Data transmission method
By judging and blocking the same storage address as the nonvolatile memory module address in the volatile memory, the problem of misreading information in the read and write operations of volatile memory is solved, and the accuracy and stability of calculation are achieved.
Patent Information
- Application Number
- CN202411776198.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-05
- Publication Date
- 2025-06-20
AI Technical Summary
In the read and write operation between the volatile memory and the main control chip, misreading information due to quality problems will lead to calculation errors if not corrected, affecting subsequent operations.
After obtaining the data read instruction, the information is read from the storage address indicated by the instruction, and during the reading process, it is determined whether the storage address is the same as the address stored in the nonvolatile storage module. If the same, the data at the address is blocked.
Automatically blocking of bad zone information ensures the accuracy of subsequent calculations, and solves the defect that the failure to automatically block bad zones in the prior art.
Smart Images
Figure CN120179155A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of signal processing, and particularly to a data transmission method. Background Art
[0002] In related technologies, for volatile memories, when performing read and write operations on a main control chip, there may be incorrect information read due to quality problems. If this information is not corrected and participates in calculations, incorrect calculation results will be obtained, causing a series of subsequent consequences. Summary of the Invention
[0003] The main object of the present invention is to provide a data transmission method to solve the deficiencies in related technologies.
[0004] To achieve the above object, according to the first aspect of the present invention, a data transmission method is provided, including: after obtaining a data read instruction, reading the pre-written information starting from the storage address indicated by the instruction; during the reading process, determining whether there is an address that is the same as the address stored in the non-volatile storage module; if they are the same, masking the data at the same address.
[0005] Optionally, obtaining a test request, detecting the information of all storage addresses according to the test method indicated by the request; for the storage address where the detected information is incorrect, transmitting the storage address to the non-volatile storage module for storage.
[0006] Optionally, if they are the same, masking the data at the same address includes: if they are the same, discarding the data at the same address; continuing to read the data at the next address, and after the reading is completed, transmitting the read information to the module that sent the data read instruction for the module to store the read information in the hard disk.
[0007] Optionally, the non-volatile storage module transmits the storage address to the module that sent the data read instruction.
[0008] According to the second aspect of the present invention, a DRAM Die is provided, and the DRAM Die executes the method shown in any item of the first aspect.
[0009] According to the third aspect of the present invention, a non-volatile storage module is provided, characterized in that it is co-packaged with the DRAM Die, and the DRAM Die executes the method shown in any item of the first aspect.
[0010] Optionally, it is connected to the module that sends the data read instruction through a specified pin and a bus.
[0011] According to the fourth aspect of the present invention, a DRAM is provided, including a DRAM Die and a non-volatile storage module. The non-volatile storage module is co-packaged with the DRAM Die, and the DRAM Die executes the method shown in any one of the first aspects.
[0012] The data transmission method of this embodiment includes: after obtaining a data read instruction, reading the pre-written information starting from the storage address indicated by the instruction; during the reading process, determining whether there is an address whose storage address is the same as the address stored in the non-volatile storage module; if they are the same, masking the data at the same address. By automatically masking the bad area information, it lays a foundation for accurate subsequent calculations and overcomes the defect in the related art that the bad area cannot be automatically masked. Description of the Drawings
[0013] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the specific embodiments or the prior art. Obviously, the following drawings are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0014] Figure 1 It is a flowchart of the data transmission method of the embodiment of the present invention; Figure 2a It is the first application diagram of the data transmission method of the embodiment of the present invention; Figure 2b It is the second application diagram of the data transmission method of the embodiment of the present invention. Detailed Embodiments
[0015] In order to enable those skilled in the art to better understand the solution of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0016] It should be noted that in the description and claims of the present invention and the above-mentioned drawings, the terms "first", "second", etc. are used to distinguish similar objects, and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so as to implement the embodiments of the present invention described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.
[0017] It should be noted that without conflict, the embodiments in the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the drawings and in combination with the embodiments.
[0018] According to an embodiment of the present invention, a data transmission method is provided, as Figure 1 shown, including the following steps 101 to step 103: Step 101: After obtaining a data reading instruction, read the pre-written information starting from the storage address indicated by the instruction.
[0019] In this step, the execution subject of this method can be a volatile memory, which obtains instructions through a data read / write bus. Specifically, write or read instructions can be obtained from the main control chip, and then data can be written or read. Data can be pre-written according to the indication of the write instruction through the bus.
[0020] Step 102: During the reading process, determine whether there is an address whose storage address is the same as the address stored in the non-volatile storage module.
[0021] Step 103: If they are the same, mask the data at the same address.
