Method and system for setting TCR test parameters

Through the interaction between the upper computer and the TCR test board, setting and modifying the test parameters of the TCR test board, the problem of inaccurate judgment of the parameters of the existing test equipment is solved, and the defect rate and safety risks of the heating body are reduced.

CN119938423APending Publication Date: 2025-05-06SHENZHEN GEEKVAPE TECH CO LTD
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Patent Information

Application Number
CN202411976142.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-27
Publication Date
2025-05-06

AI Technical Summary

Technical Problem

The test parameters of existing test equipment are inaccurate in judging the performance of the heating body, resulting in a high failure rate of the heating body after assembly and power-on test, affecting production efficiency and posing safety hazards.

Method used

Through the interaction between the host computer and the TCR test board, the command information for parameter setting is sent to the TCR test board. The TCR test board parses and configures new test parameters, returns a new test parameter string, and compares the host computer with the instruction information string, and sends the results to the TCR test board to modify the data in the register.

Benefits of technology

It effectively reduces the defect rate of incoming materials for heating bodies, improves the accuracy of judging the performance of heating bodies, and reduces faults and safety hazards in production line production.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of test parameter configuration, in particular to a method and system for setting TCR test parameters. According to the method, the instruction information of parameter setting is sent to the TCR test board through the upper computer, after the TCR test board receives the instruction information, the instruction information is analyzed into the character string, the new test parameter is configured according to the character string, then the TCR test board returns the analyzed character string to the upper computer, and then the TCR test board sends the new test parameter to the TCR test board. And the upper computer compares the analyzed character string with the character string corresponding to the instruction information to obtain a comparison result, at the moment, the upper computer sends the comparison result to the TCR test board, and the TCR test board modifies the error test parameters in the register of the TCR test board into the test parameters in the instruction information sent by the upper computer according to the comparison result. Through interaction between the upper computer and the TCR test board, the test parameters stored in the register FLASH of the TCR test board can be conveniently modified, so that the poor incoming material detection of the heating body is avoided when the heating body is tested.
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Description

Technical Field

[0001] The present invention relates to the technical field of test parameter configuration, and in particular to a method and system for setting TCR test parameters. Background Art

[0002] At present, when inspecting incoming heating elements, a TCR test board with various detection parameters is usually used to inspect the heating elements. Therefore, the setting of the detection parameters plays a vital role in judging the performance of the heating elements. However, after the existing heating elements are assembled on the production line and tested on the power supply, the defective rate of incoming resistance is relatively high, which is specifically reflected in the TCR and resistance of the heating elements after calibration not meeting the prescribed range, which in turn causes the heating elements of the heating non-combustion appliances to be prone to open circuits and short circuits during the aging process, which greatly affects the production efficiency of the production line and also causes safety hazards of the heating elements in the appliances. Summary of the invention

[0003] The present invention provides a method and system for setting TCR test parameters, which effectively solves the problem that the test parameters of existing test equipment do not accurately judge the performance of the heating element, thereby causing a high defect rate of the heating element after assembly and power-on test.

[0004] According to the first aspect, an embodiment provides a method for setting TCR test parameters, including:

[0005] Sending parameter setting instruction information to the TCR test board; the TCR test board is used to parse the instruction information and configure new test parameters according to the parsed character string;

[0006] Receive a character string corresponding to a new test parameter returned by the TCR test board;

[0007] Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result;

[0008] The comparison result is sent to the TCR test board, and the TCR test board is also used to modify the data in its register according to the comparison result.

[0009] In an achievable implementation, after comparing the character string corresponding to the new test parameter with the character string corresponding to the instruction information, the method further includes:

[0010] If the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, "Pass" is displayed on the display interface; if the character string corresponding to the new test parameter is not exactly the same as the character string corresponding to the instruction information, "Error" is displayed on the display interface, and the error-configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

[0011] In an achievable implementation, before sending the instruction information of parameter setting to the TCR test board, the method further includes:

[0012] Each instruction information in the instruction information list is set, and the instruction information includes: setting the test mode, setting the time function, setting the TCR value command, setting the RES value command, and setting the power calibration input parameter value.

