Surge test method and surge test device

Abstract

The invention relates to a surge test method and a surge test device. The method comprises the following steps: applying a surge waveform to the protection circuit; the protection circuit is used for constraining the output of the protection circuit within a safety range so as to protect the surge waveform; detecting the output of the protection circuit to obtain an output waveform output by the protection circuit; wherein the output waveform is used for determining a test result of the protection circuit, and the test result is used for reflecting a protection result of the protection circuit on the surge waveform. By adopting the method, the damage to the tested equipment can be reduced.

Description

Technical Field

[0001] This application relates to the field of power technologies, and particularly to a surge test method and a surge test device. Background Art

[0002] Before leaving the factory, electronic products need to undergo a surge immunity test, which can also be simply referred to as a surge test. Through the surge test, it can be ensured that electronic products can still operate normally in an electromagnetic environment with surges, improving the safety and reliability of electronic products.

[0003] The surge test simulates the impact of lightning strikes (indirect lightning) in nature and voltage changes caused by large switch switching in the power supply line on the power supply line and communication line, so as to generate an induced lightning strike interference phenomenon on the power line and cable of the device under test.

[0004] However, during the current surge test process, it is easy to cause damage to the device under test. Summary of the Invention

[0005] Based on this, in view of the above technical problems, it is necessary to provide a surge test method and a surge test device that can reduce damage to the device under test.

[0006] In a first aspect, this application provides a surge test method, including:

[0007] Applying a surge waveform to a protection circuit; the protection circuit is used to constrain the output of the protection circuit within a safe range to protect the surge waveform;

[0008] Detecting the output of the protection circuit to obtain an output waveform output by the protection circuit;

[0009] Wherein, the output waveform is used to determine the test result of the protection circuit, and the test result is used to reflect the protection result of the protection circuit for the surge waveform.

[0010] In one embodiment, the method further includes:

[0011] Displaying the output waveform output by the protection circuit.

[0012] In one embodiment, if the amplitude of the output waveform is within a preset amplitude range within a preset duration, or if the amplitude of the output waveform decreases after reaching a preset threshold, the test result is a successful test.

[0013] In one embodiment, if the protection circuit includes a transient voltage suppression diode or a varistor, when the test result is a successful test, the amplitude of the output waveform is within a preset amplitude range within a preset duration;

[0014] If the protection circuit includes a gas discharge tube or a solid discharge tube, then when the test result is a successful test, the amplitude of the output waveform decreases after reaching a preset threshold.

[0015] In one embodiment, when the output waveform is consistent with the surge waveform, the test result is a failed test.

[0016] In one embodiment, applying a surge waveform to the protection circuit includes:

[0017] Applying a surge waveform to the protection circuit through a waveform generator.

[0018] In a second aspect, the present application also provides a surge test device, including a waveform generator, a protection circuit, and a detection device; the protection circuit is respectively connected to the waveform generator and the detection device;

[0019] The waveform generator is configured to apply a surge waveform to the protection circuit;

[0020] The protection circuit is configured to confine the output of the protection circuit within a safe range to protect against the surge waveform;

[0021] The detection device is configured to detect the output of the protection circuit to obtain an output waveform of the output of the protection circuit; the output waveform is used to determine the test result of the protection circuit, and the test result is used to reflect the protection result of the protection circuit against the surge waveform.

[0022] In one embodiment, the surge test device further includes a display device, and the detection device is respectively connected to the protection circuit and the display device;

[0023] The display device is configured to display the output waveform of the protection circuit.

[0024] In one embodiment, the surge test device further includes a resistor, and the resistor is respectively connected to the live wire and the neutral wire of the protection circuit, or the resistor is respectively connected to the live wire and the ground wire of the protection circuit.

[0025] In one embodiment, the waveform generator is further configured to determine the surge waveform according to the voltage test level.

