A Fast Verification Method for Data Transmission of a Non-Standard Type-C Interface

Abstract

The present invention provides a method for quickly verifying data transmission of a non-standard Type-C interface. First, a verification request triggered when a target device is connected to the non-standard Type-C interface is obtained, which includes a physical connection status identifier and current transmission mode parameters. Then, based on the physical connection status identifier, real-time signal characteristics of the interface are extracted, including voltage fluctuation sequences, etc. Next, the real-time signal characteristics are dynamically matched with a standard transmission parameter library, and after generating a set of test instructions including prioritized verification actions and trigger condition thresholds, the set of test instructions is called to perform staged signal injection and feedback capture on the interface, and the execution results and timing marks are recorded. Finally, a verification report is generated accordingly, and abnormal nodes that do not meet the transmission stability index are mapped to defect descriptions of the interface physical structure, realizing fast, comprehensive, and accurate data transmission verification of the non-standard Type-C interface.

Description

Technical Field

[0001] The present invention relates to the technical field of computer testing, and in particular, to a method for quickly verifying data transmission of a non-standard Type-C interface. Background Art

[0002] With the continuous development and popularization of electronic devices, the Type-C interface has been widely used in various electronic products due to its many advantages, such as supporting plugging in either direction, high-speed data transmission, high-power charging, etc. However, due to the diversity of electronic devices in the market and the differentiated requirements of different manufacturers for interface applications, non-standard Type-C interfaces have emerged.

[0003] Although non-standard Type-C interfaces meet the special needs of specific devices or scenarios to a certain extent, they also bring a series of problems in data transmission verification. For example, in the prior art, the data transmission verification method for standard Type-C interfaces is relatively mature, mainly verifying some basic electrical parameters and transmission specifications according to a fixed standard process, such as simply detecting the rated voltage, current of the interface and the data transmission accuracy at a fixed rate.

[0004] However, the verification method for standard interfaces cannot be directly applied to non-standard Type-C interfaces. On the one hand, the physical connection method and transmission mode of non-standard Type-C interfaces are often unique, and the prior art cannot effectively handle various states of these non-standard Type-C interfaces when accessing devices, so it is difficult to effectively evaluate the subsequent data transmission situation. On the other hand, most existing verification schemes adopt a fixed test instruction set and cannot dynamically adjust the test content and priority according to the real-time signal characteristics of non-standard Type-C interfaces, resulting in a lack of pertinence in the verification process when facing the complex and changeable transmission characteristics of non-standard interfaces, and it is difficult to accurately detect potential transmission problems. Summary of the Invention

[0005] In view of the problems mentioned above, in combination with the first aspect of the present invention, embodiments of the present invention provide a method for quickly verifying data transmission of a non-standard Type-C interface, and the method includes:

[0006] Obtain a verification request triggered when a target device accesses a non-standard Type-C interface, where the verification request includes a physical connection status identifier of the interface to be verified and current transmission mode parameters, and the current transmission mode parameters are used to represent status parameters in the current transmission mode;

[0007] Based on the physical connection status identifier, extract the real-time signal characteristics of the non-standard Type-C interface in the current transmission mode from a preset signal acquisition module, where the real-time signal characteristics include a voltage fluctuation sequence, a current change trajectory, and a data packet transmission interval distribution;

[0008] Dynamically match the real-time signal characteristics with a preset standard transmission parameter library to generate a test instruction set for the non-standard Type-C interface, where the test instruction set contains multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds;

[0009] Invoke the verification actions in the test instruction set to perform staged signal injection and feedback capture on the non-standard Type-C interface, and record the execution results of each verification action and the corresponding timing marks;

[0010] Generate a verification report based on the execution results and timing marks, and map the abnormal nodes that do not meet the preset transmission stability index in the verification report to the physical structure defect description of the non-standard Type-C interface.

[0011] On the other hand, an embodiment of the present invention further provides an interface data transmission verification system, including a processor and a machine-readable storage medium. The machine-readable storage medium is connected to the processor. The machine-readable storage medium is used to store programs, instructions, or codes, and the processor is used to execute the programs, instructions, or codes in the machine-readable storage medium to implement the above method.

[0012] Based on the above aspects, in the embodiments of the present invention, real-time signal characteristics of a non-standard Type-C interface in the current transmission mode are extracted from a preset signal acquisition module based on a physical connection status identifier, covering multi-dimensional information such as voltage fluctuation sequences, current change trajectories, and packet transmission interval distributions. By dynamically matching the real-time signal characteristics with a preset standard transmission parameter library, a test instruction set containing multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds is generated. It can intelligently generate personalized test instructions according to the real-time situation of the interface. Compared with the traditional fixed-mode test instruction generation method, it can better adapt to the diversity and complexity of non-standard interfaces, effectively improve the accuracy and coverage of verification, and ensure that various potential problems can be detected in a timely manner. In the stage of executing verification actions, the verification actions in the test instruction set are called to perform staged signal injection and feedback capture on the non-standard Type-C interface, and the execution results of each verification action and the corresponding timing marks are recorded, making the verification process more detailed and traceable. Different from the traditional one-time verification method, staged verification can deeply check the performance of the interface at different stages, and the detailed timing marks provide data support for subsequent problem analysis, helping to quickly locate the problem. Finally, a verification report is generated based on the execution results and timing marks, and the abnormal nodes that do not meet the preset transmission stability indicators in the verification report are mapped to the physical structure defect description of the non-standard Type-C interface. This can not only intuitively present the verification results of the interface, but also deeply explore the root causes of problems, associate abstract transmission anomalies with specific physical structure defects, and help improve the overall quality and reliability of non-standard Type-C interfaces. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 is a schematic flowchart of the execution process of the data transmission quick verification method for a non-standard Type-C interface provided by an embodiment of the present invention.

[0014] Figure 2 is a schematic diagram of exemplary hardware and software components of an interface data transmission verification system provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0015] The present invention will be specifically described below with reference to the accompanying drawings of the specification. Figure 1 is a schematic flowchart of the data transmission quick verification method for a non-standard Type-C interface provided by an embodiment of the present invention. The data transmission quick verification method for the non-standard Type-C interface will be introduced in detail below.

[0016] Step S110: Obtain a verification request triggered when the target device accesses a non-standard Type-C interface. The verification request includes a physical connection status identifier of the interface to be verified and current transmission mode parameters, where the current transmission mode parameters are used to represent the status parameters in the current transmission mode.

[0017] In this embodiment, consider a scenario: There is a new type of tablet computer as the target device, which is designed to support multiple functions such as charging, data transmission, and connecting an external display device through the Type-C interface. During the production test, the tablet computer needs to be connected to a non-standard Type-C interface (here, non-standard usually means that there are differences in the internal circuit layout or some electrical parameters of the interface compared with the standard Type-C interface. For example, it is customized for a special charger or external device). When the tablet computer is connected to the non-standard Type-C interface, the program system inside the tablet computer will automatically trigger a verification request. The verification request includes the physical connection status identifier of the interface to be verified. For example, the physical connection status identifier can clarify whether this connection is a first connection or a reconnection status. If the tablet computer is connected to this specific non-standard Type-C interface for the first time, the physical connection status identifier will be marked as the first connection status; if there has been a previous connection record, it will be marked as the reconnection status. At the same time, the verification request can also include the current transmission mode parameters. Assume that the current usage scenario of the tablet computer is to perform data backup while charging. Then the current transmission mode parameters will include information related to charging and data transmission, such as the power requirement for charging, the data transmission rate requirement (such as the transmission rate of USB3.1 Gen2), etc.

[0018] Step S120: Based on the physical connection status identifier, extract the real-time signal characteristics of the non-standard Type-C interface in the current transmission mode from a preset signal acquisition module. The real-time signal characteristics include a voltage fluctuation sequence, a current change trajectory, and a packet transmission interval distribution.

[0019] Continuing with the scenario of the above-mentioned tablet computer connected to a non-standard Type-C interface as an example. If the physical connection status indicator indicates the first connection state, then during the testing process, the high-speed sampling unit in the preset signal acquisition module can be activated. The high-speed sampling unit is configured to collect the initial handshake signal of the non-standard Type-C interface at a relatively high first sampling frequency. For example, the first sampling frequency can be set to collect a signal sample every microsecond. During this process, the signal conditions of the power pins, ground pins, and data pins can be collected. For the initial handshake signal, parameters such as the voltage rise slope, current steady-state value, and handshake protocol response time are extracted with emphasis. Suppose during this initial handshake process of the first connection, when the collected voltage rises from 0V to 5V, its rise slope is a value that gradually increases and then tends to be stable. After calculation, the voltage rise slope is 0.5V / millisecond (this is just an example value). At the same time, it is measured that the current reaches a stable current steady-state value after a short fluctuation, such as 0.5A. And the handshake protocol response time from the start of the connection to the completion of the handshake protocol interaction is timed to be 10 milliseconds. These parameters are all key features in the initial handshake signal.

[0020] When the physical connection status identifier indicates a reconnection state, the test system switches to the anti-interference sampling unit in the signal acquisition module. This anti-interference sampling unit performs acquisitions at a relatively low preset second sampling frequency, such as once every 5 microseconds, and is configured with a dynamic filtering algorithm to eliminate residual noise from historical connections. Taking the reconnection scenario as an example, when a tablet computer reconnects to a non-standard Type-C interface, the anti-interference sampling unit acquires the reconnection synchronization signal of the non-standard Type-C interface. During this process, parameters such as the noise suppression ratio, phase offset, and data retransmission count can be extracted from the reconnection synchronization signal. Assume that during reconnection, due to certain electromagnetic interference in the surrounding environment, but through the dynamic filtering algorithm of the anti-interference sampling unit, the measured noise suppression ratio is 80% (indicating that 80% of the external interference noise can be suppressed). At the same time, the detected phase offset is 5 degrees (here to illustrate that there is a certain phase shift), and due to possible instability factors in the previous connection, the data retransmission count is 2 times (indicating that 2 data packets need to be retransmitted to ensure data integrity). Finally, the extracted parameters of the initial handshake signal during the first connection or the reconnection synchronization signal during reconnection are combined with the current transmission mode parameters (such as the relevant requirements for charging and data transmission) for analysis to generate a real-time signal feature containing a timestamp. For example, combining the voltage rise slope, current steady-state value, and handshake protocol response time during the first connection with parameters such as 5V, 0.5A for charging requirements and the rate of USB3.1 Gen2 for data transmission requirements, and adding the timestamp for each acquisition point to form a complete real-time signal feature. This real-time signal feature contains information such as the voltage fluctuation sequence, current change trajectory, and data packet transmission interval distribution for subsequent analysis.

[0021] Step S130, perform dynamic matching based on the real-time signal feature and a preset standard transmission parameter library to generate a set of test instructions for the non-standard Type-C interface. The set of test instructions contains multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds.

