A performance detection device for electronic component production

Abstract

The application discloses an electronic component production performance detection device, and relates to the technical field of electronic component detection, which comprises a rack assembly, a driving assembly, a clamping table assembly and a self-lifting assembly, and the clamping table assembly comprises a storage plate. When the application is used, only the first electric push rod, the second electric push rod, the third electric push rod and the fourth electric push rod need to be started in sequence to open to the maximum stroke, and then the STM32 can be accurately sent to the specified position, thereby replacing the high-priced servo driving mechanism. Four groups of simple and independent distributed probes are matched with the sliding plate and the trapezoidal plate to achieve the purpose of accurately connecting the specified test pins of the STM32, thereby replacing the integrated probe table composed of a complex servo control system. The power supply, burning, GPIO and communication detection can be automatically completed throughout, the comprehensive cost can be significantly reduced, the structure is simple, maintenance is easy, the purpose of cost reduction and benefit increase is achieved, and the application is suitable for large-scale popularization and use.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of electronic component detection, and particularly relates to a performance detection device for electronic component production. BACKGROUND

[0002] Performance detection in the production process of an STM32 single-chip microcomputer in electronic components is a key link for ensuring product quality and reliability, and through comprehensive verification of STM32 power supply, burning, GPIO and communication processing functions, substandard products with unqualified parameters or defects can be effectively screened out, so that unqualified products can be prevented from flowing into the market. The detection can not only discover potential problems such as short circuit and virtual welding in advance and prevent terminal product faults, but also significantly reduce after-sales maintenance and scrap costs.

[0003] In the prior art, during performance detection of an STM32, power supply, burning, GPIO and communication processing performance need to be comprehensively detected to effectively remove defective products in the STM32. However, a precise servo driving mechanism is needed to control STM32 movement in the existing automatic detection device, and power supply, burning, GPIO and communication performance detection is completed by a test host in cooperation with an integrated probe table. The precise servo driving mechanism and the integrated probe table are expensive and have high maintenance costs, and are not suitable for large-scale popularization and use.

[0004] Therefore, the performance detection device for electronic component production is provided to solve the problems in the background technology. SUMMARY

[0005] The application aims to provide a performance detection device for electronic component production to solve the problems in the background technology.

[0006] To achieve the above object, the application provides the following technical scheme: a performance detection device for electronic component production, comprising a rack assembly, a driving assembly, a clamping table assembly and a self-lifting assembly, the clamping table assembly comprises a placement plate, the placement plate is fixedly connected with a limiting frame at the top, the limiting frame is fixedly connected with a trapezoidal plate at the top near the rear surface, the self-lifting assembly comprises four installation plates, each installation plate is slidably connected with a sliding plate at the front surface near the upper side, the sliding plate is symmetrically provided with an outer inclined opening and an inner inclined opening at the bottom near the outer side and the inner side respectively, and the sliding plate is provided with an upward extending avoiding opening between the two inner inclined openings, and the outer inclined opening, the inner inclined opening and the avoiding opening are matched with the trapezoidal plate.

[0007] Preferably, the rack assembly comprises a U-shaped rack, the right surface of the U-shaped rack is fixedly connected with a front plate, the left surface of the U-shaped rack is fixedly connected with a rear plate, the inner surface wall of the front and rear sides of the U-shaped rack is provided with a sliding groove near the top, the outer surface of the front and rear sides of the storage plate is fixedly connected with a T-shaped strip, the inner surface of the T-shaped strip is rotatably connected with a pulley near the four corners, and the T-shaped strip is arranged in the sliding groove and the outer surface of the pulley is rollingly attached to the inner wall of the sliding groove.

[0008] Preferably, the four sliding plates are fixedly connected with a connecting frame near the top of the front surface, the bottom of the four connecting frames is respectively fixedly connected with a first probe, a second probe, a third probe and a fourth probe, a spring is fixedly connected between the top of the sliding plate and the inner top of the mounting plate, a test host is installed on the left surface of the rear plate, and the test host is electrically connected with the first probe, the second probe, the third probe and the fourth probe through lines.

