Quartz crystal resonator inspection and marking equipment

Abstract

The present invention relates to a quartz crystal resonator inspection and marking device and process, comprising a first turntable, a second turntable and an exchange station; the first turntable can rotate around its axis and drive multiple suction nozzles to rotate synchronously; along the circumference of the first turntable, there are arranged in sequence: positioning mechanism 1, testing mechanism 1, testing mechanism 2, positioning mechanism 3, and detection mechanism 2; the second turntable can rotate around its axis and drive multiple temporary tables to rotate synchronously; along the circumference of the second turntable, there are arranged in sequence: positioning mechanism 2, marking mechanism, and detection mechanism 1; the exchange station is located directly opposite the first turntable and the second turntable, and is located between testing mechanism 1 and testing mechanism 2, and is located between positioning mechanism 2 and detection mechanism 1; at the exchange station, the suction nozzle releases a quartz crystal resonator to the temporary table and picks up a quartz crystal resonator from the next temporary table. Through the above-mentioned arrangement, the present invention does not require manual intervention, improves production efficiency, and facilitates management.

Description

Technical Field

[0001] The present invention relates to the technical field of quartz crystal resonator processing, in particular to a quartz crystal resonator inspection and marking device. Background Art

[0002] A quartz crystal resonator is an electronic component that utilizes the inverse piezoelectric effect of quartz crystal material to generate high-precision oscillation frequencies. Quartz crystal resonators are widely used in electronic devices such as oscillators, timers, clock circuits, and wireless communication systems to ensure precise timing and frequency stability.

[0003] The production of quartz crystal resonators includes basic steps such as cutting, grinding, and coating. Before packaging, the quartz crystal resonator also needs to be marked to indicate its parameters, model, batch, and other information. During these production processes, some defective products are inevitably produced. These defective products may have some cosmetic defects such as cracks and bends, as well as performance defects such as unqualified electrical parameters and insulation performance. These can cause the quartz crystal resonator's oscillation frequency to deviate, frequency stability to decrease, and signal transmission to be easily interrupted. In turn, the frequency fluctuation during operation can easily exceed the allowable range, making it unable to provide accurate clock signals for electronic devices, shortening its lifespan and making it prone to failure.

[0004] However, in the existing technology, during the marking process of quartz crystal resonators, it is often necessary to manually and repeatedly take and place the quartz crystal resonator under the laser head of the marking mechanism. Defect detection of quartz crystal resonators is also often performed by manual screening. Manual participation in the marking and detection of quartz crystal resonators is inefficient, costly, and has poor detection accuracy. It is also prone to safety accidents and cannot form a coherent and efficient assembly line operation, making it difficult to meet the production needs of large-scale detection and marking. Summary of the Invention

[0005] In order to solve the above-mentioned defects, the present invention proposes a quartz crystal resonator inspection and marking device.

[0006] The technical solution adopted by the present invention is a quartz crystal resonator inspection and marking device, comprising a first turntable, a second turntable and an exchange station;

[0007] The first turntable is provided with a plurality of suction nozzles uniformly distributed along its circumference. The first turntable can rotate about its axis and drive the plurality of suction nozzles to rotate synchronously. The suction nozzles are used to suck / release the quartz crystal resonator. The first turntable is provided with: a first positioning mechanism for positioning the quartz crystal resonator, a first testing mechanism for performing an electrical parameter test on the quartz crystal resonator, a second testing mechanism for performing an insulation performance test on the quartz crystal resonator, a third positioning mechanism for positioning the quartz crystal resonator, and a second testing mechanism for performing a bottom visual inspection on the quartz crystal resonator.

[0008] The second turntable is provided with a plurality of temporary platforms for carrying quartz crystal resonators, and an air inlet is provided in the middle of the temporary platforms. The second turntable can rotate around its axis and drive the plurality of temporary platforms to rotate synchronously. The second turntable is provided with a second positioning mechanism for positioning the quartz crystal resonator, a marking mechanism for marking the quartz crystal resonator, and a first inspection mechanism for performing a frontal visual inspection of the quartz crystal resonator.

[0009] The exchange station is located directly opposite the first turntable and the second turntable, and between the test mechanism 1 and the test mechanism 2, and between the positioning mechanism 2 and the detection mechanism 1; at the exchange station, the suction nozzle releases one of the quartz crystal resonators to the temporary placement table, and picks up one of the quartz crystal resonators from the next temporary placement table.

[0010] Furthermore, a feeding station and a loading station are sequentially arranged between the positioning mechanism 1 and the detection mechanism 2 along the rotation direction of the first turntable. The suction nozzle rotated to the loading station absorbs the quartz crystal resonator output from the upstream process, and the suction nozzle rotated to the feeding station releases the qualified quartz crystal resonator to the downstream process.

[0011] Furthermore, a discarding mechanism 1 is provided between the detection mechanism 1 of the second turntable and the exchange station, and a discarding mechanism 2 is provided between the detection mechanism 2 of the first turntable and the feeding station;

[0012] The quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discarding mechanism 1, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discarding mechanism 2.

[0013] Furthermore, along the rotation direction of the second turntable, a material identification station 1 is provided between the exchange station and the second positioning mechanism, and / or a material identification station 2 is provided between the marking mechanism and the first detection mechanism, and / or a material identification station 3 is provided between the first discarding mechanism and the exchange station; and / or along the rotation direction of the first turntable, a material identification station 4 is provided between the second discarding mechanism and the feeding station;

[0014] The inspection and marking equipment also includes an optical fiber detection mechanism, which is used to detect whether the quartz crystal resonator is on the material identification station 1, the material identification station 2, the material identification station 3 or the material identification station 4.

[0015] Furthermore, the marking mechanism includes a marking adjustment mounting base with adjustable height and angle, a laser installed at the upper end of the marking adjustment mounting base, and a laser head installed at one end of the laser. The laser is used to generate a laser beam and emit it to the quartz crystal resonator through the laser head.

[0016] Furthermore, the testing mechanism 1 includes:

[0017] Probe test mechanism mounting base;

[0018] A test probe, used to contact the electrodes of the quartz crystal resonator and obtain an electrical parameter signal;

[0019] A test probe board is arranged on the probe test mechanism mounting seat, a plurality of the test probes are fixed and connected to the test probe board, and the test probe board outputs an electrical parameter signal through a test probe board connecting wire;

[0020] The second testing mechanism includes one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester.

[0021] Furthermore, the detection mechanism 1 includes a mounting and adjusting bracket, a red light ring light source and a black and white camera mounted on the mounting and adjusting bracket, wherein the black and white camera is located directly above the red light ring light source; the red light ring light source emits light downwardly toward the quartz crystal resonator, and the black and white camera is used to capture an image of the quartz crystal resonator;

[0022] The second detection mechanism includes a camera part and a light source irradiation part. The camera part includes a camera adjustment mount and a camera arranged on the camera adjustment mount. The camera adjustment mount is used to adjust the position and shooting angle of the camera; the light source irradiation part includes a light source mount, and a reflecting prism and an annular light source arranged on the light source mount. The reflecting prism reflects the light from the annular light source to the bottom of the quartz crystal resonator to the camera at 45 degrees, and the center of the camera and the center of the reflecting prism are on the same horizontal line.

[0023] Furthermore, the positioning mechanism 1 and / or the positioning mechanism 3 each include a positioning motor 1 and a positioning cam mechanism that are transmission-connected, and four positioning claws arranged orthogonally, wherein the positioning motor 1 drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to correct the position of the quartz crystal resonator;

[0024] The second positioning mechanism includes a positioning mounting seat, a second positioning motor and a positioning slide mounted on the positioning mounting seat, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and drives the positioning piece to reciprocate.

[0025] Furthermore, the discarding mechanism one and the discarding mechanism two both include a second air nozzle and a collection mechanism, and the blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle; the quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is blown into the collection mechanism by the second air nozzle, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is blown into the collection mechanism by the second air nozzle.