[0026] For the above-mentioned surge test method and surge test device, since the surge waveform is directly applied to the protection circuit, it is possible to avoid the surge waveform being directly applied to the device under test, reducing the damage to the device under test in the related art. Further, since the protection circuit is used to confine the output of the protection circuit within a safe range to protect against the surge waveform, therefore, after detecting the output of the protection circuit to obtain the output waveform of the output of the protection circuit, the test result of the protection circuit can be determined through the output waveform. In this way, it is beneficial to efficiently and accurately obtain the protection result of the protection circuit against the surge waveform through the output waveform. Description of the Drawings

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for the description of the embodiments of the present application or related technologies. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0028] Figure 1 It is a schematic flowchart of a surge test method in an embodiment;

[0029] Figure 2 It is a schematic diagram of a surge waveform in an embodiment;

[0030] Figure 3 It is an application schematic diagram of a protection circuit in an embodiment;

[0031] Figure 4 It is a schematic diagram of an output waveform in an embodiment;

[0032] Figure 5 It is a schematic structural diagram of a surge test device in an embodiment;

[0033] Figure 6 It is a schematic structural diagram of another surge test device in an embodiment;

[0034] Figure 7 It is a wiring schematic diagram of a surge test device in an embodiment;

[0035] Figure 8 It is a schematic diagram of the process of a surge test in an embodiment. Detailed Embodiments

[0036] In order to make the objectives, technical solutions and advantages of the present application more clear, the following further details the present application in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0037] Electromagnetic compatibility (EMC) testing will test the equipment under test (EUT) based on the methods specified by electromagnetic compatibility standards to evaluate whether the EUT meets the standard requirements before leaving the factory.

[0038] Surge immunity testing is a test in EMC testing. Surge refers to a transient wave of current, voltage, or power transmitted along a line or circuit, characterized by a rapid rise followed by a slow fall. Surges are used to simulate the effects of lightning strikes (indirect lightning) in nature and voltage changes caused by large switchings in the power supply line on the power supply line and communication line. It can be understood that the impact of such induced lightning interference on the device under test is very large, such as causing phenomena like the TV screen to be distorted, the light bulb to flicker or be damaged during thunderstorms.

[0039] In the related art, usually when the device under test is in a normal working state, an energy wave with a wavefront time of 1.2 microseconds (μs), a half-peak duration of 50 μs, a voltage amplitude of 1 kilovolt (kV) line-to-line and 2 kV line-to-ground is injected into the power supply line of the device under test, and an interference waveform is generated every 60 seconds to test whether the function or performance of the device under test is reduced or lost, and to test whether the device under test can automatically recover without the intervention of the operator.

[0040] However, the above surge testing method has the following defects:

[0041] First, the related art has a high demand for the number of devices under test. In other words, in the related art, since it is necessary to use a device under test that can work normally for surge testing, the device under test is easily damaged. Even if the device under test can work normally during and after the test, it will also affect the protection devices or internal chips of the device under test.

[0042] Second, in order to enable the device under test to withstand the impact of the surge, in the related art, it is necessary to repeatedly test and make trial and error to determine the protection scheme and parameters for the device under test, which prolongs the R & D time and cost.

[0043] Third, since the test needs to be carried out under the normal working state of the device under test, there are also different requirements for the power supply and test environment setup of the device under test in different application scenarios of the device under test. For example, for a high-power three-phase device under test, a high-power test environment is required.

[0044] Based on this, it is necessary to provide a surge testing method, which will be introduced below.

[0045] Figure 1 For the flow schematic diagram of the surge testing method in an embodiment, in an exemplary embodiment, as Figure 1 shown, a surge testing method is provided, including the following S101 to S102.

[0046] S101, applying a surge waveform to the protection circuit; the protection circuit is used to constrain the output of the protection circuit within a safe range to protect against the surge waveform.

[0047] In order to avoid directly applying the surge waveform to the device under test, in this embodiment, the surge waveform is applied to the protection circuit.

