Storage system testing method and device

Abstract

The invention relates to a storage system testing method and device. The method comprises the following steps: in response to a reliability test request of the storage system, under the condition that different working conditions of each controller in the storage system are simulated, obtaining influence reliability test information of each controller on other controllers and single reliability test information of each controller; and determining a reliability test result of the storage system according to each piece of single reliability test information and each piece of influence reliability test information. When the reliability test is carried out on the storage system, the reliability and the stability of a single controller are considered, and the influence on other controllers when one controller is abnormal is also considered, that is, factors influencing the reliability of the storage system are considered more comprehensively, so that the reliability test result of the storage system is determined through more comprehensive information; and the accuracy of a test result is improved.

Description

Technical Field

[0001] The present application relates to the technical field of storage system testing, and in particular, to a storage system testing method and device. Background Art

[0002] The number of controllers in a storage system can be one or more, and the number of controllers will vary depending on the type of storage system. For example, all-flash storage systems typically adopt a dual-controller design. When one of the controllers in the system fails or goes offline, the other controller will immediately take over without interrupting the existing services.

[0003] In the related art, when performing reliability testing on an all-flash storage system, the controllers in the all-flash storage system are usually tested individually to ensure the stability and reliability of each controller in the all-flash storage system.

[0004] However, the reliability testing method for all-flash storage systems in the related art has the technical problem of low accuracy of test results. Summary of the Invention

[0005] Based on this, in view of the above technical problems, it is necessary to provide a storage system testing method and device that can improve the accuracy of test results.

[0006] In a first aspect, the present application provides a storage system testing method, including:

[0007] In response to a reliability testing request of the storage system, when simulating different working conditions for each controller in the storage system, obtain the influence reliability testing information of each controller on other controllers and the individual reliability testing information of each controller;

[0008] Determine the reliability testing result of the storage system according to the individual reliability testing information and the influence reliability testing information.

[0009] In the storage system testing method provided by the embodiments of the present application, in response to a reliability test request of the storage system, while simulating different working conditions for each controller in the storage system, the influence reliability test information of each controller on other controllers and the individual reliability test information of each of the controllers are obtained. Then, based on the individual reliability test information and the influence reliability test information, the reliability test result of the storage system is determined. In this method, when it is necessary to perform a reliability test on the storage system, by simulating different working conditions for each controller in the storage system, the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller can be obtained. By combining the influence reliability test information of each controller on other controllers, a more accurate reliability test result can be obtained. That is, when performing a reliability test on the storage system, not only the reliability and stability of a single controller are considered, but also the influence of one controller being abnormal on other controllers is considered, that is, more comprehensive factors affecting the reliability of the storage system are considered. In this way, the reliability test result of the storage system is determined through more comprehensive information, improving the accuracy of the test result.

[0010] In one embodiment, obtaining the influence reliability test information of each controller on other controllers includes:

[0011] For any target controller in the storage system, while simulating an abnormal working condition for the target controller and simulating a normal working condition for other controllers except the target controller, the influence reliability test information of the target controller on other controllers is obtained.

[0012] In the storage system testing method provided by the embodiments of the present application, for any target controller in the storage system, while simulating an abnormal working condition for the target controller and simulating a normal working condition for other controllers except the target controller, the influence reliability test information of the target controller on other controllers is obtained. In this method, by simulating an abnormal working condition for the target controller and a normal working condition for other controllers, the status information of other controllers can be monitored. In this way, it can be tested whether there is an influence on other controllers when the target controller is abnormal, that is, the influence reliability test information of the target controller on other controllers is obtained, providing an optional way for obtaining the influence reliability test information.

[0013] In one embodiment, simulating an abnormal working condition for the target controller includes:

[0014] Obtain the test configuration file of the storage system;

[0015] According to the test configuration file, the abnormal working conditions of the target controller are simulated by controlling the power-on and power-off states of the target controller and the working modes of the ports connected to the target controller.

[0016] In the storage system test method provided by the embodiments of the present application, by obtaining the test configuration file of the storage system, and then according to the test configuration file, the abnormal working conditions of the target controller are simulated by controlling the power-on and power-off states of the target controller and the working modes of the ports connected to the target controller. In this method, an optional way to quickly simulate the abnormal working conditions of the target controller is provided; by introducing the test configuration file, according to the working condition design of each controller and port in the test configuration file, the power-on and power-off states of each controller and the working modes of the ports are controlled to realize the simulation of the abnormal working conditions of the target controller.

[0017] In one of the embodiments, controlling the power-on and power-off states of the target controller and the working modes of the ports connected to the target controller includes:

[0018] Controlling the target controller to be in the power-off state, and controlling the ports connected to the target controller to be in the normal working mode; or;

[0019] Controlling the target controller to be in the power-on state, and controlling the ports connected to the target controller to be in the abnormal working mode.

[0020] In the storage system test method provided by the embodiments of the present application, controlling the target controller to be in the power-off state, and controlling the ports connected to the target controller to be in the normal working mode; or; controlling the target controller to be in the power-on state, and controlling the ports connected to the target controller to be in the abnormal working mode. In this method, two ways to simulate the abnormal working conditions of the target controller are provided; one is to control the target controller to be abnormal and the ports connected to the target controller to be normal, and the other is to control the target controller to be normal and the ports connected to the target controller to be abnormal. By simulating the abnormality of a single target controller and the abnormality of the ports, the abnormal working conditions of the target controller are simulated, and at the same time, the controller and the port link are covered, and the reliability test is carried out from multiple dimensions, improving the accuracy of the storage system test.

[0021] In one of the embodiments, obtaining the single reliability test information of each controller includes:

[0022] For any target controller in the storage system, when simulating the normal working conditions of the target controller, obtaining the task completion information when the target controller executes the data reading and writing tasks;

[0023] According to the task completion information, determining the single reliability test information of the target controller.

[0024] In the storage system testing method provided by the embodiments of the present application, for any target controller in the storage system, when simulating the normal operating conditions of the target controller, the task completion information when the target controller executes data reading and writing tasks is obtained, and according to the task completion information, the single reliability test information of the target controller is determined. In this method, an optional way to quickly determine the single reliability test information is provided; by simulating the normal operating conditions of the target controller, the single reliability test information of the target controller can be determined based on the completion situation when the target controller executes tasks, providing data support for determining the reliability test result of the storage system subsequently.

