Automatic address allocation

Abstract

The invention relates to automatic address allocation. A method for assigning an address to an electronic device (114) is presented. The method comprises: a) starting a test system (112) for performing a test on a circuit assembly (110) comprising an electronic device (114); b) performing a communication protocol between the circuit component (110) and the test system (112); c) reading out a predetermined unique identifier (UID) of the electronic device (114) by using the test system (112); d) assigning the UID to at least one attribute of the electronic device (114) within the lookup table (136), wherein the attribute is determined by using the test system (112); and e) assigning the address to the electronic device (114) by using the lookup table (136). Further, an electronic device (114), a circuit assembly (110), a test system (112), and uses of the methods and devices are presented.

Description

Technical Field

[0001] The present disclosure relates to a method for assigning an address to an electronic device, an electronic device, a circuit assembly, a test system and uses thereof. Background Art

[0002] Groups of electronic devices, and in particular networks, often require addresses of electronic devices in order to enable communication. When assigning addresses to electronic devices, for clarity, interference with the addresses of other electronic devices should be avoided. This is particularly problematic for electronic devices of the same type. Therefore, a predefined address range may often be required. Further, assigning such addresses often requires additional connected passive components for address selection. Summary of the invention

[0003] In a first aspect, a method for assigning an address to an electronic device is presented.

[0004] The method includes:

[0005] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0006] b) implementing a communication protocol between the circuit components and the test system;

[0007] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0008] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0009] e) Assigning addresses to electronic devices by using a lookup table.

[0010] In another aspect, an electronic device is presented. The electronic device has an address assigned by using at least the following steps:

[0011] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0012] b) implementing a communication protocol between the circuit components and the test system;

[0013] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0014] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0015] e) Assigning addresses to electronic devices by using a lookup table.

[0016] In another aspect, a circuit assembly is presented. The circuit assembly includes at least one electronic device and at least one interface. The electronic device has an address assigned by using at least the following steps:

[0017] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0018] b) implementing a communication protocol between the circuit components and the test system;

[0019] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0020] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0021] e) Assigning addresses to electronic devices by using a lookup table.

[0022] In another aspect, a test system is presented. The test system is configured to perform a test on at least one circuit assembly. The circuit assembly includes at least one electronic device and at least one interface. The test system is further configured to read a predetermined unique identifier (UID) of the electronic device. The test system is further configured to determine at least one attribute of the electronic device.

[0023] In another aspect, use of at least one of a method, an electronic device, a circuit assembly, and a test system is presented. The intended use is an automotive application.

[0024] Those skilled in the art will recognize additional features and advantages upon reading the following detailed description, and upon viewing the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The present disclosure is illustrated in the drawings by way of example and not limitation, in which like reference numerals refer to similar or equivalent elements. The elements of the drawings are not necessarily drawn to scale relative to each other. The features of the various illustrated examples may be combined unless they exclude each other.

[0026] Figure 1 An example embodiment of a circuit assembly interacting with a test system according to the present disclosure is illustrated in a schematic manner;

[0027] Figure 2 A flow chart illustrating an example embodiment of a method for assigning an address to an electronic device according to the present disclosure is illustrated;

[0028] Figure 3 A schematic diagram illustrating an example embodiment of a specific procedure for address allocation is illustrated. DETAILED DESCRIPTION

[0029] In a first aspect, a method for assigning an address to an electronic device is presented. The term "electronic device" generally used herein is a broad term and is given its common and customary meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. An electronic device may be a device that uses electrical energy during operation. An electronic device may be at least one electronic circuit or may include at least one electronic circuit. An electronic device may include at least one electronic component. An electronic component may be connected to at least one other electronic component. Therefore, an electronic device may be an assembly of at least two electronic components at least partially interconnected by a conductive element. For example, an electronic component may include a resistor, an inductor, a capacitor, a diode and / or a transistor and / or an assembly thereof (such as a logic gate and / or a processor). For example, a conductive element may include a wire and / or a trace.

[0030] In particular, the electronic device may be or may include at least one integrated circuit. Thus, the electronic device or at least a portion of the electronic device may be assembled on at least one semiconductor material (in particular silicon, silicon carbide and / or gallium nitride). Thus, the electronic device may be or may include at least one semiconductor device. The semiconductor device may be a device comprising at least one semiconductor material (in particular silicon, silicon carbide and / or gallium nitride). In particular, the electronic device may be network compatible. Thus, the electronic device may be configured to communicate with at least one other electronic device. The electronic device may be configured to interpret and / or follow at least one communication protocol. The electronic device may include at least one input / output module for sending and / or receiving data. As will be further outlined in detail below, the electronic device may include at least one pin.

[0031] The term "address" as generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. An address may be an identifier or label configured to identify an electronic device within a group of electronic devices. In particular, the electronic device may be part of a network. The address may be a network address. A network may be a group of electronic devices of the same or different types that are at least partially interconnected. An address may be configured to control or direct the transfer of data between electronic devices. Thus, an address may be configured to identify the source and / or destination of a data packet being transferred.

[0032] The term "allocation" as generally used herein (including its grammatical variations) is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. Allocation can be the act of assigning or designating a first entity to a second entity, in this case, assigning or designating an address to an electronic device. Allocation can be the act of linking or connecting a first entity and a second entity, in this case, linking or connecting an address and an electronic device. Therefore, after allocation, the address and the electronic device can be associated with each other. Assigning an address to an electronic device can enable the electronic device to communicate with other electronic devices (particularly within a network). In particular, such as when sending a data packet, assigning an address to an electronic device can enable other electronic devices to address the electronic device.

[0033] In step a), the method includes starting a test system for performing a test on a circuit assembly including an electronic device. The term "circuit assembly" generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The circuit assembly may be or may include at least one electronic circuit, in particular at least one integrated circuit. In particular, the circuit assembly may include a plurality of electronic circuits. Therefore, the circuit assembly may also include a plurality of electronic devices. The electronic devices may be at least partially interconnected. Therefore, the circuit assembly may be an assembly of at least two electronic devices at least partially interconnected by a conductive element. The circuit assembly may be or may include at least one printed circuit board (PCB). The term "printed circuit board" (abbreviated as "PCB") generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. The PCB may be or may include a carrier or support for at least one electronic component or electronic device. The PCB may include a planar board configured to support and / or connect an electronic component or electronic device. Therefore, the PCB may include at least one insulating material (such as plastic) and / or at least one conductive material (such as metal). Conductive material may be patterned on insulating material for forming connections between circuit components or at least parts of circuit components, in particular at least electronic components or electronic devices. Thus, a PCB may include a plurality of traces or at least one trace.

[0034] The term "test" as generally used herein is a broad term and is given its ordinary or customary meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. Testing may be or may include the act of evaluating or analyzing the performance or quality of an entity (such as a circuit component or an electronic device). Therefore, testing may be configured to identify or determine whether a circuit component is working correctly. Testing of a circuit component may be performed to troubleshoot a faulty circuit component. Testing of a circuit component may be performed to identify and / or solve problems in a circuit component (such as a faulty electronic device that may be replaced or repaired). Therefore, testing may also be configured to identify or determine which parts of a circuit component may work correctly and which parts of a circuit component may not work correctly. Testing may be configured to measure and / or determine electrical parameters (such as resistance, capacitance, or inductance) to identify defects (e.g., by using an electronic probe).

