Closed test section direction probe angle adjusting mechanism

Abstract

The invention discloses a closed test section direction probe angle adjusting mechanism which comprises a direction probe and further comprises a test section with the two ends open in the axial direction, a plenum chamber located below the test section and a probe supporting mechanism installed in the plenum chamber, the probe supporting mechanism is used for being connected with the direction probe, and the direction probe is located in the test section; the probe supporting mechanism comprises a pitch angle adjusting mechanism and a sideslip angle adjusting mechanism, the pitch angle adjusting mechanism is used for adjusting the pitch angle of the direction probe, and the sideslip angle adjusting mechanism is used for adjusting the sideslip angle of the direction probe. The invention provides a closed test section direction probe angle adjusting mechanism, and aims to solve the problem that a direction probe adjusting mechanism in the prior art cannot be matched with a closed test section wind tunnel and cannot be used in the closed test section wind tunnel. The calibration operation of the direction probe can be carried out in the wind tunnel of the closed test section, and the calibration precision of the direction probe is improved.

Description

Technical Field

[0001] The invention relates to the field of wind tunnel flow field parameter measurement, and in particular to a closed test section direction probe angle adjustment mechanism. Background Art

[0002] A directional probe is an aerodynamic probe that measures the parameters of a three-dimensional flow field. It can be used to obtain parameter information such as airflow velocity, airflow direction, total pressure, and static pressure in a three-dimensional flow field. It has good rigidity and machinability and is widely used in aerodynamic-related tests and technical research. For example, in the aviation field, directional probe test data is an important reference for correcting aircraft navigation angle parameters; in the aeroengine field, directional probes are the main method for obtaining inter-stage airflow parameters of blades; in the field of wind tunnel tests, directional probe test data is the basis for assessing airflow deflection indicators. The above fields all have high requirements for the test accuracy of directional probes, and calibration is required to ensure data accuracy. At the same time, each pressure measuring hole of the directional probe actually has different mechanical properties due to processing factors. Each pressure measuring hole has different aerodynamic characteristics as the airflow conditions change. In order to ensure the quality of the test data, each probe must be strictly calibrated.

[0003] The calibration of directional probes in the prior art is mostly carried out in wind tunnels with open test sections, and the corresponding probe angle adjustment mechanism is also designed based on the open test section and normal temperature, and cannot be used in wind tunnels with closed test sections. Calibration of directional probes based on wind tunnels with open test sections has the advantages of being free from space restrictions and easy installation. However, due to the characteristics of wind tunnels with open test sections, they cannot achieve temperature and pressure regulation functions, and the wind speed is limited to a relatively low level, and cannot increase transonic or supersonic wind speeds.

[0004] During the research process, the inventor team of this case found that the calibration of the directional probe has a strong correlation with the Mach number of the flow field, and the Mach number is the derived result of the flow field pressure, temperature, and speed. Therefore, each probe needs to carry out calibration tests of different pressure, temperature, and velocity flow fields under different angle conditions to improve the calibration accuracy. The number of calibration points ranges from hundreds to thousands. The calibration workload is very large. When using the adjustment mechanism based on the open test section wind tunnel in the prior art, there are at least the following limitations: First, the flow field temperature of the open test section wind tunnel is at room temperature, and the calibration result cannot correct the error caused by high and low temperature changes; second, the wind speed of the flow field in the open test section wind tunnel is much lower than that of the closed test section flow field, resulting in a limited range of directional probe wind speed calibration; third, the open test section wind tunnel cannot adjust the pressure, and the directional probe calibration under the pressure change state cannot be achieved.

[0005] Therefore, if the direction probe can be calibrated based on a closed test section wind tunnel, the calibration accuracy can be significantly improved. However, the direction probe adjustment mechanisms in the prior art are not compatible with closed test section wind tunnels and cannot be used in closed test section wind tunnels. Summary of the invention

[0006] The present invention provides a closed test section directional probe angle adjustment mechanism to solve the problem in the prior art that the directional probe adjustment mechanism cannot be adapted to a closed test section wind tunnel and cannot be used in a closed test section wind tunnel, thereby achieving the purpose of being able to carry out directional probe calibration operations in the closed test section wind tunnel and improving the directional probe calibration accuracy.