[0009] Preferably, the driving assembly comprises a first electric push rod, the first electric push rod is fixedly connected to the left surface of the front plate and the telescopic end extends to the left, the telescopic end of the first electric push rod is fixedly connected with a first connecting plate extending to the front side, a second electric push rod extending to the left is installed on the outer surface of the first connecting plate near the right side, the telescopic end of the second electric push rod is fixedly connected with a second connecting plate extending downward, a third electric push rod extending to the left is installed on the outer surface of the second connecting plate near the right side.

[0010] Preferably, the telescopic end of the third electric push rod is fixedly connected with a third connecting plate extending backward, a fourth electric push rod extending to the left is installed on the outer surface of the third connecting plate near the right side, the telescopic end of the fourth electric push rod is fixedly connected with a fourth connecting plate, the storage plate is fixedly connected to the left surface of the fourth connecting plate near the top, and the outer surface of the fourth connecting plate is slidably attached to the inner surface wall of the U-shaped rack.

[0011] Preferably, the top of the mounting plate is provided with a through hole, the inner wall of the through hole is adhesively connected with a rubber sleeve, the top of the sliding plate is fixedly connected with an upward extending guide rod, the outer surface of the guide rod is slidably attached to the inner wall of the rubber sleeve, and the spring is sleeved outside the guide rod.

[0012] Preferably, four stroke switches are installed on the top of the mounting plate on the rear side of the through hole, the stroke switch trigger lever and the guide rod are matched, and the four stroke switches are electrically connected with the test host through lines.

[0013] Preferably, the inner wall of the limiting frame is provided with an inclined opening around, the bottom of the trapezoidal plate is slidably attached to the top of the U-shaped rack near the rear side, and the trapezoidal plate and the sliding plate are matched in position.

[0014] Preferably, rotation bases are symmetrically and fixedly connected to the top of the limiting frame near the front side, a rotating shaft is rotatably connected between the outer surfaces of the two rotation bases, a soft rubber rod is sleeved on the outer surface of the rotating shaft, and the soft rubber rod is arranged in an X shape.

[0015] Preferably, a round rod is fixedly connected to the outer surface of the soft rubber rod away from the rotation base, arc-shaped clamping seats are symmetrically and fixedly connected to the top of the limiting frame near the rear side, and the top of the round rod and the arc-shaped clamping seat are clampedly connected.

[0016] Compared with the prior art, the present application has the following advantages:

[0017] 1. When the present application is used, only the first, second, third and fourth electric push rods need to be started in sequence to open to the maximum stroke, and then the STM32 can be accurately sent to the specified position, replacing the high-priced servo drive mechanism. Four groups of simple and independent distributed probes cooperate with the sliding plate and the trapezoidal plate to achieve the purpose of accurately docking the specified test pins of the STM32, replacing the integrated probe table composed of a complex servo control system. The power supply, burning, GPIO and communication detection can be automatically completed throughout, the comprehensive cost can be significantly reduced, the structure is simple, easy to maintain, the purpose of reducing cost and increasing benefit is achieved, and it is suitable for large-scale popularization and use.

[0018] 2. When the present application is used, after the STM32 on the object placing table is positioned, the sliding plate will move upwards and press the spring to contract and drive the guide rod to move upwards. The guide rod presses and triggers the stroke switch in the corresponding area. The stroke switch directly provides a binary signal to the test host to prompt that the STM32 has been positioned. Then, the test host directly starts the corresponding test program according to the electrical signal sent by the different stroke switches, thereby omitting the process of real-time position calibration required by traditional automatic detection equipment. The present application has the effects of simplifying hardware, reducing cost, simplifying logic and reducing the hardware requirements of the test host, thereby further improving the automation degree of the present device and reducing the equipment cost.

[0019] 3. When the present application is used, after the object placing table drives the STM32 to be completely positioned, the sliding plate moves downwards. In this process, the spring generates a downward thrust to ensure that the sliding plate and the probe can smoothly descend to the specified height. In addition, the friction generated by the guide rod in the rubber sleeve during the downward sliding process provides a good damping effect, which can avoid damage to the probe and the STM32 caused by the excessive falling speed of the probe, and improves the reliability of the present device.

