Constant torque type chip testing device

Abstract

The invention discloses a constant torque type chip testing device which comprises a box body, and a testing assembly is arranged in the box body. One end of the box cover is rotationally connected with the box body, a cushion block is arranged in the box cover, and the cushion block is connected with the box cover through an elastic piece; and the knob assembly is connected with the box cover through threads, the knob assembly is arranged above the cushion block, the knob assembly is used for adjusting the height of the cushion block, a non-return assembly is arranged in the knob assembly, and the non-return assembly is used for adjusting the pressure of the knob assembly. According to the constant torque type chip testing device provided by the invention, the pressure of the knob assembly is adjusted through the non-return assembly, and when the pressure of the knob assembly exceeds a set value, the knob assembly does not move downwards to increase the pressure of the cushion block on the chip, so that the constant stress of the chip is ensured, and the chip is prevented from being damaged.

Description

Technical Field

[0001] The invention belongs to the technical field of chip testing, and in particular relates to a constant torque chip testing device. Background Art

[0002] In the field of chip testing, especially in the testing process of RF chips, lossless and reliable contact must be achieved between the RF pad and the test system. This contact link is crucial, because only by ensuring good contact between the two can the stability and consistency of the signal during transmission be guaranteed, and undesirable phenomena such as signal distortion, attenuation or fluctuation can be avoided, thereby ensuring the accuracy and reliability of the chip test results.

[0003] In the prior art, for example, CN214703722U discloses a test device for radio frequency chips with a protective structure, which is connected to the tester by rotating one end of a rotating plate, and the chip is pressed by the rotating plate. This pressing method will first contact the test chip at the end close to the shaft, which is likely to cause the chip to warp or deviate on one side, making the entire test state uncontrollable, and unable to meet the requirements of test stability and consistency. In addition, the pressure applied to the chip is difficult to control, and excessive pressure can easily damage the chip. Summary of the invention

[0004] The purpose of the present invention is to provide a constant torque chip testing device to solve the problem in the prior art that the chip pressing force is difficult to control and excessive pressure easily causes chip damage.

[0005] To this end, the present invention provides a constant torque chip testing device, comprising a box, wherein a testing component is arranged in the box; A box cover, one end of which is rotatably connected to the box body, a cushion block is arranged inside the box cover, and the cushion block is connected to the box cover through an elastic member; A knob assembly is connected to the box cover by threads, the knob assembly is above the cushion block, the knob assembly is used to adjust the height of the cushion block, a check assembly is arranged inside the knob assembly, and the check assembly is used to adjust the pressure of the knob assembly.

[0006] Preferably, the knob assembly includes a knob, a static shaft, a dynamic shaft and a stud, the static shaft extends from the bottom of the knob to the top of the knob, the static shaft is connected to the knob by a combined spring sheet and a locking nut, a rotation groove is provided in the stud, the dynamic shaft is fixedly connected to the stud in the rotation groove, a connecting rod is provided at the bottom of the static shaft, a through hole is provided at the top of the dynamic shaft, and the connecting rod is cooperatively connected to the through hole.

[0007] Preferably, the check assembly includes a screw, a guide column and a check block, the screw and the guide column vertical rod are fixedly installed in the rotating groove, the check block is slidably connected to the screw and the guide column, and the bottom of the check block is connected to the bottom surface of the rotating groove through a spring.

[0008] Preferably, a push block is provided at the bottom of the knob, and a first inclined surface is provided at one end of the push block.

[0009] Preferably, a second inclined surface is provided at one end of the check block, and the second inclined surface matches the first inclined surface.

[0010] Preferably, a plane bearing is provided at the bottom of the stud.

[0011] Preferably, the test assembly comprises a metal panel and a metal limiting frame, the metal limiting frame is fixedly mounted on the top of the metal panel, and an elastic probe is arranged on the metal panel.

[0012] Preferably, a silicone pad is provided between the metal panel and the metal limiting frame, and the elastic probe passes through the silicone pad. Preferably, a thin film pressure sensor is also included, and the thin film pressure sensor is used to replace the silicone pad and detect real-time internal stress.

[0013] Preferably, the thickness of the thin film pressure sensor is the same as that of the silicone pad.

[0014] Beneficial effects: 1. The present invention provides a constant torque chip testing device. After the box cover is flipped and fastened on the box body, the knob assembly is rotated to adjust the position of the pad so that the pad presses the chip tightly. The knob assembly presses the pad vertically downward to avoid uneven force on the chip causing chip deviation. At the same time, the pressure of the knob assembly is adjusted by the check assembly. When the pressure of the knob assembly exceeds the set value, the knob assembly will not move downward to increase the pressure of the pad on the chip, thereby ensuring that the force on the chip is constant and avoiding damage to the chip due to excessive pressure.

