Storage device test method and test system and storage medium

Abstract

The invention provides a storage device testing method and system and a storage medium. The testing method comprises the steps that at least one miniature mainboard is connected with an upper computer and a plurality of to-be-tested storage devices, and the upper computer loads a first number of drive programs after connection is established; the miniature mainboard loads a second number of driving programs, wherein the second number is smaller than the first number; and the miniature mainboard obtains the test instruction, tests the connected storage device according to the test instruction, and transmits a test result to the upper computer. Related processes executed by the upper computer in a traditional test process are shared by the miniature mainboard, and compared with a control system carried by the upper computer, a system carried by the miniature mainboard can be simpler, so that the restarting speed of the system is higher than that of the control system of the upper computer, and the test efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of storage device testing, and particularly to a storage device testing method, a testing system, and a storage medium. Background Art

[0002] A solid state drive (SSD) is a hard disk made of a solid state electronic storage chip array, usually composed of a control unit and a storage unit (such as a FLASH chip, a DRAM chip). Before the SSD is shipped, it needs to go through a series of tests to verify whether its actual performance is qualified, and after confirmation, it enters the market for sale for users to use.

[0003] Currently, for a solid state drive using a PCIE (Peripheral Component Interconnect Express) interface, in order to simulate its operation condition when running on a host computer (usually implemented as a PC in the actual scenario), the solid state drive is inserted into the PCIE interface slot of the host computer to establish a communication connection between the two, and then the host computer tests the solid state drive. After each solid state drive is tested in this way, it is necessary to restart the operating system of the host computer. Since the operating system of the host computer is relatively complex, the restart takes a long time, resulting in low overall test efficiency. Summary of the Invention

[0004] In view of this, the present application provides a storage device testing method, a testing system, and a storage medium, which can improve the problem of low test efficiency for storage devices such as solid state drives.

[0005] A storage device testing method provided by the present application includes:

[0006] At least one micro motherboard is connected to a host computer and a plurality of storage devices to be tested. After the connection is established, the host computer loads a first number of driver programs;

[0007] The micro motherboard loads a second number of driver programs, and the second number is less than the first number;

[0008] The micro motherboard obtains a test instruction, tests the connected storage devices according to the test instruction, and transmits the test result to the host computer.

[0009] Optionally, the micro motherboard obtaining a test instruction includes at least one of the following:

[0010] The micro motherboard receives a test instruction from the host computer;

[0011] The micro main board obtains a test instruction from an external memory connected to the micro main board in response to receiving a test trigger instruction from the host computer.

[0012] Optionally, the micro main board establishes a connection with the host computer in the same local area network.

[0013] Optionally, the method further includes:

[0014] The micro main board pre - installs driver programs of multiple transmission protocol types;

[0015] The micro main board loads a second number of driver programs, including:

[0016] The micro main board, in response to detecting the transmission protocol type of the connected storage device, loads the driver program corresponding to the transmission protocol type and does not load the driver programs corresponding to other transmission protocol types.

[0017] Optionally, the micro main board and the storage device are connected by plugging through an interface;

[0018] The method further includes:

[0019] The micro main board pre - installs driver programs of multiple transmission protocol types;

[0020] The micro main board loads a second number of driver programs, including:

[0021] The micro main board, in response to detecting the interface type of the connected storage device, loads the driver program of the transmission protocol type corresponding to the interface type and does not load the driver programs of the transmission protocol types corresponding to other interface types.

[0022] Optionally, the method further includes:

[0023] The micro main board pre - installs driver programs of multiple transmission protocol types;

[0024] The micro main board loads a second number of driver programs, including:

[0025] The micro main board, in response to connecting to multiple storage devices, determines the number of transmission protocol types of the multiple storage devices;

[0026] The micro main board loads the driver programs corresponding to the transmission protocol types in the order from the most to the least in quantity. Among them, after loading the driver program corresponding to one transmission protocol type and completing the test for all storage devices using the one transmission protocol type, it then loads the driver programs corresponding to other transmission protocol types.

[0027] Optionally, a single micro main board and multiple storage devices are connected by plugging through an interface; the method further includes:

[0028] The micro main board is pre - installed with drivers of multiple transmission protocol types;

[0029] The micro main board loads a second number of drivers, including:

[0030] The micro main board determines the number of interface types of the multiple storage devices in response to connecting to multiple storage devices;

[0031] The micro main board loads the drivers of the transmission protocol types corresponding to the interface types in the order from the most to the least in number. Among them, after loading the driver of the transmission protocol type corresponding to one interface type and completing the test for all storage devices using the one interface type, then load the drivers of the transmission protocol types corresponding to other interface types.

