Calibration device and measurement method for multi-station high-precision photoelectric measurement laser tracking system

Abstract

The invention discloses a calibration device and a measurement method for a multi-station high-precision photoelectric measurement laser tracking system. The calibration device comprises a bottom frame, and supports are connected to the tops of the front side edge and the rear side edge of the top of the bottom frame. The rotating ring is pushed to rotate on the surface of the connecting frame, at the moment, the movable clamping frame is separated from the notch, the elastic force of the elastic structure enables the movable clamping frame to be tightly attached to the end face of the rotating ring, and the rotating ring drives the movable clamping frame to rotate on the inner side of the elastic structure; the rotating ring rotates to enable the sliding sleeve to move on the surface of the connecting frame, so that the position of the sliding sleeve on the surface of the connecting frame is changed until the supporting rod is in the vertical state again, and the elastic force of the elastic structure enables the movable clamping frame to be buckled with the notch of the rotating ring again; at the moment, the laser heads of the two corresponding rings can be correspondingly calibrated in real time, so that the test piece can be conveniently measured at different positions of the connecting frame, and the measurement accuracy of the test piece is ensured.

Description

Technical Field

[0001] The present invention belongs to the technical field of optoelectronic measurement, and particularly relates to a calibration device and a measurement method for a multi-station high-precision optoelectronic measurement laser tracking system. Background Art

[0002] Laser measurement is a non-contact measurement, which is widely used because of its advantages such as not affecting the surface of the measured product, high precision, large measurement range, and short detection time. Before using the laser to test the product, it is necessary to calibrate the position of the laser to ensure the accuracy of the laser test results.

[0003] When measuring different measured products, it is necessary to adjust the position of the laser in real time for calibration, which affects the test efficiency of the measured products.

[0004] Therefore, it is necessary to invent a calibration device and a measurement method for a multi-station high-precision optoelectronic measurement laser tracking system to solve the above problems. Summary of the Invention

[0005] In view of the above problems, the present invention provides a calibration device and a measurement method for a multi-station high-precision optoelectronic measurement laser tracking system to solve the problems raised in the above background art.

[0006] To achieve the above object, the present invention provides the following technical solution: A calibration device for a multi-station high-precision optoelectronic measurement laser tracking system, including a chassis. Both the front and rear sides of the top of the chassis are connected with brackets. Both ends of the surfaces of the two brackets are slidably sleeved with clamping structures for limiting test pieces. The two clamping structures are arranged oppositely. The clamping structure includes a connecting frame. Both ends of the connecting frame are fixedly connected with collar rings. The two collar rings are respectively sleeved on the surfaces of the two brackets. The inner sides of the two opposite collar rings are both provided with shelf plates for correspondingly limiting test pieces. The outer sides of the collar rings are provided with nuts spirally sleeved on the surfaces of the brackets. And an optoelectronic structure is sleeved at the center of the clamping structure. The two optoelectronic structures are arranged oppositely. The optoelectronic structure includes a laser head. The laser heads of the two optoelectronic structures are arranged oppositely, and the end faces of the laser heads are flush with the inner side faces of the shelf plates correspondingly.

[0007] Further, the clamping structure further includes an arc-shaped frame. Both ends of the arc-shaped frame are fixedly connected with clamping frames. The inner side faces of the clamping frames correspond to the inner side faces of the collar rings. Grooves are arranged at the centers of both sides of the chassis. The arc-shaped frame and the clamping frames are correspondingly located inside the grooves. Inner grooves are arranged on both sides of the grooves. The outer ends of the clamping frames are correspondingly inserted into the inner grooves on the sides of the chassis. A vertical rod is vertically installed inside the inner grooves. The outer ends of the clamping frames are slidably sleeved on the surfaces of the vertical rods. A first spring is sleeved on the surfaces of the vertical rods, and the outer ends of the clamping frames are fixedly connected with the bottoms of the inner grooves by the first springs.

[0008] Further, the arc-shaped frame is arranged as a semi-circular plate, and the opening of the arc-shaped frame is arranged upward. The arc-shaped frame is made of a rigid material, and the top surfaces of the two arc-shaped frames are correspondingly flush. The top surface of the clamping frame is higher than the top surface of the arc-shaped frame.