[0007] The present invention is achieved through the following technical solutions: A closed test section direction probe angle adjustment mechanism comprises a direction probe, a test section open at both ends along the axial direction, a stationary chamber located below the test section, and a probe support mechanism installed in the stationary chamber, wherein the probe support mechanism is used to connect the direction probe, and the direction probe is located in the test section; the probe support mechanism comprises a pitch angle adjustment mechanism and a sideslip angle adjustment mechanism, wherein the pitch angle adjustment mechanism is used to adjust the pitch angle of the direction probe, and the sideslip angle adjustment mechanism is used to adjust the sideslip angle of the direction probe.

[0008] In view of the problem that the direction probe adjustment mechanism in the prior art cannot be adapted to and cannot be used in a closed test section wind tunnel, the present invention proposes a closed test section direction probe angle adjustment mechanism, wherein the test section and the stationary chamber are distributed up and down, the direction probe is located in the test section and supported by a probe supporting mechanism, the probe supporting mechanism is installed in the stationary chamber, and the pitch angle of the direction probe is adjusted by the pitch angle adjustment mechanism therein, and the sideslip angle of the direction probe is adjusted by the sideslip angle adjustment mechanism therein.

[0009] When the present application is used specifically, the test section is connected to the wind tunnel of the existing closed test section, so that the flow channel size in the test section and the mechanical interface between the test section and the upstream and downstream sections are consistent with the existing closed test section wind tunnel. The calibrated direction probe is installed on the probe support mechanism, and the wind tunnel test is started after the initial pitch angle and the initial sideslip angle are obtained. During the test, the pitch angle and the sideslip angle are flexibly adjusted as needed to achieve rapid measurement of a large number of calibration points, which significantly reduces the calibration workload. At the same time, compared with the prior art, the present application can be adapted to the wind tunnel of the closed test section and can be used in the wind tunnel of the closed test section, overcoming the defect that the prior art can only be calibrated at normal temperature, normal pressure and relatively low wind speed, and can realize the calibration of the direction probe under different temperatures, different pressures, and a wider wind speed state, significantly improving the calibration accuracy of the direction probe, and is conducive to broadening the use environment and operating conditions of the direction probe.

[0010] Furthermore, the probe support mechanism also includes a support rod and a probe clamping device connected to the top of the support rod, and the probe clamping device is used to clamp the direction probe. In this solution, the probe clamping device is located in the test section, and the support rod is partially located in the test section and partially located in the station room.

[0011] Furthermore, the support rod is a hollow structure, and a perforation is provided on the top side wall of the support rod. The directional probe needs to be connected to an air hose during use. In this solution, the air hose is inserted into the top of the support rod through the perforation, and is led out through the hollow support rod and finally passes through the stationary chamber. This setting can reduce the interference of the air hose of the directional probe on the flow field of the closed test section wind tunnel, and at the same time avoid the air hose being exposed in large quantities in the wind tunnel under high-speed flow fields (such as transonic or supersonic wind speeds) to cause adverse conditions such as shaking, thereby improving the calibration accuracy.

[0012] Furthermore, the probe clamping device includes a connecting block, a clamping head and a rectifier head detachably connected to the opposite ends of the connecting block; the top end of the support rod is connected to the connecting block, the clamping head is used to clamp the direction probe, and the connecting block and the rectifier head are both provided with through holes for the direction probe to pass through.

[0013] When the present solution is used, the head of the direction probe is inserted into the rectifier, the connecting block and the clamping head in sequence, and the direction probe is clamped by the clamping head. Among them, the rectifier can be implemented by any existing rectifier structure, and the clamping head can be implemented by any existing clamping method, which are not specifically limited here. In the present solution, the clamping head and the rectifier are both detachably connected to the connecting block, so the clamping head and the rectifier head of different specifications or sizes can be flexibly replaced as needed, which is conducive to adapting to the calibration and use of direction probes with different outer diameters, different lengths or different shapes, and can conveniently realize the installation and disassembly of the direction probe. Since the connecting block is relatively fixed compared to the support rod, the different direction probes can also maintain a relatively stable position with the connecting block after installation, which is conducive to ensuring that the different direction probes have a high coaxiality after installation, thereby improving the calibration consistency.

