High-temperature object surface emissivity measuring device

Abstract

The invention discloses a high-temperature object surface emissivity measuring device, which comprises a guide mechanism, a measuring mechanism, a longitudinal moving mechanism, a transverse moving mechanism, a moving block, a clamping mechanism and an object placing plate, and is characterized in that the guide mechanism comprises a track and a cover body arranged at the top of the track; the measuring mechanism comprises a total radiation heat flow meter system sensor, an infrared thermal imager system lens and a control center, the longitudinal moving mechanism controls the moving block to move longitudinally, the transverse moving mechanism controls the moving block to move transversely, a fixed plate is arranged at the top of the moving block, and the fixed plate is connected with the control center. The clamping mechanism comprises a rotating disc arranged on the side wall of the fixing plate, a linkage rod movably matched with the rotating disc and a clamping block movably matched with the linkage rod, and the clamping block moves along the guide groove. And the measuring instrument does not need to be moved, so that the accuracy of the measuring instrument is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of radiative heat transfer, and specifically to a device for measuring the emissivity of the surface of a high-temperature object. Background Art

[0002] All objects in nature are constantly emitting radiative heat into space, and at the same time, constantly absorbing the radiative heat emitted by other objects. This heat transfer completed by the combined action of radiation and absorption between the surfaces of objects is radiative heat transfer. Radiative heat transfer is an important heat transfer method in various high-temperature thermal equipment such as industrial furnaces and boilers.

[0003] A black body can emit thermal radiation in the full wavelength band. Under the same temperature conditions, its radiation ability is the largest. At a certain temperature, the ratio of the radiation ability of a gray body to that of a black body at the same temperature is defined as the emissivity (blackness) of the object. The emissivity of the object surface is related to factors such as the nature of the object, the surface condition, and the temperature, and is an inherent characteristic of the object itself, independent of the external environment. Usually, the emissivity of an object needs to be measured experimentally.

[0004] According to different measurement principles, emissivity measurement methods can be divided into calorimetric methods (such as steady state, transient, etc.), reflection methods (such as hot cavity reflectometer method, integrating sphere reflectometer method, laser polarization method, etc.), energy methods (such as infrared Fourier spectroscopy method, black body method, etc.), multi-wavelength methods, etc. Among them, the Fourier spectroscopy method is relatively typical and can achieve high-precision measurement of spectral emissivity in a wide wavelength range and a wide temperature range. However, the system is expensive and complex in structure.

[0005] However, the emissivity measurement method based on an infrared thermometer (infrared thermal imager) is based on the infrared spectrum. During the operation, the lens of the infrared thermal imager system and the sensor of the total radiation (infrared + visible light) heat flow meter system need to be successively moved above the object to be measured. If manually moved traditionally, it is difficult to control the height and the moving position, resulting in flawed measurement data, affecting the experimental results. Moreover, frequently moving the lens of the infrared thermal imager system and the sensor of the total radiation (infrared + visible light) heat flow meter system is likely to affect the precision of the lens of the infrared thermal imager system and the sensor of the total radiation (infrared + visible light) heat flow meter system, affecting the implementation results. Summary of the Invention

[0006] The purpose of this part is to outline some aspects of the embodiments of the present invention and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this part, as well as in the abstract and title of the specification of this application, to avoid obscuring the purpose of this part, the abstract, and the title. However, such simplifications or omissions shall not be used to limit the scope of the present invention.

[0007] In view of the above and / or problems existing in the use of the high-temperature object surface emissivity measurement device, the present invention is proposed.

[0008] Therefore, the object of the present invention is to provide a high-temperature object surface emissivity measurement device, which can adjust the horizontal and vertical coordinates of the object on the placement plate, and then move the object on the placement plate under different measuring tools, and can also accurately control the detection points of the object to be measured and move it under the measuring tool without moving the measuring instrument, ensuring the accuracy of the measuring instrument and improving the accuracy of the measurement data, providing an effective guarantee for the success of the experiment.

