Aging test control system and aging test system

Abstract

The invention discloses an aging test control system and an aging test system, and relates to the technical field of server tests.The aging test control system comprises a power supply, an inductive switch and a signal trigger, after the inductive switch induces that a plug of an aging rack leaves a power socket of an aging room, a loop where the power supply and the signal trigger are located is switched on, and the signal trigger is switched on; and the signal trigger is electrified and triggered at the moment and then sends a transfer signal to the transfer trolley, so that the transfer trolley can transfer the aging rack in time after the aging test of the server is finished, so as to facilitate the aging test of other subsequent servers, thereby improving the efficiency of the aging test of the server.

Description

Technical Field

[0001] This application relates to the technical field of server testing, and particularly to an aging test control system and an aging test system. Background Art

[0002] Server products are important basic key devices for informatization. To ensure the quality of server products, aging tests are generally performed on server products. The aging test of a server is generally to place the server on a dedicated aging rack, and a transfer vehicle transports the aging rack to an aging room for aging test. After the aging test is completed, the transfer vehicle transports the aging rack out of the aging room.

[0003] In related technologies, after the aging rack enters the aging room, generally, a staff member connects the plug on the aging rack to the power supply of the aging room, and after the aging test is completed, the staff member cuts off the power, and the staff member controls the transfer vehicle to transport the aging rack out of the aging room. Since the manual processing method has the problem of untimely control of the operation of the transfer vehicle, the aging rack cannot be transported out of the aging room in time, which is likely to cause a long delay, delaying the progress of the aging test of subsequent other servers, and thus resulting in low efficiency of the aging test of the servers. Summary of the Invention

[0004] This application provides an aging test control system and an aging test system to at least solve the problem of low efficiency in aging testing servers in related technologies.

[0005] This application provides an aging test control system, including: a power supply (U1), an induction switch (K1), and a signal trigger (D). One end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of an aging room power socket (104) through a conductive path;

[0006] The other end of the power supply (U1) is electrically connected to the other end of the aging room power socket (104) through a conductive path;

[0007] An induction switch (K1) is provided at the joint of any end of the aging room power socket (104) and the conductive path;

[0008] The induction switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when it senses that the plug (103) of the aging rack (102) is inserted into the aging room power socket (104); and to conduct the electrical connection of the corresponding conductive path when it senses that the plug (103) of the aging rack (102) leaves the aging room power socket (104), so that the signal trigger (D) is powered on and outputs a transfer signal to the transfer vehicle to cause the transfer vehicle to transport the aging rack (102).

[0009] The present application also provides an aging test system, including: the aging test control system provided above, and an aging rack (102);

[0010] When the plug (103) of the aging rack (102) is inserted into or removed from the power socket (104) of the aging chamber, it triggers the disconnection or conduction of the induction switch of the aging test control system.

[0011] With the aging test control system and the aging test system provided by the present application, since the induction switch can sense whether the plug of the aging rack is inserted into the power socket of the aging chamber or removed from it, after the induction switch senses that the plug of the aging rack has been removed from the power socket of the aging chamber, that is, after the aging test of the server is completed, it conducts the loop where the power supply and the signal trigger are located. At this time, after the signal trigger is powered on and triggered, it sends a transfer signal to the transfer vehicle, so that the transfer vehicle can transfer the aging rack in a timely manner after the aging test of the server is completed, facilitating the subsequent aging test of other servers, thereby improving the efficiency of the aging test of the server. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] To more clearly illustrate the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0013] Figure 1 The usage scenario provided for the embodiments of the present application;

[0014] Figure 2 The structural schematic of the aging test control system provided for the embodiments of the present application Figure 1 ;

[0015] Figure 3 The structural schematic of the aging test control system provided for the embodiments of the present application Figure 2 ;

[0016] Figure 4 The structural schematic of the aging test control system provided for the embodiments of the present application Figure 3 ;

[0017] Figure 5 The structural schematic of the aging test control system provided for the embodiments of the present application Figure 4 ;

[0018] Figure 6 The structural schematic of the aging test control system provided for the embodiments of the present application Figure 5 ;

[0019] Figure 7 Structural schematic of the aging test control system provided by the embodiment of the present application Figure 6 ;

[0020] Figure 8 Structural schematic of the aging test control system provided by the embodiment of the present application Figure 7 ;

[0021] Figure 9 Structural schematic of the aging test system provided by the embodiment of the present application Figure 1 ;

[0022] Figure 10 Structural schematic of the aging test system provided by the embodiment of the present application Figure 2 ;

[0023] Figure 11 Structural schematic of the aging test system provided by the embodiment of the present application Figure 3 。

[0024] Among them, the above-mentioned drawings include the following reference numerals:

[0025] 101: Server;

[0026] 102: Aging rack;

[0027] 103: Plug;

[0028] 1031: First-end switch contact;

[0029] 1032: Second-end switch contact;

[0030] 104: Aging chamber power socket;

[0031] 105: Transfer cart;

[0032] 106: Detection module;

[0033] 107: Lock control mechanism;

[0034] U0: Aging chamber power supply;

[0035] U1: Power supply;

[0036] D: Signal trigger;

[0037] K1: Inductive switch;

[0038] K2: Control switch. Detailed implementation mode

[0039] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without making creative efforts belong to the protection scope of the present application.