[0014] Furthermore, a first mounting surface is set on the top of the connecting block, and a second mounting surface is set on the side wall of the connecting block, and the first mounting surface and the second mounting surface are perpendicular to each other; a level can be detachably connected to the first mounting surface, and an extension rod can be detachably connected to the second mounting surface, and the length direction of the extension rod is parallel to the axial direction of the through hole, and a first reflector positioning device for connecting a reflector is set at one end of the extension rod away from the connecting block.

[0015] The first mounting surface and the second mounting surface in this scheme are both planes; the first mounting surface is used to install a spirit level to facilitate the initial installation of the direction probe; the second mounting surface is used to install an extension rod, which extends toward the end of the direction probe, and a reflector can be temporarily connected to it, which, in conjunction with an external collimator, can provide a guarantee for obtaining an initial sideslip angle.

[0016] Furthermore, the pitch angle adjustment mechanism includes an arc-shaped guide rail, a slider slidably cooperated with the arc-shaped guide rail, and a first power mechanism for driving the slider to slide along the arc-shaped guide rail; the support rod is arc-shaped, and the center of the support rod and the center of the arc-shaped guide rail are both located on the axis of the test section.

[0017] In this solution, the slider is driven to make circular motion along the arc-shaped guide rail by the first power mechanism, thereby driving the support rod to make circular motion synchronously, thereby adjusting the pitch angle of the direction probe. In addition, the support rod and the arc-shaped guide rail in this solution are both arc-shaped structures and the two are coaxial, which is conducive to ensuring that the head position of the direction probe remains unchanged during the operation of the pitch angle adjustment mechanism, thereby ensuring that the probe head is always located at the core flow of the device test section. Among them, the first power mechanism can drive the slider to slide along the arc-shaped guide rail by any existing method, and its specific driving method is not specifically limited here, as long as the driving accuracy meets the set requirements.

[0018] Furthermore, the sideslip angle adjustment mechanism includes a turntable, a second power mechanism for driving the turntable to rotate, and a mounting frame located on the turntable, and the arc-shaped guide rail is connected to the mounting frame.

[0019] In this solution, the turntable is driven to rotate by the second power mechanism, which drives the mounting frame, the arc guide rail and the support rod to rotate synchronously, thereby realizing the adjustment of the sideslip angle of the direction probe. The second power mechanism can drive the turntable to rotate by any existing method, and its specific driving method is not specifically limited here, as long as the driving accuracy meets the set requirements.

[0020] Furthermore, a second reflector positioning device is provided on the side wall of the test section, and the second reflector positioning device is used to connect the reflector to the inner wall of the test section.

[0021] Before starting the calibration, a reflector may be temporarily connected at the second reflector positioning device to cooperate with an external collimator to provide a guarantee for obtaining an initial sideslip angle.

[0022] The first reflector positioning device and the second reflector positioning device in the present application can be implemented by any existing device that can temporarily connect the reflector, and no specific limitation is made here.

[0023] Furthermore, an observation window is provided on the surface of the test section. When obtaining the initial sideslip angle of the directional probe, it is necessary to cooperate with the collimator outside the mechanism. Therefore, the existence of the observation window can ensure that the optical path between the collimator and the reflector inside the test section is unobstructed, avoiding the use of complex optical path design and reducing the difficulty of installation and initialization of this application. In addition, the existence of the observation window can also facilitate the staff to observe the internal situation of the test section with the naked eye before and after calibration, and promptly discover fault conditions.

[0024] Furthermore, a heat preservation device located outside the test section and / or the station room is included to meet the calibration requirements of the present application at high or low temperatures, which is conducive to ensuring the stability of the temperature field in the test area. Any existing external heat preservation means can be applied to the heat preservation device of the present application.

[0025] Compared with the prior art, the present invention has at least the following advantages and beneficial effects: 1. The invention discloses a closed test section directional probe angle adjustment mechanism, which can be matched with and used in the wind tunnel of the closed test section, and overcomes the defect of the prior art that calibration can only be performed at normal temperature, normal pressure and relatively low wind speed, and can realize the calibration of the directional probe under different temperatures, different pressures and a wider wind speed state, thus significantly improving the calibration accuracy of the directional probe and being conducive to broadening the use environment and operating conditions of the directional probe.

