Reliability evaluation method, device and equipment for satellite navigation, medium and product

Abstract

The invention relates to a satellite navigation reliability evaluation method and device, equipment, a medium and a product. The method comprises the following steps: acquiring a fluctuation range corresponding to the reference reliability level of a current batch of satellite navigation terminals, acquiring a risk probability value and a failure fluctuation ratio according to the fluctuation range, acquiring a failure judgment boundary value based on the risk probability value and the failure fluctuation ratio, and determining the reliability of the satellite navigation terminals according to the failure probability and the failure judgment boundary value of the satellite navigation terminals. And performing reliability evaluation on the satellite navigation terminal. By adopting the method, the reliability of the satellite navigation terminal product can be accurately evaluated.

Description

Technical Field

[0001] The present application relates to the technical field of satellite navigation, and particularly to a method, device, equipment, medium and product for reliability assessment of satellite navigation. Background Art

[0002] Satellite navigation terminal products usually consist of an antenna unit, a radio frequency unit and a baseband processing unit. Their performance is easily affected by factors such as electromagnetic interference and device aging, resulting in reliability fluctuations, which in turn affect the normal use of the products. During the production process, statistical process control (SPC) methods are usually adopted for product quality control. By real-time monitoring of measurable physical parameters such as voltage, current, capacitance, and size, random fluctuations are distinguished from abnormal fluctuations, thus ensuring production stability. However, SPC is mainly applicable to the monitoring of physical indicators parallel to the time axis, while the core reliability index of satellite navigation terminal products, the mean time between failures (MTBF), is a statistic perpendicular to the time axis and cannot be directly measured by conventional instruments, making it difficult to monitor its fluctuations in real time during the production process.

[0003] Currently, the reliability assessment of satellite navigation terminal products mostly focuses on performance indicators such as positioning accuracy, signal integrity, continuity and availability, while there is a lack of an effective monitoring and assessment system for key reliability indicators such as the fluctuation trend of MTBF, determination risk and fluctuation ratio. Summary of the Invention

[0004] Based on this, in view of the above technical problems, it is necessary to provide a method, device, equipment, medium and product for reliability assessment of satellite navigation that can accurately evaluate the reliability of satellite navigation terminal products.

[0005] In a first aspect, the present application provides a method for reliability assessment of satellite navigation, including:

[0006] Obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals of the current batch;

[0007] According to the fluctuation range, obtaining the risk probability value and the failure fluctuation ratio;

[0008] Based on the risk probability value and the failure fluctuation ratio, obtaining the failure determination boundary value;

[0009] According to the failure probability of the satellite navigation terminal and the failure determination boundary value, performing a reliability assessment on the satellite navigation terminal.

[0010] In one of the embodiments, the upper limit value of the fluctuation range is the expected reliability level of the satellite navigation terminals of the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals of the current batch.

[0011] In one embodiment, the risk probability value includes a first risk value and a second risk value; the first risk value is used to represent the misjudgment risk probability corresponding to the determination reference reliability level being not less than the upper limit value of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to the determination reference reliability level being less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0012] In one embodiment, the steps of obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio include:

[0013] According to the risk probability value and the failure fluctuation ratio, obtain the upper limit failure probability of the satellite navigation terminal; the upper limit failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range;

[0014] According to the risk probability value and the failure fluctuation ratio, obtain the lower limit failure probability of the satellite navigation terminal; the lower limit failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range;

[0015] According to the upper limit failure probability and the lower limit failure probability, obtain the failure expression corresponding to the satellite navigation terminal, and according to the failure expression, obtain the failure determination boundary value.

[0016] In one embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration; the steps of performing reliability assessment on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal include:

[0017] According to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminal, obtain the reliability change trend of the satellite navigation terminal, so as to perform corresponding production processes according to the reliability change trend.