[0022] In the above scenario, a reference signal template corresponding to the current transmission mode parameters can be loaded from the standard transmission parameter library. Assuming that the current transmission mode is simultaneous charging and data transmission, the corresponding reference signal template is found from the standard transmission parameter library. This reference signal template includes a standard voltage range (e.g., 4.5V - 5.5V), an allowable current threshold (e.g., 0.4A - 0.6A), and a data packet integrity verification rule (such as using CRC-32 verification, requiring that the verification result must be correct, and the interval between data packets cannot exceed 10 milliseconds, etc.). Then, the voltage fluctuation sequence in the real-time signal characteristics is compared point by point with the standard voltage range. For example, in the previously collected voltage fluctuation sequence, it is detected that there are several points where the voltage value is lower than 4.5V. For these abnormal voltage points outside the standard voltage range, calculate their duration (assuming that one of the low voltage points lasts for 5 milliseconds) and amplitude deviation (such as the deviation from the standard voltage lower limit of 4.5V is -0.2V).

[0023] Next, the current change trajectory is segmented and fitted with the allowable current threshold. Assuming that during the charging process, the current change trajectory shows that the current suddenly rises from 0.5A to 0.7A within a certain time period, this area is identified as the current over-limit area. By further analyzing the load fluctuation pattern corresponding to this current over-limit area, it is detected that it is due to the tablet computer starting a high-power background task during this time period, resulting in a sudden increase in the load. Then, the time sequence correlation between the data packet transmission interval distribution and the data packet integrity verification rule is carried out. For example, during the data transmission process, it is detected that the transmission intervals of 3 data packets exceed 10 milliseconds, and the packet loss rate (assuming it is 5%), the number of out-of-order times (assuming it is 1 time), and the verification failure events (such as the CRC-32 verification result of one of the data packets fails) are counted.

[0024] Based on the statistical results of these abnormal voltage points, current over-limit regions, and verification failure events, a matching difference matrix containing weight scores is generated. For example, the duration and amplitude deviation of each abnormal voltage point are classified in segments. If an abnormal voltage point has a long duration and a large amplitude deviation, its influence range level is rated as high, which means that the voltage fluctuation has a high potential risk level for the stability of the interface power supply. For the current over-limit region, the instantaneous overload capacity and steady-state load adaptability of the non-standard Type-C interface are identified according to the load fluctuation pattern. Suppose that in the above case of current over-limit, the instantaneous overload capacity of the interface is detected to be 1.2 A (indicating the maximum instantaneous current that can be tolerated), and the steady-state load adaptability is 0.6 A (indicating the load current suitable in the stable state). Based on the difference between the two, a current stability score is generated (such as calculating a score representing stability through a specific formula). For the verification failure events, the type distribution and occurrence frequency of the verification failure events are extracted, and the verification failure events are classified into protocol mismatch type, timing disorder type, and data corruption type. Suppose that in this scenario, the verification failure event is of the data corruption type and occurs 1 time within 10 seconds. The triggering times of each type of verification failure event per unit time are statistically obtained to get the type distribution of the verification failure events.

[0025] Then, based on the influence scope level, current stability score, and the distribution of verification failure event types, a voltage weight coefficient is assigned to each abnormal voltage point, a current weight coefficient is assigned to each current over-limit area, and a verification weight coefficient is assigned to each type of verification failure event. For example, a higher voltage weight coefficient is assigned to abnormal voltage points with high risk, a corresponding current weight coefficient is assigned to the current over-limit area according to its impact on stability, and a verification weight coefficient is assigned to the verification failure event according to its type and occurrence frequency. Then, the above weight coefficients are mapped to a multi-dimensional space coordinate system according to a preset rule to generate a matching difference matrix. In this matching difference matrix, each dimension corresponds to an abnormal type (such as voltage abnormality, current abnormality, verification failure, etc.), and the value of the matrix node represents the comprehensive influence weight of the corresponding type of abnormality on transmission stability. According to the value size of the nodes in the matching difference matrix, a verification action priority list is generated from high to low, and a trigger condition threshold is associated with each verification action. For example, the verification action corresponding to the abnormality with the highest value has the highest priority. For a situation with severe voltage fluctuations, the priority of its corresponding verification action (such as in-depth testing of voltage stability) is set to the highest, and a trigger condition threshold is set, such as the allowable upper limit of voltage fluctuation is ±0.1V (indicating that more stringent testing or a fault determination is triggered when the fluctuation range is exceeded), the current transient recovery time is 100 milliseconds (indicating that the current should return to the normal range within 100 milliseconds after a transient change in current), and the tolerance number of verification failures is 0 times (indicating that no verification failure is allowed), etc. If the value of any node in the matching difference matrix exceeds the preset emergency response threshold (such as the comprehensive influence weight of an abnormality reaches 0.8, while the emergency response threshold is set to 0.7), the priority of the corresponding verification action is raised to the highest level, and the strictness of its trigger condition threshold is dynamically adjusted, such as further reducing the allowable upper limit of voltage fluctuation to ±0.05V, etc. Finally, a verification action group in the test instruction set is generated in sequence according to the priority list.

[0026] Step S140, call the verification actions in the test instruction set, perform staged signal injection and feedback capture on the non-standard Type-C interface, and record the execution results of each verification action and the corresponding timing marks.

[0027] In the above test scenario of the tablet computer and the non-standard Type-C interface, according to the priority order of the verification actions, the target verification actions are sequentially selected from the test instruction set, and the trigger condition thresholds corresponding to the target verification actions are parsed. For example, the first selected target verification action belongs to the voltage stability test type, and a stepped voltage waveform is injected into the power supply pins of the non-standard Type-C interface as required. Suppose the injected stepped voltage waveform starts from 4.5V, rises step by step by 0.1V to 5.5V, and then gradually drops back to 4.5V. While injecting the voltage, the transient response of the feedback current and the voltage drop recovery time are synchronously monitored. For example, when the voltage rises to 5.0V, it is detected that the feedback current instantaneously rises from 0.5A to 0.6A and then returns to 0.5A after 50 milliseconds. The transient response and the voltage drop recovery time during this process are recorded.

[0028] Next, if the next target verification action belongs to the data integrity test type, a preset verification data sequence is sent to the data channel of the non-standard Type-C interface. A standard test data packet containing an incrementing sequence number, a pseudo-random data block, and a cyclic redundancy check code (CRC-32) is constructed, and the verification data sequence corresponding to the standard test data packet is sent to the data channel of the non-standard Type-C interface at a preset sending interval (such as sending one data packet every 1 millisecond). A data packet listener is deployed at the receiving end of the non-standard Type-C interface, and the arrival time, sequence number integrity, and check code matching status of each received standard test data packet are recorded through this data packet listener. For example, after sending 100 data packets, it is detected that the arrival time of the 50th data packet is 2 milliseconds later than expected, and the check code matching status indicates that the check code does not match. The one-way transmission delay is calculated based on the sending interval and the arrival time to obtain the response delay of the data channel (such as the response delay of the 50th data packet is 2 milliseconds), and the occurrence location (the 50th data packet) and interval of the packet loss event are statistically analyzed based on the sequence number integrity. When the check code matching status indicates that the check code does not match, a retransmission request generator is triggered to send a retransmission instruction to the sending end, and the retransmission request frequency of the retransmission instruction is statistically analyzed (such as during the transmission of these 100 data packets, the retransmission request frequency is 10%, that is, 10 data packets need to be retransmitted) and the successful response ratio (assuming 8 of the retransmitted data packets are successful, then the successful response ratio is 80%), as well as the bit error rate corresponding to the check code matching status (a numerical value representing the bit error rate is calculated according to a specific algorithm). The one-way transmission delay, the packet loss event, and the retransmission response ratio are integrated into a data integrity evaluation matrix and associated with the sending batch identifier of the current test data packet.

[0029] If the next target verification action belongs to the physical connection durability test type, control the plugging and unplugging mechanism of the non-standard Type-C interface to perform periodic connection-disconnection operations. For example, control the robotic arm to grip the plug part of the non-standard Type-C interface and perform 100 insertion-withdrawal cycles at a preset plugging and unplugging speed (such as 1 insertion and withdrawal per second) and force (such as applying a 1N plugging and unplugging force). After each insertion is completed, measure the contact resistance value between the power pin and the ground pin of the non-standard Type-C interface using a contact resistance tester, and record the initial value of the contact resistance value (assuming the initial value after the first insertion is 0.1Ω) and the stable value (the resistance value after a period of stability is 0.2Ω). During each withdrawal process, capture the separation trajectory of the plug and the interface using a camera, and analyze the wear mark distribution of the plug metal contacts (such as detecting slight scratches on the edge of the metal contacts) and the foreign object attachment area (assuming 0.1 square millimeters of dust is detected). Input the contact resistance value, wear marks, and foreign object attachment area into the durability prediction model to calculate the expected plugging and unplugging life of the non-standard Type-C interface (such as it can be normally plugged and unplugged 500 times through model calculation) and the contact reliability index (such as a numerical value representing contact reliability calculated based on factors such as the contact resistance value and wear condition). If the expected plugging and unplugging life is lower than the preset threshold (assuming the preset threshold is 1000 times), mark the mechanical structure defect level of the interface (such as marked as a minor defect) and the recommended replacement cycle (such as recommended to be replaced after 100 plugging and unplugging operations) in the verification report. After each target verification action is completed, compare the monitoring data with the trigger condition threshold in real time. For example, in the voltage stability test, if the voltage fluctuation exceeds the set trigger condition threshold (such as the fluctuation exceeds ±0.1V), terminate the subsequent verification actions and mark it as a critical fault node.

[0030] Step S150, generate a verification report based on the execution result and the timing mark, and map the abnormal nodes that do not meet the preset transmission stability index in the verification report to the physical structure defect description of the non-standard Type-C interface.

[0031] In this embodiment, after completing all the previous tests, the execution results of each verification action are integrated into a multi-dimensional data set according to the time sequence. The multi-dimensional data set includes evaluation indicators for the voltage stability dimension, data integrity dimension, and connection durability dimension. For example, in the voltage stability dimension, the evaluation indicators include the voltage fluctuation range, transient response time, etc.; in the data integrity dimension, the evaluation indicators include the packet loss rate, bit error rate, etc.; in the connection durability dimension, the evaluation indicators include the change in contact resistance, expected insertion and extraction life, etc. Then, these evaluation indicators are normalized. A first weight coefficient (assumed to be 0.5) is assigned to the voltage stability dimension, a second weight coefficient (assumed to be 0.3) is assigned to the data integrity dimension, and a third weight coefficient (assumed to be 0.2) is assigned to the connection durability dimension. The original evaluation indicators of each dimension are converted into standardized values within the range of 0-1. For example, for the voltage stability dimension, if the voltage fluctuation range is within the allowable range, its standardized value is set to 1, indicating full compliance with the standard; if the voltage fluctuation exceeds the allowable range, the standardized value is set to a value less than 1 according to the degree of exceeding (such as 0.6, indicating partial compliance with the standard). The standardized values are weighted and summed according to the weight coefficients to obtain the comprehensive performance score of the non-standard Type-C interface. Suppose the calculated comprehensive performance score is 0.7. If this comprehensive performance score is lower than the preset passing line (assumed to be 0.8), a three-level alarm mechanism is triggered. If the comprehensive performance score is lower than the passing line due to the voltage stability dimension, a first-level alarm is triggered to indicate a voltage stability defect; if it is a problem with the data integrity dimension, a second-level alarm is triggered to indicate a data integrity defect; if it is a problem with the connection durability dimension, a third-level alarm is triggered to indicate a connection durability defect. The generation format of the verification report is dynamically adjusted according to the alarm level, and different color identifiers (such as red for the first-level alarm, yellow for the second-level alarm, and blue for the third-level alarm) and repair priority labels (such as the highest repair priority for the first-level alarm) are associated with each alarm level.

