Method and system for testing service life of electrolytic capacitor, computer equipment and storage medium

Abstract

The invention relates to the technical field of electronic power, in particular to a service life test method and system for an electrolytic capacitor, computer equipment and a storage medium. The method comprises the steps of obtaining a bill of material unique code and a preset parameter of a target circuit board; determining a capacitance rated parameter of an electrolytic capacitor in the target circuit board according to the unique code of the bill of material; acquiring current and voltage measured values and thermal test measured data of the electrolytic capacitor; and determining the service life of the electrolytic capacitor according to the preset parameters, the capacitor rated parameters, the current and voltage actual measurement values and the thermal test actual measurement data. The electrolytic capacitor life determination efficiency is improved without manual operation, and the error rate and the cost are reduced.

Description

Technical Field

[0001] The present application relates to the field of electronic power technology, and in particular to a life test method, system, computer equipment and storage medium for an electrolytic capacitor. Background Art

[0002] During long-term use, the electrolyte of electrolytic capacitor components in existing circuit boards will be lost, thus affecting the service life of the product. Therefore, the service life of electrolytic capacitors is usually used to measure the service life of electronic products. Since the process of measuring the service life of electrolytic capacitors is complicated and involves a wide variety of parameters, it is necessary to manually extract and input multiple parameters, which is not only prone to errors, but also increases labor costs. Summary of the invention

[0003] In view of this, the embodiments of the present application provide a life test method, system, computer device and storage medium for an electrolytic capacitor, which can effectively solve the problems of low efficiency in determining the life of an electrolytic capacitor and high labor costs.

[0004] In a first aspect, an embodiment of the present application provides a life test method for an electrolytic capacitor, comprising:

[0005] Get the unique BOM code and preset parameters of the target circuit board;

[0006] Determining the capacitance rating parameters of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials;

[0007] Obtaining actual current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor;

[0008] The life of the electrolytic capacitor is determined according to the preset parameters, the rated parameters of the capacitor, the measured values ​​of the current and voltage, and the measured data of the thermal test.

[0009] In some embodiments, the capacitor rated parameter includes a capacitor rated voltage, and the current and voltage measured values ​​include voltage measured values;

[0010] The determining the life of the electrolytic capacitor according to the preset parameters, the rated parameters of the capacitor, the measured current and voltage values, and the measured data of the thermal test includes:

[0011] Determining a calculation rule corresponding to the life of the electrolytic capacitor according to the rated voltage of the capacitor and the measured voltage value;

[0012] Based on the calculation rule, the preset parameters, the capacitor rated parameters and the thermal test measured data, the life of the electrolytic capacitor is determined.

[0013] In some implementations, determining a calculation rule corresponding to the life of the electrolytic capacitor according to the rated voltage of the capacitor and the measured voltage value includes:

[0014] If the rated voltage of the capacitor is less than the first preset voltage, determining that the calculation rule corresponding to the life of the electrolytic capacitor is the first calculation rule;

[0015] If the rated voltage of the capacitor is not less than the first preset voltage, and the measured voltage value is greater than the second preset voltage, determining that the calculation rule corresponding to the life of the electrolytic capacitor is the second calculation rule;

[0016] If the rated voltage of the capacitor is not less than the first preset voltage and the measured voltage value is not greater than the second preset voltage, the calculation rule corresponding to the life of the electrolytic capacitor is determined to be the third calculation rule; wherein the second preset voltage is the product of the rated voltage of the capacitor and a preset derating factor, and the preset derating factor is greater than 0 and less than or equal to 1.

[0017] In some embodiments, the preset parameters include specifying a calculation operating temperature;

[0018] The current and voltage measured values ​​include the total ripple current measured value and the high-frequency ripple current measured value;

[0019] The thermal test measured data includes the measured surface temperature of the capacitor and the measured ambient temperature of the capacitor;

[0020] The rated parameters of the capacitor include the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the maximum rated ripple current design temperature rise, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor;

[0021] The determining of the life of the electrolytic capacitor based on the calculation rule, the preset parameters, the capacitor rated parameters and the thermal test measured data includes:

[0022] When the calculation rule is the first calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor;

[0023] When the calculation rule is the second calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor, the high-frequency ripple current frequency factor and the first preset frequency reduction coefficient; wherein the first preset frequency reduction coefficient is obtained according to the measured voltage value and the rated voltage of the capacitor;

[0024] When the calculation rule is the third calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor, the high-frequency ripple current frequency factor and the second preset frequency reduction factor.

