Probe detection method and system

Abstract

The invention relates to the technical field of probe detection, and discloses a probe detection method which is applied to a probe detection system, the probe detection system comprises a test board, an electric measuring instrument and a control terminal, the electric measuring instrument is electrically connected with the test board, the control terminal is electrically connected with the electric measuring instrument, and the control terminal is electrically connected with the test board. The test board is composed of a plurality of base layers. The method comprises the following steps: S1, connecting a probe to be tested with the test board; s2, judging whether a short circuit occurs between any two adjacent base layers in the test board or not; s3, when a short circuit occurs between any two adjacent base layers in the test board, the control terminal sends a warning signal; and S4, when the short circuit does not occur between any two adjacent base layers in the test board, the control terminal sends a probe normal signal. Through the mode, the defects existing in the background technology are overcome, the probe maintenance accuracy is greatly improved, and the automation degree is high.

Description

Technical Field

[0001] The present invention relates to the technical field of probe detection, and particularly to a probe detection method and system. Background Art

[0002] At present, since the PCBA board needs to undergo many detections during the testing process, and probes are usually required for cooperation during the detections. When the probes fail, the process is not maintained in a timely manner, or reliability problems occur with the probes, it will cause mass scrapping problems, which will have a great impact on the test results of the PCBA board.

[0003] Moreover, the common practice in the market is to manually perform regular maintenance inspections on the probes. Such a detection method is very time-consuming and laborious and the effect is not good. Summary of the Invention

[0004] The purpose of the present invention is to provide a probe detection method and system to solve the deficiencies in the background art, greatly improve the accuracy during probe maintenance, and have a high degree of automation.

[0005] To achieve the above purpose, the present invention provides the following technical solutions: A probe detection method is applied in a probe detection system. The probe detection system includes a test board, an electrical measuring instrument, and a control terminal. The electrical measuring instrument is electrically connected to the test board, and the control terminal is electrically connected to the electrical measuring instrument. The test board is composed of multiple basic layers, including: S1. Connect a probe to be tested to the test board; S2. Determine whether a short circuit occurs between any two adjacent basic layers in the test board; S3. When a short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a warning signal; S4. When no short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a probe normal signal.

[0006] Preferably, the step of determining whether a short circuit occurs between any two adjacent basic layers in the test board includes: S201. Obtain the electrical signal between any two adjacent basic layers in the test board; S202. Determine whether the electrical signal is the same as a conduction signal.

[0007] Preferably, in step S201, the step of obtaining the electrical signal between two adjacent basic layers in the test board includes: S2011. Electrically connect a pin between two adjacent basic layers; S2022. Electrically connect the pin through the electrical measuring instrument.

[0008] Preferably, the electrical measuring instrument is a programmable multimeter.

[0009] To further achieve the above object, the present invention also provides the following technical solutions: A probe detection system includes a test board composed of multiple base layers; and a control terminal electrically connected to the test board. The control terminal determines whether a short circuit occurs between any two adjacent base layers in the test board. When a short circuit occurs between any two adjacent base layers in the test board, the control terminal issues a warning signal. When no short circuit occurs between any two adjacent base layers in the test board, the control terminal issues a normal probe signal.

[0010] Preferably, the probe detection system includes an electrical measuring instrument electrically connected to the test board and the control terminal respectively. The electrical measuring instrument is used to collect electrical signals between any two adjacent base layers on the test board and send the electrical signals to the control terminal. The control terminal determines whether the electrical signals are the same as a conduction signal.

[0011] Preferably, the electrical measuring instrument has multiple test terminals. A pin electrically connects between two adjacent base layers, and each test terminal is electrically connected to the pin respectively, so that the electrical measuring instrument collects the electrical signals between any two adjacent base layers on the test board.

[0012] Preferably, the electrical measuring instrument is a programmable multimeter.

[0013] Compared with the prior art, the beneficial effects of the present invention are as follows: By adopting the above probe detection method and system, the detection of the probe can be effectively and quickly realized, the errors and time waste caused by manual detection can be avoided, the detection efficiency is high. Moreover, by adding this detection method before each detection experiment that requires the use of a probe, the situation of piercing the PCBA board due to probe failure can be well avoided, the defective rate of the PCBA board can be reduced, and unnecessary losses can be avoided. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 Is a flowchart of the probe detection method; Figure 2 Is a schematic diagram of the setting between the test board, the probe and the pin; Figure 3 Is a schematic diagram of the probe detection system. EMBODIMENTS

[0015] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0016] It should be noted that when an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

[0017] It should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present invention.

