Chip testing method and system

Abstract

The invention discloses a chip testing method and system, the chip testing method is applied to the chip testing system, the chip testing system comprises a testing box and a communication board, the communication board is provided with a first connecting piece, and the testing box is provided with a second connecting piece and is in a power-on state; the chip test method comprises the following steps: after a first connecting piece of a communication board is connected with a second connecting piece of a test box, receiving first connection confirmation information; after the first connection confirmation information is received, issuing an initialization command to the communication board according to a preset address table; and when confirmation response information fed back by the communication board aiming at the initialization command is received, controlling the test box to execute initialization work. According to the invention, the stability and reliability of chip testing work can be improved, so that the chip testing effect is improved.

Description

Technical Field

[0001] This application relates to the technical field of chip testing, and particularly to a chip testing method and system. Background Art

[0002] In an automated testing device, a drawer cabinet type three-dimensional testing rack, as a testing system with a high-density combination where the temperature testing environment and the aging board can be separated, can greatly meet the requirements for integration density, and at the same time can monitor the working conditions of the chip at different temperatures.

[0003] Currently, when the automated testing device is testing, the test box is in a continuous power supply state, and the aging board conducts temperature testing inside the test box. When the testing is completed, the next aging board is tested. In this case where the aging board is frequently connected to and disconnected from the test box, the connection between the test box and the aging board and / or the communication board on the aging board may become unstable. Moreover, since the test box is in a continuous power supply state, the connector of the test box includes several address pins (PINs), several communication pins, and several power pins. The communication board of the aging board is provided with corresponding gold fingers. When the power pins are abnormally connected, unstable power supply or power-off occurs, resulting in abnormal testing; when the address pins are abnormally connected, an error occurs in reading the address of the communication board, and the address of the communication board cannot be obtained. When the communication pins are abnormally connected, the communication board cannot establish communication with the host computer. The above-mentioned unstable connection situations are likely to affect the chip testing effect. Summary of the Invention

[0004] In view of this, this application provides a chip testing method and system to improve the chip testing effect.

[0005] This application provides a chip testing method, which is applied to a chip testing system. The chip testing system includes a test box and a communication board. The communication board is provided with a first connector, and the test box is provided with a second connector and is in a powered-on state;

[0006] Wherein, the chip testing method includes:

[0007] After the first connector of the communication board is connected to the second connector of the test box, a first connection confirmation message is received;

[0008] After receiving the first connection confirmation message, according to a preset address table, an initialization command is sent to the communication board;

[0009] When the confirmation response message sent by the communication board in response to the initialization command is received, the test box is controlled to perform initialization work.

[0010] Optionally, when the first connector of the communication board is connected to the second connector of the test box, the communication board identifies the identifier of the connected test box, and determines the first network address of the communication board according to the identifier of the test box.

[0011] Optionally, the preset address table is used to record the identifiers of multiple test boxes and the second network addresses of the communication boards corresponding to the identifiers of each test box respectively.

[0012] Optionally, the step of sending an initialization command to the communication board according to the preset address table includes: according to the identifier of the test box connected to the communication board, looking up the corresponding second network address of the communication board in the preset address table; and sending an initialization command to the communication board according to the second network address.

[0013] Optionally, the test box further includes a sensor; the sensor is configured to send a first connection confirmation message after the first connector of the communication board is connected to the second connector of the test box.

[0014] Optionally, the sensor is further configured to start timing when the first connector of the communication board is connected to the second connector of the test box, and send a first connection confirmation message after the timing time reaches a preset first delay time.

[0015] Optionally, the step of sending an initialization command to the communication board according to the preset address table after receiving the first connection confirmation message includes: starting to time when receiving the confirmation response message, and sending an initialization command to the communication board according to the preset address table when the timing time reaches a preset second delay time.

[0016] Optionally, before sending an initialization command to the communication board according to the preset address table, it includes: detecting the connection between the first connector and the second connector based on the detection resistor of the test box, detecting the level signal corresponding to the second connector according to a reference level, and receiving a second connection confirmation message when the level signal conforms to the reference level; and after receiving the first connection confirmation message, it includes: after receiving the first connection confirmation message and the second connection confirmation message.

[0017] Optionally, the detection resistor is a pull-up resistor, and the reference level is a high level.

[0018] This application further provides a chip testing system, which is configured to execute any one of the above chip testing methods.