[0035] As described, the circuit assembly may include at least one PCB. Therefore, the test may in particular be or may include an online test (ICT). Therefore, the test system may be or may include an ICT system. The term "online test" (abbreviated as "ICT") generally used herein is a broad term, which is given its ordinary and customary meaning to ordinary technicians in the field without limiting it to a special or customized meaning. ICT may be or may include testing of PCBs, in particular testing of electronic devices of PCBs and / or connections between electronic devices. In ICT, an electronic probe can test the PCB for quantities (such as short circuits or open circuits), which can show whether the PCB is correctly assembled. ICT can be performed by using an adapter, in particular a pin adapter for contacting the PCB.

[0036] The term "system" generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. A system may be any collection of entities that interact or are interdependent or components that form a whole. In particular, the components may interact with each other to perform at least one common function. The components may be processed independently or may be coupled or connected. The term "test system" generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. A test system may be a system configured to test an entity such as a circuit component, wherein the definitions of the terms "test" and "system" described above may be particularly referred to. As described, a test system may be or may include an ICT system in particular. The term "online test system" generally used herein, referred to as "ICT system" for short, is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or customized meaning. An ICT system may be a system for performing ICT of a PCB, wherein the definitions of the terms "ICT" and "PCB" described above may be particularly referred to. Before using it, it may usually be necessary to test a circuit assembly, in particular a PCB. Therefore, before putting the circuit assembly into operation, it may be necessary to test the system anyway, in particular an ICT system. Therefore, by additionally using a test system for address allocation, the use of another specific passive component for address allocation can be avoided.

[0037] Step a) may further include connecting the test system to the interface of the circuit assembly by using an adapter of the test system. The adapter may be a pin adapter in particular. Still further, step a) may include contacting the pin of the electronic device by using an adapter (in particular a pin adapter). The term "interface" generally used herein is a broad term and is given its ordinary and customary meaning and is not limited to a special or customized meaning for a person of ordinary skill in the art. An interface may be a boundary across which two or more entities may transmit information (such as a data packet). An interface may be a physical interface and / or a logical interface. In particular, an interface of a circuit assembly may allow communication between the circuit assembly and the test system. More particularly, an interface may allow communication between an electronic device and the test system. Further, an interface may allow components of the circuit assembly to communicate with each other (i.e. communicate internally within the circuit assembly). An interface may be a serial interface in particular. However, the interface may also be a parallel interface in principle. An interface may include at least one pin. An interface may include at least one bus, in particular at least one serial bus. A bus may include at least one pin. A bus may include at least one signal line (i.e. a conductive path). A signal line may be a data line in particular. More specifically, the bus may include a clock line and a data line. The data line may be used to transmit data packets. The clock line may be used for synchronization. For example, the bus may be an integrated circuit interconnect (ICI). 2 C) However, other options may also be possible.

[0038] The term "adapter" generally used herein is a broad term and is given its ordinary and customary meaning and is not limited to a special or customized meaning for those of ordinary skill in the art. An adapter can be a device configured to establish an electronic connection to an object (such as a pin of an electrical device or a circuit component, in particular a pin of a bus of an interface of the circuit component). In particular, the adapter can be configured to establish an electrical connection between an electrical device and a test system and / or between a circuit component and a test system. Therefore, the test system can be enabled to electrically test an electronic device and / or a circuit component. As indicated, the adapter can be a pin adapter in particular. Therefore, the adapter can include at least one pin, in particular a plurality of pins. A first pin can make physical contact with a pin of an electronic device. A second pin can make physical contact with a pin of a bus. Therefore, the adapter can be connected to an interface of a circuit component, more particularly to a bus of an interface, for enabling communication between the circuit component and the test system.

[0039] In step b), the method further includes implementing a communication protocol between the circuit assembly and the test system. The term "communication protocol" generally used herein is a broad term, and for those of ordinary skill in the art, it is given its common and customary meaning and is not limited to a special or customized meaning. A communication protocol can be or can include a set of rules and / or tasks that allow entities to pass information (such as messages or data packets) to each other. The communication protocol can particularly determine at least one of the format, syntax, semantics, synchronization and error checking of the messages exchanged between entities. The entity can particularly include an electronic device, but also, for example, includes a test system. The entities can all agree on the communication protocol used. Multiple communication protocols can be used in parallel for different purposes, or in other words, for different aspects or functions of communication between entities. The communication protocol can be assigned to different layers (such as layers defined in the open system interconnection model). Therefore, the communication protocol can be a layered communication protocol and / or a standardized communication protocol. The communication protocol can be implemented in software and / or hardware.

[0040] The term "implementation" (including any grammatical variations thereof) generally used herein is a broad term and is given its common and customary meaning and is not limited to a special or customized meaning to a person of ordinary skill in the art. Implementation can be the act of realizing something or establishing something or making something effective. Therefore, the communication protocol can be implemented by programming software and / or hardware (for example, by executing a software program in a processor or by programming a field programmable gate array through hardware). The communication protocol can be implemented by providing an infrastructure for communication, such as a hardware infrastructure (for example, at least one interface). Therefore, implementation can include providing an interface that connects the circuit assembly with the test system and allows the circuit assembly to communicate with the test system. Further, implementation can include aligning or coordinating the circuit assembly and the system to communicate with each other using a common communication protocol. Therefore, at least one shared communication protocol can be established in both the circuit assembly and the test protocol.

[0041] In step c), the method further includes reading out a predetermined unique identifier (UID) of the electronic device by using a test system. The term "unique identifier" (abbreviated as "UID") generally used herein is a broad term, and for those of ordinary skill in the art, it is given its common and customary meaning and is not limited to a special or customized meaning. UID can be a label or identifier configured to clearly or obviously identify or mark an entity (especially an electronic device). In other words, UID can be a characteristic of an electronic device in particular, configured to clearly distinguish an electronic device from another electronic device (especially another electronic device including the same type). Therefore, two or more electronic devices of the same type can have different UIDs. In other words, two or more electronic devices that are equivalent in design can have different UIDs. UID can be programmed on a non-volatile memory of an electronic device. UID can be hardware programmed on an electronic device. UID can be derived from an assigned chip identifier (chip ID) by using a predetermined algorithm. Chip ID and / or algorithm can be determined by the manufacturer of the electronic device.

[0042] In step d), the method further includes assigning the UID to at least one attribute of the electronic device in the lookup table. The attribute is determined by using a test system. The attribute may be an attribute other than the UID. In other words, the attribute may not be the UID or may be different from the UID. The attribute may be determined directly by using a test system. In particular, the attribute of the electronic device may include the position of the electronic device in the circuit assembly. Therefore, step d) may particularly include assigning the UID to the position of the electronic device in the lookup table. More particularly, step d) may include assigning the UID to the position of the electronic device in the circuit assembly in the lookup table. For example, the test system may test the circuit assembly by contacting the electronic device included by the circuit assembly. When contacting the electronic device in the circuit assembly, the test system may also know or measure the position of the electronic device in the circuit assembly. As indicated, in step c), the test system may read out the UID of the electronic device. Therefore, the test system may know the UID and position of the electronic device and may map the UID and position in the lookup table for further processing. The test system may then store and / or forward the lookup table.

[0043] Additionally or alternatively, the attribute can be determined indirectly by using a test system. In particular, when considering the predetermined installation options on the PCB, another attribute (such as the type or function of the electronic device) can be derived from the position, which can also be mapped with the UID. Therefore, the attribute of the electronic device can include the function of the electronic device. Further, the attribute of the electronic device can include the type number of the electronic device. The type number can also be referred to as a part number. Electronic devices of the same type or in other words electronic devices with equivalent designs can have the same type number. However, as described, electronic devices of the same type can still have different IDs in particular. Other options besides position, function or type number are also conceivable.