[0040] It should be noted that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application. The terms "installation", "connection", and "coupling" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. The terms "parallel", "perpendicular", and "equal" include the described situations and situations similar to the described situations, and the range of the similar situations is within the acceptable deviation range, where the acceptable deviation range is determined by those of ordinary skill in the art considering the measurement being discussed and the errors associated with the measurement of a specific quantity (i.e., the limitations of the measurement system). For example, "parallel" includes absolute parallel and approximate parallel, and the acceptable deviation range of approximate parallel can be, for example, within 5° deviation; "perpendicular" includes absolute perpendicular and approximate perpendicular, and the acceptable deviation range of approximate perpendicular can also be, for example, within 5° deviation. "Equal" includes absolute equality and approximate equality, and the acceptable deviation range of approximate equality can be, for example, that the difference between the two equal ones is less than or equal to 5% of either of them. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific situations.

[0041] Figure 1The usage scenario provided by the embodiment of the present application. Here, the aging rack 102 is used to place the server 101 to be aged and tested. The transfer vehicle 105 transports the aging rack 102 to the aging chamber. There is an aging chamber power supply U0 in the aging chamber, and the aging chamber power supply U0 is connected to the aging chamber power socket 104. When the plug 103 of the aging rack 102 is inserted into the aging chamber power socket 104, the aging rack is powered on, and the server 101 can be aged and tested. When the plug 103 of the aging rack 102 leaves the aging chamber power socket 104, the aging rack is powered off, and then the transfer vehicle 105 transports the aging rack 102 out of the aging chamber.

[0042] In the related art, generally, a staff member inserts the plug 103 of the aging rack 102 into the aging chamber power socket 104, and after the aging test is completed, the staff member removes the plug 103 of the aging rack 102 from the aging chamber power socket 104, and the staff member controls the transfer vehicle 105 to transport the aging rack 102 out of the aging chamber. Due to the problem that the operation of the transfer vehicle 105 is not timely controlled in the manual processing method, the aging rack 102 cannot be transported out of the aging chamber in time, which is likely to cause a long delay, delaying the progress of the aging test of other subsequent servers, and thus resulting in low efficiency of the aging test of the servers.

[0043] In the embodiment of the present application, an induction switch, a power supply, and a signal trigger are added. The induction switch is used to sense whether the plug 103 of the aging rack 102 is inserted into the aging chamber power socket or leaves the aging chamber power socket 104. After the induction switch senses that the plug 103 of the aging rack 102 leaves the aging chamber power socket 104, that is, after the aging test of the server 101 is completed, the loop where the power supply and the signal trigger are located is conducted. At this time, after the signal trigger is powered on and triggered, it sends a transfer signal to the transfer vehicle 105, so that the transfer vehicle 105 can transport the aging rack 102 in time after the aging test of the server 101 is completed, facilitating the aging test of other subsequent servers, thereby improving the efficiency of the aging test of the servers.

[0044] To enable those skilled in the art of the present technology to better understand the solution of the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0045] Figure 2 Structural schematic of the aging test control system provided by the embodiment of the present application Figure 1 , as Figure 2 shown, includes: a power supply (U1), an induction switch (K1), and a signal trigger (D). One end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of the aging chamber power socket (104) through a conductive path;

[0046] The other end of the power supply (U1) is electrically connected to the other end of the aging chamber power socket (104) through a conductive path;

[0047] An induction switch (K1) is provided at the joint of any end of the aging chamber power socket (104) and the conductive path;

[0048] The induction switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when it senses that the plug (103) of the aging rack is inserted into the aging chamber power socket (104); and, when it senses that the plug (103) of the aging rack leaves the aging chamber power socket (104), conduct the electrical connection of the corresponding conductive path, so that the signal trigger (D) is powered on and outputs a transfer signal to the transfer vehicle to make the transfer vehicle transfer the aging rack (102).