[0013] In an achievable implementation manner, the step of setting each instruction information in the instruction information list includes:

[0014] The string corresponding to each instruction information and the document storage path are set through the Json.py document.

[0015] In an achievable implementation, after the display interface displays "pass", the method further includes:

[0016] Receive a data export instruction, and in response to the instruction, save new test parameters corresponding to each instruction information returned by the TCR test board to the storage path.

[0017] In an achievable implementation manner, after the new test parameters corresponding to each instruction information returned by the TCR test board are saved to the storage path, the method further includes:

[0018] Determine whether the new test parameters are saved successfully; if so, display "pass" and the corresponding storage path on the display interface; otherwise, display "error" and the cause of the error on the display interface.

[0019] In an achievable implementation, when the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, the display interface also displays the instruction information and the character string corresponding to the new test parameter returned by the TCR test board corresponding to the instruction information.

[0020] According to a second aspect, an embodiment provides a system for setting TCR test parameters, including a host computer and a TCR test board;

[0021] The TCR test board is used to parse the instruction information sent by the host computer and configure new test parameters according to the parsed character string;

[0022] The host computer is used for:

[0023] Send parameter setting instruction information to the TCR test board;

[0024] Receive a character string corresponding to a new test parameter returned by the TCR test board;

[0025] Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result;

[0026] Sending the comparison result to the TCR test board;

[0027] The TCR test board is also used to modify the data in its register according to the comparison result.

[0028] In an achievable implementation, the host computer includes a display unit, and the display unit is used to:

[0029] If the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, "pass" is displayed on the interface of the display unit; if the character string corresponding to the new test parameter is not exactly the same as the character string corresponding to the instruction information, "error" is displayed on the interface of the display unit, and the error-configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

[0030] In an achievable implementation, when the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, the interface of the display unit also displays the instruction information and the character string corresponding to the new test parameter returned by the TCR test board corresponding to the instruction information.

[0031] According to a third aspect, an embodiment provides a computer-readable storage medium, on which a computer program is stored. The computer program can be executed by a processor to implement the method as described above.

[0032] According to a fourth aspect, an embodiment provides a computer program product, comprising a computer program and / or instructions, wherein the computer program and / or instructions implement the method as described above when executed by a processor.

[0033] According to the method / system for setting TCR test parameters of the above-mentioned embodiment, the host computer sends instruction information for parameter setting to the TCR test board. After receiving the instruction information, the TCR test board parses the instruction information and configures new test parameters corresponding to the instruction according to the parsed character string. Then, the TCR test board returns the character string corresponding to the configured new test parameter to the host computer. The host computer compares the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result. At this time, the host computer sends the comparison result to the TCR test board, and the TCR test board modifies the erroneous test parameters in its register to the test parameters in the instruction information sent by the host computer according to the comparison result. Using the method / system of the present application, through the interaction between the host computer and the TCR test board, the test parameters stored in the register FLASH of the TCR test board can be conveniently modified for the next heating element resistance test, so as to reduce the defective rate of incoming material detection when the heating element is tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A structural block diagram of a system for setting TCR test parameters provided in this embodiment;

[0035] Figure 2 A flowchart of a method for setting TCR test parameters provided in this embodiment;

[0036] Figure 3 A method for setting TCR test parameters provided in this embodiment displays a flow chart of the comparison result after the comparison result is obtained;

[0037] Figure 4 Example of the host computer display interface provided for this embodiment Figure 1 ;

[0038] Figure 5 Example of the host computer display interface provided for this embodiment Figure 2 ;

[0039] Figure 6 Example of the host computer display interface provided for this embodiment Figure 3 ;

[0040] Figure 7 Example of the host computer display interface provided for this embodiment Figure 4 .