[0044] The term "lookup table" as generally used herein is a broad term and is given its ordinary and customary meaning to those of ordinary skill in the art and is not limited to a special or customized meaning. A lookup table can be a data structure that maps at least two entities. Therefore, a lookup table can include multiple data tuples (e.g., data pairs). In particular, a lookup table can provide a link between a UID and at least one other attribute of an electronic device (such as a location and / or function and / or type number). The lookup table can then be retrieved for further processing. The lookup table can be stored in, for example, a memory, or forwarded to another entity (e.g., forwarded to a processor for further processing). The lookup table can be implemented as an array. Therefore, an equivalent index can be used to index associated entities. Other options for implementing a lookup table are feasible and known to the technician.

[0045] In step e), the method further includes assigning the address to the electronic device by using a lookup table. In particular, step e) may include assigning the address to the electronic device using at least one of the UID and the attribute of the electronic device determined by using the test system. Therefore, step e) may particularly include using the UID for assigning the address to the electronic device. As described, the UID can clearly distinguish the electronic device from another electronic device (in particular, another electronic device of the same type). Therefore, by the method presented, it can be ensured that different electronic devices can be assigned different addresses even though they may be of the same type. The circuit assembly may include a plurality of electronic devices. The method may include assigning a separate address to each electronic device of the circuit assembly. At least two of the electronic devices may be of the same type. The method may include assigning different addresses to at least two electronic devices of the same type. Therefore, interference with the address of another electronic device can be avoided and a clear assignment can be established for further communication. Further, predefined address ranges can also be avoided.

[0046] Throughout the present disclosure, the method steps presented may be performed in the order indicated. However, it should be noted that different orders may also be possible. The method may include other method steps that are not listed. Further, one or more method steps may be performed once or repeatedly. Further, two or more method steps may be performed simultaneously or in a temporally overlapping manner. In particular, steps a) to c) may be performed during the test of the circuit component. Step d) and / or step e) may also be performed during the test. Therefore, at least one of step d) and step e) may be performed at least in part by using a test system. Further, at least one of step d) and step e) may be performed at the initial power-up of the circuit component. In other words, step d) and / or step e) may be performed after the test and without using a test system that will be outlined in more detail below. The initial power-up of the circuit component may be the first start-up of the operation of the circuit component or the restart of the operation of the circuit component.

[0047] The communication protocol may at least determine a set of addresses. The addresses may include addresses that are already occupied (i.e. addresses that cannot be additionally assigned (e.g. because they have already been assigned to another entity (such as another electronic device))). However, the addresses may also specifically include addresses that are still available and not occupied. Therefore, the address set may include at least a set of available addresses. Step e) may include assigning at least one of the UID and attributes of the electronic device determined by using the test system to the available address. Therefore, step e) may include assigning the UID and / or attributes of the electronic device (e.g. the location of the electronic device) to the available address. The addresses may be organized in an address list (e.g. an address array), wherein a first number of addresses may be available and a second number of addresses may be occupied. For example, step e) may include assigning the UID and / or attribute to the first available address in the address list that may be occupied later. Therefore, the next UID and / or attribute may be assigned to the next available address in the address list.

[0048] The communication protocol may further determine at least one command set for communication between the circuit assembly and the test system. Additionally or alternatively, the communication protocol may determine a command set for communication within the circuit assembly (such as a command set for communication between an electronic device of the circuit assembly and a controller). The command set may include at least one general command issued to all electronic devices included in the circuit assembly. The term "general command" generally used herein is a broad term, and for those of ordinary skill in the art, it is given a common or customary meaning and is not limited to a special or customized meaning. A general command may be a command that is globally sent to all connected devices (e.g., to all network members). Therefore, a general command may not only be sent to a selected device group, which may require its address to be known in advance. A general command may not require confirmation of the receiver of the general command.

[0049] The general command may be a general read command or a general allocation command. Other options may also be feasible. Further, the general command may trigger at least one arbitration. Step c) may include issuing a general read command from the test system to send the UID to the test system. The general allocation command may be sent to all electronic devices of the circuit assembly via an interface. Therefore, the test system may require all electronic devices to send their corresponding UIDs via an interface. Step e) may include issuing a general allocation command from the test system. The general allocation command may include the UID of the electronic device and the address assigned to the electronic device. The general allocation command may be sent to all electronic devices of the circuit assembly via an interface. Therefore, each electronic device can identify its own UID and accept the address sent with the UID. Step e) may further include confirming the allocation address through a handshake between the electronic device and the test system. Therefore, the test system may be configured to allocate addresses to electronic devices by using a lookup table.

[0050] Additionally or alternatively, the reading of the UID in step c) can be triggered by detecting a predetermined logical state of the electronic device using the test system. The logical state can be determined in the communication protocol. In particular, the predetermined logical state can include a predetermined voltage applied to at least one pin of the electronic device. In other words, when the test system detects a predetermined voltage at the pin during the test of the circuit component, the test system can read out the UID of the electronic device. The predetermined voltage can be an arbitrary voltage (for example, a supply voltage, or also 0V). The predetermined voltage can also be a voltage interval (for example, in order to cover voltage fluctuations in the electronic circuit). The predetermined voltage can further cause a current. Therefore, additionally or alternatively, when the pin is contacted during the test of the circuit component, when the test system detects a current, the test system can read out the UID of the electronic device.

[0051] The term "pin" generally used herein is a broad term and is given its common and customary meaning and is not limited to a special or customized meaning for those of ordinary skill in the art. A pin can be an electrical contact of a device (such as an electronic device or a circuit assembly, in particular a bus of an interface of a circuit assembly). A pin can be conductive and particularly include a metal that can be accessed to the outside of an electronic device and / or a circuit assembly. A pin can be configured to contact at least one other entity outside an electronic device and / or a circuit assembly, in particular (such as by using a pin adapter) contact with a test system. Therefore, a pin can enable electrical connection between an electronic device and a test system and continuously enable signal transfer. Additionally or alternatively, a pin can enable electrical connection between a circuit assembly and a test system and continuously enable signal transfer.

[0052] The circuit assembly may further include a controller. The term "controller" as generally used herein is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art and is not limited to a special or custom meaning. A controller may be an entity configured to observe or regulate or operate or manage at least one other entity. A controller may be a computing device. A controller may be an electronic device. Thus, a controller may be or may include at least one electronic circuit (particularly an integrated circuit). A controller may include at least one processor (e.g. a central processing unit). A controller may further include at least one memory. A controller may include at least one peripheral device, particularly an input / output module (such as a universal asynchronous receiver / transmitter). A controller may be particularly a microcontroller. The circuit assembly may include a plurality of microcontrollers. A controller may be particularly a master microcontroller of a circuit assembly or a central microcontroller of a circuit assembly. However, multi-host components may also be feasible within a circuit assembly.

[0053] At least one of step d) and step e) can be at least partially performed by using a controller (particularly the main microcontroller of the circuit assembly). In particular, in step d), the UID can be assigned to the attribute of the electronic device (e.g., the location of the electronic device) in the lookup table by using the controller. Therefore, the lookup table can be provided to the controller to assign the address to the electronic device. In particular, the lookup table can be provided to the controller from the test system. Step e) may include issuing a general allocation command from the controller. The general allocation command may include the UID of the electronic device and the address assigned to the electronic device. The general allocation command can be sent to all electronic devices of the circuit assembly via the interface. Therefore, each electronic device can identify its own UID and accept the address sent with the UID. Step e) may further include confirming the allocation address by a handshake between the electronic device and the controller. Therefore, the controller can be configured to assign the address to the electronic device by using a lookup table.

