A high and low temperature test device for optical modules and a method of using the same

Abstract

The application discloses a kind of for optical module high-low temperature test equipment and its use method, belong to optical module test technical field, by supporting assembly drive push and press assembly to move down and contact with storage board, compression ring is pressed after will be driven by multiple slide bars to move up to inclined block, because the inclined surface portion of inclined block is contacted in locking assembly roller, roller can drive carriage to slide in second slide hole, carriage drives locating plate to be close to optical module, four locating plates are synchronously moved, so that four locating plates can push optical module to the center position of support table, realize the purpose of optical module center calibration, make the test assembly in fixed seat and the port at the top of optical module correspond, with locating plate continuously closing, optical module can be locked, cooperate test jumper to move down and contact with the port at the top of optical module to test optical module, so that effectively correct the deviation of optical module, prevent the deviation of fixed point of optical module to affect test precision.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of optical module testing, in particular to an optical module high-low temperature testing device and a method thereof. BACKGROUND

[0002] In mobile communication core network and access network construction, networking and other mobile telecommunication services, mobile communication optical modules are important devices used in optical fiber communication systems, mainly used for realizing optical-electric conversion and electric-optical conversion functions, playing a crucial role in the entire optical network, and capable of converting electrical signals into optical signals for long-distance transmission, or converting received optical signals back into electrical signals to complete information decoding.

[0003] Mobile communication optical module high-low temperature testing is an important means to evaluate the performance of optical modules in high-low temperature environments to ensure their stability and reliability in high-low temperature conditions. When testing optical modules, the optical modules need to be heated or cooled to the target temperature for testing. After testing is completed, the next optical module needs to be heated or cooled to start testing. The preheating time is long, and only one product can be tested at a time. This repeated operation makes the utilization rate and testing efficiency of the high-low temperature test box low. Moreover, during the testing process, test jumpers need to be inserted into the ports on the optical modules to obtain data. To improve testing accuracy, fixtures are used to lock them. However, for batch optical module testing, frequent disassembly and assembly procedures increase work intensity and reduce the efficiency of the entire testing process. Moreover, during the locking process, it is difficult to achieve the purpose of correcting the optical modules, resulting in a certain deviation of the fixed points of each optical module, which affects testing accuracy and also easily causes damage to the optical modules or jumper end faces. SUMMARY

[0004] The present application aims to provide an optical module high-low temperature testing device and a method thereof to solve the problems of long preheating time of the optical module body surface, only one product testing at a time, repeated operation, low utilization rate and testing efficiency of the high-low temperature test box, frequent disassembly and assembly procedures increasing work intensity and reducing the efficiency of the entire testing process, and difficulty in achieving the purpose of correcting the optical modules during the locking process, resulting in a certain deviation of the fixed points of each optical module and affecting testing accuracy.

[0005] To achieve the above-mentioned purpose, the present application provides the following technical solutions:

[0006] The utility model provides a kind of high-low temperature test equipment for optical module, including high-low temperature test box, the two sides of the high-low temperature test box are respectively opened with access hole, the bottom of the inner wall of the high-low temperature test box is installed with workstation, the top of the high-low temperature test box is installed with control panel and TEC temperature control device, the high-low temperature test box is equipped with several support assemblies, the fixedly connected with fixed seat on the support assembly, several fixed seats are fixedly connected with top plate, the top plate is fixedly connected with multistage electric hydraulic rod, the top of the multistage electric hydraulic rod is fixed with the top of the inner wall of high-low temperature test box, the bottom of the support assembly is installed with push assembly, the top of the push assembly is connected with four locking assemblies, the locking assembly penetrates the inside of support assembly, test assembly is equipped between four locking assemblies, and the test assembly is installed in fixed seat;

[0007] The two sides of the workstation are respectively connected with the article board, the article board is provided with the support assembly position on the corresponding support assembly position, the article board is provided with the temperature sensing module on the support assembly position, the middle portion of the two article boards and the side of the two article boards away from each other are respectively provided with the sealing plate, the two sealing plates are respectively installed in the access hole on the two sides of the high-low temperature test box, and the bottom of the two article boards is provided with the adjusting assembly.

[0008] As a further scheme of the utility model, the support assembly includes an annular cylinder, the bottom of the annular cylinder is provided with four first sliding holes, the push assembly penetrates and slides in the four first sliding holes, the top of the inner wall of the annular cylinder is provided with a plurality of rolling rods corresponding to the position of the first sliding hole, the bottom of the rolling rod is overlapped with the top of the locking assembly, the inner wall of the annular cylinder is provided with four limiting holes and four second sliding holes, and the locking assembly penetrates and slides in the limiting hole and the second sliding hole.