[0015] 2. In the present invention, the first inclined surface of the push block under the knob cooperates with the second inclined surface of the check block. When the applied pressure is greater than the set value, the push block will press the check block downward, so that the push block slides over the check block. The knob will not generate thrust on the stud, and the stud remains stationary, so that the knob continues to rotate without increasing the pressure on the chip.

[0016] 3. The pressure in the present invention mainly depends on the spring force in the check assembly and the height of the check block. Before testing the chip, a test piece with the same shape and size as the chip is placed in the test assembly. The test assembly has a pressure sensor, which can detect the pressure on the chip in conjunction with the knob assembly, thereby adjusting the spring and the check block to make the pressure of the knob assembly constant at the set value.

[0017] 4. A silicone pad is provided between the metal panel and the metal limit frame in the present invention. The silicone pad can make the chip to be tested flexibly contact with the metal panel, and the distance between the chip to be tested and the pad can be controlled by the thickness of the silicone pad to ensure the stability and consistency of the test state. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 It is a structural schematic diagram of a constant torque chip testing device in the present invention.

[0020] Figure 2 It is a structural schematic diagram of a box cover of a constant torque chip testing device in the present invention.

[0021] Figure 3 It is a structural schematic diagram of a knob assembly of a constant torque chip testing device in the present invention.

[0022] Figure 4 An exploded view of a knob assembly of a constant torque chip testing device in the present invention.

[0023] Figure 5 An exploded view of a test assembly of a constant torque chip test device in the present invention.

[0024] Figure 6 The structure diagram of a thin film pressure sensor of a constant torque chip testing device in the present invention.

[0025] Figure 7 An exploded view of a constant torque chip testing device in the present invention using a thin film pressure sensor to replace a silicone pad.

[0026] In the figure, 1-box, 2-test assembly, 21-metal panel, 22-metal limit frame, 23-elastic probe, 24-silicone pad, 3-box cover, 31-pad, 4-knob assembly, 41-knob, 42-static shaft, 43-moving shaft, 44-stud, 45-combination spring, 46-nut, 47-plane bearing, 411-push block, 412-first inclined surface, 421-connecting rod, 431-through hole, 441-rotation groove, 5-check assembly, 51-screw, 52-guide column, 53-check block, 54-spring, 531-second inclined surface, 6-thin film pressure sensor. DETAILED DESCRIPTION

[0027] The content of the present invention can be more easily understood by selecting the following detailed description of the preferred implementation method of the present invention and the embodiments included. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those of ordinary skill in the art to which the present invention belongs. When there is a conflict, the definition in this specification shall prevail.

[0028] Embodiment 1: like Figure 1-Figure 3 As shown, a constant torque chip testing device is provided in the present embodiment, including a box body 1, in which a testing assembly 2 is arranged; a box cover 3, one end of which is rotatably connected to the box body 1, a pad 31 is arranged in the box cover 3, and the pad 31 is connected to the box cover 3 through an elastic member; a knob assembly 4, which is connected to the box cover 3 through a thread, the knob assembly 4 is above the pad 31, the knob assembly 4 is used to adjust the height of the pad 31, and a check assembly 5 is arranged in the knob assembly 4, and the check assembly 5 is used to adjust the pressure of the knob assembly 4.

[0029] like Figure 4As shown, the knob assembly 4 includes a knob 41, a static shaft 42, a dynamic shaft 43 and a stud 44. The static shaft 42 runs through the bottom of the knob 41 to the top of the knob 41. The static shaft 42 is connected to the knob 41 through a combination spring 45 and a locking nut 46. A rotation groove 441 is provided in the stud 44. The dynamic shaft 43 is fixedly connected to the stud 44 in the rotation groove 441. A connecting rod 421 is provided at the bottom of the static shaft 42. A through hole 431 is provided at the top of the dynamic shaft 43. The connecting rod 421 is matched and connected with the through hole 431. The check assembly 5 includes a screw 51, a guide post 52 and a check block 53. The screw 51 and the guide post 52 are vertically fixedly installed in the rotation groove 441. The check block 53 is slidably connected to the screw 51 and the guide post 52. The bottom of the check block 53 is connected to the bottom surface of the rotation groove 441 through a spring 54. A push block 411 is provided at the bottom of the knob 41, and a first inclined surface 412 is provided at one end of the push block 411. A second inclined surface 531 is provided at one end of the check block 53, and the second inclined surface 531 matches the first inclined surface 412. A plane bearing 47 is provided at the bottom of the stud 44. The knob 41 rotates on the static shaft 42, and the first inclined surface 412 of the push block 411 at the bottom of the knob 41 fits with the second inclined surface 531 on the check block 53. In the initial state, the height of the stud 44 is relatively high, and the height of the check block 53 is also relatively high. The spring 54 is compressed to provide thrust for the check block 53, increase the friction force of the first inclined surface 412 and the second inclined surface 531, so that the check block 53 rotates together with the push block 411, thereby driving the stud 44 to rotate together with the check block 53, so that the stud 44 gradually rotates downward. When the stud 44 descends until the pressure on the chip reaches the set pressure value, the friction between the first inclined surface 412 and the second inclined surface 531 is insufficient to cause the check block 53 to rotate with the push block 411. The push block 411 presses the check block 53 downward and slides over the check block 53, so that the knob 41 can only rotate on the static shaft 42 without driving the stud 44 to rotate, thereby ensuring that the pressure on the chip is constant.

