Contactor guide pin device
By designing a device for testing the contactor guide pin, it is possible to detect defects in the alignment and size setting of the guide pin, and the error contact problem of the contactor with the printed circuit board and the test equipment in the prior art is solved, and the reliability of the test results is improved.
Patent Information
- Application Number
- CN202311739962.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-18
- Publication Date
- 2025-06-20
AI Technical Summary
In the prior art, when testing guide pins associated with contactors, it is difficult to effectively identify defects in alignment and size setting of guide pins, resulting in erroneous contact between the contactor and the printed circuit board and the test equipment, resulting in unreliable test results.
A device for testing contactor guide pins is designed, which has a rectangular prism-shaped base and through-hole, and by inserting the guide pins into the holes of the device in different orientations, the alignment and size setting defects of the guide pins can be detected.
The device can effectively identify the alignment and size setting defects of the contactor guide pins, ensure the correct contact between the contactor and the printed circuit board and the test equipment, and improve the reliability of the test results.
Smart Images
Figure CN120177988A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to a contactor for mounting an integrated circuit (IC) package on a printed circuit board (PCB). Specifically, this specification relates to an apparatus and method for testing a guide pin associated with the contactor. Background Art
[0002] The contactor serves as a medium for connecting an integrated circuit (IC) package, such as a quad flat no-lead (QFN) package, to a printed circuit board (PCB). Contactors are commonly used for testing QFN packages. During testing, the QFN package is temporarily mounted on the PCB using the contactor. The contactor includes different components, such as contactor pins for electrical connection to the IC package, a socket body for fixing the IC package, guide pins for mounting the contactor to the PCB, etc. The guide pins indicate the mounting position of the contactor towards the PCB. The guide pins are further used to connect the contactor to a test device (e.g., a processor) for testing the QFN package. Summary of the Invention
[0003] A first example relates to an apparatus for a contactor. The apparatus includes a substrate having a rectangular prism shape, the substrate having a first face and a second face, the second face being opposite the first face. The apparatus further includes a first pair of holes proximate a first edge of the substrate, the centers of the first pair of holes being spaced apart by a first distance. A first hole of the first pair of holes has a first diameter, a second hole of the first pair of holes has a second diameter different from the first diameter, and the center of the second hole of the first pair of holes is spaced apart from a third edge of the substrate by a second distance. Additionally, the apparatus includes a second pair of holes proximate a second edge of the substrate, the centers of the second pair of holes being spaced apart by the first distance, the second edge of the substrate being opposite the first edge of the substrate. A first hole of the second pair of holes has the second diameter and a second hole of the second pair of holes has the first diameter, and the center of the second hole of the second pair of holes is spaced apart from a fourth edge of the substrate by the second distance, the fourth edge being opposite the third edge of the substrate. The centerlines of the first edge and the second edge of the substrate cross the center of the first hole of the first pair of holes and the center of the first hole of the second pair of holes.
[0004] A second example relates to a method for testing a contactor. The method includes inserting a first guide pin and a second guide pin of the contactor into through holes of a device in a first orientation. The device includes a substrate having a rectangular prism shape and a first pair of holes in the through holes near a first edge of the substrate, the centers of the first pair of holes being spaced apart by a first distance. A first hole of the first pair of holes has a first diameter, a second hole of the first pair of holes has a second diameter different from the first diameter, and the center of the second hole of the first pair of holes is spaced apart from a third edge of the substrate by a second distance. The device further includes a second pair of holes in the through holes near a second edge of the substrate, the centers of the second pair of holes being spaced apart by the first distance, the second edge of the substrate being opposite the first edge. A first hole of the second pair of holes has the second diameter, and a second hole of the second pair of holes has the first diameter, the second hole being spaced apart from a fourth edge of the substrate by the second distance, the fourth edge being opposite the third edge, and the centerlines of the first edge and the second edge of the substrate cross the center of the first hole of the first pair of holes and the center of the first hole of the second pair of holes. The method further includes determining whether the first guide pin and the second guide pin extending from the surface of the contactor are aligned based on the insertion of the first guide pin and the second guide pin extending from the surface of the contactor in the first orientation. Additionally, the method includes: rotating the contactor 180 degrees in a first orientation about an axis perpendicular to the surface of the contactor, thereby setting the contactor in a second orientation; and inserting the first guide pin and the second guide pin extending from the surface of the contactor into the through holes of the device in the second orientation. Further, the method includes determining whether the first guide pin and the second guide pin extending from the surface of the contactor are properly sized based on the insertion of the first guide pin and the second guide pin extending from the surface of the contactor in the second orientation. BRIEF DESCRIPTION OF THE DRAWINGS
[0005] Figure 1A A transparent view showing an example device for a contactor.
[0006] Figure 1B A perspective view showing an example device for a contactor.
[0007] Figure 1C A bottom view showing an example device for a contactor.
[0008] Figure 1D A top view showing an example device for a contactor.
[0009] Figure 2A An example contactor is shown.
[0010] Figure 2B1 An example view showing a first guide pin of the contactor.
