Vehicle-mounted time sensitive network TSN test system and method

Abstract

The invention discloses a vehicle-mounted time sensitive network TSN test system and method, the test system comprises a test processing device and a test device connected with the test processing device, the test processing device stores protocol configuration information of at least one sub-protocol in a TSN protocol family, and the test processing device is connected with a tested part; the test processing equipment determines a to-be-tested target sub-protocol in the protocol configuration information based on the test demand information, and generates a test instruction corresponding to the target sub-protocol; the test device responds to the received test instruction, executes clock synchronization configuration, generates a test message corresponding to the test instruction, sends the test message to the tested component, and receives a feedback message of the tested component; and the test processing equipment generates a test result matched with the feedback message. According to the method and the device, multiple sub-protocols of the TSN can be tested, clock synchronization is completed before the test is executed, actual test requirements are met, and the test precision and effect are improved.

Description

Technical Field

[0001] The present application relates to the field of communication technologies, and particularly to a vehicle-mounted Time-Sensitive Networking (TSN) test system and method. Background Art

[0002] TSN (Time-Sensitive Networking) is a protocol family that realizes deterministic minimum time delay in non-deterministic Ethernet. It is a set of protocol standards developed by the TSN working group in the IEEE 802.1 working group, which defines the time-sensitive mechanism for Ethernet data transmission, adding determinism and reliability to standard Ethernet to ensure real-time, deterministic, and reliable data transmission.

[0003] Currently, the platforms capable of conducting TSN tests are relatively large in volume and high in price, making it impossible to conduct tests flexibly. At the same time, due to the relatively fixed test mode, the complete test requirements and custom test content of users cannot be met. For TSN tests with high time accuracy requirements, the clock accuracy of some TSN test devices is insufficient, resulting in limited accuracy of test results and poor test effects. Summary of the Invention

[0004] In view of the above problems, the present application provides a vehicle-mounted Time-Sensitive Networking (TSN) test system and method, achieving the purpose of improving test accuracy and test effects.

[0005] To achieve the above purpose, the present application provides the following technical solutions:

[0006] A vehicle-mounted Time-Sensitive Networking (TSN) test system, the system comprising:

[0007] A test processing device and a test device connected to the test processing device, wherein the test processing device stores protocol configuration information of at least one sub-protocol in the TSN protocol family, and the test device is connected to a component to be tested;

[0008] The test processing device is configured to determine a target sub-protocol to be tested from the protocol configuration information based on test requirement information, generate a test instruction corresponding to the target sub-protocol, and send the test instruction to the test device;

[0009] The test device is configured to perform clock synchronization configuration in response to receiving the test instruction, generate a test message corresponding to the test instruction, send the test message to the component to be tested, receive a feedback message from the component to be tested, and send the feedback message to the test processing device;

[0010] The test processing device is further configured to generate a test result matching the feedback message.

[0011] Optionally, the system further includes a clock device. One end of the clock device is connected to a global navigation satellite system antenna or a rubidium clock; the other end of the clock device is connected to the test device, so that the test device completes clock synchronization configuration based on the clock device.

[0012] Optionally, the test processing device is further configured to:

[0013] Determine display configuration information based on the test requirement information;

[0014] Display the associated information of the test result based on the display configuration information.

[0015] Optionally, the test device is further configured to parse the test instruction to obtain a message sending mode; send the test message based on the message sending mode, where the message sending mode includes a periodic sending mode or a sending mode based on a preset sending time; wherein, the test message includes the time information when the test device sends the test message.

[0016] Optionally, the system further includes: a multiplexing device. One end of the multiplexing device is connected to the test device, and the other end of the multiplexing device is connected to the component under test; the multiplexing device includes at least one Ethernet interface, and is used to access the component under test when the number of Ethernet interfaces of the test device is less than the number of Ethernet interfaces required by the component under test.

[0017] Optionally, the test device includes at least one Ethernet interface. The test device is configured to sort the feedback messages received by each Ethernet interface, combine them to obtain a message data packet, and send the message data packet to the test processing device; the test device is further configured to send the obtained feedback messages to the test processing device based on a preset Ethernet interface order.

[0018] Optionally, the system further includes: a network splitter. The network splitter is connected to the component under test. The network splitter is used to monitor the state of the component under test, obtain monitoring data, and send the monitoring data and the feedback message sent by the component under test to the test processing device.