[0025] In some embodiments, obtaining the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor includes:

[0026] Obtain a measured value graph of the first preset path and a thermal test report of the second preset path;

[0027] The current and voltage measured values ​​and the thermal test measured data are extracted from the measured value graph and the thermal test report respectively.

[0028] In some implementations, determining the capacitance rating parameter of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials includes:

[0029] Obtaining the electrolytic capacitor material specification sheet in the bill of materials corresponding to the target circuit board according to the unique code of the bill of materials;

[0030] Determine the capacitance rated parameters according to the electrolytic capacitor material specification.

[0031] In some embodiments, the preset parameters include a target life value; the capacitor rated parameters include a capacitor rated voltage; the current and voltage measured values ​​include a total ripple current measured value and a high-frequency ripple current measured value; the capacitor rated parameters include a capacitor rated life, a maximum rated ripple current, a temperature coefficient, a low-frequency ripple current frequency factor, and a high-frequency ripple current frequency factor;

[0032] The method further comprises:

[0033] Determining a maximum derated rated ripple current according to the maximum rated ripple current, the capacitor rated voltage and a preset derating factor;

[0034] Determining a maximum ripple current according to the maximum derated rated ripple current and the temperature coefficient;

[0035] Determining a normalized total ripple current according to the total ripple current measured value, the high-frequency ripple current measured value, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor;

[0036] If the life of the electrolytic capacitor is greater than the target life value and the maximum ripple current is greater than the normalized total ripple current, it is determined that the life test result of the electrolytic capacitor passes; otherwise, it is determined that the life test result of the electrolytic capacitor fails;

[0037] A test report is generated based on the preset parameters, the current and voltage measured values, the thermal test measured data, the capacitor rated parameters, the electrolytic capacitor life and the life test results.

[0038] In a second aspect, an embodiment of the present application provides a life test system for an electrolytic capacitor, comprising:

[0039] A first acquisition unit, used to acquire a unique code and preset parameters of a bill of materials of a target circuit board;

[0040] A determination unit, configured to determine a capacitance rating parameter of an electrolytic capacitor in the target circuit board according to the unique code of the bill of materials;

[0041] A second acquisition unit is used to obtain the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor;

[0042] A calculation unit is used to determine the life of the electrolytic capacitor based on the preset parameters, the capacitor rated parameters, the current and voltage measured values, and the thermal test measured data.

[0043] In a third aspect, an embodiment of the present application provides a computer device, comprising a processor and a memory, wherein the memory stores a computer program, and the processor is used to execute the computer program to implement the above-mentioned electrolytic capacitor life test method.

[0044] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program, which, when executed on a processor, implements the above-mentioned life test method for an electrolytic capacitor.

[0045] The embodiments of the present application have the following beneficial effects:

[0046] The present application proposes a life test method for an electrolytic capacitor, including: obtaining a unique bill of materials code and preset parameters of a target circuit board; determining the capacitance rated parameters of the electrolytic capacitor in the target circuit board according to the unique bill of materials code; obtaining the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor; determining the life of the electrolytic capacitor according to the preset parameters, the capacitance rated parameters, the current and voltage measured values, and the thermal test measured data. The present application determines the life of the electrolytic capacitor by automatically obtaining capacitance rated parameters and measured data, etc., without manual operation, thus reducing the error rate and cost. At the same time, the algorithm of the present application also effectively improves the accuracy of the life of the electrolytic capacitor. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0048] Figure 1 A first flow chart of a life test method for an electrolytic capacitor proposed in an embodiment of the present application is shown;

[0049] Figure 2 A second flow chart of the life test method of an electrolytic capacitor proposed in an embodiment of the present application is shown;

[0050] Figure 3 A voltage test value diagram of the life test method of an electrolytic capacitor proposed in an embodiment of the present application is shown;

[0051] Figure 4 A current test value diagram of the life test method of an electrolytic capacitor proposed in an embodiment of the present application is shown;

[0052] Figure 5 A third flow chart of the life test method of an electrolytic capacitor proposed in an embodiment of the present application is shown;

[0053] Figure 6 A structural schematic diagram of a life test system for an electrolytic capacitor proposed in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0054] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.

