Interference immunity measurement, solution method, computer equipment and storage medium

Abstract

The present application relates to the field of integrated circuit technology, and discloses an anti-interference degree measurement and solution method, computer equipment and storage medium, wherein, by setting a circuit model and a simulation parameter table of a circuit unit, the circuit model can be dynamically simulated based on the pulse parameter values ​​and load values ​​in the parameter group in the simulation parameter table, and the output signal of the circuit model under the parameter group can be obtained. Then, according to the amplitude of the output signal of the circuit model, the anti-interference degree of the circuit unit is measured, thereby realizing accurate and batch measurement of the anti-interference degree of the circuit unit. The anti-interference degree measurement method can cover a large number of application scenarios and has strong applicability.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuits, and in particular to an anti-interference measurement and solution method, a computer device, and a storage medium. Background Art

[0002] In IC design, when two or more interconnect lines are adjacent, the presence of coupling capacitance can cause signal interference (crosstalk), resulting in glitches or delays. Each unit has a certain noise tolerance, known as noise immunity, which is a key indicator of unit failure.

[0003] In the related art, the anti-interference degree is specified by using a curve or polynomial form, but the versatility of this method is limited. Therefore, it is urgent to propose a new anti-interference degree measurement method. Summary of the Invention

[0004] The present application provides an anti-interference degree measurement and solution method, a computer device and a storage medium, which solves the problem of insufficient versatility of the specified anti-interference degree method in the related art and can provide a more accurate anti-interference degree measurement method for the unit.

[0005] In order to achieve the above objectives, the main technical solutions adopted in this application include:

[0006] In a first aspect, an embodiment of the present application provides a method for measuring interference immunity, the method comprising:

[0007] Setting a circuit model and a simulation parameter table of a circuit unit; wherein the simulation parameter table includes a plurality of parameter groups; wherein the parameter groups include pulse parameter values ​​and load values, wherein the pulse parameter values ​​are used to describe a simulated noise waveform at an input end of the circuit model, and the load values ​​are used to describe a simulated load connected to an output end of the circuit model;

[0008] Based on the pulse parameter values ​​and load values ​​in the parameter group, dynamically simulate the circuit model to obtain an output signal of the circuit model under the parameter group;

[0009] The anti-interference degree of the circuit unit is measured according to the amplitude of the output signal of the circuit model.

[0010] In a second aspect, an embodiment of the present application provides a method for solving interference immunity, the method comprising:

[0011] determining a noise pulse width at an input end of a circuit unit and an actual load value at an output end of the circuit unit;

[0012] Obtaining an anti-interference record table suitable for the circuit unit;

[0013] The anti-interference degree of the circuit unit is obtained by using the corresponding relationship between the pulse width, the load value and the anti-interference degree in the anti-interference degree record table and performing a solution according to the noise pulse width and the actual load value.

[0014] In a third aspect, an embodiment of the present application provides a computer device comprising: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, computer instructions are stored in the memory, and the processor executes the method described in the first aspect by executing the computer instructions.

[0015] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which computer instructions are stored, and the computer instructions are used to enable a computer to execute the method described in the first aspect.

[0016] In an embodiment of the present application, by setting a circuit model and a simulation parameter table of a circuit unit, the circuit model can be dynamically simulated based on the pulse parameter values ​​and load values ​​in the parameter group in the simulation parameter table, and the output signal of the circuit model under the parameter group can be obtained. Then, according to the amplitude of the output signal of the circuit model, the anti-interference degree of the circuit unit is measured, thereby realizing accurate and batch measurement of the anti-interference degree of the circuit unit. This anti-interference degree measurement method can cover a large number of application scenarios and has strong applicability. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the specific implementation methods or the description of the prior art. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1a A schematic diagram of burrs caused by coupling capacitance provided in an embodiment of the present application;

[0019] Figure 1b A schematic diagram of the anti-interference degree provided in an embodiment of the present application;

[0020] Figure 1c A schematic diagram of a timing arc provided in an embodiment of the present application;

[0021] Figure 1d Schematic diagram of four types of noise at the clock input end provided in an embodiment of the present application;

[0022] Figure 1e This is a schematic diagram of the effect of a noise signal at the CP end on the output at the Q end provided in an embodiment of the present application;

[0023] Figure 1f This is a schematic diagram of the effect of a noise signal at the CP end on the output at the Q end provided in an embodiment of the present application;

[0024] Figure 1g This is a schematic diagram of a situation in which the noise signal at the CP end does not affect the output at the Q end provided in an embodiment of the present application;

[0025] Figure 1h This is a schematic diagram of a situation in which the noise signal at the CP end does not affect the output at the Q end provided in an embodiment of the present application;

[0026] Figure 1i Schematic diagram of the flow of the algorithm for solving the anti-interference degree based on the dichotomy method provided in the embodiment of the present application;

[0027] Figure 1j Schematic diagram of the flow of the algorithm for solving the anti-interference degree based on the dichotomy method provided in the embodiment of the present application;

[0028] Figure 1k Schematic diagram of the flow of an algorithm for solving anti-interference degree using a data partitioning method provided in an embodiment of the present application;

[0029] Figure 11 Schematic diagram of the flow of an algorithm for solving anti-interference degree using a data partitioning method provided in an embodiment of the present application;

[0030] Figure 1m A flow chart of a method for determining the anti-interference degree of a sequential unit provided in an embodiment of the present application;

[0031] Figure 2 Schematic diagram of the flow chart of the anti-interference degree determination method provided in the embodiment of the present application;

[0032] Figure 3 Schematic diagram of the flow chart of the anti-interference degree determination method provided in the embodiment of the present application;

[0033] Figure 4 A schematic diagram of a process for setting a simulation parameter table provided in an embodiment of the present application;

[0034] Figure 5 A schematic diagram of a process for determining a pulse height value provided in an embodiment of the present application;

[0035] Figure 6 A schematic diagram of a process for setting a specified high voltage value and a specified low voltage value provided in an embodiment of the present application;

[0036] Figure 7 Schematic diagram of the flow chart of the anti-interference degree determination method provided in the embodiment of the present application;

[0037] Figure 8Schematic diagram of the flow chart of the anti-interference degree determination method provided in the embodiment of the present application;

[0038] Figure 9 A flow chart of a method for determining the anti-interference degree provided in an embodiment of the present application;

[0039] Figure 10 Schematic diagram of the anti-interference measurement device provided in an embodiment of the present application;

[0040] Figure 11 This is a flow chart of a device for determining the degree of interference immunity provided in an embodiment of the present application;

[0041] Figure 12 This is a schematic diagram of the structure of the computer device provided in the embodiment of the present application. DETAILED DESCRIPTION

[0042] To make the purpose, technical solutions, and advantages of the embodiments of the present application more clear, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative efforts shall fall within the scope of protection of this application.

[0043] In the field of Electronic Design Automation (EDA), crosstalk analysis is crucial in chip timing verification. Crosstalk refers to the situation where two or more interconnects are adjacent and the signals interfere with each other due to the presence of coupling capacitance. This interference usually manifests as glitches (see Figure 1a ) or delay effects, glitches may cause signal transmission errors, while delays may cause timing violations.

[0044] Each unit has a certain degree of noise tolerance, which is called noise immunity. Noise analysis tools can determine whether noise causes unit failure based on the noise immunity of the unit input. Figure 1b Interference immunity can be divided into two forms: 1) static interference immunity, which refers to the maximum noise peak allowed at the unit input terminal defined by a fixed noise margin; 2) dynamic interference immunity, which refers to the change in the noise peak allowed at the unit input terminal when the noise width at the input terminal changes.

[0045] In related technologies, static interference immunity refers to an interference immunity method based on a fixed noise tolerance, which is relatively simple to operate. In timing analysis, a fixed noise tolerance can be set for a unit. When the noise peak at the unit input exceeds the tolerance, it can be determined as a noise violation. However, please continue to refer to Figure 1b When the input glitch is very narrow, even if the noise peak is high, the actual impact of this "narrow and sharp" noise on the unit is usually small and can often be ignored. Furthermore, when the unit is connected to a heavy load, some glitches are significantly eliminated. Therefore, the noise immunity method based on a fixed noise tolerance is relatively crude and has limited application scenarios.

[0046] In related technologies, dynamic interference rejection is usually expressed in the form of an interference rejection curve or polynomial. Taking the interference rejection curve as an example, the interference rejection of a unit is closely related to the noise characteristics of the input end and can be described by an inverse proportional function, as shown in formula (1):

[0047] (1)

[0048] in, It indicates the pulse peak value that the unit can tolerate when the input noise pulse width is width. The coordination coefficient representing the pulse height. The coordination coefficient representing the pulse area. The coordination coefficient that represents the pulse width.

[0049] According to formula (1), the unit's anti-interference degree is specified in the form of a hyperbola, which can be understood as follows: as the input noise width increases, the noise peak that the unit can tolerate decreases.

[0050] After analysis, it was found that in actual applications, due to the differences in the loads connected to the units, the dynamic anti-interference method specified in the form of curves or polynomials lacks versatility, thereby reducing the accuracy of the analysis. Therefore, the embodiment of the present application proposes a method for measuring anti-interference based on dynamic simulation, which can provide accurate anti-interference for the unit and cover a variety of application scenarios through batch data generation, and has strong applicability. In addition, in actual applications, if other parameters that cannot be covered appear, new anti-interference can be dynamically generated twice by interpolation method, thereby achieving efficient and versatile anti-interference measurement.

[0051] This application scenario example provides a method for measuring anti-interference. Take the timing unit as an example to illustrate. Specifically, take the timing arc from the clock (CP) to the output terminal (Q) of the timing unit as an example. Figure 1c , Figure 1cFigure 2 shows a schematic diagram of a timing arc. When the interconnect connected to the CP front end serves as the victim network, the CP side must be tested for interference immunity. This involves determining whether the Q side will output an erroneous signal due to the intrusive noise when a noise signal enters the CP side. Based on the characteristics of dynamic interference immunity, the noise peak that the CP side can tolerate is related to the pulse width and the load connected to the Q side. It can be explained that the D port of the timing unit is the data input port, used to receive external input data. The Q port of the timing unit is the data output port, used to output processed data. The QN port of the timing unit is also an output port. The CP port of the timing unit is the clock control port, used to trigger the timing unit for data transmission.

