System and method of configuring radiographic system

Abstract

An example method of configuring a radiographic system having a radiation emitter and a radiation detector includes analyzing, using processing circuitry, a reference image captured with a first value of a first power parameter of the radiation emitter to determine a value of a focus size of the radiation emitter; outputting an indication of whether the selected value of the first power parameter causes the value of the non-definition parameter to satisfy a threshold non-definition value based on a determined relationship between the first value of the first power parameter and the value of the focus size; and using the selected power parameter to control the radiographic system to perform a radiographic process to obtain one or more radiographic images satisfying a threshold non-definition value.

Description

Technical Field

[0001] This application claims the benefit of U.S. Provisional Patent Application No. 63 / 389,664, entitled “SYSTEM AND METHOD FOR CONFIGURING A RADIOGRAPHIC SYSTEM,” filed on July 15, 2022. The entire contents of U.S. Provisional Patent Application No. 63 / 389,664 are expressly incorporated herein by reference. Technical Field

[0003] The present disclosure relates generally to industrial radiographic imaging processes and, more particularly, to systems and methods for configuring radiographic systems. Background Art

[0004] Industrial radiographic imaging systems are used to acquire two-dimensional (2D) radiographs, 2D sinograms, and / or three-dimensional (3D) volume data of components for industrial applications. Such industrial applications may include, for example, aerospace, automotive, electronics, medical, pharmaceutical, military, and / or defense applications. 2D radiographs may be evaluated to inspect components for cracks, defects, flaws, discontinuities, and / or anomalies that may or may not be visible to the human eye, and / or to determine internal and / or external measurements of components.

[0005] By comparing the conventional and traditional systems with the present disclosure as set forth in the remainder of this application with reference to the accompanying drawings, the limitations and disadvantages of the conventional and traditional approaches will become apparent to those skilled in the art. Summary of the invention

[0006] The present disclosure is directed to systems and methods for configuring a radiographic system, substantially as shown in and / or described in connection with at least one of the accompanying drawings and as more fully set forth in the claims.

[0007] These and other advantages, aspects and novel features of the present disclosure, as well as details of an illustrated example thereof, will be more fully understood from the following description and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] Figure 1 An example of an industrial radiography system according to aspects of the present disclosure is shown.

[0009] Figure 2 Shown with Figure 1 Block diagram of an industrial X-ray camera example X-ray system.

[0010] Figure 3A and 3B Shows that you can use Figure 1 and Figure 2 An example of a focus measurement configuration implemented with a radiographic system to measure focus size using configured parameters.

[0011] Figure 4 Shows that you can use Figure 1 and Figure 2 An example user interface implemented for a radiographic system.

[0012] Figure 5 is a graph representing example stored focus data that may be used to determine focus based on configured power.

[0013] Figure 6 is a flowchart representing example machine-readable instructions that may be executed by Figure 1 and Figure 2 An example X-ray radiography system of is implemented to determine imaging parameters of a radiographic procedure based on a measured focal spot.

[0014] Fig. 7A and 7B A flowchart representing other example machine-readable instructions is shown, which may be executed by Figure 1 and Figure 2 An example X-ray radiography system of is implemented to determine imaging parameters of a radiographic procedure based on a measured focal spot.

[0015] Figure 8 is a flowchart representing other example machine-readable instructions that may be executed by Figure 1 and Figure 2 An example X-ray radiography system of is implemented to determine imaging parameters for a radiographic procedure based on a specified pixel pitch and / or voxel size.

[0016] Fig. 9 It is a flow chart, which shows that Figure 1 and Figure 2 Example machine readable instructions implemented by an example X-ray radiography system to provide guidance for imaging parameters of a radiography procedure based on the measured focus.

[0017] Fig.10 is a flowchart representing other example machine-readable instructions that may be executed by Figure 1 and Figure 2 The example X-ray radiography system 100 is implemented to provide guidance for imaging parameters of a radiography procedure based on a specified effective pixel pitch and / or effective voxel size.

[0018] The drawings are not necessarily drawn to scale. Where appropriate, the same or similar reference numbers are used in the drawings to represent the same or similar elements. DETAILED DESCRIPTION

[0019] In computed tomography (CT) and other industrial radiographic applications, spatial resolution is a parameter used to describe the size of features that can be resolved in the resulting radiograph. Unsharpness appears as blur in a radiograph, for example around the edges of an inspected object. Unsharpness is related to several parameters of the radiographic configuration, including geometric features, emitter focal spot size, and other factors that affect the focal spot (e.g., emitter voltage, emitter current, emitter power). In general, unsharpness increases with increasing focal spot size and increases with increasing geometric magnification.

[0020] In some conventional radiographic system designs, the focal spot is set to a specific size and the power is limited for the set focal spot size. The focal spot size varies slightly with changes in transmitter voltage, current, and / or power. In other conventional radiographic systems, the focal spot size increases with increasing power and the focal spot size of the transmitter is proportional to the transmitter power to some extent. Some conventional radiographic systems make assumptions about the focal spot size based on the power. However, since the focal spot size is assumed, the operator is also required to estimate or predict the operating parameters. Due to imprecise parameter settings, conventional systems may produce radiographs with higher than desired (or higher than acceptable) unsharpness and / or require longer radiographic processing times to obtain images with acceptable unsharpness. In addition, radiographic transmitters may degrade or otherwise change over time, causing the relationship between focal spot size and power to change. Additionally or alternatively, detector degradation may affect spatial resolution and result in the need to increase geometric magnification, which may require corresponding changes to the transmitter configuration.

[0021] The disclosed systems and methods perform measurements of focal spot size to determine and / or guide selection of one or more parameters of a radiographic system for performing a radiographic procedure. By measuring the actual focal spot size, the true unsharpness of the radiographic system can be understood for a given radiographic technique or application, thereby allowing for a more accurate representation of blur in an image. In some examples, the radiographic system can be populated with measurement data relating to transmitter power, transmitter voltage, transmitter current, focal spot size in one or more dimensions, two-dimensional and / or three-dimensional spatial resolution, voxel size, pixel pitch, and / or geometric magnification of the radiographic system. The stored measurement data can update and / or supplement measurements taken after the radiographic system is installed.

[0022] The disclosed example systems and methods provide recommendations for one or more radiographic imaging parameters based on measuring the focus of a radiographic system to provide an unsharpness less than a predetermined threshold without causing an increase in imaging processing time associated with reducing the unsharpness to significantly exceed the threshold. For example, by maximizing power while maintaining below a threshold unsharpness value, the example systems and methods can attempt to optimize a balance between unsharpness and imaging processing time (e.g., photon counts, frames per second, total processing time, etc.). In some examples, the threshold unsharpness corresponds to the pixel or voxel size or pixel pitch of a radiographic detector, because further reducing the blur below a single pixel size may result in undetectable and unhelpful changes in image quality. However, in other examples using sub-pixel spatial resolution, the threshold unsharpness (or the upper limit of the target unsharpness range) may be less than the pixel pitch of the detector. As unsharpness decreases, image quality improves. If image quality improves due to a change in imaging parameters, then for a particular geometric magnification, the focal spot size has been improved. The disclosed example systems and methods utilize a single pixel threshold to determine a specific unsharpness value for a given geometric magnification and power by measuring the focal spot size.

[0023] Although example systems and methods are disclosed below with reference to unsharpness parameters or values, other examples may use similar, equivalent, or related measurements, such as sharpness or spatial resolution. The terms "unsharpness" and "blur" are used interchangeably herein.

[0024] As used herein, the terms "effective pixel pitch" and "voxel size" are used interchangeably.

[0025] An example method disclosed for configuring a radiographic system having a radiation emitter and a radiation detector includes: analyzing, using a processing circuit, a reference image captured using a first value of a first power parameter of the radiation emitter to determine a value of a focal spot size of the radiation emitter; outputting an indication of whether a selected first power parameter value causes a value of an unsharpness parameter to satisfy a threshold unsharpness value based on the determined relationship between the first value of the first power parameter and the value of the focal spot size; and controlling the radiographic system using the selected power parameter to perform a radiographic process to obtain one or more radiographs that satisfy the threshold unsharpness value.

