Automatic test system and method for voltage reference chip

By designing an automated test system, combining the data acquisition system, host computer, verification board and coaxial anti-interference cable, the integration and accuracy of existing voltage reference chip tests are solved, and efficient and accurate voltage reference chip tests are achieved.

CN120254564APending Publication Date: 2025-07-04CHINA STATE SHIPBUILDING CORP NO 707 RES INST
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Patent Information

Application Number
CN202510390649.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-31
Publication Date
2025-07-04

AI Technical Summary

Technical Problem

There are gaps in existing voltage reference chip testing instruments in terms of versatility, applicability, interface standardization, process automation and high-precision electrical parameter testing. They have low integration, insufficient accuracy, low automation, and are susceptible to external environment interference, making it difficult to achieve efficient and accurate testing.

Method used

An automated test system is designed, including a data acquisition system, a computer, a verification board, a program-controlled power supply and a coaxial anti-interference cable. Through unified control and high-precision data acquisition, automated testing of voltage reference chips is realized, external interference is reduced, and multiplexing and automatic data recording is supported.

Benefits of technology

It improves the accuracy and efficiency of voltage reference chip parameter testing, has user interaction page and automated testing functions, adapts to a variety of environments, and achieves high reliability and high precision test results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention belongs to the technical field of electronic component testing, and discloses an automatic testing system and method for a voltage reference chip. The system can be detachably connected with a voltage reference chip, can detect the voltage reference chip, and comprises a data acquisition system, an upper computer, a verification board, a programmable power supply and a coaxial anti-interference cable. The test system is provided with a data acquisition system, an upper computer, a verification board, a programmable power supply and a coaxial anti-interference cable, and can acquire reference voltages output by a voltage reference chip under different thermal environments, power supply voltages and loads, analyze and calculate whether various indexes of the voltage reference chip meet specifications or not, and determine whether the indexes of the voltage reference chip meet the specifications or not. And an automatic testing effect is achieved.
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Description

Technical Field

[0001] The present invention belongs to the technical field of electronic component testing, and particularly relates to an automated testing system and method for a voltage reference chip. Background Art

[0002] The voltage reference source is one of the core components in modern electronic circuits and is widely used in the fields of communication, computers, instruments, and automation. The voltage reference chip is an integrated circuit that provides an accurate and stable voltage output and is the most common voltage reference source. As a reference voltage source, it mainly exists in units such as digital-to-analog conversion, power management, and clock control in electronic devices. The parameters of the voltage reference chip mainly include: reference voltage deviation, reference voltage temperature coefficient, reference voltage linear regulation rate, load regulation rate, etc. The performance of this device plays a crucial role in the performance of electronic devices. Currently, voltage reference source chips are developing towards the direction of high precision, low noise, small size, and low power consumption.

[0003] However, most current voltage reference chip testing instruments and devices have a large gap from the international advanced level in the fields of generality, applicability, interface standardization, process automation, and high-precision electrical parameter testing, and cannot achieve a general design. The capabilities and coverage of various tests are insufficient.

[0004] Defects of the prior art:

[0005] 1. Poor integration: In current voltage reference chip testing, most use scattered instruments and meters (such as power supplies, loads, signal sources, digital multimeters, etc.). Each testing instrument is independent, lacking an industrial control computer and control program for unified command issuance. When adjusting parameters, it is necessary to operate the control panel of each instrument and meter separately, rather than being uniformly controlled by the main control program. In addition, the volumes, weights, power supply interfaces, and signal transmission interfaces of each instrument and meter are inconsistent. If these instruments need to be moved, they need to be disassembled and reassembled, which is time-consuming and laborious, and the cables are prone to connection errors. Noise and interference will also be generated between multi-channel coaxial anti-interference cables. If a certain testing instrument fails, it is very difficult to isolate and locate the fault, and there is a lack of a system with self-checking functions.

