping mechanism is known for its stable and reliable clamping performance and convenient operation. By operating the second handle 14, the tester can easily drive the double-elbow clamping mechanism to clamp or release the test board 4.
[0102] Figure 1 and Figure 2 Two different positions of the second handle 14 when it is in a locked state and an unlocked state are shown respectively. Figure 2 As shown in FIG. 1 ), the double-elbow clamping mechanism tightly clamps the test board 4 to ensure that it will not shake or move due to external forces during the test, thereby greatly improving the stability and accuracy of the test process. Figure 1 As shown), the double-elbow clamping mechanism automatically releases the clamping of the test board 4, so that the tester can easily take out or replace different test boards 4 to meet different test requirements.
[0103] The test boards 4 play a vital role in the production and quality control of integrated circuit boards as an important tool for testing the performance, function and reliability of the integrated circuit board 24. They simulate the actual working environment and conduct comprehensive tests on the integrated circuit board 24, including electrical performance testing, function verification, reliability evaluation and other aspects, to ensure its stability and reliability in actual applications.
[0104] In summary, by introducing the innovative design of the second handle 14 and the double-elbow clamping mechanism, the present invention not only achieves efficient and stable clamping of the test board 4, but also greatly simplifies the operation process of replacing the test board 4.
[0105] Please refer again Fig.12, the specific structure and working principle of the double-elbow clamping mechanism in this embodiment can be understood in more detail. In this ingenious design, the double-elbow clamping mechanism achieves stable clamping and convenient operation of the test board 4 through a series of precise mechanical connections.
[0106] First, the connecting rod 15, as one of the core components of the double-elbow clamping mechanism, is closely connected to the second handle 14. By operating the second handle 14, the tester can indirectly control the movement of the connecting rod 15, thereby driving the entire double-elbow clamping mechanism to work.
[0107] A connecting frame 16 is fixedly connected to the connecting rod 15, and the connecting frame acts as a bridge to transmit the movement of the connecting rod 15 to the elbow rods 17 on both sides. The design of the connecting frame 16 is reasonable and strong, ensuring the stability and reliability of the entire clamping mechanism during the movement.
[0108] Two elbow rods 17 are respectively hingedly connected on both sides of the connecting frame 16. As a key component of the double elbow clamping mechanism, the elbow rods 17 have excellent mechanical properties and motion characteristics. They are connected to the connecting frame 16 through an articulated connection and can perform coordinated movements under the drive of the connecting rod 15.
[0109] The end of each toggle rod 17 is hingedly connected to a clamping block 18. The two clamping blocks 18 are respectively arranged on both sides of the test board 4. When they are close to each other, the test board 4 can be clamped. The design of the clamping block 18 fully considers the size and shape of the test board 4, ensuring the stability and reliability of the clamping process.
[0110] In addition, each clamping block 18 is disposed on a corresponding slide rail 19. The slide rail 19 provides a stable motion track for the clamping blocks 18, so that they can slide along the slide rail 19 under the drive of the second handle 14. This design not only simplifies the structure of the clamping mechanism, but also improves its motion accuracy and stability.
[0111] In summary, the double-elbow clamping mechanism in this embodiment realizes efficient and stable clamping of the test board 4 through the precise coordination of the connecting rod 15, the connecting frame 16, the elbow 17, the clamping block 18 and the slide rail 19. The tester can easily control the clamping mechanism to clamp or release the test board 4 by simply operating the second handle 14, which greatly improves the convenience and efficiency of the test process.
[0112] Please refer again Fig.12 , in order to further explore the precise matching mode between the double-elbow clamping mechanism and the test board 4 in this embodiment. This design not only improves the stability and reliability of the clamping mechanism, but also ensures the precise positioning and firm clamping of the test board 4 during the test process.
[0113] Guide posts 20 are cleverly arranged on both sides of the test board 4. These guide posts 20 serve as positioning elements to guide the movement of the clamping block 18 and limit the position of the test board 4. They are reasonably designed and sturdy, and can withstand various forces and moments that may be generated during the test process, ensuring the stability of the test board 4.
[0114] At the same time, guide grooves 21 are provided on the clamping block 18 at positions corresponding to the guide posts 20. The shapes and sizes of the guide grooves 21 match the guide posts 20, so that the guide posts 20 can be smoothly inserted therein. When the clamping block 18 slides along the slide rail 19 driven by the second handle 14, the guide posts 20 move along the guide grooves 21, thereby achieving the downward pressing and locking of the test board 4.
[0115] The advantage of this design is that it can not only ensure the stability and accuracy of the test board 4 during the clamping process, but also accurately control the downward pressing position of the test board 4 through the cooperation between the guide pillar 20 and the guide groove 21. In this way, even under different test conditions, the test board 4 can always maintain the correct position and posture, so as to contact with the probe module 7, and ensure the accuracy and reliability of the test results.
