Scintillator detector for measuring slow extraction beam microstructure

Abstract

The invention relates to the technical field of accelerator beam diagnosis, in particular to a scintillator detector for measuring a slow extraction beam microstructure. The scintillator detector comprises a scintillator which is a rectangular plate and is used for receiving beam current to generate photons; the SiPM array is used for receiving photons generated by the scintillator and outputting electric signals; the SiPM processing circuit is used for performing summation processing and reverse processing on the electric signals; the supporting shell is used for installing all the components, one end of the supporting shell is arranged to be a cylindrical shell, and the other end of the supporting shell is arranged to be a rectangular shell; the SiPM array is arranged on the rectangular shell, and the SiPM processing circuit is arranged on the cylindrical shell and is electrically connected with the SiPM array; one end of the scintillator is embedded into the rectangular shell and is connected with the SiPM array, and the other end of the scintillator overhangs in a direction deviating from the cylindrical shell, so that the size of the scintillator detector is reduced, the power consumption is reduced, and the scintillator detector is suitable for high-counting-rate measurement.

Description

Technical Field

[0001] The invention relates to the technical field of accelerator beam diagnosis, and in particular to a scintillator detector for measuring a slow extraction beam microstructure. Background Art

[0002] Scintillation detectors are a commonly used particle detector that is widely used in the field of accelerators. In principle, particles lose energy when passing through a scintillator, which causes the atoms and molecules of the scintillator to be ionized or excited, and photons to be generated when de-excited. Therefore, the classic scintillator detector is composed of a photomultiplier tube (PMT) and a scintillator. However, due to the disadvantages of the photomultiplier tube (PMT), such as large size, high power consumption, high operating voltage, and sensitivity to magnetic fields, and the photomultiplier tube (PMT) will lose power at high count rates, the scintillator detector composed of the photomultiplier tube cannot be used for high count rate measurements. In the prior art, the silicon photomultiplier tube (SiPM) based on the semiconductor avalanche multiplication mechanism has the characteristics of high gain, high time resolution, low operating voltage, and low power consumption, so it has an inherent advantage in high count rate measurements.

[0003] At present, the slow extraction beam of the proton and heavy ion synchrotron plays an irreplaceable role in nuclear physics experiments, aerospace, material irradiation, biological breeding, tumor treatment, drug preparation, etc. The quality of the slow extraction beam is related to the utilization rate of the end-user beam and even the success or failure of the experiment. The quality of the beam requires a detector with high time resolution and high counting rate to measure the microstructure of the slow extraction. The measurement and analysis of the microstructure of the slow extraction beam is currently a key research topic of the proton and heavy ion synchrotron.

[0004] Therefore, there is an urgent need for a new detector suitable for proton and heavy ion synchrotron slow extraction microstructure measurement to solve the problems of existing scintillator detectors, such as large size, high power consumption, and inability to be applied to high count rate measurements. Summary of the invention

[0005] The present invention aims to solve at least one of the technical problems existing in the related art. To this end, the present invention proposes a scintillator detector for measuring slow extraction beam microstructure, which optimizes the structure of the support shell, combines the scintillator with the silicon photomultiplier tube and the related processing circuit, so that the scintillator detector is reduced in size, power consumption is reduced, and is suitable for high counting rate measurement.

[0006] The present invention provides a scintillator detector for measuring a slow extraction beam microstructure, the scintillator detector comprising: A scintillator, configured as a rectangular plate, is used to receive the beam to generate photons; A SiPM array, used to receive photons generated by the scintillator and output electrical signals; SiPM processing circuit for performing summing and inverse processing on the electrical signal; Among them, it also includes a support shell for installing the above components, one end of the support shell is set as a cylindrical shell, and the other end of the support shell is set as a rectangular shell; The SiPM array is installed in the rectangular housing, and the SiPM processing circuit is installed in the cylindrical housing and is electrically connected to the SiPM array; One end of the scintillator is embedded in the rectangular shell and connected to the SiPM array, and the other end of the scintillator is cantilevered in a direction away from the cylindrical shell; The cylindrical shell is composed of an end cover, a first sleeve, a transition flange and a second sleeve connected in sequence along the central axis direction thereof, the rectangular shell is arranged on the end surface of the second sleeve, and the cavity of the rectangular shell is connected to the cavity of the cylindrical shell; The SiPM processing circuit is embedded in the second sleeve, and a flexible flat cable for connecting the SiPM processing circuit and the SiPM array is passed through the rectangular shell.

