Radio frequency test equipment convenient to adjust

Abstract

The invention relates to the technical field of chip radio frequency testing, and discloses radio frequency testing equipment convenient to adjust, which comprises a testing table, a threaded rod I is rotatably connected in the testing table, the outer wall of the threaded rod I is in threaded connection with a lifting plate, and the outer wall of the threaded rod I is fixedly connected with a bevel gear I; a test box is fixedly connected to the upper surface of the lifting plate, a display screen is arranged on the upper surface of the test box, a microscopic camera is arranged on the lower surface of the display screen, a radio frequency interface is fixedly connected to the outer wall of the test box, and one end of a cable is fixedly connected to the interior of the radio frequency interface; and the other end of the cable is fixedly connected with a radio frequency test probe. Through synchronous rotation of the first threaded rods on the two sides of the lifting plate, it can be ensured that movement on the two sides is kept consistent, so that vertical movement of the radio frequency test probe is ensured, the test precision is improved, and test errors or poor contact between the radio frequency test probe and a test point caused by asymmetric movement are avoided.

Description

Technical Field

[0001] The present invention relates to the technical field of chip radio frequency testing, in particular to a radio frequency testing device which is easy to adjust. Background Art

[0002] RF test equipment is widely used in wireless communications, electronic product design, radio and television, radar technology, medical equipment, and scientific research. These devices ensure the performance and reliability of RF systems by providing precise frequency and signal testing.

[0003] In the prior art, it is necessary to manually adjust the lifting screws on both sides of the equipment to lift synchronously so that the RF test probe can move downward. It is difficult to manually adjust the lifting screws on both sides to achieve completely synchronous lifting. Even a slight asynchrony may cause uneven force on the RF test probe, which may affect the contact effect between the probe and the chip under test, making the contact unstable and resulting in inaccurate test data. Summary of the invention

[0004] In view of the shortcomings of the prior art, the present invention provides an easily adjustable RF testing device, which solves the problem that it is difficult to achieve completely synchronous lifting and lowering of the lifting screws on both sides through manual adjustment, resulting in uneven force on the RF test probes, which may affect the contact effect between the probes and the chip under test, making the contact unstable and leading to inaccurate test data.

[0005] To achieve the above objectives, the present invention is implemented through the following technical solutions: an easily adjustable radio frequency testing device, comprising a test bench, a threaded rod 1 is rotatably connected inside the test bench, a lifting plate is threadedly connected to the outer wall of the threaded rod 1, a bevel gear 1 is fixedly connected to the outer wall of the threaded rod 1, a test box is fixedly connected to the upper surface of the lifting plate, a display screen is arranged on the upper surface of the test box, a microscopic camera is arranged on the lower surface of the display screen, a radio frequency interface is fixedly connected to the outer wall of the test box, one end of a cable is fixedly connected to the inside of the radio frequency interface, a radio frequency test probe is fixedly connected to the other end of the cable, the outer wall of the radio frequency test probe is fixedly connected to the inside of the test box, a moving mechanism is arranged on the upper surface of the test bench, a chip carrier is arranged on the upper surface of the moving mechanism, a rotating mechanism is arranged on the upper surface of the lifting plate, and an adjustment mechanism is arranged on the upper surface of the lifting plate.

[0006] Preferably, the adjusting mechanism includes a support frame, the lower surface of the support frame is fixedly connected to the upper surface of the lifting plate, the outer wall of the support frame is provided with an oblique groove, the interior of the support frame is slidably connected with a sliding rod 1, the outer wall of the sliding rod 1 is fixedly connected with a rack 1, the tooth end of the rack 1 is meshingly connected with a circular gear, the interior of the circular gear is fixedly connected with a rotating column, the outer wall of the rotating column is rotatably connected to the interior of the support frame, the outer wall of the rotating column is fixedly connected with a bevel gear 2, the outer wall of the bevel gear 2 is meshingly connected with the outer wall of the bevel gear 1, and the outer wall of the sliding rod 1 is fixedly connected with a movable plate 1.

[0007] Preferably, the moving mechanism also includes a sliding rod 2, the outer wall of which is slidably connected to the inside of the support frame, the outer wall of which is fixedly connected to a rack 2, the outer wall of which is meshingly connected to the outer wall of the circular gear, and the outer wall of which is fixedly connected to a moving plate 2.

