Ship-based electronic compression system reliability index verification method and system, and storage medium

Abstract

The invention provides a ship-borne electronic compression system reliability index verification method and system and a storage medium. The ship-borne electronic compression system reliability index verification method comprises the steps that basic information of a ship-borne electronic compression system is acquired; acquiring an external input requirement of the ship-borne electronic compression system, and judging whether reliability evaluation is needed or not according to the external input requirement; when reliability evaluation does not need to be carried out, reliability index verification is carried out based on an L-M method; when reliability evaluation needs to be carried out, judging whether the reliability distribution result is confirmed through evaluation; when the reliability distribution result is not reviewed and confirmed, reliability index verification is carried out based on the compression ratio K; and when the reliability distribution result is reviewed and confirmed, reliability index verification is carried out based on reliability model backstepping. Through the technical scheme provided by the invention, while the product reliability index verification is completed, the test time is shortened, the test cost of a development unit is reduced, and the development progress of equipment is guaranteed.

Description

Technical Field

[0001] The present application belongs to the technical field of reliability index verification, and in particular, relates to a reliability index verification method and system, and a storage medium for a shipborne electronic compact system. Background Art

[0002] Reliability index verification test is an important task in the development stage of shipborne electronic systems. Mean time between failures (MTBF) is a common index of shipborne electronic systems, which strictly corresponds to the components of the system. In the development process of shipborne electronic systems, there are usually two forms: prototype and equipment. The prototype is usually fully functional, and the number of components is less than that of the equipment, thus forming a shipborne electronic compact system. Traditionally, the reliability index verification test of shipborne electronic systems is mainly carried out according to the reliability index requirements of the equipment and the risks of the user, and the appropriate timed truncation test scheme is selected. Since the reliability index is proposed for the equipment, the actual test is carried out on the prototype, and the index verification cannot be completed by strictly following the selected timed truncation test scheme. As a complex giant system, the shipborne platform is limited by the impact of development funds, and usually only compact systems can be used for testing during the development stage. At present, the mean time between failures (MTBF) requirements of the reliability index of shipborne electronic systems are very high. The conventional reliability index verification method of shipborne electronic compact systems has the problems of long test time, high test funds, and affecting the development progress. Summary of the invention

[0003] This application aims to solve or improve the above technical problems.

[0004] To this end, an embodiment of the present application provides a method for verifying reliability indicators of a shipborne electronic compact system.

[0005] The embodiment of the present application also provides a shipborne electronic compact system reliability index verification system.

[0006] The embodiment of the present application also provides a shipborne electronic compact system reliability index verification system.

[0007] The embodiment of the present application also provides a readable storage medium.

[0008] To achieve the above-mentioned purpose, an embodiment of the present application provides a reliability index verification method for a shipborne electronic compact system, comprising: obtaining basic information of the shipborne electronic compact system, the basic information including mean time between failures, compact ratio, duration of a mission profile of the shipborne electronic system, and confidence; obtaining external input requirements of the shipborne electronic compact system, and judging whether reliability assessment is required according to the external input requirements; when reliability assessment is not required, performing reliability index verification based on a test time determination method of the LM method; when reliability assessment is required, judging whether a reliability allocation result has been reviewed and confirmed; when the reliability allocation result has not been reviewed and confirmed, performing reliability index verification based on a test time determination method of the compact ratio K; when the reliability allocation result has been reviewed and confirmed, performing reliability index verification based on a test time determination method of the reliability model inverse method.

[0009] According to the reliability index verification method of the shipborne electronic compact system provided by the present application, firstly, the basic information of the shipborne electronic compact system is obtained, and the basic information includes the reliability index of the shipborne electronic system, the compact ratio, the duration of the mission profile of the shipborne electronic system, and the confidence level required for verifying the reliability index, and the reliability index is the mean time between failures. Then, the external input requirements of the shipborne electronic compact system are obtained, and it is determined whether a reliability assessment is required based on the external input requirements. When a reliability assessment is not required, the reliability index is verified based on the test time determination method of the LM method. When a reliability assessment is required, it is determined whether the reliability allocation result has been reviewed and confirmed. When the reliability allocation result has not been reviewed and confirmed, the reliability index is verified based on the test time determination method of the compact ratio K. When the reliability allocation result has been reviewed and confirmed, the reliability index is verified based on the test time determination method of the reliability model inverse. Through the reliability index verification method of the shipborne electronic compact system provided in the present application, it is possible to fully utilize the number of equipment of the shipborne electronic compact system in the development stage without increasing the number of each component equipment, adopt the LM method, the compact ratio K and the reliability distribution result inverse method, consider the external input requirements and the reliability distribution result, realize the reliability index verification of the shipborne electronic system, and while completing the product reliability index verification, shorten the test time, reduce the test cost of the development unit, and ensure the development progress of the equipment.

[0010] Among them, the LM (Levenberg-Marquardt) method is a method for least squares estimation of nonlinear regression parameters. The LM method combines the advantages of the steepest descent method and the linearization method (Taylor series). It is suitable for situations where the parameter estimate is far from the optimal value or close to the optimal value, so that the optimal solution can be found quickly.

[0011] In addition, the technical solution provided by this application may also have the following additional technical features:

[0012] In some technical solutions, optionally, basic information of a shipborne electronic compression system is obtained, including: obtaining reliability indicators of the shipborne electronic system, duration of a mission profile of the shipborne electronic system, and confidence, the reliability indicators including the mean time between failures; obtaining equipment of the shipborne electronic compression system, the number of corresponding equipment of the equipment, and the number of corresponding prototypes of the equipment; and obtaining a compression ratio of the equipment according to the number of corresponding equipment and the number of corresponding prototypes.