[0018] In one embodiment, the method further includes:

[0019] Obtain the product information of the satellite navigation terminals in the current batch, and obtain the product characteristics according to the product information;

[0020] Obtain the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtain the risk probability value and the failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0021] In a second aspect, the present application further provides a reliability assessment device for satellite navigation, including:

[0022] A first acquisition module, configured to acquire a fluctuation range corresponding to a reference reliability level of satellite navigation terminals in a current batch;

[0023] A second acquisition module, configured to acquire a risk probability value and a failure fluctuation ratio according to the fluctuation range;

[0024] A failure determination module, configured to acquire a failure determination boundary value based on the risk probability value and the failure fluctuation ratio;

[0025] A reliability evaluation module, configured to perform reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value.

[0026] In a third aspect, the present application further provides a computer device, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the method steps of any one of the first aspect are implemented.

[0027] In a fourth aspect, the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the method steps of any one of the first aspect are implemented.

[0028] In a fifth aspect, the present application further provides a computer program product, including a computer program. When the computer program is executed by a processor, the method steps of any one of the first aspect are implemented.

[0029] For the above-mentioned reliability evaluation method, device, equipment, medium and product of satellite navigation, by acquiring the fluctuation range corresponding to the reference reliability level of satellite navigation terminals in the current batch, acquiring the risk probability value and the failure fluctuation ratio according to the fluctuation range, acquiring the failure determination boundary value based on the risk probability value and the failure fluctuation ratio, and performing reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value, it is possible to accurately monitor the fluctuation of the reliability evaluation index, thereby accurately evaluating the reliability level of the satellite navigation terminals. Description of the Drawings

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments of the present application or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0031] Figure 1 It is an application environment diagram of the reliability evaluation method of satellite navigation in an embodiment;

[0032] Figure 2Schematic flowchart of a method for evaluating the reliability of satellite navigation in an embodiment;

[0033] Figure 3 Schematic diagram for determining fluctuations in reliability evaluation in an embodiment;

[0034] Figure 4 Schematic flowchart of a method for evaluating the reliability of satellite navigation in another embodiment;

[0035] Figure 5 Structural block diagram of a device for evaluating the reliability of satellite navigation in an embodiment;

[0036] Figure 6 Internal structure diagram of a computer device in an embodiment. Detailed implementation manners

[0037] To make the objectives, technical solutions, and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0038] The method for evaluating the reliability of satellite navigation provided by the embodiments of the present application can be applied to an application environment as shown in Figure 1 wherein, the terminal 102 communicates with the server 104 through a network. The data storage system can store the data that the server 104 needs to process. The data storage system can be integrated on the server 104, or can be placed in the cloud or other network servers. Among them, the terminal 102 is used to obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals, obtain the risk probability value and the failure fluctuation ratio according to the fluctuation range, obtain the failure determination boundary value based on the risk probability value and the failure fluctuation ratio, and evaluate the reliability of the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure determination boundary value. Among them, the terminal 102 can be but is not limited to various personal computers, laptop computers, smart phones, tablet computers, Internet of Things devices, and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart in-vehicle devices, projection devices, etc. The portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The head-mounted devices can be virtual reality (VR) devices, augmented reality (AR) devices, smart glasses, etc. The server 104 can be an independent physical server, or a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services.

[0039] In an exemplary embodiment, as shown in Figure 2As shown, a method for evaluating the reliability of satellite navigation is provided. Taking the terminal 102 applied in Figure 1 as an example, it includes the following steps S202 to S208. Among them:

[0040] S202: Obtain the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch.

[0041] Optionally, the reference reliability level of the satellite navigation terminal is a benchmark for measuring and evaluating its reliability. Usually, the Mean Time Between Failures (MTBF) is used as the reliability evaluation index. The fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch refers to the value range of the mean time between failures (MTBF) of this batch of products. For example, the range defined by the lower limit value and the upper limit value. Obtaining this range is the basis for subsequent evaluation and clarifies the possible variation range of the product reliability level.

[0042] S204: According to the fluctuation range, obtain the risk probability value and the failure fluctuation ratio.