[0032] Optionally, the second number of drivers does not include peripheral device drivers.

[0033] Optionally, the method further includes:

[0034] The micro main board tests the connected standard storage device according to the test instruction in response to detecting the access of a standard storage device, and compares it with the test result of the connected storage device;

[0035] The transmitting the test result to the host computer includes:

[0036] The micro main board transmits the test result of the storage device to the host computer in response to the different test results of the standard storage device and the storage device, or only obtains the part of the test result corresponding to the storage device that is different from the standard storage device and transmits it to the host computer.

[0037] A storage device testing method provided by the present application includes:

[0038] The host computer establishes a connection with at least one micro main board, where the at least one micro main board is connected to several storage devices to be tested;

[0039] The host computer loads a first number of drivers after establishing the connection. Among them, the micro main board loads a second number of drivers, and the first number is greater than the second number;

[0040] The host computer controls the micro main board to obtain a test instruction so that the micro main board tests the connected storage device according to the test instruction;

[0041] The host computer receives the test result from the micro main board.

[0042] A storage device testing system provided by the present application includes a host computer and at least one micro main board. Between the micro main board, the host computer, and the storage device to be tested, the storage device is tested by the method described in any one of the above.

[0043] A storage medium provided by the present application stores a program. When the program is executed by a processor, it implements the storage device testing method described in any one of the above.

[0044] As described above, the test system architecture of the present application includes a host computer, a micro main board, and a storage device to be tested. The host computer is communicatively connected to the micro main board, and the micro main board is connected to the storage device to be tested. The host computer issues a test instruction to the micro main board, and the micro main board tests the connected storage device according to the test instruction. On the one hand, it can test the solid-state drive in an environment simulating actual use. On the other hand, the micro main board can adapt to the transmission protocol of the new storage device, and the cost can be reduced compared with re-developing the bridge chip of the test adapter device. In addition, since the micro main board only shares some relevant processes that are executed by the host computer in the traditional test process, the system carried by the micro main board can be relatively simple compared with the operating system carried by the host computer. After each storage device is tested, at least only the micro main board needs to be started, and its restart speed will be faster than the operating system of the host computer, thereby improving the test efficiency. Description of the Drawings

[0045] Figure 1 It is a schematic flowchart of a storage device testing method provided by an embodiment of the present application;

[0046] Figure 2 Based on Figure 1 An interaction diagram provided for the storage device testing method shown;

[0047] Figure 3 It is a schematic structural diagram of a storage device testing system provided by an embodiment of the present application;

[0048] Figure 4 It is a schematic structural diagram of another storage device testing system provided by an embodiment of the present application;

[0049] Figure 5 Based on Figure 1 Another interaction diagram provided for the storage device testing method shown;

[0050] Figure 6 Based on Figure 1 Another interaction diagram provided for the storage device testing method shown;

[0051] Figure 7Schematic flowchart of another storage device testing method provided by an embodiment of the present application;

[0052] Figure 8 Schematic flowchart of yet another storage device testing method provided by an embodiment of the present application. Detailed implementation manners

[0053] To solve the above problems existing in the prior art, the present application provides a storage device testing method, a testing system, and a storage medium. These several protection subjects are based on the same concept, and the principles of solving problems are basically the same or similar. The implementation manners of each protection subject can be referred to each other, and the repeated parts will not be elaborated. In the present application, the micro main board only shares some relevant processes that are executed by the host computer in the traditional testing process. Therefore, compared with the operating system installed on the host computer, the system installed on the micro main board can be relatively simple. After each storage device is tested, at least only the micro main board needs to be started, and its restart speed is faster than the operating system of the host computer, thereby improving the testing efficiency.

[0054] To make the objectives, technical solutions, and advantages of the present application clearer, the technical solutions of the present application will be clearly described below in conjunction with specific embodiments and corresponding drawings. Obviously, the embodiments described below are only a part of the embodiments of the present application, rather than all embodiments. Without conflict, the following various embodiments and their technical features can be combined with each other, and they also belong to the technical solutions of the present application.