[0041] Figure numerals: 10, host computer; 11, display unit; 12, instruction information list area; 13, instruction trigger area; 14, verification information area; 20, TCR test board; 30, device under test. DETAILED DESCRIPTION

[0042] The present invention is further described in detail below by specific embodiments in conjunction with the accompanying drawings. Wherein similar elements in different embodiments adopt associated similar element numbers. In the following embodiments, many detailed descriptions are for making the present application better understood. However, those skilled in the art can easily recognize that some features can be omitted in different situations, or can be replaced by other elements, materials, methods. In some cases, some operations related to the present application are not shown or described in the specification, this is to avoid the core part of the present application being overwhelmed by too much description, and for those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations according to the description in the specification and the general technical knowledge in the art.

[0043] In addition, the features, operations or characteristics described in the specification can be combined in any appropriate manner to form various implementations. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various sequences in the specification and the drawings are only for the purpose of clearly describing a certain embodiment and are not meant to be a required sequence, unless otherwise specified that a certain sequence must be followed.

[0044] The serial numbers of the components in this document, such as "first", "second", etc., are only used to distinguish the objects described and do not have any order or technical meaning. The "connection" and "coupling" mentioned in this application, unless otherwise specified, include direct and indirect connections (couplings).

[0045] The incoming heating element material detection includes the initial resistance of the heating element (upper and lower sections), the TCR of the heating element after power calibration (upper and lower sections), and whether the current resistance of the heating element (upper and lower sections) meets the specified range during and after the power-on test to ensure the consistency of the heating elements used in the production line assembly, and then the parameter data of the heating tubes on the TCR test board are uniformly saved to the document for export. However, for the determination of the specified range, the range values ​​corresponding to different test modes are different. Therefore, this application proposes a system and method for setting the test parameters of the TCR test board.

[0046] refer to Figure 1, a system for setting TCR test parameters provided in this embodiment includes a host computer 10 and a TCR test board 20; wherein the TCR test board 20 is used to parse the instruction information sent by the host computer 10, and configure new test parameters according to the parsed character string. In actual application, the TCR test board 20 adopts an integrated circuit board. When the incoming material inspection is performed on the device to be tested 30 (the heating element in this embodiment), the heating element is fixed on the fixture, and the TCR test board 20 and the fixture are energized to realize the electrical connection between the TCR test board 20 and the heating element, thereby realizing the TCR test board 20 to test the performance of various parameters of the heating element.

[0047] The host computer 10 is used for:

[0048] Sending parameter setting instruction information to the TCR test board 20;

[0049] Receive a character string corresponding to a new test parameter returned by the TCR test board 20;

[0050] Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result;

[0051] Send the comparison result to the TCR test board 20;

[0052] The TCR test board 20 is also used to modify the data in its register according to the comparison result.

[0053] In this solution, the host computer 10 interacts with the TCR test board 20, and the host computer 10 sets the current test mode, TCR range, resistance range, power-on test times, heating time, pause time and other parameters of the TCR test board 20 to prepare for the next step of the incoming material test of the heating element. Figure 3-Figure 6 ,in, Figure 3-Figure 6The display diagram of the control interface of the host computer 10 is captured partially. First, when the host computer 10 sends the instruction information of parameter setting to the TCR test board 20, all the test parameters will be sent to the TCR test board 20 at the same time. The TCR test board 20 stores all the test parameters in the register FLASH. At this time, when the staff clicks "all verification" in the instruction trigger area 13 in the control interface of the host computer 10, the host computer 10 will send an instruction to start verification to the TCR test board 20. After receiving the verification instruction, the TCR test board 20 starts to parse the test parameters in the instruction information of the parameter setting sent by the host computer 10, and reconfigures (or updates) the original test parameters of the TCR test board 20 according to the parsed character string. After the TCR test board 20 is reconfigured (or updated), the character string corresponding to the updated test parameters will be returned to the host computer 10; then, the host computer 10 will compare the character string returned by the TCR test board 20 with the character string corresponding to the instruction information of the parameter setting to determine whether the parameter setting of the TCR test board 20 is successful. When the comparison result shows that the character string returned by the TCR test board 20 is exactly the same as the character string corresponding to the instruction information of the parameter setting, it means that the parameter setting of the TCR test board 20 is successful; when the comparison result shows that the character string returned by the TCR test board 20 is different from the character string corresponding to the instruction information of the parameter setting, it means that the character string setting corresponding to the current instruction information has failed. At this time, the host computer 10 sends the comparison result to the TCR test board 20, and the TCR test board 20 modifies the original test parameters in its register FLASH to the test parameters corresponding to the instruction information sent by the host computer 10 according to the comparison result.