[0018] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality of" means two or more unless otherwise specifically defined. Embodiment 1

[0019] Refer to Figure 1 and Figure 2, the present invention provides a probe detection method, which is mainly applied in a probe detection system 100. The probe detection system 100 includes a test board 1, an electrical measuring instrument, and a control terminal. The electrical measuring instrument is electrically connected to the test board 1, and the control terminal is electrically connected to the electrical measuring instrument. The test board 1 is composed of multiple base layers 101. Then, the detection method includes: S1. Connect a probe to be tested to the test board; S2. Determine whether a short circuit occurs between any two adjacent base layers in the test board; S3. When a short circuit occurs between any two adjacent base layers in the test board, the control terminal issues a warning signal; S4. When no short circuit occurs between any two adjacent base layers in the test board, the control terminal issues a probe normal signal. Through the above detection method, by determining whether a short circuit occurs between any two adjacent base layers in the test board, when a short circuit occurs between any two adjacent base layers in the test board, it proves that there is an abnormality in the connection between the two base layers 101 at this time. Then, the control terminal issues a warning signal to indicate that the current probe 2 is abnormal, that is, the situation of the probe piercing the PCBA board occurs, proving that the probe 2 fails. On the contrary, when no short circuit occurs between any two adjacent base layers, it proves that the situation of piercing the PCBA board does not occur at this time, proving that the state of the probe 2 is normal. At this time, a probe normal signal will be issued through the control terminal. Therefore, before using the probe, for example, before performing a detection test that requires the use of a probe, the probe can be detected in the above manner first. When the short circuit situation occurs between any two adjacent base layers in the test board in step S3, the control terminal issues a warning signal to indicate that the current probe has failed, thus greatly avoiding unnecessary losses in the follow-up.

[0020] More specifically, in step S2, the step of determining whether a short circuit occurs between any two adjacent base layers in the test board includes: S201. Obtain the electrical signal between any two adjacent base layers in the test board; S202. Determine whether the electrical signal is the same as a conduction signal. Among them, because a probe 2 with normal function will not penetrate the multiple base layers 101 that make up the test board 1 due to its elastic characteristics. If the electrical signal generated between the adjacent base layers 101 is consistent with the conduction signal at this time, it means that a short circuit situation occurs between the two base layers at this time. At this time, the probe 2 connects the multiple base layers 101, that is, the probe 2 pierces the PCBA board, which means that the probe 2 is abnormal. Through this method, it is possible to quickly determine whether a short circuit occurs between the adjacent base layers.

[0021] It should be noted that the size, material, and number of layers of the test board 1 are the same as those of the PCBA board that the probe 2 actually needs to detect, so as to ensure that the results of the probe 2 during detection on the test board 1 are more accurate, which is beneficial to improving the detection efficiency and stability.

[0022] As a preferred implementation manner, in step S201, the step of obtaining the electrical signal between two adjacent basic layers in the test board includes: S2011. Electrically connect a pin 3 between two adjacent basic layers 101; S2022. Electrically connect the pin 3 through the electrical measuring instrument. Through such a setting method, the pin 3 is arranged between the two basic layers 101, and the signal on the pin 3 is detected as the electrical signal, so as to determine whether a conduction signal is generated between the adjacent basic layers 101. If the electrical signal detected on the pin 3 is the same as the conduction signal, it means that the basic layers 101 at both ends of the pin 3 are conducting at this time, indicating that the probe 2 has penetrated through the two basic layers 101 at this time, indicating that the structure of the probe 2 is abnormal at this time. Through such a method, the situation of the probe 2 can be quickly determined, and the rapid detection of the probe 2 can be realized. The whole process requires little manual participation, and at the same time, the accuracy is high, which well solves the deficiencies existing in the background technology and has high detection efficiency.

[0023] Among them, referring to Figure 2 , at this time, the probe has passed through the two basic layers 101 from top to bottom, and the end stays on the second basic layer 101. That is to say, at this time, when the electrical measuring instrument detects the pin between the first basic layer 101 and the second basic layer 101, an electrical signal identical to the conduction signal will be detected, proving that multiple basic layers 101 are penetrated at this time, that is, it indicates that the current probe 2 has failed, so as to realize the result of knowing whether the probe fails in advance before the test.

[0024] As another preferred implementation manner, the electrical measuring instrument is a programmable multimeter, which is an instrument that can measure, test, and record electrical parameters through program control. It integrates multimeter and computer technologies, and can realize automated electrical testing and data recording by connecting to a computer or other control devices.

[0025] As another preferred implementation manner, the warning signal can be in various forms, such as beeping or popping up a preset reminder picture or text on a display screen, so as to warn the user that the probe 2 is abnormal at this time.

[0026] As another preferred embodiment, the control terminal is electrically connected to the electrical measuring instrument. After the probe 2 is connected to the test board, the electrical measuring instrument transmits the collected electrical signal of the pin 3 to the control terminal. After analyzing the electrical signal, the control terminal determines whether the electrical signal is the same as a conduction signal. If the electrical signal is the same as the conduction signal, the control terminal issues a warning signal to indicate that there is an abnormality with the current probe.

