Six-degree-of-freedom ground simulation test device and method for in-orbit release of inspection mass

Abstract

The invention belongs to the field of precision measurement, and particularly discloses a six-degree-of-freedom ground simulation test device and method for checking mass in-orbit release, and the device comprises a vacuum unit which is used for simulating a space vacuum environment; the second-stage pendulum unit is arranged in the vacuum unit and used for achieving six-degree-of-freedom movement of the inspection mass, the second-stage pendulum unit comprises a first-stage pendulum body connected to the interior of the vacuum unit in a suspended mode, the inspection mass is connected to one transverse end of a suspension connection point of the first-stage pendulum body in a suspended mode, and the other transverse end of the suspension connection point of the first-stage pendulum body is connected with a balancing mass; the locking and releasing unit is arranged in the vacuum unit and is used for locking and releasing the inspection mass; and the detection unit is used for detecting displacement and deflection of the inspection mass. According to the testing device, the six-degree-of-freedom ground simulation test of in-orbit release of the inspection mass can be carried out.

Description

Technical Field

[0001] The present application belongs to the field of precision measurement, and more specifically, to a six-degree-of-freedom ground simulation test device and method for in-orbit release of inspection mass. Background Art

[0002] Space locking and release technology is one of the core technologies of the space gravitational wave detection program. It is necessary to ensure that the test mass is safely and reliably fixed in the motor cage during the satellite launch phase. After the satellite enters orbit, the test mass is released into space with high positioning accuracy and extremely low residual speed, and is captured by the electrostatic control system. During the on-orbit release phase, if the test mass fails to be released or the release speed is too high, the capacitive control system will not be able to control the test mass in an ideal suspended state. Therefore, it is necessary to conduct in-depth research on the locking and release technology on the ground to ensure the smooth progress of the on-orbit test.

[0003] In the related technology, the ground test of locking and releasing mostly uses a simple pendulum or torsion pendulum to test the motion state of the test mass after release in a single degree of freedom. However, the real on-orbit locking and releasing faces complex working conditions, and there may be multi-degree-of-freedom motion after the test mass is released; and most of the existing ground test devices for locking and releasing can only simulate the motion behavior of a single degree of freedom, and their simulation capabilities are insufficient. The simulation test results are usually difficult to accurately reflect the actual situation, and they are in urgent need of improvement. Summary of the invention

[0004] In response to the defects or improvement needs of the prior art, the present application provides a six-degree-of-freedom ground simulation test device for inspecting the in-orbit release of mass, aiming to solve the problem of insufficient simulation capability of the existing locking and release ground test devices.

[0005] The present application provides a six-degree-of-freedom ground simulation test device for on-orbit release of inspection mass, specifically comprising: Vacuum unit, used to simulate the vacuum environment of space; A secondary pendulum unit is arranged inside the vacuum unit and is used to realize the six-degree-of-freedom motion of the inspection mass. The secondary pendulum unit includes a primary pendulum body suspended inside the vacuum unit, wherein the primary pendulum body is suspended with the inspection mass at one lateral end of its suspension connection point and is connected with the balancing mass at the other lateral end; The locking and releasing unit is arranged inside the vacuum unit and is used for locking and releasing to check the quality; A detection unit is used to detect the displacement and deflection of the proof mass.

[0006] Through the above technical scheme conceived by the present application, compared with the prior art, this scheme adopts a two-stage pendulum unit suspension scheme to overcome the influence of gravity on the inspection mass. The inspection mass in this scheme can be suspended as a secondary pendulum at one end of the primary pendulum, and can perform translation in the three directions of X-axis, Y-axis and Z-axis, as well as rotation around the suspension wire (i.e. Z-axis), X-axis and Y-axis. On the basis of using the vacuum unit to simulate the vacuum environment of space, it can truly simulate the six-degree-of-freedom movement of the inspection mass released in orbit; at the same time, the locking and releasing unit can lock the inspection mass in its free motion equilibrium state, and cooperate with the detection unit to realize the motion monitoring of the inspection mass release, thereby realizing high-precision measurement of the inspection mass movement. Compared with the traditional single pendulum or torsion pendulum device, this scheme can perform multi-degree-of-freedom simulation of the inspection mass, the simulation is more in line with the actual situation, and the test results can more accurately reflect the actual situation of the inspection mass released in orbit.