[0054] The method may be computer-implemented at least in part. The term "computer-implemented" generally used herein is a broad term, and for those of ordinary skill in the art, it is given its common and customary meaning and is not limited to a special or customized meaning. Without limitation, the term may particularly refer to a method involving at least one computing device (e.g., microcontroller). As indicated, the computing device may include at least one processor configured to at least partially perform at least one of the method steps according to the present disclosure. The method steps may be at least partially performed automatically, particularly in the absence of user interaction. However, it is apparent that the method steps presented may also be performed at least in part using user interaction. For example, a user may manually start the test system in step a). The user may also at least partially control or guide the test itself. Further, the allocation in step d) and step e) may also be at least assisted by the user in principle.

[0055] In another aspect, an electronic device is presented. The electronic device has an address assigned by using at least the following steps:

[0056] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0057] b) implementing a communication protocol between the circuit components and the test system;

[0058] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0059] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0060] e) Assigning addresses to electronic devices by using a lookup table.

[0061] The address can be assigned by using a method according to any one of the embodiments relating to the method as further disclosed in detail in the context. As described, the electronic device may include at least one pin. The pin may be configured as an adapter of a contact test system. In particular, the pin may be configured as a pin adapter of a contact test system. The electronic device may be network compatible. The electronic device may be a semiconductor device. The electronic device may include at least one electronic circuit, in particular at least one integrated circuit. Further definitions and embodiments regarding the electronic device may also be specifically referenced to the definitions and embodiments presented regarding the method for assigning addresses to the electronic device.

[0062] In another aspect, a circuit assembly is presented. The circuit assembly includes at least one electronic device and at least one interface. The electronic device has an address assigned by using at least the following steps:

[0063] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0064] b) implementing a communication protocol between the circuit components and the test system;

[0065] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0066] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0067] e) Assigning addresses to electronic devices by using a lookup table.

[0068] The address may be assigned by using a method according to any of the embodiments relating to the method as disclosed in further detail in the context. The electronic device may be an electronic device according to any of the embodiments relating to the electronic device as disclosed in further detail in the context. As described, the circuit assembly may include at least one PCB. The interface may be a serial interface. The interface may include at least one bus, in particular at least one serial bus. The bus may include at least one signal line, in particular a data line. The bus may include a clock line and a data line. The bus may in particular be an I 2 C. The interface may be configured to be connected to an adapter of the test system, in particular to a pin adapter. Further, the electronic device may be connected to the interface of the circuit assembly. As described, the electronic device may include at least one pin. The pin may be part of the interface of the circuit assembly. The circuit assembly may further include at least one controller, in particular a main microcontroller. The controller may be connected to the interface of the circuit assembly. The controller may be configured to assign addresses to the electronic device by using a lookup table. The controller may be configured to issue a general assignment command to at least one electronic device of the circuit assembly (such as for assigning addresses to the electronic device). For further definitions and embodiments regarding the circuit assembly, reference may be made in particular to the definitions and embodiments presented regarding the method for assigning addresses to the electronic device.

[0069] In another aspect, a test system is presented. The test system is configured to perform a test on at least one circuit assembly. The circuit assembly includes at least one electronic device and at least one interface. The test system is further configured to read a predetermined unique identifier (UID) of the electronic device. The test system is further configured to determine at least one attribute of the electronic device.

[0070] As already indicated, the attribute may be selected from the group comprising: the position of the electronic device in the circuit assembly; the function of the electronic device within the circuit assembly; the type number of the electronic device. Other options may be feasible. The electronic device may be an electronic device according to any of the embodiments relating to the electronic device as disclosed in further detail in the context. The circuit assembly may be a circuit assembly according to any of the embodiments relating to the circuit assembly as disclosed in further detail in the context. In particular, the circuit assembly may include at least one PCB. Thus, the test system may be an ICT system configured to perform ICT. Further, the test system may be configured to assign the UID to an attribute (e.g., position) of the electronic device within the lookup table. The test system may be configured to issue at least one general command to the circuit assembly. The general command may be at least one of a general read command and a general assignment command. Other options may also be feasible. The test system may include at least one adapter, in particular at least one pin adapter. The adapter may be configured to be connected to an interface of the circuit assembly. The adapter may be further configured to contact the electronic device, in particular at least one pin of the electronic device. For further definitions and embodiments regarding the test system, reference may be made in particular to the definitions and embodiments presented with respect to the method for assigning an address to an electronic device.

[0071] On the other hand, the use of at least one of the presented method, electronic device, circuit assembly and test system is presented. The purpose of the use is an automotive application. In other words, the method and / or the electronic device and / or the circuit assembly and / or the test system can be particularly used for automotive applications. As the technician will immediately realize, other uses are of course also possible. In particular, the method is a method according to any of the embodiments relating to the method as disclosed in detail in the context. The electronic device is an electronic device according to any of the embodiments relating to the electronic device as disclosed in detail in the context. The circuit assembly is a circuit assembly according to any of the embodiments relating to the circuit assembly as disclosed in detail in the context. The test system is a test system according to any of the embodiments relating to the test system as disclosed in detail in the context.

[0072] The method and apparatus presented herein have considerable advantages over the prior art already indicated throughout the description. As described, it can help avoid assigning interfering addresses, particularly for electronic devices of the same type. This can result in less error sensitivity (such as attempting to address a specific electronic device with an address that has also been assigned to another electronic device). This can ultimately increase the operational safety of systems using electronic devices or circuit assemblies including electronic devices (such as automotive systems with considerable safety requirements). Therefore, the method and apparatus presented can further help avoid predefined address ranges, which can result in greater flexibility. Further, by using a test system for assigning addresses (which can be used to test the circuit assembly before operation anyway), no additional components may be required to assign addresses. This can result in less processing complexity and ultimately reduced costs. As outlined, during the assignment of addresses, the test system can take over several tasks. Therefore, the test system can also deactivate work from the controller of the circuit assembly, particularly from the main microcontroller of the circuit assembly. Further, also as outlined, a serial interface can be used, which can result in a reduction of pins at the controller.

[0073] As used herein, the terms "have", "comprise" or "include" or any arbitrary grammatical variation thereof are used in a non-exclusive manner. Therefore, these terms can refer to the situation where other features, except for the features introduced by these terms, are not present in the entity described herein, and can also refer to the situation where one or more other features are present. For example, the expressions "A has B", "A includes B" and "A contains B" can refer to the situation where no other elements are present in A except B (that is, the situation where A is solely and exclusively composed of B), and can also refer to the situation where, in addition to B, one or more other elements (such as element C, element C and element D or even other elements) are present in entity A.

[0074] Further, it should be noted that the terms "at least one", "one or more" or similar expressions indicating that a feature or element may occur once or more than once are usually used only once when introducing the respective feature or element. In most cases, the expression "at least one" or "one or more" is not repeated when referring to the corresponding feature or element, although in fact the corresponding feature or element may occur once or more than once.

[0075] Further, as used herein, the terms "preferably", "more preferably", "particularly", "more particularly", "specifically", "more particularly" or similar terms are used in conjunction with optional features without limiting the possibility of other alternatives. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As the skilled person will appreciate, the present disclosure may be performed using alternative features. Similarly, the features introduced by "in an embodiment of the present disclosure" or similar expressions are intended to be optional features without any limitations on alternative embodiments of the present disclosure, without any limitations on the scope of the present disclosure, and without any limitations on the possibility of combining features introduced in this manner with other optional or non-optional features of the present disclosure.

