Multi-mode power control board testing system and method and related equipment

Abstract

The invention provides a multi-mode power control board testing system and method and related device.The testing system comprises a computing device, an electronic testing device and a power control board testing jig, the computing device is used for recording a testing instruction corresponding to a to-be-tested object and testing the to-be-tested object according to the testing instruction of the to-be-tested object; controlling the power supply control board test fixture to test the to-be-tested object, controlling the electronic test equipment to read the measurement data of the power supply control board test fixture, storing and analyzing the measurement data acquired by the electronic test equipment, and forming a test analysis report of the to-be-tested object; the power supply control board test fixture is used for testing at least one to-be-tested index according to a test instruction of a to-be-tested object; the electronic test equipment is used for collecting and displaying the test result, multiple circuit parameters of the to-be-tested object can be tested in parallel, the method has the advantages of being efficient and stable, and the test cost can be reduced.

Description

Technical Field

[0001] This application relates to the technical field of power control board testing, and particularly to a multi-mode power control board testing system, method and related equipment. Background Art

[0002] In the field of electronic technology, the performance and reliability of circuits are crucial for the normal operation of various electronic devices. As a key link to ensure circuit quality, circuit testing has long relied on manual operation and recording.

[0003] Traditional multi-mode power control board testing methods require technicians to use specialized testing equipment, such as oscilloscopes, multimeters, etc., to measure each parameter of the circuit one by one. During the testing process, technicians need to manually set the test conditions, connect the test points, and carefully observe the display results of the testing equipment, and then manually record the test data and conclusions in paper forms or electronic documents. This manual testing method has many obvious drawbacks. First, manual operation inevitably introduces human errors, affecting the accuracy and consistency of test results. Differences in the operating habits and experience levels of different technicians may lead to deviations in the test results of the same circuit. Second, manual testing is inefficient. For complex circuit systems with numerous test points and diverse parameters, it takes a large amount of time and effort to complete a comprehensive test. This becomes a serious limiting factor in the face of large-scale production or scenarios where rapid testing is required. In addition, manual recording of test results is prone to recording errors, omissions, or data loss, which brings difficulties to subsequent data analysis and quality traceability. Moreover, a large amount of manual test data is difficult to organize and analyze effectively, and potential quality problems and trends cannot be discovered in a timely manner.

[0004] With the rapid development of electronic technology, the complexity of circuits has been continuously increasing, posing higher requirements for the accuracy, speed, and reliability of testing. The traditional manual testing method has been difficult to meet the needs of modern circuit production and research and development, and there is an urgent need for a new system that can achieve automatic testing, improve testing efficiency and accuracy, and effectively manage and analyze test data. Summary of the Invention

[0005] This application aims to at least solve one of the above technical defects. In view of this, this application provides a multi-mode power control board testing system, method and related equipment, which are used to solve the technical defect that the circuit testing cannot be efficiently completed in the prior art.

[0006] A multi-mode power control board testing system, the system includes: a computing device, an electronic testing device, and a power control board testing fixture, wherein the power control board testing fixture is respectively connected to the electronic testing device and the computing device; The computing device is used to record test instructions corresponding to the object to be tested, and control the power control board test fixture to test the object to be tested according to the test instructions of the object to be tested, control the electronic test equipment to read the measurement data of the power control board test fixture, save and analyze the measurement data collected by the electronic test equipment, and form a test analysis report of the object to be tested; The power control board test fixture includes a first test component and a second test component. Among them, the first test component includes a first test pin plate, a second test pin plate, a test board, and a single-chip microcomputer. The first test pin plate includes a plurality of first test pins, the second test pin plate includes a plurality of second test pins, the second test pin plate is placed in the test board, and the test board is used to place the object to be tested; the power control board test fixture is used to control the first test pin plate, the single-chip microcomputer, the second test pin plate, and the second test component to test at least one test index of the object to be tested according to the test instructions of the object to be tested.

[0007] The electronic test equipment is used to collect and display the test results of the object to be tested.

[0008] Preferably, the second test component includes a signal relay board, a high-power relay, a low-power relay, a cylinder, a communicator, a power supply, and an upper template. Based on this, the process of the power control board test fixture controlling the first test pin plate, the single-chip microcomputer, the second test pin plate, and the second test component to test at least one test index of the object to be tested according to the test instructions of the object to be tested includes: The first test pin plate and the second test pin plate are used to test different test indexes of the object to be tested; The single-chip microcomputer is used to control the operation of the high-power relay and the low-power relay to complete the test of the object to be tested; The signal relay board is used to switch different test points on the object to be tested to complete the test of different test indexes of the object to be tested; The high-power relay is used to control the up and down movement of the cylinder; The low-power relay is used to control the operation of the high-power relay; The communicator is used for data communication between the power control board fixture and the object to be tested; The upper template is used to fix the first test pin plate; The cylinder is used to control the ascent and descent of the upper template, so that each first test pin of the first test pin plate is in close contact with each test point above the object to be tested and each second test pin of the second test pin plate is in close contact with each test point below the object to be tested, thereby completing the tests of different test indexes of the object to be tested; The power supply includes two digital power supplies and one fixture power supply. The digital power supply is used to supply power to the object to be tested, and the fixture power supply is used to supply power to the power control board test fixture.

[0009] Preferably, the power control board test device further includes a plurality of gratings; The gratings are used to identify whether there is a foreign object entering the test area during the start-up of the cylinder, and when it is identified that there is a foreign object entering the test area during the start-up of the cylinder, a signal is fed back to the computing device, so that the computing device cuts off the signal for controlling the operation of the cylinder.

[0010] Preferably, the power control board test fixture further includes a plurality of fans, and the fans are used to dissipate heat from the power control board test fixture.

[0011] Preferably, the power control board test fixture further includes a common button, a rising button, a descending button, a switch button, and an emergency stop button; The switch button is used to control the switch of the fixture power supply of the power control board test fixture; When the common button and the rising button are started together, they are used to control the ascent of the cylinder, so as to prevent an operator from accidentally entering the test area of the power control board fixture and causing harm; When the common button and the descending button are started together, they are used to control the descent of the cylinder, so as to prevent an operator from accidentally entering the test area of the power control board fixture and causing harm; The emergency stop button is used to control the cutting off of all the power supplies of the power control board test fixture.

[0012] Preferably, the power control board test fixture further includes a sound test module, and the sound test module is used to test the sound index of the object to be tested.

[0013] Preferably, the second test pin plate is set according to the shape of the object to be tested.

[0014] A multi-mode power control board test method is applied to the multi-mode power control board test system described in any one of the foregoing introductions. The method includes: Place the object to be tested on the test board of the power control board test fixture; Determine the test instructions for the object to be tested, where the test instructions for the object to be tested include test parameters for each test index of the object to be tested; According to the test instructions for the object to be tested, start the cylinder of the power control board test fixture, and bring the first test pin disk and the second test pin disk of the power control board test fixture into close contact with different test points of the object to be tested to test the object to be tested; Read and save the test data of the object to be tested; If abnormal information is identified in the test data of the object to be tested, display the abnormal test result of the object to be tested and provide a solution to the abnormal test that has occurred; Analyze and save the test data of the object to be tested and form a test report.

[0015] A multi-mode power control board test device, comprising: one or more processors, and a memory; The memory stores computer-readable instructions, and when the computer-readable instructions are executed by the one or more processors, the steps of the multi-mode power control board test method as described above are implemented.

[0016] A readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, the one or more processors are caused to implement the steps of the multi-mode power control board test method as described above.