[0007] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the diameter of the second sleeve is greater than the diameter of the first sleeve, and the adapter flange forms an annular end surface between the first sleeve and the second sleeve.

[0008] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the SiPM processing circuit is provided with a bias interface for realizing the SiPM bias adjustment function, and the end cover is provided with a bias control interface; A SiPM control cable is installed in the first sleeve and is used to connect the bias control interface with the bias interface.

[0009] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the scintillator is made of EJ200 scintillating material and its outer surface is wrapped with light-proof tape.

[0010] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the SiPM processing circuit is provided with a SiPM temperature measurement and compensation function.

[0011] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the SiPM array is composed of 20 SiPM units, and the SiPM units are coupled to the scintillator.

[0012] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the end cap is provided with an SMA signal connector, and the SiPM processing circuit is provided with a signal output interface; A signal cable is installed in the first sleeve and is used to connect the SMA signal connector and the signal output interface.

[0013] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the support shell is made of aluminum material, and the wall thickness of the support shell is 2 mm.

[0014] According to a scintillator detector for measuring slow extraction beam microstructure provided by the present invention, the bias interface and the bias control interface both adopt a Type-C interface.

[0015] The above one or more technical solutions in the present invention have at least one of the following technical effects: 1. The scintillator is integrated with the silicon photomultiplier tube and the related processing circuit through the support shell. The compact structure of the support shell is used to reduce the volume of the scintillator detector. The power consumption of the scintillator detector is greatly reduced through the SiPM array, and the scintillator detector is suitable for high count rate measurement.

[0016] 2. The SiPM processing circuit adopts an adjustable gain circuit design, which can be applied to the measurement of ion beams with different energies, such as protons to uranium beams; the use of the SiPM array ensures the stability of the signal amplitude and the accuracy of the count of the scintillator detector at high count rates.

[0017] 3. One end of the support shell is designed as a cylindrical shell, so that the scintillator detector can be conveniently installed on the membrane window probe on the accelerator beam line by plugging and unplugging.

[0018] 4. The support shell is made of aluminum material, which can shield the influence of the beam on the SiPM processing circuit, so that the scintillator detector has a good signal-to-noise ratio.

[0019] 5. The mechanical structure is reliable, the operation and maintenance are simple and reliable, it can be operated and used stably for a long time, and can be widely used in the field of accelerator beam diagnosis.

[0020] In addition to the technical problems solved by the present invention, the technical features of the technical solutions constituted, and the advantages brought about by the technical features of these technical solutions described above, other technical features of the present invention and the advantages brought about by these technical features will be further explained in conjunction with the accompanying drawings or will be understood through the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0022] Figure 1 A schematic diagram of the three-dimensional structure of a scintillator detector provided in an embodiment of the present invention.

[0023] Figure 2 A cross-sectional structural diagram of a scintillator detector provided in an embodiment of the present invention along a transverse symmetry plane.

[0024] Figure 3 A schematic diagram of the operation of a scintillator detector provided in an embodiment of the present invention.

[0025] Figure 4 A schematic diagram of offline testing of a scintillator detector provided in an embodiment of the present invention.

[0026] Reference numerals: 1. Scintillator; 2. SiPM array; 3. Flexible flat cable; 4. SiPM processing circuit; 5. Bias interface; 6. Signal output interface; 7. Support shell; 71. End cover; 72. First sleeve; 73. Adapter flange; 74. Second sleeve; 8. Bias control interface; 9. SMA signal connector. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] At present, the slow extraction beam of the proton and heavy ion synchrotron plays an irreplaceable role in nuclear physics experiments, aerospace, material irradiation, biological breeding, tumor treatment, drug preparation, etc. The quality of the slow extraction beam is related to the utilization rate of the end-user beam and even the success or failure of the experiment. The quality of the beam requires a detector with high time resolution and high counting rate to measure the microstructure of the slow extraction. The measurement and analysis of the microstructure of the slow extraction beam is currently a key research topic of the proton and heavy ion synchrotron.

[0029] Therefore, there is an urgent need for a new detector suitable for proton and heavy ion synchrotron slow extraction microstructure measurement to solve the problems of existing scintillator detectors, such as large size, high power consumption, and inability to be applied to high count rate measurements.

[0030] In an embodiment of the present invention, a scintillator detector for measuring a slow extraction beam microstructure is introduced.

[0031] like Figure 1 and Figure 2 As shown, the scintillator detector mainly includes a scintillator 1, a SiPM array 2, a SiPM processing circuit 4 and a supporting shell 7. The scintillator 1, the SiPM array 2 and the SiPM processing circuit 4 are mounted on the supporting shell 7 to form an integrated structure.

