Multi-segment impedance wiring structure, preparation method thereof, device, equipment, medium and product

By dividing areas on the circuit board and setting connection lines of different widths, a multi-stage impedance trace structure is formed, which solves the signal reflection problem caused by trace impedance discontinuity and realizes signal integrity.

CN119946978AActive Publication Date: 2025-05-06CHENGDU XINJINBANG TECH CO LTD

Patent Information

Application Number
CN202411942577.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-27
Publication Date
2025-05-06
Estimated Expiration
2044-12-27

AI Technical Summary

Technical Problem

In the prior art, the discontinuity of the trace impedance leads to signal reflection, affecting the integrity of the signal.

Method used

A multi-stage impedance trace structure is adopted, and narrow areas and loose areas are divided on the circuit board, and connecting lines of different widths (first connecting lines and second connecting lines) are set to form a trace structure in which the average impedance of each section of the line is equal to the standard impedance.

Benefits of technology

Maintain the continuity of trace impedance, avoid signal reflection, and ensure signal integrity.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a multi-segment impedance routing structure and a preparation method, device and equipment thereof, a medium and a product, and relates to the technical field of communication, the structure comprises a first connecting line and a second connecting line; the first connecting line is located in a narrow area on the circuit board; the second connecting line is located in a loose area on the circuit board to form a multi-section impedance routing structure; the width of the first connecting line is smaller than that of the second connecting line, and the average impedance of each section of line in the multi-section impedance routing structure is equal to standard impedance; and each section of line comprises the first connecting line and the second connecting line, so that the continuity of wiring impedance can be kept, and the signal integrity is ensured.
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Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a multi-segment impedance routing structure and a preparation method, device, equipment, medium and product thereof. Background Art

[0002] Nowadays, the density of chip packaging is getting higher and higher, and the pad spacing is getting smaller and smaller, which makes it more difficult for the traces on the circuit board to pass through the pad range. Narrowing the width of the trace to pass through the pad is the current processing method, such as Figure 1 As shown, the change of line width will cause the change of trace impedance value. Since the trace impedance value is related to the signal reflection coefficient, and whether the transmitted signal is complete is determined by the signal reflection coefficient, the change of impedance value will cause the reflection coefficient to change. This practice will cause discontinuity of trace impedance, which will cause signal reflection and affect signal integrity. Summary of the invention

[0003] The purpose of the present application is to provide a multi-segment impedance routing structure and its preparation method, device, equipment, medium and product to solve the problem of routing impedance discontinuity affecting signal integrity.

[0004] To achieve the above objectives, this application provides the following solutions.

[0005] In a first aspect, the present application provides a multi-segment impedance routing structure, which is applied to a circuit board, and includes: a first connecting line and a second connecting line.

[0006] The first connecting line is located in a narrow area on the circuit board; the second connecting line is located in a loose area on the circuit board, forming a multi-segment impedance routing structure; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line.

[0007] In a second aspect, the present application provides a method for preparing a multi-segment impedance routing structure, comprising the following steps.

[0008] Based on the spatial position of the circuit board, the circuit board is divided into areas to determine narrow areas and loose areas.

[0009] Based on the pad position on the circuit board, the first connecting line is set in the narrow area, and the second connecting line is set in the loose area to determine the routing path of the multi-segment lines; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line.

[0010] According to the routing path of each section of the line and the spatial position of the circuit board, a final routing path is determined, and a multi-section impedance routing structure is prepared according to the final routing path.

[0011] In a third aspect, the present application provides a device for preparing a multi-segment impedance routing structure, comprising the following modules.

[0012] The area division module is used to divide the circuit board into areas based on the spatial position of the circuit board and determine the narrow area and the loose area.

[0013] A routing path determination module is used to determine the routing paths of multiple segments of lines by arranging a first connecting line in the narrow area and a second connecting line in the loose area based on the pad position on the circuit board; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line.