[0008] Preferably, the adjustment mechanism includes a fixed plate, the lower surface of the fixed plate is fixedly connected to the upper surface of the lifting plate, the internal thread of the fixed plate is connected with an adjustment thread, the outer wall of the adjustment thread is fixedly connected with a hand wheel, and the outer wall of the adjustment thread is threadedly connected to the interior of movable plate 2.

[0009] Preferably, the adjustment mechanism further comprises a limiting rod, an outer wall of which is fixedly connected to the inside of the fixed plate, and an outer wall of which is slidably connected to the inside of the second movable plate.

[0010] Preferably, the moving mechanism includes a support table, an outer wall of the support table is fixedly connected to the outer wall of the test table, the upper surface of the support table is fixedly connected with a slide rail 1, the outer wall of the slide rail 1 is slidably connected with a moving plate 3, the upper surface of the support table is fixedly connected with a fixed block 1, the outer wall of the fixed block 1 is fixedly connected with a motor 1, the output end of the motor 1 is rotatably connected to the inside of the fixed block 1 and fixedly connected to a threaded rod 2, the outer wall of the threaded rod 2 is rotatably connected to the inside of the fixed block 1, and the outer wall of the threaded rod 2 is threadedly connected to the inside of the moving plate 3.

[0011] Preferably, the moving mechanism also includes a slide rail 2, the lower surface of the slide rail 2 is fixedly connected to the upper surface of the moving plate 3, the outer wall of the slide rail 2 is slidably connected to the inner wall of the chip carrier, the upper surface of the moving plate 3 is fixedly connected to a fixed block 2, the outer wall of the fixed block 2 is fixedly connected to a motor 2, the output end of the motor 2 is rotatably connected to the inside of the fixed block 2 and fixedly connected to a threaded rod 3, the outer wall of the threaded rod 3 is rotatably connected to the inside of the fixed block 2, and the outer wall of the threaded rod 3 is threadedly connected to the inside of the chip carrier.

[0012] Preferably, the outer wall of the sliding rod 1 is fixedly connected with a moving block, and the interior of the moving block is slidably connected with a sliding bar.

[0013] Preferably, the outer wall of the sliding bar is fixedly connected with a round pin, and the outer wall of the round pin is slidably connected to the inner wall of the inclined groove.

[0014] Preferably, an outer wall of the sliding bar is fixedly connected to an L-shaped connecting frame, and an outer wall of the L-shaped connecting frame is fixedly connected to a sunshade.

[0015] Working principle: When in use, the hand-turned wheel is used to rotate the adjusting thread to cause the moving plate 2 to move. The movement of the moving plate 2 drives the sliding rod 2 to move and causes the rack 2 to move. The movement of the rack 2 causes the circular gear to rotate, and then the circular gear drives the rotating column to rotate inside the support frame and drives the bevel gear 2 to rotate. When the bevel gear 2 rotates, it drives the threaded rod 1 to rotate inside the lifting plate and the test bench through the bevel gear 1. During the rotation of the threaded rod 1, the threaded rod 1 will drive the test box to move downward through the lifting plate, and then the test box drives the RF test probe to move downward and contact the chip placed on the chip carrier. During the downward movement of the lifting plate, the threaded rods 1 on both sides of the lifting plate rotate synchronously to ensure that the movement of both sides is consistent, thereby ensuring the vertical movement of the RF test probe, which helps to improve the test accuracy and avoid test errors caused by asymmetric movement or poor contact between the RF test probe and the test point.

[0016] During the rotation of the circular gear, the rotation of the circular gear causes the rack 1 to passively move, driving the sliding rod 1 to slide inside the support frame. During the movement of the sliding rod 1, the sliding rod 1 will drive the moving block to move, and then the moving block drives the round pin through the sliding bar to slide in the inner wall of the inclined groove opened on the outer wall of the support frame, so that the round pin pulls the sliding bar to move downward and slide inside the moving block. During the downward and inward movement of the sliding bar, the light shielding plate is driven downward and inward by the L-shaped connecting frame to form a certain degree of closure on the chip detection area, which can effectively isolate unnecessary light sources, thereby reducing or eliminating light interference and ensuring the accuracy of the test results.