[0055] The components of the embodiments of the present application generally described and shown in the drawings herein may be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0056] Hereinafter, the terms "including", "having" and their cognates that can be used in various embodiments of the present application are intended only to indicate specific features, numbers, steps, operations, elements, components or a combination of the foregoing items, and should not be understood as first excluding the existence of one or more other features, numbers, steps, operations, elements, components or a combination of the foregoing items or increasing the possibility of one or more features, numbers, steps, operations, elements, components or a combination of the foregoing items. In addition, the terms "first", "second", "third" and the like are only used to distinguish descriptions and cannot be understood as indicating or implying relative importance.

[0057] Unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings as those generally understood by those skilled in the art to which the various embodiments of the present application belong. The terms (such as those defined in generally used dictionaries) will be interpreted as having the same meanings as the contextual meanings in the relevant technical field and will not be interpreted as having idealized meanings or overly formal meanings unless clearly defined in the various embodiments of the present application.

[0058] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0059] Generally, during long-term use of electrolytic capacitor components in circuit boards, high temperatures will cause the electrolyte to evaporate faster, so that the electrolyte will slowly drain away until the electrical performance of the electrolytic capacitor is reduced or fails, which may eventually cause product malfunction or failure, thus affecting the product's service life. Therefore, the life of the electrolytic capacitor is usually used to measure the service life of electronic products.

[0060] Parameters such as ripple current, thermal temperature, and voltage selection will affect the life of electrolytic capacitors. When calculating the life, it is necessary to manually look up capacitor specification parameters such as ripple current, rated life, rated ripple current, frequency factor, etc., and manually enter measured values ​​such as voltage, ripple current, and heat, and then calculate the electrolytic capacitor life value through specific derating rules and cumbersome life methods. Manually extracting the parameters required for calculation is not only time-consuming but also prone to errors. How to efficiently determine the life of electrolytic capacitors has become a technical problem that needs to be solved urgently. Not only that, how to effectively improve the accuracy of the electrolytic capacitor life while efficiently solving technical problems is also a technical problem that needs to be solved urgently.

[0061] Therefore, in order to solve the above problems, the present application proposes a life test method for an electrolytic capacitor.

[0062] The life test method of the electrolytic capacitor is described below in conjunction with some specific embodiments.

[0063] Figure 1 A flow chart of a life test method for an electrolytic capacitor according to an embodiment of the present application is shown. Exemplarily, the life test of the electrolytic capacitor includes the following steps:

[0064] Step S110, obtaining the unique BOM code and preset parameters of the target circuit board.

[0065] Specifically, the bill of materials refers to a list of all parts required to manufacture a printed circuit board (PCBA), usually called a BOM (Bill of Material). The list includes a detailed list of the required raw materials, components, and parts. For example, part number, name, quantity, manufacturer, or supplier information, etc.

[0066] Since the life of the electrolytic capacitor is tested, it is necessary to calculate the relevant parameters of the electrolytic capacitor. In general, the relevant parameters of the electrolytic capacitor are recorded in the corresponding BOM, so it is necessary to obtain the BOM of the target circuit board first. Among them, the circuit board with the electrolytic capacitor to be tested is used as the target circuit board. The target circuit board can be used in various electronic products, such as home gateway products, smart phones, tablets, computers, cars, etc. Among them, the preset parameters include the specified calculation operating temperature and the target life value. The specified calculation operating temperature refers to the specified working environment temperature of the product (that is, the temperature of the electrolytic capacitor life specified in the product requirement specification). For example, the user specifies that the 5-year life requirement is met at 25 degrees, and the calculation operating temperature is 25. The user specifies that the 3-year life requirement is met at 45 degrees, and the calculation operating temperature is 45. The target life value refers to the life value of the electrolytic capacitor that needs to be achieved.

[0067] Step S210: Determine the capacitance rating parameters of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials.

[0068] Capacitor rating parameters include capacitor rated life L o , Maximum rated operating temperature T o , Maximum rated ripple current I o 、Maximum rated ripple current design temperature rise △T o , temperature coefficient, low frequency ripple current frequency factor Kf Lo and high frequency ripple current frequency factor Kf Hi Among them, the maximum rated ripple current design temperature rise refers to the maximum rated ripple current I o For example, if the capacitor is a 105℃ product, then △T o =5° C. The electrolytic capacitor is a liquid electrolytic capacitor, for example, a liquid aluminum electrolytic capacitor, etc., which is not limited here.