[0009] To solve the above technical problems, according to one aspect of the present invention, the following technical solutions are provided:

[0010] A high-temperature object surface emissivity measurement device, which includes:

[0011] A guiding mechanism, the guiding mechanism includes a track and a cover body arranged on the top of the track;

[0012] A measuring mechanism, the measuring mechanism includes a total radiation heat flux meter system sensor, an infrared thermal imager system lens and a control center;

[0013] A longitudinal moving mechanism, the longitudinal moving mechanism controls the longitudinal movement of the moving block;

[0014] A transverse moving mechanism, the transverse moving mechanism controls the transverse movement of the moving block;

[0015] A moving block, a fixing plate is arranged on the top of the moving block;

[0016] A clamping mechanism, the clamping mechanism includes a turntable arranged on the side wall of the fixing plate, a linkage rod movably matched with the turntable, and a clamping block movably matched with the linkage rod, and the clamping block moves along the guiding groove;

[0017] A placement plate, the placement plate is arranged on the top of the fixing plate, a guiding groove is arranged on the side wall of the placement plate, and a heating plate is arranged at the bottom of the placement plate.

[0018] As a preferred scheme of the high-temperature object surface emissivity measurement device described in the present invention, wherein, a sliding groove is arranged on the inner wall of the track, and a transparent door is arranged on the side wall of the cover body.

[0019] As a preferred scheme of the high-temperature object surface emissivity measurement device described in the present invention, wherein, the total radiation heat flux meter system sensor and the infrared thermal imager system lens are arranged on the inner wall of the cover body, and the control center is arranged on the outer wall of the cover body.

[0020] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, the control center is electrically connected to the sensors of the total radiation heat flux meter system and the lens of the infrared thermal imager system, and a display is provided on the side wall of the control center.

[0021] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, the longitudinal movement mechanism includes a first driving motor, a first threaded rod disposed at the output end of the first driving motor, a first threaded block engaged with the first threaded rod, and a first guide rod disposed on the side wall of the first threaded block. A first slider is provided at the end of the first guide rod.

[0022] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, the longitudinal movement mechanism includes a second driving motor, a second threaded rod disposed at the output end of the second driving motor, a second threaded block engaged with the second threaded rod, and a second guide rod disposed on the side wall of the second threaded block. A second slider is provided at the end of the second guide rod.

[0023] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, a first guiding hole engaged with the first guide rod is provided on the side wall of the moving block, and a second guiding hole engaged with the second guide rod is provided on the side wall of the moving block.

[0024] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, a rotating motor for controlling the rotation of the turntable is provided on the top of the fixing plate, and a support column is provided on the top of the fixing plate.

[0025] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, the top of the support column is fixedly connected to the bottom of the placing plate.

[0026] As a preferred embodiment of the surface emissivity measuring device for high-temperature objects according to the present invention, a rotating shaft is provided at the bottom of the clamping block, and the rotating shaft extends into the inside of the guiding groove.

[0027] Compared with the prior art, the beneficial effects of the present invention are as follows: For this surface emissivity measuring device for high-temperature objects, by adjusting the horizontal and vertical coordinates of the object on the placing plate, the object on the placing plate can be moved to the lower part of different measuring tools, and the detection points of the object to be measured can be accurately controlled and moved to the lower part of the measuring tool. There is no need to move the measuring instrument, which ensures the accuracy of the measuring instrument, improves the accuracy of the measurement data, and provides an effective guarantee for the success of the experiment. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] To more clearly illustrate the technical solutions of the embodiments of the present invention, the present invention will be described in detail below in conjunction with the drawings and specific embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings. Among them:

[0029] Figure 1 It is a schematic structural diagram of the overall first perspective of a surface emissivity measurement device for high-temperature objects of the present invention;

[0030] Figure 2 It is a schematic structural diagram of the overall second perspective of a surface emissivity measurement device for high-temperature objects of the present invention;

[0031] Figure 3 It is a schematic structural diagram of the cover part of a surface emissivity measurement device for high-temperature objects of the present invention;

[0032] Figure 4 It is a schematic structural diagram of the clamping mechanism part of a surface emissivity measurement device for high-temperature objects of the present invention;

[0033] Figure 5 It is a schematic structural diagram of the placement plate part of a surface emissivity measurement device for high-temperature objects of the present invention.

