Automatic distribution sample testing method, device, equipment and medium

Abstract

The invention provides an automatic distribution sample testing method and device, equipment and a medium. The method comprises the following steps: acquiring position information of a target test tube rack; under the condition that the target test tube rack is not located at the single-machine position, instrument test information corresponding to each analysis instrument is obtained in real time; based on the instrument test information of each analytical instrument, calculating to obtain an untested number of each analytical instrument; acquiring sample test information of the target test tube rack; under the condition that the to-be-distributed test number is greater than 0, determining a target instrument based on the sample test information; under the condition that the number of the target instruments is greater than 1, acquiring state information of each target instrument; and under the condition that the state information is that the target instruments which are not busy are larger than 0, based on a rule of distributing as many tests as possible to one instrument, determining the target instruments which conform to the rule, and distributing the target test tube rack to the target instrument which has the minimum number of untested instruments and is closest to the target test tube rack. The scheme can improve the instrument utilization rate of the online system and reduce the circulation of the test tube rack.

Description

Technical Field

[0001] This application relates to the technical field of test sample allocation, and particularly relates to an automatic sample test method, device, equipment, and medium. Background Art

[0002] Existing instruments require high efficiency in operation. Therefore, single-tube transportation is commonly used, that is, transporting to each instrument for sample injection, testing, and sample output in units of single tubes.

[0003] The analysis system is composed of multiple connected instruments, which may be multiple different types of instruments or multiple same-type instruments. After being sampled in a single sampling area, the multiple connected instruments are allocated to individual machines. The samples in the sampling area need to be placed on a 10-well test tube rack, that is, 10 single-tube samples are placed in a group on the 10-well test tube rack. Therefore, it is necessary to consider the allocation and testing in units of 10 test tubes on one test tube rack. The commonly used methods and existing problems are as follows:

[0004] 1. When injecting samples into the corresponding single machine analysis instrument in the sample injection area in single-tube mode, the single-tube samples are first transferred from the single test tube base to the 10-well test tube rack, and then the 10-well test tube rack is transported to the analyzer for analysis. That is, for single-sample allocation, the single-tube samples are combined and placed on the 10-well test tube rack before entering the analyzer. When the instrument needs to transfer the samples after the test is completed, the single-tube samples on the 10-well test tube rack are transferred back to the single test tube base, and then transferred in units of single-tube samples; this method increases the transfer mechanism on the one hand, resulting in an increase in the overall cost of the instrument, and on the other hand, since the single-tube samples need to be transferred between the single base and the 10-well test tube rack, the transfer steps are increased, resulting in an increase in working time and a decrease in working efficiency.

[0005] 2. When directly sampling with a 10-well test tube rack, since most of the current allocations are manual, it wastes manpower. For the few automatic allocations, the allocation mechanism is imperfect, resulting in a relatively long waiting time. For example, the existing software only considers the items that can be performed on the instrument for allocation, without considering the busy state of the instrument, and preferentially allocates the test to the first instrument in the connected instruments. In the case of multiple connected instruments, the first instrument keeps injecting and testing samples, while the subsequent instruments are idle, resulting in low working efficiency of the entire analysis system. Therefore, it is necessary to arrange different tests on multiple connected analyzers so that each test required on each test tube rack can be tested on a unique instrument without the need for allocation; however, this has limitations for the usage scenario and is not conducive to customers with few test types and large sample volumes. Summary of the Invention

[0006] This application provides an automatically allocated sample testing method, device, equipment and medium to overcome the defects of the above-mentioned existing technologies, which can improve the instrument utilization rate of the on-line system, reduce the turnover of test tube racks, and achieve the effects of improving work efficiency, reducing the overall cost and avoiding scene limitations.

[0007] To solve the above technical problems, this application provides the following technical solutions:

[0008] According to the first aspect of the embodiments of this application, an automatically allocated sample testing method is provided, including:

[0009] Obtain the position information of the target test tube rack;

[0010] Determine whether the target test tube rack is in the single-instrument position;

[0011] When the target test tube rack is not in the single-instrument position, obtain the instrument test information corresponding to each analytical instrument in real time; the single-instrument position indicates the sampling position corresponding to any one of the analytical instruments;

[0012] Based on the instrument test information of each analytical instrument, calculate the number of untested samples for each analytical instrument;

[0013] Obtain the sample test information of the target test tube rack;

[0014] Determine whether the number of tests to be allocated in the sample test information is greater than 0;

[0015] When the number of tests to be allocated is greater than 0, determine the target instrument based on the sample test information;

[0016] Determine whether the number of target instruments is greater than 1;

[0017] When the number of target instruments is greater than 1, obtain the status information of each target instrument; the status information includes busy and not busy, and the status information is determined based on preset conditions;

[0018] Preferentially select the target instrument with the status information of not busy;

[0019] Determine whether the number of target instruments with the status information of not busy is greater than 0;

[0020] When the number of target instruments with the status information of not busy is greater than 0, determine the target instrument that meets the rule based on the rule of allocating as many tests as possible to one instrument;

[0021] Determine whether the number of target instruments that meet the rule is greater than 1;

[0022] When the number of the target instruments that meet the rules is greater than 1, compare the number of untested ones among the target instruments, and determine the target instrument with the least number of untested ones;

[0023] Judge whether the target instrument with the least number of untested ones is greater than 1;

[0024] When the target instrument with the least number of untested ones is greater than 1, based on the position information of the target test tube rack and the target instruments with the least number of untested ones, allocate the target test tube rack to the target instrument closest to the target test tube rack;

[0025] Recalculate the number of tests to be allocated for the target test tube rack;

[0026] Repeat the steps of judging whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0027] In an exemplary embodiment, when the target test tube rack is in the single-machine position, it includes:

[0028] When the number of tests to be allocated for the target test tube rack is greater than 0, preferentially allocate as many tests as possible to the current analysis instrument; the current analysis instrument indicates the analysis instrument corresponding to the single-machine position;

[0029] Recalculate the number of tests to be allocated for the target test tube rack;