[0052] Examples of noise types at the input are given. Figure 1d , Figure 1d The figure shows four types of noise at the clock input. The four noise signals include a first noise signal 101 that is higher than the power supply voltage VDD (above_high), a second noise signal 102 that is lower than the ground voltage GND (below_low), a third noise signal 103 that is lower than the power supply voltage VDD (below_high), and a fourth noise signal 104 that is higher than the ground voltage GND (above_low). Generally, the effects of the above_high and below_low noise signals on the circuit can be ignored. In this scenario, the below_high and above_low noise signals are used as examples for discussion. It should be noted that in certain specific circuits, the above_high and below_low noise signals may have a significant impact on the circuit, and the methods mentioned in the embodiments of this application are also applicable to such situations.

[0053] This section shows an example of how the output terminals can output error signals. Figure 1e and Figure 1f , Figure 1e and Figure 1f The following diagrams show how the noise signal at the CP terminal affects the output at the Q terminal. Specifically, when there is no input noise at the CP terminal, the output signal at the Q terminal is low. However, when there is input noise at the CP terminal, the Q terminal outputs a high-level error signal. Figure 1g and 1h , Figure 1g and Figure 1h The following diagrams show the situation where the noise signal at the CP terminal has no effect on the output at the Q terminal. Specifically, there is input noise at the CP terminal, but the amplitude of the noise is small, and the output at the Q terminal is almost unaffected, and the output signal at the Q terminal remains low. In this case, Figure 1g and Figure 1h The noise signal shown is lower than the interference immunity of the CP terminal.

[0054] It should be noted that in some cases, in order to facilitate simulation, the standard for whether the output port is affected by noise can be customized or defined as the upper and lower thresholds of the unit, which can be queried in the unit timing library. Figure 1e and Figure 1f In the situation shown, when the Q terminal can detect a signal with a variation amplitude of 30% VDD, it indicates that there is an error signal output at the Q terminal.

[0055] The definition of anti-interference degree is introduced as an example. x In the following example, the Q terminal of the sequential unit is connected to the load c x , the noise signal amplitude of a clock is h x , after being input to the timing unit, the Q terminal does not output an error signal. x When the Q terminal outputs an error signal, it can be considered that (w x , c x ), the anti-interference degree of the timing unit is h x It is understood that in the timing arc from the clock to the output of the timing unit, the clock signal and the output signal waveform have no identical or opposite relationship, and can be set according to the above method. However, for other timing arcs, when the output and input signals have the same or opposite relationship in terms of timing perception, it is necessary to perform equivalent conversion of the output signal according to the unit output characteristics for judgment.

[0056] In this scenario, a parameter library is first created. The parameter library includes pulse width sequences and load sequences. The pulse width sequence is represented as (w1, w2, w3...w n ), which includes n pulse widths. The load sequence is expressed as (c1, c2, c3...c m ), which includes m loads. For sequential cell simulation, each case requires a pulse width w x With a load c x . The n pulse widths and m loads in the parameter library are arranged and combined to obtain n×m arrays, corresponding to n×m simulation scenarios. For example, when the pulse width sequence is (0.01ns, 0.10ns, 0.40ns, 1.00ns, 1.50ns, 3.0ns, 4.50ns) and the load sequence is (0.0002pF, 0.002pF, 0.012pF, 0.024pF, 0.048pF, 0.096pF, 0.192pF), 49 parameter groups are generated, and each parameter group corresponds to a simulation scenario. It can be understood that these parameter groups can be input into the simulation file in the form of a parameter table, so that the simulation results under all simulation scenarios can be obtained in one round of simulation.

[0057] The established parameter library can be used to generate multiple simulation scenarios. The following example illustrates how to solve the anti-interference degree algorithm based on the dichotomy method to determine the anti-interference degree corresponding to each simulation scenario and generate an anti-interference degree record table. The anti-interference degree record table stores the corresponding relationship between pulse width, load value, and anti-interference degree.

[0058] In this example, the noise type is above_low. Figure 1i , specifically including the following steps:

[0059] 11) Define simulation settings: This includes the process model and component library required for the simulation, as well as voltage and temperature settings. Set the simulation time and simulation step size. The simulation time should be long enough to capture accurate output signals. For example, you can set it to 5ns and the simulation step size to 1ps.

[0060] 12) Set up the circuit model. In this example, the circuit uses sequential cells. Set the D port excitation to a high level and the CP port to an above_low pulse waveform to simulate a noise waveform. The pulse width is widthx, the pulse peak is Hcurrentx, and the load connected to the Q port is capx.

[0061] 13) Set the parameter table for simulation (i.e. simulation parameter table): According to the established parameter library, the pulse width sequence contained in it is expressed as (w1, w2, w3...w n ), the load sequence is expressed as (c1, c2, c3……c m ), the parameter table corresponds to n×m situations, and the parameter table includes pulse width sequence, load sequence and pulse height sequence. The pulse height sequence is expressed as (H1, H2, H3……, H n×m During initial setup, for each of the n×m cases, the pulse height is set to the value of VDD. See Table 1 for the simulation parameters used for dynamic simulation.

[0062] Table 1

[0063]

[0064] It should be noted that the pulse width sequence, load sequence, and pulse height sequence shown in Table 1 are the basic parameters required for dynamic simulation. If other parameter settings are required, they can also be set in sequence as needed. Furthermore, a specified high voltage value H_high and a specified low voltage value H_low are set for each parameter group. The specified high voltage value sequence is expressed as (H1_high, H2_high, H3_high..., H n×m_high). The specified low voltage value sequence is expressed as (H1_low, H2_low, H3_low……, H n×m _low). When initially set, the H_high value in each parameter group is VDD, and the H_low value in each parameter group is ground voltage (0V). It is understood that the simulation parameter table can be converted into a simulator-readable format and written into a simulation file or called by the simulator during simulation.

[0065] 14) Calculate the ΔH1 value for each parameter group: ΔH1 = abs(Hcurrent - Hpre). For initial configuration, set ΔH1 equal to VDD. Hcurrent is the pulse height of the noise pulse during the current simulation cycle. Hpre is the pulse height of the noise pulse during the previous simulation cycle.

[0066] 15) Determine whether ΔH1 is greater than H0 for each parameter group. H0 can be set by the user, for example, H0 is equal to 0.00001V.

[0067] If the calculated ΔH1 for certain parameter groups after simulation is less than or equal to H0, the calculated anti-interference performance for these parameter groups meets the accuracy requirements. These parameter groups, along with Hcurrent for the last parameter group that did not output an error signal, are recorded as the output value, i.e., the anti-interference performance. In subsequent simulations, these parameter groups are removed from the simulation parameter table, and the process proceeds to step 20 below, where the simulation parameter table is updated.

[0068] If the calculated ΔH1 after simulation for certain parameter groups is greater than H0, the system performs an end-of-mode determination. For example, this determination determines whether each parameter group has its corresponding anti-interference rating (i.e., whether all parameter groups currently have corresponding output values ​​(i.e., anti-interference ratings) or whether the current simulation round has reached the preset round threshold num. If either of these two conditions is met, the system proceeds to step 21) of the end-of-mode procedure. If not, the simulation tool is invoked to continue the simulation. Here, num is the simulation number threshold, which can be customized, for example, num = 10.

[0069] It should be noted that H0 can be understood as the simulation accuracy threshold, which can also be recorded as Hthreshold.

[0070] 16) Invoke the simulation tool to perform dynamic simulation. The dynamic simulation process involves defining the simulation settings, determining the circuit model, and determining the simulation stimulus based on the simulation parameter table. Based on the circuit netlist consisting of the circuit and components, nonlinear time-domain analysis methods are used to calculate how the circuit output variable changes over time. For example, the circuit output variable can be the voltage at the Q terminal of a sequential cell. To facilitate the programmatic execution of the algorithm, measurement points are set during the simulation, facilitating batch analysis and testing.

[0071] In this example, the Q-end output is continuously detected to detect the moment when the Q-end output change amplitude reaches 30% of the VDD signal. If this moment can be detected during the entire simulation process, it indicates that the unit outputs an error signal at this moment. If this moment is not detected, the unit does not output an error signal. In another example, the output at the end of the simulation is compared with the output at the initial moment to see whether the Q-end output change amplitude exceeds 30% VDD. If it exceeds 30% VDD, it indicates that the unit outputs an error signal. If it does not exceed 30% VDD, it indicates that the unit does not output an error signal. Either of the above two methods can be used to determine whether an error signal is output.

[0072] During the dynamic simulation process, the output of each parameter group is judged. For parameter groups with error signal output, the process goes to step 17; for parameter groups without error signal output, the process goes to step 18).

[0073] 17) For the parameter group that has an error signal output in the current round, the pulse height value in the parameter group needs to be reduced in the next round of the current round. For example, the pulse height value Hcurrent in the parameter group is used to update the specified high voltage value H_high, that is, H_high is equal to Hcurrent, and the specified low voltage value H_low remains unchanged. Hpre is equal to Hcurrent. Furthermore, based on the updated H_high and the unchanged H_low, the pulse height value Hcurrent of the next round in the parameter group is set, Hcurrent=0.5×(H_low+H_high). Then, proceed to the step of updating the simulation parameter table in step 20).

[0074] 18) For parameter groups that did not output an error signal in the current round, determine whether this is the first round of simulation. If so, record these parameter groups and the Hcurrent values ​​for the last time these parameter groups did not output an error signal as output values. In the subsequent simulation, remove these parameter groups and proceed to step 20) to update the simulation parameter table. After the current round of determination is complete, no further determination is required for the next round, and a "No" answer is given. If this is not the first round of simulation, proceed to step 19).

[0075] 19) If the current round is not the first round of simulation, for the parameter group that has no error signal output in the current round, the pulse height value in the parameter group needs to be increased in the next round of the current round. For example, the pulse height value Hcurrent in the parameter group is used to update the specified low voltage value H_low, that is, H_low is equal to Hcurrent, and the specified high voltage value H_high remains unchanged. Hpre is equal to Hcurrent. Furthermore, based on the updated H_low and the unchanged H_high, the pulse height value Hcurrent of the next round in the parameter group is set, Hcurrent=0.5×(H_low+H_high). Then, proceed to step 20) to update the simulation parameter table.

[0076] 20) Update the pulse height value Hcurrent for each parameter group in the simulation parameter table. Since some parameter groups already have output values ​​and have been recorded, they do not need to be simulated again. Therefore, remove the parameter groups that need to be removed. After completing the simulation parameter table update, return to 14) until entering end mode 21).

[0077] 21) Summarize the output data (output values) corresponding to all parameter groups to complete the algorithm.

[0078] It should be noted that for a parameter group with an output value, the anti-interference degree under the simulation situation corresponding to the parameter group has been determined, and no further simulation is required. By summarizing all the output values, an anti-interference degree record table is obtained.

[0079] In another example, the noise type is below_high. Figure 1j , specifically including the following steps:

[0080] Step 22) in the case where the noise type is below_high is the same as step 11) in the case where the noise type is above_low, and will not be repeated here.

