Automatic test method for new energy fault ride-through and related product

Abstract

The embodiment of the invention relates to the technical field of new energy grid-connected testing, and provides an automatic testing method for new energy fault ride-through and related products, and the method comprises the steps: obtaining an impedance partial voltage value of a preset partial voltage impedance circuit according to a preset fault voltage value during voltage fault ride-through and a short-circuit impedance value of a system impedance circuit; acquiring an actual fault moment voltage value of the new energy grid-connected point; according to the fault voltage set value and the actual fault moment voltage value, a voltage comparison error is obtained; if the voltage comparison error is smaller than or equal to the preset threshold value, the impedance voltage division value of the preset voltage division impedance circuit is kept unchanged, and the next preset fault working condition is tested; and if the voltage comparison error is greater than the preset threshold value, adjusting the impedance voltage division value of the preset voltage division impedance circuit, and returning to the step of determining the fault triggering moment. According to the embodiment of the invention, the fault ride-through automatic test based on the impedance voltage division method can be realized, and the fault accuracy and the test efficiency are effectively improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of new energy grid connection testing, and in particular, to an automatic testing method for new energy fault ride-through and related products. Background Art

[0002] Automatic testing for new energy low / high voltage fault ride-through is an important testing item to verify whether new energy power generation equipment such as wind power generation and photovoltaic power generation can maintain grid connection operation ability under abnormal grid voltage conditions.

[0003] In the related technologies of automatic testing for new energy low / high voltage fault ride-through, an automatic testing model is usually established by changing the voltage value of the voltage source; when the impedance voltage division method is used for fault ride-through testing, since the impedance voltage division method involves line switching problems, and the setting of the impedance value has a great influence on voltage dip, it is not conducive to automatic testing model establishment. Summary of the Invention

[0004] The embodiments of the present application provide an automatic testing method for new energy fault ride-through and related products, which can realize automatic fault ride-through testing based on the impedance voltage division method, and effectively improve fault accuracy and testing efficiency.

[0005] In one aspect, the embodiments of the present application provide an automatic testing method for new energy fault ride-through, and the method includes:

[0006] Under a preset fault condition, determine a fault trigger moment; the fault trigger moment is used to indicate that a voltage fault ride-through occurs at the new energy grid connection point;

[0007] During voltage fault ride-through, control a preset voltage division impedance circuit to be connected in series with the system impedance circuit of the new energy grid connection point;

[0008] According to the preset fault voltage value during voltage fault ride-through and the short-circuit impedance value of the system impedance circuit, obtain the impedance voltage division value of the preset voltage division impedance circuit;

[0009] Obtain the actual fault moment voltage value of the new energy grid connection point after the preset voltage division impedance circuit is connected in series with the system impedance circuit;

[0010] According to the fault voltage set value and the actual fault moment voltage value, obtain a voltage comparison error;

[0011] If the voltage comparison error is less than or equal to a preset threshold, keep the impedance voltage division value of the preset voltage division impedance circuit unchanged, and test the next preset fault condition;

[0012] If the voltage comparison error is greater than the preset threshold, adjust the impedance voltage division value of the preset voltage division impedance circuit, and return to the step of determining the fault trigger moment.

[0013] On the other hand, an embodiment of the present application provides an automatic test device for new energy fault ride-through. The device includes:

[0014] A fault trigger time determination module, configured to determine a fault trigger time under a preset fault condition; the fault trigger time is used to indicate that a voltage fault ride-through occurs at a new energy grid connection point;

[0015] A voltage-dividing impedance input module, configured to control a preset voltage-dividing impedance circuit to be connected in series with a system impedance circuit of the new energy grid connection point during a voltage fault ride-through;

[0016] An impedance voltage-dividing value calculation module, configured to obtain an impedance voltage-dividing value of the preset voltage-dividing impedance circuit according to a preset fault voltage value during a voltage fault ride-through and a short-circuit impedance value of the system impedance circuit;

[0017] An actual voltage value acquisition module, configured to acquire an actual fault time voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit is connected in series with the system impedance circuit;

[0018] A voltage comparison error determination module, configured to obtain a voltage comparison error according to the set value of the fault voltage and the actual fault time voltage value;

[0019] An automatic test module, configured to keep the impedance voltage-dividing value of the preset voltage-dividing impedance circuit unchanged and test the next preset fault condition when the voltage comparison error is less than or equal to a preset threshold; and / or, when the voltage comparison error is greater than the preset threshold, adjust the impedance voltage-dividing value of the preset voltage-dividing impedance circuit and return to the step of determining the fault trigger time.

[0020] In yet another aspect, an embodiment of the present application further provides an electronic device, including: a processor, a memory, and a computer program stored on the memory and capable of running on the processor. When the computer program is executed by the processor, it implements the automatic test method for new energy fault ride-through according to any one of the above.

[0021] In yet another aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it implements the automatic test method for new energy fault ride-through according to any one of the above.

[0022] In yet another aspect, an embodiment of the present application further provides a computer program product containing instructions. When it runs on a computer, it causes the computer to execute the automatic test method for new energy fault ride-through described in the above aspects.

[0023] The automatic test method and related products for new energy fault ride-through provided by the embodiments of the present application determine the fault trigger moment under a preset fault condition. When a voltage fault ride-through occurs at the fault trigger moment, a preset voltage-dividing impedance circuit is controlled to be connected in series with the system impedance circuit at the new energy grid connection point, solving the line switching problem involved in the impedance voltage-dividing method. Then, according to the preset fault voltage value during voltage fault ride-through and the short-circuit impedance value of the system impedance short circuit, the impedance voltage-dividing value of the preset voltage-dividing circuit can be obtained. At this time, the actual fault moment voltage value at the new energy grid connection point after the preset voltage-dividing impedance circuit and the system impedance circuit are connected in series can be obtained, and according to the set value of the fault voltage and the actual fault moment voltage value, the voltage comparison error can be obtained. Furthermore, when the voltage comparison error is less than or equal to the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit remains unchanged, and the next preset fault condition is tested, enabling a complete set of automatic tests for fault ride-through including multiple preset fault conditions to be continuously completed without manual operation, effectively improving the test efficiency of new energy fault ride-through automatic tests. And, when the voltage comparison error is greater than the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit is adjusted, and the process returns to the step of determining the fault trigger moment, enabling the actual fault moment voltage value at the new energy grid connection point during voltage fault ride-through under the set impedance voltage-dividing value to meet the required values of voltage rise or drop while completing the automatic test, realizing the setting and correction of the impedance voltage-dividing value, and minimizing the impact of the setting of the impedance voltage-dividing value on voltage drop, thereby improving the fault drop accuracy. The embodiments of the present application can realize the automatic test of fault ride-through based on the impedance voltage-dividing method, effectively improving the fault accuracy and test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a topological schematic diagram of a new energy grid connection point with an input voltage-dividing impedance provided by the embodiments of the present application;