[0049] Combined with a scenario example, the power supply U1 can be direct current. One end of the power supply U1 can be the negative pole, and the other end of the power supply U1 can be the positive pole. That is, the positive pole of the power supply U1 is electrically connected to the other end of the aging chamber power socket 104 through a conductive path, and the negative pole of the power supply U1 is electrically connected to one end of the signal trigger D. The conductive path is the path formed by the power supply U1, the signal trigger D, and the induction switch K1. Among them, the induction switch K1 is provided at the joint of the conductive path, that is, the induction switch K1 is respectively connected to the other end of the signal trigger D and the positive pole of the power supply U1, and can be used to sense whether the plug 103 of the aging rack 102 is inserted into the aging chamber power socket 104. Servers 101 to be aged and tested are placed on the aging rack 102. When the induction switch K1 senses that the plug 103 of the aging rack 102 is inserted into the aging chamber power socket 104, the induction switch K1 disconnects the conductive path formed by the power supply U1, the signal trigger D, and the induction switch K1, so that the power supply U1 cannot provide electrical energy, and the signal trigger D cannot emit any signal. When the induction switch K1 senses that the plug 103 of the aging rack 102 leaves the aging chamber power socket 104, the induction switch K1 conducts the conductive path formed by the power supply U1, the signal trigger D, and the induction switch K1, so that the power supply U1 is conducted to provide electrical energy, and after the signal trigger D responds to the power-on trigger, it emits a transfer signal to the transfer vehicle. A signal receiver is installed on the transfer vehicle, and the transfer vehicle receives the transfer signal emitted by the signal trigger D through the signal receiver, and then transfers the aging rack 102 out of the aging chamber.

[0050] Based on the aging test control system provided in this example, the induction switch can monitor whether the plug of the aging rack is connected to the power socket of the aging chamber. When the plug of the aging rack is connected to the power socket of the aging chamber, the conductive path is disconnected so that the signal trigger cannot send a signal, preventing the transfer cart from transporting the aging rack out of the aging chamber, thus ensuring the smooth progress of the server aging test. When the plug of the aging rack is disconnected from the power socket of the aging chamber, the conductive path is conducted so that the signal trigger sends a transfer signal to the transfer cart, enabling the transfer cart to promptly transport the aging rack out of the aging chamber, ensuring the smooth progress of subsequent server aging tests and improving the efficiency of server aging tests.

[0051] Optionally, Figure 3 is the structural schematic of the aging test control system provided by the embodiment of the present application Figure 2 , as Figure 3 shown, the induction switch (K1) includes: a spring device and a connecting device;

[0052] One end of the connecting device is connected to one end of the power socket (104) of the aging chamber. When the plug (103) of the aging rack (102) is inserted into the power socket (104) of the aging chamber, the other end of the connecting device is disconnected from the other end of the power socket (104) under the thrust of the plug (103). When the plug (103) of the aging rack (102) leaves the power socket (104) of the aging chamber, the other end of the connecting device is connected to the other end of the power socket (104) under the action of the spring force.

[0053] Combined with the scenario example, as Figure 3 shown, the induction switch K1 can be a spring-loaded switch, including the connecting device and the spring device of the main body. The spring device can be arranged at a relevant position at one end of the connecting device. When the plug 103 of the aging rack is inserted into the power socket 104 of the aging chamber, the other end of the connecting device is disconnected from the other end of the power socket 104 under the thrust of the plug 103 and presses down the spring, applying pressure to the spring. When the plug 103 of the aging rack leaves the power socket 104 of the aging chamber, the thrust of the plug 103 on the other end of the connecting device disappears, and then under the action of the elastic force of the spring rebound, it returns to its original position and is then connected to the other end of the power socket 104 again.

[0054] Based on the aging test control system provided in this example, through the combined action of the spring device and the connecting device, the purpose of disconnecting the conductive path when the plug of the aging rack is connected to the power socket of the aging chamber and conducting the conductive path when the plug of the aging rack is disconnected from the power socket of the aging chamber can be achieved.

[0055] Optionally, the signal trigger is at least one of an optoelectronic signal trigger, a laser signal trigger, or a radio frequency signal trigger.

[0056] Combined with the scenario example, the optoelectronic signal trigger can be selected as the signal trigger of the Omron E2E series, and the signal receiver on the transfer cart used in conjunction with it can be selected as the Siemens Profinet receiving module. The laser signal trigger can be selected as Gate trigger and Trigger trigger, and both of these trigger methods are achieved by controlling the light output frequency and the number of light output times of the laser. The signal receiver on the transfer cart used in conjunction with it can be selected as a laser receiving system including a photodetector or an amplifier. The signal interaction between the signal trigger and the signal receiver on the transfer cart can also be achieved through radio frequency technology.

[0057] Based on the aging test control system provided in this example, the signal interaction between the signal trigger and the signal receiver can be realized to ensure that the transfer cart smoothly receives the transfer signal sent by the signal trigger, so as to transfer the aging rack out of the aging chamber in time, thereby improving the efficiency of aging testing the server.