[0034] 100, guiding mechanism; 110, track; 111, sliding groove; 120, cover body; 121, transparent door; 200, measuring mechanism; 210, infrared thermal imager system lens; 220, total radiation heat flux meter system sensor; 230, control center; 300, longitudinal moving mechanism; 310, first driving motor; 320, first threaded rod; 330, first threaded block; 340, first guide rod; 341, first slider; 400, transverse moving mechanism; 410, second driving motor; 420, second threaded rod; 430, second threaded block; 440, second guide rod; 441, second slider; 500, moving block; 510, fixing plate; 511, support pillar; 600, clamping mechanism; 610, turntable; 620, linkage rod; 630, clamping block; 631, rotating shaft; 700, placement plate; 710, heating plate; 720, guiding groove. Specific Embodiments

[0035] To make the above objects, features, and advantages of the present invention more obvious and understandable, the specific embodiments of the present invention will be described in detail below in conjunction with the drawings.

[0036] Secondly, the present invention will be described in detail with reference to the schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of explanation, the cross-sectional views showing the device structure will be locally enlarged without a general scale, and the schematic diagrams are only examples and should not limit the scope of protection of the present invention herein. In addition, in actual production, three-dimensional spatial dimensions including length, width, and depth should be included.

[0037] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0038] The present invention provides a device for measuring the surface emissivity of a high-temperature object. By adjusting the horizontal and vertical coordinates of the object on the placement plate, the object on the placement plate can be moved to the lower part of different measuring tools, and the detection points of the object to be measured can be accurately controlled. Moving it to the lower part of the measuring tool does not require moving the measuring instrument, ensuring the accuracy of the measuring instrument and improving the accuracy of the measurement data, providing an effective guarantee for the success of the experiment.

[0039] Figures 1-5 Shown is a schematic structural diagram of an embodiment of a device for measuring the surface emissivity of a high-temperature object according to the present invention. Please refer to Figures 1-5 In this embodiment, a device for measuring the surface emissivity of a high-temperature object, its main body part includes a guiding mechanism 100, a measuring mechanism 200, a longitudinal moving mechanism 300, a transverse moving mechanism 400, a moving block 500, a clamping mechanism 600, and a placement plate 700.

[0040] The guiding mechanism 100 limits and guides the first threaded block 330 and the second threaded block 430 through the track 110 for easy movement. The cover body 120 plays a heat preservation role to prevent the object to be measured from dissipating heat too quickly. The transparent door 121 facilitates observing the internal situation. Specifically, the guiding mechanism 100 includes a track 110 and a cover body 120 provided on the top of the track 110. In this embodiment, a chute 111 is provided on the inner wall of the track 110, and a transparent door 121 is provided on the side wall of the cover body 120;

[0041] The measuring mechanism 200 measures an object through the infrared thermal imager system lens 210 and the total radiation heat flux meter system sensor 220, improving the accuracy of the measurement data and providing an effective guarantee for the success of the experiment. After the data is processed by the control center 230, it is displayed through a display. Specifically, the measuring mechanism 200 includes the total radiation heat flux meter system sensor 220, the infrared thermal imager system lens 210, and the control center 230. In this embodiment, the total radiation heat flux meter system sensor 220 and the infrared thermal imager system lens 210 are arranged on the inner wall of the cover 120, and the control center 230 is arranged on the outer wall of the cover 120. The control center 230 is electrically connected to the total radiation heat flux meter system sensor 220 and the infrared thermal imager system lens 210, and a display is arranged on the side wall of the control center 230;

[0042] The longitudinal movement mechanism 300 controls the rotation of the first threaded rod 320 through the first driving motor 310, causing the first threaded block 330 to drive the first guide rod 340 to move, and then driving the moving block 500 to move longitudinally, adjusting the longitudinal coordinates of the object on the placement plate 700. Specifically, the longitudinal movement mechanism 300 controls the longitudinal movement of the moving block 500. In this embodiment, the longitudinal movement mechanism 300 includes the first driving motor 310, the first threaded rod 320 arranged at the output end of the first driving motor 310, the first threaded block 330 cooperating with the first threaded rod 320, and the first guide rod 340 arranged on the side wall of the first threaded block 330. The end of the first guide rod 340 is provided with a first slider 341;

