GIS equipment-oriented loop resistance test method and device and electronic equipment

Abstract

The invention provides a GIS equipment-oriented loop resistance test method and device and electronic equipment, and relates to the technical field of electric power. The method comprises the following steps: determining to-be-detected GIS equipment and position coordinates of the GIS equipment; and one end of the target telescopic rod is moved to the position coordinates of the GIS equipment, and the other end of the target telescopic rod is connected with a target ground control terminal. Wherein one end, close to the GIS equipment, of the target telescopic rod is designed to be two electrical contact clamps. Then, two target test points of the GIS equipment are determined, the two electrical contact clamps are controlled to stretch out and draw back and rotate, the two target test points are grabbed respectively, and each electrical contact clamp grabs one target test point. And an electrical loop is further formed between the two target test points, loop resistance test is carried out on the electrical loop, and the GIS equipment passing the electrical loop test is put into use of the power system. According to the invention, the operability and safety of the loop resistance test can be improved.

Description

Technical Field

[0001] The present application relates to the field of power technologies, and particularly to a loop resistance testing method, device and electronic device for GIS equipment. Background Art

[0002] A gas insulated switchgear (GIS) device is a switchgear used in a power system, and its main functions are to control, protect and isolate electrical equipment in the power system to ensure the safe and stable operation of the power system. Before the GIS device is put into use in the power system, loop resistance testing needs to be carried out to ensure the integrity and reliability of electrical connections.

[0003] Since GIS devices are usually installed on elevated structures, especially in substations, GIS devices may be located in positions that are difficult to directly access. In traditional testing methods, an aerial work vehicle such as a lifting platform or a hanging basket is used to lift the tester to the position of the GIS device to be tested. The tester manually connects the test clips to the test points of the GIS device, and after ensuring that the test clips are firmly connected to the GIS device, loop resistance testing is carried out.

[0004] However, the existing loop resistance testing methods have poor operability and certain insecurity. Summary of the Invention

[0005] The present application provides a loop resistance testing method, device and electronic device for GIS equipment, so as to solve the technical problems of poor operability and certain insecurity in the loop resistance testing of GIS equipment in the prior art.

[0006] In a first aspect, the present application provides a loop resistance testing method for GIS equipment, including:

[0007] Determine the gas insulated switch GIS equipment to be detected and the position coordinates of the GIS equipment;

[0008] Move one end of the target telescopic rod to the position coordinates, and connect the other end to the target ground control terminal; wherein, one end of the target telescopic rod close to the GIS equipment is designed as two electrical contact clips.

[0009] Determine two target test points of the GIS equipment, and control the two electrical contact clips to extend, retract and rotate to grab the two target test points; wherein, each electrical contact clip grabs one target test point.

[0010] Form an electrical loop between the two target test points, perform a loop resistance test on the electrical loop, and put the GIS device that passes the loop resistance test into use in the power system.

[0011] In a possible design, determining the two target test points of the GIS device includes:

[0012] Display the structural model of the GIS device on the display device of the target ground control terminal;

[0013] Determine two preset test points in the structural model; based on the preset laser ranging method and the preset visual recognition method, determine two target test points corresponding to the two preset test points on the GIS device.

[0014] In a possible design, displaying the structural model of the GIS device on the display device of the target ground control terminal includes:

[0015] Obtain the component list of the GIS device and determine the size of each component in the component list; reduce the size of each component according to the preset reduction ratio;

[0016] Determine the component layout of the GIS device and the connection method between components; based on the reduced component size, the component layout, and the connection method between components, generate the structural model of the GIS device and display it on the display device of the target ground control terminal.

[0017] In a possible design, controlling the two electrical contact clips to expand, contract, and rotate to grasp the two target test points includes:

[0018] Obtain the historical operation path and historical grasping parameters of the two electrical contact clips; wherein, the historical operation path includes the historical expansion and contraction path and the historical rotation path;

[0019] Determine the grasping success rate corresponding to the historical operation path and the historical grasping parameters; learn the grasping success rate based on the preset learning strategy and calculate the target operation path and target grasping parameters required to grasp the two target test points;

[0020] Based on the target operation path and the target grasping parameters, control the two electrical contact clips to expand, contract, and rotate to grasp the two target test points.

[0021] In a possible design, loop testers are installed on both of the two electrical contact clips, and voltage sensors are equipped in the loop testers;

[0022] Performing loop resistance testing on the electrical loop includes:

[0023] Applying a preset known current to the electrical loop and measuring the loop voltage drop of the electrical loop based on the voltage sensor;

[0024] Feeding back the loop voltage drop to the target ground control terminal; performing loop resistance testing on the electrical loop at the target ground control terminal based on the preset known current and the loop voltage drop.