[0026] The present invention also discloses a quartz crystal resonator inspection and marking process, which is based on the above-mentioned quartz crystal resonator inspection and marking equipment and includes the following steps:

[0027] The first turntable receives the quartz crystal resonator output from the upstream process and performs electrical parameter testing on it;

[0028] At the exchange station, the first turntable transports the quartz crystal resonator that has completed the electrical parameter test to the second turntable;

[0029] The second turntable performs marking and front visual inspection on the quartz crystal resonator received thereon, and the quartz crystal resonator that fails the electrical parameter test or the front visual inspection is discarded;

[0030] The quartz crystal resonator that has passed the electrical parameter test and the front visual inspection is transported by the second turntable to the first turntable;

[0031] At the exchange station, the first turntable receives the quartz crystal resonator released by the second turntable, and performs an insulation performance test and a bottom visual inspection on the quartz crystal resonator. The quartz crystal resonator that fails the insulation performance test or the bottom visual inspection is discarded;

[0032] The quartz crystal resonator that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable;

[0033] in,

[0034] After the suction nozzle located at the exchange station releases the quartz crystal resonator to the temporary placement table located at the exchange station, the first turntable stops rotating and the second turntable continues rotating until the next temporary placement table rotates to the exchange station. After the suction nozzle located at the exchange station sucks the quartz crystal resonator from the temporary placement table, the first turntable starts rotating again, the next suction nozzle rotates to the exchange station and releases the quartz crystal resonator to the temporary placement table, and the above operation is repeated.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] This invention utilizes a first turntable, a suction nozzle, and a second turntable and temporary storage table to rapidly and precisely transfer quartz crystal resonators between different inspection stations, eliminating the need for manual intervention and significantly improving inspection efficiency. The entire inspection process is automated according to a pre-set procedure, seamlessly integrating positioning, electrical parameter testing, marking, front-side visual inspection, insulation performance testing, and bottom-side visual inspection. This reduces inspection time and meets the needs of large-scale inspections.

[0037] This inspection and marking equipment integrates multiple testing methods, including electrical parameter testing, insulation performance testing, and front and bottom visual inspection. It can conduct a comprehensive and integrated evaluation of the performance and appearance of quartz crystal resonators, ensuring that only qualified products enter subsequent production stages or enter the market. This improves the overall quality level of the product and enhances its market competitiveness, while also reducing after-sales repair and recall costs caused by product quality issues. The automated turntable transfer, marking, and inspection process greatly reduces manual operation and reliance on manpower, saving not only labor costs but also avoiding human errors and safety accidents caused by factors such as operator fatigue and negligence, further improving the stability of the production process and the consistency of product quality.

[0038] The processes on the first and second turntables are carried out simultaneously and operate in coordination, which greatly shortens the production cycle of a single product, can process more products per unit time, significantly improves production efficiency, meets the needs of large-scale production, and effectively reduces production costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The present invention is described in detail below with reference to the embodiments and accompanying drawings, in which:

[0040] Figure 1 It is a schematic diagram of the overall structure of the quartz crystal resonator testing, marking, inspection and packaging equipment;

[0041] Figure 2 This is a top view of the quartz crystal resonator testing, marking, inspection, and packaging equipment;

[0042] Figure 3 It is a schematic diagram of a quartz crystal resonator inspection and marking device;

[0043] Figure 4 is a schematic diagram of the first turntable;

[0044] Figure 5 is a schematic diagram of positioning mechanism 1;

[0045] Figure 6 is a schematic diagram of test organization one;

[0046] Figure 7 is a schematic diagram of the second turntable;

[0047] Figure 8 is a schematic diagram of positioning mechanism 2;

[0048] Figure 9 It is a schematic diagram of the marking mechanism;

[0049] Figure 10 is a schematic diagram of the testing mechanism 1;

[0050] Figure 11 is a schematic diagram of the second testing mechanism;

[0051] Figure 12 It is a schematic diagram of the collection mechanism.

[0052] 200. Inspection of marking equipment;

[0053] 211. First turntable; 212. Second turntable; 213. Temporary storage table; 214. Insulation tester;

[0054] 220, collection mechanism; 221, collection mechanism mounting seat; 222, defective material cup; 223, material feeding pipe;

[0055] 230, suction nozzle; 231, filter; 232, vacuum breaking structure; 233, solenoid valve;

[0056] 240. Positioning mechanism 1; 241. Positioning claw; 242. Positioning cam mechanism; 243. Positioning motor 1;

[0057] 250, positioning mechanism 2; 251, positioning motor 2; 252, positioning slide; 253, positioning piece; 254, positioning mounting seat;

[0058] 260. Test mechanism 1; 261. Test probe; 262. Test probe board; 263. Test probe board connecting wire; 264. Probe test mechanism mounting base; 265. Industrial control host;

[0059] 270. Marking mechanism; 271. Marking adjustment mount; 272. Laser head; 273. Laser; 274. Wire connecting the laser to the control host; 275. Control host;

[0060] 280. Detection mechanism 1; 281. Mounting and adjustment bracket; 282. Red ring light source; 283. Black and white camera; 284. Telecentric lens;

[0061] 290. Detection mechanism 2; 291. Camera adjustment mount; 292. Camera; 293. Protective cover; 294. Light source mount; 295. Reflecting prism; 296. Ring light source;

[0062] 410, loading station; 420, positioning station 1; 430, testing station 1; 440, testing station 2; 450, positioning station 3; 460, testing station 2; 470, discarding station 2; 480, material identification station 4; 490, feeding station;

[0063] 510. Exchange workstations;

[0064] 610, material identification station 1; 620, positioning station 2; 630, marking station; 640, material identification station 2; 650, inspection station 1; 660, discard station 1; 670, material identification station 3;

[0065] 700. Quartz crystal resonator. DETAILED DESCRIPTION

[0066] To make the objectives, technical solutions, and advantages of the present invention more apparent, embodiments of the present invention will be described in further detail below with reference to the accompanying drawings. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar components or components having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0067] In one embodiment, a quartz crystal resonator inspection marking device 200, see Figure 1-2, which can be used in quartz crystal resonator testing, marking, inspection, and packaging equipment. The quartz crystal resonator inspection and marking equipment 200 includes a first turntable 211, a second turntable 212, and an exchange station 510. The first turntable 211 is primarily used for testing the quartz crystal resonator 700, and the turntable is primarily used for marking the quartz crystal resonator 700. The first turntable 211 and the second turntable 212 are used to exchange the quartz crystal resonator 700 at the exchange station 510 to perform different processing steps on the quartz crystal resonator 700. The first turntable 211 and the second turntable 212 can be indexing disks or other rotatable disks.

[0068] A plurality of suction nozzles 230 are evenly fixed around the circumference of the first turntable 211. The first turntable 211 can rotate around its axis and drive the plurality of suction nozzles 230 thereon to rotate synchronously around the axis of the first turntable 211. The suction nozzles 230 are used to absorb / release the quartz crystal resonator 700. Among them, the suction nozzles 230 can be connected to a negative pressure vacuum air pipe to absorb and release materials. A filter 231 can be set in the middle to filter the air entering the negative pressure vacuum air pipe to remove dust and impurities. The vacuum breaking structure 232 can also be used to realize automated suction and release operations, thereby improving production efficiency and reducing errors in manual operation. The specific vacuum breaking structure 232 can be controlled to start and stop by an electromagnetic valve 233.

[0069] A positioning mechanism 240, a testing mechanism 260, a testing mechanism 2, a positioning mechanism 3 and a detection mechanism 2 290 are sequentially arranged along the circumference of the first turntable 211. The positioning mechanism 240 is used to position the quartz crystal resonator 700, the testing mechanism 260 is used to perform electrical parameter tests on the quartz crystal resonator 700, the testing mechanism 2 is used to perform insulation performance tests on the quartz crystal resonator 700, the positioning mechanism 3 is used to position the quartz crystal resonator 700, and the detection mechanism 2 290 is used to perform visual inspection of the bottom of the quartz crystal resonator 700.