[0076] In summary and without excluding other possible embodiments, the following embodiments may be envisaged:

[0077] Embodiment 1: A method for assigning an address to an electronic device, the method comprising:

[0078] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0079] b) implementing a communication protocol between the circuit components and the test system;

[0080] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0081] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0082] e) Assigning addresses to electronic devices by using a lookup table.

[0083] Embodiment 2: The method according to the above embodiment, wherein the attribute of the electronic device includes the position of the electronic device in the circuit component.

[0084] Embodiment 3: A method according to any one of the preceding embodiments, wherein the attribute of the electronic device comprises a function of the electronic device within the circuit assembly.

[0085] Embodiment 4: According to the method of any one of the preceding embodiments, the attribute of the electronic device includes a type number of the electronic device.

[0086] Embodiment 5: The method according to any of the preceding embodiments, wherein the circuit assembly includes a plurality of electronic devices, wherein the method includes assigning a separate address to each electronic device of the circuit assembly.

[0087] Embodiment 6: The method according to the preceding embodiment, wherein at least two of the electronic devices are of the same type, and wherein the at least two electronic devices of the same type are assigned different addresses.

[0088] Embodiment 7: The method according to any one of the preceding embodiments, wherein the circuit assembly comprises at least one printed circuit board (PCB), wherein the testing of the circuit assembly is an in-circuit test (ICT), and wherein the testing system is an ICT system.

[0089] Embodiment 8: The method according to any of the preceding embodiments, wherein the electronic device is part of a network, and wherein the address is a network address.

[0090] Embodiment 9: A method according to any one of the preceding embodiments, wherein the communication protocol at least determines an address set.

[0091] Embodiment 10: The method according to the above embodiment, wherein the address set comprises at least an available address set.

[0092] Embodiment 11: The method according to the preceding embodiment, wherein step e) includes assigning at least one of a property of the electronic device determined by using the test system and a UID to the available address.

[0093] Embodiment 12: The method according to any one of the preceding embodiments, wherein the communication protocol at least determines a set of commands used for communication between the circuit assembly and the test system.

[0094] Embodiment 13: The method according to the preceding embodiment, wherein the command set includes at least one general command issued to all electronic devices included in the circuit assembly.

[0095] Embodiment 14: The method according to the preceding embodiment, wherein a general command triggers at least one arbitration.

[0096] Embodiment 15: The method according to any one of the preceding embodiments, wherein the reading of the UID in step c) is triggered by detecting a predetermined logic state of the electronic device using a test system.

[0097] Embodiment 16: A method according to the above embodiment, wherein the logic state is determined in the communication protocol.

[0098] Embodiment 17: The method of any one of the two preceding embodiments, wherein the predetermined logic state comprises a predetermined voltage applied to at least one pin of the electronic device.

[0099] Embodiment 18: The method according to any of the preceding embodiments, wherein step c) includes issuing a general read command from the test system to send the UID to the test system.

[0100] Embodiment 19: The method according to any one of the preceding embodiments, wherein at least one of step d) and step e) is at least partially performed by using a test system.

[0101] Embodiment 20: The method according to any one of the preceding embodiments, wherein step e) comprises issuing a general assignment command from the test system, wherein the general assignment command comprises the UID of the electronic device and the address assigned to the electronic device.

[0102] Embodiment 21: The method according to the preceding embodiment, wherein step e) comprises confirming the assigned address through a handshake between the electronic device and the test system.

[0103] Embodiment 22: The method according to any of the preceding embodiments, wherein at least one of steps d) and e) is at least partially performed by using a controller, in particular a main microcontroller of the circuit assembly.

[0104] Embodiment 23: A method according to the preceding embodiment, wherein a lookup table is provided to the controller to assign addresses to electronic devices.

[0105] Embodiment 24: The method according to any one of the two preceding embodiments, wherein step e) comprises issuing a general assignment command from the controller, wherein the general assignment command comprises the UID of the electronic device and the address assigned to the electronic device.

[0106] Embodiment 25: The method according to any one of the three preceding embodiments, wherein step e) comprises confirming the assigned address through a handshake between the electronic device and the controller.

[0107] Embodiment 26: The method according to any one of the preceding embodiments, wherein at least one of step d) and step e) is performed upon initial power-up of the circuit component.

[0108] Embodiment 27: A method according to any of the preceding embodiments, wherein the UID is programmed on a non-volatile memory of the electronic device.

[0109] Embodiment 28: A method according to any one of the preceding embodiments, wherein the UID is derived from an assigned chip identifier (chip ID) by using a predetermined algorithm.

[0110] Embodiment 29: The method according to any of the preceding embodiments, wherein step a) comprises connecting the test system and an interface of the circuit component by using an adapter of the test system, in particular a pin adapter of the test system.

[0111] Embodiment 30: The method according to the preceding embodiment, wherein step a) further comprises contacting the pins of the electronic device by using an adapter, in particular a pin adapter.

[0112] Embodiment 31: A method according to any of the preceding embodiments, wherein the method is at least partially implemented by a computer.

[0113] Embodiment 32: An electronic device having an address assigned by using at least the following steps:

[0114] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0115] b) implementing a communication protocol between the circuit components and the test system;

[0116] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0117] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0118] e) Assigning addresses to electronic devices by using a lookup table.

[0119] Embodiment 33: An electronic device according to the preceding embodiment, wherein the address is assigned by using a method according to any one of the preceding method embodiments.

[0120] Embodiment 34: An electronic device according to any one of the aforementioned embodiments involving electronic devices, wherein the electronic device comprises at least one pin, and the pin is configured to contact an adapter of a test system, in particular a pin adapter of the test system.

[0121] Embodiment 35: An electronic device according to any one of the aforementioned embodiments involving electronic devices, wherein the electronic device is network compatible.

[0122] Embodiment 36: An electronic device according to any one of the preceding embodiments relating to electronic devices, wherein the electronic device is a semiconductor device.

[0123] Embodiment 37: An electronic device according to any one of the aforementioned embodiments involving electronic devices, wherein the electronic device comprises at least one electronic circuit, in particular at least one integrated circuit.

[0124] Embodiment 38: A circuit assembly comprising at least one electronic device and at least one interface, wherein the electronic device has an address assigned by using the following steps:

[0125] a) starting a test system for performing a test on a circuit assembly comprising an electronic device;

[0126] b) implementing a communication protocol between the circuit components and the test system;

[0127] c) reading a predetermined unique identifier (UID) of the electronic device by using a test system;

[0128] d) assigning the UID to at least one attribute of the electronic device within a lookup table, wherein the attribute is determined using the test system; and

[0129] e) Assigning addresses to electronic devices by using a lookup table.

[0130] Embodiment 39: The circuit assembly according to the preceding embodiment, wherein the address is assigned by using a method according to any one of the preceding method embodiments.

[0131] Embodiment 40: A circuit component according to any one of the preceding embodiments involving circuit components, wherein the electronic device is an electronic device according to any one of the preceding embodiments involving electronic devices.

[0132] Embodiment 41: A circuit assembly according to any one of the preceding embodiments involving circuit assemblies, wherein the circuit assembly comprises at least one printed circuit board (PCB).

[0133] Embodiment 42: The circuit assembly according to any one of the preceding embodiments involving circuit assemblies, wherein the interface is a serial interface.

[0134] Embodiment 43: A circuit component according to any one of the preceding embodiments relating to circuit components, wherein the interface comprises at least one bus, in particular at least one serial bus.