[0006] 2. Low accuracy: The output of the voltage reference chip is an accurate voltage. During environmental tests such as high temperature resistance, low temperature resistance, temperature cycling, and aging, as the temperature changes, the voltage change amount will also change. If a data acquisition circuit is designed on the test board to collect the reference voltage, not only the accuracy cannot meet the test requirements, but the circuit parameters will also change with temperature, resulting in inaccurate test results. In addition, the voltage reference is a high-accuracy analog signal and requires a low-noise test environment. To improve the test accuracy and reduce external environmental interference, the data acquisition system can be placed outside the test board, preferably integrated into a test system to achieve the purpose of accurate testing.

[0007] 3. Low degree of automation: When a single chip is undergoing environmental tests or long-term working stability tests, a large amount of data needs to be recorded. Testing a single chip requires recording hundreds or thousands of data points. The existing testing methods can only manually record the data read from the testing instruments, which is time-consuming and laborious, and there is a lack of an interactive management software that can automatically record, store, and statistically analyze the test data for the entire process and is compatible with the testing instruments.

[0008] Therefore, there is an urgent need for one or several related new devices. Summary of the Invention

[0009] The purpose of the present invention is to overcome the deficiencies in the prior art and provide an automated testing system and method for voltage reference chips.

[0010] The technical solution adopted by the present invention to solve its technical problems is:

[0011] An automated testing system for voltage reference chips, the system can be detachably connected to the voltage reference chip and can detect the voltage reference chip. The system includes a data acquisition system, a host computer, a verification board, a programmable power supply, and a coaxial anti-interference cable;

[0012] The control interface input end of the programmable power supply is connected to the host computer through a test network cable, the electrical signal interface output end of the programmable power supply is connected to the verification board through a coaxial anti-interference cable, the electrical signal output end of the verification board is connected to the electrical signal input end of the data acquisition system through a coaxial anti-interference cable, the data interface of the host computer is connected to the data interface of the verification board through a coaxial anti-interference cable, the control interface of the host computer is connected to the control interface of the verification board through a network cable, the data interface of the data acquisition system is connected to the data interface of the host computer through an SMA radio frequency cable and a coaxial anti-interference cable, and the control interface of the data acquisition system is connected to the control interface of the host computer through a network cable;

[0013] The data acquisition system can perform verification data acquisition and communicate with the host computer;

[0014] The host computer can perform control operations on the data acquisition system, the programmable power supply, and the verification board;

[0015] The verification board can provide a peripheral circuit for the voltage reference chip to be tested, provide the input voltage and output load for testing the chip, and communicate with the host computer;

[0016] The programmable power supply can provide the input power required by the verification board;

[0017] The coaxial anti-interference cable is used to transmit electrical signals.

[0018] Further, the data acquisition system includes a channel selection module, a signal processing module, an analog-to-digital conversion module, a data buffer module, and an external interface module. The channel selection module, the signal processing module, the analog-to-digital conversion module, the data buffer module, and the external interface module are connected in sequence. The channel selection module can receive voltage input, and the external interface module outputs external data.

[0019] Alternatively, the host computer uses an embedded controller with a central processing unit, and its main board has interfaces such as LAN, SATA, GPIB, RS-232, USB, and KVM.

[0020] Alternatively, the programmable power supply is connected to the host computer using the RS232 communication protocol and can provide the power required for the verification board.

[0021] Alternatively, the data acquisition system uses a standard PXI, including a multiplexer switch, a digital multimeter, and an Ethernet switch. The multiplexer switch can implement the multiplexing function of selecting one from multiple options. The test system can access multiple verification boards simultaneously and perform tests in sequence without repeatedly connecting test cables. The digital multimeter can achieve high-speed and accurate measurement of the electrical signals of the verification board, and the Ethernet switch can ensure data transmission and link control between the devices of the test system.

[0022] Further, the data acquisition system and the verification board are connected to the host computer through coaxial anti-interference cables. The host computer is connected to the power supply through coaxial anti-interference cables. The power supply is connected to the verification board through coaxial anti-interference cables. The verification board is connected to the data acquisition system through coaxial anti-interference cables.