[0011] Figure 2B2 An example view showing a second guide pin of the contactor.
[0012] Figure 3A Shows an example first arrangement for testing the alignment of the guide pins of a contactor.
[0013] Figure 3B Shows an example first arrangement demonstrating a failed alignment test.
[0014] Figure 4A Shows an example second arrangement for testing the sizing (e.g., diameter) of the guide pins of a contactor.
[0015] Figure 4B Shows an example second arrangement demonstrating a failed sizing test.
[0016] Figure 5A Shows an example third arrangement for testing the alignment of the guide pins of a contactor.
[0017] Figure 5B Shows an example third arrangement demonstrating a failed alignment test.
[0018] Figure 6A Shows an example fourth arrangement for testing the sizing (e.g., diameter) of the guide pins of a contactor.
[0019] Figure 6B Shows an example fourth arrangement demonstrating a failed sizing test.
[0020] Figure 7A Shows an example contactor arrangement.
[0021] Figure 7B Shows another example contactor arrangement.
[0022] Figure 8 Shows a flowchart of a method for detecting defects in the guide pins of a contactor. Detailed Description
[0023] This description relates to testing guide pins associated with a contactor. The guide pins extend from a first surface and a second surface of the contactor. In some instances, the portion of the guide pin extending from the first surface of the contactor is used to connect to a printed circuit board (PCB), and the portion of the guide pin extending from the second surface of the contactor is used to connect to a test device (e.g., a processor). When the guide pins are defective in terms of, for example, their alignment (sometimes referred to as bending) or their sizing (e.g., diameter), the contact positions of the contactor with the PCB and / or the test device change. This is commonly referred to as miscontact. When miscontact occurs, the QFN package will be coupled to the PCB in a defective manner, resulting in unreliable test results.
[0024] In view of the foregoing, a device and method are described herein for testing a guide pin of a contactor to identify defects associated with the guide pin. The proposed device (e.g., fixture) for testing the guide pin includes a base having a rectangular prism shape, the base having a first face and a second face, the second face being opposite the first face. The base includes a through hole extending from the first face to the second face. A guide pin associated with the contactor is inserted into the hole of the base to detect defects associated with the guide pin. The guide pin is inserted into the hole in a first orientation to detect defects associated with the alignment (or bending) of the guide pin. In addition, the guide pin is inserted into the hole in a second orientation to detect defects associated with the sizing (or diameter) of the guide pin.
[0025] In some instances, a portion of the guide pin extending from a first surface of the contactor is inserted into the hole at the first surface of the base to detect defects associated with the portion of the guide pin extending from the first surface of the contactor. In addition, a portion of the guide pin extending from a second surface of the contactor is inserted into the hole at the second face of the base to detect defects associated with the portion of the guide pin extending from the second surface of the contactor. In some instances, detecting defects associated with the guide pin using the described device can identify good contactors, which can then be used to test QFN packages, resulting in reliable and high yields. In addition, the device and method provide a low-cost and simple way to detect defects associated with the guide pins of a contactor.
[0026] Figure 1A A transparent view of an example device 100 for a contactor is shown. In some instances, device 100 is used to test guide pins associated with a contactor (not shown). In some instances, the contactor has two guide pins, such as a first guide pin and a second guide pin. In some instances, device 100 is a fixture for a contactor. Device 100 includes a base 102 having a rectangular prism shape, the base 102 having a first face 104 and a second face 106, the second face 106 being opposite the first face 104. Device 100 further includes a first pair of holes (e.g., first hole 108 and second hole 110) proximate a first edge 112 of the base 102. The first hole 108 and the second hole 110 are through holes extending from the first face 104 of the base 102 to the second face 106. The centers of the first hole 108 and the second hole 110 are spaced apart by a first distance x. The first hole 108 in the first pair of holes has a first diameter, and the second hole 110 in the first pair of holes has a second diameter different from the first diameter. In addition, the center of the second hole 110 in the first pair of holes is spaced apart from a third edge 114 of the base 102 by a second distance y.
[0027] In addition, the device 100 includes a second pair of holes (e.g., a first hole 116 and a second hole 118) that are close to a second edge 120 of the substrate 102, where the second edge 120 of the substrate 102 is opposite to a first edge 112 of the substrate 102. The first hole 116 and the second hole 118 are through-holes that extend from a first side 104 of the substrate 102 to a second side 106. The centers of the first hole 116 in the second pair of holes and the second hole 118 in the second pair of holes are spaced apart by a first distance x. The first hole 116 in the second pair of holes has a second diameter, and the second hole 118 in the second pair of holes has a first diameter. In addition, the center of the second hole 118 in the second pair of holes is spaced apart from a fourth edge 122 of the substrate 102 by a second distance y. In some examples, the fourth edge 122 of the substrate 102 is opposite to a third edge 114 of the substrate 102. A center line 124 of the first edge 112 and the second edge 120 of the substrate 102 crosses the center of the first hole 108 in the first pair of holes and the center of the first hole 116 in the second pair of holes. In some examples, the device 100 further includes a first extended wing portion 126 that extends from the third edge 114 and a second extended wing portion 128 that extends from the fourth edge 122. The first extended wing portion 126 and the second extended wing portion 128 are used for gripping the device 100.