[0020] 4、The application is used, when the STM32 is installed on the top of the storage plate, it is placed in the inside of the limiting frame, under the action of the inclined port, the STM32 will slide down to the designated position, without additional adjustment operation, then the round rod is turned to the arc port clamping seat direction, at this time the soft rubber rod will rotate around the pivot as the center and the rotating seat, then the X-shaped soft rubber rod will be pressed on the top of the STM32 to fix it, at the same time the X-shaped soft rubber rod will not block the test pins around the STM32, when the STM32 is removed, pull the round rod upwards to separate it from the arc port clamping seat, the design is simple in structure, convenient to operate, and improves the STM32 clamping efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 It is a perspective view of the performance detection device for electronic component production of the application;

[0022] Figure 2 It is an expanded view of the performance detection device for electronic component production of the application;

[0023] Figure 3 It is another angle perspective view of the performance detection device for electronic component production of the application;

[0024] Figure 4 It is a perspective view of the driving assembly of the performance detection device for electronic component production of the application;

[0025] Figure 5 It is an expanded view of the driving assembly of the performance detection device for electronic component production of the application;

[0026] Figure 6 It is a sectional view of the performance detection device for electronic component production of the application;

[0027] Figure 7 It is a structure schematic view of the clamping table assembly of the performance detection device for electronic component production of the application;

[0028] Figure 8 It is a structure schematic view of the self-lifting assembly of the performance detection device for electronic component production of the application;

[0029] Figure 9 It is a trapezoidal plate moving schematic view of the performance detection device for electronic component production of the application.

[0030] As shown in the figure, the present application provides a technical solution: a performance detection device for electronic component production, comprising: a rack assembly 1, a driving assembly 2, a clamping table assembly 3 and a self-lifting assembly 4, the clamping table assembly 3 comprises a storage plate 301, the top of the storage plate 301 is fixedly connected with a limiting frame 304, the top of the limiting frame 304 is fixedly connected with a trapezoidal plate 306 near the back surface, the self-lifting assembly 4 is provided with four, each comprising a mounting plate 401, the front surface of the mounting plate 401 is slidably connected with a sliding plate 402 near the top, the bottom of the sliding plate 402 is symmetrically provided with an outer inclined port 409 and an inner inclined port 410 near the outer side and the inner side respectively, the bottom of the sliding plate 402 is provided with an upward extending avoiding port 411 between the two inner inclined ports 410, and the outer inclined port 409, the inner inclined port 410 and the avoiding port 411 are matched with the trapezoidal plate 306. DETAILED DESCRIPTION

[0031] The technical solutions in the embodiments of the present application will be described clearly and completely below in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative labor are within the protection scope of the present application.

[0032] Embodiment one: please refer to Figures 1-9 As shown in the figure, the present application provides a technical solution: a performance detection device for electronic component production, comprising: a rack assembly 1, a driving assembly 2, a clamping table assembly 3 and a self-lifting assembly 4, the clamping table assembly 3 comprises a storage plate 301, the top of the storage plate 301 is fixedly connected with a limiting frame 304, the top of the limiting frame 304 is fixedly connected with a trapezoidal plate 306 near the back surface, the self-lifting assembly 4 is provided with four, each comprising a mounting plate 401, the front surface of the mounting plate 401 is slidably connected with a sliding plate 402 near the top, the bottom of the sliding plate 402 is symmetrically provided with an outer inclined port 409 and an inner inclined port 410 near the outer side and the inner side respectively, the bottom of the sliding plate 402 is provided with an upward extending avoiding port 411 between the two inner inclined ports 410, and the outer inclined port 409, the inner inclined port 410 and the avoiding port 411 are matched with the trapezoidal plate 306.

[0033] The rack assembly 1 comprises a U-shaped rack 101, the right surface of the U-shaped rack 101 is fixedly connected with a front plate 102, the left surface of the U-shaped rack 101 is fixedly connected with a rear plate 104, the inner walls of the front and rear sides of the U-shaped rack 101 are both provided with a sliding groove 103 near the top, the outer surfaces of the front and rear sides of a storage plate 301 are both fixedly connected with a T-shaped strip 302, the inner part of the T-shaped strip 302 is rotatably connected with a pulley 303 near four corners, and the T-shaped strip 302 is arranged in the sliding groove 103 and the outer surface of the pulley 303 is in rolling contact with the inner wall of the sliding groove 103.