[0025] Figure 2 is a flowchart of the steps of an automatic test method for new energy fault ride-through provided by the embodiments of the present application;

[0026] Figure 3 is a schematic diagram of the process of automatic test for new energy fault ride-through provided by the embodiments of the present application;

[0027] Figure 4 is a structural block diagram of an automatic test device for new energy fault ride-through provided by the embodiments of the present application;

[0028] Figure 5 is a structural block diagram of an electronic device provided by the embodiments of the present application;

[0029] Figure 6 is a structural block diagram of a computer-readable storage medium provided by the embodiments of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0030] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present application.

[0031] The embodiments of the present application can realize the automatic test of fault ride-through based on the impedance voltage division method, effectively improving the fault accuracy and test efficiency.

[0032] Specifically, when a voltage fault ride-through occurs at the fault trigger moment, the preset voltage division impedance circuit can be controlled to be connected in series with the system impedance circuit of the new energy grid connection point, so as to solve the problem of line switching involved in the impedance voltage division method; moreover, the voltage comparison error after setting the impedance voltage division value at the new energy grid connection point can be obtained. When the voltage comparison error is less than or equal to the preset threshold, the impedance voltage division value of the preset voltage division impedance circuit is kept unchanged, and the next preset fault condition is tested, so that a complete set of automatic tests of fault ride-through including multiple preset fault conditions can be continuously completed without manual operation, effectively improving the test efficiency of the automatic test of new energy fault ride-through; and, when the voltage comparison error is greater than the preset threshold, the impedance voltage division value of the preset voltage division impedance circuit is adjusted, and the process returns to the step of determining the fault trigger moment, so that while the automatic test is completed, it can be ensured that the actual fault moment voltage value of the new energy grid connection point during voltage fault ride-through under the set impedance voltage division value meets the required value of voltage rise or drop, realizing the setting and correction of the impedance voltage division value, and minimizing the influence of the setting of the impedance voltage division value on voltage drop, thereby improving the fault drop accuracy.

[0033] In some embodiments of the present application, for the problem of line switching involved in the impedance voltage division method, refer to Figure 1 , which shows the topological schematic diagram of the new energy grid connection point for inputting the voltage division impedance provided by the embodiments of the present application.

[0034] As Figure 1 shown, it involves a power supply part 1, a system impedance part 2, a voltage division impedance part 3, and a new energy system part 4. Among them, the AC power supply in the power supply part 1 can output three-phase alternating current; the system impedance part 2 can include a system impedance X S composed of an inductor L S and a resistor R S , and this system impedance X SIt can be mainly used to simulate the equivalent impedance between the power supply and the line; the new energy system part 4 can refer to the relevant circuits of new energy power generation equipment such as wind power generation and photovoltaic power generation, such as the primary circuit of a wind turbine generator set, the primary circuit of a photovoltaic power generation system, etc., which are the target ends of power transmission.

[0035] The voltage-dividing impedance part 3 involves multiple groups of line switches and impedances. Specifically, the multiple groups of line switches can include a first switch group and a second switch group, and the first switch group and the second switch group are default open under normal circumstances. When the voltage fault ride-through is a low-voltage fault ride-through, the preset voltage-dividing impedance circuit in series with the system impedance circuit can be a first voltage-dividing impedance circuit including a first voltage-dividing impedance resistor and a voltage-dividing impedance inductor, where the series connection of the first voltage-dividing impedance circuit and the system impedance circuit is achieved by controlling the first switch group to close; when the voltage fault ride-through is a high-voltage fault ride-through, the preset voltage-dividing impedance circuit in series with the system impedance circuit is a second voltage-dividing impedance circuit including a second voltage-dividing impedance resistor and a voltage-dividing impedance capacitor, where the series connection of the second voltage-dividing impedance circuit and the system impedance circuit is achieved by controlling the second switch group to close.

[0036] Exemplarily, for the first switch group, such as S1-1, S1-2, and S1-3, when the switches S1-1, S1-2, and S1-3 are closed, the inductor L and resistor R1 on the first voltage-dividing impedance circuit can be used to simulate the equivalent inductance and resistance characteristics on the line; for the second switch group, such as S2-1, S2-2, and S2-3, when the switches S2-1, S2-2, and S2-3 are closed, the capacitor C and resistor R2 on the second voltage-dividing impedance circuit can be used to simulate the capacitance effect on the line. In practical applications, if a three-phase low-voltage fault ride-through occurs at the new energy grid connection point, S1-1, S1-2, and S1-3 in the first switch group can be turned on; if a two-phase low-voltage fault ride-through occurs at the new energy grid connection point, S1-1 and S1-2 in the first switch group can be turned on; if a three-phase high-voltage fault ride-through occurs at the new energy grid connection point, S2-1, S2-2, and S2-3 in the second switch group can be turned on; if a two-phase high-voltage fault ride-through occurs at the new energy grid connection point, S2-1 and S2-2 in the second switch group can be turned on.

[0037] In some embodiments of the present application, for each preset fault condition, when a voltage fault ride-through occurs, through the control of the first switch group or the second switch group as shown in Figure 1 , the preset voltage-dividing impedance circuit is controlled to be in series with the system impedance circuit of the new energy grid connection point, so as to achieve the purpose of solving the line switching problem involved in the impedance voltage division method.

[0038] Referring to Figure 2 , a step flow chart of an automatic test method for new energy fault ride-through provided by an embodiment of the present application is shown, which may specifically include the following steps:

[0039] Step S201, determine the fault trigger moment under a preset fault condition.