[0028] In some examples, the first hole 108 in the first pair of holes is positioned to test the alignment of a first guide pin (not shown) of a contactor, and the second hole 118 in the second pair of holes is positioned to test the alignment of a second guide pin (not shown) of the contactor. In addition, the second hole 110 in the first pair of holes is sized to test the diameter of the second guide pin (not shown) of the contactor, and the first hole 116 in the second pair of holes is sized to test the diameter of the first guide pin (not shown) of the contactor.
[0029] Figure 1B A perspective view of an example device 150 for a contactor is shown. In some examples, the device 150 is the same as the Figure 1A device 100, so the features described above with respect to Figure 1A also apply here.
[0030] Figure 1C A bottom view of an example device 160 for a contactor is shown. In some examples, the device 160 is the same as the Figure 1A device 100. The device 160 has a substrate 162 that has a bottom surface 164 and a top surface (not shown) opposite to the bottom surface 164. In some examples, the bottom surface 164 corresponds to Figure 1A the first side 104 of Figure 1CThe first hole 166 and the second hole 168 in Figure 1A correspond to the first hole 108 and the second hole 110 in Figure 1C respectively. The substrate 160 further includes a second pair of holes, which includes a first hole 170 and a second hole 172. The second pair of holes is close to (or near) the second edge 173 of the substrate 162. The second edge 173 is opposite to the first edge 169. Figure 1A The first hole 170 and the second hole 172 in
[0031] correspond to the first hole 116 and the second hole 118 in Figure 1C respectively.
[0032] In an instance of
[0033] Figure 1D , the centers of the first hole 166 and the second hole 168 in the first pair of holes are spaced apart by a first distance of 5 millimeters (mm). In some instances, the first hole 166 and the second hole 168 have a positional tolerance of 20 micrometers or less. Additionally, the centers of the first hole 170 and the second hole 172 in the second pair of holes are spaced apart by the first distance (e.g., 5 mm). In some instances, the first hole 170 and the second hole 172 have a positional tolerance of 20 micrometers or less. In different instances, the first distance and the positional tolerance may be different. The first hole 166 in the first pair of holes and the second hole 172 in the second pair of holes have a first diameter of 1.53 mm. Additionally, the second hole 168 in the first pair of holes and the first hole 170 in the second pair of holes have a second diameter of 1.5 mm. In different instances, the values of the first diameter and the second diameter may be different. However, in such instances, the first diameter is greater than the second diameter.
[0032] The substrate 162 further includes a third edge 174 and a fourth edge 176 opposite to the third edge 174. In this instance, the first edge 169 and the second edge 173 have a length of 37.4 mm. However, in other instances, the lengths of the first edge 169 and the second edge 173 may be different. The center line 178 of the first edge 169 and the second edge 173 of the substrate 162 crosses the center of the first hole 166 in the first pair of holes and the center of the first hole 170 in the second pair of holes. Therefore, in this instance, the center of the first hole 166 is 18.7 mm away from the third edge 174 and the fourth edge 176. Similarly, the center of the first hole 170 is 18.7 mm away from the third edge 174 and the fourth edge 176. In other instances, the distance between the center of the first hole 170 and the third edge 174 is longer or shorter. Additionally, in this instance, the center of the second hole 168 in the first pair of holes is spaced apart from the third edge 174 of the substrate 162 by a second distance of 13.7 mm. Similarly, the center of the second hole 172 in the second pair of holes is spaced apart from the fourth edge 176 of the substrate 162 by a second distance of 13.7 mm. In other instances, the second distance is longer or shorter.
