High-temperature working condition testing system for silicon controlled rectifier

Abstract

The invention discloses a high-temperature working condition test system for a silicon controlled rectifier, which comprises an obliquely arranged conveying platform deck, and a chute for the silicon controlled rectifier to freely slide down is arranged along the length direction of the conveying platform deck. A feeding mechanism is arranged on the upper portion of the conveying carrying table, a heating area, a testing area, a cooling area and a material receiving mechanism are sequentially arranged on the conveying carrying table from top to bottom in the height direction, and check blocks capable of ascending or descending along the conveying carrying table are arranged at the tail end of the heating area and the tail end of the testing area. The high-temperature working condition is simulated, the high-voltage alternating-current power supply is adopted to at least apply kilovolt voltage to test a semiconductor, and the failure problem caused by tiny defects of a precise product can be fed back through detection of a peak signal.

Description

Technical Field

[0001] The present invention relates to the technical field of product detection, and specifically to a high-temperature working condition test system for thyristors. Background Art

[0002] With the increasingly wide application scenarios of the power semiconductor bidirectional thyristor, customers have higher and higher requirements for the reliability of products. In the prior art, there is a lack of a test system for the high-temperature working conditions of thyristors, and the performance of thyristors under high-temperature conditions cannot be reflected. Summary of the Invention

[0003] The purpose of the present invention is to provide a high-temperature working condition test system for thyristors to solve the problems raised in the above background art.

[0004] To achieve the above purpose, the present invention provides the following technical solution: A high-temperature working condition test system for thyristors includes an inclined conveying carrier platform, and a chute for the free sliding of thyristors is arranged along the length direction of the conveying carrier platform. An upper feeding mechanism is arranged on the upper part of the conveying carrier platform, and a heating area, a testing area, a cooling area, and a material collecting mechanism are arranged on the conveying carrier platform in sequence from top to bottom along the height direction. Blocks that can rise or fall along the conveying carrier platform are arranged at the ends of the heating area and the testing area;

[0005] A connecting plate that can rise or fall facing the conveying carrier platform is arranged in the testing area. A pin probe is arranged at the bottom of the connecting plate, and the pin probe is connected to a testing circuit; the testing circuit includes a high-voltage AC power supply, a sampling and amplifying circuit, a peak detection and comparison circuit, a trigger control circuit, an intelligent control module, a protection circuit, an anti-shock circuit, and a reset circuit.

[0006] Preferably, the high-voltage AC power supply is used to apply voltage to the product to be tested;

[0007] The sampling and amplifying circuit is connected to the high-voltage AC power supply, collects and amplifies the pulsating voltage signal;

[0008] The peak detection and comparison circuit is connected to the sampling and amplifying circuit and outputs a reference voltage comparison trigger signal. The peak detection and comparison circuit is connected to the trigger control circuit, and the trigger control circuit outputs a protection control signal according to the reference voltage comparison trigger signal output by the peak detection and comparison circuit;

[0009] The intelligent control module is connected to the trigger control circuit, the high-voltage AC power supply, and the reset circuit, is used to receive the reference voltage comparison trigger signal of the trigger control circuit, and output control to the trigger control circuit. The intelligent control module controls the output voltage magnitude and AC commutation of the high-voltage AC power supply;

[0010] The protection circuit is connected to the trigger control circuit. When the peak detection and comparison circuit detects an open circuit, overcurrent, or fault in the product to be tested, the trigger control circuit outputs a protection control signal to the protection circuit, and the protection circuit performs a power-off operation.

[0011] The anti-shock circuit is used to prevent interference to the sampling and amplification circuit and the peak detection and comparison circuit caused by the impact of the high-voltage AC power supply at the moment of power-on.

[0012] The reset circuit is connected to the intelligent control module and is used to restore the overall circuit to the starting state.

[0013] Preferably, the peripheral circuit of the high-voltage AC power supply includes a transformer, and two probes are provided at the output end of the transformer for connecting to the product to be tested.

[0014] Preferably, the protection circuit includes relays K1 and K2 installed at the input end of the transformer, and both relays K1 and K2 are connected to the trigger control circuit.

[0015] Preferably, the sampling and amplification circuit includes resistor R3, operational amplifiers U1 and U2. A resistor R4, a capacitor C1, a zener diode Dz1, and a resistor R5 are connected in parallel between resistor R3 and operational amplifier U1. Operational amplifiers U1 and U2 form a two-stage amplification circuit, and a zener diode Dz2 is connected to the output end of the sampling and amplification circuit.