[0023] The data acquisition system can be used to verify data acquisition, communicate with the host computer, accurately collect the input reference voltage according to the instructions of the host computer, store it, and finally be read by the host computer.

[0024] The verification board can provide a peripheral circuit for the voltage reference chip to be tested, provide the input voltage and output load of the test chip, communicate with the host computer, and adjust the input and output of the verification circuit according to the instructions of the host computer.

[0025] The programmable power supply can provide the input power required for the verification board, and the voltage can be controlled as needed. The programmable power supply is controlled by the host computer software.

[0026] The coaxial anti-interference cable is used to transmit electrical signals.

[0027] Further, the verification board includes a control circuit and a test circuit connected to each other. The control circuit includes a single-chip microcomputer and an Ethernet PHY interface. The input end of the Ethernet PHY interface is connected to the host computer, and the input end of the single-chip microcomputer is connected to the output end of the Ethernet PHY interface; the test circuit includes a device to be verified, an adjustable power supply, and an adjustable load. The input end of the adjustable power supply is connected to the output end of the programmable power supply. The input end of the device to be verified is connected to the adjustable power supply and the output end of the single-chip microcomputer. The output end of the single-chip microcomputer is also connected to the input end of the adjustable load. The output ends of the device under test, i.e., the device to be verified, and the adjustable load are connected in parallel to the input end of the data acquisition system.

[0028] Further, in the control circuit of the verification board, the single-chip microcomputer chip uses STM32 as the MCU;

[0029] Alternatively, in the test circuit of the verification board, the adjustable power supply is a linear voltage regulator LM317A, which can input a maximum voltage of 40V, output a current of 1.25V to 37V, and 1.5A;

[0030] Alternatively, the verification board performs dispensing on large-area surface-mount non-BGA packaged chips (using STM32 chips) to enhance the anti-vibration ability;

[0031] Alternatively, all components of the verification board except the connectors are surface-mounted components to avoid the vibration of the pins of the inserted components;

[0032] Further, the connectors on the verification board are fixed with screws to prevent damage;

[0033] Alternatively, the verification board tooling has reinforcing ribs to improve the strength and is fixed with screws using methods such as screw glue and spring washers;

[0034] Alternatively, the verification board selects components with high temperature resistance, and the maximum operating temperature reaches -55°C to 85°C;

[0035] Alternatively, the verification board uses natural heat dissipation and installs heat sinks on chips with high power consumption;

[0036] Alternatively, all structures of the verification board are coated with a two-component anti-corrosion, anti-mold, and anti-oxidation paint. The anti-corrosion, anti-mold, and anti-oxidation paint is selected as S01-20 acrylic aliphatic polyurethane bright varnish and is applied by manual spraying;

[0037] Alternatively, the test system tries to increase the distance between each insulator and the wire for anti-corrosion, anti-mold, and anti-oxidation treatment, and uses raw materials that are non-toxic and flame-retardant;

[0038] Alternatively, the test system performs multi-point grounding to increase electrostatic protection.

[0039] The method for the automated test voltage reference chip system as described above includes the following steps:

[0040] Step 1, Hardware connection: Start the host computer, configure the data acquisition system, and perform self-check;

[0041] Step 2, The host computer controls the power supply, and the verification board powers on and starts up;

[0042] Step 3, The verification board performs voltage self-check and reports it;

[0043] Step 4, The host computer sets the test voltage, load, output voltage and sends them down;

[0044] Step 5, The verification board configures the voltage, load, and output voltage of the voltage reference chip to be tested;

[0045] Step 6, The host computer controls the acquisition of voltage output;

[0046] Step 7, The data acquisition system acquires data and transmits it to the host computer;

[0047] Step 8, The host computer reads the data and stores it;

[0048] Step 9, Determine whether the system detection has completed all indicators. If not, the host computer modifies the test conditions and returns to Step 4;

[0049] Step 10, Automatically analyze the test data, output the test report, and the test is completed.