[0032] Next, identify the target dimension whose comprehensive score is lower than the preset qualified threshold. Assuming that the comprehensive score of the voltage stability dimension is lower than the qualified threshold, extract the original monitoring data corresponding to the target dimension (such as the specific values of voltage fluctuations exceeding the range, transient response time, etc.) and the execution environment parameters (such as the temperature and humidity during testing). Reverse-match the defect feature model in the standard transmission parameter library based on the original monitoring data. Load the historical defect database corresponding to the non-standard Type-C interface model from the standard transmission parameter library, and this historical defect database contains the defect feature models of known physical defects. Calculate the similarity between the currently detected abnormal voltage fluctuation pattern and the oxidation contact feature, aging insulation feature, and soldering joint pin feature in the defect feature model. Assuming that the similarity between the abnormal voltage fluctuation pattern and the oxidation contact feature exceeds the first threshold (such as 0.8), then generate the probability of metal contact oxidation (such as 80%) and the recommended cleaning solution (such as gently wiping the contacts with an alcohol cotton ball). If the similarity between the abnormal voltage fluctuation pattern and the aging insulation feature exceeds the second threshold (such as 0.7), then generate the aging level of the insulation layer (such as mild aging) and the prompt for recommending replacement of the insulation material. If the similarity between the abnormal voltage fluctuation pattern and the soldering joint pin feature exceeds the third threshold (such as 0.6), then locate the position of the loose soldering joint of the pin (such as indicating that the 3rd pin may have loose soldering) and generate a schematic diagram of the repair process flow. Finally, convert the defect probability and location information into a readable physical structure defect description, and associate it with the abnormal node coordinates in the verification report (such as indicating in the verification report that there is an abnormality at a specific test point in the voltage stability test) and the repair suggestions.

[0033] Based on the above steps, in the embodiments of the present invention, real-time signal characteristics of the non-standard Type-C interface in the current transmission mode are extracted from the preset signal acquisition module based on the physical connection status identifier, covering multi-dimensional information such as voltage fluctuation sequences, current change trajectories, and packet transmission interval distributions. By dynamically matching the real-time signal characteristics with the preset standard transmission parameter library, a set of test instructions including multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds is generated. It can intelligently generate personalized test instructions according to the real-time situation of the interface. Compared with the traditional fixed-mode test instruction generation method, it can better adapt to the diversity and complexity of non-standard interfaces, effectively improve the accuracy and coverage of verification, and ensure that various potential problems can be discovered in time. In the stage of executing the verification actions, the verification actions in the set of test instructions are called to perform staged signal injection and feedback capture on the non-standard Type-C interface, and the execution results of each verification action and the corresponding timing marks are recorded, making the verification process more detailed and traceable. Different from the traditional one-time verification method, staged verification can deeply check the performance of the interface at different stages, and the detailed timing marks provide data support for subsequent problem analysis, helping to quickly locate the problem. Finally, a verification report is generated based on the execution results and timing marks, and the abnormal nodes that do not meet the preset transmission stability indicators in the verification report are mapped to the physical structure defect descriptions of the non-standard Type-C interface, which can not only intuitively present the verification results of the interface, but also deeply explore the root causes of the problems, associate the abstract transmission anomalies with the specific physical structure defects, and help improve the overall quality and reliability of the non-standard Type-C interface.

[0034] In a possible implementation manner, step S120 includes:

[0035] Step S121, when the physical connection status identifier indicates the first connection state, activate the high-speed sampling unit in the signal acquisition module, collect the initial handshake signal of the non-standard Type-C interface at a preset first sampling frequency, and extract the voltage rise slope, current steady-state value, and handshake protocol response time in the initial handshake signal.

[0036] Still taking the above scenario as an example, when the tablet computer is first connected to the non-standard Type-C interface, since the physical connection status identifier indicates the first connection status, the high-speed sampling unit in the signal acquisition module can be activated. The high-speed sampling unit is set to collect data at a relatively high first sampling frequency. Assuming that the first sampling frequency is once per microsecond, the high-speed sampling unit starts to collect the initial handshake signal of the non-standard Type-C interface. The initial handshake signal contains information such as power pins, ground pins, and data pins. During the collection process, key parameters such as the voltage rise slope, current steady-state value, and handshake protocol response time in the initial handshake signal are focused on and extracted. For example, from the perspective of the power pin, the voltage starts to rise from 0V. After measurement and calculation, it is detected that during the process of rising to 5V, the voltage rise slope is 0.5V / millisecond, which means that the voltage changes at a speed of rising 0.5V per millisecond. At the same time, in terms of current, after a short fluctuation, it reaches a stable current steady-state value, and after measurement, the current steady-state value is 0.5A. For the handshake protocol response time, from the start of the connection and interaction of the handshake protocol between the tablet computer and the non-standard Type-C interface to the complete completion of the handshake protocol, it is timed that this process takes 10 milliseconds.

[0037] Step S122, when the physical connection status identifier indicates a reconnection state, switch to the anti-interference sampling unit in the signal acquisition module, and collect the reconnection synchronization signal of the non-standard Type-C interface at a preset second sampling frequency, and extract the noise suppression ratio, phase offset amount, and data retransmission times in the reconnection synchronization signal.

[0038] When the tablet computer and the non-standard Type-C interface are in a reconnection state, the physical connection status identifier indicates a reconnection state. At this time, it can be switched to the anti-interference sampling unit in the signal acquisition module. The anti-interference sampling unit collects the reconnection synchronization signal of the non-standard Type-C interface at a preset second sampling frequency. Here, it is assumed that the second sampling frequency is once per 5 microseconds, and the anti-interference sampling unit is configured with a dynamic filtering algorithm to eliminate the residual noise of the historical connection. During the reconnection process, there may be some electromagnetic interference factors around, such as the weak electromagnetic field generated by other electronic devices. After the anti-interference sampling unit collects the reconnection synchronization signal, parameters such as the noise suppression ratio, phase offset amount, and data retransmission times are extracted from it. Assuming that in this reconnection scenario, after measurement and calculation, the noise suppression ratio is 80%, which indicates that the anti-interference sampling unit can effectively suppress 80% of the external interference noise. At the same time, the detected phase offset amount is 5 degrees, which means that the phase of the signal has shifted 5 degrees relative to the ideal state. Due to possible instability factors in the previous connection, the data retransmission times is 2 times, that is, 2 data packets need to be retransmitted to ensure data integrity.

[0039] Step S123: Combine and analyze the extraction parameters of the initial handshake signal or reconnection synchronization signal with the current transmission mode parameters to generate the real-time signal features including timestamps.

[0040] Wherein, the first sampling frequency is higher than the second sampling frequency, and the anti-interference sampling unit is configured with a dynamic filtering algorithm to eliminate the residual noise of historical connections.

[0041] In this embodiment, whether it is the initial handshake signal collected during the first connection or the reconnection synchronization signal collected during reconnection, the extracted parameters can be combined and analyzed with the current transmission mode parameters. For example, the current transmission mode of the tablet computer is to perform data backup while charging. The voltage range required for charging is 4.5V - 5.5V, the current requirement is between 0.4A - 0.6A, the data transmission requirement follows the rate standard of USB3.1 Gen2, and the interval between data packets during data transmission cannot exceed 10 milliseconds, etc. Combine the parameters such as the voltage rise slope, current steady-state value, handshake protocol response time extracted during the first connection, or the noise suppression ratio, phase offset, data retransmission times, etc. extracted during reconnection with these charging and data transmission requirements. At the same time, add timestamps to each collected parameter point to generate real-time signal features including timestamps. These real-time signal features include information such as voltage fluctuation sequences, current change trajectories, and data packet transmission interval distributions. This information will provide important basis for subsequent analysis, such as judging whether the performance of the interface meets the requirements and whether there are potential problems, etc.

[0042] In a possible implementation manner, step S130 includes:

[0043] Step S131: Load a reference signal template corresponding to the current transmission mode parameters from the standard transmission parameter library. The reference signal template includes a standard voltage range, an allowable current threshold, and a data packet integrity verification rule.

[0044] Taking the above scenario as an example, since the tablet computer is in a transmission mode of charging and data backup simultaneously, a corresponding reference signal template is found in the standard transmission parameter library. This reference signal template contains information such as the standard voltage range, allowable current threshold, and data packet integrity check rules. For example, the standard voltage range is set to 4.5V - 5.5V. This is to ensure that the tablet computer can obtain a stable voltage supply during charging and normal operation, while ensuring the safety of the interface and the device. The allowable current threshold is set between 0.4A - 0.6A. This is determined according to the power requirements of the charging circuit and data transmission of the tablet computer. Within this current range, the device can operate normally without overloading or underloading. The data packet integrity check rule adopts the CRC-32 check method, requiring that during data transmission, the check result of each data packet must be correct, and the interval between data packets cannot exceed 10 milliseconds to ensure the accuracy and continuity of data transmission.

[0045] Step S132: Compare the voltage fluctuation sequence in the real-time signal characteristics with the standard voltage range point by point, and calculate the duration and amplitude deviation of the abnormal voltage points exceeding the standard voltage range.

[0046] For example, in the previously collected voltage fluctuation sequence, there will be a series of data points of voltage values changing with time. For each data point, it is compared with the standard voltage range. For example, within a certain time period, it is detected that there are several data points with voltage values lower than 4.5V or higher than 5.5V. These are the abnormal voltage points exceeding the standard voltage range. For each abnormal voltage point, calculate its duration and amplitude deviation. Suppose one abnormal voltage point starts from time t1 and ends at t2, and the duration is t2 - t1, which is calculated to be 5 milliseconds. And the amplitude deviation of this abnormal voltage point relative to the standard voltage lower limit of 4.5V is -0.2V, that is, the actual voltage value is 4.3V.

[0047] Step S133: Fit the current change trajectory with the allowable current threshold in segments to identify the current over-limit area and the corresponding load fluctuation mode.

[0048] During the charging and data transmission of a tablet computer, the current changes dynamically with the working state of the device. By performing piecewise fitting on the collected current change trajectory, the current change situation can be analyzed more clearly. For example, within a certain time period, the current suddenly rises from 0.5A to 0.7A, and this area is identified as the current overlimit area. By further analyzing the load fluctuation pattern corresponding to this current overlimit area, it is detected that a high-power background task is started on the tablet computer during this time period, such as automatic software update in the background. This background task requires additional power support, resulting in a sudden increase in the load. The above load fluctuation pattern reflects the current response of the non-standard Type-C interface when dealing with different working states of the device.

[0049] Step S134, perform time-series association on the packet transmission interval distribution and the packet integrity verification rule, and count the packet loss rate, out-of-order times, and verification failure events.

