Ion source collimation detection method, detection system and proton heavy ion accelerator

Abstract

The application provides a kind of detection method of ion source collimation, comprising: S10: obtaining the ion current intensity value of ion source;S20: the actual extraction beam intensity value of ion source is measured by means of beam measuring device;S30: the extraction efficiency value is obtained by dividing the actual extraction beam intensity value by the ion current intensity value;And S40: the extraction efficiency value is compared with a preset standard value, if the extraction efficiency value is less than the standard value, then the ion source deviation is judged to exceed the specified value, if the extraction efficiency value is greater than or equal to the standard value, then the ion source deviation is judged not to exceed the specified value.The detection method of ion source collimation, the detection process is simple, does not need to stop and dismount shell, reduces the cost while taking into account detection accuracy and safety.The application also provides a detection system and a proton heavy ion accelerator for realizing the above detection method.

Description

Technical Field

[0001] The present invention relates to the field of proton and heavy ion accelerators, and in particular to a method for detecting the collimation of an ion source, and a detection system and a proton and heavy ion accelerator for implementing the detection method. Background Art

[0002] The Electron Cyclotron Resonance Ion Source (ECRIS) is a common device used in proton and heavy ion accelerators to generate heavy ion beams. ECRIS is a plasma ion source that uses an electric field to extract ions from a plasma. These ions are then filtered and accelerated by subsequent equipment to form the proton and heavy ion beams used for patient treatment.

[0003] Electron cyclotron resonance ion sources require a high-voltage insulation environment, so the insulation of the cavity is extremely important, and different spare parts need to be frequently replaced to ensure that the dark current is as low as possible. After multiple replacements of spare parts, the electron cyclotron resonance ion source's lead structure is prone to alignment deviation. Furthermore, if the electron cyclotron resonance ion source experiences a drop in current intensity during normal use, it is difficult to determine whether this is caused by alignment deviation exceeding the specified value. Existing alignment detection methods rely on manual visual inspection or laser calibration, which have problems such as low accuracy, the need for downtime, limited construction conditions, and high maintenance costs. Summary of the Invention

[0004] The purpose of the present invention is to provide a method for detecting the alignment of an ion source, which has a simple detection process, does not require shutdown or disassembly of the housing, and takes into account both detection accuracy and safety while reducing costs.

[0005] Another object of the present invention is to provide a system for detecting the alignment of an ion source, which has a simple detection process and does not require shutdown or removal of the housing, thereby reducing costs while taking into account both detection accuracy and safety.

[0006] Another object of the present invention is to provide a proton and heavy ion accelerator, wherein the detection process of the ion source collimation is simple and does not require shutdown or disassembly of the outer shell, thereby reducing costs while taking into account both detection accuracy and safety.

[0007] The present invention provides a method for detecting the collimation of an ion source, comprising: S10: obtaining an ion body current intensity value of the ion source; S20: measuring an actual extraction beam intensity value of the ion source by means of a beam current measuring device; S30: dividing the actual extraction beam intensity value by the ion body current intensity value to obtain an extraction efficiency value; and S40: comparing the extraction efficiency value with a preset standard value; if the extraction efficiency value is less than the standard value, determining that the ion source deviation exceeds the specified value; and if the extraction efficiency value is greater than or equal to the standard value, determining that the ion source deviation does not exceed the specified value.

[0008] Compared to visual inspection or laser collimation, this ion source alignment test verifies ion source alignment by calculating beam extraction efficiency, ensuring accuracy while reducing costs. Furthermore, this method eliminates the need to shut down the ion source or remove its housing, preventing human contact with the hardware and improving operational safety.

[0009] In another schematic implementation of the method for detecting the collimation of the ion source, S10 includes: S11: setting the ion source high-voltage power supply to load normal operating voltage to the ion source body, obtaining the current value output by the ion source high-voltage power supply, and recording it as the leakage current value; S12: setting the ion source power amplifier to load normal operating power to the ion source body, obtaining the current value output by the ion source high-voltage power supply, and recording it as the working current value; and S13: using the working current value to subtract the leakage current value to obtain the ion body current intensity value.