[0026] Some example methods also include receiving an updated value of the first power parameter and outputting an indication indicating whether the updated value of the first power parameter causes the value of the unsharpness parameter to satisfy a threshold unsharpness value. Some example methods also include outputting a recommended change to the value of the first power parameter so that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

[0027] Some example methods further include outputting an indication of whether the detected magnification value causes the value of the unsharpness parameter to satisfy a threshold unsharpness value. Some example methods further include outputting a recommended change to the magnification value so that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

[0028] In some example methods, the threshold unsharpness value is based on at least one of a pixel size and / or a pixel pitch of the radiation detector. In some example methods, the threshold unsharpness value is set to one of a pixel size or a pixel pitch of the radiation detector. In some example methods, the analysis of the reference image includes analyzing the reference image to determine one or more dimensions of the reference feature based on a predetermined gauge device. Some example methods also include measuring one or more dimensions of the blur in the reference image and storing the one or more dimensions in a storage device in association with at least one of a first power parameter, a measurement location on the reference image, a current focus size, a voxel size, an effective pixel pitch, or a magnification parameter.

[0029] In some example methods, the radiation emitter comprises an X-ray tube and the radiation detector comprises a digital X-ray detector.Some example methods also include determining a value of an unsharpness parameter based on the measured focus size and magnification parameters.

[0030] The disclosed example radiographic system includes: a user interface; a radiation detector; a radiation emitter configured to emit radiation to the radiation detector; an object positioner configured to position an object to be inspected between the radiation detector and the radiation emitter; and a computing device including a processing circuit, the processing circuit being configured to: analyze a reference image captured using a first value of a first power parameter of the radiation emitter to determine a value of a focal spot size of the radiation emitter; based on a determined relationship between the first value of the first power parameter and the value of the focal spot size, output via the user interface an indication of whether the selected first power parameter value causes the value of an unsharpness parameter to satisfy a threshold unsharpness value; and control the radiation emitter using the selected power parameter to perform a radiographic process to obtain one or more radiographs that satisfy the threshold unsharpness value.

[0031] In some example radiographic systems, the user interface is configured to receive an updated value of the first power parameter, and the processing circuitry is configured to output an indication of whether the updated value of the first power parameter causes the value of the unsharpness parameter to satisfy a threshold unsharpness value. In some example radiographic systems, the processing circuitry is configured to output a suggested change to the value of the first power parameter such that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

[0032] In some example radiographic systems, the processing circuitry is configured to output an indication of whether the detected magnification value causes the value of the unsharpness parameter to satisfy a threshold unsharpness value. In some example radiographic systems, the processing circuitry is configured to output a recommended change to the magnification value so that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

[0033] In some example radiographic systems, the threshold unsharpness value is based on at least one of a pixel size and / or a pixel pitch of a radiation detector. In some example radiographic systems, the threshold unsharpness value is set to one of a pixel size or a pixel pitch of a radiation detector. In some example radiographic systems, the processing circuit is configured to analyze a reference image by analyzing the reference image to determine one or more dimensions of a reference feature based on a predetermined gauge device. In some example radiographic systems, the processing circuit is configured to: measure one or more dimensions of a blur in a reference image; and store the one or more dimensions in a storage device in association with at least one of a first power parameter, a measurement position on the reference image, a current focus size, a voxel size, an effective pixel pitch, or a magnification parameter.

[0034] Figure 1 An example of an industrial X-ray radiography system 100 is shown. In some examples, the X-ray radiography system 100 can be used to perform non-destructive testing (NDT), digital radiography (DR) scanning, computed tomography (CT) scanning, and other applications on an object 102. The object 102 can be an industrial component or a combination of components (e.g., an engine casting, a microchip, a bolt, etc.). Sometimes, the object 102 may be relatively small, thereby requiring a more delicate, detailed, and higher resolution radiographic imaging process. For simplicity, this document is mainly described with respect to X-rays, but in some examples the industrial X-ray radiography system 100 described herein can use radiation of other wavelengths (e.g., gamma rays, neutron rays, terahertz rays, etc.).

[0035] like Figure 1 As shown, the X-ray radiography system 100 directs X-ray radiation 104 from an X-ray emitter 106 through an object 102 to an X-ray detector 108. In some examples, the X-ray emitter 106 may include an X-ray tube configured to emit a cone or fan-shaped X-ray radiation. In some examples, the X-ray emitter 106 may emit X-ray radiation with an energy range of 20 kiloelectronvolts (keV) to 15 megaelectronvolts (MeV).

[0036] In some examples, two-dimensional (2D) digital images (e.g., radiographs, X-ray images, etc.) may be generated based on the X-ray radiation 104 incident on the X-ray detector 108. In some examples, these 2D images may be generated by the X-ray detector 108 itself. In some examples, the 2D images may be generated by the X-ray detector 108 in conjunction with a computing system in communication with the X-ray detector 108.

[0037] The X-ray detector 108 can continuously capture / acquire 2D images at a given frame rate (e.g., in a free-running mode) as long as the X-ray detector 108 is powered on. However, in some examples, the X-ray detector 108 (and / or associated computing system) can fully generate the 2D image only when a scanning / imaging process is selected and started. Similarly, in some examples, the 2D image is saved in a permanent (i.e., non-volatile) memory only when a scanning / imaging process has been selected and started.

[0038] In some examples, 2D images generated by the x-ray detector 108 (and / or associated computing system) may be combined to form a three-dimensional (3D) volume and / or image. In some examples, 2D image slices of a 3D volume / image may also be formed. The term "image" as used herein is shorthand, but it is understood that an "image" may actually include representational data until such data is visually presented by one or more appropriate components (e.g., a display screen, a graphics processing unit, an x-ray detector 108, etc.).

[0039] In some examples, the X-ray detector 108 may include a flat panel detector (FDA), a linear diode array (LDA), and / or a lens-coupled scintillation detector. In some examples, the X-ray detector 108 may also include a fluoroscope detection system and / or a digital image sensor configured to indirectly receive images through scintillation. In some examples, the X-ray detector 108 is implemented using a sensor panel (e.g., a charge-coupled device (CCD) panel, a complementary metal oxide semiconductor (CMOS) panel, etc.) that is configured to directly receive X-rays and generate a digital image. The X-ray detector 108 may include a scintillating layer / screen that absorbs X-rays and emits visible photons, which are then detected by a solid-state detector panel (e.g., a CMOS X-ray panel and / or a CCD X-ray panel) coupled to the scintillating screen.

[0040] In some examples, the X-ray detector 108 (e.g., a solid-state detector panel) can include pixels. In some examples, a pixel can correspond to a portion of a scintillating screen. In some examples, the size of each pixel can range from tens of microns to hundreds of microns. In some examples, the pixel size can be in the range of 25 microns to 250 microns (e.g., 200 microns). The pixel pitch refers to the distance from the center of adjacent pixels to the center. The pixel pitch may be the same or different along different directions or axes of the X-ray detector 108.

[0041] The 2D images captured by the X-ray detector 108 (and / or an associated computing system) may contain features that are finer (e.g., smaller, denser) than the pixel size of the X-ray detector 108. For example, a computer microchip may have very fine features that are smaller than a pixel. In such cases, it may be useful to use sub-pixel sampling to obtain a higher, more detailed resolution than would otherwise be possible.

[0042] exist Figure 1 In the example of FIG. 1 , the X-ray system 100 includes a detector positioner 150 configured to move the X-ray detector 108 to different detector positions (e.g., for sub-pixel sampling). As shown, the detector positioner 150 includes two parallel posts 152 connected by two parallel rails 154. As shown, the X-ray detector 108 is held on the rails 154. As shown, the X-ray detector 108 can be held on (and / or attached to) the rails 154 by one or more intermediate supports.

[0043] Because X-ray detector 108 may be moved by detector positioner 150, object 102 may be moved by object positioner 110 in some examples. Figure 1 In some examples, object positioner 110 holds object 102 in the path of X-ray radiation 104, between X-ray emitter 106 and detector 108. In some examples, object positioner 110 may be configured to move object 102 toward and / or away from X-ray emitter 106 and / or X-ray detector 108, thereby changing the geometric magnification (defined as the distance between X-ray emitter 106 and X-ray detector 108 divided by the distance between X-ray emitter 106 and object 102). In some examples, object positioner 110 may also be configured to move and / or rotate object 102, so as to position a desired portion and / or orientation of object 102 in the path of X-ray radiation 104. In some examples, object positioner 110 may position object 102 at different angles / orientations relative to X-ray emitter 106 and / or X-ray detector 108, so as to obtain 2D images of different orientations, which may then be used to generate one or more three-dimensional (3D) images of object 102.