[0009] As a further scheme of the utility model, the push assembly includes a compression ring, the compression ring is fixedly connected with four sliding rods, the sliding rod is slidingly connected in the first sliding hole, the top of the sliding rod is fixedly connected with an inclined block, and the top of the inclined block is overlapped with the locking assembly.

[0010] As a further scheme of the utility model, the locking assembly includes a positioning plate, the inner wall of the positioning plate is provided with anti-skid lines, the outer wall of the positioning plate is fixedly provided with a sliding carriage, the sliding carriage penetrates and slides in the second sliding hole, the bottom end of the sliding carriage is installed with a rolling wheel, the rolling wheel is overlapped with the inclined surface part of the inclined block, the sliding carriage and the inner wall of the annular cylinder are fixedly connected with a first spring, two limiting rods are fixedly arranged below the outer wall of the positioning plate, and the limiting rod is slidingly connected in the limiting hole.

[0011] As a further scheme of the present application, the test assembly comprises a sensor mounted on the top of the inner wall of the fixing seat, the bottom of the sensor is inserted with a test jumper wire, the test jumper wire is externally provided with a partition plate, the partition plate is slidingly connected in the fixing seat, and a second spring is mounted between the partition plate and the sensor.

[0012] As a further scheme of the present application, the adjusting assembly comprises a motor, a screw rod is fixed on the output shaft of the motor, the screw rod is mounted in the workbench, two nuts are respectively threadedly connected on the two sides of the screw rod, and the top of the nut is fixedly connected with the bottom of the placing plate.

[0013] As a further scheme of the present application, the bottom of the placing plate is fixedly connected with two sliding blocks, two sliding channels and two sliding grooves are formed in the workbench, the nut is slidingly connected in the sliding channel, the sliding block is slidingly connected in the sliding groove, universal wheels are respectively mounted at the four corners of the bottom of the high-low temperature test box, and a glass window is mounted on one side of the high-low temperature test box.

[0014] A use method of the high-low temperature test equipment for optical modules, the use method comprises the following steps:

[0015] When the high-low temperature test is performed on the optical module, the optical module is placed on the support table on the placing plate, so that the position of the optical module is subsequently corrected, then the motor is controlled to work to drive the screw rod to rotate, the screw rod drives the two nuts to slide in the sliding channel during the rotation, the two nuts drive the two placing plates to move on the workbench, the placing plate with the optical module is moved into the high-low temperature test box, the other placing plate and the upper sealing plate are moved out of the access hole of the high-low temperature test box, the sealing plate in the middle of the two placing plates can seal one of the access holes, the sealing plate above the placing plate with the optical module seals the access hole on the other side of the high-low temperature test box, so that the high-low temperature test box is closed, and the subsequent test effect is improved.

[0016] After the optical module is moved to the high-low temperature test box, and the test assembly is located above the plurality of optical modules, the high-low temperature test box can heat, cool and detect the temperature of the optical module through the TEC temperature control device, ensure the temperature in the high-low temperature test box, and the control panel has a temperature display function, ensure that the temperature in the high-low temperature test box meets the standard, control the extension of the multi-stage electric hydraulic rod to drive the top plate to move downward, the top plate drives the test assembly to move downward through the four fixed seats, the fixed seat drives the push assembly to move downward and contact with the storage plate through the support assembly, at this time the optical module is located in the annular barrel, the compression ring in the push assembly is pressed and moves the inclined block upward through the plurality of slide rods, because the inclined surface of the inclined block contacts the roller in the locking assembly, the roller can drive the sliding frame to slide in the second sliding hole during the extrusion of the roller, the sliding frame drives the positioning plate to approach the optical module, the four positioning plates move synchronously, so that the four positioning plates can push the optical module to the center position of the support table, achieving the purpose of centering the optical module, the test assembly in the fixed seat corresponds to the port at the top of the optical module, and the optical module can be locked by continuously closing the positioning plate.

[0017] During the downward movement of the annular barrel in the support assembly, the fixed seat drives the test jumper to move downward and contact with the port at the top of the optical module through the sensor, the test jumper can drive the partition plate to move upward and extrude the second spring after being pressed, and the test jumper can slide in the port at the bottom of the sensor, the partition plate is elastically supported by the elastic force of the second spring, which can provide a downward supporting force for the partition plate and the test jumper, buffer the test jumper, enable the test jumper to be stably inserted into the optical module for testing, and prevent the test jumper from being damaged by hard contact with the optical module. Test data is transmitted to the control panel through the sensor for external regulation and analysis of the high-low temperature test box.