[0055] Figure 1 Schematic flowchart of a storage device testing method provided by an embodiment of the present application. This storage device testing method can also be simply referred to as the "method" or "testing method". By constructing a testing system architecture including at least a host computer, a micro main board, and a storage device to be tested, the storage device is tested. The specific content and process of this testing can be adaptively determined according to the actual scenarios such as the type of the storage device, and the present application does not limit it. The storage device includes but is not limited to a solid-state drive, a USB flash drive, or an eMMC (embedded Multi Media Card).

[0056] Refer to Figure 1 and Figure 2 shown. This method at least includes the following steps S11 to S13.

[0057] S11: At least one micro main board establishes connections with the host computer and several storage devices to be tested. Among them, after the connections are established, the host computer loads a first number of driver programs.

[0058] Combined with Figure 3As shown, the host computer 1, the micro main board 2, and the storage device 3 to be tested constitute the test system architecture of this application. In this test system architecture, the four micro main boards 2 and the four storage devices 3 are only for exemplary display and do not constitute a limitation. In addition, a single micro main board 2 can only establish a connection with one storage device 3, or can, as Figure 3 shown, establish connections with multiple storage devices 3.

[0059] The micro main board 2 can be provided with interfaces, and the storage device 3 is connected to the micro main board 2 by plugging into the interfaces. The types of the interfaces include, but are not limited to, PCIE interfaces. It should be understood that as an independent device, the micro main board 2 can also include other necessary structural elements. For example, in the micro main board 2 in the form of a circuit board, it is also provided with relevant traces and a main control unit connected to the interfaces.

[0060] As long as the storage device 3 is connected to the micro main board 2, it means that it has joined this test system architecture and can be called the storage device 3 to be tested. Herein, the host computer 1 and each storage device 3 to be tested can establish the connections required for testing through the micro main board 2.

[0061] In an actual scenario, the hardware modules of the host computer mainly include a power module, a storage module (including memory and external storage), a communication module, a basic system module, a human-computer interaction module, a processing module, etc. Herein, the first quantity of driver programs loaded by the host computer includes the driver programs related to these hardware modules. In this host computer, the power module supplies power to other hardware modules; the basic system module mainly includes a conventional BIOS (Basic Input Output System) chip or a UEFI (Unified Extensible Firmware Interface) chip in the art, which is used to store BIOS or UEFI basic firmware; after the host computer is powered on, the processing module (i.e., the CPU) loads the firmware in the basic system module to perform a system self-check to detect whether each hardware module is normal. When normal, it loads a boot program from the storage module, and then further loads and starts the operating system stored in the storage module through the boot program. The operating system will load various driver programs when starting, including at least a chipset driver program, a PCIE bus driver program, a network driver program, a storage controller driver program, driver programs for interfaces such as USB, and a peripheral device driver program. The peripheral device driver program is mainly used to drive peripheral devices such as a display screen and a keyboard.

[0062] S12: The micro main board loads a second quantity of driver programs, and the second quantity is less than the first quantity.

[0063] The hardware modules of the micro mainboard include a power module, a memory module, a communication module, an external module, a basic system module, and a processing module. Herein, the second quantity of driver programs loaded on the micro mainboard includes driver programs related to these hardware modules. In this micro mainboard, the power module supplies power to other hardware modules; the basic system module mainly includes a BIOS or UEFI chip for storing BIOS or UEFI basic firmware; after the micro mainboard is powered on, the processing module loads the firmware in the basic system module to perform a system self-check, detects whether each hardware module is normal, and when normal, obtains a boot program from an external memory connected by the external module and loads it, and then loads and starts a test system stored in the external memory through the boot program. When starting up, the test system will only load driver programs related to completing storage device tests, such as chipset driver programs, PCIE bus driver programs, interface driver programs for accessing external memories, driver programs of external modules, and network driver programs.

[0064] The specific manifestation forms of the above-mentioned various modules of the host computer and the micro mainboard should be determined according to the actual scenario. For example, the communication modules of the host computer and the micro mainboard can both be network ports. The micro mainboard and the host computer establish a connection in the same local area network, which not only facilitates the flexible layout of the micro mainboard and the host computer, but also avoids interference from other devices accessing the test system architecture to the entire test process. Through the local area network connection, the micro mainboard and the host computer can communicate using the TCP (Transmission Control Protocol) protocol or the IP protocol.

[0065] S13: The micro mainboard obtains a test instruction, tests the connected storage device according to the test instruction, and transmits the test result to the host computer.