[0044] exist Figure 1 In the example of , the object positioner 110 includes a rotatable fixture 112 on which the object 102 is placed. As shown, the rotatable fixture 112 is a circular plate, and as shown, the rotatable fixture 112 is attached to a motorized spindle 116, by which the rotatable fixture 112 can be rotated about an axis defined by the spindle 116. In some examples, one or more alternative and / or additional rotation mechanisms may be provided.

[0045] exist Figure 1 In some examples, the rotatable fixture 112 is supported by a support structure 118. The support structure 118 can be configured to translate the rotatable fixture 112 (and / or the object 102) toward and / or away from the X-ray emitter 106 and / or the X-ray detector 108. In addition, the support structure 118 can be configured to translate the rotatable fixture 112 (and / or the object 102) horizontally or vertically relative to the emitter 106 and the detector 108. In some examples, the support structure 118 may include one or more actuators configured to apply the translation. In some other examples, the X-ray emitter 106 and / or the X-ray detector 108 can be moved relative to a fixed or movable fixture and the support structure 118. For example, the X-ray emitter 106 and / or the X-ray detector 108 can move toward and / or away from the fixture, move up and / or down relative to the fixture, rotate around the fixture, and / or otherwise move and / or reorient while the fixture remains stationary or moves and / or reorients.

[0046] although Figure 1 An example object positioner 110 is shown in the example of FIG, but a different object positioner 110 may be used in other examples. For example, a robotic object positioner may be used to translate and / or rotate the object 102. Similarly, although Figure 1 The rotatable clamp 112 is shown as a circular plate in the example of FIG. 1 , but in some examples, the rotatable clamp 112 may include a different clamp, such as a clamp, a snap, a clip, and / or other retaining mechanism.

[0047] Figure 2 An example of an X-ray radiography system 200 is shown, which includes the X-ray radiography system 100, such as Figure 1 The X-ray radiography system 100 is shown. As shown, the X-ray radiography system 200 also includes a computing system 202, a user interface (UI) 204, and a remote computing system 299. Figure 2In the example shown, only one X-ray radiography system 100, computing system 202, UI 204 and remote computing system 299 are shown, but in some examples, the X-ray radiography system 200 may include multiple X-ray radiography systems 100, computing systems 202, UI 204 and / or remote computing systems 299.

[0048] exist Figure 2 In the example of , the radiographic system 100 has an emitter 106, a detector 108, a detector positioner 150, and an object positioner 110, all of which are enclosed in a housing 199. As shown, the radiographic system 100 is connected to and / or communicates with a computing system 202 and a UI 204. In some examples, the radiographic system 100 can also be in electrical communication with a remote computing system 299. In some examples, the communication and / or connection can be electrical, electromagnetic, wired, and / or wireless.

[0049] exist Figure 2 In some examples, UI 204 includes one or more input devices 206 and / or output devices 208. In some examples, one or more input devices 206 may include one or more touch screens, mice, keyboards, buttons, switches, sliders, knobs, microphones, dials, and / or other electromechanical input devices. In some examples, one or more output devices 208 may include one or more display screens, speakers, lights, tactile devices, and / or other devices. In some examples, a user can provide input to and / or receive output from the X-ray camera 100, the computing system 202, and / or the remote computing system 299 via UI 204.

[0050] In some examples, UI 204 can be part of computing system 202. In some examples, computing system 202 can implement one or more controllers of radiographic system 100. In some examples, computing system 202 and UI 204 together can constitute an image acquisition system of radiographic system 200. In some examples, remote computing system 299 can be similar or identical to computing system 202.

[0051] exist Figure 2 In the example of , the computing system 202 communicates (e.g., electrically) with the X-ray radiography system 100, the UI 204, and the remote computing system 299. In some examples, the communication can be direct communication (e.g., via a wired and / or wireless medium) or indirect communication, for example, via one or more wired and / or wireless networks (e.g., a local area network and / or a wide area network). As shown, the computing system 202 includes a processing circuit 210, a storage circuit 212, and a communication circuit 214, which are interconnected via a common electrical bus.

[0052] In some examples, processing circuit 210 may include one or more processors. In some examples, communication circuit 214 may include one or more wireless adapters, wireless network cards, cable adapters, wired adapters, radio frequency (RF) devices, wireless communication devices, Bluetooth devices, devices compliant with IEEE 802.11 standards, WiFi devices, cellular devices, GPS devices, Ethernet ports, network ports, Lightning cable ports, cable ports, etc. In some examples, communication circuit 214 may be configured to communicate via one or more wired media and / or protocols (e.g., Ethernet cables, universal serial bus cables, etc.) and / or wireless media and / or protocols (e.g., near field communication (NFC), ultra-high frequency radio waves (commonly known as Bluetooth), IEEE802.11x, Zigbee, HART, LTE, Z-Wave, WirelessHD, WiGig, etc.).

[0053] exist Figure 2 In some examples, the storage circuit 212 contains and / or stores one or more focus measurement processes and / or imaging processes. In some examples, the one or more focus measurement processes and / or imaging processes are implemented by machine-readable (and / or processor-executable) instructions 216 stored in the storage circuit 212 and / or executed by the processing circuit 210. In some examples, the one or more focus measurement processes and / or imaging processes are performed as part of a larger scanning and / or imaging process of the X-ray radiography system 200. The example storage circuit 212 may also include data, such as a reference table or lookup table containing measurement data.

[0054] Figure 1 and Figure 2 The example radiographic system 100 performs a focus measurement process to measure the focus of the configuration of the radiographic system 100. The focus measurement process can be performed manually or automatically. The configuration can include a specific power and / or geometric magnification of the emitter 106. The focus measurement process can be performed periodically (e.g., daily or other set period of time), non-periodically, at a predetermined time, on demand, in response to predetermined criteria (e.g., prior to an imaging process), and / or at any other time.

[0055] To measure the focal spot size, a reference image is captured using a known reference object having predetermined dimensions. For example, a standard reference gauge device such as a tungsten crosshair or a circular or cylindrical plate has predetermined dimensions that can be used in conjunction with the geometric features of the emitter 106, the detector 108, and the position of the reference gauge device as the object 102 to measure the focal spot size by measuring the unsharpness in the reference image. The reference image can be captured at one or more predetermined reference locations, which can include predetermined distances between the emitter 106, the detector 108, and / or the object 102. The reference image can be captured as a real-time image, and / or can be based on a previously captured image (e.g., an image captured using the same power parameters).

[0056] Figure 3A Shows that you can use Figure 1 and Figure 2 106 to measure a focal spot size 302 using configured parameters. The configuration 300 includes an emitter 106, a detector 108 positioned at a first distance 304 from the emitter 106, and an object 102 positioned at a second distance 306 from the emitter 106. The resulting geometric magnification of the configuration 300 is a ratio of the first distance 304 to the second distance 306 (e.g., the geometric magnification increases as the object 102 approaches the emitter 106).

[0057] Based on the distances 304, 306 and the predetermined size of the object 102 (e.g., tungsten crosshairs), the radiographic system 100 determines an expected size 308 of the object 102 produced in the reference image 310. The example radiographic system 100 analyzes the reference image 310 to determine an applicable size of the reference feature based on the predetermined size of the object 102. For example, the size may include one or more sizes of the object 102 in the image 310 and / or one or more sizes of blurriness present in the image 310. The radiographic system 100 further determines an observed size 312 of the object 102 produced in the reference image. The blurriness is then determined based on the difference between the observed size 312 and the expected size 308. The radiographic system 100 can then calculate the focal spot size using, for example, a common industry-accepted formula for measuring unsharpness (Ug) (e.g., ASTM E2903, ASTM E1165, etc.).

[0058] Figure 3B Shows another way to use Figure 1 and Figure 2 An example focus measurement configuration 320 implemented by the radiographic system 100 of the present invention to measure the focus size using the configured parameters. The example configuration 320 is Figure 3AThe configuration 300 is similar to that of FIG. 1. However, the example object 102 is a circular or cylindrical plate, or a spherical object, which results in the reference image 322 having a different size shape.