[0050] The advantages and positive effects obtained by the present invention are as follows:

[0051] 1. The test system of the present invention improves the test accuracy of various parameters of the voltage reference chip (DC voltage, linear regulation rate, load regulation rate, temperature coefficient), has a user interaction page, has functions of automated test and data statistics, improves the test efficiency of the voltage reference chip, and has high reliability and environmental adaptability.

[0052] 2. The test system of the present invention is a test system with a data acquisition system, a host computer, a verification board, a programmable power supply, and coaxial anti-interference cables. This system can collect the reference voltage output by the voltage reference chip under different thermal environments, supply voltages, and loads, analyze and calculate whether the indicators of the voltage reference chip meet the specifications, and achieve the effect of automated test. Description of the Drawings

[0053] Figure 1 It is a structural connection block diagram of the automated test system for the voltage reference chip in the present invention;

[0054] Figure 2 is Figure 1 a structural connection block diagram of the data acquisition system in

[0055] Figure 3 is Figure 1 a schematic block diagram of a verification board in

[0056] Figure 4 is Figure 1 a structural connection layout diagram of the devices on the verification board in

[0057] Figure 5 a schematic flow diagram of a test method in the present invention;

[0058] Figure 6 a structural connection schematic diagram of the test software in the present invention.

[0059] Among them, Figure 2 and Figure 3 in, the arrow direction is the signal transmission direction. Specific embodiments

[0060] The present invention will be further described in detail below through specific embodiments. The following embodiments are only descriptive and not restrictive, and the protection scope of the present invention cannot be limited thereby.

[0061] The raw materials used in the present invention are all conventional commercially available products without special instructions. The methods used in the present invention are all conventional methods in the art without special instructions. The masses of various substances used in the present invention are all conventional use masses. The structures, connection relationships, etc. not described in detail in the present invention can be understood as conventional technical means in the art.

[0062] An automated test system for a voltage reference chip, which can be detachably connected to the voltage reference chip and can detect the voltage reference chip, such as Figure 1 shown, the system includes a data acquisition system, a host computer, a verification board, a programmable power supply, and a coaxial anti-interference cable;

[0063] The control interface input end of the programmable power supply is connected to the host computer through a test network cable. The electrical signal interface output end of the programmable power supply is connected to the verification board through a coaxial anti-interference cable. The electrical signal output end of the verification board is connected to the electrical signal input end of the data acquisition system through a coaxial anti-interference cable. The data interface of the host computer is connected to the data interface of the verification board through a coaxial anti-interference cable. The control interface of the host computer is connected to the control interface of the verification board through a network cable. The data interface of the data acquisition system is connected to the data interface of the host computer through an SMA radio frequency cable and a coaxial anti-interference cable. The control interface of the data acquisition system is connected to the control interface of the host computer through a network cable;

[0064] The data acquisition system can perform verification data acquisition and communicate with the host computer;

[0065] The host computer can perform control operations on the data acquisition system, the programmable power supply, and the verification board;

[0066] The verification board can provide a peripheral circuit for the voltage reference chip to be tested (providing the input voltage and output load of the test chip), and communicate with the host computer;

[0067] The programmable power supply can provide the input power required by the verification board.

[0068] The coaxial anti-interference cable is used to transmit electrical signals.

[0069] The test system of the present invention is a test system equipped with a data acquisition system, a host computer, a verification board, a programmable power supply, and a coaxial anti-interference cable. This system can collect the reference voltages output by the voltage reference chip under different thermal environments, supply voltages, and loads, analyze and calculate whether the various indicators of the voltage reference chip meet the specifications, and achieve the effect of automated testing.

[0070] In this embodiment, as Figure 2 shown, the data acquisition system includes a channel selection module, a signal processing module, an analog-to-digital conversion module, a data cache module, and an external interface module. The channel selection module, the signal processing module, the analog-to-digital conversion module, the data cache module, and the external interface module are connected in sequence. The channel selection module can receive voltage input, and the external interface module outputs external data.

[0071] In this embodiment, the host computer uses an embedded controller with a central processing unit, and its main board has interfaces such as LAN, SATA, GPIB, RS-232, USB, and KVM.