[0043] Optionally, after the fluctuation range is determined, the risk probability value and the failure fluctuation ratio are obtained from it. Among them, the risk probability value includes the risk of rejecting a true hypothesis α and the risk of accepting a false hypothesis β, etc. The risk of rejecting a true hypothesis α and the risk of accepting a false hypothesis β are respectively used to measure the probabilities of misjudging that the product reliability does not meet the requirements and misjudging that it meets the requirements. The failure fluctuation ratio is the ratio of the MTBF upper limit to the lower limit, reflecting the degree of reliability fluctuation.

[0044] S206: Based on the risk probability value and the failure fluctuation ratio, obtain the failure determination boundary value.

[0045] Optionally, according to the risk probability value and the failure fluctuation ratio, obtain the failure determination boundary value. Among them, the failure determination boundary value is a reference standard for measuring the product reliability and is used to compare with the actual failure situation.

[0046] S208: According to the failure probability of the satellite navigation terminal and the failure determination boundary value, conduct a reliability evaluation on the satellite navigation terminal.

[0047] Optionally, compare the actual failure probability of the satellite navigation terminal with the failure determination boundary value to conduct a reliability evaluation on the satellite navigation terminal. For example, if the actual failure probability is within the boundary value range, it is determined that the product reliability is at an acceptable level; if the actual failure probability exceeds the upper limit of the boundary value range, it is determined that the product reliability is abnormal.

[0048] In the above method for evaluating the reliability of satellite navigation, by obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch, and based on the fluctuation range, obtaining the risk probability value and the failure fluctuation ratio, and then obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio, and evaluating the reliability of the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value, it is possible to accurately monitor the fluctuation of the reliability evaluation index, and thus accurately evaluate the reliability level of the satellite navigation terminals.

[0049] In an exemplary embodiment, the upper limit value of the fluctuation range is the expected reliability level of the satellite navigation terminals in the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals in the current batch.

[0050] Optionally, the expected reliability level of the satellite navigation terminals in the current batch, that is, the upper limit value of the fluctuation range, refers to the highest reliability degree that is expected for the products in this batch to achieve. The lower limit value of the fluctuation range, that is, the required reliability level, refers to the lowest reliability requirement that the products in this batch need to meet.

[0051] Exemplarily, assuming that MTBF is used as the reliability evaluation index, and the MTBF of the satellite navigation terminals in the current batch is represented as θ, then its fluctuation range is represented as: [θ L , θ U , where θ L is the required reliability level (MTBF lower limit) of the lowest requirement for the products in mass production, and θ U is the upper limit value of the reliability level of the products in mass production (MTBF upper limit), that is, the highest expected reliability level that is expected for the products in mass production to achieve.

[0052] In this embodiment, by setting the upper limit value of the fluctuation range as the expected reliability level of the satellite navigation terminals in the current batch, and setting the lower limit value of the fluctuation range as the required reliability level of the satellite navigation terminals in the current batch, it is possible to accurately obtain the reliability evaluation index of the satellite navigation terminals, and thus improve the accuracy of subsequent reliability evaluation.

[0053] In an exemplary embodiment, the risk probability value includes a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0054] Exemplarily, the first risk value is the risk of rejecting the true hypothesis α, which means that when the MTBF value is not less than the upper limit θ U , it is determined that the MTBF value is less than the upper limit θ UThe maximum probability, and the second risk value, the type II error risk β, refers to the maximum probability that when the MTBF value is less than the lower limit θ, it is determined that the MTBF value is not less than the lower limit θ. L When L this occurs.

[0055] Specifically, the first risk value refers to the maximum probability that when the actual MTBF is not less than θ U , but due to various uncertainty factors, during the determination process, it is concluded that the MTBF is less than θ U . This type of misjudgment is the maximum probability of such an incorrect conclusion. The first risk value measures the possibility of misjudging a truly reliable (meeting the high reliability standard) product as unreliable. The second risk value refers to the maximum probability that when the actual MTBF is less than the lower limit value θ L of the fluctuation range, that is, the actual reliability of the product does not meet the basic requirements, but during the determination, it is considered that the MTBF is not less than the lower limit θ L , that is, the maximum probability of misjudging an unreliable product as a reliable product. The second risk value reflects the degree of MTBF fluctuation. The larger the ratio, the greater the gap between the upper and lower limits of the MTBF, and the wider the fluctuation range of the product reliability; conversely, the narrower the fluctuation range.