[0050] During data transmission, the sending and receiving of each packet have certain time sequences and interval requirements. According to the collected packet transmission interval distribution data, count the packet loss rate, out-of-order times, and verification failure events. For example, during the transmission of 100 packets, it is detected that the transmission intervals of 3 packets exceed 10 milliseconds. After calculation, the packet loss rate is 5%. At the same time, it is detected that the receiving order of 1 packet is inconsistent with the sending order, and the out-of-order times is 1 time. In addition, the CRC-32 verification result of 1 packet fails, and this is a verification failure event.

[0051] Step S135, based on the statistical results of the abnormal voltage points, current overlimit areas, and verification failure events, generate a matching difference matrix including weight scores, and generate multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds according to the weight scores to obtain a test instruction set.

[0052] For example, in a possible implementation manner, step S135 includes:

[0053] Step S1351, perform segmented classification on the duration and amplitude deviation of each abnormal voltage point to determine the influence range level of the abnormal voltage point, and the influence range level is used to characterize the potential risk degree of voltage fluctuation on the power supply stability of the interface.

[0054] For example, for an abnormal voltage point with a long duration and a large amplitude deviation, its influence range level is rated as high, which means that such voltage fluctuations pose a relatively high potential risk to the stability of the interface power supply. Suppose an abnormal voltage point has a duration exceeding 10 milliseconds and an amplitude deviation exceeding 0.3V, then this abnormal voltage point is classified as a high influence range level. Based on this high influence range level, it can be considered that such voltage fluctuations may have a greater impact on the charging stability of the tablet computer, such as may lead to unstable charging speed or shortened battery life and other problems.

[0055] Step S1352: According to the load fluctuation pattern of the current overlimit area, identify the instantaneous overload capacity and steady-state load adaptability of the non-standard Type-C interface, and generate a current stability score based on the difference between the overload capacity and the adaptability.

[0056] In the previously mentioned current overlimit situation, assume that after analysis, the instantaneous overload capacity of the non-standard Type-C interface is 1.2A, which means that the maximum current that the interface can withstand in a short time is 1.2A. And the steady-state load adaptability is 0.6A, which means that in the stable working state, the load current suitable for the interface is 0.6A. Based on the difference between the two, a current stability score is generated through a specific algorithm. For example, the difference is 0.6A. According to a set scoring formula, a score representing the current stability is calculated, and this score can intuitively reflect the stability of the interface in terms of current.

[0057] Step S1353: Extract the type distribution and occurrence frequency of the verification failure events, classify the verification failure events into protocol mismatch type, timing disorder type, and data corruption type, and count the number of trigger times of each type of verification failure event within a unit time to obtain the type distribution of the verification failure events.

[0058] For example, in the previously mentioned verification failure event, this verification failure event is of the data corruption type and occurred 1 time within 10 seconds. If there are other types of verification failure events, they are also classified and counted in the same way. For example, within a certain period of time, the protocol mismatch type verification failure event occurred 0 times, the timing disorder type verification failure event occurred 0 times, and the data corruption type verification failure event occurred 1 time, thus obtaining the type distribution situation of the verification failure events.

[0059] Step S1354: Based on the influence range level, current stability score, and type distribution of the verification failure events, assign a voltage weight coefficient to each abnormal voltage point, assign a current weight coefficient to each current overlimit area, and assign a verification weight coefficient to each type of verification failure event.

[0060] For example, for abnormal voltage points with a high impact range level, a higher voltage weight coefficient is assigned because of its greater potential impact on interface performance. For example, the voltage weight coefficient for abnormal voltage points with a high impact range level is 0.5. For the current overlimit area, a corresponding current weight coefficient is assigned according to the degree of its impact on stability. Assume that the current weight coefficient for the aforementioned current overlimit area is 0.3. For verification failure events, a verification weight coefficient is assigned according to their types and occurrence frequencies. For example, the verification weight coefficient for data corruption type verification failure events is 0.2.

[0061] Step S1355: Map the voltage weight coefficient, current weight coefficient, and verification weight coefficient to a multi-dimensional space coordinate system according to a preset rule to generate the matching difference matrix. Each dimension of the matching difference matrix corresponds to an abnormal type, and the value of the matrix node represents the comprehensive impact weight of the corresponding type of abnormality on transmission stability.

[0062] In the matching difference matrix, each dimension corresponds to an abnormal type, such as voltage abnormality, current abnormality, verification failure, etc. The value of the matrix node represents the comprehensive impact weight of the corresponding type of abnormality on transmission stability. For example, the value of a certain node in the voltage abnormality dimension is 0.3, which means the comprehensive impact weight of voltage abnormality on transmission stability is 0.3; the value of a certain node in the current abnormality dimension is 0.2, and the value of a certain node in the verification failure dimension is 0.1, etc. These values comprehensively reflect the impact degree of various abnormal conditions on the transmission stability between the tablet computer and the non-standard Type-C interface.

[0063] Step S1356: Generate a verification action priority list in descending order according to the values of the nodes in the matching difference matrix, and associate a trigger condition threshold with each verification action. The trigger condition thresholds include the allowable upper limit of voltage fluctuation, the current transient recovery time, and the tolerance times of verification failure.

[0064] For example, the verification action corresponding to the abnormality with the highest value has the highest priority. For example, for a severe voltage fluctuation situation, the priority of its corresponding verification action (such as in-depth testing of voltage stability) is set to the highest, and a trigger condition threshold is set. Assume that the allowable upper limit of voltage fluctuation is ±0.1V, which means that if the voltage fluctuation exceeds this range in subsequent tests, more stringent tests will be triggered or it will be determined as a failure; the current transient recovery time is 100 milliseconds, indicating that the current should return to the normal range within 100 milliseconds after a transient change; the tolerance times of verification failure is 0 times, indicating that no verification failure is allowed.

[0065] Step S1357, when the value of any node in the matching difference matrix exceeds a preset emergency response threshold, raise the priority of the corresponding verification action to the highest level and dynamically adjust the strictness of its trigger condition threshold.

[0066] For example, assume the emergency response threshold is set to 0.7. When the comprehensive impact weight of an anomaly (such as voltage anomaly) reaches 0.8, exceeding the emergency response threshold, then raise the priority of the verification action related to voltage stability to the highest level. At the same time, dynamically adjust its trigger condition threshold. For example, further narrow the allowable upper limit of voltage fluctuation to ±0.05V to make the test more stringent, so as to ensure that the performance of the interface meets the requirements in this high-risk situation.

[0067] Step S1358, generate the verification action groups in the test instruction set in sequence according to the priority list.

[0068] For example, in the order from high to low priority, first put the verification actions related to voltage stability test into the test instruction set, then the verification actions related to current stability test, and finally the verification actions related to data integrity test, etc. Each verification action has a corresponding trigger condition threshold. These verification action groups will test the non-standard Type-C interface in sequence during the subsequent test process to comprehensively evaluate the performance of the interface and discover possible problems.

[0069] In a possible implementation manner, step S140 includes:

[0070] Step S141, select the target verification action from the test instruction set in sequence according to the priority order of the verification actions, and parse the trigger condition threshold corresponding to the target verification action.

[0071] For example, since the priority of the verification actions has been determined based on the analysis of various abnormal situations before, the target verification actions will be selected in this order. For example, the verification action with the highest priority may be of the voltage stability test type. After selecting this target verification action, parse its corresponding trigger condition threshold. Assume its trigger condition threshold is that the allowable upper limit of voltage fluctuation is ±0.1V, the current transient recovery time is 100 milliseconds, etc. These thresholds are based on the performance requirements of the tablet computer and the non-standard Type-C interface during normal operation and the previous analysis of abnormal situations, and they will be used as the criteria to judge whether the interface performance is qualified.

[0072] Step S142, when the target verification action belongs to the voltage stability test type, inject a stepped voltage waveform into the power supply pin of the non-standard Type-C interface, and synchronously monitor the transient response of the feedback current and the voltage drop recovery time.

[0073] In this embodiment, the stepped voltage waveform is designed to comprehensively test the stability of the interface at different voltages. For example, starting from 4.5V, it gradually increases in steps of 0.1V up to 5.5V, and then gradually decreases back to 4.5V. While injecting the voltage, the transient response of the feedback current and the voltage drop recovery time are synchronously monitored. During the voltage rise process, when the voltage reaches 5.0V, the change of the feedback current is closely observed. It is detected by the measuring instrument that the feedback current instantaneously rises from 0.5A to 0.6A, which is the transient response of the feedback current. Subsequently, as the voltage stabilizes, the current starts to decrease. After measurement and calculation, the voltage drop recovery time for the current to recover from 0.6A to 0.5A is detected to be 50 milliseconds. All the data in this process will be recorded in detail for subsequent comparison with the trigger condition threshold.

[0074] Step S143, when the target verification action belongs to the data integrity test type, send a preset check data sequence to the data channel of the non-standard Type-C interface, and capture the response delay, bit error rate, and retransmission request frequency of the data channel.

[0075] In this embodiment, according to a preset sending interval, for example, sending a data packet every 1 millisecond, send the check data sequence corresponding to the standard test data packet to the data channel of the non-standard Type-C interface. Deploy a data packet listener at the receiving end of the non-standard Type-C interface. The function of this data packet listener is to record important information such as the arrival time, sequence number integrity, and checksum matching status of each received standard test data packet. After sending 100 data packets, start analyzing the received data. For example, it is detected that the arrival time of the 50th data packet is 2 milliseconds later than expected, which is the response delay of the data channel. At the same time, check the sequence number integrity and detect that there is no missing or disordered sequence number. However, the checksum matching status shows that the CRC-32 check result of the 50th data packet fails. Based on the above situation, calculate the bit error rate. Since only 1 data packet has a check failure, assuming the total length of the data packet is 1000 bytes, according to a specific bit error rate calculation algorithm, the bit error rate is a specific value. When the checksum does not match, trigger the retransmission request generator to send a retransmission instruction to the sending end, and count the retransmission request frequency of the retransmission instruction. During the transmission of these 100 data packets, assuming a total of 10 data packets need to be retransmitted, then the retransmission request frequency is 10%. At the same time, record the successful response ratio of the retransmission instruction. For example, there are 8 successfully retransmitted data packets, then the successful response ratio is 80%. Integrate the unidirectional transmission delay, packet loss events, and retransmission response ratio into a data integrity evaluation matrix and associate it with the sending batch identifier of the current test data packet for detailed basis when analyzing the integrity of the entire data transmission process subsequently.

[0076] Step S144, when the target verification action belongs to the physical connection durability test type, control the plugging and unplugging mechanism of the non-standard Type-C interface to perform periodic connection-disconnection operations, and record the change in contact resistance and the signal attenuation rate after each operation.