[0069] Step S310, obtaining the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor.

[0070] In some embodiments, the current and voltage measured values ​​include the voltage measured value V x , Total ripple current measured value I xtotal and the measured value of high-frequency ripple current I xHi , where the total ripple current measured value and the high-frequency ripple current measured value are measured at ambient temperature. The thermal test measured data includes the capacitor measured surface temperature T c and the measured ambient temperature T of the capacitor a .

[0071] Step S410, determining the life of the electrolytic capacitor according to preset parameters, capacitor rated parameters, current and voltage measured values, and thermal test measured data.

[0072] After all the data are acquired, the life of the electrolytic capacitor is determined based on the data. In this embodiment, the accuracy of the life of the electrolytic capacitor can be effectively improved by acquiring more detailed data to determine the life of the electrolytic capacitor.

[0073] In some embodiments, Figure 2 As shown, the capacitor rated parameters include the capacitor rated voltage, and the current and voltage measured values ​​include the voltage measured values. According to the preset parameters, the capacitor rated parameters, the current and voltage measured values ​​and the thermal test measured data, the life of the electrolytic capacitor is determined, including:

[0074] Step S411: Determine a calculation rule corresponding to the life of the electrolytic capacitor according to the rated voltage of the capacitor and the measured voltage value.

[0075] Step S412: Determine the life of the electrolytic capacitor based on the calculation rules, preset parameters, capacitor rated parameters and thermal test measured data.

[0076] In some embodiments, since the rated voltage and the measured voltage of the electrolytic capacitor are different, the calculation formula and some constant coefficients for calculating the life of the electrolytic capacitor are different, so it is necessary to classify the calculation rules according to the rated voltage and the measured voltage of the capacitor. Among them, the constant coefficient refers to the coefficient used in the calculation process, and within a certain range, the coefficient is a constant and fixed in the calculation process.

[0077] In some embodiments, the calculation rule corresponding to the life of the electrolytic capacitor is determined according to the rated voltage of the capacitor and the measured voltage value, including:

[0078] If the rated voltage of the capacitor is less than the first preset voltage, the calculation rule corresponding to the life of the electrolytic capacitor is determined to be the first calculation rule.

[0079] If the rated voltage of the capacitor is not less than the first preset voltage, and the measured voltage value is greater than the second preset voltage, the calculation rule corresponding to the life of the electrolytic capacitor is determined to be the second calculation rule.

[0080] If the rated voltage of the capacitor is not less than the first preset voltage and the actual measured voltage is not greater than the second preset voltage, the calculation rule corresponding to the life of the electrolytic capacitor is determined to be the third calculation rule; wherein the second preset voltage is the product of the rated voltage of the capacitor and the preset derating factor, and the preset derating factor is greater than 0 and less than or equal to 1.

[0081] It should be noted that the first preset voltage can be used to distinguish the type of capacitor, for example, to distinguish whether the capacitor is a patch type or a bullhorn type. The second preset voltage is used to distinguish the working state of the current capacitor. For example, if it is greater than the second preset voltage, it is determined that the capacitor is in a limit working state; if it is not greater than the second preset voltage, it is determined that the capacitor is not in a limit working state. Because the life of the capacitor does not change along the same curve when it is in different working states, it is necessary to determine the calculation method of the capacitor life according to the working state of the capacitor.

[0082] Optionally, the first preset voltage has a value range of 150V to 160V, and the second preset voltage has a value range of 60% to 80% of the rated voltage. Of course, this is just an example, and other value ranges are possible, depending on the specific application situation, and there is no limitation here.

[0083] In some embodiments, the preset parameters include a specified calculated operating temperature. The measured current and voltage values ​​include a total ripple current measured value I xtotal and the measured value of high-frequency ripple current I xHi The measured data of thermal test include the measured surface temperature T of capacitor c and the measured ambient temperature T of the capacitora The rated parameters of the capacitor include the rated life L o , Maximum rated operating temperature T o , Maximum rated ripple current I o 、Maximum rated ripple current design temperature rise △T o , low frequency ripple current frequency factor Kf Lo and high frequency ripple current frequency factor Kf Hi .