[0048] Among them, the surge waveform is used to simulate a waveform with a specific shape presented by instantaneous overvoltage or overcurrent caused by reasons such as lightning strikes, switch operations, and faults. The following examples are all based on the triangular wave as the surge waveform. Figure 2 It is a schematic diagram of a surge waveform in an embodiment. Figure 2 It shows the variation of the voltage amplitude of the surge waveform with time. As Figure 2 shown, the surge waveform quickly rises to a peak voltage and then drops at a relatively slow speed. Exemplarily, the surge waveform can include but is not limited to an open-circuit voltage waveform of 1.2 / 50 us, a short-circuit current waveform of 8 / 20 us, or an open-circuit voltage waveform of 10 / 700 us, a short-circuit current waveform of 5 / 320 us.

[0049] Optionally, a circuit can be formed by electronic components to apply the surge waveform to the protection circuit. For example, the energy storage capacitor is charged by a power supply, and then the capacitor is controlled to discharge through a resistor and an inductor to the protection circuit to apply the surge waveform to the protection circuit.

[0050] In an exemplary embodiment, optionally, the above S101 can be implemented in the following manner:

[0051] Apply the surge waveform to the protection circuit through a waveform generator.

[0052] That is to say, the waveform generator and the protection circuit are connected so that the waveform generator applies the surge waveform to the protection circuit. In this way, the surge waveform can be efficiently and flexibly applied to the protection circuit through the waveform generator. Optionally, the waveform generator includes but is not limited to a combined wave generator.

[0053] The protection circuit is used to constrain the output of the protection circuit within a safe range to protect the surge waveform. Optionally, the protection circuit includes at least one protection device. Further optionally, the protection device includes but is not limited to at least one of a transient voltage suppressor (TVS), a metal oxide varistor (MOV), a gas discharge tube (GDT), or a solid discharge tube (TSS).

[0054] S102, Detect the output of the protection circuit to obtain the output waveform of the protection circuit output; wherein, the output waveform is used to determine the test result of the protection circuit, and the test result is used to reflect the protection result of the protection circuit against the surge waveform.

[0055] In this embodiment, after applying the surge waveform to the protection circuit, the output of the protection circuit can be detected to obtain the output waveform of the protection circuit output. Optionally, the output of the protection circuit can be detected by a detection device.

[0056] Since the protection circuit is used to confine the output of the protection circuit within a safe range to protect against the surge waveform, that is to say, after the surge waveform passes through the protection circuit, the output waveform of the protection circuit output will change according to the effect of the protection circuit. Therefore, the test result of the protection circuit can be determined through the output waveform, and the test result is used to reflect the protection result of the protection circuit against the surge waveform. Exemplarily, the test result can be test success or test failure. It can be understood that a test result of test success indicates that the protection circuit can protect against the surge waveform, and a test result of test failure indicates that the protection circuit cannot protect against the surge waveform. In some embodiments, the test result can also be a score, and the higher the score, the higher the protection level of the protection circuit against the surge waveform. This embodiment is not limited thereto.

[0057] Optionally, the output waveform of the protection circuit output can be obtained by a computer device, and the test result of the protection circuit can be obtained by analyzing the output waveform. Further optionally, the computer device can input the output waveform of the protection circuit output into a trained waveform analysis model, and the waveform analysis model determines the test result of the protection circuit. The computer device can also compare the output waveform of the protection circuit output with a preset waveform to determine the test result of the protection circuit according to the comparison result between the output waveform and the preset waveform. For example, when the difference between the output waveform and the preset waveform is less than the preset difference, the test result is test success, and when the difference between the output waveform and the preset waveform is not less than the preset difference, the test result is test failure.

[0058] Figure 3 It is a schematic diagram of the application of the protection circuit in an embodiment. As Figure 3 shown, when the test result of the protection circuit is test success, the protection circuit can subsequently be applied to an actual electronic device (also referred to as a protected device) so that the electronic device can still operate normally in an electromagnetic environment with surges.