[0032] The scintillator 1 is configured as a rectangular plate for receiving a beam to generate photons. The SiPM array 2 is configured to receive the photons generated by the scintillator 1 and output electrical signals. The SiPM processing circuit 4 is configured to perform summation and inverse processing on the electrical signals.

[0033] One end of the support shell 7 is set as a cylindrical shell to ensure that the scintillator detector can be easily installed on the membrane window probe on the accelerator beam line by plugging and unplugging. The other end of the support shell 7 is set as a rectangular shell to adapt to the shape of the scintillator 1.

[0034] The SiPM array 2 is installed in a rectangular housing. The SiPM processing circuit 4 is installed in a cylindrical housing. Meanwhile, the SiPM processing circuit 4 is electrically connected to the SiPM array 2.

[0035] One end of the scintillator 1 is embedded in the rectangular housing and connected to the SiPM array 2. The other end of the scintillator 1 is cantilevered in a direction away from the cylindrical housing to receive the beam to generate photons.

[0036] Furthermore, the SiPM array 2 may include multiple SiPM units. Each SiPM unit may include multiple avalanche photodiodes (APDs) operating in Geiger mode. Each APD is a pixel and outputs a charge pulse signal after receiving a photon. The sum of the charge output by all APDs is proportional to the total number of photons detected by the SiPM unit.

[0037] In this embodiment, the scintillator 1 is integrated with the silicon photomultiplier tube and the related processing circuit through the support shell 7. The compact structure of the support shell 7 is used to reduce the size of the scintillator detector. The power consumption of the scintillator detector is greatly reduced through the SiPM array 2, and the scintillator detector is suitable for high count rate measurement.

[0038] Based on the above embodiment, in another embodiment of the present invention, a scintillator detector for measuring the microstructure of a slow extraction beam is introduced.

[0039] like Figure 2 As shown, the cylindrical shell is composed of an end cover 71, a first sleeve 72, an adapter flange 73 and a second sleeve 74. Moreover, the end cover 71, the first sleeve 72, the adapter flange 73 and the second sleeve 74 are sequentially connected along the central axis direction of the cylindrical shell.

[0040] The rectangular shell is arranged on the end surface of the second sleeve 74. The cavity of the rectangular shell is connected to the cavity of the cylindrical shell. In this way, the main components such as the SiPM array 2 and the SiPM processing circuit 4 can be sequentially installed inside the support shell 7 to avoid interference from the beam.

[0041] Furthermore, the SiPM processing circuit 4 is embedded in the second sleeve 74. A flexible flat cable 3 for connecting the SiPM processing circuit 4 and the SiPM array 2 is inserted into the rectangular housing.

[0042] The support shell 7 is made of aluminum material. The wall thickness of the support shell 7 is 2 mm.

[0043] In this embodiment, by optimizing the structure of the support shell 7, the mechanical structure of the scintillator detector is reliable, the operation and maintenance are simple and reliable, and it can be used stably for a long time, and can be widely used in the field of accelerator beam diagnosis. At the same time, the support shell 7 is made of aluminum material, which can shield the influence of the beam on the SiPM processing circuit 4, so that the scintillator detector has a good signal-to-noise ratio.

[0044] Based on the above embodiment, in another embodiment of the present invention, a scintillator detector for measuring the microstructure of a slow extraction beam is introduced.

[0045] In order to ensure that the scintillator detector and the membrane window probe of the accelerator are accurately inserted into each other, the diameter of the second sleeve 74 is set to be larger than the diameter of the first sleeve 72 .

[0046] In this way, the adapter flange 73 forms an annular end surface between the first sleeve 72 and the second sleeve 74 , which can abut against the membrane window probe to play a positioning role when the first sleeve 72 is inserted.

[0047] Based on the above embodiment, in another embodiment of the present invention, a scintillator detector for measuring the microstructure of a slow extraction beam is introduced.

[0048] The scintillator detector mainly includes a scintillator 1, a SiPM array 2, a SiPM processing circuit 4 and a supporting shell 7. The scintillator 1, the SiPM array 2 and the SiPM processing circuit 4 are mounted on the supporting shell 7 to form an integrated structure.

[0049] One end of the support shell 7 is set as a cylindrical shell to ensure that the scintillator detector can be conveniently installed on the membrane window probe on the accelerator beam line by plugging and unplugging. The cylindrical shell is composed of an end cover 71, a first sleeve 72, an adapter flange 73 and a second sleeve 74. In addition, the end cover 71, the first sleeve 72, the adapter flange 73 and the second sleeve 74 are sequentially connected along the central axis direction of the cylindrical shell.