[0054] Furthermore, the host computer 10 includes a display unit 11, which is used to: if the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, then "pass" is displayed on the interface of the display unit 11; if the character string corresponding to the new test parameter is not exactly the same as the character string corresponding to the instruction information, then "error" is displayed on the interface of the display unit 11, and the incorrectly configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

[0055] Specifically, if the string returned by the TCR test board 20 is exactly the same as the string corresponding to the parameter setting instruction information sent by the host computer 10, then "pass" is displayed on the interface of the display unit 11 (such as Figure 4 If the string returned by the TCR test board 20 is not exactly the same as the string corresponding to the parameter setting instruction information sent by the host computer 10, the display unit 11 will display "error" (such as Figure 6The upper part of the display interface shown in FIG. 1 displays “FAIL”), and at the same time, the display interface of the display unit 11 displays the instruction information of the configuration error and the error string (such as the error string returned by the TCR test board 20 corresponding to the instruction information) returned by the TCR test board 20. Figure 6 The lower part of the display interface shown shows "TCR ValueSet Fail:SETTCR110590"). In this way, it is convenient for the staff to accurately grasp the setting of the parameters of the TCR test board 20, and then take corresponding measures to timely check the problematic parameters.

[0056] Furthermore, when the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, the interface of the display unit 11 also displays the instruction information and the character string corresponding to the new test parameter corresponding to the instruction information returned by the TCR test board 20.

[0057] In addition, after the host computer 10 receives the string returned by the TCR test board 20, if the string returned by the TCR test board 20 is exactly the same as the string corresponding to the instruction information of the parameter setting sent by the host computer 10, the display interface of the display unit 11 of the host computer 10 will also display the correctly configured instruction information and the string corresponding to the instruction information. Unlike the case of configuration error, the display position when the configuration is correct is different from the display position when the configuration is incorrect. When the configuration is correct, the instruction information and the corresponding string will be displayed in the middle of the display unit 11, and when the configuration is incorrect, the instruction information and the corresponding string will be displayed in the lower part of the display unit 11 (refer to Figure 4 and Figure 6 ). In order to further distinguish different display effects, the background colors of the three display areas (the upper part, the middle part, and the lower part of the display unit 11) can be set to different colors for further distinction.

[0058] refer to Figure 2 , a method for setting TCR test parameters provided in this embodiment includes the following steps:

[0059] Step 100: Sending parameter setting instruction information to the TCR test board 20; the TCR test board 20 is used to parse the instruction information and configure new test parameters according to the parsed character string;

[0060] Step 200: receiving a character string corresponding to a new test parameter returned by the TCR test board 20;

[0061] Step 300: Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result;

[0062] Step 400: Send the comparison result to the TCR test board; the TCR test board is also used to modify the data in its register according to the comparison result.