[0019] Optionally, the test device is further configured to send the test message to the component under test based on the traffic injection configuration information corresponding to a preset bandwidth.

[0020] Optionally, the traffic injection configuration information includes burst traffic configuration information, and the burst traffic configuration information includes the number of burst frames, burst frame spacing, burst spacing, and traffic characteristics.

[0021] A vehicle-mounted Time-Sensitive Networking (TSN) testing method, comprising:

[0022] Based on the test requirement information, determining a target sub-protocol to be tested in the protocol configuration information;

[0023] Generating a test instruction corresponding to the target sub-protocol;

[0024] In response to the execution of clock synchronization configuration, generating a test message corresponding to the test instruction;

[0025] Obtaining a feedback message generated by the component under test based on the test message;

[0026] Generating a test result that matches the feedback message.

[0027] Compared with the prior art, the present application provides a vehicle-mounted Time-Sensitive Networking (TSN) testing system and method. The testing system includes: a test processing device and a test device connected to the test processing device. The test processing device stores protocol configuration information of at least one sub-protocol in the TSN protocol family, and the test processing device is connected to the component under test; the test processing device determines a target sub-protocol to be tested in the protocol configuration information based on the test requirement information, and generates a test instruction corresponding to the target sub-protocol; the test device, in response to receiving the test instruction, executes clock synchronization configuration, generates a test message corresponding to the test instruction, sends the test message to the component under test, and receives the feedback message from the component under test; the test processing device generates a test result that matches the feedback message. The present application can test multiple sub-protocols of TSN, and complete clock synchronization before the test execution, meeting the actual test requirements and improving the test accuracy and effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present application, and those of ordinary skill in the art can also obtain other drawings according to the provided drawings without creative efforts.

[0029] Figure 1 A schematic structural diagram of a vehicle-mounted Time-Sensitive Networking (TSN) testing system provided by an embodiment of the present application;

[0030] Figure 2 A schematic diagram of a system-level TSN protocol family test topology provided by an embodiment of the present application;

[0031] Figure 3 A topology diagram for single-component TSN sub-protocol testing provided by an embodiment of the present application;

[0032] Figure 4 A schematic diagram of a test process for performing single-component TSN protocol family testing provided by an embodiment of the present application;

[0033] Figure 5 A schematic diagram of a process of a vehicle-mounted time-sensitive network (TSN) testing method provided by an embodiment of the present application. Specific implementation manners

[0034] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0035] Terms such as "first" and "second" in the specification and claims of the present application and the above-mentioned accompanying drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may include steps or units that are not listed.

[0036] In the embodiments of the present application, a vehicle-mounted time-sensitive network (TSN) testing system and method are provided, which are applied to the field of automotive electronic technology, mainly for the performance testing of the TSN protocol family based on a vehicle-mounted time-sensitive network testing device (Automotive TSN Tester, ATT), and can solve problems such as limited TSN sub-protocol testing and low testing accuracy.

[0037] Specifically, refer to Figure 1, which is a schematic structural diagram of a vehicle-mounted Time-Sensitive Networking (TSN) test system provided by an embodiment of the present application. The system includes a test processing device 101 and a test device 102. Among them, the test processing device 101 stores protocol configuration information of at least one sub-protocol in the TSN protocol family, and the test device is connected to the component to be tested. The test processing device is an ATT host computer, and the test device is an ATT slave computer. The test processing device is used to determine a target sub-protocol to be tested from the protocol configuration information based on test requirement information, generate a test instruction corresponding to the target sub-protocol, and send the test instruction to the test device. Among them, the test requirement information is information generated by a user currently having a TSN test requirement. For example, the user can generate corresponding test requirement information by triggering a relevant information selection button in the test processing device. For example, the user can select relevant information of the corresponding sub-protocol to be tested. Through the test requirement information, the target sub-protocol for testing is determined, and then a test instruction corresponding to the target sub-protocol is generated. The test instruction will include corresponding test content.

[0038] When the test device receives the test instruction, it first performs clock synchronization configuration to ensure test accuracy. Then it generates a test message corresponding to the test instruction, sends the test message to the component to be tested, receives the feedback message from the component to be tested, and sends the feedback message to the test processing device. The test processing device is also used to generate a test result that matches the feedback message.