[0025] In a possible design, performing loop resistance testing on the electrical loop at the target ground control terminal based on the preset known current and the loop voltage drop includes:

[0026] Calculating the loop resistance value of the electrical loop through the target ground control terminal based on the preset known current and the loop voltage drop;

[0027] If the loop resistance value is within the preset safety range, the electrical loop passes the loop resistance test; if the loop resistance value is not within the preset safety range, the electrical loop fails the loop resistance test.

[0028] In a possible design, if the electrical loop fails the loop resistance test, the method further includes:

[0029] Performing fault troubleshooting on the electrical loop and / or the GIS device to identify the cause of the failure in the loop resistance test;

[0030] Maintaining the electrical loop and / or the GIS device based on the cause of the failure and re-performing loop resistance testing on the maintained electrical loop.

[0031] In a second aspect, the present application provides a loop resistance testing device for a GIS device, including:

[0032] A determination module for determining the gas-insulated switch (GIS) device to be detected and the position coordinates of the GIS device;

[0033] A processing module for moving one end of the target telescopic rod to the position coordinates and connecting the other end to the target ground control terminal; wherein, one end of the target telescopic rod close to the GIS device is designed as two electrical contact clips;

[0034] The determination module is further used for determining two target test points of the GIS device;

[0035] A grasping module, which is used to control the telescopic and rotational movements of the two electrical contact clips to grasp the two target test points; wherein, each electrical contact clip grasps one target test point.

[0036] A testing module, which is used to form an electrical circuit between the two target test points, test the loop resistance of the electrical circuit, and put the GIS device that passes the loop resistance test into use in the power system.

[0037] In a possible design, the determination module further includes: a display module, which is used to display the structural model of the GIS device on the display device of the target ground control terminal.

[0038] The determination module is further used to determine two preset test points in the structural model; and based on a preset laser ranging method and a preset visual recognition method, determine two target test points corresponding to the two preset test points on the GIS device.

[0039] In a possible design, the display module further includes: an acquisition module, which is used to acquire the component list of the GIS device.

[0040] The determination module is further used to determine the size of each component in the component list.

[0041] The processing module is further used to perform a reduction process on the size of each component according to a preset reduction ratio.

[0042] The determination module is further used to determine the component layout of the GIS device and the connection method between components.

[0043] The display module is further used to generate the structural model of the GIS device based on the reduced component sizes, the component layout, and the connection method between components, and display it on the display device of the target ground control terminal.

[0044] In a possible design, the acquisition module is further used to acquire the historical operation path and historical grasping parameters of the two electrical contact clips; wherein, the historical operation path includes the historical telescopic path and the historical rotational path.

[0045] The determination module is further used to determine the grasping success rate corresponding to the historical operation path and the historical grasping parameters.

[0046] The grasping module further includes: a learning module, which is used to learn the grasping success rate based on a preset learning strategy and calculate the target operation path and target grasping parameters required to grasp the two target test points.

[0047] The grasping module is further configured to control the two electrical contact clips to extend, retract, and rotate based on the target operation path and the target grasping parameters, so as to grasp the two target test points.

[0048] In a possible design, loop testers are installed on both of the two electrical contact clips, and a voltage sensor is equipped in the loop tester.

[0049] The testing module further includes: a measuring module, configured to apply a preset known current to the electrical loop and measure the loop voltage drop of the electrical loop based on the voltage sensor.

[0050] The testing module is further configured to feedback the loop voltage drop to the target ground control terminal; and perform a loop resistance test on the electrical loop at the target ground control terminal based on the preset known current and the loop voltage drop.

[0051] In a possible design, the testing module further includes: a calculating module, configured to calculate the loop resistance value of the electrical loop through the target ground control terminal based on the preset known current and the loop voltage drop.

[0052] The testing module is further configured to: if the loop resistance value is within a preset safety range, the electrical loop passes the loop resistance test; if the loop resistance value is not within the preset safety range, the electrical loop fails the loop resistance test.

[0053] In a possible design, the loop resistance testing device for a GIS device further includes: a troubleshooting module, configured to perform fault troubleshooting on the electrical loop and / or the GIS device to identify the cause of the failure that fails the loop resistance test.

[0054] The loop resistance testing device for a GIS device further includes: a maintenance module, configured to perform maintenance on the electrical loop and / or the GIS device based on the cause of the failure.

[0055] The testing module is further configured to perform a loop resistance test on the electrical loop after maintenance again.