[0025] In one embodiment, the method further includes:

[0026] For any target controller in the storage system, when controlling the target controller to recover from an abnormal condition to a normal condition, according to the working state of the target controller, the abnormal recovery test information of the target controller is obtained.

[0027] In the storage system testing method provided by the embodiments of the present application, for any target controller in the storage system, when controlling the target controller to recover from an abnormal condition to a normal condition, according to the working state of the target controller, the abnormal recovery test information of the target controller is obtained. In this method, when the target controller is recovered from an abnormal condition to a normal condition, the abnormal recovery test information of the target controller can also be determined based on whether the target controller can enter the system working state normally. Through this information, the single reliability test information of the target controller can also be further determined, providing a more accurate test result for the storage system.

[0028] In one embodiment, obtaining the abnormal recovery test information of the target controller according to the working state of the target controller includes:

[0029] If the target controller can work normally, monitor the states of other controllers, and verify the device information of the target controller before and after the abnormal recovery, and determine the verification result as the abnormal recovery test information of the target controller;

[0030] If the target controller cannot work normally, determine the information that the target controller cannot work normally as the abnormal recovery test information of the target controller.

[0031] In the storage system testing method provided by the embodiments of the present application, if the target controller can work normally, the states of other controllers are monitored, and the device information of the target controller before and after abnormal recovery is verified, and the verification result is determined as the abnormal recovery test information of the target controller; if the target controller cannot work normally, the information that the target controller cannot work normally is determined as the abnormal recovery test information of the target controller. In this method, if the target controller can work normally, by verifying the device information of the target controller before and after abnormal recovery, the reliability of the storage system can be determined based on the verification result. If the target controller cannot work normally, the reliability of the storage system can also be determined based on this information that it cannot work normally, providing a more multi-dimensional judgment basis for determining the reliability test result of the storage system and improving the accuracy of the reliability test result of the storage system.

[0032] In one embodiment, determining the reliability test result of the storage system according to each individual reliability test information and each influencing reliability test information includes:

[0033] Obtain the system log of the storage system;

[0034] Determine the log abnormal list and the log normal list according to the system log and the preset keyword information;

[0035] Determine the reliability test result of the storage system according to the log abnormal list, the log normal list, each individual reliability test information and each influencing reliability test information.

[0036] In the storage system testing method provided by the embodiments of the present application, by obtaining the system log of the storage system, and then determining the log abnormal list and the log normal list according to the system log and the preset keyword information, and then determining the reliability test result of the storage system according to the log abnormal list, the log normal list, each individual reliability test information and each influencing reliability test information. In this method, by introducing the system log of the storage system, the log abnormal list including abnormal information and the log normal list including normal information are obtained according to the system log, providing other data supports for determining the reliability test result, so as to more accurately determine the reliability test result of the storage system.

[0037] In one embodiment, determining the reliability test result of the storage system according to the log abnormal list, the log normal list, each individual reliability test information and each influencing reliability test information includes:

[0038] Verify each individual reliability test information and each influencing reliability test information according to the log abnormal list and the log normal list to obtain the target influencing reliability test information of each controller on other controllers and the target individual reliability test information of each controller;

[0039] Determine the reliability test result of the storage system according to each target reliability test information affecting the reliability test and each target single reliability test information.

[0040] In the storage system test method provided by the embodiments of the present application, by checking each single reliability test information and each reliability test information affecting the reliability according to the log exception list and the log normal list, the target reliability test information of each controller on other controllers and the target single reliability test information of each controller are obtained. Furthermore, according to each target reliability test information affecting the reliability test and each target single reliability test information, the reliability test result of the storage system is determined. In this method, by checking each single reliability test information and each reliability test information affecting the reliability according to the log exception list and the log normal list, more accurate information can be obtained. Furthermore, according to this more accurate information, the reliability test result of the storage system is determined, further improving the accuracy of the reliability test result.

[0041] In a second aspect, the present application further provides a storage system test device, including:

[0042] An information acquisition module, configured to, in response to a reliability test request of the storage system, obtain the reliability test information of each controller on other controllers and the single reliability test information of each controller when simulating different working conditions for each controller in the storage system;

[0043] A result determination module, configured to determine the reliability test result of the storage system according to each single reliability test information and each reliability test information affecting the reliability.

[0044] In a third aspect, the embodiments of the present application further provide a computer device. The computer device includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps in any one of the embodiments in the first aspect are implemented.

[0045] In a fourth aspect, the embodiments of the present application further provide a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any one of the embodiments in the first aspect are implemented.

[0046] In a fifth aspect, the embodiments of the present application further provide a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the steps in any one of the embodiments in the first aspect are implemented.

[0047] The above storage system testing method and device, by responding to a reliability test request of the storage system, under the condition of simulating different working conditions for each controller in the storage system, obtain the influence reliability test information of each controller on other controllers and the individual reliability test information of each of the controllers, and then determine the reliability test result of the storage system according to the individual reliability test information and the influence reliability test information. In this method, when it is necessary to perform a reliability test on the storage system, by simulating different working conditions for each controller in the storage system, the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller can be obtained. By combining the influence reliability test information of each controller on other controllers, a more accurate reliability test result can be obtained. That is, when performing a reliability test on the storage system, not only the reliability and stability of a single controller are considered, but also the influence of one controller being abnormal on other controllers is considered, that is, more comprehensive factors affecting the reliability of the storage system are considered. In this way, the reliability test result of the storage system is determined through more comprehensive information, improving the accuracy of the test result. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained according to these drawings.