[0009] Further, the optoelectronic structure includes a sliding sleeve. The sliding sleeve is slidably sleeved on the surface of the connecting frame. A plurality of side bars arranged in parallel are provided on the circumferential side surface of the connecting frame. A plurality of connecting bars are provided at the center of the sliding sleeve. The plurality of connecting bars and the plurality of side bars are arranged in a staggered correspondence, and the sliding sleeve slides on the surface of the connecting frame by means of the plurality of connecting bars.

[0010] Further, a rotating ring is sleeved on the surface of the sliding sleeve. The rotating ring is rotatably sleeved on the surfaces of the plurality of connecting bars of the sliding sleeve, and the rotating ring is in a spiral fit with the side bars of the connecting frame. A support rod is connected to the bottom of the rotating ring. The bottom end of the support rod is connected to a bottom ring by a second spring. The top surface of the bottom ring is correspondingly clamped to a corresponding ring by a wavy surface. A plurality of laser heads are annularly and equidistantly installed on the circumferential outer side surface of the corresponding ring. A limiting ring spirally sleeved on the top of the support rod is provided at the top of the corresponding ring.

[0011] Further, clamping frame structures for limiting the position of the rotating ring are provided at the top and bottom of the inner sides of both ends of the sliding sleeve. The clamping frame structure includes a movable clamping frame, and notches corresponding to the movable clamping frame are provided at the top and bottom of both end faces of the rotating ring. Sliding grooves for slidingly cooperating with the movable clamping frame are provided at the top and bottom of the inner side of the sliding sleeve. The movable clamping frame slides inside the sliding groove by the elastic force of the elastic structure, and the movable clamping frame is correspondingly buckled with the notch under the action of the elastic force of the elastic structure.

[0012] Further, the clamping frame structure further includes a semi-frame. The elastic structure and the movable clamping frame are correspondingly located inside the semi-frame. The elastic structure includes two oppositely arranged limiting rods. An outer ring is sleeved on the surface of the limiting rod. Two inner rings are sleeved on the top of the movable clamping frame. The outer rings on the surfaces of the two limiting rods are respectively arranged in one-to-one correspondence with the two inner rings, and an elastic member is connected between the inner ring and the outer ring. An inner rod is sleeved at the center of the elastic member. The two ends of the inner rod are respectively slidably clamped with the outer ring and the inner ring.

[0013] The present invention also provides a measurement method for a multi-station high-precision optoelectronic measurement laser tracking system. The method applies the calibration device for the multi-station high-precision optoelectronic measurement laser tracking system described in any one of the above, and includes the following steps: S1. When it is necessary to limit the test piece, place the test piece correspondingly on the top of the arc-shaped frame, and use the opening of the arc-shaped frame to limit the test piece, or place the test piece correspondingly on the tops of the two arc-shaped frames, and turn the nut. The spiral effect of the nut and the bracket causes the collar at both ends of the connecting frame to slide on the surface of the bracket. At this time, the two opposite collars approach each other, and the two approaching collars clamp the test piece correspondingly by means of the frame plate, which is convenient for limiting different test pieces; After the two opposite collars clamp the test piece corresponding to each other by means of the support plates, if the test piece does not block the laser head, the movable carriage of the clamping structure is buckled corresponding to the notch of the rotating ring. At this time, the support rod at the bottom of the rotating ring is vertically downward. Rotate the limiting ring. The spiral effect between the limiting ring and the support rod and the elastic force of the second spring support make the laser heads of the two corresponding rings correspond to each other; If the test piece blocks the laser head, rotate the support rod. The support rod drives the rotating ring to rotate on the surface of the sliding sleeve. The rotating rotating ring separates the movable carriage from the notch, and the movable carriage rotates on the end face of the rotating ring until the support rod is vertically upward. And after the movable carriage is buckled corresponding to the notch again, with the elastic force cooperation of the limiting ring and the second spring, it is convenient to make the laser heads of the two corresponding rings correspond to each other; After the two laser heads face each other, the two laser heads are respectively set as a transmitter and a receiver. The transmitter sends laser to the receiver, so as to obtain the relative distance between the two laser heads, and the accurate value of the test piece can be obtained, completing the high-precision measurement of different test pieces.

