Conductive performance test system for diode

Abstract

The invention relates to the field of performance testing, in particular to a conductivity testing system for a diode, which draws a volt-ampere characteristic curve of the diode through a data analysis unit according to voltage at two ends of the diode and current flowing through the diode, and calculates the conductivity of the diode according to a fitting value of the volt-ampere characteristic curve and a standard curve. And calculating the conductivity characterization parameter of the diode according to the maximum temperature difference value of the diode image and the thermal image, judging whether to test the conductivity of the diode or not through the conductivity test unit according to the conductivity characterization parameter of the diode, and adjusting the output voltage of the power supply module. According to the invention, the conductivity of the diode is comprehensively represented through a plurality of indexes, so that the accuracy and reliability of the test are improved. The audio frequency in the process of testing the conductivity of the diode is obtained, and whether the conductivity of the diode is abnormal or not is judged by combining the characterization parameters of the conductivity of the diode.

Description

Technical Field

[0001] The present invention relates to the field of performance testing, and particularly to a conductive performance testing system for diodes. Background Art

[0002] In recent years, with the continuous development of electronic technology, the requirements for the performance of diodes have become increasingly high. In electronic devices and circuit designs, as a basic semiconductor component, the accurate evaluation of the conductive performance of diodes is crucial for ensuring the stability and reliability of circuits. Existing diode testing technologies have certain limitations in evaluating conductive performance. Therefore, it is necessary to research diode testing technologies that can more comprehensively and accurately evaluate the performance of diodes to provide strong support for the design and manufacture of electronic devices.

[0003] For example, Chinese Patent Publication No.: CN103558538A discloses a light-emitting diode testing device including a fixed substrate, a plurality of heat-conducting parts disposed on the fixed substrate for respectively carrying light-emitting diodes and being in thermally conductive contact with the light-emitting diodes, and a plurality of electrical connection parts disposed on the fixed substrate for respectively making electrical conductive connections with the light-emitting diodes. Each electrical connection part includes a first electrical connection part and a second electrical connection part for respectively making electrical conductive connections with the light-emitting diodes. The heat-conducting part can elastically expand and contract relative to the first electrical connection part and the second electrical connection part of the electrical connection part, so as to mount the light-emitting diode on the heat-conducting part and the heat-conducting part presses the light-emitting diode against the first electrical connection part and the second electrical connection part of the electrical connection part or take the light-emitting diode off the heat-conducting part. The light-emitting diode testing device of this invention is convenient and fast to operate and has a high test working efficiency.

[0004] However, the following problems still exist in the prior art.

[0005] In the prior art, when evaluating the conductive performance of diodes, only the voltage or current angle is used to evaluate diodes, without considering the influence of the environment on the conductive performance of diodes, nor considering whether there is an abnormality in the conductive performance of diodes when there is a large voltage change, resulting in a problem of low reliability in the conductive performance test of diodes. Summary of the Invention

[0006] Therefore, the present invention provides a conductive performance testing system for diodes to overcome the problem in the prior art that when evaluating the conductive performance of diodes, only the voltage or current angle is used to evaluate diodes, without considering the influence of the environment on the conductive performance of diodes, nor considering whether there is an abnormality in the conductive performance of diodes when there is a large voltage change, resulting in a problem of low reliability in the conductive performance test of diodes.

[0007] To achieve the above object, the present invention provides a conductive performance testing system for diodes, including:

[0008] A power supply module, including an adjustable DC power supply, and the adjustable DC power supply adjusts the output voltage according to a preset voltage change step and time interval;

[0009] A diode measurement module, including a voltage measurement unit for measuring the voltage across the diode, a current measurement unit for measuring the current flowing through the diode, a temperature measurement unit for obtaining a thermal imaging diagram of the diode, an image acquisition unit for obtaining an image of the diode, and an audio acquisition unit for obtaining the audio during the conductive performance test process of the diode;

[0010] A data processing module, connected to the diode measurement module, including a data analysis unit and a conductive performance test unit,

[0011] The data analysis unit is used to draw the volt-ampere characteristic curve of the diode according to the voltage across the diode and the current flowing through the diode, and calculate the conductive performance characterization parameter of the diode according to the fitting value between the volt-ampere characteristic curve and the standard curve, the diode image, and the maximum temperature difference value of the thermal imaging diagram;

[0012] The conductive performance test unit is used to determine whether to conduct a conductive performance test on the diode according to the conductive performance characterization parameter of the diode,

[0013] And, adjust the output voltage of the power supply module, adjust the temperature and humidity of the conductive performance test environment of the diode, and determine whether there is an abnormality in the conductive performance of the diode by combining the audio during the conductive performance test process of the diode with the conductive performance characterization parameter of the diode.