[0058] Optionally, Figure 4 The structural schematic of the aging test control system provided for the embodiments of this application Figure 3 is shown in Figure 4 As shown, the aging test control system further includes an aging rack locking control module;

[0059] The aging rack locking control module includes: a detection module (106), a control switch (K2), and a lock control mechanism (107);

[0060] The detection module (106) is arranged at a position corresponding to the plug (103) of the aging rack (102) for detecting whether the plug (103) of the aging rack (102) is powered on to output a detection signal;

[0061] The lock control mechanism (107) is arranged at a position corresponding to the rollers of the aging rack (102);

[0062] The control switch (K2) is electrically connected to the detection module (106) and is used to be started or closed according to the detection signal; when the detection signal is powered on, the control switch (K2) controls the lock control mechanism (107) to lock the rollers of the aging rack (102), and when the detection signal is not powered on, the control switch (K2) controls the lock control mechanism (107) to unlock the rollers of the aging rack (102).

[0063] Combined with the scenario example, the detection module 106 is set at a position corresponding to the plug 103. The specific position can be determined according to the specific type of the detection module 106. The detection module 106 is mainly used to detect whether the plug 103 of the aging rack is powered on. If the detection module 106 detects that the plug 103 of the aging rack is powered on, it can be determined at this time that the plug 103 of the aging rack has been connected to the power socket 104 of the aging chamber. At this time, a monitoring signal indicating that the plug 103 is powered on can be output to the control switch K2. If the detection module 106 detects that the plug 103 of the aging rack 102 is not powered on, it can be determined at this time that the plug 103 of the aging rack is not connected to the power socket 104 of the aging chamber. At this time, a monitoring signal indicating that the plug 103 is not powered on can be output to the control switch K2. Rollers can be provided at the bottom of the aging rack to facilitate the transfer vehicle to move the aging rack 102. The lock control mechanism 107 can be set at a position corresponding to the rollers of the aging rack 102. The specific position can be determined according to the actual situation. The lock control mechanism 107 is mainly controlled by the control switch K2 to lock the rollers. The control switch K2 can determine whether to control the lock control mechanism 107 to lock the rollers of the aging rack 102 by responding to the detection signal. Specifically, after receiving the monitoring signal indicating that the plug 103 is powered on, the control switch K2 controls the lock control mechanism 107 to lock the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. After receiving the monitoring signal indicating that the plug 103 is not powered on, the control switch K2 controls the lock control mechanism 107 to unlock the rollers of the aging rack 102, so that the aging rack 102 can move after power-off, to ensure that after the server aging test is completed, the transfer vehicle can promptly transfer the aging rack out of the aging chamber to improve the efficiency of the server aging test.

[0064] Optionally, Figure 5 is the structural schematic diagram of the aging test control system provided by the embodiment of the present application Figure 4 , as Figure 5 shown, the plug (103) of the aging rack (102) includes a first-end switch contact (1031) and a second-end switch contact (1032);

[0065] The detection module (106) is a voltage sensor. The first input terminal of the voltage sensor is connected to the first-end switch contact (1031), and the second input terminal of the voltage sensor is connected to the second-end switch contact (1032), and is used to detect the voltage signal inside the plug (103) of the aging rack (102);

[0066] The control switch (K2) is an electric control switch, and the electric control switch is set at a preset position on the ground, and the preset position is located below the rollers of the aging rack (102);

[0067] The lock control mechanism (107) is a baffle device. The baffle device is located above the electric control switch and in the middle of the rollers of the aging rack (102).

[0068] The input end of the electric control switch is connected to the first output end of the voltage sensor, and the output end of the electric control switch is connected to the second output end of the voltage sensor, for receiving the voltage signal inside the plug (103) detected by the voltage sensor.

[0069] When receiving the voltage signal, the electric control switch is electrically connected to the baffle device to control the baffle device to bulge upward to lock the rollers of the aging rack (102); it is also used to disconnect the electrical connection with the baffle device when not receiving the voltage signal to control the baffle device to contract to unlock the rollers of the aging rack (102).

[0070] Combined with the scenario example, the plug 103 of the aging rack is connected to the aging chamber power socket 104 through the switch contact. The voltage sensor is connected in the middle of the two switch contacts to detect whether there is voltage inside the plug 103. When the voltage sensor detects that there is voltage inside the plug 103, it can determine that the plug 103 has been connected to the aging chamber power socket 104. At this time, the detected voltage signal inside the plug 103 can be transmitted to the control switch K2. When the voltage sensor does not detect that there is voltage inside the plug 103, it can determine that the plug 103 is not connected to the aging chamber power socket 104. At this time, the voltage sensor cannot detect the voltage signal inside the plug 103.