[0072] In this embodiment, the programmable power supply is connected to the host computer using the RS232 communication protocol and can provide the power required by the verification board.

[0073] In this embodiment, the data acquisition system uses standard PXI and includes a multiplexer switch, a digital multimeter, and an Ethernet switch. The multiplexer switch can implement the multiplexing function of selecting one from multiple, enabling the test system to access multiple verification boards simultaneously and perform tests in sequence without repeatedly connecting test cables. The digital multimeter can achieve high-speed and accurate measurement of the electrical signals of the verification board, and the Ethernet switch can ensure data transmission and link control between the various devices of the test system.

[0074] In this embodiment, the data acquisition system and the verification board are connected to the host computer through a coaxial anti-interference cable. The host computer is connected to the power supply through a coaxial anti-interference cable. The power supply is connected to the verification board through a coaxial anti-interference cable. The verification board is connected to the data acquisition system through a coaxial anti-interference cable;

[0075] The data acquisition system can be used to verify data acquisition, communicate with the host computer, accurately acquire and store the input reference voltage according to the instructions of the host computer, and finally be read by the host computer;

[0076] The host computer can be used to install test software (the test software can be well-known software commonly used in the prior art, or test software with the structure as shown in Figure 6 ), automatically control the test process of the data acquisition system, analyze the test results and output a test report;

[0077] The verification board can provide a peripheral circuit for the voltage reference chip to be tested (provide the input voltage and output load of the test chip), communicate with the host computer, and adjust the input and output of the verification circuit according to the instructions of the host computer;

[0078] The programmable power supply can provide the input power required by the verification board, and the voltage can be controlled as needed. The programmable power supply is controlled by the host computer software;

[0079] The coaxial anti-interference cable is used to transmit electrical signals.

[0080] Preferably, the test software can run in the host computer and the verification board, and consists of a foreground user interaction page and a background modular test module; the test software is used to complete various software test functions, mainly including: software self-check, data acquisition control and data reading, verification board self-check and control, statistical calculation of reference voltage test data, display of reference voltage test results and export of test reports;

[0081] In this embodiment, as shown in Figure 3 、 Figure 4 , the verification board includes a control circuit and a test circuit connected in series. The control circuit includes a single-chip microcomputer and an Ethernet PHY interface. The input end of the Ethernet PHY interface is connected to the host computer, and the input end of the single-chip microcomputer is connected to the output end of the Ethernet PHY interface; the test circuit includes a device to be verified, an adjustable power supply, and an adjustable load. The input end of the adjustable power supply is connected to the output end of the programmable power supply. The input end of the device to be verified is connected to the adjustable power supply and the output end of the single-chip microcomputer. The output end of the single-chip microcomputer is also connected to the input end of the adjustable load. The output ends of the chip under test, i.e., the device to be verified, and the adjustable load are connected in parallel to the input end of the data acquisition system.

[0082] Preferably, the single-chip microcomputer chip in the control circuit of the verification board uses STM32 as the MCU.

[0083] Preferably, the adjustable power supply in the test circuit of the verification board is a linear voltage regulator LM317A, which can input a maximum voltage of 40V, output a current of 1.5A with a voltage ranging from 1.25V to 37V.

[0084] Preferably, the verification board performs dispensing on surface-mounted non-BGA packaged chips with a relatively large area (mainly using STM32 chips) to enhance the anti-vibration ability.

[0085] Preferably, all components of the verification board except the connectors are surface-mounted components, avoiding the vibration of the pins of the inserted components.

[0086] Preferably, the connectors on the verification board are fixed with screws to prevent damage.

[0087] Preferably, the verification board tooling has reinforcing ribs to improve the strength, and the screws are fixed by using methods such as screw glue and spring washers.

[0088] Preferably, high-temperature-resistant components are selected for the verification board. For imported devices, devices above industrial grade are selected, and the maximum operating temperature can reach -55°C to 85°C, with good heat dissipation.

[0089] Preferably, in terms of heat dissipation design, natural heat dissipation is adopted for the verification board, and heat sinks are installed on chips with relatively high power consumption to maximize the heat dissipation capacity.

