Particle control anti-interference method and device based on perfect vortex beam

Abstract

The invention relates to the technical field of particle control, and particularly discloses a particle control anti-interference method and device based on a perfect vortex beam, and the method comprises the following steps: vertically irradiating micro-nano particles suspended in a sample cell by using a modulated and shaped Gaussian beam, so as to form a dot matrix light field in the sample cell, part of micro-nano particles are stably captured at each bright spot of the dot matrix light field; an internal capture light field and an external anti-interference light field are formed in the sample cell; when the micro-nano particles which are not captured in the sample pool move to the vicinity of an external anti-interference light field, the micro-nano particles are driven by outward light force; according to the particle control anti-interference method based on the perfect vortex light beam, an anti-interference light field based on the perfect vortex light beam is directly added outside an experiment area for capturing the light field, particles which are not captured are driven out of the experiment area through outward light force of the light field, operation is easy, and the effect is obvious.

Description

Technical Field

[0001] The present invention relates to the field of particle manipulation technology, and in particular to a particle manipulation anti-interference method and device based on a perfect vortex light beam. Background Art

[0002] Although optical tweezers technology has achieved remarkable results in many fields, it still faces some challenges in the actual experimental process. Among them, the situation of high particle concentration is a common and thorny problem. In many experiments, in order to improve experimental efficiency or simulate actual biological or physical environments, a higher concentration of particle samples is required. However, when the particle concentration is high, optical tweezers can only capture a part of the particles, and a large number of uncaptured particles will move freely in the experimental area. These uncaptured particles will have many effects on the experiment. On the one hand, uncaptured particles will interfere with the movement and measurement of captured particles. They may collide with captured particles, change the trajectory and mechanical state of captured particles, and thus increase the error and uncertainty of experimental data. On the other hand, uncaptured particles will affect the imaging quality of the experiment. In the optical imaging system, the presence of a large number of uncaptured particles in the background will make the image appear dark and unclean, reducing the contrast and clarity of the image. This is a serious problem for experiments that require high-precision imaging and analysis, affecting the accuracy and reliability of experimental results. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a method and device for anti-interference of particle manipulation based on a perfect vortex light beam. No additional anti-interference device is required. An anti-interference light field based on a perfect vortex light beam is directly added outside the experimental area of ​​the captured light field. The light field's own outward light force is utilized to drive the uncaptured particles out of the experimental area. The operation is simple and the effect is obvious.

[0004] To achieve the above object, the present invention adopts the following technical solution:

[0005] In a first aspect, the present invention provides a method for anti-interference of particle manipulation based on a perfect vortex beam, comprising the following steps:

[0006] The modulated and shaped Gaussian beam is used to vertically irradiate the micro-nano particles suspended in the sample pool to form a lattice light field in the sample pool, so that some of the micro-nano particles are stably captured at each bright spot in the lattice light field;

[0007] By modulating and shaping the Gaussian beam, an internal capture light field and an external anti-interference light field are formed in the sample cell;

[0008] When the uncaptured micro-nanoparticles suspended in the sample pool move to the vicinity of the external anti-interference light field, they are driven away by the outward light force;

[0009] Among them, the external anti-interference light field is an anti-interference circular ring light field based on a perfect vortex beam.

[0010] In the method for anti-interference of particle manipulation based on a perfect vortex beam provided by at least one embodiment of the present disclosure, the internal captured light field is a lattice light field generated by superimposing a Dammann grating with a blazed grating.

[0011] In the method for anti-interference of particle manipulation based on a perfect vortex beam provided by at least one embodiment of the present disclosure, the perfect vortex beam is a ring-shaped perfect vortex beam.

[0012] In the method for anti-interference of particle manipulation based on a perfect vortex beam provided by at least one embodiment of the present disclosure, the wavelength of the Gaussian beam is 1064 nm.

[0013] In a second aspect, the present invention provides a device for anti-interference of particle manipulation based on a perfect vortex beam, comprising: a sample pool and a modulatable light source module.