[0017] When adjusting the position of the chip placed in the chip carrier, the lateral position of the chip carrier can be adjusted by starting motor 1 to cause threaded rod 2 to rotate inside movable plate 3, and the longitudinal position of the chip carrier can be adjusted by starting motor 2 to cause the adjustment thread to rotate inside the chip carrier. By combining the lateral and longitudinal position adjustments of the chip carrier, operational efficiency is improved, human errors are reduced, and more precise contact between the chip and the RF test probe can be ensured.

[0018] The present invention provides a radio frequency testing device that is easy to adjust and has the following beneficial effects: 1. In the process of the lifting plate moving downward in the present invention, the threaded rods on both sides of the lifting plate rotate synchronously, which can ensure that the movement of both sides remains consistent, thereby ensuring the vertical movement of the RF test probe, helping to improve the accuracy of the test and avoiding test errors caused by asymmetric movement or poor contact between the RF test probe and the test point.

[0019] 2. In the present invention, when the sliding bar moves downward and inward, the L-shaped connecting frame drives the shading plate to move downward and inward to form a certain degree of closure on the chip detection area, which can effectively isolate unnecessary light sources, thereby reducing or eliminating light interference and ensuring the accuracy of the test results.

[0020] 3. The present invention combines the lateral and longitudinal position adjustments of the chip carrier to improve operational efficiency, reduce human errors, and ensure more precise contact between the chip and the RF test probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A perspective view of the present invention; Figure 2 It is a schematic diagram of the partial structure of the lifting plate of the present invention; Figure 3 for Figure 2 The enlarged schematic diagram at A in the middle; Figure 4 It is a schematic diagram of the local structure of the test bench of the present invention; Figure 5 for Figure 4 The enlarged schematic diagram of point B in the middle; Figure 6 It is a schematic diagram of the local structure of the support platform of the present invention; Figure 7 It is a schematic diagram of the local structure of the moving block of the present invention; Figure 8 It is a schematic diagram of the local structure of the movable plate 2 of the present invention.

[0022] Among them, 1. Test bench; 2. Light-shielding plate; 3. Lifting plate; 4. First threaded rod; 5. First bevel gear; 6. Test box; 7. Display screen; 8. Microscopic camera; 9. RF interface; 10. Cable; 11. RF test probe; 12. L-shaped connecting frame; 13. Chip carrier; 14. Support frame; 15. First sliding rod; 16. First rack; 17. Round gear; 18. Rotating column; 19. Second bevel gear; 20. Second rack; 21. Second sliding rod; 22. First moving plate; 23. Second moving plate; 24. Fixed plate; 25. Adjusting thread; 26. Handwheel; 27. Limit rod; 28. Support table; 29. First slide rail; 30. First fixing block; 31. First motor; 32. Second threaded rod; 33. Second fixing block; 34. Second motor; 35. Third threaded rod; 36. Second slide rail; 37. Third moving plate; 38. Inclined slot; 39. Moving block; 40. Round pin; 41. Sliding strip. Detailed implementation manners

[0023] The technical solutions of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0024] Please refer to the attached Figure 1 -attached Figure 5 , an embodiment of the present invention provides a radio frequency test device that is easy to adjust, including a test bench 1. A first threaded rod 4 is rotatably connected inside the test bench 1. A lifting plate 3 is threadedly connected to the outer wall of the first threaded rod 4. A first bevel gear 5 is fixedly connected to the outer wall of the first threaded rod 4. A test box 6 is fixedly connected to the upper surface of the lifting plate 3. A display screen 7 is arranged on the upper surface of the test box 6. A microscopic camera 8 is arranged on the lower surface of the display screen 7. An RF interface 9 is fixedly connected to the outer wall of the test box 6. One end of a cable 10 is fixedly connected inside the RF interface 9. The other end of the cable 10 is fixedly connected to an RF test probe 11. The outer wall of the RF test probe 11 is fixedly connected inside the test box 6. A moving mechanism is arranged on the upper surface of the test bench 1. A chip carrier 13 is arranged on the upper surface of the moving mechanism. A rotating mechanism is arranged on the upper surface of the lifting plate 3. An adjusting mechanism is arranged on the upper surface of the lifting plate 3.