[0081] 23) Set up the circuit model. In this example, the circuit uses sequential cells. Set the CP port to a pulse waveform of below_high to simulate a noise waveform. Other settings are the same as in step 12).

[0082] 24) The simulation parameter table settings are basically the same as step 13), except that in the case of below_high, the pulse height value can be represented by the pulse peak value. In this embodiment, the pulse peak value is represented by (H1, H2, H3..., H n×m ). When initially set, the vertex in the below_high case is at ground voltage 0 for each case.

[0083] 25) Calculate the ΔH2 value for each parameter group: ΔH2 = abs(Hcurrent - Hpre). For initial configuration, set ΔH2 equal to VDD. Hcurrent is the peak value of the noise pulse during the current simulation cycle. Hpre is the peak value of the noise pulse during the previous simulation cycle.

[0084] 26) Determine whether ΔH2 is greater than H0 for each parameter group. H0 can be set by the user, for example, H0 is equal to 0.00001V.

[0085] If the calculated ΔH2 for certain parameter groups after simulation is less than or equal to H0, the calculated anti-interference performance for these parameter groups meets the accuracy requirements. These parameter groups, along with Hcurrent for the last parameter group that did not output an error signal, are recorded. The difference between the power supply voltage VDD and Hcurrent is used as the output value, i.e., the anti-interference performance. In subsequent simulations, these parameter groups are removed from the simulation parameter table, and the process proceeds to step 31) updating the simulation parameter table.

[0086] If the calculated ΔH2 after simulation for certain parameter groups is greater than H0, the system performs an end-of-mode determination. For example, this determination determines whether each parameter group has its corresponding anti-interference rating (i.e., whether all parameter groups currently have corresponding output values ​​(i.e., anti-interference ratings) or whether the current simulation round has reached the preset round threshold num. If either of these two conditions is met, the system proceeds to step 32) of the end-of-mode procedure. If not, the simulation tool is invoked to continue the simulation. Here, num is the simulation number threshold, which can be customized, for example, num = 10.

[0087] It should be noted that H0 can be understood as the simulation accuracy threshold, which can also be recorded as Hthreshold.

[0088] 27) Call the simulation tool for simulation.

[0089] The method for determining unit failure (outputting an error signal) when the noise type is below_high is the same as the method for determining unit failure (outputting an error signal) when the noise type is above_low, and will not be repeated here.

[0090] During the dynamic simulation process, the output of each parameter group is judged. For parameter groups with error signal output, the process goes to step 28; for parameter groups without error signal output, the process goes to step 29).

[0091] 28) For the parameter group with error signal output in the current round, the pulse height value in the parameter group needs to be reduced in the next round of the current round (because the waveform is similar to an inverted triangle shape at this time). For the waveform of below_high, the reduction of the pulse height value can be understood as raising the pulse apex.

[0092] For example, the pulse vertex value Hcurrent in this parameter group is used to update the specified low voltage value H_low, i.e., H_low is equal to Hcurrent, while the specified high voltage value H_high remains unchanged. Hpre is equal to Hcurrent. Furthermore, based on the updated H_low and the unchanged H_high, the pulse vertex value Hcurrent for the next round in this parameter group is set: Hcurrent = 0.5 × (H_low + H_high). Next, the process proceeds to step 31) to update the simulation parameter table.

[0093] 29) For the parameter groups that do not output an error signal in the current round, determine whether it is the first round of simulation. If it is the first round of simulation, record these parameter groups and the Hcurrent values ​​of these parameter groups when they did not output an error signal for the last time, and use the difference between the power supply voltage VDD and Hcurrent as the output value.

[0094] In the subsequent simulation process, these parameter groups are removed and the process proceeds to step 31) to update the simulation parameter table. After the current round of judgment is completed, the next round does not need to be judged again and the result is directly "no". If the judgment is not the first round of simulation, the process proceeds to step 30).

[0095] 30) If the current round is not the first round of simulation, for the parameter group that has no error signal output in the current round, the pulse height value in the parameter group needs to be increased in the next round of the current round. For the waveform of below_high, the increase in the pulse height value can be understood as lowering the pulse apex.

[0096] For example, the pulse vertex value Hcurrent in this parameter group is used to update the specified high voltage value H_high, i.e., H_high is equal to Hcurrent, while the specified low voltage value H_low remains unchanged. Hpre is equal to Hcurrent. Furthermore, the pulse vertex value Hcurrent for the next round in this parameter group is set based on the updated H_high and the unchanged H_low: Hcurrent = 0.5 × (H_low + H_high). Next, the process proceeds to step 30) to update the simulation parameter table.

[0097] 31) Update the pulse vertex value Hcurrent for each parameter group in the simulation parameter table. Since some parameter groups already have output values ​​and have been recorded, they do not need to be simulated again. Therefore, remove the parameter groups that need to be removed. After completing the simulation parameter table update, return to 25) until entering end mode 32).

[0098] 32) Summarize the output data (output values) corresponding to all parameter groups to complete the algorithm.

[0099] It should be noted that for a parameter group with an output value, the anti-interference degree under the simulation situation corresponding to the parameter group has been determined, and no further simulation is required. By summarizing all the output values, an anti-interference degree record table is obtained.

[0100] In this scenario example, in addition to the above algorithm for solving the anti-interference degree based on the dichotomy method, an algorithm for solving the anti-interference degree using the data partitioning method is also exemplarily introduced.

[0101] In this example, the noise type is above_low. Figure 1k , specifically including the following steps:

[0102] 33) Define the simulation settings. This includes the process model and component libraries required for the simulation, as well as voltage and temperature settings. Set the simulation time and simulation step size. The simulation time should be long enough to capture accurate output signals. For example, you can set it to 5ns and the simulation step size to 1ps.

[0103] 34) Set up the circuit model. In this example, the circuit is a sequential cell. Set the D port excitation to a high level and the CP port to an above_low pulse waveform to simulate a noise waveform. The pulse width is widthx, the pulse peak is Hcurrentx, and the load connected to the Q port is capx.

[0104] 35) Set the parameter table for simulation (i.e. simulation parameter table). According to the established parameter library, the pulse width sequence contained in it is expressed as (w1, w2, w3...w n ), the load sequence is expressed as (c1, c2, c3……c m ), the parameter table corresponds to n×m situations, and the parameter table includes pulse width sequence, load sequence and pulse peak sequence. The pulse peak sequence is represented as (H1, H2, H3……, H n×m ).

[0105] 36) Set the Hcurrent value set.

[0106] The Hcurrent set can evenly divide the ground voltage to the power supply voltage VDD. For example, when VDD=1V, the Hcurrent set can be (0.0025, 0.005, 0.0075, 0.001, ..., 1). The ground voltage to the power supply voltage VDD can also be divided according to a logarithmic function, for example, (0, 0.3010, 0.4771, 0.6021, 0.6990, 0.7782, ..., 1). The ground voltage to the power supply voltage VDD can also be divided according to device characteristics, such as DC conversion characteristics.

[0107] 37) Sequentially read each value Hp in the Hcurrent value set and set the vertex parameters in each parameter group to Hp. See Table 2, which shows the simulation parameter table after assigning values ​​to the pulse vertex sequence in each parameter group using Hp. It will be appreciated that the simulation parameter table can be converted into a simulator-readable format and written into a simulation file or called by the simulator during simulation.

[0108] Table 2

[0109]

[0110] 38) Call the dynamic simulation tool for simulation.

[0111] This process is consistent with the algorithm for solving the anti-interference degree based on the dichotomy method, and will not be described in detail here.

[0112] 39) Determine whether the current Hp is the last number in the Hcurrent set. If not, proceed to step 40). If so, proceed to step 41).

[0113] 40) Record whether the Q terminal outputs an error signal under each parameter group. Then, return to step 37) and read the next value in the Hcurrent set as Hp.

[0114] 41) Record whether the Q terminal outputs an error signal for each parameter set in the current simulation round, and record the Hp value at which no error signal is generated at the Q terminal in the current simulation round as the output value for the current parameter set. Enter end mode 42). It is understood that, if accuracy allows, the Hp value at which an error signal is first generated at the Q terminal in the current simulation round can also be recorded.

[0115] 42) End Mode: Summarizes parameter groups with output values.

[0116] It should be noted that the anti-interference record table is obtained by summarizing all output values.

[0117] In another example, the noise type is below_high. Figure 11, specifically including the following steps:

[0118] Steps 43), 44), ..., to 50) in the case where the noise type is below_high are the same as steps 33), 34), ..., to 40) in the case where the noise type is above_low, and are not repeated here.

[0119] 51) Record whether the Q terminal outputs an error signal for each parameter set in the current simulation round, and record the Hp value at which the Q terminal first outputs no error signal in the current simulation round. The difference between the power supply voltage VDD and the Hp value is used as the output value for the current parameter set. Enter end mode 52). It is understood that, if accuracy allows, the Hp value at which the Q terminal last outputs an error signal in the current simulation round can also be recorded.

[0120] 52) End Mode: Summarizes parameter groups with output values.

[0121] In this scenario, whether the algorithm for solving the interference rejection degree is based on the binary method or the algorithm for solving the interference rejection degree using the data partitioning method, an interference rejection record table is generated, enabling batch interference rejection degree measurement. Because parameter groups can be generated in large quantities, the dynamic simulation method used in this scenario has greater applicability and versatility.

[0122] Based on the above-obtained anti-interference record table, the present application also provides a scenario example of a method for determining the anti-interference degree of a circuit unit. Figure 1m Specifically, continuing with the sequential unit as an example, determine the noise pulse width w0 at the sequential unit's input and the actual load value c0 at the sequential unit's output. Based on (w0, c0), search the interference immunity record table. If the interference immunity corresponding to (w0, c0) is found, it is used as the interference immunity of the sequential unit.

[0123] If the anti-interference degree corresponding to (w0, c0) is not found, search for two points adjacent to w0 in the pulse width sequence in the anti-interference degree record table, record them as x1 and x2; search for two points adjacent to c0 in the load sequence in the anti-interference degree record table, record them as y1 and y2; search for the first anti-interference degree T11 corresponding to (x1, y1), the second anti-interference degree T12 corresponding to (x1, y2), the third anti-interference degree T21 corresponding to (x2, y1), and the fourth anti-interference degree T22 corresponding to (x2, y2) in the anti-interference degree record table. The anti-interference degree corresponding to (w0, c0) is calculated using the following formula (2):

[0124] T0=x20×y20×T11+x20×y01×T12+x01×y20×T21+x01×y01×T22 (2)

[0125] Among them, x01=(x0-x1) / (x2-x1); x20=(x2-x0) / (x2-x1);

[0126] y01=(y0-y1) / (y2-y1); y20=(y2-y0) / (y2-y1).