[0066] The host computer establishes a communication connection with the test system of the micro mainboard through its own operating system. In one example, the host computer issues a test instruction to the micro mainboard. The test instruction can include a test command and test data. The test command can instruct the micro mainboard to execute a corresponding test type, and the test data can be used for data writing to the storage device being tested when performing a write test.

[0067] In other examples, the host computer can only issue a test trigger instruction, which only indicates the start of this test. Then, in response to the test trigger instruction received from the host computer, the micro mainboard obtains the test instruction from an external memory connected to the micro mainboard. The external memory includes, but is not limited to, a USB flash drive. The external memory is connected to the micro mainboard in a wired manner such as plugging. Compared with the host computer and the micro mainboard issuing test instructions through a wireless network, this example can improve the rate at which the micro mainboard obtains test instructions, thereby facilitating the overall improvement of test efficiency.

[0068] The micro mainboard tests the connected storage device according to the test data in the test instruction. The storage device generates corresponding log data and transmits the log data to the micro mainboard through the corresponding interface. The micro mainboard organizes it to form a test result and transmits it to the host computer.

[0069] Since the micro mainboard only shares some relevant processes that were previously executed by the host computer in the traditional test process, compared with the operating system installed on the host computer, the test system installed on the micro mainboard can be relatively simple. For example, based on the hardware modules included in the aforementioned host computer and micro mainboard respectively, the second quantity of driver programs loaded on the micro mainboard do not include peripheral device driver programs, that is, the micro mainboard does not need to load peripheral device driver programs. Therefore, the test system of the micro mainboard does not need to set relevant codes and has a relatively fast restart speed. After each storage device is tested, at least only the corresponding micro mainboard needs to be started, without the need for the host computer to restart. Moreover, the restart speed of the micro mainboard is relatively fast, so the time for restarting due to plugging and unplugging and replacing storage devices can be reduced, and the test efficiency can be improved. In addition, since the micro mainboard is used for testing, the micro mainboard can better simulate the usage situation of storage devices such as solid state drives in actual scenarios, so the test results are more in line with the real usage scenarios. In addition, the micro mainboard can adapt to the transmission protocols of new storage devices, which can reduce costs compared with redeveloping the bridge chip of the test adapter device.

[0070] The micro mainboard can establish connections with various types of storage devices, and different types of storage devices can communicate with the micro mainboard through appropriate transmission protocols. In view of this, combined with Figure 5 as shown, the test method may further include step S100: the micro mainboard pre installs driver programs for multiple transmission protocols. This step S100 can be executed before step S12.

[0071] Correspondingly, step S12 may include step S121: the micro mainboard, in response to detecting the transmission protocol type of the connected storage device, loads the driver program corresponding to the transmission protocol type and does not load the driver programs corresponding to other transmission protocol types. That is to say, the micro mainboard loads the appropriate transmission protocol driver program according to the accessed storage device and does not load the driver programs of other types of transmission protocols, avoiding the micro mainboard starting and loading all types of driver programs simultaneously, reducing the load of the micro mainboard, and further facilitating the simplification of the test system of the micro mainboard and improving the test efficiency.

[0072] Various types of transmission protocols have corresponding types of interfaces. In the scenario where a connection is established by plugging in through an interface between a micro motherboard and a storage device, the present application can load the corresponding driver program through the interface type without directly detecting the transmission protocol type adopted by the connected storage device. In this regard, please continue to refer to Figure 5 As shown, the test method may also include step S100: The micro motherboard pre-installs driver programs for multiple transmission protocols.

[0073] Correspondingly, step S12 may include step S122: The micro motherboard, in response to detecting the interface type of the connected storage device, loads the driver program for the transmission protocol corresponding to the interface type and does not load the driver programs for the transmission protocols corresponding to other interface types. That is to say, the micro motherboard loads the appropriate driver program for the transmission protocol according to the interface type of the connected storage device and does not load the driver programs for the transmission protocols corresponding to other interface types, avoiding the micro motherboard from starting and loading the driver programs for all interface types simultaneously, reducing the load on the micro motherboard, so that the test system of the micro motherboard can be designed simply, which further helps to improve the test efficiency.