[0049] Figure 1 It is the internal structure diagram of a computer device in one embodiment;

[0050] Figure 2 It is the flowchart of the storage system testing method in one embodiment;

[0051] Figure 3 It is the schematic diagram of the status information of other controllers in one embodiment;

[0052] Figure 4 It is the schematic diagram of the status information of other controllers in another embodiment;

[0053] Figure 5 It is the flowchart of simulating abnormal working conditions in one embodiment;

[0054] Figure 6 It is the flowchart of obtaining individual reliability test information in one embodiment;

[0055] Figure 7 It is the flowchart of obtaining abnormal recovery test information in one embodiment;

[0056] Figure 8 A schematic flowchart for determining the reliability test result in one embodiment;

[0057] Figure 9 A schematic flowchart for determining the reliability test result in another embodiment;

[0058] Figure 10 A schematic structural diagram of a storage system test device in one embodiment. Detailed implementation manners

[0059] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0060] The storage system test method provided by the embodiments of the present application can be applied to a computer device. The computer device can be a test auxiliary machine. Among them, the test auxiliary machine is connected to each controller in the storage system, and each controller is connected to each hard disk through a port. Taking a dual-controller as an example, the test auxiliary machine is communicatively connected to two controllers, and each controller is connected to a dual-port hard disk in the storage system through a port. Its internal structure diagram can be as Figure 1 shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, it implements a storage system test method. Those skilled in the art can understand that Figure 1 the structure shown in

[0061] The number of controllers in a storage system can be one or more, and the number of controllers will vary depending on the type of storage system. For example, all-flash storage systems support various advanced data backup and disaster recovery functions, ensuring the high reliability of the system. All-flash storage systems typically adopt a fully redundant architecture design, which improves the reliability of the system. Among them, the controller redundancy in the all-flash storage system is an important manifestation of the redundant architecture, and usually adopts a dual-controller design. When one of the controllers in the system fails or goes offline, the other controller will immediately take over without interrupting the existing services. Therefore, an efficient reliability testing method for all-flash storage systems is essential to ensure the reliable and stable operation of all-flash storage systems.

[0062] In the related art, when performing reliability testing on an all-flash storage system, it is usually to perform IO and Power Cycle tests on each controller in the all-flash storage system individually. The function is relatively single. This method can ensure the stability and reliability of a single controller in the system, but the test coverage is relatively limited, lacking system-level reliability testing. However, in the actual user usage scenario, the occurrence of anomalies such as a single controller being in a false dead state or hanging often has a bad impact.

[0063] Based on this, the present application provides a storage system testing method. When it is necessary to perform reliability testing on a storage system, by simulating different working conditions for each controller in the storage system, the influence reliability testing information of each controller on other controllers and the individual reliability testing information of each controller can be obtained. By combining the influence reliability testing information of each controller on other controllers, a more accurate reliability testing result can be obtained. Equivalently, when performing reliability testing on a storage system, not only the reliability and stability of a single controller are considered, but also the influence of one controller being abnormal on other controllers is considered, that is, more comprehensive factors affecting the reliability of the storage system are considered. In this way, the reliability testing result of the storage system is determined through more comprehensive information, improving the accuracy of the testing result.

[0064] It should be noted that the beneficial effects or technical problems solved by the embodiments of the present application are not limited to this one, and there may be other implicit or related problems. For specific details, please refer to the description of the following embodiments.

[0065] The technical solution of the present application and how the technical solution of the present application solves the above technical problems will be described in detail below with specific embodiments. These specific embodiments below can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below with reference to the accompanying drawings.

[0066] In an exemplary embodiment, as Figure 2As shown, a storage system testing method is provided. Taking the computer device to which this method is applied as an example for illustration, the method includes the following steps 201 to 202. Among them: Figure 1 Taking the computer device in Figure 1 as an example, it includes the following steps 201 to 202. Among them:

[0067] S201, in response to the reliability test request of the storage system, under the condition of simulating different working conditions of each controller in the storage system, obtain the impact reliability test information of each controller on other controllers and the individual reliability test information of each controller.

[0068] Among them, the reliability test request of the storage system refers to the request triggered when the storage system needs to be reliability-tested in the reliability test application program of the computer device. Naturally, after the computer device receives this reliability test request, it needs to perform a reliability test on the storage system to obtain the reliability test result of the storage system.

[0069] In one embodiment, this request is triggered by the user through the computer device interface in the reliability test application program; among them, the triggering method includes but is not limited to external input device clicking, voice control, touch screen triggering, etc., and the embodiments of the present application do not limit the triggering method.

[0070] In another embodiment, this request is triggered according to a preset automatic program; for example, if the computer device receives the system information of the storage system (such as system identification, etc.), it automatically triggers the reliability test request for the storage system according to the preset program; or, after the computer device receives the system information of the storage system, the application program is in an idle state, and it automatically triggers the reliability test request for the storage system according to the preset program. The embodiments of the present application do not limit the method of triggering the reliability test request of the storage system.

[0071] In the embodiments of the present application, different working conditions refer to the normal operating conditions or abnormal operating conditions of each controller in the storage system. Taking the storage system including two controllers as an example, the computer device is communicatively connected to both controllers of the storage system. Among them, when simulating different working conditions of each controller in the storage system, there can be different operation methods. For example, if there are controller A and controller B, then it can be simulated that controller A is in an abnormal operating state while controller B is in a normal operating state, and it can also be simulated that controller B is in an abnormal operating state while controller A is in a normal operating state.

[0072] When simulating the abnormal operating state of the controller, the abnormal operating state of the controller can be achieved through a shutdown operation, or the port connected to the controller can also be disconnected. When the port is abnormal, the controller cannot operate normally either.

[0073] It should be noted that when the embodiments of the present application simulate different working conditions for each controller, the different controllers will be switched to the abnormal operation state for simulation multiple times, that is, the abnormal simulation will be performed on two controllers respectively.

[0074] In the embodiments of the present application, the influence reliability information refers to the influence information of an abnormal controller on other controllers when one controller is abnormal. The single reliability test information refers to the test information of each controller obtained by performing a single test on each controller.

[0075] Exemplarily, when a computer device simulates different working conditions for each controller in a storage system, it can monitor the status information of other controllers through a status monitoring tool, so as to obtain the influence reliability test information of the current controller on other controllers according to the status information of other controllers. For example, if the computer device simulates that controller A is in the abnormal operation state and controller B is in the normal operation state, it can monitor the status of controller B through a status monitoring tool to obtain the influence reliability information of controller A on controller B. Conversely, if it simulates that controller B is in the abnormal operation state and controller A is in the normal operation state, it can monitor the status of controller A through a status monitoring tool to obtain the influence reliability test information of controller B on controller A.