[0026] 2. The closed-end test section direction probe angle adjustment mechanism of the present invention can flexibly adjust the pitch angle and sideslip angle as needed during the test, thereby realizing rapid measurement of a large number of calibration points and significantly reducing the calibration workload.

[0027] 3. The closed-end test section directional probe angle adjustment mechanism of the present invention can reduce the interference of the air path hose of the directional probe on the closed-end test section wind tunnel flow field, while avoiding the adverse working conditions such as shaking caused by a large amount of air path hose exposed in the wind tunnel under high-speed flow field, thereby improving the calibration accuracy.

[0028] 4. The closed test section directional probe angle adjustment mechanism of the present invention can adapt to the calibration of directional probes with different outer diameters, different lengths or different shapes, and can conveniently realize the installation and disassembly of the directional probes, which is beneficial to ensure that the different directional probes have high coaxiality after installation, thereby improving the calibration consistency.

[0029] 5. The closed-end test section directional probe angle adjustment mechanism of the present invention can simply and conveniently obtain the initial installation angle of the directional probe, which is convenient for angle correction during the calibration process of the directional probe.

[0030] 6. The closed test section directional probe angle adjustment mechanism of the present invention can ensure that the directional probe head is always located at the core flow of the test section during the angle adjustment process. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The drawings described herein are used to provide a further understanding of the embodiments of the present invention, constitute a part of this application, and do not constitute a limitation of the embodiments of the present invention. In the drawings: Figure 1 It is a structural schematic diagram of a specific embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of a specific embodiment of the present invention without the heat preservation device; Figure 3 It is a structural schematic diagram of a test section in a specific embodiment of the present invention; Figure 4 It is a schematic diagram of the separation of the test section and the probe support mechanism in a specific embodiment of the present invention; Figure 5 It is a structural schematic diagram of a probe support mechanism in a specific embodiment of the present invention; Figure 6 It is a structural schematic diagram of a probe clamping device in a specific embodiment of the present invention; Figure 7 It is a partial schematic diagram of a reflector installed on a first reflector positioning device in a specific embodiment of the present invention; Figure 8 It is a partial schematic diagram of a reflector installed on a second reflector positioning device in a specific embodiment of the present invention.

[0032] Marks and corresponding parts names in the attached drawings: 1-test section, 2-station chamber, 3-direction probe, 4-second reflector positioning device, 5-observation window, 6-heat preservation device, 7-opening, 8-station chamber bracket, 9-universal wheel, 10-universal foot cup, 11-reflector; 101-support rod, 102-perforation; 201-connecting block, 202-clamping head, 203-rectifier head, 204-first reflector positioning device, 205-first mounting surface, 206-second mounting surface, 207-extension rod; 301-arc guide rail, 302-slider, 303-turntable, 304-mounting frame, 305-first motor, 306-arc rack, 307-second motor, 308-pitch limit switch, 309-grating ruler, 310-positioning disk, 311-encoder. DETAILED DESCRIPTION

[0033] In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with the examples and the accompanying drawings. The schematic embodiments of the present invention and the description thereof are only used to explain the present invention and are not intended to limit the present invention. In the description of the present application, it should be understood that the orientation or positional relationship indicated by terms such as "front", "rear", "left", "right", "up", "down", "vertical", "horizontal", "high", "low", "inside", "outside", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the scope of protection of the present application.

[0034] Example 1

[0035] like Figures 1 to 5 A closed test section direction probe angle adjustment mechanism is shown, comprising a test section 1 which is open at both ends along the axial direction, a stationary chamber 2 located below the test section 1, and a probe support mechanism installed in the stationary chamber 2, wherein the probe support mechanism is used to connect a direction probe 3, and the direction probe 3 is located in the test section 1; the probe support mechanism comprises a pitch angle adjustment mechanism and a sideslip angle adjustment mechanism, wherein the pitch angle adjustment mechanism is used to adjust the pitch angle of the direction probe 3, and the sideslip angle adjustment mechanism is used to adjust the sideslip angle of the direction probe 3.