[0135] Embodiment 44: A circuit component according to the preceding embodiment, wherein the bus comprises at least one signal line, in particular a data line.

[0136] Embodiment 45: The circuit component according to any one of the two preceding embodiments, wherein the bus comprises a clock line and a data line.

[0137] Embodiment 46: A circuit assembly according to any one of the three preceding embodiments, wherein the bus is an integrated circuit interconnect (I 2 C).

[0138] Embodiment 47: The circuit assembly according to any one of the preceding embodiments relating to the circuit assembly, wherein the interface is configured to be connected to an adapter of a test system, in particular to a pin adapter.

[0139] Embodiment 48: A circuit assembly according to any of the preceding embodiments involving circuit assemblies, wherein an electronic device is connected to an interface of the circuit assembly.

[0140] Embodiment 49: A circuit assembly according to any one of the preceding embodiments relating to circuit assemblies, wherein the electronic device comprises at least one pin, wherein the pin is part of an interface of the circuit assembly.

[0141] Embodiment 50: A circuit component according to any one of the preceding embodiments relating to circuit components, wherein the circuit component comprises at least one controller, in particular a main microcontroller.

[0142] Embodiment 51: A circuit assembly according to the previous embodiment, wherein the controller is connected to the interface of the circuit assembly.

[0143] Embodiment 52: The circuit assembly according to any one of the two preceding embodiments, wherein the controller is configured to assign addresses to the electronic device by using a lookup table.

[0144] Embodiment 53: The circuit assembly according to any one of the three preceding embodiments, wherein the controller is configured to issue a general distribution command to at least one electronic device of the circuit assembly.

[0145] Embodiment 54: A test system configured to perform testing on at least one circuit component, wherein the circuit component includes at least one electronic device and at least one interface, wherein the test system is further configured to read out a predetermined unique identifier (UID) of the electronic device, wherein the test system is further configured to determine at least one attribute of the electronic device.

[0146] Embodiment 55: A test system according to the preceding embodiments, wherein the attribute is selected from the group consisting of: the position of the electronic device in the circuit assembly; the function of the electronic device within the circuit assembly; the type number of the electronic device.

[0147] Embodiment 56: A test system according to any one of the aforementioned embodiments involving a test system, wherein the electronic device is an electronic device according to any one of the aforementioned embodiments involving an electronic device.

[0148] Embodiment 57: The test system according to any one of the preceding embodiments relating to the test system, wherein the circuit component is the circuit component according to any one of the preceding embodiments relating to the circuit component.

[0149] Embodiment 58: A test system according to any one of the preceding embodiments, wherein the circuit assembly comprises at least one printed circuit board (PCB), wherein the test system is an ICT system configured to perform an in-circuit test (ICT).

[0150] Embodiment 59: A test system according to any one of the preceding embodiments involving a test system, wherein the test system is configured to assign a UID to an attribute of an electronic device within a lookup table.

[0151] Embodiment 60: The test system according to the preceding embodiment, wherein the test system is further configured to assign addresses to the electronic devices by using a lookup table.

[0152] Embodiment 61: A test system according to any one of the preceding embodiments involving a test system, wherein the test system is configured to issue at least one general command, in particular at least one of a general read command and a general allocation command, to a circuit component.

[0153] Embodiment 62: The test system according to any one of the preceding embodiments relating to the test system, wherein the test system comprises at least one adapter, in particular at least one needle adapter.

[0154] Embodiment 63: The testing system according to the preceding embodiment, wherein the adapter is configured to connect to an interface of the circuit component.

[0155] Embodiment 64 The test system according to any one of the two preceding embodiments, wherein the adapter is configured to contact the electronic device, in particular at least one pin of the electronic device.

[0156] Embodiment 65: A use of at least one of a method according to any one of the aforementioned method embodiments, an electronic device according to any one of the aforementioned electronic devices, a circuit component according to any one of the aforementioned circuit components, and a test system according to any one of the aforementioned test systems, wherein the purpose of the use is automotive application.

[0157] Other optional features and embodiments will be disclosed in more detail in the description of subsequent embodiments, preferably in combination with the dependent embodiments. Wherein, as the technician will appreciate, the corresponding optional features can be implemented in an independent manner, and in any feasible combination. The scope of the present disclosure is not limited by the preferred embodiments. The embodiments are schematically depicted in the pictures. Wherein, the same reference numerals in these pictures refer to equivalent or functionally similar elements.

[0158] Figure 1 An exemplary embodiment of a circuit assembly 110 interacting with a test system 112 is illustrated in schematic form. The circuit assembly 110 includes at least one electronic device 114 (e.g., Figure 1 The three electronic devices 114 are shown in FIG. 1 . Other numbers are of course also possible. In principle, the circuit component 110 can also include only one electronic device 114. The electronic device 114 can be a semiconductor device. The electronic device 114 can include an electronic circuit, in particular an integrated circuit. Figure 1 As shown, the circuit assembly 110 may in particular include a plurality of electronic devices 114. The method for assigning addresses to electronic devices 114 may then in particular include assigning a separate address to each electronic device 114 of the circuit assembly 110. In particular, at least two of the electronic devices 114 may be of the same type. For example, Figure 1 Two of the three electronic devices 114 shown in the figure may be of the same type, or in other words, identical in design. In this case, at least two electronic devices 114 of the same type may be assigned different addresses in particular. Therefore, during the subsequent operation of the circuit assembly 110, all electronic devices 114 may be individually addressed and distinguished. This may result in trouble-free operation of the circuit assembly 110, such as when used, for example, in automotive applications.

[0159] In addition to the electronic device 114, the circuit assembly 110 further comprises at least one interface 116. The interface 116 may be in particular a serial interface. The interface 116 may include at least one bus 118. The bus 118 may be in particular a serial bus. The bus 118 may include at least one signal line, in particular a data line. The bus 118 may further include a clock line. In particular, the bus 118 may be an integrated circuit interconnect (ICI). 2 C). Interface 116 may be configured to connect to test system 112 for data transfer. Thus, interface 116 may include at least one pin 120 that can be accessed from outside of circuit assembly 110. Thus, interface 116 may be configured to connect circuit assembly 110 to at least one external device (such as test system 112). Further, interface 116 may be configured to interconnect internal devices of circuit assembly 110.

[0160] The circuit assembly 110 may further include at least one controller 122. The controller 122 may be a microcontroller, more particularly a main microcontroller of the circuit assembly. The controller 122 may be connected to the interface 116. The electronic device 114 may also be connected to the interface 116. The controller 122 and / or the electronic device 114 or at least one of them may include at least one input / output module 124. The input / output module 124 itself may be a device interface and may also be a serial interface in particular. The input / output module 124 may enable the device to receive information from another device via the interface 116 and / or send information to another device via the interface 116. Therefore, the electronic device 114 and the controller 122 may be interconnected via the interface 116 (in particular via the bus 118). Therefore, the controller 122 may be configured to control the electronic device 114 (such as sending a data packet to the electronic device 114 and / or receiving a data packet from the electronic device 114). In particular, the controller 122 may be configured to send a command to the electronic device 114. The controller 122 may be configured to issue general commands to all of the electronics 114 of the circuit assembly 110. However, external devices, such as the test system 112, may also be configured to do so via the pins 120, as indicated.