[0007] As further preferred, the inspection mass is a planar conductor formed by metal or metal plating.

[0008] As further preferred, the inspection mass is a hollow structure.

[0009] As a further preference, the portion of the inspection mass that is used to contact the locking and releasing unit is a detachable portion.

[0010] As a further preference, the secondary pendulum unit also includes a pendulum bracket installed inside the hollow structure, the pendulum bracket is suspended to the primary pendulum body by a suspension wire, and the connection node between the pendulum bracket and the suspension wire is located at the center of mass / center of the whole formed by the hollow structure and the pendulum bracket.

[0011] As further preferred, the detection unit includes: Capacitor plates, the capacitor plates are statically arranged in the vacuum unit, and two capacitor plates are distributed on each side of the inspection mass, the capacitor plates and the inspection mass are independent of each other and together constitute a capacitor; The sensing circuit is connected to the capacitor plate and is used to detect the capacitance signal generated when the proof mass and the capacitor plate move relative to each other and obtain the six-degree-of-freedom displacement and deflection information after the proof mass is released based on the capacitance signal.

[0012] As further preferred, the detection unit further comprises a plate frame located in the vacuum unit, and each capacitor plate is connected to the plate frame; The proof mass is located in the pole plate frame in a contactless manner and is movable in the pole plate frame.

[0013] As further preferred, the locking and releasing unit comprises a translation platform disposed on both sides of the inspection mass, wherein a ejector pin is mounted on the translation platform, and the translation platform is used to drive the ejector pin to lock and release the inspection mass.

[0014] As further preferred, the device also includes a vibration isolation platform, and the vibration isolation platform is used to support the vacuum unit.

[0015] A testing method provided in the second aspect of the present application adopts the following technical solution: A testing method, based on any one of the six-degree-of-freedom ground simulation testing devices for on-orbit release of a proof mass described in the first aspect, comprises the following steps: Adjust the locking and releasing unit to lock the inspection mass and realize the on-track locking simulation of the inspection mass; The locking and releasing unit is adjusted to release the test mass, and the test mass suspended in the secondary pendulum unit generates six-degree-of-freedom movement and deflection, realizing the six-degree-of-freedom on-orbit release simulation of the test mass; After the proof mass is released, the displacement and deflection of the proof mass are detected by a detection unit to obtain motion information of the proof mass in six degrees of freedom.

[0016] In general, the above technical solutions conceived by this application have the following technical advantages compared with the prior art: 1. The test mass in this scheme is connected to the first-stage pendulum through suspension wires, so that the test mass can be displaced and deflected in six degrees of freedom. On this basis, the vacuum unit simulates the vacuum environment of space, the locking and releasing unit simulates the on-orbit locking and releasing of the test mass, and the detection unit detects the differential signal generated between the test mass and the capacitor plate in the initial state and after release, monitors the displacement and deflection of the test mass, and can realize the six-degree-of-freedom test of the test mass.

[0017] 2. The test mass in this scheme is a hollow structure, and its center of mass / center is suspended by a wire at one end of the first-stage pendulum body, so that the test mass and the wire form a second-stage pendulum structure. Based on the capacitor plates distributed around the test mass, the motion information of the test mass in six degrees of freedom can be accurately detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is an overall schematic diagram of a six-degree-of-freedom ground simulation test device for on-orbit release of a proof mass provided by an embodiment of the present invention; Figure 2 is a schematic diagram of inspection quality provided by an embodiment of the present invention; Figure 3 is a schematic diagram of a secondary pendulum unit provided by an embodiment of the present invention; Figure 4 is a schematic diagram of an example of capacitor plate distribution provided by an embodiment of the present invention; Figure 5 Schematic diagram of a capacitive displacement sensing circuit provided by an embodiment of the present invention.