[0010] In another exemplary embodiment of the method for detecting the alignment of the ion source, in S11 and S12, the current value output by the ion source high voltage power supply is obtained by utilizing the current detection function of the ion source high voltage power supply, thereby further reducing costs.

[0011] In another exemplary embodiment of the method for detecting the collimation of an ion source, in S20 , the actual extracted beam intensity value is measured using a Faraday cup.

[0012] In another exemplary embodiment of the method for detecting ion source collimation, S20 includes: S21: providing a driving device capable of driving a Faraday cup to move into or out of the path of a particle beam generated by the ion source; S22: configuring the driving device to drive the Faraday cup into the path of the particle beam and measure the actual extracted beam intensity; and S23: configuring the driving device to drive the Faraday cup out of the path of the particle beam. This facilitates switching between a detection mode and a normal operation mode.

[0013] The present invention also provides an ion source alignment detection system comprising an ion source high-voltage power supply, an ion source power amplifier, a beam current measurement device, and a data processing unit. The ion source high-voltage power supply is used to apply normal operating voltage to the ion source body. The ion source power amplifier is used to apply normal operating power to the ion source to excite plasma. The beam current measurement device is used to measure the actual extracted beam current intensity of the ion source along the path of the particle beam generated by the ion source. The data processing unit signal is connected to the beam measuring device and can receive the actual extracted beam intensity value. The data processing unit can also obtain the current value output by the ion source high-voltage power supply after the ion source high-voltage power supply loads the normal operating voltage to the ion source body and save it as the leakage current value. After the ion source power amplifier loads the normal operating power to the ion source body, the current value output by the ion source high-voltage power supply is obtained and saved as the working current value. The data processing unit is configured to use the working current value to subtract the leakage current value to obtain the ion body current intensity value, and use the actual extracted beam intensity value to divide the ion body current intensity value to obtain the extraction efficiency value, and compare the extraction efficiency value with a preset standard value. If the extraction efficiency value is less than the standard value, a collimation deviation signal is generated. If the extraction efficiency value is greater than or equal to the standard value, a collimation normal signal is generated.

[0014] In another exemplary embodiment of the ion source collimation detection system, the ion source high voltage power supply can monitor the output current value, and the data processing unit signal is connected to the ion source high voltage power supply and can receive the current value output by the ion source high voltage power supply.

[0015] In another exemplary embodiment of the system for detecting ion source collimation, the beam current measuring device is a Faraday cup.

[0016] In another exemplary embodiment of the ion source alignment detection system, the ion source alignment detection system further includes a drive device capable of driving the beam current measurement device to move into or out of the path of the particle beam generated by the ion source, thereby conveniently switching between a detection mode and a normal operation mode.

[0017] The present invention also provides a proton and heavy ion accelerator, comprising the above-mentioned ion source collimation detection system. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The following drawings are only used to schematically illustrate and explain the present invention and are not intended to limit the scope of the present invention.

[0019] Figure 1 The figure is a flow chart of an exemplary embodiment of a method for detecting ion source alignment.

[0020] Figure 2 Schematic diagram of the implementation of the method for detecting the collimation of the ion source.

[0021] Figure 3 This is a partial flow chart of the method for detecting the alignment of the ion source.

[0022] Figure 4 This is another partial flow chart of the method for detecting the alignment of the ion source.

[0023] Figure 5 Schematic diagram of another implementation of the method for detecting ion source collimation.

[0024] Description of labels

[0025] 10 Ion source high voltage power supply

[0026] 20 Ion source power amplifier

[0027] 30 Beam measurement device

[0028] 40 Data Processing Unit

[0029] 50 drive unit

[0030] 60 Ion source body

[0031] 61 particle beam DETAILED DESCRIPTION

[0032] In order to have a clearer understanding of the technical features, purposes and effects of the invention, the specific embodiments of the present invention are now described with reference to the accompanying drawings. The same reference numerals in the drawings represent components with the same structure or similar structures but the same functions.