[0040] To solve the line switching problem involved in the impedance voltage division method, the fault trigger moment under a certain preset fault condition can be determined. The fault trigger moment can be used to indicate that a voltage fault crossing occurs at the new energy grid connection point, that is, a voltage fault crossing occurs at the fault trigger moment, so as to input the voltage division impedance during the voltage fault crossing.

[0041] In some embodiments of the present application, first, the fault start recording moment can be determined under a preset fault condition. Then, at the fault start recording moment, the voltage at the new energy grid connection point during the fault can be recorded, and the moment when the preset phase voltage crosses zero during the recording process can be determined as the fault trigger moment.

[0042] The fault start recording moment is earlier than the fault trigger moment. The fault start recording moment is usually affected by different preset fault conditions, and the embodiments of the present application do not limit this.

[0043] Optionally, assuming that the fault start recording moment is T0, at this time, the voltage at the new energy grid connection point during the fault can be recorded 3 s after T0, and the preset phase voltage, such as the A-phase voltage, can be identified during the recording process. When the moment when the A-phase voltage crosses zero is determined as the fault trigger moment T1.

[0044] Exemplarily, the specific expression for the fault trigger moment T1 can be as follows:

[0045]

[0046] In the formula, U A is the A-phase voltage, t is the actual time; U A (t) refers to the value of the A-phase voltage at the actual time t, refers to the value of the A-phase voltage at the actual time moment, where Δt is the simulation step length, which can mainly be used to indicate the time interval between two adjacent detection moments.

[0047] In the above expression, the determination condition of the fault trigger moment can be expressed as after t = T0 + 3 s, , that is, it is required that the A-phase voltage is greater than or equal to 0 at the actual time t, and the A-phase voltage is less than 0 at the moment, which means that the A-phase voltage has a zero-crossing change between these two adjacent moments (the interval is Δt). In some embodiments of the present application, after t = T0 + 3 s, when there is a certain moment t that satisfies U A (t) ≥ 0 and the previous moment satisfies When this occurs, the actual time t at this moment can be determined as the fault triggering moment T1, and the fault triggering moment can be accurately determined by detecting the zero-crossing of the phase A voltage.

[0048] Step S202: When a voltage fault rides through, control the preset voltage-dividing impedance circuit to be connected in series with the system impedance circuit at the new energy grid connection point.

[0049] As Figure 3 shown, when a voltage fault rides through, that is, when the actual time t is equal to the fault triggering moment T1, the preset voltage-dividing impedance circuit can be controlled to be connected in series with the system impedance circuit at the new energy grid connection point by controlling the first switch group S1 or the second switch group S2 as Figure 1 shown, so as to achieve the purpose of solving the line switching problem involved in the impedance voltage division method.

[0050] As an example, when the voltage fault ride-through is a low voltage fault ride-through, the preset voltage-dividing impedance circuit can be a first voltage-dividing impedance circuit including a first voltage-dividing impedance resistor and a voltage-dividing impedance inductor, that is, the first voltage-dividing impedance circuit formed by connecting the inductor L and the resistor R1 in series as Figure 1 shown. Specifically, when the voltage fault ride-through is a low voltage fault ride-through, the first switch group S1 between the first voltage-dividing impedance circuit and the system impedance circuit can be controlled to close, that is, S1-1, S1-2, and S1-3 as Figure 1 shown are closed to connect the voltage-dividing impedance, so that the first voltage-dividing impedance circuit is connected in series with the system impedance circuit. It should be noted that the second switch group S2, that is, S2-1, S2-2, and S2-3, is currently in the open state.

[0051] When the switches S1-1, S1-2, and S1-3 are closed, by connecting the first voltage-dividing impedance circuit composed of the inductor L and the resistor R, the inductive load of the new energy grid connection performance can be increased. The inductive load can play a role in suppressing current mutation and stabilizing current during the low voltage fault ride-through, so as to avoid damage to system equipment caused by excessive current impact, and at the same time contribute to maintaining the transient stability of the system. In some embodiments of the present application, in order to avoid affecting the power quality and efficiency of the normal operation of the system by connecting an additional load for a long time, the first switch group S1 can be controlled to close within a preset first time period, and after the preset first time period, the first switch group between the first voltage-dividing impedance circuit and the system impedance circuit can be controlled to open.

[0052] Optionally, when the voltage fault ride-through is a low voltage fault ride-through, assuming that the preset fault voltage value is the first fault voltage setting value U LVRT of the low voltage fault ride-through, when controlling the first switch group S1 to close and the second switch group S2 to open, it can have a continuous duration of a preset first time period, assumed to be t LVRT ; as Figure 3As shown, after a first preset duration t LVRT has elapsed, i.e., t > t LVRT , control the first switch group S1 to open. It should be noted that the first preset duration t LVRT can be determined based on the first fault voltage set value U LVRT , and the embodiments of the present application do not limit this.

[0053] As another example, when the voltage fault ride-through is a high-voltage fault ride-through, the preset voltage-dividing impedance circuit can be a second voltage-dividing impedance circuit including a second voltage-dividing impedance resistor and a voltage-dividing impedance capacitor, i.e., the second voltage-dividing impedance circuit formed by connecting the capacitor C and the resistor R2 in series as shown in Figure 1 . Specifically, when the voltage fault ride-through is a high-voltage fault ride-through, the second switch group S1 between the second voltage-dividing impedance circuit and the system impedance circuit can be controlled to close, i.e., turn on S2-1, S2-2, and S2-3 as shown in Figure 1 to insert the voltage-dividing impedance, so that the second voltage-dividing impedance circuit is connected in series with the system impedance circuit. It should be noted that the first switch group S2, i.e., S1-1, S1-2, and S1-3, is currently in the open state.

[0054] When the switches S2-1, S2-2, and S2-3 are closed, by connecting the second voltage-dividing impedance circuit composed of the capacitor C and the resistor R, the transient process of the system can be simplified during voltage faults, facilitating the stable control of the system. In some embodiments of the present application, to avoid the long-term connection of an additional load from affecting the power quality and efficiency of the normal operation of the system, the second switch group S2 can be controlled to close within a second preset duration, and after the second preset duration, the second switch group between the second voltage-dividing impedance circuit and the system impedance circuit can be controlled to open.