[0161] The test system 112 may include an adapter 126. The adapter 126 may be, in particular, a pin adapter. The test system 112 may further include at least one evaluation module 128. The evaluation module 128 may be configured to evaluate or analyze signals received by the adapter 126. The evaluation module 128 may be configured to at least partially control the adapter 126. The evaluation module 128 may include at least one processor or at least one microprocessor. In particular, the evaluation module 128 may include at least one central processing unit or at least one field programmable gate array. The evaluation module 128 may be connected to the adapter 126 and optionally also to a processor not in the test system 112. Figure 1 1. For example, the evaluation module 128 may be part of the cloud. The adapter 126 may be configured to connect to the interface 116 (such as by contacting the pins 120 with a pin). In other words, the interface 116 may be configured to connect to the adapter 126 or contact the adapter 126.

[0162] Further, the electronic device 114 may also be configured to connect to or contact the adapter 126. Thus, each of the electronic devices 114 may also include a pin 130. The pin 130 may be configured to contact an external device (such as, in particular, contact the test system 112). Thus, the pin 130 may enable a signal to be passed to the outside of the circuit assembly 110. In this sense, the pin 130 may also be part of the interface 116 of the circuit assembly 110. The adapter 126 may also be configured to contact the pin 130. Thus, the adapter 126 may be configured to contact or connect to the electronic device 114 via the pin 130.

[0163] The circuit assembly 110 may include a printed circuit board (PCB) 132. The electronic device 114, the controller 122, and the interface 116 may be assembled on the PCB 132. Therefore, the test system 112 may be particularly an ICT system configured to perform an online test (ICT). Therefore, the test of the circuit assembly 110 may be particularly ICT. The controller 122 and the electronic device 114 may further form a network 134 on the PCB 132. Therefore, the electronic device 114 may be part of the network 134 and the addresses assigned to them may be network addresses. The electronic device 114 may be network compatible. As described, the electronic device 114 may particularly include an input / output module 124, enabling the electronic device 114 to receive information from other devices via the interface 116 and to send information to other devices via the interface 116. In principle, entities outside the circuit assembly 110 may also be part of the network 134. Such entities may also communicate with the circuit assembly 110 and its components by using the entity interface 116 and particularly, for example, the pin 120.

[0164] Figure 2 A flow chart of an example embodiment of a method for assigning an address to an electronic device 114 is illustrated. Figure 3 A diagram of an example embodiment of a particular process for address allocation including the use of a lookup table 136 is illustrated. Figure 2 and Figure 3 The methods include:

[0165] a) (indicated by reference numeral 138) starting a test system 112 for performing a test on a circuit assembly 110 including an electronic device 114;

[0166] b) (indicated by reference numeral 140) implementing a communication protocol between the circuit assembly 110 and the test system 112;

[0167] c) (indicated by reference numeral 142) reading a predetermined unique identifier (UID) of the electronic device 114 by using the test system 112;

[0168] d) (indicated by reference numeral 144) assigning the UID to at least one attribute of the electronic device 114 within the lookup table 136, wherein the attribute is determined using the test system 112; and

[0169] e) (indicated by reference numeral 146 ) assigns an address to the electronic device 114 by using the lookup table 136 .

[0170] Thus, the electronic device 114 (such as, for example, included by the circuit assembly 110) ultimately has an address assigned by using at least the steps mentioned above. The existing method steps can be performed in the order indicated. It should be noted, however, that different orders are also possible. The method may include other method steps that are not listed. Further, one or more method steps may be performed once or repeatedly. Further, two or more method steps may be performed simultaneously or in a temporally overlapping manner. In particular, steps a) to c) may be performed during the test of the circuit assembly 110. Step d) and / or step e) may also be performed during the test. Thus, at least one of step d) and step e) may be at least partially performed using the test system 112. Further, at least one of step d) and step e) may be performed at the initial power-on of the circuit assembly 110, and / or by using the controller 122. The method may be at least partially implemented by a computer.

[0171] The UID may be programmed on a non-volatile memory of the electronic device 114 and / or may be derived from a chip identifier (chip ID) assigned by the manufacturer of the electronic device 114 by using a predetermined algorithm. As mentioned in step d), the properties of the electronic device 114 may particularly include the location of the electronic device 114 in the circuit assembly 110. Thus, Figure 3 The lookup table 136 in shows the UIDs assigned to the locations (such as UID1 to POS1, UID2 to POS2, UID3 to POS3, etc.). Additionally or alternatively, however, the attributes may also include the function of the electronic device 114 within the circuit assembly 110 and / or the type number of the electronic device 114. Other options may also be possible. The location of the electronic device 114 may be determined directly in the testing of the circuit assembly 110.

[0172] As an example and without limiting other options, the test system 112 can test the circuit assembly 110 (such as determining whether the circuit assembly is working correctly). For this purpose, the adapter 126 can be in particular contact pins 120. Therefore, the test system 112 can be connected to the circuit assembly 110, in particular to the interface 116 and more particularly to the bus 118. By using the adapter 126 to contact the pins 120, the test system 112 can be connected to the bus 118 to communicate with the electronic device 114 and the controller 122. The communication protocol implemented between the circuit assembly 110 and the test system 112 can determine the command set for communication. The command set can include at least one general command. Therefore, the test system 112 can send a general read command to all electronic devices 114 of the circuit assembly 110, asking them for their corresponding UID. For this purpose, the controller 122 can be turned off and / or disconnected from the bus 118 so that it does not interfere. The general read command can trigger at least one arbitration. Subsequently, the electronic device 114 can send its corresponding UID to the test system via the bus 118.

[0173] Further, during testing of the circuit assembly 110, the adapter 126 may contact the pin 130. The readout of the UID may then be triggered by detecting a predetermined logic state of the electronic device 114 using the test system 112. The logic state may be determined in the communication protocol. In particular, the logic state may be a predetermined voltage applied to the pin 130. The test system 112 may detect the predetermined voltage and may therefore know that the corresponding electronic device 114 has a UID that may be read out. For example, the predetermined voltage may cause a current to flow from the pin 130 to the adapter 126, which may be detected by the test system 112. Therefore, when performing testing of the circuit assembly 110, the test system 112 may know which electronic devices 114 have a UID to be read out by contacting the pin 130.

[0174] When performing the test of the circuit assembly 110, the test system 112 can further know the position of the electronic device 114, because during the test, the test system 112 usually has to contact the electronic device 114 in space. Therefore, the test system 112 can assign the read UID of the electronic device 114 to its position in the circuit assembly 110 in the lookup table 136. The test system 112 can also derive other properties of the electronic device 114 (such as its function and / or its type number) from its position. When considering the ICT of the PCB 132, such properties can be derived, for example, by considering the installation options given on the PCB 132. Therefore, the test system is configured to perform the test of the circuit assembly 110, read out the UID of the electronic device 114, and further determine at least one property of the electronic device 114. The property can be particularly at least one of the position of the electronic device 114, the function of the electronic device 114, and the type number of the electronic device 114. Other options may also be feasible. The test system 112 can be further configured to assign the UID to the property in the lookup table 136.

[0175] Further, the test system 112 can be configured to assign addresses to the electronic devices 114 by using the lookup table 136. For this purpose, the test system 112 can send a general assignment command to the electronic devices 114 by using the bus 118. Again, the controller 122 can be turned off and / or disconnected from the bus 118 so that it does not interfere. The general assignment command may include the UID of the electronic device 114 and the address assigned to the electronic device 114. Each electronic device 114 can identify its own UID and accept the address sent with it, which can ultimately be confirmed by a handshake between the electronic device 114 and the test system 112.