[0090] Preferably, all structures of the verification board are coated with two-component three-proof paint. It is used to protect the circuit board, chips and their structures from environmental erosion. The three-proof paint has good high and low temperature resistance performance. After curing, it forms a transparent protective film with excellent insulation, moisture-proof, anti-electric leakage, anti-vibration, dust-proof, anti-corrosion, anti-aging, corona resistance and other performances. The three-proof paint selected is S01-20 acrylic aliphatic polyurethane bright varnish, and the manual spraying method is adopted.

[0091] Preferably, in the test system, the distances between insulators and wires are maximally separated for three-proof treatment. The edges and corners of the housing are chamfered and passivated to prevent scratching operators. Raw materials made of non-toxic and flame-retardant materials are used.

[0092] Preferably, the test system is grounded at multiple points to increase electrostatic protection.

[0093] More specifically:

[0094] As Figure 2 shown, the input end of the data acquisition system is a digital multimeter. The digital multimeter receives the electrical signal of the DC voltage input from the verification board, opens the specified channel according to the channel selection instruction of the upper computer, and the collected electrical signal is converted into a digital signal through the signal processing unit and the analog-to-digital conversion unit, and then is output to the industrial control computer through the buffer unit and the external interface.

[0095] The principle block diagram of the verification board is as Figure 3 shown, which includes two parts: a control circuit and a test circuit. The main function of the control circuit is to communicate with the host computer, control the power supply voltage, output reference voltage and load parameters of the voltage reference chip under test, and it is mainly composed of a single-chip microcomputer chip and an Ethernet PHY interface. The main function of the test circuit is to build the test environment for the chip under test, and it is mainly composed of an adjustable power supply, a device to be verified, and an adjustable load.

[0096] It should be noted that in the control circuit, the single-chip microcomputer chip uses STM32 as the MCU, and the Ethernet PHY controls the verification board to receive the Ethernet data frame input by the industrial control computer and transfer the instructions to the single-chip microcomputer. In the test circuit, the adjustable power supply is implemented by the linear voltage regulator LM317A, which can input a maximum voltage of 40V, output a current of 1.25V to 37V, and 1.5A. The adjustable load is used to implement the output resistance load, and the adjustable load is composed of a digital potentiometer and two SPST analog switches. The voltage reference output is led out to the data acquisition system through an SMA connector and a coaxial shielded cable to reduce interference and improve the test accuracy.

[0097] The layout diagram of the verification board is as Figure 4 shown. The J30J connector on the left is the control part of the external interface, including the Ethernet port and the power supply. The two SMA connectors on the right, one is for the reference voltage output of the chip under test, and the other is for the power supply voltage monitoring output of the chip under test. The verification board uses a 3U size, with a size of 160mm * 100mm. The relay driver is used to drive the opening and closing of the relay network, and the relay network is used to realize the output voltage regulation. Three solid-state relays are used to set the output voltage by switching the short circuit method.

[0098] The structure of the test software is as Figure 5 shown. The test software is mainly divided into two major functional modules, namely the reference voltage test module and the self-check and calibration module. It is written in C++, using the visual software design method, with a visual software interface and graphical programming.

[0099] The method for automatically testing the voltage reference chip using the system described above is as Figure 5 shown, including the following steps:

[0100] Step 1, hardware connection, start the host computer, configure the data acquisition system, and perform self-check;

[0101] Step 2, the host computer controls the power supply to supply power, and the verification board powers on and starts;

[0102] Step 3, the verification board performs voltage self-check and reports it;

[0103] Step 4, the host computer sets the test voltage, load, output voltage and sends them down;

[0104] Step 5, verify the voltage, load, and output voltage of the voltage reference chip to be measured on the verification board;

[0105] Step 6, the host computer controls the acquisition of voltage output;

[0106] Step 7, the data acquisition system collects data and transmits it to the host computer;

[0107] Step 8, the host computer reads and stores the data;

[0108] Step 9, determine whether the system detection has completed all indicators. If not, the host computer modifies the test conditions and returns to Step 4;

[0109] Step 10, automatically analyze the test data, output the test report, and the test is completed.