[0033] In this document, “illustrative” means “serving as an example, instance or illustration”, and any diagram or implementation described in this document as “illustrative” should not be interpreted as a more preferred or more advantageous technical solution.

[0034] To simplify the drawings, each figure schematically shows only the parts related to the present invention, which do not represent the actual structure of the product.

[0035] The invention provides a method for detecting the collimation of an ion source. Figure 1 The figure is a flow chart of an exemplary embodiment of a method for detecting ion source alignment. Figure 2 Schematic diagram of the implementation of the method for detecting the alignment of the ion source. Figure 1 and Figure 2 The method for detecting the collimation of the ion source includes S10 to S40.

[0036] S10: Obtaining the ion current intensity value of the ion source. Obtaining the ion current intensity value requires removing the interference of leakage current. Figure 3 This is a partial flow chart of the method for detecting the alignment of the ion source. Figure 3 S10 specifically comprises S11 to S13.

[0037] S11: Set the ion source high voltage power supply 10 to load normal working voltage to the ion source body 60, get the current value output by the ion source high voltage power supply 10, and record it as the leakage current value. The leakage current is the current when only the normal working voltage (for example, 24KV) is loaded and the plasma is not excited, which is usually caused by high voltage insulation defects or stray electric fields. Usually, the ion source high voltage power supply 10 has a current detection function, and the output current value can be directly read from the ion source high voltage power supply 10, without the need for additional current measurement devices, further reducing costs.

[0038] S12: Set the ion source power amplifier 20 to load normal working power to the ion source body 60, get the current value output by the ion source high voltage power supply 10, and record it as the working current value. The working current is the total current after the ion source body 60 is loaded with normal working power (for example, -14dbm), which includes the leakage current.

[0039] S13: Subtract the leakage current value from the working current value to obtain the plasma current intensity value. By subtraction, the leakage current interference is eliminated to obtain the pure plasma current intensity.

[0040] S20: Measure the actual extracted beam intensity value of the ion source by means of the beam measurement device 30. In the illustrative embodiment, the beam measurement device 30 is a Faraday cup. The Faraday cup is a commonly used device for measuring beam intensity, with high measurement accuracy and low cost, so proton heavy ion accelerators usually have a Faraday cup installed.

[0041] During the measurement of beam intensity, the Faraday cup will block the particle beam 61 between the ion source and the treatment room, so after the measurement is completed, the Faraday cup needs to be moved out of the path of the particle beam 61. Figure 4 Another part of the flowchart of the ion source collimation detection method. Figure 5 Another embodiment of the ion source collimation detection method is shown in the schematic diagram. Refer to Figures 2 to 5 S20 comprises S21 to S23.

[0042] S21: Set a driving device 50, which can drive the Faraday cup to move onto the path of the particle beam 61 generated by the ion source or outside the path of the particle beam 61.

[0043] S22: Set the driving device 50 to drive the Faraday cup to move onto the path of the particle beam 61, and measure the actual extracted beam intensity value.

[0044] S23: The drive device 50 is configured to move the Faraday cup out of the path of the particle beam 61. After the measurement is completed, the drive device 50 moves the Faraday cup out of the path of the ion source particle beam 61, allowing the particle beam 61 generated by the ion source to reach the treatment room. This facilitates switching between detection mode and normal operation mode.

[0045] S30: Divide the actual extracted beam intensity value by the plasma current intensity value to obtain an extraction efficiency value.

[0046] S40: Compare the extraction efficiency value with a preset standard value. If the extraction efficiency value is less than the standard value, it is determined that the ion source deviation exceeds the specified value. If the extraction efficiency value is greater than or equal to the standard value, it is determined that the ion source deviation does not exceed the specified value.