[0013] In this technical solution, the basic information of the shipborne electronic compact system is obtained by first obtaining the reliability index, the duration of the mission profile of the shipborne electronic system and the confidence level, wherein the reliability index includes the mean time between failures. Then, the equipment of the shipborne electronic compact system, the number of equipment corresponding to the equipment and the number of prototypes corresponding to the equipment are obtained. Finally, the compact ratio of the equipment is obtained according to the number of equipment corresponding to the number of prototypes. Specifically, it is known that the reliability index of a certain shipborne electronic system is MTBF=θ, which is composed of equipment A1, A2, ..., An, and the corresponding numbers of its equipment (system) are N1, N2, ..., Nn respectively, and the corresponding numbers of prototypes (compact systems) are M1, M2, ..., Mn respectively. The compact ratio Ki=Ni / Mi of each component equipment A1~An, the duration of the mission profile of the shipborne electronic system is T0, and the confidence level required for verifying the reliability index is C.

[0014] In some technical solutions, optionally, a test time determination method based on the LM method is used to verify the reliability index, including: determining a test plan based on the allowable number of failures, and determining a coefficient based on the test plan; obtaining the required reliability test time based on the reliability index and the coefficient; obtaining an estimated lower limit of the mean failure interval time of the shipborne electronic system through the LM method based on the required reliability test time, the compression ratio, the duration of the mission profile of the shipborne electronic system, and the confidence level; judging whether the requirements are met based on the estimated lower limit of the mean failure interval time and the reliability index.

[0015] In this technical solution, the reliability index verification is performed based on the test time determination method of the LM method. Specifically, the test plan is first determined according to the allowable number of failures, and the coefficient is determined according to the test plan. Then, the required reliability test time is obtained according to the reliability index and the coefficient. According to the required reliability test time, the compression ratio, the duration of the mission profile of the shipborne electronic system, and the confidence level, the lower limit estimate of the mean failure interval time of the shipborne electronic system is obtained by the LM method. Finally, it is judged whether the requirements are met based on the lower limit estimate of the mean failure interval time and the reliability index, thereby realizing the reliability index verification.

[0016] In some technical solutions, optionally, the calculation formula of the estimated value of the lower limit of the mean time between failures is:

[0017] The reliability test time should be:

[0018] T1 = ε × MTBF = ε × θ;

[0019] Wherein, T1 is the required reliability test time, ε is the coefficient, MTBF = θ is the reliability index, the compression ratio of the equipment A1, A2, ..., An of the shipborne electronic system is K1, K2, ..., Kn, the actual test time of the equipment A1, A2, ..., An of the shipborne electronic system is T11 = K1 × T1, T12 = K2 × T1, ..., T1n = Kn × T1, the equivalent task number of the equipment A1, A2, ..., An of the shipborne electronic system is η1 = T11 / T0, η2 = T12 / T0, ..., ηn = T1n / T0, T0 is the duration of the mission profile of the shipborne electronic system, the LM method is used to carry out reliability assessment, and the sample number of the equipment A1, A2, ..., An of the shipborne electronic system is (η1, 0), (η2, 0), ..., (ηn, 0);

[0020]

[0021] Among them, R L is reliability, C is confidence, MTBF L is the estimated value of the lower limit of the mean time between failures, Q is the number of equivalent tasks of the shipborne electronic system, f is the number of mission failures of the shipborne electronic system in Q tests, T0 is the duration of the mission profile of the shipborne electronic system, η i is the equivalent task number of equipment Ai of the shipborne electronic system, and n is the number of equipment in the shipborne electronic system.

[0022] In this technical solution, by using the LM method to carry out reliability assessment, the estimated lower limit of the mean failure interval time can be obtained, thereby realizing reliability indicator verification.

[0023] In some technical solutions, optionally, a test time determination method based on the compression ratio K is used to verify the reliability index, including: determining a test plan according to an allowable number of failures, and determining a coefficient according to the test plan; obtaining a required reliability test time according to the reliability index and the coefficient; obtaining the actual test time of multiple devices according to the required reliability test time and the compression ratio of multiple devices of the shipborne electronic compression system; and obtaining the reliability test time according to the maximum value of multiple actual test times.

[0024] In this technical solution, the reliability index is verified by the test time determination method based on the compression ratio K. Specifically, the test plan is first determined according to the allowable number of failures, and the coefficient is determined according to the test plan. The required reliability test time is obtained according to the reliability index and the coefficient. Then, the actual test time of multiple devices is obtained according to the required reliability test time and the compression ratio of multiple devices of the shipborne electronic compression system. Finally, the reliability test time is obtained according to the maximum value of multiple actual test times, so that the reliability test time is greatly shortened on the basis of completing the purpose of reliability index verification.

[0025] In some technical solutions, optionally, the formula for inverse derivation of the reliability model includes:

[0026]

[0027] T3=ε×θ # ;

[0028] Among them, reliability allocation is carried out for the shipborne electronic system, and the reliability index MTBF = θ is allocated to the equipment A1, A2, ..., An of the shipborne electronic system, and its corresponding reliability index is θ 1 ,θ 2 ,…,θ n , the corresponding numbers of equipment are N1, N2, ..., Nn, the corresponding numbers of prototypes are M1, M2, ..., Mn, and the reliability index of the prototype is θ # , T3 is the required reliability test time, and ε is the coefficient.

