A laser scanning and projecting integrated system and a control method thereof

Abstract

The application discloses a kind of laser scanning projection integration system and its control method, by MCU micro-control unit, laser, dynamic focusing module, laser beam splitting module, two-dimensional galvanometer module, light intensity detection module, distance detection module and host computer composition;Scanning stage, host computer sends instruction to MCU micro-control unit, MCU micro-control unit controls No. 1 laser to open, MCU micro-control unit receives angle data and distance data, generates the spherical coordinate of target point cloud data and is transferred to host computer;Projection stage, host computer sends instruction to MCU micro-control unit, MCU micro-control unit controls to open No. 2 laser to open, host computer converts three-dimensional space coordinates into spherical coordinate and is transferred to MCU micro-control unit, MCU micro-control unit extracts angle data, controls two-dimensional galvanometer to swing, so that laser beam is projected according to preset path.The application integrates laser scanning and projection function into one device, system versatility is strong, realizes high precision, high efficiency and low cost target.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of laser systems, and particularly relates to a laser scanning and projection integrated system and a control method thereof, which is widely applicable to the fields of building construction, medical equipment, engineering assembly and the like. BACKGROUND

[0002] As important components of precision measurement and projection technology, laser scanners and laser projectors are widely used in industrial and engineering fields. Laser scanners obtain three-dimensional point cloud data of target objects through laser ranging technology, and are widely used in surface measurement, model reconstruction and deformation monitoring. Laser projectors use precise laser beams as media to project digital graphics onto target surfaces for guidance, construction or display. However, in the prior art, these two devices are usually independently designed and operated systems, and users need to perform data transmission and conversion operations between them.

[0003] When the conventional independent laser scanner and projector are used independently, the optical systems and coordinate systems of the scanning device and the projection device are usually inconsistent. The conventional solution requires a complex coordinate calibration and calibration process, which not only increases the complexity of operation, but also easily introduces errors, makes it difficult to coordinate between devices, and may cause error accumulation due to field of view differences. At the same time, the separate device structure design increases the volume and cost of the system, limits the portability and economy, and hinders its application in mobile scenarios and rapid deployment. Therefore, a device integrating scanning and projection functions is needed to solve the inconsistency of the field of view through unified optical design, simplify the coordinate conversion process, and improve the accuracy and efficiency of the system. SUMMARY

[0004] In order to solve the problems of low efficiency, high error and cost increase caused by the separate design of scanning and projection devices in the prior art, the application provides a laser scanning and projection integrated system and a control method thereof, which is designed for the integration of laser scanners and projectors. Through the cooperation of the MCU micro control unit, the laser, the dynamic focusing module, the laser beam splitting module, the two-dimensional galvanometer module, the light intensity detection module, the distance detection module and the upper computer, a laser scanning and projection integrated system is built, the laser scanning and projection functions are integrated into one device, and a system architecture with common optical path is designed. The system has strong versatility, reduces the operation errors introduced by human operation, and achieves the goals of high precision, high efficiency and low cost.

[0005] The purpose of the application is achieved by the following technical solutions:

[0006] As a first aspect of the present application, a laser scanning and projection integrated system is provided, which comprises an MCU micro-control unit, a first laser, a second laser, a dynamic focusing module, a laser beam splitting module, a two-dimensional galvanometer module, a light intensity detection module, a distance detection module, and an upper computer.

[0007] The first laser serves as a scanning light source in the laser scanning stage, and the second laser serves as a projection light source in the laser projection stage.

[0008] In the laser scanning stage, the MCU micro-control unit controls the first laser to be turned on. The laser scanning beam passes through the dynamic focusing module for dynamic focusing and then exits to the laser beam splitting module. The laser scanning beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module controls the deflection of the laser scanning beam under the control of the MCU micro-control unit, so that the laser scanning beam moves and scans on the target surface. The light intensity detection module transmits the light intensity signal of the reflected laser beam on the target surface to the MCU micro-control unit. The reflected laser scanning beam on the target surface is reflected to the distance detection module by the laser beam splitting module, and the processed data is transmitted to the MCU micro-control unit by the distance detection module. The two-dimensional galvanometer module simultaneously transmits the deflection angle data to the MCU micro-control unit.

