Photoelectric detector screening device and screening method

Abstract

The invention relates to a photoelectric detector screening device and method, belongs to the technical field of photoelectric detection, and solves the problem that there is no effective device and method for screening photoelectric detectors. The screening device comprises a narrow linewidth laser, a vacuum cavity, a clamping tool, a vacuum pump, a temperature control system and a data acquisition and processing system. The clamping tool is located in the vacuum cavity, fixedly connected with the vacuum cavity and used for clamping the photoelectric detectors to be screened. The vacuum cavity is provided with an optical window, and laser generated by the narrow linewidth laser irradiates the receiving surface of the photoelectric detector through the optical window. The screening method comprises the steps of installing the photoelectric detector to be screened, starting the narrow linewidth laser, vacuumizing the vacuum cavity, measuring response amplitudes of the photoelectric detector under different temperature conditions, and screening. The screening device is used for screening the photoelectric detector.

Description

Technical Field

[0001] The present invention belongs to the technical field of optoelectronic detection, and particularly relates to an optoelectronic detector screening device and a screening method. Background Art

[0002] Optoelectronic detectors are commonly used devices for measuring optical power and energy. Especially for single-packaged optoelectronic detectors, such as Figure 1 the InGaAs detector shown in the figure, which includes a window glass 1, a detector chip 2, a substrate 3, a housing 4, and pins 5; it can be used singly or in an array for measuring the intensity of laser signals, and is a common measurement method for the spatial distribution of laser light intensity. Its basic principle is as shown in Figure 2 the figure, which consists of a protective panel 6, a sampling channel 7, a detector 8, a data acquisition circuit 9, and a data processing device 10; the optoelectronic detectors are arranged in a certain array, with an attenuation sampling device at the front end and connected to a signal acquisition and processing circuit at the back end. The optoelectronic detector converts the incident laser intensity into current and is detected by the subsequent circuit. Since the laser intensity is proportional to the magnitude of the generated current, after calibrating the system, the magnitude of the incident laser energy can be obtained through the magnitude of the signal. However, when the optoelectronic detector has strong coherence with the incident laser, an interference phenomenon will occur between the window and the chip of the optoelectronic detector, resulting in deviation of the measurement results. Therefore, it is necessary to screen the optoelectronic detectors to avoid using optoelectronic detectors with strong interference performance with the laser. Currently, there is a lack of effective devices and methods for screening optoelectronic detectors. Summary of the Invention

[0003] In order to screen optoelectronic detectors without interference performance with lasers, the present invention proposes an optoelectronic detector screening device and a screening method.

[0004] The technical solution adopted by the present invention to solve its technical problems is:

[0005] An optoelectronic detector screening device includes a narrow-linewidth laser, a vacuum chamber, a clamping tooling, a vacuum pump, a temperature control system, and a data acquisition and processing system.

[0006] The clamping tooling is located inside the vacuum chamber and is fixedly connected to the vacuum chamber for clamping the optoelectronic detector to be discriminated.

[0007] The vacuum chamber is provided with an optical window. The narrow-linewidth laser is located outside the vacuum chamber. The narrow-linewidth laser generates laser, and the laser wavelength is within the wavelength working range of the optoelectronic detector. The laser can be incident through the optical window and irradiate on the receiving surface of the optoelectronic detector.

[0008] The vacuum pump is connected to the vacuum chamber for evacuating the cavity of the vacuum chamber.

[0009] The data acquisition and processing system is located outside the vacuum chamber and is connected to the photodetector to be discriminated inside the vacuum chamber, and is used to collect, amplify and display the signal of the photodetector in real time.

[0010] The temperature control system is used to control the temperature inside the vacuum chamber so that the temperatures of the clamping tooling and the photodetector change within a set temperature range or remain at a certain temperature.

[0011] The above-mentioned photodetector screening device further includes a multi-dimensional adjustment frame, which is used to install and fix a narrow linewidth laser and adjust the position of the narrow linewidth laser.

[0012] In the above-mentioned photodetector screening device, the temperature control system includes a cooling system and a heating system to control the temperature inside the vacuum chamber, and the temperature range inside the vacuum chamber is -50°C to 50°C.

[0013] In the above-mentioned photodetector screening device, the clamping tooling has heat conduction performance and can clamp several photodetectors at the same time.

