A constant torque type chip testing device

Abstract

The present invention discloses a constant torque type chip testing device, which includes a box body, and a testing component is arranged inside the box body; a box cover, one end of the box cover is rotatably connected to the box body, a cushion block is arranged inside the box cover, and the cushion block is connected to the box cover through an elastic member; a knob component, the knob component is threadedly connected to the box cover, the knob component is above the cushion block, the knob component is used to adjust the height of the cushion block, and a check component is arranged inside the knob component, and the check component is used to adjust the pressure of the knob component. The present invention provides a constant torque type chip testing device. By adjusting the pressure of the knob component through the check component, when the pressure of the knob component exceeds the set value, the knob component will no longer move downward to increase the pressure of the cushion block on the chip, ensuring that the force on the chip is constant and avoiding damaging the chip.

Description

Technical Field

[0001] The present invention belongs to the technical field of chip testing, and particularly relates to a constant torque type chip testing device. Background Art

[0002] In the field of chip testing, especially during the testing process of radio frequency chips, a lossless and reliable contact must be achieved between the radio frequency pads and the testing system. This contact link is crucial because only by ensuring good contact between the two can the stability and consistency of signal transmission be guaranteed, avoiding adverse phenomena such as signal distortion, attenuation, or fluctuation, thereby ensuring the accuracy and reliability of chip test results.

[0003] In the prior art, for example, a testing device for radio frequency chips with a protective structure disclosed in CN214703722U is rotatably connected to a tester through one end of a rotating plate, and the chip is pressed tightly by the rotating plate. This pressing method causes the end close to the rotating shaft to contact the test chip first, easily leading to phenomena such as unilateral warping and offset of the chip, resulting in an uncontrollable overall test state and unable to meet the requirements of test stability and consistency. Moreover, the pressure applied to the chip is not easy to control, and excessive pressure is likely to cause chip damage. Summary of the Invention

[0004] The purpose of the present invention is to propose a constant torque type chip testing device to solve the problems in the prior art that the pressing force on the chip is not easy to control and excessive pressure is likely to cause chip damage.

[0005] To this end, the present invention provides a constant torque type chip testing device, including a box body, and a testing component is arranged inside the box body;

[0006] A box cover, one end of the box cover is rotatably connected to the box body, a cushion block is arranged inside the box cover, and the cushion block is connected to the box cover through an elastic member;

[0007] A knob assembly, the knob assembly is threadedly connected to the box cover, the knob assembly is above the cushion block, the knob assembly is used to adjust the height of the cushion block, and a check component is arranged inside the knob assembly, and the check component is used to adjust the pressure of the knob assembly.

[0008] Preferably, the knob assembly includes a knob, a static shaft, a moving shaft, and a stud. The static shaft penetrates from the bottom of the knob to the top of the knob, and the static shaft is connected to the knob through a combined elastic piece and a locking nut. A rotating groove is arranged inside the stud, the moving shaft is fixedly connected to the stud inside the rotating groove, a connecting rod is arranged at the bottom of the static shaft, a through hole is arranged at the top of the moving shaft, and the connecting rod is connected in cooperation with the through hole.

[0009] Preferably, the check component includes a screw, a guide post and a check stop block. The screw and the vertical rod of the guide post are fixedly installed in the rotation groove. The check stop block is slidably connected to the screw and the guide post. The bottom of the check stop block is connected to the bottom surface of the rotation groove through a spring.

[0010] Preferably, a push block is provided at the bottom of the knob, and a first inclined surface is provided at one end of the push block.

[0011] Preferably, a second inclined surface is provided at one end of the check stop block, and the second inclined surface is matched with the first inclined surface.

[0012] Preferably, a plain bearing is provided at the bottom of the stud.

[0013] Preferably, the test component includes a metal panel and a metal limit frame. The metal limit frame is fixedly installed on the top of the metal panel, and elastic probes are provided on the metal panel.

[0014] Preferably, a silica gel pad is provided between the metal panel and the metal limit frame, and the elastic probe penetrates through the silica gel pad.

[0015] Preferably, a thin film pressure sensor is further included, and the thin film pressure sensor is used to replace the silica gel pad and detect the real-time internal stress.

[0016] Preferably, the thickness of the thin film pressure sensor is the same as that of the silica gel pad.

[0017] Beneficial effects:

[0018] 1. The present invention provides a constant torque type chip testing device. After the box cover is flipped and buckled on the box body, the position of the cushion block is adjusted by rotating the knob assembly, so that the cushion block presses the chip tightly. The knob assembly makes the cushion block press vertically, avoiding chip offset caused by uneven force on the chip. At the same time, the pressure of the knob assembly is adjusted through the check component. When the pressure of the knob assembly exceeds the set value, the knob assembly will not move downward to increase the pressure of the cushion block on the chip, thereby ensuring a constant force on the chip and avoiding chip damage caused by excessive pressure.