[0110] Based on the above system, design test software and load it into the host computer and the verification board to verify the system and method.

[0111] The test software includes a foreground user interaction page and a background modular test module. The test software is used to complete various software test functions, mainly including: software self-check, data acquisition control and data reading, verification board self-check and control, statistical calculation of reference voltage test data, display of reference voltage test results, and export of test reports.

[0112] The test software structure is as Figure 6 shown. The test software includes two major functional modules, namely the reference voltage test module and the self-check calibration module. The test software is written in C++ to enable visual software design methods, visual software interfaces, and graphical programming.

[0113] The relevant detections and result discussions of the present invention are as follows:

[0114] Table 1 Comparison table of the present invention and traditional test methods

[0115]

[0116]

[0117] It can be seen from Table 1 that the present invention has higher efficiency compared with the traditional test method, and meets the environmental adaptability requirements for high temperature resistance, low temperature resistance, damp heat resistance, vibration resistance, shock resistance, salt spray resistance, and mold resistance in GJB150A-2009. It can meet more working scenarios and greatly improve work efficiency.

[0118] Although embodiments of the present invention are disclosed for illustrative purposes, those skilled in the art will appreciate that various substitutions, changes, and modifications are possible without departing from the spirit and scope of the present invention and the appended claims. Therefore, the scope of the present invention is not limited to the content disclosed in the embodiments.

Claims

1. An automated test system for a voltage reference chip, characterized in that: The system can be detachably connected to a voltage reference chip and can detect the voltage reference chip. The system includes a data acquisition system, a host computer, a verification board, a programmable power supply, and a coaxial anti-interference cable; The control interface input end of the programmable power supply is connected to the host computer through a test network cable. The electrical signal interface output end of the programmable power supply is connected to the verification board through a coaxial anti-interference cable. The electrical signal output end of the verification board is connected to the electrical signal input end of the data acquisition system through a coaxial anti-interference cable. The data interface of the host computer is connected to the data interface of the verification board through a coaxial anti-interference cable. The control interface of the host computer is connected to the control interface of the verification board through a network cable. The data interface of the data acquisition system is connected to the data interface of the host computer through an SMA radio frequency cable and a coaxial anti-interference cable. The control interface of the data acquisition system is connected to the control interface of the host computer through a network cable; The data acquisition system can perform verification data acquisition and communicate with the host computer; The host computer can perform control operations on the data acquisition system, the programmable power supply, and the verification board; The verification board can provide a peripheral circuit for the voltage reference chip to be tested, provide the input voltage and output load of the test chip, and communicate with the host computer; The programmable power supply can provide the input power required by the verification board; The coaxial anti-interference cable is used to transmit electrical signals.

2. The automated test system for a voltage reference chip according to claim 1, wherein: The data acquisition system includes a channel selection module, a signal processing module, an analog-to-digital conversion module, a data buffer module, and an external interface module. The channel selection module, the signal processing module, the analog-to-digital conversion module, the data buffer module, and the external interface module are connected in sequence. The channel selection module can receive voltage input, and the external interface module outputs external data; Alternatively, the host computer uses an embedded controller with a central processing unit, and its main board has LAN, SATA, GPIB, RS-232, USB, and KVM interfaces; Alternatively, the programmable power supply is connected to the host computer using the RS232 communication protocol and can provide the power required by the verification board; Alternatively, the data acquisition system uses a standard PXI, including a multiplexer switch, a digital multimeter, and an Ethernet switch. The multiplexer switch can implement the multiplexing function of selecting one from multiple options. The test system can simultaneously access multiple verification boards and perform tests in sequence without repeatedly connecting test cables. The digital multimeter can achieve high-speed and accurate measurement of the electrical signals of the verification board. The Ethernet switch can ensure data transmission and link control between the devices of the test system.