[0059] Figure 1 The example radiographic system 100 determines an expected size 324 of an object in a reference image 322 (e.g., based on geometric features) and a measured size 326 of the object. The radiographic system 100 then determines a measured focal spot size based on the measured blur. Figure 3B The blur in the reference image 322 is non-uniform, so the radiographic system 100 can blur the blur and determine the blur as an average blur or other filtered value based on samples 328 taken around the object in the reference image and / or based on fitting a function to the blur and determining an average or maximum blur value or other filtered blur value. The radiographic system 100 can then calculate the focus size and shape based on the measured unsharpness (Ug). For example, when imaging a circular or spherical object, the radiographic system 100 can calculate measurements of the focus size and shape in multiple dimensions. The focus shape (e.g., dimensions in 2 or more directions) allows the radiographic system 100 to select a geometric magnification and / or power for a given application to avoid exceeding an unsharpness threshold in more than one direction. Although some of the examples disclosed herein are discussed with reference to one dimension, any example system and method can be adjusted for measuring and configuring multiple dimensions of focus.

[0060] Figure 4 Demonstrates a method that can be used Figure 1 and Figure 2 1 and 2. An example of a user interface 400 implemented by the radiographic system 100 (e.g., the user interface 204) of FIG. 4 is provided. The example user interface 400 includes a pixel spacing input 402, a geometric magnification input 404, an emitter voltage input 406, an emitter current input 408, a voxel size input 410, and an unsharpness limit value input 412. The example interface 400 also includes a calculated current unsharpness value output 414.

[0061] Any of the example inputs 402-412 may also be selected as output as a recommended value based on the other inputs 402-412. After measuring the focal spot size, the example radiographic system 100 may recommend or determine one or more imaging parameters based on one or more input parameters. For example, if the operator enters (or configures) a specific geometric magnification via the geometric magnification input 404, the radiographic system 100 may set or recommend a power (e.g., voltage and / or current) for the emitter 106 to obtain an unsharpness value Ug that is less than a threshold unsharpness (e.g., less than 1 pixel width, less than a pixel pitch). For example, the interface 400 may display the recommended power, voltage, and / or current by displaying the values ​​in the voltage input area 406 and / or the current input area 408.

[0062] Additionally or alternatively, if the operator inputs (or configures) a specific power for the emitter 106 (e.g., via an emitter voltage input 406 and / or an emitter current input 408), the radiographic system 100 can set or recommend a geometric magnification (e.g., a physical configuration of the emitter 106, the detector 108, and the object 102) to obtain an unsharpness value Ug that is less than a threshold unsharpness. For example, the interface 400 can display the recommended geometric magnification by displaying the value in a geometric magnification area 404. In other examples, the operator can specify any of a voxel size limit (e.g., a specific voxel size, a minimum voxel size, a maximum voxel size), a spatial resolution limit (e.g., a minimum spatial resolution), an effective pixel pitch, and / or any other relevant parameters. Based on the input needs or limitations, the radiographic system 100 can determine any of a focal spot size, power, voltage, current, geometric magnification, and / or any other parameters and / or configurations to perform a radiographic imaging process according to the input parameters.

[0063] The example interface 400 also includes a button (or other input device) that allows the operator to specify which of the one or more parameters the operator wishes to receive recommended values ​​for. For example, the interface 400 includes a "recommended magnification" button 416 to cause the radiographic system 100 to determine a geometric magnification value (e.g., based on the pixel spacing 402, the emitter voltage 406, the emitter current 408, and the unsharpness limit 412, the effective pixel spacing or voxel size 410, and / or the determined focal spot size). The interface 400 also includes "recommended voltage" and "recommended current" buttons 418, 420 to cause the radiographic system 100 to determine voltage and / or current values ​​for the emitter 106 (e.g., based on the pixel spacing 402, the geometric magnification 404, the effective pixel spacing or voxel size 410, and the unsharpness limit 412, and / or the determined focal spot size).

[0064] The example interface 400 also includes a "Solve Effective Pixel Spacing / Effective Voxel Size" button 422 that causes the radiographic system 100 to determine a set of parameters (e.g., geometric magnification, emitter voltage, emitter current) for the specified voxel size input 410 and the unsharpness limit 412 (e.g., based on the pixel spacing 402). For example, if the operator specifies a 40 micron voxel requirement for a given radiographic procedure, the radiographic system 100 determines the required geometric magnification based on the pixel spacing and the voxel size (e.g., geometric magnification = pixel spacing / voxel size). Using the geometric magnification, the radiographic system 100 can then determine the power based on the measured focal spot size and the determined geometric magnification.

[0065] In some examples, the radiographic system 100 stores the data in a storage device (e.g., Figure 2 The radiographic system 100 may store data 218 (e.g., a reference table, a lookup table, or an equivalent function) in a storage circuit 212 that relates transmitter power, voltage, current, geometric magnification, pixel size, pixel pitch, voxel size, focal spot size, and / or any other parameter to unsharpness. The reference table may be pre-populated with data obtained by a manufacturer, installer, maintainer, and / or operator during and / or after manufacture and during or after installation of the radiographic system 100. Additionally or alternatively, the radiographic system 100 may supplement or update the reference table based on subsequent focal spot measurements.

[0066] The example radiography system 100 references a reference table to determine radiography parameters based on input parameters. For example, the reference table can be used when the operator does not want to perform a focus measurement before the radiography process, and / or within a defined time window after performing a focus measurement. Table 1 below shows a portion of an example reference table that can be stored in the storage circuit 212, referenced to determine parameters, and / or updated.

[0067]

[0068] Table 1 - Example Reference Table

[0069] Figure 5 5 is a graph 500 representing example stored focus data that can be used to determine focus based on configured power. Graph 500 depicts a range of focus sizes corresponding to transmitter power values. A set of reference values ​​502 corresponds to a default or assumed focus size value of 1 W / μm. A first set of observed focus size values ​​504 are measured at a first transmitter voltage (X kV) and a second set of observed focus size values ​​are measured at a second transmitter voltage (Y kV). The data may include additional voltages and / or may be measured for multiple dimensions of the detector 108.

[0070] As the radiographic system 100 performs focus measurements, the radiographic system 100 may add data points to the observations 504, 506. In some examples, the radiographic system 100 replaces an existing data point with an updated data point if the updated data point has the same transmitter power.

[0071] In some examples, rather than measuring an absolute focal spot size, stored values ​​(e.g., the reference table described above, value 504, value 506, etc.) are used to determine adjustments to the current configuration. For example, if a particular transmitter power corresponds to a measured unsharpness value that is above an unsharpness threshold or significantly below an unsharpness threshold, the radiographic system 100 can determine an increment or decrement in power based on the values ​​in the table or graph 500 to obtain a desired unsharpness (e.g., obtain a focal spot size that corresponds to that unsharpness).

[0072] By storing and updating the data, the radiographic system 100 can summarize the data points and use machine learning algorithms to identify trends, degradation of the radiographic system 100 (e.g., degradation of the emitter 106 and / or detector 108), and / or any other changes in the radiographic system 100 over time. For example, the radiographic system 100 can identify thresholds for normal focal spot sizes at different power values, and / or upper and / or lower control limits to identify fluctuations outside of a normal range. Additionally or alternatively, the machine learning algorithm can learn to adjust the values ​​and / or limits over time and / or system life to detect and / or predict changes in the imaging system and the corresponding impact on image quality. These potential impacts can be accepted by the operator to allow the system to learn based on these data points. If a data point is deemed to be outside of an acceptable range (e.g., based on a determined threshold), the operator can be provided with the option of performing hardware and / or imaging setting corrections.

[0073] Figure 6 is a flow chart representing example machine readable instructions 600 that may be executed by Figure 1 and Figure 2 The example X-ray radiography system 100 is implemented to determine imaging parameters for a radiography process based on the measured focus. The example instructions 600 may be stored in a storage device (e.g., Figure 2 212) and by a processing circuit (e.g., Figure 2 The processing circuit 210) is executed.

[0074] At block 602, the X-ray detector 108 captures a reference image in a reference configuration (e.g., Figure 3AFor example, the reference configuration may include a predetermined arrangement of the radiation emitter 106, the reference object 102 under inspection, and the X-ray detector 108. The predetermined arrangement may have been previously measured as a preferred arrangement for obtaining accurate measurements of the blur and / or focal spot size.

[0075] At block 604, processing circuit 210 measures blur in reference image 310. For example, processing circuit 210 may calculate expected size 308 of an object in reference image 310 and measure actual size 312 of the object in the image. Processing circuit 210 may then determine blur as half of the difference between expected size 308 and actual size 312. Blur may be measured along multiple dimensions. At block 606, processing circuit 210 determines a focal size based on the measured blur.