[0070] Specifically, if Figure 3 As shown, the positioning station 1 420, the testing station 1 430, the testing station 2 440, the positioning station 3 450 and the detection station 2 460 can be arranged in sequence along the rotation direction of the first turntable 211, and each suction nozzle 230 can be rotated through the positioning station 1 420, the testing station 1 430, the testing station 2 440, the positioning station 3 450 and the detection station 2 460 in sequence. The suction nozzle 230 can suck the quartz crystal resonator 700, so that the suction nozzle 230 can drive the quartz crystal resonator 700 to rotate through the positioning station 1 420, the testing station 1 430, the testing station 2 440, the positioning station 3 450 and the detection station 2 460 in sequence.

[0071] Positioning mechanism 1 240 corresponds to positioning station 1 420 and positions the quartz crystal resonator 700 located at positioning station 1 420. Testing mechanism 1 260 corresponds to testing station 1 430 and performs electrical parameter testing on the quartz crystal resonator 700 located at testing station 1 430. Testing mechanism 2 corresponds to testing station 2 440 and performs insulation performance testing on the quartz crystal resonator 700 located at testing station 2 440. Positioning mechanism 3 corresponds to positioning station 3 450 and positions the quartz crystal resonator 700 located at positioning station 3 450. Inspection mechanism 2 290 corresponds to inspection station 2 460 and performs bottom visual inspection on the quartz crystal resonator 700 located at inspection station 2 460.

[0072] like Figure 7 As shown, multiple temporary platforms 213 for supporting quartz crystal resonators 700 are evenly distributed along the circumference of the second turntable 212. The second turntable 212 can rotate about its axis, driving the multiple temporary platforms 213 thereon to rotate synchronously. A second positioning mechanism 250, a marking mechanism 270, and a first inspection mechanism 280 are sequentially arranged along the circumference of the second turntable 212. The second positioning mechanism 250 is used to position the quartz crystal resonator 700, the marking mechanism 270 is used to mark the quartz crystal resonator 700, and the first inspection mechanism 280 is used to perform front-view visual inspection of the quartz crystal resonator 700.

[0073] Specifically, if Figure 3As shown, the second turntable 212 is sequentially provided with a second positioning station 620, a marking station 630, and a first inspection station 650 along its rotation direction. As the second turntable 212 rotates, the temporary table 213 sequentially passes through the second positioning station 620, the marking station 630, and the first inspection station 650. As the second turntable 212 rotates, when the temporary table 213 drives the quartz crystal resonator 700 to rotate to the second positioning station 620, the second positioning mechanism 250 positions the quartz crystal resonator 700 located on the second positioning station 620 to correct the position of the quartz crystal resonator 700 on the temporary table 213, ensuring that key positional parameters such as its center and angle meet the requirements of the subsequent marking process. When the temporary table 213 drives the quartz crystal resonator 700 to rotate to the marking station 630, the marking mechanism 270 marks the quartz crystal resonator 700 located on the marking station 630. When the temporary placement table 213 drives the quartz crystal resonator 700 to the first inspection station 650, the first inspection mechanism 280 performs a front-facing visual inspection on the quartz crystal resonator 700 located at the first inspection station 650. The first inspection mechanism 280 can promptly and accurately detect various defects and marking issues on the front of the quartz crystal resonator 700, screening out unqualified products at an early stage, preventing defective products from flowing into the next process and effectively ensuring the overall quality of the product.

[0074] Furthermore, an air inlet is provided in the middle of the temporary table 213, which forms a negative pressure by suctioning air, so that the quartz crystal resonator 700 is more firmly supported on the temporary table 213, and is not easily displaced relative to the temporary table 213 during the movement of the quartz crystal resonator 700 along with the temporary table 213. Figure 4 As shown, the suction port can be connected to a negative pressure vacuum air pipe to suck and release materials. A filter 231 can be provided in the middle to filter the air entering the negative pressure vacuum air pipe to remove dust and impurities. The vacuum breaking structure 232 can also be used to achieve automated suction and release operations, improving production efficiency and reducing human error. Specifically, the vacuum breaking structure 232 can be controlled to start and stop by a solenoid valve 233.

[0075] The exchange station 510 is located opposite the first turntable 211 and the second turntable 212, and between the test mechanism 1 260 and the test mechanism 2, and between the positioning mechanism 2 250 and the detection mechanism 1 280; at the exchange station 510, the suction nozzle 230 releases a quartz crystal resonator 700 to the temporary placement table 213, and absorbs a quartz crystal resonator 700 from the next temporary placement table 213.

[0076] During use, driven by the rotation of the first turntable 211, the suction nozzle 230 rotates to the first positioning station 420. The first positioning mechanism 240 positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first positioning station 420, ensuring that it is in the ideal standard position during the subsequent electrical parameter test and insulation performance test, ensuring the accuracy and reliability of the test results. The first turntable 211 then drives the suction nozzle 230 to rotate to the first testing station 430. The first testing mechanism 260 performs an electrical parameter test on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the first testing station 430, distinguishing quartz crystal resonators 700 with qualified electrical parameters from those with unqualified electrical parameters.

[0077] Then the first turntable 211 drives the suction nozzle 230 to rotate to the exchange station 510 , and the suction nozzle 230 of the exchange station 510 releases a quartz crystal resonator 700 to the temporary placement table 213 on the second turntable 212 . Under the rotation of the second turntable 212, the temporary table 213 drives the quartz crystal resonator 700 to rotate to the second positioning station 620, and the second positioning mechanism 250 positions the quartz crystal resonator 700 located on the second positioning station 620 to correct the position of the quartz crystal resonator 700 on the temporary table 213; then the temporary table 213 continues to drive the quartz crystal resonator 700 to rotate to the marking station 630, and the marking mechanism 270 marks the quartz crystal resonator 700 located on the marking station 630; then the temporary table 213 drives the quartz crystal resonator 700 to rotate to the first detection station 650, and the first detection mechanism 280 performs a front visual inspection on the quartz crystal resonator 700 located on the first detection station 650.

[0078] After the temporary table 213 drives the quartz crystal resonator 700 to complete the front visual inspection, the second turntable 212 continues to rotate until the temporary table 213 rotates to the exchange station 510. After the suction nozzle 230 of the first turntable 211 sucks the quartz crystal resonator 700 that has completed the marking and front visual inspection, the first turntable 211 drives the suction nozzle 230 to rotate to the second test station 440. The second testing mechanism performs an insulation performance test on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second test station 440 to distinguish between quartz crystal resonators 700 with qualified insulation performance and quartz crystal resonators 700 with unqualified insulation performance. Then, the first turntable 211 drives the suction nozzle 230 to rotate to the third positioning station 450. The third positioning mechanism positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the third positioning station 450 to ensure that the quartz crystal resonator 700 is still in the correct position after the previous testing process, providing a stable test object for the subsequent bottom visual inspection and ensuring the consistency and accuracy of the test image. Then, the first turntable 211 drives the suction nozzle 230 to rotate to the second inspection station 460. The second inspection mechanism 290 performs a bottom visual inspection on the quartz crystal resonator 700 sucked by the suction nozzle 230 at the second inspection station 460 to distinguish the quartz crystal resonator 700 with appearance defects on the bottom.

[0079] The combination of the first turntable 211, suction nozzle 230, second turntable 212, and temporary storage table 213 enables rapid and precise transfer of quartz crystal resonators 700 between different inspection stations, eliminating the need for manual intervention and significantly improving inspection efficiency. The entire inspection process is automated according to pre-set procedures, from positioning, electrical parameter testing, marking, front visual inspection, insulation performance testing, to bottom visual inspection. Each step is seamlessly integrated, reducing inspection time and meeting the needs of large-scale inspections.

[0080] This inspection and marking equipment 200 integrates multiple testing methods, including electrical parameter testing, insulation performance testing, and front and bottom visual inspection. It can conduct a comprehensive and integrated assessment of the performance and appearance of the quartz crystal resonator 700, ensuring that only qualified products enter subsequent production stages or enter the market. This improves overall product quality and enhances product competitiveness, while also reducing after-sales repair and recall costs due to product quality issues. The automated turntable transfer, marking, and inspection process significantly reduces manual operations and reduces reliance on manpower, saving labor costs while also avoiding human errors and safety incidents caused by factors such as operator fatigue and negligence. This further improves the stability of the production process and the consistency of product quality.