[0029] In this technical solution, the reliability index verification is carried out by determining the test time through the back-calculation of the reliability model, which can achieve a significant reduction in the reliability test time on the basis of completing the purpose of reliability index verification.

[0030] In some technical solutions, optionally, the method for verifying the reliability index of the shipborne electronic compaction system also includes: preparing a reliability test outline and conducting a reliability test.

[0031] In this technical solution, the reliability index verification method of the shipborne electronic compression system also includes preparing a reliability test outline and conducting reliability tests.

[0032] The embodiment of the present application provides a reliability index verification system for a shipborne electronic compact system, comprising: a first acquisition module, used to obtain basic information of the shipborne electronic compact system, the basic information including mean time between failures, compact ratio, duration of the shipborne electronic system mission profile and confidence; a second acquisition module, used to obtain external input requirements of the shipborne electronic compact system, and determine whether reliability assessment is required according to the external input requirements; a verification module, used to verify the reliability index based on the test time determination method of the LM method when reliability assessment is not required; when reliability assessment is required, determine whether the reliability allocation result has been reviewed and confirmed; when the reliability allocation result has not been reviewed and confirmed, verify the reliability index based on the test time determination method of the compact ratio K; when the reliability allocation result has been reviewed and confirmed, verify the reliability index based on the test time determination method of the reliability model inverse.

[0033] According to the shipborne electronic compact system reliability index verification system provided by the present application, it includes a first acquisition module, a second acquisition module and a verification module. Among them, the first acquisition module is used to obtain basic information of the shipborne electronic compact system, and the basic information includes the mean time between failures, the compact ratio, the duration of the shipborne electronic system mission profile and the confidence level. The second acquisition module is used to obtain the external input requirements of the shipborne electronic compact system, and determine whether a reliability assessment is required based on the external input requirements. The verification module is used to verify the reliability index based on the test time determination method of the LM method when a reliability assessment is not required. When a reliability assessment is required, it is determined whether the reliability allocation result has been reviewed and confirmed. When the reliability allocation result has not been reviewed and confirmed, the reliability index is verified based on the test time determination method of the compact ratio K. When the reliability allocation result has been reviewed and confirmed, the reliability index is verified based on the test time determination method of the reliability model inverse. Through the shipborne electronic compact system reliability index verification system provided by the present application, it is possible to fully utilize the number of equipment of the shipborne electronic compact system in the development stage without increasing the number of each component equipment, adopt the LM method, the compact ratio K and the reliability distribution result inverse method, consider the external input requirements and the reliability distribution results, and realize the reliability index verification of the shipborne electronic system. While completing the product reliability index verification, it shortens the test time, reduces the test cost of the development unit, and ensures the development progress of the equipment.

[0034] An embodiment of the present application provides a shipborne electronic deflation system reliability index verification system, comprising: a memory and a processor, wherein the memory stores a program or instruction that can be run on the processor, and when the processor executes the program or instruction, the shipborne electronic deflation system reliability index verification method of any one of the technical solutions of the first aspect is implemented, so it has the technical effect of any one of the technical solutions of the first aspect above, which will not be repeated here.

[0035] An embodiment of the present application provides a readable storage medium on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of the shipborne electronic compact system reliability index verification method of any one of the technical solutions of the first aspect are implemented, so it has the technical effect of any of the technical solutions of the first aspect above, which will not be repeated here.

[0036] Additional aspects and advantages of the present application will become apparent in the following description or will be learned through practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0038] Figure 1 This is a schematic diagram of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present application;

[0039] Figure 2 This is a schematic diagram of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present application;

[0040] Figure 3 This is a schematic diagram of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present application;

[0041] Figure 4 This is a schematic diagram of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present application;

[0042] Figure 5 This is a schematic diagram of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present application;

[0043] Figure 6 This is a schematic block diagram of the structure of a shipborne electronic compact system reliability index verification system according to one embodiment of the present application;

[0044] Figure 7 This is a schematic block diagram of the structure of a shipborne electronic compact system reliability index verification system according to one embodiment of the present application;

[0045] Figure 8 The present invention is a flowchart of the steps of a method for verifying reliability indicators of a shipborne electronic compact system according to an embodiment of the present invention.

[0046] in, Figure 6 and Figure 7 The corresponding relationship between the reference numerals and component names in the figure is:

[0047] 10: shipborne electronic compression system reliability index verification system; 110: first acquisition module; 120: second acquisition module; 130: verification module; 20: shipborne electronic compression system reliability index verification system; 300: memory; 400: processor. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0049] Refer to the following Figures 1 to 8 Describe the shipborne electronic compact system reliability index verification method and system, and storage medium of some embodiments of the present application.

[0050] like Figure 1 As shown, the embodiment of the first aspect of the present application provides a method for verifying reliability indicators of a shipborne electronic compact system, comprising the following steps:

[0051] Step S102: acquiring basic information of the shipborne electronic compact system, the basic information including mean time between failures, compact ratio, duration of the shipborne electronic system mission profile and confidence;

[0052] Step S104: obtaining external input requirements of the shipborne electronic compaction system, and determining whether reliability assessment is required according to the external input requirements;

[0053] Step S106: when reliability evaluation is not required, reliability index verification is performed based on the test time determination method of the LM method;

[0054] Step S108: When reliability assessment is required, determine whether the reliability allocation result has been reviewed and confirmed;

[0055] Step S110: when the reliability allocation result has not been reviewed and confirmed, reliability index verification is performed based on the test time determination method of the compression ratio K;

[0056] Step S112: When the reliability allocation result is reviewed and confirmed, the reliability index is verified based on the test time determination method based on the reliability model inversion.