[0039] Specifically, the test processing device is mainly used for configuring test content, such as configuring according to the sub-protocol in the TSN protocol family to be tested, monitoring the progress of the test and generating test reports. For example, the test processing device supports single-component accuracy testing and system testing for IEEE802.1Qbv, IEEE802.1Qci, IEEE802.1CB, and IEEE802.1Qav protocols in the TSN protocol family.

[0040] To facilitate the presentation of test information and enable the user to accurately obtain the test process or test results. In an embodiment of the present application, the test processing device is further used to: determine display configuration information based on the test requirement information; and display the associated information of the test result based on the display configuration information. Among them, the associated information of the test result can be test content information, test process information, or direct test result information. Different display configuration information can be determined based on different sub-protocols to be tested, so as to display the relevant information correspondingly.

[0041] For example, when the protocol to be tested is the Qbv protocol, the content that can be displayed during the Qbv protocol test includes:

[0042] Support separating and statistically analyzing the received data according to priorities and saving it; generating a display interface to display the number of transmitted and received frames, the frame loss rate, and the occupied bandwidth; displaying the measured gating period, window size, guard band size, the situation and proportion of the delay to the next window; and displaying the delay from the transmitter to the receiver and showing the change situation through images.

[0043] For example, when performing Qci protocol tests, the displayable and configurable contents include: displaying the number of yellow frames and green frames transmitted and received; displaying the number of discarded frames; and being able to configure the DEI field in the virtual local area network (VLAN).

[0044] Another example is that when performing CB protocol tests, the displayable and configurable contents include: viewing the message sequence number; supporting reading the registers of the device under test and viewing the modification results of the registers; displaying the buffer of the captured frames in real time; being able to configure the relevant content of RTAG; and being able to customize the transmission sequence number. For example, when sending five traffic flows, the sequence numbers are [0, 0, 3, 4, 5] in sequence.

[0045] In addition to the above configurable information, the test processing device can use an automated script to automatically analyze the data uploaded by the test device and automatically generate a test report corresponding to the test results. Users can freely customize the test content included in the test processing device according to their needs.

[0046] To facilitate time synchronization, in the embodiment of this application, the in-vehicle time-sensitive network TSN test system further includes a clock device. One end of the clock device is connected to a global navigation satellite system antenna or a rubidium clock; the other end of the clock device is connected to the test device so that the test device completes the clock synchronization configuration based on the clock device, improving the accuracy of the ATT test.

[0047] In the test device (such as the ATT lower computer) in the embodiment of this application, a ZU11 chip of the Zynq UltraScale + MPSoC series can be used. This chip is divided into two parts: a processing system (PS) and a programmable logic layer (PL). Among them, the TSN function module runs in the Linux APP on the PS side and controls the interface on the PL side through the corresponding Linux driver on the PS side. In the implementation of the Linux driver side, this application adopts XILINX's LogiCORE 100M / 1G TSN Subsystem IP solution, which supports multiple TSN protocols such as Qbv, Qci, CB, CBS, etc. Due to the modular design, the cost of ATT is well controlled, and modules can be added and deleted according to user needs.

[0048] The test device can also construct, send test messages, and receive feedback messages according to the test instructions sent by the test processing device, and send the received feedback messages to the test processing device through a defined protocol. For example, in message construction, the test device not only supports the construction of basic Precision Time Protocol (PTP), Generalized Precision Time Protocol (gPTP), and IEEE 802.1 CB protocol messages, but can also freely define each byte in the message to achieve complete custom message construction.

[0049] In an implementation manner of the embodiment of the present application, the test device can also determine the message sending mode based on the test instructions. The test device is also used to parse the test instructions to obtain the message sending mode; and send the test message based on the message sending mode. The message sending mode includes a periodic sending mode or a sending mode based on a preset sending time; wherein, the test message includes the time information when the test device sends the test message. Specifically, the sending mode of the custom message can be configured as periodic or triggered through the configuration of the test processing device (such as the ATT host computer). The periodically sent messages can be configured to be sent according to the set sending period and sending duration, or traffic injection can be performed according to the set bandwidth. The messages sent through the ATT will add the time information when the message is sent to the message, which is used to record the time when the message is sent. After the message with the timestamp returns to the ATT through the device under test, the message delay can be calculated through the sending timestamp.

