Non-contact measuring method and device for voltage of three-phase wire and electronic equipment

Abstract

The invention belongs to the technical field of voltage measurement, and particularly discloses a three-phase wire voltage non-contact measurement method and device and electronic equipment, and the method comprises the steps: obtaining an electric field signal waveform and a bus voltage signal waveform of a to-be-measured three-phase wire before and after switching operation through a three-phase non-contact sensor and a voltage transformer, the switch operation is to put the to-be-tested wire into a bus for operation or cut off the to-be-tested wire from the bus; based on the electric field signal waveform and the bus voltage signal waveform, a coupling coefficient matrix is calculated, and the coupling coefficient matrix comprises a coupling coefficient matrix between a to-be-measured three-phase wire and a three-phase non-contact sensor and a coupling coefficient matrix between other wires and the three-phase non-contact sensor; and based on the electric field signal waveform and the coupling coefficient matrix, calculating the voltage waveform of the to-be-detected three-phase conductor in the transient process. According to the method, the transient voltage waveform measurement accuracy can be improved.

Description

Technical Field

[0001] The present application belongs to the technical field of voltage measurement, and more specifically, relates to a non-contact measurement method, device and electronic equipment for three-phase conductor voltage. Background Art

[0002] The transient voltage waveform caused by switch operation or fault events (such as single-phase grounding, lightning strike, etc.) in the power system not only carries the characteristic information of the system fault process, but also is a potential cause of equipment insulation degradation. Therefore, accurate measurement of the transient voltage waveform in the power system is of great significance for system fault diagnosis and equipment life cycle assessment.

[0003] At present, the power system mainly uses electromagnetic or capacitive voltage transformers to measure the power frequency voltage waveform in the line and station. Since the bandwidth of traditional voltage transformers (≤1kHz) is difficult to meet the transient voltage waveform measurement requirements of the power system, broadband voltage waveform monitoring technology has received widespread attention from scholars in recent years. At present, for transient voltage monitoring of high voltage level (110kV and above) transmission systems, scholars have proposed the concept of non-contact transient voltage monitoring. Non-contact transient voltage measurement sensors have the advantages of wide bandwidth, small size, and easy installation, and have potential application prospects.

[0004] However, the output of these sensors is affected by all the live conductors surrounding the target. Therefore, a key challenge in contactless voltage measurement, whether in transmission lines or substations, is to decouple the measured electric field signal to accurately reconstruct the voltage of the target conductor.

[0005] There are three main methods for calculating the coupling matrix: 1) Construct a lumped capacitance model between the three-phase conductor to be measured and the non-contact sensor. The lumped capacitance parameter distribution is calculated based on the diameter of the three-phase conductor, the phase distance and the sensor position coordinates. The transmission relationship between the voltage of the conductor to be measured and the output voltage of the sensor is determined, that is, the coupling coefficient matrix between the sensor measurement value and the voltage to be measured. However, in practical engineering applications, it is very difficult to accurately obtain the sensor coordinates, and the coordinate error will further increase the error in the calculation of the lumped parameters. On the other hand, this method is difficult to consider the background electric field signals generated by the non-tested conductors in the substation, and the accuracy is not high.

[0006] 2) Use the voltage transformer installed in the substation to provide the steady-state power frequency voltage waveform of the line to be tested , and the electric field signal measured by the sensor at the same time Calculate the coupling coefficient matrix .

[0007] 3) The coupling matrix is ​​calculated using the voltage mutation of the conductor caused by the operation of the circuit breaker or disconnector. That is, the moment when a significant voltage jump occurs in one phase conductor but no voltage jump occurs in the other two phase conductors is selected. It is considered that the output jumps of the three-phase sensors are all caused by the voltage mutation of the conductor, thereby obtaining the relationship between the coupling coefficients of the sensors.

[0008] Method 2) and method 3) have similar problems. In their specific implementation, they both rely on the symmetry assumption of the conductor to be tested, which is difficult to meet in a substation with a complex conductor structure. In addition, it is necessary to assume that the diagonal element of the coupling coefficient matrix is ​​1, which also lacks mathematical rationality and accuracy. Summary of the invention

[0009] In view of the defects of the prior art, the purpose of the present application is to provide a non-contact measurement method, device and electronic device for three-phase conductor voltage, aiming to solve the problem of insufficient accuracy of transient voltage waveform measurement caused by the need to make assumptions on the diagonal elements of the coupling coefficient matrix in the existing non-contact voltage measurement scheme.