[0030] Repeat the steps of judging whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0031] In an exemplary embodiment, when the number of the target instruments is not greater than 1, it includes:

[0032] Allocate the test to the target instrument;

[0033] Recalculate the number of tests to be allocated for the target test tube rack;

[0034] Repeat the steps of judging whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0035] In an exemplary embodiment, when the number of the target instruments with the status information of being not busy is not greater than 0, it includes:

[0036] Determine whether the number of target instruments with the status information being busy is greater than 0;

[0037] When the number of target instruments with the status information being busy is greater than 0, based on the rule of allocating as many tests as possible to one instrument, determine the target instruments that meet the rule;

[0038] Determine whether the number of target instruments that meet the rule is greater than 1;

[0039] When the number of target instruments that meet the rule is greater than 1, compare the number of untested items of each target instrument, and determine the target instrument with the least number of untested items;

[0040] Determine whether the number of target instruments with the least number of untested items is greater than 1;

[0041] When the number of target instruments with the least number of untested items is greater than 1, based on the position information of the target test tube rack and each target instrument with the least number of untested items, allocate the target test tube rack to the target instrument closest to the target test tube rack;

[0042] Recalculate the number of tests to be allocated for the target test tube rack;

[0043] Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0044] In an exemplary embodiment, when the number of target instruments that meet the rule is not greater than 1, it includes:

[0045] Allocate the test to the target instrument;

[0046] Recalculate the number of tests to be allocated for the target test tube rack;

[0047] Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0048] In an exemplary embodiment, when the number of target instruments with the least number of untested items is not greater than 1, it includes:

[0049] Allocate the test to the target instrument;

[0050] Recalculate the number of tests to be allocated for the target test tube rack;

[0051] Repeat the step of judging whether the number of tests to be assigned in the sample test information is greater than 0 until the number of tests to be assigned in the target test tube rack is not greater than 0, and then repeat the step of recalculating the number of tests to be assigned in the target test tube rack.

[0052] In an exemplary embodiment, the method further includes:

[0053] Determine the test threshold of the analytical instrument according to the attribute information of the analytical instrument;

[0054] When the total number of tests in the instrument test information does not reach the test threshold, determine that the status information of the analytical instrument is not busy;

[0055] When the total number of tests in the instrument test information reaches the test threshold, determine that the status information of the analytical instrument is busy;

[0056] Wherein, the total number of tests is the sum of the number of tests in progress and the number of untested tests.

[0057] According to the second aspect of the embodiments of the present application, there is provided an automatically allocated sample testing device, the device includes:

[0058] A position information acquisition module, configured to acquire the position information of the target test tube rack;

[0059] A first judgment module, configured to judge whether the target test tube rack is in the single-machine position;

[0060] An instrument information acquisition module, configured to, when the target test tube rack is not in the single-machine position, acquire the instrument test information corresponding to each analytical instrument in real time; the single-machine position indicates the sample loading position corresponding to any one of the analytical instruments;

[0061] An untested number calculation module, configured to calculate the untested number of each analytical instrument based on the instrument test information of each analytical instrument;

[0062] A sample information acquisition module, configured to acquire the sample test information of the target test tube rack;

[0063] A second judgment module, configured to judge whether the number of tests to be assigned in the sample test information is greater than 0;

[0064] A first instrument determination module, configured to, when the number of tests to be assigned is greater than 0, determine a target instrument based on the sample test information;

[0065] A third judgment module, configured to judge whether the number of target instruments is greater than 1;

[0066] A status information acquisition module, configured to acquire the status information of each of the target instruments when the number of the target instruments is greater than 1; the status information includes busy and not busy, and the status information is determined based on a preset condition;

[0067] A priority selection module, configured to preferentially select the target instrument with the status information of not busy;

[0068] A fourth judgment module, configured to judge whether the number of the target instruments with the status information of not busy is greater than 0;

[0069] A second instrument determination module, configured to determine the target instrument that meets the rule based on the rule of allocating as many tests as possible to one instrument when the number of the target instruments with the status information of not busy is greater than 0;

[0070] A fifth judgment module, configured to judge whether the number of the target instruments that meet the rule is greater than 1;

[0071] A third instrument determination module, configured to compare the number of untested items of each of the target instruments and determine the target instrument with the least number of untested items when the number of the target instruments that meet the rule is greater than 1;

[0072] A sixth judgment module, configured to judge whether the number of the target instruments with the least number of untested items is greater than 1;

[0073] A first allocation module, configured to allocate the target test tube rack to the target instrument closest to the target test tube rack based on the target test tube rack and the position information of each of the target instruments with the least number of untested items when the number of the target instruments with the least number of untested items is greater than 1;

[0074] A recalculation module, configured to recalculate the number of tests to be allocated for the target test tube rack.

[0075] According to the third aspect of the embodiments of the present application, there is provided an electronic device, including a processor and a memory, where at least one instruction or at least one program segment is stored in the memory, and the at least one instruction or the at least one program segment is loaded and executed by the processor to implement the automatic allocation sample test method described in any one of the above.

[0076] According to the fourth aspect of the embodiments of the present application, there is provided a computer-readable storage medium, where at least one instruction or at least one program segment is stored in the storage medium, and the at least one instruction or the at least one program segment is loaded and executed by a processor to implement the automatic allocation sample test method described in any one of the above.