[0050] Correspondingly, in an implementation manner, the test device is also used to send the test message to the component under test based on the traffic injection configuration information corresponding to the preset bandwidth. Optionally, the traffic injection configuration information includes burst traffic configuration information, and the burst traffic configuration information includes the number of burst frames, burst frame spacing, burst spacing, and traffic characteristics. Specifically, the traffic injection function can perform 1%-100% bandwidth traffic injection on any one or more hardware channels for the rates of 100M and 1000M. At the same time, the injection order of multiple traffic can be configured. On the injected Ethernet frames, it supports inputting Ethernet frames exceeding the Ethernet maximum frame limit of 1522 bytes. For the requirements of some TSN protocols, the traffic injection function of the ATT can configure burst traffic, including configuring the number of burst frames, burst frame spacing, burst spacing, and traffic characteristics.

[0051] When the test device receives the feedback message from the component under test, it can also be integrated in different ways. In one implementation, the test device includes at least one Ethernet interface. The test device is used to sort the feedback messages received by each Ethernet interface, combine them to obtain a message data packet, and send the message data packet to the test processing device; the test device is also used to send the obtained feedback messages to the test processing device based on the pre-set Ethernet interface order. For example, the test device can choose to sort the data received by multiple ports as a whole, combine them into an Ethernet packet and send it to the test processing device (such as, the host computer), or send the data monitored by the channel to the host computer according to the channel. When receiving a message, ATT will also add a time information of the moment when the message is received to the message.

[0052] Furthermore, when there are many components under test and the Ethernet interfaces of the test device cannot meet the current test requirements, a multi-way switching device can be used to achieve the lightweight and flexibility of the test device. Specifically, the in-vehicle Time-Sensitive Networking (TSN) test system further includes: a multi-way switching device, one end of the multi-way switching device is connected to the test device, and the other end of the multi-way switching device is connected to the component under test; the multi-way switching device includes at least one Ethernet interface, which is used to access the component under test when the number of Ethernet interfaces of the test device is less than the number of Ethernet interfaces required by the component under test. Specifically, the multi-way switching device is used to connect the test device and the component under test. For example, the test device (such as, ATT) itself has four in-vehicle Ethernet ports. When the number of Ethernet ports required for testing by the component under test is greater than four, a multi-way switching device can be used to connect to ATT. The principle is to forward the uplink and downlink data of two in-vehicle Ethernet ports at the ATT end to the in-vehicle Ethernet ports connected to the device under test through configuration. The relevant configuration is sent from the host computer to the multi-way switching device through the Universal Serial Bus (USB). Through the multi-way switching device, the lightweight and flexibility of the test device can be achieved. In the case of fewer network ports to be tested, only the small-sized ATT can be used to start the test. In the case of more network ports, a multi-way switching device can be added.

[0053] When performing system-level TSN protocol family tests, the in-vehicle Time-Sensitive Networking (TSN) test system further includes: a network splitter, the network splitter is connected to the component under test, and the network splitter is used to monitor the status of the component under test, obtain monitoring data, and send the monitoring data and the feedback message sent by the component under test to the test processing device.

[0054] See Figure 2 , which is a schematic diagram of a system-level TSN protocol family test topology provided by an embodiment of the present application. In Figure 2The test processing device is represented by a host computer application. The host computer application can be connected to a network splitter based on the RJ45 protocol. In Figure 2 the components to be tested include DUT 1, DUT 2, and DUT 3. When conducting system-level TSN protocol family tests, an additional network splitter (represented by TAP) device is required to connect the DUTs on the entire system together through the TAP device. The role of the TAP device is to forward the received data to other ports while copying the monitored data and sending it to the host computer through the industrial Ethernet port. After the TAP is serially connected to the DUT system, the data uploaded to the ATT host computer application through the TAP can be automatically analyzed, and a test report can be automatically generated.

[0055] See Figure 3 for a topology diagram of a single-component TSN sub-protocol test provided by an embodiment of the present application. In Figure 3 the test processing device is represented by a host computer application, and the test device is represented by a lower computer. The ATT host computer TSN function module is responsible for the configuration download, test execution, and test report generation. The host computer TSN function module supports single-component accuracy testing and system testing for the IEEE802.1Qbv, IEEE802.1Qci, IEEE802.1CB, and IEEE802.1Qav protocols in the TSN protocol family. The ATT host computer application can use an automation script to automatically analyze the data uploaded by the lower computer and automatically generate a test report. Users can freely customize the test content included in the host computer application according to their needs.