[0076] The computer device can also simulate a single controller in the normal operation state, and then obtain the single reliability test information of each controller according to the situation when the single controller processes read and write tasks. For example, the computer device simulates that controller A is in the normal operation state and makes controller A write data, and determines the single reliability test information of controller A by obtaining the situation of controller A writing data. Similarly, it simulates that controller B is in the normal operation state and makes controller B write data, and determines the single reliability test information of controller A by obtaining the situation of controller B writing data.

[0077] Alternatively, the computer device obtains the single reliability test information by comparing the devices before and after the abnormal recovery of a single controller. For example, the computer device simulates that controller A is in the abnormal operation state, obtains the device information when it is abnormal, then restores controller A to the normal operation state, obtains the device information when it is normal, and then compares the device information when it is abnormal with the device information when it is normal to determine the single reliability test information of controller A.

[0078] S202. Determine the reliability test result of the storage system according to each single reliability test information and each influence reliability test information.

[0079] In one embodiment, the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller can be used to determine the reliability test result of the storage system. If there are abnormal conditions in the influence reliability test information or the individual reliability test information, it is determined that the reliability of the storage system is poor. If there are no abnormal conditions in the influence reliability test information or the individual reliability test information, it is determined that the reliability of the storage system is high.

[0080] For example, the influence reliability test information includes that when controller A is abnormal, controller B is in a normal operating state and can handle tasks normally, and when controller B is abnormal, controller A is also in a normal operating state and can handle tasks normally. And the individual reliability test information includes that controller A is operating normally without read / write errors, and controller B is also operating normally without read / write errors. In this way, it can be determined that the reliability of the storage system is high. If in the influence reliability test information, when controller A is abnormal, controller B is also abnormal, or when controller B is abnormal, controller A is also abnormal, it is determined that the reliability of the storage system is poor. If there are abnormalities when controller A reads and writes data or when controller B reads and writes data in the individual reliability test information, it is also determined that the reliability of the storage system is poor.

[0081] In the storage system test method provided by the embodiments of the present application, in response to a reliability test request of the storage system, under the condition of simulating different working conditions for each controller in the storage system, the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller are obtained. Then, according to the individual reliability test information and the influence reliability test information, the reliability test result of the storage system is determined. In this method, when it is necessary to perform a reliability test on the storage system, by simulating different working conditions for each controller in the storage system, the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller can be obtained. By combining the influence reliability test information of each controller on other controllers, a more accurate reliability test result can be obtained. Equivalently, when performing a reliability test on the storage system, not only the reliability and stability of individual controllers are considered, but also the influence of one controller being abnormal on other controllers is considered, that is, more comprehensive factors affecting the reliability of the storage system are considered. In this way, the reliability test result of the storage system is determined through more comprehensive information, improving the accuracy of the test result.

[0082] Based on the above embodiments, an embodiment is provided to illustrate the process of obtaining the influence reliability test information of each controller on other controllers.

[0083] In an exemplary embodiment, obtaining the influence reliability test information of each controller on other controllers includes:

[0084] For any target controller in a storage system, when simulating an abnormal operating condition for the target controller and simulating a normal operating condition for other controllers except the target controller, obtain the reliability test information of the influence of the target controller on other controllers.

[0085] Among them, the target controller is any one of the controllers in the storage system. Taking a storage system including controller A and controller B as an example, the target controller can be controller A or controller B.

[0086] When obtaining the reliability information of the influence of the target controller on other controllers, it is necessary to perform abnormal simulation on the target controller to observe the influence on other controllers when the target controller is abnormal.

[0087] Exemplarily, for any target controller in the storage system, the target controller can be controlled to shut down, and other controllers except the target controller can be controlled to power on and read and write data normally. Then, the status of other controllers except the target controller can be monitored through a status monitoring tool to obtain the operating status information of other controllers. After that, according to the operating status information of other controllers, determine the reliability test information of the influence of the target controller on other controllers.

[0088] Taking a storage system including controller A and controller B, and controller A as the target controller as an example, when simulating an abnormal operating condition for controller A and simulating a normal operating condition for controller B, monitor the status of controller B through a status monitoring tool to obtain the operating status information of controller B. If it is determined according to the operating status information of controller B that controller B has no abnormal status, then determine that the reliability information of the influence of controller A on controller B is that when controller A is abnormal, it has no influence on controller B; if it is determined according to the operating status information of controller B that controller B has an abnormal status, then determine that the reliability information of the influence of controller A on controller B is that when controller A is abnormal, it has an influence on controller B.

[0089] It should be noted that the status monitoring tool used in the embodiments of the present application is a "ms"-level high-precision IO stability monitoring tool. Using a higher-precision status monitoring tool can improve the accuracy of the status monitoring information, and thus improve the accuracy of the reliability test results of the storage system.

[0090] For example, as Figure 3 shown, it is the status information of other controllers collected by a "ms"-level high-precision IO stability monitoring tool. It can be clearly seen from this figure that the rectangular box exposes the abnormality of the sharp decline and recovery of the instantaneous performance, and the abnormality can be seen at this position. And as Figure 4As shown, it is the status information of other controllers collected by the "s"-level monitoring tool. From this figure, it can be seen that no abnormal decrease in IO is found. In this way, by means of comparison, it can be seen that collecting status information using the "ms"-level high-precision IO stability monitoring tool is more accurate.

[0091] In the storage system test method provided by the embodiments of the present application, for any target controller in the storage system, when simulating abnormal working conditions for the target controller and simulating normal working conditions for other controllers except the target controller, the influence reliability test information of the target controller on other controllers is obtained. In this method, by simulating abnormal working conditions for the target controller and normal working conditions for other controllers, the status information of other controllers can be monitored. In this way, it can be tested whether there is an impact on other controllers when the target controller is abnormal, that is, the influence reliability test information of the target controller on other controllers is obtained, providing an optional way to obtain the influence reliability test information.

[0092] Based on the above embodiments, an embodiment of the process of simulating abnormal working conditions for the target controller is provided for illustration.

[0093] In an exemplary embodiment, as Figure 5 shown, simulating abnormal working conditions for the target controller includes:

[0094] S301, obtain the test configuration file of the storage system.