[0019] Throughout the drawings, the same reference numerals are used to denote the same elements or structures, wherein: 1. Vacuum unit; 2. Secondary pendulum unit; 2-1. Primary pendulum body; 2-2. Balancing mass; 2-3. Pendulum bracket; 2-4. Suspension wire; 2-5. Vacuum guide; 2-6. Bushing; 3. Inspection mass; 3-1. Removable surface; 3-2. Fixed structure; 4. Locking and releasing unit; 4-1. Translation table; 4-2. Ejector pin; 4-3. Adapter plate; 5. Detection unit; 5-1. Capacitor plate; 5-2. Plate frame; 5-3. High-voltage amplifier; 5-4. Transformer circuit; 5-5. Front-end circuit; 5-6. AC amplifier circuit; 5-7. Demodulation circuit; 5-8. Low-pass filter circuit; 5-9. ADC converter; 6. Vibration isolation platform. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0021] The following is combined with Figure 1-Figure 5 This application is described in further detail.

[0022] The present application embodiment discloses a six-degree-of-freedom ground simulation test device for on-orbit release of inspection mass. Figure 1 The six-degree-of-freedom ground simulation test device for the on-orbit release of the inspection mass includes a vacuum unit 1, a secondary pendulum unit 2, a locking unit 4 and a detection unit 5. The vacuum unit 1 is used to simulate the vacuum environment of space; the secondary pendulum unit 2 is arranged inside the vacuum unit 1, and is used to realize the six-degree-of-freedom movement of the inspection mass 3. The secondary pendulum unit 2 includes a primary pendulum body 2-1 suspended inside the vacuum unit 1, and the primary pendulum body 2-1 is suspended at one lateral end of its own suspension connection point with the inspection mass 3, and the inspection mass 3 is the secondary pendulum body, and the other lateral end is connected with a balancing mass 2-2 to adjust the dynamic characteristics and stability of the inspection mass 3; the locking unit 4 is arranged inside the vacuum unit 1, and is used to lock and release the inspection mass 3; and the detection unit 5 is used to detect the displacement and deflection of the inspection mass 3.

[0023] Furthermore, the vacuum unit 1 is used to simulate complex working conditions in space. In some embodiments, the vacuum unit 1 has a vacuum chamber with an internal vacuum, which is used to simulate the high vacuum and / or microgravity environment in space, and devices such as the inspection mass 3 and the locking and releasing unit 4 are arranged in the vacuum chamber.

[0024] In some embodiments, the inspection mass 3 is preferably a planar conductor formed of metal or metal plating.

[0025] In some embodiments, the inspection mass 3 is designed as a detachable hollow structure, and the portion of the inspection mass 3 that is used to contact the locking and releasing unit 4 is preferably a detachable portion.

[0026] In some embodiments, Figure 2 As shown, the inspection mass 3 includes a fixed structure 3-2 and detachable surfaces 3-1 on both sides; the detachable surface 3-1 is the area in contact with the locking and releasing unit, which is convenient for replacing the contact surfaces of different materials and realizing the exploration and research of the locking and releasing of the inspection mass 3; the fixed structure 3-2 is the basic frame of the hollow inspection mass 3, which is used to realize the suspension installation of the inspection mass 3.

[0027] In some specific embodiments, the inspection mass 3 is a standard hollow cube of 50mm×50mm×50mm (in other embodiments, the inspection mass 3 can also be changed to any other feasible structural dimensions). The inspection mass 3 consists of removable surfaces 3-1 on both sides and a fixed structure 3-2. The material is gold-platinum alloy, and its surface has been polished, ground, coated and other processes.

[0028] In some embodiments, Figure 1 and Figure 3 As shown, the secondary pendulum unit 2 further includes a vacuum guide 2-5, which extends from the outside into the interior of the vacuum unit 1 and is fixed at the top of the vacuum unit 1; the primary pendulum body 2-1 is connected to the vacuum guide 2-5 through a suspension wire 2-4 (i.e., the primary suspension wire). The primary pendulum body 2-1 includes but is not limited to a crossbar, and when the crossbar is selected, the crossbar is placed horizontally, and the connection point between the crossbar and the suspension wire 2-4 is located at the center of the crossbar.