[0071] The control switch K2 can be an electric control switch, such as a relay control switch. The relay control switch and the voltage sensor can be electrically connected. The voltage sensor sends the voltage signal inside the plug 103 to the relay control switch through the electrical connection with the relay control switch. Or, the voltage sensor can also send the voltage signal inside the plug 103 to the relay control switch through radio frequency technology. As Figure 5As shown in the figure, the relay control switch and the lock control mechanism 107 can be set at a preset position on the floor of the aging chamber. When the transfer cart transports the aging rack 102 to the aging chamber, the aging rack 102 can be placed above this preset position, so that the lock control mechanism 107 is located in the middle of the rollers of the aging rack 102. The lock control mechanism 107 can be a baffle device. When the relay control switch receives the voltage signal sent by the voltage sensor, it is electrically connected to the baffle device, and can control the baffle device to protrude upward, so that the baffle device locks the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the voltage signal sent by the voltage sensor, it is disconnected from the baffle device, and the baffle device returns to its initial position under the action of its own gravity to release the locking of the rollers of the aging rack 102. So that after the server aging test is completed, the transfer cart can move the aging rack 102.

[0072] Based on the aging test control system provided in this example, when the server is undergoing an aging test, the aging rack can be locked to ensure the smooth progress of the server aging test. After the aging test of the server is completed, the locking of the aging rack is released, so that the transfer cart can transport the server out of the aging chamber in time to improve the efficiency of the server aging test.

[0073] Optionally, Figure 6 is a structural schematic of the aging test control system provided by the embodiment of the present application Figure 5 , as Figure 6 shown, the plug 103 of the aging rack (102) includes a first-end switch contact (1031) and a second-end switch contact (1032);

[0074] The detection module (106) is a voltage sensor, and the voltage sensor is arranged inside the plug 103 of the aging rack (102) and is connected between the first-end switch contact (1031) and the second-end switch contact (1032);

[0075] The control switch (K2) is an electric control switch, and the electric control switch is arranged on the aging rack (102);

[0076] The lock control mechanism (107) is a braking device, and the braking device is arranged at the connection between the roller of the aging rack (102) and the aging rack body.

[0077] Combined with the scenario example, the plug 103 of the aging rack is connected to the aging chamber power socket 104 through the switch contacts, and the voltage sensor is connected between the two switch contacts. Specifically, as Figure 6As shown, the first input terminal of the voltage sensor is connected to the first terminal switch contact 1031, and the second input terminal of the voltage sensor is connected to the second terminal switch contact 1032, which is used to detect whether there is voltage inside the plug 103. When the voltage sensor detects that there is voltage inside the plug 103, it can determine that the plug 103 has been connected to the aging chamber power socket 104. At this time, the detected voltage signal inside the plug 103 can be transmitted to the control switch K2. When the voltage sensor does not detect voltage inside the plug 103, it can determine that the plug 103 is not connected to the aging chamber power socket 104. At this time, the voltage sensor cannot detect the voltage signal inside the plug 103.

[0078] The control switch K2 can be an electric control switch, such as a relay control switch. The relay control switch and the voltage sensor can be electrically connected. Specifically, as Figure 6 shown, the input terminal of the relay control switch is connected to the first output terminal of the voltage sensor, and the output terminal of the relay control switch is connected to the second output terminal of the voltage sensor, which is used to receive the voltage signal inside the plug 103 detected by the voltage sensor. The voltage sensor sends the voltage signal inside the plug 103 to the relay control switch through the electrical connection with the relay control switch. Alternatively, the voltage sensor can also send the voltage signal inside the plug 103 to the relay control switch through radio frequency technology. The relay control switch and the lock control mechanism 107 can be arranged on the aging rack 102. The lock control mechanism can be a braking device, which can be specifically arranged between the aging rack main body and the roller. The braking device can directly lock the roller. When the relay control switch receives the voltage signal sent by the voltage sensor, it is electrically connected to the braking device, and can control the braking device to lock the roller of the aging rack 102, so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the voltage signal sent by the voltage sensor, it controls the braking device to unlock the roller of the aging rack 102, so that after the server aging test is completed, the transport vehicle can move the aging rack 102.

[0079] Based on the aging test control system provided in this example, when the server is undergoing an aging test, the aging rack can be locked to ensure the smooth progress of the server aging test. After the server aging test is completed, the lock of the aging rack can be released, so that the transport vehicle can timely transport the server out of the aging chamber, thereby improving the efficiency of the server aging test.

[0080] Optionally, Figure 7 is the structural schematic Figure 6 of the aging test control system provided by the embodiment of the present application Figure 7As shown, the detection module (106) is a current sensor, which is arranged in the power socket (104) of the aging chamber and is connected between the first end and the second end of the power socket (104) of the aging chamber;

[0081] The control switch (K2) is an electric control switch, which is arranged on the aging rack (102);

[0082] The lock control mechanism (107) is a braking device, which is arranged at the connection between the roller of the aging rack (102) and the main body of the aging rack.