[0025] Specifically, the display screen 7 is used to observe the contact between the RF test probe 11 and the chip through the microscopic camera 8. The RF interface 9 is connected to the RF test probe 11 through the cable 10. When the chip is tested, the microscopic camera 8 will provide a light source for accurately observing the contact between the RF test probe 11 and the chip. The RF test probe 11 contacts the chip and outputs the detection signal through the cable 10 and the RF interface 9. The moving mechanism is used to detect different ranges of the chip by adjusting the position of the chip carrier 13. The adjustment mechanism and the rotating structure can cause the lifting plate 3 to drive the test box 6 to move up and down, so that the RF test probe 11 contacts the chip to achieve detection.

[0026] Please see attached Figure 4 - Attachment Figure 5 The adjusting mechanism includes a support frame 14, the lower surface of the support frame 14 is fixedly connected to the upper surface of the lifting plate 3, the outer wall of the support frame 14 is provided with an oblique groove 38, the interior of the support frame 14 is slidably connected with a sliding rod 15, the outer wall of the sliding rod 15 is fixedly connected with a rack 16, the tooth end of the rack 16 is meshingly connected with a circular gear 17, the interior of the circular gear 17 is fixedly connected with a rotating column 18, the outer wall of the rotating column 18 is rotatably connected to the interior of the support frame 14, the outer wall of the rotating column 18 is fixedly connected with a bevel gear 2 19, the outer wall of the bevel gear 2 19 is meshingly connected with the outer wall of the bevel gear 5, and the outer wall of the sliding rod 15 is fixedly connected with a moving plate 22; the moving mechanism also includes a sliding rod 21, the outer wall of the sliding rod 21 is slidably connected to the interior of the support frame 14, the outer wall of the sliding rod 21 is fixedly connected with a rack 20, the outer wall of the rack 20 is meshingly connected with the outer wall of the circular gear 17, and the outer wall of the sliding rod 21 is fixedly connected with a moving plate 23.

[0027] Specifically, when the sliding rod 15 moves, it will slide inside the support frame 14, and the support frame 14 can support the movement of the sliding rod 15. When the sliding rod 21 moves, it will slide inside the support frame 14, and the support frame 14 can support the movement of the sliding rod 21. When the sliding rod 21 drives the rack 20 to move, the rack 20 will cause the circular gear 17 to move and cause the circular gear 17 to drive the rotating column 18 to rotate inside the support frame 14 and drive the circular gear 17 to rotate. The rotation of the circular gear 17 can drive the threaded rod 14 to rotate inside the lifting plate 3 through the rotation of the bevel gear 15. The mutual cooperation between the bevel gear 219 and the bevel gear 15 can convert the rotational motion of the rotating column 18 into the rotational motion of the threaded rod 14.

[0028] Please see attached Figure 1 and attached Figure 5, the adjusting mechanism includes a fixing plate 24, the lower surface of the fixing plate 24 is fixedly connected to the upper surface of the lifting plate 3, an adjusting screw thread 25 is threadedly connected inside the fixing plate 24, a handwheel 26 is fixedly connected to the outer wall of the adjusting screw thread 25, and the outer wall of the adjusting screw thread 25 is threadedly connected inside the second moving plate 23; the adjusting mechanism further includes a limiting rod 27, the outer wall of the limiting rod 27 is fixedly connected inside the fixing plate 24, and the outer wall of the limiting rod 27 is slidably connected inside the second moving plate 23.

[0029] Specifically, the function of the adjusting mechanism is to cause the second moving plate 23 to move. Specifically, by rotating the handwheel 26, the adjusting screw thread 25 is driven to rotate inside the second moving plate 23 and the fixing plate 24. During the process of the adjusting screw thread 25 rotating inside the second moving plate 23, it will cause the second moving plate 23 to move and slide on the outer wall of the limiting rod 27. The limiting rod 27 therein is used to limit the second moving plate 23.