[0033] Figure 1DA top view of an example apparatus 180 for a contactor is shown. Apparatus 180 is the same as the apparatus 150 in Figure 1C . However, in Figure 1D , an inverted view of the substrate 162 is shown. Specifically, the top surface of the substrate 162 is shown. Figure 1C The features of Figure 1D can be applied to
[0034] Figure 2A and are thus not repeated here. Figure 1A An example contactor 200 is shown. In some instances, contactor 200 can be used to implement the contactor mentioned in
[0035] . Contactor 200 includes a first guide pin 202 and a second guide pin 204. The first guide pin 202 is adjacent to a first edge 206 of the contactor 200. Contactor 200 further includes a socket 211 (alternatively referred to as a contactor module) for mounting and testing an integrated circuit (IC) package. The second guide pin 204 is adjacent to a second edge 208 of the contactor 200. The second edge 208 of the contactor 200 is opposite the first edge 206 of the contactor. Contactor 200 includes a first surface 210 and a second surface (not shown). In some instances, the second surface is the opposite (or relative) side of the first surface 210. The centerlines 209 of the first edge 206 and the second edge 208 of the contactor 200 cross through the center of the first guide pin 202, and the second guide pin 204 is spaced apart from the centerlines 209 of the first edge 206 and the second edge 208 of the contactor 200. Figure 2B1 An example view 250 of the first guide pin 202 of the contactor 200 is shown, and Figure 2B2 an example view 252 of the second guide pin 204 of the contactor 200 is shown. Figure 2A , Figure 2B1 and Figure 2B2 The contactor 200, the first guide pin 202, and the second guide pin 204 in Figure 2B1 are the same, and thus, the same reference numerals are used herein to depict the same structures. As shown in Figure 2B2 , the first guide pin 202 has a portion 212 extending from the first surface 210 of the contactor 200 and a portion 214 extending from the second surface of the contactor 200. Similarly, as shown in
[0036] Returning to reference Figure 2A , in some instances, by using Figure 1AThe device 100 in the embodiment of the present invention tests the first guide pin 202 and the second guide pin 204. The first guide pin 202 and the second guide pin 204 of the contactor 200 are inserted into the contactor 200 in a first orientation. Figure 1A The first guide pin 202 and the second guide pin 204 are inserted into the through hole of the device 100 in the contactor 200 in the second orientation to test the alignment of the first guide pin 202 and the second guide pin 204. In addition, the first guide pin 202 and the second guide pin 204 of the contactor 200 are inserted into the through hole of the device 100 in the contactor 200 in the second orientation. Figure 1A The guide pins 202 and 204 are inserted into the through-holes of the device 100 to determine whether the first guide pin 202 and the second guide pin 204 are properly sized (e.g., to check the diameter).
[0037] Figure 3A An example first arrangement 300 for testing the alignment of guide pins of a contactor is shown. The first arrangement 300 includes Figure 2A The contactor 200 and Figure 1A The device 100 in FIG. 1 and thus referred to herein as Figure 2A and Figure 1A A first arrangement 300 is illustrated. Some features of the device 100 and the contactor 200 are not visible, so Figure 3A Some reference numerals are omitted. Figure 1A , 2A The first arrangement 300 is used to test the alignment of a portion of a first guide pin 202 extending from a first surface of the contactor 200 with a portion of a second guide pin 204. The first surface corresponds to Figure 2A The first surface 210 of the contactor 200 in FIG. 1 is a surface of the contactor 200 facing the device 100 in this example.
[0038] To test alignment, in a first arrangement 300, portions of first guide pins 202 and portions of second guide pins 204 extending from a first surface of contactor 200 are aligned with a first surface (eg, Figure 1A The first surface 104) is inserted into the through hole. The first surface corresponds to Figure 1A In the first orientation, a portion of the first guide pin 202 extending from the first surface of the contactor 200 is inserted into the first hole 108 of the first pair of holes at the first face of the base 102 of the device 100. In addition, in the first orientation, a portion of the second guide pin 204 extending from the first surface of the contactor 200 is inserted into the second hole 118 of the second pair of holes at the first face of the base 102 of the device 100. The first hole 108 of the first pair of holes and the second hole 118 of the second pair of holes are designed to have the same diameter (e.g., the first diameter). In some examples, the first diameter is designed to be equal to or slightly larger than the diameter of the first guide pin 202 and the second guide pin 204 (or the diameter of the portion of the first guide pin 202 and the portion of the second guide pin 204 extending from the first surface of the contactor 200).
[0039] The apparatus 100 is configured such that if portions of a first guide pin 202 and a second guide pin 204 extending from a first surface of the contactor 200 are smoothly inserted into a first hole 108 and a second hole 118, respectively, without resistance, then the alignment test passes. A passed alignment test indicates that portions of the first guide pin 202 and the second guide pin 204 extending from the first surface of the contactor 200 are properly aligned. As can be seen in Figure 3A the contactor 200 and the apparatus 100 are aligned with each other, thereby indicating a passed alignment test. However, if the first guide pin 202 and the second guide pin 204 cannot be smoothly inserted into the first hole 108 and the second hole 118, respectively, or encounter significant resistance during insertion, then the alignment test fails. A failed alignment test indicates that portions of the first guide pin 202 and the second guide pin 204 extending from the first surface of the contactor 200 are not properly aligned (e.g., the guide pins are bent).
[0040] Figure 3B An example first arrangement 350 showing a failed alignment test is shown. Specifically, as can be seen in Figure 3B the contactor 200 and the apparatus 100 are not aligned with each other, thereby indicating a failed alignment test. The same numbers are used in the first arrangement 300 and the first arrangement 350 to depict the same structures. The features of the first arrangement 300 may also be applied to the first arrangement 350 and are therefore not repeated here.
[0041] Figure 4A An example second arrangement 400 for testing the sizing (e.g., diameter) of the guide pins of the contactor is shown. The second arrangement 400 includes the contactor 200 as in Figure 2A and the apparatus 100 as in Figure 1A and is therefore described herein with reference to Figure 2A and Figure 1A Some features of the apparatus 100 and the contactor 200 are not visible, and thus some reference numerals are omitted from Figure 4A . However, Figure 1A , 2A and 4A use the same reference numerals to depict the same structures. The second arrangement 400 is used to test the sizing / diameter of a portion of the first guide pin 202 and a portion of the second guide pin 204 extending from the first surface of the contactor 200. The first surface corresponds to the first surface 210 of the contactor 200 in Figure 2A . In this example, the first surface is the surface of the contactor 200 facing the apparatus 100.