[0019] In the above chip testing method and system of the present application, after the host computer receives the first connection confirmation information and determines that the first connector of the communication board is connected to the second connector of the test box, it sends an initialization command to the communication board according to the preset address table, receives the confirmation response information feedback by the communication board for the initialization command, determines that the connection between the communication board and the test box is stable, and then controls the test box to perform initialization work, which can ensure the effectiveness and reliability of the initialization work performed by the test box. As a result, the test box can perform the power supply operation stably and effectively, the communication board is started, and the aging board provides a test environment for the chips under test on the test board, so that the test board can test the corresponding chips under test, which can improve the stability and reliability of the testing work, and thus improve the chip testing effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those skilled in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0021] Figure 1 It is a schematic flowchart of a chip testing method according to an embodiment of the present application;

[0022] Figure 2 It is a schematic diagram of a preset address table according to an embodiment of the present application;

[0023] Figure 3 It is a communication schematic diagram of a chip testing system according to an embodiment of the present application;

[0024] Figure 4 It is a partial flowchart of a chip testing method according to an embodiment of the present application;

[0025] Figure 5 It is a partial working timing diagram of a chip testing system according to an embodiment of the present application;

[0026] Figure 6 It is a partial working timing diagram of a chip testing system according to an embodiment of the present application;

[0027] Figure 7 It is a partial pin connection schematic diagram of a communication board according to an embodiment of the present application;

[0028] Figure 8 It is a partial pin connection schematic diagram of a communication board according to an embodiment of the present application;

[0029] Figure 9 It is a partial working timing diagram of a chip testing system according to an embodiment of the present application;

[0030] Figure 10Schematic diagram of part of the process of a chip testing method according to an embodiment of the present application;

[0031] Figure 11 Timing diagram of part of the operation of a chip testing system according to an embodiment of the present application. Detailed implementation manners

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative efforts belong to the scope of protection of the present application. Without conflict, the following various embodiments and their technical features can be combined with each other.

[0033] The first aspect of the present application provides a chip testing method, which can be applied to a chip testing system. The chip testing system includes a test box and a communication board, and the communication board can be placed on an aging board. The communication board is provided with a first connector, and the first connector can include connection structures such as a gold finger. The test box is provided with a second connector and is in a powered-on state; wherein the second connector can include connection structures such as a pogo pin (connector). During the process of the chip testing system performing testing work, the aging board can be placed inside the test box, and a test board is also carried on the aging board. The aging board can provide a testing environment such as an aging environment for the test board. The test board is used to carry the integrated circuit chip to be tested and provide a testing platform for the integrated circuit chip.

[0034] Among them, the test box can be controlled by a host computer to perform initialization and related testing work, and the chip testing method can be executed by the host computer. Specifically, referring to Figure 1 as shown, the chip testing method includes steps S110 to S130.

[0035] S110, after the first connector of the communication board is connected to the second connector of the test box, a first connection confirmation message is received.

[0036] Specifically, a sorting drive system and a sensor (which can also be called a transducer) for detecting the connection state between the first connector of the communication board and the second connector of the test box are provided inside the test box. The sorting drive system can establish physical contact between the communication board and the test box, so that the first connector of the communication board is connected to the second connector of the test box. At this time, the sensor can send a first connection confirmation message to the host computer after the connection between the first connector of the communication board and the second connector of the test box is successful.

[0037] S120, after receiving the first connection confirmation message, an initialization command is sent to the communication board according to a preset address table.

[0038] S130. When receiving the confirmation response information feedback by the communication board for the initialization command, control the test box to perform initialization work.

[0039] In the above step S130, if the communication board receives the initialization command, it will reply to the host computer with the confirmation response information (which can be recorded as ACK), so that the host computer can determine that the power supply, address, and communication pins of the current communication board are all connected normally. At this time, the test box can perform initialization work.

[0040] Further, after receiving the first connection confirmation information, and after sending the initialization command to the communication board according to the preset address table, the chip testing method further includes: if the confirmation response information feedback by the communication board is not received, it indicates that a connection anomaly occurs (such as an abnormal connection between the communication board and the test box, etc.), and the first alarm information can be output to enable the relevant user to know the current anomaly and avoid invalid testing.