[0043] The transverse movement mechanism 400 controls the rotation of the second threaded rod 420 through the second driving motor 410, causing the second threaded block 430 to drive the second guide rod 440 to move, and then driving the moving block 500 to move transversely, adjusting the transverse coordinates of the object on the placement plate 700. Furthermore, the object on the placement plate 700 is moved to below different measuring tools, and the detection point of the object to be measured can also be precisely controlled and moved to below the measuring tool without moving the measuring instrument, ensuring the accuracy of the measuring instrument. Specifically, the transverse movement mechanism 400 controls the transverse movement of the moving block 500. In this embodiment, the longitudinal movement mechanism 300 includes the second driving motor 410, the second threaded rod 420 arranged at the output end of the second driving motor 410, the second threaded block 430 cooperating with the second threaded rod 420, and the second guide rod 440 arranged on the side wall of the second threaded block 430. The end of the second guide rod 440 is provided with a second slider 441;

[0044] The moving block 500 controls the rotation of the turntable 610 through a rotating motor at the top of the fixed plate 510. Specifically, a fixed plate 510 is provided at the top of the moving block 500. In this embodiment, a first guiding hole cooperating with the first guiding rod 340 is provided on the side wall of the moving block 500, and a second guiding hole cooperating with the second guiding rod 440 is provided on the side wall of the moving block 500. A rotating motor for controlling the rotation of the turntable 610 is provided at the top of the fixed plate 510, and a support column 511 is provided at the top of the fixed plate 510;

[0045] The clamping mechanism 600 clamps the object to be measured on the object placing plate 700 by rotating the turntable 610 and cooperating with the linkage rod 620 under the limiting and guiding action of the guiding groove 720 to maintain the stability of the object during movement. Specifically, the clamping mechanism 600 includes a turntable 610 provided on the side wall of the fixed plate 510, a linkage rod 620 movably cooperating with the turntable 610, and a clamping block 630 movably cooperating with the linkage rod 620. The clamping block 630 moves along the guiding groove 720. The top of the support column 511 is fixedly connected to the bottom of the object placing plate 700. A rotating shaft 631 is provided at the bottom of the clamping block 630, and the rotating shaft 631 extends into the interior of the guiding groove 720;

[0046] The object placing plate 700 supports the object to be measured, and heats the object by the heating plate 710 to keep the temperature of the object stable. Specifically, the object placing plate 700 is provided on the top of the fixed plate 510. A guiding groove 720 is provided on the side wall of the object placing plate 700, and a heating plate 710 is provided at the bottom of the object placing plate 700.

[0047] Combined with Figures 1-5, a device for measuring the emissivity of the surface of a high-temperature object in this embodiment is used as follows. The object to be measured is supported by the placement plate 700, and the object is heated by the heating plate 710 to keep the object temperature stable. The rotating motor at the top of the fixed plate 510 is used to control the rotation of the turntable 610. By rotating the turntable 610 and cooperating with the linkage rod 620, under the limiting and guiding action of the guiding groove 720, the clamping block 630 clamps the object to be measured on the placement plate 700 to keep the object stable during the movement process. The first threaded block 330 and the second threaded block 430 are limited and guided by the track 110 to facilitate movement. The cover 120 plays a heat preservation role to prevent the object to be measured from dissipating heat too quickly. The transparent door 121 is convenient for observing the internal situation. The first driving motor 310 is used to control the rotation of the first threaded rod 320, so that the first threaded block 330 drives the first guide rod 340 to move, and then drives the moving block 500 to move longitudinally to adjust the longitudinal coordinates of the object on the placement plate 700. The second driving motor 410 is used to control the rotation of the second threaded rod 420, so that the second threaded block 430 drives the second guide rod 440 to move, and then drives the moving block 500 to move laterally to adjust the lateral coordinates of the object on the placement plate 700. Then, the object on the placement plate 700 is moved under different measuring tools, and the detection points of the object to be measured can also be accurately controlled. Moving it under the measuring tool does not require moving the measuring instrument, ensuring the accuracy of the measuring instrument. The object is measured by the infrared thermal imager system lens 210 and the total radiation heat flow meter system sensor 220 to improve the accuracy of the measurement data and provide an effective guarantee for the success of the experiment. After the data is processed by the control center 230, it is displayed on the display for easy viewing of the detection situation.