[0029] Furthermore, in some embodiments, the secondary pendulum unit 2 further includes a pendulum bracket 2-3, which is diagonally connected to the inside of the inspection mass 3; the pendulum bracket 2-3 is suspended and connected to the primary pendulum body 2-1 through another suspension wire 2-4 (i.e., the secondary suspension wire), and the connection node between the pendulum bracket 2-3 and the suspension wire 2-4 is located at the center of mass / center of the inspection mass 3 and the pendulum bracket 2-3. The pendulum bracket 2-3 includes but is not limited to being formed by the cross-connection of the centers of two connecting rods, and a sleeve 2-6 for mounting the suspension wire 2-4 is preferably provided at the center of the pendulum bracket 2-3.

[0030] Generally speaking, the suspension connection point of the inspection mass 3 is preferably the center of mass of the whole composed of the inspection mass 3 and the pendulum support 2-3. When actually manufacturing the device, the center point of the whole composed of the inspection mass 3 and the pendulum support 2-3 can also be used as the connection node of the suspension wire 2-4, but it should be ensured that the center point is as close to the center of mass of the whole composed of the inspection mass 3 and the pendulum support 2-3 as possible.

[0031] Furthermore, the detection unit 5 includes a capacitor plate 5-1 and a sensor circuit. The capacitor plate 5-1 is statically arranged in the vacuum unit 1, and the capacitor plate 5-1 and the inspection mass 3 are independent of each other. There are two capacitor plates 5-1 distributed on each side of the inspection mass 3, and the capacitor plate 5-1 and the inspection mass 3 form a capacitor (i.e., a differential capacitor and a differential capacitor). The sensor circuit is connected to the capacitor plate 5-1, and the sensor circuit is used to detect the capacitance signal generated when the inspection mass 3 and the capacitor plate 5-1 move relative to each other, and is used to obtain the six-degree-of-freedom displacement and deflection information after the inspection mass 3 is released based on the capacitance signal.

[0032] Furthermore, in order to ensure the stability of the capacitor plate 5-1, the detection unit 5 also includes a plate frame 5-2, which remains stationary in the vacuum unit 1 (such as the plate frame 5-2 is placed on or connected to the bottom wall of the vacuum chamber of the vacuum unit 1), and each capacitor plate 5-1 is connected to each surface of the plate frame 5-2.

[0033] In addition, the inspection mass 3 suspended by the suspension wire 2-4 is inside the plate frame 5-2, the inspection mass 3 has no contact with the plate frame 5-2, and the inspection mass 3 can move inside the plate frame 5-2. Generally speaking, in order to ensure that the inspection mass 3 does not touch the substrate frame and the suspension wire 2-4 when moving inside the plate frame 5-2, the inspection mass 3 and the plate frame 5-2 should reserve a through hole for the suspension wire 2-4 to penetrate in a clearance fit manner.

[0034] Preferably, the plate frame 5-2 is in a standard cubic shape, and its structural dimensions are the receiving dimensions of the proof mass 3. Preferably, when the proof mass 3 is in a stationary and unlocked state, the proof mass 3 can be substantially maintained at the center of the plate frame 5-2.

[0035] For ease of understanding, Figure 4 A schematic diagram showing an example of the distribution of the capacitor plate 5-1 at a certain viewing angle is shown. Figure 4 As shown, after the inspection mass 3 is unlocked, the inspection mass 3 may rotate and displace due to the influence of the complex working environment in which it is located. Since the inspection mass 3 and the capacitor plate 5-1 form a capacitor, the inspection mass 3 and the capacitor plate 5-1 will generate a capacitance signal due to relative movement, and then the signal is collected and detected through the sensor circuit.