[0041] In some examples, when the first connector of the communication board is connected to the second connector of the test box, the communication board can identify the identifier of the connected test box, and determine its own first network address according to the identifier of the test box, so as to receive the initialization command sent by the host computer according to the second network address after determining the second network address. The identifier of the test box can also be called the test box ID, which is used to represent the identification information of the test box.

[0042] Optionally, both the first network address and the second network address can include the communication board network address, which can also be called the communication board IP. Optionally, the rule for the communication board to determine its own first network address according to the identifier of the test box is the same as the rule recorded in the preset address table for determining the corresponding second network address by the identifier of the test box, so that the communication board and the host computer can obtain the same network address of the communication board according to the identifier of the same test box, and thus the information such as the initialization command sent by the host computer according to the second network address can be successfully received by the communication board.

[0043] In some examples, the preset address table is used to record the identifiers of multiple test boxes and the second network addresses of the communication boards corresponding to the identifiers of each test box respectively. For example, as shown in Figure 2 so that it can be fast and accurate according to the preset address table.

[0044] Optionally, the first connection confirmation information sent by the test box to the host computer includes the identifier of this test box; alternatively, the test box can send the identifier of this test box to the host computer. Correspondingly, the step of sending an initialization command to the communication board according to the preset address table includes: looking up the second network address of the corresponding communication board from the preset address table according to the identifier of the test box connected to the communication board; sending an initialization command to the corresponding communication board according to the second network address, so that the communication board connected to the test box can successfully receive the corresponding initialization command and timely feedback a confirmation response message. For example, as shown in Figure 3 shown, in this way, the host computer can confirm that a stable physical connection has been established between the test box and the communication board according to the confirmation response message, and it meets the test initialization conditions, and controls the test box to perform initialization work, and can reliably carry out the test initialization work and related test work.

[0045] Specifically, each test box is set with a corresponding address and identifier (such as test box ID), and the host computer can pre-store, as shown in Figure 2 shown, a preset address table including the communication board IP (i.e., the second network address) corresponding to the identifier of each test box. When the sorting drive system establishes a physical contact connection between the communication board and the test box, the communication board is powered on; as shown in Figure 4 shown, the communication board can also read the identifier of the connected test box from the connection end of its first connector and the second connector of the test box, and set its own communication board IP (i.e., the first network address) according to the obtained identifier of the test box. The test box can also inform the host computer of its own identifier in the form of the first connection confirmation information, etc. The host computer obtains the identifier of the test box and can look up the corresponding second network address of the identifier of the test box from the preset address table. For example, as shown in Figure 2As shown in the figure, the host computer is connected to two test boxes. The identifiers of the two test boxes are 1 and 2 respectively. The test box with identifier 1 (hereinafter referred to as test box 1) corresponds to the address 192.168.50.101, and the test box with identifier 2 (hereinafter referred to as test box 2) corresponds to the address 192.168.50.102. The first connector of the communication board is connected to the second connector of the test box. The communication board knows the identifier of the test box, and the address set by the communication board is set according to the identifier of the test box. The communication board in test box 1 sets the first network address as 192.168.50.1 according to the identifier of the test box being 1, and the communication board in test box 2 sets the first network address as 192.168.50.11 according to the identifier of the test box being 2. And when the host computer receives that the identifier of the corresponding test box is 1, it can look up the second network address corresponding to the identifier of this test box as 192.168.50.1 from the preset address table. When the host computer receives that the identifier of the corresponding test box is 2, it can look up the second network address corresponding to the identifier of this test box as 192.168.50.11 from the preset address table. In this way, the host computer can determine the corresponding second network address, and send an initialization command to the communication board connected to the test box according to this second network address. Since this second network address is the same as the first network address determined by the communication board itself, the communication board can successfully receive the above initialization command and feedback the corresponding confirmation response information. If the communication board and the test box do not establish a stable connection, at this time, the communication board may recognize an incorrect test box identifier or fail to recognize. For example, it recognizes identifier 1 as identifier 2. At this time, the communication board sets the first network address as 192.168.50.11 according to the identifier of the test box being 2, while the test box identifier received by the host computer is 1, and looks up the second network address corresponding to the identifier of this test box 1 as 192.168.50.1 from the preset address table. At this time, the second network address determined by the host computer is not the same as the first network address determined by the communication board itself. When the host computer sends an initialization command to the communication board according to this second network address, the communication board cannot receive the above initialization command and it is also difficult to feedback the confirmation response information. It can be seen that if the host computer receives the confirmation response information feedback by the communication board for the initialization command, it can determine that the connection between the communication board and the test box is stable.