[0050] The other end of the support shell 7 is configured as a rectangular shell to fit the shape of the scintillator 1. The rectangular shell is disposed on the end surface of the second sleeve 74. The cavity of the rectangular shell is communicated with the cavity of the cylindrical shell.

[0051] Furthermore, the SiPM processing circuit 4 is embedded in the second sleeve 74. A flexible flat cable 3 for connecting the SiPM processing circuit 4 and the SiPM array 2 is inserted into the rectangular housing.

[0052] In order to be applicable to the measurement of ion beams with different energies such as proton to uranium beam, the SiPM processing circuit 4 is provided with a bias interface 5 for realizing the SiPM bias adjustment function. Correspondingly, the end cover 71 is provided with a bias control interface 8.

[0053] The SiPM control cable is installed in the first sleeve 72, and is used to connect the bias control interface 8 and the bias interface 5. The SiPM control cable is a multi-core cable.

[0054] Furthermore, the bias interface 5 adopts a Type-C interface. The bias control interface 8 adopts a Type-C interface.

[0055] Furthermore, the SiPM processing circuit 4 adopts a gain-adjusting circuit design, which can be effectively applied to beam measurements of different beam types and beam energies.

[0056] In addition, the SiPM processing circuit 4 is provided with SiPM temperature measurement and compensation functions.

[0057] In this embodiment, by setting the bias interface 5, the gain adjustment circuit and the SiPM temperature measurement and compensation functions in the SiPM processing circuit 4, the scintillator detector has a faster response time and a higher count rate when measuring the slow extraction beam microstructure, and can more accurately measure the information of the slow extraction microstructure. The output signal pulse width of the scintillator detector is 20ns, and a high count rate measurement of 5E7 particles per second (pps) can be achieved at most.

[0058] Based on the above embodiment, in another embodiment of the present invention, a scintillator detector for measuring the microstructure of a slow extraction beam is introduced.

[0059] like Figure 1 and Figure 4As shown, the scintillator 1 is configured as a rectangular plate for receiving a beam to generate photons. The outer surface of the scintillator 1 is wrapped with a light-shielding tape. The size of the scintillator 1 is configured as 86 mm×70 mm×5 mm. The size and shape of the scintillator 1 are not limited to the size and shape shown in the figure.

[0060] The scintillator 1 is made of EJ200 scintillator material, which is a plastic scintillator 1 material produced by Eljen Technology. EJ200 has good mechanical properties and can be easily processed into various shapes and sizes.

[0061] The EJ200 has a high light yield and responds well to high-energy particles (such as fast neutrons).

[0062] The fluorescence decay time of EJ200 is short, and it can quickly return from the excited state to the ground state and emit photons, making it more suitable for application scenarios that require high-speed counting.

[0063] The main luminescence peak of EJ200 is located at about 425 nanometers, which is in the blue spectrum. The scintillator 1 made of EJ200 scintillating material has good compatibility with the silicon photomultiplier tube.

[0064] Furthermore, the SiPM array 2 is composed of 20 SiPM units, which are coupled to the scintillator 1 .

[0065] The model of the SiPM unit is microfj-30035-tr1. The outer dimensions of the SiPM unit are 3.16 mm × 3.16 mm.

[0066] In the SiPM array 2 , the number of SiPM units can be determined based on the size of the scintillator 1 .

[0067] Based on the above embodiment, in another embodiment of the present invention, a scintillator detector for measuring the microstructure of a slow extraction beam is introduced.

[0068] The end cap 71 is provided with an SMA signal connector 9. The SiPM processing circuit 4 is provided with a signal output interface 6.

[0069] A signal cable is installed in the first sleeve 72 to connect the SMA signal connector 9 and the signal output interface 6. The signal cable is a radio frequency cable.

[0070] Based on the above embodiment, in another embodiment of the present invention, a method for using a scintillator detector is introduced.

[0071] like Figure 3As shown, the scintillator 1 is placed in beam irradiation, and the scintillator 1 generates photons and transmits the photons to the SiPM array 2. The SiPM array 2 receives the photons generated by the scintillator 1 and outputs electrical signals to the SiPM processing circuit 4.

[0072] After the electrical signal passes through the SiPM processing circuit 4, a measurement signal is output. By sending parameters, the output amplitude is adjusted to adapt to proton and heavy ion beams of different beam types and beam energies.

[0073] The bias control interface 8 of the scintillator detector is connected to the computer via a SiPM control cable, and the SMA signal connector 9 of the scintillator detector is connected to the oscilloscope via a radio frequency cable.