[0042] To test the size setting / diameter, in the second arrangement 400, portions of the first guide pin 202 and the second guide pin 204 extending from the first surface of the contactor 200 are inserted into through-holes at the first face of the substrate 102 of the device 100 in a second orientation. The first face corresponds to Figure 1A the first face 104 in Figure 3A illustrated first orientation. In some examples, the second orientation is obtained by rotating the contactor 200 180 degrees about an axis perpendicular to the first surface of the contactor 200 in a first orientation (e.g., the first orientation described with respect to
[0043] In the second orientation, the portion of the first guide pin 202 extending from the first surface of the contactor 200 is inserted into the first hole 116 of the second pair of holes at the first face of the substrate 102 of the device 100. Additionally, in the second orientation, the portion of the second guide pin 204 extending from the first surface of the contactor 200 is inserted into the second hole 110 of the first pair of holes at the first face of the substrate 102 of the device 100. The first hole 116 of the second pair of holes and the second hole 110 of the first pair of holes are designed to have the same diameter, e.g., a second diameter. In some examples, the second diameter is less than the diameter of the first guide pin 202 and the second guide pin 204 (or the diameters of the portions of the first guide pin 202 and the second guide pin 204 extending from the first surface of the contactor 200). Figure 4A As can be seen in
[0044] Figure 4B the contactor 200 and the device 100 are misaligned with each other (more specifically, the first guide pin 202 and the second guide pin 204 are not properly inserted), thereby indicating a passed size setting test. However, if the first guide pin 202 and the second guide pin 204 can be smoothly inserted into the first hole 116 and the second hole 110 respectively without resistance, then the size setting test fails. A failed size setting test indicates that the portions of the first guide pin 202 and the second guide pin 204 extending from the first surface of the contactor 200 are not properly sized (or have a diameter smaller than the required diameter). Figure 4BAs can be seen, the contactor 200 and the device 100 are aligned with each other, thereby indicating a failed size setting test. The same numbers are used to depict the same structures in the second arrangement 400 and the second arrangement 450. The features of the second arrangement 400 may also be applied to the second arrangement 450 and are therefore not repeated here.
[0045] Figure 5A An example third arrangement 500 for testing the alignment of the pilot pins of the contactor is shown. The third arrangement 500 includes Figure 2A the contactor 200 in Figure 1A and the device 100 in Figure 2A and Figure 1A and is thus described herein with reference to Figure 5A and Figure 1A Some features of the device 100 and the contactor 200 are not visible, and thus some reference numerals are omitted in 2A However, Figure 2A and 5A use the same reference numerals to depict the same structures. The third arrangement 500 is used to test the alignment of a portion of the first pilot pin 202 and a portion of the second pilot pin 204 extending from the second surface of the contactor 200. The second surface corresponds to
[0046] the second surface of the contactor 200 in Figure 1A In this example, the second surface is the surface of the contactor 200 facing the device 100. Figure 3A Figure 4A
[0047] The apparatus 100 is configured such that if portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are smoothly inserted into the first hole 108 and the second hole 118, respectively, without resistance, then the alignment test passes. A passed alignment test indicates that the portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are properly aligned. As can be seen in Figure 5A , the contactor 200 and the apparatus 100 are aligned with each other, thereby indicating a passed alignment test. However, if the first guide pin 202 and the second guide pin 204 cannot be smoothly inserted into the first hole 108 and the second hole 118, respectively, or encounter some resistance during insertion, then the alignment test fails. A failed alignment test indicates that the portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are not properly aligned (e.g., the guide pins are bent).
[0048] Figure 5B An example third arrangement 550 showing a failed alignment test is shown. Specifically, as can be seen in Figure 5B , the contactor 200 and the apparatus 100 are not aligned with each other, thereby indicating a failed alignment test. The same numbers are used in the third arrangement 500 and the third arrangement 550 to depict the same structures. The features of the third arrangement 500 can also be applied to the third arrangement 550 and are therefore not repeated here.
[0049] Figure 6A An example fourth arrangement 600 for testing the sizing (e.g., diameter) of the guide pins of a contactor is shown. The fourth arrangement 600 includes the contactor 200 as in Figure 2A and the apparatus 100 as in Figure 1A , and thus the fourth arrangement 600 is described herein with reference to Figure 2A and Figure 1A . Some features of the apparatus 100 and the contactor 200 are not visible, and thus some reference numerals are omitted from Figure 6A . However, Figure 1A , 2A and 6A use the same reference numerals to depict the same structures. The fourth arrangement 600 is used to test the sizing / diameter of a portion of the first guide pin 202 and a portion of the second guide pin 204 extending from the second surface of the contactor 200. The second surface corresponds to the second surface of the contactor 200 in Figure 2A . In this example, the second surface is the surface of the contactor 200 facing the apparatus 100.