[0055] Optionally, when the voltage fault ride-through is a high-voltage fault ride-through, assuming that the preset fault voltage value is the second fault voltage set value U HVRT during high-voltage fault ride-through, when controlling the second switch group S2 to close and the first switch group S1 to open, there can be a duration of a second preset duration, assumed to be t HVRT ; as shown in Figure 3 , after a second preset duration t HVRT has elapsed, i.e., t > t HVRT , control the second switch group S2 to open. It should be noted that the second preset duration t HVRT can be determined based on the second fault voltage set value U HVRT , and the embodiments of the present application do not limit this.

[0056] Step S203: Obtain the impedance voltage division value of the preset voltage division impedance circuit according to the preset fault voltage value during voltage fault ride-through and the short-circuit impedance value of the system impedance circuit.

[0057] In the embodiments of the present application, during low-voltage or high-voltage fault ride-through, the impedance voltage division value of the preset voltage division impedance circuit that is put into operation can be calculated to realize the setting of the impedance value during the automatic test of new energy fault ride-through.

[0058] In some embodiments of the present application, when the voltage fault ride-through is a low-voltage fault ride-through, the preset fault voltage value is the first fault voltage setting value during the low-voltage fault ride-through, and the impedance voltage division value to be calculated includes the voltage division impedance value of the first voltage division impedance circuit, the resistance value of the first voltage division impedance resistor, and the inductance value of the voltage division impedance inductor.

[0059] Specifically, the voltage division impedance value of the first voltage division impedance circuit can be calculated by using the first fault voltage setting value and the short-circuit impedance value of the system impedance circuit, and then the resistance value of the first voltage division impedance resistor and the inductance value of the voltage division impedance inductor can be calculated by using the voltage division impedance value of the first voltage division impedance circuit.

[0060] Exemplarily, the specific calculation formula can be as follows:

[0061]

[0062]

[0063]

[0064] In the formula, is the first fault voltage setting value during the low-voltage fault ride-through, which is a per-unit value with the unit p.u. (abbreviation for per unit); X S is the short-circuit impedance value of the system impedance circuit, which is a known number and can be determined according to the actual system; X1 is the voltage division impedance value of the first voltage division impedance circuit, R1 is the resistance value in the first voltage division impedance circuit, L is the inductance value in the first voltage division impedance circuit, and f is the frequency value.

[0065] In some embodiments of the present application, when the voltage fault ride-through is a high-voltage fault ride-through, the preset fault voltage value is the second fault voltage setting value during the high-voltage fault ride-through, and the impedance voltage division value to be calculated can include the voltage division impedance value of the second voltage division impedance circuit, the voltage division impedance value of the second voltage division impedance resistor, and the capacitance value of the voltage division impedance capacitor.

[0066] Specifically, the voltage division impedance value of the second voltage division impedance circuit can be calculated by using the second fault voltage setting value and the short-circuit impedance value of the system impedance circuit, and then the resistance value of the second voltage division impedance resistor and the capacitance value of the voltage division impedance capacitor can be calculated by using the voltage division impedance value of the second voltage division impedance circuit.

[0067] Exemplarily, the specific calculation formula can be as follows:

[0068]

[0069]

[0070]

[0071] In the formula, is the second fault voltage setting value during high-voltage fault ride-through, which is a per-unit value with the unit p.u.; X S is the short-circuit impedance value of the system impedance circuit, which is a known number and can be determined according to the actual system; X2 is the voltage division impedance value of the second voltage division impedance circuit, R2 is the resistance value in the second voltage division impedance circuit, C is the capacitance value in the second voltage division impedance circuit, and f is the frequency value.

[0072] Step S204, obtain the actual fault moment voltage value at the new energy grid connection point after the preset voltage division impedance circuit and the system impedance circuit are connected in series.

[0073] Step S205, obtain the voltage comparison error according to the fault voltage setting value and the actual fault moment voltage value.

[0074] Since the setting of the impedance value has a great influence on the voltage dip, in order to verify whether the actual fault moment voltage value during voltage fault ride-through is consistent with the required value of voltage dip or rise under the setting of the impedance voltage division value, the actual fault moment voltage value can be obtained at this time, and the impedance voltage division value can be set or further corrected based on the voltage comparison error determined by the actual fault moment voltage value and the fault voltage setting value.

[0075] Optionally, the obtained actual fault moment voltage value refers to the actual fault moment voltage value at the new energy grid connection point after the preset voltage division impedance circuit and the system impedance circuit are connected in series, that is, specifically the actual fault moment voltage value at the new energy grid connection point after the voltage division impedance is put into use, and the actual fault moment voltage value will be affected by the put-in voltage division impedance.

[0076] In some embodiments of the present application, during the recording process of the new energy grid connection point starting from the fault start recording moment, the current and voltage waveform conditions of the new energy grid connection point under the preset fault conditions can be recorded, and at this time, the actual fault moment voltage value of the new energy grid connection point can be extracted from the recording result.

[0077] Specifically, first, the recording operation can be ended after a preset third duration starting from the moment when the fault starts to be recorded, and a recording result can be obtained, so as to extract the actual fault moment voltage value of the new energy grid connection point from the recording result. Among them, in order to ensure the integrity of the recording, the preset third duration is usually greater than the preset first duration and the preset second duration when the voltage dividing impedance is put into use. The embodiments of the present application do not limit this.

[0078] Exemplarily, assuming that the preset third duration is 20 s, as Figure 3 shown, in the case of t = T0 + 20 s, the recording can be ended. At this time, the actual fault moment voltage value of the new energy grid connection point can be obtained according to the recording result, and the voltage comparison error can be calculated with the target voltage dip. Among them, the target voltage dip can be a preset fault voltage value during voltage fault ride-through.

[0079] The specific calculation formula can be as follows:

[0080] Low voltage fault ride-through:

[0081] High voltage fault ride-through:

[0082] In the formula, U F is the actual fault moment voltage value, and ΔU F is the voltage comparison error.

[0083] Step S206, if the voltage comparison error is less than or equal to a preset threshold, keep the impedance voltage division value of the preset voltage dividing impedance circuit unchanged, and test the next preset fault condition.