[0077] In this embodiment, the periodic connection-disconnection operation is to simulate the frequent plugging and unplugging of the non-standard Type-C interface of the tablet computer during actual use. For example, use a robotic arm to clamp the plug part of the non-standard Type-C interface, and perform 100 insertion-extraction cycles at a preset plugging and unplugging speed (1 plugging and unplugging per second) and force (applying a plugging and unplugging force of 1 N). After each insertion is completed, measure the contact resistance value between the power pin and the ground pin of the non-standard Type-C interface with a contact resistance tester, and record the initial value and the stable value of the contact resistance value. After the first insertion, the measured initial value of the contact resistance value is 0.1 Ω. After a period of stabilization, the stable value is measured again to be 0.2 Ω. During each extraction process, capture the separation trajectory of the plug and the interface through a camera, and analyze the wear trace distribution of the metal contacts of the plug. Through image analysis, it is found that there are slight scratches on the edge of the metal contacts of the plug, and the foreign object attachment area can also be analyzed. Suppose 0.1 square millimeter of dust is detected to be attached. Input data such as the contact resistance value, wear traces, and foreign object attachment area into the durability prediction model. The durability prediction model calculates the expected plugging and unplugging life and the contact reliability index of the non-standard Type-C interface according to the preset algorithm and a large amount of experimental data. For example, after model calculation, the expected plugging and unplugging life of this non-standard Type-C interface is 500 times. The contact reliability index calculates a numerical value representing contact reliability based on factors such as the change in contact resistance value, wear condition, and foreign object attachment condition. If the expected plugging and unplugging life is lower than the preset threshold (assuming the preset threshold is 1000 times), mark the mechanical structure defect level (such as marked as a minor defect) and the recommended replacement cycle (such as recommended to be replaced after 100 plugging and unplugging operations) in the verification report.

[0078] Step S145, after each target verification action is completed, compare the monitored data with the trigger condition threshold in real time. If it exceeds the trigger condition threshold, terminate the subsequent verification actions and mark them as critical failure nodes.

[0079] For example, in the voltage stability test, if during the injection of a stepped voltage waveform, it is detected that the voltage fluctuation exceeds the set trigger condition threshold (such as the fluctuation exceeds ±0.1V), then the subsequent verification actions will be terminated and marked as a critical failure node. This is because a voltage fluctuation exceeding the threshold indicates that there are serious problems with the non-standard Type-C interface in terms of voltage stability, which may affect the normal charging and operation of the tablet computer. Continuing with other tests may cause further damage to the device or result in inaccurate test results. Similarly, in the data integrity test, if the bit error rate exceeds the set threshold or the retransmission request frequency is too high, the subsequent verification actions will also be terminated and marked as a critical failure node. In the physical connection durability test, if the change in the contact resistance value exceeds the expected value or the wear marks are too severe, the same treatment will be carried out. By means of this real-time comparison and marking of critical failure nodes, serious problems with the non-standard Type-C interface can be detected in a timely manner, improving the test efficiency and ensuring the safety and stability of the tablet computer when using the non-standard Type-C interface.

[0080] In a possible implementation manner, step S150 includes:

[0081] Step S151, integrating the execution results of each verification action into a multi-dimensional data set according to time sequence, where the multi-dimensional data set includes evaluation indicators in the voltage stability dimension, data integrity dimension, and connection durability dimension.

[0082] In the previous various tests on the non-standard Type-C interface, including voltage stability tests, data integrity tests, and physical connection durability tests, etc., each test has its execution result and a corresponding time sequence mark. The above execution results are integrated into a multi-dimensional data set, which includes evaluation indicators in the voltage stability dimension, data integrity dimension, and connection durability dimension.

[0083] In the voltage stability dimension, the evaluation indicators include data such as the voltage fluctuation range and transient response time in previous tests. For example, in the voltage stability test, when injecting a stepped voltage waveform into the power pins of the non-standard Type-C interface, the recorded voltage fluctuation range is from 4.3V to 5.7V (including the situation where it exceeds the standard voltage range of 4.5V - 5.5V), and the measured values of the transient response time at certain voltage change points, such as when the voltage rises from 5.0V to 5.1V, the transient response time of the current is 50 milliseconds.

[0084] In the data integrity dimension, the evaluation metrics include packet loss rate, bit error rate, etc. In the data integrity test, after sending 100 data packets, the packet loss rate is statistically 5%, and the bit error rate of a specific data packet is calculated to obtain a specific value, such as the bit error rate of a certain data packet is 0.1% (hypothesis).

[0085] In the connection durability dimension, the evaluation metrics include contact resistance change, expected insertion and extraction life, etc. In the physical connection durability test, the measured contact resistance value changes after each insertion and extraction. The initial contact resistance value after the first insertion is 0.1Ω, and the stable contact resistance value after multiple insertions and extractions is 0.2Ω. After calculation, the expected insertion and extraction life of the non-standard Type-C interface is 500 times.

[0086] Step S152, perform normalization processing on the evaluation metrics, and calculate the comprehensive score of each dimension based on the preset transmission stability weight coefficient.

[0087] For example, assign the first weight coefficient to the voltage stability dimension, assume it is 0.5; assign the second weight coefficient to the data integrity dimension, assume it is 0.3; assign the third weight coefficient to the connection durability dimension, assume it is 0.2. For the voltage stability dimension, convert the original evaluation metrics such as voltage fluctuation range and transient response time into standardized values within the range of 0 - 1. For example, if the voltage fluctuation range is completely within the standard voltage range (4.5V - 5.5V), then set its standardized value to 1, indicating full compliance with the standard; if, as previously recorded, the voltage fluctuation range is from 4.3V to 5.7V, set the standardized value to a value less than 1 according to the degree of exceeding the standard range, assume it is 0.6, indicating partial compliance with the standard. Perform normalization processing on the evaluation metrics of the data integrity dimension and the connection durability dimension in a similar manner. Then, perform weighted summation on the standardized values according to the weight coefficients to obtain the comprehensive performance score of the non-standard Type-C interface. Assume that after calculation, the standardized value of the voltage stability dimension is 0.6, the standardized value of the data integrity dimension is 0.8, and the standardized value of the connection durability dimension is 0.7. Then the comprehensive performance score = 0.5×0.6 + 0.3×0.8 + 0.2×0.7 = 0.68.

[0088] Step S153, identify the target dimension whose comprehensive score is lower than the preset qualified threshold, and extract the original monitoring data and execution environment parameters corresponding to the target dimension.

[0089] Assume that the preset qualified threshold is 0.8. Since the calculated comprehensive performance score of 0.68 is lower than this qualified threshold, it is necessary to find out which dimensions led to this result. In this example, it is detected that the score of the voltage stability dimension is relatively low. Then, the original monitoring data of the voltage stability dimension is extracted, such as the previously mentioned voltage fluctuation range from 4.3V to 5.7V, and data such as the transient response time at different voltage change points. At the same time, the execution environment parameters are extracted, such as the temperature is 25°C and the humidity is 50% during the test.

[0090] Step S154, according to the original monitoring data, reverse-match the defect feature model in the standard transmission parameter library to determine the defect probability and location information of the non-standard Type-C interface.

[0091] For example, load the historical defect database corresponding to the non-standard Type-C interface model from the standard transmission parameter library. This historical defect database contains defect feature models of known physical defects. Calculate the similarity between the currently detected abnormal voltage fluctuation pattern (such as the fluctuation range of 4.3V - 5.7V) and the oxidation contact feature, aging insulation feature, and solder joint pin feature in the defect feature model. Assume that after calculation, the similarity between the abnormal voltage fluctuation pattern and the oxidation contact feature exceeds the first threshold (assume the first threshold is 0.8), then generate the metal contact oxidation probability, such as 80%, and give a recommended cleaning solution according to the standard operation process, such as gently wiping the contacts with a special electronic device cleaning solution and a clean wiping cloth. If the similarity between the abnormal voltage fluctuation pattern and the aging insulation feature exceeds the second threshold (assume the second threshold is 0.7), then generate the aging level of the insulation layer (such as mild aging) and a prompt to recommend replacing the insulation material. If the similarity between the abnormal voltage fluctuation pattern and the solder joint pin feature exceeds the third threshold (assume the third threshold is 0.6), then locate the position where the pin solder joint is loose (such as indicating that the 3rd pin may have a loose solder joint) and generate a diagram of the repair process flow.

[0092] Step S155, convert the defect probability and location information into a readable physical structure defect description and associate it with the abnormal node coordinates and repair suggestions in the verification report.

[0093] For example, convert "the metal contact oxidation probability is 80%" into a physical structure defect description such as "there is an 80% probability that the metal contacts of the power pins of the non-standard Type-C interface are oxidized". In the verification report, associate this physical structure defect description with the relevant abnormal node coordinates in the voltage stability test, such as marking that this abnormality is detected at the 5th test point in the voltage stability test. At the same time, give repair suggestions, such as "gently wipe the contacts with a special electronic device cleaning solution and a clean wiping cloth, and avoid causing other damages to the interface during wiping".

[0094] In a possible implementation, when activating the high-speed sampling unit in the signal acquisition module or switching to the anti-interference sampling unit in the signal acquisition module, the method further includes:

[0095] Step S210, configure a multi-channel parallel acquisition circuit in the high-speed sampling unit, and capture the independent signal traces of the power pin, ground pin, and data pin of the non-standard Type-C interface.

[0096] In this embodiment, the multi-channel parallel acquisition circuit can simultaneously acquire signals from three pins, ensuring that the signals of each pin can be independently and accurately obtained. For example, for the power pin, the acquired signal trace may show the process of the voltage rising from 0V to 5V at a certain slope; for the ground pin, a relatively stable low-level signal trace is acquired, and its voltage value is close to 0V with very little fluctuation; for the data pin, the acquired signal trace is a series of complex pulse signals, which represent the data transmission process.

[0097] Step S220, allocate an independent buffer queue for each signal trace, and poll and read the buffer queue at the first sampling frequency to generate time-aligned multi-channel signal samples.

[0098] In this embodiment, each buffer queue is specifically used to store the signal data of the corresponding pin, and is polled and read at the previously set first sampling frequency (assuming one acquisition per microsecond). For example, at a certain moment, data is read from the three buffer queues simultaneously, ensuring that the timestamps of the signal data of each pin are aligned, thereby generating time-aligned multi-channel signal samples. These multi-channel signal samples can accurately reflect the signal states of each pin at the same moment.

[0099] Step S230, embed an adaptive noise canceller in the anti-interference sampling unit, predict the current environmental noise spectrum according to the historical connection record of the non-standard Type-C interface, and dynamically adjust the center frequency and bandwidth of the band-stop filter.

[0100] Since previous connections may be affected by different environmental noises, by analyzing the historical connection records, the noise spectra that may appear in a specific environment can be understood. For example, the historical records show that there is relatively high electromagnetic interference noise in a certain frequency band. The adaptive noise canceller predicts the possible noise spectrum in the current environment based on this information, and then dynamically adjusts the center frequency and bandwidth of the band-stop filter. If the predicted main noise frequency is 100 kHz, then adjust the center frequency of the band-stop filter to around 100 kHz and adjust the bandwidth of the filter according to the bandwidth of the noise to suppress the noise in this frequency band to the greatest extent.

[0101] Step S240: Input the filtered multi-channel signal samples into a signal feature extractor, and separate the valid signal components and residual noise components through a peak detection algorithm and a mean shift algorithm.