[0076] At block 608, processing circuitry 210 records the focal spot size, actual geometric magnification, calculated geometric magnification, transmitter voltage, power parameters, and unsharpness (e.g., in a reference table). For example, in addition to recording the geometric magnification used to capture the reference image, processing circuitry 210 may also calculate and store the geometric magnification at which the determined focal spot size will achieve a predetermined unsharpness threshold. The recorded data may be used to update current data in the reference table.

[0077] At block 610, the processing circuit 210 calculates unsharpness for the configuration of the imaging process to be performed. The configuration of the imaging process may be the same as or different from the reference configuration. For example, the arrangement may be changed while using the same transmitter power parameters, resulting in different geometric magnification and different unsharpness.

[0078] At block 612, the processing circuit 210 determines whether the calculated unsharpness is within a target unsharpness range configured for the process. For example, the target unsharpness range may be equal to or based on a pixel size or pixel spacing, such that the processing circuit 210 determines whether the unsharpness is less than the equivalent of one pixel. In other examples, the calculated unsharpness may be compared to a voxel size. However, any other desired threshold may be used.

[0079] In some examples, processing circuitry 210 may determine whether the calculated unsharpness is below an upper unsharpness threshold and / or above a lower unsharpness threshold in block 612. In some examples, the lower unsharpness threshold is determined to be a threshold that is slightly (e.g., by a predetermined amount or percentage of the threshold) lower than the upper unsharpness threshold, thereby avoiding unnecessarily long processing times to obtain substantially the same image quality.

[0080] If the calculated unsharpness is not within the target unsharpness range configured for the process (block 612), then at block 614, the processing circuitry 210 determines whether to adjust (e.g., correct) a power parameter (e.g., power, voltage, current). For example, the processing circuitry 210 may determine whether the geometric magnification factor is fixed, and / or whether the operator has requested a recommendation for a power parameter. In some examples, the processing circuitry 210 determines whether to adjust (e.g., correct) a geometric magnification factor parameter instead of adjusting a power parameter. For example, the processing circuitry 210 may determine whether the power parameter is fixed, and / or whether the operator has requested a recommended magnification factor.

[0081] If the power parameters are to be adjusted (block 614), then at block 616, the processing circuit 210 determines one or more power parameters based on the geometric magnification and the unsharpness threshold. For example, the processing circuit 210 may select one or more power parameters based on the geometric magnification and the unsharpness threshold in a reference table (e.g., Figure 2 The power, voltage, and / or current may be searched in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the value of the selected power parameter results in the value of the unsharpness parameter satisfying a threshold unsharpness.

[0082] If the power parameter is not adjusted (block 614), then at block 618, the processing circuit 210 determines a geometric magnification factor based on one or more power parameters and the unsharpness threshold. For example, the processing circuit 210 may determine a geometric magnification factor based on the power, voltage, and / or current and the unsharpness threshold in a reference table (e.g., Figure 2 The geometric magnification may be found in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the selected geometric magnification value results in the unsharpness parameter value satisfying a threshold unsharpness.

[0083] After determining the geometric magnification correction (block 618), after determining the power parameter correction (block 616), if there are no parameters to correct (block 618), and / or if the calculated unsharpness is within the target unsharpness range (block 612), then at block 620, the processing circuit 210 controls the imaging process based on the configured parameters. For example, the processing circuit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scans, etc.) using the parameters recommended by blocks 602-618 based on the measured focal spot size. The example instructions 600 then end.

[0084] Fig. 7A and 7B A flow chart 700 is shown, which shows that Figure 1 and Figure 2Other example machine readable instructions for determining imaging parameters for a radiographic process based on a measured focus, implemented by an example X-ray radiography system of the invention. The example instructions 700 may be stored in a storage device (e.g., Figure 2 212) and by a processing circuit (e.g., Figure 2 The processing circuit 210) is executed.

[0085] At block 702, processing circuit 210 receives (e.g., via Figure 2 and Figure 4 The operator may input the power parameter and geometric magnification into the user interface 400. For example, the operator may input the power, voltage and / or current and the geometric magnification into the user interface 400. In other examples, the power parameter and geometric magnification input may be automatically received in association with the object 102 to be detected using the system 100 (e.g., from a remote computing device, a data storage device).

[0086] At block 704, the X-ray detector 108 captures a reference image in a reference configuration (e.g., Figure 3A The reference configuration may include a received power and geometric magnification input or a predetermined power and geometric magnification. For example, the reference configuration may include a predetermined arrangement of the radiation emitter 106, the reference object 102 under inspection, and the X-ray detector 108. The predetermined arrangement may have been previously measured as a preferred arrangement for obtaining an accurate measurement of the blur and / or focal spot size.

[0087] At block 706, processing circuit 210 measures blur in reference image 310. For example, processing circuit 210 may calculate expected size 308 of an object in reference image 310 and measure actual size 312 of the object in the image. Processing circuit 210 may then determine blur as half of the difference between expected size 308 and actual size 312. Blur may be measured along multiple dimensions. At block 708, processing circuit 210 determines a focal size based on the measured blur.

[0088] At block 710, the processing circuit 210 records the focal size, the actual geometric magnification, the calculated geometric magnification, the power parameter, and the unsharpness (e.g., in a reference table). For example, in addition to recording the geometric magnification used to capture the reference image, the processing circuit 210 may also calculate and store a geometric magnification at which the focal size determined will obtain a predetermined unsharpness threshold. If used to generate the reference image 310, the actual geometric magnification and the power parameter may be the received geometric magnification and power parameter inputs. The recorded data may be used to update the current data in the reference table.

[0089] At block 712, the processing circuit 210 determines whether the measured unsharpness is within a target unsharpness range configured for the process. For example, an upper threshold of the target unsharpness range may be equal to or based on a pixel size or a pixel pitch, such that the processing circuit 210 determines whether the unsharpness is less than the equivalent of one pixel. In other examples, the calculated unsharpness may be compared to a voxel size. However, any other desired threshold may be used.

[0090] In some examples, processing circuitry 210 may determine whether the calculated unsharpness is below an upper unsharpness threshold and / or above a lower unsharpness threshold in block 712. In some examples, the lower unsharpness threshold is determined to be a threshold that is slightly (e.g., by a predetermined amount or percentage of the threshold) lower than the upper unsharpness threshold, thereby avoiding unnecessarily long processing times to achieve substantially the same image quality.

[0091] If the calculated unsharpness is not within the target unsharpness range configured for the process (block 712), then at block 714, the processing circuitry 210 determines whether to adjust (e.g., correct) a power parameter (e.g., power, voltage, current). For example, the processing circuitry 210 may determine whether the geometric magnification factor is fixed, and / or whether the operator has requested a recommended power parameter. In some examples, the processing circuitry 210 determines whether to adjust (e.g., correct) a geometric magnification factor parameter instead of a power parameter. For example, the processing circuitry 210 may determine whether the power parameter is fixed, and / or whether the operator has requested a recommendation for a recommended magnification factor.

[0092] If the power parameters are to be adjusted (block 714), then at block 716, the processing circuit 210 determines one or more power parameters based on the geometric magnification and the unsharpness threshold. For example, the processing circuit 210 may select one or more power parameters based on the geometric magnification and the unsharpness threshold in a reference table (e.g., Figure 2 The power, voltage, and / or current are then searched in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the value of the selected power parameter results in the value of the unsharpness parameter satisfying the threshold unsharpness. Control then returns to block 704 to iterate the focus measurement and comparison of the unsharpness to the threshold.

[0093] refer to Figure 7B If the power parameter is not adjusted (block 714), then at block 718, the processing circuit 210 determines the geometric magnification factor based on one or more power parameters and the unsharpness threshold. For example, the processing circuit 210 may determine the geometric magnification factor based on the power, voltage and / or current and the unsharpness threshold in a reference table (e.g., Figure 2The geometric magnification may be found in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the selected geometric magnification value results in the unsharpness parameter value satisfying a threshold unsharpness.

[0094] At block 720 , the processing circuit 210 calculates an updated unsharpness value based on the measured focal spot size and the determined geometric magnification.