[0056] The multi-switching device is used to connect ATT to the DUT sample. ATT itself has four in-vehicle Ethernet ports. When the number of Ethernet ports required for testing by the DUT sample is greater than four, it can be connected to ATT through the multi-switching device. The principle is to forward the uplink and downlink data of two in-vehicle Ethernet ports at the ATT end to the in-vehicle Ethernet ports connected to the DUT sample through configuration. The relevant configuration is sent by the host computer to the multi-switching device through the Universal Serial Bus (USB). Through the multi-switching device, the lightweight and flexibility of the test device can be achieved. In the case of fewer network ports to be tested, only the small-sized ATT can be used to start the test. In the case of more network ports, the multi-switching device can be added. The lower computer TSN function module is responsible for constructing, sending, and receiving data packets according to the instructions of the host computer, and sending the received data to the host computer through a defined protocol.

[0057] See Figure 4 for a schematic diagram of the test process for a single-component TSN protocol family test provided by an embodiment of the present application. Among them, the test processing device is represented by a host computer, the test device is represented by a lower computer, and the component to be tested is simply referred to as DUT.

[0058] Before the test starts, according to steps S201 and S202, it is necessary to first configure the ATT slave computer, the multi-channel switching device, and the external clock source, select the protocol and test items to be tested, and input relevant parameters. For the multi-channel switching device and the external clock source, they can be connected according to the test requirements of the device under test.

[0059] After the test starts, according to steps S203, S204, and S205, the ATT slave computer will start to execute the test according to the test items. According to the test process of the test items, the host computer will send the configuration of the message to be sent or injected to the slave computer through USB. After the slave computer parses it, it can complete the construction of the message and send or inject the message to one or more Ethernet ports. At the same time, the ATT slave computer will enable the listening function, listen to the data sent and received on all ports, sort the data, and then send it to the host computer application through USB using the set communication protocol.

[0060] In the test result generation stage, that is, steps S206 and S207, the ATT host computer application will automatically analyze the data uploaded by the slave computer, generate real-time display content according to the test items, and generate test results and test reports after all the analyses are completed.

[0061] The in-vehicle time-sensitive network TSN test system in the embodiment of the present application includes a test processing device and a test device. Functionally, it can not only test multi-Ethernet port devices by adding a multi-channel switching device and inject full-bandwidth traffic, but also solve the pain points of large volume, high price, and limited TSN sub-protocols that can be tested in current market TSN test devices. By connecting an external clock source, the TSN test method based on ATT has higher test accuracy and better test results.

[0062] In the embodiment of the present application, a method for testing an in-vehicle time-sensitive network TSN is also provided. Refer to Figure 5 , including:

[0063] S301. Determine the target sub-protocol to be tested in the protocol configuration information based on the test requirement information;

[0064] S302. Generate a test instruction corresponding to the target sub-protocol;

[0065] S303. In response to the execution of clock synchronization configuration, generate a test message corresponding to the test instruction;

[0066] S304. Obtain a feedback message generated by the component under test based on the test message;

[0067] S305. Generate a test result that matches the feedback message.

[0068] Optionally, the method further includes:

[0069] Determine display configuration information based on the test requirement information;

[0070] Display the associated information of the test result based on the display configuration information.

[0071] Optionally, generating a test message corresponding to the test instruction includes:

[0072] Parse the test instruction to obtain a message sending mode;

[0073] Send the test message based on the message sending mode, where the message sending mode includes a periodic sending mode or a sending mode based on a preset sending time; wherein, the test message includes time information of the test device sending the test message.

[0074] Optionally, the method further includes:

[0075] Sort the feedback messages received by each Ethernet interface and combine them to obtain a message data packet;

[0076] Send the obtained feedback messages based on a preset Ethernet interface order.

[0077] Optionally, the method further includes:

[0078] Send the test message to the component under test based on traffic injection configuration information corresponding to a preset bandwidth.

[0079] Based on the foregoing embodiments, an embodiment of the present application provides a computer-readable storage medium. The computer-readable storage medium stores one or more programs, and the one or more programs can be executed by one or more processors to implement the in-vehicle time-sensitive network TSN test method as described in any one of the above.