[0095] In the embodiments of the present application, the test configuration file is a file for recording test configuration information when testing the storage system, including machine information of each controller in the storage system, IO service model design, different working condition designs, and corresponding abnormal trigger cycles, etc. Among them, the machine information of each controller may include controller identification, port information connected to the controller, etc. Designing the IO service model refers to setting the controller task processing mode, such as randomly writing data, sequentially writing data, reading data, etc.

[0096] In one embodiment, the test configuration file can be uploaded by the user to the database, and the computer device obtains it from the database. For example, before testing the storage system, the user has written the test configuration file and uploaded the test configuration file to the computer device, and the computer device stores the test configuration file in the database. When it is necessary to obtain the test configuration file of the storage system, the computer device can screen the test configuration file matching the identification information from the database according to the identification information of the storage system. In this way, the computer device obtains the test configuration file.

[0097] In another embodiment, the test configuration file can be generated after the user fills in the test configuration information on the computer device interface. For example, when it is necessary to obtain the test configuration file of the storage system, the computer device displays the test configuration information filling interface. Then, after the user fills in the test configuration information in the interface and clicks OK, the computer device generates a test configuration file according to the test configuration information filled in by the user.

[0098] S302, according to the test configuration file, by controlling the power-on / off state of the target controller and the working mode of the port connected to the target controller, simulate the abnormal working conditions of the target controller.

[0099] After the computer device obtains the test configuration file, according to the different working condition designs in the test configuration file, control the power-on / off state of the target controller and the working mode of the port connected to the target controller to simulate the abnormal working conditions of the target controller.

[0100] For example, taking a storage system including controller A and controller B as an example, if the different working condition designs in the test configuration file are that controller A is abnormal, controller B is normal, port A is normal, and port B is normal, then the computer device can control controller A to be in the power-off state, control controller B to be in the power-on state, control port A to be in the normal working mode, and control port B to be in the normal working mode. Among them, port A is the port connected to controller A in the dual-port hard disk, and port B is the port connected to controller B in the dual-port hard disk.

[0101] In the storage system test method provided by the embodiments of the present application, by obtaining the test configuration file of the storage system, and then according to the test configuration file, by controlling the power-on / off state of the target controller and the working mode of the port connected to the target controller, simulate the abnormal working conditions of the target controller. In this method, an optional way to quickly simulate the abnormal working conditions of the target controller is provided; by introducing the test configuration file, according to the working condition designs of each controller and port in the test configuration file, control the power-on / off state of each controller and the working mode of the port to simulate the abnormal working conditions of the target controller.

[0102] Based on the above embodiments, an embodiment is provided to illustrate the process of controlling the power-on / off state of the target controller and the working mode of the port connected to the target controller.

[0103] In an exemplary embodiment, controlling the power-on / off state of the target controller and the working mode of the port connected to the target controller includes:

[0104] Control the target controller to the shutdown state and control the port connected to the target controller to the normal working mode; or; control the target controller to the power-on state and control the port connected to the target controller to the abnormal working mode.

[0105] In the embodiments of the present application, there are two ways to simulate the abnormal working conditions of the target controller. One is to control the target controller abnormally, and the other is to control the port connected to the target controller abnormally.

[0106] In one embodiment, the target controller is controlled abnormally and the port connected to the target controller is normal, that is, the target controller is controlled to the shutdown state, and the port connected to the target controller is controlled to the normal working mode. At this time, other controllers are in the power-on state, and the ports connected to other controllers are in the normal working mode.

[0107] For example, taking controller A and controller B as an example, controller A is the target controller. Control controller A to the shutdown state, and port A is in the normal working mode, controller B is in the power-on state, and port B is in the normal working mode.

[0108] In another embodiment, the port connected to the target controller is controlled abnormally, that is, the target controller is controlled to the power-on state, and the port connected to the target controller is controlled to the abnormal working mode. At this time, other controllers are in the power-on state, and the ports connected to other controllers are in the normal working mode.

[0109] For example, taking controller A and controller B as an example, controller A is the target controller. Control controller A to the power-on state, and port A is in the abnormal working mode, controller B is in the power-on state, and port B is in the normal working mode.

[0110] In the storage system test method provided by the embodiments of the present application, control the target controller to the shutdown state and control the port connected to the target controller to the normal working mode; or; control the target controller to the power-on state and control the port connected to the target controller to the abnormal working mode. In this method, two ways to simulate the abnormal working conditions of the target controller are provided; one is to control the target controller abnormally and the port connected to the target controller is normal, and the other is to control the target controller normally and the port connected to the target controller is abnormal. By simulating the abnormality of a single target controller and the port abnormality, the abnormal working conditions of the target controller are simulated, and at the same time, the controller and the port link are covered, and reliability tests are carried out from multiple dimensions, improving the accuracy of the storage system test.

[0111] Based on any of the above embodiments, an embodiment is provided to illustrate the process of obtaining the single reliability test information of each controller.

[0112] In an exemplary embodiment, such asFigure 6 As shown, obtain the single reliability test information of each controller, including:

[0113] S401. For any target controller in the storage system, when simulating the normal working condition of the target controller, obtain the task completion information when the target controller executes the data read / write task.

[0114] In the embodiment of the present application, for any target controller in the storage system, the computer device simulates the normal working condition of the target controller to obtain the single reliability test information of the target controller through the task completion situation of the target controller.

[0115] Exemplarily, for any target controller in the storage system, the computer device can control the target controller to be in the powered-on state, and the ports connected to the target controller are in the normal working mode, so as to realize the simulation of the normal working condition of the target controller. At the same time, set read / write tasks for the target controller to make the target controller read and write data. After the target controller completes the read / write task, obtain the task completion information.

[0116] For example, send a data write request to the target controller, where the data write request carries the target data to be written and the target write address. After the target controller receives the data write request, according to the information carried in the data write request, write the target data to the target write address. After the target controller finishes writing, obtain the data written by the target controller and the write address, and determine the data written by the target controller and the write address as the task completion information.

[0117] S402. Determine the single reliability test information of the target controller according to the task completion information.

[0118] The computer device can compare the task completion information with the task requirement information to determine the single reliability test information of the target controller.