[0081] The processes on the first turntable 211 and the second turntable 212 are carried out synchronously and operate in coordination, which greatly shortens the production cycle of a single product, can process more products per unit time, significantly improves production efficiency, meets mass production needs, and effectively reduces production costs.

[0082] In one embodiment, a feeding station 490 and a loading station 410 are sequentially arranged between the positioning mechanism 1 240 and the detection mechanism 2 290 along the rotation direction of the first turntable 211. The suction nozzle 230 rotates to the loading station 410 to absorb the quartz crystal resonator 700 output from the upstream process, and the suction nozzle 230 rotates to the feeding station 490 to release the qualified quartz crystal resonator 700 to the downstream process.

[0083] Specifically, when the suction nozzle 230 rotates to the loading station 410, its position is precisely aligned with the output end of the upstream process, and the quartz crystal resonator 700 is gently and firmly sucked from the output position of the upstream process through vacuum adsorption or other suitable suction methods to ensure that no damage is caused to the resonator during the transfer process. The suction nozzle 230 that has sucked the quartz crystal resonator 700 rotates to the positioning station 420 along with the first turntable 211. The quartz crystal resonator 700 is accurately positioned at this station and is ready for the subsequent inspection process. After a series of inspection processes, when the suction nozzle 230 rotates to the feeding station 490, it is also precisely matched with the input end of the downstream process. At this time, the suction nozzle 230 releases the quartz crystal resonator 700 that has been inspected and determined to be qualified to the receiving position of the downstream process, completing the handover of the product.

[0084] By installing loading station 410 and feeding station 490 on first turntable 211, seamless integration with upstream and downstream processes is achieved, integrating the quartz crystal resonator 700 inspection process into the overall production process. This makes material transfer on the production line smoother and more efficient, reduces stagnation and waiting time in intermediate links, improves overall production efficiency, and can meet the needs of large-scale, continuous production. By adjusting parameters such as the rotation speed of first turntable 211 and the suction and release time of suction nozzle 230, it can adapt to different production rhythms and product model switching. It also facilitates real-time monitoring and management of the production process, promptly identifying and resolving potential problems, and improving the intelligence and automation level of the production process.

[0085] The precise suction of the loading station 410 and the accurate release of the feeding station 490 ensure the stable state of the quartz crystal resonator 700 when entering and leaving the inspection process, avoiding product damage or position deviation due to human operation or improper material transfer, and helping to ensure the accuracy and reliability of the inspection results. Only products that have passed strict inspection and are of qualified quality will enter the downstream process, thereby effectively ensuring the stability and consistency of the product quality of the entire production line, reducing the defective rate and scrap rate, and improving the product yield and market competitiveness.

[0086] In one embodiment, a discarding mechanism 1 is further provided between the detection mechanism 1 280 of the second turntable 212 and the exchange station 510, and a discarding mechanism 2 is further provided between the detection mechanism 2 290 of the first turntable 211 and the feeding station 490; the quartz crystal resonator 700 that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discarding mechanism 1, and the quartz crystal resonator 700 that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discarding mechanism 2. Specifically, along the rotation direction of the second turntable 212, a discard station 660 is provided between the inspection station 650 and the exchange station 510. The quartz crystal resonator 700 that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discard mechanism 1 at the discard station 660; along the rotation direction of the first turntable 211, a discard station 470 is provided between the inspection station 460 and the feeding station 490. The quartz crystal resonator 700 that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discard mechanism 2 at the discard station 470.

[0087] Furthermore, the first discard mechanism includes a second air nozzle and a collection mechanism 220. Quartz crystal resonators 700 that fail electrical parameter testing and / or front visual inspection are blown into the collection mechanism 220 by the second air nozzle at the first discard station 660. The blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle 230, so that the second air nozzle can easily blow away the unqualified products sucked up by the suction nozzle 230. The first and second discard mechanisms can be configured as the same structure. The first and second discard mechanisms can also be configured as other structures with the same function, such as a mechanical gripper-type discard structure, a vacuum suction-type discard structure, an inclined slide-type discard structure, etc.

[0088] In one embodiment, Figure 12As shown, the collection mechanism 220 includes a collection mechanism mounting base 221, a defective material cup 222, and a material feed tube 223 mounted on the collection mechanism mounting base 221. Unqualified quartz crystal resonators 700 pass through the material feed tube 223 and fall into the defective material cup 222. The collection mechanism mounting base 221 serves as the basic support component of the entire collection mechanism 220 and has sufficient strength to withstand the weight of the defective material cup 222 and material feed tube 223, as well as the impact force generated by the unqualified quartz crystal resonators 700 during their fall, ensuring that the entire collection mechanism 220 does not shake or shift during operation. The defective material cup 222 is typically made of a transparent or translucent plastic material (such as polycarbonate). This allows operators to visually observe the number and status of the collected unqualified quartz crystal resonators 700, allowing them to clean the material cup in a timely manner to prevent overflowing material cups that could cause blockage or failure of the collection system. The feeding tube 223 is made of metal or plastic material with a smooth inner wall (such as a stainless steel tube or a hard plastic tube), and its inner diameter is slightly larger than the maximum size of the quartz crystal resonator 700 to ensure that unqualified products can pass smoothly under the action of airflow or their own gravity, while minimizing friction and collision of the products in the tube to prevent damage to the product surface or clogging of the feeding tube 223 due to jamming.

[0089] In other embodiments, the collection mechanism 220 further includes a cylinder, and the defective material cups 222 include two. The two defective material cups 222 of the first discard mechanism are respectively loaded with quartz crystal resonators 700 that fail the electrical parameter test and the quartz crystal resonators 700 that fail the front visual inspection; the two defective material cups 222 of the second discard mechanism are respectively loaded with quartz crystal resonators 700 that fail the insulation performance test and the quartz crystal resonators 700 that fail the bottom visual inspection, so that different defective products can be subsequently tested, analyzed, or recycled. The material feeding pipe 223 includes two pipes and a pipe head, and the quartz crystal resonators 700 enter different defective material cups 222 from the pipe head and pipes. The pipe connected to the pipe head is switched according to the cylinder inspection results, thereby achieving classified collection of different defective products.

[0090] In one embodiment, along the rotation direction of the second turntable 212, a material identification station 1 610 is provided between the exchange station 510 and the second positioning mechanism 250, and / or a material identification station 2 640 is provided between the marking mechanism 270 and the first detection mechanism 280, and / or a material identification station 3 670 is provided between the first discard mechanism and the exchange station 510; and / or along the rotation direction of the first turntable 211, a material identification station 480 is provided between the second discard mechanism and the feeding station 490. The inspection and marking device 200 further includes an optical fiber detection mechanism for detecting whether a quartz crystal resonator 700 is present at the material identification station 1 610, the material identification station 2 640, the material identification station 3 670, or the material identification station 480.

[0091] Specifically, multiple fiber optic detection mechanisms are provided, each of which is used to detect whether a quartz crystal resonator 700 is present on the temporary table 213. For example, a material identification station 1 610 is provided between the exchange station 510 and the positioning station 2 620 of the second turntable 212. The fiber optic detection mechanism detects whether a quartz crystal resonator 700 is present on the temporary table 213 at the material identification station 1 610. If so, the temporary table 213 rotates to a subsequent station and then performs positioning, marking, etc. at the subsequent station. If not, the temporary table 213 idles. A material identification station 240 is provided between the marking station 630 and the detection station 1 650 of the second turntable 212. The fiber optic detection mechanism detects whether a quartz crystal resonator 700 is present on the temporary table 213 at the material identification station 2 640. If so, the temporary table 213 rotates to a subsequent station and then performs material inspection, etc. at the subsequent station. If not, the temporary table 213 idles. A material identification station 480 is provided between the second material disposal station 470 and the feeding station 490 of the first turntable 211. The optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the suction nozzle 230 at the fourth material identification station 480. If so, the suction nozzle 230 rotates to the subsequent station and then unloads the material at the subsequent station. If not, the suction nozzle 230 idles.