[0034] The front surfaces of the four sliding plates 402 are all fixedly connected with a connecting frame 403 near the top, the bottoms of the four connecting frames 403 are respectively fixedly connected with a first probe 51, a second probe 52, a third probe 53 and a fourth probe 54, the top of the sliding plate 402 and the inner top of the mounting plate 401 are fixedly connected with a spring 407, and the left surface of the rear plate 104 is provided with a test host 105, and the test host 105 is electrically connected with the first probe 51, the second probe 52, the third probe 53 and the fourth probe 54 through a circuit.

[0035] The driving assembly 2 comprises a first electric push rod 201, the first electric push rod 201 is fixedly connected to the left surface of the front plate 102 and extends to the left, the first electric push rod 201 is fixedly connected with a first connecting plate 202 extending to the front side at the telescopic end, a second electric push rod 203 extending to the left at the telescopic end is arranged on the outer surface of the first connecting plate 202 near the right side, the second electric push rod 203 is fixedly connected with a second connecting plate 204 extending downward at the telescopic end, and a third electric push rod 205 extending to the left at the telescopic end is arranged on the outer surface of the second connecting plate 204 near the right side.

[0036] The telescopic end of the third electric push rod 205 is fixedly connected with a third connecting plate 206 extending backward, the telescopic end of a fourth electric push rod 207 extending to the left is arranged on the outer surface of the third connecting plate 206 near the right side, the fourth electric push rod 207 is fixedly connected with a fourth connecting plate 208, the storage plate 301 is fixedly connected to the left surface of the fourth connecting plate 208 near the top, and the outer surface of the fourth connecting plate 208 is in sliding contact with the inner wall of the U-shaped rack 101.

[0037] The application uses steps, when using, the STM32 is fixed inside the limiting frame 304 on the top of the object plate 301, the first electric push rod 201, the second electric push rod 203, the third electric push rod 205 and the fourth electric push rod 207 are started in turn to extend to the maximum stroke, the first electric push rod 201 will drive the second electric push rod 203, the third electric push rod 205, the fourth electric push rod 207 and the fourth connecting plate 208 to move left by a specified stroke through the first connecting plate 202, the fourth connecting plate 208 drives the object plate 301 to move left, so that the STM32 moves accurately to the right side below the first probe 51, in the process, the trapezoidal plate 306 will lift the sliding plate 402 upward when contacting the outer inclined port 409 at the bottom of the sliding plate 402 in the moving process, the connecting frame 403 will drive the first probe 51 to move upward with the sliding plate 402, when the trapezoidal plate 306 reaches the avoiding port 411 position at the bottom of the sliding plate 402, the sliding plate 402 will move downward to reset, at this time, the trapezoidal plate 306 is located inside the avoiding port 411, so that when the STM32 is close to the first probe 51, the first probe 51 will automatically rise to avoid, and after the STM32 reaches the first probe 51 directly below, the first probe 51 will complete the straight-line falling and contact with the power pin of the STM32, the internal integrated adjustable power supply of the test host 105 replaces the external power supply, the integrated STM32 burns the firmware to replace the ST-Link debugger, and the direct driving / detection signal of the GPIO expansion board replaces the logic analyzer, the internal modules are all market products and have low cost, the first probe 51, the second probe 52, the third probe 53 and the fourth probe 54 select the low-cost spring needle on the market and are fixed on the plate material in groups to replace the integrated probe station, the cost can be greatly reduced, the test host 105 applies 3.3V voltage, after measuring the static current, the power supply performance detection is completed and recorded, when the second electric push rod 203 is extended to the maximum stroke, it will drive the third electric push rod 205 and the fourth electric push rod 207 to move left again by a specified stroke, during the process, when the inclined surface of the trapezoidal plate 306 will be in contact with the inner inclined port 410 at the bottom of the sliding plate 402, it will again lift the sliding plate 402 and the first probe 51 upward, then the trapezoidal plate 306 enters the avoidance port 411 below another sliding plate 402, at this time the second probe 52 will perform the same action as the first probe 51 and accurately connect with the debugging pin of STM32, then the test host 105 cooperates with the second probe 52 and injects the burning test program through the SWD protocol and reads the Flash content to verify the integrity, then records the data, then the third electric push rod 205 and the fourth electric push rod 207 are started, and the third connecting plate 206 and the fourth connecting plate 208 will accurately send the storage plate 301 and the STM32 to the below of the third probe 53 and the fourth probe 54, then the third probe 53 and the fourth probe 54 are accurately connected with the GPIO pin and the serial port pin of the STM32, then the test machine 105 cooperates with the third probe 53 to pull up / pull down PA0-PA3 in turn, and records the GPIO test data after detecting the output voltage with the comparator, and records whether the signal data returned by the STM32 is complete after the fourth probe 54 inputs signal data to the STM32, and then completes the communication test, when the device is used, only the first electric push rod 201, the second electric push rod 203, the third electric push rod 205 and the fourth electric push rod 207 are started in turn to the maximum stroke, then the STM32 can be accurately sent to the specified position, replacing the high-priced servo drive mechanism, the four groups of simple and independent distributed probes cooperate with the sliding plate 402 and the trapezoidal plate 306 to achieve the purpose of accurately connecting the specified test pin of the STM32, replacing the integrated probe table composed of a complex servo control system, and the power supply, burning, GPIO and communication detection can be completed automatically throughout the process, while the comprehensive cost can be significantly reduced, and the structure is simple and easy to maintain, achieving the purpose of cost reduction and efficiency improvement, suitable for large-scale popularization and use, during the movement of the storage plate 301, the T-shaped bar 302 slides in the sliding groove 103, which serves to slide the storage plate 301 in the U-shaped rack 101, and the design of the pulley 303 is mainly used to reduce the friction between the T-shaped bar 302 and the inner wall of the sliding groove 103.