[0018] After completing the test work of the optical module on one of the storage plates, the optical module is placed on the storage plate outside the high-low temperature test box in advance, the multi-stage electric hydraulic rod is retracted, and the plurality of fixed seats are moved upward through the top plate, the fixed seat drives the push assembly to move upward through the support assembly, when the compression ring in the push assembly moves away from the storage plate, the sliding frame is supported by the elastic force of the first spring, the sliding frame drives the positioning plate to move away from the optical module, and the four positioning plates move synchronously to release the locking state of the optical module.

[0019] The motor is controlled to work to drive the screw rod to rotate, and the two nuts drive the two storage plates to move, one of the storage plates can move the optical module after test out of the high-low temperature test box, and the other storage plate moves the optical module to be tested into the high-low temperature test box, so that the purpose of continuous test of batch optical modules is realized, and when the optical module after test and the optical module to be tested are switched, the adjacent two sealing plates on the storage plate can seal the access holes on the two sides of the high-low temperature test box, so that the heat inside the high-low temperature test box is prevented from dissipating too fast.

[0020] Compared with the prior art, the beneficial effects of the present application are:

[0021] 1、The optical module is moved to the high-low temperature test box, and the high-low temperature test box can heat the optical module when working, the multi-stage electric hydraulic rod is controlled to extend to drive the top plate to move downward, the top plate drives the test assembly to move downward through the four fixing seats, the fixing seat drives the push assembly to move downward and contact with the storage plate through the support assembly, at this time the optical module is located in the annular barrel, the compression ring in the push assembly is pressed to drive the inclined block to move upward through the plurality of slide rods, the inclined block is in contact with the roller in the locking assembly through the inclined surface part, the roller can drive the sliding frame to slide in the second sliding hole in the process of extruding the roller, the sliding frame drives the positioning plate to approach the optical module, the four positioning plates are synchronously moved to drive the four positioning plates to push the optical module to the center position of the supporting table, the purpose of centering the optical module is achieved, the test assembly in the fixing seat corresponds to the port at the top of the optical module, and the optical module can be locked by continuously closing the positioning plate, and the test jumper is lowered and contacts the port at the top of the optical module to test the optical module, so that the optical module is effectively corrected, and deviation of the fixing point of the optical module is prevented to affect test accuracy.

[0022] 2、The motor is controlled to work to drive the screw rod to rotate, and the two nuts drive the two storage plates and the plurality of sealing plates to move, one of the storage plates can move the optical module after test out of the high-low temperature test box, and the other storage plate moves the optical module to be tested into the high-low temperature test box, so that the purpose of continuous test of batch optical modules is realized, and when the optical module after test and the optical module to be tested are switched, the adjacent two sealing plates on the storage plate can seal the access holes on the two sides of the high-low temperature test box, so that the heat inside the high-low temperature test box is prevented from dissipating too fast to affect the heating speed of the optical module, and the test efficiency is improved.

[0023] 3、The application drives the test jumper to move down and contact the port on the top of the optical module through the sensor, the test jumper can drive the partition to move up and extrude the second spring after being pressed, and the test jumper can slide in the port at the bottom of the sensor, the partition is elastically supported by the elastic force of the second spring, a downward supporting force is provided for the partition and the test jumper, the test jumper is buffered, the test jumper can be stably inserted into the optical module for testing, and meanwhile, the test jumper is prevented from being damaged by hard contact with the optical module.

[0024] 4、The application drives the multiple fixed seats to move up through the top plate by controlling the multiple-stage electric hydraulic rods to contract, drives the push-and-press assembly to move up through the support assembly, supports the slide rail through the elastic force of the first spring when the pressing ring in the push-and-press assembly is away from the object plate, drives the positioning plate to be away from the optical module, the four positioning plates are synchronously moved, and thus the locking state of all the optical modules on the object plate is conveniently released, manual assistance is not needed for operation, and operation convenience is improved. BRIEF DESCRIPTION OF DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiment description. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative effort on the basis of these drawings.

[0026] Figure 1 It is a three-dimensional structural schematic view of the application.

[0027] Figure 2 It is a partial bottom view structural schematic view of the application.

[0028] Figure 3 It is a structural schematic view of the workbench and the object plate connection of the application.

[0029] Figure 4 It is a structural schematic view of the workbench section of the application.

[0030] Figure 5 It is a structural schematic view of the fixed seat and the top plate connection of the application.

[0031] Figure 6 It is a structural schematic view of the support assembly and the fixed seat connection of the application.

[0032] Figure 7 It is a structural schematic view of the push-and-press assembly of the application.

[0033] Figure 8 It is a structural schematic view of the locking assembly of the application.