[0014] The technical effects and advantages of the present invention: 1. In the present invention, by pushing the rotating ring to rotate on the surface of the connecting frame, at this time, the movable carriage is separated from the notch, and the elastic force of the elastic structure makes the movable carriage closely fit with the end face of the rotating ring. The rotating rotating ring drives the movable carriage to rotate inside the elastic structure. When the rotating ring rotates on the side strip of the connecting frame, the rotating rotating ring makes the sliding sleeve move on the surface of the connecting frame, thereby changing the position of the sliding sleeve on the surface of the connecting frame. Until the support rod is in the vertical state again, the elastic force of the elastic structure makes the movable carriage buckle with the notch of the rotating ring again. Due to the elastic force of the limiting ring and the second spring, the laser heads of the two corresponding rings can be calibrated corresponding to each other in real time, which is convenient for measuring the test piece at different positions on the connecting frame and ensuring the accuracy of the test piece measurement.

[0015]

[0015] 2. In the present invention, by placing the test piece, since the weight of the test piece is directly applied to the top of the arc-shaped frame, the arc-shaped frame moves downward under the pressure of the weight. During the downward movement of the arc-shaped frame, it drives the clamping frame to move downward synchronously. During the downward movement of the clamping frame, the first spring on the surface of the vertical rod is squeezed. The elastic force of the first spring is used to prevent the arc-shaped frame from directly impacting the bottom surface of the groove. The first springs connected to the clamping frames at both ends of the arc-shaped frame make the test piece keep stable during the downward movement. Until the test piece is placed, turn the nut. The spiral effect between the nut and the bracket facilitates the clamping of the test piece by the support plates inside the collar. The test piece is clamped by the two relatively parallel support plates, and the arc-shaped frame itself is supported by the two first springs, so that the test piece itself is in a horizontal state, ensuring the accuracy of the test piece during the measurement process.

[0016] 3. In the present invention, the sliding sleeve is defined on the surface of the connecting frame by means of a plurality of connecting bars. At this time, the sliding sleeve can move smoothly horizontally on the surface of the connecting frame, and the plurality of connecting bars and the plurality of side bars are arranged alternately to prevent the sliding sleeve from rotating on the surface of the connecting frame. The sliding sleeves on the surfaces of the two connecting frames are arranged oppositely and are located at the centers of the connecting frames. The sliding sleeves move on the surfaces of the connecting frames, and two laser heads are used to measure the test piece multiple times to ensure that the two connecting frames are always parallel, guarantee the accuracy of the test data of the test piece, and avoid serious errors in the measurement of the test piece caused by the condition of the calibration device itself. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0018] Figure 1 is a schematic diagram of the overall structure of a multi-station high-precision optoelectronic measurement laser tracking system calibration device according to an embodiment of the present invention; Figure 2 is a schematic diagram of the overall structure of a connecting frame according to an embodiment of the present invention; Figure 3 is an embodiment of the present invention Figure 2 enlarged view of the structure of part A in; Figure 4 is an embodiment of the present invention Figure 1 enlarged view of the structure of part B in; In the figure: 1, chassis; 2, support; 3, connecting frame; 4, collar; 5, frame plate; 6, nut; 7, laser head; 8, arc-shaped frame; 9, clamping frame; 10, vertical rod; 11, first spring; 12, sliding sleeve; 13, connecting bar; 14, rotating ring; 15, support rod; 16, second spring; 17, bottom ring; 18, corresponding ring; 19, limiting ring; 20, moving clamping frame; 21, notch; 22, sliding groove; 23, half-frame; 24, limiting rod; 25, outer ring; 26, inner ring; 27, elastic member; 28, inner rod. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