[0010] To achieve the above objectives, in a first aspect, the present application provides a non-contact measurement method for a three-phase conductor voltage, comprising: Using a three-phase non-contact sensor and a voltage transformer respectively, an electric field signal waveform and a bus voltage signal waveform are obtained before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; Based on the electric field signal waveform and the bus voltage signal waveform, a coupling coefficient matrix is ​​calculated, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase conductor to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other conductors and the three-phase contactless sensor; Based on the electric field signal waveform and the coupling coefficient matrix, the voltage waveform of the transient process of the three-phase conductor to be measured is calculated.

[0011] The present application obtains the electric field signal waveform and the bus voltage signal waveform before and after the switching operation of the three-phase conductor to be measured to calculate the coupling coefficient matrix, and then calculates the voltage waveform of the transient process of the three-phase conductor to be measured. It does not depend on the geometric structure of the three-phase conductor to be measured and the symmetrical distribution of the sensor, which is conducive to on-site installation and maintenance, and does not need to make assumptions on the diagonal element values ​​of the coupling coefficient matrix. The obtained coupling coefficient is more accurate, thereby improving the accuracy of voltage measurement.

[0012] According to a non-contact measurement method for three-phase conductor voltage provided by the present application, the coupling coefficient matrix is ​​calculated based on the electric field signal waveform and the bus voltage signal waveform, including: If the switch operation performed on the three-phase conductor to be tested is that the conductor to be tested is put into bus operation, based on the electric field signal waveform and the bus voltage signal waveform, the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be tested are calculated; Based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured, an optimization problem for solving the coupling coefficient matrix is ​​constructed; The optimization problem is solved by an optimization algorithm to obtain a coupling coefficient matrix.

[0013] According to a non-contact measurement method for three-phase conductor voltage provided by the present application, the optimization problem of solving the coupling coefficient matrix is ​​constructed based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured, including: Setting constraint conditions based on the electric field signal waveform and the bus voltage signal waveform; Based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured and the constraint conditions, an optimization problem for solving the coupling coefficient matrix is ​​constructed.

[0014] According to a non-contact measurement method for three-phase conductor voltage provided by the present application, the coupling coefficient matrix is ​​calculated based on the electric field signal waveform and the bus voltage signal waveform, including: If the switch operation performed on the three-phase conductor to be tested is that the conductor to be tested is cut off from the bus, an optimization problem for solving a coupling coefficient matrix is ​​constructed based on the electric field signal waveform and the bus voltage signal waveform; The optimization problem is solved by an optimization algorithm to obtain a coupling coefficient matrix.

[0015] According to a non-contact measurement method for three-phase conductor voltage provided by the present application, solving the optimization problem by an optimization algorithm to obtain a coupling coefficient matrix includes: The optimization problem is solved by a sequential quadratic programming algorithm.

[0016] This application uses a sequential quadratic programming algorithm to solve the constructed optimization problem. The sequential quadratic programming algorithm has significant advantages in dealing with nonlinear optimization problems, including good convergence and effective handling of constraints. In addition, the sequential quadratic programming algorithm can use quadratic approximation in each iteration, thereby improving computational efficiency and accuracy.

[0017] According to a non-contact measurement method for three-phase conductor voltage provided by the present application, the three-phase non-contact sensor is arranged at a side of the three-phase conductor circuit breaker to be measured close to the line.

[0018] The present application arranges the three-phase non-contact sensor at one side of the three-phase conductor circuit breaker to be tested close to the line to obtain a higher signal-to-noise ratio.

[0019] In a second aspect, the present application provides a non-contact measurement device for three-phase conductor voltage, comprising: An acquisition module is used to respectively use a three-phase non-contact sensor and a voltage transformer to obtain an electric field signal waveform and a bus voltage signal waveform before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; A first calculation module is used to calculate a coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase conductor to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other conductors and the three-phase contactless sensor; The second calculation module is used to calculate the voltage waveform of the transient process of the three-phase conductor to be measured based on the electric field signal waveform and the coupling coefficient matrix.

[0020] In a third aspect, the present application provides an electronic device comprising: at least one memory for storing programs; and at least one processor for executing the programs stored in the memory. When the programs stored in the memory are executed, the processor is used to execute the non-contact measurement method for three-phase wire voltage described in the first aspect or any possible implementation of the first aspect.