[0017] As can be seen from the technical solutions introduced above, the multi-mode power control board test system provided by the embodiments of the present application includes a computing device, an electronic test device, and a power control board test fixture. Among them, the power control board test fixture is respectively connected to the electronic test device and the computing device; the computing device can be used to record test instructions corresponding to the object to be tested, and can control the power control board test fixture to test the object to be tested and control the electronic test device to read the measurement data of the power control board test fixture according to the test instructions of the object to be tested, save and analyze the measurement data collected by the electronic test device, and form a test analysis report of the object to be tested; the power control board test fixture includes a first test component and a second test component. Among them, the first test component includes a first test pin plate, a second test pin plate, a test board, and a single-chip microcomputer. The first test pin plate includes a plurality of first test pins, the second test pin plate includes a plurality of second test pins, the second test pin plate is placed in the test board, and the test board is used to place the object to be tested; the power control board test fixture is used to control the first test pin plate, the single-chip microcomputer, the second test pin plate, and the second test component to test at least one test index of the object to be tested according to the test instructions of the object to be tested. The electronic test device can be used to collect and display the test results of the object to be tested. Through the multi-mode power control board test system provided by the embodiments of the present application, multiple circuit parameters of the object to be tested can be tested in parallel. For mass-produced circuit boards, electronic components, etc., a large number of tests can be completed in a short time, can run according to a preset program, the test results are more accurate and stable, can be equipped with high-precision test instruments, can accurately measure tiny voltage and current changes, have the characteristics of high efficiency and stability, can reduce the test cost, can timely detect and eliminate defective circuit boards or electronic components, avoid defective products from flowing into the next process, thereby reducing the scrap rate and rework cost, can automatically record and store test data, facilitate subsequent data analysis and quality traceability, can help enterprises achieve statistical process control (SPC), optimize the production process, improve product quality, and can ensure that the conditions and methods of each test are exactly the same, ensuring the repeatability of test results; in summary, the multi-mode power control board test system provided by the embodiments of the present application has obvious advantages in terms of efficiency, accuracy, cost, data management, and repeatability, and is suitable for large-scale and high-precision circuit board production requirements. Description of the Drawings

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0019] Figure 1 Schematic diagram of a system architecture for implementing multi-mode power control board testing provided by an embodiment of the present application; Figure 2 and Figure 3 Schematic diagrams of the structures of a multi-mode power control board test fixture provided by embodiments of the present application respectively; Figure 4 Flowchart of a method for implementing multi-mode power control board testing provided by an embodiment of the present application; Figure 5 Schematic diagram of the structure of a multi-mode power control board test device exemplified by an embodiment of the present application; Figure 6 Hardware structure block diagram of a multi-mode power control board test device disclosed by an embodiment of the present application. Detailed implementation manners

[0020] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0021] In view of the fact that most current circuit test solutions are difficult to adapt to complex and changeable business requirements, for this reason, the applicant has studied a circuit test solution. This circuit test solution can test multiple circuit parameters in parallel. For circuit boards in mass production, a large number of tests can be completed in a short time. It can run according to a preset program, and the test results are more accurate and stable. It can be equipped with high-precision test instruments and can accurately measure tiny voltage and current changes. It has the characteristics of high efficiency and stability, can reduce test costs, can timely detect and eliminate defective circuit boards, avoid defective products from flowing into the next process, thereby reducing the scrap rate and rework costs. It can automatically record and store test data, facilitating subsequent data analysis and quality traceability, and can help enterprises achieve statistical process control (SPC), optimize production processes, and improve product quality. It can ensure that the conditions and methods of each test are completely consistent, ensuring the repeatability of test results. In summary, the multi-mode power control board test system provided by the embodiments of the present application has obvious advantages in terms of efficiency, accuracy, cost, data management, and repeatability, and is suitable for large-scale and high-precision circuit board production requirements.

[0022] The method provided by the embodiments of the present application can be used in many general or special computing device environments or configurations. For example: personal computers, server computers, handheld devices or portable devices, tablet devices, multi-processor devices, distributed computing environments including any of the above devices or equipment, and so on.

[0023] An embodiment of the present application provides a multi-mode power control board testing method. This method can be applied to various circuit board detection systems, and can also be applied to various computer terminals or intelligent terminals. The execution subject can be the processor or server of a computer terminal or an intelligent terminal.

[0024] In the actual application process, circuit board testing mainly relies on manual measurement by technicians. Manual measurement requires operators to measure each parameter on the circuit board one by one, such as voltage, current, resistance, etc. For complex circuit boards, there are numerous measurement points, and manual operation will consume a large amount of time. For example, during mass production of circuit boards, manual measurement will seriously slow down the production progress and cannot meet the requirements of large-scale production. It is difficult to measure multiple parameters simultaneously by manual measurement. Usually, it is necessary to measure them one by one in sequence, which further reduces the measurement efficiency.

[0025] Furthermore, the measurement accuracy of manual measurement is also limited. The accuracy of manual measurement largely depends on the skills and experience of the operator. Fatigue, inattention, or unskilled operation of the operator may all lead to measurement errors. For example, when reading the values on a multimeter, different operators may have different readings, especially when measuring tiny voltages or currents, this kind of error is more obvious.

[0026] Furthermore, in the actual application process, the accuracy of manual measurement instruments is also limited. For example, manual measurement usually uses handheld measurement instruments, and the accuracy of these instruments is generally lower than that of professional automatic test equipment. For the measurement of high-precision circuit boards, manual measurement is difficult to meet the requirements.

[0027] There are also inconveniences in the data recording and management of manual measurement. For example, the data of manual measurement is usually manually recorded by the operator, and it is easy to have problems such as recording errors, unclear handwriting, or incomplete records. For example, when recording a large amount of measurement data, there may be problems such as data omission or incorrect recording position. And the data manually recorded is difficult to store and manage effectively. When it is necessary to trace the data or conduct data analysis, the workload of searching and organizing the data is large and the efficiency is low.

[0028] The repeatability of manual measurement is poor. It is difficult to ensure that the conditions of each measurement are exactly the same in manual measurement. Factors such as probe contact pressure and measurement environment will all affect the measurement results. For example, different positions and pressures of the probe contacting the circuit board each time may lead to fluctuations in the measurement results. Different measurement techniques and habits of different operators will result in poor repeatability of the measurement results, which is not conducive to quality control.

[0029] In summary, manual measurement of circuit board parameters has obvious drawbacks in terms of efficiency, accuracy, data management, and repeatability, and it is gradually difficult to meet the needs of modern electronic manufacturing. Therefore, there is an urgent need for an automatic measurement method that can achieve high efficiency and high accuracy in batch processing.

[0030] The following will introduce, in combination with Figure 1 , an optional system architecture provided by the embodiments of the present application that can automatically test various indicators of circuit boards or electronic components. As Figure 1 shown, this system architecture may include a computing device, an electronic test device, and a power control board test fixture.

[0031] Among them, the power control board test fixture is respectively connected to the electronic test device and the computing device.

[0032] In the actual application process, the computing device can be used to record test instructions corresponding to the object to be tested, and according to the test instructions of the object to be tested, control the power control board test fixture to test the object to be tested and control the electronic test device to read the measurement data of the power control board test fixture, save and analyze the measurement data collected by the electronic test device, and form a test analysis report corresponding to the object to be tested.

[0033] In the actual application process, when the object to be tested is a circuit board or a power control board, the quality of the circuit board or the power control board can be traced by saving the test results of the circuit board or the power control board. For each circuit board or power control board, there are detailed test data records, which can clearly indicate whether it meets the quality standards. For example, in the mass production of electronic products, if there are quality problems with a certain batch of circuit boards or power control boards, the root cause of the problem can be found by referring to the previously saved test results, whether it is a general abnormality of a specific test index or a special situation of individual circuit boards or power control boards.

[0034] Furthermore, analyzing the test results of circuit boards or power control boards helps to establish quality control standards. Based on historical test data, a reasonable range of test indicators and the impact of different indicators on the overall quality of the product can be determined. For example, for high-precision electronic device circuit boards or power control boards, by analyzing the test results of parameters such as voltage and current, a more stringent quality control range can be determined to ensure the stability of product quality.

[0035] Furthermore, saving the test results of the object to be tested can serve as an important basis for fault diagnosis. For example, when the object to be tested is a circuit board or a power control board, when a fault occurs during the use of the circuit board or power control board, comparing the test data of the faulty circuit board or power control board with the historical data of the normal circuit board or power control board can quickly locate the fault point. For example, if the current test result of a circuit board or power control board is much higher than the normal range, combined with the previous test data and circuit principles, it may be quickly determined that a certain component is short-circuited or there is a circuit design defect.

[0036] Furthermore, analyzing the test results can reveal potential quality problem trends. For example, through statistical analysis, it can be observed whether certain test indicators have a tendency to gradually deviate from the normal range, so as to take measures in advance to prevent large-scale failures. For example, if it is found that the capacitance value of a certain type of circuit board gradually decreases during multiple tests, the production process can be adjusted in time or the capacitor supplier can be replaced to avoid circuit board failures caused by capacitor failure.

[0037] Furthermore, analyzing the test results of the object to be tested can provide data support for the improvement of the production process. For example, when the object to be tested is a circuit board, by comparing the test results of circuit boards on different production lines or in different production batches, it can be found that certain production links may affect the performance of the circuit board. If the resistance values of the circuit boards produced by a production line deviate greatly, there may be problems with the soldering process or component selection on this production line, and thus targeted improvements can be made. Moreover, for new production processes or new circuit board designs, the analysis of test results can verify their feasibility. Comparing the test results of circuit boards using the new process or new design with the traditional ones to evaluate whether the new process or new design can improve the performance of the circuit board or reduce costs. For example, after introducing a new surface mount technology, by analyzing the electrical performance test results of the circuit board, it is determined whether this technology can effectively improve production efficiency and product quality.