[0083] Combined with the scenario example, the current sensor is connected inside the power socket 104 of the aging chamber. Specifically, as Figure 7 shown, the first input end of the current sensor is connected to the first end of the power socket 104 of the aging chamber, and the second input end of the current sensor is connected to the second end of the power socket 104 of the aging chamber, for detecting whether there is current inside the power socket 104 of the aging chamber. When the current sensor detects that there is current inside the power socket 104 of the aging chamber, it can be determined that the plug 103 has been connected to the power socket 104 of the aging chamber. At this time, the detected current signal inside the power socket 104 of the aging chamber can be transmitted to the control switch K2. When the current sensor does not detect that there is current inside the power socket 104 of the aging chamber, it can be determined that the plug 103 is not connected to the power socket 104 of the aging chamber. At this time, the current sensor cannot detect the current signal inside the power socket 104 of the aging chamber.

[0084] The control switch K2 can be an electric control switch, such as a relay control switch. The relay control switch and the current sensor can be electrically connected. Specifically, as Figure 7As shown, the input end of the relay control switch is connected to the first output end of the current sensor, and the output end of the relay control switch is connected to the second output end of the current sensor, which is used to receive the current signal inside the power socket 104 of the aging chamber detected by the current sensor. The current sensor sends the current signal inside the power socket 104 of the aging chamber to the relay control switch through the electrical connection with the relay control switch. Alternatively, the current sensor can also send the current signal inside the power socket 104 of the aging chamber to the relay control switch through radio frequency technology. The relay control switch and the lock control mechanism 107 can be arranged on the aging rack 102. The lock control mechanism can be a braking device, which can be specifically arranged between the aging rack main body and the roller. The braking device can directly lock the roller. When the relay control switch receives the current signal sent by the current sensor, it is electrically connected to the braking device, and can control the braking device to lock the roller of the aging rack 102, so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the current signal sent by the current sensor, it controls the braking device to unlock the roller of the aging rack 102, so that after the server aging test is completed, the transport vehicle can move the aging rack 102.

[0085] Based on the aging test control system provided in this example, when the server is undergoing an aging test, the aging rack can be locked to ensure the smooth progress of the server aging test. After the aging test of the server is completed, the lock of the aging rack is released, so that the transport vehicle can promptly transport the server out of the aging chamber, thereby improving the efficiency of the server aging test.

[0086] Optionally, Figure 8 is the structural schematic of the aging test control system provided by the embodiment of the present application Figure 7 , as Figure 8 shown, the detection module (106) is a current sensor, and the current sensor is arranged inside the power socket (104) of the aging chamber and is connected between the first end and the second end of the power socket (104) of the aging chamber;

[0087] The control switch (K2) is an electric control switch, and the electric control switch is arranged at a preset position on the ground, and the preset position is located below the roller of the aging rack (102);

[0088] The lock control mechanism (107) is a baffle device, and the baffle device is located above the electric control switch and in the middle of the roller of the aging rack (102).

[0089] Combined with the scenario example, the current sensor is connected inside the power socket 104 of the aging chamber. Specifically, as Figure 8As shown, the first input terminal of the current sensor is connected to the first terminal of the aging chamber power socket 104, and the second input terminal of the current sensor is connected to the second terminal of the aging chamber power socket 104, for detecting whether there is current inside the aging chamber power socket 104. When the current sensor detects that there is current inside the aging chamber power socket 104, it can determine that the plug 103 has been connected to the aging chamber power socket 104. At this time, the detected current signal inside the aging chamber power socket 104 can be transmitted to the control switch K2. When the current sensor does not detect current inside the aging chamber power socket 104, it can determine that the plug 103 is not connected to the aging chamber power socket 104. At this time, the current sensor cannot detect the current signal inside the aging chamber power socket 104.

[0090] The control switch K2 can be an electric control switch, such as a relay control switch. The relay control switch and the current sensor can be electrically connected. Specifically, as Figure 8 shown, the input terminal of the relay control switch is connected to the first output terminal of the current sensor, and the output terminal of the relay control switch is connected to the second output terminal of the current sensor, for receiving the current signal inside the aging chamber power socket 104 detected by the current sensor. The current sensor sends the current signal inside the aging chamber power socket 104 to the relay control switch through the electrical connection with the relay control switch. Or, the current sensor can also send the current signal inside the aging chamber power socket 104 to the relay control switch through radio frequency technology.

[0091] As Figure 8 shown, the relay control switch and the lock control mechanism 107 can be set at a preset position on the floor of the aging chamber. When the transfer cart transports the aging rack 102 to the aging chamber, the aging rack 102 can be placed above this preset position, so that the lock control mechanism 107 is located in the middle of the rollers of the aging rack 102. The lock control mechanism 107 can be a baffle device. When the relay control switch receives the current signal sent by the current sensor, it is electrically connected to the baffle device, and can control the baffle device to protrude upward, so that the baffle device locks the rollers of the aging rack 102, so that the aging rack 102 cannot move when powered on, to ensure the smooth progress of the server aging test. When the relay control switch does not receive the current signal sent by the current sensor, it disconnects from the baffle device, and the baffle device returns to its initial position under the action of its own gravity to release the locking of the rollers of the aging rack 102. So that after the server aging test is over, the transfer cart can move the aging rack 102.