[0095] At block 722, the processing circuit 210 determines whether the calculated unsharpness is within a target unsharpness range for the process configuration. Block 722 may be the same, similar, or different than block 712. If the calculated unsharpness is within the target unsharpness range (block 722), then at block 724, the processing circuit 210 determines whether the imaging parameters for the updated parameters and / or configuration are improved relative to the previous parameters. For example, the processing circuit 210 may determine whether the imaging processing time is higher or lower than the previous iteration while remaining below a threshold unsharpness. If the imaging parameters are improved (block 724), or if the calculated unsharpness is not less than the threshold unsharpness (block 722), control returns to block 704 to iterate the focus measurement (e.g., using a different configuration) to improve the parameters.

[0096] In this manner, the processing circuitry 210 may iterate parameters to obtain acceptable, improved, or optimal parameters and configurations for a desired radiographic procedure.

[0097] If the imaging parameters have not improved (block 724), the processing circuit 210 selects the best identified parameters for the imaging process at block 726. For example, for each calculated unsharpness value and configuration, the parameters may be stored in a reference table.

[0098] If the calculated unsharpness is less than the threshold unsharpness (block 712), or if the power parameters and geometric magnification are not adjusted (block 718), or after selecting the best identified parameters (block 726), then at block 728, the processing circuit 210 controls the imaging process based on the configured parameters. For example, the processing circuit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scans, etc.) using the parameters recommended by blocks 702-726 based on the measured focal spot size. The example instructions 700 then end.

[0099] Figure 8 is a flowchart representing other example machine-readable instructions 800 that may be executed by Figure 1 and Figure 2The example X-ray radiography system 100 is implemented to determine imaging parameters of a radiographic procedure based on a specified effective pixel pitch and / or effective voxel size. The example instructions 800 may be stored in a storage device (e.g., Figure 2 212) and by a processing circuit (e.g., Figure 2 For example, the instructions 800 may be executed in response to inputting the voxel size input 410 through the interface 400 and selecting the “effective pixel pitch / effective voxel size” button 420.

[0100] At block 802, processing circuit 210 receives (e.g., via Figure 4 The processing circuit 210 may calculate the unsharpness threshold value by manually inputting and / or receiving the unsharpness threshold value from the pixel pitch and / or the effective voxel size. The processing circuit 210 may calculate the unsharpness threshold value by manually inputting and / or receiving the unsharpness threshold value from a remote computing system (e.g., Figure 2 The system 299) automatically receives the pixel spacing and / or effective voxel size and the unsharpness threshold.

[0101] At block 804, processing circuitry 210 determines whether the focal spot size is known (e.g., previously measured or otherwise determined). For example, if the focal spot size was determined (e.g., measured) less than a threshold time before using the measured power, processing circuitry 210 may look up the focal spot size in a reference table. If the focal spot size is known (block 804), then at block 806, processing circuitry 210 looks up the geometric magnification and power parameter values ​​from a storage device based on the focal spot size, the unsharpness threshold, and the pixel pitch and / or effective voxel size.

[0102] If the focal spot size is unknown (block 804), then at block 808, processing circuitry 210 measures the focal spot size. For example, the focal spot size may be measured by executing Figure 6 Block 808 is implemented by using blocks 602-606.

[0103] At block 810, the processing circuit 210 determines whether the calculated unsharpness is within a target unsharpness range configured for the process. For example, an upper threshold of the target unsharpness range may be equal to or based on a pixel size or an effective pixel pitch, such that the processing circuit 210 determines whether the unsharpness is less than the equivalent of one pixel. In other examples, the calculated unsharpness may be compared to a voxel size. However, any other desired threshold may be used.

[0104] In some examples, the processing circuit 210 may further determine whether the calculated unsharpness is below an upper unsharpness threshold and / or above a lower unsharpness threshold in block 810. In some examples, the lower unsharpness threshold is determined to be a threshold that is slightly (e.g., by a predetermined amount or percentage of the threshold) lower than the upper unsharpness threshold, thereby avoiding unnecessarily long processing time to obtain substantially the same image quality.

[0105] If the calculated unsharpness is not within the target unsharpness range configured for the process (block 810), then at block 812, the processing circuitry 210 determines whether to adjust (e.g., correct) a power parameter (e.g., power, voltage, current). For example, the processing circuitry 210 may determine whether the geometric magnification factor is fixed, and / or whether the operator has requested a recommended power parameter. In some examples, the processing circuitry 210 determines whether to adjust (e.g., correct) a geometric magnification factor parameter instead of a power parameter. For example, the processing circuitry 210 may determine whether the power parameter is fixed, and / or whether the operator has requested a recommended magnification factor.

[0106] If the power parameters are to be adjusted (block 812), then at block 814, the processing circuit 210 determines one or more power parameters based on the geometric magnification and the unsharpness threshold. For example, the processing circuit 210 may select one or more power parameters based on the geometric magnification and the unsharpness threshold in a reference table (e.g., Figure 2 The power, voltage, and / or current may be searched in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the value of the selected power parameter results in the value of the unsharpness parameter satisfying a threshold unsharpness.

[0107] If the power parameter is not corrected (block 812), then at block 816, the processing circuit 210 determines a geometric magnification factor based on one or more power parameters and a non-sharpness threshold. For example, the processing circuit 210 may determine a geometric magnification factor based on power, voltage, and / or current and a non-sharpness threshold in a reference table (e.g., Figure 2 The geometric magnification may be found in the data 218 of FIG. 214 . In some examples, the determination may include interpolation between sets of data points in the table. The determination may further include outputting an indication that the selected geometric magnification value results in the unsharpness parameter value satisfying a threshold unsharpness.

[0108] After determining the geometric magnification correction (block 816), after determining the power parameter correction (block 814), if there are no parameters to correct (block 816), and / or after looking up the geometric magnification and power parameter values ​​(block 806), at block 818, the processing circuit 210 controls the imaging process based on the configured parameters. For example, the processing circuit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scans, etc.) using the parameters recommended by block 806 or blocks 808-818 based on the measured focal spot size. The example instructions 800 then end.

[0109] In addition to or in lieu of automatically setting the power parameter and / or geometric magnification, the example radiography system 100 can guide the operator in selecting the power parameter and / or adjusting the geometric magnification by providing a calculated unsharpness and / or indicating whether the unsharpness is within an acceptable range. For example, the acceptable range can be determined based on techniques developed for the object 102. The acceptable range can have an upper unsharpness limit, a lower unsharpness limit, or both.

[0110] In one example of guiding an operator, the radiographic system 100 may determine the focal spot size based on the reference image in a manner similar or identical to that described above. The radiographic system 100 calculates a non-sharpness value for a configured geometric magnification and for a configured power parameter. The radiographic system 100 may compare the calculated non-sharpness value with an acceptable range and output an indication of whether the power parameter value and / or the geometric magnification result in the non-sharpness parameter value meeting the acceptable non-sharpness range. The indication may be output via the user interface 204, for example, through a display, by displaying an icon or other text or graphics to the operator. The indication may inform the user whether the calculated non-sharpness is within an acceptable non-sharpness range. If the calculated non-sharpness is not within an acceptable range, the indication may further indicate which parameters and / or configurations the user may adjust to adjust the non-sharpness relative to the acceptable non-sharpness range, and / or how to adjust the parameters and / or configurations. For example, the user interface 204 may only display the result of comparing the calculated non-sharpness value with the acceptable non-sharpness range, or may further indicate that increasing the power will reduce the non-sharpness above the acceptable range.

[0111] Fig. 9 is a flow chart representing example machine readable instructions 900 that may be executed by Figure 1 and Figure 2 The example X-ray radiography system 100 is implemented to provide guidance for imaging parameters of a radiography process based on the measured focus. The example instructions 900 may be stored in a storage device (e.g., Figure 2212) and by a processing circuit (e.g., Figure 2 The processing circuit 210) is executed.

[0112] At block 902, the X-ray detector 108 captures a reference image in a reference configuration (e.g., Figure 3A For example, the reference configuration may include a predetermined arrangement of the radiation emitter 106, the reference object 102 to be detected, and the X-ray detector 108. The predetermined arrangement may have been previously measured as a preferred arrangement to obtain an accurate measurement of the blur and / or focal spot size.

[0113] At block 904, processing circuit 210 measures blur in reference image 310. For example, processing circuit 210 may calculate expected size 308 of an object in reference image 310 and measure actual size 312 of the object in the image. Processing circuit 210 may then determine blur as half of the difference between expected size 308 and actual size 312. Blur may be measured along multiple dimensions. At block 906, processing circuit 210 determines a focal size based on the measured blur.