[0046] In the above chip testing method, after the host computer receives the first connection confirmation information and determines that the first connector of the communication board is connected to the second connector of the test box, it issues an initialization command to the communication board according to the preset address table, receives the confirmation response information feedback by the communication board for the initialization command, determines that the connection between the communication board and the test box is stable, and then controls the test box to perform the initialization work, which can ensure the effectiveness and reliability of the initialization work performed by the test box, so that the test box can perform the power supply operation stably and effectively, the communication board starts, and the aging board provides a test environment for the chips under test on the test board, so that the test board can test the corresponding chips under test, which can improve the stability and reliability of the testing work, and thus improve the chip testing effect.

[0047] The inventor further studied the above test solution and found that the sensor of the test box detected the physical contact between the test box and the communication board. In fact, when the first connector such as the gold finger of the communication board is in vertical contact, due to the different horizontal control lifting forces, a part of the gold fingers of the communication board enter the power-on state first, while the gold fingers of the other part have not reached a stable state and are not well connected to the second connector such as the pogo pin of the test box, which will affect the normal reading of relevant communication and addresses. When the communication board is connected to the test box, the gold fingers of the communication board are not all connected to the address pogo pins of the test box, and the identifier of the test box obtained by the communication board is incorrect. Due to the incorrect identifier of the test box, the host computer obtains a mismatched second network address from its preset address table, and the host computer sends an initialization command according to the second network address. Due to the address mismatch, the communication board is difficult to receive the corresponding initialization command smoothly, so it is easy to fail to feedback the confirmation response information and issue an alarm signal (such as the first alarm information).

[0048] In view of the above problems, in some embodiments, refer to Figure 5As shown, the sensor can start timing when the first connector of the communication board is connected to the second connector of the test box. After the timing reaches the preset first delay time, it sends the first connection confirmation information, so that after the communication board is stably connected to the test box, it sends the first connection confirmation information to the host computer, enabling the communication board to determine its own state in a stable environment, thereby determining the accurate first network address. The host computer can also obtain the matching second network address from the corresponding preset address table according to the identifier of the corresponding test box. Based on this second network address, it can accurately send the initialization command to the corresponding communication board, and the communication board can also successfully receive this initialization command and successfully feedback the corresponding confirmation response information. In this embodiment, a delayed initialization function is added to the test box. After the sensor of the test box detects the physical contact with the communication board, a preset delay of T1 seconds is set, that is, after the first connector of the communication board is connected to the second connector of the test box and reaches the preset first delay time of T1 seconds, the first connection confirmation information is sent to the host computer, and then the host computer sends the initialization instruction. This can avoid problems such as incorrect first network addresses obtained by the communication board and difficulties for the host computer to successfully send the initialization command. In addition, in this embodiment, the power supply state and the connection of the communication board can be adjusted to connect first and then power on, which can avoid impacts and other damages to the circuit caused by hot plugging. Optionally, the first delay time T1 can be set according to the time required for the test box and the communication board to establish a stable connection relationship, for example, it can be set to 3 seconds, 5 seconds or other values.

[0049] In some other embodiments, referring to Figure 6 As shown, the sensor can send the first connection confirmation information to the host computer when it detects that the first connector of the communication board is connected to the second connector of the test box. The host computer can start timing when it receives the first connection confirmation information. When the timing reaches the preset second delay time, it sends the initialization command to the communication board according to the preset address table, enabling the communication board to determine its own state in a stable environment, thereby determining the accurate first network address. The host computer can also obtain the matching second network address from the corresponding preset address table according to the identifier of the corresponding test box. Based on this second network address, it can accurately send the initialization command to the corresponding communication board, and the communication board can also successfully receive this initialization command and successfully feedback the corresponding confirmation response information. In this embodiment, a delayed initialization function is added to the host computer. When the host computer receives the first connection confirmation information, a preset delay of T2 seconds is set. After reaching the second delay time T2 seconds from receiving the first connection confirmation information, the host computer sends the initialization instruction. This can avoid problems such as incorrect identifiers of the test box obtained by the communication board and difficulties for the host computer to accurately determine the second network address. Optionally, the second delay time T2 can be set according to the time required for the test box and the communication board to establish a stable connection relationship, for example, it can be set to 3 seconds, 5 seconds or other values.