[0014] Furthermore, the data analysis unit further includes obtaining an image fitting value according to the diode image, including,

[0015] Obtain a number of diode image pictures;

[0016] Successively compare each diode image with the standard diode image through image analysis software;

[0017] Obtain the fitting value between each diode image and the standard diode image;

[0018] Record the average value of the fitting values between each diode image and the standard diode image as the image fitting value.

[0019] Furthermore, the data analysis unit further includes obtaining the temperature difference ratio of the thermal imaging diagram, including,

[0020] Obtain the maximum temperature value and the minimum temperature value of the thermal imaging diagram through image analysis software;

[0021] Calculate the maximum temperature difference value of the thermal imaging diagram;

[0022] The standard temperature difference value comparison threshold is compared with the maximum temperature difference value of the thermal imaging image to obtain the temperature difference ratio of the thermal imaging image.

[0023] Furthermore, the data analysis unit calculates diode conductivity characterization parameters based on the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image and the maximum temperature difference value of the thermal imaging image, including:

[0024] The ratio of the fitting value of the volt-ampere characteristic curve and the standard curve to the curve fitting value threshold is recorded as the curve fitting value ratio;

[0025] The ratio of the image fitting value to the image fitting value threshold is obtained and recorded as the image fitting value ratio;

[0026] The characteristic parameters of the diode conductivity are obtained by weighted summing up the ratio of curve fitting values, image fitting values ​​and thermal imaging temperature difference ratio.

[0027] Furthermore, the conductive performance testing unit determines whether to perform a conductive performance test on the diode according to the conductive performance characterizing parameter of the diode, including:

[0028] If the diode conductivity characteristic parameter is greater than the preset conductivity characteristic parameter comparison threshold, it is determined that the diode is to be subjected to a conductivity test;

[0029] If the conductivity characteristic parameter of the diode is less than or equal to the preset conductivity characteristic parameter comparison threshold, it is determined that the conductivity test of the diode is not performed.

[0030] Furthermore, the conductive performance testing unit adjusts the output voltage of the power module, wherein the adjustment is performed by sequentially increasing the voltage change step at every preset time length.

[0031] Furthermore, the data processing module also includes a data storage unit for storing the measurement data acquired by the diode measurement module.

[0032] Furthermore, the conductive performance test unit also includes an audio recognition feature audio according to the diode conductive performance test process, including:

[0033] Divide the audio of the diode conductivity performance test process into several short time frames;

[0034] Obtain the audio frequency and audio amplitude of each short-time frame;

[0035] Obtaining the audio frequency difference and audio amplitude difference of each adjacent short-time frame;

[0036] If the audio signal recognition condition is met, the audio is recognized as a characteristic audio;

[0037] The audio signal recognition condition is that there is a short-time frame audio frequency greater than a preset audio frequency threshold, or there is a short-time frame audio amplitude greater than a preset audio amplitude threshold, or there is a difference between adjacent short-time frame audio frequencies greater than a preset audio frequency difference threshold, or there is a difference between adjacent short-time frame audio amplitudes greater than a preset audio amplitude difference threshold.

[0038] Further, the conductivity testing unit obtains the audio during the diode conductivity testing process and determines whether there is an abnormality in the diode conductivity in combination with the diode conductivity characterization parameter, including,

[0039] If there is an abnormal condition, it is determined that there is an abnormality in the diode conductivity;

[0040] The abnormal condition is that there is a characteristic audio or the diode conductivity characterization parameter is greater than a preset conductivity characterization parameter comparison threshold.