[0020] The present invention provides a calibration device for a multi-station high-precision optoelectronic measurement laser tracking system, as Figure 1 shown, which includes a chassis 1. On the top of both the front and rear sides of the chassis 1, brackets 2 are connected. At both ends of the surfaces of the two brackets 2, a clamping structure for limiting the test piece is slidably sleeved. The two clamping structures are arranged oppositely. The clamping structure includes a connecting frame 3. At both ends of the connecting frame 3, collar rings 4 are fixedly connected. The two collar rings 4 are respectively sleeved on the surfaces of the two brackets 2. On the inner sides of the two opposite collar rings 4, a frame plate 5 for correspondingly limiting the test piece is installed. On the outer side of the collar ring 4, a nut 6 is spirally sleeved on the surface of the bracket 2. And an optoelectronic structure is sleeved at the center of the clamping structure. The two optoelectronic structures are arranged oppositely. The optoelectronic structure includes a laser head 7. The laser heads 7 of the two optoelectronic structures are arranged oppositely, and the end face of the laser head 7 is flush with the inner side face of the frame plate 5 correspondingly. When limiting the test piece, after the test piece is correspondingly placed between the two frame plates 5, rotate the nut 6. The spiral cooperation between the nut 6 and the bracket 2 facilitates pushing the two connecting frames 3 to approach each other. When the collar rings 4 at both ends of the two connecting frames 3 approach each other, since the connecting frame 3 is sleeved on the surface of the bracket 2 by using the collar ring 4, the two connecting frames 3 are always in a parallel corresponding state during the sliding process, thereby avoiding the inclination of the connecting frame 3 during the sliding process, facilitating the inner side face of the frame plate 5 connected by the two collar rings 4 to always be flush with the end face of the laser head 7 correspondingly. The two opposite collar rings 4 clamp the test piece by using the frame plate 5. When the two opposite laser heads 7 measure the test piece, the two laser heads 7 are respectively set as a transmitter and a receiver. The transmitter sends laser to the receiver, thereby obtaining the relative distance between the two laser heads 7 and ensuring the accuracy of the test piece during measurement. The two opposite laser heads 7 correspond to each other, and the optoelectronic measurement method ensures the high-precision accuracy of the test piece during the measurement process.

[0021] In Figure 1 , the clamping structure further includes an arc-shaped frame 8. At both ends of the arc-shaped frame 8, clamping frames 9 are fixedly connected. The inner side face of the clamping frame 9 corresponds to the inner side face of the collar ring 4. At the centers of both sides of the chassis 1, grooves are provided. The arc-shaped frame 8 and the clamping frame 9 are correspondingly located inside the grooves. Inner grooves are provided on both sides of the groove. The outer ends of the clamping frames 9 are correspondingly inserted into the inner grooves on the side of the chassis 1. A vertical rod 10 is vertically installed inside the inner groove. The outer ends of the clamping frames 9 are slidably sleeved on the surface of the vertical rod 10. A first spring 11 is sleeved on the surface of the vertical rod 10, and the outer ends of the clamping frames 9 are fixedly connected to the bottom of the inner groove by using the first spring 11. Different placement methods can be carried out for different test pieces according to the length and shape of the test piece. If the test piece has a cylindrical shape, place the test piece at the opening on the top of the arc-shaped frame 8, and use the arc-shaped frame 8 itself to preliminarily limit the cylindrical test piece. If the length of the test piece is greater than the length of the arc-shaped frame 8, place the test piece flat on the tops of the two arc-shaped frames 8, and use the two arc-shaped frames 8 to complete the preliminary limitation of the test piece.

[0022] When the test piece is placed, since the weight of the test piece is directly applied to the top of the arc-shaped frame 8, the arc-shaped frame 8 moves downward under the pressure of the weight. During the downward movement of the arc-shaped frame 8, the clamping frame 9 is driven to move downward synchronously. During the downward movement of the clamping frame 9, the first spring 11 on the surface of the vertical rod 10 is squeezed. The elastic force of the first spring 11 is used to prevent the arc-shaped frame 8 from directly impacting the bottom surface of the groove. The first springs 11 connected to the clamping frames 9 at both ends of the arc-shaped frame 8 keep the test piece stable during the downward movement. Until the test piece is placed, turn the nut 6. The spiral effect of the nut 6 and the support 2 facilitates the clamping plate 5 inside the collar 4 to clamp the test piece. The test piece is clamped by two relatively parallel clamping plates 5. Moreover, the arc-shaped frame 8 itself is supported by two first springs 11, making the test piece itself in a horizontal state, ensuring the accuracy of the test piece during measurement.

[0023] The arc-shaped frame 8 is set as a semi-circular plate, and the opening of the arc-shaped frame 8 is upward. The arc-shaped frame 8 is made of a hard material. The top surfaces of the two arc-shaped frames 8 are correspondingly flush. The top surface of the clamping frame 9 is higher than the top surface of the arc-shaped frame 8. After the test piece needs to be limited, the test piece is placed on the top of the arc-shaped frame 8. The arc-shaped frame 8 made of a hard material has a supporting effect on the test piece, avoiding the situation of deformation of the arc-shaped frame 8 during the process of supporting the test piece.