[0050] In addition, the inventors also considered that when there are situations such as incorrect address reading between the communication board and the test box, it may disrupt the testing work of the entire chip testing system. Based on the above considerations, in some embodiments, the test box is configured to, after detecting the connection between the first connector and the second connector, identify the detection resistor corresponding to the IP pin of the communication board, determine the reference level, detect the level signal corresponding to the second connector, and when the level signal conforms to the reference level, send a second connection confirmation message to the host computer to indicate that the current test box is normally connected to the communication board; wherein the second connection confirmation message includes information indicating that the test box is normally connected to the communication board. Correspondingly, before sending the initialization command to the communication board according to the preset address table, the chip testing method may further include: detecting the connection between the first connector and the second connector based on the detection resistor of the test box, detecting the level signal corresponding to the second connector according to the reference level, and when the level signal conforms to the reference level, receiving the second connection confirmation message sent by the test box to the host computer.

[0051] Further, after receiving the first connection confirmation message, it includes: after receiving the first connection confirmation message and the second connection confirmation message. Specifically, after receiving the first connection confirmation message sent by the inductor in the test box after the first connector of the communication board is connected to the second connector of the test box, and receiving the second connection confirmation message sent by the test box when the detected level signal conforms to the reference level, then sending the initialization command to the communication board according to the preset address table can ensure the effectiveness of the action of sending the initialization command. Not sending relevant information to the communication board when the second connection confirmation message is not received can avoid ineffective communication, improve the testing efficiency, and when the detection resistor detects successfully, execute the initialization instruction, and through secondary confirmation, improve the testing accuracy. Optionally, the detection resistor is a pull-up resistor and / or a pull-down resistor, the reference level corresponding to the pull-up resistor is a high level, and the reference level corresponding to the pull-down resistor is a low level. Optionally, reference Figure 7 and Figure 8 Partial pin connection schematic diagram of the communication board shown Figure 7 and Figure 8 In, PIN represents the first connector of the communication board or the corresponding connection pin, wherein the pull-up resistor can be as shown by R1 in Figure 7 and is a resistor connected to the preset power supply VCC, and the pull-down resistor can be as shown by R2 in Figure 8 and is a resistor connected to the ground terminal.

[0052] Specifically, here the above-mentioned secondary confirmation process is further described through Figure 9 the communication timing diagram, refer to Figure 9As shown, after the sensor in the test box connects the first connector of the communication board to the second connector of the test box, it sends a first connection confirmation message to the host computer to enable the host computer to perform the first connection confirmation. The test box detects the level signal corresponding to the second connector. When the level signal conforms to the reference level, it sends a second connection confirmation message to the host computer to enable the host computer to perform the second connection confirmation according to the sent second connection confirmation message. After receiving the first connection confirmation message and the second connection confirmation message and performing the secondary confirmation, the host computer issues an initialization command to the communication board according to the preset address table. The communication board feeds back a confirmation response message to the host computer for the initialization command to enable the host computer to control the test box to perform the initialization work.

[0053] Specifically, when the test box is in the powered-on state, after the communication board connects to the test box, the test box can read the status of all address pins of the test box, which are the second connectors. If there is an external pull-up resistor on the PIN (the first connector) circuit of the communication board, the pin can default to a high level, and the address IO setting of the corresponding connection pin of the test box can be set to default pull-down input (read as low level). Therefore, referring to Figure 10 As shown, when the test box detects that all address pins are touched and the readings are all high levels, it indicates that the detected level signal conforms to the corresponding reference level, the physical connection between the communication board and the test box is normal, and the test box can continue to supply power to the communication board and / or the aging board based on this connection state. If the test box detects all address pins and there are some pins with low-level corresponding levels, it indicates that the detected level signal does not conform to the corresponding reference level, and there is an abnormality in the connection between the communication board and the test box. At this time, the test box disconnects the power supply and feeds it back to the host computer, and the host computer executes the subsequent logic to issue an abnormality alarm. For example, each address PIN (such as PIN1 - PIN4) of the communication board is connected to the power supply through a pull-up resistor and defaults to output a high level. The address PIN of the test box is set to the pull-down input mode and defaults to read a low level. After the sensor detects physical contact, the test box reads the input status of all address PINs. The test box and the communication board are aligned and conducted through the address PINs to form a current path. The high level (pull-up resistor) of the communication board covers the low level (pull-down resistor) of the test box. The test box detects that all address PINs are high levels and determines that the connection is normal. If for PIN1, PIN3, PIN4, the high level of the communication board is transmitted to the test box and the test box detects that PIN2 is low level, it means that PIN2 is not touched or has poor contact. The test box immediately disconnects the power supply and feeds back a second alarm message to the host computer to enable the host computer to know the above abnormal situation and stop controlling the initialization work of the test box.