[0036] Further, such as Figure 5 As shown, the sensing circuit includes a high-voltage amplifier 5-3, a transformer circuit 5-4, a front-end circuit 5-5, an AC amplifier circuit 5-6, a demodulation circuit 5-7, a low-pass filter circuit 5-8 and an ADC converter 5-9. The high-voltage amplifier 5-3 is used to load a high-frequency modulated carrier voltage on the inspection mass 3. V pThe transformer circuit 5-4 is used to modulate the capacitance difference signal onto the high-frequency modulated carrier current signal when the hollow test mass 3 moves to generate a capacitance difference signal with the capacitor plate 5-1; the front-end circuit 5-5 (usually including an operational amplifier OP) is used to amplify and convert the current signal modulated by the transformer circuit 5-4 into a voltage signal V a ; AC amplifier circuit 5-6 is used to amplify the voltage signal V a Frequency-selective filtering to obtain frequency-selective voltage signal V b ; Demodulation circuit 5-7 is used based on the frequency-selective voltage signal V b Multiplying the modulation signal of the demodulation circuit 5-7 to obtain the modulation voltage signal V c ; Low-pass filter circuit 5-8 is used to filter out voltage signals V c The high-frequency signal in the filter voltage signal is obtained V d ADC converter 5-9 is used to convert the filtered voltage signal V d Perform digital-to-analog conversion to obtain the displacement and deflection information of the test mass 3 after it is released.

[0037] Further, such as Figure 1 As shown, in order to lock and release the inspection mass 3, the locking and releasing mechanism includes a set of displacement platforms 4-1 disposed on two opposite sides of the inspection mass 3, and a pin 4-2 is installed on the displacement platform 4-1. The displacement platform 4-1 is used to drive the pin 4-2 to move closer to and away from the inspection mass 3 to lock and release the inspection mass 3, thereby realizing the on-track locking and releasing simulation of the inspection mass 3. Preferably, the pin 4-2 is fixed to the displacement platform 4-1 through an adapter plate 4-3. The displacement platform 4-1 is preferably a six-degree-of-freedom displacement platform 4-1.

[0038] Furthermore, the device further includes a vibration isolation platform 6, which is used to support the vacuum unit 1 (i.e., the vibration isolation platform 6 is placed below the vacuum unit 1, and the vibration isolation platform 6 is usually installed on the ground) to reduce / suppress the influence of external vibration on the vacuum unit 1. The vibration isolation principle of the vibration isolation platform 6 is a prior art and will not be elaborated here.

[0039] Furthermore, the six-degree-of-freedom detection described in this scheme includes the translation of the test mass 3 in the three directions of X, Y, and Z, the rotation around the secondary suspension wire 2-4, and the rotation around the X and Y axes (similar to a "seesaw"). The origin of the coordinate system is preferably the connection point between the test mass 3 and the secondary suspension wire 2-4.

[0040] It is understandable that after the ejector pin 4-2 releases the inspection mass 3, the displacement and deflection of the inspection mass 3 are the result of complex factors and working conditions such as the preload force applied by the ejector pin 4-2 on the inspection mass 3 and the environment in which the inspection mass 3 is located (such as high vacuum, thermal interference).

[0041] The present application also discloses a test method based on any of the above-mentioned six-degree-of-freedom ground simulation test devices for on-orbit release of inspection mass. The test method comprises the following steps: S1. Adjust the locking and releasing unit 4 to lock the inspection mass 3, and realize the on-track locking simulation of the inspection mass 3.

[0042] Specifically, the on-orbit locking simulation of proof mass 3 includes the following steps: S11. Preliminarily adjust the translation stage 4-1 to align the ejector pins 4-2 on both sides of the inspection mass 3.

[0043] S12. Adjust the displacement stage 4-1 again, so that the ejector pins 4-2 on both sides of the inspection mass 3 approach the inspection mass 3 at the same time, until the ejector pins 4-2 on both sides contact the inspection mass 3 at the same time, so that the inspection mass 3 is located at the center of the plate frame 5-2 and remains in a balanced state.