[0056] In a third aspect, an embodiment of the present application provides an electronic device, including: at least one processor and a memory; the memory stores computer-executable instructions; the at least one processor executes the computer-executable instructions stored in the memory, so that the at least one processor executes the method described in the first aspect and various possible designs above.

[0057] Fourthly, an embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the methods described in the first aspect above and various possible designs are implemented.

[0058] Fifthly, an embodiment of the present application provides a computer program product, including a computer program. When the computer program is executed by a processor, the methods described in the first aspect above and various possible designs of the first aspect are implemented.

[0059] The loop resistance testing method, device and electronic device for GIS equipment provided by the present application determine the GIS equipment to be detected and the position coordinates of the GIS equipment. One end of the target telescopic rod is moved to the position coordinates of the GIS equipment, and the other end is connected to the target ground control terminal. Wherein, one end of the target telescopic rod close to the GIS equipment is designed as two electrical contact clips. Then, two target test points of the GIS equipment are determined, and the two electrical contact clips are controlled to stretch and rotate to grab the two target test points, and each electrical contact clip grabs one target test point. Further, an electrical loop is formed between the two target test points, the loop resistance of the electrical loop is tested, and the GIS equipment passing the loop resistance test is put into use in the power system. Using the target telescopic rod can not only avoid the high-altitude operation of testers and reduce insecurity, but also support the test requirements of different heights and angles, and is applicable to various complex on-site environments. When there are multiple target test points to be inspected, the target test points can be quickly grabbed by stretching and rotating the electrical contact clips, greatly improving the test efficiency. In addition, the electrical contact clip can provide a stable grasping force, combined with the target ground control terminal, improving the reliability and accuracy of the test. Therefore, the present application can improve the operability and safety of loop resistance testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] The drawings here are incorporated into the specification and constitute a part of this specification, showing the embodiments consistent with the present application, and are used together with the specification to explain the principles of the present application.

[0061] Figure 1 It is a schematic flow chart of the loop resistance testing method for GIS equipment provided by an embodiment of the present application;

[0062] Figure 2 It is a schematic structural diagram of the loop resistance testing device for GIS equipment provided by an embodiment of the present application;

[0063] Figure 3 It is a hardware structure diagram of the electronic device provided by an embodiment of the present application.

[0064] Through the above-mentioned drawings, specific embodiments of the present application have been shown, and will be described in more detail hereinafter. These drawings and the written description are not intended to limit the scope of the concept of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. Detailed Description of the Invention

[0065] Exemplary embodiments will be described in detail herein, and examples thereof are shown in the drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0066] The terms "first", "second", "third", "fourth", etc. (if any) in the specification, claims and above-mentioned drawings of the present invention are used to distinguish similar objects and do not necessarily have to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein.

[0067] In the embodiments of the present application, words such as "exemplary" or "for example" are used to represent examples, illustrations or explanations. Any embodiment or design solution described as "exemplary" or "for example" in the present application should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Rather, the use of words such as "exemplary" or "for example" is intended to present relevant concepts in a specific manner.

[0068] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data need to comply with relevant laws, regulations and standards, and corresponding operation entrances are provided for the user to choose to authorize or refuse.

[0069] In power tests, the loop resistance test of GIS equipment is an important means to judge the operating state and electrical performance of the equipment. The loop resistance test is used to verify the connection quality of the circuit. A complete electrical connection means that the connections between all components and conductors are firm and defect-free.

[0070] By measuring the loop resistance, the quality of the circuit connection can be judged, and any problems that may lead to an incomplete connection can be detected. For example, a too high loop resistance may indicate poor contact, corrosion or other problems in the GIS equipment, which in turn affects the normal operation of the GIS equipment. The size of the loop resistance directly affects the current transmission efficiency. By measuring the loop resistance, the electrical performance of the GIS equipment during actual operation can also be detected.

[0071] To perform a loop resistance test on GIS equipment, traditional methods usually use an aerial work platform such as a lift platform or a gondola to lift the tester to the position of the GIS equipment to be tested. After that, the test points for the loop resistance test are identified on the GIS equipment, and the tester manually connects the test clips to the test points of the GIS equipment. After ensuring that the test clips are firmly connected to the GIS equipment, start the loop resistance test equipment to perform the test and record the test results.

[0072] However, manually connecting the test clips at high altitude has certain safety hazards, especially in adverse weather conditions. When there are multiple test points to be checked, the entire process of manually connecting the test clips and performing the loop resistance test can be very time-consuming, resulting in low test efficiency. At the same time, manually connecting the test clips may cause problems such as poor contact and insufficiently firm connection due to uneven force, thus affecting the accuracy and reliability of the test results.