[0014] A method for screening photodetectors includes the following steps:

[0015] Step 1, install the photodetector to be screened

[0016] Fix the photodetector to be screened on the clamping tooling. When the photodetector works normally, run the data acquisition and processing system until the baseline signal of the photodetector is normally displayed on the display device of the data acquisition and processing system;

[0017] Step 2, turn on the narrow linewidth laser

[0018] Start the narrow linewidth laser until a stable irradiation light source is generated by the narrow linewidth laser;

[0019] Adjust the position and angle of the narrow linewidth laser so that the laser generated by it is perpendicularly incident on the receiving surface of the photodetector;

[0020] Step 3, evacuate the vacuum chamber and the temperature of the photodetector is at the starting temperature

[0021] Start the vacuum pump to evacuate the inside of the vacuum chamber to the set vacuum degree;

[0022] The temperature control system regulates the temperature inside the vacuum chamber until the temperature of the photodetector is at the set starting temperature; make the response amplitude of the photodetector stable at the maximum value;

[0023] Step 4, measure the response amplitude of the photodetector under different temperature conditions

[0024] Set the end temperature of the photodetector, and continuously vary the temperature of the photodetector from the starting temperature to the end temperature. Use a data acquisition and processing system to measure and record the response amplitude of the photodetector in real time.

[0025] Step 5, screening

[0026] Based on the response amplitude of the photodetector from the starting temperature to the end temperature, plot the curve of the change in the response amplitude during the temperature change process of the photodetector.

[0027] Based on the curve of the change in the response amplitude during the temperature change process of the photodetector, screen out the photodetectors without interference performance as qualified products.

[0028] In the above photodetector screening method, the screening in step 5 further includes:

[0029] During the temperature change process of the photodetector, if the response amplitude changes monotonically, it is determined that the interference performance of this photodetector is eliminated and it is a qualified photodetector;

[0030] During the temperature change process of the photodetector, if the response amplitude does not change monotonically, it is determined that the photodetector has interference performance and it is an unqualified photodetector.

[0031] In the above photodetector screening method, the starting temperature of the photodetector is -30°C and the end temperature is 30°C.

[0032] The beneficial effects of the present invention are:

[0033] A photodetector screening method, by measuring the output signal amplitude of the photodetector under strong coherent laser irradiation during the temperature change process, combined with the temperature response characteristics of the detector itself, can quickly judge the interference characteristics of the detector, avoid measurement errors caused by interference phenomena during the laser measurement process, and improve the measurement accuracy and accuracy of the laser intensity.

[0034] A photodetector screening method is not limited to the material, structure and packaging method of the detector. As long as the detector has a light-transmitting window for receiving the irradiated light field, this method can be used for interference performance screening.

[0035] A photodetector screening device can design a multi-channel clamping tooling and a simple gating circuit according to needs, and measure the interference performance of multiple photodetectors at one time to improve the screening efficiency. Description of the Drawings

[0036] Figure 1 It is the structure of the photodetector in the prior art;

[0037] Figure 2 It is the schematic diagram of measuring the energy distribution of the laser light field by the typical array target in the prior art;

[0038] Figure 3 Schematic diagram of the structure of the optoelectronic detector screening device in the first embodiment of the present invention;

[0039] Figure 4 Curve of the response amplitude change during the temperature change of the optoelectronic detector without interference phenomenon when the response amplitude of the optoelectronic detector in the first embodiment of the present invention is independent of temperature;

[0040] Figure 5 Curve of the response amplitude change during the temperature change of the optoelectronic detector without interference phenomenon when the response amplitude of the optoelectronic detector in the first embodiment of the present invention is related to temperature;

[0041] Figure 6 Curve of the response amplitude change during the temperature change of the optoelectronic detector with interference phenomenon in the first embodiment of the present invention.