[0047] The specified value and standard value are determined based on the actual situation of the proton and heavy ion accelerator. The deviation value of the extraction structure can be adjusted in advance to reach the specified value. For example, the extraction structure is adjusted so that the deviation value is 0.5 mm. At this time, the extraction efficiency value obtained through detection and calculation is 0.8. In the subsequent detection process, the standard value can be set to 0.8. If the extraction efficiency value obtained during the detection process is less than 0.8, it can be inferred that the deviation value of the extraction structure exceeds 0.5 mm.

[0048] Compared to methods that determine alignment through manual visual inspection or laser collimation, the ion source alignment test method provided by the present invention verifies ion source alignment by calculating the particle beam extraction efficiency, ensuring accuracy while reducing costs. Furthermore, this ion source alignment test method eliminates the need for shutdown and disassembly of the ion source housing, preventing personnel from touching high-voltage hardware and improving operational safety.

[0049] The present invention also provides a detection system for the alignment of an ion source. Figure 2 and Figure 5 The ion source alignment detection system includes an ion source high voltage power supply 10 , an ion source power amplifier 20 , a beam current measurement device 30 and a data processing unit 40 .

[0050] The ion source high-voltage power supply 10 is used to apply normal operating voltage to the ion source body 60. The ion source power amplifier 20 is used to apply normal operating power to the ion source to ignite the plasma. The beam current measurement device 30 is used to measure the actual extracted beam current intensity of the ion source along the path of the particle beam 61 generated by the ion source. In the exemplary embodiment, the beam current measurement device 30 is a Faraday cup.

[0051] The data processing unit 40 is signal-connected to the beam current measurement device 30 and is capable of receiving the actual extracted beam current intensity value. The data processing unit 40 is also capable of obtaining the current value output by the ion source high-voltage power supply 10 after the ion source main body 60 is supplied with a normal operating voltage, and storing it as a leakage current value. Furthermore, the data processing unit 40 is capable of obtaining the current value output by the ion source high-voltage power supply 10 after the ion source main body 60 is supplied with a normal operating power by the ion source power amplifier 20, and storing it as an operating current value.

[0052] The data processing unit 40 is configured to obtain a plasma current intensity value by subtracting a leakage current value from an operating current value, obtain an extraction efficiency value by dividing the actual extracted beam intensity value by the plasma current intensity value, and compare the extraction efficiency value with a preset standard value. If the extraction efficiency value is less than the standard value, a collimation error signal is generated; if the extraction efficiency value is greater than or equal to the standard value, a collimation normality signal is generated. The collimation error signal and the collimation normality signal are used to display corresponding information on a display device or to activate an alarm device to issue an alarm signal.

[0053] The ion source alignment detection system provided by the present invention verifies ion source alignment by calculating beam extraction efficiency, ensuring accuracy while reducing costs. Furthermore, when using this ion source alignment detection system, the ion source does not need to be shut down or its casing removed, preventing personnel from touching high-voltage hardware and improving operational safety.

[0054] In the exemplary embodiment, the ion source high voltage power supply 10 is capable of monitoring the output current value, and the data processing unit 40 is signal-connected to the ion source high voltage power supply 10 and is capable of receiving the current value output by the ion source high voltage power supply 10. This eliminates the need for an additional current measurement device, further reducing costs.

[0055] In an exemplary embodiment, referring to Figure 2 and Figure 5 The ion source alignment detection system further includes a drive device 50, which may be a cylinder, capable of driving the beam measurement device 30 to move into or out of the path of the particle beam 61. The drive device 50 allows the beam measurement device 30 to be driven without opening the particle beam conduit, thereby conveniently switching between a detection mode and a normal operation mode.

[0056] The present invention also provides a proton and heavy ion accelerator, comprising the above-mentioned ion source collimation detection system.

[0057] It should be understood that although this specification is described according to various embodiments, not every embodiment contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

[0058] The series of detailed descriptions listed above are only specific descriptions of feasible embodiments of the present invention. They are not intended to limit the scope of protection of the present invention. Any equivalent implementation scheme or changes that do not deviate from the technical spirit of the present invention, such as the combination, division or repetition of features, should be included in the scope of protection of the present invention.

