Method for testing high-precision automatic capacitance box
By designing a high-precision automated capacitor box, using the main control unit and relay array to automatically switch and control the capacitance value, the existing capacitance testing methods are solved, and efficient and automated capacitance testing is achieved.
Patent Information
- Application Number
- CN202510191518.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-20
- Publication Date
- 2025-05-13
AI Technical Summary
The existing capacitance testing methods rely on manual operation, are inefficient and error-prone, and cannot meet the needs of high-precision and automated testing.
A high-precision automated capacitor box is designed, which is connected to the combined array of capacitor groups through the main control unit and relay array, so as to realize automatic switching and precise control of the capacitor value, and can output continuously adjustable capacitors of 0 to 1999pF.
It significantly reduces the working intensity of the testers, improves the testing efficiency of the capacitor converter, realizes fully automatic testing, reduces the impact of human factors on the test results, and simplifies the testing process and cost.
Smart Images
Figure CN119986152A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of capacitor boxes, and in particular to a high-precision automatic capacitor box testing method. Background Art
[0002] With the rapid development of my country's aerospace industry and military industry, the demand for various types of capacitor converters has increased year by year with the increase in launch missions, and more stringent requirements have been put forward in terms of their reliability. At present, the testing of various types of capacitor converters is mainly done by testers who use manual variable capacitor boxes to manually switch the capacitance value, visually output the value, and manually record the data. During the test process, there are many manual operations, low test efficiency, and error-prone data recording; therefore, it is necessary to study a precision automated capacitor box to solve the problems existing in the current capacitor testing work. Summary of the invention
[0003] The object of the present invention is to provide a high-precision automated capacitance box testing method that improves capacitance testing efficiency and reduces the workload of testers in order to solve the above problems.
[0004] In order to achieve the above object, the technical solution of the present invention is: A high-precision automated capacitor box testing method, the capacitor box comprising a main control unit, a capacitor group combination array, and a relay array, the main control unit being connected to the capacitor group combination array via the relay array; the implementation method comprising the following steps: S1. The main control unit receives the capacitance generation instruction of the device under test from the host computer through the network port, and converts it into a switching control signal for the relay array by analyzing the capacitance generation instruction; S2, the main control unit controls the relay array to switch by switching the control signal, so that the relay array controls the on-off state of different fixed capacitors in the capacitor group combination array to form a detection capacitor combination suitable for the device under test; S3, the main control unit corrects the detection capacitor combination so that the capacitance value accuracy of the detection capacitor combination is better than 0.1pF; S4. The main control unit outputs the capacitance value of the corrected detection capacitor combination to the device under test, thereby implementing the capacitance test operation of the device under test.
[0005] Furthermore, the capacitor group combination array includes a 0.1-1.9pF capacitor group, a 1.0-10pF capacitor group, a 10-100pF capacitor group, and a 100-1000pF capacitor group; the detection capacitor combination is formed by a superposition combination of a fixed capacitor in the 0.1-1.9pF capacitor group, a fixed capacitor in the 1.0-10pF capacitor group, a fixed capacitor in the 10-100pF capacitor group, and one or two fixed capacitors in the 100-1000pF.
[0006] Furthermore, the 0.1-1.9pF capacitor group is formed by a combination of 0.1pF fixed capacitor, 0.2pF fixed capacitor, 0.3pF fixed capacitor, 0.4pF fixed capacitor, 0.5pF fixed capacitor, 0.6pF fixed capacitor, 0.7pF fixed capacitor, 0.8pF fixed capacitor, 0.9pF fixed capacitor, 1.0pF fixed capacitor, 1.1pF fixed capacitor, 1.2pF fixed capacitor, 1.3pF fixed capacitor, 1.4pF fixed capacitor, 1.5pF fixed capacitor, 1.6pF fixed capacitor, 1.7pF fixed capacitor, 1.8pF fixed capacitor and 1.9pF fixed capacitor.
[0007] Furthermore, the 1.0-10 pF capacitor group is formed by a combination of a 2.0 pF fixed capacitor, a 3.0 pF fixed capacitor, a 3.9 pF fixed capacitor, a 4.7 pF fixed capacitor, a 5.6 pF fixed capacitor, a 6.8 pF fixed capacitor, a 7.5 pF fixed capacitor, and an 8.2 pF fixed capacitor.
[0008] Furthermore, the 10-100pF capacitor group is formed by a combination of a 10pF fixed capacitor, a 20pF fixed capacitor, a 30pF fixed capacitor, a 39pF fixed capacitor, a 47pF fixed capacitor, a 56pF fixed capacitor, a 62pF fixed capacitor, a 68pF fixed capacitor, a 75pF fixed capacitor, an 82pF fixed capacitor, and a 91pF fixed capacitor.