[0038] Saving and analyzing test results helps reduce production costs. By accurately locating quality problems, the scrap rate is reduced. For example, if the problem causing the short circuit of the circuit board can be discovered and solved in time by analyzing the test results, a large number of circuit boards can be prevented from being scrapped due to short circuit faults, thus saving raw materials and production costs. The test process itself can be optimized based on the test results. If it is found that certain test indicators are almost normal during multiple tests, or can be indirectly inferred through other indicators, these test steps can be considered simplified to improve test efficiency and thus reduce test costs.

[0039] During the R & D stage of a circuit board or a power control board, saving and analyzing the test results of the circuit board is crucial for verifying whether the design meets the requirements. By testing and analyzing the performance indicators of the circuit board under different design schemes, such as signal integrity, frequency response, etc., the optimal design scheme can be selected. For example, when designing a high-speed digital circuit board, by testing and analyzing the signal integrity test results under different wiring schemes, the wiring method that can achieve the best signal transmission quality can be determined.

[0040] When the circuit board or the power control board needs to be functionally upgraded, the previous test results can help engineers understand the performance bottlenecks of the circuit board and the directions for improvement. For example, when adding signal processing functions to the circuit board, by analyzing the previous frequency response test results, it can be determined whether it is necessary to modify the existing circuit or add new components to meet the new functional requirements.

[0041] Therefore, the computing device provided in the embodiments of the present application can be used to save and analyze the test results of the object to be tested and form a test analysis report of the object to be tested.

[0042] An electronic test device is used to collect and display the test results of the object to be tested; for example, the electronic test device can be an oscilloscope or a multimeter, which can be used to collect or display the test results of the object to be tested.

[0043] The test fixture for the power control board includes a first test component and a second test component. Among them, the first test component includes a first test pin plate, a second test pin plate, a test board, and a single-chip microcomputer. The first test pin plate includes a number of first test pins, and the second test pin plate includes a number of second test pins. The second test pin plate is placed in the test board, and the test board is used to place the object to be tested; the test fixture for the power control board is used to control the first test pin plate, the single-chip microcomputer, the second test pin plate, and the second test component according to the test instructions of the object to be tested to test at least one test index of the object to be tested.

[0044] Among them, the second test component includes a signal relay board, a high-power relay, a low-power relay, a cylinder, a communicator, a power supply, and an upper template. Based on this, the process of the test fixture for the power control board controlling the first test pin plate, the single-chip microcomputer, the second test pin plate, and the second test component according to the test instructions of the object to be tested to test at least one test index of the object to be tested can include the following: The first test needle plate and the second test needle plate are responsible for testing different test indexes of the object to be tested; the single-chip microcomputer is responsible for controlling the operation of the high-power relay and the low-power relay to complete the test of the object to be tested; when different test indexes need to be switched, the signal relay board is responsible for switching different test points on the object to be tested to complete the test of different test indexes of the object to be tested; the high-power relay is responsible for controlling the rise and fall of the cylinder; the low-power relay is responsible for controlling the operation of the high-power relay; the communicator is responsible for enabling data communication between the power control board fixture and the object to be tested; the upper template is responsible for fixing the first test needle plate; the cylinder is responsible for controlling the rise and fall of the upper template so that each first test needle of the first test needle plate is in close contact with each test point above the object to be tested and each second test needle of the second test needle plate is in close contact with each test point below the object to be tested to complete the test of different test indexes of the object to be tested; the power supply includes two digital power supplies and a fixture power supply, the digital power supply is responsible for supplying power to the object to be tested, and the fixture power supply is responsible for supplying power to the power control board test fixture.

[0045] For example, the test indexes to be tested may include the frequency, programming, voltage, current, resistance, sound, impedance, resistance value, network port test, digital IO port test, USB test, and serial port test of the object to be tested. For example, the power control board test fixture of the present application may include the following types of test circuits: 1. Voltage test circuit: (1) DC voltage test circuit: voltage divider circuit and operational amplifier circuit; The voltage divider circuit is a simple and common circuit composed of two series resistors. By measuring the voltage across one of the resistors and according to the voltage distribution principle of the series circuit, the input voltage can be calculated. For example, in a voltage divider circuit composed of a 10kΩ and a 20kΩ resistor in series, if the voltage across the 10kΩ resistor is measured as 5V, the input voltage is 15V. This circuit is suitable for measuring higher DC voltages, and the measurement range can be changed by selecting appropriate resistor values.

[0046] The operational amplifier circuit uses the voltage follower or proportional amplification characteristics of the operational amplifier to measure voltage. The voltage follower (such as composed of an operational amplifier such as LM324) can output the input voltage almost without attenuation, which is used for buffering and isolating the measured voltage to improve the measurement accuracy. The proportional amplification circuit can amplify or reduce the input voltage as needed to facilitate the measurement of small or large voltages.

[0047] (2) AC voltage test: rectification-filtering-voltage division circuit and true RMS conversion circuit; Rectification-filtering-voltage divider circuit For AC voltage measurement, the AC is first converted to DC through a rectifier circuit (such as a bridge rectifier), and then the ripple is removed by a filter capacitor, and then measured through a voltage divider circuit. For example, in a simple AC voltage measurement circuit, the AC voltage is rectified by a rectifier bridge, filtered by a large-capacity capacitor, and then passed through a voltage divider composed of 1kΩ and 9kΩ resistors. The voltage across the 1kΩ resistor is measured, and the effective value of the AC voltage is calculated.

[0048] True RMS conversion circuit In some situations where the effective value of AC voltage needs to be accurately measured, a true RMS conversion chip (such as AD637) is used. This circuit can convert an AC signal of any waveform into a DC signal proportional to its effective value, without being affected by the signal waveform, thereby accurately measuring the AC voltage.

[0049] 2. Current test circuit (1) Series resistance method test circuit: The series resistance method is the simplest current measurement method. A precision resistor with a small resistance value (called a sampling resistor) is connected in series in the current branch to be measured. The voltage across the sampling resistor is measured and the current is calculated according to Ohm's law (I = V / R). For example, if a 0.1Ω sampling resistor is connected in series and the voltage across it is measured to be 0.5V, the current is 5A. This method is suitable for DC and AC current measurements, but it may introduce large errors for small current measurements.

[0050] (2) Current transformer circuit: For large AC current measurement, the current transformer circuit is a commonly used circuit. It consists of a primary coil (connected in series in the current branch to be measured) and a secondary coil. According to the principle of electromagnetic induction, the secondary coil induces a current proportional to the primary current, and the primary current is indirectly measured by measuring the secondary current. For example, if the transformation ratio of a current transformer is 100:1, if the current measured by the secondary coil is 0.5A, then the primary current is 50A.

[0051] (3) Hall effect current sensor circuit: Hall effect current sensor has a good application in both DC and AC current measurement. It is based on the Hall effect. When current passes through a current-carrying conductor, a Hall voltage is generated in the direction perpendicular to the current and magnetic field. The current is determined by measuring the Hall voltage. For example, in a linear Hall effect current sensor, its output voltage is linearly related to the measured current, and the current can be accurately measured based on the sensitivity coefficient of the sensor.

[0052] 3. Resistance test circuit (1) Wheatstone bridge circuit: The Wheatstone bridge circuit is a classic resistance measurement circuit. It consists of four resistors forming a quadrilateral bridge, where one is the resistor under test and the other three are standard resistors with known resistance values. By adjusting one of the standard resistors (usually a variable resistor) to balance the bridge (i.e., the potentials at both ends of the diagonal are equal), the resistance value of the resistor under test is calculated according to the bridge balance condition (such as R1 / R2 = R3 / R4). For example, in a Wheatstone bridge, R1 = 100Ω, R2 = 200Ω, R3 is a variable resistor, and R4 is the resistor under test. When R3 is adjusted to 200Ω to balance the bridge, R4 can be calculated as 400Ω.

[0053] (2) Ohmmeter circuit: The most common is the ohmmeter range circuit in a multimeter. It generally adopts the combination of a constant current source and a voltmeter. The constant current source provides a known current to pass through the resistor under test, and then the voltage across the resistor is measured by the voltmeter, and the resistance value is calculated according to Ohm's law. For example, if the constant current source outputs 1mA current and the measured voltage across the resistor is 5V, then the resistance value is 5kΩ.