[0041] Further, it further includes a display module, connected to the data processing module, for displaying the determination result.

[0042] Compared with the prior art, the beneficial effects of the present invention are that the data analysis unit of the present invention draws the diode volt-ampere characteristic curve according to the voltage across the diode and the current flowing through the diode, calculates the diode conductivity characterization parameter according to the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image and the maximum temperature difference value of the thermal imaging diagram, the conductivity testing unit determines whether to perform the diode conductivity test according to the diode conductivity characterization parameter, and adjusts the output voltage of the power supply module, adjusts the temperature and humidity of the diode conductivity test environment, obtains the audio during the diode conductivity test process and determines whether there is an abnormality in the diode conductivity in combination with the diode conductivity characterization parameter. The present invention comprehensively characterizes the diode conductivity through multiple indicators, thereby improving the accuracy and reliability of the test.

[0043] In particular, the data analysis unit of the present invention calculates the diode conductivity characterization parameter through the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image and the maximum temperature difference value of the thermal imaging diagram. The volt-ampere characteristic curve, the diode image and the thermal imaging diagram are important parameters for evaluating whether there is an abnormality in the diode conductivity. In actual situations, after the diode is completed on the production line, there may be appearance defects such as cracks, scratches or manufacturing defects. The diode image can identify whether there are appearance defects in the diode. The thermal imaging diagram can display the temperature distribution of the diode in real time. The volt-ampere characteristic curve is a chart describing the current change of the diode under different voltages, which can comprehensively evaluate the diode conductivity. The diode conductivity can be comprehensively characterized through multiple indicators by the diode conductivity characterization parameter, thereby improving the accuracy and reliability of the test.

[0044] In particular, the conductivity test unit of the present invention adjusts the output voltage of the power supply module and the environmental temperature and humidity for testing the conductivity of the diode. In actual situations, the conductivity of the diode may be affected by large voltage fluctuations and extreme environmental temperature and humidity. By calculating the characterization parameters of the diode conductivity, the conductivity of the diode can be characterized to a certain extent, but it is still necessary to further obtain the conductivity of the diode in a harsher environment. The present invention improves the accuracy and reliability of the test by further testing the conductivity of the diode.

[0045] In particular, the conductivity test unit of the present invention obtains the audio during the process of testing the conductivity of the diode and determines whether there is an abnormality in the conductivity of the diode in combination with the characterization parameters of the diode conductivity. In actual situations, the diode itself does not make a sound during normal operation. If there is a sound, it is very likely caused by other factors, such as thermal expansion, electromagnetic interference, arc, mechanical vibration, or other component failures. During the test, the audio of the diode is collected in real time by the audio acquisition unit, which can characterize whether there is an abnormality in the conductivity of the diode. Combining the characterization parameters of the diode conductivity obtained under harsh conditions can obtain a more reliable judgment result for the conductivity test of the diode. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 is a structural block diagram of a conductivity test system for a diode according to an embodiment of the invention;

[0047] Figure 2 is a structural block diagram of the data processing module according to an embodiment of the invention;

[0048] Figure 3 is a logic block diagram for the conductivity test unit according to an embodiment of the invention to determine whether to perform a conductivity test on the diode;

[0049] Figure 4 is a logic block diagram for the conductivity test unit according to an embodiment of the invention to identify characteristic audio. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0050] In order to make the objectives and advantages of the present invention clearer, the present invention will be further described below in conjunction with embodiments; it should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0051] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention and do not limit the protection scope of the present invention.

[0052] Please refer to Figures 1 to 4 as shown Figure 1Block diagram of the conductive performance test system for a diode in an invention embodiment Figure 2 Block diagram of the data processing module in an invention embodiment Figure 3 Logic diagram for the conductive performance test unit in an invention embodiment to determine whether to conduct a conductive performance test on a diode Figure 4 Logic diagram for the conductive performance test unit in an invention embodiment to identify characteristic audio. The conductive performance test system for a diode in an invention embodiment includes:

[0053] A power supply module, including an adjustable DC power supply, which adjusts the output voltage according to a preset voltage change step and time interval