[0009] In the laser projection stage, the MCU micro-control unit controls the second laser to be turned on. The laser projection beam passes through the dynamic focusing module for dynamic focusing and then exits to the laser beam splitting module. The light beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module controls the swing of the laser projection beam under the control of the MCU micro-control unit, so that the laser projection beam generates a laser projection pattern on the target surface. At the same time, the light intensity detection module transmits the light intensity signal of the reflected laser beam on the target surface to the MCU micro-control unit. The MCU micro-control unit controls the dynamic focusing module to focus the laser projection beam according to the light intensity signal, and adjusts the definition of the laser projection pattern.

[0010] The upper computer and the MCU micro-control unit perform bidirectional data transmission.

[0011] Further, the first laser and the second laser are not turned on at the same time. In the scanning stage, the first laser is turned on and the second laser is turned off. In the projection stage, the first laser is turned off and the second laser is turned on.

[0012] Further, the wavelength of the first laser is different from the wavelength of the second laser.

[0013] Further, the two-dimensional galvanometer module is used to realize deflection control of the laser scanning beam and the laser projection beam. In the laser scanning phase, the laser scanning beam moves and scans on the target surface through swinging of the two-dimensional galvanometer, and the deflection angle of the two-dimensional galvanometer is monitored in real time through the angle displacement sensor integrated in the two-dimensional galvanometer, and the deflection angle data is fed back to the MCU micro control unit in real time. In the laser projection phase, the two-dimensional galvanometer swings under the control of the MCU micro control unit, so that the laser projection beam generates a laser projection pattern on the target surface.

[0014] Further, the light intensity detection module captures the reflected laser beam on the target surface as a light signal, converts the light signal into an electrical signal, and transmits the electrical signal to the MCU micro control unit for light intensity energy analysis. When the energy signal received by the light intensity detection module is the maximum value, it is determined that the laser beam is accurately focused on the target surface at this time.

[0015] Further, the host computer receives the spherical coordinates of the target surface point cloud data processed by the MCU micro control unit in the laser scanning phase, converts the spherical coordinates into three-dimensional coordinates, integrates the scanning points to form a three-dimensional model of the target surface, and adds a projection pattern according to user requirements. In the laser projection phase, the host computer calculates the required projection pattern into three-dimensional point cloud data, converts the three-dimensional data into spherical coordinates and transmits them to the MCU micro control unit, extracts the angle data in the spherical coordinates by the MCU micro control unit, controls the two-dimensional galvanometer of the two-dimensional galvanometer module to swing, and makes the laser projection beam project the projection pattern required by the user on the target surface.

[0016] As a second aspect of the present application, a control method for a laser scanning and projection integrated system is simultaneously provided, comprising:

[0017] In the laser scanning phase, the host computer sends a laser scanning instruction to the MCU micro control unit, the MCU micro control unit controls the first laser to be turned on and the second laser to be turned off, the first laser emits a laser scanning beam, and the laser scanning beam moves and scans on the target surface through swinging of the two-dimensional galvanometer. The MCU micro control unit receives the angle data of the two-dimensional galvanometer collected by the two-dimensional galvanometer module and the distance data collected by the distance detection module, combines the distance data and the angle data to obtain the spherical coordinates of each scanning point of the target surface, generates the spherical coordinates of the point cloud data of the target surface, and stores them. After scanning, the point cloud data is transmitted to the host computer, the host computer converts the spherical coordinates of the point cloud data into three-dimensional space coordinates, and the host computer integrates the scanning points to form a three-dimensional model of the target surface;

[0018] Laser projection stage: the host computer sends a laser projection instruction to the MCU micro control unit, the MCU micro control unit controls the first laser to close, and the second laser to open, and the second laser emits a laser projection beam; the host computer converts the three-dimensional space coordinates of the projection pattern to be projected into spherical coordinates, and transmits the spherical coordinates to the MCU micro control unit, and the MCU micro control unit extracts the angle data in the spherical coordinates, and controls the two-dimensional galvanometer of the two-dimensional galvanometer module to swing according to the angle data, so that the laser beam is projected according to the preset path.