[0016] Preferably, the peak detection and comparison circuit includes processor U3, comparator U4, and comparator U5. Processor U3 is used for peak signal holding. The inverting input end of comparator U5 is connected to a voltage regulator U6, and voltage regulator U6 has adjustable reference voltage. The peak signal is compared with the reference voltage formed by voltage regulator U6.

[0017] Preferably, the trigger control circuit includes processors U7 and U8. The positive pulse signal Q output by the processor is isolated by resistors R19, R20, transistor Q2, and opto-coupled solid-state relay U10 and sent to the intelligent control module for storage and processing to output a sorting control signal. The negative pulse signal $\overline{Q}$ output by processor U7 is sent to the TR+ end of the trigger control circuit composed of processor U8. Resistors R14 and capacitor C5 set the trigger pulse width. The positive pulse signal Q output by processor U8 is isolated by resistors R17, R18, transistor Q1, and opto-coupled solid-state relay U10 and sent to the intelligent control module for storage and processing to output a protection control signal.

[0018] Preferably, one end of the solid-state relay U11 in the reset circuit is connected to the reset pin of processor U7, and the other end is connected to the intelligent control module.

[0019] Preferably, the impact protection circuit includes a solid-state relay U13 and a processor U12. One section of the processor U12 is connected to the intelligent control module through the solid-state relay U11, and the solid-state relay U13 is connected to the sampling and amplification circuit.

[0020] Compared with the prior art, the beneficial effects of the present invention are as follows: The present invention simulates high-temperature working conditions and uses a high-voltage AC power supply to apply at least a kilovolt voltage to test the semiconductor. By detecting the peak signal, it can accurately feedback the failure problems caused by subtle defects in the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a schematic diagram of the overall circuit principle of the present invention;

[0022] Figure 2 is a system block diagram of the present invention;

[0023] Figure 3 is a schematic diagram of the peripheral connection circuit of the high-voltage AC power supply;

[0024] Figure 4 is a control block diagram of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0026] As Figures 1-4 shown, the present invention provides a technical solution: A high-temperature working condition test system for thyristors includes an inclined conveying carrier platform, and a chute for the thyristors to freely slide down is arranged along the length direction of the conveying carrier platform. A feeding mechanism 1 is arranged on the upper part of the conveying carrier platform, and a heating area 2, a testing area 3, a cooling area 4, and a material receiving mechanism are arranged on the conveying carrier platform in sequence from top to bottom along the height direction. Blocks 8 that can rise or fall along the conveying carrier platform are arranged at the ends of the heating area 2 and the testing area 3;

[0027] The testing area 3 is provided with a connecting plate that can rise or fall facing the conveying carrier platform. A pin probe is arranged at the bottom of the connecting plate, and the pin probe is connected to a testing circuit. The testing circuit, the corresponding testing control system 7, and the temperature control system are all installed at the bottom position of the conveying carrier platform.

[0028] The thyristor product is released from the feeding mechanism 1, slides downwards from the chute, and is first blocked by the stopper 8 at the end of the heating zone 2. After being heated for a period of time, it continues to flow to the testing area, and electrical testing is carried out through the docking of the pin probe with the thyristor pins. After the testing is completed, it continues to flow downwards to the cooling zone and is finally collected by the receiving mechanism 5.

[0029] The test circuit includes a high-voltage AC power supply, a sampling and amplifying circuit, a peak detection and comparison circuit, a trigger control circuit, an intelligent control module, a protection circuit, an anti-shock circuit, and a reset circuit;

[0030] The high-voltage AC power supply is used to apply a voltage to the product to be tested, and a voltage of at least 1000 volts is applied to meet the requirements; as Figure 1 shown, the peripheral circuit of the high-voltage AC power supply includes a transformer, and two probes are provided at the output end of the transformer for connecting with the product to be tested. The protection circuit includes relays K1 and K2 installed at the input end of the transformer, and both relays K1 and K2 are connected to the trigger control circuit.

[0031] The sampling and amplifying circuit is connected to the high-voltage AC power supply, collects and amplifies the pulsating voltage signal; as Figure 1 shown, the sampling and amplifying circuit includes a resistor R3, operational amplifiers U1 and U2. A resistor R4, a capacitor C1, a zener diode Dz1, and a resistor R5 are connected in parallel between the resistor R3 and the operational amplifier U1. The operational amplifiers U1 and U2 form a two-stage amplifying circuit, and a zener diode Dz2 is connected to the output end of the sampling and amplifying circuit.