[0063] The method for setting TCR test parameters of this embodiment is to send parameter setting instruction information to TCR test board 20 through host computer 10. After receiving the instruction information, TCR test board 20 parses the instruction information and configures new test parameters corresponding to the instruction information according to the parsed character string. Then, TCR test board 20 returns the character string corresponding to the configured new test parameter to host computer 10. Host computer 10 compares the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result. At this time, host computer sends the comparison result to TCR test board 20. TCR test board 20 will modify the erroneous test parameters in its register to the test parameters in the instruction information sent by host computer 10 according to the comparison result. Using the method of the present application, through the interaction between host computer 10 and TCR test board 20, it is possible to conveniently modify the test parameters stored in the register FLASH of TCR test board, so as to facilitate the use of the next heating element resistance test, so as to reduce the defective rate of incoming material detection when testing the heating element.

[0064] In some embodiments, after step 400, that is, after comparing the character string corresponding to the new test parameter with the character string corresponding to the instruction information, the method further includes:

[0065] Step 500: If the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, "pass" is displayed on the display interface; Step 600: If the character string corresponding to the new test parameter is not exactly the same as the character string corresponding to the instruction information, "error" is displayed on the display interface, and the incorrectly configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

[0066] When it is determined that the two character strings are exactly the same, "Pass" is displayed on the display interface; when it is determined that the two character strings are not exactly the same, "Error" is displayed on the display interface. At the same time, the erroneous character string returned by the TCR test board 20 and its corresponding instruction information are also displayed on the display interface, so that the staff can promptly discover the incorrectly configured instruction information and its corresponding test parameters.

[0067] Furthermore, when the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, the display interface also displays the instruction information and the character string corresponding to the new test parameter corresponding to the instruction information returned by the TCR test board 20.

[0068] After the host computer 10 receives the string returned by the TCR test board 20, if the string returned by the TCR test board 20 is exactly the same as the string corresponding to the instruction information of the parameter setting sent by the host computer 10, the display interface of the display unit 11 of the host computer 10 will also display the correctly configured instruction information and the string corresponding to the instruction information. Unlike the case where the parameter configuration of the TCR test board 20 is incorrect, the display position when the configuration is correct is different from the display position when the configuration is incorrect. When the configuration is correct, the instruction information and the corresponding string will be displayed in the middle of the display unit 11, and when the configuration is incorrect, the instruction information and the corresponding string will be displayed in the lower part of the display unit 11 (refer to Figure 4 and Figure 6 ).

[0069] In some embodiments, before sending the instruction information of parameter setting to the TCR test board 20, it also includes:

[0070] Each instruction information in the instruction information list is set, and the instruction information includes: setting the test mode, setting the time function, setting the TCR value command, setting the RES value command, and setting the power calibration input parameter value.

[0071] In general, the existing suppliers of heating elements only screen the initial resistance of the heating elements before leaving the factory, which results in a high defect rate of the heating element resistance after the power-on test during assembly on the production line, which greatly affects the production efficiency of the production line and also causes the heating element safety hazard of the heating non-combustion appliance. Therefore, in order to solve this problem, the present application sets the instruction information in the host computer 10, and establishes an instruction information list area 12 during the setting, and sets multiple instruction information in the instruction information list, such as: setting the test mode, setting the time function, setting the TCR value (temperature coefficient of resistance) command, setting the RES value (resistance) command, and setting the power calibration input parameter value, etc.

[0072] Specifically, before the host computer 10 is used to set the test parameters of the TCR test board 20, the character string of the test parameter corresponding to each instruction information in the instruction information list area 12 of the host computer 10 is set first, and the character string corresponding to each instruction information and the document storage path are set through the Json.py document.