[0024] In Figure 1 and Figure 3 Among them, the optoelectronic structure includes a sliding sleeve 12. The sliding sleeve 12 is slidably sleeved on the surface of the connecting frame 3. A plurality of side strips are arranged in parallel and side by side on the circumferential side surface of the connecting frame 3. A plurality of connecting strips 13 are arranged at the center of the sliding sleeve 12. The plurality of connecting strips 13 are arranged in an interleaved and corresponding manner with the plurality of side strips. And the sliding sleeve 12 slides on the surface of the connecting frame 3 by means of the plurality of connecting strips 13. The sliding sleeve 12 is limited on the surface of the connecting frame 3 by means of the plurality of connecting strips 13. At this time, the sliding sleeve 12 can move smoothly horizontally on the surface of the connecting frame 3. And the plurality of connecting strips 13 and the plurality of side strips are arranged in an interleaved manner to prevent the sliding sleeve 12 from rotating on the surface of the connecting frame 3. The sliding sleeves 12 on the surfaces of the two connecting frames 3 are arranged oppositely, and the sliding sleeve 12 is located at the center of the connecting frame 3. The sliding sleeve 12 moves on the surface of the connecting frame 3. The test piece is measured multiple times by means of the two laser heads 7, ensuring that the two connecting frames 3 are always in a parallel state, ensuring the accuracy of the test data of the test piece, and avoiding serious errors in the measurement of the test piece caused by the condition of the calibration device itself.

[0025] In Figure 1 and Figure 2In the figure, a rotating ring 14 is sleeved on the surface of the sliding sleeve 12. The rotating ring 14 is rotatably sleeved on the surfaces of multiple connecting bars 13 of the sliding sleeve 12, and the rotating ring 14 is in spiral cooperation with the side bars of the connecting frame 3. A support rod 15 is connected to the bottom of the rotating ring 14. The bottom end of the support rod 15 is connected to a bottom ring 17 by a second spring 16. The top surface of the bottom ring 17 is correspondingly clamped with a corresponding ring 18 by a wavy surface. A plurality of laser heads 7 are annularly and equidistantly installed on the outer circumferential side surface of the corresponding ring 18. A limiting ring 19 is arranged at the top of the corresponding ring 18 and is spirally sleeved on the top of the support rod 15. After the sliding sleeve 12 itself is limited on the surface of the connecting frame 3 by multiple connecting bars 13, the rotating ring 14 is spirally sleeved on the surface of the connecting frame 3, and the rotating ring 14 itself is used to limit the sliding sleeve 12 to prevent the sliding sleeve 12 from moving wantonly on the surface of the connecting frame 3, ensuring that the two sliding sleeves 12 are always in a relative state. After the two sliding sleeves 12 are opposite to each other, at this time, the support rod 15 is vertically installed at the bottom of the rotating ring 14. It is necessary to align the laser heads 7 on the surfaces of the two corresponding rings 18. Rotate the limiting ring 19. The spiral effect of the limiting ring 19 and the support rod 15 and the elastic force of the second spring 16 facilitate adjusting the positions of the bottom ring 17 and the corresponding ring 18 on the surface of the support rod 15. Due to the limitation of the second spring 16 on the bottom ring 17 itself and the up and down movement of the bottom ring 17 on the surface of the support rod 15, the bottom ring 17 itself is ensured to maintain a horizontal state, and the bottom ring 17 can move smoothly up and down on the surface of the support rod 15. The wavy surface on the top surface of the bottom ring 17 cooperates with the limiting ring 19, enabling the corresponding ring 18 to move smoothly up and down on the surface of the support rod 15, and the laser heads 7 of the two corresponding rings 18 can correspond to each other until the laser heads 7 of the two corresponding rings 18 can be in the same horizontal plane, completing the calibration of the laser heads 7.