[0054] 4. Logic function test circuit (1) Logic analyzer circuit: This is a complex test circuit used to analyze logic signals in digital circuits. It can simultaneously collect multiple digital signal channels and record the level changes and timing relationships of the signals. For example, when testing a complex digital system (such as a CPU chip), the logic analyzer can capture the signal changes at the chip pins and determine whether the logic function is correct by analyzing these signals, such as checking whether the data transmission conforms to the protocol and whether the control signals are executed in sequence.

[0055] (2) Simple logic level test circuit: For simple logic circuits, a test circuit can be composed of a light-emitting diode (LED) and a current-limiting resistor. Connect the anode of the LED to the logic high-level output terminal, and the cathode to the ground through the current-limiting resistor. If the output is high level, the LED lights up, indicating that the logic output is correct; if the LED does not light up, there may be a logic error. This circuit is simple and intuitive and is suitable for initially checking the output state of logic circuits.

[0056] 5. Analog function test circuit (1)Amplifier test circuit: For an amplifier, its performance such as amplification factor and bandwidth is mainly tested. An input signal can be provided by a signal generator, and then the amplitudes of the input and output signals are measured with an oscilloscope to calculate the amplification factor. For example, if the signal generator outputs a sine wave signal of 10 mV and the amplifier output measured by the oscilloscope is a sine wave signal of 1 V, then the amplification factor is 100 times. The bandwidth test is carried out by changing the frequency of the input signal and observing the frequency at which the amplitude of the output signal drops to \(1 / \sqrt{2}\) times (about 0.707 times), which is the bandwidth of the amplifier.

[0057] (2)Filter test circuit: For a filter, a signal generator is also used to provide the input signal, and the waveforms and amplitude changes of the input and output signals are observed with an oscilloscope. For example, for a low-pass filter, when the signal generator outputs a high-frequency signal, it can be observed through the oscilloscope that the amplitude of the output signal decreases significantly to verify the filtering characteristics of the filter. At the same time, by changing the frequency of the input signal, the frequency response curve of the filter can be plotted to accurately evaluate its performance.

[0058] During the actual application process, the test fixture for the power control board of the present application can support measuring at least two test indexes of the object to be tested simultaneously.

[0059] As Figure 2 shown in an example of the test fixture for the power control board, the test fixture for the power control board provided by the embodiment of the present application may include a base and a frame. Among them, an up button 1, a down button 2, an emergency stop button 3, a common button 4, a switch button 5, a second test pin board 6, and a test board 7 are deployed on the base, and two gratings 8 are deployed on both sides in the frame, and a first test pin board 9, an upper template 10, and a cylinder 11 are deployed above in the frame. Among them, the switch button 5 can be used to control the fixture power switch of the test fixture for the power control board; when the common button 4 and the up button 1 are started together, they can be used to control the rising of the cylinder to prevent operators from accidentally entering the test area of the test fixture for the power control board and causing harm; when the common button 4 and the down button 2 are started together, they can be used to control the descending of the cylinder to prevent operators from accidentally entering the test area of the test fixture for the power control board and causing harm; the emergency stop button 3 can be used to control the cutting off of all the power of the test fixture for the power control board. The first test pin board 9 may include a number of first test pins, and the second test pin board 6 includes a number of second test pins. The first test pin board 9 and the second test pin board 6 are used to test different test indexes of the object to be tested.

[0060] In the actual application process, the probe is a key component of each test probe plate and is used to contact the test points on the object to be tested. The probe is usually made of a metal material with high hardness and high electrical conductivity (such as tungsten steel or beryllium copper). It has various shapes, and the common ones are needle-shaped or spring-needle-shaped. The needle-shaped probe is suitable for test points with a larger contact area, while the spring-needle-shaped probe has elasticity, can better adapt to test points at different heights, and can compensate for the contact pressure to a certain extent.

[0061] The probes are arranged on the test probe plate according to the layout of the test points of the object to be tested. To ensure that multiple test points can be tested simultaneously, the arrangement of the probes needs to match the design of the object to be tested. In some high-precision test molds, the layout of the probes may be made by precision machining or 3D printing and other technologies according to the CAD drawings of the circuit board to ensure that each probe can accurately contact the corresponding test point.

[0062] In the actual application process, manual control, semi-automatic control or full-automatic control methods can be adopted to control the test head to test the object to be tested. For example, in this application, the cylinder can be used to achieve the contact of the first test probe plate and the second test probe plate with each test point of the object to be tested.

[0063] The second test probe plate 6 can be placed in the test board 7, and the test board 7 is used to place the object to be tested.

[0064] In the actual application process, different power control boards to be tested may have various shapes and sizes, and the distribution of their test points is also different. To improve the test accuracy, avoid damaging the test object, improve the test efficiency, and improve the versatility of the power control board test fixture of this application, the shape of the second test probe plate of this application and the deployment strategy of each second test probe can be set according to the shape of the object to be tested. Setting the shape of the second test probe plate and the probe deployment strategy according to the shape of the object to be tested can make the test probe contact the test points on the control board comprehensively and accurately. For example, for a power control board with an irregular shape, designing the test probe plate into a matching shape and arranging the probes reasonably can ensure that each test point can be accurately touched by the probe, thus achieving a comprehensive electrical connection and avoiding test blind spots. By customizing the test probe plate and probe deployment according to the shape of the object to be tested, the contact resistance and signal transmission error in the test process can be minimized. When the contact position and angle of the test probe and the test point are accurately matched, a stable and reliable electrical connection can be ensured, improving the quality and accuracy of the test signal. This is very important for accurately measuring various parameters of the power control board, such as voltage, current, resistance, etc., and helps to accurately judge whether the control board meets the quality standards.

[0065] An unreasonable test probe tray shape and probe deployment may cause damage to the power control board to be tested. For example, if the probes are unevenly distributed or do not match the shape of the control board, uneven pressure may be exerted on the control board during the test, resulting in deformation of the circuit board, solder joint detachment, or damage to electronic components. By setting according to the shape of the object to be tested, the pressure can be evenly distributed, reducing the risk of damage to the control board and protecting the integrity and performance of the test object.

[0066] The customized second test probe tray can be quickly and accurately docked with the object to be tested, reducing the adjustment and alignment time before testing. At the same time, since the probe deployment strategy is optimized based on the shape of the control board and the distribution of test points, multiple test points can be measured in one go, avoiding repeated adjustments and multiple tests, thereby improving the overall test efficiency and saving test time and costs.

[0067] Although the test probe tray is set according to the shape of a specific object to be tested, through reasonable design and modular structure, the versatility of the fixture can be achieved to a certain extent. For example, for some power control boards with similar shapes but slightly different sizes, the position of some probes on the test probe tray can be adjusted or some modules can be replaced to make it suitable for different test objects, reducing the cost of designing a separate test fixture for each different-shaped control board.

[0068] As Figure 3 shown in the structural schematic diagram of the power control board test fixture, inside the power control board test fixture, there are a single-chip microcomputer, a signal relay board, high-power relays, low-power relays, and a communicator.

[0069] Among them, the single-chip microcomputer can be used to control the operation of high-power relays and low-power relays to complete the test of the object to be tested.

[0070] A microcontroller unit (MCU), also known as a microcontroller, is a microcomputer system that integrates functions such as a central processing unit (CPU), random access memory (RAM), read-only memory (ROM), multiple input / output interfaces (I / O interfaces), and an interrupt system on a single chip. The central processing unit (CPU) in the microcontroller is the core component, responsible for executing instructions, performing data operations and logical judgments, etc., and directing the operation of the entire microcontroller system. The memory in the microcontroller includes program memory (ROM) and data memory (RAM). The program memory is used to store the written program code, and these codes will be loaded into the CPU for execution after the microcontroller is powered on; the data memory is used to store temporary data, variables, etc. generated during the program operation. Therefore, in the actual application process, different test instruction codes can be set according to the actual application requirements and stored in the microcontroller. When different indicators of the object to be tested need to be tested, different test instruction codes can be switched to for testing.

[0071] The input / output interface (I / O interface) of the microcontroller is the bridge for the microcontroller to communicate with external devices. Through the I / O interface, the microcontroller can connect various input devices, such as buttons, sensors, etc., to receive external signals and data; at the same time, it can also connect various output devices, such as displays, motors, relays, etc., to control the working states of these devices and realize various functions. Therefore, the microcontroller in the test fixture of this application can control the operation of high-power relays and low-power relays to complete the test of the object to be tested.