[0019] Further, in the laser scanning stage, the light intensity detection module captures the energy of the reflected scanning light beam on the target surface, the light intensity detection module converts the detected optical signal into an electrical signal and transmits it to the MCU micro control unit, the MCU micro control unit judges whether the laser beam is correctly focused on the target surface, the MCU micro control unit controls the dynamic focusing module to focus the scanning light beam emitted by the first laser, and simultaneously analyzes the energy signal fed back by the light intensity detection module in real time, when the energy signal fed back by the light intensity detection module is the maximum value, it indicates that the scanning light source emitted by the first laser is focused on the target surface, at this time the reflected scanning light beam is reflected to the distance detection module through the laser beam splitting module.

[0020] Further, in the laser projection stage, the laser projection beam gets the laser projection pattern required by the user on the target surface after passing through the laser beam splitting module, and the light intensity detection module captures the optical signal of the reflected projection light beam on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU micro control unit for energy analysis, the MCU micro control unit controls the dynamic focusing module to focus the laser projection beam emitted by the second laser, and analyzes the energy signal fed back by the light intensity detection module in real time, and stops controlling the dynamic focusing module when the energy signal is the maximum value.

[0021] The present application has the following beneficial effects:

[0022] The present application provides a laser scanning and projection integrated system, which integrates laser scanning and projection functions in the same device, and realizes field consistency and function cooperation by sharing a two-dimensional galvanometer and an optical path. Through an efficient algorithm, point cloud data is quickly converted into a projectionable pattern file, realizing dynamic and real-time projection adjustment. The single optical path design not only reduces the complexity of optical components, but also improves the stability and reliability of the whole system. All functional modules are designed with high integration, and the device is small in size, light in weight, easy to carry and deploy. The device is compatible with multiple input data formats and supports wide application in the fields of architecture and industry. BRIEF DESCRIPTION OF DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings used in the description of the embodiments of the present application will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative effort on the basis of the contents of the embodiments of the present application and the drawings.

[0024] Figure 1 A schematic diagram of the composition principle of the laser scanning and projection integrated system according to Embodiment 1 of the present application is shown in the figure.

[0025] Figure 2 A flowchart of the overall control method of the laser scanning and projection integrated system according to Embodiment 2 of the present application is shown in the figure.

[0026] Figure 3 A flowchart of the laser scanning stage of the laser scanning and projection integrated system according to Embodiment 2 of the present application is shown in the figure.

[0027] Figure 4 A flowchart of the laser projection stage according to Embodiment 2 of the present application is shown in the figure.

[0028] In the figure:

[0029] 1-MCU micro control unit; 2-first laser; 3-second laser; 4-dynamic focusing module; 5-laser beam splitting module; 6-two-dimensional galvanometer module; 7-optical intensity detection module; 8-distance detection module; 9-upper computer; 10-target surface; 11-laser projection pattern. DETAILED DESCRIPTION

[0030] The present application will be further described in detail below in combination with the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present application, and not to limit the present application.

[0031] Embodiment 1

[0032] The present embodiment is a laser scanning and projection integrated system, as shown in the figure, which is composed of a MCU micro control unit 1, a first laser 2, a second laser 3, a dynamic focusing module 4, a laser beam splitting module 5, a two-dimensional galvanometer module 6, an optical intensity detection module 7, a distance detection module 8, and an upper computer 9. Figure 1 The first laser 2 serves as a scanning light source in the laser scanning stage, and the second laser 3 serves as a projection light source in the laser projection stage. The first laser 2 and the second laser 3 are respectively controlled to be turned on or turned off by the MCU micro control unit 1.