[0026] In Figure 3 and Figure 4 In the figure, clamping structures for limiting the position of the rotating ring 14 are arranged at the top and bottom of the inner sides of both ends of the sliding sleeve 12. The clamping structures include movable clamping frames 20, and notches 21 corresponding to the movable clamping frames 20 are arranged at the top and bottom of both end faces of the rotating ring 14. Sliding grooves 22 slidably matched with the movable clamping frames 20 are arranged at the top and bottom of the inner side of the sliding sleeve 12. The movable clamping frames 20 slide inside the sliding grooves 22 by the elastic force of an elastic structure, and the movable clamping frames 20 are correspondingly clamped with the notches 21 under the action of the elastic force of the elastic structure. When the support rod 15 is in a vertical state, at this time, the elastic force of the elastic structure enables the movable clamping frames 20 to slide inside the sliding grooves 22 until the movable clamping frames 20 are clamped inside the notches 21 of the rotating ring 14. By using the clamping of the movable clamping frames 20 and the notches 21, the limitation of the support rod 15 is completed, ensuring that the support rod 15 is always in a vertical state. At this time, the laser heads 7 on the surfaces of the two corresponding rings 18 can be in the same horizontal plane, ensuring the calibration accuracy of the laser heads 7.

[0027] When the test piece is placed on the tops of the two arc-shaped frames 8 to block the two laser heads 7 from performing optoelectronic measurement, the rotating ring 14 is pushed to rotate on the surface of the connecting frame 3. At this time, the moving holder 20 is separated from the notch 21, and the elastic force of the elastic structure makes the moving holder 20 closely fit with the end face of the rotating ring 14. The rotating rotating ring 14 drives the moving holder 20 to rotate inside the elastic structure. When the rotating ring 14 rotates on the side strip of the connecting frame 3, the rotating rotating ring 14 makes the sliding sleeve 12 move on the surface of the connecting frame 3, so as to change the position of the sliding sleeve 12 on the surface of the connecting frame 3. Until the support rod 15 is in the vertical state again, the elastic force of the elastic structure makes the moving holder 20 and the notch 21 of the rotating ring 14 buckle again. Due to the elastic force of the limiting ring 19 and the second spring 16, the two laser heads 7 of the corresponding rings 18 are calibrated with each other at this time, which is convenient for measuring the test piece at different positions of the connecting frame 3 and ensures the accuracy of the test piece measurement.

[0028] In Figure 3 and Figure 4 In the above, the holder structure further includes a semi-frame 23. The elastic structure and the moving holder 20 are correspondingly located inside the semi-frame 23. The elastic structure includes two limiting rods 24 arranged oppositely. An outer ring 25 is sleeved on the surface of the limiting rod 24. Two inner rings 26 are sleeved on the top of the moving holder 20. The outer rings 25 on the surfaces of the two limiting rods 24 are respectively arranged in one-to-one correspondence with the two inner rings 26, and an elastic member 27 is connected between the inner ring 26 and the outer ring 25. An inner rod 28 is sleeved at the center of the elastic member 27. Two ends of the inner rod 28 are respectively slidably clamped with the outer ring 25 and the inner ring 26. When the moving holder 20 moves towards the notch 21 inside the chute 22, the two outer rings 25 rotate on the surfaces of the two limiting rods 24 respectively, and the two inner rings 26 rotate on the surface of the moving holder 20. At this time, the elastic force of the elastic member 27 makes the inner ring 26 separate from the outer ring 25 until the elastic force of the elastic member 27 makes the moving holder 20 correspondingly buckle inside the notch 21. The elasticity of the elastic member 27 is used to ensure the stability between the rotating ring 14 and the sliding sleeve 12, and the buckling of the moving holder 20 and the notch 21, so as to ensure that the support rod 15 is in the vertical state.