[0059] In the above surge test method, since the surge waveform is directly applied to the protection circuit, it is possible to avoid the surge waveform being directly applied to the device under test, reducing the damage to the device under test in the related art. Further, since the protection circuit is used to constrain the output of the protection circuit within a safe range to protect the surge waveform, after detecting the output of the protection circuit and obtaining the output waveform of the protection circuit, the test result of the protection circuit can be determined through the output waveform. In this way, it is beneficial to efficiently and accurately obtain the protection result of the protection circuit for the surge waveform through the output waveform.

[0060] In an exemplary embodiment, optionally, the above surge test method may further include the following steps:

[0061] Display the output waveform of the protection circuit.

[0062] In some application scenarios, when a computer device obtains the output waveform of the protection circuit, it not only needs to consider the acquisition accuracy of the waveform, but also needs to consider the impact of the surge waveform on the computer device and protect the computer device. Therefore, after obtaining the output waveform of the protection circuit in this embodiment, the output waveform of the protection circuit will be displayed. Optionally, a display device can be used to display the output waveform of the protection circuit.

[0063] In the above embodiment, by displaying the output waveform of the protection circuit, the test result of the protection circuit can be determined by manually observing the output waveform of the protection circuit, which is more flexible and convenient.

[0064] In an exemplary embodiment, optionally, if the amplitude of the output waveform is within a preset amplitude range within a preset time period, or if the amplitude of the output waveform decreases after reaching a preset threshold, the test result is a successful test.

[0065] In this embodiment, the protection circuit can constrain the output of the protection circuit within a safe range by means of clamping or short-circuiting.

[0066] Taking clamping as an example, when the protection circuit normally protects the surge waveform, the protection circuit can clamp the voltage or current corresponding to the surge waveform within a certain range. Therefore, if the amplitude of the output waveform is within the preset amplitude range within the preset time period, it indicates that the test result is a successful test.

[0067] Among them, the preset time period and the preset amplitude range can be determined according to actual needs. Optionally, the preset amplitude range can be determined according to the circuit parameters of the protection circuit. In this way, after the protection circuit is designed, the preset amplitude range is also determined.

[0068] Figure 4 Schematic diagram of the output waveform in an embodiment, asFigure 4 As shown in (a), taking the preset amplitude range including the preset platform amplitude as an example, if the amplitude of the output waveform is the preset platform amplitude within the preset time duration, that is, there is a "waveform platform" in the output waveform, it indicates that the test result is a successful test.

[0069] Taking a short circuit as an example, when the protection circuit normally protects the surge waveform, the protection circuit can short-circuit the protected device to discharge the energy of the surge waveform. Therefore, if the amplitude of the output waveform drops after reaching the preset threshold, the test result is a successful test. Similarly, optionally, the preset threshold can be determined according to the circuit parameters of the protection circuit. Please refer to Figure 4 As shown in (b), if the amplitude of the output waveform of the protection circuit drops rapidly after reaching the preset threshold, it indicates that the test result is a successful test.

[0070] In the above embodiments, if the amplitude of the output waveform is within the preset amplitude range within the preset time duration, or if the amplitude of the output waveform drops after reaching the preset threshold, the test result is a successful test. Therefore, the output waveform output by the protection circuit can efficiently and accurately determine whether the test result is successful.

[0071] In an exemplary embodiment, optionally, if the protection circuit includes a transient suppression diode or a varistor, then when the test result is a successful test, the amplitude of the output waveform is within the preset amplitude range within the preset time duration.

[0072] In this embodiment, if the protection circuit includes a transient suppression diode or a varistor, the protection circuit restricts the output of the protection circuit within a safe range through clamping. Therefore, in this case, if the amplitude of the output waveform is within the preset amplitude range within the preset time duration, the test result is a successful test. For example, if there is Figure 4 the output waveform shown in (a), the test result is a successful test.

[0073] In an exemplary embodiment, optionally, if the protection circuit includes a gas discharge tube or a solid discharge tube, then when the test result is a successful test, the amplitude of the output waveform drops after reaching the preset threshold.