[0022] In the above steps, bad areas usually exist in the volatile memory, and the information written in these bad areas is inconsistent with the information read out. Refer to Figure 2a Theoretically, the SOC writes "0x00FF 11FE" to the DRAM. Refer to Figure 2b Actually, the data returned by the DRAM is "0x00FF 10FE".
[0023] Therefore, during the reading process, if the storage address corresponding to a bad block is encountered, the information at that address is masked. This storage address is the physical address with error information mapped by the damaged cell in the DRAM. For example, for a DRAM with a capacity of 2G Byte, the mapped physical address ranges from 0x0000 0000 to 0x7FFF FFFF. The storage addresses corresponding to the bad blocks are as follows: 0x10CC0FEA, 0x10CC 0FEE, 0x10CC 11AC, 0x10AD 120C, 0x3200 4002, 0x32AF 103E, etc.
[0024] As an alternative implementation of this embodiment, if they are the same, masking the data at the same address includes: if they are the same, discarding the data at the same address; continuing to read the data at the next address, and after the reading is completed, transmitting the read information to the module that sends the data reading instruction for the module to store the read information in the hard disk.
[0025] In this alternative implementation, the module that sends the data reading instruction can be the aforementioned main control chip, and the main control chip is connected to the ROM.
[0026] As an alternative implementation of this embodiment, obtain a test request, and detect the information of all storage addresses according to the test method indicated by the request; for the storage addresses where the detected information is incorrect, transmit the storage addresses to the non-volatile storage module for storage.
[0027] In this alternative implementation, it can be obtained through several detection methods, such as CP test or FT test or SLT test.
[0028] As an alternative implementation of this embodiment, the non-volatile storage module transmits the storage address to the module that sends the data reading instruction.
[0029] In this alternative implementation, each non-volatile storage chip is composed of multiple cells, and each cell has a unique address. Through this address, a specific storage cell can be located. In a non-volatile storage chip, the address of the cell starts from 0x0000 0000 and increases. It is connected to the main control chip through a bus, and the detected storage address of the bad block is transmitted to the main control chip. The data structure of the non-volatile storage chip is usually one-dimensional and is used to store byte data of a fixed size. Structured data can be stored through a specific encoding method (such as BSON, JSON, XML, etc.) for easy reading and parsing. This type of chip is composed of bits (Bit) and bytes (Byte). A bit is the smallest storage unit, representing 0 or 1 in binary. A byte is composed of 8 bits and can store a character or an integer.
[0030] According to an embodiment of the present invention, a DRAM Die is further provided, and the DRAM Die executes the method shown in the foregoing embodiment item.
[0031] According to an embodiment of the present invention, a non-volatile storage module is further provided, which is co-packaged with the DRAM Die, and the DRAM Die executes the method shown in the foregoing embodiment item. It is connected to the module that sends the data read instruction through the specified pin and the bus.
[0032] According to an embodiment of the present invention, a DRAM is further provided, which includes a DRAM Die and a non-volatile storage module. Among them, the non-volatile storage module is co-packaged with the DRAM Die, and the DRAM Die executes the method shown in the foregoing embodiment.
Claims
1. A data transmission method, characterized in that: include: After obtaining the data read instruction, the pre-written information is read from the storage address indicated by the instruction; During the reading process, determining whether there is a storage address that is the same as the address stored in the non-volatile storage module; If they are the same, the data at the same address is masked.
2. The data transmission method according to claim 1, characterized in that: Obtain a test request, and test the information of all storage addresses according to the test method indicated by the request; The storage address where the information error is detected is transmitted to the non-volatile storage module for storage.
3. The data transmission method according to claim 1, characterized in that: If they are the same, masking the data at the same address includes: If they are the same, the data at the same address are discarded; Continue to read the data at the next address, and after reading is completed, transmit the read information to the module that sends the data reading instruction, so that the module can store the read information to the hard disk.
4. The data transmission method according to claim 2, characterized in that: The non-volatile storage module transmits the storage address to the module that sends the data read instruction.
5. A DRAM Die, characterized in that: The DRAM Die executes the method shown in any one of claims 1-4.
6. A non-volatile storage module, characterized in that: Sealed together with a DRAM Die, the DRAM Die executes the method as claimed in any one of claims 1 to 4.
7. The non-volatile storage module according to claim 6, wherein: Connect the module that sends the data read command through the specified pin and bus.
8. A DRAM, characterized in that: It comprises a DRAM Die and a non-volatile memory module, wherein the non-volatile memory module is sealed with the DRAM Die, and the DRAM Die executes the method shown in any one of claims 1-4.