[0030] like Figure 5 As shown, the test assembly 2 includes a metal panel 21 and a metal limit frame 22. The metal limit frame 22 is fixedly mounted on the top of the metal panel 21, and an elastic probe 23 is arranged on the metal panel 21. A silicone pad 24 is arranged between the metal panel 21 and the metal limit frame 22, and the elastic probe 23 passes through the silicone pad 24. The silicone pad 24 can make the chip to be tested contact with the metal panel 21 flexibly, and the thickness of the silicone pad 24 can control the distance between the chip to be tested and the pad 31, thereby ensuring the stability and consistency of the test state.

[0031] like Figure 6-Figure 7As shown, a thin film pressure sensor 6 is also included. The thickness of the thin film pressure sensor 6 is the same as that of the silicone pad. The thin film pressure sensor 6 is used to replace the silicone pad 24 and detect the real-time internal stress. Before testing the chip, the silicone pad 24 needs to be taken out and replaced with a thin film pressure sensor of the same thickness, and used to test a test piece with the same size and shape as the chip to be tested, and the pressure of the pad 31 on the test piece is detected, so as to adjust the check assembly 5 to keep the pressure constant at the set value.

[0032] Working principle: before testing the chip, first put the test piece and the thin film pressure sensor 6 with the same shape and size as the chip to be tested into the test assembly 2, close the box cover 3, turn the knob 41, the knob 41 rotates on the static shaft 42, the first inclined surface 412 of the push block 411 at the bottom of the knob 41 fits with the second inclined surface 531 on the check block 53, the check block 53 drives the stud 44 to rotate and move the stud 44 downward, when the set pressure value is reached, adjust the elastic force of the check block 53 so that the friction between the push block 411 and the check block 53 is insufficient to drive the check block 53 to move, at this time, rotate the knob 41, the push block 411 will press the check block 53 downward to slide on the top of the check block 53, and will not drive the stud 44 to rotate and move downward. After multiple debugging, the knob assembly 4 makes the pressure value of the test piece constant. Then open the box cover 3, take out the test piece and the thin film pressure sensor 6, put in the silicone pad 24, and then put in the chip for testing.

[0033] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A constant torque chip testing device, characterized in that: include A box body, wherein a test component is arranged in the box body; A box cover, one end of which is rotatably connected to the box body, a cushion block is arranged inside the box cover, and the cushion block is connected to the box cover through an elastic member; A knob assembly, the knob assembly is connected to the box cover by threads, the knob assembly is above the cushion block, the knob assembly is used to adjust the height of the cushion block, a check assembly is arranged inside the knob assembly, and the check assembly is used to adjust the pressure of the knob assembly; The knob assembly comprises a knob, a static shaft, a dynamic shaft and a stud, wherein the static shaft runs through the bottom of the knob to the top of the knob, the static shaft is connected to the knob through a combined spring sheet and a locking nut, a rotation groove is provided in the stud, the dynamic shaft is fixedly connected to the stud in the rotation groove, a connecting rod is provided at the bottom of the static shaft, a through hole is provided at the top of the dynamic shaft, and the connecting rod is matched and connected with the through hole; The non-return assembly includes a screw, a guide column and a non-return block. The screw and the guide column vertical rod are fixedly installed in the rotation groove. The non-return block is slidably connected to the screw and the guide column. The bottom of the non-return block is connected to the bottom surface of the rotation groove through a spring.

2. A constant torque chip testing device according to claim 1, characterized in that: A push block is arranged at the bottom of the knob, and a first inclined surface is arranged at one end of the push block.

3. The constant torque chip testing device according to claim 2, characterized in that: A second inclined surface is provided at one end of the non-return block, and the second inclined surface matches the first inclined surface.

4. The constant torque chip testing device according to claim 1, characterized in that: A plane bearing is arranged at the bottom of the stud.

5. The constant torque chip testing device according to claim 1, characterized in that: The test assembly comprises a metal panel and a metal limiting frame. The metal limiting frame is fixedly installed on the top of the metal panel. An elastic probe is arranged on the metal panel.

6. The constant torque chip testing device according to claim 5, characterized in that: A silicone pad is arranged between the metal panel and the metal limiting frame, and the elastic probe passes through the silicone pad.

7. The constant torque chip testing device according to claim 6, characterized in that: A thin film pressure sensor is also included, and the thin film pressure sensor is used to replace the silicone pad and detect real-time internal stress.

8. The constant torque chip testing device according to claim 7, characterized in that: The thickness of the thin film pressure sensor is the same as that of the silicone pad.

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