[0014] The sample pool stores a micro-nano particle solution.

[0015] The modulatable light source module is used to form a light field in the sample pool to capture and perform anti-interference processing on the micro-nano particles in the micro-nano particle solution.

[0016] In the method for anti-interference of particle manipulation based on a perfect vortex beam provided in at least one embodiment of the present disclosure, the particle size of the micro-nano particles in the micro-nano particle solution is 1-3 μm.

[0017] In the method for anti-interference of particle manipulation based on perfect vortex beam provided by at least one embodiment of the present disclosure, the material of the micro-nano particles in the micro-nano particle solution is polystyrene.

[0018] In the method for anti-interference of particle manipulation based on perfect vortex beam provided by at least one embodiment of the present disclosure, the modulatable light source module includes: a laser emission component, a modulation and shaping component, a focusing component and an illumination component.

[0019] The laser output component is used to provide a Gaussian beam.

[0020] The modulation and shaping component is used to modulate and shape the Gaussian light beam to form a light field.

[0021] The focusing component is used to focus the modulated and shaped light field onto the micro-nano particle solution in the sample pool.

[0022] The illumination assembly is used to provide a white light field to the sample cell.

[0023] In the method for anti-interference of particle manipulation based on a perfect vortex beam provided by at least one embodiment of the present disclosure, a reflection component is arranged between the modulation and shaping component and the focusing component.

[0024] The reflection component is used to reflect the light field modulated and shaped by the modulation and shaping component to the focusing component.

[0025] The method for anti-interference of particle manipulation based on a perfect vortex beam provided by at least one embodiment of the present disclosure also includes: an imaging module, which is used to form an image of the movement process of the micro-nano particles.

[0026] The beneficial effects of the present invention are as follows: the present invention uses a perfect vortex light beam as an anti-interference light beam, the energy is relatively concentrated, and it can provide three-dimensional protection for particles. At the same time, the capture light field and the anti-interference light field in the center of the light field can be designed separately, which has the advantages of high flexibility and simple operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0028] Figure 1 Schematic diagram of the structure of the device for anti-interference of particle manipulation based on perfect vortex beam.

[0029] Figure 2 Schematic diagram of the movement of micro-nanoparticles under the outward optical force when the uncaptured particles move near the anti-interference circular light field.

[0030] Figure 3 This is a schematic diagram of a method for anti-interference of particle manipulation based on a perfect vortex beam according to an embodiment of the present invention.

[0031] Figure 4 The images were taken when the imaging module was verifying the feasibility of the anti-interference method for particle manipulation based on perfect vortex beam.

[0032] In the figure:

[0033] 1. Sample pool; 2. Laser emission component; 3. Modulation and shaping component; 4. Reflection component; 5. Focusing component; 6. Illumination component; 7. Imaging module. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments will be described clearly and completely below in conjunction with the drawings in the embodiments. Obviously, the described embodiments are only a part of the embodiments, rather than all the embodiments.

[0035] The method for anti-interference of particle manipulation based on perfect vortex beam of the present invention mainly includes a capture process and an anti-interference process.

[0036] The sample pool contains a solution of micro-nano particles to be captured, and the micro-nano particles can move freely in the microparticle solution and are suspended in the solution;

[0037] Capture process: The modulated and shaped Gaussian beam is used to vertically illuminate the micro-nano particles suspended in the sample pool to form a lattice light field in the sample pool, so that some micro-nano particles are stably captured at each bright spot in the lattice light field;

[0038] Anti-interference process: By modulating and shaping the Gaussian beam, the light field in the sample pool is changed into a light field composed of the internal capture light field and the external anti-interference light field. When the uncaptured micro-nanoparticles suspended in the sample pool move to the vicinity of the external anti-interference light field, they are driven away by the outward light force.