[0050] To test the size setting / diameter, in the fourth arrangement 600, portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are inserted into through-holes at the second face of the substrate 102 of the device 100 in a second orientation. The second face corresponds to Figure 1A the second face 106 in Figure 3A For example, the second orientation is obtained by rotating the contactor 200 180 degrees about an axis perpendicular to the first surface of the contactor 200 in a first orientation (e.g., the first orientation described with respect to
[0051] The device 100 is configured such that if the portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are not smoothly inserted into the first hole 116 and the second hole 110, respectively, then the size setting test passes. A passed size setting test indicates that the portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are properly sized (or have the correct diameter). As can be seen in Figure 6A the contactor 200 and the device 100 are misaligned (more specifically, the first guide pin 202 and the second guide pin 204 are not properly inserted), thereby indicating a passed size setting test. However, if the first guide pin 202 and the second guide pin 204 can be smoothly inserted into the first hole 116 and the second hole 110, respectively, without resistance, then the size setting test fails. A failed size setting test indicates that the portions of the first guide pin 202 and the second guide pin 204 extending from the second surface of the contactor 200 are not properly sized (or have a diameter smaller than the required diameter).
[0052] Figure 6B An example fourth arrangement 650 showing a failed size setting test is shown. Specifically, as can be seen in Figure 6BAs can be seen, the contactor 200 and the device 100 are aligned with each other, thereby indicating a failed size setting test. The same numbers are used to depict the same structures in the fourth arrangement 600 and the fourth arrangement 650. The features of the fourth arrangement 600 can also be applied to the fourth arrangement 650 and are therefore not repeated here.
[0053] Figure 7A An exemplary contactor arrangement 700 is shown. The contactor arrangement 700 includes a contactor 702 mounted on a printed circuit board (PCB) 704. The contactor 702 can be the same as the Figure 2A contactor 200 therein. In some instances, the contactor 702 is mounted on the PCB 704 to test an integrated circuit (IC) package. The contactor 702 is mounted on the PCB 704 using the guide pins of the contactor 702 (e.g., the Figure 2A first guide pin 202 and the second guide pin 204 therein). When the guide pins are free of defects (e.g., not bent and having the proper diameter), the contactor 702 can be properly aligned with the PCB 704. As can be seen in Figure 7A the contactor 702 is properly aligned with the PCB 704, indicating that the guide pins associated with the contactor 702 are free of defects.
[0054] Figure 7B Another exemplary contactor arrangement 750 is shown. The contactor arrangement 750 includes a contactor 702 mounted on a printed circuit board (PCB) 704. The contactor arrangement 750 is the same as the Figure 7A contactor arrangement 700 therein, and thus the same numbers are used to depict the same structures. The contactor 702 is mounted on the PCB 704 using the guide pins of the contactor 702 (e.g., the Figure 2A first guide pin 202 and the second guide pin 204 therein). When the guide pins have defects (e.g., bent and / or having an incorrect diameter), the contactor 702 may be misaligned with the PCB 704. As can be seen in Figure 7B the contactor 702 is not properly aligned with the PCB 704, indicating that the guide pins associated with the contactor 702 have defects.
[0055] Figure 8 A flowchart of a method 800 for detecting defects in the guide pins of a contactor is shown. Method 800 is described herein with reference to the device 100 in Figure 1A and the contactor 200 in Figure 2A . Method 800 is described herein with reference to Figure 3A , Figure 3B , Figure 4A , Figure 4B , Figure 5A , Figure 5B , Figure 6A and Figure 6BFurther describe method 800. At 802, a portion of a guide pin (e.g., the first guide pin 202 and the second guide pin 204 in Figure 2A ) extending from the first surface of a contactor (e.g., the contactor 200 in Figure 2A ) is inserted into a through-hole on the first surface of a fixture (e.g., the device 100 in Figure 3A ) in a first orientation (e.g., as illustrated in Figure 1A ). At 804, determine whether the guide pins on the first surface of the contactor are aligned. If the guide pins cannot be smoothly inserted into the through-hole or encounter some resistance during insertion (e.g., as shown in Figure 3B ), then the determination at 804 is negative (e.g., no). A negative determination at 804 indicates that the guide pins on the first surface of the contactor are not aligned. Alternatively, if the guide pins can be smoothly inserted into the through-hole without resistance (e.g., as shown in Figure 3A ), then the determination at 804 is positive (e.g., yes). A positive determination at 804 indicates that the guide pins on the first surface of the contactor are properly aligned. If the determination at 804 is negative (e.g., no), then method 800 proceeds to 806 and method 800 ends. Alternatively, if the determination at 804 is positive, then method 800 proceeds to 808.