[0019] 2. In the present invention, the first inclined surface of the push block under the knob is matched with the second inclined surface of the check stop block. When the applied pressure is greater than the set value, the push block will press down the check stop block, so that the push block slides over the check stop block, and the knob will not generate a thrust on the stud, and the stud remains stationary, so that the knob can continue to rotate without increasing the pressure on the chip.

[0020] 3. In the present invention, the pressure mainly depends on the spring force in the check component and the height of the check block. Before testing the chip, a test piece with the same shape and size as the chip is first placed in the test component. The test component is equipped with a pressure sensor, and in cooperation with the knob component, it can detect the pressure on the chip, thereby adjusting the spring and the check block to keep the pressure of the knob component constant at the set value.

[0021] 4. A silica gel pad is provided between the metal panel and the metal limit frame in the present invention. Through the silica gel pad, the chip to be tested can be in flexible contact with the metal panel, and the distance between the chip to be tested and the spacer can be controlled by the thickness of the silica gel pad to ensure the stability and consistency of the test state. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0023] Figure 1 It is a schematic structural diagram of a constant torque type chip testing device in the present invention.

[0024] Figure 2 It is a schematic structural diagram of the box cover of a constant torque type chip testing device in the present invention.

[0025] Figure 3 It is a schematic structural diagram of the knob component of a constant torque type chip testing device in the present invention.

[0026] Figure 4 It is an exploded view of the knob component of a constant torque type chip testing device in the present invention.

[0027] Figure 5 It is an exploded view of the test component of a constant torque type chip testing device in the present invention.

[0028] Figure 6 It is a schematic structural diagram of the thin film pressure sensor of a constant torque type chip testing device in the present invention.

[0029] Figure 7 It is an exploded view of a constant torque type chip testing device in the present invention using a thin film pressure sensor to replace the silica gel pad.

[0030] In the figure, 1 - box body, 2 - test component, 21 - metal panel, 22 - metal limit frame, 23 - elastic probe, 24 - silica gel pad, 3 - box cover, 31 - cushion block, 4 - knob assembly, 41 - knob, 42 - static shaft, 43 - moving shaft, 44 - stud, 45 - combined elastic piece, 46 - nut, 47 - plain bearing, 411 - push block, 412 - first inclined surface, 421 - connecting rod, 431 - through hole, 441 - rotating groove, 5 - anti - check component, 51 - screw, 52 - guide post, 53 - anti - check stop block, 54 - spring, 531 - second inclined surface, 6 - thin - film pressure sensor. Detailed implementation mode

[0031] The content of the present invention can be more easily understood by referring to the following detailed description of the preferred implementation methods of the present invention and the included embodiments. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs. In case of conflict, the definitions in this specification shall prevail.

[0032] Embodiment 1:

[0033] As Figures 1 - 3 shown, in this embodiment, a constant - torque chip testing device is provided, which includes a box body 1, and a test component 2 is arranged inside the box body 1; a box cover 3, one end of the box cover 3 is rotatably connected to the box body 1, a cushion block 31 is arranged inside the box cover 3, and the cushion block 31 is connected to the box cover 3 through an elastic member; a knob assembly 4, the knob assembly 4 is threadedly connected to the box cover 3, the knob assembly 4 is above the cushion block 31, the knob assembly 4 is used to adjust the height of the cushion block 31, and an anti - check component 5 is arranged inside the knob assembly 4, and the anti - check component 5 is used to adjust the pressure of the knob assembly 4.

[0034] As Figure 4As shown in the figure, the knob assembly 4 includes a knob 41, a static shaft 42, a moving shaft 43 and a stud 44. The static shaft 42 penetrates from the bottom of the knob 41 to the top of the knob 41. The static shaft 42 and the knob 41 are connected by a combined elastic piece 45 and a locking nut 46. A rotating groove 441 is provided inside the stud 44. The moving shaft 43 is fixedly connected to the stud 44 inside the rotating groove 441. A connecting rod 421 is provided at the bottom of the static shaft 42, and a through hole 431 is provided at the top of the moving shaft 43. The connecting rod 421 is cooperatively connected with the through hole 431. The check component 5 includes a screw 51, a guide post 52 and a check stop block 53. The screw 51 and the guide post 52 are vertically and fixedly installed inside the rotating groove 441. The check stop block 53 is slidably connected to the screw 51 and the guide post 52. The bottom of the check stop block 53 is connected to the bottom surface of the rotating groove 441 by a spring 54. A push block 411 is provided at the bottom of the knob 41, and a first inclined surface 412 is provided at one end of the push block 411. A second inclined surface 531 is provided at one end of the check stop block 53, and the second inclined surface 531 cooperates with the first inclined surface 412. A plain bearing 47 is provided at the bottom of the stud 44. The knob 41 rotates on the static shaft 42. The first inclined surface 412 of the push block 411 at the bottom of the knob 41 fits with the second inclined surface 531 on the check stop block 53. In the initial state, the height of the stud 44 is relatively high, and the height of the check stop block 53 is also relatively high. The spring 54 is compressed to provide a thrust for the check stop block 53, increasing the friction between the first inclined surface 412 and the second inclined surface 531, so that the check stop block 53 rotates together with the push block 411, thereby driving the stud 44 and the check stop block 53 to rotate together, and making the stud 44 gradually rotate downward. When the stud 44 descends until the pressure on the chip reaches the set pressure value, at this time, the friction between the first inclined surface 412 and the second inclined surface 531 is just not enough to make the check stop block 53 rotate together with the push block 411. The push block 411 presses down the check stop block 53 and slides over the top of the check stop block 53, so that the knob 41 can only rotate idly on the static shaft 42 without driving the stud 44 to rotate together, thereby ensuring a constant pressure on the chip.