[0084] Determine the life of electrolytic capacitors based on calculation rules, preset parameters, capacitor rating parameters, and thermal test measured data, including:

[0085] When the calculation rule is the first calculation rule, based on the rated life of the capacitor L o , Maximum rated operating temperature T o , Maximum rated ripple current I o , specify the calculation working temperature T calculated , Capacitor measured surface temperature T c , Capacitor measured ambient temperature T a 、Maximum rated ripple current design temperature rise △T o , Total ripple current measured value I xtotal , high frequency ripple current measured value I xHi , low frequency ripple current frequency factor Kf Lo and high frequency ripple current frequency factor Kf Hi , determine the life of the electrolytic capacitor L y .

[0086] When the calculation rule is the second calculation rule, based on the rated life of the capacitor L o , Maximum rated operating temperature T o , Maximum rated ripple current I o , specify the calculation working temperature T calculated , Capacitor measured surface temperature T c , Capacitor measured ambient temperature T a 、Maximum rated ripple current design temperature rise △T o , Total ripple current measured value I xtotal , high frequency ripple current measured value I xHi , low frequency ripple current frequency factor Kf Lo , high frequency ripple current frequency factor I xHi and the first preset frequency reduction coefficient K y1 , determine the life of the electrolytic capacitor L y ; Among them, the first preset frequency reduction coefficient is obtained according to the actual measured voltage value and the rated voltage of the capacitor.

[0087] When the calculation rule is the third calculation rule, based on the rated life of the capacitor L o, Maximum rated operating temperature T o , Maximum rated ripple current I o , specify the calculation working temperature T calculated , Capacitor measured surface temperature T c , Capacitor measured ambient temperature T a 、Maximum rated ripple current design temperature rise △T o , Total ripple current measured value I xtotal , high frequency ripple current measured value I xHi , low frequency ripple current frequency factor Kf Lo , high frequency ripple current frequency factor I xHi and the second preset frequency reduction coefficient K y2 , determine the life of the electrolytic capacitor L y .

[0088] It is understandable that the maximum area in each calculation rule includes a preset frequency reduction coefficient. There is no preset frequency reduction coefficient in the first calculation rule. The preset frequency reduction coefficients in the second calculation rule and the third calculation rule are different. However, the first preset frequency reduction coefficient in the second calculation rule is a variable value related to the actual measured voltage value and the rated voltage of the capacitor, and the second preset frequency reduction coefficient in the third calculation rule is a constant value.

[0089] Optionally, the first preset frequency reduction factor Among them, a1 and k2 are constants.

[0090] Optionally, when the calculation rule is the first calculation rule, the calculation formula for determining the life of the electrolytic capacitor may be:

[0091]

[0092] Among them, a3 is a preset value, and the specific value can be determined according to the capacitor specification, and there is no restriction here. For example, a3 can be 5.

[0093] Where, Tx = Tc-Ta + Tcalculated,

[0094] in,

[0095] Among them, T x represents the expected surface temperature at the specified calculated operating temperature, △T x Indicates the temperature rise of the capacitor core caused by the ripple current under the working conditions of the device; I xLo Represents the low-frequency ripple current calculated at ambient temperature; I x Represents the normalized total ripple current at low frequency at ambient temperature.

[0096] Optionally, when the calculation rule is the second calculation rule, the calculation formula for determining the life of the electrolytic capacitor may be:

[0097]

[0098] Among them, a3 and a4 are both preset values, which can be determined according to the capacitor specifications. There is no limitation here. Optionally, for example, a3 can be 8 and a4 can be 4.4.

[0099] Optionally, when the calculation rule is the third calculation rule, the calculation formula for determining the life of the electrolytic capacitor may be:

[0100]

[0101] Among them, a3 and a4 are both preset values, which can be determined according to the capacitor specifications. There is no limitation here. Optionally, for example, a3 can be 8, a4 can be 4.4, and K2 can be 1.25.

[0102] In some embodiments, obtaining the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor includes:

[0103] Obtain a measured value graph of the first preset path and a thermal test report of the second preset path; and extract current and voltage measured values ​​and thermal test measured data from the measured value graph and the thermal test report, respectively.

[0104] It should be noted that the measured value graph and the thermal test report need to be tested by corresponding test equipment, so these data are generally extracted from the graph and the report manually. In this embodiment, by automatically obtaining the measured value graph and the thermal test report and extracting corresponding data therefrom, the labor cost and the error rate can be reduced.