[0036] The probe supporting mechanism further includes a supporting rod 101 and a probe clamping device connected to the top of the supporting rod 101 , wherein the probe clamping device is used to clamp the direction probe 3 .

[0037] The pitch angle adjustment mechanism includes an arc-shaped guide rail 301, a slider 302 slidably matched with the arc-shaped guide rail 301, and a first power mechanism for driving the slider 302 to slide along the arc-shaped guide rail 301; the support rod 101 is arc-shaped, and the center of the support rod 101 and the center of the arc-shaped guide rail 301 are both located on the axis of the test section 1. The arc-shaped guide rail extends in the longitudinal direction.

[0038] The sideslip angle adjustment mechanism includes a rotating disk 303 , a second power mechanism for driving the rotating disk 303 to rotate, and a mounting frame 304 located on the rotating disk 303 , and the arc guide rail 301 is connected to the mounting frame 304 .

[0039] It also includes a heat preservation device 6 located outside the test section 1 and / or the stationary chamber 2.

[0040] In this embodiment, the test section 1, the probe support mechanism and the stationary chamber 2 are formed as a sealed whole and are sealed from the outside.

[0041] In this embodiment, the control accuracy of the first power mechanism over the pitch angle and the second power mechanism over the sideslip angle is better than ±0.05°.

[0042] Preferably, Figure 5 As shown: the first power mechanism in this embodiment includes a first motor 305, the output end of the first motor 305 is meshed with an arc rack 306 through a gear, and the arc rack 306 is fixed on the arc guide rail 301 and the two are coaxial; the second power mechanism includes a second motor 307, and the output end of the second motor 307 drives the turntable 303 through a gear / gear set. The first motor 305 and the second motor 307 are preferably servo motors.

[0043] Preferably, it also includes a grating ruler 309 matched with the first power mechanism and an encoder 311 matched with the second power mechanism; the grating ruler 309 and the encoder 311 are respectively used to accurately position the pitch angle adjustment mechanism and the side slip angle adjustment mechanism to improve the angle adjustment accuracy. A pitch limit switch 308 matched with the slider 302 can also be set on the mounting frame 304 to prevent the slider 302 from detaching from the arc guide rail 301. A side slip limit switch matched with the turntable 303 can also be set to limit the rotation range of the turntable 303.

[0044] More preferably, Figure 4 and Figure 5 As shown, a positioning plate 310 is fixedly connected to the top of the mounting frame 304, and an opening 7 matching the positioning plate 310 is provided at the bottom of the test section 1. When the station chamber 2 is connected to the test section 1, the positioning plate 310 just blocks the opening 7. The positioning plate 310 is provided with a hole for the support rod 101 to pass through, and of course, the hole can allow the support rod 101 to adjust the pitch angle within the travel range.

[0045] More preferably, at least the portion of the support rod 101 extending into the interior of the test section 1 is a cylindrical structure to reduce flow field resistance.

[0046] More preferably, the support rod 101 and the arc-shaped guide rail 301 are both arc-shaped structures and are coaxial, and the axes of the two are preferably collinear with the axis of the test section 1 .

[0047] More preferably, the heat preservation device 6 is a heat preservation box or a heat preservation layer; the heat preservation device 6 of the test section 1 is a structure that is convenient to open, close or disassemble. The heat preservation box or the heat preservation layer includes a polyurethane foam board, and may also include an aluminum foil layer superimposed on the inner wall of the polyurethane foam board.

[0048] More preferably, an openable plugging plate is provided on the surface of the test section 1, and when the plugging plate is closed, an airtight connection is maintained between the body of the test section 1. The plugging plate is preferably located at the top of the test section 1.

[0049] Example 2

[0050] A closed test section direction probe angle adjustment mechanism, based on embodiment 1, as Figures 1 to 8 As shown, the support rod 101 is a hollow structure, and a through hole 102 is provided on the top side wall of the support rod 101 .

[0051] In this embodiment, the air hose matching the direction probe 3 is led out from the end of the direction probe, penetrates into the support rod 101 through the perforation 102, and passes out from the end of the support rod 101. After reserving a certain length of movable section, it is fixed on the mounting frame 304, extends downward along the mounting frame 304, then passes through the turntable 303 and leads out, and then seals and passes out of the resident chamber 2.