[0038] Embodiment two: as shown in Figures 1-3 and Figure 8 The difference between the base combined with the embodiment is that the mounting plate 401 is provided with a through port 405 at the top, the through port 405 is adhesively connected with a rubber sleeve 406 on the inner wall, the sliding plate 402 is fixedly connected with an upward extending guide rod 404 at the top, the guide rod 404 is in sliding fit with the inner wall of the rubber sleeve 406, and the spring 407 is sleeved outside the guide rod 404.

[0039] The four stroke switches 408 are installed on the top of the four mounting plates 401 at the rear side of the through hole 405, and trigger the cooperation of the dial lever and the guide rod 404, and the four stroke switches 408 are electrically connected to the test host 105 through a line.

[0040] When the sliding plate 402 is moved up, the spring 407 is compressed and the guide rod 404 is moved up, and in the process, the guide rod 404 presses the stroke switch 408 in the corresponding area, and the stroke switch 408 directly provides a binary signal to the test host 105 to prompt that the STM32 is in place, and then the test host 105 directly starts the corresponding test program according to the electrical signal sent by the different stroke switches 408, which saves the process of real-time position calibration required by traditional automatic detection equipment, simplifies the hardware and reduces the cost, and simplifies the logic and reduces the hardware requirements of the test host, thereby further improving the automation degree of the device and reducing the equipment cost, and in the process of moving the sliding plate 402 downward, the spring 407 generates a downward thrust to ensure that the sliding plate 402 and the probe can smoothly descend to the specified height, and the friction generated by the guide rod 404 in the rubber sleeve 406 during the downward sliding process provides a good damping effect, which can avoid the probe and the STM32 being damaged due to the probe falling too fast, and improve the reliability of the device.

[0041] Embodiment three: as shown in Figures 1-3 and Figure 7 The difference between the embodiment and the embodiment is that the inclined openings 305 are formed in the inner walls around the limiting frame 304, the trapezoidal plate 306 is slidably attached to the top of the U-shaped rack 101 near the rear side, and the trapezoidal plate 306 and the sliding plate 402 are positioned in cooperation.

[0042] The rotating seats 307 are symmetrically and fixedly connected to the top of the limiting frame 304 near the front side, the rotating shaft 308 is rotatably connected between the outer surfaces of the two rotating seats 307, the soft rubber rod 309 is sleeved on the outer surface of the rotating shaft 308, and the soft rubber rod 309 is arranged in an X shape.