[0074] For example, the memory module of the micro motherboard can pre-install two types of transmission protocols: AHCI (Advanced Host Controller Interface) transmission protocol and NVMe (Non Volatile Memory Express) transmission protocol. When it is detected that the connected storage device uses the NVMe transmission protocol, the micro motherboard only loads the M.2 interface driver and the NVMe driver to select the M.2 interface corresponding to the PCIE bus to establish a connection with the storage device, thereby reducing the startup time. When it is detected that the connected storage device uses the AHCI transmission protocol, the micro motherboard loads the SATA (Serial Advanced Technology Attachment) interface driver and the AHCI driver to select the SATA interface corresponding to the SATA bus to establish a connection with the storage device, thereby reducing the startup time.

[0075] Continue to refer to Figure 4 As shown, the micro motherboard 1 can establish a connection with multiple storage devices 3 of different transmission protocol types. In this regard, in combination with Figure 6 As shown, the test method may also include the above step S100: The micro motherboard pre-installs driver programs for multiple transmission protocol types.

[0076] Correspondingly, the step S12 may include step S123: the micro main board determines the number of types of transmission protocols of the multiple storage devices in response to connecting to the multiple storage devices; and step S124: the micro main board loads the driver programs corresponding to the types of transmission protocols in descending order of the number. Wherein, after loading the driver program corresponding to each type of transmission protocol and completing the test on all the storage devices adopting the type of transmission protocol, the driver program corresponding to other types of transmission protocols is loaded.

[0077] In Figure 6 In the interaction example shown, according to the number of types of transmission protocols adopted, the multiple storage devices connected to a certain micro main board are divided into a first storage device and a second storage device. The first storage device is a storage device that establishes a communication connection with the micro main board using a first type of transmission protocol, which may refer to a single storage device or a collective term for two or more storage devices. The second storage device establishes a communication connection with the micro main board using a second type of transmission protocol. Similarly, the second storage device may refer to a single storage device or a collective term for two or more storage devices; the number of the first storage devices is greater than the number of the second storage devices. Taking this as an example, the step S12 may be implemented as at least the following three sub-steps:

[0078] Sub-step 1: Load the driver programs except for the types of transmission protocols.

[0079] Sub-step 2: Execute the step S123 to determine the number of types of transmission protocols adopted by the currently connected multiple storage devices.

[0080] Sub-step 3: Execute step S124. In this step S124, first load the driver program corresponding to the first type of transmission protocol, and after completing the test on all the first storage devices accordingly, then load the driver program corresponding to the second type of transmission protocol and test the second storage devices accordingly.

[0081] It should be noted that after completing the test on each first storage device or each second storage device, the micro main board can transmit the corresponding test results to the host computer; or, after completing the test on all the first storage devices, the micro main board packs and transmits the test results of each test device to the host computer; or, after completing the test on all the first storage devices and the second storage devices, the micro main board packs and transmits the test results of all the storage devices to the host computer.

[0082] Combined with Figure 4As shown in the figure, taking the example of a single micro mainboard 1 accessing two storage devices (labeled 31 and 33 respectively) using the NVMe transmission protocol and a storage device 32 using the AHCI transmission protocol, in step S124, the micro mainboard first loads the NVMe driver, and then performs relevant tests on the storage devices 31 and 33 according to the NVMe driver. The storage devices 31 and 33 can be tested sequentially or simultaneously. After all the tests on the storage devices 31 and 33 are completed, the AHCI driver is loaded, and the storage device 32 is tested based on the AHCI driver. Herein, this example can load the drivers corresponding to only one type of transmission protocol in sequence at a time, avoiding the micro mainboard from starting and loading all types of transmission protocol drivers simultaneously, reducing the load on the micro mainboard, so that the test system of the micro mainboard can be designed simply, which is further conducive to improving the test efficiency.

[0083] In view of the fact that various types of transmission protocols have corresponding types of interfaces, the present application can also load drivers according to the number of interface types. Continuing to refer to Figure 6 As shown in the figure, the test method may further include step S101: The micro mainboard pre-sets drivers of multiple interface types.

[0084] Correspondingly, step S12 may include step S125: The micro mainboard determines the number of interface types of the multiple storage devices in response to connecting multiple storage devices; and step S126: The micro mainboard loads the drivers of the transmission protocols corresponding to the interface types in the order from more to less in terms of quantity. Among them, after loading the drivers of the transmission protocol corresponding to each interface type and completing the tests on all the storage devices using this interface type, the drivers of the transmission protocols corresponding to other interface types are loaded.