[0056] Exemplarily, the failure fluctuation ratio is the ratio of the upper limit value θ U of the fluctuation range to the lower limit value θ L , that is, D = θ U / θ L .

[0057] In this embodiment, by obtaining the first risk value, the second risk value, and the failure fluctuation ratio, the error probability of the reliability assessment can be accurately obtained, thereby improving the accuracy of the reliability assessment.

[0058] In an exemplary embodiment, the steps of obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio include: obtaining the upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining the lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining the failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining the failure determination boundary value according to the failure expression.

[0059] Optionally, the risk probability value and the failure fluctuation ratio reflect the uncertainty and fluctuation degree in product reliability determination. Based on these values, when passing through relevant probability models, the possibility of a specific number of failures occurring within a specific duration. For example, taking the Poisson distribution as an example, when the upper limit value of the mean time between failures is θ U , the preset working duration t, and the preset number of failures r are given, the upper limit failure probability is calculated, which represents the probability that when the actual reliability of the product reaches the expected reliability level, a preset number of failures occur within the preset working duration.

[0060] Similarly, taking the Poisson distribution as an example, when the lower limit value of the mean time between failures is θ L , the preset working duration t, and the preset number of failures r are given, the lower limit failure probability is calculated, which represents the probability that when the actual reliability of the product reaches the required reliability level, a preset number of failures occur within the preset working duration.

[0061] Exemplarily, according to the Poisson distribution, for an exponential product with an unknown MTBF value θ, the probability of r failures occurring within the cumulative working duration t is:

[0062]

[0063] where, P r (r) is the failure probability, t is the preset working duration, θ is the reference reliability level of the satellite navigation terminal (i.e., the MTBF value), and r is the number of failures.

[0064] Furthermore, for the reliability monitoring of the satellite navigation terminal, as production continues, it is necessary to prove that the MTBF value of the product is always between the lower limit value θ L and the upper limit value θ U . If the actual MTBF value is equal to the MTBF lower limit value θ L , then the probability of r failures occurring within the working time t is:

[0065]

[0066] Similarly, if the actual MTBF value is equal to the MTBF upper limit value θ U , then the probability of r failures occurring within the working time t is:

[0067]

[0068] If the MTBF of the satellite navigation terminal product is between [θ L , θ U , then the interval representation of the number of its failures within the time t is:

[0069]

[0070] Among them, the upper limit failure probability and the lower limit failure probability C b are constants, and their values depend on the risk probability value and the failure fluctuation ratio. Then their mathematical expressions are as follows:

[0071]

[0072]

[0073] Among them, β is the second risk value, D is the failure fluctuation ratio, and α is the first risk value.

[0074] In this embodiment, by obtaining the upper limit failure probability and the lower limit failure probability, and then obtaining the failure determination boundary, an accurate quantitative standard can be provided for the reliability determination of the satellite navigation terminal, improving the accuracy of the reliability assessment.

[0075] In an exemplary embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of faults within a preset working duration; the steps of performing a reliability assessment on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal include: obtaining the reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminal, so as to perform corresponding production processes according to the reliability change trend.

[0076] Optionally, the failure determination boundary value includes a failure lower limit value and a failure upper limit value, which represent a reasonable range of the failure situation of the satellite navigation terminal under certain conditions. The failure probability refers to the probability that the satellite navigation terminal has a preset number of faults within a preset working duration. Comparing the failure probability of the satellite navigation terminal with the failure lower limit value and the failure upper limit value, if the failure probability is close to or lower than the failure lower limit value, it indicates that the actual probability of the product having a fault is lower than the expected lowest standard, meaning that the reliability of the product is getting better and the reliability change trend is positive; if the failure probability is close to or higher than the failure upper limit value, it indicates that the probability of the product having a fault exceeds the expected highest standard and the reliability of the product becomes worse, and the reliability change trend is negative; when the failure probability is between the failure lower limit value and the failure upper limit value, the reliability of the product is relatively stable and within the normal fluctuation range. Different measures can be taken according to the obtained reliability change trend.