[0030] Please refer to the appendix Figure 1 and the appendix Figure 6 , the moving mechanism includes a support platform 28, the outer wall of the support platform 28 is fixedly connected to the outer wall of the test bench 1, a first slide rail 29 is fixedly connected to the upper surface of the support platform 28, a third moving plate 37 is slidably connected to the outer wall of the first slide rail 29, a first fixing block 30 is fixedly connected to the upper surface of the support platform 28, a first motor 31 is fixedly connected to the outer wall of the first fixing block 30, the output end of the first motor 31 is rotatably connected inside the first fixing block 30 and fixedly connected to a second threaded rod 32, the outer wall of the second threaded rod 32 is rotatably connected inside the first fixing block 30, and the outer wall of the second threaded rod 32 is threadedly connected inside the third moving plate 37; the moving mechanism further includes a second slide rail 36, the lower surface of the second slide rail 36 is fixedly connected to the upper surface of the third moving plate 37, the outer wall of the second slide rail 36 is slidably connected to the inner wall of the chip carrier 13, a second fixing block 33 is fixedly connected to the upper surface of the third moving plate 37, a second motor 34 is fixedly connected to the outer wall of the second fixing block 33, the output end of the second motor 34 is rotatably connected inside the second fixing block 33 and fixedly connected to a third threaded rod 35, the outer wall of the third threaded rod 35 is rotatably connected inside the second fixing block 33, and the outer wall of the third threaded rod 35 is threadedly connected inside the chip carrier 13.

[0031] Specifically, the function of the moving mechanism is to adjust the position of the chip carrier 13 and thus adjust the position of the chip in the chip carrier 13, so as to realize multi-range detection of multiple chips. In the process of starting the motor 1 31, the output end of the motor 1 31 will rotate and connect to the inside of the fixed block 1 30 and cause the threaded rod 2 32 to rotate and rotate inside the fixed block 1 30. In the process of the threaded rod 2 32 rotating, the threaded rod 2 32 will rotate inside the moving plate 3 37 and cause the moving plate 3 37 to move horizontally and slide on the outer wall of the slide rail 1 29. The slide rail 1 29 is used to limit and guide the moving plate 3 37, and ensure that the moving plate 3 37 keeps moving horizontally and linearly during the movement of the moving plate 3 37. Starting the motor 2 34 causes the output end of the motor 2 34 to rotate on the fixed block 2 33 and drive the threaded rod 3 35 to rotate. When the threaded rod 3 35 rotates, it rotates inside the chip carrier 13 and causes the chip carrier 13 to move and slide on the outer wall of the slide rail 2 36 and move longitudinally. The slide rail 2 36 is used to limit and guide the chip carrier 13. By moving the chip carrier 13 longitudinally and transversely, the transverse and longitudinal positions of the chip can be adjusted.

[0032] Please see attached Figure 1 , Attachment Figure 7 and attached Figure 8 The outer wall of the sliding rod 15 is fixedly connected to a moving block 39, and the interior of the moving block 39 is slidably connected to a sliding bar 41; the outer wall of the sliding bar 41 is fixedly connected to a round pin 40, and the outer wall of the round pin 40 is slidably connected to the inner wall of the inclined groove 38; the outer wall of the sliding bar 41 is fixedly connected to an L-shaped connecting frame 12, and the outer wall of the L-shaped connecting frame 12 is fixedly connected to the shading plate 2.

[0033] Specifically, during the movement of the sliding rod 15, the movement of the sliding rod 15 will drive the sliding bar 41 to move through the moving block 39. When the sliding bar 41 moves, the round pin 40 slides on the inner wall of the inclined groove 38 opened on the outer wall of the support frame 14, thereby causing the round pin 40 to move downward. When the round pin 40 moves downward, it pulls the sliding bar 41 to move downward and slide inside the moving block 39, thereby causing the sliding bar 41 to drive the shading plate 2 to move downward and inward through the L-shaped connecting frame 12 to form a certain degree of shading for detection needs.

[0034] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A radio frequency test device that is easy to adjust, comprising a test bench (1), characterized in that: The test bench (1) is rotatably connected to a threaded rod (4) inside, the outer wall of the threaded rod (4) is threadedly connected to a lifting plate (3), the outer wall of the threaded rod (4) is fixedly connected to a bevel gear (5), the upper surface of the lifting plate (3) is fixedly connected to a test box (6), the upper surface of the test box (6) is provided with a display screen (7), the lower surface of the display screen (7) is provided with a microscopic camera (8), the outer wall of the test box (6) is fixedly connected to a radio frequency interface (9), one end of a cable (10) is fixedly connected inside the radio frequency interface (9), the other end of the cable (10) is fixedly connected to a radio frequency test probe (11), the outer wall of the radio frequency test probe (11) is fixedly connected to the inside of the test box (6), the upper surface of the test bench (1) is provided with a moving mechanism, the upper surface of the moving mechanism is provided with a chip carrier (13), the upper surface of the lifting plate (3) is provided with a rotating mechanism, and the upper surface of the lifting plate (3) is provided with an adjusting mechanism.

2. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The adjustment mechanism comprises a support frame (14), the lower surface of the support frame (14) is fixedly connected to the upper surface of the lifting plate (3), the outer wall of the support frame (14) is provided with an inclined groove (38), the interior of the support frame (14) is slidably connected to a sliding rod (15), the outer wall of the sliding rod (15) is fixedly connected to a rack (16), the tooth end of the rack (16) is meshingly connected to a circular gear (17), the interior of the circular gear (17) is fixedly connected to a rotating column (18), the outer wall of the rotating column (18) is rotatably connected to the interior of the support frame (14), the outer wall of the rotating column (18) is fixedly connected to a bevel gear (19), the outer wall of the bevel gear (19) is meshingly connected to the outer wall of the bevel gear (5), and the outer wall of the sliding rod (15) is fixedly connected to a moving plate (22).

3. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The moving mechanism also includes a second sliding rod (21), the outer wall of which is slidably connected to the inside of the support frame (14), the outer wall of which is fixedly connected to a second rack (20), the outer wall of which is meshingly connected to the outer wall of the circular gear (17), and the outer wall of which is fixedly connected to a second moving plate (23).

4. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The adjustment mechanism comprises a fixed plate (24), the lower surface of the fixed plate (24) is fixedly connected to the upper surface of the lifting plate (3), the internal thread of the fixed plate (24) is connected to an adjustment thread (25), the outer wall of the adjustment thread (25) is fixedly connected to a hand wheel (26), and the outer wall of the adjustment thread (25) is threadedly connected to the inside of the second movable plate (23).

5. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The adjustment mechanism further comprises a limiting rod (27), the outer wall of which is fixedly connected to the inside of the fixed plate (24), and the outer wall of which is slidably connected to the inside of the second movable plate (23).

6. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The moving mechanism comprises a support platform (28), the outer wall of the support platform (28) is fixedly connected to the outer wall of the test platform (1), the upper surface of the support platform (28) is fixedly connected to a slide rail 1 (29), the outer wall of the slide rail 1 (29) is slidably connected to a moving plate 3 (37), the upper surface of the support platform (28) is fixedly connected to a fixed block 1 (30), the outer wall of the fixed block 1 (30) is fixedly connected to a motor 1 (31), the output end of the motor 1 (31) is rotatably connected to the inside of the fixed block 1 (30) and is fixedly connected to a threaded rod 2 (32), the outer wall of the threaded rod 2 (32) is rotatably connected to the inside of the fixed block 1 (30), and the outer wall of the threaded rod 2 (32) is threadedly connected to the inside of the moving plate 3 (37).

7. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The moving mechanism also includes a slide rail 2 (36), the lower surface of which is fixedly connected to the upper surface of a moving plate 3 (37), the outer wall of which is slidably connected to the inner wall of a chip carrier (13), the upper surface of the moving plate 3 (37) is fixedly connected to a fixed block 2 (33), the outer wall of which is fixedly connected to a motor 2 (34), the output end of which is rotatably connected to the interior of the fixed block 2 (33) and fixedly connected to a threaded rod 3 (35), the outer wall of which is rotatably connected to the interior of the fixed block 2 (33), and the outer wall of which is threadably connected to the interior of the chip carrier (13).

8. The easily adjustable radio frequency testing device according to claim 1, characterized in that: The outer wall of the sliding rod 1 (15) is fixedly connected to a moving block (39), and the interior of the moving block (39) is slidably connected to a sliding bar (41).

9. The easily adjustable radio frequency testing device according to claim 8, characterized in that: The outer wall of the sliding bar (41) is fixedly connected to a round pin (40), and the outer wall of the round pin (40) is slidably connected to the inner wall of the inclined groove (38).

10. The easily adjustable radio frequency testing device according to claim 8, characterized in that: The outer wall of the sliding bar (41) is fixedly connected to an L-shaped connecting frame (12), and the outer wall of the L-shaped connecting frame (12) is fixedly connected to a sunshade (2).

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