[0127] In the above scenario example, the anti-interference degree record table can provide an efficient and convenient way to determine the anti-interference degree in actual application. By searching the anti-interference degree record table based on the noise pulse width and actual load value, the user can quickly match the corresponding anti-interference degree. If the record table already has a matching noise pulse width and actual load value, the corresponding anti-interference degree can be directly used as the anti-interference degree of the timing unit, thereby achieving rapid determination. If the record table does not have a completely matching noise pulse width and actual load value, the appropriate anti-interference degree can be dynamically generated by searching adjacent values ​​and interpolating. This method not only ensures high efficiency, but also has strong versatility and wide adaptability.

[0128] According to an embodiment of the present application, an embodiment of a method for measuring anti-interference degree is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0129] In the embodiment of the present application, a method for measuring the anti-interference degree is provided. Figure 2 , Figure 2 : is a flow chart of a method for measuring anti-interference performance according to an embodiment of the present application, the flow chart comprising the following steps:

[0130] S210: Setting a circuit model and simulation parameter table of the circuit unit.

[0131] Among them, the simulation parameter table includes multiple parameter groups; among them, the parameter groups include pulse parameter values ​​and load values, the pulse parameter values ​​are used to describe the simulated noise waveform at the input end of the circuit model, and the load values ​​are used to describe the simulated load connected to the output end of the circuit model.

[0132] A circuit unit may be a circuit component that performs a specified function, for example, a circuit unit may be an electronic circuit of the type of amplifier, filter, timing unit, etc. A circuit unit may receive an input signal and provide an output signal.

[0133] A circuit model is a mathematical description of the electrical characteristics and behavior of a circuit unit. It can include the electrical structure, component parameters, and related operating conditions of the circuit unit and is typically implemented using computer simulation tools. A circuit model can be represented by a circuit schematic or equivalent circuit. Specifically, a circuit model can simulate the operating state of a circuit and provide responses to different input signals without actually building a physical circuit.

[0134] The simulation parameter table can be a two-dimensional table for storing circuit model simulation input conditions. Each row in the two-dimensional table can correspond to a parameter group. The simulation parameter table has multiple rows, that is, it includes multiple parameter groups. The parameter group contains specific values ​​and settings for a simulation process to simulate different operating environments so that the circuit unit produces a corresponding response. In this embodiment, the simulation parameter table includes pulse parameter values ​​and load values. Each parameter group can be set according to different test requirements to simulate different operating conditions. It is understandable that different circuit units can have different pulse parameter values ​​or different load values ​​in the simulation parameter table.

[0135] Pulse parameter values ​​can be understood as parameter values ​​used to describe the simulated noise waveform at the input of a circuit model. These values ​​can include pulse width or pulse width and pulse area. The pulse parameter values ​​are used to generate corresponding noise signals to simulate the effects on the input of a circuit unit. The range of pulse parameter values ​​may depend on the type of circuit unit.

[0136] The load value can be understood as the size of the simulated load connected to the output of the circuit model. The load value simulates the actual load components connected to the output of the circuit model. Because the load connected to the output of a circuit unit has a certain impact on the circuit unit's immunity to interference, setting an appropriate load value simulates the changes in the circuit output under different loads to accurately measure the circuit unit's immunity to interference.

[0137] In some cases, since the load and pulse parameters (such as pulse area, pulse width, and pulse height) will affect the anti-interference ability of the circuit unit, it is necessary to consider the load and pulse parameters simultaneously during the simulation process of this embodiment. Furthermore, in order to improve the simulation efficiency, first, multiple loads and multiple pulse parameters are generated in batches, and secondly, multiple loads and multiple pulse parameters are used to combine scenarios and generate multiple simulation scenarios in batches. This not only fully considers the possible working conditions of the circuit unit, but also facilitates accurate and efficient measurement of the anti-interference degree of the circuit unit. Therefore, in this embodiment, a simulation parameter table is pre-adopted to accommodate the multiple simulation scenarios generated in batches, so that the simulation parameter table can be called during the simulation process, thereby using each parameter group in the simulation parameter table in turn to dynamically simulate the circuit model and simulate the noise pulses to which the circuit unit is subjected.

[0138] Specifically, it is necessary to pre-set the circuit model of the circuit unit and set the simulation parameter table that needs to be called during the simulation process to provide a basis for the subsequent execution of the simulation process.

[0139] S220 , based on the pulse parameter values ​​and the load values ​​in the parameter group, dynamically simulate the circuit model to obtain an output signal of the circuit model under the parameter group.

[0140] Dynamic simulation can be understood as using a simulation tool to call a simulation parameter table and continuously and repeatedly simulate the circuit model using the parameter sets within it, so that the circuit model outputs corresponding responses under different parameter sets. Dynamic simulation can provide data support for subsequent rapid determination of interference immunity.

[0141] In some cases, when measuring the interference immunity of a circuit unit, it is necessary to determine the specific performance of the circuit model when receiving a noise pulse. Furthermore, the characteristics of the circuit model's output signal can directly reflect the circuit model's response to the noise pulse. Therefore, in this embodiment, the pulse parameter values ​​and load values ​​in the parameter group are used to dynamically simulate the circuit model.

[0142] Specifically, by means of computer simulation, the pulse parameter values ​​and load values ​​in the parameter group are applied to the circuit model for simulation, and a response signal of the circuit model under the parameter group, ie, an output signal, is obtained.

[0143] S230 : Measure the anti-interference degree of the circuit unit according to the amplitude of the output signal of the circuit model.

[0144] The anti-interference degree may be the ability of a circuit unit to maintain normal operation and signal output when encountering interference from noise signals.

[0145] In some cases, a simulation parameter table includes multiple parameter groups. Each parameter group, when applied to a circuit model, yields the circuit model's output signal for each parameter group. The amplitude of the output signal reflects the circuit model's operating conditions under the simulation scenario corresponding to each parameter group. Therefore, the amplitude of the circuit model's output signal can be used to determine whether the circuit is outputting an erroneous signal, thereby measuring the circuit unit's interference immunity.

[0146] Specifically, multiple parameter groups include a current parameter group. After obtaining the output signal of the circuit unit under the current parameter group, it is determined whether the circuit unit outputs an error signal under the current parameter group according to the amplitude of the output signal. Based on the determination result, the parameters of the parameter group in the next round of simulation in the simulation parameter table are adjusted or updated. The updated parameter group is applied to the circuit model to obtain the output signal of the circuit unit under the updated parameter group. It is determined again whether the circuit unit outputs an error signal. The above steps are repeated to continue adjusting or updating the parameters of other parameter groups in the simulation parameter table until the anti-interference degree corresponding to all parameter groups in the simulation parameter table is determined.

[0147] It should be noted that during dynamic simulation using the simulation parameter table, if it is detected that the circuit unit does not output an error signal under certain pulse parameters and a certain connected load, the maximum pulse height that the circuit unit can tolerate noise is determined based on the pulse parameters, and this is used as the anti-interference degree of the circuit unit under the certain pulse parameters and a certain connected load. In other words, the maximum pulse height that the circuit unit can tolerate noise is determined based on the pulse parameters, and this is used as the anti-interference degree of the circuit unit under the certain pulse parameters and a certain connected load.

[0148] In some embodiments, the simulation process is divided into multiple rounds of simulation, and multiple simulations are performed in each round of simulation. Each round of simulation corresponds to a simulation parameter table, and the current round of simulation corresponds to the current simulation parameter table. During the current round of simulation, each parameter group in the current simulation parameter table is used to dynamically simulate the circuit model to obtain multiple output signals of the circuit model in the current round, and the output signals correspond to the parameter groups one by one. After completing the current round of simulation, any parameter group can be updated based on the amplitude of the output signal corresponding to the parameter group to obtain an updated parameter group used in the next round of simulation, forming an updated parameter table used in the next round of simulation, and the next round of simulation is performed using the updated parameter table to obtain multiple output signals of the circuit model in the next round, and so on, to complete the entire simulation process. Finally, the multiple output signals obtained in each round of simulation can be analyzed to determine the simulation round in which the circuit unit just does not output an error signal, and the anti-interference degree of the circuit unit is measured based on the pulse parameters in the parameter group corresponding to the round.

[0149] In some embodiments, the pulse parameter of the parameter group in the simulation parameter table is denoted as S, and the corresponding load is denoted as c. Any parameter group is represented as (S1, c x ), the next parameter group of any parameter group is expressed as (S2, c x Specifically, in the process of dynamic simulation using the simulation parameter table, under a certain pulse parameter (recorded as pulse parameter S1) and a certain connected load (recorded as load value c x), based on the output signal amplitude, it is detected that the circuit unit does not output an error signal; in the case of the next pulse parameter (recorded as pulse parameter S2), based on the output signal amplitude, it is detected that the circuit unit does not output an error signal; and so on. n-1 and load value c x In the case of the output signal amplitude, it is detected that the circuit unit still does not output the error signal; in the pulse parameter S n and load value c x In the case of the circuit unit outputting an error signal based on the output signal amplitude, the circuit unit outputs an error signal. n , c x ) outputs an error signal, and the parameter group (S n-1 , c x ) does not output an error signal, it can be based on the pulse parameter S n-1 Measure the anti-interference degree of the circuit unit. Further, if the pulse parameter S n-1 Including pulse area A n-1 and pulse width value W n-1 Based on the pulse area A n-1 and pulse width value W n-1 The pulse height value H is calculated as the anti-interference degree of the circuit unit. It is understood that if the pulse parameters include pulse area and pulse width values, the simulation parameter table may include a pulse area sequence, a pulse width sequence, and a load sequence. The parameter groups included in the simulation parameter table may include pulse area, pulse width, and load values.

[0150] In the above embodiment, by setting the circuit model and simulation parameter table of the circuit unit, the circuit model can be dynamically simulated based on the pulse parameter values ​​and load values ​​in the parameter group in the simulation parameter table, and the output signal of the circuit model under the parameter group can be obtained. Then, according to the amplitude of the output signal of the circuit model, the anti-interference degree of the circuit unit is measured, thereby realizing accurate and batch measurement of the anti-interference degree of the circuit unit. This anti-interference degree measurement method can cover a large number of application scenarios and has strong applicability.

[0151] In the embodiment of the present application, the pulse parameter value includes a pulse width value and a pulse height value. Figure 3 , based on the pulse parameter values ​​and load values ​​in the parameter group, dynamically simulate the circuit model to obtain the output signal of the circuit model under the parameter group, which may include:

[0152] S310 , inserting a noise pulse into the input terminal of the circuit model based on the pulse width value and the pulse height value in each parameter group.