[0057] According to the reliability index verification method of the shipborne electronic compact system provided in this embodiment, firstly, the basic information of the shipborne electronic compact system is obtained, and the basic information includes the reliability index, compact ratio, mission profile duration of the shipborne electronic system and the confidence required for verifying the reliability index of the shipborne electronic system, and the reliability index is the mean time between failures. Then, the external input requirements of the shipborne electronic compact system are obtained, and it is determined whether a reliability assessment is required based on the external input requirements. When a reliability assessment is not required, the reliability index is verified based on the test time determination method of the LM method. When a reliability assessment is required, it is determined whether the reliability allocation result has been reviewed and confirmed. When the reliability allocation result has not been reviewed and confirmed, the reliability index is verified based on the test time determination method of the compact ratio K. When the reliability allocation result has been reviewed and confirmed, the reliability index is verified based on the test time determination method of the reliability model inverse. Through the reliability index verification method of the shipborne electronic compact system provided in the present application, it is possible to fully utilize the number of equipment of the shipborne electronic compact system in the development stage without increasing the number of each component equipment, adopt the LM method, the compact ratio K and the reliability distribution result inverse method, consider the external input requirements and the reliability distribution result, realize the reliability index verification of the shipborne electronic system, and while completing the product reliability index verification, shorten the test time, reduce the test cost of the development unit, and ensure the development progress of the equipment.

[0058] like Figure 2 As shown, according to a method for verifying the reliability index of a shipborne electronic compact system according to an embodiment of the present application, obtaining basic information of the shipborne electronic compact system includes the following steps:

[0059] Step S202: Obtaining reliability indicators, mission profile duration and confidence of the shipborne electronic system, where the reliability indicators include mean time between failures;

[0060] Step S204: obtaining the number of equipment, equipment configurations and prototypes of the shipborne electronic compaction system;

[0061] Step S206: Obtain the equipment compression ratio according to the number corresponding to the equipment and the number corresponding to the prototype.

[0062] In this embodiment, obtaining the basic information of the shipborne electronic compact system specifically includes first obtaining the reliability index of the shipborne electronic system, the duration of the mission profile of the shipborne electronic system, and the confidence level, wherein the reliability index includes the mean time between failures. Then, the equipment of the shipborne electronic compact system, the number corresponding to the equipment of the equipment, and the number corresponding to the prototype of the equipment are obtained. Finally, the compact ratio of the equipment is obtained according to the number corresponding to the equipment and the number corresponding to the prototype. Specifically, it is known that the reliability index of a certain shipborne electronic system is MTBF=θ, and it is composed of equipment A1, A2, ..., An, and the corresponding numbers of its equipment (system) are N1, N2, ..., Nn, respectively, and the corresponding numbers of the prototypes (compact systems) are M1, M2, ..., Mn, respectively. The compact ratio Ki=Ni / Mi of each component equipment A1~An, the duration of the mission profile of the shipborne electronic system is T0, and the confidence level required for verifying the reliability index is C.

[0063] like Figure 3 As shown, according to a reliability index verification method of a shipborne electronic compact system according to an embodiment of the present application, reliability index verification is performed based on a test time determination method of the LM method, including the following steps:

[0064] Step S302: determining a test plan according to the allowable number of failures, and determining a coefficient according to the test plan;

[0065] Step S304: Obtaining the required reliability test time according to the reliability index and coefficient;

[0066] Step S306: Obtain an estimated value of the lower limit of the mean time between failures of the shipborne electronic system by using the LM method according to the expected reliability test time, the compression ratio, the duration of the mission profile of the shipborne electronic system and the confidence level;

[0067] Step S308: judging whether the requirements are met according to the estimated value of the lower limit of the mean time between failures and the reliability index.

[0068] In this embodiment, the reliability index verification is performed based on the test time determination method of the LM method, specifically, the test plan is first determined according to the allowable number of failures, and the coefficient is determined according to the test plan. Then, the required reliability test time is obtained according to the reliability index and the coefficient. According to the required reliability test time, the compression ratio, the duration of the mission profile of the shipborne electronic system, and the confidence level, the lower limit estimated value of the mean time between failures of the shipborne electronic system is obtained by the LM method. Finally, it is judged whether the requirements are met according to the lower limit estimated value of the mean time between failures and the reliability index, thereby realizing the reliability index verification.

[0069] In some embodiments, optionally, the calculation formula of the lower limit estimate of the mean time between failures is:

[0070] The reliability test time should be:

[0071] T1 = ε × MTBF = ε × θ;

[0072] Wherein, T1 is the required reliability test time, ε is the coefficient, MTBF = θ is the reliability index, the compression ratio of the equipment A1, A2, ..., An of the shipborne electronic system is K1, K2, ..., Kn, the actual test time of the equipment A1, A2, ..., An of the shipborne electronic system is T11 = K1 × T1, T12 = K2 × T1, ..., T1n = Kn × T1, the equivalent task number of the equipment A1, A2, ..., An of the shipborne electronic system is η1 = T11 / T0, η2 = T12 / T0, ..., ηn = T1n / T0, T0 is the duration of the mission profile of the shipborne electronic system, the LM method is used to carry out reliability assessment, and the sample number of the equipment A1, A2, ..., An of the shipborne electronic system is (η1, 0), (η2, 0), ..., (ηn, 0);

[0073]

[0074] Among them, R L is reliability, C is confidence, MTBF L is the estimated value of the lower limit of the mean time between failures, Q is the equivalent mission number of the shipborne electronic system, f is the number of mission failures of the shipborne electronic system in Q tests, T0 is the duration of the mission profile of the shipborne electronic system, ηi is the equivalent mission number of the equipment Ai of the shipborne electronic system, and n is the number of equipment in the shipborne electronic system. By using the LM method to carry out reliability assessment, the estimated value of the lower limit of the mean time between failures can be obtained, thereby realizing the reliability index verification.