[0014] The final wiring route determination module is used to determine the final wiring route according to the wiring path of each section of the line and the spatial position of the circuit board.

[0015] A multi-segment impedance routing structure preparation module is used to prepare a multi-segment impedance routing structure according to the final routing path.

[0016] In a fourth aspect, the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method for preparing a multi-segment impedance routing structure described above.

[0017] In a fifth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method for preparing a multi-segment impedance routing structure as described above.

[0018] In a sixth aspect, the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the method for preparing a multi-segment impedance routing structure described in any one of the above.

[0019] According to the specific embodiments provided in this application, this application discloses the following technical effects.

[0020] The present application provides a multi-segment impedance routing structure and a preparation method, device, equipment, medium and product thereof. Based on the spatial position of a circuit board, narrow areas and loose areas are divided to set connecting lines of different widths, namely, a first connecting line and a second connecting line, to form a multi-segment impedance routing structure; wherein the multi-segment impedance routing structure includes a plurality of lines. When setting the first connecting line and the second connecting line, the present application requires that the average impedance of each line segment is equal to the standard impedance. Among them, Γ is the signal reflection coefficient, ZL is the load impedance, which is the average impedance of each line segment here, and Zo is the standard impedance. It can be seen that the signal reflection coefficient of the multi-segment impedance routing structure prepared in the present application is 0, thereby maintaining the continuity of the routing impedance of the multi-segment impedance routing structure of the present application, thereby avoiding signal reflection and ensuring signal integrity. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0022] Figure 1 This is a schematic diagram of the prior art method for narrowing the routing.

[0023] Figure 2 A schematic diagram of a multi-segment impedance routing structure provided in one embodiment of the present application.

[0024] Figure 3 A schematic diagram of another multi-segment impedance routing structure provided in an embodiment of the present application.

[0025] Figure 4 A schematic flow chart of a method for preparing a multi-segment impedance routing structure provided in one embodiment of the present application.

[0026] Figure 5 A schematic diagram of a computer device provided in accordance with an embodiment of the present application. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0028] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0029] In the process of ball grid array (BGA), Figure 1 The method shown is to narrow the width of the trace to cross the pad range. Since the reflection coefficient is as high as 20%, the signal integrity is seriously affected.

[0030] Based on this, the present application provides a multi-segment impedance routing structure, which is applied to a circuit board, and the multi-segment impedance routing structure includes: a first connecting line and a second connecting line; the first connecting line is located in a narrow area of ​​the circuit board; the second connecting line is located in a loose area of ​​the circuit board, forming a multi-segment impedance routing structure, such as Figure 2-Figure 3 As shown; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each line segment in the multi-segment impedance routing structure is equal to the standard impedance; each line segment includes the first connecting line and the second connecting line.

[0031] In an exemplary embodiment, the routing path length of each line segment is less than a critical length; the critical length is determined based on a signal rise time when a radar detection instrument measures the impedance value of each line segment.

[0032] In an exemplary embodiment, the critical length L Critical For: L Critical =T rise / 2; where T rise is the signal rise time.

[0033] In an exemplary embodiment, the critical length is equal to an averaging window of the radar detection instrument.

[0034] In practical applications, a radar detection instrument with a time domain reflectometry (TDR) technique is used to measure the impedance value of a transmission line using an average window. The transmission line is the line of the multi-segment impedance routing structure.

[0035] Within the averaging window, if the average impedance is equal to the characteristic impedance of the transmission line, the continuity of the transmission line can be maintained and the signal integrity can be maintained.

[0036] In an exemplary embodiment, the average impedance Z of each line segment is avg (t) is: Where a is the starting point of each line segment, b is the end point of each line segment, t is the routing path length time of each line segment; Z(t) is the impedance of the routing path length.

[0037] In practical applications, the multi-segment impedance routing structure is not limited to use in narrow pad spacing, but can also be used between vias, etc.