[0054] A diode measurement module, including a voltage measurement unit for measuring the voltage across the diode, a current measurement unit for measuring the current flowing through the diode, a temperature measurement unit for obtaining the thermal imaging diagram of the diode, an image acquisition unit for obtaining the image of the diode, and an audio acquisition unit for obtaining the audio during the conductive performance test process of the diode

[0055] A data processing module, connected to the diode measurement module, including a data analysis unit and a conductive performance test unit

[0056] The data analysis unit is used to draw the volt-ampere characteristic curve of the diode based on the voltage across the diode and the current flowing through the diode, and calculate the conductive performance characterization parameter of the diode according to the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image, and the maximum temperature difference value of the thermal imaging diagram

[0057] The conductive performance test unit is used to determine whether to conduct a conductive performance test on the diode according to the conductive performance characterization parameter of the diode

[0058] And, adjust the output voltage of the power supply module, adjust the temperature and humidity of the conductive performance test environment of the diode, obtain the audio during the conductive performance test process of the diode, and determine whether there is an abnormality in the conductive performance of the diode in combination with the conductive performance characterization parameter of the diode

[0059] Specifically, in this embodiment, the preset voltage change step is 0.05V and the time interval is 10s

[0060] Specifically, the present invention can be used to test different types of diodes, including silicon diodes, germanium diodes, light-emitting diodes, etc. In this embodiment, a silicon diode is tested

[0061] Specifically, in this embodiment, the power supply voltage starts from 0 to test the conductive performance of the diode, and the adjustable DC power supply adjusts the output voltage according to the preset voltage change step and time interval

[0062] Specifically, in this embodiment, the ambient temperature and humidity of the test environment for adjusting the electrical conductivity of the diode are adjusted. Among them, the ambient temperature adjustment range is [-30°C, 100°C], and the ambient humidity adjustment range is [60%, 80%].

[0063] Specifically, the present invention does not limit the specific structure of the voltage measurement unit, which can be a digital multimeter. The present invention does not limit the specific structure of the current measurement unit, which can be a digital multimeter. The present invention does not limit the specific structure of the temperature measurement unit, which can be a thermal imager. The present invention does not limit the specific structure of the image acquisition unit, which can be an industrial CCD camera. The present invention does not limit the specific structure of the audio acquisition unit, which can be an audio acquisition card.

[0064] Specifically, the present invention does not limit the specific structure of the data processing module, which can be composed of logic components or a combination of logic components. The logic components include field programmable processors, computers, or microprocessors in computers.

[0065] Specifically, the data analysis unit further includes obtaining an image fitting value according to the diode image, including,

[0066] Obtain several diode image pictures;

[0067] Successively compare each diode image with the standard diode image through image analysis software;

[0068] Obtain the fitting value of each diode image and the standard diode image;

[0069] Record the average value of the fitting values of each diode image and the standard diode image as the image fitting value.

[0070] It can be understood that after the diode is completed on the production line, there may be appearance defects such as cracks, scratches, or manufacturing defects. By comparing with the standard diode image, the present invention can identify the diodes that do not meet the standard according to the image fitting value.

[0071] Specifically, the present invention does not limit the image analysis software. In this embodiment, python is used for image analysis.

[0072] Specifically, the standard diode image is an image of a diode without appearance defects obtained in advance.

[0073] Specifically, the data analysis unit further includes obtaining the temperature difference ratio of the thermal imaging map, including,

[0074] Obtain the maximum temperature value and the minimum temperature value of the thermal imaging map through image analysis software;

[0075] Calculate the maximum temperature difference value of the thermal imaging map;

[0076] Compare the standard temperature difference value comparison threshold with the maximum temperature difference value of the thermal imaging map to obtain the temperature difference ratio of the thermal imaging map.

[0077] Specifically, in this embodiment, the temperature difference ratio of the thermal imaging map is the standard temperature difference value comparison threshold divided by the maximum temperature difference value of the thermal imaging map.

[0078] Specifically, the thermal imaging map can display the temperature distribution of the diode in real time. By calculating the temperature difference ratio, it is possible to identify whether there is a temperature anomaly.