[0075] like Figure 4 As shown, according to a reliability index verification method of a shipborne electronic compact system according to an embodiment of the present application, reliability index verification is performed based on a test time determination method of a compaction ratio K, including the following steps:

[0076] Step S402: determining a test plan according to the allowable number of failures, and determining a coefficient according to the test plan;

[0077] Step S404: Obtaining the required reliability test time according to the reliability index and coefficient;

[0078] Step S406: obtaining actual test time of multiple devices according to the expected reliability test time and the compaction ratio of multiple devices of the shipborne electronic compaction system;

[0079] Step S408: Obtain the reliability test time according to the maximum value of multiple actual test times.

[0080] In this embodiment, the reliability index verification is performed based on the test time determination method of the compression ratio K. Specifically, the test plan is first determined according to the allowable number of failures, and the coefficient is determined according to the test plan. The expected reliability test time is obtained according to the reliability index and the coefficient. Then, the actual test time of multiple devices is obtained according to the expected reliability test time and the compression ratio of multiple devices of the shipborne electronic compression system. Finally, the reliability test time is obtained according to the maximum value of the multiple actual test times, so that the reliability test time is greatly shortened on the basis of completing the purpose of reliability index verification.

[0081] In some embodiments, optionally, reliability allocation is performed on the shipborne electronic system, and the reliability index MTBF=θ is allocated to the equipment A1, A2, ..., An of the shipborne electronic system, and the corresponding reliability index is θ 1 ,θ 2 ,…,θ n , satisfying the following formula:

[0082]

[0083] The corresponding numbers of equipment are N1, N2, ..., Nn, and the corresponding numbers of prototypes are M1, M2, ..., Mn. The reliability index of the prototype is θ # , satisfying the following formula:

[0084]

[0085] The reliability test time should be T3 = ε*θ # ;

[0086] Among them, ε is a coefficient. The reliability index verification can be carried out by determining the test time through the reliability model inverse method, which can greatly shorten the reliability test time on the basis of completing the purpose of reliability index verification.

[0087] like Figure 5 As shown, according to an embodiment of the present application, the shipborne electronic compact system reliability index verification method further includes the following steps:

[0088] Step S502: Prepare a reliability test outline and conduct a reliability test.

[0089] In this embodiment, the reliability index verification method of the shipborne electronic compact system also includes preparing a reliability test outline and conducting a reliability test.

[0090] like Figure 6As shown, an embodiment of the second aspect of the present application provides a shipborne electronic compact system reliability index verification system 10, including: a first acquisition module 110, used to obtain basic information of the shipborne electronic compact system, the basic information including mean failure interval time, compaction ratio, shipborne electronic system mission profile duration and confidence; a second acquisition module 120, used to obtain external input requirements of the shipborne electronic compact system, and determine whether reliability assessment is required according to the external input requirements; a verification module 130, used to perform reliability index verification based on the test time determination method of the LM method when reliability assessment is not required; when reliability assessment is required, determine whether the reliability allocation result has been reviewed and confirmed; when the reliability allocation result has not been reviewed and confirmed, perform reliability index verification based on the test time determination method of the compaction ratio K; when the reliability allocation result has been reviewed and confirmed, perform reliability index verification based on the test time determination method of the reliability model inverse.

[0091] According to the shipborne electronic compact system reliability index verification system 10 provided in this embodiment, it includes a first acquisition module 110, a second acquisition module 120 and a verification module 130. Among them, the first acquisition module 110 is used to obtain basic information of the shipborne electronic compact system, and the basic information includes mean time between failures, compact ratio, duration of the shipborne electronic system mission profile and confidence. The second acquisition module 120 is used to obtain the external input requirements of the shipborne electronic compact system, and judge whether reliability assessment is required according to the external input requirements. The verification module 130 is used to verify the reliability index based on the test time determination method of the LM method when reliability assessment is not required. When reliability assessment is required, it is judged whether the reliability allocation result has been reviewed and confirmed. When the reliability allocation result has not been reviewed and confirmed, the reliability index is verified based on the test time determination method of the compact ratio K. When the reliability allocation result has been reviewed and confirmed, the reliability index is verified based on the test time determination method of the reliability model inverse. Through the shipborne electronic compact system reliability index verification system provided by the present application, it is possible to fully utilize the number of equipment of the shipborne electronic compact system in the development stage without increasing the number of each component equipment, adopt the LM method, the compact ratio K and the reliability distribution result inverse method, consider the external input requirements and the reliability distribution results, and realize the reliability index verification of the shipborne electronic system. While completing the product reliability index verification, it shortens the test time, reduces the test cost of the development unit, and ensures the development progress of the equipment.