[0084] In one case, when the voltage comparison error is less than or equal to the preset threshold, the impedance voltage division value of the preset voltage dividing impedance circuit can be kept unchanged, and the next preset fault condition can be tested, so that a complete set of automatic tests for fault ride-through including multiple preset fault conditions can be continuously completed without manual operation, effectively improving the test efficiency of the new energy fault ride-through automatic test.

[0085] It should be noted that the preset threshold is used to indicate the required value of voltage drop or rise. The determination of this value is related to the specific preset fault condition, and the embodiments of the present application do not limit this.

[0086] Exemplarily, assuming that during low voltage fault ride-through, the required value of voltage drop is 0.05 p.u., as Figure 3 shown, if ΔU F≤0.05pu, it means that under the current setting of the impedance voltage divider value, the actual fault voltage value of the new energy grid connection point during the voltage fault crossing can meet the required value of the voltage drop. At this time, the impedance voltage divider value of the first voltage divider impedance circuit under the current preset fault condition can be set according to the current impedance voltage divider value, that is, the resistor R1 and inductor L corresponding to the current impedance voltage divider value are applied to the new energy grid connection. Optionally, the result can also be output at this time, specifically the voltage and current waveforms of the new energy grid connection point at the time of the fault, which is not limited in the embodiment of the present application.

[0087] In some embodiments of the present application, after the result is output, it indicates that the setting of the impedance voltage divider value for the current preset fault condition has been completed. Figure 3 As shown, the next preset fault condition can be tested continuously until all conditions are tested.

[0088] Step S207: if the voltage comparison error is greater than the preset threshold, the impedance voltage division value of the preset voltage division impedance circuit is adjusted, and the process returns to the step of determining the fault triggering time.

[0089] In another case, when the voltage comparison error is greater than a preset threshold, the impedance divider value of the preset voltage divider impedance circuit can be adjusted, and the step of determining the fault triggering moment can be returned to complete the automatic test, so that the actual fault voltage value of the new energy grid-connected point when the voltage fault is crossed under the impedance divider value setting can be guaranteed to meet the required value of voltage rise or drop, thereby realizing the setting and correction of the impedance divider value, minimizing the influence of the impedance divider value setting on the voltage drop, and thereby improving the fault drop accuracy.

[0090] It should be noted that the preset threshold is used to indicate the required value of voltage drop or increase, and the determination of this value is related to the specific preset fault condition, which is not limited in this embodiment of the present application.

[0091] For example, it is assumed that the required voltage drop value is 0.05 pu during low voltage fault ride-through. Figure 3 As shown, if ΔU F >0.05pu, it means that under the current setting of the impedance voltage divider value, the actual fault voltage value of the new energy grid-connected point during the voltage fault ride-through does not meet the required value of the voltage drop, which means that there is a large gap between the actual fault drop voltage and the required value of the drop voltage when the impedance voltage divider method is used for fault ride-through test. At this time, the current impedance voltage divider value can be corrected or adjusted to minimize the impact of the impedance voltage divider value setting on the voltage drop.

[0092] The specific adjustment formula can be shown as follows:

[0093] Low voltage fault ride-through: , ,

[0094] High - voltage fault ride - through: , ,

[0095] Wherein, a is the impedance adjustment coefficient; is the divided - voltage impedance value after correction of the first divided - voltage impedance circuit, is the resistance value after correction of the first divided - voltage impedance resistor, is the inductance value after modification of the divided - voltage impedance inductor in the first divided - voltage impedance circuit; is the divided - voltage impedance value after correction of the second divided - voltage impedance circuit, is the resistance value after correction of the second divided - voltage impedance resistor, is the capacitance value after modification of the divided - voltage impedance capacitor in the second divided - voltage impedance circuit.

[0096] In some embodiments of the present application, as Figure 3 shown, after adjusting the impedance divided - voltage value, it is possible to return to the step of determining the fault trigger moment, and repeat steps S201 - S207 to further verify whether the actual fault moment voltage value during voltage fault ride - through is consistent with the required value of voltage dip or rise under the set adjusted impedance divided - voltage value.

[0097] Optionally, after completing the test of the current preset fault condition, it is possible to continue testing the next preset fault condition until all conditions are tested.

[0098] Exemplarily, an engineering test table including multiple preset fault conditions can be as shown in Table 1 below:

[0099] Table 1 Engineering Test Table

[0100]

[0101] Optionally, as Figure 3 shown, it is possible to determine whether all conditions shown in Table 1 have been tested. If the test is completed, it means that the automatic test of new - energy fault ride - through has ended, and a complete set of automatic tests for fault ride - through including multiple preset fault conditions has been continuously completed; if the test is not completed, it means that at this time, it is possible to automatically change the preset fault condition to be tested, and repeat steps S201 - S207 until all conditions are tested.

[0102] In the embodiment of the present application, by determining the fault trigger moment under a preset fault condition, when a voltage fault ride-through occurs at the fault trigger moment, the preset voltage-dividing impedance circuit is controlled to be connected in series with the system impedance circuit of the new energy grid connection point, so as to solve the line switching problem involved in the impedance voltage-dividing method; then, according to the preset fault voltage value at the time of voltage fault ride-through and the short-circuit impedance value of the system impedance short circuit, the impedance voltage-dividing value of the preset voltage-dividing circuit can be obtained. At this time, the actual fault moment voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit and the system impedance circuit are connected in series can be obtained, and according to the set value of the fault voltage and the actual fault moment voltage value, the voltage comparison error can be obtained. Furthermore, when the voltage comparison error is less than or equal to the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit is kept unchanged, and the next preset fault condition is tested, so that a complete set of automatic tests for fault ride-through including multiple preset fault conditions can be continuously completed without manual operation, effectively improving the test efficiency of the new energy fault ride-through automatic test; and, when the voltage comparison error is greater than the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit is adjusted, and the process returns to the step of determining the fault trigger moment, so that while the automatic test is completed, it can be ensured that the actual fault moment voltage value of the new energy grid connection point at the time of voltage fault ride-through under the set impedance voltage-dividing value meets the required value of voltage rise or drop, realizing the setting and correction of the impedance voltage-dividing value, and trying to avoid the influence of the setting of the impedance voltage-dividing value on the voltage dip, thereby improving the fault dip accuracy. The embodiment of the present application can realize the automatic test of fault ride-through based on the impedance voltage-dividing method, effectively improving the fault accuracy and test efficiency.