[0034] Figure 9The structural schematic diagram of the test assembly of the present application is shown in the figure.

[0035] Figure 10 The structural schematic diagram of the support assembly profile of the present application is shown in the figure.

[0036] In the figure, the components represented by each number are listed as follows:

[0037] 1. High-low temperature test box; 2. Access hole; 3. Workbench; 4. Control panel; 5. Support assembly; 501. Annular cylinder; 502. First sliding hole; 503. Roll bar; 504. Second sliding hole; 505. Limiting hole; 6. Fixed seat; 7. Top plate; 8. Multi-stage electric hydraulic rod; 9. Pushing and pressing assembly; 901. Pressing ring; 902. Slide bar; 903. Inclined block; 10. Locking assembly; 101. Positioning plate; 102. Slide carriage; 103. Roller; 104. First spring; 105. Limiting rod; 11. Test assembly; 111. Sensor; 112. Test jumper wire; 113. Partition; 114. Second spring; 12. Storage plate; 13. Support table; 14. Sealing plate; 15. Slide block; 16. Slide way; 17. Slide groove; 18. Adjusting assembly; 181. Motor; 182. Screw rod; 183. Nut; 19. Universal wheel; 20. TEC temperature control device; 21. Temperature sensing module; 22. Glass window. DETAILED DESCRIPTION

[0038] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work are within the protection scope of the present application.

[0039] Please refer to Figures 1-10 The present application provides a technical solution:

[0040] The utility model provides a kind of for optical module high-low temperature test equipment, including high-low temperature test box 1, high-low temperature test box 1 two sides are respectively opened with access hole 2, the bottom of the inner wall of high-low temperature test box 1 is installed with workstation 3, the top of high-low temperature test box 1 is installed with control panel 4 and TEC temperature control device 20, high-low temperature test box 1 is equipped with several support assemblies 5, support assembly 5 is fixedly connected with fixed seat 6 on, several fixed seat 6 are fixedly connected with top plate 7, top plate 7 is fixedly connected with multistage electric hydraulic rod 8, the top of multistage electric hydraulic rod 8 is fixed with the top of the inner wall of high-low temperature test box 1, the bottom of support assembly 5 is installed with push and press assembly 9, the top of push and press assembly 9 is connected with four locking assemblies 10, locking assembly 10 penetrates the inside of support assembly 5, four locking assemblies 10 are equipped with test assembly 11 between, test assembly 11 is installed in fixed seat 6, push and press assembly 9 is pushed up and down to drive locking assembly 10 horizontal movement clamping optical module, and then test assembly 11 carries out test operation to optical module.

[0041] As a further scheme of the utility model, support assembly 5 includes annular cylinder 501, four first sliding holes 502 are formed in the bottom of annular cylinder 501, push and press assembly 9 includes pressing ring 901, four slide rods 902 are fixedly connected on pressing ring 901, slide rod 902 is slidingly connected in first sliding hole 502, the top of slide rod 902 is fixedly connected with inclined block 903;Several roller rods 503 are arranged on the top of the inner wall of annular cylinder 501 corresponding to the position of first sliding hole 502, four limiting holes 505 and four second sliding holes 504 are formed in the inner wall of annular cylinder 501, locking assembly 10 penetrates and slides in limiting hole 505 and second sliding hole 504;Locking assembly 10 includes positioning plate 101, anti-skid lines are arranged on the inner wall of positioning plate 101, L-shaped slide 102 is fixed on the outer wall of positioning plate 101, slide 102 penetrates and slides in second sliding hole 504, roller 103 is installed on the bottom end of slide 102, roller 103 is overlapped with the inclined surface part of inclined block 903;First spring 104 is fixedly connected between slide 102 and the inner wall of annular cylinder 501, two limiting rods 105 are fixed below the outer wall of positioning plate 101, limiting rod 105 is slidingly connected in limiting hole 505, the bottom of roller rod 503 is overlapped with the top of slide 102.

[0042] When working, the compression ring 901 is pressed and moves the inclined block 903 upward through the plurality of slide rods 902, because the inclined surface of the inclined block 903 is in contact with the roller 103 in the locking assembly 10, the inclined surface of the inclined block 903 is in contact with the roller 103, when the inclined block 903 moves upward, the roller 103 can roll on the inclined block 903, thereby reducing the friction generated when the roller 103 drives the slide 102 to move; during the extrusion of the roller 103, the roller 103 can drive the slide 102 to slide in the second sliding hole 504, and the force transmission direction is changed to facilitate the horizontal adjustment of the positioning plate 101 to realize the positioning locking or unlocking of the optical module; during the movement of the positioning plate 101, the limiting rod 105 can slide in the limiting hole 505, which can support and limit the positioning plate 101, thereby improving the stability of the horizontal movement of the positioning plate 101.