[0073] like Figure 3-Figure 6In the control interface shown, a command information list area 12 is provided on the left side of the display unit 11, and a verification information area 14 is provided on the right side of the display unit 11, wherein each verification information in the verification information area 14 is a specific action item corresponding to each command information in the command information list area 12, and the command information list area 12 also includes a character string of test parameters corresponding to each command information. For example, when the command information is command1, its corresponding character string is SETSEL0, and the specific action item corresponding to the command information is "set test mode", wherein the test modes include: 0 [power calibration first and then power-on test], 1 [power-on test first and then power calibration], 2 [power calibration only], 3 [power-on test only], and when setting the test mode, select one of them according to the test requirements of different heating elements. When the instruction information is command2, the corresponding string is SETTIME060010002005060, and the specific action item corresponding to the instruction information is "set time function", where the time function includes: SETTIME [power calibration cooling time] [power-on test times] [heating time] [pause time] [power-on test cooling time]. When setting the time function, the corresponding time function is set according to the set test mode, and the time functions corresponding to different test modes are different. When the instruction information is command3, the corresponding string is SETTCR110590, and the specific action item corresponding to the instruction information is "set TCR value command", where the TCR value command includes: [maximum value] [minimum value]. When the instruction information is command4, the corresponding string is SETRES900400050, and the specific action item corresponding to the instruction information is "set RES value command", where the RES value command includes: [maximum value] [minimum value]. When the instruction information is command5, its corresponding character string is RESADJ280280, and the specific action item corresponding to the instruction information is "set power calibration input parameter value", wherein the power calibration input parameter value includes: [target temperature at the bottom of the heating element] [target temperature at the top of the heating element].

[0074] After clicking the "All Verification" command in the command trigger area 13, the host computer 10 sends the command information in Command_List to the TCR test board 20 in sequence. After each string is sent, the same string must be sent back by the TCR test board 20. When the host computer 10 receives the same string sent back by the TCR test board 20, it means that the communication of this instruction is successful and the parameter setting is completed; otherwise, it means that the communication of this instruction failed. When all the command information in Command_List is set successfully, the host computer 10 displays the following Figure 4 If a command is not set successfully, the host computer 10 will display the following Figure 6The interface status is shown.

[0075] In some embodiments, after the display interface displays "pass", the method further includes:

[0076] Receive the data export instruction, and in response to the instruction, save the new test parameters corresponding to each instruction information returned by the TCR test board 20 to the storage path.

[0077] Specifically, after the verification is completed, all data can be saved. For example, after clicking the "data export" command, the current heating element parameter values ​​are exported to Figure 5 The path shown by the display unit 11 is shown in the figure. It is convenient for the staff to directly find the parameter values ​​under the path when searching later.

[0078] Furthermore, after the new test parameters corresponding to each instruction information returned by the TCR test board 20 are saved to the storage path, it also includes: determining whether the new test parameters are saved successfully; if so, displaying "pass" and the corresponding storage path on the display interface; otherwise, displaying "error" and the cause of the error on the display interface.

[0079] Specifically, after saving the data, the staff cannot know whether the data is saved successfully. Therefore, in this embodiment, after clicking "Data Export" in the command trigger area 13, it is necessary to determine whether the test parameters are saved successfully. If a dialog box of "Pass" or "Save Successfully" pops up on the display interface, it means that the data is saved successfully. At this time, the corresponding storage path is displayed on the display interface. If a dialog box of "Error" or "Save Failed" pops up on the display interface, it means that the data is saved unsuccessfully. At this time, the reason for the save error will be displayed on the display interface.

[0080] This embodiment provides a computer-readable storage medium, on which a computer program is stored, and the computer program can be executed by a processor to implement the method described in the above embodiment. In view of the above embodiment, the method for setting TCR test parameters has been described in detail, and this embodiment will not be repeated here.

[0081] The present embodiment provides a computer program product, including a computer program and / or instructions, which implement the method described in the above embodiment when executed by a processor. In view of the above embodiment, the method for setting TCR test parameters has been described in detail, and this embodiment will not be repeated here.

[0082] Those skilled in the art will appreciate that all or part of the functions of the various methods in the above-mentioned embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above-mentioned embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, and the storage medium can include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to implement the above-mentioned functions. For example, the program is stored in the memory of the device, and when the program in the memory is executed by the processor, all or part of the above-mentioned functions can be implemented. In addition, when all or part of the functions in the above-mentioned embodiments are implemented by computer programs, the program can also be stored in a storage medium such as a server, another computer, disk, optical disk, flash disk or mobile hard disk, and can be downloaded or copied and saved in the memory of the local device, or the system of the local device is updated, and when the program in the memory is executed by the processor, all or part of the functions in the above-mentioned embodiments can be implemented.