[0033]

[0034] ​In the laser scanning stage, the MCU micro-control unit 1 controls the first laser 2 to be turned on, and the laser scanning beam is emitted to the laser beam splitting module 5 after dynamic focusing by the dynamic focusing module 4. The laser scanning beam transmitted by the laser beam splitting module 5 enters the two-dimensional galvanometer module 6, which is controlled by the MCU micro-control unit 1 to control the deflection of the laser scanning beam, so that the laser scanning beam moves and scans on the target surface 10. The light intensity detection module 7 transmits the reflected laser beam signal on the target surface to the MCU micro-control unit 1. The reflected laser scanning beam on the target surface is reflected to the distance detection module 8 by the laser beam splitting module 5, and the processed data is transmitted to the MCU micro-control unit 1 by the distance detection module. The two-dimensional galvanometer module 6 simultaneously transmits the deflection angle data to the MCU micro-control unit 1.

[0035] In the laser projection stage, the MCU micro-control unit 1 controls the second laser 3 to be turned on, and the laser projection beam is emitted to the laser beam splitting module 5 after dynamic focusing by the dynamic focusing module 4. The light beam transmitted by the laser beam splitting module 5 enters the two-dimensional galvanometer module 6, which is controlled by the MCU micro-control unit 1 to control the swing of the laser projection beam, so that the laser projection beam generates a laser projection pattern 11 on the target surface. At the same time, the light intensity detection module 7 transmits the light intensity signal of the reflected laser beam on the target surface to the MCU micro-control unit 1. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the laser projection beam according to the light intensity signal of the light intensity detection module 7, and adjusts the definition of the laser projection pattern.

[0036] The host computer 9 and the MCU micro-control unit 1 perform bidirectional data transmission.

[0037] In this embodiment, the first laser 2 is used as the scanning light source in the laser scanning stage, and the wavelength is 1064nm.

[0038] In this embodiment, the second laser 3 is used as the projection light source in the laser projection stage, and the wavelength is different from that of the first laser 2, which is 532nm.

[0039] In this embodiment, the first laser 2 and the second laser cannot be turned on at the same time. In the scanning stage, the first laser 2 is turned on and the second laser 3 is turned off. In the projection stage, the first laser 2 is turned off and the second laser 3 is turned on.

[0040] In this embodiment, the dynamic focusing module 4 is used to focus the laser beam emitted by the first laser 2 or the second laser 3, so that the laser scanning beam or the laser projection beam is focused on the target surface 10, improving the scanning accuracy in the laser scanning stage and the projection definition in the projection stage.

[0041] In this embodiment, the laser beam splitting module 5 is used to emit the laser beam emitted by the first laser 2 or the second laser 3, and has no effect on the transmitted laser beam. When the system is in the laser scanning stage, the reflected light beam of the receiving target surface is reflected to the distance detection module 8, so that the system obtains the distance data in the scanning stage.

[0042] In this embodiment, the two-dimensional galvanometer module 6 is used to realize deflection control of the laser scanning beam and the laser projection beam. In the laser scanning stage, the laser scanning beam moves and scans on the target surface through the swing of the two-dimensional galvanometer, and the angle of the two-dimensional galvanometer is monitored in real time through the angle displacement sensor integrated in the two-dimensional galvanometer. The angle data is fed back to the MCU micro control unit 1 in real time. In the laser projection stage, the two-dimensional galvanometer swings under the control of the MCU micro control unit 1, so that the laser projection beam generates a laser projection pattern on the target surface.

[0043] In this embodiment, the light intensity detection module 7 captures the reflected laser beam on the target surface and converts the optical signal into an electrical signal, which is transmitted to the MCU micro control unit 1 for energy analysis. When the energy signal received by the light intensity detection module 7 is the maximum value, it is determined that the laser beam is accurately focused on the target surface at this time.

[0044] In this embodiment, the distance detection module 8 receives the reflected laser beam of the laser beam splitting module 5 in the laser scanning stage of the system, obtains the distance data of the laser scanning beam, and transmits it to the MCU micro control unit 1.