[0072] The microcontroller can also have an interrupt system. The interrupt system allows external devices or internal events to interrupt the program being executed by the CPU, and then execute the corresponding interrupt service program. After processing the interrupt event, it returns to the original program to continue execution. This can improve the real-time response ability of the microcontroller and handle various emergency events in a timely manner.

[0073] Generally speaking, the working process of the microcontroller in the power control board test fixture of this application is a process of continuously fetching and executing instructions. First, the program code is stored in the program memory. When the microcontroller is powered on and reset, the CPU will start reading instructions from the specified address in the program memory, then decode the instructions, and perform corresponding operations according to the functions of the instructions, such as performing data operations, controlling the I / O interface to output signals, accessing the memory, etc. After executing an instruction, the CPU will automatically point to the address of the next instruction and continue to repeat the above process until the program execution is completed or a halt instruction is encountered.

[0074] When it is necessary to test different test indicators on the object to be tested, it may be necessary to switch different test points on the object to be tested. Therefore, the signal relay board can be used to switch different test points on the object to be tested to complete the test of different test indicators of the object to be tested. The signal relay board is a circuit board integrating multiple signal relays and plays an important role in various electrical control systems. The signal relay board mainly consists of signal relays, printed circuit boards, terminal blocks, etc. The signal relay is the core component and is composed of an electromagnetic system and a contact system. The printed circuit board is used to connect each component to achieve electrical connection and signal transmission. The terminal block is used to connect the external circuit.

[0075] It works based on the principles of electromagnetic induction and contact control. When a certain voltage is applied to the coil of the signal relay, the coil generates an electromagnetic effect to attract the armature, driving the moving contact to engage with the static contact, thus conducting the circuit. After the coil is powered off, the electromagnetic attraction disappears, and the armature resets under the reaction force of the spring, separating the moving contact from the static contact and cutting off the circuit. The signal relay board can convert digital signals into analog signals or perform conversions of different level signals to meet the requirements of different devices for signal types and levels. It can achieve electrical isolation between input and output signals, improve the anti-interference ability of the system, and protect the backend devices from interference and damage by the front-end signals. It can amplify weak signals and enhance the driving ability of the signals to better control load devices or transmit them over longer distances. It can also perform logical operations such as AND, OR, and NOT through the combination of multiple signal relays to complete complex control logics, such as the start-stop and sequential control of devices in an industrial automation production line. Therefore, by controlling the signal relay board through a single-chip microcomputer in this application, it is possible to switch different test points on the object to be tested to complete the test of different test indicators of the object to be tested.

[0076] In the actual application process, in order to make each different test point of the object to be tested be in close contact with each test needle, the rise and fall of the cylinder can be controlled by a high-power relay to make the cylinder press down to promote the close contact between the first test needle plate and the second test needle plate and different test points on the object to be tested. Considering factors such as control cost and operation safety, the test fixture of the power control board in this application uses a low-power relay to control the operation of the high-power relay.

[0077] In the actual test process, the rise and fall of the cylinder usually require a large amount of power to drive. The high-power relay has a high current and voltage tolerance and can meet the power requirements during the operation of the cylinder, ensuring that the cylinder can work stably and reliably.

[0078] Furthermore, during the circuit board testing process, the air cylinder may need to rise and fall frequently to achieve the contact and separation between the object to be tested and the test probe board. High-power relays can withstand frequent switching operations, and their mechanical and electrical lifetimes are relatively long, enabling them to adapt to such high-frequency operations. Moreover, high-power relays can achieve electrical isolation between the control circuit and the air cylinder drive circuit, preventing strong electricity from interfering with or damaging the control circuit and protecting other components in the control circuit.

[0079] However, using a low-power relay to control a high-power relay can effectively reduce the power requirement for the control signal. The control signals output by control circuits (such as PLCs, single-chip microcomputers, etc.) are usually of low power and are difficult to directly drive high-power relays. The coil of a low-power relay requires less driving power and can match the output signal of the control circuit. By using a low-power relay as an intermediate link, a small control signal can be used to control the operation of the high-power relay. Further, using a low-power relay can conveniently achieve logic control and signal conversion. Complex logic control, such as time control and sequence control, can be achieved through the combination of multiple low-power relays, thereby more flexibly controlling the operation of the high-power relay to meet different test requirements. In addition, low-power relays are small in size, fast in operation speed, and can play a certain buffering and isolation role in the control circuit. When the control signal is abnormal, the low-power relay can react first, avoiding directly affecting the high-power relay and the air cylinder drive circuit, thus improving the safety and reliability of the entire test fixture.

[0080] In addition, the cost of low-power relays is relatively low. If high-power relays are directly used for complex logic control, multiple high-power relays may be required, resulting in a high cost. However, using low-power relays for logic control and then using low-power relays to control high-power relays can reduce the cost of the entire test fixture while meeting the control requirements.

[0081] In the test fixture for the power control board, communication with the object to be tested is often required. Based on the actual requirements during the testing process, a Canbus communicator is deployed in the test fixture of this application. The communicator can be used for data communication between the power control board fixture and the object to be tested.

[0082] The Canbus communicator, namely the CAN bus communicator, is a device used for data transceiver and protocol processing in the CAN bus network.

[0083] The CAN (Controller Area Network) bus is a serial communication protocol that transmits data using differential signals and communicates in a two-wire (CAN_H and CAN_L) manner. The core principle of the CANbus communicator is to convert the digital signals generated by a microcontroller or other devices into electrical signals compliant with the CAN bus protocol for transmission on the bus, and at the same time convert the received CAN bus electrical signals into digital signals for device processing. The communication process is based on a non-destructive arbitration mechanism. When multiple nodes attempt to send data simultaneously, the node with a higher priority can preferentially occupy the bus for data transmission.

[0084] The Canbus communicator consists of a Can controller, a microprocessor, an interface circuit, and a Can transceiver. The Can controller is the core component of the communicator and is responsible for implementing the physical layer and data link layer functions of the CAN protocol. It can handle operations such as the format of CAN frames, error detection, and arbitration to ensure reliable data transmission on the bus. The main function of the Can transceiver is to convert the digital signals output by the CAN controller into differential signals suitable for transmission on the CAN bus, and at the same time convert the received differential signals into digital signals and input them to the CAN controller, playing a role in electrical isolation and signal driving, improving the anti-interference ability and transmission distance of the bus. The microprocessor is used to configure and manage the CAN controller, process the received data, and forward, store, or interact with other devices as needed. The interface circuit provides interfaces for connecting to external devices (such as computers, industrial controllers, etc.). Common interface types include USB, RS232, Ethernet, etc., facilitating users to transmit and monitor data. The Canbus communicator can achieve data communication between devices, accurately transmit the data generated by one node to other nodes, and can also perform data conversion and communication between devices with different protocols. For example, convert the data of the CAN bus protocol into the data of the Ethernet protocol for connection to a remote monitoring system. It can monitor the working status of the CAN bus network, detect and diagnose faults on the bus. When an error or anomaly occurs on the bus, the communicator can promptly issue an alarm and provide fault information to help maintenance personnel quickly locate and solve problems. It can also record and analyze the data transmitted on the CAN bus, providing a basis for system debugging, optimization, and fault troubleshooting. By analyzing the change trends and abnormal situations of the data, the operating status and performance of the system can be deeply understood.

[0085] In industrial production lines, the CANbus communicator is used to connect various sensors, actuators, controllers, etc. to achieve real-time communication and automated control between devices. It can improve production efficiency, reduce costs, and enhance the reliability and stability of the system.

[0086] Since the CAN bus uses differential signal transmission, it has strong anti-interference ability and can transmit data stably and reliably in a complex electromagnetic environment. In the power control board test environment, there may be various electromagnetic interferences, such as power supply noise, interference generated by switch actions, etc. The high reliability of the CAN bus can ensure the accuracy and stability of communication, reduce data transmission errors, and guarantee the reliability of test results. The CAN bus adopts a non-destructive bus arbitration technology, which can access the bus according to the priority of messages. High-priority messages can be transmitted first, thus ensuring the real-time performance of the system. During the power control board test process, it may be necessary to obtain the status information, parameter data, etc. of the object to be tested in real time. The real-time performance of the CAN bus can meet this requirement, enabling testers to understand the test situation in a timely manner. The CAN bus supports multiple nodes to be connected to the bus simultaneously for communication, and can connect up to 110 nodes at most. In the power control board test fixture, it may be necessary to communicate with multiple objects to be tested simultaneously, or to interact with other test devices (such as sensors, actuators, etc.). The multi-node communication ability of the CAN bus can meet this complex communication requirement.