[0103] It should be noted that, for the method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the embodiments of the present application are not limited by the described action sequence, because according to the embodiments of the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions involved are not necessarily essential to the embodiments of the present application.

[0104] Referring to Figure 4 , a structural block diagram of an automatic test device for new energy fault ride-through provided by an embodiment of the present application is shown, which may specifically include the following modules:

[0105] A fault trigger moment determination module 401, configured to determine a fault trigger moment under a preset fault condition; the fault trigger moment is used to indicate that a voltage fault ride-through occurs at the new energy grid connection point;

[0106] A voltage-dividing impedance input module 402, configured to control a preset voltage-dividing impedance circuit to be connected in series with a system impedance circuit of a new energy grid connection point during a voltage fault ride-through;

[0107] The impedance voltage division value calculation module 403 is configured to obtain the impedance voltage division value of the preset voltage division impedance circuit according to the preset fault voltage value during voltage fault ride-through and the short-circuit impedance value of the system impedance circuit;

[0108] The actual voltage value acquisition module 404 is configured to acquire the actual fault moment voltage value of the new energy grid connection point after the preset voltage division impedance circuit and the system impedance circuit are connected in series;

[0109] The voltage comparison error determination module 405 is configured to obtain the voltage comparison error according to the fault voltage setting value and the actual fault moment voltage value;

[0110] The automatic test module 406 is configured to, when the voltage comparison error is less than or equal to the preset threshold, keep the impedance voltage division value of the preset voltage division impedance circuit unchanged and test the next preset fault condition; and / or, when the voltage comparison error is greater than the preset threshold, adjust the impedance voltage division value of the preset voltage division impedance circuit and return to the step of determining the fault trigger moment.

[0111] In some embodiments of the present application, the fault trigger moment determination module 401 may include the following sub-modules:

[0112] The fault trigger moment determination sub-module is configured to, under the preset fault condition, determine the fault start recording moment; perform a voltage recording operation on the new energy grid connection point fault at the fault start recording moment, and determine the fault trigger moment as the moment when the preset phase voltage passes through zero during the recording process.

[0113] In some embodiments of the present application, when the voltage fault ride-through is a low voltage fault ride-through, the preset voltage division impedance circuit is a first voltage division impedance circuit including a first voltage division impedance resistor and a voltage division impedance inductor; the voltage division impedance input module 402 may include the following sub-modules:

[0114] The first voltage division impedance input sub-module is configured to, when the voltage fault ride-through is a low voltage fault ride-through, control the first switch group between the first voltage division impedance circuit and the system impedance circuit to close within a preset first duration, so that the first voltage division impedance circuit and the system impedance circuit are connected in series; and, after the preset first duration, control the first switch group between the first voltage division impedance circuit and the system impedance circuit to open.

[0115] In some embodiments of the present application, when the voltage fault ride-through is a low voltage fault ride-through, the preset fault voltage value is the first fault voltage setting value during the low voltage fault ride-through, and the impedance voltage division value includes the voltage division impedance value of the first voltage division impedance circuit, the resistance value of the first voltage division impedance resistor, and the inductance value of the voltage division impedance inductor; the impedance voltage division value calculation module 403 may include the following sub-modules:

[0116] The first impedance voltage division value calculation sub-module is used to calculate the voltage division impedance value of the first voltage division impedance circuit by using the first fault voltage setting value and the short-circuit impedance value of the system impedance circuit; and calculate the resistance value of the first voltage division impedance resistor and the inductance value of the voltage division impedance inductor by using the voltage division impedance value of the first voltage division impedance circuit.

[0117] In some embodiments of the present application, when the voltage fault ride-through is a high-voltage fault ride-through, the preset voltage division impedance circuit is a second voltage division impedance circuit including a second voltage division impedance resistor and a voltage division impedance capacitor; the voltage division impedance input module 402 may include the following sub-modules:

[0118] The second voltage division impedance input sub-module is used to control the second switch group between the second voltage division impedance circuit and the system impedance circuit to close within a preset second time period when the voltage fault ride-through is a high-voltage fault ride-through, so that the second voltage division impedance circuit is connected in series with the system impedance circuit; and after the preset second time period, control the second switch group between the second voltage division impedance circuit and the system impedance circuit to open.

[0119] In some embodiments of the present application, when the voltage fault ride-through is a high-voltage fault ride-through, the preset fault voltage value is the second fault voltage setting value during the high-voltage fault ride-through, and the impedance voltage division value includes the voltage division impedance value of the second voltage division impedance circuit, the voltage division impedance value of the second voltage division impedance resistor, and the capacitance value of the voltage division impedance capacitor; the impedance voltage division value calculation module 403 may include the following sub-modules:

[0120] The second impedance voltage division value calculation sub-module is used to calculate the voltage division impedance value of the second voltage division impedance circuit by using the second fault voltage setting value and the short-circuit impedance value of the system impedance circuit; and calculate the resistance value of the second voltage division impedance resistor and the capacitance value of the voltage division impedance capacitor by using the voltage division impedance value of the second voltage division impedance circuit.

[0121] In some embodiments of the present application, the actual voltage value acquisition module 404 may include the following sub-modules:

[0122] The actual voltage value extraction sub-module is used to end the recording operation after a preset third time period starting from the fault start recording moment to obtain a recording result; and extract the actual fault moment voltage value of the new energy grid connection point from the recording result.