[0043] The roller 503 is installed on the top of the inner wall of the annular barrel 501, and can move at the bottom of the roller 503 during the movement of the slide 102, thereby reducing the friction generated when the slide 102 moves, and cooperating with the second sliding hole 504 to limit the positioning plate 101, thereby improving the stability of the horizontal movement of the locking assembly 10.

[0044] When the compression ring 901 in the push and press assembly 9 moves away from the placement plate 12, the slide 102 is supported by the elastic force of the first spring 104, so that the slide 102 drives the positioning plate 101 to move away from the optical module, and the four positioning plates 101 move synchronously, thereby facilitating the unlocking of the optical module.

[0045] As a further scheme of the present application, the test assembly 11 comprises a sensor 111 installed on the top of the inner wall of the fixed seat 6, a test jumper 112 is inserted into the bottom of the sensor 111, a partition plate 113 is provided outside the test jumper 112, the partition plate 113 is slidably connected inside the fixed seat 6 and can slide up and down, and a second spring 114 is installed between the partition plate 113 and the sensor 111. The test jumper 112 can slide in the port at the bottom of the sensor 111, and the partition plate 113 is elastically supported by the elastic force of the second spring 114, which can provide a downward supporting force to the partition plate 113 and the test jumper 112, thereby buffering the test jumper 112 and preventing the test jumper 112 from being damaged by hard contact with the optical module.

[0046] As a further scheme of the present application, the two sides of the workbench 3 are respectively connected with the storage plates 12, the storage plates 12 are provided with the supporting assemblies 5, the supporting assemblies 5 are provided with the temperature sensing modules 21, the middle parts of the two storage plates 12 and the sides of the two storage plates 12 away from each other are respectively provided with the sealing plates 14, the two sealing plates 14 are respectively installed in the access holes 2 on the two sides of the high-low temperature test box 1, the bottoms of the two storage plates 12 are provided with the adjusting assemblies 18, and the adjusting assemblies 18 are installed in the workbench 3. The locking assemblies 10 are synchronously moved to push the optical module to the center position of the supporting assembly 13, the center calibration of the optical module is realized, the test assembly 11 corresponds to the port on the top of the optical module, the optical module is locked by continuously closing the four locking assemblies 10, and the stability of the optical module test is improved.

[0047] The adjusting assembly 18 comprises a motor 181, a screw rod 182 fixed on the output shaft of the motor 181, the screw rod 182 is installed in the workbench 3, two nuts 183 are respectively screwed on the two sides of the screw rod 182, and the tops of the nuts 183 are fixedly connected with the bottoms of the storage plates 12. The bottoms of the storage plates 12 are respectively fixedly connected with the sliding blocks 15, the workbench 3 is provided with two sliding channels 16 and two sliding grooves 17, the nuts 183 are slidably connected in the sliding channels 16, the sliding blocks 15 are slidably connected in the sliding grooves 17, universal wheels 19 are respectively installed at the four corners of the bottom of the high-low temperature test box 1, and a glass window 22 is installed on one side of the high-low temperature test box 1. The glass window 22 is arranged to observe the internal condition of the high-low temperature test box 1.

[0048] The screw rod 182 rotates to drive the two nuts 183 to slide in the sliding channels 16, the two nuts 183 drive the two storage plates 12 to move on the workbench 3, so that the position of the optical module on the storage plate 12 can be adjusted, and the optical module is convenient to take and place. The sliding grooves 17 limit the sliding blocks 15, the sliding blocks 15 are T-shaped, the stability of the horizontal movement of the storage plates 12 is improved, the sliding channels 16 limit the nuts 183, the nuts 183 do not rotate synchronously during the rotation of the screw rod 182, the position of the nuts 183 is convenient to adjust, and the universal wheels 19 are convenient to transfer the test equipment.

[0049] A use method of the high-low temperature test equipment for the optical module, the use method comprises the following steps:

[0050] When the high and low temperature test is carried out on the optical module, the optical module is placed on the support table 13 on the storage plate 12, so as to facilitate the subsequent deviation correction of the optical module, and then the motor 181 is controlled to work to drive the screw rod 182 to rotate. The screw rod 182 rotates to drive the two nuts 183 to slide in the slide 16, and the two nuts 183 drive the two storage plates 12 to move on the workbench 3. The storage plate 12 on which the optical module is placed moves into the high and low temperature test box 1, and the other storage plate 12 and the upper sealing plate 14 move out of the access hole 2 of the high and low temperature test box 1, so that the sealing plate 14 in the middle of the two storage plates 12 can seal one of the access holes 2, and the sealing plate 14 above the storage plate 12 on which the optical module is placed seals the access hole 2 on the other side of the high and low temperature test box 1, so as to realize the purpose of closing the high and low temperature test box 1, which is beneficial to improve the subsequent test effect.