[0052] The probe clamping device includes a connection block 201, a clamping head 202 and a rectifier head 203 detachably connected to opposite ends of the connection block 201, and the rectifier head 203 has a rectifier appearance. The top end of the support rod 101 is fixedly connected to the connection block 201, the clamping head 202 is used to clamp the direction probe 3, and the connection block 201 and the rectifier head 203 are both provided with through holes for the direction probe 3 to pass through.

[0053] In this embodiment, a first mounting surface 205 is set on the top of the connecting block 201, and a second mounting surface 206 is set on the side wall of the connecting block 201, and the first mounting surface 205 and the second mounting surface 206 are perpendicular to each other; a spirit level can be detachably connected to the first mounting surface 205, and an extension rod 207 can be detachably connected to the second mounting surface 206, and the length direction of the extension rod 207 is parallel to the axial direction of the through hole, and a first reflector positioning device 204 for connecting a reflector is set at one end of the extension rod 207 away from the connecting block 201.

[0054] In this embodiment, a second reflector positioning device 4 is further provided on the side wall of the test section 1 , and the second reflector positioning device 4 is used to connect the reflector to the inner wall of the test section 1 .

[0055] The left and / or right surfaces of the test section 1 are provided with an observation window 5, which is preferably made of optical glass.

[0056] Preferably, the clamping head 202 has a matching fixing bolt, and after the end of the direction probe 3 is inserted into the clamping head 202, clamping is achieved by tightening the fixing bolt.

[0057] Preferably, the first reflector positioning device 204 and the second reflector positioning device 4 are both magnetically attracted, and the back of the corresponding reflector has a magnetic metal object that can be magnetically attracted. The magnetic attraction member can be realized by, for example, a neodymium magnet.

[0058] More preferably, the second reflector positioning device 4 comprises a mounting groove provided on the outer wall of the test section 1, and the corresponding magnetic attraction member is fixed in the mounting groove.

[0059] Example 3

[0060] A closed test section direction probe angle adjustment mechanism, based on embodiment 1 or 2, such as Figure 1 and Figure 2 As shown, it also includes a chamber support 8 for supporting the chamber 2. Universal wheels 9 and universal feet 10 are installed at the bottom of the chamber support 8. After the adjustment mechanism of the present application is moved into place, the height of the chamber support 8 can be adjusted by rotating the universal feet 10, and then the height of the test section 1 can be adjusted to better match the existing closed test section. In addition, if each universal foot cup 10 is adjusted to a different height, the overall inclination of the present application in different directions can be adjusted, which is more convenient for installation and alignment.

[0061] Example 4

[0062] The method for using the closed test section direction probe angle adjustment mechanism based on any of the above embodiments comprises the following steps: S1. Move the closed test section direction probe angle adjustment mechanism to the closed test section of the wind tunnel, adjust the height so that the axial ends of the test section 1 are at the same height as the front and rear sections of the wind tunnel, and fasten them with bolts; S2, open the test section 1, install the direction probe 3 into the probe clamping device, adjust the front and rear distance of the direction probe 3 to keep the probe tip at the center of the test section 1; S3, measuring the initial pitch angle and initial sideslip angle of direction probe 3; S4. Close test section 1, start the wind tunnel, control the pitch angle adjustment mechanism and sideslip angle adjustment mechanism according to the design plan, and calibrate the direction probe.

[0063] Among them, opening and closing the test section 1 can be achieved by opening or closing the blocking plate on the surface of the test section.

[0064] More preferably, in step S3, the initial pitch angle of the direction probe 3 is measured by the following method: a level is installed on the first installation surface 205 on the top of the connection block 201, and the initial pitch angle is measured based on the display of the level.