[0092] The fiber optic detection mechanism may include a light source, optical fibers, and a light detector. Light emitted by the light source is transmitted via optical fibers to the detection point corresponding to the material identification station. When a quartz crystal resonator 700 is present, the optical signal changes (e.g., due to changes in reflection, refraction, or scattering). This change is then transmitted back to the light detector via optical fibers. The light detector converts the change in the optical signal into an electrical signal, thereby determining the presence of a quartz crystal resonator 700. For example, in a reflective fiber optic sensor, if a quartz crystal resonator 700 is in the detection position, the intensity and other characteristics of the reflected light will change, thereby achieving detection. Multiple fiber optic detection mechanisms can detect the presence of material and control the operation of subsequent stations, avoiding unnecessary operations, reducing equipment loss and energy consumption, and improving production efficiency.

[0093] In one embodiment, Figure 9As shown, the marking mechanism 270 includes a marking adjustment mount 271, a laser 273, and a laser head 272. The laser 273 is mounted on the upper end of the marking adjustment mount 271, and the laser head 272 is mounted on one end of the laser 273. The laser 273 is used to generate a laser beam, which is then transmitted through the laser head 272 to the quartz crystal resonator 700 on the marking station 630. The laser 273 is used to generate a high-energy laser beam and can be an Nd:YAG laser 273, a semiconductor laser 273, or the like. The laser head 272 is mounted on one end of the laser 273 and serves as the laser beam transmitting terminal. It is responsible for focusing the laser beam generated by the laser 273 and accurately projecting it onto the surface of the quartz crystal resonator 700. Specifically, the laser head 272 can have a red light correction function, and the lens focal length can be precisely adjusted within a certain range, which can cover approximately from a certain initial value to 100mm. It can use 20W of laser power for laser marking.

[0094] The height and angle of the marking adjustment mount 271 are adjustable, allowing for fine-tuning of the vertical and horizontal angles of the laser 273 and laser head 272. The height and angle of the marking adjustment mount 271 can be adjusted using screw drives, gear adjustments, or hydraulic or pneumatic devices. For example, when rotating the screw, the laser 273 and laser head 272 can be smoothly raised or lowered with a predetermined accuracy (e.g., 0.1mm step) to accommodate marking tasks requiring quartz crystal resonators 700 at different heights. For angle adjustment, a graduated rotary joint or worm gear mechanism can be used to precisely adjust the tilt angle of the laser 273 and laser head 272, ensuring that the laser beam is incident perpendicularly on the product surface and ensuring consistent marking results.

[0095] Furthermore, the marking mechanism 270 also includes a laser connection control host wire 274, which connects the laser 273 and the control host 275 to transmit control signals. The control host 275 has built-in marking control software, and the operator enters various marking parameters on the human-machine interface of the control host 275, such as laser power, pulse frequency, marking speed, marking pattern and other detailed information. Based on these instructions, the control host 275 sends corresponding electrical signals to the laser 273 through the laser connection control host wire 274, thereby realizing real-time and precise control of the working state of the laser 273. For example, when the laser power needs to be changed, the control host 275 sends a digital signal containing the power adjustment value to the laser 273. After the laser 273 receives it, the internal power regulation circuit responds quickly and adjusts the output laser power to the set value, ensuring that the marking process is flexible, changeable and accurate.

[0096] Due to the flexible adjustment characteristics of the marking adjustment mount 271 and the multi-adjustment function of the laser head 272, the marking mechanism 270 can cope with quartz crystal resonators 700 of different specifications and materials, achieving accurate and efficient marking operations during the production process, and improving product traceability and identification quality.

[0097] In one embodiment, Figure 6 As shown, the test mechanism 260 includes a probe test mechanism mounting base 264, a test probe 261 and a test probe plate 262. The test probe 261 is used to contact the electrode of the quartz crystal resonator 700 and obtain electrical parameter signals. The test probe 261 is usually made of a highly conductive and highly elastic metal material, such as beryllium copper alloy, etc. Its head is specially treated to ensure good electrical contact with the electrode of the quartz crystal resonator 700 while avoiding scratching the electrode surface.

[0098] The probe test mechanism mounting base 264 can be made of metal or high-strength engineering plastic, with sufficient rigidity and stability to resist external vibration and impact, ensuring that the test probe board 262 and its components do not shift or shake during testing. The test probe board 262 is mounted on the probe test mechanism mounting base 264. Multiple test probes 261 are fixed to the test probe board 262 and connected to the signal. The test probes 261 are fixed to the test probe board 262 through a precise welding or crimping process, ensuring that they will not loosen or shift during long-term use, maintaining stable contact performance.

[0099] After the test probe 261 contacts the electrode of the quartz crystal resonator 700, it obtains its electrical parameter signals, and then transmits these signals to the test probe board 262 connected to its signal. The test probe board 262 then outputs the electrical parameter signals through the test probe board connecting wire 263 and transmits them to subsequent test boards and other equipment. The test board displays and records the electrical parameter test results through the industrial control host 265 software, obtains the test results, and thus determines whether the electrical parameters of the quartz crystal resonator 700 are qualified to ensure that each packaged quartz crystal resonator 700 meets the electrical performance requirements.

[0100] In other embodiments, the test mechanism 260 can also be set as other structures, such as a capacitive coupling test structure, an electromagnetic induction test structure, a microelectromechanical system (MEMS) test structure, a system on chip (SoC) test structure, a laser interference test structure, a spectral analysis test structure, etc.

[0101] In one embodiment, the second testing organization may include a common insulation tester 214 such as an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester, which is used to perform insulation performance testing on the quartz crystal resonator 700 to ensure that the insulation performance of each quartz crystal resonator 700 meets the standards and provide reliable quality assurance for subsequent use.

[0102] In one embodiment, Figure 10 As shown, detection mechanism 1 280 includes a mounting and adjustment bracket 281, a red ring light source 282, and a black and white camera 283. The red ring light source 282 and the black and white camera 283 are respectively mounted on the mounting and adjustment bracket 281. The mounting and adjustment bracket 281 can be equipped with multiple sets of guide rails, sliders, screw nut pairs, and angle adjustment devices to enable precise three-dimensional position adjustment of the red ring light source 282 and the black and white camera 283. The light-emitting elements of the red ring light source 282 typically utilize a high-brightness LED array distributed in a ring structure. The red ring light source 282 provides uniform illumination, eliminates shadows and reflections, and ensures that the camera 292 can clearly capture images of the quartz crystal resonator 700.

[0103] The black and white camera 283 is used to capture images of the quartz crystal resonator 700. Its photosensitive element can use a highly sensitive CCD or CMOS chip, which can quickly convert the received light intensity signal into a digital electrical signal. Specifically, the black and white camera 283 can use a 130W pixel resolution to clearly present the detailed features of the product surface. For example, for laser-marked fonts, the black and white camera 283 can accurately distinguish the clarity of the font strokes, the sharpness of the edges, and the presence of subtle missing marking marks, providing high-precision image data for subsequent visual inspection algorithms. A telecentric lens 284 can be installed at the front end of the black and white camera 283 to provide distortion-free, high-precision imaging.

[0104] During operation, the red ring light source 282 emits light downward to the quartz crystal resonator 700 on the inspection station 650. The black and white camera 283 is located directly above the red ring light source 282. It uses the good lighting conditions provided by the light source to capture the light reflected from the surface of the quartz crystal resonator 700. With a resolution of 130W pixels, it clearly presents the detailed features of the product surface.

[0105] The inspection unit 280 performs font inspection and missing marking inspection on the quartz crystal resonator 700 after laser marking and engraving. Through accurate and efficient front visual inspection, unqualified quartz crystal resonators 700 are screened out at an early stage, avoiding defective products from flowing into subsequent processes and effectively reducing the scrap rate.