[0054] This embodiment adds a signal detection mechanism at the test box end, which can further determine the connection stability between the test box and the communication board, timely detect abnormal situations, and ensure the stability of subsequent test work.

[0055] It should be noted that by first detecting the level and then performing the initialization test, the accuracy of the address connection is ensured. The level detection can quickly detect the address PIN. Therefore, the level detection is performed first to ensure the normal physical connection of the address PIN. The initialization test reconfirms the normal connection of the address PIN, and at the same time, it can also detect the protocol compatibility and whether there are abnormalities in the firmware or hardware, ensuring communication between the host computer and the communication board.

[0056] In some other embodiments, when the initialization fails or the level detection fails, the host computer uses the previous address for testing to improve the test efficiency. In the above chip testing method, after the host computer receives the first connection confirmation information and determines that the first connector of the communication board is connected to the second connector of the test box, it issues an initialization command to the communication board according to the preset address table, receives the confirmation response information feedback by the communication board for the initialization command, determines that the connection between the communication board and the test box is stable, and then controls the test box to perform the initialization work, which can ensure the effectiveness and reliability of the initialization work performed by the test box. Thus, the test box can stably and effectively perform the power supply operation, the communication board starts, and the aging board provides a test environment for the chips to be tested on the test board, so that the test board can test the corresponding chips to be tested, which can improve the stability and reliability of the test work, and thus improve the chip test effect. The above chip testing method also adds a delayed initialization function, which can avoid the problem that the host computer is difficult to successfully issue the initialization command due to the incorrect corresponding network address determined by the communication board and / or the host computer; the above chip testing method also adds a signal detection mechanism at the test box end, which can further determine the connection stability between the test box and the communication board, timely detect abnormal situations, and ensure the stability of the entire test work.

[0057] The second aspect of the present application provides a chip testing system, which is used to execute the chip testing method described in any of the above embodiments to test the chips to be tested.

[0058] Specifically, the chip testing system may include components such as a test box, an aging board, a communication board, a test board, and a host computer; the test box is used to carry the aging board, the aging board is used to carry the communication board and the test board, the test board is used to carry the chips to be tested, and the first connector of the communication board and the second connector of the test box.

[0059] The working process of the chip testing system can refer to Figure 11 As shown, it includes: the inductor in the test box detects the connection between the first connector of the communication board and the second connector of the test box, and sends the first connection confirmation information to the host computer. The host computer receives the first connection confirmation information and issues an initialization command to the communication board according to the preset address table. The communication board feeds back the confirmation response information to the host computer for the initialization command, so that the host computer determines that the connection between the communication board and the test box is stable.

[0060] Optionally, the sensor in the test box can also start timing when the first connector of the communication board is connected to the second connector of the test box, and send a first connection confirmation message after the timing reaches a preset first delay time; or the host computer can start timing when receiving the first connection confirmation message, and issue an initialization command to the communication board according to a preset address table when the timing reaches a preset second delay time; thereby implementing the delayed initialization function.

[0061] The sensor in the test box sends a first connection confirmation message to the host computer after the first connector of the communication board is connected to the second connector of the test box, so that the host computer can perform the first connection confirmation. Optionally, the test box can also identify the detection resistor corresponding to the IP pin of the communication board to determine the reference level, and refer to Figure 11 As shown, detect the level signal corresponding to the second connector. When the level signal conforms to the reference level, send a second connection confirmation message to the host computer, so that the host computer can perform the second connection confirmation according to the sent second connection confirmation message. After receiving the first connection confirmation message and the second connection confirmation message and performing the secondary confirmation, the host computer issues an initialization command to the communication board according to a preset address table, and the communication board feeds back a confirmation response message to the host computer for the initialization command, so that the host computer controls the test box to perform the initialization work.