[0077] By adopting the above technical solutions, the present application has the following beneficial effects:

[0078] An automatic allocation sample testing method, device, equipment and medium provided by the present application perform test load balancing through software. For a target test tube rack, the instrument that can meet the test completion is calculated, and as many tests on the target test tube rack as possible are completed in one instrument, so as to shorten the time by reducing the transfer of the target test tube rack. If there are multiple instruments that can meet as many tests as possible, an instrument with fewer remaining untested samples is selected according to the current untested number of the instrument. If the instrument selected according to the principle of completing as many tests on the target test tube rack as possible is in a very busy state, this instrument is excluded, and the instrument is re-allocated according to the principle of completing as many tests on a test tube rack as possible among the non-busy instruments. If the user manually places the test tube rack on a single machine for testing, the software needs to allocate as many tests of this test tube rack to this instrument as possible. The above logic can improve the instrument utilization rate of the on-line system, reduce the transfer of test tube racks, and achieve the effects of improving work efficiency, reducing overall costs, and avoiding scenario limitations. Description of the Drawings

[0079] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0080] Figure 1 It is a schematic flowchart of an automatic allocation sample testing method provided by an embodiment of the present application;

[0081] Figure 2 It is a schematic overview diagram of the actual application principle of an automatic allocation sample testing method provided by an embodiment of the present application;

[0082] Figure 3 It is a schematic overview diagram of the actual application principle of allocating tests to an instrument provided by an embodiment of the present application;

[0083] Figure 4 It is a schematic overview diagram of the actual application principle of instrument sample addition provided by an embodiment of the present application;

[0084] Figure 5 It is a schematic overview diagram of the actual application principle of determining the instrument status provided by an embodiment of the present application;

[0085] Figure 6 It is a schematic flowchart of the actual application process of an automatic allocation sample testing method provided by an embodiment of the present application;

[0086] Figure 7 It is a structural block diagram of an automatic allocation sample testing device provided by an embodiment of the present application;

[0087] Figure 8 The structural block diagram of another sample testing device with automatic allocation provided by an embodiment of the present application;

[0088] Figure 9 The hardware structural block diagram of an electronic device for running a sample testing method with automatic allocation provided by an embodiment of the present application;

[0089] Figure 10 The hardware structural block diagram of an electronic device for running another sample testing method with automatic allocation provided by an embodiment of the present application. Specific implementation manners

[0090] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative efforts shall fall within the protection scope of the present application.

[0091] As used herein, the term "one embodiment" or "embodiment" refers to a specific feature, structure, or characteristic that may be included in at least one implementation manner of the present application. In the description of the embodiments of the present application, it should be understood that the orientation or positional relationship indicated by terms such as "upper", "lower", "top", "bottom", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present application. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. Moreover, the terms "first", "second", etc. are used to distinguish similar objects and do not necessarily have to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein.

[0092] Please refer to Figure 1 , which shows the flowchart of a sample testing method with automatic allocation provided by an embodiment of the present application. The sample testing method with automatic allocation includes:

[0093] Obtain the position information of the target test tube rack;

[0094] Determine whether the target test tube rack is in the single-machine position;

[0095] Otherwise, that is, when the target test tube rack is not in the single-instrument position, obtain the instrument test information corresponding to each analytical instrument in real time; the single-instrument position indicates the sample loading position corresponding to any one of the analytical instruments.

[0096] Based on the instrument test information of each analytical instrument, calculate the number of untested samples for each analytical instrument.

[0097] Obtain the sample test information of the target test tube rack.

[0098] Judge whether the number of tests to be assigned in the sample test information is greater than 0.

[0099] If so, that is, when the number of tests to be assigned is greater than 0, determine the target instrument based on the sample test information.

[0100] Judge whether the number of target instruments is greater than 1.

[0101] If so, that is, when the number of target instruments is greater than 1, obtain the status information of each target instrument; the status information includes busy and not busy, and the status information is determined based on preset conditions.

[0102] Give priority to selecting the target instrument with the status information of not busy.

[0103] Judge whether the number of target instruments with the status information of not busy is greater than 0.

[0104] If so, that is, when the number of target instruments with the status information of not busy is greater than 0, based on the rule of allocating as many tests as possible to one instrument, determine the target instrument that meets the rule.

[0105] Judge whether the number of target instruments that meet the rule is greater than 1.

[0106] If so, that is, when the number of target instruments that meet the rule is greater than 1, compare the number of untested samples of each target instrument, and determine the target instrument with the least number of untested samples.

[0107] Judge whether the number of target instruments with the least number of untested samples is greater than 1.

[0108] If so, that is, when the number of target instruments with the least number of untested samples is greater than 1, based on the position information of the target test tube rack and each target instrument with the least number of untested samples, allocate the target test tube rack to the target instrument closest to the target test tube rack.

[0109] Recalculate the number of tests to be assigned for the target test tube rack.

[0110] Repeat the step of determining whether the number of tests to be assigned in the sample test information is greater than 0 until the step of recalculating the number of tests to be assigned for the target test tube rack, until the number of tests to be assigned for the target test tube rack is not greater than 0.

[0111] In a specific embodiment, if so, that is, when the target test tube rack is in the single-instrument position, the method includes:

[0112] When the number of tests to be assigned for the target test tube rack is greater than 0, preferentially assign as many tests as possible to the current analytical instrument; the current analytical instrument indicates the analytical instrument corresponding to the single-instrument position;

[0113] Recalculate the number of tests to be assigned for the target test tube rack;

[0114] Repeat the step of determining whether the number of tests to be assigned in the sample test information is greater than 0 until the step of recalculating the number of tests to be assigned for the target test tube rack, until the number of tests to be assigned for the target test tube rack is not greater than 0.

[0115] In a specific embodiment, if not, that is, when the number of target instruments is not greater than 1, it includes:

[0116] Assign the test to the target instrument;

[0117] Recalculate the number of tests to be assigned for the target test tube rack;

[0118] Repeat the step of determining whether the number of tests to be assigned in the sample test information is greater than 0 until the step of recalculating the number of tests to be assigned for the target test tube rack, until the number of tests to be assigned for the target test tube rack is not greater than 0.