[0042] The reference numerals are as follows:

[0043] 1. Window glass; 2. Detector chip; 3. Substrate; 4. Outer shell; 5. Pin; 6. Protection panel; 7. Sampling channel; 8. Detector; 9. Data acquisition circuit; 10. Data processing device; 11. Multi-dimensional adjustment frame; 12. Narrow-linewidth laser; 13. Vacuum chamber; 14. Optoelectronic detector; 15. Clamping tooling; 16. Temperature control system; 17. Data acquisition and processing system; 18. Optical window; 19. Vacuum pump. Detailed implementation manners

[0044] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0045] First Embodiment

[0046] As Figure 3 shown, an optoelectronic detector screening device includes a multi-dimensional adjustment frame 11, a narrow-linewidth laser 12, a vacuum chamber 13, an optoelectronic detector 14, a clamping tooling 15, a temperature control system 16 and a data acquisition and processing system 17; in this example, the optoelectronic detector 14 is fixed on the clamping tooling 15, and the clamping tooling 15 is installed in the vacuum chamber 13; the signal of the optoelectronic detector 14 is collected by the data acquisition and processing system 17 and amplified to an appropriate amplitude and then displayed in real time; the vacuum chamber 13 has an optical window 18, and after the laser emitted by the narrow-linewidth laser 12 is adjusted by the multi-dimensional adjustment frame 11, it is incident on the surface of the detector 14 through the optical window 18; the vacuum chamber 13 is equipped with peripheral devices such as a vacuum pump 19, and the air pressure in the vacuum chamber 13 can be evacuated after the detector 14 is placed and the cabinet door of the vacuum chamber 13 is closed; the temperature control system 16 consists of a cooling system and a heating system, which can measure the temperature of the clamping tooling 15 in real time according to the temperature probe arranged on the clamping tooling 15, and realize temperature change or maintenance within a certain range according to the program.

[0047] The method for screening photoelectric detectors by using a photoelectric detector screening device to measure the interference performance of the detector comprises the following steps:

[0048] Step 1: Fix the photodetector to be screened 14

[0049] Fix the photoelectric detector 14 on the clamping fixture 15, run the data acquisition and processing system 17, the display device can correctly display the detector baseline signal, and the photoelectric detector 14 works normally;

[0050] Step 2: Turn on the narrow linewidth laser 12 to generate a stable irradiation light source

[0051] According to the laser operation manual, turn on the narrow line width laser 12, and after the narrow line width laser 12 is stable, adjust the position and angle of the narrow line width laser 12 so that it can be vertically incident on the receiving surface of the photodetector 14; at this time, the data acquisition and processing system 17 should be able to display the response signal of the photodetector 14;

[0052] Step 3: The vacuum chamber 13 is evacuated and the photodetector 14 is set at the starting temperature.

[0053] Close the door of the vacuum chamber 13, start the vacuum pump 19, and evacuate the vacuum chamber 13 to near vacuum; at the same time, set the starting temperature, start the cooling and heating units, and make the temperature of the photoelectric detector 14 reach the starting temperature. After the temperature stabilizes for a period of time, adjust the multi-dimensional adjustment frame 11 to stabilize the response amplitude of the photoelectric detector 14 at the maximum value;

[0054] Step 4: The temperature changes from the starting temperature to the ending temperature

[0055] Setting the end temperature so that the temperature of the photoelectric detector 14 changes continuously from the starting temperature to the end temperature, and recording the response amplitude of the photoelectric detector in real time;

[0056] Step 5: Data judgment

[0057] After the temperature of the photoelectric detector 14 is stabilized at the end temperature, a response amplitude change curve of the photoelectric detector 14 during the temperature change process is drawn.

[0058] Combined with the performance of the photodetector, it is determined whether the interference performance of the photodetector is eliminated. If the response amplitude of the photodetector 14 is independent of temperature, the response amplitude is within the laser power fluctuation range during the temperature change process, such as Figure 4 If the curve shown in FIG. 1 is a curve, it is considered that the interference elimination performance of the detector is better; if the laser response rate of the photodetector 14 changes monotonically with temperature, then when the response amplitude changes monotonically during the temperature change process, such as Figure 5 If the curve shown in Figure 1 is not correct, it is considered that the interference elimination performance of this detector is good; if the response amplitude shows non-monotonic changes during the temperature change process, it is in the shape of a fluctuating curve, such as Figure 6If the curve shown is such, it is considered that this detector has strong interference characteristics, and this detector is excluded during the screening process.