[0123] In the embodiments of the present application, by determining the fault trigger moment under a preset fault condition, when a voltage fault ride-through occurs at the fault trigger moment, the preset voltage-dividing impedance circuit is controlled to be connected in series with the system impedance circuit of the new energy grid connection point, so as to solve the problem of line switching involved in the impedance voltage-dividing method; then, according to the preset fault voltage value at the time of voltage fault ride-through and the short-circuit impedance value of the system impedance short circuit, the impedance voltage-dividing value of the preset voltage-dividing circuit can be obtained. At this time, the actual fault moment voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit and the system impedance circuit are connected in series can be obtained, and according to the set value of the fault voltage and the actual fault moment voltage value, the voltage comparison error can be obtained. Furthermore, when the voltage comparison error is less than or equal to the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit is kept unchanged, and the next preset fault condition is tested, so that a complete set of automatic tests for fault ride-through including multiple preset fault conditions can be continuously completed without manual operation, effectively improving the test efficiency of the new energy fault ride-through automatic test; and, when the voltage comparison error is greater than the preset threshold, the impedance voltage-dividing value of the preset voltage-dividing impedance circuit is adjusted, and the process returns to the step of determining the fault trigger moment, so that while the automatic test is completed, it can be ensured that the actual fault moment voltage value of the new energy grid connection point at the time of voltage fault ride-through under the set impedance voltage-dividing value meets the required value of voltage rise or fall, realizing the setting and correction of the impedance voltage-dividing value, and avoiding the influence of the setting of the impedance voltage-dividing value on voltage dip as much as possible, thereby improving the fault dip accuracy. The embodiments of the present application can realize the automatic test of fault ride-through based on the impedance voltage-dividing method, effectively improving the fault accuracy and test efficiency.

[0124] For the device embodiments, since they are basically similar to the method embodiments, the description is relatively simple. For the relevant parts, refer to the partial description of the method embodiments.

[0125] The embodiments of the present application also provide an electronic device. Refer to Figure 5 , the provided electronic device 500 includes a memory 510, a processor 520, and a computer program 511 stored on the memory 510 and capable of running on the processor 520. When the computer program 511 is executed by the processor, it realizes each process of the above-mentioned embodiment of the automatic test method for new energy fault ride-through, and can achieve the same technical effect. To avoid repetition, it will not be elaborated here.

[0126] The embodiments of the present application also provide a computer-readable storage medium. Refer to Figure 6 , the computer-readable storage medium 600 stores a computer program 511. When the computer program 511 is executed by the processor, it realizes each process of the above-mentioned embodiment of the automatic test method for new energy fault ride-through, and can achieve the same technical effect. To avoid repetition, it will not be elaborated here.

[0127] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference can be made to each other.

[0128] It should be noted that the terms "first", "second", etc. in the description of the embodiments of this application, the claims and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily need to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances, so that the embodiments described here can be implemented in an order other than that shown or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device including a series of steps or modules does not necessarily have to be limited to those steps or modules clearly listed, but may include other steps or modules not clearly listed or inherent to these processes, methods, products or devices. The division of modules in the embodiments of this application is only a logical division. In actual implementation, there may be other division methods. For example, multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the shown or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections between modules can be electrical or other similar forms, which are not limited in the embodiments of this application. And the modules or sub-modules described as separate components may or may not be physically separated, may or may not be physical modules, or may be distributed to multiple circuit modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of the embodiments of this application.

[0129] In the above embodiments, the descriptions of the various embodiments have their own focuses. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0130] Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, devices and modules described above can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated here.

[0131] In several embodiments provided by the embodiments of the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling, direct coupling, or communication connection between each other can be through some interfaces, and the indirect coupling or communication connection of the devices or modules can be in electrical, mechanical, or other forms.

[0132] The modules described as separate components may or may not be physically separated. The components displayed as modules may or may not be physical modules, that is, they may be located in one place or distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0133] In addition, in each embodiment of the embodiments of the present application, each functional module can be integrated in a processing module, or each module can exist physically alone, or two or more modules can be integrated in one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium.

[0134] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product.

[0135] The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the processes or functions according to the embodiments of the present application are wholly or partially generated. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions may be transmitted from a website, computer, server, or data center to another website, computer, server, or data center by wire (such as coaxial cable, optical fiber, Digital Subscriber Line (DSL)) or wirelessly (such as infrared, wireless, microwave, etc.). The computer-readable storage medium may be any available medium that can be stored by a computer or a data storage device such as a server or data center that includes one or more integrated available media. The available medium may be a magnetic medium (such as a floppy disk, hard disk, magnetic tape), an optical medium (such as a DVD), or a semiconductor medium (such as a Solid State Disk (SSD)), etc.

[0136] The embodiments of the present application are described with reference to the flowcharts and / or block diagrams of methods, terminal devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, and the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing terminal device to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing terminal device generate a device for implementing the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0137] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal device to work in a specific manner, such that the instructions stored in the computer-readable memory generate a manufactured article including an instruction device that implements the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks; these computer program instructions can also be loaded onto a computer or other programmable data processing terminal device, such that a series of operation steps are executed on the computer or other programmable terminal device to generate a computer-implemented process, so that the instructions executed on the computer or other programmable terminal device provide for implementing the functions inFigure 1 one process or multiple processes and / or blocks Figure 1 steps of the functions specified in one block or multiple blocks.

[0138] Although the preferred embodiments of the embodiments of the present application have been described, those skilled in the art can make additional changes and modifications to these embodiments once they learn the basic creative concepts. Therefore, the appended claims are intended to be construed to include the preferred embodiments and all changes and modifications falling within the scope of the embodiments of the present application.

[0139] Finally, it should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or fully authorized by all parties. Moreover, the collection, use, and processing of relevant data need to comply with the relevant laws, regulations, and standards of relevant countries and regions, and corresponding operation entrances are provided for users to choose to authorize or refuse.

[0140] The technical solutions provided by the embodiments of the present application have been introduced in detail above. Specific examples are used in the embodiments of the present application to elaborate on the principles and implementation manners of the embodiments of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the embodiments of the present application; at the same time, for those of ordinary skill in the art, based on the idea of the embodiments of the present application, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation to the embodiments of the present application.

Claims

1. An automatic test method for new energy fault ride-through, characterized in that The method includes: Under a preset fault condition, determining a fault trigger moment; the fault trigger moment is used to indicate that a voltage fault ride-through occurs at a new energy grid connection point; During the voltage fault ride-through, controlling a preset voltage-dividing impedance circuit to be connected in series with a system impedance circuit of the new energy grid connection point; According to a preset fault voltage value during the voltage fault ride-through and a short-circuit impedance value of the system impedance circuit, obtaining an impedance voltage-dividing value of the preset voltage-dividing impedance circuit; Obtaining an actual fault moment voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit is connected in series with the system impedance circuit; According to the fault voltage set value and the actual fault moment voltage value, obtaining a voltage comparison error; If the voltage comparison error is less than or equal to a preset threshold, keeping the impedance voltage-dividing value of the preset voltage-dividing impedance circuit unchanged and testing the next preset fault condition; If the voltage comparison error is greater than the preset threshold, adjusting the impedance voltage-dividing value of the preset voltage-dividing impedance circuit and returning to the step of determining the fault trigger moment.