[0114] At block 908, processing circuit 210 records the focal spot size, actual geometric magnification, calculated geometric magnification, transmitter voltage, power parameters, and unsharpness (e.g., in a reference table). For example, in addition to recording the geometric magnification used to capture the reference image, processing circuit 210 may also calculate and store a geometric magnification at which the focal spot size determined will obtain a predetermined unsharpness threshold. The recorded data may be used to update current data in the reference table.

[0115] Blocks 902-908 may be performed with Figure 6 In other examples, processing circuit 210 may use different focus measurement positions for emitter 106, detector 108, and / or object locator 110. During the focus measurement process, processing circuit 210 may store the geometric magnification value (e.g., input by an operator, obtained from a stored technique, etc.) for use during subsequent scans.

[0116] At block 910, the processing circuit 210 receives the geometric magnification and / or power parameters via the user interface 204. For example, an operator may input and modify the power and / or configured geometric magnification. In some examples, the processing circuit 210 may automatically calculate and / or store the current geometric magnification (e.g., before moving to the focus measurement position) based on the relative positions of the emitter 106, the x-ray detector 108, and the object positioner 110 and / or the rotatable fixture 112. The stored geometric magnification may correspond to the technical magnification, and the system 100 may be configured using the stored geometric magnification after the focus measurement.

[0117] At block 912, the processing circuitry 210 calculates the unsharpness for the imaging process configuration input by the operator. For example, the processing circuitry 210 may determine the unsharpness at the same focal spot size at the same power parameters as during the focus measurement, using the same magnification or a different magnification, and / or may determine the unsharpness at different focal spot sizes at the same geometric magnification (e.g., based on a lookup table).

[0118] At block 914, the processing circuit 210 outputs (e.g., via the user interface 204) an indication of whether the power parameter value and / or the geometric magnification factor results in a non-sharpness parameter value that satisfies the non-sharpness range. The indication may indicate to the operator whether the calculated non-sharpness is within the non-sharpness range, and if not within the range, an indication of how to change the parameters and / or configuration to obtain acceptable non-sharpness. For example, the processing circuit 210 may output instructions to increase or decrease the power and / or increase or decrease the geometric magnification factor.

[0119] At block 916, the processing circuit 210 determines whether to start an imaging process. For example, the operator may command the radiographic system 100 to start a scan via the user interface 204. If the imaging process is not started (block 916), control returns to block 910 to continue configuring the test and determining the unsharpness value.

[0120] When the command to start the imaging process is issued (block 916), the processing circuit 210 controls the imaging process based on the configured parameters at block 918. For example, the processing circuit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scans, etc.) using the parameters set by the operator at block 910. The example instructions 900 then end.

[0121] In some other examples, Figure 8Blocks 812-816 may be modified and / or replaced to output an indication of whether the selected power parameter and / or geometric magnification factor results in an unsharpness value within an acceptable range (eg, determined based on an effective pixel pitch and / or an effective voxel size).

[0122] In other examples, processing circuit 210 may implement a loop in which an operator inputs power parameters, focal spot size, and / or geometric magnification required for the technique, and system 100 measures the actual focal spot size and outputs an indication of whether the unsharpness is within an acceptable range. The operator may then adjust the parameters and / or geometric features and remeasure the focal spot size until the desired unsharpness range is achieved. In some examples, processing circuit 210 may provide guidance to the operator for adjusting the parameters and / or geometric features.

[0123] Fig.10 is a flow chart representing other example machine readable instructions 1000 that may be executed by Figure 1 and Figure 2 The example X-ray radiography system 100 is implemented to provide guidance for imaging parameters of a radiography process based on a specified effective pixel pitch and / or effective voxel size. The example instructions 1000 may be stored in a storage device (e.g., Figure 2 212) and by a processing circuit (e.g., Figure 2 The example instructions 1000 guide the selection of parameters and / or magnification factors by outputting an indication of whether the measured focal spot size and geometric features result in a desired unsharpness (e.g., rather than automatically selecting the parameters and / or magnification factors). For example, the instructions 1000 may be executed in response to inputting a voxel size input 410 through the interface 400 and selecting an “effective pixel pitch / effective voxel size” button 420.

[0124] At block 1002, processing circuit 210 receives (e.g., via Figure 4 The processing circuit 210 may calculate the unsharpness threshold value by manually inputting and / or receiving the unsharpness threshold value from the pixel pitch and / or the effective voxel size. The processing circuit 210 may calculate the unsharpness threshold value by manually inputting and / or receiving the unsharpness threshold value from a remote computing system (e.g., Figure 2 The system 299) automatically receives the pixel spacing and / or effective voxel size and the unsharpness threshold.

[0125] At block 1004, processing circuitry 210 determines whether the focal spot size is known (e.g., previously measured or otherwise determined). For example, if the focal spot size was determined (e.g., measured) less than a threshold time before using the measured power, processing circuitry 210 may look up the focal spot size in a reference table. If the focal spot size is known (block 1004), processing circuitry 210 may look up the geometric magnification and power parameter values ​​from a storage device based on the focal spot size, the unsharpness threshold, and the pixel pitch and / or effective voxel size.

[0126] If the focal spot size is unknown (block 1004), then at block 1006, the processing circuit 210 measures the focal spot size. For example, the focal spot size may be measured by executing Figure 6 Block 1006 is implemented by using blocks 602-606 of FIG.

[0127] At block 1008, the processing circuit 210 determines whether the calculated unsharpness is within a target unsharpness range configured for the process. For example, an upper threshold of the target unsharpness range may be equal to or based on a pixel size or an effective pixel pitch, such that the processing circuit 210 determines whether the unsharpness is less than the equivalent of one pixel. In other examples, the calculated unsharpness may be compared to a voxel size. However, any other desired threshold may be used.

[0128] In some examples, the processing circuit 210 may further determine whether the calculated unsharpness is below an upper unsharpness threshold and / or above a lower unsharpness threshold in block 1008. In some examples, the lower unsharpness threshold is determined to be a threshold that is slightly (e.g., by a predetermined amount or percentage of the threshold) lower than the upper unsharpness threshold, thereby avoiding unnecessarily long processing time to achieve substantially the same image quality.

[0129] If the calculated unsharpness is not within the target unsharpness range configured for the process (block 1008 ), then at block 1010 , the processing circuit 210 outputs (e.g., via the user interface 204 ) an indication that the power parameter value and / or geometric magnification factor caused the unsharpness parameter value to exceed the unsharpness range.

[0130] At block 1012, processing circuitry 210 determines whether an adjustment to a power parameter has been received (e.g., via user interface 204). For example, an operator may select a different power or other power parameter value to change focus and unsharpness. Alternatively, processing circuitry 210 may correct the power parameter based on a stored relationship between the power parameter and unsharpness (or focus).

[0131] If no adjustment to the power parameter has been received or determined (block 1012), then at block 1014, processing circuitry 210 determines whether an adjustment to the geometric magnification has been received (e.g., via user interface 204). For example, an operator may select a different geometric magnification value via user interface 204, and / or adjust the geometry of emitter 106, detector 108, and / or object locator 210, from which processing circuitry 210 may calculate the geometric magnification. Alternatively, processing circuitry 210 may correct the geometric magnification (and / or the configuration geometry of system 100) based on a stored relationship between magnification and unsharpness (or focus).

[0132] If no adjustment to the geometric magnification has been received or determined (block 1014), control returns to block 1010 to continue outputting the indication of unsharpness out of range. On the other hand, when an adjustment to the power parameter has been received or determined (block 1012), or an adjustment to the geometric magnification has been received or determined (block 1014), control returns to block 1006 to remeasure the focal size.

[0133] When the calculated unsharpness is within the target unsharpness range (block 1008 ), at block 1016 , the processing circuit 210 outputs (e.g., via the user interface 204 ) an indication that the power parameter value and / or the geometric magnification factor resulted in the unsharpness parameter value being within the unsharpness range.

[0134] At block 1018, the processing circuit 210 controls the imaging process based on the configured parameters. For example, the processing circuit 210 controls the emitter 106 and the detector 108 to generate one or more 2D and / or radiographs for 3D data (e.g., 3D CT scans, etc.). The example instructions 1000 then end.