[0092] like Figure 7As shown, an embodiment of the third aspect of the present application provides a shipborne electronic deflation system reliability index verification system 20, comprising: a memory 300 and a processor 400, wherein the memory 300 stores a program or instruction that can be run on the processor 400, and when the processor 400 executes the program or instruction, the steps of the shipborne electronic deflation system reliability index verification method of any one of the embodiments of the first aspect are implemented, so it has the technical effect of any one of the embodiments of the first aspect above, which will not be repeated here.

[0093] An embodiment of the fourth aspect of the present application provides a readable storage medium on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of the shipborne electronic compact system reliability index verification method of any one of the embodiments of the first aspect are implemented, and thus it has the technical effect of any one of the embodiments of the first aspect mentioned above, which will not be repeated here.

[0094] like Figure 8 As shown, according to a specific embodiment of a shipborne electronic compact system reliability index verification method provided by the present application, a determination rule of whether external input requirements allow reliability evaluation is mainly based on the LM method, the compaction ratio K, and the reliability index re-determination method, and a "reliability test + reliability evaluation" mode or a "reliability test" mode is adopted to complete the reliability index verification, thereby achieving a significant reduction in the reliability test time on the basis of completing the purpose of reliability index verification.

[0095] The steps implemented in this embodiment are as follows:

[0096] Step 1: Determine the basic information of the shipborne electronic compact system. It is known that the reliability index of a certain shipborne electronic system is MTBF = θ, which is composed of equipment A1, A2, ..., An. The corresponding numbers of its equipment (system) are N1, N2, ..., Nn, and the corresponding numbers of prototypes (compact systems) are M1, M2, ..., Mn. The compact ratio of each component equipment A1~An is Ki = Ni / Mi, the duration of the shipborne electronic system mission profile is T0, and the confidence required for verifying the reliability index is C.

[0097] Step 2: Check the external input requirements of the shipborne electronic system. Communicate with the product orderer and determine the test plan according to the following principles:

[0098] (1) If the assessment is allowed, proceed to step 3;

[0099] (2) If the assessment is not allowed and the reliability allocation results have not been rigorously reviewed and confirmed, go to step 4;

[0100] (3) If the assessment is not allowed, but the reliability allocation results have been reviewed and approved by the ordering party, proceed to step 5.

[0101] Step 3: Test time determination method based on LM method: Select a test plan with an allowable failure number of 0, and the coefficient specified in the test plan is ε. The reliability test time that should be carried out for the shipborne electronic compression system in the development stage is:

[0102] T1=ε×MTBF=ε×θ

[0103] The actual test time of each component A1~An of the shipborne electronic compression system is T11=K1×T1, T12=K2×T1, …, T1n=Kn×T1. The equivalent task number of each component η1=T11 / T0, η2=T12 / T0, …, ηn=T1n / T0 can be obtained. Using the LM method to carry out reliability evaluation, the sample number of each component A1~An can be obtained as (η1, 0), (η2, 0), …, (ηn, 0), which can be substituted into the following formula for evaluation:

[0104]

[0105] The reliability R L , the mission duration T0 is substituted into the following formula to obtain the lower limit estimate of the mean time between failures of the shipborne electronic system:

[0106]

[0107] If MTBF L If θ is greater than or equal to θ, the requirement is met; otherwise, the requirement is not met.

[0108] Therefore, determine the reliability test time as T1, and then go to step six.

[0109] Step 4: Determination of test time based on the compression ratio K: Select a test plan with an allowable number of failures of 0, and the coefficient specified in the test plan is ε. The reliability test time that should be carried out for the shipborne electronic compression system in the development stage is:

[0110] T1=ε×MTBF=ε×θ

[0111] The actual test time of each component of the shipborne electronic compression system A1~An is T11=K1×T1, T12=K2×T1, …, T1n=Kn×T1. Under the arrangement of conducting tests at the same time, the longest test time is The reliability test time of this shipborne electronic compression system is T2.

[0112] Step 5: Test time determination method based on reliability model inversion: Carry out reliability allocation for shipborne electronic systems, and allocate the system reliability index MTBF = θ to each component equipment A1, A2, ..., An, and its corresponding reliability index is θ 1 ,θ 2 ,…,θn , satisfying the following formula:

[0113]

[0114] Since the number of components in the prototype does not exceed the number of equipment, the reliability index of the prototype is θ # , satisfying the following formula

[0115]

[0116] Then the reliability test time that the system should carry out is T3=ε×θ #

[0117] Therefore, the reliability index verification test time of the shipborne electronic compression system is T3.

[0118] Step 6: Prepare a test outline and conduct the test: Prepare a reliability test outline and conduct the reliability test.

[0119] This embodiment makes full use of the number of equipment of the shipborne electronic compact system in the development stage without increasing the number of each component equipment, adopts the LM method, the compact ratio K and the reliability distribution result inverse method, considers the external input requirements and the reliability distribution results, and realizes the reliability index verification of the shipborne electronic system by designing a reasonable test plan.

[0120] This embodiment shortens the test time, reduces the test cost of the development unit, and ensures the development progress of the equipment while completing the product reliability index verification.

[0121] Specifically, step one: determine the basic information of the shipborne electronic compression system.

[0122] The reliability index of a certain shipborne electronic system is MTBF=500h. It is composed of equipment A, B, C, and D. The corresponding numbers of the equipment are N1=1, N2=2, N3=3, and N4=4 respectively. The corresponding numbers of prototypes (compact systems) in the development stage are M1=1, M2=1, M3=2, and M4=3 respectively. The compaction ratios of each component equipment A1~An are K1=1, K2=2, K3=1.5, and K4=1.34. The duration of the mission profile of the shipborne electronic system is T0=2160h. The confidence level required for verifying the reliability index is C=0.7.