[0056] At 808, rotate the contactor 180 degrees from the first orientation to obtain a second orientation, and insert a portion of the guide pin extending from the first surface of the contactor into the through-hole on the first surface of the fixture (e.g., as illustrated in Figure 4A ). At 810, determine whether the guide pins on the first surface of the contactor are properly sized. If the guide pins can be smoothly inserted into the through-hole without resistance (e.g., as shown in Figure 4B ), then the determination at 810 is negative (e.g., no). A negative determination at 810 indicates that the guide pins on the first surface of the contactor are not properly sized. Alternatively, if the guide pins cannot be smoothly inserted into the through-hole (e.g., as shown in Figure 4A ), then the determination at 810 is positive. A positive determination at 810 indicates that the guide pins on the first surface of the contactor are properly sized. If the determination at 810 is negative (e.g., no), then method 800 proceeds to 812 and method 800 ends. Alternatively, if the determination at 810 is positive (e.g., yes), then method 800 proceeds to 814.
[0057] At 814, rotate the contactor 180 degrees from the second orientation to obtain the first orientation, and insert a portion of the guide pin extending from the second surface of the contactor into the through-hole on the second surface of the fixture (e.g., as illustrated in Figure 5Aas described). At 816, it is determined whether the dowel pins on the second surface of the contactor are aligned. If the dowel pins cannot be smoothly inserted into the through holes or encounter some resistance during insertion (e.g., as shown in Figure 5B as shown), then the determination at 816 is negative. A negative determination at 816 indicates that the dowel pins on the second surface of the contactor are not aligned. Alternatively, if the dowel pins can be smoothly inserted into the through holes without resistance (e.g., as shown in Figure 5A as shown), then the determination at 816 is positive (e.g., yes). A positive determination at 816 indicates that the dowel pins on the second surface of the contactor are properly aligned. If the determination at 816 is negative (e.g., no), then method 800 proceeds to 818 and method 800 ends. Alternatively, if the determination at 816 is positive (e.g., yes), then method 800 proceeds to 820.
[0058] At 820, the contactor is rotated 180 degrees from the first orientation to obtain a second orientation, and the portion of the dowel pin extending from the second surface of the contactor is inserted into the through hole on the second surface of the fixture (e.g., as described in Figure 6A as described). At 822, it is determined whether the dowel pins on the second surface of the contactor are properly sized. If the dowel pins can be smoothly inserted into the through holes without resistance (e.g., as shown in Figure 6B as shown), then the determination at 822 is negative (e.g., no). A negative determination at 822 indicates that the dowel pins on the second surface of the contactor are not properly sized. Alternatively, if the dowel pins cannot be smoothly inserted into the through holes (e.g., as shown in Figure 6A as shown), then the determination at 822 is positive (e.g., yes). A positive determination at 822 indicates that the dowel pins on the second surface of the contactor are properly sized. If the determination at 822 is negative (e.g., no), then method 800 proceeds to 824 and method 800 ends. Alternatively, if the determination at 822 is positive (e.g., yes), then method 800 proceeds to 826. At 826, it is determined that the dowel pins are aligned and properly sized.
[0059] Within the scope of the claims, modifications may be made in the described embodiments, and other embodiments are possible.
Claims
1. An apparatus for a contactor, the apparatus comprising: A base having a rectangular prism shape, the base having a first face and a second face, the second face being opposite the first face; A first pair of holes near a first edge of the base, the centers of the first pair of holes being spaced apart by a first distance, wherein a first hole of the first pair of holes has a first diameter and a second hole of the first pair of holes has a second diameter different from the first diameter, and the center of the second hole of the first pair of holes is spaced apart from a third edge of the base by a second distance; And A second pair of holes near a second edge of the base, the centers of the second pair of holes being spaced apart by the first distance, the second edge of the base being opposite the first edge of the base, wherein a first hole of the second pair of holes has the second diameter and a second hole of the second pair of holes has the first diameter, the center of the second hole of the second pair of holes being spaced apart from a fourth edge of the base by the second distance, the fourth edge being opposite the third edge of the base, and the centerlines of the first edge and the second edge of the base cross the center of the first hole of the first pair of holes and the center of the first hole of the second pair of holes.
2. The apparatus according to claim 1, wherein the apparatus is a jig for the contactor.
3. The apparatus according to claim 2, wherein the contactor comprises: A first guide pin near a first edge of the contactor, the first guide pin extending from a first surface and a second surface of the contactor; And A second guide pin near a second edge of the contactor, the second edge being opposite the first edge, the second guide pin extending from the first surface and the second surface, wherein the centerlines of the first edge and the second edge of the contactor cross the center of the first guide pin, and the second guide pin is spaced apart from the centerlines of the first edge and the second edge of the contactor.
4. The apparatus according to claim 3, wherein the first hole in the first pair of holes is positioned to test the alignment of a portion of the first guide pin extending from the first surface of the contactor, and the second hole in the second pair of holes is positioned to test the alignment of a portion of the second guide pin extending from the first surface of the contactor.
5. The apparatus according to claim 3, wherein the first hole in the first pair of holes and the second hole in the second pair of holes have a positional tolerance of 20 microns or less.
6. The apparatus according to claim 4, wherein the second hole in the first pair of holes is sized to test the diameter of the portion of the second guide pin extending from the first surface of the contactor, and the first hole in the second pair of holes is sized to test the diameter of the portion of the first guide pin extending from the first surface of the contactor.