[0074] In this embodiment, if the protection circuit includes a gas discharge tube or a solid discharge tube, the protection circuit restricts the output of the protection circuit within a safe range through short-circuiting. Therefore, in this case, if the amplitude of the output waveform drops after reaching the preset threshold, the test result is a successful test. For example, if there is Figure 4 the output waveform shown in (b), the test result is a successful test.

[0075] Further optionally, the preset threshold can be the protection voltage of the protection device, for example, the protection voltage of the gas discharge tube or the solid discharge tube.

[0076] In the above embodiments, since if the protection circuit includes a transient suppression diode or a varistor, then when the test result is a successful test, the amplitude of the output waveform is within a preset amplitude range within a preset time period; if the protection circuit includes a gas discharge tube or a solid discharge tube, then when the test result is a successful test, the amplitude of the output waveform decreases after reaching a preset threshold. Therefore, when different types of protection devices are used in the protection circuit, the characteristics of the output waveform presented by a successful test are different. Through the characteristics of the output waveform, the test result can be judged efficiently and accurately.

[0077] In an exemplary embodiment, optionally, when the output waveform is the same as the surge waveform, the test result is a failed test.

[0078] In this embodiment, the output waveform being the same as the surge waveform means that the difference between the output waveform and the surge waveform is less than a preset difference, and the preset difference can be set according to actual requirements. If the protection circuit fails, then the output waveform will be the same as the surge waveform. Therefore, when the output waveform is the same as the surge waveform, it can be determined that the test result is a failed test.

[0079] In the above embodiments, by whether the output waveform is the same as the surge waveform, it can be determined efficiently and accurately whether the test result is a failed test.

[0080] In some embodiments, there may also be a situation where the output waveform is neither the same as the surge waveform nor the output waveform corresponding to a successful test. In such a case, this is usually an unacceptable situation and anomalies need to be investigated.

[0081] Furthermore, if the surge test is directly performed on the device under test as in the related art, it is necessary to observe the device under test to judge the test result. In this scenario, it is possible that the protection circuit fails but the device under test has not failed yet, or it is also possible that the protection circuit has not failed but the device under test has already malfunctioned, which is likely to cause misjudgment. However, in the technical solution of the present application, the judgment basis is only the output waveform of the protection circuit, and the output waveform is clear in both the case of a successful test and a failed test. Therefore, compared with the related art, misjudgment of the test result can also be reduced.

[0082] Based on the same inventive concept, in one embodiment, a surge test device is further provided. Figure 5 For the structural schematic diagram of a surge test device in an embodiment, as Figure 5 shown, the surge test device 500 includes a waveform generator 501, a protection circuit 502, and a detection device 503. The protection circuit 502 is respectively connected to the waveform generator 501 and the detection device 503.

[0083] Among them, a waveform generator 501 is configured to apply a surge waveform to a protection circuit 502.

[0084] The protection circuit 502 is configured to confine the output of the protection circuit 502 within a safe range to protect against the surge waveform.

[0085] A detection device 503 is configured to detect the output of the protection circuit to obtain an output waveform of the output of the protection circuit; the output waveform is used to determine a test result of the protection circuit, and the test result is used to reflect a protection result of the protection circuit against the surge waveform. Among them, the detection device 503 can be a current detection device and / or a voltage detection device. Exemplarily, the detection device 503 can be a current clamp.

[0086] In the above surge test device, since the surge test device includes a waveform generator, a protection circuit, and a detection device, and the protection circuit is respectively connected to the waveform generator and the detection device. Since the waveform generator can apply a surge waveform to the protection circuit, it is possible to avoid directly applying the surge waveform to the device under test and reduce the damage to the device under test in the related art. Moreover, since the protection circuit is configured to confine the output of the protection circuit within a safe range to protect against the surge waveform, and the detection device is configured to detect the output of the protection circuit to obtain an output waveform of the output of the protection circuit, after detecting the output of the protection circuit to obtain the output waveform of the output of the protection circuit, the test result of the protection circuit can be determined through the output waveform. In this way, it is beneficial to efficiently and accurately know the protection result of the protection circuit against the surge waveform through the output waveform.