[0153] Among them, the pulse width value represents the duration of each pulse, and the pulse height value represents the amplitude or intensity of each pulse. It can be understood that, whether it is the above_low noise type or the below_high noise type, the pulse height value can also be converted into the value corresponding to the vertex of the pulse, that is, the pulse vertex value. By selecting different pulse width values ​​and pulse height values ​​(or pulse vertex values), different noise signals can be applied to the circuit model to simulate the noise situation received by the circuit unit. Specifically, based on the pulse width value and pulse height value (or pulse vertex value) in each parameter group, a noise pulse is applied to the input end of the circuit model. Different pulse widths and pulse heights (or pulse vertex values) are used to simulate different noise signals that the circuit unit may encounter in actual applications, thereby reflecting the output response of the circuit unit under different noise signals.

[0154] S320 : Connect a load to the output end of the circuit model based on the load value in each parameter group.

[0155] In some cases, the load value directly affects the operating state of a circuit unit. Changes in load can cause changes in current and voltage, which in turn affect the unit's output signal. Therefore, when measuring interference immunity, both pulse width and connected load are considered. Specifically, if pulse noise corresponding to the pulse width and pulse height (or pulse peak value) in any parameter group intrudes at the input, the load value in that parameter group should be connected to the output.

[0156] S330 , dynamically simulate the circuit model based on the noise pulse at the input end and the load at the output end to obtain the output signal of the circuit model under each parameter group.

[0157] Specifically, the noise pulse intruding at the input and the load at the output are determined based on any parameter group in the simulation parameter table. This noise pulse and the corresponding load are then used to simulate the circuit model, yielding the output signal of the circuit model under that parameter group. Similarly, each parameter group in the simulation parameter table is simulated on the circuit model in sequence, representing a dynamic simulation, yielding the corresponding output signal of the circuit model under each parameter group.

[0158] In some embodiments, the pulse parameters include a pulse width value and a pulse height value (or a pulse peak value), and the simulation parameter table may include a pulse width sequence, a pulse height sequence (or a pulse peak sequence), and a load sequence. The parameter groups included in the simulation parameter table may include a pulse width value, a pulse height value (or a pulse peak value), and a load value. For example, the pulse width of the parameter group in the simulation parameter table is recorded as W, the corresponding pulse height is recorded as H, and the corresponding load is recorded as c. Any parameter group is represented by (Wx, H1, c x ), the next parameter group of any parameter group is expressed as (Wx, H2, cx Specifically, in the process of dynamic simulation using the simulation parameter table, at a certain pulse width (recorded as width value W x ), a certain pulse height (recorded as height value H1) and a certain connected load (recorded as load value c x ), it is detected based on the output signal amplitude that the circuit unit does not output an error signal; in the case of the same pulse width, the next pulse height (recorded as height value H2) and the same connected load, it is detected based on the output signal amplitude that the circuit unit does not output an error signal; and so on, in the case of the pulse width W x , pulse height H n-1 and load value c x In the case of the output signal amplitude, it is detected that the circuit unit still does not output the error signal; in the pulse width W x , pulse height H n and load value c x In the case of the circuit unit outputting an error signal, it is detected based on the output signal amplitude. x , H n , c x ) outputs an error signal, and the parameter group (W x , H n-1 , c x ) does not output an error signal, it can be based on the pulse height H n-1 Determine the interference immunity of circuit units.

[0159] In the above embodiment, the circuit model is operated under the simulation conditions corresponding to each parameter group in the simulation parameter table to obtain the corresponding output signal, which can comprehensively understand the response of the circuit model under various simulation conditions. Dynamic simulation of the circuit model using the simulation parameter table is implemented, thereby quickly understanding the performance of the circuit unit under different noise and load conditions, and thus efficiently and accurately evaluating the anti-interference capability of the circuit unit under various simulation conditions.

[0160] In an embodiment of the present application, before setting the simulation parameter table, the method may further include: establishing a parameter library, wherein the parameter library includes a pulse width sequence and a load sequence.

[0161] Accordingly, see Figure 4 , setting the simulation parameter table can include the following steps:

[0162] S410 , determining a pulse width value and a load value in each parameter group based on the pulse width sequence and the load sequence.

[0163] S420 , determining a pulse height value in each parameter group based on the ground voltage and the power supply voltage.

[0164] In some cases, to achieve batch anti-interference measurement, a simulation parameter table required for dynamic simulation is constructed. Furthermore, to improve the versatility of the simulation parameter table, a parameter library containing the parameters required for simulation is pre-established. This parameter library serves as the data foundation for setting up the simulation parameter table, facilitating the construction of multiple simulation scenarios to comprehensively evaluate the anti-interference capability of the circuit unit under various simulation scenarios.

[0165] Specifically, pulse width sequences and load sequences suitable for the circuit unit are set, and a corresponding parameter library is established. The pulse width sequence includes multiple pulse widths, and the load sequence includes multiple load values. The multiple pulse widths and load values ​​are permuted and combined to generate several parameter groups, each of which includes corresponding pulse width and load values. For example, the multiple pulse widths are W1, W2, and W3, and the multiple load values ​​are C1 and C2, resulting in parameter groups (W1, C1), (W2, C1), (W3, C1), (W1, C2), (W2, C2), and (W3, C2).

[0166] Furthermore, the simulation parameter table can be a set of parameters used to define the operating state of the circuit during the simulation process. In addition to the pulse width sequence and the load sequence, the simulation parameter table also includes a pulse height sequence (or pulse vertex sequence). To ensure that the voltage range during the simulation matches the actual application conditions, the pulse height values ​​in the pulse height sequence are set based on the ground voltage and the power supply voltage (or the pulse vertex values ​​in the pulse vertex sequence are set based on the ground voltage and the power supply voltage). For example, the pulse height values ​​(or pulse vertex values) are set between the ground voltage and the power supply voltage.

[0167] In the above embodiment, the pulse width value and load value in each parameter group are determined through a pre-constructed parameter library, and the corresponding pulse height value (or pulse peak value) is determined according to the ground voltage and the power supply voltage, so as to realize the construction of a simulation parameter table, which is conducive to determining various simulation scenarios and providing a data basis for constructing various simulation scenarios in subsequent simulation processes, so as to improve the comprehensiveness of the anti-interference measurement.

[0168] In the examples of this application, please refer to Figure 5 , determining the pulse height value in each parameter group based on the ground voltage and the power supply voltage may include the following steps:

[0169] S510 : For the first round of simulation, determine the pulse height value of each parameter group in the first round in the ground voltage and the power supply voltage according to the noise signal type of the noise pulse.

[0170] Among them, the simulation of the first round and any round thereafter is recorded as the simulation of the current round. Among them, the noise signal type of the noise pulse can be a noise type higher than the ground voltage GND (recorded as above_low) or a noise type lower than the power supply voltage VDD (recorded as below_high). It can be understood that the pulse height value can be understood as the relative difference between the voltage corresponding to the pulse waveform vertex and the voltage corresponding to the pulse starting point, or in other words, the pulse height value can be understood as the difference between the voltage value corresponding to the pulse waveform vertex and the voltage value corresponding to the pulse starting point. For the above_low noise type, the pulse height value can be the amplitude of the pulse waveform vertex of this type, or recorded as the pulse vertex value. For the below_high noise type, the pulse height value can also be further converted into the pulse waveform vertex value of this type, or recorded as the pulse vertex value.

[0171] Specifically, for the first round of simulation, the simulation parameter table used is denoted as the first-round simulation parameter table. If the noise signal type of the noise pulse is the above_low noise type, the pulse height value of each parameter group in the first-round simulation parameter table is set to the power supply voltage. If the noise signal type of the noise pulse is the below_high noise type, the pulse peak value of each parameter group in the first-round simulation parameter table is set to the ground voltage.

[0172] S520 : For at least some parameter groups in the simulation parameter table, set a designated high voltage value and a designated low voltage value to be used in the next round of the current round.

[0173] The specified high voltage value can be the upper limit of the voltage range used to adjust the pulse height value (or pulse apex value) in the next round, and the specified low voltage value can be the lower limit of the voltage range used to adjust the pulse height value (or pulse apex value) in the next round. The specified high voltage value and the specified low voltage value can also be set values ​​or specific values ​​used to adjust the pulse height value (or pulse apex value) during the simulation process. The specified high voltage value and the specified low voltage value can be set based on the simulation results of the previous round.

[0174] Specifically, after the first round of simulation, if the corresponding anti-interference degree has been determined for some parameter groups in the simulation parameter table, that is, it is no longer necessary to simulate these parameter groups in the subsequent simulation process, then these parameter groups are removed from the simulation parameter table. In addition, after the first round of simulation, for the remaining parameter groups in the simulation parameter table, the specified high voltage value and the specified low voltage value used in the next round of the first round are set. If the current round is not the first round, for the next round that is not the first round, if the anti-interference degree corresponding to any parameter group is not determined in the current round, then for each parameter group in the simulation parameter table, the specified high voltage value and the specified low voltage value in the next round are set, so as to provide an accurate voltage range for the subsequent round of simulation, which is conducive to setting a pulse height value that is more suitable for the circuit unit.

[0175] S530 , using the specified high voltage value and the specified low voltage value, setting the pulse height value of at least part of the parameter groups in the simulation parameter table in the next round.

[0176] In some cases, after a current simulation round, in order to obtain a more comprehensive evaluation of the circuit unit's anti-interference performance, it is necessary to update the pulse height values ​​in the simulation parameter table so that the circuit unit's anti-interference performance can be quickly and accurately measured in subsequent simulation rounds. Specifically, for any parameter group in at least some of the parameter groups in the simulation parameter table, an appropriate voltage value within a range of a specified high voltage value and a specified low voltage value is selected as the pulse height value for that parameter group in the next round.

[0177] In this embodiment, the intermediate value between the specified high voltage value and the specified low voltage value can be calculated, and the intermediate value can be directly used as the pulse height value of any parameter group in the next round; or the intermediate value can be fine-tuned, and the fine-tuned intermediate value can be used as the pulse height value of any parameter group in the next round.

[0178] In the above embodiment, in the first simulation round, the pulse height value for each parameter group is set by comprehensively considering the noise signal type, ground voltage, and power supply voltage of the noise pulse. After the subsequent simulation round, the pulse height value for the next round is adjusted using the specified high voltage value and the specified low voltage value, thereby improving simulation efficiency and facilitating the rapid and accurate determination of the interference immunity of the circuit unit.