[0087] According to the actual requirements during the test process, through the CAN bus communicator, various parameters of the power control board to be tested can be conveniently configured and read. For example, set parameters such as the output voltage, current, and frequency of the power supply, and read the actual output value, working status, fault information, etc. of the power supply. This helps testers comprehensively understand the performance and working conditions of the power control board and conduct accurate tests and evaluations. Using the CAN bus communicator, remote control and monitoring of the power control board can be achieved. Testers can send control instructions through the host computer software at a place far from the test site to control operations such as the start, stop, and reset of the power control board; at the same time, monitor the operating status and parameter changes of the power control board in real time to detect and handle abnormal situations in a timely manner. In an automated test system, the CAN bus communicator can serve as a communication bridge between the test fixture and the test device to achieve automated control of the test process. By writing test programs, automatically send test instructions, collect test data, and analyze test results, improve test efficiency and accuracy, and reduce manual intervention and errors.

[0088] Furthermore, the CAN bus is an international standard serial communication protocol with good compatibility and interchangeability. Many power control boards support the CAN bus communication interface. Using the CAN bus communicator can facilitate communication with power control boards of different manufacturers and different models, improving the versatility and applicability of the test fixture.

[0089] Among them, the upper template is used to fix the first test needle plate; in the power control board test fixture, using the upper template to fix the first test needle plate can ensure the position accuracy of the test probes. Each test point on the power control board has a relatively high position accuracy requirement. The upper template can accurately position each first test probe to ensure that each first test probe is accurately aligned with the corresponding test point on the power control board. This helps to improve the accuracy and reliability of the test and avoid test errors or poor contacts caused by the position deviation of the first test probes. Further, during the test process, it is necessary to ensure a stable contact between the test probes and the test points. The upper template can provide a stable support for the test probes, preventing the probes from shaking, displacing or tilting during the test, thus ensuring the stable transmission of test signals and reducing the errors and uncertainties of the test results. The upper template can provide a standardized installation interface for the first test needle plate, making the installation and disassembly of the test needle plate more convenient and fast. When it is necessary to replace the test needle plate or perform maintenance or repair on it, it can be easily removed from the upper template without affecting other components. At the same time, the standardized installation method also helps to improve the versatility and maintainability of the test fixture. The upper template can play a certain protective role for each first test probe and the power control board. It can prevent the test probes from being damaged by external collisions when not in use, and at the same time can also avoid friction or collision between the power control board and other components during the test, thus protecting the electronic components and circuits on the circuit board from damage. By fixing the first test needle plate with the upper template, rapid positioning and connection to the power control board for testing can be achieved. During batch testing, it can improve the test efficiency, reduce the test preparation time, and make the test process more standardized and normalized.

[0090] In the actual application process, in the power control board test fixture, in order to achieve automated operation and precise control of the test process, a cylinder can be used to realize the automated operation and precise control during the test. In the actual application process, the cylinder can provide stable and relatively powerful power, which can be used to drive the first test probe plate to contact or separate from the power control board. By controlling the extension and retraction of the cylinder, each first test probe can be accurately pressed on the test points of the power control board, and at the same time, it can ensure that each second test probe makes contact with the test points of the object to be tested, ensuring good electrical connection for various tests. Compared with manual operation, the power provided by the cylinder is more uniform and stable, which can ensure that the contact pressure between the test probe and the test point is consistent during each test, thereby improving the accuracy and repeatability of the test results. The moving distance and speed of the first test probe plate can be precisely controlled by adjusting parameters such as the air pressure and stroke of the cylinder. This is very important for ensuring that each first test probe is accurately aligned with the test points on the power control board, avoiding damage to the test points or affecting the test results due to excessive pressing or inaccurate contact positions. At the same time, precise control also helps to achieve an automated test process and improve test efficiency. By adjusting the stroke of the cylinder and related fixtures, it is convenient to adapt to the test requirements of power control boards with different sizes, thicknesses, and shapes. Only by replacing the corresponding fixtures or adjusting the parameters of the cylinder can the test of different specifications of circuit boards be quickly switched, improving the versatility and flexibility of the test fixture.

[0091] In the actual application process, the cylinder has a fast action speed and can complete the rising and falling actions of the first test probe plate within a short time, realizing a fast test cycle. When batch testing power control boards, it can greatly improve test efficiency and reduce test time and costs. Moreover, the cylinder can be integrated with an automated control system to achieve the automation of the entire test process, further improving production efficiency. And the operation of the cylinder can be controlled through an electrical control system and can be linked with other safety devices of the test fixture (such as emergency stop buttons, safety light curtains, etc.). During the test process, if an abnormal situation occurs, the safety device can be triggered in time to stop the action of the cylinder, avoiding harm to the operator and test equipment and ensuring the safety of the test process.

[0092] Therefore, the test fixture of the present application controls the rising and falling of the upper template through a cylinder, so that each first test probe of the first test probe plate is in close contact with each test point above the object to be tested and each second test probe of the second test probe plate is in close contact with each test point below the object to be tested to complete the test of different test indexes of the object to be tested.

[0093] The power supply of the power control board test fixture of the present application includes two digital power supplies and a fixture power supply. Among them, the two digital power supplies can be externally connected to the outside of the power control board test fixture or built into the inside of the power control board test fixture. The two digital power supplies can be used to supply power to the object to be tested, and the fixture power supply can be used to supply power to the power control board test fixture. Using two different power supplies for power supply can effectively ensure the smooth progress of the test process.

[0094] To avoid test safety accidents during actual application, the power control board test device of the present application further includes a number of light grids; the light grids are used to identify whether there are foreign objects entering the test area during the start of the cylinder. If it is identified that there are foreign objects entering the test area during the start of the cylinder, the signal can be fed back to the computing device so that the computing device controls the single-chip microcomputer to cut off the signal for controlling the operation of the cylinder. To avoid the situation of accidentally pressing the operator.

[0095] For example, during the operation of the power control board test fixture, there may be safety risks such as pinching or squeezing the operator's hand, especially when the cylinder drives the test needle plate to move up and down. The light grid can emit and receive infrared light to form a protective light curtain. When an object blocks the light in the light curtain, the light grid will immediately detect it and transmit the signal to the computing device. After receiving the signal, the computing device will quickly stop the relevant moving parts of the power control board test fixture, such as the action of the cylinder, thus avoiding harm to the operator. In industrial production, safety is of utmost importance. Using the light grid can make the power control board test fixture meet relevant safety standards and specification requirements, such as mechanical safety standards, electrical safety standards, etc. This not only helps to ensure the life safety and physical health of the operator, but also enables the enterprise to avoid legal risks and economic losses caused by safety problems.

[0096] Furthermore, during the test of the power control board, the internal electronic components will consume electrical energy and generate heat. If this heat cannot be dissipated in time, it will cause the temperature of the control board to rise. Excessive temperature will affect the performance and lifespan of the electronic components, and may even cause component damage, affecting the accuracy of the test results. Therefore, the power control board test fixture of the present application further includes: a number of fans, and each fan can be used to dissipate heat from the power control board test fixture.

[0097] In the actual application process, the fan can discharge the hot air inside the power control board test fixture through forced air flow, and introduce cold air at the same time, thereby reducing the temperature inside the test fixture and ensuring that the power control board is tested within the normal operating temperature range. A stable temperature environment is crucial for the accuracy and repeatability of test results. By dissipating heat through the fan, parameter drift of electronic components caused by temperature changes can be avoided, ensuring the stable performance of the power control board during the test. This helps to improve the reliability of the test and reduce test errors and misjudgments caused by temperature factors.

[0098] In addition to the power control board, other components in the power control board test fixture of this application, such as test probes, relays, circuit boards, etc., will also be affected by high temperatures. Fan heat dissipation can reduce the temperature inside the entire test fixture, protect these components from high-temperature damage, extend their service life, and reduce maintenance and replacement costs.

[0099] In the actual application process, many power control boards may involve audio-related functions, such as controlling the power switch of audio devices, volume adjustment, audio signal processing, etc. Therefore, the power control board test fixture of this application may also include a sound test module, and the sound test module is used to test the sound indicators of the object to be tested. The sound test module can detect the audio signal processing ability of the power control board by inputting specific audio signals, including indicators such as signal amplification, attenuation, and distortion, to ensure the normal operation of the audio function. Through the sound test module, when a fault occurs in the power control board, it can help locate the problem. For example, if there are abnormalities in the audio output, such as noise, abnormal volume, etc., the sound test module can further detect whether it is a problem with the audio processing circuit of the power control board or unstable power supply related to the audio, which helps to quickly and accurately diagnose the cause of the fault and improve the maintenance efficiency. During the production process, comprehensive sound testing of the power control board can ensure the quality consistency of the product. By testing the audio function of each power control board through the sound test module, potential quality problems can be detected in a timely manner, preventing products with audio function defects from entering the market, improving the overall quality and reliability of the product, and enhancing the market competitiveness of the product.