[0119] For example, still taking the above-mentioned writing of target data as an example, compare the data written by the target controller and the write address with the target data and the target write address carried in the data write request. If the data written by the target controller is consistent with the target data and the write address is consistent with the target write address, it is determined that the single reliability test information of the target controller is that the reliability of the target controller is relatively high; otherwise, if the data written by the target controller is inconsistent with the target data, or the write address is inconsistent with the target write address, it is determined that the single reliability test information of the target controller is that the reliability of the target controller is relatively low.

[0120] In the storage system testing method provided by the embodiments of the present application, for any target controller in the storage system, when simulating the normal working condition of the target controller, the task completion information when the target controller executes the data reading and writing task is obtained, and according to the task completion information, the single reliability test information of the target controller is determined. In this method, an optional way to quickly determine the single reliability test information is provided; by simulating the normal working condition of the target controller, the single reliability test information of the target controller can be determined through the completion situation when the target controller executes the task, providing data support for determining the reliability test result of the storage system subsequently.

[0121] After restoring the target controller to normal, the abnormal recovery test information of the target controller can also be determined according to whether the target controller can enter the system working state normally. Based on this, in the following embodiment, the method for obtaining the abnormal recovery test information of the target controller will be described.

[0122] In an exemplary embodiment, the method further includes:

[0123] For any target controller in the storage system, when controlling the target controller to recover from the abnormal working condition to the normal working condition, according to the working state of the target controller, the abnormal recovery test information of the target controller is obtained.

[0124] In the embodiments of the present application, for any target controller in the storage system, the target controller is controlled to recover from the abnormal working condition to the normal working condition, and then according to the working state of the target controller at this time, the abnormal recovery test information of the target controller is obtained. If the target controller can enter the system to work normally after recovering to the normal working condition, the abnormal recovery test information of the target controller is that the target controller can work normally after abnormal recovery; if the target controller cannot enter the system to work normally after recovering to the normal working condition, the abnormal recovery test information of the target controller is that the target controller cannot work normally after abnormal recovery.

[0125] Among them, when controlling the target controller to recover from the abnormal working condition to the normal working condition, it is necessary to recover according to the mode of the abnormal working condition.

[0126] For example, if the mode of the target controller in the abnormal working condition is that the target controller is in the shutdown state and the port connected to the target controller is in the normal working mode, then when restoring the target controller to the normal working condition, control the target controller to be in the power-on state and control the port connected to the target controller to be in the normal working mode.

[0127] If the mode of the target controller under abnormal conditions is that the target controller is in the power-on state and the port connected to the target controller is in the abnormal working mode, then when the target controller is restored to the normal condition, control the target controller to be in the power-on state and control the port connected to the target controller to be in the normal working mode.

[0128] In the storage system test method provided by the embodiments of the present application, for any target controller in the storage system, when controlling the target controller to recover from the abnormal condition to the normal condition, according to the working state of the target controller, obtain the abnormal recovery test information of the target controller. In this method, when the target controller is restored from the abnormal condition to the normal condition, the abnormal recovery test information of the target controller can also be determined according to whether the target controller can normally enter the system working state. Through this information, the single reliability test information of the target controller can be further determined, providing a more accurate test result for the storage system.

[0129] Based on the above embodiments, an embodiment is provided to illustrate the process of obtaining the abnormal recovery test information of the target controller according to the working state of the target controller.

[0130] In an exemplary embodiment, as Figure 7 shown, obtaining the abnormal recovery test information of the target controller according to the working state of the target controller includes:

[0131] S501, if the target controller can work normally, monitor the states of other controllers, and verify the device information of the target controller before and after abnormal recovery, and determine the verification result as the abnormal recovery test information of the target controller.

[0132] In this embodiment, if the target controller can enter the system to work normally, monitor the states of other controllers, and at the same time verify the device information of the target controller before and after abnormal recovery, and then determine the verification result as the abnormal recovery test information of the target controller. If the device information of the target controller is consistent before and after abnormal recovery, it is determined that the reliability of the target controller is high. If the device information of the target controller is inconsistent before and after abnormal recovery, stop the test and retain the test environment for engineers to locate and solve problems later.

[0133] It should be noted that at this time, after the abnormal recovery of the target controller, the monitoring data of monitoring the states of other controllers can also be used as the basis for determining the storage system test result later. If at this time, the states of other controllers are abnormal, it can also be determined that the reliability of the storage system is poor.

[0134] S502, if the target controller cannot work normally, determine the information that the target controller cannot work normally as the abnormal recovery test information of the target controller.

[0135] If the target controller cannot enter the normal operation of the system, the information that the target controller cannot work properly is determined as the abnormal recovery test information of the target controller, that is, it is determined that the target controller is abnormally unable to recover, and the test is stopped, and the test environment is retained to facilitate engineers to locate and solve problems later.

[0136] In the storage system test method provided by the embodiments of the present application, if the target controller can work properly, the status of other controllers is monitored, and the device information of the target controller before and after abnormal recovery is verified, and the verification result is determined as the abnormal recovery test information of the target controller; if the target controller cannot work properly, the information that the target controller cannot work properly is determined as the abnormal recovery test information of the target controller. In this method, if the target controller can work properly, by verifying the device information of the target controller before and after abnormal recovery, the reliability of the storage system can be determined based on the verification result. If the target controller cannot work properly, the reliability of the storage system can also be determined based on this information that it cannot work properly, providing more dimensional judgment bases for determining the reliability test result of the storage system and improving the accuracy of the reliability test result of the storage system.

[0137] Based on any of the above embodiments, an embodiment is provided to illustrate the process of determining the reliability test result of the storage system according to the above individual reliability test information and the influencing reliability test information.

[0138] In an exemplary embodiment, as Figure 8 shown, determining the reliability test result of the storage system according to each individual reliability test information and each influencing reliability test information includes:

[0139] S601, obtain the system log of the storage system.

[0140] Among them, the system log of the storage system is the log information of the operating system recorded during the entire process of testing the storage system.

[0141] Exemplarily, the computer device can obtain the system log of the storage system from the log database. During the process of performing the reliability test on the storage system, each log file recorded by the system is stored in the log database. When it is necessary to obtain the system log of the storage system, the computer device can screen out the log file that matches the identification information from multiple log files in the log database according to the identification information of the system log, and then determine the screened log file as the system log of the storage system.

[0142] S602, determine the log abnormal list and the log normal list according to the system log and the preset keyword information.