[0039] The external anti-interference light field is an anti-interference circular light field based on a perfect vortex beam, specifically a circular perfect vortex beam.

[0040] The internal captured light field is a dot-matrix light field generated by superimposing a Dammann grating with a blazed grating.

[0041] For the light field design, the light field consists of two parts. The experimental area is a 4×1 dot-matrix light field generated by a Dammann grating superimposed with a blazed grating. The periphery of the experimental area uses an aconical lens to modulate the vortex beam to obtain a Bessel-Gaussian beam, and then uses the Fourier transform function of the Fourier lens to obtain a perfect vortex beam in the focal plane area. The Bessel-Gaussian beam is modulated by a spatial light modulator, and the transmittance function of the aconical lens is multiplied by the phase of the vortex beam to obtain the phase diagram parameters loaded into the spatial light modulator. The phase diagram parameters of the two parts of the light field can be expressed as:

[0042]

[0043] Where exp(ibr) represents the phase of the conical lens, b is the cone angle parameter, which adjusts the size of the ring; l is the topological charge of the perfect vortex beam; n is a natural number; T is the grating period, which adjusts the lattice spacing; k is an odd number, y k is the inflection point of the Dammann grating phase, which adjusts the number of bright spots in the lattice; M defines the range of phase movement in each period of the grating, 0≤M≤1; c is the position where the hologram is divided.

[0044] For the capture process, the Gaussian beam is modulated into a 4×1 dot matrix light field and irradiated vertically into the micro-nano particle solution, and the micro-nano particles to be manipulated are in the light spot. According to the principle of interaction between light and matter, the light field will exert a force on the micro-nano particles in it. Specifically in the present invention, the micro-nano particles are subjected to the gradient force exerted by the light field. The gradient force is generated because the light intensity of the light field is unevenly distributed in space. The micro-nano particles will feel forces of different directions and magnitudes in this uneven light field. More specifically, the micro-nano particles are subjected to the transverse gradient force. The transverse gradient force refers to the force generated by the light field intensity gradient in a plane perpendicular to the direction of light propagation. At each bright spot of the 4×1 dot matrix light field, the light intensity shows a distribution characteristic that gradually weakens from the center of the bright spot to the surroundings. This light intensity distribution forms a transverse light intensity gradient. Under the action of this transverse light intensity gradient, the micro-nano particles will be subjected to a force pointing to the center of the bright spot, so that they can be stably captured at each bright spot of the dot matrix light field.

[0045] For the anti-interference process, based on the capture process, the uncaptured micro-nano particles are suspended in the experimental area, and the spatial light modulator is adjusted to change the light field in the sample pool into a combination of the anti-interference circular light field based on the perfect vortex beam. When the micro-nano particles move near the external anti-interference light field, they will be affected by the optical force and thus driven out of the experimental area. The captured particles can be further operated in the experimental area, such as transportation and sorting.

[0046] like Figure 1 As shown, based on the same inventive concept, an embodiment of the present invention further provides a device for anti-interference of particle manipulation based on a perfect vortex light beam, comprising a sample pool 1 and a modulatable light source module.

[0047] Specifically, the sample pool stores a micro-nano particle solution. The modulatable light source module is used to form a light field in the sample pool to capture and perform anti-interference processing on the micro-nano particles in the micro-nano particle solution.

[0048] Specifically, the particle size of the micro-nano particles is 1-3 μm, the refractive index of the micro-nano particles is n=1.59-1.60, and the material of the micro-nano particles is polystyrene.

[0049] In this embodiment, the modulatable light source module includes: a laser emitting component 2 , a modulation and shaping component 3 , a focusing component 5 , an illumination component 6 and an imaging module 7 .

[0050] In this embodiment, the laser emitting component 2 is used to provide a Gaussian beam. The output optical power of the laser emitting component is 30-5140 mW, and the wavelength of the Gaussian beam emitted by the laser emitting component is 1064 nm.