[0051] After the optical module is moved to the high and low temperature test box 1, and the test assembly 11 is located above the plurality of optical modules, the high and low temperature test box 1 can heat, cool and detect the temperature of the optical module through the TEC temperature control device 20, so as to ensure the temperature in the high and low temperature test box 1. The control panel 4 has a temperature display function, so as to ensure that the temperature in the high and low temperature test box 1 meets the standard. By controlling the multi-stage electric hydraulic rod 8 to elongate, the top plate 7 is driven to move downward, and the test assembly 11 is driven to move downward by the four fixed seats 6. The fixed seat 6 drives the push assembly 9 to move downward and contact the storage plate 12 through the support assembly 5. At this time, the optical module is located in the annular barrel 501, and the pressure ring 901 in the push assembly 9 is pressed to drive the inclined block 903 to move upward through the plurality of slide rods 902. Because the inclined surface part of the inclined block 903 contacts the roller 103 in the locking assembly 10, the roller 103 can drive the sliding frame 102 to slide in the second slide hole 504 in the process of extruding the roller 103. The sliding frame 102 drives the positioning plate 101 to approach the optical module, and the four positioning plates 101 move synchronously, so that the four positioning plates 101 can push the optical module to the center position of the support table 13, so as to realize the purpose of centering the optical module. The test assembly 11 in the fixed seat 6 corresponds to the port at the top of the optical module, and the optical module can be locked by continuously closing the positioning plate 101.

[0052] In the process of the annular cylinder 501 in the support assembly 5 moving down, the fixed seat 6 drives the test jumper 112 to move down and contact the port at the top of the optical module through the sensor 111, the test jumper 112 can drive the partition plate 113 to move up and extrude the second spring 114 after being pressed, and the test jumper 112 can slide in the port at the bottom of the sensor 111, the partition plate 113 is elastically supported by the elastic force of the second spring 114, which can provide the partition plate 113 and the test jumper 112 with a downward supporting force, buffer the test jumper 112, make the test jumper 112 be able to be stably inserted into the optical module for testing work, and prevent the test jumper 112 from being damaged by hard contact with the optical module, and the test data is transmitted to the control panel 4 through the sensor 111, so as to be controlled and analyzed outside the high-low temperature test box 1.

[0053] After completing the testing work of the optical module on one of the shelves 12, the optical module is placed on the shelf 12 outside the high-low temperature test box 1 in advance, the multi-stage electric hydraulic rod 8 is controlled to retract and drive the plurality of fixed seats 6 to move up through the top plate 7, the fixed seat 6 drives the push and press assembly 9 to move up through the support assembly 5, when the pressing ring 901 in the push and press assembly 9 moves away from the shelf 12, the slide 102 is supported by the elastic force of the first spring 104, the slide 102 drives the positioning plate 101 to move away from the optical module, the four positioning plates 101 move synchronously, which can release the locking state of the optical module, and the push and press assembly 9 can be adjusted above the sealing plate 14.

[0054] The motor 181 is controlled to work to drive the screw rod 182 to rotate, and the two nuts 183 drive the two shelves 12 to move respectively, one of the shelves 12 can move the optical module after testing out of the high-low temperature test box 1, and the other shelf 12 moves the optical module to be tested into the high-low temperature test box 1, so that the purpose of continuous testing of batch optical modules can be achieved, and when the optical module after testing and the optical module to be tested are switched, the adjacent two sealing plates 14 on the shelf 12 can seal the access hole 2 on both sides of the high-low temperature test box 1, so as to prevent the heat inside the high-low temperature test box 1 from dissipating too fast.