[0105] It is understandable that the above voltage test values, total ripple current measured values ​​and high-frequency ripple current measured values ​​are extracted from the measured value diagram, which can be referred to Figure 3 to Figure 4 ( Figure 3 The voltage measured value diagram is Figure 4 is the current measured value diagram), Figure 3 The horizontal axis in Figure 4 is time, and the vertical axis is voltage amplitude value; the horizontal axis in Figure 5 is time, and the vertical axis is current amplitude value. The above-mentioned measured surface temperature of the capacitor and the measured ambient temperature of the capacitor are extracted from the thermal test report.

[0106] In some implementations, determining the capacitance rating of an electrolytic capacitor in a target circuit board according to a unique code of the bill of materials includes:

[0107] Obtain the electrolytic capacitor material specification sheet in the bill of materials corresponding to the target circuit board according to the unique code of the bill of materials; then, determine the capacitor rated parameters according to the electrolytic capacitor material specification sheet.

[0108] It should be noted that usually, it is necessary to manually search and download the corresponding bill of materials according to the unique code of the bill of materials, and obtain the corresponding capacitance rated parameters from the bill of materials. However, this embodiment can find the corresponding electrolytic capacitor material specification sheet through the unique code of the bill of materials, and extract the capacitance rated parameters from it. It can reduce labor costs and reduce error rates.

[0109] It is understandable that the above-mentioned capacitor rated life, maximum rated operating temperature, maximum rated ripple current, maximum rated ripple current design temperature rise, low-frequency ripple current frequency factor and high-frequency ripple current frequency factor are extracted from the electrolytic capacitor material specification sheet.

[0110] In some embodiments, the preset parameters include a target life value; the capacitor rated parameters include a capacitor rated voltage; the current and voltage measured values ​​include a total ripple current measured value and a high-frequency ripple current measured value; the capacitor rated parameters include a capacitor rated life, a temperature coefficient, a low-frequency ripple current frequency factor, and a high-frequency ripple current frequency factor.

[0111] like Figure 5 As shown, the life test method of electrolytic capacitors also includes:

[0112] Step S510: According to the maximum rated ripple current I o , capacitor rated voltage V o And preset derating factor K j , determine the maximum derated rated ripple current I o '.

[0113] In some embodiments, the preset derating factor is determined according to the rated voltage of the capacitor. Optionally, if the rated life of the capacitor is less than the preset rated life threshold, the preset derating factor is determined to be a first preset derating factor; if the rated life of the capacitor is not less than the preset rated life threshold, the preset derating factor is determined to be a second preset derating factor. The product of the preset derating factor and the maximum rated ripple current is used as the maximum derated rated ripple current.

[0114] For example, if the rated voltage V o When the voltage is less than 200V, the preset derating factor K is determined. j is 80%, that is, the maximum derated rated ripple current I o '=I o *0.8; if the rated voltage V o When the voltage is greater than 200V, the preset derating factor K is determined. j is 1, that is, I o '=I o .

[0115] Step S520: determine the maximum ripple current according to the maximum derated rated ripple current and the temperature coefficient.

[0116] In some implementations, the product of the maximum derated rated ripple current and the temperature coefficient is used as the maximum ripple current, wherein the maximum ripple current refers to the maximum ripple current allowed by the capacitor at the highest operating temperature.

[0117] Step S530: determining a normalized total ripple current according to the total ripple current measured value, the high-frequency ripple current measured value, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor.

[0118] It can be understood that the normalized total ripple current I x Please refer to the above calculation method of normalized total ripple current, which will not be repeated here.

[0119] Step S540: If the life of the electrolytic capacitor is greater than the target life value and the maximum ripple current is greater than the normalized total ripple current, it is determined that the life test result of the electrolytic capacitor passes; otherwise, it is determined that the life test result of the electrolytic capacitor fails.

[0120] It should be noted that if the life of the electrolytic capacitor is not greater than the target life value, or the maximum ripple current is not greater than the normalized total ripple current, it is determined that the life test result of the electrolytic capacitor has failed.

[0121] Step S550: Generate a test report based on preset parameters, current and voltage measured values, thermal test measured data, capacitor rated parameters, electrolytic capacitor life and life test results.

[0122] Optionally, preset parameters, current and voltage measured values, thermal test measured data, capacitor rated parameters, electrolytic capacitor life and life test results, etc. can be filled into a preset created table to generate a test report in a table form. Of course, test reports can also be generated in other forms, which are not limited here.