[0079] Specifically, in this embodiment, the standard temperature difference value comparison threshold is selected within the range of [5°C, 10°C].

[0080] Specifically, the data analysis unit calculates the diode conductivity characterization parameter according to the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image, and the maximum temperature difference value of the thermal imaging map, including

[0081] Obtain the ratio of the fitting value of the volt-ampere characteristic curve and the standard curve to the curve fitting value threshold, and record it as the curve fitting value ratio;

[0082] Obtain the ratio of the image fitting value to the image fitting value threshold, and record it as the image fitting value ratio;

[0083] Weighted sum the curve fitting value ratio, the image fitting value ratio, and the temperature difference ratio of the thermal imaging map to obtain the diode conductivity characterization parameter.

[0084] Specifically, in this embodiment, the curve fitting value ratio is the fitting value of the volt-ampere characteristic curve and the standard curve divided by the curve fitting value threshold, and the image fitting value ratio is the image fitting value divided by the image fitting value threshold.

[0085] Specifically, in this embodiment, the curve fitting value threshold is selected within the range of [95%, 100%], the image fitting value threshold is selected within the range of [95%, 100%], the weight coefficient of the curve fitting value ratio is 0.3, the weight coefficient of the image fitting value ratio is 0.3, and the weight coefficient of the temperature difference ratio of the thermal imaging map is 0.4.

[0086] Specifically, the data analysis unit of the present invention calculates the characterization parameters of the diode's conductivity through the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image, and the maximum temperature difference value of the thermal imaging map. The volt-ampere characteristic curve, the diode image, and the thermal imaging map are important parameters for evaluating whether there are abnormalities in the diode's conductivity. In actual situations, after the diode is completed on the production line, there may be appearance defects such as cracks, scratches, or manufacturing defects. The diode image can identify whether there are appearance defects in the diode. The thermal imaging map can display the temperature distribution of the diode in real time. The volt-ampere characteristic curve is a chart that describes the current change of the diode under different voltages and can comprehensively evaluate the conductivity of the diode. The characterization parameters of the diode's conductivity can comprehensively characterize the conductivity of the diode through multiple indicators, thereby improving the accuracy and reliability of the test.

[0087] Specifically, the conductivity test unit determines whether to perform a conductivity test on the diode according to the characterization parameters of the diode's conductivity, including

[0088] If the characterization parameters of the diode's conductivity are greater than the preset comparison threshold of the characterization parameters of the conductivity, it is determined to perform a conductivity test on the diode;

[0089] If the characterization parameters of the diode's conductivity are less than or equal to the preset comparison threshold of the characterization parameters of the conductivity, it is determined not to perform a conductivity test on the diode.

[0090] Specifically, in this embodiment, the preset comparison threshold of the characterization parameters of the conductivity is selected within the range of [3, 3.4].

[0091] Specifically, the conductivity test unit adjusts the output voltage of the power supply module, where the adjustment method is to increase the voltage change step size in turn every preset time period.

[0092] Specifically, in this embodiment, the preset time period is 10s. Every preset time period, the voltage change step size increases by 0.05V each time. For example, the first voltage change step size is 0.1V, and the second voltage change compensation is 0.15V, and so on until the power supply voltage reaches the upper limit value of the voltage within the safe test range of the diode.

[0093] Specifically, the data processing module further includes a data storage unit for storing the measurement data obtained by the diode measurement module.

[0094] Specifically, the conductivity test unit further includes identifying the characteristic audio according to the audio during the conductivity test of the diode, including

[0095] Segmenting the audio during the conductivity test of the diode into several short-time frames;

[0096] Obtain the audio frequencies and audio amplitudes of each short-time frame;

[0097] Obtain the differences in audio frequencies and the differences in audio amplitudes between adjacent short-time frames;

[0098] If the audio signal recognition condition is satisfied, then identify the audio as characteristic audio;

[0099] The audio signal recognition condition is that there is a short-time frame audio frequency greater than a preset audio frequency threshold, or there is a short-time frame audio amplitude greater than a preset audio amplitude threshold, or there is a difference in audio frequencies between adjacent short-time frames greater than a preset audio frequency difference threshold, or there is a difference in audio amplitudes between adjacent short-time frames greater than a preset audio amplitude difference threshold.