Claims

1. A high-low temperature test device for optical modules, comprising a high-low temperature test box (1), characterized in that: The high-low temperature test box (1) is provided with an inlet and outlet hole (2) on each side, a workbench (3) is installed on the bottom of the inner wall of the high-low temperature test box (1), a control panel (4) and a TEC temperature control device (20) are installed on the top of the high-low temperature test box (1), a plurality of support assemblies (5) are arranged in the high-low temperature test box (1), a fixed seat (6) is fixedly connected to the support assembly (5), a plurality of fixed seats (6) are fixedly connected to the top plate (7), a multi-stage electric hydraulic rod (8) is fixedly connected to the top plate (7), the top end of the multi-stage electric hydraulic rod (8) is fixed to the top of the inner wall of the high-low temperature test box (1), a pushing assembly (9) is installed at the bottom of the support assembly (5), four locking assemblies (10) are connected to the top end of the pushing assembly (9), the locking assembly (10) penetrates through the inner side of the support assembly (5), a test assembly (11) is arranged between the four locking assemblies (10), and the test assembly (11) is installed in the fixed seat (6). The workbench (3) is provided with a storage plate (12) on each side, the storage plate (12) is provided with a supporting table (13) at a position corresponding to the support assembly (5), the supporting table (13) is provided with a temperature sensing module (21), the middle part of each storage plate (12) and the side of each storage plate (12) away from each other are respectively provided with an enclosing plate (14), and the two enclosing plates (14) are respectively installed in the inlet and outlet holes (2) on the two sides of the high-low temperature test box (1), the bottom of each storage plate (12) is provided with an adjusting assembly (18), and the adjusting assembly (18) is installed in the workbench (3). When the optical module is subjected to high-low temperature test, the optical module is placed on the supporting table (13) of the storage plate (12), the storage plate (12) with the optical module is moved into the high-low temperature test box (1), the other storage plate (12) and the enclosing plate (14) above are moved out of the inlet and outlet holes (2) of the high-low temperature test box (1), so that the enclosing plate (14) in the middle of the two storage plates (12) can seal one of the inlet and outlet holes (2), and the enclosing plate (14) above the storage plate (12) with the optical module can seal the other inlet and outlet hole (2) of the high-low temperature test box (1), so that the high-low temperature test box (1) can be closed, and the subsequent test effect can be improved.

2. The high and low temperature test equipment for optical module according to claim 1, characterized in that: The support assembly (5) comprises an annular cylinder (501), four first sliding holes (502) are formed in the bottom of the annular cylinder (501), the pushing assembly (9) penetrates and slides in the four first sliding holes (502), a plurality of rolling rods (503) are arranged on the top of the inner wall of the annular cylinder (501) and correspond to the first sliding holes (502), the bottom of the rolling rod (503) is overlapped with the top of the locking assembly (10), four limiting holes (505) and four second sliding holes (504) are formed in the inner wall of the annular cylinder (501), and the locking assembly (10) penetrates and slides in the limiting holes (505) and the second sliding holes (504).

3. The high and low temperature test equipment for optical module according to claim 2, characterized in that: The push assembly (9) comprises a pressing ring (901), four slide rods (902) are fixedly connected on the pressing ring (901), the slide rods (902) are slidingly connected in the first sliding hole (502), the top end of the slide rod (902) is fixedly connected with an inclined block (903), and the top of the inclined block (903) is overlapped with the locking assembly (10).

4. The high and low temperature test equipment for optical module according to claim 3, characterized in that: The locking assembly (10) comprises a positioning plate (101), the inner wall of the positioning plate (101) is provided with anti-skid lines, the outer wall of the positioning plate (101) is fixedly provided with a sliding frame (102), the sliding frame (102) penetrates and slides in the second sliding hole (504), the bottom end of the sliding frame (102) is provided with a roller (103), the roller (103) is overlapped with the inclined surface part of the inclined block (903), the first spring (104) is fixedly connected between the sliding frame (102) and the inner wall of the annular barrel (501), two limiting rods (105) are fixedly arranged below the outer wall of the positioning plate (101), and the limiting rods (105) are slidingly connected in the limiting holes (505).

5. The high and low temperature test equipment for optical module according to claim 1, characterized in that: The test assembly (11) comprises a sensor (111), the sensor (111) is arranged at the top of the inner wall of the fixed seat (6), a test jumper (112) is inserted into the bottom of the sensor (111), a partition plate (113) is arranged outside the test jumper (112), the partition plate (113) is slidingly connected in the fixed seat (6), and the second spring (114) is arranged between the partition plate (113) and the sensor (111).

6. The high and low temperature test equipment for optical module according to claim 1, characterized in that: The adjusting assembly (18) comprises a motor (181), a lead screw (182) is fixedly arranged on the output shaft of the motor (181), the lead screw (182) is arranged in the working table (3), and the two sides of the lead screw (182) are respectively threadedly connected with a nut (183).

7. The high and low temperature test equipment for optical module according to claim 6, characterized in that: The two sides of the bottom of the storage plate (12) are respectively fixedly connected with sliding blocks (15), two sliding channels (16) and two sliding grooves (17) are formed in the working table (3), the nut (183) is slidingly connected in the sliding channel (16), the sliding block (15) is slidingly connected in the sliding groove (17), universal wheels (19) are arranged at the four corners of the bottom of the high-low temperature test box (1), and a glass window (22) is arranged on one side of the high-low temperature test box (1).