[0045] In this embodiment, the MCU micro control unit 1 is the core control unit of the system, which is responsible for coordinating the operation of the first laser 2, the second laser 3, the dynamic focusing module 4, the two-dimensional galvanometer module 6, the light intensity detection module 7, and the distance detection module 8, ensuring the synchronization of the scanning and projection processes, and transmitting data with the host computer 9, processing external input instructions such as user operation required projection image, and executing corresponding control logic. In the scanning process control, the MCU micro control unit 1 controls the first laser 2 to be turned on and the second laser 3 to be turned off. The MCU micro control unit 1 receives the two-dimensional galvanometer angle data collected by the two-dimensional galvanometer module 6 and the distance data collected by the distance detection module 8, obtains the spherical coordinates of the point cloud data of the target surface 10, and manages the storage and transmission of the point cloud data. The MCU micro control unit 1 transmits the collected scanning data to the host computer 9 for further processing. In the projection process control, the MCU micro control unit 1 controls the first laser 2 to be turned off and the second laser 3 to be turned on. The MCU micro control unit 1 receives the projection pattern data required by the user from the host computer 9, extracts the angle data in the spherical coordinates of the point cloud data, controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing according to the angle data, and makes the laser beam project according to the preset path, so as to ensure the accurate projection of the projection pattern.

[0046] In this embodiment, the host computer 9 and the MCU micro control unit 1 carry out data bidirectional transmission. In the laser scanning stage, the host computer 9 receives the spherical coordinates of the point cloud data of the target surface 10 processed by the MCU micro control unit 1, converts the spherical coordinates into three-dimensional coordinates, and the host computer 9 can be converted into a visual model, and according to the user's demand, add projection graphics; in the laser projection stage, the host computer 9 calculates the required projection graphics into three-dimensional point cloud data, and transmits the three-dimensional data to the MCU micro control unit 1 by converting the spherical coordinates, extracts the angle data in the spherical coordinates by the MCU micro control unit 1, controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing, and makes the laser projection beam project the projection graphics 11 required by the user on the target surface.

[0047] Embodiment 2

[0048] As shown in Figures 2 to 4 The embodiment is a control method of the laser scanning and projection integrated system as described in embodiment 1, which comprises:

[0049] In the laser scanning stage, the host computer 9 sends a laser scanning instruction to the MCU micro control unit 1, the MCU micro control unit 1 controls the first laser 2 to open and the second laser 3 to close, the first laser 2 emits a laser scanning beam, and the laser scanning beam moves and scans on the target surface through the swing of the two-dimensional galvanometer; the MCU micro control unit 1 receives the angle data of the two-dimensional galvanometer collected by the two-dimensional galvanometer module 6 and the distance data collected by the distance detection module 8, combines the distance data and the angle data to obtain the spherical coordinates p(α,β,d) of each scanning point of the target surface, generates and stores the spherical coordinates of the point cloud data of the target surface, and after the scanning is completed, transmits the point cloud data to the host computer 9, the host computer 9 converts the spherical coordinates of the point cloud data into three-dimensional space coordinates q(x,y,z), and the host computer 9 integrates each scanning point to form a three-dimensional model of the target surface;

[0050] In the laser projection stage, the host computer 9 sends a laser projection instruction to the MCU micro control unit 1, the MCU micro control unit 1 controls the first laser 2 to close and the second laser 3 to open, and the second laser 3 emits a laser projection beam; the host computer 9 converts the three-dimensional space coordinates of the projection graphics required to be projected into spherical coordinates, transmits the spherical coordinates to the MCU micro control unit 1, the MCU micro control unit 1 extracts the angle data in the spherical coordinates, controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing according to the angle data, and makes the laser beam project according to the preset path.

[0051] In this embodiment, in the laser scanning process, the light intensity detection module 7 captures the energy of the reflected scanning light beam on the target surface, and the light intensity detection module 7 converts the detected optical signal into an electrical signal and transmits it to the MCU micro-control unit 1, so that the MCU micro-control unit 1 can determine whether the laser beam is correctly focused on the target surface. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the scanning light beam emitted by the first laser 2, and simultaneously analyzes the energy signal fed back by the light intensity detection module 7 in real time. When the energy signal fed back by the light intensity detection module 7 is the maximum value, it indicates that the scanning light source emitted by the first laser 2 is focused on the target surface. At this time, the reflected scanning light beam is reflected to the distance detection module 8 through the laser beam splitting module 5.