[0038] exist Figure 2 In, t a for Figure 2 The starting time of the multi-segment impedance routing structure shown, t b for Figure 2 The end time of the multi-segment impedance routing structure shown in the figure, a section of the line shown in the multi-segment impedance routing structure includes a first connecting line and a second connecting line connected to each other; the impedance Z1 of the first connecting line is 50Ω, and the impedance of the second connecting line is 30Ω; the standard impedance is 40Ω, therefore, Because Z avg (t) = ZL, therefore, There is no signal reflection and the integrity of the serial number will not be affected during the transmission process.

[0039] exist Figure 3 In, t a’ for Figure 3 The starting time of the multi-segment impedance routing structure shown, t b’ for Figure 3 The end time of the multi-segment impedance routing structure shown in the figure, a section of the line shown in the multi-segment impedance routing structure includes a first connecting line and a second connecting line connected to each other; the impedance Z1 of the first connecting line is 50Ω, and the impedance of the second connecting line is 30Ω; the standard impedance is 40Ω, therefore, Because Z' avg (t) = ZL, a' is Figure 3 The starting point of each line shown, b' is Figure 3 The end point of each line segment shown, therefore, There is no signal reflection and the integrity of the serial number will not be affected during the transmission process.

[0040] The present application uses a multi-segment impedance routing structure in a narrow pad spacing, and uses the multi-segment impedance routing structure within a critical length to reduce impedance discontinuity.

[0041] The present application embodiment provides a method for preparing a multi-segment impedance routing structure, which is executed by a computer device, and can be specifically executed by a computer device such as a terminal or a server alone, or can be executed by a terminal and a server together. In the present application embodiment, Figure 4 As shown, the method includes the following steps.

[0042] S1: Based on the spatial position of the circuit board, the circuit board is divided into regions to determine narrow areas and loose areas.

[0043] S2: Based on the pad positions on the circuit board, the first connecting line is set in the narrow area, and the second connecting line is set in the loose area, and the routing paths of the multi-segment lines are determined; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line. Figure 2-Figure 3 BGA pads shown.

[0044] S3: Determine a final routing path according to the routing path of each line segment and the spatial position of the circuit board.

[0045] S4: preparing a multi-segment impedance routing structure according to the final routing path.

[0046] In practical applications, the first step is to determine the standard impedance Zo of the connecting line according to production requirements.

[0047] Step 2: Design the routing paths for multiple lines based on the pad locations on the circuit board.

[0048] Step 3: Design the final routing path according to the routing paths of multiple lines and the spatial position of the circuit board. The final routing path consists of one or more lines, and the routing path length of each line does not exceed the critical length, ensuring the average impedance Z of the routing path length of each line avg Equal to the standard impedance Zo.

[0049] Therefore, the impedance design method for each line segment is as follows: according to the spatial position of the circuit board, in the narrow part, such as the boundary or between the pad array, the width of the connection line is reduced; in the loose part, the width of the connection line is increased to ensure the average impedance Z of each line segment. avg Equal to the standard impedance Zo.

[0050] Step 4: Complete the line connection according to the final routing path and the impedance design of each line segment, and prepare a multi-segment impedance routing structure.

[0051] Based on the same inventive concept, the embodiment of the present application also provides a device for preparing a multi-segment impedance routing structure for implementing the method for preparing the multi-segment impedance routing structure involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in the embodiments of one or more multi-segment impedance routing structure preparation devices provided below can refer to the limitations of the method for preparing the multi-segment impedance routing structure above, and will not be repeated here.

[0052] In an exemplary embodiment, a device for preparing a multi-segment impedance routing structure is provided, including the following modules.

[0053] The area division module is used to divide the circuit board into areas based on the spatial position of the circuit board and determine the narrow area and the loose area.

[0054] A routing path determination module is used to determine the routing paths of multiple segments of lines by arranging a first connecting line in the narrow area and a second connecting line in the loose area based on the pad position on the circuit board; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line.

[0055] The final wiring route determination module is used to determine the final wiring route according to the wiring path of each section of the line and the spatial position of the circuit board.