[0176] Alternatively, the generated lookup table 136 can be provided to the controller 122. For example, at the initial power-up of the circuit assembly 110, the controller 122 can then issue a general allocation command. In this case, the test system 112 can be disconnected or turned off from the bus 118 so that it does not interfere. As above, the general allocation command can include the UID of the electronic device 114 and the address assigned to the electronic device 114. Each electronic device 114 can identify its own UID and accept the address sent with it, which can ultimately be confirmed by a handshake between the electronic device 114 and the controller 122. Therefore, the controller 122 can also be configured to issue a general allocation command and allocate the address to the electronic device 114 by using the lookup table 136.

[0177] The addresses may be determined in the communication protocol. The communication protocol may generally determine an address set. The address set may include available addresses and occupied addresses. For example, the address set may be in the form of an address list 148 having addresses ADDR1, ADDR2, ADDR3, etc., such as Figure 3 As shown. For example, ADDR1 may be available, ADDR2 may be occupied and ADDR3 may be available again. Therefore, the address set includes an available address set (ADDR1 and ADDR3 in this case). When the address is assigned to the electronic device 114 by using the lookup table 136, the corresponding UID mapped to the attribute of the electronic device 114 (such as the location of the electronic device 114) can be specifically assigned to the available address as indicated by the arrow 150. Therefore, in the example given, UID1 and POS1 can be assigned to ADDR1. ADDR2 can be occupied as described and can therefore not be used for allocation. Therefore, UID2 and POS2 can be subsequently assigned to the next available address. ADDR3 may be available again. Therefore, UID2 and POS2 can be subsequently assigned to ADDR3. Other schemes may also be feasible.

[0178] Although specific examples have been illustrated and described herein, it will be understood by those of ordinary skill in the art that various alternative and / or equivalent embodiments may replace the specific examples shown and described without departing from the scope of the present disclosure. This application is intended to cover any adjustments or modifications to the specific examples discussed herein. Therefore, the present disclosure is intended to be limited only by the claims and their equivalents.

[0179] It should be noted that the methods and devices as outlined in this document, including their preferred embodiments, can be used alone or in combination with other methods and devices disclosed in this document. In addition, the features outlined in the context of the device also apply to the corresponding method, and vice versa. In addition, all aspects of the methods and devices outlined in this document can be combined arbitrarily. In particular, the features of the claims can be combined with each other in any way.

[0180] It should be noted that the description and the accompanying drawings only illustrate the basic principles of the proposed method and system. Those skilled in the art will be able to implement various components, which, although not explicitly described or shown in this article, embody the basic principles of the present disclosure and are included in the spirit and scope of the present disclosure. In addition, all examples and embodiments outlined in this disclosure document are clearly intended to be used only for illustrative purposes in principle to help the reader understand the principles of the proposed method and system. In addition, all statements of the principles, aspects and embodiments of the present disclosure, and their specific examples are intended to include their equivalents.

Claims

1. A method for assigning an address to an electronic device (114), the method comprising: a) starting a test system (112), the test system (112) being used to perform a test on a circuit assembly (110) including the electronic device (114); b) implementing a communication protocol between the circuit assembly (110) and the test system (112); c) reading out a predetermined unique identifier UID of the electronic device (114) by using the test system (112); d) assigning the UID to at least one attribute of the electronic device (114) within a lookup table (136), wherein the attribute is determined using the test system (112); and e) assigning an address to the electronic device (114) by using the lookup table (136).

2. The method according to the preceding claim, wherein the property of the electronic device (114) comprises a location of the electronic device (114) in the circuit assembly (110).

3. The method according to any of the preceding claims, wherein the circuit assembly (110) comprises a plurality of electronic devices (114), wherein the method comprises assigning a separate address to each electronic device (114) of the circuit assembly (110).

4. The method according to the preceding claim, wherein at least two of the electronic devices (114) are of the same type, wherein the at least two electronic devices (114) of the same type are assigned different addresses.

5. The method according to any of the preceding claims, wherein the circuit component (114) comprises at least one printed circuit board PCB (132), wherein the testing of the circuit component (110) is an in-circuit test ICT, and wherein the testing system (112) is an ICT system.

6. The method of any of the preceding claims, wherein the electronic device (114) is part of a network (134), and wherein the address is a network address.

7. A method according to any one of the preceding claims, wherein the communication protocol determines at least an address set, wherein the address set includes at least an available address set, wherein step e) includes assigning at least one of the attributes and the UID of the electronic device (114) determined by using the test system (112) to an available address.

8. A method according to any of the preceding claims, wherein the communication protocol at least determines a command set for communication between the circuit component (110) and the test system (112), wherein the command set includes at least one general command issued to all electronic devices (114) included in the circuit component (110).

9. A method according to any of the preceding claims, wherein the reading of the UID in step c) is triggered by detecting a predetermined logical state of the electronic device (114) using the test system (112), wherein the logical state is determined in the communication protocol.

10. The method according to the preceding claim, wherein the predetermined logic state comprises a predetermined voltage applied to at least one pin (130) of the electronic device (114).

11. The method according to any of the preceding claims, wherein at least one of steps d) and e) is at least partially performed by using the test system (112).

12. The method according to any of the preceding claims, wherein at least one of steps d) and e) is at least partially performed by using a controller (122).

13. The method according to any of the preceding claims, wherein at least one of steps d) and e) is performed upon initial power-up of the circuit assembly (110).

14. A method according to any of the preceding claims, wherein step a) includes connecting the test system to an interface (116) of the circuit component (110) by using an adapter (126) of the test system (112), wherein step a) further includes contacting pins (120, 130) of the electronic device (114) by using the adapter (126).

15. An electronic device (114) having an address assigned by using at least the following steps: a) starting a test system (112), the test system (112) being used to perform a test on a circuit assembly (110) including the electronic device (114); b) implementing a communication protocol between the circuit assembly (110) and the test system (112); c) reading out a predetermined unique identifier UID of the electronic device (114) by using the test system (112); d) assigning the UID to at least one attribute of the electronic device (114) within a lookup table (136), wherein the attribute is determined using the test system (112); and e) assigning an address to the electronic device (114) by using the lookup table (136).

16. A circuit assembly (110) comprising at least one electronic device (114) and at least one interface (116), wherein the electronic device (114) has an address assigned by using at least the following steps: a) starting a test system (112), the test system (112) being used to perform a test on a circuit assembly (110) including the electronic device (114); b) implementing a communication protocol between the circuit assembly (110) and the test system (112); c) reading out a predetermined unique identifier UID of the electronic device (114) by using the test system (112); d) assigning the UID to at least one attribute of the electronic device (114) within a lookup table (136), wherein the attribute is determined using the test system (112); and e) assigning an address to the electronic device (114) by using the lookup table (136).

17. The circuit assembly (110) according to the preceding claim, wherein the interface (116) is a serial interface.

18. The circuit assembly (110) of any one of the preceding claims relating to the circuit assembly (110), wherein the interface (116) comprises at least one bus (118), wherein the bus (118) is an integrated circuit interconnect I 2 C.

19. A test system (112) configured to perform testing of at least one circuit component (110), wherein the circuit component (110) includes at least one electronic device (114) and at least one interface (116), wherein the test system (112) is further configured to read out a predetermined unique identifier UID of the electronic device (114), and wherein the test system (112) is further configured to determine at least one attribute of the electronic device (114).

20. Use of at least one of a method according to any of the preceding method claims, an electronic device (114) according to any of the preceding claims involving an electronic device (114), a circuit component (110) according to any of the preceding claims involving a circuit component (110), and a test system (112) according to any of the preceding claims involving a test system (112), wherein the purpose of the use is an automotive application.

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