[0116] In addition, the design of the guide slot 21 also has a certain degree of flexibility, that is, the slot width of the guide slot 21 can be appropriately enlarged to accommodate the test board 4 with guide pins 20 of different sizes and shapes. This flexibility enables the double-elbow clamping mechanism in this embodiment to be widely used in various types of integrated circuit board testing occasions, thereby improving its versatility and practicality.
[0117] In summary, the double-elbow clamping mechanism in this embodiment realizes efficient, stable clamping and precise positioning of the test board 4 through the precise cooperation of the guide pillar 20 and the guide groove 21. This design not only improves the convenience and efficiency of the test process, but also provides a more reliable technical guarantee for the production and quality control of integrated circuit boards.
[0118] Please refer to Figure 13-15 It can be seen that the integrated circuit board automatic tester in this embodiment has added an innovative design, namely the rotating support frame 22 and its ingenious combination with the lower box 101. This design not only enhances the functionality and flexibility of the tester, but also provides a more convenient and efficient testing experience for testers.
[0119] Specifically, the rotating support frame 22 is an important component of the testing machine and is firmly installed at a proper position of the testing machine. Its main function is to provide rotating support so that the lower box body 101 can rotate around the rotating shaft 23.
[0120] On both sides of the lower box 101, rotating shafts 23 are cleverly arranged. These rotating shafts not only serve as key components connecting the lower box 101 and the rotating support frame 22, but also ensure the stability and reliability of the rotating motion. They are precisely installed at the corresponding positions of the rotating support frame 22, so that the lower box 101 can rotate freely under the support of the rotating support frame 22.
[0121] Through this design, the tester can easily adjust the tilt angle of the lower box 101 to meet different test requirements. For example, in some test scenarios, the tester may need to place the test board at different angles to obtain the performance data of the chip at different angles. In this case, the tester only needs to gently rotate the lower box 101 to achieve this purpose.
[0122] It is worth mentioning that the materials and manufacturing processes of the rotating support frame 22 and the rotating shaft 23 have also been carefully selected and optimized. They are made of high-strength, corrosion-resistant materials to ensure the stability and reliability of the test machine during long-term use. At the same time, the manufacturing process has also been strictly controlled and inspected to ensure the accuracy and smoothness of the rotational motion.
[0123] In summary, the integrated circuit board automatic tester in this embodiment realizes the flexible rotation and tilt angle adjustment of the lower box 101 by introducing the innovative design of the rotating support frame 22 and the rotating shaft 23. This design not only improves the convenience and efficiency of the test, but also provides a more diversified and personalized test experience for the tester.
[0124] In this innovative design of the present embodiment, the integrated circuit board automatic tester further incorporates a rotary drive mechanism, which is cleverly arranged on the rotary support frame 22, and its drive rod is connected to one of the rotary shafts 23 in a transmission manner. This design not only greatly improves the automation level of the tester, but also brings a more intelligent and efficient testing experience to users.
[0125] As one of the core components of the test machine, the rotary drive mechanism is responsible for driving the rotary shaft 23 to perform rotary motion. It uses advanced drive technology and precise transmission mechanism to ensure the stability, accuracy and reliability of the rotary motion.
[0126] Through the transmission connection with the rotating shaft 23, the rotating drive mechanism can easily realize the rotating motion of the lower box body 101. The user can remotely control the rotating drive mechanism to work through the control panel or other operation modes, thereby adjusting the tilt angle of the lower box body 101.
[0127] The advantage of this design is that it greatly simplifies the operating steps during the test and improves the convenience and efficiency of the test. The user does not need to manually rotate the lower box 101, but can adjust the tilt angle through simple operations, thereby saving test time and cost.
[0128] In addition, the rotary drive mechanism also has certain intelligent functions. It can automatically adjust the rotation angle and speed according to the user's settings or test requirements to achieve a more accurate and stable test process. At the same time, it can also be linked with other test equipment to achieve more complex and diverse test tasks.
[0129] It is worth mentioning that the material and manufacturing process of the rotary drive mechanism have also been carefully selected and optimized. It is made of high-strength, wear-resistant materials to ensure stability and reliability during long-term use. At the same time, the manufacturing process has also been strictly controlled and inspected to ensure the accuracy and durability of the transmission mechanism.
[0130] In summary, the integrated circuit board automatic tester in this embodiment realizes the automatic rotation and precise adjustment of the tilt angle of the lower box 101 by introducing the innovative design of the rotation drive mechanism. This design not only improves the convenience and efficiency of the test, but also provides users with a more intelligent and efficient testing experience.
[0131] Although the terms such as test box and water cooling plate are used more frequently in this application, the possibility of using other terms is not excluded. These terms are used only to more conveniently describe and explain the essence of the present invention; interpreting them as any additional restrictions is contrary to the spirit of the present invention.