[0143] Among them, the log exception list refers to a list including controller-related data with exception information / error information. The log normal list refers to a list including controller-related data with normal information.

[0144] The preset keyword information may include information indicating exceptions such as "bad", "error", etc., and information indicating normality such as "ok", "succeeded", etc.

[0145] Exemplarily, the computer device may, according to the preset keyword information, filter out data corresponding to the information indicating exceptions from the system log to obtain the log exception list, and filter out data corresponding to the information indicating normality from the system log to obtain the log normal list.

[0146] S603. Determine the reliability test result of the storage system according to the log exception list, the log normal list, each individual reliability test information, and each influencing reliability test information.

[0147] After obtaining the log exception list and the log normal list, the computer device may remove the error information in each individual reliability test information and each influencing reliability test information according to the log exception list and the log normal list, and then determine the reliability test result of the storage system based on the remaining correct information.

[0148] In the storage system test method provided by the embodiments of the present application, by obtaining the system log of the storage system, and then determining the log exception list and the log normal list according to the system log and the preset keyword information, and then determining the reliability test result of the storage system according to the log exception list, the log normal list, each individual reliability test information, and each influencing reliability test information. In this method, by introducing the system log of the storage system, the log exception list including exception information and the log normal list including normal information are obtained according to the system log, providing other data supports for the determination of the reliability test result, so as to more accurately determine the reliability test result of the storage system.

[0149] Based on the above embodiments, an embodiment is provided to illustrate the process of determining the reliability test result of the storage system according to the log exception list, the log normal list, each individual reliability test information, and each influencing reliability test information.

[0150] In an exemplary embodiment, as Figure 9 shown, determining the reliability test result of the storage system according to the log exception list, the log normal list, each individual reliability test information, and each influencing reliability test information includes:

[0151] S701. According to the log exception list and the log normal list, verify each individual reliability test information and each influencing reliability test information to obtain the target influencing reliability test information of each controller for other controllers and the target individual reliability test information of each controller.

[0152] In this embodiment, the computer device can compare the log exception list and the log normal list with each individual reliability test information and each influencing reliability test information, and then determine the target influencing reliability test information of each controller for other controllers and the target individual reliability test information of each controller according to the comparison result.

[0153] If there is information in the influencing reliability test information that is inconsistent with the log exception list and the log normal list, remove the information in the influencing reliability test information that is inconsistent with the log exception list and the log normal list, and then determine the remaining in the influencing reliability test information as the target influencing reliability test information of each controller for other controllers.

[0154] If there is information in the individual reliability test information that is inconsistent with the log exception list and the log normal list, remove the information in the individual reliability test information that is inconsistent with the log exception list and the log normal list, and then determine the remaining in the individual reliability test information as the target individual reliability test information of each controller.

[0155] S702. Determine the reliability test result of the storage system according to the target influencing reliability test information and the target individual reliability test information.

[0156] After the computer device obtains the target influencing reliability test information and the target individual reliability test information, determine the reliability test result of the storage system according to the target influencing reliability test information and the target individual reliability test information. If there is no abnormal information in the target influencing reliability test information and the target individual reliability test information, determine that the reliability test result of the storage system is that the storage system has high reliability; if there is abnormal information in the target influencing reliability test information and the target individual reliability test information, determine that the reliability test result of the storage system is that the storage system has low reliability.

[0157] In the storage system testing method provided by the embodiments of the present application, by verifying each individual reliability test information and each influencing reliability test information according to the log exception list and the log normal list, the target influencing reliability test information of each controller on other controllers and the target individual reliability test information of each controller are obtained. Furthermore, according to the target influencing reliability test information and the target individual reliability test information, the reliability test result of the storage system is determined. In this method, by verifying each individual reliability test information and each influencing reliability test information according to the log exception list and the log normal list, more accurate information can be obtained. Furthermore, according to this more accurate information, the reliability test result of the storage system is determined, further improving the accuracy of the reliability test result.

[0158] It should be understood that although the steps in the flowcharts involved in the above-described embodiments are shown in sequence according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear indication in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-described embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps in other steps.

[0159] Based on the same inventive concept, the embodiments of the present application also provide a storage system testing device for implementing the above-mentioned storage system testing method. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the storage system testing device provided below can refer to the limitations on the storage system testing method in the above text, and will not be repeated here.

[0160] In an exemplary embodiment, as Figure 10 shown, a storage system testing device 1 is provided, including: an information acquisition module 10 and a result determination module 20, where:

[0161] The information acquisition module 10 is configured to, in response to a reliability test request of the storage system, obtain the influencing reliability test information of each controller on other controllers and the individual reliability test information of each controller when simulating different working conditions for each controller in the storage system;

[0162] The result determination module 20 is configured to determine the reliability test result of the storage system according to the individual reliability test information and the influencing reliability test information.

[0163] In one embodiment, the above information acquisition module 10 is further configured to:

[0164] For any target controller in the storage system, when simulating an abnormal working condition for the target controller and simulating a normal working condition for other controllers except the target controller, obtain the influence reliability test information of the target controller on other controllers.

[0165] In one embodiment, the above information acquisition module 10 is further configured to:

[0166] Obtain the test configuration file of the storage system; according to the test configuration file, control the power-on and power-off states of the target controller and the working modes of the ports connected to the target controller to simulate the abnormal working conditions of the target controller.

[0167] In one embodiment, the above information acquisition module 10 is further configured to:

[0168] Control the target controller to be in the power-off state, and control the ports connected to the target controller to be in the normal working mode; or; control the target controller to be in the power-on state, and control the ports connected to the target controller to be in the abnormal working mode.

[0169] In one embodiment, the above information acquisition module 10 is further configured to:

[0170] For any target controller in the storage system, when simulating the normal working condition of the target controller, obtain the task completion information when the target controller executes the data read and write tasks; according to the task completion information, determine the single reliability test information of the target controller.

[0171] In one embodiment, the above storage system test device 1 further includes:

[0172] An abnormal recovery information acquisition module, configured to, for any target controller in the storage system, when controlling the target controller to recover from an abnormal working condition to a normal working condition, obtain the abnormal recovery test information of the target controller according to the working state of the target controller.