[0092] Based on the aging test control system provided in this example, when the server is undergoing an aging test, the aging rack can be locked to ensure the smooth progress of the server aging test. After the aging test of the server is completed, the lock of the aging rack is released so that the transfer cart can promptly transfer the server out of the aging chamber, thereby improving the efficiency of the server aging test.

[0093] Optionally, Figure 9 The structural schematic of the aging test system provided in the embodiment of the present application Figure 1 , such as Figure 9 shown, includes: an aging test control system and an aging rack (102);

[0094] When the plug (103) of the aging rack (102) is inserted into or removed from the power socket (104) of the aging chamber, it triggers the disconnection or conduction of the induction switch of the aging test control system.

[0095] Combined with the scenario example, the structure of the aging test control system can refer to the above embodiment, and its implementation principle and technical effect are similar, so it will not be elaborated here in this embodiment.

[0096] The aging test control system includes a conductive path composed of a power supply U1, a signal trigger D, and an induction switch K1. The induction switch K1 is used to sense whether the plug 103 of the aging rack is inserted into the power socket 104 of the aging chamber. When the induction switch K1 senses that the plug 103 of the aging rack is inserted into the power socket 104 of the aging chamber, it disconnects the conductive path composed of the power supply U1, the signal trigger D, and the induction switch K1, so that the power supply U1 cannot provide electrical energy, and the signal trigger D cannot emit any signal. When the induction switch K1 senses that the plug 103 of the aging rack leaves the power socket 104 of the aging chamber, it conducts the conductive path composed of the power supply U1, the signal trigger D, and the induction switch K1, so that the power supply U1 conducts to provide electrical energy, and after the signal trigger D responds to the power-on trigger, it emits a transfer signal.

[0097] Optionally, Figure 10 The structural schematic of the aging test system provided in the embodiment of the present application Figure 2 , such as Figure 10 shown, the aging test system further includes: a transfer cart (105);

[0098] The transfer cart (105) is used to receive the transfer signal output by the signal trigger and transfer the corresponding aging rack (102) according to the transfer signal.

[0099] Combined with the scenario example, when the induction switch K1 senses that the plug 103 of the aging rack leaves the aging chamber power socket 104, the conductive path formed by the power supply U1, the signal trigger D, and the induction switch K1 is turned on, so that the power supply U1 is turned on to provide electrical energy. After the signal trigger D responds to the power-on trigger, a transfer signal is sent to the transfer vehicle 105. A signal receiver is installed on the transfer vehicle 105, and the transfer vehicle 105 receives the transfer signal sent by the signal trigger D through the signal receiver, and then transfers the aging rack 102 out of the aging chamber.

[0100] Optionally, Figure 11 The structural schematic of the aging test system provided by the embodiment of the present application Figure 3 , as Figure 11 shown, the aging test system further includes: an aging chamber power supply (U0);

[0101] The aging chamber power supply (U0) is connected to the aging chamber power socket (104) and is used to provide electrical energy for the aging test control system.

[0102] Combined with the scenario example, the aging chamber power supply U0 provides electrical energy for the aging test control system to ensure that the aging test control system can operate normally.

[0103] Based on the aging test system provided in this embodiment, when the plug of the aging rack is connected to the aging chamber power socket, the induction switch disconnects the conductive path so that the signal trigger cannot send a signal, and the transfer vehicle will not transfer the aging rack out of the aging chamber, thus ensuring the smooth progress of the server aging test. And when the plug of the aging rack is disconnected from the aging chamber power socket, the conductive path is turned on so that the signal trigger sends a transfer signal to the transfer vehicle, so that the transfer vehicle timely transfers the aging rack out of the aging chamber, ensuring the smooth progress of the subsequent aging tests of other servers, and improving the efficiency of the server aging test.

[0104] The above has introduced in detail an aging test control system and an aging test system provided by the present application. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application. It should be noted that for those of ordinary skill in the art in this technical field, without departing from the principle of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.

Claims

1. An aging test control system, characterized in that, Including: A power supply (U1), an induction switch (K1), and a signal trigger (D). One end of the power supply (U1) is electrically connected to one end of the signal trigger (D), and the other end of the signal trigger (D) is electrically connected to one end of an aging chamber power socket (104) through a conductive path. The other end of the power supply (U1) is electrically connected to the other end of the aging chamber power socket (104) through a conductive path. An induction switch (K1) is provided at the joint of any end of the aging chamber power socket (104) and the conductive path. The induction switch (K1) is used to disconnect the electrical connection of the corresponding conductive path when it senses that the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104); and when it senses that the plug (103) of the aging rack (102) leaves the aging chamber power socket (104), it conducts the electrical connection of the corresponding conductive path, enabling the signal trigger (D) to be powered on and output a transfer signal to the transfer cart to cause the transfer cart to transfer the aging rack (102).