[0102] In this embodiment, there may still be some residual noise in the multi-channel signal samples filtered by the band-stop filter. The signal feature extractor uses the peak detection algorithm to identify the peak points in the signal. These peak points often correspond to important features in the signal, such as the start bit or stop bit in data transmission, etc. At the same time, the mean shift algorithm can distinguish the valid signal and noise according to the change of the signal mean. For example, for the signal of the data pin, the mean of the valid signal is relatively stable and fluctuates within a certain range, while the noise will cause irregular changes in the signal mean. Through these two algorithms, the valid signal components and residual noise components can be accurately separated, so as to obtain a purer signal data for subsequent analysis, such as extracting parameters such as the noise suppression ratio, phase offset, and data retransmission times in the reconnection synchronization signal.

[0103] In a possible implementation manner, step S143 includes:

[0104] Step S1431: Construct a standard test data packet including an incrementing sequence number, a pseudo-random data block, and a cyclic redundancy check code, and send the check data sequence corresponding to the standard test data packet to the data channel of the non-standard Type-C interface at a preset sending interval.

[0105] In this process, in order to comprehensively test the performance of the data channel, first a standard test data packet is constructed. The incrementing sequence number is used to ensure the sequentiality of the data packets. Each data packet has a unique and incrementing number, for example, starting from 1 and incrementing sequentially to the number required for the test. The pseudo-random data block simulates the data content in actual data transmission. Its randomness can cover various possible data combination situations to fully test the data transmission ability of the data channel for different data. The cyclic redundancy check code (CRC) is an important error detection code used to verify whether the data packet has an error during transmission at the receiving end. Assuming the CRC-32 check code is used, it can calculate the data block and generate a 32-bit check value to be appended to the end of the data packet. According to the preset sending interval, for example, send the check data sequence corresponding to such a standard test data packet to the data channel of the non-standard Type-C interface every 1 millisecond.

[0106] Step S1432: Deploy a data packet listener at the receiving end of the non-standard Type-C interface, and record the arrival time, sequence number integrity, and check code matching status of each received standard test data packet through the data packet listener.

[0107] When the data packet arrives at the receiving end, for each received standard test data packet, the packet listener records its arrival time, which is the time elapsed from the start of packet transmission to its reception by the receiving end, recorded with nanosecond-level precision. Meanwhile, the sequence number integrity is checked to ensure that the sequence numbers of the received data packets increase in order, without skipping numbers, repeating numbers, etc. For example, if 100 data packets are sent, the receiving end should receive the data packets with correct sequence numbers in the order of 1 - 100. The checksum matching status is also strictly inspected. The receiving end recalculates the CRC-32 checksum based on the content of the received data packet (including the pseudo-random data block) and compares it with the checksum attached to the data packet.

[0108] Step S1433, calculate the one-way transmission delay based on the sending interval and the arrival time to obtain the response delay of the data channel, and count the occurrence location and interval of packet loss events according to the sequence number integrity.

[0109] For example, the sending time of the 10th data packet is 10 milliseconds (since one data packet is sent every 1 millisecond), and the receiving end records its arrival time as 12 milliseconds. Then the one-way transmission delay of this data packet is 12 - 10 = 2 milliseconds. Such calculations are performed for all received data packets to obtain the response delay situation of the data channel. When checking the sequence number integrity, if it is detected that the sequence numbers of the received data packets do not increase continuously, for example, the received data packets have sequence numbers 8, 10, 11, then it can be determined that a packet loss event has occurred. The location of the packet loss is at the data packet with sequence number 9, and the packet loss interval can be calculated based on the sequence numbers of the data packets received before and after. If multiple packet loss events occur, the overall distribution of the packet loss events can be counted, including the location of packet loss and the interval pattern, etc.

[0110] Step S1434, when the checksum matching status indicates that the checksums do not match, trigger the retransmission request generator to send a retransmission instruction to the sending end, and count the retransmission request frequency and successful response ratio of the retransmission instruction, as well as the bit error rate corresponding to the checksum matching status.

[0111] Assume that among 100 received data packets, 5 have mismatched checksum codes. When a mismatched checksum code is detected, a retransmission request generator is triggered to send a retransmission instruction to the sender. For these 5 data packets that need to be retransmitted, the retransmission request frequency is counted. If during the entire test process (assuming 1000 data packets are sent) there are a total of 50 retransmission requests, then the retransmission request frequency is 50 / 1000 = 5%. After sending the retransmission instruction, the receiver waits for the sender to resend the data packets and counts the number of times it successfully receives the correct data packets (i.e., the checksum codes match). If 40 out of 50 retransmission requests result in successfully receiving the correct data packets, then the successful response ratio is 40 / 50 = 80%. For data packets with mismatched checksum codes, the bit error rate also needs to be calculated. By comparing the actually received data in the data packet with the original data at the sender, according to a specific bit error rate calculation algorithm, such as calculating the bit error rate based on the ratio of the number of error bits in a data block to the total number of bits. Assume that in a data packet with a mismatched checksum code, there are a total of 1000 bits and 10 of them are in error, then the bit error rate is 10 / 1000 = 1%.

[0112] Step S1435, integrate the unidirectional transmission delay, packet loss event, and retransmission response ratio into a data integrity evaluation matrix and associate it with the transmission batch identifier of the current test data packet.

[0113] For example, construct a data integrity evaluation matrix. The rows of the data integrity evaluation matrix can represent different test data packets or groups of data packets, and the columns are parameters such as unidirectional transmission delay, packet loss event (including information such as packet loss position and interval), and retransmission response ratio. For example, for a group of data packets with a transmission batch identifier of 1 (assuming each group contains 100 data packets), the corresponding row in the matrix records information such as the average unidirectional transmission delay of this group of data packets (assuming it is 2 milliseconds), the situation of the packet loss event (such as packet loss at the 10th data packet), and the retransmission response ratio (assuming it is 80%). In this way, through this data integrity evaluation matrix, the data integrity situation of each transmission batch can be comprehensively evaluated, and the data transmission integrity of different batches of data packets can be conveniently queried and analyzed through the transmission batch identifier.

[0114] In a possible implementation manner, when controlling the plugging and unplugging mechanism of the non-standard Type-C interface to perform periodic connection-disconnection operations, the method further includes:

[0115] Step S310, control the robotic arm to clamp the plug part of the non-standard Type-C interface and perform multiple insertion-withdrawal cycles at a preset plugging and unplugging speed and force.

[0116] When testing the physical connection durability of a non-standard Type-C interface, a robotic arm is used to simulate the plugging and unplugging operations in actual use. The robotic arm grips the plug part of the non-standard Type-C interface and operates according to the preset plugging and unplugging speed and force. Suppose the preset plugging and unplugging speed is 1 time per second and the force is 1 N. Such speed and force are set according to the plugging and unplugging situations that the tablet computer may encounter in the actual use scenario, for example, the general operation situations when the user plugs and unpluggs the charger or external devices in daily use. The robotic arm performs multiple insertion - extraction cycles according to this setting, for example, performs 100 such cycle operations to fully test the performance changes of the interface after multiple plugging and unplugging operations.

[0117] Step S320, after each insertion is completed, measure the contact resistance value between the power pin and the ground pin of the non-standard Type-C interface through a contact resistance tester, and record the initial value and the stable value of the contact resistance value.

[0118] When the robotic arm completes an insertion operation, immediately measure the contact resistance value between the power pin and the ground pin of the non-standard Type-C interface through a contact resistance tester. At the moment of insertion, the contact resistance value may have an initial value, which reflects the contact situation between the pins and the interface when the plug is just inserted. For example, the initial contact resistance value measured after the first insertion is 0.1 Ω. As time goes by, the contact resistance value may change. After a period of time (for example, 10 seconds) when it stabilizes, measure again and get a stable value of 0.2 Ω. This stable value represents the contact resistance situation between the pins and the interface in the normal connection state. For each insertion operation, repeat this measurement and recording process to obtain a series of initial values and stable values of the contact resistance data, which can reflect the influence of the plugging and unplugging operations on the contact resistance and the change law of the contact resistance over time.

[0119] Step S330, during each extraction process, capture the separation trajectory of the plug and the interface through a camera, and analyze the wear trace distribution of the metal contacts of the plug and the foreign object attachment area.

[0120] During the extraction process, the camera is placed in a suitable position to clearly capture the separation trajectory of the plug and the interface. Through image analysis technology, process the captured images and analyze the wear trace distribution of the metal contacts of the plug. For example, during the extraction process, it may be detected that there are slight scratches on the edge of the metal contacts of the plug, and information such as the position, length, and depth of these scratches can be obtained through image analysis. At the same time, the foreign object attachment area can also be analyzed. Suppose that after a certain extraction, it is detected through image analysis that there is 0.1 square millimeter of dust attached to the metal contacts of the plug. For each extraction operation, perform the above analysis to obtain detailed data on the wear situation and foreign object attachment situation of the metal contacts of the plug after multiple plugging and unplugging operations.

[0121] Step S340: Input the contact resistance value, wear marks, and foreign object attachment area into the durability prediction model, and calculate the expected plugging and unplugging life and contact reliability index of the non-standard Type-C interface.

[0122] The durability prediction model is a mathematical model established based on a large amount of experimental data and theoretical analysis. Data such as the contact resistance value, wear marks (such as quantified information like the length and depth of scratches), and foreign object attachment area obtained from each plugging and unplugging operation are input into this durability prediction model. The durability prediction model calculates the expected plugging and unplugging life and contact reliability index of the non-standard Type-C interface according to the above input data. For example, based on factors such as the change trend of the input contact resistance value, the severity of the wear marks, and the size of the foreign object attachment area, after model calculation, the expected plugging and unplugging life of this non-standard Type-C interface is 500 times. The contact reliability index is a numerical value representing contact reliability obtained by comprehensively considering various factors according to the internal calculation logic of the model. Suppose it is 0.7 (this value is between 0 and 1, and the higher the value, the higher the contact reliability).

[0123] Step S350: When the expected plugging and unplugging life is lower than the preset threshold, mark the mechanical structure defect level and recommended replacement cycle of the interface in the verification report.

[0124] Suppose the preset threshold is 1000 times of plugging and unplugging life. If the calculated expected plugging and unplugging life is 500 times, which is lower than this preset threshold, then the mechanical structure of the non-standard Type-C interface is marked in the verification report. For example, according to factors such as the gap between the expected plugging and unplugging life and the preset threshold and the contact reliability index, the mechanical structure defect level is marked as a minor defect. At the same time, according to the analysis of the model and empirical data, a recommended replacement cycle is given. For example, it is recommended to replace after 100 plugging and unplugging operations to ensure the stability and safety of the tablet computer when using the non-standard Type-C interface.

[0125] In a possible implementation manner, when normalizing the evaluation indicators, the method further includes:

[0126] Step S410: Assign a first weight coefficient to the voltage stability dimension, a second weight coefficient to the data integrity dimension, and a third weight coefficient to the connection durability dimension, where the first weight coefficient is greater than the second weight coefficient and the third weight coefficient.

[0127] For example, in the above test scenario of the tablet computer and the non-standard Type-C interface, since voltage stability is crucial for the normal charging and operation of the tablet computer, a relatively high weight coefficient is given to the voltage stability dimension. Suppose the first weight coefficient is 0.5, the second weight coefficient is 0.3, and the third weight coefficient is 0.2. Among them, the above weight coefficients can be determined according to the importance of each dimension's impact on the overall performance of the tablet computer.