[0119] In a specific embodiment, if not, that is, when the number of target instruments with the status information being not busy is not greater than 0, the method includes:

[0120] Determine whether the number of target instruments with the status information being busy is greater than 0;

[0121] When the number of target instruments with the status information being busy is greater than 0, based on the rule of assigning as many tests as possible to one instrument, determine the target instrument that meets the rule;

[0122] Determine whether the number of target instruments that meet the rule is greater than 1;

[0123] When the number of target instruments that meet the rule is greater than 1, compare the number of untested tests of each target instrument and determine the target instrument with the least number of untested tests;

[0124] Determine whether the target instrument with the fewest untested samples is greater than 1;

[0125] When the target instrument with the fewest untested samples is greater than 1, based on the position information of the target test tube rack and each target instrument with the fewest untested samples, allocate the target test tube rack to the target instrument closest to the target test tube rack;

[0126] Recalculate the number of tests to be allocated for the target test tube rack;

[0127] Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0128] In a specific embodiment, if not, that is, when the number of target instruments that meet the rules is not greater than 1, the method includes:

[0129] Allocate the test to the target instrument;

[0130] Recalculate the number of tests to be allocated for the target test tube rack;

[0131] Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0132] In a specific embodiment, if not, that is, when the number of target instruments with the fewest untested samples is not greater than 1, the method includes:

[0133] Allocate the test to the target instrument;

[0134] Recalculate the number of tests to be allocated for the target test tube rack;

[0135] Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

[0136] In a specific embodiment, if not, that is, when the number of target instruments with a busy status is not greater than 0, record the target test tube rack and issue a warning.

[0137] In a specific embodiment, the method further includes:

[0138] Determine the test threshold of the analytical instrument according to the attribute information of the analytical instrument;

[0139] When the total number of tests in the instrument test information does not reach the test threshold, it is determined that the status information of the analytical instrument is not busy;

[0140] When the total number of tests in the instrument test information reaches the test threshold, it is determined that the status information of the analytical instrument is busy;

[0141] Among them, the total number of tests is the sum of the number of tests in progress and the number of untested ones.

[0142] In a practical application scenario, the application method of this kind of automatically allocated sample testing method is as follows:

[0143] Please refer to Figure 2 , in practical applications, this kind of automatically allocated sample testing method may include the following steps:

[0144] S1: Obtain the number of unloaded tests of each instrument in the system in real time;

[0145] S2: Taking a 10-well test tube rack as a unit, there may be 0 - 10 samples on the 10-well test tube rack, with no limit on the items and the number of tests. Allocate as many tests as possible on the 10-well test tube rack, preferably all tests, to one instrument for loading and testing, reduce the transfer of test tube racks between instruments, and shorten the time for a single sample to get the result;

[0146] S3: If there are multiple instruments that meet the requirement of "allocating as many tests as possible on the 10-well test tube rack to the same instrument", then give priority to allocating to the instrument with less remaining unloaded test number;

[0147] S4: The entire analysis system can be connected to various different models of instruments, and there may be differences in the test speeds of different models of instruments. If the allocation is based on the remaining number of uncompleted tests, it may allocate overloaded tests to low-speed instruments. Therefore, a test number for reaching the busiest state should be set for each instrument. If the instrument reaches the set busiest state, exclude this instrument from the set of instruments that can be allocated tests during the test allocation. After all the instruments in the not-busy state are allocated, if there are still tests unallocated, then conduct test allocation among the busy instruments;

[0148] S5: If the tests on a test tube rack are allocated to multiple instruments, to avoid all test tube racks entering one instrument simultaneously at the same time, the transfer path of the test tube racks needs to be in ascending order according to the remaining number of tests.

[0149] In step S1, obtaining the number of unloaded tests of each instrument in the system in real time further includes:

[0150] The software modifies the test status in real time. After the sample addition of each instrument is completed, information such as the software project test and reagent remaining amount will be notified to the software in real time, and the software will update the data. For details, see Figure 3 and Figure 4 .

[0151] Optionally, the number of tests assigned by the software to each instrument is recorded in the database, and each sample test corresponds to a unique ID;

[0152] Each time the instrument performs a sample addition action and the sample addition is successful, it will notify the software in the form of an instruction. Using the unique test ID as the identification code, after the software receives it, it marks the test as having had the sample added and excludes it from the calculation of the number of tests for samples that have not had the sample added.

[0153] The software obtains the project test number of the samples on the test tube rack, the remaining number of un-added tests for each instrument, and the remaining amount of reagent on the instrument from the database, and allocates the tests of the samples on the test tube rack to the instruments according to the load balancing calculation.

[0154] Taking the analysis system as an example, all the instrument information that needs to be saved in the database needs to include reagent information, remaining reagent amount, sample information, test information, etc. As the instrument analysis work progresses, samples are added, reagents are consumed, and reagents are replaced, etc., the software needs to be notified in a timely manner to update the database. When a new sample enters the system and a test instrument needs to be allocated, these data are obtained from the database, calculations are performed based on these data, and then the tests are allocated to the testable instruments to maximize the efficiency of the analysis system.

[0155] In step S2, the further allocation of tests in units of a 10-well test tube rack includes:

[0156] A sample is placed on a single test tube rack when it is transferred between instruments. To reduce the number of test tube rack transfers and the length of the travel route, all the samples on the test tube rack and the project test numbers on the samples need to be considered as a whole set for test allocation.

[0157] In practical applications, it is necessary to record the position information of the test tube rack where the sample is located, and the items and test quantities to be allocated on the entire test tube rack can be obtained based on the rack number and position number information, and then this test set should be allocated to as many tests as possible on one instrument.

[0158] Optionally, only one test tube rack number can exist in an analysis system. After scanning the test tube rack number and the sample barcode number on the test tube rack, a set of tests {t1*n1, t2*n2, t3*n3, t4*n4,...} for all the samples on the test tube rack can be obtained and generated, where t represents the project name and n represents the test quantity.

[0159] In step S3, allocating as many tests as possible on a test tube rack to one instrument further includes:

[0160] When allocating as many tests as possible on a test tube rack to one instrument, if it is found that multiple instruments meet the requirement of the same number of tests, then according to the remaining unloaded tests in front of the instrument, the instruments are allocated in ascending order of the remaining unloaded tests.

[0161] In practical applications, it is necessary to comprehensively consider the number of tests to be allocated on a 10-well test tube rack, the number of item tests that can be allocated on the instrument, the remaining unloaded tests on the instrument, and whether the instrument has reached the busy state for test allocation.