[0080] An embodiment of the present application further provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor. The in-vehicle time-sensitive network TSN test method is implemented when the processor executes the program.

[0081] It should be noted that the above-mentioned processor or CPU can be at least one of an application specific integrated circuit (ASIC), a digital signal processor (DSP), a digital signal processing device (DSPD), a programmable logic device (PLD), a field programmable gate array (FPGA), a central processing unit (CPU), a controller, a microcontroller, and a microprocessor. It can be understood that the electronic device implementing the functions of the above-mentioned processor can also be other devices, and the embodiments of the present application do not make specific limitations.

[0082] As described above, the above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present application, and all of them should be covered by the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

[0083] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference can be made to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and reference can be made to the description of the method part for the relevant parts.

[0084] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A vehicle-mounted time-sensitive network TSN test system, characterized in that: The system comprises: A test processing device and a test device connected to the test processing device, wherein the test processing device stores protocol configuration information of at least one sub-protocol in the TSN protocol family, and the test device is connected to a component under test; The test processing device is used to determine the target sub-protocol to be tested in the protocol configuration information based on the test requirement information, generate a test instruction corresponding to the target sub-protocol, and send the test instruction to the test device; The test device is used to respond to receiving the test instruction, perform clock synchronization configuration, generate a test message corresponding to the test instruction, send the test message to the component under test, receive a feedback message from the component under test, and send the feedback message to the test processing device; The test processing device is further used to generate a test result matching the feedback message.

2. The vehicle-mounted time-sensitive network TSN test system according to claim 1, characterized in that: The system also includes a clock device, one end of which is connected to a global navigation satellite system antenna or a rubidium clock; the other end of the clock device is connected to the test device, so that the test device completes clock synchronization configuration based on the clock device.

3. The vehicle-mounted time-sensitive system TSN test system according to claim 1, characterized in that: The test processing equipment is also used for: Based on the test requirement information, determine display configuration information; Based on the display configuration information, the associated information of the test result is displayed.

4. The vehicle-mounted time-sensitive system TSN test system according to claim 1, characterized in that: The test device is also used to parse the test instruction to obtain a message sending mode; send the test message based on the message sending mode, and the message sending mode includes a periodic sending mode or a sending mode based on a preset sending time; wherein the test message includes time information when the test device sends the test message.

5. The vehicle-mounted time-sensitive network TSN test system according to claim 1, characterized in that: The system also includes: a multi-way switching device, one end of which is connected to the test device, and the other end of which is connected to the component under test; the multi-way switching device includes at least one Ethernet interface, which is used to access the component under test when the number of Ethernet interfaces of the test device is less than the Ethernet interfaces required by the component under test.

6. The vehicle-mounted time-sensitive network TSN test system according to claim 1, characterized in that: The test device includes at least one Ethernet interface, and the test device is used to sort the feedback messages received by each Ethernet interface, combine them to obtain a message data packet, and send the message data packet to the test processing device; the test device is also used to send the obtained feedback message to the test processing device based on a pre-set Ethernet interface order.

7. The vehicle-mounted time-sensitive network TSN test system according to claim 1, characterized in that: The system further comprises: a network splitter connected to the tested component, and used for monitoring the status of the tested component, obtaining monitoring data, and sending the monitoring data and feedback messages sent by the tested component to the test processing device.

8. The vehicle-mounted time-sensitive network TSN test system according to claim 1, characterized in that: The test device is also used to send the test message to the tested component based on the traffic injection configuration information corresponding to the preset bandwidth.

9. The vehicle-mounted time-sensitive network TSN test system according to claim 8, characterized in that: The traffic injection configuration information includes burst traffic configuration information, and the burst traffic configuration information includes the number of burst frames, burst frame spacing, burst spacing and traffic characteristics.

10. A vehicle-mounted time-sensitive network TSN testing method, characterized in that: include: Based on the test requirement information, determine the target sub-protocol to be tested in the protocol configuration information; Generating a test instruction corresponding to the target sub-protocol; In response to executing the clock synchronization configuration, generating a test message corresponding to the test instruction; Obtaining a feedback message generated by the tested component based on the test message; Generate a test result that matches the feedback message.

Images