[0073] Therefore, the existing loop resistance test methods have poor operability and certain insecurity.

[0074] To address the above technical problems, the inventor thought of using a telescopic rod to replace the lifting function of the aerial work platform, and designing the end of the telescopic rod as an electrical contact clip to replace the manual operation of the tester. To further improve the test safety, the inventor also connected the other end of the telescopic rod to the ground control terminal, and the tester can control the movement of the telescopic rod and the grasping of the electrical contact clip through the ground control terminal. This avoids the direct contact between the tester and the electrical contact clip and the GIS equipment, improving the test safety while ensuring the operability of the loop resistance test.

[0075] The following uses specific embodiments to elaborate in detail on the technical solution of the present application and how the technical solution of the present application solves the above technical problems. These several specific embodiments below can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the drawings.

[0076] The embodiment of the present application provides a loop resistance test method for GIS equipment. Figure 1The flow schematic diagram of the loop resistance testing method for GIS devices provided by the embodiments of this application is as follows: Figure 1 As shown, the loop resistance testing method for GIS devices includes:

[0077] S101. Determine the GIS device to be detected and its location coordinates.

[0078] Explanatorily, each GIS device usually has a unique identifier, such as a serial number or an asset number. Through the identifier, each GIS device can be accurately identified in the device management system.

[0079] The location coordinates can be an important data point in the device management system, helping to establish a comprehensive GIS device database. This is because GIS devices are usually distributed in a wide geographical area, especially in large power grids. Precise geographical coordinates can help testers quickly find specific GIS devices.

[0080] S102. Move one end of the target telescopic rod to the location coordinates of the GIS device, and connect the other end to the target ground control terminal.

[0081] It can be understood that the target telescopic rod consists of multiple telescopic structures and can freely adjust its length according to the location coordinates of the GIS device. The target telescopic rod can adopt high-strength lightweight materials, such as carbon fiber or aluminum alloy. High-strength lightweight materials provide better stability and accuracy. Especially in cases where precise positioning or operation is required, the stability of high-strength lightweight materials helps to reduce the sway of the target telescopic rod during movement and improve the accuracy of operation.

[0082] One end of the target telescopic rod close to the GIS device is designed as two electrical contact clips with automatic clamping and releasing functions. It should be noted that the surfaces of the two electrical contact clips can be coated with high-conductivity materials to reduce contact resistance and improve measurement accuracy.

[0083] The other end of the target telescopic rod is connected to the target ground control terminal, which is a device for monitoring, controlling, and recording data. With this connection method, testers can adjust the operation of the target telescopic rod in real time through the target ground control terminal, or it can be automatically adjusted by the target ground control terminal. Among them, the target telescopic rod is equipped with an angle adjustment component to support flexible positioning in multiple directions, ensuring that one end of the target telescopic rod can reach the location coordinates of the GIS device.

[0084] S103. Determine two target test points of the GIS device, and control the two electrical contact clips to expand, contract, and rotate to grab the two target test points.

[0085] Since the basic principle of loop resistance testing is to calculate the resistance by measuring the voltage drop of the current in the electrical loop, two target test points need to be selected in the GIS device to measure the voltage drop. However, directly selecting two target test points on the GIS device may face some practical operation challenges, such as the complexity of the GIS device and safety considerations. Therefore, the display device of the target ground control terminal can be used to assist in the selection.

[0086] Specifically, obtain the component list of the GIS device and determine the size of each component in the component list. Shrink the size of each component according to the preset shrinkage ratio. After that, determine the component layout of the GIS device and the connection method between components. Based on the shrunk component size, component layout, and connection method between components, generate the structural model of the GIS device and display it on the display device of the target ground control terminal.

[0087] Explanatorily, the actual GIS device may be very large, while the screen size of the display device of the target ground control terminal is limited and cannot directly display the GIS device with actual size. By shrinking the component size, the entire GIS device can be adapted to the screen for easy viewing and operation.

[0088] After displaying the structural model of the GIS device on the display device of the target ground control terminal, determine two preset test points in the structural model. Among them, the preset test points are usually selected according to the test requirements and device structure, representing the ideal positions where loop resistance testing needs to be carried out on the actual GIS device. Based on the preset laser ranging method and preset visual recognition method, determine two target test points corresponding to the two preset test points on the GIS device.

[0089] Laser ranging is a method for accurately measuring distances, which uses a laser beam to measure the distance from one point to another point. Through this method, the distance from the target ground control terminal to each point on the GIS device can be accurately measured. Visual recognition uses a camera and image processing algorithms to identify and locate objects. Through visual recognition, specific components and features on the GIS device can be obtained to assist in locating the target test points.