[0062] The above chip test system is used to execute the chip test method described in any one of the above embodiments, and has all the beneficial effects of the chip test method described in any one of the foregoing embodiments, which will not be elaborated herein.

[0063] Although the present application has been shown and described with respect to one or more implementations, those skilled in the art will envision equivalent variations and modifications based on reading and understanding this specification and the drawings. The present application includes all such modifications and variations and is limited only by the scope of the appended claims. In particular, with respect to the various functions performed by the above components, the terms used to describe such components are intended to correspond to any component (unless otherwise indicated) that performs the specified function of the component (i.e., it is functionally equivalent), even if it is not structurally equivalent to the disclosed structure that performs the function in the exemplary implementations of the present specification shown herein.

[0064] That is, the above description is only an embodiment of the present application, and does not limit the patent scope of the present application. Any equivalent structural or equivalent process transformation made by using the content of the specification and drawings of the present application, such as the mutual combination of technical features between various embodiments, or direct or indirect application in other related technical fields, are equally included in the patent protection scope of the present application.

[0065] In addition, in the description of the present application, it should be understood that the orientation or positional relationship indicated by terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application. In addition, for structural elements with the same or similar characteristics, the present application may use the same or different reference numerals for identification. In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly indicating the quantity of the technical features indicated. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more features. In the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise specifically defined.

[0066] In the present application, the term "exemplary" is used to mean "serving as an example, illustration, or explanation". Any embodiment described as "exemplary" in the present application is not necessarily to be construed as more preferred or more advantageous than other embodiments. The above description is given in order for any person skilled in the art to implement and use the present application. In the above description, various details are set forth for purposes of explanation. It should be understood that those of ordinary skill in the art can recognize that the present application can be implemented without the use of these specific details. In other embodiments, well-known structures and processes are not elaborated in detail so as not to obscure the description of the present application with unnecessary details. Therefore, the present application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope that conforms to the principles and features disclosed in the present application.

Claims

1. A chip testing method, characterized in that, The chip testing method is applied to a chip testing system, which includes a test box and a communication board. The communication board is provided with a first connector, and the test box is provided with a second connector and is in a powered-on state; Among them, the chip testing method includes: After the first connector of the communication board is connected to the second connector of the test box, a first connection confirmation message is received; After receiving the first connection confirmation message, an initialization command is sent to the communication board according to a preset address table; When receiving the confirmation response message sent by the communication board in response to the initialization command, control the test box to perform initialization work.

2. The chip testing method according to claim 1, wherein When the first connector of the communication board is connected to the second connector of the test box, the communication board identifies the identifier of the connected test box and determines the first network address of the communication board according to the identifier of the test box.

3. The chip testing method according to claim 1, characterized in that The preset address table is used to record the identifiers of multiple test boxes and the second network addresses of the communication boards corresponding to the identifiers of each test box respectively.

4. The chip testing method according to claim 3, wherein The step of sending the initialization command to the communication board according to the preset address table includes: According to the identifier of the test box connected to the communication board, look up the corresponding second network address of the communication board in the preset address table; Send the initialization command to the communication board according to the second network address.

5. The chip testing method according to claim 1, wherein The test box further includes a sensor; The sensor is used to send a first connection confirmation message after the first connector of the communication board is connected to the second connector of the test box.

6. The chip testing method according to claim 5, wherein The sensor is also used to start timing when the first connector of the communication board is connected to the second connector of the test box, and send a first connection confirmation message after the timing time reaches a preset first delay time.

7. The chip testing method according to claim 5, wherein The step of, after receiving the first connection confirmation message, sending the initialization command to the communication board according to the preset address table includes: Start timing when receiving the confirmation response message, and send the initialization command to the communication board according to the preset address table when the timing time reaches a preset second delay time.

8. The chip testing method according to claim 1, wherein, Before sending the initialization command to the communication board according to the preset address table, it includes: based on the detection resistor of the test box, detecting the connection between the first connector and the second connector, detecting the level signal corresponding to the second connector according to a reference level, and receiving a second connection confirmation message when the level signal conforms to the reference level; and The step of, after receiving the first connection confirmation message, includes: after receiving the first connection confirmation message and the second connection confirmation message.

9. The chip testing method according to claim 8, wherein The detection resistor is a pull-up resistor, and the reference level is a high level.

10. A chip testing system, characterized in that, The chip testing system is used to execute the chip testing method according to any one of claims 1 to 9.

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