[0021] In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the non-contact measurement method for three-phase wire voltage described in the first aspect or any possible implementation of the first aspect.

[0022] In a fifth aspect, the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the non-contact measurement method for three-phase wire voltage described in the first aspect or any possible implementation of the first aspect.

[0023] It can be understood that the beneficial effects of the second to sixth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0024] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art: By obtaining the electric field signal waveform and bus voltage signal waveform before and after the switching operation of the three-phase conductor to be tested, the coupling coefficient matrix is ​​calculated, and then the voltage waveform of the transient process of the three-phase conductor to be tested is calculated. This method does not depend on the geometric structure of the three-phase conductor to be tested and the symmetrical distribution of the sensor, which is beneficial to on-site installation and maintenance, and does not require assumptions on the diagonal element values ​​of the coupling coefficient matrix. The obtained coupling coefficient is more accurate, thereby improving the measurement accuracy of the transient voltage waveform. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the present application or the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0026] Figure 1 It is a flow chart of a non-contact measurement method of three-phase conductor voltage provided in an embodiment of the present application; Figure 2 is a schematic diagram of an electric field signal waveform provided in an embodiment of the present application; Figure 3 is a schematic diagram of bus voltage signal waveform provided in an embodiment of the present application; Figure 4 It is a schematic diagram of the voltage waveform of the transient process of the three-phase conductor to be tested obtained by decoupling provided in an embodiment of the present application; Figure 5 It is a schematic diagram of the arrangement position of the three-phase non-contact sensor provided in the embodiment of the present application in the substation; Figure 6 is a structural schematic diagram of a non-contact measurement device for three-phase conductor voltage provided in an embodiment of the present application; Figure 7 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0028] The term "and / or" in this article is a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The symbol " / " in this article indicates that the associated objects are in an or relationship, for example, A / B means A or B.

[0029] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0030] In the description of the embodiments of the present application, unless otherwise specified, "multiple" means two or more than two. For example, multiple processing units refer to two or more processing units, etc.; multiple elements refer to two or more elements, etc.

[0031] First, the following contents are introduced: If we assume that the number of charged conductors in space is The voltage applied to each conductor is When performing non-contact measurements, a The electric field waveform obtained by the measurement is If the number of sensors arranged is the same as the number of live conductors (i.e. ), then the electric field vector obtained by non-contact measurement and the conductor voltage vector satisfy .in, for As long as the coupling matrix is ​​determined in advance element value, we can use the measured electric field vector Calculate the voltage of the conductor to be measured .

[0032] Next, combine Figure 1-Figure 5 The non-contact measurement method of the three-phase conductor voltage provided in the embodiment of the present application is introduced.

[0033] Figure 1 is a flow chart of a non-contact measurement method of a three-phase conductor voltage provided in an embodiment of the present application, such as Figure 1 As shown, the method comprises the following steps: Step 100, using a three-phase non-contact sensor and a voltage transformer to obtain an electric field signal waveform and a bus voltage signal waveform before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; Before the three-phase conductor to be tested is switched, a three-phase non-contact sensor is used to collect an electric field signal of at least one power frequency cycle time, and a voltage transformer is used to collect a bus three-phase voltage waveform of at least one power frequency cycle time. Then the three-phase conductor to be tested is switched and put into bus operation or cut off from the bus. Then the three-phase non-contact sensor is used to collect electric field signals, and a voltage transformer is used to collect the bus three-phase voltage waveform, which lasts at least until the time of steady-state operation for one power frequency cycle after the transient process ends.

[0034] After obtaining the electric field signals and bus voltage signals before and after the switching operation, the electric field signal waveforms and bus voltage signal waveforms before and after the switching operation of the three-phase conductor to be tested can be obtained, wherein the electric field signal waveforms include background electric field signals, transient electric field signals and steady-state electric field signals.

[0035] Figure 2 is a schematic diagram of an electric field signal waveform provided in an embodiment of the present application, such as Figure 2 As shown, in one embodiment of the present application, the electric field signal waveform collected by the three-phase non-contact sensor is as follows Figure 2 shown.

[0036] Figure 3 : is a schematic diagram of bus voltage signal waveform provided in an embodiment of the present application, such as Figure 3 As shown, in one embodiment of the present application, the bus voltage signal waveform collected by the voltage transformer is as follows Figure 3 shown.