[0173] In one embodiment, the above abnormal recovery information acquisition module is further configured to:

[0174] If the target controller can work normally, monitor the states of other controllers, and verify the device information of the target controller before and after the abnormal recovery, and determine the verification result as the abnormal recovery test information of the target controller; if the target controller cannot work normally, determine the information that the target controller cannot work normally as the abnormal recovery test information of the target controller.

[0175] In one embodiment, the above result determination module 20 is further configured to:

[0176] Obtain the system log of the storage system; determine the log exception list and the log normal list according to the system log and the preset keyword information; determine the reliability test result of the storage system according to the log exception list, the log normal list, each individual reliability test information, and each influencing reliability test information.

[0177] In one embodiment, the above result determination module 20 is further configured to:

[0178] Verify each individual reliability test information and each influencing reliability test information according to the log exception list and the log normal list to obtain the target influencing reliability test information of each controller on other controllers and the target individual reliability test information of each controller; determine the reliability test result of the storage system according to each target influencing reliability test information and each target individual reliability test information.

[0179] Each module in the above storage system testing device can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in the processor of the computer device in hardware form or be independent of it, or can be stored in the memory of the computer device in software form, so as to facilitate the processor to call and execute the operations corresponding to the above respective modules.

[0180] In an exemplary embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented:

[0181] In response to a reliability test request of the storage system, when simulating different working conditions for each controller in the storage system, obtain the influencing reliability test information of each controller on other controllers and the individual reliability test information of each controller;

[0182] Determine the reliability test result of the storage system according to each individual reliability test information and each influencing reliability test information.

[0183] For each step implemented by the processor in the embodiments of the present application, the implementation principle and technical effect are similar to those of the above storage system testing method, and will not be elaborated here.

[0184] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0185] In response to a reliability test request of a storage system, under the condition of simulating different operating conditions for each controller in the storage system, obtain the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller;

[0186] Determine the reliability test result of the storage system according to the individual reliability test information and the influence reliability test information.

[0187] The implementation principles and technical effects of the steps implemented when the computer program in the embodiments of the present application is executed by a processor are similar to the principles of the above storage system test method, and will not be elaborated here.

[0188] In one embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0189] In response to a reliability test request of a storage system, under the condition of simulating different operating conditions for each controller in the storage system, obtain the influence reliability test information of each controller on other controllers and the individual reliability test information of each controller;

[0190] Determine the reliability test result of the storage system according to the individual reliability test information and the influence reliability test information.

[0191] The implementation principles and technical effects of the steps implemented when the computer program in the embodiments of the present application is executed by a processor are similar to the principles of the above storage system test method, and will not be elaborated here.

[0192] It should be noted that the personnel information (including but not limited to personnel device information, personnel personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the personnel or fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with relevant regulations.

[0193] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0194] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0195] The above-described embodiments merely represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A storage system testing method, characterized in that: The method comprises: In response to a reliability test request of the storage system, obtaining reliability test information of the influence of each controller on other controllers and individual reliability test information of each controller while simulating different working conditions of each controller in the storage system; A reliability test result of the storage system is determined according to each of the single reliability test information and each of the impact reliability test information.

2. The method according to claim 1, characterized in that The obtaining of reliability test information of the influence of each controller on other controllers includes: For any target controller in the storage system, when abnormal operating conditions are simulated for the target controller and normal operating conditions are simulated for other controllers except the target controller, reliability test information of the impact of the target controller on the other controllers is obtained.

3. The method according to claim 2, characterized in that The simulating abnormal operating conditions of the target controller includes: Obtaining a test configuration file of the storage system; According to the test configuration file, the abnormal working condition of the target controller is simulated by controlling the on / off state of the target controller and the working mode of the port connected to the target controller.

4. The method according to claim 3, characterized in that The controlling of the on / off state of the target controller and the working mode of the port connected to the target controller includes: Control the target controller to be in a shutdown state, and control the port connected to the target controller to be in a normal working mode; or; The target controller is controlled to be in a power-on state, and the port connected to the target controller is controlled to be in an abnormal working mode.

5. The method according to any one of claims 1 to 4, characterized in that: The obtaining of the single reliability test information of each controller includes: For any target controller in the storage system, in the case of simulating a normal working condition of the target controller, obtaining task completion information when the target controller performs a data reading and writing task; According to the task completion information, single reliability test information of the target controller is determined.

6. The method according to any one of claims 1 to 4, characterized in that: The method further comprises: For any target controller in the storage system, when controlling the target controller to recover from an abnormal working condition to a normal working condition, abnormal recovery test information of the target controller is obtained according to the working state of the target controller.

7. The method according to claim 6, characterized in that The step of acquiring abnormal recovery test information of the target controller according to the working state of the target controller includes: If the target controller can work normally, status monitoring is performed on other controllers, and device information of the target controller before and after abnormal recovery is verified, and the verification result is determined as abnormal recovery test information of the target controller; If the target controller cannot work normally, information that the target controller cannot work normally is determined as abnormal recovery test information of the target controller.

8. The method according to any one of claims 1 to 4, characterized in that: The step of determining the reliability test result of the storage system according to each of the single reliability test information and each of the reliability-affecting test information comprises: Obtaining a system log of the storage system; Determine a list of abnormal logs and a list of normal logs according to the system logs and preset keyword information; The reliability test result of the storage system is determined according to the abnormal log list, the normal log list, each of the single reliability test information and each of the reliability impact test information.

9. The method according to claim 8, characterized in that Determining the reliability test result of the storage system according to the abnormal log list, the normal log list, each of the single reliability test information and each of the reliability impact test information includes: According to the abnormal log list and the normal log list, each of the single reliability test information and each of the impact reliability test information are verified to obtain the target impact reliability test information of each controller on the other controllers and the target single reliability test information of each of the controllers; The reliability test result of the storage system is determined according to the reliability test information of each target and the single reliability test information of each target.

10. A storage system testing device, characterized in that: The device comprises: An information acquisition module, configured to respond to a reliability test request of a storage system, and acquire reliability test information of the influence of each controller on other controllers and individual reliability test information of each controller while simulating different working conditions of each controller in the storage system; The result determination module is used to determine the reliability test result of the storage system according to each of the single reliability test information and each of the reliability influencing test information.

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