3. The automated test system for a voltage reference chip according to claim 1, characterized in that: The data acquisition system and the verification board are connected to the host computer through a coaxial anti-interference cable. The host computer is connected to the power supply through a coaxial anti-interference cable. The power supply is connected to the verification board through a coaxial anti-interference cable. The verification board is connected to the data acquisition system through a coaxial anti-interference cable; The data acquisition system can be used for verification data acquisition, communicate with the host computer, accurately collect the input reference voltage according to the instructions of the host computer and store it, and finally be read by the host computer; The verification board can provide a peripheral circuit for the voltage reference chip to be tested, provide the input voltage and output load of the test chip, communicate with the host computer, and adjust the input and output of the verification circuit according to the instructions of the host computer; The programmable power supply can provide the input power required by the verification board, and the voltage can be controlled as needed; the programmable power supply is controlled by the host computer software; The coaxial anti-interference cable is used to transmit electrical signals.

4. The automated test system for a voltage reference chip according to claim 1, wherein: The verification board includes a control circuit and a test circuit connected together. The control circuit includes a single-chip microcomputer and an Ethernet PHY interface. The input end of the Ethernet PHY interface is connected to the host computer, and the input end of the single-chip microcomputer is connected to the output end of the Ethernet PHY interface; the test circuit includes a device to be verified, an adjustable power supply, and an adjustable load. The input end of the adjustable power supply is connected to the output end of the programmable power supply. The input end of the device to be verified is connected to the adjustable power supply and the output end of the single-chip microcomputer. The output end of the single-chip microcomputer is also connected to the input end of the adjustable load. The output ends of the chip under test, that is, the device to be verified, and the adjustable load are connected in parallel to the input end of the data acquisition system.

5. The automated test system for a voltage reference chip according to any one of claims 1 to 4, characterized in that: In the control circuit of the verification board, the single-chip microcomputer chip uses STM32 as the MCU; Alternatively, in the test circuit of the verification board, the adjustable power supply is a linear voltage regulator LM317A, which can input a maximum voltage of 40V, output a current of 1.25V to 37V, and 1.5A; Alternatively, the verification board performs dispensing on a large-area surface-mounted non-BGA package chip (using an STM32 chip) to enhance the anti-vibration ability; Alternatively, all modules of the verification board use surface-mounted components except for connectors to avoid the vibration of the pins of the inserted components; Alternatively, the connectors on the verification board are fixed with screws to prevent damage; Alternatively, the verification board tooling has reinforcing ribs to improve the strength and is fixed with screws using methods such as screw glue and spring washers; Alternatively, the verification board selects components with high temperature resistance, and the maximum operating temperature reaches -55°C to 85°C; Alternatively, the verification board uses natural heat dissipation and installs heat sinks for chips with high power consumption; Alternatively, all structures of the verification board are coated with a two-component anti-corrosion, anti-mold, and anti-dust paint. The anti-corrosion, anti-mold, and anti-dust paint is selected as S01-20 acrylic aliphatic polyurethane bright varnish, and the manual spraying method is used; Alternatively, the test system tries to increase the distance between all insulators and wires, performs anti-corrosion, anti-mold, and anti-dust treatment, and uses raw materials that are non-toxic and flame-retardant; Alternatively, the test system performs multi-point grounding to increase electrostatic protection.

6. The method for an automated test voltage reference chip system according to any one of claims 1 to 5, characterized in that: It includes the following steps: Step 1, hardware connection, start the host computer, configure the data acquisition system, and perform self-check; Step 2, the host computer controls the power supply to supply power, and the verification board powers on and starts; Step 3, the verification board performs voltage self-check and reports it; Step 4, the host computer sets the test voltage, load, output voltage and sends them down; Step 5, the verification board configures the voltage, load, and output voltage of the voltage reference chip to be tested; Step 6, the host computer controls the acquisition of voltage output; Step 7, the data acquisition system collects data and transmits it to the host computer; Step 8, the host computer reads the data and stores it; Step 9: Determine whether the system detection has completed all indicators. If not, modify the test conditions on the host computer and return to Step 4. Step 10: Automatically analyze the test data, output a test report, and the test is completed.

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