[0052] Further, the distance detection module 8 converts the received optical signal into distance data of the scanning light beam and the target surface, obtains target distance data d, and transmits it to the MCU micro-control unit 1. The two-dimensional galvanometer module 6 can obtain the deflection angle data (α, β) of the galvanometer by using the internal integrated angle displacement sensor, and transmit the angle data to the MCU micro-control unit 1.

[0053] In this embodiment, in the laser projection stage, the scanning model can be modified in the host computer 9 according to the specific needs of the user, and the projection pattern required by the user on the target surface can be added.

[0054] In this embodiment, in the laser projection stage, the laser projection light beam obtains the projection pattern required by the user on the target surface after passing through the laser beam splitting module 5, and the light intensity detection module captures the optical signal of the reflected projection light beam on the target surface, converts the optical signal into an electrical signal, and transmits it to the MCU micro-control unit 1 for energy analysis. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the laser projection light beam emitted by the second laser 3, and analyzes the energy signal fed back by the light intensity detection module 7 in real time. When the energy signal is the maximum value, the control of the dynamic focusing module 4 is stopped. At this time, the laser projection pattern on the target surface has the highest definition, and the system completes the projection.

[0055] Although embodiments of the present application have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the application, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A laser scanning projection integrated system, characterized in that, It consists of an MCU microcontroller unit, a first laser, a second laser, a dynamic focusing module, a laser beam splitting module, a two-dimensional galvanometer module, a light intensity detection module, a distance detection module, and a host computer; The first laser serves as the scanning light source during the laser scanning stage, and the second laser serves as the projection light source during the laser projection stage. The first laser and the second laser are respectively controlled to be turned on or off by the MCU microcontroller unit. During the laser scanning phase, the MCU microcontroller unit controls the first laser to turn on. The laser scanning beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The laser scanning beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. Under the control of the MCU microcontroller unit, the two-dimensional galvanometer module controls the deflection of the laser scanning beam, so that the laser scanning beam moves and scans on the target surface. The light intensity detection module transmits the light intensity signal of the laser beam reflected on the target surface to the MCU microcontroller unit. The laser scanning beam reflected on the target surface is reflected by the laser beam splitting module to the distance detection module, and the distance detection module transmits the processed data to the MCU microcontroller unit. The two-dimensional galvanometer module also transmits the deflection angle data to the MCU microcontroller unit. During the laser projection stage, the MCU microcontroller unit controls the second laser to turn on. The laser projection beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module is controlled by the MCU microcontroller unit to control the swing of the laser projection beam, so that the laser projection beam produces a laser projection pattern on the target surface. At the same time, the light intensity detection module transmits the light intensity signal of the laser beam reflected from the target surface to the MCU microcontroller unit. The MCU microcontroller unit controls the dynamic focusing module to focus the laser projection beam according to the light intensity signal and adjust the clarity of the laser projection pattern. The host computer and the MCU microcontroller unit perform bidirectional data transmission; The light intensity detection module captures the light signal of the laser beam reflected from the target surface, converts the light signal into an electrical signal and transmits it to the MCU microcontroller unit for light intensity energy analysis. When the energy signal received by the light intensity detection module is at its maximum value, it is determined that the laser beam is precisely focused on the target surface at this time. During the laser scanning stage, the host computer receives the spherical coordinates of the target surface point cloud data processed by the MCU microcontroller unit, converts the spherical coordinates into three-dimensional coordinates, integrates them according to each scanning point to form a three-dimensional model of the target surface, and adds projection graphics according to user requirements. During the laser projection stage, the host computer solves the required projection graphics into three-dimensional point cloud data, converts the three-dimensional data into spherical coordinates and transmits it to the MCU microcontroller unit. The MCU microcontroller unit extracts the angle data in the spherical coordinates and controls the two-dimensional galvanometer module to swing, so that the laser projection beam projects the projection graphics required by the user onto the target surface.