[0051] In this embodiment, the modulation and shaping component 3 is used to modulate and shape the Gaussian beam to form a light field.

[0052] Specifically, the modulation and shaping component 3 is composed of a lens group, a spatial light modulator and its control driver. The modulation and shaping component 3 is used to modulate and shape the Gaussian light beam emitted by the laser output component 2 into a lattice light field for capturing particles, and on the basis of capture, the modulation and shaping component 3 is adjusted so that the light field in the sample pool becomes a light field composed of a lattice light field and an anti-interference circular light field based on a perfect vortex beam, thereby dispersing unnecessary particles from the experimental area, thereby reducing the interference of uncaptured particles on the experiment.

[0053] In this embodiment, the focusing component 5 is used to focus the modulated and shaped light field onto the micro-nano particle solution in the sample pool 1 .

[0054] In this embodiment, the lighting assembly 6 is used to provide a white light field for the sample pool 1 . The white light field lighting assembly 6 is a white light LED lamp, which illuminates the sample pool 1 after passing through the objective lens.

[0055] In this embodiment, a reflection component 4 is disposed between the modulation and shaping component 3 and the focusing component 5 . The reflection component 4 is used to reflect the light field modulated and shaped by the modulation and shaping component 3 to the focusing component 5 .

[0056] In this embodiment, the imaging module 7 is used to form an image of the movement process of the particles.

[0057] The working method of the device for particle manipulation and anti-interference based on perfect vortex beam specifically includes the following steps:

[0058] 1) First, use a 10μl pipette to take 10μl of polystyrene microparticle size standard material (solid content 0.3%, refractive index n=1.50-1.60) and dilute it in 10ml of ultrapure water to a volume ratio of 1:1000. Then ultrasonicate the solution for 10 minutes to evenly distribute the polystyrene microparticles in the liquid. Finally, use a 2ml microinjector to take 1ml of sample and drop it into the groove of a single-groove slide until it is just covered by a cover glass. Slowly cover the cover glass on the sample solution from one side to prevent bubbles from appearing, forming a sample pool. Place the sample pool on the sample stage and fix it with a tablet clamp.

[0059] 2) above the sample pool, the Gaussian beam emitted by the laser output component 2 is modulated and shaped by the modulation and shaping component 3. The Gaussian beam passes through the reflection component 4 and the focusing component 5 and then vertically irradiates the micro-nano particles to form a lattice light field in the sample pool, so that some micro-nano particles are stably captured at each bright spot of the lattice light field;

[0060] 3) The Gaussian beam is modulated and shaped by the modulation and shaping component 3, so that an internal capture light field and an external anti-interference light field are formed in the sample pool; wherein, the internal capture light field is a lattice light field generated by superimposing a Dammann grating with a blazed grating, and the external anti-interference light field is an anti-interference circular light field based on a perfect vortex beam, specifically a circular perfect vortex beam.

[0061] 4) When the uncaptured micro-nanoparticles suspended in the sample pool move to the vicinity of the external anti-interference light field, they are driven away by the outward light force.

[0062] Figure 2 It is a schematic diagram of a method for anti-interference of particle manipulation based on a perfect vortex light beam according to an embodiment of the present invention. When uncaptured particles move near the anti-interference circular light field, they will be driven away by the outward light force.

[0063] Figure 3 This is a schematic diagram of the method for particle manipulation and anti-interference based on perfect vortex beam according to an embodiment of the present invention. The Gaussian beam is modulated by the modulation shaping component, and an internal capture light field and an external anti-interference light field are formed in the sample pool. When the micro-nano particles move to the vicinity of the anti-interference circular light field, they are affected by the outward optical force. Figure 3 As shown, the gray thin line represents the intensity distribution of the light field, the red solid line represents the light force exerted on the 2μm micro-nano particles, and the red dotted line represents the light force exerted on the 3μm micro-nano particles. Under the action of the light force, the micro-nano particles always move to the outside of the ring and are driven out of the experimental area.