[0029] The present invention also provides a measurement method for a multi-station high-precision optoelectronic measurement laser tracking system. The method applies the calibration device of the multi-station high-precision optoelectronic measurement laser tracking system described above, referring to the accompanying drawings of the specification Figures 1-4 , including the following steps: S1. When it is necessary to limit the test piece, place the test piece correspondingly on the top of the arc-shaped frame 8, and use the opening of the arc-shaped frame 8 to limit the test piece. Or place the test piece correspondingly on the tops of two arc-shaped frames 8, and turn the nut 6. The spiral effect of the nut 6 and the bracket 2 causes the collars 4 at both ends of the connecting frame 3 to slide on the surface of the bracket 2. At this time, the two opposite collars 4 approach each other, and the two approaching collars 4 clamp the test piece correspondingly by means of the shelf plate 5, which is convenient for limiting different test pieces. S2. After the two opposite collars 4 clamp the test piece correspondingly by means of the shelf plate 5, if the test piece does not block the laser head 7, the movable bracket 20 of the clamping bracket structure is correspondingly buckled with the notch 21 of the rotating ring 14. At this time, the support rod 15 at the bottom of the rotating ring 14 is vertically downward. Rotate the limiting ring 19. The spiral effect of the limiting ring 19 and the support rod 15 and the elastic force of the second spring 16 support, so that the laser heads 7 of the two corresponding rings 18 are corresponding. S3. If the test piece blocks the laser head 7, rotate the support rod 15. The support rod 15 drives the rotating ring 14 to rotate on the surface of the sliding sleeve 12. The rotating rotating ring 14 causes the movable bracket 20 to separate from the notch 21, and the movable bracket 20 rotates on the end face of the rotating rotating ring 14 until the support rod 15 is vertically upward, and the movable bracket 20 is correspondingly buckled with the notch 21 again. Then, with the cooperation of the elastic force of the limiting ring 19 and the second spring 16, it is convenient to make the laser heads 7 of the two corresponding rings 18 corresponding. S4. After the two laser heads 7 are opposite to each other, the two laser heads 7 are respectively set as a transmitter and a receiver. The transmitter sends laser to the receiver, so as to obtain the relative distance between the two laser heads 7, and the accurate value of the test piece can be obtained, and the high-precision measurement of different test pieces is completed.

[0030] Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A calibration device for a multi-station high-precision optoelectronic measurement laser tracking system, comprising a chassis (1), characterized in that: On both the front and rear sides of the top of the chassis (1), brackets (2) are connected. At both ends of the surfaces of the two brackets (2), a clamping structure for restricting the test piece is slidably sleeved. The two clamping structures are arranged oppositely. The clamping structure includes a connecting frame (3). At both ends of the connecting frame (3), collar rings (4) are fixedly connected. The two collar rings (4) are respectively sleeved on the surfaces of the two brackets (2). On the inner sides of the two opposite collar rings (4), a frame plate (5) for correspondingly restricting the test piece is installed. On the outer side of the collar ring (4), a nut (6) is spirally sleeved on the surface of the bracket (2). And an optoelectronic structure is sleeved at the center of the clamping structure. The two optoelectronic structures are arranged oppositely. The optoelectronic structure includes a laser head (7). The laser heads (7) of the two optoelectronic structures are arranged oppositely, and the end face of the laser head (7) is flush with the inner side face of the frame plate (5).

2. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 1, wherein: The clamping structure further includes an arc-shaped frame (8). At both ends of the arc-shaped frame (8), clamping frames (9) are fixedly connected. The inner side face of the clamping frame (9) corresponds to the inner side face of the collar ring (4). At the centers of both sides of the chassis (1), grooves are provided. The arc-shaped frame (8) and the clamping frame (9) are correspondingly located inside the grooves. Inner grooves are provided on both sides of the groove. The outer end of the clamping frame (9) is correspondingly inserted into the inner groove on the side of the chassis (1). A vertical rod (10) is vertically installed inside the inner groove. The outer end of the clamping frame (9) is slidably sleeved on the surface of the vertical rod (10). A first spring (11) is sleeved on the surface of the vertical rod (10). And the outer end of the clamping frame (9) is fixedly connected to the bottom of the inner groove by the first spring (11).

3. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 2, wherein: The arc-shaped frame (8) is set as a semi-circular plate, and the opening of the arc-shaped frame (8) is upward. The arc-shaped frame (8) is made of a hard material. The top surfaces of the two arc-shaped frames (8) are flush with each other. The top surface of the clamping frame (9) is higher than the top surface of the arc-shaped frame (8).

4. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 1, wherein: The optoelectronic structure includes a sliding sleeve (12). The sliding sleeve (12) is slidably sleeved on the surface of the connecting frame (3). On the circumferential side surface of the connecting frame (3), a plurality of side bars are arranged in parallel and side by side. At the center of the sliding sleeve (12), a plurality of connecting bars (13) are provided. The plurality of connecting bars (13) and the plurality of side bars are arranged in an alternating and corresponding manner. And the sliding sleeve (12) slides on the surface of the connecting frame (3) by means of the plurality of connecting bars (13).

5. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 4, wherein: A swivel ring (14) is sleeved on the surface of the sliding sleeve (12). The swivel ring (14) is rotatably sleeved on the surfaces of a plurality of connecting bars (13) of the sliding sleeve (12), and the swivel ring (14) is in screw fit with the side bars of the connecting frame (3). A support rod (15) is connected to the bottom of the swivel ring (14). The bottom end of the support rod (15) is connected to a bottom ring (17) by a second spring (16). The top surface of the bottom ring (17) is correspondingly clamped to a corresponding ring (18) by a wavy surface. A plurality of laser heads (7) are annularly and equidistantly installed on the outer circumferential side surface of the corresponding ring (18). A limiting ring (19) sleeved on the top of the support rod (15) is arranged at the top of the corresponding ring (18).

6. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 4, wherein: Clamping frame structures for limiting the position of the swivel ring (14) are arranged at the top and bottom of the inner sides of both ends of the sliding sleeve (12). The clamping frame structure includes a movable clamping frame (20). Notches (21) corresponding to the movable clamping frame (20) for buckling are arranged at the top and bottom of both end faces of the swivel ring (14). Chutes (22) slidably matched with the movable clamping frame (20) are arranged at the top and bottom of the inner side of the sliding sleeve (12). The movable clamping frame (20) slides inside the chute (22) by the elastic force of an elastic structure, and the movable clamping frame (20) is buckled with the notch (21) under the action of the elastic force of the elastic structure.

7. The calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to claim 6, wherein: The clamping frame structure further includes a semi-frame (23). The elastic structure and the movable clamping frame (20) are correspondingly arranged inside the semi-frame (23). The elastic structure includes two oppositely arranged limiting rods (24). An outer ring (25) is sleeved on the surface of the limiting rod (24). Two inner rings (26) are sleeved on the top of the movable clamping frame (20). The outer rings (25) on the surfaces of the two limiting rods (24) are respectively arranged in one-to-one correspondence with the two inner rings (26). An elastic member (27) is connected between the inner ring (26) and the outer ring (25). An inner rod (28) is sleeved at the center of the elastic member (27). Both ends of the inner rod (28) are slidably clamped with the outer ring (25) and the inner ring (26) respectively.

8. A measurement method for a multi-station high-precision optoelectronic measurement laser tracking system, characterized in that, The method uses the calibration device for a multi-station high-precision optoelectronic measurement laser tracking system according to any one of claims 1-7, and includes the following steps: S1. When it is necessary to limit a test piece, place the test piece correspondingly on the top of the arc-shaped frame (8), and use the opening of the arc-shaped frame (8) to limit the test piece, or place the test piece correspondingly on the tops of two arc-shaped frames (8), and turn the nut (6). The screw effect of the nut (6) and the support (2) causes the collar (4) at both ends of the connecting frame (3) to slide on the surface of the support (2). At this time, the two opposite collars (4) approach each other, and the two approaching collars (4) clamp the test piece correspondingly by using the shelf plate (5), which is convenient for limiting different test pieces; S2. After the two opposite collars (4) clamp the test piece correspondingly using the support plate (5), if the test piece does not block the laser head (7), the movable carriage (20) of the clamping structure is correspondingly buckled with the notch (21) of the rotating ring (14). At this time, the support rod (15) at the bottom of the rotating ring (14) is vertically downward. Rotate the limiting ring (19). The spiral effect between the limiting ring (19) and the support rod (15) and the elastic force of the second spring (16) support make the laser heads (7) of the two corresponding rings (18) correspond to each other; S3. If the test piece blocks the laser head (7), rotate the support rod (15). The support rod (15) drives the rotating ring (14) to rotate on the surface of the sliding sleeve (12). The rotating rotating ring (14) makes the movable carriage (20) separate from the notch (21), and the movable carriage (20) rotates on the end face of the rotating rotating ring (14) until the support rod (15) is vertically upward, and the movable carriage (20) corresponds to the notch (21) again and is buckled. Then, using the elastic force cooperation of the limiting ring (19) and the second spring (16), it is convenient to make the laser heads (7) of the two corresponding rings (18) correspond to each other; S4. After the two laser heads (7) face each other, the two laser heads (7) are respectively set as a transmitter and a receiver. The transmitter sends laser to the receiver, so as to obtain the relative distance between the two laser heads (7), and the accurate value of the test piece can be obtained, completing the high-precision measurement of different test pieces.

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