[0179] In the examples of this application, please refer to Figure 6 , for at least some parameter groups in the simulation parameter table, setting the specified high voltage value and the specified low voltage value to be used in the next round after the current round may include:

[0180] S610. In the first round of simulation, for each parameter group in the simulation parameter table, a specified high voltage value to be used by each parameter group in the next round after the first round is set based on the power supply voltage, and a specified low voltage value to be used by each parameter group in the next round after the first round is set based on the ground voltage.

[0181] Specifically, to provide more accurate pulse height values ​​for the next round of simulation, when performing the first round of simulation, regardless of whether the noise type is above_low or below_high, the specified high voltage value of each parameter group in the next round after the first round is set to the power supply voltage. The specified low voltage value of each parameter group in the next round after the first round is set to the ground voltage.

[0182] S620. In any round of simulation after the first round, for some parameter groups in the simulation parameter table, set the specified high voltage value and the specified low voltage value used by some parameter groups in the simulation parameter table in the next round of the current round according to the noise signal type and the amplitude of the output signal in the current round.

[0183] In this embodiment, during the simulation process of the current round after the first round, when setting the designated high voltage value and the designated low voltage value for the next round, not only the noise signal type is considered, but also the output of the error signal in the current round under any parameter set. The pulse height value in the current round under any parameter set is recorded as the current voltage value. The first preset noise type can be the below_high noise type. The second preset noise type can be the above_low noise type.

[0184] If the noise signal type is the first preset noise type, and the circuit model is determined to output an error signal under the first parameter group based on the amplitude of the output signal in the current round, the specified low voltage value of the current round is updated using the current voltage value to obtain the specified low voltage value of the next round, and the specified high voltage value of the current round is kept unchanged in the next round.

[0185] If the noise signal type is the first preset noise type, and the circuit model is determined to have not output an error signal under the second parameter group based on the amplitude of the output signal in the current round, the specified high voltage value of the current round is updated using the current voltage value to obtain the specified high voltage value of the next round, and the specified low voltage value of the current round is kept unchanged in the next round.

[0186] If the noise signal type is the second preset noise type, and the circuit model is determined to output an error signal under the third parameter group based on the amplitude of the output signal in the current round, the specified high voltage value of the current round is updated using the current voltage value to obtain the specified high voltage value of the next round, and the specified low voltage value of the current round is kept unchanged in the next round.

[0187] If the noise signal type is the second preset noise type, and the circuit model is determined to have not output an error signal under the fourth parameter group based on the amplitude of the output signal in the current round, the specified low voltage value of the current round is updated using the current voltage value to obtain the specified low voltage value of the next round, and the specified high voltage value of the current round is kept unchanged in the next round.

[0188] In the above embodiment, according to the noise signal type and the output characteristics of the output signal in the current round, the specified high voltage value and the specified low voltage value of some parameter groups in the simulation parameter table are set in the next round of the current round to obtain an accurate voltage adjustment range, which provides a data basis for dynamically adjusting the pulse height value and improves the accuracy of dynamic simulation.

[0189] In an embodiment of the present application, the anti-interference degree measurement method may further include: if the anti-interference degree of the circuit unit under some parameter groups has been measured in the current round, deleting the measured some parameter groups from the simulation parameter table to update the simulation parameter table.

[0190] In some cases, if the anti-interference performance of a circuit unit under a certain parameter set has been measured and this parameter set is retained in the simulation parameter table, the next simulation cycle will require re-simulating this parameter set, resulting in unnecessary calculations. Therefore, if the anti-interference performance of a circuit unit under a certain parameter set has been measured in the current cycle, the simulation parameter table is updated to make subsequent simulations more efficient and focus on the unmeasured parameter sets. Specifically, the measured parameter sets are deleted from the simulation parameter table, while the unmeasured parameter sets are retained in the simulation parameter table.

[0191] In the above embodiment, after each round of simulation, an analysis is performed on whether the parameter group has been measured for anti-interference performance, and the simulation parameter table is dynamically updated based on the analysis results to reduce redundant data in the simulation parameter table and provide a simulation parameter table with a more accurate range for subsequent simulations, which can not only optimize the simulation process but also improve simulation efficiency.

[0192] In an embodiment of the present application, the anti-interference degree of the circuit unit is determined based on the amplitude of the output signal of the circuit model, including: in the first round of simulation, if no error signal is detected based on the amplitude of the output signal in the first round, the anti-interference degree of the circuit unit is determined using the current voltage value in the parameter group corresponding to the last time that the circuit model did not output an error signal.

[0193] Specifically, in the first round of simulation, if the output signal amplitude in the first round meets the error-free signal detection condition, it indicates that no error signal was detected. The target parameter set corresponding to the last time the circuit model did not output an error signal is determined, and the current voltage value in this target parameter set is used to measure the circuit unit's anti-interference performance.

[0194] Furthermore, if the noise signal type is below_high noise type, the difference between the power supply voltage and the current voltage value in the target parameter group is set as the anti-interference degree. If the noise signal type is above_low noise type, the current voltage value in the target parameter group is set as the anti-interference degree.

[0195] In an embodiment of the present application, determining the interference immunity of a circuit unit based on the amplitude of an output signal of a circuit model includes: in any simulation round after the first round, detecting whether an error signal exists based on the amplitude of the output signal in any round to detect a first designated signal. Determining the interference immunity of the circuit unit using the current voltage value in the first target parameter group corresponding to the first designated signal. The first designated signal is the last pulse signal that did not cause the circuit model to output an error signal.

[0196] Specifically, in any subsequent simulation rounds, the output signal amplitude in any round is determined to meet the error signal detection criteria. This determines the last pulse signal that did not cause the circuit model to output an error signal, which is recorded as the first designated signal. Next, a first target parameter set corresponding to the first designated signal is determined, and the current voltage value in the first target parameter set is used to measure the circuit unit's interference immunity.

[0197] Furthermore, if the noise signal type is below_high noise type, the difference between the power supply voltage and the current voltage value in the target parameter group is set as the anti-interference degree. If the noise signal type is above_low noise type, the current voltage value in the target parameter group is set as the anti-interference degree.

[0198] In the embodiments of this application, please refer to Figure 7 , determining the pulse height value in each parameter group based on the ground voltage and the power supply voltage may include:

[0199] S710 , performing data division between the ground voltage and the power supply voltage using a preset data division method to obtain a preset voltage value set.

[0200] The preset data division method includes any one of a uniform division method, a logarithmic function division method, and a device characteristic division method. The uniform division method may refer to evenly dividing the voltage range between the ground voltage and the power supply voltage into multiple equal-width intervals. The logarithmic function division method may divide the voltage range based on a logarithmic function, which is generally applicable to situations where voltage changes show a logarithmic relationship. The device characteristic division method may divide the voltage range based on the electrical characteristics of a specific device to more accurately reflect the requirements of the circuit unit.

[0201] Specifically, the voltage range between the ground voltage and the power supply voltage is divided into multiple intervals, and then a preset voltage value set is generated to provide a data basis for the subsequent setting of the pulse height sequence (or pulse vertex sequence) in the simulation parameter table. The data division method can be selected according to different application requirements, thereby affecting the setting of the pulse height value in the pulse height sequence (or the setting of the pulse vertex value in the pulse vertex sequence). For example, if the uniform division method is selected, the range between the ground voltage and the power supply voltage will be evenly divided into several identical intervals. If the logarithmic function division method is selected, the divided intervals will be allocated according to the logarithmic relationship, so as to better reflect the nonlinear characteristics of the voltage change. The formation of the preset voltage value set is the basis for subsequent operations, ensuring that the pulse height value (or pulse vertex value) is selected within a reasonable voltage range to fill the pulse height sequence (or pulse vertex sequence) in the simulation parameter table.

[0202] It should be noted that for the above_low noise type, the pulse height value can be the amplitude of the peak of the pulse waveform of this type, or recorded as the pulse peak value. For the below_high noise type, the pulse height value can also be further converted to the peak value of the pulse waveform of this type, or recorded as the pulse peak value. Therefore, the pulse height sequence can also be recorded as the pulse peak sequence.

[0203] S720 , sequentially read each preset voltage value in the preset voltage value set, and set each read preset voltage value as a pulse height value in each parameter group.

[0204] Specifically, by reading each preset voltage value in the preset voltage value set, each pulse height value (or pulse apex value) is determined one by one, thereby completing the setting process of the pulse height value (or pulse apex value). Through this process, the preset voltage value obtained by dividing between the ground voltage and the power supply voltage can be mapped to a specific pulse height value (or pulse apex value). Exemplarily, if the preset voltage value set includes N preset voltage values, the preset voltage values ​​are read N times from the preset voltage value set. Each time a preset voltage value is read, the values ​​of the pulse height sequence (or pulse apex sequence) in the simulation parameter table are set to the preset voltage value read that time.

[0205] In the above embodiment, a set of preset voltage values ​​is obtained by dividing data between the ground voltage and the power supply voltage, and a pulse height value (or pulse vertex value) in the simulation parameter table is set based on each preset voltage value in the preset voltage value set, and a simulation parameter table is generated in batch form, and dynamic batch measurement of the degree of anti-interference is achieved through the simulation parameter table.

[0206] In the embodiments of this application, please refer to Figure 8 After setting each preset voltage value read as the pulse height value (or pulse peak value) in each parameter group, the corresponding simulation parameter table is recorded as the current simulation parameter table.

[0207] Based on the pulse parameter values ​​and load values ​​in the parameter group, the circuit model is dynamically simulated to obtain the output signal of the circuit model under the parameter group, including:

[0208] S810 , dynamically simulate the circuit model using the preset voltage value, pulse width value, and load value in each parameter group in the current simulation parameter table to obtain an output signal of the circuit model under each parameter group.

[0209] Specifically, after setting each read preset voltage value as the pulse height value (or pulse apex value) in each parameter group, the corresponding simulation parameter table is recorded as the current simulation parameter table. Each parameter group in the current simulation parameter table includes a preset voltage value, a pulse width value, and a load value. Based on the preset voltage and pulse width values, a noise pulse is injected into the input of the circuit model. Based on the load value, a load is connected to the output of the circuit model. The circuit model is dynamically simulated based on the noise pulse and the load to obtain the output signal of the circuit model under each parameter group.

[0210] Accordingly, the anti-interference degree of the circuit unit is determined according to the amplitude of the output signal of the circuit model, including:

[0211] S820: If a second designated signal is detected according to the amplitude of the output signal of the circuit model under each parameter group in the current simulation parameter table, the anti-interference degree of the circuit unit is measured using the preset voltage value in the second target parameter group corresponding to the second designated signal.