Claims

1. A photoelectric detector screening device, characterized in that: It includes a narrow line width laser (12), a vacuum chamber (13), a clamping tool (15), a vacuum pump (19), a temperature control system (16) and a data acquisition and processing system (17); The clamping tool (15) is located in the vacuum chamber (13), fixedly connected to the vacuum chamber (13), and is used to clamp the photoelectric detector (14) to be screened; The vacuum chamber (13) is provided with an optical window (18), the narrow line width laser (12) is located outside the vacuum chamber (13), the narrow line width laser (12) generates laser light, the wavelength of the laser light is within the wavelength operating range of the photodetector (14), and the laser light can be incident through the optical window (18) and irradiated onto the receiving surface of the photodetector (14); The vacuum pump (19) is connected to the vacuum chamber (13) and is used to evacuate the cavity of the vacuum chamber (13); The data acquisition and processing system (17) is located outside the vacuum chamber (13), connected to the photoelectric detector (14) to be identified in the vacuum chamber (13), and is used to collect, amplify and display the signal of the photoelectric detector (14) in real time; The temperature control system (16) is used to control the temperature in the vacuum chamber (13) so that the temperature of the clamping tool (15) and the photoelectric detector (14) changes within a set temperature range or is maintained at a certain temperature.

2. The photodetector screening device according to claim 1, characterized in that: It also comprises a multi-dimensional adjustment frame (11), wherein the multi-dimensional adjustment frame (11) is used to install and fix the narrow line width laser (12) and adjust the position of the narrow line width laser (12).

3. The photodetector screening device according to claim 1, characterized in that: The temperature control system (16) comprises a cooling system and a heating system, and controls the temperature in the vacuum chamber (13); the temperature in the vacuum chamber (13) ranges from -50°C to 50°C.

4. The photodetector screening device according to claim 1, characterized in that: The clamping tool (15) has heat-conducting properties and can clamp several photoelectric detectors at the same time.

5. A photodetector screening method, using any photodetector screening device according to claim 1 to 4, characterized in that: The steps include: Step 1, install the photoelectric detector to be screened: The photoelectric detector (14) to be screened is fixed on the clamping tool (15), the photoelectric detector (14) works normally, and the data acquisition and processing system (17) is operated until the display device of the data acquisition and processing system (17) normally displays the baseline signal of the photoelectric detector (14); Step 2, turn on the narrow linewidth laser: Starting the narrow line width laser (12) until the narrow line width laser (12) generates a stable irradiation light source; Adjusting the position and angle of the narrow line width laser (12) so that the laser light generated by the narrow line width laser (12) is vertically incident on the receiving surface of the photodetector (14); Step 3, the vacuum chamber is evacuated and the temperature of the photodetector is at the starting temperature: Starting the vacuum pump (19) to evacuate the vacuum chamber (13) to a set vacuum degree; The temperature control system (16) regulates the temperature inside the vacuum chamber (13) until the temperature of the photoelectric detector (14) is at a set starting temperature; Stabilizing the response amplitude of the photodetector (14) at a maximum value; Step 4, measure the response amplitude of the photodetector under different temperature conditions: Setting the end temperature of the photoelectric detector (14) so ​​that the temperature of the photoelectric detector (14) changes continuously from the starting temperature to the end temperature, and using a data acquisition and processing system (17) to measure and record the response amplitude of the photoelectric detector (14) in real time; Step 5, Screening: According to the response amplitude of the photoelectric detector (14) under the conditions from the starting temperature to the ending temperature, a response amplitude change curve of the photoelectric detector (14) during the temperature change process is drawn; According to the response amplitude change curve of the photoelectric detector (14) during the temperature change process, the photoelectric detector (14) with no interference performance is screened as a qualified product.

6. The photodetector screening method according to claim 5, characterized in that: The step 5 screening further comprises: During the temperature change process of the photoelectric detector (14), if the response amplitude changes monotonically, it is determined that the interference performance of the photoelectric detector is eliminated and the photoelectric detector is a qualified photoelectric detector; When the response amplitude of the photoelectric detector (14) changes non-monotonically during the temperature change process, it is determined that the photoelectric detector has interference performance and is an unqualified photoelectric detector.

7. The photodetector screening method according to claim 5, characterized in that: The photoelectric detector has a starting temperature of -30°C and an ending temperature of 30°C.

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