[0009] Furthermore, the 100-1000pF capacitor group is formed by a combination of a 100pF fixed capacitor, a 200pF fixed capacitor, a 300pF fixed capacitor, a 390pF fixed capacitor, a 470pF fixed capacitor, a 560pF fixed capacitor, a 620pF fixed capacitor, a 680pF fixed capacitor, a 750pF fixed capacitor, an 820pF fixed capacitor, a 910pF fixed capacitor, and a 1000pF fixed capacitor.
[0010] Furthermore, the relay array is provided with 100 relays and is evenly divided into 50 groups. The 50 groups of relays correspond to the 50 fixed capacitors in the capacitor group combination array respectively and control the on-off states of the corresponding fixed capacitors. The two relays in each group of relays are respectively connected to both sides of the leads of the fixed capacitors.
[0011] Furthermore, among the 50 fixed capacitors in the capacitor group combination array, the width of the power line of each capacitor is 20 mil; a ground line is set between adjacent capacitors for division, and the width of the ground line is not less than 40 mil.
[0012] Furthermore, the 50 fixed capacitors in the capacitor group combination array are all aerospace-grade RF and microwave multilayer chip ceramic capacitors of CCK41Q-1111-BC-150V-xxx-B or CCK41Q-1111-BC-150V-xxx-F, and the packaging form thereof is 1111.
[0013] Compared with the prior art, the present invention has the following advantages and positive effects: The present invention designs a high-precision and automated capacitor box design scheme, which receives instructions from a host computer through a network port, and controls the capacitor box to generate 0-1999pF continuously adjustable high-precision capacitance with a step of 0.1pF for a device under test by parsing the instructions, thereby greatly reducing the work intensity of testers and improving the test efficiency of various types of capacitor converters; and the capacitor box adopts advanced electronic control technology, can automatically switch capacitance values, and read and record output values in real time without manual intervention, can realize full-automatic testing of capacitor converters, improves test efficiency, reduces the influence of human factors on test results, simplifies the test process, and reduces test costs; and at the same time, the capacitor group combination array in the present invention adopts a modular installation method, which makes the entire capacitor test system have high flexibility and scalability, can easily adapt to different types of capacitor converter test requirements, and provides a more reliable and efficient testing means for the research and development and production of capacitor converters. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0015] Figure 1 It is the framework logic diagram of the present invention. DETAILED DESCRIPTION
[0016] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work, any modifications, equivalent substitutions, improvements, etc., should be included in the protection scope of the present invention.
[0017] like Figure 1As shown, this embodiment discloses a high-precision automated capacitor box test method, which is operated by a capacitor box system; the capacitor box system receives instructions from a host computer through a network port, and controls the capacitor box to generate a continuously adjustable capacitance of 0 to 1999 pF in steps of 0.1 pF for the device under test by parsing the instructions; The capacitor box system includes a main control unit, a capacitor group combination array, and a relay array, and the main control unit is connected to the capacitor group combination array through the relay array; Main control unit: The main control unit receives the capacitor generation command from the host computer through the network port, analyzes the command, converts it into a switching signal for various high-precision capacitors, and outputs the corresponding capacitance value to the device under test. In order to achieve high-precision capacitance output, in addition to using high-precision aerospace-grade capacitors, the main control unit must further complete the correction of various parasitic capacitances to make the accuracy of various output capacitance values better than 0.1pF; Capacitor bank combination array: In order to ensure the accuracy of the capacitors, all capacitors in the system use aerospace-grade RF and microwave multilayer ceramic capacitors of CCK41Q-1111-BC-150V-xxx-B or F. The packaging of these capacitors is 1111. Capacitors with a capacitance less than 10pF use Class C products. The error of Class C capacitors is For capacitors with a capacitance greater than 10pF, use Class F products. The error of Class F capacitors is . Select capacitor products with temperature characteristics of BC grade. The temperature change of this grade of products is less than , the working range is .
[0018] The capacitor group combination array includes a 0.1-1.9pF capacitor group, a 1.0-10pF capacitor group, a 10-100pF capacitor group, and a 100-1000pF capacitor group; The implementation scheme of 0.1~1.9pF capacitor group is shown in Table 1: Table 1
[0019] Since there are no integer capacitance values for capacitors between 1pF and 10pF, capacitors between 0.1pF and 1.8pF are integrated in the capacitors below 1pF, for a total of 19 types of capacitors.