[0100] The power control board may need to be compatible with a variety of different audio devices or systems. The sound test module can simulate various different audio input signals and working scenarios to test the audio function performance of the power control board under different conditions, ensuring that it can cooperate stably and well with various related devices and meet the usage requirements of different users.

[0101] In the actual application process, according to the actual application requirements, various interfaces can be provided outside the power control board test fixture, and these interfaces can be used to connect external test devices (such as computers, oscilloscopes, power supplies, etc.). These interfaces can include USB interfaces, RS - 232 interfaces, power interfaces, etc. The USB interface facilitates data transmission with the computer and the sending of control commands; the RS-232 interface is used to communicate with some traditional test devices; the power interface is used to access the external power supply. When the power supply of the power control board fixture fails, the power interface can provide power for the electrical components and test circuits inside the power control board test fixture.

[0102] The following combines Figure 4 to introduce the process of the multi-mode power control board test method given in the embodiments of this application. As Figure 4 shown, this process can include the following steps: Step S101, place the object to be tested on the test board of the power control board test fixture.

[0103] Step S102, determine the test instructions for the object to be tested. Among them, the test instructions for the object to be tested include the test parameters for each test index of the object to be tested.

[0104] Among them, the test instructions for the object to be tested can include the following several types: 1. Electrical parameter test instructions (1) Voltage test instructions a. DC voltage measurement instruction: For example, "MEASURE_DC_VOLTAGE(test point number)", this instruction will make the test device connect to the specified test point and then measure the DC voltage at that point. During the test, there may also be a voltage range setting instruction, such as "SET_VOLTAGE_RANGE(minimum voltage value, maximum voltage value)", which is used to determine the measurement range and ensure the accuracy of the measurement.

[0105] b. AC voltage measurement instruction: Similar to the DC voltage measurement, such as "MEASURE_AC_VOLTAGE(test point number)" is used to measure the effective value of the AC voltage at the specified test point. At the same time, in order to accurately measure the AC voltage, there may be instructions to set the frequency range of the AC signal: For example: like "SET_AC_FREQUENCY_RANGE(lowest frequency, highest frequency)", because the measurement of AC voltage may be affected by the frequency.

[0106] (2) Current test instructions a. DC current measurement instruction: Such as "MEASURE_DC_CURRENT(branch number)", which is used to measure the DC current of a certain branch on the circuit board. In actual testing, the current measurement range also needs to be set, which is achieved through the instruction "SET_CURRENT_RANGE(minimum current value, maximum current value)". In addition, for some high-precision current measurements, there may be instructions to calibrate the current sensor, such as "CALIBRATE_CURRENT_SENSOR(calibration parameter)".

[0107] b. AC current measurement instruction: "MEASURE_AC_CURRENT(branch number)" is used to measure the AC current. Similarly, parameters such as the frequency range and current range need to be set. Related instructions are such as "SET_AC_CURRENT_FREQUENCY_RANGE(lowest frequency, highest frequency)" and "SET_AC_CURRENT_RANGE(minimum current value, maximum current value)".

[0108] (3)Resistance test instruction a. Single resistance measurement instruction: For example, "MEASURE_RESISTANCE(resistance element number)", which is used to measure the resistance value of the specified resistance element. Before testing, there may be instructions to set the accuracy level of the resistance measurement, such as "SET_RESISTANCE_PRECISION(accuracy level)", to meet different test requirements.

[0109] b. Resistance measurement instruction between circuit nodes: The instruction "MEASURE_NODE_RESISTANCE(start node number, end node number)" can be used to measure the resistance between two circuit nodes, which is very useful when checking the conductivity of the circuit or finding short-circuit faults.

[0110] 2. Function test instruction (1)Logic function test instruction a. Single logic gate test instruction: For example, "TEST_LOGIC_GATE(logic gate element number, input logic level combination)", this instruction will input the specified logic level combination into the logic gate element, and then check whether the output logic level conforms to the truth table of the logic gate. For complex digital circuits, there may be instructions to set the test sequence, such as "SET_LOGIC_TEST_SEQUENCE(logic level combination sequence)", which is used to perform sequential testing on a circuit composed of multiple logic gates.

[0111] b. Digital Circuit Function Test Instruction: "TEST_DIGITAL_CIRCUIT(circuit module number, input test data sequence)" is used to perform a function test on the entire digital circuit module. The input test data sequence can be a set of binary data, used to simulate actual digital signal inputs, and then check whether the output data conforms to the designed function of the circuit.

[0112] (2)Analog Function Test Instruction a. Amplifier Function Test Instruction: Such as "TEST_AMPLIFIER(amplifier component number, input signal frequency, input signal amplitude)", this instruction will input a signal with the specified frequency and amplitude into the amplifier, then measure the output signal amplitude of the amplifier, and calculate the amplification factor. At the same time, there may be an instruction to test the bandwidth of the amplifier, such as "TEST_AMPLIFIER_BANDWIDTH(amplifier component number, start frequency, end frequency)", by changing the input signal frequency to scan within the specified range and observing the change of the output signal amplitude to determine the bandwidth.

[0113] b. Filter Function Test Instruction: "TEST_FILTER(filter component number, input signal frequency sequence)" is used to test the filtering characteristics of the filter. By inputting a series of signals with different frequencies, measuring the output signal amplitude of the filter, and plotting the frequency response curve to evaluate the performance of the filter, such as the cut-off frequency, passband attenuation, etc.

[0114] 3. Fault Detection and Diagnosis Instructions (1)Short Circuit Detection Instruction: "DETECT_SHORT_CIRCUIT(test area number)" is used to check whether there is a short circuit fault in the specified area. The test equipment may judge whether there is a short circuit by applying a small current signal and then monitoring the voltage. If a short circuit is detected, an alarm signal may be issued or the short circuit location information may be returned.

[0115] (2)Open Circuit Detection Instruction: "DETECT_OPEN_CIRCUIT(test branch number)" is used to detect whether there is an open circuit fault in the specified branch. Usually, it judges whether the branch is conducting by measuring the resistance at both ends of the branch or applying a test voltage.

[0116] (3)Component Fault Diagnosis Instruction: For components suspected of having faults, the instruction "DIAGNOSE_COMPONENT_FAILURE(component number, test parameter list)" can be used. This instruction will perform a detailed test on the component according to the type of the component and the provided test parameter list, such as testing parameters such as the amplification factor and breakdown voltage of the transistor to determine whether the component is damaged.

[0117] Step S103, according to the test instruction of the object to be tested, start the cylinder of the power control board test fixture, and make the first test needle plate and the second test needle plate of the power control board test fixture closely contact with different test points of the object to be tested to test the object to be tested.

[0118] Step S104, reading and saving the test data of the object to be tested.

[0119] Step S105: if it is identified that the test data of the object to be tested has abnormal information, the abnormal test result of the object to be tested is displayed, and a solution to solve the abnormal test is provided.

[0120] Step S106, analyzing and saving the test data of the object to be tested and forming a test report.

[0121] It can be seen from the technical solutions introduced above that the multi-mode power control board testing method provided in the embodiment of the present application can test multiple circuit parameters in parallel. For mass-produced circuit boards, a large number of tests can be completed in a short time. It can be run according to the preset program, and the test results are more accurate and stable. It can be equipped with high-precision test instruments, which can accurately measure tiny voltage and current changes. It has high efficiency and stability, can reduce testing costs, and can promptly detect and remove defective circuit boards to prevent defective products from flowing into the next process, thereby reducing scrap rate and rework costs. It can automatically record and store test data for subsequent data analysis and quality traceability, which can help enterprises achieve statistical process control (SPC), optimize production processes, and improve product quality. It can ensure that the conditions and methods of each test are completely consistent, and ensure the repeatability of test results. In summary, the multi-mode power control board testing system provided in the embodiment of the present application has obvious advantages in efficiency, accuracy, cost, data management and repeatability, and is suitable for large-scale, high-precision circuit board production needs.

[0122] The specific processing flow of the multi-mode power control board test method can refer to the relevant introduction of the multi-mode power control board test system mentioned above, which will not be repeated here.