[0032] The peak detection and comparison circuit is connected to the sampling and amplifying circuit and outputs a reference voltage comparison trigger signal. The peak detection and comparison circuit is connected to the trigger control circuit. The trigger control circuit outputs a protection control signal according to the reference voltage comparison trigger signal output by the peak detection and comparison circuit; the peak detection and comparison circuit includes a processor U3, comparators U4 and U5. The processor U3 is used for peak signal holding. The inverting input end of the comparator U5 is connected to a voltage regulator U6, and the voltage regulator U6 has adjustable reference voltage. The peak signal is compared with the reference voltage formed by the voltage regulator U6.

[0033] Refer to Figure 1As shown in the figure, the weak pulsating voltage signal sampled by the sampling and amplifying circuit is filtered by R3 and C1, clamped by DZ1, and fed into the non-inverting + terminal of the TL084(A) operational amplifier for the first-stage amplification, and then fed into the non-inverting + terminal of the TL084(B) operational amplifier for the second-stage amplification. The two-stage voltage amplification signal clamped by DZ2 is fed into the peak detection and holding circuit composed of LF398 and TL084(C). The peak DC voltage signal output by the peak detection and holding circuit is fed into the non-inverting + terminal of the comparator U5 (TL084D), compared with the reference voltage composed of U6 (TL431) to output a trigger signal, and fed into the TR+ terminal of the trigger control circuit composed of U7 (HCF4098). R12 and C4 set the trigger pulse width. The positive pulse signal Q processed and output by U7 (HCF4098) is isolated by the opto-coupled solid-state relay composed of R19, R20, Q2, and U10 (AQY212) and sent to the intelligent control module for storage and processing to output the sorting control signal. The negative pulse signal Uō8 output by U7 (HCF4098) is sent to the TR+ terminal of the trigger control circuit composed of (HC entered F4098). R14 and C5 set the trigger pulse width. The positive pulse signal Q processed and output by U8 (HCF4098) is isolated by the opto-coupled solid-state relay composed of R17, R18, Q1, and U10 (AQY212) and sent to the intelligent control module for storage and processing to output the protection control signal.

[0034] The intelligent control module is connected to the trigger control circuit, the high-voltage AC power supply, and the reset circuit, and is used to receive the reference voltage comparison trigger signal of the trigger control circuit and output control to the trigger control circuit. The intelligent control module controls the output voltage magnitude and AC commutation of the high-voltage AC power supply;

[0035] The protection circuit is connected to the trigger control circuit. When the peak detection and comparison circuit detects an open circuit, overcurrent, and faults of the product to be tested, the trigger control circuit outputs a protection control signal to the protection circuit, and the protection circuit performs a power-off operation;

[0036] The anti-shock circuit is used to prevent interference to the sampling and amplifying circuit and the peak detection and comparison circuit caused by the impact of the high-voltage AC power supply at the moment of power-on. The anti-shock circuit includes the solid-state relay U13 and the processor U12. One section of the processor U12 is connected to the intelligent control module through the solid-state relay U11, and the solid-state relay U13 is connected to the sampling and amplifying circuit.

[0037] The reset circuit is connected to the intelligent control module and is used to restore the overall circuit to the starting state. The reset circuit includes one end of the solid-state relay U11 connected to the reset pin of the processor U7 and the other end connected to the intelligent control module.

[0038] When the high-voltage sampling circuit described in this embodiment is applied, it needs to cooperate with the mechanical module. The mechanical module includes an automatic feeding module, a probe testing module, an intelligent sorting module, and an automatic material collecting module;

[0039] Perform the following steps under the control of the intelligent control module:

[0040] The product to be tested is input through the automatic feeding module, the probe test module is connected to the pin of the product to be tested, and voltage is applied to the probe test module through a high-voltage AC power supply;

[0041] The pulse signal output is obtained through sampling and processing by the sampling and amplification circuit, the peak detection and comparison circuit, and the trigger control circuit and is sent to the intelligent control module for identification and storage processing. When the intelligent control module detects qualified products or defective products, the intelligent control module outputs a control signal to control the intelligent sorting module. The intelligent sorting module automatically classifies qualified products and defective products. The automatic material receiving module automatically receives materials into qualified material tubes and defective material tubes according to the classification of the intelligent sorting module. When the intelligent control module detects that the tested product is short-circuited, over-current, or faulty, the intelligent control module outputs a control signal to control the protection module, cuts off the high-voltage AC power supply module's AC source and alarms. When the fault alarm is released, the intelligent control module outputs a control signal to control the reset circuit to reset, and the equipment continues testing.