2. The laser scanning projection integrated system as described in claim 1, characterized in that, The first laser and the second laser are not turned on at the same time. During the scanning phase, the first laser is turned on and the second laser is turned off. During the projection phase, the first laser is turned off and the second laser is turned on.

3. The laser scanning projection integrated system as described in claim 1, characterized in that, The wavelength of the first laser is different from that of the second laser.

4. The laser scanning projection integrated system as described in claim 1, characterized in that, The two-dimensional galvanometer module is used to control the deflection of the laser scanning beam and the laser projection beam. During the laser scanning stage, the laser scanning beam moves and scans the target surface by the swing of the two-dimensional galvanometer. The deflection angle of the two-dimensional galvanometer is monitored in real time by the angular displacement sensor integrated inside the two-dimensional galvanometer, and the deflection angle data is fed back to the MCU microcontroller unit in real time. During the laser projection stage, the two-dimensional galvanometer is controlled by the MCU microcontroller unit to swing, so that the laser projection beam produces a laser projection pattern on the target surface.

5. The control method for a laser scanning projection integrated system according to claim 1, characterized in that, include: Laser scanning stage: The host computer sends a laser scanning command to the MCU microcontroller unit. The MCU microcontroller unit controls the first laser to turn on and the second laser to turn off. The first laser emits a laser scanning beam, which moves and scans the target surface by the swing of the two-dimensional galvanometer. The MCU microcontroller unit receives the angle data of the two-dimensional galvanometer module and the distance data collected by the distance detection module. It combines the distance data and angle data to obtain the spherical coordinates of each scanning point on the target surface, generates the spherical coordinates of the point cloud data of the target surface, and stores them. After the scanning is completed, the point cloud data is transmitted to the host computer. The host computer converts the spherical coordinates of the point cloud data into three-dimensional spatial coordinates. The host computer integrates the data according to each scanning point to form a three-dimensional model of the target surface. Laser projection stage: The host computer sends a laser projection command to the MCU microcontroller unit. The MCU microcontroller unit controls the first laser to turn off and the second laser to turn on. The second laser emits a laser projection beam. The host computer converts the three-dimensional spatial coordinates of the projection graphic to be projected into spherical coordinates and transmits the spherical coordinates to the MCU microcontroller unit. The MCU microcontroller unit extracts the angle data from the spherical coordinates and controls the two-dimensional galvanometer module to swing according to the angle data, so that the laser beam is projected according to the preset path.

6. The control method for a laser scanning projection integrated system as described in claim 5, characterized in that, During the laser scanning phase, the light intensity detection module captures the energy of the optical signal reflected from the scanning beam on the target surface. The light intensity detection module converts the detected optical signal into an electrical signal and transmits it to the MCU microcontroller unit. The MCU microcontroller unit determines whether the laser beam is correctly focused on the target surface. The MCU microcontroller unit controls the dynamic focusing module to focus the scanning beam emitted by the first laser. At the same time, it analyzes the energy signal fed back by the light intensity detection module in real time. When the energy signal fed back by the light intensity detection module is at its maximum value, it indicates that the scanning light source emitted by the first laser has been focused on the target surface. At this time, the reflected scanning beam is reflected to the distance detection module through the laser beam splitting module.

7. The control method for a laser scanning projection integrated system as described in claim 5, characterized in that, In the laser projection stage, the laser projection beam passes through the laser beam splitting module and obtains the laser projection pattern required by the user on the target surface. At the same time, the light intensity detection module captures the light signal of the projection beam reflected from the target surface, converts the light signal into an electrical signal, and transmits it to the MCU microcontroller unit for energy analysis. The MCU microcontroller unit controls the dynamic focusing module to focus the laser projection beam emitted by the second laser and analyzes the energy signal returned by the light intensity detection module in real time. When the energy signal reaches its maximum value, the control of the dynamic focusing module is stopped.

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