[0162] Please refer to Figure 6 , the calculation and allocation mentioned here in combination with the number of tests to be allocated on the test tube rack, the testable items on the instrument, the remaining unloaded tests on the instrument, and whether the instrument has reached the busy state further includes:

[0163] First, judge the position of the test tube rack. If the test tube rack is already in a certain single instrument, then give priority to allocating the test to the single instrument where it is located; after the allocation is completed, if there are still tests to be allocated, then allocate as many tests as possible to the same non-busy instrument. If there are multiple instruments that meet the conditions, then give priority to the instrument with fewer remaining unloaded tests; after all possible non-busy instruments have been allocated, if there are still tests to be allocated, then allocate the tests to the busy instrument that meets the requirements until the test allocation is completed or there are no allocable instruments.

[0164] In practical applications, if the user wants to perform tests on some samples on a certain instrument, the samples can be directly tested on the single instrument, and the software will give priority to allocating them to that instrument, only judging the remaining reagent volume and no longer considering the remaining unloaded tests on the instrument.

[0165] Optionally, the software makes two instrument sets according to the testable number of tests on each instrument: the "non-busy" instrument set {sn1, sn2, sn3,...} and the "busy" instrument set {bsn1, bsn2, bsn3,...}, lists the testable number of items that can be allocated in each sn, and then finds the testable number of tests that each sn meets the samples on the test tube rack. First, find an instrument sn in the "non-busy" instrument set that meets the most testable number of tests on the samples on the test tube rack, and then find the remaining unallocated tests on the test tube rack in the new instrument set according to the above logic. By analogy, after allocating the "non-busy" instruments, then allocate the "busy" instruments.

[0166] In step S4, a test number can be set for each instrument to define the instrument entering the "busy" state, further including:

[0167] Due to different items that can be performed on the instrument, there may be some identical situations; there may also be situations where the instrument tests are different; therefore, a maximum number of tests for the instrument to enter the busy state needs to be set. When the instrument enters the busy state, it is the last consideration among the allocable instruments. The judgment method is shown in Figure 5 。

[0168] In practical applications, as many tests as possible on the 10-hole test tube rack are allocated to one instrument, and the set of non-busy instruments is given priority. After considering the set of non-busy instruments, if there are still some tests not allocated to an instrument, then the set of busy instruments is considered.

[0169] In step S5, the test tube rack circulates among the instruments and preferentially enters the instrument with fewer remaining tests to be sampled, which further includes:

[0170] When the test tube rack enters the instrument allocation, confirm the instrument to which the test tube rack needs to circulate, and then circulate in ascending order according to the number of remaining tests to be aspirated of the several instruments that need to circulate.

[0171] As can be seen from the above technical solutions of the embodiments of the present application, in the embodiments of the present application, software is used to perform test load balancing, and the instrument that can meet the test completion is calculated for the target test tube rack, and as many tests as possible on the target test tube rack are completed in one instrument as much as possible, and the time is shortened by reducing the circulation of the target test tube rack; if there are multiple instruments that can meet as many tests as possible, then an instrument with fewer remaining tests is selected according to the current number of untested items of the instrument; if the instrument selected according to the principle of completing as many tests as possible on the target test tube rack is in a very busy state, then this instrument is excluded, and the instrument is re-allocated according to the principle of completing as many tests as possible on a test tube rack among the non-busy state instruments; if the user manually places the test tube rack on a single machine for testing, the software needs to allocate as many tests of this test tube rack to this instrument as possible. The above logic can improve the instrument utilization rate of the on-line system, reduce the circulation of the test tube rack, and achieve the effects of improving work efficiency, reducing the overall cost, and avoiding scenario limitations.

[0172] In addition, in view of the problem that existing software administrators cannot authorize users who need to use software in a timely manner, and the accounts used by maintenance engineers in the biochemical analyzer software used by multiple engineers are the same, resulting in weak confidentiality of accounts and passwords and indistinguishable operation records for actual operators, the software corresponding to this method can pre-obtain the identity information and corresponding permission information of software users and store them in the user information and permission table in the server. When a user needs to log in to the software, the user can create his own account and log in by scanning the login application QR code for authorization, without the software administrator creating users and allocating permissions in real time, saving human resources; and since each user's account is different, it avoids the situation where the identity of the operator in the operation log is unclear due to different users logging in to the software using the same maintenance account, facilitating enterprise management.

[0173] Corresponding to the automatic allocation sample testing method provided in the above embodiment, an embodiment of the present application further provides an automatic allocation sample testing device. Since the automatic allocation sample testing device provided in the embodiment of the present application corresponds to the automatic allocation sample testing method provided in the above embodiment, the implementation manners of the foregoing automatic allocation sample testing method are also applicable to the automatic allocation sample testing device provided in this embodiment and will not be described in detail in this embodiment.

[0174] Please refer to Figure 7 , which shows a structural block diagram of an automatic allocation sample testing device provided in an embodiment of the present application; the device includes:

[0175] A position information acquisition module, configured to acquire the position information of a target test tube rack;

[0176] A first judgment module, configured to judge whether the target test tube rack is in a single-machine position;

[0177] An instrument information acquisition module, configured to, when the target test tube rack is not in the single-machine position, acquire the instrument test information corresponding to each analytical instrument in real time; the single-machine position indicates the sample loading position corresponding to any one of the analytical instruments;

[0178] An untested number calculation module, configured to calculate the untested number of each analytical instrument based on the instrument test information of each analytical instrument;

[0179] A sample information acquisition module, configured to acquire the sample test information of the target test tube rack;

[0180] A second judgment module, configured to judge whether the number of tests to be allocated in the sample test information is greater than 0;

[0181] A first instrument determination module, configured to, when the number of tests to be allocated is greater than 0, determine a target instrument based on the sample test information;

[0182] A third judgment module, configured to judge whether the number of the target instruments is greater than 1;

[0183] A status information acquisition module, configured to acquire the status information of each of the target instruments when the number of the target instruments is greater than 1; the status information includes busy and not busy, and the status information is determined based on a preset condition;