[0123] Step 2: Check the external input requirements of the shipborne electronic system and communicate with the product orderer.

[0124] (1) If the assessment is allowed, proceed to step 3;

[0125] (2) If the assessment is not allowed and the reliability allocation results have not been rigorously reviewed and confirmed, go to step 4;

[0126] (3) If the assessment is not allowed, but the reliability allocation results have been reviewed and approved by the ordering party, proceed to step 5.

[0127] Step 3: Select a test plan with an allowable failure number of 0. The coefficient specified in the test plan is 1.204. The reliability test time for the shipborne electronic compression system in the development stage should be:

[0128] T1=ε×MTBF=ε×θ=1.204×500h=602h

[0129] The actual test time of each component of the shipborne electronic compression system A, B, C, D is

[0130] T11=K1×T1=1×602h=602h;

[0131] T12=K2×T1=2×602h=1204h;

[0132] T13=K3×T1=1.5×602h=903h;

[0133] T14=K4×T1=1.34×602h≈807h;

[0134] The equivalent number of tasks for each component device can be obtained

[0135] η1=T11 / T0=602 / 2160≈0.28;

[0136] η2=T12 / T0=1204 / 2160≈0.56;

[0137] η3=T12 / T0=903 / 2160≈0.42;

[0138] eta4=T1n / T0=807 / 2160≈0.37.

[0139] Using the LM method to carry out reliability evaluation, we can get the sample numbers of each component equipment A1~An as (η1, 0), (η2, 0), …, (ηn, 0), and substitute them into the following formula to carry out the evaluation:

[0140]

[0141] The reliability R L =0.0136, mission duration T0 = 2160 Substituting into the following formula, we can get the estimated lower limit of the mean time between failures of the shipborne electronic system.

[0142]

[0143] If MTBFL ≥500h is greater than or equal to θ, then the requirement is met.

[0144] Step 4: Select a test plan with an allowable number of failures of 0. The coefficient specified in the test plan is ε. The reliability test time for the shipborne electronic compression system in the development stage should be:

[0145] T1=ε×MTBF=ε×θ=1.204×500h=602h

[0146] The actual test time of each component of the shipborne electronic compression system A, B, C, D is

[0147] T11=K1×T1=1×602h=602h;

[0148] T12=K2×T1=2×602h=1204h;

[0149] T13=K3×T1=1.5×602h=903h;

[0150] T14=K4×T1=1.34×602h≈807h;

[0151] Under the arrangement of conducting tests simultaneously, the maximum test time is

[0152] The reliability test time of this shipborne electronic compression system is T2=1204h.

[0153] Step 5: Carry out reliability allocation for the shipborne electronic system, and allocate the system reliability index MTBF = θ to each component device A1, A2, ..., An, and its corresponding reliability index is θ 1 =5000h,θ 2 =5000h,θ 3 =5000h,θ 4 =5000h, satisfying the following formula:

[0154]

[0155] Since the number of components in the prototype does not exceed the number of equipment, the reliability index of the prototype is θ # , satisfying the following formula

[0156]

[0157] We can get θ # ≈714.3h

[0158] Then the reliability test time that the system should carry out is T3=ε×θ # =1.204×714.3h≈860h

[0159] Therefore, the reliability index verification test time of this shipborne electronic compression system is T3=860h.

[0160] Step 6: Prepare a reliability test outline and conduct reliability tests.

[0161] In summary, the beneficial effects of the embodiments of the present application are as follows: without increasing the number of each component of the equipment, the number of equipment of the shipborne electronic compact system in the development stage is fully utilized, the LM method, the compact ratio K and the reliability distribution result inverse method are adopted, the external input requirements and the reliability distribution results are considered, and the reliability index verification of the shipborne electronic system is realized by designing a reasonable test plan. While completing the product reliability index verification, the test time is shortened, the test cost of the development unit is reduced, and the development progress of the equipment is guaranteed.

[0162] In this application, the terms "first", "second", and "third" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance; the term "plurality" refers to two or more, unless otherwise expressly defined. Terms such as "installed", "connected", "connected", and "fixed" should be understood in a broad sense. For example, "connected" can be a fixed connection, a detachable connection, or an integral connection; "connected" can be a direct connection or an indirect connection through an intermediate medium. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0163] In the description of the present application, it should be understood that the terms "upper", "lower", "front", "rear", etc., indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the system or module referred to must have a specific direction, be constructed and operated in a specific orientation, and therefore, should not be understood as a limitation on the present application.

[0164] In the description of this specification, the description of the terms "one embodiment", "some embodiments", "specific embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0165] The above are only preferred embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A reliability index verification method for a shipborne electronic compact system, characterized in that: include: Acquiring basic information of a shipborne electronic compact system, wherein the basic information includes a mean time between failures, a compact ratio, a duration of a mission profile of the shipborne electronic system, and a confidence level; obtaining external input requirements of the shipborne electronic compaction system, and determining whether reliability assessment is required according to the external input requirements; When reliability evaluation is not required, the reliability index verification is performed based on the test time determination method of the LM method; When reliability assessment is required, determine whether the reliability allocation results have been reviewed and confirmed; When the reliability allocation result has not been reviewed and confirmed, the reliability index verification is carried out based on the test time determination method of the compression ratio K; When the reliability allocation results are reviewed and confirmed, the reliability index is verified based on the test time determination method based on the reliability model inversion.