[0090] Combining the preset laser ranging method and preset visual recognition method, the positions of the actual test points on the GIS device can be automatically calculated, that is, determine two target test points corresponding to the two preset test points on the GIS device.

[0091] Furthermore, through the target ground control terminal, control the two electrical contact clips on the target telescopic rod to grab the two target test points, where each electrical contact clip grabs one target test point. The electrical contact clips also have telescopic and rotating functions, and can accurately locate and grab the target test points to ensure good electrical connection.

[0092] It should be noted that in this embodiment, an autonomous learning technology is adopted to achieve the grasping of target test points. By continuously optimizing the operation path and grasping parameters through measuring historical data, the working efficiency and stability of the electrical contact clip are improved.

[0093] Specifically, obtain the historical operation paths and historical grasping parameters of two electrical contact clips. Among them, the historical operation path includes the historical telescopic path and the historical rotation path. Determine the grasping success rate corresponding to the historical operation path and the historical grasping parameters, learn the grasping success rate based on a preset learning strategy, and calculate the target operation path and the target grasping parameters required for grasping two target test points. Based on the target operation path and the target grasping parameters, control the two electrical contact clips to perform telescoping and rotation to grasp two target test points.

[0094] Among them, a pressure sensor is integrated in the electrical contact clip, which can monitor the target grasping parameters in real time to ensure good contact between the electrical contact clip and the target test point. In addition, an acceleration sensor, a pressure sensor and a temperature sensor are also integrated in the electrical contact clip to monitor the operating state of the electrical contact clip in real time to prevent abnormalities.

[0095] It should be understood that since multiple sensors are integrated in the electrical contact clip, these sensors rely on power to work. A high-capacity rechargeable lithium battery can be used to supply power to the electrical contact clip. At the same time, the electrical contact clip supports fast charging and modular battery replacement to ensure long-term continuous operation.

[0096] S104. Form an electrical loop between two target test points, perform a loop resistance test on the electrical loop, and put the GIS device that passes the loop resistance test into use in the power system.

[0097] It should be noted that loop testers are installed on both of the two electrical contact clips. When the two electrical contact clips respectively grasp two target test points on the GIS device, the two target test points are connected by the wires of the loop tester to form a complete electrical loop. This electrical loop allows current to flow through, so that various electrical measurements can be carried out.

[0098] Specifically, apply a preset known current to the electrical loop, and measure the loop voltage drop of the electrical loop based on the voltage sensor in the loop tester. Feed back the loop voltage drop to the target ground control terminal. Among them, the loop tester and the target ground control terminal are wirelessly connected through 5G or WiFi to achieve real-time data transmission and control signal feedback.

[0099] It should be noted that the loop tester is also equipped with built-in data encryption and anti-interference components to ensure the integrity and security of the measurement data during wireless communication.

[0100] Next, based on the preset known current and the loop voltage drop feedback, the loop resistance test of the electrical loop is carried out at the target ground terminal. Explanatorily, based on the preset known current and the loop voltage drop, the loop resistance value of the electrical loop is calculated through the target ground control terminal, where the loop resistance value = loop voltage drop / preset known current.

[0101] If the loop resistance value is within the preset safety range, it indicates that the electrical loop passes the loop resistance test; if the loop resistance value is not within the preset safety range, it indicates that the electrical loop fails the loop resistance test.

[0102] Furthermore, the GIS equipment that passes the loop resistance test is put into use in the power system. For the GIS equipment that fails the loop resistance test, troubleshoot the electrical loop and / or the GIS equipment to identify the cause of the failure of the loop resistance test, and based on the cause of the failure, maintain the electrical loop and / or the GIS equipment, and re-perform the loop resistance test on the maintained electrical loop.

[0103] After the completion of this loop resistance test, control the electrical contact clip to release the fixture, and retract the target telescopic rod, automatically reset to the initial state, and prepare for the next loop resistance test.