[0077] Exemplarily, if the failure probability P r (r) is lower than the lower limit failure probability C b , it indicates that the reliability of the satellite navigation terminal has an upward trend; if the failure probability P r (r) exceeds the upper limit failure probability , it indicates that the reliability of the satellite navigation terminal has a downward trend; if the failure probability P r (r) is at the lower limit failure probability C b and the upper limit failure probability between, it indicates that the reliability of the satellite navigation terminal fluctuates within the normal range, and the production process can continue.

[0078] In this embodiment, by obtaining the reliability change trend of the satellite navigation terminal according to the failure probability, failure lower limit value, and failure upper limit value of the satellite navigation terminal, and performing the corresponding production process according to the reliability change trend, the fluctuation of the reliability evaluation index can be accurately monitored, so as to accurately evaluate the reliability level of the satellite navigation terminal.

[0079] In an exemplary embodiment, the method further includes: obtaining the product information of the satellite navigation terminal of the current batch, obtaining the product characteristics according to the product information; obtaining the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtaining the risk probability value and the failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0080] Optionally, in practical applications, different fluctuation ratios and risk probability values can be set according to the product characteristics of the satellite navigation terminal. When performing reliability evaluation, the specific risk probability value and failure fluctuation ratio of the satellite navigation terminal of the current batch can be directly found and matched in the risk probability value table and the fluctuation ratio value table according to the product characteristics.

[0081] In this embodiment, by obtaining the risk probability value table and the fluctuation ratio value table according to the product characteristics, the pertinence of the reliability evaluation can be improved, and the reliability evaluation of the satellite navigation terminal can be accurately realized.

[0082] In an exemplary embodiment, the value of the failure fluctuation ratio can be as shown in Table 1. The failure fluctuation ratio is the ratio of the upper limit value to the lower limit value of the fluctuation range. By setting an appropriate failure fluctuation ratio, the range of the evaluated reliability fluctuation can be limited. Among them, in Table 1, K is the slope of the straight line used to represent the failure determination boundary value when the risk probability value and the failure fluctuation ratio take different values.

[0083] Table 1 Fluctuation ratio value table

[0084]

[0085] Exemplarily, as shown in Table 2 and Table 3, Table 2 and Table 3 are respectively the values of C 上限值 and C 下限值 when the first risk value α and the second risk value β take equal values, at different failure fluctuation ratios D and different risk values α = β.

[0086] Table 2 C 上限值Value Table

[0087]

[0088] Table 3 C 下限值 Value Table

[0089]

[0090] Exemplarily, such as Figure 3 shown Figure 3 is a schematic diagram of a fluctuation determination for reliability assessment Figure 3 where the horizontal axis is the working duration and the vertical axis is the failure probability Figure 3 in the determination diagram shown, the selected failure fluctuation ratio is D = 2, the first risk value α = the second risk value β = 0.2, and the mathematical expression for the slope K of the straight line is:

[0091]

[0092] The intercepts respectively represent the upper limit failure probability C 上限值 and the lower limit failure probability C 下限值 . Among them, the mathematical expressions for C 上限值 and C 下限值 are:

[0093]

[0094]

[0095] In an exemplary embodiment, such as Figure 4 shown, a method for reliability assessment of satellite navigation is provided, and the method includes the following steps:

[0096] S402: Obtain the fluctuation range corresponding to the reference reliability level of the current batch of satellite navigation terminals.

[0097] Among them, the upper limit value of the fluctuation range is the expected reliability level of the current batch of satellite navigation terminals, and the lower limit value of the fluctuation range is the required reliability level of the current batch of satellite navigation terminals.

[0098] S404: Obtain the risk probability value and the failure fluctuation ratio according to the fluctuation range.