[0035] As Figure 5 shown in the figure, the test component 2 includes a metal panel 21 and a metal limit frame 22. The metal limit frame 22 is fixedly installed on the top of the metal panel 21. Elastic probes 23 are provided on the metal panel 21. A silica gel pad 24 is provided between the metal panel 21 and the metal limit frame 22. The elastic probes 23 penetrate through the silica gel pad 24. Through the silica gel pad 24, the chip to be tested can be in flexible contact with the metal panel 21, and the distance between the chip to be tested and the spacer 31 can be controlled by the thickness of the silica gel pad 24, ensuring the stability and consistency of the test state.

[0036] As Figures 6 - 7As shown, it further includes a thin film pressure sensor 6. The thickness of the thin film pressure sensor 6 is the same as that of the silica gel pad. The thin film pressure sensor 6 is used to replace the silica gel pad 24 and detect the real-time internal stress. Before testing the chip, it is necessary to remove the silica gel pad 24 and replace it with a thin film pressure sensor of the same thickness, and use a test piece with the same size and shape as the chip to be tested for testing, detect the pressure of the spacer 31 on the test piece, and thus adjust the check assembly 5 to keep the pressure constant at the set value.

[0037] Working principle: Before testing the chip, first place a test piece with the same size and shape as the chip to be tested and the thin film pressure sensor 6 into the test assembly 2, close the box cover 3, and rotate the knob 41. The knob 41 rotates on the static shaft 42. The first inclined surface 412 of the push block 411 at the bottom of the knob 41 fits with the second inclined surface 531 on the check stop block 53. The check stop block 53 drives the screw 44 to rotate and move downward. When the set pressure value is reached, adjust the elastic force received by the check stop block 53 so that the frictional force between the push block 411 and the check stop block 53 is not sufficient to drive the check stop block 53 to move. At this time, rotate the knob 41, and the push block 411 will press down the check stop block 53 and slide over the top of the check stop block 53, without driving the screw 44 to rotate and move downward. After multiple debuggings, the knob assembly 4 makes the pressure value on the test piece constant. Then open the box cover 3, take out the test piece and the thin film pressure sensor 6, and put in the silica gel pad 24, and then the chip can be put in for testing.

[0038] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A constant torque type chip testing device, characterized in that, including a box body, in which a test component is arranged; a box cover, one end of the box cover is rotatably connected to the box body, a cushion block is arranged in the box cover, and the cushion block is connected to the box cover through an elastic member; a knob assembly, the knob assembly is threadedly connected to the box cover, the knob assembly is above the cushion block, the knob assembly is used to adjust the height of the cushion block, and a check component is arranged in the knob assembly, and the check component is used to adjust the pressure of the knob assembly; the knob assembly includes a knob, a static shaft, a moving shaft and a stud, the static shaft penetrates from the bottom of the knob to the top of the knob, the static shaft is connected to the knob through a combined elastic sheet and a locking nut, a rotating groove is arranged in the stud, the moving shaft is fixedly connected to the stud in the rotating groove, a connecting rod is arranged at the bottom of the static shaft, a through hole is arranged at the top of the moving shaft, and the connecting rod is connected in cooperation with the through hole; the check component includes a screw, a guide post and a check stop block, the screw and the guide post vertical rod are fixedly installed in the rotating groove, the check stop block is slidably connected to the screw and the guide post, and the bottom of the check stop block is connected to the bottom surface of the rotating groove through a spring; a push block is arranged at the bottom of the knob, and a first inclined surface is arranged at one end of the push block; a second inclined surface is arranged at one end of the check stop block, and the second inclined surface is matched with the first inclined surface.

2. The constant torque type chip testing device according to claim 1, wherein a plain bearing is arranged at the bottom of the stud.

3. The constant torque type chip testing device according to claim 1, characterized in that the test component includes a metal panel and a metal limiting frame, the metal limiting frame is fixedly installed on the top of the metal panel, and elastic probes are arranged on the metal panel.

4. The constant torque type chip testing device according to claim 3, wherein, a silica gel pad is arranged between the metal panel and the metal limiting frame, and the elastic probe penetrates through the silica gel pad.

5. A constant torque type chip testing device according to claim 4, characterized in that, also includes a thin film pressure sensor, and the thin film pressure sensor is used to replace the silica gel pad and detect the real-time internal stress.

6. The constant torque type chip testing device according to claim 5, wherein the thickness of the thin film pressure sensor is the same as that of the silica gel pad.

Images