[0104] The loop resistance test method for GIS devices provided in this application determines the GIS device to be detected and the position coordinates of the GIS device. One end of the target telescopic rod is moved to the position coordinates of the GIS device, and the other end is connected to the target ground control terminal. One end of the target telescopic rod close to the GIS device is designed as two electrical contact clips. Then, the structural model of the GIS device is displayed on the display device of the target ground control terminal, and two preset test points are determined in the structural model. Based on the preset laser ranging method and the preset visual recognition method, two target test points corresponding to the two preset test points are determined on the GIS device. Next, based on the historical operation path and historical grasping parameters of the two electrical contact clips and the corresponding grasping success rate, the grasping success rate is learned based on the preset learning strategy, and the target operation path and target grasping parameters required to grasp the two target test points are calculated. Based on the target operation path and target grasping parameters, the two electrical contact clips are controlled to expand, contract, and rotate to grasp the two target test points, with each electrical contact clip grasping one target test point. Further, an electrical loop is formed between the two target test points. By applying a preset known current to the electrical loop, the loop voltage drop of the electrical loop is measured. Based on the preset known current and the loop voltage drop, the loop resistance test of the electrical loop is performed. The GIS device that passes the loop resistance test is put into use in the power system, and the GIS device that fails the loop resistance test is maintained. Using the target telescopic rod can not only avoid high-altitude operations by testers and reduce insecurity, but also support test requirements at different heights and angles and is applicable to various complex on-site environments. When there are multiple target test points to be inspected, the target test points can be quickly grasped by expanding, contracting, and rotating the electrical contact clips, greatly improving the test efficiency. In addition, the electrical contact clips can provide a stable grasping force, combined with the target ground control terminal, to improve the reliability and accuracy of the test. Therefore, this application can improve the operability and safety of the loop resistance test.

[0105] Figure 2 FIG. is a schematic structural diagram of a loop resistance test device for GIS devices provided in an embodiment of this application, as Figure 2 shown, the loop resistance test device 200 for GIS devices includes: a determination module 201, a processing module 202, a grasping module 203, and a test module 204;

[0106] Among them, the determination module 201 is used to determine the gas-insulated switch GIS device to be detected and the position coordinates of the GIS device;

[0107] The processing module 202 is used to move one end of the target telescopic rod to the position coordinates and connect the other end to the target ground control terminal; one end of the target telescopic rod close to the GIS device is designed as two electrical contact clips;

[0108] The determination module 201 is further configured to determine two target test points of the GIS device;

[0109] The grasping module 203 is configured to control two electrical contact clips to extend, retract and rotate so as to grasp the two target test points; wherein, each electrical contact clip grasps one target test point;

[0110] The testing module 204 is configured to form an electrical loop between the two target test points, perform loop resistance testing on the electrical loop, and put the GIS device that passes the loop resistance test into use in the power system.

[0111] In a possible design, the determination module 201 further includes: a display module 205 configured to display a structure model of the GIS device on a display device of a target ground control terminal;

[0112] The determination module 201 is further configured to determine two preset test points in the structure model; and determine two target test points corresponding to the two preset test points on the GIS device based on a preset laser ranging method and a preset visual recognition method.

[0113] In a possible design, the display module 205 further includes: an acquisition module 206 configured to acquire a component list of the GIS device;

[0114] The determination module 201 is further configured to determine the size of each component in the component list;

[0115] The processing module 202 is further configured to perform a reduction process on the size of each component according to a preset reduction ratio;

[0116] The determination module 201 is further configured to determine the component layout of the GIS device and the connection manner between components;

[0117] The display module 205 is further configured to generate a structure model of the GIS device based on the reduced component sizes, the component layout, and the connection manner between components, and display it on the display device of the target ground control terminal.

[0118] In a possible design, the acquisition module 206 is further configured to acquire the historical operation path and historical grasping parameters of the two electrical contact clips; wherein, the historical operation path includes a historical extension path and a historical rotation path;

[0119] The determination module 201 is further configured to determine the grasping success rate corresponding to the historical operation path and the historical grasping parameters;

[0120] The grasping module 203 further includes: a learning module 207, configured to learn the grasping success rate based on a preset learning strategy, and calculate a target operation path and target grasping parameters required for grasping two target test points;

[0121] The grasping module 203 is further configured to control the telescopic and rotational movements of two electrical contact clips based on the target operation path and target grasping parameters, so as to grasp two target test points.

[0122] In a possible design, loop testers are installed on both of the two electrical contact clips, and a voltage sensor is provided in the loop tester;

[0123] The testing module 204 further includes: a measuring module 208, configured to apply a preset known current to the electrical loop and measure the loop voltage drop of the electrical loop based on the voltage sensor;

[0124] The testing module 204 is further configured to feedback the loop voltage drop to a target ground control terminal; perform loop resistance testing on the electrical loop at the target ground control terminal based on the preset known current and the loop voltage drop.

[0125] In a possible design, the testing module 208 further includes: a calculation module 209, configured to calculate the loop resistance value of the electrical loop through the target ground control terminal based on the preset known current and the loop voltage drop;

[0126] The testing module 208 is further configured to: if the loop resistance value is within a preset safe range, the electrical loop passes the loop resistance test; if the loop resistance value is not within the preset safe range, the electrical loop fails the loop resistance test.