[0099] Among them, the risk probability value includes the first risk value and the second risk value; the first risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0100] S406: Obtain the upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtain the lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtain the failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtain the failure determination boundary value according to the failure expression.

[0101] Among them, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to represent the probability that the satellite navigation terminal has a preset number of failures within a preset working duration.

[0102] S408: Obtain the reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value and the failure upper limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0103] S410: Obtain the product information of the satellite navigation terminal of the current batch, and obtain the product characteristics according to the product information; obtain the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtain the risk probability value and the failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0104] In this embodiment, by obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminal of the current batch, obtaining the risk probability value and the failure fluctuation ratio according to the fluctuation range, obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio, and performing reliability evaluation on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal, it is possible to accurately monitor the fluctuation of the reliability evaluation index, thereby accurately evaluating the reliability level of the satellite navigation terminal.

[0105] It should be understood that although the steps in the flowcharts involved in the above embodiments are shown in sequence according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same moment, but can be executed at different moments. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps in other steps.

[0106] Based on the same inventive concept, an embodiment of the present application further provides a reliability evaluation device for satellite navigation for implementing the reliability evaluation method of satellite navigation involved above. The solution provided by this device for solving problems is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the reliability evaluation device for satellite navigation provided below can refer to the limitations on the reliability evaluation method of satellite navigation in the above text, and will not be repeated here.

[0107] In an exemplary embodiment, as Figure 5 shown, a reliability evaluation device for satellite navigation is provided, including: a first acquisition module 10, a second acquisition module 20, a failure determination module 30, and a reliability evaluation module 40, where:

[0108] The first acquisition module 10 is configured to acquire the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch.

[0109] The second acquisition module 20 is configured to acquire a risk probability value and a failure fluctuation ratio according to the fluctuation range.

[0110] The failure determination module 30 is configured to acquire a failure determination boundary value based on the risk probability value and the failure fluctuation ratio.

[0111] The reliability evaluation module 40 is configured to perform a reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value.

[0112] In an exemplary embodiment, the upper limit value of the fluctuation range involved in the first acquisition module 10 is the expected reliability level of the satellite navigation terminals in the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals in the current batch.

[0113] In an exemplary embodiment, the risk probability value involved in the second acquisition module 20 includes a first risk value and a second risk value; the first risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0114] In an exemplary embodiment, the failure determination module 30 is further configured to obtain the upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtain the lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtain the failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtain the failure determination boundary value according to the failure expression.

[0115] In an exemplary embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration; the reliability evaluation module 40 is further configured to obtain the reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value and the failure upper limit value of the satellite navigation terminal, so as to perform corresponding production processes according to the reliability change trend.

[0116] In an exemplary embodiment, the first acquisition module 10 is further configured to acquire the product information of the satellite navigation terminals in the current batch, and acquire the product characteristics according to the product information;

[0117] Obtain the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtain the risk probability value and the failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0118] Each module in the above satellite navigation reliability evaluation device can be implemented in whole or in part by software, hardware and their combination. The above modules can be embedded in the processor in the computer device in the form of hardware or independent of the processor, or stored in the memory in the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0119] In an exemplary embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as Figure 6As shown in the figure. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit, and an input device. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface, the display unit, and the input device are connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with external terminals in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, near field communication (NFC), or other technologies. When the computer program is executed by the processor, it realizes a method for evaluating the reliability of satellite navigation. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen. The input device of the computer device can be a touch layer covered on the display screen, or a button, a trackball, or a touchpad provided on the housing of the computer device, or an external keyboard, touchpad, or mouse, etc.

[0120] Those skilled in the art can understand that Figure 6 the structure shown in the figure is only a block diagram of some structures related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0121] In an exemplary embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented: obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch; obtaining a risk probability value and a failure fluctuation ratio according to the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; and performing a reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value.

[0122] In one embodiment, the upper limit value of the fluctuation range involved when the processor executes the computer program is the expected reliability level of the satellite navigation terminals in the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals in the current batch.