[0106] In one embodiment, Figure 11 As shown, the second detection mechanism 290 includes a camera part and a light source irradiation part. The camera part includes a camera adjustment mount 291 and a camera 292 arranged on the camera adjustment mount 291. The camera adjustment mount 291 is used to adjust the position and shooting angle of the camera 292; the light source irradiation part includes a light source mount 294, and a reflecting prism 295 and a ring light source 296 arranged on the light source mount 294. First, the camera 292 is installed with the adjustment mount and the camera 292 as a whole, and then the light source mount 294, the reflecting prism 295 and the ring light source 296 are installed as another whole. The second detection mechanism 290 can perform real-time and accurate bottom visual inspection during the production process to ensure that the bottom quality of each quartz crystal resonator 700 meets the standards, providing reliable quality assurance for subsequent processes.

[0107] The reflecting prism 295 reflects the light from the annular light source 296 to the bottom of the quartz crystal resonator 700 at 45 degrees to the camera 292 , and the center of the camera 292 and the center of the reflecting prism 295 are on the same horizontal line.

[0108] Specifically, the camera adjustment mount 291 is usually composed of guide rails, sliders, rotating joints, and adjusting screws. Through these components, the position of the camera 292 can be accurately adjusted in three-dimensional space, including translation along the X, Y, and Z axes and rotation around each axis, so that the camera 292 can be accurately aligned with the bottom of the quartz crystal resonator 700 to ensure that a clear, complete image that meets the detection requirements is captured. The camera 292 can use a high-resolution, high-frame-rate industrial camera 292, and parameters such as the focal length and aperture of the lens can be adjusted according to actual detection requirements. The camera 292 is fixed on the camera adjustment mount 291 and is firmly connected by screws or bayonet to ensure that no displacement occurs during the detection process.

[0109] Furthermore, the camera part can also include a protective cover 293, which is tightly installed around the camera 292 and fixed to the camera adjustment mount 291 through a slot or screws. It can prevent dust, debris, water vapor and other impurities in the production environment from contaminating the camera 292 lens and affecting the shooting effect, and can also protect the camera 292 from collision and accidental damage to a certain extent, while not affecting the normal shooting angle and light reception of the camera 292.

[0110] Light source mount 294 is typically made of metal, such as stainless steel, to ensure sufficient strength and stability. Light source mount 294 is designed with precise mounting holes and positioning structures to secure annular light source 296 and reflective prism 295, maintaining their relative positional accuracy and stability during the inspection process. Light source mount 294 may also be equipped with a heat dissipation structure, such as a heat sink or fan, to dissipate heat generated by annular light source 296 during operation, ensuring that the light source's luminous intensity and stability are not affected.

[0111] Reflecting prism 295 can be made of highly reflective optical glass, and its surface is precisely polished to ensure efficient and accurate light reflection. Reflecting prism 295 is secured to light source mounting base 294 using a special fixture or glue, ensuring its precise position relative to ring light source 296 and camera 292. Its reflective surface forms a 45-degree angle with the direction of light emitted by ring light source 296, accurately reflecting light from ring light source 296 toward the bottom of quartz crystal resonator 700. The light reflected from the bottom is then reflected back at a 45-degree angle toward camera 292, achieving efficient light utilization and precise guidance.

[0112] Ring light source 296 typically utilizes a light-emitting diode (LED) as its light-emitting element. Its light color and intensity can be selected and adjusted based on the material of the bottom of the quartz crystal resonator 700 and the inspection requirements. For example, it can emit different colors of light, such as white, blue, and red, and have different brightness levels. Ring light source 296 is securely mounted to light source mounting base 294 using screws or clips. Its internal circuitry is connected to an external power controller, which allows precise adjustment of parameters such as the brightness and on / off timing of ring light source 296 to accommodate different inspection scenarios and requirements. This provides uniform, stable, and appropriate illumination conditions for the bottom of the quartz crystal resonator 700, enhancing image contrast and clarity, and facilitating the camera 292 to capture clear bottom features.

[0113] Since the camera adjustment mount 291 can accurately adjust the position and angle of the camera 292, and the reflective prism 295 has a precise optical fit with the ring light source 296 and the camera 292, the detection mechanism 290 can obtain a high-definition, high-resolution image of the bottom of the quartz crystal resonator 700, thereby accurately detecting subtle quality problems such as tiny cracks, scratches, impurities, and packaging defects, which helps to improve product quality standards and reduce the outflow of defective products. For some application fields with extremely high quality requirements, such as the production of quartz crystal resonators 700 in aerospace, medical equipment, etc., it can ensure the reliability and stability of the product and avoid serious consequences caused by minor defects.

[0114] In other embodiments, the second detection mechanism 290 can also be set to other structures, such as a line scanning camera 292 detection structure, a binocular stereo vision detection structure, a multispectral detection structure based on machine vision, etc.

[0115] In one embodiment, Figure 5 As shown, positioning mechanism 1 240 includes a positioning motor 1 243 and a positioning cam mechanism 242, which are connected in a transmission manner, and four orthogonally arranged positioning claws 241. The four positioning claws 241 calibrate the position of the quartz crystal resonator 700 located in the center. Positioning motor 1 243 drives positioning cam mechanism 242 to rotate, which in turn drives the four positioning claws 241 to open and close, thereby correcting the position of the quartz crystal resonator 700.

[0116] The positioning motor 243 is usually a high-precision servo motor or stepper motor, and its output shaft is rigidly connected to the input shaft of the positioning cam mechanism 242 through a coupling or a synchronous belt to ensure stable power transmission and accurate transmission ratio. The rotation angle and speed of the motor can be precisely programmed and controlled by the controller, providing a reliable power source for the precise movement of the positioning cam mechanism 242. The positioning cam mechanism 242 consists of a cam and a follower. The profile curve of the cam is designed according to the opening and closing action requirements of the four positioning claws 241. When the positioning motor 243 rotates, it drives the cam to rotate, and the cam profile contacts the follower, converting the rotational motion of the motor into a linear reciprocating motion of the follower.

[0117] The four positioning claws 241 are connected to the followers of the positioning cam mechanism 242 via a connecting rod or slider, forming a linkage system. As the cam rotates, the linear motion of the followers causes the four positioning claws 241 to open or close simultaneously. For example, the rising section of the cam profile pushes the followers outward, causing the positioning claws 241 to open, allowing the quartz crystal resonator 700 to smoothly enter the positioning area. The falling section of the cam profile retracts the followers inward, pulling the positioning claws 241 closed, thus precisely correcting the position of the quartz crystal resonator 700 from four directions.

[0118] The inner side of the positioning claw 241 is usually designed with a soft buffer material, such as a rubber pad or a silicone pad, which can provide sufficient clamping force to ensure the stability of the position of the quartz crystal resonator 700 while avoiding scratches or damage to the resonator surface.

[0119] Furthermore, the rotational position of the first turntable 211 can also be monitored in real time by a high-precision sensor (such as an encoder). When the quartz crystal resonator 700 sucked by the suction nozzle 230 rotates to the working area of ​​the positioning mechanism 240, the sensor feeds back a signal to the control system, and the control system immediately starts the positioning motor 243.

[0120] The suction nozzle 230 places the quartz crystal resonator 700 near the center of the four positioning claws 241. The positioning claws 241 are driven by the motor and cam mechanism to open and close, and adjust the position of the resonator so that its center coincides with the preset standard position. The error is controlled within a very small range. Then the suction nozzle 230 absorbs the positioned resonator and transfers it to the next workstation.