[0127] In a possible design, the loop resistance testing device 200 for a GIS device further includes: a troubleshooting module 210, configured to troubleshoot faults in the electrical loop and / or the GIS device to identify the cause of the failure in the loop resistance test;

[0128] The loop resistance testing device 200 for a GIS device further includes: a maintenance module 211, configured to maintain the electrical loop and / or the GIS device based on the cause of the fault;

[0129] The testing module 204 is further configured to re-perform loop resistance testing on the maintained electrical loop.

[0130] The loop resistance testing device for a GIS device provided in the embodiments of the present application can be used to execute the loop resistance testing method for a GIS device in any of the above embodiments, and its implementation principle and technical effects are similar, which will not be elaborated here.

[0131] It should be noted that the division of each module of the above device is only a division of logical functions. In actual implementation, it can be fully or partially integrated into a physical entity, or physically separated. And these modules can all be implemented in the form of software called by processing elements; they can also all be implemented in the form of hardware; or some modules can be implemented in the form of software called by processing elements, and some modules can be implemented in the form of hardware. In addition, all or part of these modules can be integrated together or can be independently implemented. The processing element mentioned here can be an integrated circuit with signal processing capabilities. In the implementation process, each step of the above method or each of the above modules can be completed by the integrated logic circuit in the processor element or the instruction in the form of software.

[0132] Figure 3 FIG. is a schematic structural diagram of an electronic device provided by an embodiment of the present application. As Figure 3 shown, the electronic device may include: a transceiver 31, a processor 32, and a memory 33.

[0133] The processor 32 executes the computer execution instructions stored in the memory, so that the processor 32 executes the solutions in the above embodiments. The processor 32 may be a general-purpose processor, including a central processing unit CPU, a network processor (NP), etc.; it may also be a digital signal processor DSP, an application specific integrated circuit ASIC, a field programmable gate array FPGA, or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0134] The memory 33 is connected to the processor 32 through a system bus and completes communication with each other. The memory 33 is used to store computer program instructions.

[0135] The transceiver 31 can be used for communication and interaction with other devices.

[0136] The system bus may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The system bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of simplicity, only a thick line is used to represent it in the figure, but it does not mean that there is only one bus or one type of bus. The transceiver is used to implement communication between the database access device and other computers (such as clients, read-write libraries, and read-only libraries). The memory may include a random access memory (RAM), and may also include a non-volatile memory.

[0137] The electronic device provided by the embodiment of the present application can be used to execute the method provided by any of the above embodiments, and its implementation principle and technical effects are similar, which will not be elaborated here.

[0138] The embodiment of the present application also provides a computer-readable storage medium, in which computer instructions are stored. When the computer instructions run on a computer, the computer is made to execute the method provided by any of the above embodiments.

[0139] The embodiment of the present application also provides a computer program product, which includes a computer program stored in a computer-readable storage medium. At least one processor can read the computer program from the computer-readable storage medium, and when at least one processor executes the computer program, the method provided by any of the above embodiments can be implemented.

[0140] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces, indirect couplings or communication connections of devices or modules, and can be in electrical, mechanical or other forms.

[0141] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they can be located in one place, or can be distributed to multiple network units. Some or all of the modules can be selected according to actual needs to implement the solution of this embodiment.

[0142] In addition, the functional modules in each embodiment of the present application can be integrated in a processing unit, or each module can exist physically alone, or two or more modules can be integrated in one unit. The unit formed by the above modules can be implemented in the form of hardware, or in the form of a hardware plus a software functional unit.

[0143] The above integrated modules implemented in the form of software functional modules can be stored in a computer-readable storage medium. The above software functional modules are stored in a storage medium, including several instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor execute some steps of the methods in each embodiment of the present application.

[0144] It should be understood that the above-mentioned processor may be a Central Processing Unit (CPU), or other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the method disclosed in combination with the invention can be directly embodied as being executed and completed by a hardware processor, or by a combination of hardware and software modules in the processor.

[0145] The memory may include high-speed RAM memory, and may also include non-volatile storage NVM, such as at least one disk memory, and may also be a USB flash drive, a removable hard disk, a read-only memory, a magnetic disk, or an optical disc, etc.

[0146] The bus may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of representation, the buses in the drawings of this application are not limited to only one bus or one type of bus.

[0147] The above-mentioned storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as Static Random Access Memory (SRAM), Electrically Erasable Programmable Read-Only Memory (EEPROM), Erasable Programmable Read-Only Memory (EPROM), Programmable Read-Only Memory (PROM), Read-Only Memory (ROM), magnetic memory, flash memory, a magnetic disk, or an optical disc. The storage medium can be any available medium that can be accessed by a general-purpose or special-purpose computer.