[0128] Step S420: Convert the original evaluation index of each dimension into a standardized value within the range of 0-1, where 0 indicates completely non-compliant with the standard and 1 indicates completely compliant with the standard.

[0129] In the voltage stability dimension, for example, in previous tests, the measured voltage fluctuation range was from 4.3V to 5.7V (the standard voltage range is 4.5V - 5.5V), and there were also corresponding measured values of the transient response time at certain voltage change points. For the voltage fluctuation range, calculate the degree of deviation from the standard range. The width of the standard range is 5.5V - 4.5V = 1V, and the width of the actual fluctuation exceeding the range is (5.7V - 5.5V) + (4.5V - 4.3V) = 0.4V. Then, calculate the standardized value according to the degree of deviation. Suppose the standardized value obtained according to a specific calculation formula (such as the proportional relationship between the degree of deviation and the total width, etc.) is 0.6, indicating partial compliance with the standard. For the transient response time, assume that the standard transient response time requirement is within 50 milliseconds for complete compliance with the standard, and the maximum measured transient response time at certain voltage change points is 60 milliseconds. Calculate the standardized value according to the proportion of the transient response time exceeding the standard. Suppose it is 0.8 (indicating relatively close to complete compliance with the standard). Considering factors such as the voltage fluctuation range and the transient response time comprehensively, obtain the final standardized value of the voltage stability dimension according to the conventional comprehensive calculation methods in the prior art (such as taking the average value or weighted average according to importance, etc.).

[0130] In the data integrity dimension, take the packet loss rate and the bit error rate as examples. If in the data transmission test, the packet loss rate is 5% and the bit error rate is 0.1%. Suppose the completely compliant packet loss rate is 0%, and the completely non-compliant packet loss rate is 10% (this is an assumed limit set according to the acceptable range of the packet loss rate for data transmission of the tablet computer). Calculate the standardized value of the packet loss rate according to the linear ratio, that is, (10% - 5%) / 10% = 0.5. For the bit error rate, assume that the completely compliant bit error rate is 0%, and the completely non-compliant bit error rate is 1% (also an assumed limit), and calculate the standardized value of the bit error rate in a similar way as (1% - 0.1%) / 1% = 0.9. Then, according to the importance of the packet loss rate and the bit error rate in data integrity (assuming the packet loss rate is more important), obtain the standardized value of the data integrity dimension through methods such as weighted average.

[0131] In the dimension of connection durability, such as the change of contact resistance, assuming that the initial contact resistance value is 0.1 Ω, the stable contact resistance value is 0.2 Ω, and the standard requirement for the stable contact resistance value is below 0.15 Ω to be fully compliant with the standard. Calculate the standardized value according to the degree of deviation of the contact resistance value from the standard, assuming that it is 0.6 obtained according to a specific formula. For the expected plugging and unplugging life, assuming that the test shows that the expected plugging and unplugging life is 500 times, and the preset fully compliant plugging and unplugging life is 1000 times, calculate the standardized value as 500 / 1000 = 0.5 according to the ratio. Considering factors such as contact resistance and expected plugging and unplugging life comprehensively, obtain the standardized value of the connection durability dimension.

[0132] Step S430, perform weighted summation on the standardized values according to the weight coefficients to obtain the comprehensive performance score of the non-standard Type-C interface.

[0133] For example, according to the weight coefficients set previously, the comprehensive performance score = 0.5 × the standardized value of the voltage stability dimension + 0.3 × the standardized value of the data integrity dimension + 0.2 × the standardized value of the connection durability dimension. Assume that the standardized value of the voltage stability dimension obtained through the previous calculation is 0.6, the standardized value of the data integrity dimension is 0.8, and the standardized value of the connection durability dimension is 0.5. Then the comprehensive performance score = 0.5 × 0.6 + 0.3 × 0.8 + 0.2 × 0.5 = 0.64.

[0134] Step S440, when the comprehensive performance score is lower than the preset passing line, trigger a three-level alarm mechanism: the first-level alarm indicates a voltage stability defect, the second-level alarm indicates a data integrity defect, and the third-level alarm indicates a connection durability defect.

[0135] Assume that the preset passing line is 0.8. Since the calculated comprehensive performance score of 0.64 is lower than this passing line, it is necessary to trigger the alarm mechanism. Because in this score, the weight of the voltage stability dimension is relatively large and its standardized value is relatively low, so first consider whether there is a problem with the voltage stability that causes the relatively low comprehensive score. If the evaluation index of the voltage stability dimension causes the comprehensive performance score to be lower than the passing line, then trigger the first-level alarm, indicating a voltage stability defect. This means that the problem with the voltage stability has a greater impact on the overall performance and needs to be focused on and repaired. If the evaluation index of the data integrity dimension mainly causes the comprehensive score to be lower than the passing line, trigger the second-level alarm indicating a data integrity defect. If the problem with the connection durability dimension is the main factor, trigger the third-level alarm indicating a connection durability defect.

[0136] Step S450, dynamically adjust the generation format of the verification report according to the alarm level, and associate different color identifiers and repair priority labels with each alarm level.

[0137] For example, for a first-level alarm (voltage stability defect), in the verification report, the test data and analysis results related to voltage stability are placed in a more prominent position, such as elaborated in detail at the beginning of the report. And a red identifier is associated with this alarm level to indicate a serious problem. At the same time, the repair priority is set to the highest, prompting relevant personnel to handle this problem first because voltage stability problems may directly affect the normal charging and operation of the tablet computer and may even damage the device. For a second-level alarm (data integrity defect), the corresponding data and analysis results in the verification report are placed in a less important position, and a yellow identifier is associated to indicate a problem of medium severity, and the repair priority is medium, indicating that although there are problems with data integrity, the impact on the overall performance is slightly smaller than that of voltage stability problems. For a third-level alarm (connection durability defect), the relevant content in the verification report is placed relatively later, and a blue identifier is associated to indicate a relatively minor problem, and the repair priority is low, meaning that after dealing with voltage stability and data integrity problems, if there are resources and time, then consider dealing with connection durability problems.

[0138] In a possible implementation manner, when determining the defect probability and location information of the non-standard Type-C interface by reverse matching the defect feature model in the standard transmission parameter library according to the original monitoring data, the method further includes:

[0139] Step S510, load the historical defect database corresponding to the non-standard Type-C interface model from the standard transmission parameter library, and the historical defect database includes defect feature models of known physical defects.

[0140] When determining the defect probability and location information of the non-standard Type-C interface, it is necessary to load the historical defect database corresponding to the non-standard Type-C interface model from the standard transmission parameter library, and this historical defect database includes defect feature models of known physical defects. In the test scenario of the tablet computer and the non-standard Type-C interface, this historical defect database is established specifically for this type of interface and the tablet computer device that matches it.

[0141] Step S520, calculate the similarity between the currently detected abnormal voltage fluctuation pattern and the oxidation contact feature, aging insulation feature, and soldering joint pin feature in the defect feature model.

[0142] For example, the abnormal voltage fluctuation pattern detected in the previous voltage stability test is that the voltage fluctuates between 4.3V and 5.7V, and this fluctuation pattern needs to be compared with various defect feature models in the historical defect database.

[0143] Step S530, if the similarity between the abnormal voltage fluctuation pattern and the oxidation contact characteristics exceeds the first threshold, generate the probability of metal contact oxidation and a recommended cleaning solution.

[0144] Suppose the first threshold is set at 0.8. Through a specific similarity calculation algorithm (which may involve comparing various factors such as the fluctuation range and frequency with the oxidation contact characteristic model), it is detected that the similarity between the abnormal voltage fluctuation pattern and the oxidation contact characteristics is 0.9, exceeding the first threshold. Based on this result, combined with historical data and empirical formulas, generate the probability of metal contact oxidation. For example, it is concluded that there is an 80% probability of oxidation in the metal contacts. At the same time, give a recommended cleaning solution. For example, use a professional electronic device cleaning solution and a clean, static-free wiping cloth to gently wipe the metal contacts. During the wiping process, avoid mechanical damage to the contacts and ensure that the cleaning solution does not seep into the interface to cause short circuits or other problems.

[0145] Step S540, if the similarity between the abnormal voltage fluctuation pattern and the aging insulation characteristics exceeds the second threshold, generate the aging level of the insulation layer and a prompt for recommending insulation material replacement.

[0146] Suppose the second threshold is 0.7. After calculation, the similarity between the abnormal voltage fluctuation pattern and the aging insulation characteristics is 0.8, exceeding the second threshold. Based on this result and the corresponding relationship in the historical defect data, generate the aging level of the insulation layer. For example, it is judged to be slightly aged. Then give a prompt for recommending insulation material replacement, such as recommending the use of insulation materials with specific models and specifications for replacement, and during the replacement process, strict operating procedures should be followed to ensure the insulation effect after replacement and the overall performance of the interface.

[0147] Step S550, if the similarity between the abnormal voltage fluctuation pattern and the characteristics of a soldering joint with a loose pin exceeds the third threshold, locate the position of the loose soldering joint of the pin and generate a schematic diagram of the repair process flow.

[0148] Suppose the third threshold is 0.6. When the calculated similarity between the abnormal voltage fluctuation pattern and the characteristics of a soldering joint with a loose pin is 0.7, it exceeds the third threshold. Through a detailed comparison and analysis with the model of the characteristics of a soldering joint with a loose pin, locate the position of the loose soldering joint of the pin. For example, it is determined that there is a greater possibility of a loose connection in the 3rd pin. Then, based on historical repair data and standard operating procedures, generate a schematic diagram of the repair process flow. This schematic diagram of the repair process flow details the entire process from disassembling the device housing, locating the loose pin, re-soldering to assembling the device, including key parameters such as the tools used, the soldering temperature and time, etc., so that maintenance personnel can perform repair operations according to the standard process to ensure that the repaired non-standard Type-C interface can work properly and meet the charging and data transmission requirements of the tablet computer.

[0149] Figure 2FIG. 0 shows a schematic diagram of exemplary hardware and software components of an interface data transmission verification system 100 provided by some embodiments of the present invention that can implement the idea of the present invention. For example, the processor 120 can be used on the interface data transmission verification system 100 and is used to execute the functions in the present invention.

[0150] The interface data transmission verification system 100 can be a general-purpose server or a special-purpose server, both of which can be used to implement the method for quickly verifying data transmission of the non-standard Type-C interface of the present invention. Although only one server is shown in the present invention, for convenience, the functions described in the present invention can be implemented in a distributed manner on multiple similar platforms to balance the processing load.

[0151] For example, the interface data transmission verification system 100 can include a network port 110 connected to a network, one or more processors 120 for executing program instructions, a communication bus 130, and different forms of storage media 140, such as disks, ROMs, or RAMs, or any combination thereof. Exemplarily, the interface data transmission verification system 100 can also include program instructions stored in ROM, RAM, or other types of non-transitory storage media, or any combination thereof. The method of the present invention can be implemented according to these program instructions. The interface data transmission verification system 100 also includes an input / output (I / O) interface 150 between the computer and other input / output devices.