[0087] Figure 6 is a schematic structural diagram of another surge test device in an embodiment. In an exemplary embodiment, as Figure 6 shown, optionally, the surge test device 500 further includes a display device 504, and the detection device 503 is respectively connected to the protection circuit 502 and the display device 504;

[0088] The display device 504 is configured to display the output waveform output by the protection circuit 502. Exemplarily, the display device 504 can include but is not limited to an oscilloscope.

[0089] In the above embodiment, since the surge test device further includes a display device, and the detection device is respectively connected to the protection circuit and the display device, and the display device displays the output waveform output by the protection circuit, it is possible for a person to flexibly and conveniently observe the output waveform output by the protection circuit to determine the test result of the protection circuit.

[0090] Figure 7 is a wiring schematic diagram of the surge test device in an embodiment, as Figure 7As shown, in one embodiment, optionally, the surge test device 500 further includes a resistor 505. The resistor 505 is used to increase the effective output impedance of the waveform generator 501 to simulate the electromagnetic environment in the actual application scenario. Also, selecting a suitable resistor 505 can also limit the magnitude of the surge current and reduce the damage to the surge test device 500.

[0091] Further optionally, the magnitude of the resistor 505 can be set according to actual requirements. Exemplarily, a resistor 505 of 2 ohms (Ω) represents the source impedance of the low-voltage power grid and is used to simulate the surge situation of direct coupling in the power grid; a resistor 505 of 12 Ω represents the source impedance of the low-voltage power grid to the ground and is used to simulate the surge situation of coupling from the power grid to the ground.

[0092] Please continue to refer to Figure 7 FIG. (a), in one embodiment, optionally, the resistor 505 is respectively connected to the live wire (L) and the neutral wire (N) of the protection circuit 502, that is, arranged line-to-line.

[0093] Please continue to refer to Figure 7 FIG. (b), optionally, the resistor 505 is respectively connected to the live wire and the protective earthing (PE) of the protection circuit 502, that is, arranged line-to-ground.

[0094] Please continue to refer to Figure 7 , in one embodiment, the detection device 503 is connected to the live wire of the protection circuit 502.

[0095] In the above embodiment, since the surge test device further includes a resistor, and the resistor is respectively connected to the live wire and the neutral wire of the protection circuit, or the resistor is respectively connected to the live wire and the ground wire of the protection circuit, therefore, the surge test device can be arranged line-to-line or line-to-ground, with high flexibility.

[0096] In an exemplary embodiment, optionally, the waveform generator 501 is further configured to determine the surge waveform according to the voltage test level.

[0097] In this embodiment, the voltage test level refers to the voltage level to be tested. It can be understood that the required voltage test levels are different in different application scenarios. Furthermore, the user can adjust the energy of the surge waveform by adjusting the voltage test level of the waveform generator 501. For example, when the user sets the voltage test level to level 1, the waveform generator 501 outputs the surge waveform corresponding to level 1, and when the user sets the voltage test level to level 2, the waveform generator 501 outputs the surge waveform corresponding to level 2.

[0098] In the above embodiments, since the waveform generator can determine the surge waveform according to the voltage test level, the surge waveform can be made suitable for different test scenarios through the waveform generator.

[0099] To introduce the present application more clearly, it is described herein in conjunction with Figure 8 as follows. Figure 8 FIG. is a schematic diagram of the process of surge testing in an embodiment. For the process of surge testing, please refer to the following S801 to S805. The processes of S801 to S805 can also refer to the above embodiments and will not be elaborated herein.

[0100] S801, determine the protection circuit. For example, select protection devices according to actual protection requirements and build a protection circuit.

[0101] S802, connect the waveform generator to the protection circuit and connect the display device to the protection circuit to obtain a surge testing device.