[0027] In summary, by adopting the above probe detection method, the detection of the probe 2 can be effectively and quickly realized, errors and time waste caused by manual detection can be avoided, the detection efficiency is high, and the probe detection method can be added before each detection test that requires the use of the probe, which can well avoid the situation of piercing the PCBA board due to probe failure, reduce the defective rate of the PCBA board, and avoid unnecessary losses. Embodiment 2

[0028] Refer to Figure 2 and Figure 3 The present invention also provides a probe detection system 100, including a test board 1 and a control terminal 5, which is electrically connected to the test board 1. The control terminal 5 determines whether a short circuit occurs between any two adjacent base layers 101 in the test board 1. When a short circuit occurs between any two adjacent base layers 101 in the test board 1, the control terminal 5 issues a warning signal. When no short circuit occurs between any two adjacent base layers 101 in the test board 1, the control terminal 5 issues a probe normal signal.

[0029] Furthermore, the probe detection system includes an electrical measuring instrument 4. The electrical measuring instrument is electrically connected to the test board and the control terminal 5 respectively. The electrical measuring instrument 4 is used to collect the electrical signal between any two adjacent base layers 101 on the test board 1 and send the electrical signal to the control terminal 5. The control terminal 5 determines whether the electrical signal is the same as a conduction signal. Among them, the electrical measuring instrument 4 has multiple test ends. Any two adjacent base layers 101 are electrically connected through a pin 3, and each test end is electrically connected to the pin 3 respectively, so that the electrical measuring instrument 4 collects the electrical signal between any two adjacent base layers 101 on the test board 1.

[0030] It should be noted that the size, material, and number of layers of the test board 1 are the same as those of the PCBA board that the probe 2 actually needs to detect, so as to ensure that the results are more accurate when the probe 2 is detected on the test board 1, which is beneficial to improving the detection efficiency and stability.

[0031] As another preferred embodiment, the electrical measuring instrument 4 is a programmable multimeter, which is an instrument capable of measuring, testing, and recording electrical parameters through program control. It integrates multimeter and computer technologies and can achieve automated electrical testing and data recording by connecting to a computer or other control devices.

[0032] As another preferred embodiment, the warning signal can be in various forms such as beeping or popping up a preset reminder picture or text on a display screen to warn the user that the probe 2 is abnormal at this time.

[0033] In summary, by adopting the above probe detection system 100, the detection of the probe 2 can be effectively and quickly realized, the errors and time waste caused by manual detection can be avoided, and the detection efficiency is high. Secondly, the detection method adopted by the probe detection system 100 is the same as the probe detection method in Embodiment 1 and will not be repeated here.

[0034] According to the disclosure and teachings of the above specification, those skilled in the art to which the present invention pertains can also make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and changes to the present invention should also fall within the protection scope of the claims of the present invention. In addition, although some specific terms are used in this specification, these terms are only for convenience of description and do not constitute any limitation to the present invention.

Claims

1. A probe detection method is applied in a probe detection system. The probe detection system includes a test board, an electrical measuring instrument, and a control terminal. The electrical measuring instrument is electrically connected to the test board, and the control terminal is electrically connected to the electrical measuring instrument. The test board is composed of multiple basic layers. Characterized in that, including: S1. Connect a probe to be tested to the test board; S2. Determine whether a short circuit occurs between any two adjacent basic layers in the test board; S3. When a short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a warning signal; S4. When no short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a probe normal signal.

2. The probe detection method according to claim 1, Characterized in that, In step S2, the step of determining whether a short circuit occurs between any two adjacent basic layers in the test board includes: S201. Obtain the electrical signal between any two adjacent basic layers in the test board; S202. Determine whether the electrical signal is the same as a conduction signal.

3. The probe detection method according to claim 2, Characterized in that, In step S201, the step of obtaining the electrical signal between two adjacent basic layers in the test board includes: S2011. Electrically connect a pin between two adjacent basic layers; S2022. Electrically connect the pin through the electrical measuring instrument.

4. The probe detection method according to claim 1, Characterized in that, The electrical measuring instrument is a programmable multimeter.

5. A probe detection system, Characterized in that, including A test board composed of multiple basic layers; and A control terminal electrically connected to the test board. The control terminal determines whether a short circuit occurs between any two adjacent basic layers in the test board. When a short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a warning signal. When no short circuit occurs between any two adjacent basic layers in the test board, the control terminal issues a probe normal signal.

6. The probe detection system according to claim 5, Characterized in that, The probe detection system includes an electrical measuring instrument. The electrical measuring instrument is electrically connected to the test board and the control terminal respectively. The electrical measuring instrument is used to collect the electrical signal between any two adjacent basic layers on the test board and send the electrical signal to the control terminal. The control terminal determines whether the electrical signal is the same as a conduction signal.

7. The probe detection system according to claim 6, Characterized in that, The electrical measuring instrument has multiple test ends. A pin is electrically connected between two adjacent basic layers, and each test end is electrically connected to the pin respectively, so that the electrical measuring instrument collects the electrical signal between any two adjacent basic layers on the test board.

8. The probe detection system according to claim 5, Characterized in that, The electrical measuring instrument is a programmable multimeter.

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