[0148] An exemplary storage medium is coupled to the processor, so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an Application Specific Integrated Circuit (ASIC). Of course, the processor and the storage medium can also exist as discrete components in an electronic control unit or a master control device.

[0149] Those of ordinary skill in the art will understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments; and the aforementioned storage medium includes: various media such as ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0150] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A loop resistance testing method for GIS equipment, characterized in that, Including: Determine the gas-insulated switch GIS equipment to be detected and the position coordinates of the GIS equipment; Move one end of the target telescopic rod to the position coordinates, and connect the other end to the target ground control terminal; wherein, one end of the target telescopic rod close to the GIS equipment is designed as two electrical contact clips; Determine two target test points of the GIS equipment, and control the two electrical contact clips to expand, contract and rotate to grab the two target test points; wherein, each electrical contact clip grabs one target test point; Form an electrical circuit between the two target test points, perform a loop resistance test on the electrical circuit, and put the GIS equipment that passes the loop resistance test into use in the power system.

2. The method according to claim 1, wherein The determination of the two target test points of the GIS equipment includes: Display the structural model of the GIS equipment on the display device of the target ground control terminal; Determine two preset test points in the structural model; based on the preset laser ranging method and the preset visual recognition method, determine two target test points corresponding to the two preset test points on the GIS equipment.

3. The method according to claim 2, wherein The display of the structural model of the GIS equipment on the display device of the target ground control terminal includes: Obtain the component list of the GIS equipment and determine the size of each component in the component list; reduce the size of each component according to the preset reduction ratio; Determine the component layout of the GIS equipment and the connection method between components; based on the reduced component size, the component layout, and the connection method between components, generate the structural model of the GIS equipment and display it on the display device of the target ground control terminal.

4. The method according to claim 1, wherein The control of the two electrical contact clips to expand, contract and rotate to grab the two target test points includes: Obtain the historical operation path and historical grabbing parameters of the two electrical contact clips; wherein, the historical operation path includes the historical expansion and contraction path and the historical rotation path; Determine the grabbing success rate corresponding to the historical operation path and the historical grabbing parameters; learn the grabbing success rate based on the preset learning strategy, and calculate the target operation path and target grabbing parameters required to grab the two target test points; Based on the target operation path and the target grabbing parameters, control the two electrical contact clips to expand, contract and rotate to grab the two target test points.

5. The method according to claim 1, characterized in that, Loop testers are installed on both of the two electrical contact clips, and voltage sensors are equipped in the loop testers; The loop resistance test on the electrical circuit includes: Apply a preset known current to the electrical circuit and measure the loop voltage drop of the electrical circuit based on the voltage sensor; Feed back the loop voltage drop to the target ground control terminal; based on the preset known current and the loop voltage drop, perform a loop resistance test on the electrical circuit at the target ground control terminal.

6. The method according to claim 5, wherein The loop resistance test on the electrical circuit at the target ground control terminal based on the preset known current and the loop voltage drop includes: Based on the preset known current and the loop voltage drop, calculate the loop resistance value of the electrical loop through the target ground control terminal; If the loop resistance value is within the preset safety range, the electrical loop passes the loop resistance test; if the loop resistance value is not within the preset safety range, the electrical loop fails the loop resistance test.

7. The method according to any one of claims 1 to 6, characterized in that, If the electrical loop fails the loop resistance test, the method further includes: Conduct a fault check on the electrical loop and / or the GIS device to identify the cause of the failure in the loop resistance test; Based on the cause of the failure, maintain the electrical loop and / or the GIS device, and re-conduct the loop resistance test on the maintained electrical loop.

8. A loop resistance testing device for GIS equipment, characterized in that, Including: A determination module, configured to determine the gas-insulated switch GIS device to be detected and the position coordinates of the GIS device; A processing module, configured to move one end of the target telescopic rod to the position coordinates and connect the other end to the target ground control terminal; wherein, one end of the target telescopic rod close to the GIS device is designed as two electrical contact clips; The determination module is further configured to determine two target test points of the GIS device; A grasping module, configured to control the two electrical contact clips to expand and contract and rotate to grasp the two target test points; wherein each electrical contact clip grasps one target test point; A test module, configured to form an electrical loop between the two target test points, conduct a loop resistance test on the electrical loop, and put the GIS device that passes the loop resistance test into use in the power system.

9. An electronic device, characterized in that, Including: A processor and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the loop resistance test method for GIS devices according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, Computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by the processor, they are used to implement the loop resistance test method for GIS devices according to any one of claims 1 to 7.

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