[0056] A multi-segment impedance routing structure preparation module is used to prepare a multi-segment impedance routing structure according to the final routing path.

[0057] In an exemplary embodiment, a computer device is provided, such as Figure 5As shown, the computer device can be a server or a terminal. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store preparation data of a multi-segment impedance routing structure. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for preparing a multi-segment impedance routing structure is implemented.

[0058] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the above method is implemented when the processor executes the computer program.

[0059] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, which implements the above method when executed by a processor.

[0060] In an exemplary embodiment, a computer program product is provided, including a computer program, which implements the above method when executed by a processor.

[0061] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ReadOnlyMemory, ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (Magnetoresistive RandomAccess Memory, MRAM), ferroelectric random access memory (Ferroelectric RandomAccess Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory can include random access memory (RandomAccess Memory, RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0062] In this application, all actions to obtain signals, information or data are carried out in compliance with the relevant data protection laws and policies of the country where they are located and with the authorization given by the owner of the corresponding device.

[0063] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0064] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0065] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A multi-segment impedance routing structure, characterized in that: The multi-section impedance routing structure is applied to a circuit board, and the multi-section impedance routing structure comprises: a first connecting line and a second connecting line; The first connecting line is located in a narrow area on the circuit board; the second connecting line is located in a loose area on the circuit board, forming a multi-segment impedance routing structure; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line.

2. The multi-segment impedance routing structure according to claim 1, characterized in that: The routing path length of each section of the line is less than a critical length; the critical length is determined based on a signal rise time when a radar detection instrument measures the impedance value of each section of the line.

3. The multi-segment impedance routing structure according to claim 2, characterized in that: The critical length L Critical for: L Critical =T rise / 2; where T rise is the signal rise time.

4. The multi-segment impedance routing structure according to claim 2, characterized in that: The critical length is equal to the average window of the radar detection instrument.

5. The multi-segment impedance routing structure according to claim 1, characterized in that: The average impedance Z of each line segment avg (t) is: Among them, a is the starting point of each line segment, b is the end point of each line segment; t is the routing path length time of each line segment; Z(t) is the impedance of the routing path length.

6. A method for preparing a multi-segment impedance routing structure, characterized in that: The method for preparing the multi-segment impedance routing structure is applied to the multi-segment impedance routing structure according to any one of claims 1 to 5, and the method for preparing the multi-segment impedance routing structure comprises: Based on the spatial position of the circuit board, the circuit board is divided into regions to determine the narrow area and the loose area; Based on the pad position on the circuit board, the first connecting line is set in the narrow area, and the second connecting line is set in the loose area, and the routing path of the multi-segment line is determined; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line; Determine the final routing path according to the routing path of each line segment and the spatial position of the circuit board; A multi-segment impedance routing structure is prepared according to the final routing path.

7. A device for preparing a multi-segment impedance routing structure, characterized in that: The preparation device of the multi-segment impedance routing structure comprises: The area division module is used to divide the circuit board into areas based on the spatial position of the circuit board to determine the narrow area and the loose area; A routing path determination module, configured to determine the routing paths of multiple segments of lines by arranging the first connecting line in the narrow area and the second connecting line in the loose area based on the pad positions on the circuit board; the width of the first connecting line is smaller than the width of the second connecting line, and the average impedance of each segment of the line in the multi-segment impedance routing structure is equal to the standard impedance; each segment of the line includes the first connecting line and the second connecting line; A final routing route determination module is used to determine the final routing path according to the routing path of each line segment and the spatial position of the circuit board; A multi-segment impedance routing structure preparation module is used to prepare a multi-segment impedance routing structure according to the final routing path.

8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method for preparing the multi-segment impedance routing structure according to claim 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for preparing the multi-segment impedance routing structure described in claim 6 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the method for preparing the multi-segment impedance routing structure described in claim 6 is implemented.

Citation Information

Patent Citations

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