[0123] The present application proposes a life test method for an electrolytic capacitor, including: obtaining a unique bill of materials code and preset parameters of a target circuit board; determining the capacitance rated parameters of the electrolytic capacitor in the target circuit board according to the unique bill of materials code; obtaining the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor; determining the life of the electrolytic capacitor according to the preset parameters, capacitance rated parameters, current and voltage measured values, and thermal test measured data. The present application determines the life of the electrolytic capacitor by automatically obtaining capacitance rated parameters and measured data, etc., without manual operation, thus reducing the error rate and cost, and at the same time, the algorithm of the present application also effectively improves the accuracy of the life of the electrolytic capacitor.

[0124] Another embodiment of the present application also provides a life test system 600 for an electrolytic capacitor. Figure 6As shown, the life test system 600 includes:

[0125] The first acquisition unit 610 is used to acquire the unique BOM code and preset parameters of the target circuit board.

[0126] The determination unit 620 is used to determine the capacitance rating parameters of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials.

[0127] The second acquisition unit 630 is used to acquire the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor.

[0128] The calculation unit 640 is used to determine the life of the electrolytic capacitor according to preset parameters, capacitor rated parameters, current and voltage measured values, and thermal test measured data.

[0129] It can be understood that the various units of this embodiment are used to execute the life test method of the above embodiment, and the options in the above embodiment are also applicable to this embodiment, so they will not be described repeatedly here.

[0130] Another embodiment of the present application further provides a computer device, which includes a processor and a memory, wherein the memory stores a computer program, and the processor is used to execute the computer program to implement the above-mentioned electrolytic capacitor life test method.

[0131] It can be understood that the computer device execution method of this embodiment corresponds to the life test method of the above embodiment, and the options in the above embodiment are also applicable to this embodiment, so they will not be repeated here.

[0132] Among them, the processor can be an integrated circuit chip with signal processing capabilities. The processor can be a general-purpose processor, including a central processing unit (CPU), a graphics processing unit (GPU) and a network processor (NP), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or at least one of other programmable logic devices, discrete gates or transistor logic devices, and discrete hardware components. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc., which can implement or execute the disclosed methods, steps and logic block diagrams in the embodiments of the present application.

[0133] The memory may be, but is not limited to, a random access memory (RAM), a read only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc. The memory is used to store a computer program, and the processor may execute the computer program accordingly after receiving an execution instruction.

[0134] The present application also provides a computer-readable storage medium for storing the computer program used in the above-mentioned computer device. For example, the computer-readable storage medium may include, but is not limited to, various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0135] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are merely schematic. For example, the flowcharts and structure diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, a program segment or a part of a code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in an alternative implementation, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the structure diagram and / or the flow diagram, and the combination of boxes in the structure diagram and / or the flow diagram, can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0136] In addition, the functional modules or units in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0137] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a smart phone, a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in the various embodiments of the present application.

[0138] The above description is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application.

Claims

1. A life test method for an electrolytic capacitor, characterized in that: include: Get the unique BOM code and preset parameters of the target circuit board; Determining the capacitance rating parameters of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials; Obtaining actual current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor; The life of the electrolytic capacitor is determined according to the preset parameters, the rated parameters of the capacitor, the measured values ​​of the current and voltage, and the measured data of the thermal test.

2. The life test method of an electrolytic capacitor according to claim 1, characterized in that: The capacitor rated parameters include the capacitor rated voltage, and the current and voltage measured values ​​include the voltage measured values; The determining the life of the electrolytic capacitor according to the preset parameters, the rated parameters of the capacitor, the measured current and voltage values, and the measured data of the thermal test includes: Determining a calculation rule corresponding to the life of the electrolytic capacitor according to the rated voltage of the capacitor and the measured voltage value; Based on the calculation rule, the preset parameters, the capacitor rated parameters and the thermal test measured data, the life of the electrolytic capacitor is determined.

3. The life test method of an electrolytic capacitor according to claim 2, characterized in that: The step of determining a calculation rule corresponding to the life of the electrolytic capacitor according to the rated voltage of the capacitor and the measured voltage value includes: If the rated voltage of the capacitor is less than the first preset voltage, determining that the calculation rule corresponding to the life of the electrolytic capacitor is the first calculation rule; If the rated voltage of the capacitor is not less than the first preset voltage, and the measured voltage value is greater than the second preset voltage, determining that the calculation rule corresponding to the life of the electrolytic capacitor is the second calculation rule; If the rated voltage of the capacitor is not less than the first preset voltage and the measured voltage value is not greater than the second preset voltage, the calculation rule corresponding to the life of the electrolytic capacitor is determined to be the third calculation rule; wherein the second preset voltage is the product of the rated voltage of the capacitor and a preset derating factor, and the preset derating factor is greater than 0 and less than or equal to 1.