[0043] The circular rod 310 is fixedly connected to the outer surface of the soft rubber rod 309 away from the rotating seat 307, the arc-shaped clamping seat 311 is symmetrically and fixedly connected to the top of the limiting frame 304 near the rear side, and the circular rod 310 and the arc-shaped clamping seat 311 are clamped at the top.

[0044] The application uses steps, when the STM32 is placed in the special size limiting frame 304, the STM32 will slide down to the designated position on the top of the storage plate 301 under the action of the inclined port 305, without additional adjustment operation, then the round rod 310 is turned to the arc port clamping seat 311 direction, the soft rubber rod 309 will rotate around the pivot 308 as the center and the rotating seat 307, then the X-shaped soft rubber rod 309 will be pressed on the top of the STM32 to fix it after the round rod 310 and the arc port clamping seat 311 on the top of the arc port are clamped, at the same time, the X-shaped soft rubber rod 309 will not block the test pins around the STM32, when the STM32 is removed, the round rod 310 is pulled up to separate it from the arc port clamping seat 311, the design is simple in structure, convenient in operation, improves the STM32 clamping efficiency, the soft rubber rod 309 is composed of internal metal sheet and external silica gel layer, has certain extensibility, can effectively press the STM32 on the storage plate 301 and will not cause bruising.

[0045] The effect and working principle of the whole mechanism are as follows: when the device is used for performance detection of the STM32, the STM32 is fixed inside the limiting frame 304 on the top of the storage plate 301, then the first electric push rod 201, the second electric push rod 203, the third electric push rod 205 and the fourth electric push rod 207 are started in turn to extend to the maximum stroke, when the first electric push rod 201 extends to the maximum stroke, the second electric push rod 203, the third electric push rod 205, the fourth electric push rod 207 and the fourth connecting plate 208 are driven by the first connecting plate 202 to move leftwards by a specified stroke, at this time, the fourth connecting plate 208 drives the storage plate 301 to move leftwards by a specified distance, so that the STM32 is accurately moved below the first probe 51 at the bottom of the rightmost connecting frame 403, and in the process, the trapezoidal plate 306 moving with the limiting frame 304 above the storage plate 301 contacts the outer inclined port 409 at the bottom of the sliding plate 402 in the moving process, so that the sliding plate 402 is lifted upwards, at this time, the connecting frame 403 drives the first probe 51 to move upwards with the sliding plate 402, when the trapezoidal plate 306 reaches the avoiding port 411 position at the bottom of the sliding plate 402, the sliding plate 402 moves downwards to reset, at this time, the trapezoidal plate 306 is located inside the avoiding port 411 without resisting the sliding plate 402, so that when the STM32 approaches the first probe 51, the first probe 51 automatically rises to avoid, when the STM32 reaches directly below the first probe 51, the first probe 51 completes linear falling and contacts the power pin of the STM32, then the test host 105 applies 3.3V voltage, after measuring the static current, the power supply performance test is completed and recorded. Then, when the second electric push rod 203 is extended to the maximum stroke, it will drive the third electric push rod 205 and the fourth electric push rod 207 to move to the left again by the specified stroke through the second connecting plate 204. During the process, the inclined surface of the trapezoidal plate 306 will conflict with the inner oblique opening 410 at the bottom of the sliding plate 402, which will push the sliding plate 402 and the first probe 51 upward again. Then the trapezoidal plate 306 enters the avoidance opening 411 under the other sliding plate 402. At this time, the second probe 52 will move together with the third electric push rod 205 and the fourth electric push rod 207. After the first probe 51 performs the same action, it precisely docks with the debugging pin of STM32. Then, the test host 105 cooperates with the second probe 52 and injects the burning test program through the SWD protocol and reads the Flash content to verify the integrity and record the data. Then, after the third electric push rod 205 and the fourth electric push rod 207 are started, the third connecting plate 206 and the fourth connecting plate 208 will accurately send the storage plate 301 and STM32 to the bottom of the third probe 53 and the fourth probe 54, so that the third probe 53 and the fourth probe 54 are aligned with the ST The STM32's GPIO pins and serial port pins are precisely aligned. The tester 105 then cooperates with the third probe 53 to sequentially pull PA0-PA3 high and low. A comparator detects the output voltage and records the GPIO test data. The fourth probe 54 then inputs signal data to the STM32 and records the integrity of the signal data returned by the STM32, completing the communication test. When in use, this device only requires activating the first, second, third, and fourth electric push rods 201, 203, 205, and 207 to their maximum travel in sequence to precisely move the STM32 to the designated position. This replaces the expensive servo drive mechanism. Four sets of simple, independently distributed probes, along with the sliding plate 402 and trapezoidal plate 306, precisely align the STM32's designated test pins, replacing an integrated probe station with a complex internal servo control system. Power supply, programming, GPIO, and communication testing are fully automated, significantly reducing overall costs. The device's simple structure and ease of maintenance achieve cost-effectiveness and make it suitable for large-scale deployment.