[0085] Figure 7 It is a schematic flowchart of another test method provided by an embodiment of the present application. Refer to Figure 7 As shown in the figure, the test method of this example includes the following steps S21 to S233.

[0086] S21: At least one micro mainboard establishes a connection with the host computer and several storage devices to be tested. Among them, the host computer loads a first quantity of drivers after establishing the connection;

[0087] S22: The micro mainboard loads a second quantity of drivers, and the second quantity is less than the first quantity;

[0088] S231: The micro mainboard obtains a test instruction and tests the connected storage devices according to the test instruction;

[0089] S232: The micro mainboard, in response to detecting the access of a standard storage device, tests the connected standard storage device according to the test instruction and compares the result with the test result of the connected storage device;

[0090] S233: In response to different test results of the standard storage device and the storage device, transmit the test result of the storage device to the host computer, or only obtain the part of the test result corresponding to the storage device that is different from the standard storage device and transmit it to the host computer.

[0091] For the same features of this example and any of the above examples, reference can be made to the foregoing. For example, steps S21, S22 and Figure 1 the relevant features in steps S11, S12 of the example shown correspond identically, and will not be elaborated here.

[0092] In step S232, the micro mainboard can determine whether a standard storage device is accessed through the unique identity identifier (such as device ID) of the standard storage device, or can determine that the storage device currently accessing this dedicated interface is a standard storage device through the dedicated interface.

[0093] The standard storage device refers to a reference device that has successfully completed testing and is completely the same as the storage device to be tested in terms of type, content to be tested, index and other dimensional information. Herein, in step S233, once the test results of the standard storage device and other storage devices are different, only transmit the test results different from the standard storage device to the host computer, which can reduce the transmission volume between the micro mainboard and is conducive to simplifying the complexity of the test system of the micro mainboard and improving the test efficiency.

[0094] In addition, by comparing the test results through the micro mainboard instead of the host computer performing this comparison, the amount of computation required for the comparison is small and will not significantly increase the complexity of the test system of the micro mainboard, and the impact on the test efficiency is small or even negligible. Of course, in other examples, the host computer can also perform this comparison, thus not affecting the complexity of the test system of the micro mainboard.

[0095] The execution subject of the test method of any of the foregoing examples is the micro mainboard, which does not constitute a limitation on the inventive concept and protection scope of this application. In the constructed test system architecture, when each subject is the execution subject, the steps of the test method of each example only change adaptively in language description. For example, when the host computer is the execution subject, Figure 1 the method of the example can be expressed as Figure 8 the example of Figure 8 shown, and the test method at least includes the following steps S31 to S34.

[0096] S31: The host computer establishes a connection with at least one micro motherboard, where the at least one micro motherboard is connected to a plurality of storage devices to be tested;

[0097] S32: After establishing the connection, the host computer loads a first number of driver programs, where the micro motherboard loads a second number of driver programs, and the first number is greater than the second number;

[0098] S33: The host computer controls the micro motherboard to obtain a test instruction, so that the micro motherboard tests the connected storage devices according to the test instruction;

[0099] S34: The host computer receives the test result from the micro motherboard.

[0100] The embodiment of the present application further provides a storage device test system, including a host computer and at least one micro motherboard. The connection relationship among the micro motherboard, the host computer, and the storage devices to be tested can be referred to the foregoing Figure 2 or Figure 3 shown, and is used to execute the method of any foregoing embodiment to test the storage device. For the specific principle, process, and beneficial effects, reference can be made to the above examples, and details are not described herein again.

[0101] It should be understood that the storage device test system, micro motherboard, host computer, etc. provided by the embodiment of the present application are complete devices respectively, and also have the structures corresponding to known devices. Here, only the components related to testing in the devices are described, and other components are not described in detail.

[0102] The embodiment of the present application further provides a storage medium, on which a test program is stored. When the test program is executed by a processor, the steps of the test method of any foregoing example are implemented.

[0103] The storage medium includes, but is not limited to, any one of a read-only memory (ROM, Read Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk, and an optical disc.

[0104] Since the program stored in the storage medium can execute the steps in the test method of any foregoing embodiment provided by the present application, the beneficial effects that can be achieved by the test method of any foregoing embodiment can be realized. For details, see the foregoing embodiments, and details are not described herein again.