[0100] It can be understood that a diode itself does not emit sound during normal operation. If there is sound, it is very likely caused by other factors such as thermal expansion, electromagnetic interference, arc, mechanical vibration, or other component failures. During the test, the audio of the diode is collected in real time by the audio acquisition unit, and it is possible to identify whether there is an abnormality in the diode.

[0101] Specifically, the conductivity test unit of the present invention adjusts the output voltage of the power supply module, and adjusts the ambient temperature and humidity of the diode conductivity test environment. In actual situations, the conductivity of the diode may be affected by large voltage fluctuations and extreme ambient temperature and humidity. By calculating the conductivity characterization parameters of the diode, it can characterize to a certain extent whether there is an abnormality in the diode conductivity, but it is still necessary to further obtain the conductivity of the diode in a more severe environment. The present invention improves the accuracy and reliability of the test by further testing the diode conductivity.

[0102] Specifically, in this embodiment, the preset audio frequency threshold, the preset audio amplitude threshold, the preset audio frequency difference threshold, and the preset audio amplitude difference threshold are measured in advance by experiments. Obtain the audio of several diodes during normal operation, divide the audio into several short-time frames, obtain the audio frequencies and audio amplitudes of each short-time frame, obtain the differences in audio frequencies and the differences in audio amplitudes between adjacent short-time frames, record the average value of the audio frequencies of each obtained short-time frame as the preset audio frequency threshold, record the average value of the audio amplitudes of each obtained short-time frame as the preset audio amplitude threshold, record the average value of the differences in audio frequencies between adjacent short-time frames as the preset audio frequency difference threshold, and record the average value of the differences in audio amplitudes between adjacent short-time frames as the preset audio amplitude difference threshold.

[0103] Specifically, the conductivity test unit obtains the audio during the diode conductivity test process and determines whether there is an abnormality in the diode conductivity in combination with the diode conductivity characterization parameters, including,

[0104] If there are abnormal conditions, it is determined that there is an abnormality in the conductivity of the diode;

[0105] The abnormal conditions are the existence of characteristic audio or the conductivity characterization parameter of the diode being greater than the preset conductivity characterization parameter comparison threshold.

[0106] Specifically, the conductivity test unit of the present invention obtains the audio during the conductivity test of the diode and combines the conductivity characterization parameter of the diode to determine whether there is an abnormality in the conductivity of the diode. In actual situations, the diode itself does not make a sound during normal operation. If there is a sound, it is very likely caused by other factors, such as thermal expansion, electromagnetic interference, arc, mechanical vibration, or other component failures. During the test, the audio of the diode is collected in real time by the audio acquisition unit, which can characterize whether there is an abnormality in the conductivity of the diode. Combining the conductivity characterization parameter of the diode obtained under harsh conditions can obtain a more reliable judgment result for the conductivity test of the diode.

[0107] Specifically, it further includes a display module, connected to the data processing module, for displaying the determination result.

[0108] So far, the technical solution of the present invention has been described in conjunction with the preferred embodiments shown in the drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will all fall within the protection scope of the present invention.

Claims

1. A conductive performance testing system for a diode, characterized in that: include: A power supply module, comprising an adjustable DC power supply, wherein the adjustable DC power supply adjusts the output voltage according to a preset voltage variation step and time interval; The diode measurement module includes a voltage measurement unit for measuring the voltage across the diode, a current measurement unit for measuring the current flowing through the diode, a temperature measurement unit for obtaining a thermal imaging image of the diode, an image acquisition unit for obtaining an image of the diode, and an audio acquisition unit for obtaining audio during the diode conductivity test process; A data processing module is connected to the diode measurement module and includes a data analysis unit and a conductive performance testing unit. The data analysis unit is used to draw a diode volt-ampere characteristic curve according to the voltage across the diode and the current flowing through the diode, and calculate the diode conductive performance characterization parameter according to the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image and the maximum temperature difference value of the thermal imaging image; The conductive performance testing unit is used to determine whether to perform a conductive performance test on the diode according to the conductive performance characterization parameter of the diode. Also, adjusting the output voltage of the power module, adjusting the temperature and humidity of the diode conductivity test environment, obtaining the audio of the diode conductivity test process and combining it with the diode conductivity characterization parameters to determine whether there is any abnormality in the diode conductivity.