[0046] In use, when the sliding plate 402 is moved upward under the resistance of the trapezoidal plate 306, the top of the sliding plate 402 will squeeze the spring 407 to contract and drive the guide rod 404 to move upward, and in the process, the guide rod 404 at different positions will squeeze the travel switch 408 of the corresponding function detection area, and in the process, the travel switch 408 will directly provide a binary signal to the test host 105 to prompt that the STM32 has been positioned, and then the test host 105 will directly start the corresponding test program according to the electrical signal sent by the different travel switches 408, thereby saving the real-time position calibration process required by traditional automated detection equipment, simplifying the hardware and reducing the cost, and simplifying the logic and reducing the hardware requirements of the test host, thereby further improving the automation degree of the device and reducing the equipment cost, and in the process of downward movement of the sliding plate 402, the spring 407 will generate a downward thrust to ensure that the sliding plate 402 and the probe can smoothly descend to the specified height, and in the process, the friction generated by the downward sliding of the guide rod 404 in the rubber sleeve 406 provides good damping effect, which can avoid the probe from falling too fast and causing damage to the probe and the STM32, thereby improving the reliability of the device.

[0047] In use, when the STM32 is installed on the top of the storage plate 301 and placed inside the specially sized limiting frame 304, the STM32 will slide downward to the specified position on the top of the storage plate 301 under the action of the inclined port 305, without the need for additional adjustment operation, and then the round rod 310 is flipped towards the arc port clamping seat 311, at this time the soft rubber rod 309 will rotate around the pivot 308 and the rotating seat 307, and then after the round rod 310 and the arc port clamping seat 311 on the top of the arc-shaped port are clamped, the X-shaped soft rubber rod 309 will be pressed on the top of the STM32 to fix it, and the X-shaped soft rubber rod 309 will not block the test pins around the STM32, and when the STM32 is removed after detection, the round rod 310 is pulled upward to separate it from the arc port clamping seat 311, which is simple in structure and convenient to operate, and improves the clamping efficiency of the STM32.

[0048] Although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art can modify the technical solutions described in the foregoing embodiments or make equivalent replacements to some technical features, and any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A performance testing device for electronic component production, characterized in that: include: A frame assembly (1), a drive assembly (2), a clamping platform assembly (3) and a self-lifting assembly (4); The clamping platform assembly (3) comprises a storage plate (301), the top of the storage plate (301) is fixedly connected to a limiting frame (304), and the top of the limiting frame (304) near the rear surface is fixedly connected to a trapezoidal plate (306); There are four self-lifting components (4), each comprising a mounting plate (401), a sliding plate (402) being slidably connected to a front surface of the mounting plate (401) near the top, an outer bevel (409) and an inner bevel (410) being symmetrically provided at the bottom of the sliding plate (402) near the outer side and the inner side, respectively, a relief opening (411) extending upwards being provided at the bottom of the sliding plate (402) between the two inner bevel openings (410), and the outer bevel (409), the inner bevel (410) and the relief opening (411) being matched with the trapezoidal plate (306); The drive assembly (2) comprises a first electric push rod (201), the first electric push rod (201) being fixedly connected to the left surface of the front plate (102) and having a telescopic end extending to the left, the telescopic end of the first electric push rod (201) being fixedly connected to a first connecting plate (202) extending forward, a second electric push rod (203) having a telescopic end extending to the left is installed on the outer surface of the first connecting plate (202) near the right side, the telescopic end of the second electric push rod (203) being fixedly connected to a second connecting plate (204) extending downward, and a third electric push rod (205) having a telescopic end extending to the left is installed on the outer surface of the second connecting plate (204) near the right side; The telescopic end of the third electric push rod (205) is fixedly connected to a third connecting plate (206) extending backward, and a fourth electric push rod (207) with a telescopic end extending leftward is installed near the right side of the outer surface of the third connecting plate (206). The telescopic end of the fourth electric push rod (207) is fixedly connected to a fourth connecting plate (208), and the storage plate (301) is fixedly connected to a position near the top of the left surface of the fourth connecting plate (208). The outer surface of the fourth connecting plate (208) is slidably fitted to the inner surface wall of the U-shaped frame (101).