[0123] In one embodiment, the risk probability values involved when the processor executes a computer program include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the determination reference reliability level being not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the determination reference reliability level being less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0124] In one embodiment, based on the risk probability value and the failure fluctuation ratio, obtaining a failure determination boundary value when the processor executes a computer program includes: obtaining an upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value according to the failure expression.

[0125] In one embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration; performing a reliability assessment on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal when the processor executes a computer program includes: obtaining the reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminal, so as to execute a corresponding production process according to the reliability change trend.

[0126] In one embodiment, the processor also implements the following steps when executing a computer program: obtaining product information of the satellite navigation terminals in the current batch, and obtaining product characteristics according to the product information; obtaining a risk probability value table and a fluctuation ratio value table according to the product characteristics, and obtaining a risk probability value and a failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0127] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented: obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch; obtaining a risk probability value and a failure fluctuation ratio according to the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; performing a reliability assessment on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal.

[0128] In one embodiment, the upper limit value of the fluctuation range involved when the computer program is executed by the processor is the expected reliability level of the satellite navigation terminals of the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals of the current batch.

[0129] In one embodiment, the risk probability values involved when the computer program is executed by the processor include a first risk value and a second risk value; the first risk value is used to characterize the misjudgment risk probability corresponding to the determination that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to characterize the misjudgment risk probability corresponding to the determination that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

[0130] In one embodiment, obtaining the failure determination boundary value based on the risk probability value and the failure fluctuation ratio when the computer program is executed by the processor includes: obtaining the upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining the lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining the failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining the failure determination boundary value according to the failure expression.

[0131] In one embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to characterize the probability that the satellite navigation terminal has a preset number of failures within a preset working duration; performing reliability assessment on the satellite navigation terminal according to the failure probability and the failure determination boundary value of the satellite navigation terminal when the computer program is executed by the processor includes: obtaining the reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminal, so as to execute the corresponding production process according to the reliability change trend.

[0132] In one embodiment, the computer program also implements the following steps when executed by the processor: obtaining the product information of the satellite navigation terminals of the current batch, and obtaining the product characteristics according to the product information; obtaining the risk probability value table and the fluctuation ratio value table according to the product characteristics, and obtaining the risk probability value and the failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0133] In one embodiment, a computer program product is provided, including a computer program which, when executed by a processor, implements the following steps: obtaining a fluctuation range corresponding to a reference reliability level of a current batch of satellite navigation terminals; obtaining a risk probability value and a failure fluctuation ratio according to the fluctuation range; obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; and performing a reliability assessment on the satellite navigation terminal according to a failure probability of the satellite navigation terminal and the failure determination boundary value.

[0134] In one embodiment, an upper limit value of the fluctuation range involved when the computer program is executed by the processor is an expected reliability level of the current batch of satellite navigation terminals, and a lower limit value of the fluctuation range is a required reliability level of the current batch of satellite navigation terminals.

[0135] In one embodiment, the risk probability value involved when the computer program is executed by the processor includes a first risk value and a second risk value; the first risk value is used to represent a misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to represent a misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; the failure fluctuation ratio is a ratio between the upper limit value and the lower limit value of the fluctuation range.

[0136] In one embodiment, obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio when the computer program is executed by the processor includes: obtaining an upper limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to represent a probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; obtaining a lower limit failure probability of the satellite navigation terminal according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to represent a probability that the satellite navigation terminal has a preset number of failures within a preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; obtaining a failure expression corresponding to the satellite navigation terminal according to the upper limit failure probability and the lower limit failure probability, and obtaining the failure determination boundary value according to the failure expression.

[0137] In one embodiment, the failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to represent a probability that the satellite navigation terminal has a preset number of failures within a preset working duration; performing a reliability assessment on the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure determination boundary value when the computer program is executed by the processor includes: obtaining a reliability change trend of the satellite navigation terminal according to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminal, so as to perform a corresponding production process according to the reliability change trend.