[0044] S13. A preload force is applied at the contact position by the locking and releasing unit 4 (for example, a driving force is applied to the ejector pin 4 - 2 toward the inspection mass 3 by the displacement stage 4 - 1 ), thereby locking the inspection mass 3 and realizing an on-track locking simulation of the inspection mass 3 .

[0045] S2. Adjust the lock-release unit 4 to release the inspection mass 3, and the inspection mass 3 suspended in the secondary pendulum unit 2 generates six-degree-of-freedom movement and deflection, so as to realize the six-degree-of-freedom on-orbit release simulation of the inspection mass 3; Specifically, this step should be performed after completing a period of time of on-orbit locking simulation of the inspection mass 3 (the time can be pre-set or controlled and adjusted based on actual conditions), and the ejector pins 4-2 on both sides of the inspection mass 3 are driven by the translation platform 4-1 to release the inspection mass 3 at the same time, thereby realizing the six-degree-of-freedom on-orbit release simulation of the inspection mass 3.

[0046] In this step, the inspection mass 3 may be displaced and deflected due to the influence of complex factors such as the preload force applied by the ejector pin 4-2 on the inspection mass 3, the environment in which the inspection mass 3 is located (such as high vacuum, thermal interference), and different working conditions.

[0047] S3. Use the detection unit 5 to detect the displacement and deflection of the inspection mass 3 to obtain the motion information of the inspection mass 3 in six degrees of freedom.

[0048] Specifically, in this step, the detection unit 5 will collect the initial equilibrium state when the test mass 3 is located at the center of the plate frame 5-2 and the differential capacitance signal and differential signal generated by the test mass 3 and the capacitor plate 5-1 after the test mass 3 is released, and use the relationship between the output voltage of the sensor circuit and the input capacitance difference signal to monitor the displacement and deflection information of the test mass 3 to obtain the motion information of the hollow structure test mass 3 in six degrees of freedom.

[0049] Among them, Figure 4 For example, the basic operating principle of the detection unit 5 is: The test mass 3 and the capacitor plates 5-1 on both sides of the opposite surface generate a differential capacitance signal C 1. C 2. C 3. C 4. When the inspection mass 3 and the plate frame 5-2 move relative to each other, the capacitor spacing will change accordingly, and the differential capacitance signal will change accordingly. According to the change of the capacitance between the inspection mass 3 and the capacitor plate 5-1 with the displacement x and angle The relationship between the changes is that the two relative capacitors are differentially amplified to obtain the combination C 13 and C 24 , in the second-order approximation, the difference between the two capacitors C 13 , C 24 With x and A linear combination relationship is formed. For the displacement measurement of translational freedom, the C 13 + C 24 Combination, for the measurement of rotational freedom, use C 13 - C 24 combination.

[0050] Specifically, in some specific embodiments, the detection process of the detection unit 5 is as follows: After the lock-and-release unit 4 releases the test mass 3, the test mass 3 moves to generate a capacitance difference signal. C , a high frequency modulated carrier voltage is applied to the test mass 3 through the high voltage amplifier 5-3 V pThe capacitance difference signal is modulated to a high-frequency modulated carrier current signal by the transformer circuit 5-4, and the current signal is amplified and converted into a voltage signal by the front-end circuit 5-5. V a , the frequency-selective voltage signal is obtained through the frequency-selective filtering of the AC amplifier circuit 5-6 V b , multiplied by the modulation signal of the demodulation circuit 5-7 to obtain V c Finally, the high-frequency signal is filtered out through the low-pass filter circuit 5-8 to obtain V d , using ADC converter 5-9 to V d The signal is converted into digital and analog, thereby obtaining the displacement and deflection information of the hollow structure test mass 3.

[0051] It should be understood that expressions such as "include" and "may include" used in this application indicate the existence of the disclosed functions, operations or constituent elements, and do not limit one or more additional functions, operations and constituent elements. In this application, terms such as "include" and / or "have" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components or combinations thereof.