[0135] The method and / or system herein can be implemented in hardware, software, or a combination of hardware and software. The method and / or system herein can be implemented in at least one computing system in a centralized manner, or in a distributed manner, where different elements are distributed in several interconnected computing and / or remote computing systems. Any type of computing system or other device suitable for executing the method described herein is applicable. A typical combination of hardware and software can be a general computing system with a program or other code, which controls the computing system to execute the method described herein when loaded and executed. Another typical implementation may include a dedicated integrated circuit or chip. Some implementations may include a non-temporary machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disk, a disk, or the like), on which one or more instructions (e.g., lines of code) executable by a machine are stored, so that the machine performs the process described herein.

[0136] As used herein, the terms "such as" and "for example" set forth a list of one or more non-limiting examples, instances, or illustrations.

[0137] As used herein, the terms "coupled," "coupled to," and "coupled with" all refer to a structural and / or electrical connection, whether attached, fixed, connected, joined, fastened, in contact, and / or otherwise secured. As used herein, the term "attached" refers to fixed, coupled, connected, joined, fastened, in contact, and / or otherwise secured. As used herein, the term "connected" refers to attached, fixed, coupled, joined, fastened, in contact, and / or otherwise secured.

[0138] As used herein, the terms "circuitry" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that may configure, be executed by, and / or otherwise be associated with the hardware. As used herein, for example, a particular processor and memory may comprise a first "circuitry" when executing a first line or more lines of code, and may comprise a second "circuitry" when executing a second line or more lines of code. As used herein, a circuitry is "operable" and / or "configured" to perform a function when it includes the hardware and / or code (if necessary) required to perform the function, regardless of whether the performance of the function is disabled or enabled (e.g., by a user-configurable setting, factory adjustment, etc.).

[0139] As used herein, control circuitry may include digital and / or analog circuits, discrete and / or integrated circuits, microprocessors, DSPs, etc., software, hardware, and / or firmware, located on one or more circuit boards, forming part or all of a controller, and / or used to control a radiographic system to perform a radiographic procedure.

[0140] As used herein, the term "processor" refers to processing devices, apparatuses, programs, circuits, devices, systems and subsystems, whether implemented in hardware, tangibly embodied software, or both, and whether programmable or not. The term "processor", as used herein, includes, but is not limited to, one or more computing devices, hardwired circuits, signal modification devices and systems, devices and machines for controlling systems, central processing units, programmable devices and systems, field programmable gate arrays, application specific integrated circuits, systems on chips, systems containing discrete components and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the above. The processor may be, for example, any type of general purpose microprocessor or microcontroller, a digital signal processing (DSP) processor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, etc. The processor may be coupled to and / or integrated with a storage device.

[0141] As used herein, the terms "memory", "memory circuitry" and / or "memory device" refer to computer hardware or circuitry for storing information for use by a processor and / or other digital device. The memory, memory circuitry and / or memory device may be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random access memory (RAM), cache memory, compact disk read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable media, etc. The memory may include, for example, non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM), first-in-first-out (FIFO) memory, last-in-first-out (LIFO) memory, stack memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash memory card, compact flash memory card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash memory, subscriber identity module (SIM) card, hard disk drive (HDD), solid state drive (SSD), etc. The memory may be configured to store code, instructions, applications, software, firmware, and / or data, and may be external, internal, or both relative to the processor.

[0142] As used herein, "and / or" refers to any one or more items in a list connected by "and / or". For example, "x and / or y" refers to any element in the three-element set {(x), (y), (x, y)}. In other words, "x and / or y" refers to "one or both of x and y". As another example, "x, y and / or z" refers to any element in the seven-element set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y and / or z" refers to "one or more of x, y and z". As used herein, the term "exemplary" refers to a non-limiting example, instance, or legend. As used herein, the terms "such as" and "for example" list one or more non-limiting examples, instances, or legends.

[0143] Although the present method and / or system has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the present method and / or system. For example, the blocks and / or components of the disclosed examples may be combined, split, rearranged and / or otherwise modified. In addition, many modifications may be made to adapt specific circumstances or materials to the teachings of the present disclosure without departing from its scope. Therefore, the present method and / or system is not limited to the specific embodiments disclosed. On the contrary, the present method and / or system will include all embodiments that fall within the scope of the appended claims, both literally and under the doctrine of equivalents.

Claims

1. A method of configuring a radiographic system having a radiation emitter and a radiation detector, the method comprising: analyzing, using processing circuitry, a reference image captured using a first value of a first power parameter of the radiation emitter to determine a value of a focal spot size of the radiation emitter; outputting an indication of whether the selected value of the first power parameter results in a value of an unsharpness parameter satisfying a threshold unsharpness value based on a determined relationship between the first value of the first power parameter and the value of the focal spot size; as well as The radiographic system is controlled using the selected power parameters to perform a radiographic process to obtain one or more radiographic images that satisfy the threshold unsharpness value.

2. The method of claim 1, further comprising receiving an updated value of the first power parameter and outputting an indication of whether the updated value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

3. The method of claim 1, further comprising outputting a suggested change to the value of the first power parameter so that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value. 4 . The method of claim 1 , further comprising outputting an indication of whether the detected magnification value causes the value of the unsharpness parameter to satisfy a threshold unsharpness value.

5. The method of claim 4, further comprising outputting a suggested change to the amplification value such that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value. 6 . The method of claim 1 , wherein the threshold unsharpness value is based on at least one of a pixel size of the radiation detector and a pixel pitch of the radiation detector. 7 . The method of claim 1 , wherein the threshold unsharpness value is set to one of a dimension of a pixel of the radiation detector or a pixel pitch of the radiation detector.

8. The method of claim 1, wherein the analyzing of the reference image comprises analyzing the reference image to determine one or more dimensions of a reference feature based on a predetermined gauge device.

9. The method according to claim 8, further comprising: measuring one or more dimensions of blur in the reference image; as well as The one or more dimensions are stored in a storage device in association with at least one of the first power parameter, the measurement location on the reference image, the current focus size, the voxel size, the effective pixel pitch, or a magnification parameter.

10. The method of claim 1, wherein the radiation emitter comprises an X-ray tube and the radiation detector comprises a digital X-ray detector.

11. The method according to claim 1, further comprising: A value for the unsharpness parameter is determined based on the measured focus size and magnification parameters.

12. A radiographic system comprising: user interface; Radiation detectors; a radiation emitter configured to emit radiation toward the radiation detector; an object positioner configured to position an object to be detected between the radiation detector and the radiation emitter; as well as A computing device comprising a processing circuit configured to: analyzing a reference image captured using a first value of a first power parameter of the radiation emitter to determine a value of a focal spot size of the radiation emitter; outputting, via the user interface, an indication of whether the selected value of the first power parameter results in a value of an unsharpness parameter satisfying a threshold unsharpness value based on the determined relationship between the first value of the first power parameter and the value of the focal spot size; as well as The radiation emitter is controlled using the selected power parameters to perform a radiographic process to obtain one or more radiographic images that satisfy the threshold unsharpness value.

13. A radiographic system according to claim 12, wherein the user interface is configured to receive an updated value of the first power parameter, and the processing circuit is configured to output an indication of whether the updated value of the first power parameter causes the value of the non-sharpness parameter to satisfy the threshold non-sharpness value.

14. The radiographic system of claim 12, wherein the processing circuit is configured to output a suggested change to the value of the first power parameter such that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

15. The radiographic system of claim 12, wherein the processing circuit is configured to output an indication of whether the detected magnification value causes the value of the unsharpness parameter to satisfy a threshold unsharpness value.

16. The radiographic system of claim 15, wherein the processing circuit is configured to output a suggested change to the magnification value such that the value of the first power parameter causes the value of the unsharpness parameter to satisfy the threshold unsharpness value.

17. The radiographic system of claim 12, wherein the threshold unsharpness value is based on at least one of a pixel size of the radiation detector and a pixel pitch of the radiation detector.

18. The radiographic system of claim 12, wherein the threshold unsharpness value is set to one of a dimension of a pixel of the radiation detector or a pixel pitch of the radiation detector.

19. The radiographic system of claim 12, wherein the processing circuit is configured to analyze the reference image by analyzing the reference image to determine one or more dimensions of a reference feature based on a predetermined gauge arrangement.

20. The radiographic system of claim 19, wherein the processing circuit is configured to: measuring one or more dimensions of blur in the reference image; and The one or more dimensions are stored in a storage device in association with at least one of the first power parameter, the measurement location on the reference image, the current focus size, the voxel size, the effective pixel pitch, or a magnification parameter.

Images