[0037] Step 110, calculating a coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase conductor to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other conductors and the three-phase contactless sensor; After the electric field signal waveform and the bus voltage signal waveform are obtained, the coupling coefficient matrix can be calculated based on the steady-state electric field signal, the transient electric field signal, the background electric field signal and the bus steady-state voltage.

[0038] Step 120, calculating the voltage waveform of the transient process of the three-phase conductor to be measured based on the electric field signal waveform and the coupling coefficient matrix.

[0039] Specifically, the calculation formula is as follows:

[0040] in, is the voltage waveform of the transient process of the three-phase conductor to be tested, is the coupling coefficient matrix between the three-phase conductor to be tested and the three-phase non-contact sensor, is the coupling coefficient matrix between other conductors and the three-phase non-contact sensor, is a transient electric field signal.

[0041] Figure 4 Schematic diagram of the voltage waveform of the transient process of the three-phase conductor to be measured obtained by decoupling provided in the embodiment of the present application. Based on the electric field signal waveform and the coupling coefficient matrix, the voltage waveform of the transient process of the three-phase conductor to be measured is calculated as follows: Figure 4 shown.

[0042] The present application provides a non-contact measurement method for three-phase conductor voltage. Non-contact measurement of three-phase conductor voltage in a substation can be achieved through a limited number of three-phase non-contact sensors. The number of sensors does not need to increase with the number of live conductors, which has significant economic benefits.

[0043] The present application provides a non-contact measurement method for three-phase conductor voltage. By obtaining the electric field signal waveform and bus voltage signal waveform before and after the switching operation of the three-phase conductor to be measured, a coupling coefficient matrix is ​​calculated, and then the voltage waveform of the transient process of the three-phase conductor to be measured is calculated. This method is independent of the geometric structure of the three-phase conductor to be measured and the symmetrical distribution of the sensor, which is conducive to on-site installation and maintenance, and does not require assumptions on the diagonal element values ​​of the coupling coefficient matrix. The obtained coupling coefficient is more accurate, thereby improving the accuracy of transient voltage waveform measurement.

[0044] In some embodiments, step 110 specifically includes: Step 1101, if the switch operation performed on the three-phase conductor to be tested is that the conductor to be tested is put into bus operation, based on the electric field signal waveform and the bus voltage signal waveform, calculate the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be tested; Step 1102: construct an optimization problem for solving the coupling coefficient matrix based on the theoretical lower and upper limits of the transient voltage offset of the three-phase conductor to be measured. Step 1103, solving the optimization problem by using an optimization algorithm to obtain a coupling coefficient matrix.

[0045] If the switch operation performed by the three-phase conductor to be tested is that the conductor to be tested is put into bus operation, the optimization problem for solving the coupling coefficient matrix is ​​constructed as shown in the following formula (1):

[0046] in, , They are the coupling coefficient matrices between the conductor to be tested, other conductors in the substation and the contactless sensor, all of which are 3×3 in size, so there are 18 unknown coupling coefficients in total. and They are respectively the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured.

[0047] Calculate using the following formula (2):

[0048] in, It is the transient electric field signal of the three-phase non-contact sensor during the transient process of circuit breaker closing. The busbar power frequency steady-state voltage waveform provided for the voltage transformer.

[0049] The derivation of formula (2) is as follows: the electric field signal output by the three-phase non-contact sensor is It includes four components, namely, the power frequency and transient voltage of the conductor to be tested and other conductors. If the influence of the difference between the wave impedance of other conductors and the measured line and the line length is ignored, and it is assumed that the transient voltage amplitude caused by the closing of the measured line and other lines is the same, in this case, the lower limit of the transient voltage component of the three-phase conductor to be tested is estimated, and the electric field signal is as follows (3): (3) Transpose the terms in formula (3) to obtain formula (2).

[0050] Calculate using formula (4): (4) The derivation of formula (4) is as follows. If it is assumed that during the closing process, the voltage of other lines in the substation is not affected by the transient voltage component of the measured line and maintains a steady state at the power frequency, the transient change of the electric field signal output by the non-contact sensor is mainly contributed by the transient component of the measured line. In this case, the upper limit of the transient voltage component of the measured conductor is estimated, and the electric field signal is as shown in formula (5): (5) Transpose the terms in equation (5) to obtain equation (4).

[0051] It should be noted that Contains different frequency components of the transient process, so for Time series of sampling points , we can construct independent equations, only the sampling points of the transient process need to be guaranteed Then we can realize formula (1) , Stable calculation.