[0048] Although the present invention has been described above with reference to the embodiments, various improvements can be made to it and components therein can be replaced with equivalents without departing from the scope of the present invention. In particular, as long as there is no structural conflict, the various features in the embodiments disclosed in the present invention can be combined with each other in any way. The reason for not exhaustively describing the situations of these combinations in this specification is only to save space and resources. Therefore, the present invention is not limited to the specific embodiments disclosed in the text, but includes all technical solutions falling within the scope of the claims.

Claims

1. A device for measuring the surface emissivity of a high-temperature object, characterized in that: include: A guide mechanism (100), the guide mechanism (100) comprising a track (110) and a cover (120) arranged on the top of the track (110); A measuring mechanism (200), the measuring mechanism (200) comprising a total radiation heat flow meter system sensor (220), an infrared thermal imager system lens (210) and a control center (230); A longitudinal moving mechanism (300), wherein the longitudinal moving mechanism (300) controls the longitudinal movement of the moving block (500); A lateral movement mechanism (400), wherein the lateral movement mechanism (400) controls the moving block (500) to move lateraly; A moving block (500), wherein a fixing plate (510) is arranged on the top of the moving block (500); A clamping mechanism (600), the clamping mechanism (600) comprising a rotating disk (610) arranged on a side wall of a fixing plate (510), a linkage rod (620) movably engaged with the rotating disk (610), and a clamping block (630) movably engaged with the linkage rod (620), wherein the clamping block (630) moves along the guide groove (720); A storage plate (700) is arranged on the top of the fixing plate (510), a guide groove (720) is arranged on the side wall of the storage plate (700), and a heating plate (710) is arranged on the bottom of the storage plate (700).

2. A high-temperature object surface emissivity measuring device according to claim 1, characterized in that: The inner wall of the track (110) is provided with a sliding groove (111), and the side wall of the cover body (120) is provided with a transparent door (121).

3. A high-temperature object surface emissivity measuring device according to claim 2, characterized in that: The total radiation calorimeter system sensor (220) and the infrared thermal imager system lens (210) are arranged on the inner wall of the cover body (120), and the control center (230) is arranged on the outer wall of the cover body (120).

4. A high-temperature object surface emissivity measuring device according to claim 3, characterized in that: The control center (230) is electrically connected to the total radiation heat flux meter system sensor (220) and the infrared thermal imager system lens (210), and a display is provided on the side wall of the control center (230).

5. A high-temperature object surface emissivity measuring device according to claim 4, characterized in that: The longitudinal movement mechanism (300) comprises a first driving motor (310), a first threaded rod (320) arranged at the output end of the first driving motor (310), a first threaded block (330) matched with the first threaded rod (320), and a first guide rod (340) whose side wall is arranged on the side wall of the first threaded block (330), and a first sliding block (341) is arranged at the end of the first guide rod (340).

6. A high-temperature object surface emissivity measuring device according to claim 5, characterized in that: The longitudinal movement mechanism (300) comprises a second drive motor (410), a second threaded rod (420) arranged at the output end of the second drive motor (410), a second threaded block (430) matched with the second threaded rod (420), and a second guide rod (440) whose side wall is arranged on the side wall of the second threaded block (430), and a second sliding block (441) is arranged at the end of the second guide rod (440).

7. A high-temperature object surface emissivity measuring device according to claim 6, characterized in that: The side wall of the moving block (500) is provided with a first guide hole matched with the first guide rod (340), and the side wall of the moving block (500) is provided with a second guide hole matched with the second guide rod (440).

8. A high-temperature object surface emissivity measuring device according to claim 7, characterized in that: A rotating motor for controlling the rotation of the rotating disk (610) is arranged on the top of the fixing plate (510), and a support column (511) is arranged on the top of the fixing plate (510).

9. A high-temperature object surface emissivity measuring device according to claim 8, characterized in that: The top of the support (511) is fixedly connected to the bottom of the storage plate (700).

10. A high-temperature object surface emissivity measuring device according to claim 9, characterized in that: A rotating shaft (631) is provided at the bottom of the clamping block (630), and the rotating shaft (631) extends into the interior of the guide groove (720).

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