[0132] An automatic testing machine for integrated circuit boards provided by an embodiment of the present invention arranges a water cooling plate in the cavity of a lower box body, connects the water cooling plate to the water cooling box through a circulation pipeline, and then fixes the integrated circuit board to be tested on two opposite surfaces of the water cooling plate, so that the water cooling plate can dissipate heat for the integrated circuit board to prevent damage to the integrated circuit board caused by excessive heat accumulation. This improvement not only greatly improves the quality control level of the integrated circuit boards before leaving the factory, and ensures that each integrated circuit board can meet the established performance standards; at the same time, it also further enhances the market appeal of the automatic testing machine, and lays a solid foundation for its wide application in the field of integrated circuit board testing.
[0133] Finally, it should be noted that although the above embodiments have been described in the specification and drawings of this application, this does not limit the scope of patent protection of this application. All technical solutions generated by replacing or modifying equivalent structures or equivalent processes based on the essential concept of this application using the contents recorded in the specification and drawings of this application, as well as directly or indirectly implementing the technical solutions of the above embodiments in other related technical fields, are included in the scope of patent protection of this application.
Claims
1. An automatic testing machine for integrated circuit boards, characterized in that: It comprises a test box (1), a water cooling box (2), a water cooling plate (3) and a test board (4); wherein: The test box (1) comprises a lower box body (101) and an upper cover (102), the lower box body (101) having a cavity and an opening, the opening being in communication with the cavity; The upper cover (102) is arranged to cover the opening; The water cooling plate (3) is arranged in the cavity, and two opposite surfaces of the water cooling plate (3) are used to fix the integrated circuit board to be tested and to dissipate heat from the integrated circuit board; The water cooling box (2) is connected to the water cooling plate (3) via a circulation pipeline (5) so as to inject cooling liquid into the water cooling plate (3) and to recover the cooling liquid; The upper cover (102) is provided with a workbench (6), and the workbench (6) is provided with a probe module (7) electrically connected to the integrated circuit board; The test board (4) is arranged on the workbench (6) and is in contact with the probe module (7) to establish an electrical connection.
2. The integrated circuit board automatic tester according to claim 1, characterized in that: The upper cover (102) and the lower box body (101) are connected via a hinge; A multi-angle positioning support assembly (8) is provided between the upper cover (102) and the lower box body (101) to provide stable support for the upper cover (102) when it is opened to different angles.
3. The integrated circuit board automatic testing machine according to claim 1, characterized in that: Also included is an air cooling assembly (9); The air cooling component (9) is arranged in the cavity and is located at the bottom of the water cooling plate (3).
4. The integrated circuit board automatic tester according to claim 1, characterized in that: Hook pieces (10) are provided on opposite side edges of the water cooling plate (3); The lower box body (101) is provided with a buckle groove (11) on the inner wall corresponding to the hook member (10); The hook member (10) can be buckled in the buckle slot (11) to fix the water cooling plate (3) to the lower box (101).
5. The integrated circuit board automatic testing machine according to claim 4, characterized in that: The hook member (10) is provided with a rotating shaft hole; A rotating shaft (12) is inserted into the rotating shaft hole; The hook member (10) is rotatably hinged to the water cooling plate (3) via the rotating shaft hole and the rotating shaft (12); The hook member (10) is provided with a first handle (13) for easy operation.
6. The integrated circuit board automatic tester according to claim 1, characterized in that: The upper cover (102) is provided with a second handle (14) and a double-elbow clamping mechanism; The second handle (14) is connected to the double-elbow clamping mechanism, and by operating the second handle (14), the double-elbow clamping mechanism can be driven to clamp or release the test board (4).
7. The integrated circuit board automatic testing machine according to claim 6, characterized in that: The double-elbow clamping mechanism comprises a connecting rod (15), wherein the connecting rod (15) is connected to the second handle (14); A connecting frame (16) is fixedly connected to the connecting rod (15); Both sides of the connecting frame (16) are respectively hingedly connected with toggle rods (17); Each of the toggle rods (17) is hingedly connected to a clamping block (18), and the two clamping blocks (18) are used to clamp the test board (4); Each clamping block (18) is arranged on a corresponding slide rail (19), and can slide along the slide rail (19) under the drive of the second handle (14).
8. The integrated circuit board automatic testing machine according to claim 7, characterized in that: Guide pillars (20) are provided on both sides of the test board (4); A guide groove (21) is provided on the clamping block (18) at a position corresponding to the guide column (20); The guide column (20) is inserted into the guide groove (21), and can move along the guide groove (21) when the second handle (14) drives the clamping block (18) to slide along the slide rail (19), so as to lock the test board (4).
9. The integrated circuit board automatic tester according to claim 1, characterized in that: Also includes a rotating support frame (22); Rotating shafts (23) are provided on both sides of the lower box body (101); The rotating shaft (23) is rotatably mounted on the rotating support frame (22).
10. The integrated circuit board automatic testing machine according to claim 1, characterized in that: Also included is a rotary drive mechanism; The rotary drive mechanism is arranged on the rotary support frame (22), and a drive rod of the rotary drive mechanism is drivingly connected to one of the rotary shafts (23).
Citation Information
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