[0184] A fourth judgment module, configured to judge whether the number of the target instruments with the status of not busy is greater than 0;

[0185] A second instrument determination module, configured to determine the target instrument that meets the rule based on the rule of allocating as many tests as possible to one instrument when the number of the target instruments with the status of not busy is greater than 0;

[0186] A fifth judgment module, configured to judge whether the number of the target instruments that meet the rule is greater than 1;

[0187] A third instrument determination module, configured to compare the number of untested items of each of the target instruments and determine the target instrument with the least number of untested items when the number of the target instruments that meet the rule is greater than 1;

[0188] A sixth judgment module, configured to judge whether the number of the target instruments with the least number of untested items is greater than 1;

[0189] A first allocation module, configured to allocate the target test tube rack to the target instrument closest to the target test tube rack based on the position information of the target test tube rack and each of the target instruments with the least number of untested items when the number of the target instruments with the least number of untested items is greater than 1;

[0190] A recalculation module, configured to recalculate the number of tests to be allocated for the target test tube rack.

[0191] In a specific embodiment, the device further includes:

[0192] A single machine operation module, configured to preferentially allocate as many tests as possible to the current analysis instrument when the target test tube rack is in the single machine position and the number of tests to be allocated for the target test tube rack is greater than 0; the current analysis instrument indicates the analysis instrument corresponding to the single machine position.

[0193] In a specific embodiment, the device further includes:

[0194] A second allocation module, configured to allocate tests to the target instrument when the number of the target instruments is not greater than 1.

[0195] In a specific embodiment, the device further includes:

[0196] A seventh judgment module, configured to determine whether the number of target instruments with the status information being busy is greater than 0 when the number of target instruments with the status information being not busy is not greater than 0;

[0197] A fourth instrument determination module, configured to determine the target instrument that meets the rule based on the rule of allocating as many tests as possible to one instrument when the number of target instruments with the status information being busy is greater than 0.

[0198] In a specific embodiment, the device further includes:

[0199] A third allocation module, configured to allocate tests to the target instrument when the number of target instruments that meet the rule is not greater than 1.

[0200] In a specific embodiment, the device further includes:

[0201] A fourth allocation module, configured to allocate tests to the target instrument when the number of target instruments with the least number of untested items is not greater than 1.

[0202] In a specific embodiment, the device further includes:

[0203] A recording and warning module, configured to record the target test tube rack and issue a warning when the number of target instruments with the status information being busy is not greater than 0.

[0204] In a specific embodiment, the device further includes:

[0205] A threshold determination module, configured to determine the test threshold of the analytical instrument according to the attribute information of the analytical instrument;

[0206] An idle state determination module, configured to determine that the status information of the analytical instrument is idle when the total number of tests in the instrument test information does not reach the test threshold;

[0207] A busy state determination module, configured to determine that the status information of the analytical instrument is busy when the total number of tests in the instrument test information reaches the test threshold.

[0208] Wherein, the total number of tests is the sum of the number of tests in progress and the number of untested items.

[0209] It should be noted that when the device provided in the above embodiment realizes its functions, only the division of the above-mentioned functional modules is used for illustration. In actual applications, the above functions can be allocated to different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the device provided in the above embodiment and the method embodiment belong to the same concept. For the specific implementation process, please refer to the method embodiment and will not be elaborated here.

[0210] Please refer to Figure 8 , which shows a structural block diagram of another sample testing device with automatic allocation provided by an embodiment of the present application; the device includes:

[0211] A test number statistics module 1, configured to statistically calculate the remaining un-sampled test numbers of each instrument in real time;

[0212] A sample allocation module 2, configured to statistically calculate the test numbers that can be allocated on each instrument in real time, and timely allocate the tests on a test tube rack according to the principle of "allocating as many tests as possible to one instrument";

[0213] A sample scheduling module 3, configured to allocate the travel route according to the allocation situation of the tests on the test tube rack and in combination with the remaining test numbers of the instrument.

[0214] The functions and implementation methods of the above-mentioned test number statistics module 1, sample allocation module 2, and sample scheduling module 3 are as described in the above method embodiment and will not be elaborated here.

[0215] The automatically allocated sample testing device according to the embodiment of the present application performs test load balancing through each module, calculates the instrument that can meet the test completion for the target test tube rack, and tries to complete as many tests on the target test tube rack as possible in one instrument, so as to shorten the time by reducing the transfer of the target test tube rack; if there are multiple instruments that can meet as many tests as possible, then select an instrument with fewer remaining tests according to the current untested numbers of the instruments; if the instrument selected according to the principle of completing as many tests on the target test tube rack as possible is in a very busy state, then exclude this instrument and preferentially re-allocate the instrument among the instruments in the non-busy state according to the principle of completing as many tests on a test tube rack as possible; if the user manually places the test tube rack on a single machine for testing, then it is necessary to preferentially allocate as many tests of this test tube rack to this instrument as possible. The above logic can improve the instrument utilization rate of the on-line system, reduce the transfer of test tube racks, and achieve the effects of improving work efficiency, reducing the overall cost, and avoiding scenario limitations.

[0216] In addition, for the problem that the existing software administrator cannot authorize users who need to use the software in a timely manner, and the accounts used by maintenance engineers in the biochemical analyzer software used by multiple engineers are the same, resulting in weak confidentiality of accounts and passwords and indistinguishable operation records for actual operators, the software corresponding to this device can pre-obtain the identity information and corresponding permission information of software users, and store them in the user information and permission table in the server. When a user needs to log in to the software, they can create their own account and perform the login operation by scanning the login application QR code for authorization, without the software administrator having to create users and assign permissions in real time, saving human resources; and since each user's account is different, it avoids the situation where the identity of the operator in the operation log is unclear due to different users logging in to the software using the same maintenance account, facilitating enterprise management.

[0217] An embodiment of the present application also provides an electronic device, including a processor and a memory. At least one instruction or at least one segment of program is stored in the memory, and the at least one instruction or at least one segment of program is loaded and executed by the processor to implement the automatically allocated sample testing method provided in the above method embodiment.