[0020] The implementation scheme of 1.0~10pF capacitor group is shown in Table 2: Table 2
[0021] There are 8 types of capacitors in total.
[0022] The implementation scheme of 10~100pF capacitor group is shown in Table 3: Table 3
[0023] There are 11 types of capacitors in total.
[0024] The implementation scheme of 100~1000pF capacitor group is shown in Table 4: Table 4
[0025] There are 12 types of capacitors in total, and a total of 50 types of capacitors in the system.
[0026] It can be seen from Tables 1 to 4 that by using the above 50 types of capacitors, with a combination number of 4, all capacitors with a resolution of 0.1pF from 0.1pF to 999.9pF can be generated; by adding a 1000pF capacitor, with a combination number of 5, all capacitors with a resolution of 0.1pF from 1000pF to 1999.9pF can be generated, so the design accuracy of the solution is very high.
[0027] Relay Array: The function of the relay array is to output the selected high-precision capacitors as required. The traditional capacitor box switches the capacitance value manually, with a low degree of automation, and cannot meet the needs of long-term large-scale testing. By using the relay array to switch the matrix, the main control unit directly controls the on and off of each high-precision capacitor through the control signal, which greatly improves the automation level of the capacitor box.
[0028] The specific steps of the test method of the above capacitor box are as follows: S1. The main control unit receives the capacitance generation instruction of the device under test from the host computer through the network port, and converts it into a switching control signal for the relay array by analyzing the capacitance generation instruction; S2, the main control unit controls the relay array to switch by switching the control signal, so that the relay array controls the on-off state of different fixed capacitors in the capacitor group combination array to form a detection capacitor combination suitable for the device under test; The detection capacitor combination is formed by a fixed capacitor in a 0.1-1.9pF capacitor group, a fixed capacitor in a 1.0-10pF capacitor group, a fixed capacitor in a 10-100pF capacitor group, and one or two fixed capacitors in a 100-1000pF capacitor group. The relay array is provided with 100 relays and is evenly divided into 50 groups. The 50 groups of relays correspond to the 50 fixed capacitors in the capacitor group combination array and control the on-off state of the corresponding fixed capacitors. The two relays in each group of relays are respectively connected to both sides of the lead of the fixed capacitor. When isolating a fixed capacitor, the relays on both sides of the fixed capacitor are turned on at the same time. In this way, the generation of various parasitic capacitances can be reduced to the maximum extent. S3, the main control unit corrects the detection capacitor combination so that the capacitance value accuracy of the detection capacitor combination is better than 0.1pF; S4. The main control unit outputs the capacitance value of the corrected detection capacitor combination to the device under test, thereby implementing the capacitance test operation of the device under test.
[0029] In the specific design, it is required that all the traces connected to the high-precision capacitors must be routed in a separate routing layer. The upper and lower layers of this special routing layer are both ground layers. At the same time, the line width of these traces is required to be 20mil, and the lines are divided by ground wires, and the width of the ground wire is not less than 40mil. After processing in these ways, the overall parasitic capacitance generated by the relay and the lead can be controlled within 2pF. Moreover, the errors generated by these parasitic capacitances are systematic errors, not random errors. From this, we can know that we can measure the actual capacitance values of all capacitors with a resolution of 0.1pF from 0.1pF to 1999.9pF (fixed capacitance plus parasitic capacitance). Since the capacitance of 0.1pF to 1.9pF is composed of the highest level of capacitance with an accuracy of 0.1pF, the system can easily increase or decrease the capacitance value through software. Therefore, through at most two capacitance tests, high-precision control of the full range of 0.1pF to 1999.9pF can be achieved.
[0030] The invention designs a high-precision and automated capacitor box design scheme, which receives instructions from a host computer through a network port, and controls the capacitor box to generate 0-1999pF continuously adjustable high-precision capacitance with a step of 0.1pF for a device under test by parsing the instructions, thereby greatly reducing the work intensity of testers and improving the test efficiency of various types of capacitor converters; and the capacitor box adopts advanced electronic control technology, can automatically switch the capacitance value, and read and record the output value in real time without manual intervention, can realize full-automatic testing of the capacitor converter, improves the test efficiency, reduces the influence of human factors on the test results, simplifies the test process, and reduces the test cost; in addition, the invention also simplifies the wiring steps of the capacitor converter, making the test preparation work simpler and faster; at the same time, the capacitor group combination array in the invention adopts a modular installation method, which makes the entire capacitor test system have high flexibility and scalability, can easily adapt to different types of capacitor converter test requirements, and provides a more reliable and efficient testing means for the research and development and production of capacitor converters.