2. The method according to claim 1, characterized in that, The determining the fault trigger moment under the preset fault condition includes: Under the preset fault condition, determining a fault start recording moment; Performing a voltage recording operation on the new energy grid connection point during the fault at the fault start recording moment, and determining the moment when a preset phase voltage crosses zero during the recording process as the fault trigger moment.

3. The method according to claim 1, wherein When the voltage fault ride-through is a low voltage fault ride-through, the preset voltage-dividing impedance circuit is a first voltage-dividing impedance circuit including a first voltage-dividing impedance resistor and a voltage-dividing impedance inductor; The controlling the preset voltage-dividing impedance circuit to be connected in series with the system impedance circuit of the new energy grid connection point during the voltage fault ride-through includes: When the voltage fault ride-through is a low voltage fault ride-through, controlling a first switch group between the first voltage-dividing impedance circuit and the system impedance circuit to be closed within a preset first time period, so that the first voltage-dividing impedance circuit is connected in series with the system impedance circuit; After the preset first time period, the method further includes: Controlling the first switch group between the first voltage-dividing impedance circuit and the system impedance circuit to be disconnected.

4. The method according to claim 3, characterized in that When the voltage fault ride-through is a low voltage fault ride-through, the preset fault voltage value is a first fault voltage set value during the low voltage fault ride-through, and the impedance voltage-dividing value includes a voltage-dividing impedance value of the first voltage-dividing impedance circuit, a resistance value of the first voltage-dividing impedance resistor, and an inductance value of the voltage-dividing impedance inductor; The obtaining the impedance voltage-dividing value of the preset voltage-dividing impedance circuit according to the preset fault voltage value during the voltage fault ride-through and the short-circuit impedance value of the system impedance circuit includes: Using the first fault voltage set value and the short-circuit impedance value of the system impedance circuit to calculate and obtain the voltage-dividing impedance value of the first voltage-dividing impedance circuit; Using the voltage-dividing impedance value of the first voltage-dividing impedance circuit to calculate and obtain the resistance value of the first voltage-dividing impedance resistor and the inductance value of the voltage-dividing impedance inductor.

5. The method according to claim 1, characterized in that When the voltage fault ride-through is a high voltage fault ride-through, the preset voltage-dividing impedance circuit is a second voltage-dividing impedance circuit including a second voltage-dividing impedance resistor and a voltage-dividing impedance capacitor; When there is a voltage fault ride-through, controlling the preset voltage-dividing impedance circuit to be connected in series with the system impedance circuit of the new energy grid connection point includes: When the voltage fault ride-through is a high-voltage fault ride-through, controlling the second switch group between the second voltage-dividing impedance circuit and the system impedance circuit to close within a preset second time period, so that the second voltage-dividing impedance circuit is connected in series with the system impedance circuit; After the preset second time period, the method further includes: Controlling the second switch group between the second voltage-dividing impedance circuit and the system impedance circuit to open.

6. The method according to claim 5, wherein When the voltage fault ride-through is a high-voltage fault ride-through, the preset fault voltage value is the second fault voltage setting value during the high-voltage fault ride-through, and the impedance voltage-dividing value includes the voltage-dividing impedance value of the second voltage-dividing impedance circuit, the voltage-dividing impedance value of the second voltage-dividing impedance resistor, and the capacitance value of the voltage-dividing impedance capacitor; Obtaining the impedance voltage-dividing value of the preset voltage-dividing impedance circuit according to the preset fault voltage value during the voltage fault ride-through and the short-circuit impedance value of the system impedance circuit includes: Using the second fault voltage setting value and the short-circuit impedance value of the system impedance circuit to calculate the voltage-dividing impedance value of the second voltage-dividing impedance circuit; Calculating the resistance value of the second voltage-dividing impedance resistor and the capacitance value of the voltage-dividing impedance capacitor using the voltage-dividing impedance value of the second voltage-dividing impedance circuit.

7. The method according to claim 2, characterized in that Obtaining the actual fault moment voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit is connected in series with the system impedance circuit includes: After a preset third time period starting from the fault start recording moment, ending the recording operation to obtain a recording result; Extracting the actual fault moment voltage value of the new energy grid connection point from the recording result.

8. An automatic test device for new energy fault ride-through, characterized in that, The device includes: A fault trigger moment determination module, configured to determine a fault trigger moment under a preset fault condition; the fault trigger moment is used to indicate that a voltage fault ride-through occurs at the new energy grid connection point; A voltage-dividing impedance input module, configured to control the preset voltage-dividing impedance circuit to be connected in series with the system impedance circuit of the new energy grid connection point during a voltage fault ride-through; An impedance voltage-dividing value calculation module, configured to obtain the impedance voltage-dividing value of the preset voltage-dividing impedance circuit according to the preset fault voltage value during the voltage fault ride-through and the short-circuit impedance value of the system impedance circuit; An actual voltage value acquisition module, configured to acquire the actual fault moment voltage value of the new energy grid connection point after the preset voltage-dividing impedance circuit is connected in series with the system impedance circuit; A voltage comparison error determination module, configured to obtain a voltage comparison error according to the fault voltage setting value and the actual fault moment voltage value; An automatic test module, configured to keep the impedance voltage-dividing value of the preset voltage-dividing impedance circuit unchanged and test the next preset fault condition when the voltage comparison error is less than or equal to a preset threshold; and / or, when the voltage comparison error is greater than the preset threshold, adjust the impedance voltage-dividing value of the preset voltage-dividing impedance circuit and return to the step of determining the fault trigger moment.

9. An electronic device, characterized in that, Includes: A processor, a memory, and a computer program stored on the memory and capable of running on the processor, wherein when the computer program is executed by the processor, it implements the automatic test method for new energy fault ride-through according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, it implements the automatic test method for new energy fault ride-through according to any one of claims 1 to 7.

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