[0121] By utilizing the precise control of the positioning motor 243 and the design of the positioning cam mechanism 242, high-precision positioning of the quartz crystal resonator 700 can be achieved, and the position deviation of the resonator can be controlled to the micron or even submicron level, ensuring that in subsequent testing, processing and other processes, all operations can be performed at the correct position, greatly improving the consistency and performance stability of the product. For example, for electrical parameter testing, precise positioning can ensure good contact between the test probe and the resonator pin, thereby obtaining accurate test data. The positioning mechanism 240 has a certain degree of versatility. For quartz crystal resonators 700 of different sizes and shapes, precise positioning can be achieved by adjusting the initial position of the positioning claw 241 and the profile curve of the cam, and it has strong adaptability. At the same time, due to its relatively simple structure and the firm connection of each component, it has high reliability in long-term production operations, reducing downtime and product defective rate caused by positioning mechanism failure, and reducing production costs and maintenance costs.

[0122] The structure of the positioning mechanism 3 can be the same as that of the positioning mechanism 1 240. In other embodiments, the positioning mechanism 1 240 and the positioning mechanism 3 can also be designed as other positioning structures, such as a pneumatic gripper positioning structure, an electromagnetic adsorption positioning structure, a visual recognition and robotic arm positioning structure, etc.

[0123] In one embodiment, Figure 8 As shown, the positioning mechanism 250 includes a positioning mounting seat 254, a positioning motor 251 and a positioning slide 252 installed on the positioning mounting seat 254, and a positioning plate 253 fixedly connected to one end of the positioning slide 252. The positioning motor 251 drives the positioning slide 252 to reciprocate and drives the positioning plate 253 to reciprocate.

[0124] The mounting base can be provided with a series of standard threaded holes, locating pin holes, and guide rail mounting grooves and other connecting structures. The positioning motor 251 is firmly fixed in the predetermined position by bolts, locating pins and other connecting parts to ensure that the motor does not shift or shake during operation. At the same time, it can also provide a smooth and highly precise guide rail support for the positioning slide 252, so that the slide can only move along the predetermined straight line direction. The matching clearance between the guide rail and the slide is extremely small, generally controlled within 0.05mm, to ensure the high precision and stability of the slide movement. The stroke of the slide is designed according to the positioning requirements of the quartz crystal resonator 700, usually between 10-50mm, which can not only meet the correction requirements of products placed in different positions, but also avoid structural redundancy and reduced motion accuracy caused by excessive stroke.

[0125] After receiving the positioning instruction from the control system, the positioning motor 251 is accurately started according to the preset program and parameters, rotates at the required speed and direction, and drives the positioning slide 252 to move forward and backward in a straight line. One end of the slide is firmly fixed with a positioning plate 253 by means of bolts or welding, so that the positioning plate 253 can move synchronously with the slide. The positioning plate 253 is a component that directly contacts the quartz crystal resonator 700. The choice of its material takes into account both the protection of the product and effective positioning. Generally, plastic or rubber-coated metal materials with moderate hardness, smooth surface and certain wear resistance are used. The shape of the positioning plate 253 is customized according to the outer contour of the quartz crystal resonator 700, and is usually designed to be compatible with the edge of the product, such as L-shaped, U-shaped, etc., so that when contacting the product, it can accurately apply force from multiple directions to push or adjust the position of the product.

[0126] During operation, the positioning plate 253 gradually approaches the quartz crystal resonator 700 as the positioning slide 252 moves. When it contacts the product, it uses the friction between itself and the product and the driving force transmitted by the slide to gently and accurately correct the position of the product on the temporary table 213, ensuring that its key position parameters such as center and angle meet the requirements of subsequent marking or inspection processes.

[0127] In one embodiment, a quartz crystal resonator 700 inspection and marking process, based on the above-mentioned quartz crystal resonator inspection and marking device 200, includes the following steps:

[0128] The first turntable 211 receives the quartz crystal resonator 700 output from the upstream process and performs an electrical parameter test on the quartz crystal resonator 700. Furthermore, before the electrical parameter test, the quartz crystal resonator 700 may be positioned.

[0129] At the exchange station 510 , the first turntable 211 transports the quartz crystal resonator 700 that has completed the electrical parameter test to the second turntable 212 ;

[0130] The second turntable 212 performs marking and front-view visual inspection on the quartz crystal resonators 700 it receives. Quartz crystal resonators 700 that fail the electrical parameter test or the front-view visual inspection are discarded. Furthermore, before marking, the presence of the quartz crystal resonator 700 can be checked. After the presence of the quartz crystal resonator 700 is detected, the quartz crystal resonator 700 is positioned. Before the front-view visual inspection, the presence of the quartz crystal resonator 700 can also be checked. After the presence of the quartz crystal resonator 700 is detected, the front-view visual inspection can be performed on it.

[0131] The quartz crystal resonator 700 that has passed the electrical parameter test and the front visual inspection is transported by the second turntable 212 to the first turntable 211 ;

[0132] At the exchange station 510, the first turntable 211 receives the quartz crystal resonator 700 released by the second turntable 212 and performs an insulation performance test and a bottom visual inspection on it. Quartz crystal resonators 700 that fail the insulation performance test or bottom visual inspection are discarded. Furthermore, before the second turntable 212 releases the quartz crystal resonator 700, it can also first detect the presence of the quartz crystal resonator 700. After the presence of the quartz crystal resonator 700 is detected, the first turntable 211 receives the quartz crystal resonator 700. Before the bottom visual inspection, the quartz crystal resonator 700 can also be positioned.

[0133] The quartz crystal resonator 700 that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable 211. Furthermore, before the quartz crystal resonator 700 is transported to the downstream process by the first turntable 211, it can also be inspected for the presence of the quartz crystal resonator 700. Only after the presence of the quartz crystal resonator 700 is detected can it be transported.

[0134] in,

[0135] After the suction nozzle 230 located at the exchange station 510 releases the quartz crystal resonator 700 to the temporary placement table 213 located at the exchange station 510, the first turntable 211 stops rotating and the second turntable 212 continues rotating until the next temporary placement table 213 rotates to the exchange station 510. After the suction nozzle 230 located at the exchange station 510 sucks the quartz crystal resonator 700 from the temporary placement table 213, the first turntable 211 starts rotating again, the next suction nozzle 230 rotates to the exchange station 510 and releases the quartz crystal resonator 700 to the temporary placement table 213, and the above operation is repeated.

[0136] At the beginning of use, there is no material on the second turntable 212. Therefore, after the suction nozzle 230 releases the quartz crystal resonator 700 at the exchange station 510, it cannot pick up the quartz crystal resonator 700 from the next temporary table 213. When the suction nozzle 230 on the first turntable 211 continues to release material to the temporary table 213 on the second turntable 212 until the temporary table 213 is full, at the exchange station 510, after the suction nozzle 230 releases the quartz crystal resonator 700, it can pick up the quartz crystal resonator 700 from the next temporary table 213. From this point on, after the suction nozzle 230 on the first turntable 211 releases a quartz crystal resonator 700 to the second turntable 212 each time, there is no need to wait for the quartz crystal resonator 700 to be marked and visually inspected from the front. A quartz crystal resonator 700 that has completed marking and visually inspected from the next temporary table 213 on the second turntable 212 can be directly picked up, and then driven to proceed to the subsequent process. After that, the processes on the first turntable 211 and the second turntable 212 are carried out synchronously and operate in coordination. The overall rhythm of the production line is greatly accelerated, and the number of products that can be processed per unit time is significantly increased. The entire process enters a continuous cycle state. The processes on the first turntable 211 and the second turntable 212 are closely coordinated and the above operations are repeated continuously according to the established process to ensure that the production line can stably and efficiently output qualified products.

[0137] This multi-step process ensures that the electrical parameters, marking quality, insulation performance, and appearance quality of the quartz crystal resonator 700 meet standards, thereby improving the overall quality and reliability of the product. The automated testing, marking, inspection, and packaging processes reduce manual intervention and improve production efficiency and consistency.

[0138] In this specification, the use of terms such as "Embodiment 1," "this embodiment," and "in one embodiment" indicates that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in the invention or at least one embodiment or example of the invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example; furthermore, the specific features, structures, materials, or characteristics described may be appropriately combined in any one or more embodiments or examples.

[0139] In the description of this specification, the terms "connect," "install," "fix," "dispose," and "have" are to be understood in a broad sense. For example, "connect" can mean a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0140] In the description of this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises", "comprising" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or apparatus comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising the element.