8. A method for using the high and low temperature test equipment for optical modules according to any one of claims 1-7, characterized in that, The use method comprises the following steps: In the high and low temperature test of the optical module, the optical module is placed on the support table (13) on the storage plate (12) to facilitate the subsequent deviation correction of the optical module. Then the motor (181) is controlled to work to drive the screw rod (182) to rotate. The screw rod (182) drives the two nuts (183) to slide in the slide (16) during rotation. The two nuts (183) drive the two storage plates (12) to move on the workbench (3). The storage plate (12) with the optical module is moved into the high and low temperature test box (1). The other storage plate (12) and the upper sealing plate (14) are moved out of the access hole (2) of the high and low temperature test box (1), so that the sealing plate (14) in the middle of the two storage plates (12) can seal one of the access holes (2). The sealing plate (14) above the storage plate (12) with the optical module seals the access hole (2) on the other side of the high and low temperature test box (1), which can realize the purpose of sealing the high and low temperature test box (1), and is conducive to improving the subsequent test effect. After the optical module is moved to the high and low temperature test box (1), and the test assembly (11) is located above the plurality of optical modules, the high and low temperature test box (1) can heat, cool and temperature detect the optical module through the TEC temperature control device (20), ensure the temperature in the high and low temperature test box (1), and the control panel (4) has temperature display function, ensure the temperature in the high and low temperature test box (1) meets the standard. By controlling the multi-stage electric hydraulic rod (8) to elongate, the top plate (7) is driven to move downward. The top plate (7) drives the test assembly (11) to move downward through the four fixed seats (6). The fixed seat (6) drives the push assembly (9) to move downward and contact with the storage plate (12) through the support assembly (5). At this time, the optical module is located in the annular cylinder (501). The compression ring (901) in the push assembly (9) is pressed and drives the inclined block (903) to move upward through the plurality of slide rods (902). Because the inclined surface of the inclined block (903) contacts with the roller (103) in the locking assembly (10), the roller (103) can drive the sliding frame (102) to slide in the second sliding hole (504) in the process of pressing the roller (103). The sliding frame (102) drives the positioning plate (101) to approach the optical module. The four positioning plates (101) move synchronously, so that the four positioning plates (101) can push the optical module to the center position of the support table (13), realizing the purpose of centering the optical module. The test assembly (11) in the fixed seat (6) corresponds to the port at the top of the optical module. With the continuous closing of the positioning plate (101), the optical module can be locked. In the process of the annular cylinder (501) in the support assembly (5) moving down, the fixed seat (6) drives the test jumper (112) to move down and contact the port at the top of the optical module through the sensor (111), the test jumper (112) can drive the partition plate (113) to move up and press the second spring (114) after being pressed, and the test jumper (112) can slide in the port at the bottom of the sensor (111), the partition plate (113) is elastically supported by the elastic force of the second spring (114), which can provide the partition plate (113) and the test jumper (112) with a downward supporting force, buffers the test jumper (112), and enables the test jumper (112) to be stably inserted into the optical module for testing work, while preventing the test jumper (112) from being damaged by hard contact with the optical module, and the test data is transmitted to the control panel (4) through the sensor (111) for analysis and control outside the high-low temperature test box (1). After completing the test work of the optical module on one of the shelves (12), the optical module is placed on the shelf (12) outside the high-low temperature test box (1) in advance, the multi-stage electric hydraulic rod (8) is retracted, and the plurality of fixed seats (6) are driven to move up by the top plate (7), the fixed seat (6) drives the push assembly (9) to move up by the support assembly (5), when the pressing ring (901) in the push assembly (9) is away from the shelf (12), the slide (102) is supported by the elastic force of the first spring (104), the slide (102) drives the positioning plate (101) to be away from the optical module, and the four positioning plates (101) move synchronously, so that the locking state of the optical module is released, and the push assembly (9) is adjusted above the sealing plate (14). By controlling the motor (181) to work, the screw rod (182) is rotated, and the two nuts (183) drive the two shelves (12) to move, one of the shelves (12) can move the optical module after the test out of the high-low temperature test box (1), and the other shelf (12) moves the optical module to be tested into the high-low temperature test box (1), so that the purpose of continuous testing of a batch of optical modules is achieved, and when the optical module after the test and the optical module to be tested are switched, the adjacent two sealing plates (14) on the shelf (12) can seal the inlet and outlet holes (2) on both sides of the high-low temperature test box (1), so that the heat inside the high-low temperature test box (1) is prevented from dissipating too quickly.

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