[0123] The following is a description of a multi-mode power control board testing device provided in an embodiment of the present application. The multi-mode power control board testing device described below and the multi-mode power control board testing method described above can be referred to in correspondence with each other. Figure 5 , Figure 5 Schematic diagram of the structure of a multi-mode power control board test device disclosed in the embodiment of the present application. Figure 5 As shown, the multi-mode power control board testing device may include: A placement unit 101 is used to place the object to be tested on a test board of a power control board test fixture; A determination unit 102, configured to determine a test instruction for the object to be tested, wherein the test instruction for the object to be tested includes test parameters for each indicator to be tested of the object to be tested; A starting unit 103 is used to start the cylinder of the power control board test fixture according to the test instruction of the object to be tested, so as to closely contact the first test needle disk and the second test needle disk of the power control board test fixture with different test points of the object to be tested to test the object to be tested; The reading unit 104 is used to read and save the test data of the object to be tested; The display unit 105 is used to display the abnormal test result of the object to be tested and provide a solution to solve the abnormal test when it is identified that the test data of the object to be tested has abnormal information; The analysis unit 106 is used to analyze and save the test data of the object to be tested and form a test report.

[0124] It can be seen from the technical solutions introduced above that the multi-mode power control board test device provided in the embodiment of the present application can test multiple circuit parameters in parallel. For mass-produced circuit boards, a large number of tests can be completed in a short time. It can be run according to the preset program, and the test results are more accurate and stable. It can be equipped with high-precision test instruments, which can accurately measure tiny voltage and current changes. It has high efficiency and stability, can reduce testing costs, and can promptly detect and remove defective circuit boards to prevent defective products from flowing into the next process, thereby reducing scrap rate and rework costs. It can automatically record and store test data for subsequent data analysis and quality traceability, which can help enterprises achieve statistical process control (SPC), optimize production processes, and improve product quality. It can ensure that the conditions and methods of each test are completely consistent, and ensure the repeatability of test results. In summary, the multi-mode power control board test system provided in the embodiment of the present application has obvious advantages in efficiency, accuracy, cost, data management and repeatability, and is suitable for large-scale, high-precision circuit board production needs.

[0125] Among them, the specific processing flow of each unit included in the above-mentioned multi-mode power control board testing device can refer to the relevant introduction of the multi-mode power control board testing method part above, and will not be repeated here.

[0126] The multi-mode power control board test device provided in the embodiment of the present application can be applied to multi-mode power control board test equipment, such as terminals: mobile phones, computers, etc. Optionally, Figure 6 The hardware structure diagram of the multi-mode power control board test equipment is shown in FIG. Figure 6 The hardware structure of the multi-mode power control board test device may include: at least one processor 1, at least one communication interface 2, at least one memory 3 and at least one communication bus 4.

[0127] In the embodiments of the present application, the number of the processor 1, the communication interface 2, the memory 3, and the communication bus 4 is at least one, and the processor 1, the communication interface 2, and the memory 3 complete communication with each other through the communication bus 4. The processor 1 may be a central processing unit (CPU), or a specific integrated circuit (ASIC) (Application Specific Integrated Circuit), or one or more integrated circuits configured to implement the embodiments of the present application, etc.; the memory 3 may include a high-speed RAM memory, and may also include a non-volatile memory, etc., such as at least one disk memory; wherein, the memory stores a program, and the processor can call the program stored in the memory, and the program is used for: implementing each processing flow in the foregoing terminal circuit test solution.

[0128] The embodiments of the present application further provide a readable storage medium, which can store a program suitable for being executed by a processor, and the program is used for: implementing each processing flow in the foregoing terminal circuit test solution.

[0129] Finally, it should also be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of additional identical elements in the process, method, article or device including the element.

[0130] The various embodiments in this specification are described in a progressive manner, and the key point of each embodiment is to illustrate the differences from other embodiments. The same or similar parts among the various embodiments can be referred to each other.

[0131] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. The various embodiments can be combined with each other. Therefore, the present application will not be limited to these embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A multi-mode power control board test system, characterized in that: The system comprises: a computing device, an electronic testing device and a power control board test fixture, wherein the power control board test fixture is connected to the electronic testing device and the computing device respectively; The computing device is used to record the test instructions corresponding to the object to be tested, and according to the test instructions of the object to be tested, control the power control board test fixture to test the object to be tested and control the electronic test equipment to read the measurement data of the power control board test fixture, and save and analyze the measurement data collected by the electronic test equipment, and form a test analysis report related to the object to be tested; The power control board test fixture comprises a first test component and a second test component, wherein the first test component comprises a first test needle tray, a second test needle tray, a test board, and a single-chip microcomputer, the first test needle tray comprises a plurality of first test needles, the second test needle tray comprises a plurality of second test needles, the second test needle tray is placed in the test board, and the test board is used to place the object to be tested; the power control board test fixture is used to control the first test needle tray, the single-chip microcomputer, the second test needle tray, and the second test component according to the test instruction of the object to be tested to test at least one indicator to be tested of the object to be tested; The electronic testing equipment is used to collect and display the test results of the object to be tested.

2. The system according to claim 1, characterized in that The second test assembly includes a signal relay board, a high-power relay, a low-power relay, a cylinder, a communicator, a power supply, and an upper template. Based on this, the power control board test fixture controls the first test needle disk, the single-chip microcomputer, the second test needle disk, and the second test assembly according to the test instruction of the object to be tested to test at least one test indicator of the object to be tested; including: The first test needle disk and the second test needle disk are used to test different test indicators of the object to be tested; The single chip microcomputer is used to control the operation of the high power relay and the low power relay to complete the test of the object to be tested; The signal relay board is used to switch different test points on the object to be tested to complete the test of different test indicators of the object to be tested; The high-power relay is used to control the rise and fall of the cylinder; The low-power relay is used to control the operation of the high-power relay; The communicator is used for data communication between the power control board fixture and the object to be tested; The upper template is used to fix the first test needle disk; The cylinder is used to control the rise and fall of the upper template, so that each first test needle of the first test needle disk is in close contact with each test point above the object to be tested, and each second test needle of the second test needle disk is in close contact with each test point below the object to be tested, so as to complete the test of different test indicators of the object to be tested; The power supply includes two digital power supplies and a fixture power supply. The digital power supply is used to supply power to the object to be tested, and the fixture power supply is used to supply power to the power control board test fixture.

3. The system according to claim 2, characterized in that The power control board testing device also includes a plurality of gratings; The grating is used to identify whether a foreign object enters the test area during the cylinder startup, and when it is identified that a foreign object enters the test area during the cylinder startup, the signal is fed back to the computing device so that the computing device cuts off the signal controlling the operation of the cylinder.

4. The system according to claim 2, characterized in that The power control board test fixture further includes: a plurality of fans, and the fans are used to dissipate heat from the power control board test fixture.

5. The system according to claim 2, characterized in that The power control board test fixture also includes: a common button, an up button, a down button, a switch button, and an emergency stop button; The switch button is used to control the fixture power switch of the power control board test fixture; The common button and the rising button are used to control the rising of the cylinder when they are activated together, so as to prevent the operator from accidentally entering the test area of ​​the power control board fixture and causing injury; The common button and the descending button are used to control the descent of the cylinder when activated together, so as to prevent the operator from accidentally entering the test area of ​​the power control panel fixture and causing injury; The emergency stop button is used to control cutting off all power supplies of the power control board test fixture.

6. The system according to claim 2, characterized in that The power control board test fixture further includes a sound test module, and the sound test module is used to test the sound index of the object to be tested.

7. The system according to claim 2, characterized in that The second test needle disk is arranged according to the shape of the object to be tested.

8. A method for testing a multi-mode power supply control board, characterized in that: Applied to the multi-mode power supply control board test system according to any one of claims 1 to 7, the method comprises: Placing the object to be tested on the test board of the power control board test fixture; Determine a test instruction for the object to be tested, wherein the test instruction for the object to be tested includes test parameters for each indicator to be tested of the object to be tested; According to the test instruction of the object to be tested, the cylinder of the power control board test fixture is started, and the first test needle disk and the second test needle disk of the power control board test fixture are closely contacted with different test points of the object to be tested to test the object to be tested; Read and save the test data of the object to be tested; If it is identified that the test data of the object to be tested has abnormal information, the abnormal test result of the object to be tested is displayed, and a solution to solve the abnormal test is provided; Analyze and save the test data of the object to be tested and form a test report.

9. A multi-mode power control board test device, characterized in that: include: one or more processors, and memory; The memory stores computer-readable instructions, and when the computer-readable instructions are executed by the one or more processors, the steps of the multi-mode power supply control board testing method as claimed in claim 8 are implemented.

10. A readable storage medium, characterized in that: The readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, the one or more processors implement the steps of the multi-mode power supply control board testing method as claimed in claim 8.

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