[0138] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented: obtaining product information of satellite navigation terminals in the current batch, and obtaining product features according to the product information; obtaining a risk probability value table and a fluctuation ratio value table according to the product features, and obtaining a risk probability value and a failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

[0139] Those of ordinary skill in the art can understand that all or part of the processes in the above-described embodiment methods can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the above-described method embodiments. Among them, any reference to a memory, database, or other medium used in the various embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the various embodiments provided in this application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., and are not limited thereto. The processors involved in the various embodiments provided in this application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, artificial intelligence (AI) processors, etc., and are not limited thereto.

[0140] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this application.

[0141] The above-described embodiments merely represent several implementation manners of this application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of this application. It should be noted that for those of ordinary skill in the art, without departing from the concept of this application, several variations and improvements can still be made, and these all belong to the protection scope of this application. Therefore, the protection scope of this application should be subject to the appended claims.

Claims

1. A reliability evaluation method for satellite navigation, characterized in that, The method includes: Obtaining the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch; Obtaining a risk probability value and a failure fluctuation ratio according to the fluctuation range; Obtaining a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; Performing reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value.

2. The method according to claim 1, wherein The upper limit value of the fluctuation range is the expected reliability level of the satellite navigation terminals in the current batch, and the lower limit value of the fluctuation range is the required reliability level of the satellite navigation terminals in the current batch.

3. The method according to claim 1, characterized in that, The risk probability value includes a first risk value and a second risk value; The first risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is not less than the upper limit value of the fluctuation range, and the second risk value is used to represent the misjudgment risk probability corresponding to determining that the reference reliability level is less than the lower limit value of the fluctuation range; The failure fluctuation ratio is the ratio between the upper limit value and the lower limit value of the fluctuation range.

4. The method according to claim 1, characterized in that The obtaining of the failure determination boundary value based on the risk probability value and the failure fluctuation ratio includes: Obtaining the upper limit failure probability of the satellite navigation terminals according to the risk probability value and the failure fluctuation ratio; the upper limit failure probability is used to represent the probability that the satellite navigation terminals have a preset number of failures within a preset working duration when the reference reliability level is equal to the upper limit value of the fluctuation range; Obtaining the lower limit failure probability of the satellite navigation terminals according to the risk probability value and the failure fluctuation ratio; the lower limit failure probability is used to represent the probability that the satellite navigation terminals have the preset number of failures within the preset working duration when the reference reliability level is equal to the lower limit value of the fluctuation range; Obtaining a failure expression corresponding to the satellite navigation terminals according to the upper limit failure probability and the lower limit failure probability, and obtaining a failure determination boundary value according to the failure expression.

5. The method according to claim 1, characterized in that The failure determination boundary value includes a failure lower limit value and a failure upper limit value; the failure probability is used to represent the probability that the satellite navigation terminals have a preset number of failures within a preset working duration; The performing of reliability evaluation on the satellite navigation terminals according to the failure probability of the satellite navigation terminals and the failure determination boundary value includes: Obtaining the reliability change trend of the satellite navigation terminals according to the failure probability, the failure lower limit value, and the failure upper limit value of the satellite navigation terminals, so as to perform corresponding production processes according to the reliability change trend.

6. The method according to claim 1, wherein The method further includes: Obtaining the product information of the satellite navigation terminals in the current batch, and obtaining product features according to the product information; Obtaining a risk probability value table and a fluctuation ratio value table according to the product features, and obtaining a risk probability value and a failure fluctuation ratio according to the risk probability value table and the fluctuation ratio value table.

7. A reliability evaluation device for satellite navigation, characterized in that, The device includes: A first obtaining module, configured to obtain the fluctuation range corresponding to the reference reliability level of the satellite navigation terminals in the current batch; A second acquisition module, configured to acquire a risk probability value and a failure fluctuation ratio according to the fluctuation range; A failure determination module, configured to obtain a failure determination boundary value based on the risk probability value and the failure fluctuation ratio; A reliability evaluation module, configured to perform a reliability evaluation on the satellite navigation terminal according to the failure probability of the satellite navigation terminal and the failure determination boundary value.

8. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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