Claims

1. A method for detecting ion source collimation, characterized in that: include: S10: obtaining the ion current intensity value of the ion source; S20: measuring the actual extracted beam intensity value of the ion source by means of a beam current measuring device; S30: Dividing the actual extracted beam intensity value by the plasma current intensity value to obtain an extraction efficiency value; as well as S40: comparing the extraction efficiency value with a preset standard value; if the extraction efficiency value is less than the standard value, determining that the ion source deviation exceeds a specified value; and if the extraction efficiency value is greater than or equal to the standard value, determining that the ion source deviation does not exceed the specified value; Among them, S10 includes: S11: Setting the ion source high-voltage power supply to apply a normal operating voltage to the ion source body, obtaining a current value output by the ion source high-voltage power supply, and recording it as a leakage current value; S12: Setting the ion source power amplifier to load normal operating power to the ion source body, obtaining the current value output by the ion source high voltage power supply, and recording it as the operating current value; and S13: Subtract the leakage current value from the working current value to obtain the plasma current intensity value.

2. The method for detecting the collimation of an ion source according to claim 1, wherein: In S11 and S12 , the current value output by the ion source high voltage power supply is acquired by utilizing the current detection function of the ion source high voltage power supply.

3. The method for detecting the collimation of an ion source according to claim 1, wherein: In S20, the actual extracted beam intensity value is measured using a Faraday cup.

4. The method for detecting the collimation of an ion source according to claim 3, wherein: The S20 includes: S21: providing a driving device, wherein the driving device is capable of driving the Faraday cup to move onto a path of a particle beam generated by an ion source or outside the path of the particle beam; S22: Setting the driving device to drive the Faraday cup to move to the path of the particle beam, and measuring the actual extracted beam intensity value; and S23: Setting the driving device to drive the Faraday cup to move outside the path of the particle beam.

5. A system for detecting the collimation of an ion source, characterized in that: include: an ion source high voltage power supply (10) for applying a normal operating voltage to the ion source body; an ion source power amplifier (20) for applying normal operating power to the ion source to excite plasma; A beam current measuring device (30) is used to measure the actual extracted beam current intensity value of the ion source on the path of the particle beam generated by the ion source; as well as A data processing unit (40) is connected to the beam current measuring device (30) by a signal and is capable of receiving the actual extracted beam current intensity value. The data processing unit (40) is further capable of obtaining the current value output by the ion source high-voltage power supply (10) and saving it as a leakage current value after the ion source high-voltage power supply (10) loads the normal operating voltage to the ion source body, and obtaining the current value output by the ion source high-voltage power supply (10) and saving it as a working current value after the ion source power amplifier (20) loads the normal operating power to the ion source body. The data processing unit (40) is configured to obtain an ion current intensity value by subtracting the leakage current value from the working current value, obtain an extraction efficiency value by dividing the actual extracted beam current intensity value by the ion current intensity value, compare the extraction efficiency value with a preset standard value, generate a collimation deviation signal if the extraction efficiency value is less than the standard value, and generate a collimation normal signal if the extraction efficiency value is greater than or equal to the standard value.

6. The ion source alignment detection system according to claim 5, wherein: The ion source high voltage power supply (10) is capable of monitoring the output current value, and the data processing unit (40) is signal-connected to the ion source high voltage power supply (10) and is capable of receiving the current value output by the ion source high voltage power supply (10).

7. The ion source alignment detection system according to claim 5, wherein: The beam current measuring device (30) is a Faraday cup.

8. The ion source alignment detection system according to claim 7, wherein: The ion source collimation detection system further comprises a driving device (50), wherein the driving device (50) is capable of driving the beam current measurement device (30) to move onto the path of the particle beam current generated by the ion source or outside the path of the particle beam current.

9. Proton and heavy ion accelerator, characterized in that: A detection system for ion source alignment comprising the system according to any one of claims 5 to 8.

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