[0105] The embodiments of the present application further provide a micro main board or a chip, including a memory and a processor. A test program is stored on the memory. When the test program is executed by the processor, the steps of the test method in any of the foregoing embodiments are implemented; and / or, the micro main board or the chip is provided with a storage medium as in the above example, and the processor of the micro main board or the chip loads the storage medium to execute the steps of the test method, so as to achieve the beneficial effects that the corresponding example of the test method can achieve.

[0106] The foregoing are only some embodiments of the present application, and thus do not limit the patent scope of the present application. For those of ordinary skill in the art, any equivalent structural transformation made by using the content of this specification and the drawings shall be equally included in the patent protection scope of the present application.

[0107] In this article, step codes such as S11 and S12 are used. The purpose is to more clearly and briefly express the corresponding content and does not constitute a substantial limitation in order. Those skilled in the art may execute S21 first and then S11 during specific implementation, etc., but these should all be within the protection scope of the present application.

[0108] Although the terms "first", "second", etc. are used in this article to describe various information, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. Additionally, the singular forms "a", "an", and "the" are also intended to include the plural forms. The terms "or" and "and / or" are interpreted inclusively, or mean any one or any combination. An exception to this definition only occurs when the combination of elements, functions, steps, or operations is inherently mutually exclusive in some way.

Claims

1. A storage device testing method, characterized in that: include: At least one micro mainboard establishes a connection with a host computer and a plurality of storage devices to be tested, wherein the host computer loads a first number of driver programs after establishing the connection; The micro motherboard loads a second number of drivers, the second number being less than the first number; The micro mainboard obtains the test instruction, tests the connected storage device according to the test instruction, and transmits the test result to the host computer.

2. The storage device testing method according to claim 1, characterized in that: The micro mainboard obtains a test instruction, including at least one of the following: The micro mainboard receives a test instruction from the host computer; In response to receiving a test trigger instruction from the host computer, the micro mainboard obtains a test instruction from an external memory connected to the micro mainboard.

3. The storage device testing method according to claim 1 or 2, characterized in that: The micro mainboard and the host computer are connected in the same local area network.

4. The storage device testing method according to claim 1, characterized in that: The method further comprises: presetting drivers of multiple transmission protocol types on the micro-mainboard; The micro motherboard loads a second number of drivers, including: In response to detecting the transmission protocol type of the connected storage device, the micro motherboard loads a driver corresponding to the transmission protocol type and does not load drivers corresponding to other transmission protocol types.

5. The storage device testing method according to claim 1 or 4, characterized in that: The method further comprises: presetting drivers of multiple transmission protocol types on the micro-mainboard; The micro motherboard loads a second number of drivers, including: The micro motherboard determines the number of transmission protocol types of the plurality of storage devices in response to connecting the plurality of storage devices; The micro-mainboard loads the drivers corresponding to the transmission protocol types in order from most to least, wherein after each driver corresponding to a transmission protocol type is loaded and all storage devices using the transmission protocol type are tested, the drivers corresponding to other transmission protocol types are loaded.

6. The storage device testing method according to claim 1, characterized in that: The second number of drivers does not include a peripheral device driver.

7. The storage device testing method according to claim 1, characterized in that: The method further comprises: In response to detecting the access to the standard storage device, the micro motherboard tests the connected standard storage device according to the test instruction and compares the test result with the test result of the connected storage device; The step of transmitting the test result to the host computer comprises: In response to the different test results of the standard storage device and the storage device, the micro motherboard transmits the test results of the storage device to the host computer, or only obtains the part of the test results corresponding to the storage device that is different from the standard storage device and transmits it to the host computer.

8. A storage device testing method, characterized in that: include: The host computer establishes a connection with at least one micro mainboard, wherein the at least one micro mainboard establishes a connection with a plurality of storage devices to be tested; The host computer loads a first number of driver programs after establishing the connection, wherein the micro motherboard loads a second number of driver programs, the first number being greater than the second number; The host computer controls the micro mainboard to obtain a test instruction, so that the micro mainboard tests the connected storage device according to the test instruction; The host computer receives the test result from the micro mainboard.

9. A storage device testing system, characterized in that: It comprises a host computer and at least one micro mainboard, wherein the micro mainboard, the host computer and the storage device to be tested are connected, and the storage device is tested by the method according to any one of claims 1 to 8.

10. A storage medium, characterized in that: A test program is stored, and when the test program is executed by a processor, the storage device testing method according to any one of claims 1 to 8 is implemented.

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