[0052] After constructing the optimization problem, the optimization problem is solved by the optimization algorithm to obtain the coupling coefficient matrix.

[0053] Optionally, the optimization algorithm includes but is not limited to global optimization algorithms such as sequence quadratic program (SQP) algorithm, genetic algorithm, simulated annealing algorithm, L-BFGS algorithm, particle swarm algorithm, genetic algorithm, and local optimization algorithms such as quasi-Newton algorithm, conjugate gradient method, gradient descent method, etc., which can realize partial functions.

[0054] In some embodiments, step 1102 specifically includes: Step 11021, setting constraint conditions based on the electric field signal waveform and the bus voltage signal waveform; Step 11022, based on the theoretical lower and upper limits of the transient voltage offset of the three-phase conductor to be measured and the constraint conditions, construct an optimization problem for solving the coupling coefficient matrix.

[0055] In order to avoid the result of formula (1) only satisfying or =0, should be , Add constraints. The constraints of formula (1) are:

[0056] in, is the background electric field signal, is the steady-state electric field signal.

[0057] In some embodiments, step 110 specifically includes: Step 1104, if the switch operation performed on the three-phase conductor to be tested is to cut off the conductor to be tested from the bus, construct an optimization problem for solving the coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform; Step 1105, solving the optimization problem by using an optimization algorithm to obtain a coupling coefficient matrix.

[0058] For the transient process of the opening of the switch, since the three-phase conductor to be tested no longer has the power frequency voltage component after the opening of the switch, the form of the optimization problem is different from equation (1), as shown in the following equation:

[0059] After the optimization problem is constructed, the optimization problem is solved by the optimization algorithm to obtain the coupling coefficient matrix.

[0060] In some embodiments, step 1103 or step 1105 specifically includes: The optimization problem is solved by sequential quadratic programming algorithm.

[0061] The constructed optimization problem is solved by using the sequential quadratic programming (SQP) algorithm. The SQP algorithm has significant advantages in dealing with nonlinear optimization problems, including good convergence and effective handling of constraints. In addition, the SQP algorithm can use quadratic approximation in each iteration, thereby improving computational efficiency and accuracy.

[0062] Although the SQP algorithm is given priority in this study, the optimization problem can also be solved by a variety of other methods, such as genetic algorithm or particle swarm optimization, which can be adjusted according to the characteristics of measured data and the constraints in actual engineering.

[0063] In some embodiments, the three-phase non-contact sensor is arranged at a side of the three-phase conductor circuit breaker to be tested close to the line.

[0064] Figure 5 Schematic diagram of the arrangement of the three-phase non-contact sensor in the substation provided by the embodiment of the present application, such as Figure 5 As shown, the three-phase non-contact sensors are respectively arranged at one side of the three-phase conductor circuit breaker to be tested close to the line.

[0065] Figure 6 is a schematic diagram of the structure of a non-contact measuring device for three-phase conductor voltage provided in an embodiment of the present application, such as Figure 6 As shown, the device includes an acquisition module 610, a first calculation module 620 and a second calculation module 630, wherein: The acquisition module 610 is used to respectively use a three-phase non-contact sensor and a voltage transformer to obtain an electric field signal waveform and a bus voltage signal waveform before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; A first calculation module 620 is used to calculate a coupling coefficient matrix based on the electric field signal waveform and the voltage signal waveform, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase wire to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other wires and the three-phase contactless sensor; The second calculation module 630 is used to calculate the voltage waveform of the transient process of the three-phase conductor to be measured based on the electric field signal waveform and the coupling coefficient matrix.

[0066] It should be understood that the above-mentioned device is used to execute the method in the above-mentioned embodiment. The implementation principle and technical effect of the corresponding program module in the device are similar to those described in the above-mentioned method. The working process of the device can refer to the corresponding process in the above-mentioned method, which will not be repeated here.

[0067] Based on the method in the above embodiment, Figure 7 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 7 As shown, an embodiment of the present application provides an electronic device, which may include: a processor 710, a communication interface 720, a memory 730 and a communication bus 740, wherein the processor 710, the communication interface 720, and the memory 730 communicate with each other through the communication bus 740. The processor 710 may call the logic instructions in the memory 730 to execute the non-contact measurement method of the three-phase conductor voltage in the above embodiment.

[0068] In addition, the logic instructions in the above-mentioned memory 730 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the non-contact measurement method of the three-phase conductor voltage described in each embodiment of the present application.