7. The apparatus according to claim 6, wherein the second diameter is less than the diameter of the portion of the second guide pin extending from the first surface of the contactor and the diameter of the portion of the first guide pin extending from the first surface of the contactor.
8. The apparatus according to claim 6, wherein the first hole in the first pair of holes is positioned to further test the alignment of a portion of the first guide pin extending from the second surface of the contactor, and the second hole in the second pair of holes is positioned to further test the alignment of a portion of the second guide pin extending from the second surface of the contactor.
9. The apparatus according to claim 8, wherein the second hole in the first pair of holes is sized to further test the diameter of the portion of the second guide pin extending from the second surface of the contactor, and the first hole in the second pair of holes is sized to test the diameter of the portion of the first guide pin extending from the second surface of the contactor.
10. The apparatus according to claim 9, wherein the second diameter is less than the diameter of the portion of the first guide pin extending from the second surface of the contactor and the diameter of the portion of the second guide pin extending from the second surface of the contactor.
11. A method for testing a contactor, the method comprising: Inserting the first guide pin and the second guide pin of the contactor into a through hole of the device in a first orientation, wherein the device includes: A base having a rectangular prism shape; A first pair of holes in the through hole near a first edge of the base, the centers of the first pair of holes being spaced apart by a first distance, wherein a first hole of the first pair of holes has a first diameter and a second hole of the first pair of holes has a second diameter different from the first diameter, and the center of the second hole of the first pair of holes is spaced apart from a third edge of the base by a second distance; and A second pair of holes in the through hole near a second edge of the base, the centers of the second pair of holes being spaced apart by the first distance, the second edge of the base being opposite the first edge of the base, wherein a first hole of the second pair of holes has the second diameter and a second hole of the second pair of holes has the first diameter, the second hole being spaced apart from a fourth edge of the base by the second distance, the fourth edge being opposite the third edge of the base, and the centerlines of the first edge and the second edge of the base cross the center of the first hole of the first pair of holes and the center of the first hole of the second pair of holes; Determine whether the first guide pin and the second guide pin extending from the surface of the contactor are aligned based on the insertion of the first guide pin and the second guide pin extending from the surface of the contactor in the first orientation; Rotate the contactor 180 degrees in the first orientation about an axis perpendicular to the surface of the contactor, thereby setting the contactor in a second orientation; Insert the first guide pin and the second guide pin extending from the surface of the contactor into the through hole of the device in the second orientation; and Determine whether the first guide pin and the second guide pin extending from the surface of the contactor are properly sized based on the insertion of the first guide pin and the second guide pin extending from the surface of the contactor in the second orientation.
12. The method according to claim 11, wherein the first hole in the first pair of holes and the second hole in the second pair of holes of the apparatus have a positional tolerance of 20 microns or less.
13. The method according to claim 12, wherein the second diameter is less than the diameter of the second guide pin of the contactor and the diameter of the first guide pin of the contactor.
14. The method according to claim 11, wherein the surface of the contactor is a first surface, and the contactor further comprises: The first guide pin adjacent to the first edge of the contactor, the first guide pin extending from the first surface and the second surface of the contactor; And The second guide pin adjacent to the second edge of the contactor, the second edge being opposite to the first edge, the second guide pin extending from the first surface and the second surface, wherein the center lines of the first edge and the second edge of the contactor cross the center of the first guide pin, and the second guide pin is spaced apart from the center lines of the first edge and the second edge of the contactor.
15. The method according to claim 14, wherein the substrate of the apparatus has a first side and a second side, and the contactor is inserted into the first side of the substrate in the first orientation and the second orientation, the method further comprising: Rotate the contactor 180 degrees in the second orientation about the axis perpendicular to the first surface of the contactor, thereby setting the contactor in the first orientation; Insert a portion of the first guide pin and the second guide pin extending from the second surface of the contactor into the through hole at the second side of the substrate in the first orientation; And Determine whether the portion of the first guide pin and the second guide pin extending from the second surface of the contactor is aligned based on the insertion of the portion of the first guide pin and the second guide pin extending from the second surface of the contactor in the first orientation.
16. The method according to claim 15, wherein the first hole in the first pair of holes and the second hole in the second pair of holes of the apparatus have a positional tolerance of 20 microns or less.
17. The method according to claim 15, further comprising: Rotate the contactor 180 degrees in the first orientation about the axis perpendicular to the first surface of the contactor, thereby setting the contactor in the second orientation; Insert the portion of the first guide pin and the second guide pin extending from the second surface of the contactor into the through hole of the device in the second orientation; And Determine whether the portion of the first guide pin and the second guide pin extending from the second surface of the contactor is properly sized based on the insertion of the portion of the first guide pin and the second guide pin extending from the second surface of the contactor in the second orientation.
18. The method according to claim 15, wherein the second diameter is smaller than the diameter of the portion of the second guide pin extending from the second surface of the contactor and the diameter of the portion of the first guide pin extending from the second surface of the contactor.
19. The method according to claim 11, wherein the device is a jig.
20. The method according to claim 19, wherein the contactor includes a socket for testing an integrated circuit IC package.