[0218] The memory can be used to store software programs and modules. The processor executes various functional applications and realizes high-level autonomous driving by running the software programs and modules stored in the memory. The memory mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system, application programs required for functions, etc.; the data storage area can store data created according to the use of the device, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices. Correspondingly, the memory can also include a memory controller to provide the processor with access to the memory.

[0219] The method embodiment provided by the embodiment of the present application can be executed in a computer terminal, a server, or a similar computing device, that is, the above electronic device can include a computer terminal, a server, or a similar computing device.

[0220] Figure 9 is the hardware structure block diagram of the electronic device that runs an automatically allocated sample testing method provided by the embodiment of the present application, as Figure 9 shown. The internal structure of this electronic device can include, but is not limited to: a processor, a network interface, and a memory. Among them, the processor, network interface, and memory in the electronic device can be connected through a bus or other means. In the embodiment of this specification Figure 9 it is taken as an example of being connected through a bus.

[0221] Among them, the processor (or CPU (Central Processing Unit)) is the computing core and control core of the electronic device. The network interface may optionally include a standard wired interface, a wireless interface (such as WI-FI, a mobile communication interface, etc.). The memory is the memory device in the electronic device, used to store programs and data. It can be understood that the memory here can be a high-speed RAM storage device, or a non-volatile memory device, such as at least one disk storage device; optionally, it can also be at least one storage device located far from the aforementioned processor. The memory provides a storage space, and this storage space stores the operating system of the electronic device, which may include but is not limited to: Windows system (an operating system), Linux (an operating system), Android (a mobile operating system) system, IOS (a mobile operating system) system, etc., and this application does not make any limitations in this regard; and, one or more instructions suitable for being loaded and executed by the processor are also stored in this storage space, and these instructions can be one or more computer programs (including program codes). In the embodiments of this specification, the processor loads and executes one or more instructions stored in the memory to implement the automatically allocated sample testing method provided in the above method embodiments.

[0222] Figure 10 is the hardware structure block diagram of the electronic device provided in the embodiments of this application for running another automatically allocated sample testing method, as Figure 10 shown, the automatically allocated sample testing device 500 may vary greatly due to different configurations or performances, and may include one or more processors (central processing units, CPU) 510 (for example, one or more processors) and a memory 520, and one or more storage media 530 for storing application programs 533 or data 532 (such as one or more mass storage devices). Among them, the memory 520 and the storage medium 530 can be transient storage or persistent storage. The programs stored in the storage medium 530 may include one or more modules (not marked in the figure), and each module may include a series of instruction operations on the automatically allocated sample testing device 500.

[0223] Furthermore, the processor 510 can be set to communicate with the storage medium 530 and execute a series of instruction operations in the storage medium 530 on the automatically allocated sample testing device 500.

[0224] The automatically allocated sample testing device 500 may further include one or more power supplies 540, one or more wired or wireless network interfaces 550, one or more input / output interfaces 560, and / or one or more operating systems 531, such as Windows Serve, Vista, and so on.

[0225] Those skilled in the art can understand that Figure 9 and Figure 10 the structure of the automatically allocated sample testing device shown does not constitute a limitation on the automatically allocated sample testing device, and it may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0226] The embodiment of the present application also provides a computer-readable storage medium, in which at least one instruction or at least one program segment is stored, and at least one instruction or at least one program segment is loaded and executed by a processor to implement the automatically allocated sample testing method provided by the method embodiment.

[0227] Optionally, in this embodiment, the above storage medium may include but is not limited to: USB flash drives, read-only memories (ROMs), random access memories (RAMs), mobile hard disks, magnetic disks, or optical discs and other various media that can store program codes.

[0228] It should be noted that: the above sequence of the embodiments of the present application is only for description and does not represent the superiority or inferiority of the embodiments. And the above specific embodiments of this specification have been described. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be executed in a different order than in the embodiments and still achieve the desired results. Additionally, the processes depicted in the drawings do not necessarily require the specific order or sequential order shown to achieve the desired results. In certain embodiments, multi-small sample image classification and parallel processing are also possible or may be advantageous.

[0229] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments. In particular, for the device embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.

[0230] Those of ordinary skill in the art can understand that all or part of the steps to implement the above embodiments can be completed by hardware, or can be completed by instructing relevant hardware through a program. The program can be stored in a computer-readable storage medium. The above-mentioned storage medium can be a read-only memory, a disk, an optical disc, etc.

[0231] The above are only the preferred embodiments of the present application, and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. An automatically allocated sample testing method, characterized in that, Including: Obtain the position information of the target test tube rack; Determine whether the target test tube rack is in the single-instrument position; When the target test tube rack is not in the single-instrument position, obtain the instrument test information corresponding to each analytical instrument in real time; The single-instrument position indicates the sample loading position corresponding to any one of the analytical instruments; Based on the instrument test information of each analytical instrument, calculate the number of untested samples for each analytical instrument; Obtain the sample test information of the target test tube rack; Determine whether the number of tests to be assigned in the sample test information is greater than 0; When the number of tests to be assigned is greater than 0, determine the target instrument based on the sample test information; Determine whether the number of target instruments is greater than 1; When the number of target instruments is greater than 1, obtain the status information of each target instrument; the status information includes busy and not busy, and the status information is determined based on preset conditions; Prioritize selecting the target instrument with the status information of not busy; Determine whether the number of target instruments with the status information of not busy is greater than 0; When the number of target instruments with the status information of not busy is greater than 0, based on the rule of allocating as many tests as possible to one instrument, determine the target instrument that meets the rule; Determine whether the number of target instruments that meet the rule is greater than 1; When the number of target instruments that meet the rule is greater than 1, compare the number of untested samples of each target instrument, and determine the target instrument with the least number of untested samples; Determine whether the number of target instruments with the least number of untested samples is greater than 1; When the number of target instruments with the least number of untested samples is greater than 1, based on the position information of the target test tube rack and each target instrument with the least number of untested samples, allocate the target test tube rack to the target instrument closest to the target test tube rack; Recalculate the number of tests to be assigned for the target test tube rack; Repeat the steps of determining whether the number of tests to be assigned in the sample test information is greater than 0 to recalculating the number of tests to be assigned for the target test tube rack until the number of tests to be assigned for the target test tube rack is not greater than 0.