[0064] Next, the feasibility of the anti-interference method of particle manipulation based on perfect vortex beam is verified by using imaging module 6:

[0065] After preparing the micro-nano particle solution, slowly adjust the output power of the laser output component 2 to 1620mW; observe the dispersion of the polystyrene particles and the focusing of the light spot through the image formed by the imaging module 6; modulate and shape the Gaussian beam into a dot matrix light field through the modulation and shaping component 3 and irradiate it on the sample pool.

[0066] like Figure 4 As shown, four polystyrene particles are firmly captured at the bright spot of the dot matrix light field, but there are still many uncaptured particles in the background. By modulating the shaping component 3, the light field is changed into a light field composed of the internal capture light field and the external anti-interference light field. The uncaptured particles are driven out of the experimental area by the outward light force, thereby reducing the interference of unnecessary particles on the experiment.

[0067] Although the embodiments of the present application have been shown and described above, the scope of protection of the present invention is not limited thereto, and any changes or substitutions that are not conceivable through creative work should be included in the scope of protection of the present invention; unless explicitly stated, any elements, actions or instructions used in this document should not be interpreted as critical or necessary.

Claims

1. A method for anti-interference of particle manipulation based on perfect vortex beam, characterized in that: The following steps are involved: The modulated and shaped Gaussian beam is used to vertically irradiate the micro-nano particles suspended in the sample pool to form a lattice light field in the sample pool, so that some of the micro-nano particles are stably captured at each bright spot in the lattice light field; By modulating and shaping the Gaussian beam, an internal capture light field and an external anti-interference light field are formed in the sample cell; When the uncaptured micro-nanoparticles suspended in the sample pool move to the vicinity of the external anti-interference light field, they are driven away by the outward light force; Among them, the external anti-interference light field is an anti-interference circular ring light field based on a perfect vortex beam.

2. The method for anti-interference of particle manipulation based on perfect vortex beam according to claim 1, characterized in that: The internal captured light field is a dot-matrix light field generated by superimposing a Dammann grating with a blazed grating.

3. The method for anti-interference of particle manipulation based on perfect vortex beam according to claim 2, characterized in that: The perfect vortex light beam is a ring-shaped perfect vortex light beam.

4. The method for anti-interference of particle manipulation based on perfect vortex beam according to claim 3, characterized in that: The Gaussian beam has a wavelength of 1064 nm.

5. A device for particle manipulation and anti-interference based on perfect vortex beam, characterized in that: include: A sample pool storing a micro-nano particle solution; as well as The modulatable light source module is used to form a light field in the sample pool to capture and perform anti-interference processing on the micro-nano particles in the micro-nano particle solution.

6. The device for anti-interference of particle manipulation based on perfect vortex beam according to claim 5, characterized in that: The particle size of the micro-nano particles in the micro-nano particle solution is 1-3 μm.

7. The device for anti-interference of particle manipulation based on perfect vortex beam according to claim 5, characterized in that: The material of the micro-nano particles in the micro-nano particle solution is polystyrene.

8. The device for anti-interference of particle manipulation based on perfect vortex beam according to claim 5, characterized in that: The modulatable light source module comprises: A laser output assembly for providing a Gaussian beam; A modulation and shaping component, used for modulating and shaping the Gaussian beam to form a light field; A focusing component, used for focusing the modulated and shaped light field onto the micro-nano particle solution in the sample pool; as well as Illumination assembly for providing a white light field to the sample cell.

9. The device for anti-interference of particle manipulation based on perfect vortex beam according to claim 8, characterized in that: A reflection component is arranged between the modulation and shaping component and the focusing component; The reflection component is used to reflect the light field modulated and shaped by the modulation and shaping component to the focusing component.

10. The device for anti-interference of particle manipulation based on perfect vortex beam according to claim 8, characterized in that: Also includes: The imaging module is used to form an image of the movement process of the micro-nano particles.

Images