[0102] S803, adjust the voltage test level of the waveform generator and apply a surge waveform from the waveform generator to the protection circuit.

[0103] S804, determine the output waveform of the protection circuit shown by the display device.

[0104] S805, determine the test result of the protection circuit according to the output waveform.

[0105] It can be seen that by adopting the technical solution of the present application, first, it is possible to perform surge testing without using the EUT, reducing damage to the EUT. Second, by using a display device (such as an oscilloscope) to confirm the test result, it is not necessary to actually test the EUT, and the requirements for the layout environment and the EUT are low, and it is not necessary to spend a lot of time on the layout and operation of the EUT. Third, the requirements for the test scenario are low, and it is not necessary to consider three-phase power supply, DC power supply, and high and low voltage power supply. It is only necessary to inject the surge waveform output by the waveform generator into the corresponding wire harness.

[0106] It should be understood that although the steps in the flowcharts of the above-described embodiments are shown in sequence according to the arrows, these steps do not necessarily need to be executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowcharts of the above-described embodiments may include multiple steps or multiple stages. These steps or stages do not necessarily need to be executed at the same time, but can be executed at different times. The execution order of these steps or stages does not necessarily need to be sequential, but can be executed alternately or alternately with at least some of the steps or steps in other steps.

[0107] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in this application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in this application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, data processing logics based on quantum computing, artificial intelligence (AI) processors, etc., without limitation.

[0108] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as within the scope recorded in this application.

[0109] The above-described embodiments merely represent several implementation manners of the present application. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims

1. A surge testing method, characterized in that: The method comprises: Applying a surge waveform to a protection circuit; the protection circuit is used to constrain the output of the protection circuit within a safe range to protect against the surge waveform; Detecting the output of the protection circuit to obtain an output waveform of the protection circuit; The output waveform is used to determine the test result of the protection circuit, and the test result is used to reflect the protection result of the protection circuit against the surge waveform.

2. The method according to claim 1, characterized in that The method further comprises: Displays the output waveform of the protection circuit output.

3. The method according to claim 1 or 2, characterized in that: If the amplitude of the output waveform is within a preset amplitude range within a preset time period, or if the amplitude of the output waveform decreases after reaching a preset threshold, the test result is that the test is successful.

4. The method according to claim 3, characterized in that If the protection circuit includes a transient suppression diode or a varistor, then when the test result is that the test is successful, the amplitude of the output waveform is within the preset amplitude range within the preset time length; If the protection circuit includes a gas discharge tube or a solid discharge tube, then when the test result is that the test is successful, the amplitude of the output waveform decreases after reaching the preset threshold.

5. The method according to claim 1 or 2, characterized in that: When the output waveform is consistent with the surge waveform, the test result is a test failure.

6. The method according to claim 1 or 2, characterized in that: The step of applying a surge waveform to the protection circuit comprises: The surge waveform is applied to the protection circuit by a waveform generator.

7. A surge test device, characterized in that: The surge test device comprises a waveform generator, a protection circuit and a detection device; the protection circuit is connected to the waveform generator and the detection device respectively; The waveform generator is used to apply a surge waveform to the protection circuit; The protection circuit is used to constrain the output of the protection circuit within a safe range to protect against surge waveforms; The detection device is used to detect the output of the protection circuit to obtain the output waveform of the protection circuit; the output waveform is used to determine the test result of the protection circuit, and the test result is used to reflect the protection result of the protection circuit against the surge waveform.

8. The surge test device according to claim 7, characterized in that: The surge test device further comprises a display device, and the detection device is connected to the protection circuit and the display device respectively; The display device is used to display the output waveform output by the protection circuit.

9. The surge test device according to claim 7, characterized in that: The surge test device further comprises a resistor, and the resistor is respectively connected to the live wire and the neutral wire of the protection circuit, or the resistor is respectively connected to the live wire and the ground wire of the protection circuit.

10. The surge test device according to claim 7, characterized in that: The waveform generator is also used to determine the surge waveform according to the voltage test level.

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