4. The life test method of an electrolytic capacitor according to claim 3, characterized in that: The preset parameters include specifying the calculation working temperature; The current and voltage measured values ​​include the total ripple current measured value and the high-frequency ripple current measured value; The thermal test measured data includes the measured surface temperature of the capacitor and the measured ambient temperature of the capacitor; The rated parameters of the capacitor include the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the maximum rated ripple current design temperature rise, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor; The determining of the life of the electrolytic capacitor based on the calculation rule, the preset parameters, the capacitor rated parameters and the thermal test measured data includes: When the calculation rule is the first calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor; When the calculation rule is the second calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor, the high-frequency ripple current frequency factor and the first preset frequency reduction coefficient; wherein the first preset frequency reduction coefficient is obtained according to the measured voltage value and the rated voltage of the capacitor; When the calculation rule is the third calculation rule, the life of the electrolytic capacitor is determined based on the rated life of the capacitor, the maximum rated operating temperature, the maximum rated ripple current, the specified calculated operating temperature, the measured surface temperature of the capacitor, the measured ambient temperature of the capacitor, the maximum rated ripple current design temperature rise, the measured value of the total ripple current, the measured value of the high-frequency ripple current, the low-frequency ripple current frequency factor, the high-frequency ripple current frequency factor and the second preset frequency reduction factor.

5. The life test method of electrolytic capacitor according to claim 1, characterized in that: The obtaining of the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor includes: Obtain a measured value graph of the first preset path and a thermal test report of the second preset path; The current and voltage measured values ​​and the thermal test measured data are extracted from the measured value graph and the thermal test report respectively.

6. The life test method of an electrolytic capacitor according to claim 1, characterized in that: The step of determining the capacitance rating parameter of the electrolytic capacitor in the target circuit board according to the unique code of the bill of materials includes: Obtaining the electrolytic capacitor material specification sheet in the bill of materials corresponding to the target circuit board according to the unique code of the bill of materials; Determine the capacitance rated parameters according to the electrolytic capacitor material specification.

7. The life test method of an electrolytic capacitor according to claim 1, characterized in that: The capacitor rated parameters include the capacitor rated voltage; the preset parameters include the target life value; the current and voltage measured values ​​include the total ripple current measured value and the high-frequency ripple current measured value; the capacitor rated parameters include the capacitor rated life, the maximum rated ripple current, the temperature coefficient, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor; The method further comprises: Determining a maximum derated rated ripple current according to the maximum rated ripple current, the capacitor rated voltage and a preset derating factor; Determining a maximum ripple current according to the maximum derated rated ripple current and the temperature coefficient; Determining a normalized total ripple current according to the total ripple current measured value, the high-frequency ripple current measured value, the low-frequency ripple current frequency factor and the high-frequency ripple current frequency factor; If the life of the electrolytic capacitor is greater than the target life value and the maximum ripple current is greater than the normalized total ripple current, it is determined that the life test result of the electrolytic capacitor passes; otherwise, it is determined that the life test result of the electrolytic capacitor fails; A test report is generated based on the preset parameters, the current and voltage measured values, the thermal test measured data, the capacitor rated parameters, the electrolytic capacitor life and the life test results.

8. A life test system for electrolytic capacitors, characterized in that: include: A first acquisition unit, used to acquire a unique code and preset parameters of a bill of materials of a target circuit board; A determination unit, configured to determine a capacitance rating parameter of an electrolytic capacitor in the target circuit board according to the unique code of the bill of materials; A second acquisition unit is used to obtain the current and voltage measured values ​​and thermal test measured data of the electrolytic capacitor; A calculation unit is used to determine the life of the electrolytic capacitor based on the preset parameters, the capacitor rated parameters, the current and voltage measured values, and the thermal test measured data.

9. A computer device, characterized in that: The computer device comprises a processor and a memory, wherein the memory stores a computer program, and the processor is used to execute the computer program to implement the life test method of the electrolytic capacitor according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The device stores a computer program, which, when executed on a processor, implements the life test method for an electrolytic capacitor according to any one of claims 1 to 7.

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