[0069] Based on the method in the above embodiment, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the non-contact measurement method of the three-phase wire voltage in the above embodiment.

[0070] Based on the method in the above embodiment, an embodiment of the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the non-contact measurement method for the three-phase conductor voltage in the above embodiment.

[0071] It is understandable that the processor in the embodiment of the present application may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor.

[0072] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, and the software modules can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an ASIC.

[0073] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions may be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid state disk (SSD)), etc.

[0074] It should be understood that the various numerical numbers involved in the embodiments of the present application are only used for the convenience of description and are not used to limit the scope of the embodiments of the present application.

[0075] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A non-contact measurement method for three-phase conductor voltage, characterized in that: include: Using a three-phase non-contact sensor and a voltage transformer respectively, an electric field signal waveform and a bus voltage signal waveform are obtained before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; Based on the electric field signal waveform and the bus voltage signal waveform, a coupling coefficient matrix is ​​calculated, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase conductor to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other conductors and the three-phase contactless sensor; Based on the electric field signal waveform and the coupling coefficient matrix, the voltage waveform of the transient process of the three-phase conductor to be measured is calculated.

2. The non-contact measurement method of three-phase conductor voltage according to claim 1, characterized in that: The calculating of the coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform comprises: If the switch operation performed on the three-phase conductor to be tested is that the conductor to be tested is put into bus operation, based on the electric field signal waveform and the bus voltage signal waveform, the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be tested are calculated; Based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured, an optimization problem for solving the coupling coefficient matrix is ​​constructed; The optimization problem is solved by an optimization algorithm to obtain a coupling coefficient matrix.

3. The non-contact measurement method of three-phase conductor voltage according to claim 2, characterized in that: The optimization problem of solving the coupling coefficient matrix is ​​constructed based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured, including: Setting constraint conditions based on the electric field signal waveform and the bus voltage signal waveform; Based on the theoretical lower limit and upper limit of the transient voltage offset of the three-phase conductor to be measured and the constraint conditions, an optimization problem for solving the coupling coefficient matrix is ​​constructed.

4. The non-contact measurement method of three-phase conductor voltage according to claim 1, characterized in that: The calculating of the coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform comprises: If the switch operation performed on the three-phase conductor to be tested is that the conductor to be tested is cut off from the bus, an optimization problem for solving a coupling coefficient matrix is ​​constructed based on the electric field signal waveform and the bus voltage signal waveform; The optimization problem is solved by an optimization algorithm to obtain a coupling coefficient matrix.

5. The non-contact measurement method of three-phase conductor voltage according to claim 2 or 4, characterized in that: The optimization problem is solved by an optimization algorithm to obtain a coupling coefficient matrix, including: The optimization problem is solved by a sequential quadratic programming algorithm.

6. The non-contact measurement method of three-phase conductor voltage according to claim 1, characterized in that: The three-phase non-contact sensor is arranged at one side of the three-phase conductor circuit breaker to be tested close to the line.

7. A non-contact measuring device for three-phase conductor voltage, characterized in that: include: An acquisition module is used to respectively use a three-phase non-contact sensor and a voltage transformer to obtain an electric field signal waveform and a bus voltage signal waveform before and after a switch operation is performed on the three-phase conductor to be tested, wherein the switch operation is to put the conductor to be tested into operation on the bus or to cut it off from the bus; A first calculation module is used to calculate a coupling coefficient matrix based on the electric field signal waveform and the bus voltage signal waveform, wherein the coupling coefficient matrix includes a coupling coefficient matrix between the three-phase conductor to be measured and the three-phase contactless sensor, and a coupling coefficient matrix between other conductors and the three-phase contactless sensor; The second calculation module is used to calculate the voltage waveform of the transient process of the three-phase conductor to be measured based on the electric field signal waveform and the coupling coefficient matrix.

8. An electronic device, characterized in that: include: at least one memory for storing a computer program; At least one processor is used to execute the program stored in the memory. When the program stored in the memory is executed, the processor is used to execute the non-contact measurement method for three-phase conductor voltage according to any one of claims 1-6.

9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program runs on a processor, the processor is enabled to execute the non-contact measurement method for three-phase conductor voltage according to any one of claims 1 to 6.

10. A computer program product, characterized in that When the computer program product runs on a processor, the processor is enabled to execute the non-contact measurement method for three-phase conductor voltage according to any one of claims 1 to 6.

Images