[0065] More preferably, in step S3, the initial sideslip angle of the direction probe 3 is measured by the following method: S301, placing a collimator outside the test section 1, so that the optical path between the collimator and the direction probe 3 is straightly connected through the observation window 5; S302, installing the reflector 11 on a side wall of the test section 1 facing the observation window 5 by the second reflector positioning device 4, measuring the first angle by the collimator; and disassembling the reflector; S303, installing the extension rod 207 on the second installation surface 206, installing the reflector 11 on the extension rod 207 through the first reflector positioning device 204, measuring the second angle through the collimator; disassembling the reflector; S304: Based on the first angle and the second angle, an initial sideslip angle can be calculated. The specific calculation method of the initial sideslip angle here belongs to the general technology in the art and can be completed by simple mathematical calculation, which will not be described in detail here.

[0066] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

[0067] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In addition, the term "connected" used in this article can be directly connected or indirectly connected via other components without special explanation.

Claims

1. A closed test section direction probe angle adjustment mechanism, comprising a direction probe (3), characterized in that: The invention also comprises a test section (1) which is open at both ends along the axial direction, a stationary chamber (2) located below the test section (1), and a probe support mechanism installed in the stationary chamber (2), wherein the probe support mechanism is used to connect the direction probe (3), and the direction probe (3) is located in the test section (1); the probe support mechanism comprises a pitch angle adjustment mechanism and a sideslip angle adjustment mechanism, wherein the pitch angle adjustment mechanism is used to adjust the pitch angle of the direction probe (3), and the sideslip angle adjustment mechanism is used to adjust the sideslip angle of the direction probe (3).

2. A closed test section direction probe angle adjustment mechanism according to claim 1, characterized in that: The probe support mechanism further comprises a support rod (101) and a probe clamping device connected to the top end of the support rod (101), wherein the probe clamping device is used to clamp the directional probe (3).

3. The closed test section direction probe angle adjustment mechanism according to claim 2, characterized in that: The support rod (101) has a hollow structure, and a through hole (102) is provided on the top side wall of the support rod (101).

4. The closed test section direction probe angle adjustment mechanism according to claim 2, characterized in that: The probe clamping device comprises a connecting block (201), a clamping head (202) and a rectifying head (203) detachably connected to opposite ends of the connecting block (201); the top end of the support rod (101) is connected to the connecting block (201), the clamping head (202) is used to clamp the direction probe (3), and the connecting block (201) and the rectifying head (203) are both provided with through holes for the direction probe (3) to pass through.

5. The closed test section direction probe angle adjustment mechanism according to claim 4, characterized in that: A first mounting surface (205) is arranged on the top of the connection block (201), and a second mounting surface (206) is arranged on the side wall of the connection block (201); the first mounting surface (205) and the second mounting surface (206) are perpendicular to each other; a level gauge is detachably connected to the first mounting surface (205), and an extension rod (207) is detachably connected to the second mounting surface (206); the length direction of the extension rod (207) is parallel to the axial direction of the through hole; and a first reflector positioning device (204) for connecting a reflector is arranged at one end of the extension rod (207) away from the connection block (201).

6. The closed test section direction probe angle adjustment mechanism according to claim 2, characterized in that: The pitch angle adjustment mechanism comprises an arc-shaped guide rail (301), a slider (302) slidably matched with the arc-shaped guide rail (301), and a first power mechanism for driving the slider (302) to slide along the arc-shaped guide rail (301); the support rod (101) is arc-shaped, and the center of the support rod (101) and the center of the arc-shaped guide rail (301) are both located on the axis of the test section (1).

7. The closed test section direction probe angle adjustment mechanism according to claim 6, characterized in that: The sideslip angle adjustment mechanism comprises a rotating disk (303), a second power mechanism for driving the rotating disk (303) to rotate, and a mounting frame (304) located on the rotating disk (303), and the arc-shaped guide rail (301) is connected to the mounting frame (304).

8. The closed test section direction probe angle adjustment mechanism according to claim 1, characterized in that: The side wall of the test section (1) is also provided with a second reflector positioning device (4), and the second reflector positioning device (4) is used to connect the reflector to the inner wall of the test section (1).

9. The closed test section direction probe angle adjustment mechanism according to claim 1, characterized in that: An observation window (5) is provided on the surface of the test section (1).

10. The closed test section direction probe angle adjustment mechanism according to claim 1, characterized in that: It also includes a heat preservation device (6) located outside the test section (1) and / or the stationary chamber (2).

Images