[0141] The above description of the embodiments is to facilitate ordinary technicians in this technical field to understand and apply the technology of this case. People familiar with the technology in this field can obviously make various modifications to these examples easily and apply the general principles described here to other embodiments without having to go through creative work. Therefore, this case is not limited to the above embodiments. Modifications to the following situations should all be within the scope of protection of this case: ① A new technical solution implemented based on the technical solution of the present invention and combined with existing common knowledge, the technical effect produced by the new technical solution does not exceed the technical effect of the present invention; ② The equivalent replacement of some features of the technical solution of the present invention with the known technology, the technical effect produced is the same as the technical effect of the present invention; ③ The technical solution of the present invention is expandable, and the substantive content of the expanded technical solution does not exceed the technical solution of the present invention; ④ The equivalent transformation made by the content of the description and drawings of the present invention is directly or indirectly applied to other related technical fields.

Claims

1. A quartz crystal resonator inspection and marking device, characterized in that: It includes a first turntable, a second turntable and an exchange station, wherein the first turntable and the second turntable are both indexing disks; The first turntable is provided with a plurality of suction nozzles uniformly distributed along its circumference. The first turntable can rotate about its axis and drive the plurality of suction nozzles to rotate synchronously. The suction nozzles are used to suck / release the quartz crystal resonator. The first turntable is provided with: a first positioning mechanism for positioning the quartz crystal resonator, a first testing mechanism for performing an electrical parameter test on the quartz crystal resonator, a second testing mechanism for performing an insulation performance test on the quartz crystal resonator, a third positioning mechanism for positioning the quartz crystal resonator, and a second testing mechanism for performing a bottom visual inspection on the quartz crystal resonator. The second turntable is provided with a plurality of temporary platforms for carrying quartz crystal resonators, and an air inlet is provided in the middle of the temporary platforms. The second turntable can rotate around its axis and drive the plurality of temporary platforms to rotate synchronously. The second turntable is provided with a second positioning mechanism for positioning the quartz crystal resonator, a marking mechanism for marking the quartz crystal resonator, and a first inspection mechanism for performing a frontal visual inspection of the quartz crystal resonator. The exchange station is located opposite the first turntable and the second turntable, and between the first testing mechanism and the second testing mechanism, and between the second positioning mechanism and the first detection mechanism; at the exchange station, the suction nozzle releases one of the quartz crystal resonators to the temporary placement table, and picks up one of the quartz crystal resonators from the next temporary placement table; The test mechanism 1 includes: a probe test mechanism mounting seat; a test probe, which is used to contact the electrode of the quartz crystal resonator and obtain an electrical parameter signal; a test probe board, which is arranged on the probe test mechanism mounting seat, and a plurality of the test probes are fixed and signal-connected on the test probe board, and the test probe board outputs the electrical parameter signal through the test probe board connecting wire; the test mechanism 2 includes one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacitance scanning tester; The first detection mechanism includes a mounting and adjusting bracket, a red light ring light source and a black and white camera mounted on the mounting and adjusting bracket, wherein the black and white camera is located directly above the red light ring light source; the red light ring light source emits light downwardly toward the quartz crystal resonator, and the black and white camera is used to capture an image of the quartz crystal resonator; The second detection mechanism includes a camera part and a light source irradiation part, the camera part includes a camera adjustment mount and a camera arranged on the camera adjustment mount, the camera adjustment mount is used to adjust the position and shooting angle of the camera; the light source irradiation part includes a light source mount, and a reflecting prism and an annular light source arranged on the light source mount, the reflecting prism reflects the light irradiated by the annular light source to the bottom of the quartz crystal resonator at 45 degrees to the camera, and the center of the camera and the center of the reflecting prism are on the same horizontal line; The positioning mechanism 1 and / or the positioning mechanism 3 each include a positioning motor 1 and a positioning cam mechanism that are transmission-connected, and four positioning claws arranged orthogonally, wherein the positioning motor 1 drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to correct the position of the quartz crystal resonator; The second positioning mechanism includes a positioning mounting seat, a second positioning motor and a positioning slide mounted on the positioning mounting seat, and a positioning piece fixedly connected to one end of the positioning slide. The second positioning motor drives the positioning slide to reciprocate and drives the positioning piece to reciprocate. The inspection marking device adopts a quartz crystal resonator inspection marking process, and the inspection marking process includes the following steps: The first turntable receives the quartz crystal resonator output from the upstream process and performs electrical parameter testing on it; At the exchange station, the first turntable transports the quartz crystal resonator that has completed the electrical parameter test to the second turntable; The second turntable performs marking and front visual inspection on the quartz crystal resonators received thereon, and the quartz crystal resonators that fail the electrical parameter test or the front visual inspection are discarded; The quartz crystal resonator that has passed the electrical parameter test and the front visual inspection is transported by the second turntable to the first turntable; At the exchange station, the first turntable receives the quartz crystal resonator released by the second turntable, and performs an insulation performance test and a bottom visual inspection on the quartz crystal resonator. The quartz crystal resonator that fails the insulation performance test or the bottom visual inspection is discarded; The quartz crystal resonator that has passed the insulation performance test and the bottom visual inspection is transported to the downstream process by the first turntable; wherein, S110, after the suction nozzle located at the exchange station releases the quartz crystal resonator to the temporary table located at the exchange station, S120, the first turntable stops rotating, and the second turntable continues rotating until the next temporary table rotates to the exchange station, S130, after the suction nozzle located at the exchange station sucks the quartz crystal resonator from the temporary table, S140, the first turntable starts rotating again, and the next suction nozzle rotates to the exchange station; repeat the operations of S110-S140.

2. The quartz crystal resonator inspection and marking device according to claim 1, characterized in that: A feeding station and a loading station are arranged in sequence between the positioning mechanism 1 and the detection mechanism 2 along the rotation direction of the first turntable. The suction nozzle rotated to the loading station absorbs the quartz crystal resonator output from the upstream process, and the suction nozzle rotated to the feeding station releases the qualified quartz crystal resonator to the downstream process.

3. The quartz crystal resonator inspection and marking device according to claim 2, characterized in that: A discarding mechanism 1 is further provided between the detection mechanism 1 of the second turntable and the exchange station, and a discarding mechanism 2 is further provided between the detection mechanism 2 of the first turntable and the feeding station; The quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is taken away and discarded by the discarding mechanism 1, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is taken away and discarded by the discarding mechanism 2.

4. The quartz crystal resonator inspection and marking device according to claim 3, characterized in that: Along the rotation direction of the second turntable, a material identification station 1 is provided between the exchange station and the second positioning mechanism, and / or a material identification station 2 is provided between the marking mechanism and the first detection mechanism, and / or a material identification station 3 is provided between the first discarding mechanism and the exchange station; and / or along the rotation direction of the first turntable, a material identification station 4 is provided between the second discarding mechanism and the feeding station; The inspection and marking equipment also includes an optical fiber detection mechanism, which is used to detect whether the quartz crystal resonator is on the material identification station 1, the material identification station 2, the material identification station 3 or the material identification station 4.

5. The quartz crystal resonator inspection and marking device according to any one of claims 1 to 4, characterized in that: The marking mechanism includes a marking adjustment mounting base with adjustable height and angle, a laser installed on the upper end of the marking adjustment mounting base, and a laser head installed at one end of the laser. The laser is used to generate a laser beam and emit it to the quartz crystal resonator through the laser head.

6. The quartz crystal resonator inspection and marking device according to claim 3 or 4, characterized in that: The first and second discarding mechanisms both include a second air nozzle and a collecting mechanism, the blowing force of the airflow ejected by the second air nozzle is greater than the suction force of the suction nozzle; the quartz crystal resonator that fails the electrical parameter test and / or the front visual inspection is blown into the collecting mechanism by the second air nozzle, and the quartz crystal resonator that fails the insulation performance test and / or the bottom visual inspection is blown into the collecting mechanism by the second air nozzle.

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