2. The aging test control system according to claim 1, wherein The induction switch (K1) includes: a spring device and a connecting device. One end of the connecting device is connected to one end of the aging chamber power socket (104). When the plug (103) of the aging rack (102) is inserted into the aging chamber power socket (104), the other end of the connecting device is disconnected from the other end of the aging chamber power socket (104) under the thrust of the plug (103); when the plug (103) of the aging rack (102) leaves the aging chamber power socket (104), the other end of the connecting device is connected to the other end of the aging chamber power socket (104) under the action of the spring force.

3. The aging test control system according to claim 1, characterized in that The signal trigger is at least one of an optoelectronic signal trigger, a laser signal trigger, or a radio frequency signal trigger.

4. The aging test control system according to claim 2, wherein It further includes an aging rack locking control module. The aging rack locking control module includes: a detection module (106), a control switch (K2), and a lock control mechanism (107). The detection module (106) is provided at a position corresponding to the plug (103) of the aging rack (102) for detecting whether the plug (103) of the aging rack (102) is powered on to output a detection signal. The lock control mechanism (107) is provided at a position corresponding to the rollers of the aging rack (102). The control switch (K2) is electrically connected to the detection module (106) and is used to be started or closed according to the detection signal; when the detection signal is powered on, the control switch (K2) controls the lock control mechanism (107) to lock the rollers of the aging rack (102), and when the detection signal is not powered on, the control switch (K2) controls the lock control mechanism (107) to unlock the rollers of the aging rack (102).

5. The aging test control system according to claim 4, wherein The plug (103) of the aging rack (102) includes a first-end switch contact (1031) and a second-end switch contact (1032). The detection module (106) is a voltage sensor. The first input terminal of the voltage sensor is connected to the first terminal switch contact (1031), and the second input terminal of the voltage sensor is connected to the second terminal switch contact (1032), for detecting the voltage signal inside the plug (103) of the aging rack (102); The control switch (K2) is an electric control switch, which is arranged at a preset position on the ground, and the preset position is below the roller of the aging rack (102); The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the rollers of the aging rack (102); The input terminal of the electric control switch is connected to the first output terminal of the voltage sensor, and the output terminal of the electric control switch is connected to the second output terminal of the voltage sensor, for receiving the voltage signal inside the plug (103) detected by the voltage sensor; When the electric control switch receives the voltage signal, it is electrically connected to the baffle device to control the baffle device to protrude upward to lock the roller of the aging rack (102); it is also used to disconnect the electrical connection with the baffle device when it does not receive the voltage signal, to control the baffle device to contract to unlock the roller of the aging rack (102).

6. The aging test control system according to claim 4, wherein The plug (103) of the aging rack (102) includes a first terminal switch contact (1031) and a second terminal switch contact (1032); The detection module (106) is a voltage sensor, which is arranged inside the plug (103) of the aging rack (102) and is connected between the first terminal switch contact (1031) and the second terminal switch contact (1032); The control switch (K2) is an electric control switch, which is arranged on the aging rack (102); The lock control mechanism (107) is a braking device, which is arranged at the connection between the roller of the aging rack (102) and the aging rack body; 7. The aging test control system according to claim 4, wherein The detection module (106) is a current sensor, which is arranged inside the aging chamber power socket (104) and is connected between the first end and the second end of the aging chamber power socket (104); The control switch (K2) is an electric control switch, which is arranged on the aging rack (102); The lock control mechanism (107) is a braking device, which is arranged at the connection between the roller of the aging rack (102) and the aging rack body; 8. The aging test control system according to claim 4, characterized in that The detection module (106) is a current sensor, which is arranged inside the aging chamber power socket (104) and is connected between the first end and the second end of the aging chamber power socket (104); The control switch (K2) is an electric control switch, which is arranged at a preset position on the ground, and the preset position is below the roller of the aging rack (102); The lock control mechanism (107) is a baffle device, which is located above the electric control switch and in the middle of the rollers of the aging rack (102).

9. An aging test system, characterized in that, Comprising: The aging test control system according to any one of claims 1 to 8, and an aging rack (102); When the plug (103) of the aging rack (102) is inserted into or removed from the aging chamber power socket (104), it triggers the disconnection or conduction of the induction switch of the aging test control system.

10. The aging test system according to claim 9, wherein Further comprising: A transport vehicle (105); the transport vehicle (105) is configured to receive the transport signal output by the signal trigger and transport the corresponding aging rack (102) according to the transport signal.

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