2. The automatically allocated sample testing method according to claim 1, characterized in that When the target test tube rack is in the single-instrument position, including: When the number of tests to be assigned for the target test tube rack is greater than 0, preferentially allocate as many tests as possible to the current analytical instrument; the current analytical instrument indicates the analytical instrument corresponding to the single-instrument position; Recalculate the number of tests to be assigned for the target test tube rack; Repeat the steps of determining whether the number of tests to be assigned in the sample test information is greater than 0 to recalculating the number of tests to be assigned for the target test tube rack until the number of tests to be assigned for the target test tube rack is not greater than 0.

3. The automatically assigned sample testing method according to claim 1, wherein When the number of target instruments is not greater than 1, including: Allocate the test to the target instrument; Recalculate the number of tests to be assigned for the target test tube rack; Repeat the steps of determining whether the number of tests to be assigned in the sample test information is greater than 0 to recalculating the number of tests to be assigned for the target test tube rack until the number of tests to be assigned for the target test tube rack is not greater than 0.

4. The automatically allocated sample testing method according to claim 1, wherein When the number of target instruments with the status information of not busy is not greater than 0, including: Determine whether the number of target instruments with the status information being busy is greater than 0; When the number of target instruments with the status information being busy is greater than 0, based on the rule of allocating as many tests as possible to one instrument, determine the target instruments that meet the rule; Determine whether the number of target instruments that meet the rule is greater than 1; When the number of target instruments that meet the rule is greater than 1, compare the number of untested samples of each target instrument, and determine the target instrument with the least number of untested samples; Determine whether the number of target instruments with the least number of untested samples is greater than 1; When the number of target instruments with the least number of untested samples is greater than 1, based on the position information of the target test tube rack and each target instrument with the least number of untested samples, allocate the target test tube rack to the target instrument closest to the target test tube rack; Recalculate the number of tests to be allocated for the target test tube rack; Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to the step of recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

5. The automatically allocated sample testing method according to claim 1, wherein When the number of target instruments that meet the rule is not greater than 1, it includes: Allocate the test to the target instrument; Recalculate the number of tests to be allocated for the target test tube rack; Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to the step of recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

6. The automatically allocated sample testing method according to claim 1, wherein When the number of target instruments with the least number of untested samples is not greater than 1, it includes: Allocate the test to the target instrument; Recalculate the number of tests to be allocated for the target test tube rack; Repeat the steps of determining whether the number of tests to be allocated in the sample test information is greater than 0 to the step of recalculating the number of tests to be allocated for the target test tube rack until the number of tests to be allocated for the target test tube rack is not greater than 0.

7. The automatically allocated sample testing method according to claim 1, wherein It further includes: Determine the test threshold of the analytical instrument according to the attribute information of the analytical instrument; When the total number of tests in the instrument test information does not reach the test threshold, determine that the status information of the analytical instrument is not busy; When the total number of tests in the instrument test information reaches the test threshold, determine that the status information of the analytical instrument is busy; Wherein, the total number of tests is the sum of the number of tests in progress and the number of untested samples.

8. An automatically allocated sample testing device, characterized in that, The device includes: A position information acquisition module, configured to acquire the position information of the target test tube rack; A first judgment module, configured to judge whether the target test tube rack is in a single-instrument position; An instrument information acquisition module, configured to, when the target test tube rack is not in the single-instrument position, acquire the instrument test information corresponding to each analytical instrument in real time; the single-instrument position indicates the sample loading position corresponding to any one of the analytical instruments; An untested sample number calculation module, configured to calculate the number of untested samples of each analytical instrument based on the instrument test information of each analytical instrument; A sample information acquisition module, configured to acquire the sample test information of the target test tube rack; A second judgment module, configured to judge whether the number of tests to be allocated in the sample test information is greater than 0; The first instrument determination module is configured to determine a target instrument based on the sample test information when the number of tests to be assigned is greater than 0. The third judgment module is configured to judge whether the number of the target instruments is greater than 1. The status information acquisition module is configured to acquire the status information of each of the target instruments when the number of the target instruments is greater than 1; the status information includes busy and not busy, and the status information is determined based on preset conditions. The priority selection module is configured to preferentially select the target instrument with the status information of not busy. The fourth judgment module is configured to judge whether the number of the target instruments with the status information of not busy is greater than 0. The second instrument determination module is configured to determine the target instrument that meets the rule based on the rule of allocating as many tests as possible to one instrument when the number of the target instruments with the status information of not busy is greater than 0. The fifth judgment module is configured to judge whether the number of the target instruments that meet the rule is greater than 1. The third instrument determination module is configured to compare the number of untested samples of each of the target instruments and determine the target instrument with the least number of untested samples when the number of the target instruments that meet the rule is greater than 1. The sixth judgment module is configured to judge whether the number of the target instruments with the least number of untested samples is greater than 1. The first allocation module is configured to allocate the target test tube rack to the target instrument closest to the target test tube rack based on the target test tube rack and the position information of each of the target instruments with the least number of untested samples when the number of the target instruments with the least number of untested samples is greater than 1. The recalculation module is configured to recalculate the number of tests to be assigned for the target test tube rack.

9. An electronic device, characterized in that, It includes a processor and a memory. At least one instruction or at least one program segment is stored in the memory. The at least one instruction or the at least one program segment is loaded and executed by the processor to implement the automatic allocation of sample test method according to any one of claims 1 to 7.

10. A computer-readable storage medium, in which at least one instruction or at least one program segment is stored. The at least one instruction or the at least one program segment is loaded and executed by a processor to implement the automatic allocation of sample test method according to any one of claims 1 to 7.

Images