2. The performance testing device for electronic component production according to claim 1, characterized in that: The rack assembly (1) comprises a U-shaped rack (101), wherein a front plate (102) is fixedly connected to the right surface of the U-shaped rack (101), and a rear plate (104) is fixedly connected to the left surface of the U-shaped rack (101). A slide groove (103) is provided on the inner wall of the front and rear sides of the U-shaped rack (101) near the top. The outer surfaces of the front and rear sides of the storage plate (301) are fixedly connected to T-shaped bars (302). Positions near the four corners of the T-shaped bars (302) are rotatably connected to pulleys (303). The T-shaped bars (302) are arranged inside the slide groove (103), and the outer surface of the pulley (303) and the inner wall of the slide groove (103) are in rolling contact.

3. The performance testing device for electronic component production according to claim 2, characterized in that: The front surfaces of the four sliding plates (402) are all fixedly connected to a connection frame (403) near the top, and the bottoms of the four connection frames (403) are respectively fixedly connected to a first probe (51), a second probe (52), a third probe (53) and a fourth probe (54). A spring (407) is fixedly connected between the top of the sliding plate (402) and the top of the mounting plate (401). A test host (105) is installed on the left surface of the rear plate (104). The test host (105) is electrically connected to the first probe (51), the second probe (52), the third probe (53) and the fourth probe (54) through circuits.

4. The performance testing device for electronic component production according to claim 3, characterized in that: A through opening (405) is provided at the top of the mounting plate (401), and a rubber sleeve (406) is bonded to the inner wall of the through opening (405). An upwardly extending guide rod (404) is fixedly connected to the top of the sliding plate (402), and the outer surface of the guide rod (404) and the inner wall of the rubber sleeve (406) are slidably fitted, and the spring (407) is sleeved on the outside of the guide rod (404).

5. The performance testing device for electronic component production according to claim 1, characterized in that: A travel switch (408) is installed at the top of each of the four mounting plates (401) at a position behind the through opening (405). The travel switch (408) triggers the lever and the guide rod (404) to cooperate with each other. The four travel switches (408) are electrically connected to the test host (105) through a circuit.

6. The performance testing device for electronic component production according to claim 1, characterized in that: The inner walls of the limiting frame (304) are all provided with inclined openings (305), the bottom of the trapezoidal plate (306) and the top of the U-shaped frame (101) near the rear side are slidably fitted, and the positions of the trapezoidal plate (306) and the sliding plate (402) are matched.

7. The performance testing device for electronic component production according to claim 1, characterized in that: A rotating seat (307) is symmetrically fixedly connected to the top of the limit frame (304) near the front side, and a rotating shaft (308) is rotatably connected between the outer surfaces of the two rotating seats (307). A soft rubber rod (309) is sleeved on the outer surface of the rotating shaft (308), and the soft rubber rod (309) is arranged in an X shape.

8. The performance testing device for electronic component production according to claim 7, characterized in that: The outer surface of the soft rubber rod (309) is fixedly connected to a round rod (310) at a position away from the rotating seat (307), and the top of the limit frame (304) is symmetrically fixedly connected to an arc-shaped clamping seat (311) at a position close to the rear side. The round rod (310) and the top of the arc-shaped clamping seat (311) are in a snap-fit ​​connection.

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