2. The conductive performance testing system for a diode according to claim 1, characterized in that: The data analysis unit further comprises obtaining an image fitting value according to the diode image, include, Get several diode image pictures; Compare each diode image with the standard diode image in turn using image analysis software; Obtaining the fitting value of each diode image and the standard diode image; The average of the fitting values ​​of each diode image and the standard diode image is recorded as the image fitting value.

3. The conductive performance testing system for a diode according to claim 2, characterized in that: The data analysis unit also includes obtaining the temperature difference ratio of the thermal imaging image, including: Obtain the maximum and minimum temperature values ​​of the thermal image through image analysis software; Calculate the maximum temperature difference of the thermal image; The standard temperature difference value comparison threshold is compared with the maximum temperature difference value of the thermal imaging image to obtain the temperature difference ratio of the thermal imaging image.

4. The conductive performance testing system for diodes according to claim 3, characterized in that: The data analysis unit calculates diode conductivity characterization parameters based on the fitting value of the volt-ampere characteristic curve and the standard curve, the diode image and the maximum temperature difference of the thermal imaging image, including: The ratio of the fitting value of the volt-ampere characteristic curve and the standard curve to the curve fitting value threshold is recorded as the curve fitting value ratio; The ratio of the image fitting value to the image fitting value threshold is obtained and recorded as the image fitting value ratio; The characteristic parameters of the diode conductivity are obtained by weighted summing up the ratio of curve fitting values, image fitting values ​​and thermal imaging temperature difference ratio.

5. The conductive performance testing system for a diode according to claim 4, characterized in that: The conductive performance testing unit determines whether to perform a conductive performance test on the diode according to the conductive performance characterizing parameter of the diode, including: If the diode conductivity characteristic parameter is greater than the preset conductivity characteristic parameter comparison threshold, it is determined that the diode is to be subjected to a conductivity test; If the conductivity characteristic parameter of the diode is less than or equal to the preset conductivity characteristic parameter comparison threshold, it is determined that the conductivity test of the diode is not performed.

6. The conductive performance testing system for a diode according to claim 1, characterized in that: The conductive performance testing unit adjusts the output voltage of the power module, wherein the adjustment method is to increase the voltage change step size in sequence at every preset time length.

7. The conductive performance testing system for a diode according to claim 1, characterized in that: The data processing module also includes a data storage unit for storing the measurement data acquired by the diode measurement module.

8. The conductive performance testing system for a diode according to claim 1, characterized in that: The conductive performance test unit also includes an audio recognition feature audio according to the diode conductive performance test process, include, Divide the audio of the diode conductivity performance test process into several short time frames; Obtain the audio frequency and audio amplitude of each short-time frame; Obtaining the audio frequency difference and audio amplitude difference of each adjacent short-time frame; If the audio signal recognition condition is met, the audio is recognized as a characteristic audio; The audio signal identification condition is that there is a short-time frame audio frequency greater than a preset audio frequency threshold, or, there is a short-time frame audio amplitude greater than a preset audio amplitude threshold, or there is an adjacent short-time frame audio frequency difference greater than a preset audio frequency difference threshold, or there is an adjacent short-time frame audio amplitude difference greater than a preset audio amplitude difference threshold.

9. The conductive performance testing system for diodes according to claim 8, characterized in that: The conductive performance testing unit obtains the audio of the diode conductive performance testing process and combines the diode conductive performance characterization parameter to determine whether the diode conductive performance is abnormal, including: If an abnormal condition exists, it is determined that the conductive performance of the diode is abnormal; The abnormal condition is the presence of a characteristic audio frequency or a diode conductivity characteristic parameter greater than a preset conductivity characteristic parameter comparison threshold.

10. The conductive performance testing system for a diode according to claim 1, characterized in that: It also includes a display module and the data processing module for displaying the determination result.

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