[0212] Specifically, the system checks whether the current parameter group is the last parameter group in the current simulation parameter table. If so, it indicates that all parameter groups in the current simulation parameter table have completed simulation. The system then obtains the output signal for each parameter group in the current simulation parameter table. The system then determines the presence of an error signal based on the amplitude of the output signal. The circuit unit's anti-interference capability is then measured based on the noise signal type of the noise pulse and the preset voltage value in the parameter group corresponding to the error signal.

[0213] In this embodiment, simulation is performed from smallest to largest pulse peak value. If the noise signal type of the noise pulse is the below_high noise type, a second designated signal is determined that does not cause the circuit model to output an error signal for the first time during the simulation process corresponding to the current simulation parameter table. Furthermore, the preset voltage value corresponding to the second designated signal is recorded, and the difference between the power supply voltage and the preset voltage value corresponding to the second designated signal is set as the interference immunity level.

[0214] In this embodiment, if the noise signal type of the noise pulse is the above_low noise type, a second designated error signal that did not cause the circuit model to output an error signal for the last time during the simulation process corresponding to the current simulation parameter table is determined. Furthermore, a preset voltage value corresponding to the second designated error signal is recorded, and the preset voltage value corresponding to the second designated error signal is set as the interference rejection level.

[0215] In the above embodiment, the circuit model is dynamically simulated using the current simulation parameter table to obtain multiple output signals of the circuit model under multiple parameter groups, providing a data basis for batch anti-interference measurement. Furthermore, the current simulation parameter table includes pulse width and load values, which improves the accuracy of anti-interference measurement.

[0216] In an embodiment of the present application, whether the circuit model outputs an error signal is determined in the following manner: if an event / moment at which the amplitude of the output signal reaches a first preset amplitude threshold is dynamically detected, the circuit model is determined to output an error signal; or, if after a preset detection time, the amplitude of the output signal relative to the reference signal is detected to reach a second preset amplitude threshold, the circuit model is determined to output an error signal.

[0217] The second preset amplitude threshold is equal to or different from the first preset amplitude threshold. The first preset amplitude threshold can be a specified percentage of the power supply voltage, such as 30% × VDD. The second preset amplitude threshold can also be a specified percentage of the power supply voltage, such as 30% × VDD. The reference signal can be the output signal of the circuit model at an initial moment. The amplitude of the output signal relative to the reference signal is determined. The preset detection time can be a predetermined necessary detection time.

[0218] Specifically, if an event / moment at which the amplitude of the output signal of the circuit model reaches a first preset amplitude threshold is detected, it is determined that the circuit model outputs an error signal. If an event / moment at which the amplitude of the output signal of the circuit model reaches the first preset amplitude threshold is not detected, it is determined that the circuit model does not output an error signal. Alternatively, if after a preset detection time, it is detected that the amplitude change of the output signal relative to the reference signal reaches a second preset amplitude threshold, it is determined that the circuit model outputs an error signal. If after a preset detection time, it is not detected that the amplitude change of the output signal relative to the reference signal reaches the second preset amplitude threshold, it is determined that the circuit model does not output an error signal. A method for determining whether a circuit unit has failed is implemented in the above embodiment, which is beneficial to the subsequent determination of anti-interference degree.

[0219] This application embodiment provides a method for solving the anti-interference degree. Figure 9 , the method may include:

[0220] S910 , determining a noise pulse width at an input end of a circuit unit and an actual load value at an output end of the circuit unit.

[0221] S920: Obtain an anti-interference record table suitable for the circuit unit.

[0222] S930 , using the correspondence between the pulse width, the load value, and the anti-interference degree in the anti-interference degree record table, and performing a solution according to the noise pulse width and the actual load value, to obtain the anti-interference degree of the circuit unit.

[0223] The anti-interference degree record table can be obtained by the anti-interference degree measurement method in any of the above embodiments, or by other methods. The anti-interference degree record table stores the corresponding relationship between the pulse width, the load value and the anti-interference degree.

[0224] Specifically, in practical applications, the noise pulse width at the input and the actual load value at the output are first determined. A table of interference immunity values ​​appropriate for the circuit unit is then obtained. Next, the noise pulse width and actual load values ​​are searched for in the table to obtain a search result. Based on the search result, the noise pulse width and actual load values ​​are then solved to determine the interference immunity of the circuit unit.

[0225] In the above embodiment, the anti-interference degree of the circuit unit is obtained by combining the noise pulse width at the input end of the circuit unit and the actual load value at the output end of the circuit unit with the anti-interference degree record table, and solving according to the noise pulse width and the actual load value, thereby realizing efficient determination of the anti-interference degree, and providing chip designers with an efficient and high-precision method for determining the anti-interference degree.

[0226] In an embodiment of the present application, the correspondence between the pulse width, load value and anti-interference degree in the anti-interference degree recording table is utilized, and a solution is performed according to the noise pulse width and the actual load value to obtain the anti-interference degree of the circuit unit, including: if the noise pulse width and the actual load value match the anti-interference degree in the anti-interference degree recording table, the matched anti-interference degree is read from the anti-interference degree recording table as the anti-interference degree of the circuit unit; or, if the noise pulse width and the actual load value do not match the anti-interference degree in the anti-interference degree recording table, the adjacent anti-interference degree is read from the anti-interference degree recording table, and interpolation processing is performed based on the adjacent anti-interference degrees to obtain the anti-interference degree of the circuit unit.

[0227] Interpolation can be performed using linear interpolation (e.g., two-dimensional linear interpolation) or polynomial interpolation. Different interpolation methods are suitable for different scenarios, and the selection of an interpolation method should take into account data characteristics, computational efficiency, and accuracy requirements.

[0228] Specifically, if the noise pulse width and actual load value exist in the anti-interference record table, the noise pulse width and actual load value can be matched to the anti-interference level in the anti-interference record table, and the matched anti-interference level is used as the anti-interference level of the circuit unit. If the noise pulse width and actual load value do not exist in the anti-interference record table, adjacent anti-interference levels are read from the anti-interference record table and interpolated using the adjacent anti-interference levels to obtain the anti-interference level of the circuit unit.

[0229] In the above embodiment, an interpolation method is used to dynamically generate the corresponding anti-interference degree for a second time. This method has the characteristics of high efficiency and strong versatility.

[0230] The present invention provides an anti-interference degree measuring device 1000. Figure 10 , the measuring device 1000 may include:

[0231] A model parameter table setting module 1010 is used to set a circuit model and a simulation parameter table for a circuit unit; wherein the simulation parameter table includes a plurality of parameter groups; wherein the parameter groups include pulse parameter values ​​and load values, wherein the pulse parameter values ​​are used to describe the simulated noise waveform at the input end of the circuit model, and the load values ​​are used to describe the simulated load connected to the output end of the circuit model;

[0232] The parameter load simulation module 1020 is used to dynamically simulate the circuit model based on the pulse parameter value and the load value in the parameter group to obtain the output signal of the circuit model under the parameter group;

[0233] The anti-interference degree measuring module 1030 is used to measure the anti-interference degree of the circuit unit according to the amplitude of the output signal of the circuit model.

[0234] In the embodiment of the present application, an anti-interference degree solving device 1100 is provided. Figure 11 , the solving device 1100 may include:

[0235] A width load determination module 1110 is configured to determine a noise pulse width at an input end of a circuit unit and an actual load value at an output end of the circuit unit;

[0236] A record table acquisition module 1120 is used to acquire an anti-interference record table suitable for the circuit unit;

[0237] The anti-interference degree solving module 1130 is used to solve the noise pulse width and the actual load value by using the correspondence between the pulse width, the load value and the anti-interference degree in the anti-interference degree record table to obtain the anti-interference degree of the circuit unit.

[0238] The further functional description of each of the above modules is the same as that of the above corresponding method embodiments and will not be repeated here.

[0239] The measuring device or solving device in this embodiment is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, and / or other devices that can provide the above functions.

[0240] See also Figure 12 , Figure 121 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application, the computer device comprising: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. The various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process instructions executed in the computer device, including instructions stored in or on the memory to display graphical information of the GUI on an external input / output device (such as a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Figure 12 A processor 10 is taken as an example.

[0241] The processor 10 may be a central processing unit, a network processor, or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be an application-specific integrated circuit, a programmable logic device, or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic, or any combination thereof.

[0242] The memory 20 stores instructions that can be executed by at least one processor 10, so that the at least one processor 10 executes the method shown in the above embodiment.

[0243] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and application programs required for at least one function; the data storage area may store data created based on the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely located relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0244] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid-state drive; the memory 20 may also include a combination of the above types of memory.

[0245] The computer device further includes an input device 30 and an output device 40. The processor 10, the memory 20, the input device 30 and the output device 40 may be connected via a bus or other means.

[0246] The input device 30 can receive input digital or character information and generate key signal input related to user settings and function control of the computer device. Examples include a touch screen, keypad, mouse, trackpad, touchpad, pointing stick, one or more mouse buttons, trackball, joystick, etc. The output device 40 may include a display device, auxiliary lighting devices (e.g., LEDs), and tactile feedback devices (e.g., vibration motors). Such display devices include, but are not limited to, liquid crystal displays, light emitting diodes, monitors, and plasma displays. In some optional embodiments, the display device may be a touch screen.

[0247] The embodiments of the present application also provide a computer-readable storage medium. The above-mentioned method according to the embodiment of the present application can be implemented in hardware, firmware, or implemented as a computer code that can be recorded in a storage medium, or implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and downloaded through a network and will be stored in a local storage medium, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state drive, etc.; further, the storage medium can also include a combination of the above-mentioned types of memory. It can be understood that a computer, a processor, a microprocessor controller or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor or hardware, the method shown in the above embodiment is implemented.

[0248] An embodiment of the present application provides a computer program product, which includes computer instructions stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the computer device to perform a method according to any embodiment of the present application.

[0249] Although the embodiments of the present application have been described with reference to the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations shall fall within the scope defined by the appended claims.

[0250] The systems, devices, modules, or units described in the above embodiments may be implemented by computer chips or entities, or by products having certain functions. A typical implementation device is a computer. Specifically, the computer may be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0251] For the convenience of description, the above devices are described as being divided into various units according to their functions. Of course, when implementing this application, the functions of each unit can be implemented in the same or multiple software and / or hardware.

[0252] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware. Furthermore, the present application may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0253] This application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate a device for implementing the functions specified in one or more processes in the flowchart and / or one or more blocks in the block diagram.

[0254] These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce a product including an instruction device that implements the functions specified in one or more processes in the flowchart and / or one or more boxes in the block diagram.

[0255] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, so that the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one or more processes in the flowchart and / or one or more boxes in the block diagram.