[0083] The above specific examples are used to illustrate the present invention, which is only used to help understand the present invention and is not intended to limit the present invention. For those skilled in the art, according to the concept of the present invention, some simple deductions, modifications or substitutions can be made.

Claims

1. A method for setting TCR test parameters, characterized in that: include: Send parameter setting instruction information to the TCR test board; The TCR test board is used to parse the instruction information and configure new test parameters according to the parsed character string; Receive a character string corresponding to a new test parameter returned by the TCR test board; Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result; The comparison result is sent to the TCR test board, and the TCR test board is also used to modify the data in its register according to the comparison result.

2. The method for setting TCR test parameters according to claim 1, characterized in that: After comparing the character string corresponding to the new test parameter with the character string corresponding to the instruction information, the method further includes: If the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, "pass" is displayed on the display interface; If the character string corresponding to the new test parameter is not completely the same as the character string corresponding to the instruction information, "error" is displayed on the display interface, and the error-configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

3. The method for setting TCR test parameters according to claim 1, characterized in that: Before sending the instruction information of parameter setting to the TCR test board, the method further includes: Each instruction information in the instruction information list is set, and the instruction information includes: setting the test mode, setting the time function, setting the TCR value command, setting the RES value command, and setting the power calibration input parameter value.

4. The method for setting TCR test parameters according to claim 3, characterized in that: The step of setting each instruction information in the instruction information list includes: The string corresponding to each instruction information and the document storage path are set through the Json.py document.

5. The method for setting TCR test parameters according to claim 2, characterized in that: After the display interface displays "pass", the method further includes: Receive a data export instruction, and in response to the instruction, save new test parameters corresponding to each instruction information returned by the TCR test board to the storage path.

6. The method for setting TCR test parameters according to claim 5, characterized in that: After the new test parameters corresponding to each instruction information returned by the TCR test board are saved in the storage path, the method further includes: Determine whether the new test parameters are saved successfully; if so, display "pass" and the corresponding storage path on the display interface; otherwise, display "error" and the cause of the error on the display interface.

7. The method for setting TCR test parameters according to claim 2, characterized in that: When the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, the display interface also displays the instruction information and the character string corresponding to the new test parameter returned by the TCR test board corresponding to the instruction information.

8. A system for setting TCR test parameters, characterized in that: Including host computer and TCR test board; The TCR test board is used to parse the instruction information sent by the host computer and configure new test parameters according to the parsed character string; The host computer is used for: Send parameter setting instruction information to the TCR test board; Receive a character string corresponding to a new test parameter returned by the TCR test board; Compare the character string corresponding to the new test parameter with the character string corresponding to the instruction information to obtain a comparison result; Sending the comparison result to the TCR test board; The TCR test board is also used to modify the data in its register according to the comparison result.

9. The system for setting TCR test parameters according to claim 8, characterized in that: The host computer includes a display unit, which is used for: If the character string corresponding to the new test parameter is exactly the same as the character string corresponding to the instruction information, "pass" is displayed on the interface of the display unit; if the character string corresponding to the new test parameter is not exactly the same as the character string corresponding to the instruction information, "error" is displayed on the interface of the display unit, and the error-configured instruction information and its corresponding character string corresponding to the new test parameter are displayed at the same time.

10. A computer-readable storage medium, characterized in that: A computer program is stored on the medium, and the computer program can be executed by a processor to implement the method according to any one of claims 1 to 7.

11. A computer program product comprising a computer program and / or instructions, characterized in that: When the computer program and / or the instructions are executed by a processor, the method according to any one of claims 1 to 7 is implemented.