Claims
1. A high-precision automated capacitance box testing method, characterized in that: The capacitor box includes a main control unit, a capacitor group combination array, and a relay array, and the main control unit is connected to the capacitor group combination array through the relay array; the implementation method includes the following steps: S1. The main control unit receives the capacitance generation instruction of the device under test from the host computer through the network port, and converts it into a switching control signal for the relay array by analyzing the capacitance generation instruction; S2, the main control unit controls the relay array to switch by switching the control signal, so that the relay array controls the on-off state of different fixed capacitors in the capacitor group combination array to form a detection capacitor combination suitable for the device under test; S3, the main control unit corrects the detection capacitor combination so that the capacitance value accuracy of the detection capacitor combination is better than 0.1pF; S4. The main control unit outputs the capacitance value of the corrected detection capacitor combination to the device under test, thereby implementing the capacitance test operation of the device under test.
2. The high-precision automated capacitor box testing method according to claim 1, characterized in that: The capacitor group combination array includes a 0.1-1.9pF capacitor group, a 1.0-10pF capacitor group, a 10-100pF capacitor group, and a 100-1000pF capacitor group; the detection capacitor combination is formed by a superposition combination of a fixed capacitor in the 0.1-1.9pF capacitor group, a fixed capacitor in the 1.0-10pF capacitor group, a fixed capacitor in the 10-100pF capacitor group, and one or two fixed capacitors in the 100-1000pF.
3. The high-precision automated capacitor box testing method according to claim 2, characterized in that: The 0.1-1.9pF capacitor group is formed by a combination of 0.1pF fixed capacitor, 0.2pF fixed capacitor, 0.3pF fixed capacitor, 0.4pF fixed capacitor, 0.5pF fixed capacitor, 0.6pF fixed capacitor, 0.7pF fixed capacitor, 0.8pF fixed capacitor, 0.9pF fixed capacitor, 1.0pF fixed capacitor, 1.1pF fixed capacitor, 1.2pF fixed capacitor, 1.3pF fixed capacitor, 1.4pF fixed capacitor, 1.5pF fixed capacitor, 1.6pF fixed capacitor, 1.7pF fixed capacitor, 1.8pF fixed capacitor and 1.9pF fixed capacitor.
4. The high-precision automated capacitance box testing method according to claim 3, characterized in that: The 1.0-10pF capacitor group is formed by combining a 2.0pF fixed capacitor, a 3.0pF fixed capacitor, a 3.9pF fixed capacitor, a 4.7pF fixed capacitor, a 5.6pF fixed capacitor, a 6.8pF fixed capacitor, a 7.5pF fixed capacitor, and an 8.2pF fixed capacitor.
5. The high-precision automated capacitance box testing method according to claim 4, characterized in that: The 10-100pF capacitor group is formed by a combination of 10pF fixed capacitor, 20pF fixed capacitor, 30pF fixed capacitor, 39pF fixed capacitor, 47pF fixed capacitor, 56pF fixed capacitor, 62pF fixed capacitor, 68pF fixed capacitor, 75pF fixed capacitor, 82pF fixed capacitor and 91pF fixed capacitor.
6. The high-precision automated capacitance box testing method according to claim 5, characterized in that: The 100-1000pF capacitor group is formed by combining 100pF fixed capacitor, 200pF fixed capacitor, 300pF fixed capacitor, 390pF fixed capacitor, 470pF fixed capacitor, 560pF fixed capacitor, 620pF fixed capacitor, 680pF fixed capacitor, 750pF fixed capacitor, 820pF fixed capacitor, 910pF fixed capacitor and 1000pF fixed capacitor.
7. The high-precision automated capacitor box testing method according to claim 6, characterized in that: The relay array is provided with 100 relays and is evenly divided into 50 groups. The 50 groups of relays correspond to the 50 fixed capacitors in the capacitor group combination array and control the on-off states of the corresponding fixed capacitors. The two relays in each group of relays are respectively connected to both sides of the leads of the fixed capacitors.
8. The high-precision automated capacitor box testing method according to claim 7, characterized in that: Among the 50 fixed capacitors in the capacitor group combination array, the width of the power line of each capacitor is 20 mil; a ground line is set between adjacent capacitors for division, and the width of the ground line is not less than 40 mil.
9. The high-precision automated capacitor box testing method according to claim 8, characterized in that: The 50 fixed capacitors in the capacitor group combination array are all aerospace-grade radio frequency and microwave multilayer chip ceramic capacitors of CCK41Q-1111-BC-150V-xxx-B or CCK41Q-1111-BC-150V-xxx-F, and the packaging form is 1111.