[0256] It should also be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, commodity, or apparatus that includes a series of elements includes not only those elements but also other elements not explicitly listed, or includes elements inherent to such process, method, commodity, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not exclude the presence of other identical elements in the process, method, commodity, or apparatus that includes the element.

[0257] The various embodiments in this specification are described in a progressive manner. Similar parts between the various embodiments can be referred to in conjunction with each other. Each embodiment focuses on the differences between the other embodiments. In particular, the system embodiments are generally similar to the method embodiments, so the description is relatively simple. For relevant parts, refer to the description of the method embodiments.

[0258] The foregoing is merely an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should all be included within the scope of the claims of the present application.

[0259] Although the embodiments of the present application have been described with reference to the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations shall fall within the scope defined by the appended claims.

Claims

1. A method for measuring anti-interference, characterized in that: The method comprises: Setting a circuit model and a simulation parameter table for a circuit unit; wherein the simulation parameter table includes a plurality of parameter groups; wherein the simulation parameter table is used to accommodate a plurality of simulation scenarios generated in batches, wherein the plurality of simulation scenarios are generated in batches by combining scenarios using a plurality of loads and a plurality of pulse parameters; the parameter groups include pulse parameter values ​​and load values, wherein the pulse parameter values ​​are used to describe a simulated noise waveform at an input end of the circuit model, and the load values ​​are used to describe a simulated load connected to an output end of the circuit model; Based on the pulse parameter values ​​and load values ​​in the parameter group, dynamically simulate the circuit model to obtain an output signal of the circuit model under the parameter group; Determining the anti-interference performance of the circuit unit according to the amplitude of the output signal of the circuit model; wherein the anti-interference performance is determined while taking into account both load and pulse parameters; Wherein, the pulse parameter value includes a pulse height value; the pulse height value is determined in the following manner, including: for the first round of simulation, according to the noise signal type of the noise pulse, determining the pulse height value of each parameter group in the first round in the ground voltage and the power supply voltage; wherein, the simulation of the first round and any round thereafter is recorded as the simulation of the current round; for at least some parameter groups in the simulation parameter table, setting the specified high voltage value and the specified low voltage value used in the next round of the current round, and using the specified high voltage value and the specified low voltage value to set the pulse height value of at least some parameter groups in the simulation parameter table in the next round.

2. The method according to claim 1, characterized in that The pulse parameter value also includes a pulse width value; and the dynamically simulating the circuit model based on the pulse parameter value and the load value in the parameter group to obtain the output signal of the circuit model under the parameter group includes: inserting a noise pulse at an input of the circuit model based on the pulse width value and the pulse height value in each parameter group; connecting a load to an output terminal of the circuit model based on the load value in each parameter group; The circuit model is dynamically simulated based on the noise pulse at the input end and the load at the output end to obtain an output signal of the circuit model under each parameter group.

3. The method according to claim 2, characterized in that Before setting the simulation parameter table, the method further includes: Establish a parameter library; wherein, the parameter library includes a pulse width sequence and a load sequence; wherein, The pulse width value and the load value in each parameter group are determined based on the pulse width sequence and the load sequence.

4. The method according to claim 1, wherein The step of setting the designated high voltage value and the designated low voltage value to be used in the next round after the current round for at least part of the parameter groups in the simulation parameter table includes: In the first round of simulation, for each parameter group in the simulation parameter table, setting a specified high voltage value used by each parameter group in a next round of the first round based on the power supply voltage, and setting a specified low voltage value used by each parameter group in a next round of the first round based on the ground voltage; In any round of simulation after the first round, for some parameter groups in the simulation parameter table, the specified high voltage value and the specified low voltage value used by some parameter groups in the simulation parameter table in the next round of the current round are set according to the noise signal type and the amplitude of the output signal in the current round.

5. The method according to claim 4, characterized in that The pulse height value in the current round in the parameter group is recorded as the current voltage value; and the setting of the specified high voltage value and the specified low voltage value in the next round of the current round of some parameter groups in the simulation parameter table according to the noise signal type and the amplitude of the output signal in the current round includes any one of the following situations: If the noise signal type is a first preset noise type, and it is determined based on the amplitude of the output signal in the current round that the circuit model outputs an error signal under the first parameter set, the designated low voltage value of the current round is updated using the current voltage value to obtain the designated low voltage value of the next round, and the designated high voltage value of the current round is maintained unchanged in the next round; If the noise signal type is the first preset noise type, and it is determined based on the amplitude of the output signal in the current round that the circuit model does not output an error signal under the second parameter set, the designated high voltage value of the current round is updated using the current voltage value to obtain the designated high voltage value of the next round, and the designated low voltage value of the current round is maintained unchanged in the next round; If the noise signal type is the second preset noise type, and it is determined based on the amplitude of the output signal in the current round that the circuit model outputs an error signal under the third parameter set, the designated high voltage value of the current round is updated using the current voltage value to obtain the designated high voltage value of the next round, and the designated low voltage value of the current round is maintained unchanged in the next round; If the noise signal type is the second preset noise type, and it is determined based on the amplitude of the output signal in the current round that the circuit model does not output an error signal under the fourth parameter group, the current voltage value is used to update the specified low voltage value of the current round to obtain the specified low voltage value of the next round, and the specified high voltage value of the current round is maintained unchanged in the next round.

6. The method according to claim 5, characterized in that The method further comprises: If the anti-interference degree of the circuit unit under some parameter groups has been measured in the current round, the measured some parameter groups are deleted from the simulation parameter table to update the simulation parameter table.

7. The method according to claim 5, characterized in that Determining the anti-interference degree of the circuit unit according to the amplitude of the output signal of the circuit model includes at least one of the following situations: In the first round of simulation, if no error signal is detected based on the amplitude of the output signal in the first round, the anti-interference degree of the circuit unit is measured using the current voltage value in the parameter group corresponding to the last time that the circuit model did not output the error signal; In any round of simulation after the first round, whether there is an error signal is detected based on the amplitude of the output signal in any round to detect the first designated signal; the anti-interference degree of the circuit unit is measured using the current voltage value in the first target parameter group corresponding to the first designated signal; wherein, the first designated signal is the pulse signal that did not cause the circuit model to output an error signal for the last time.

8. The method according to claim 7, characterized in that If the noise signal type is a first preset noise type, setting the difference between the power supply voltage and the current voltage value in the first target parameter group as the anti-interference degree; or If the noise signal type is the second preset noise type, the current voltage value in the first target parameter group is set as the anti-interference degree.

9. The method according to any one of claims 1 to 8, characterized in that The step of setting the pulse height values ​​of at least part of the parameter groups in the simulation parameter table in the next round by using the specified high voltage value and the specified low voltage value includes: An intermediate value between the designated high voltage value and the designated low voltage value is determined as a pulse height value of at least part of the parameter groups in the simulation parameter table in the next round.

10. The method according to claim 1, characterized in that The method of determining the pulse height value in each of the parameter groups further includes: Performing data division between the ground voltage and the power supply voltage using a preset data division method to obtain a preset voltage value set; wherein the preset data division method includes any one of a uniform division method, a logarithmic function division method, and a device characteristic division method; Each preset voltage value in the preset voltage value set is read in sequence, and each of the read preset voltage values ​​is set as the pulse height value in each of the parameter groups.

11. The method according to claim 10, characterized in that After setting each of the read preset voltage values ​​as the pulse height value in each of the parameter groups, the corresponding simulation parameter table is recorded as the current simulation parameter table; The dynamically simulating the circuit model based on the pulse parameter value and the load value in the parameter group to obtain the output signal of the circuit model under the parameter group includes: Dynamically simulating the circuit model using the preset voltage value, pulse width value, and load value in each parameter group in the current simulation parameter table to obtain an output signal of the circuit model under each parameter group; Correspondingly, the measuring the anti-interference degree of the circuit unit according to the amplitude of the output signal of the circuit model includes: If a second designated signal is detected according to the amplitude of the output signal of the circuit model under each parameter group in the current simulation parameter table, the anti-interference degree of the circuit unit is determined using the preset voltage value in the second target parameter group corresponding to the second designated signal.

12. The method according to claim 11, characterized in that If the noise signal type of the noise pulse is a first preset noise type, the second designated signal is a pulse signal that does not cause the circuit model to output an error signal for the first time during the simulation process corresponding to the current simulation parameter table; or If the noise signal type of the noise pulse is a second preset noise type, the second designated signal is a pulse signal that did not cause the circuit model to output an error signal for the last time during the simulation process corresponding to the current simulation parameter table.

13. The method according to claim 12, characterized in that If the noise signal type of the noise pulse is a first preset noise type, setting the difference between the power supply voltage and a preset voltage value corresponding to the second designated signal as the anti-interference degree; or If the noise signal type of the noise pulse is a second preset noise type, a preset voltage value corresponding to the second designated signal is set as the anti-interference degree.

14. The method according to claim 5 or 12, characterized in that Whether the circuit model outputs an error signal is determined by the following method: If it is dynamically detected that the amplitude of the output signal reaches a first preset amplitude threshold, it is determined that the circuit model outputs an error signal; or If it is detected after a preset detection time that the change amplitude of the output signal relative to the reference signal reaches a second preset amplitude threshold, it is determined that the circuit model outputs an error signal; wherein the second preset amplitude threshold is equal to or different from the first preset amplitude threshold.

15. A method for solving anti-interference degree, characterized in that: The method comprises: determining a noise pulse width at an input end of a circuit unit and an actual load value at an output end of the circuit unit; Obtaining an anti-interference degree record table suitable for the circuit unit; wherein the anti-interference degree record table stores a correspondence between pulse width, load value, and anti-interference degree; the anti-interference degree in the anti-interference degree record table is obtained by the method according to any one of claims 1 to 14; The anti-interference degree of the circuit unit is obtained by using the corresponding relationship between the pulse width, the load value and the anti-interference degree in the anti-interference degree record table and performing a solution according to the noise pulse width and the actual load value.

16. The method according to claim 15, characterized in that The method of utilizing the correspondence between the pulse width, the load value, and the anti-interference degree in the anti-interference degree record table and solving the problem according to the noise pulse width and the actual load value to obtain the anti-interference degree of the circuit unit includes: If the noise pulse width and the actual load value match the anti-interference level in the anti-interference level record table, read the matched anti-interference level from the anti-interference level record table as the anti-interference level of the circuit unit; or If the noise pulse width and the actual load value do not match the anti-interference degree in the anti-interference degree record table, adjacent anti-interference degrees are read from the anti-interference degree record table, and interpolation processing is performed based on the adjacent anti-interference degrees to obtain the anti-interference degree of the circuit unit.

17. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the method according to any one of claims 1 to 15 by executing the computer instructions.

18. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute the method according to any one of claims 1 to 15.

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