[0074] Furthermore, in another embodiment of the present invention, an offline testing method for a scintillator detector is introduced.

[0075] like Figure 4 As shown, the test method includes: placing an X-ray source close to the scintillator 1; connecting the bias control interface 8 to a personal computer (PC) so as to use the bias control software to send parameters, thereby controlling the amplitude of the scintillator detector output signal; and setting the SMA signal connector 9 to connect to the oscilloscope, thereby reading the scintillator detector output signal through the oscilloscope.

[0076] By testing the working state of the scintillator detector through this method, a calibrated standard scintillator detector can be provided for the ionization chamber. The beam signal can be accurately measured by the standard scintillator detector, and then the quality of the slow extraction beam can be analyzed to achieve accurate calibration of particles with strong penetrating ability, such as protons, helium ions and other light ions, to provide support for accelerator beam tuning.

[0077] In the description of the embodiments of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as limitations on the embodiments of the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0078] In the description of the embodiments of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "connected" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present invention can be understood according to specific circumstances.

[0079] In the embodiments of the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0080] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the embodiment of the present invention. In this specification, the schematic representations of the above terms are not limited to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A scintillator detector for measuring slow extraction beam microstructure, characterized in that: include: A scintillator (1) is configured as a rectangular plate and is used to receive a beam to generate photons; A SiPM array (2) for receiving photons generated by the scintillator (1) and outputting electrical signals; SiPM processing circuit (4) for performing summing and inverse processing on the electrical signal; It also includes a support shell (7) for mounting the above components, one end of the support shell (7) is configured as a cylindrical shell, and the other end of the support shell (7) is configured as a rectangular shell; The SiPM array (2) is installed in the rectangular housing, and the SiPM processing circuit (4) is installed in the cylindrical housing and is electrically connected to the SiPM array (2); One end of the scintillator (1) is embedded in the rectangular shell and connected to the SiPM array (2), and the other end of the scintillator (1) is cantilevered in a direction away from the cylindrical shell; The cylindrical shell is composed of an end cover (71), a first sleeve (72), a transfer flange (73) and a second sleeve (74) connected in sequence along the central axis direction thereof; the rectangular shell is arranged on the end surface of the second sleeve (74); and the cavity of the rectangular shell is in communication with the cavity of the cylindrical shell; The SiPM processing circuit (4) is embedded in the second sleeve (74), and a flexible flat cable (3) for connecting the SiPM processing circuit (4) and the SiPM array (2) is passed through the rectangular housing.

2. The scintillator detector for measuring slow extraction beam microstructure according to claim 1, characterized in that: The diameter of the second sleeve (74) is greater than the diameter of the first sleeve (72), and the adapter flange (73) forms an annular end surface between the first sleeve (72) and the second sleeve (74).

3. The scintillator detector for measuring slow extraction beam microstructure according to claim 1, characterized in that: The SiPM processing circuit (4) is provided with a bias interface (5) for realizing the SiPM bias adjustment function, and the end cover (71) is provided with a bias control interface (8); A SiPM control cable is installed in the first sleeve (72) and is used to connect the bias control interface (8) and the bias interface (5).

4. The scintillator detector for measuring slow extraction beam microstructure according to any one of claims 1 to 3, characterized in that: The scintillator (1) is made of EJ200 scintillating material and its outer surface is wrapped with light-proof tape.

5. The scintillator detector for measuring slow extraction beam microstructure according to claim 4, characterized in that: The SiPM processing circuit (4) is provided with SiPM temperature measurement and compensation functions.

6. The scintillator detector for measuring slow extraction beam microstructure according to claim 4, characterized in that: The SiPM array (2) is composed of 20 SiPM units, and the SiPM units are coupled to the scintillator (1).

7. The scintillator detector for measuring slow extraction beam microstructure according to any one of claims 1 to 3, characterized in that: The end cover (71) is provided with an SMA signal connector (9), and the SiPM processing circuit (4) is provided with a signal output interface (6); A signal cable is installed in the first sleeve (72) and is used to connect the SMA signal connector (9) and the signal output interface (6).

8. The scintillator detector for measuring slow extraction beam microstructure according to any one of claims 1 to 3, characterized in that: The support shell (7) is made of aluminum material, and the wall thickness of the support shell (7) is 2 mm.

9. The scintillator detector for measuring slow extraction beam microstructure according to claim 3, characterized in that: The bias voltage interface (5) and the bias voltage control interface (8) both adopt Type-C interfaces.

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