2. The reliability index verification method of the shipborne electronic compact system according to claim 1 is characterized in that: The basic information of the shipborne electronic compression system is obtained, including: Obtaining reliability indicators of shipborne electronic systems, duration of mission profiles of shipborne electronic systems, and confidence levels, wherein the reliability indicators include mean time between failures; Obtain equipment of a shipborne electronic compaction system, the number of equipment corresponding to the equipment, and the number of prototypes corresponding to the equipment; The compression ratio of the equipment is obtained according to the quantity corresponding to the equipment and the quantity corresponding to the prototype.

3. The reliability index verification method of the shipborne electronic compact system according to claim 2 is characterized in that: The test time determination method based on the LM method is used to verify the reliability index, including: Determine a test plan based on the allowable number of failures, and determine a coefficient based on the test plan; Obtaining the required reliability test time according to the reliability index and the coefficient; Obtaining a lower limit estimate of the mean time between failures of the shipborne electronic system by the LM method according to the required reliability test time, the compression ratio, the duration of the mission profile of the shipborne electronic system and the confidence level; Whether the requirements are met is determined based on the estimated lower limit value of the mean time between failures and the reliability index.

4. The reliability index verification method of the shipborne electronic compact system according to claim 3 is characterized in that: The calculation formula for the estimated lower limit of the mean time between failures is: The reliability test time should be: T1 = ε × MTBF = ε × θ; Wherein, T1 is the required reliability test time, ε is the coefficient, MTBF = θ is the reliability index, the compression ratio of the equipment A1, A2, ..., An of the shipborne electronic system is K1, K2, ..., Kn, the actual test time of the equipment A1, A2, ..., An of the shipborne electronic system is T11 = K1 × T1, T12 = K2 × T1, ..., T1n = Kn × T1, the equivalent task number of the equipment A1, A2, ..., An of the shipborne electronic system is η1 = T11 / T0, η2 = T12 / T0, ..., ηn = T1n / T0, T0 is the duration of the mission profile of the shipborne electronic system, the LM method is used to carry out reliability assessment, and the sample number of the equipment A1, A2, ..., An of the shipborne electronic system is (η1, 0), (η2, 0), ..., (ηn, 0); Among them, R L is reliability, C is confidence, MTBF L is the estimated value of the lower limit of the mean time between failures, Q is the equivalent mission number of the shipborne electronic system, f is the number of mission failures of the shipborne electronic system in Q tests, T0 is the duration of the mission profile of the shipborne electronic system, ηi is the equivalent mission number of the equipment Ai of the shipborne electronic system, and n is the number of equipment in the shipborne electronic system.

5. The reliability index verification method of the shipborne electronic compact system according to claim 2 is characterized in that: The test time determination method based on the compression ratio K is used to verify the reliability index, including: Determine a test plan based on the allowable number of failures, and determine a coefficient based on the test plan; Obtaining the required reliability test time according to the reliability index and the coefficient; According to the expected reliability test time and the compression ratio of multiple devices of the shipborne electronic compression system, actual test time of the multiple devices is obtained; The reliability test time is obtained according to the maximum value of the multiple actual test times.

6. The reliability index verification method of the shipborne electronic compact system according to claim 2 is characterized in that: The formula for back-calculation of the reliability model includes: <h2 style=";text-align:left;direction:ltr">T3 = ε×θ<h2 style=";text-align:left;direction:ltr"> # <h2 style=";text-align:left;direction:ltr"> ; Among them, reliability allocation is carried out for the shipborne electronic system, and the reliability index MTBF = θ is allocated to the equipment A1, A2, ..., An of the shipborne electronic system, and its corresponding reliability indexes are θ1, θ2, ..., θ n , the corresponding numbers of equipment are N1, N2, ..., Nn, the corresponding numbers of prototypes are M1, M2, ..., Mn, and the reliability index of the prototype is θ # , T3 is the required reliability test time, and ε is the coefficient.

7. The reliability index verification method of a shipborne electronic compact system according to any one of claims 1 to 6, characterized in that: Also includes: Prepare reliability test outline and carry out reliability test.

8. A shipborne electronic compaction system reliability index verification system, characterized in that: include: A first acquisition module (110) is used to acquire basic information of a shipborne electronic compact system, wherein the basic information includes a mean time between failures, a compact ratio, a duration of a shipborne electronic system mission profile, and a confidence level; A second acquisition module (120) is used to acquire external input requirements of the shipborne electronic compaction system and determine whether reliability assessment is required according to the external input requirements; The verification module (130) is used to verify the reliability index based on the test time determination method of the LM method when reliability evaluation is not required; to determine whether the reliability allocation result has been reviewed and confirmed when reliability evaluation is required; to verify the reliability index based on the test time determination method of the tightening ratio K when the reliability allocation result has not been reviewed and confirmed; and to verify the reliability index based on the test time determination method of the reliability model inverse deduction when the reliability allocation result has been reviewed and confirmed.

9. A shipborne electronic compaction system reliability index verification system, characterized in that: include: A memory (300) and a processor (400), wherein the memory (300) stores a program or instruction that can be run on the processor (400), and when the processor (400) executes the program or the instruction, the steps of the shipborne electronic compact system reliability indicator verification method according to any one of claims 1 to 7 are implemented.

10. A readable storage medium having a program or instruction stored thereon, characterized in that: When the program or the instruction is executed by a processor, the steps of the method for verifying reliability indicators of a shipborne electronic compact system according to any one of claims 1 to 7 are implemented.

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