[0052] It should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0053] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0054] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0055] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A six-degree-of-freedom ground simulation test device for on-orbit release of inspection mass, characterized in that: include: A vacuum unit (1), used to simulate the vacuum environment of space; A secondary pendulum unit (2) is arranged inside the vacuum unit (1) and is used to realize the six-degree-of-freedom motion of the inspection mass (3). The secondary pendulum unit (2) comprises a primary pendulum body (2-1) suspended inside the vacuum unit (1), the primary pendulum body (2-1) having the inspection mass (3) suspended at one lateral end of its suspension connection point and a balancing mass (2-2) connected at the other lateral end; A locking and releasing unit (4), arranged inside the vacuum unit (1), is used to check the locking and releasing of the mass (3); The detection unit (5) is used to detect the displacement and deflection of the test mass (3).

2. The six-degree-of-freedom ground simulation test device according to claim 1, characterized in that: The inspection mass (3) is a planar conductor formed by metal or metal plating.

3. The six-degree-of-freedom ground simulation test device according to claim 2, characterized in that: The inspection mass (3) is a hollow structure.

4. The six-degree-of-freedom ground simulation test device according to claim 2, characterized in that: The portion of the inspection mass (3) that is in contact with the locking and releasing unit (4) is a detachable portion.

5. The six-degree-of-freedom ground simulation test device according to claim 3, characterized in that: The secondary pendulum unit (2) further comprises a pendulum bracket (2-3) installed inside the hollow structure, the pendulum bracket (2-3) being suspended and connected to the primary pendulum body (2-1) via a suspension wire (2-4), and the connection node between the pendulum bracket (2-3) and the suspension wire (2-4) is located at the center of mass / center of the whole formed by the hollow structure and the pendulum bracket (2-3).

6. The six-degree-of-freedom ground simulation test device according to claim 5, characterized in that: The detection unit (5) comprises: A capacitor plate (5-1), the capacitor plate (5-1) being statically arranged in the vacuum unit (1), and having two capacitor plates (5-1) distributed on each surface of the inspection mass (3), the capacitor plate (5-1) and the inspection mass (3) being independent of each other and forming a capacitor together; A sensing circuit is connected to the capacitor plate (5-1) and is used to detect a capacitance signal generated when the inspection mass (3) and the capacitor plate (5-1) move relative to each other, and to obtain six-degree-of-freedom displacement and deflection information of the inspection mass (3) after release based on the capacitance signal.

7. The six-degree-of-freedom ground simulation test device according to claim 6, characterized in that: The detection unit (5) further comprises a plate frame (5-2) located in the vacuum unit (1), and each capacitor plate (5-1) is connected to the plate frame (5-2); The test mass (3) is located in the pole plate frame (5-2) without contact, and the test mass (3) is movable in the pole plate frame (5-2).

8. The six-degree-of-freedom ground simulation test device according to any one of claims 1 to 7, characterized in that: The locking and releasing unit (4) comprises a displacement platform (4-1) arranged on both sides of the inspection mass (3), a ejector pin (4-2) being installed on the displacement platform (4-1), and the displacement platform (4-1) is used to drive the ejector pin (4-2) to lock and release the inspection mass (3).

9. The six-degree-of-freedom ground simulation test device according to any one of claims 1 to 7, characterized in that: The device also comprises a vibration isolation platform (6), wherein the vibration isolation platform (6) is used to carry the vacuum unit (1).

10. A test method, based on a six-degree-of-freedom ground simulation test device for on-orbit release of a proof mass as claimed in any one of claims 1 to 9, characterized in that: The following steps are involved: Adjusting the locking and releasing unit (4) to lock the inspection mass (3) to achieve on-track locking simulation of the inspection mass (3); The locking and releasing unit (4) is adjusted to release the inspection mass (3), so that the inspection mass (3) suspended in the secondary pendulum unit (2) generates six-degree-of-freedom movement and deflection, thereby realizing six-degree-of-freedom on-orbit release simulation of the inspection mass (3); After the test mass (3) is released, the displacement and deflection of the test mass (3) are detected by a detection unit (5) to obtain motion information of the test mass (3) in six degrees of freedom.

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