[0152] For ease of explanation, only one processor is described in the interface data transmission verification system 100. However, it should be noted that the interface data transmission verification system 100 in the present invention can also include multiple processors. Therefore, the steps performed by one processor described in the present invention can also be jointly executed or separately executed by multiple processors. For example, if the processor of the interface data transmission verification system 100 executes step A and step B, it should be understood that step A and step B can also be jointly executed by two different processors or separately executed in one processor. For example, the first processor executes step A, the second processor executes step B, or the first processor and the second processor jointly execute steps A and B.

[0153] In addition, an embodiment of the present invention also provides a readable storage medium, in which computer-executable instructions are preset. When the processor executes the computer-executable instructions, the above-mentioned method for quickly verifying data transmission of the non-standard Type-C interface is implemented.

[0154] It should be noted that, in order to simplify the expression of the disclosure of the present invention and thus help the understanding of one or more embodiments of the invention, in the foregoing description of the embodiments of the present invention, sometimes multiple features are merged into one embodiment, drawing, or description thereof.

Claims

1. A method for rapid verification of data transmission of a non-standard Type-C interface, characterized in that: The method comprises: Obtain a verification request triggered when the target device accesses a non-standard Type-C interface, wherein the verification request includes a physical connection status identifier of the interface to be verified and a current transmission mode parameter, wherein the current transmission mode parameter is used to indicate a status parameter in the current transmission mode; Based on the physical connection state identifier, extracting the real-time signal characteristics of the non-standard Type-C interface in the current transmission mode from a preset signal acquisition module, wherein the real-time signal characteristics include a voltage fluctuation sequence, a current change trajectory, and a data packet transmission interval distribution; Dynamically matching the real-time signal feature with a preset standard transmission parameter library to generate a test instruction set for the non-standard Type-C interface, the test instruction set comprising a plurality of groups of verification actions sorted by priority and corresponding trigger condition thresholds; Calling the verification action in the test instruction set, performing phased signal injection and feedback capture on the non-standard Type-C interface, and recording the execution result of each verification action and the corresponding timing mark; Generate a verification report based on the execution result and the timing mark, and map the abnormal nodes in the verification report that do not meet the preset transmission stability index to the physical structure defect description of the non-standard Type-C interface; The extracting, based on the physical connection state identifier, the real-time signal feature of the non-standard Type-C interface in the current transmission mode from a preset signal acquisition module includes: When the physical connection status identifier indicates a first connection state, activating the high-speed sampling unit in the signal acquisition module, collecting the initial handshake signal of the non-standard Type-C interface at a preset first sampling frequency, and extracting the voltage rising slope, current steady-state value and handshake protocol response time in the initial handshake signal; When the physical connection state identifier indicates a reconnection state, switch to the anti-interference sampling unit in the signal acquisition module, collect the reconnection synchronization signal of the non-standard Type-C interface at a preset second sampling frequency, and extract the noise suppression ratio, phase offset and number of data retransmissions in the reconnection synchronization signal; Combine and analyze the extracted parameters of the initial handshake signal or the reconnection synchronization signal with the current transmission mode parameters to generate the real-time signal feature including a timestamp; The first sampling frequency is higher than the second sampling frequency, and the anti-interference sampling unit is configured with a dynamic filtering algorithm to eliminate residual noise from historical connections.

2. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 1, characterized in that: The dynamically matching the real-time signal characteristics with a preset standard transmission parameter library to generate a test instruction set for the non-standard Type-C interface includes: Loading a reference signal template corresponding to the current transmission mode parameters from the standard transmission parameter library, the reference signal template including a standard voltage range, an allowable current threshold, and a data packet integrity check rule; Compare the voltage fluctuation sequence in the real-time signal feature with the standard voltage range point by point, and calculate the duration and amplitude deviation of the abnormal voltage point exceeding the standard voltage range; Performing segmented fitting of the current change trajectory and the allowable current threshold to identify the current over-limit area and the corresponding load fluctuation mode; Perform time-sequential correlation between the data packet transmission interval distribution and the data packet integrity check rule, and count the packet loss rate, disorder times and check failure events; Based on the statistical results of the abnormal voltage points, current exceeding limit areas and verification failure events, a matching difference matrix including weight scores is generated, and multiple groups of verification actions sorted by priority and corresponding trigger condition thresholds are generated according to the weight scores to obtain a test instruction set.

3. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 1, characterized in that: The calling of the verification action in the test instruction set to perform phased signal injection and feedback capture on the non-standard Type-C interface includes: Selecting target verification actions from the test instruction set in sequence according to the priority order of the verification actions, and parsing the trigger condition thresholds corresponding to the target verification actions; When the target verification action belongs to the voltage stability test type, a step voltage waveform is injected into the power pin of the non-standard Type-C interface, and the transient response and voltage drop recovery time of the feedback current are simultaneously monitored; When the target verification action belongs to the data integrity test type, a preset verification data sequence is sent to the data channel of the non-standard Type-C interface, and the response delay, bit error rate and retransmission request frequency of the data channel are captured; When the target verification action belongs to the physical connection durability test type, the plug-in mechanism of the non-standard Type-C interface is controlled to perform periodic connection-disconnection operations, and the contact resistance change and signal attenuation rate after each operation are recorded; After each target verification action is executed, the monitoring data is compared with the trigger condition threshold in real time. If the trigger condition threshold is exceeded, the subsequent verification action is terminated and marked as a critical fault node.

4. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 1, characterized in that: The generating of the verification report based on the execution result and the timing mark, and mapping the abnormal nodes in the verification report that do not meet the preset transmission stability index to the physical structure defect description of the non-standard Type-C interface, includes: Integrate the execution results of each verification action into a multidimensional data set according to time series marks, wherein the multidimensional data set includes evaluation indicators of voltage stability dimension, data integrity dimension and connection durability dimension; Normalizing the evaluation indicators and calculating a comprehensive score for each dimension based on a preset transmission stability weight coefficient; Identify the target dimension whose comprehensive score is lower than the preset qualified threshold, and extract the original monitoring data and execution environment parameters of the corresponding target dimension; Reverse matching the defect feature model in the standard transmission parameter library according to the original monitoring data to determine the defect probability and location information of the non-standard Type-C interface; The defect probability and location information are converted into a readable physical structure defect description and associated with the abnormal node coordinates and repair suggestions in the verification report.

5. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 1, characterized in that: When the high-speed sampling unit in the signal acquisition module is activated, or when the anti-interference sampling unit in the signal acquisition module is switched, the method further includes: A multi-channel parallel acquisition circuit is configured in the high-speed sampling unit, and independent signal traces of the power pin, ground pin and data pin of the non-standard Type-C interface are captured; Allocate an independent buffer queue for each signal trace, and poll and read the buffer queue according to the first sampling frequency to generate time-aligned multi-channel signal samples; An adaptive noise canceller is embedded in the anti-interference sampling unit, the current environmental noise spectrum is predicted according to the historical connection record of the non-standard Type-C interface, and the center frequency and bandwidth of the band-stop filter are dynamically adjusted; The filtered multi-channel signal samples are input into the signal feature extractor, and the effective signal components and residual noise components are separated by the peak detection algorithm and the mean shift algorithm.

6. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 3, characterized in that: The sending of a preset verification data sequence to the data channel of the non-standard Type-C interface and capturing the response delay, bit error rate and retransmission request frequency of the data channel includes: Constructing a standard test data packet including an increasing sequence number, a pseudo-random data block, and a cyclic redundancy check code, and sending a verification data sequence corresponding to the standard test data packet to the data channel of the non-standard Type-C interface at a preset sending interval; Deploy a data packet listener at the receiving end of the non-standard Type-C interface, and record the arrival time, sequence number integrity and check code matching status of each received standard test data packet through the data packet listener; Calculate the one-way transmission delay according to the sending interval and the arrival time to obtain the response delay of the data channel, and count the occurrence position and interval of the packet loss event according to the sequence number integrity; When the check code matching status indicates that the check code does not match, the retransmission request generator is triggered to send a retransmission instruction to the sending end, and the retransmission request frequency and successful response ratio of the retransmission instruction, as well as the bit error rate corresponding to the check code matching status are counted; The one-way transmission delay, packet loss event and retransmission response ratio are integrated into a data integrity evaluation matrix and associated with a sending batch identifier of a current test data packet.

7. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 3, characterized in that: When the plugging and unplugging mechanism of the non-standard Type-C interface is controlled to perform a periodic connection-disconnection operation, the method further includes: Controlling the robotic arm to clamp the plug portion of the non-standard Type-C interface and perform multiple insertion-extraction cycles at a preset insertion and extraction speed and force; After each insertion is completed, the contact resistance value between the power pin and the ground pin of the non-standard Type-C interface is measured by a contact resistance tester, and the initial value and stable value of the contact resistance value are recorded; During each unplugging process, the camera captures the separation track of the plug and the interface, and analyzes the wear trace distribution of the metal contacts of the plug and the area of ​​foreign matter adhesion; Inputting the contact resistance value, wear mark and foreign matter attachment area into a durability prediction model to calculate the expected plug-in life and contact reliability index of the non-standard Type-C interface; When the expected plug-in life is lower than a preset threshold, the mechanical structure defect level of the interface and the recommended replacement cycle are marked in the verification report.

8. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 4, characterized in that: When the evaluation index is normalized, the method further includes: Assigning a first weight coefficient to the voltage stability dimension, assigning a second weight coefficient to the data integrity dimension, and assigning a third weight coefficient to the connection durability dimension, wherein the first weight coefficient is greater than the second weight coefficient and the third weight coefficient; The original evaluation index of each dimension is converted into a standardized value in the range of 0-1, where 0 means that it does not meet the standard at all and 1 means that it fully meets the standard; Performing weighted summation on the standardized values ​​according to the weight coefficients to obtain a comprehensive performance score of the non-standard Type-C interface; When the comprehensive performance score is lower than the preset qualified line, a three-level alarm mechanism is triggered: the first-level alarm indicates a voltage stability defect, the second-level alarm indicates a data integrity defect, and the third-level alarm indicates a connection durability defect; The generation format of the verification report is dynamically adjusted according to the alarm level, and different color identification and repair priority labels are associated with each alarm level.

9. The method for rapid verification of data transmission of a non-standard Type-C interface according to claim 8, characterized in that: When reverse matching the defect feature model in the standard transmission parameter library according to the original monitoring data to determine the defect probability and location information of the non-standard Type-C interface, the method further includes: Loading a historical defect database corresponding to the non-standard Type-C interface model from the standard transmission parameter library, the historical defect database containing defect feature models of known physical defects; Calculate the similarity between the abnormal voltage fluctuation mode currently detected and the oxidation contact feature, the aged insulation feature and the cold solder pin feature in the defect feature model; If the similarity between the abnormal voltage fluctuation pattern and the oxidized contact feature exceeds a first threshold, a metal contact oxidation probability and a recommended cleaning solution are generated; If the similarity between the abnormal voltage fluctuation pattern and the aged insulation feature exceeds a second threshold, an insulation layer aging level and a suggestion to replace the insulation material are generated; If the similarity between the abnormal voltage fluctuation pattern and the feature of the cold-welded pin exceeds a third threshold, the cold-welded pin position is located and a rework process flow chart is generated.

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