[0042] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A high temperature working condition test system for thyristors, characterized in that: The invention comprises an inclined conveying platform, and a slideway for the thyristor to slide freely is arranged along the length direction of the conveying platform. A loading mechanism is arranged on the upper part of the conveying platform, and a heating zone (2), a testing zone (3), a cooling zone (4) and a receiving mechanism are arranged on the conveying platform in sequence from top to bottom along the height direction. The ends of the heating zone (2) and the testing zone (3) are both provided with blocks that can rise or fall along the conveying platform; The test area (3) is provided with a connection plate that can be raised or lowered directly in front of the conveying platform, and a pin probe is provided at the bottom of the connection plate, and the pin probe is connected to a test circuit; The test circuit includes a high-voltage AC power supply, a sampling and amplifying circuit, a peak detection and comparison circuit, a trigger control circuit, an intelligent control module, a protection circuit, an anti-shock circuit and a reset circuit.

2. A high temperature working condition testing system for thyristors according to claim 1, characterized in that: A high voltage AC power source is used to apply voltage to the product under test; The sampling and amplifying circuit is connected to a high-voltage AC power supply to collect and amplify the pulsating voltage signal; The peak detection comparison circuit is connected to the sampling and amplifying circuit and outputs a reference voltage comparison trigger signal. The peak detection comparison circuit and the trigger control circuit output a protection control signal according to the reference voltage comparison trigger signal output by the peak detection comparison circuit. The intelligent control module is connected to the trigger control circuit, the high-voltage AC power supply and the reset circuit, and is used to receive the reference voltage comparison trigger signal of the trigger control circuit and output control to the trigger control circuit. The intelligent control module controls the output voltage of the high-voltage AC power supply and the AC commutation; The protection circuit is connected to the trigger control circuit. When the peak detection comparison circuit detects that the product to be tested is open circuit, overcurrent or faulty, the trigger control circuit outputs a protection control signal to the protection circuit, and the protection circuit performs a power-off operation. The anti-shock circuit is used to prevent the high-voltage AC power supply from interfering with the sampling amplifier circuit and the peak detection comparison circuit during the power-on moment; The reset circuit is connected to the intelligent control module and is used to restore the entire circuit to an initial state.

3. A high temperature working condition testing system for thyristor according to claim 1, characterized in that: The peripheral circuit of the high-voltage AC power supply includes a transformer. Two probes are arranged at the output end of the transformer for connecting with the product to be tested.

4. A high temperature working condition testing system for thyristors according to claim 2, characterized in that: The protection circuit comprises a relay K1 and a relay K2 installed at the input end of the transformer, and both the relay K1 and the relay K2 are connected to the trigger control circuit.

5. A high temperature working condition testing system for thyristor according to claim 1, characterized in that: The sampling and amplifying circuit includes a resistor R3 and operational amplifiers U1 and U2. A resistor R4, a capacitor C1, a voltage-stabilizing diode Dz1 and a resistor R5 are connected in parallel between the resistor R3 and the operational amplifier U1. The operational amplifier U1 and the operational amplifier U2 form a two-stage amplifying circuit. The output end of the sampling and amplifying circuit is connected to a voltage-stabilizing diode Dz2.

6. A high temperature working condition testing system for thyristors according to claim 4, characterized in that: The peak detection comparison circuit includes a processor U3, a comparator U4 and a comparator U5. The processor U3 is used to maintain the peak signal. The reverse input end of the comparator U5 is connected to a regulator U6. The regulator U6 has an adjustable reference voltage. The peak signal is compared with the reference voltage formed by the regulator U6.

7. A high temperature working condition testing system for thyristors according to claim 1, characterized in that: The trigger control circuit includes processor U7 and processor U8. The processed output positive pulse signal Q is isolated via resistor R19, resistor R20, transistor Q2, and optocoupler solid-state relay U10 and sent to the intelligent control module for storage and processing of the output sorting control signal. The negative pulse signal Uō8 output by processor U7 is sent to the TR+ end of the trigger control circuit for processing. Resistor R14 and capacitor C5 set the trigger pulse width. The positive pulse signal Q output by processor U8 is isolated via resistor R17, resistor R18, transistor Q1, and optocoupler solid-state relay U10 and sent to the intelligent control module for storage and processing of the output protection control signal.

8. The high temperature working condition testing system for thyristor according to claim 1, characterized in that: The reset circuit includes a solid-state relay U11, one end of which is connected to the reset pin of the processor U7, and the other end of which is connected to the intelligent control module.

9. A high temperature working condition testing system for thyristors according to claim 8, characterized in that: The anti-shock circuit includes a solid-state relay U13 and a processor U12. One section of the processor U12 is connected to the intelligent control module via the solid-state relay U11, and the solid-state relay U13 is connected to the sampling and amplifying circuit.

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